A testing method of a memory chip and related device

By configuring the data transmission pins of the test machine to adapt to the pin types of different memory chips, communication between control and data signals is achieved, solving the problem of requiring dedicated test equipment for different memory chips and reducing test costs.

CN117632605BActive Publication Date: 2026-02-27HYGON YUNXIN INTEGRATED CIRCUIT DESIGN (SHANGHAI) CO LTD
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Patent Information

Application Number
CN202311533041.2
Authority / Receiving Office
CN · China
Patent Type
Patents(China)
Current Assignee / Owner
Filing Date
2023-11-16
Publication Date
2026-02-27
Estimated Expiration
2043-11-16

AI Technical Summary

Technical Problem

Different types of memory chips require specialized testing equipment, resulting in higher testing costs.

Method used

Configure the data transmission pins of the test machine according to the pin type of the memory chip under test, so that it is suitable for signal transmission with the preset chip pins, realize communication of control and data signals, and expand the applicability of the test object.

Benefits of technology

Even without dedicated control pins in the testing machine, it can test a variety of memory chips, reducing testing costs.

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Abstract

The embodiment of the present application discloses a kind of test method and related device of storage chip, it is related to integrated circuit technical field, can test multiple types of storage chip, effectively expand the applicable scope of test object, to greatly reduce test cost.The method comprises: according to the pin type of the preset chip pin in the storage chip to be measured, the data transmission pin of test machine is configured, so that the data transmission pin is adapted to signal transmission with the preset chip pin;Wherein, the pin type includes control class, and the preset chip pin of the control class is used to transmit control class signal;The test machine is used to test the storage chip to be measured.The present application is applicable to the test of storage chip.
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