A method and system for detecting the state of key components of an optical current transformer

By synchronously collecting and analyzing the measurement data of optical current transformers, and combining fractal dimension and fault tree model, the problem of determining the cause of measurement error degradation in optical current transformers was solved, realizing autonomous diagnosis and fault location of optical current transformers, and improving equipment reliability and operation and maintenance efficiency.

CN117538597BActive Publication Date: 2026-08-04STATE GRID ANHUI ELECTRIC POWER CO LTD ELECTRIC POWER SCI RES INST +1
2 Cites 0 Cited by

Patent Information

Application Number
CN202311490811.X
Authority / Receiving Office
CN · China
Patent Type
Patents(China)
Current Assignee / Owner
Filing Date
2023-11-07
Publication Date
2026-08-04
Estimated Expiration
2043-11-07

AI Technical Summary

Technical Problem

Existing technologies cannot effectively analyze the operating status of key components of optical current transformers, making it impossible to accurately determine the cause of measurement error degradation and posing safety hazards.

Method used

By synchronously collecting measurement data from three optical current transformers, calculating the CRSt statistic and its threshold CRSc, and combining the fractal dimension and fault tree model, the source of abnormal influence is inverted, enabling online self-detection and fault location.

Benefits of technology

It enables autonomous diagnosis of measurement errors of optical current transformers without a standard, improves equipment management and the scientific nature of operation and maintenance strategies, and avoids operational failures caused by abnormal errors.

✦ Generated by Eureka AI based on patent content.
Patent Text Reader

Abstract

The application discloses a kind of optical current transformer key component state detection method and system, method includes: the CRS t Statistics and its statistical threshold value CRS c , carry out online self-detection;Establish the time series of the CRS t Statistics of representing the overall error state of three optical current transformers under the same node, calculate the fractal dimension of the time series, when the overall error state of three optical current transformers under the same node appears abnormal, according to the difference of fractal dimension, judge the degradation form of the overall error state of three optical current transformers under the same node;According to the degradation form, combine fault tree model, the abnormal influence source of optical current transformer measurement error is inversed, and the autonomous identification of optical current transformer fault position is realized;The application has the advantages that: method accurately deduces the abnormal influence source of optical current transformer measurement error, avoids security risks.
Need to check novelty before this filing date? Find Prior Art