Particle screening device and heat sink tower

Abstract

The application discloses a kind of particle screening device and heat absorption tower, particle screening device includes: shell;Purification pipe, obliquely through the shell, the inlet end of the purification pipe is higher than its outlet end, the upper portion of the purification pipe is equipped with several air inlet holes and its lower portion is equipped with several air outlet holes;Air flow supply assembly, set in the upper portion of the purification pipe, the air flow supply assembly is communicated to the purification pipe by several air inlet holes to blow through the particle of the purification pipe;Impurity collection assembly, by several air outlet holes are communicated to the purification pipe to collect the impurities discharged from the air outlet hole.The particle screening device and heat absorption tower provided by the application can realize efficient purification treatment of particles entering the heat absorber, solve the efficiency influence caused by dust or small particles generated by abrasion of particles in the long running process, and ensure the purity of particles and heat absorption efficiency.

Description

Technical Field

[0001] This invention belongs to the field of solar thermal power generation technology, specifically relating to a particle screening device and a heat absorption tower. Background Technology

[0002] Currently, the mainstream heat storage medium used in concentrated solar power (CSP) is binary molten salt. Binary molten salt heat storage systems have high investment costs, and the heat storage temperature is limited to 565℃, resulting in a Rankine cycle power generation efficiency of less than 45% for the downstream system. Therefore, the levelized cost of electricity (LCOE) for CSP based on molten salt energy storage remains high. To further improve the efficiency of tower CSP and reduce the LCOE of CSP plants, there is an urgent need to develop a higher-temperature and cheaper heat storage technology. Solid particle heat storage technology offers high temperatures (up to 1000℃), is non-corrosive, and eliminates the need for high-performance alloy materials in the heat exchange equipment, making it inexpensive and one of the main development directions for third-generation CSP heat storage technology.

[0003] There are certain problems with particle heat absorption technology, such as wear and tear on particles during long-term operation. The dust or tiny particles generated by this wear and tear have a significant impact on the efficiency of particle heat absorption / exchange. Summary of the Invention

[0004] This invention provides a particle screening device and an endothermic tower to solve the aforementioned technical problems, specifically adopting the following technical solution:

[0005] A particle screening device, comprising:

[0006] case;

[0007] A purification tube is inclined through the housing, with the inlet end of the purification tube higher than its outlet end. The upper part of the purification tube is provided with several air inlets and the lower part is provided with several air outlets.

[0008] An airflow supply assembly is disposed at the upper part of the purification tube. The airflow supply assembly is connected to the purification tube through a plurality of air inlets to purge particles flowing through the purification tube.

[0009] An impurity collection assembly is connected to the purification tube through several of the air outlets to collect impurities discharged from the air outlets.

[0010] Furthermore, the airflow supply assembly includes:

[0011] A primary unidirectional flow layer is disposed above the purification pipe. An air cavity is formed between the primary unidirectional flow layer and the upper part of the housing. A plurality of first one-way valves are spaced apart in the primary unidirectional flow layer. One end of each first one-way valve is connected to the air cavity and the other end is connected to the purification pipe through the air outlet.

[0012] The air supply section provides airflow to the air cavity.

[0013] Furthermore, the airflow supply assembly also includes:

[0014] An airflow converging layer is disposed between the primary unidirectional conduction layer and the purification pipe. An airflow distribution chamber is provided in the airflow converging layer. One end of the first one-way valve is connected to the air cavity and the other end is connected to the airflow distribution chamber. The airflow distribution chamber is connected to the purification pipe through the air inlet.

[0015] Furthermore, the airflow converging layer is also provided with a plurality of nozzles corresponding to the air inlet. One end of the nozzle is connected to the airflow distribution chamber and the other end is connected to the purification pipe through the air inlet. The inner diameter of the nozzle gradually decreases from top to bottom.

[0016] Furthermore, the upper surface of the primary unidirectional conduction layer is inclined along the extension direction of the purification pipe, and the air supply section is located at the top of the air cavity.

[0017] Furthermore, in the vertical direction, the air supply section covers each of the first one-way valves.

[0018] Furthermore, the impurity collection component includes:

[0019] A secondary unidirectional flow layer is located below the purification pipe, and several second one-way valves are spaced apart inside it;

[0020] A fine impurity discharge layer is disposed below the secondary unidirectional conduction layer. Several discharge channels are provided at intervals in the fine impurity discharge layer. A coarse impurity guide channel is formed between the fine impurity discharge layer and the secondary unidirectional conduction layer. The coarse impurity guide channel is inclined along the extension direction of the purification tube. One end of the second one-way valve is connected to the coarse impurity guide channel and the other end is connected to the purification tube through the air outlet.

[0021] A coarse impurity storage tank is connected to the lower end of the coarse impurity guide channel.

[0022] Furthermore, the impurity collection component also includes:

[0023] Several acceleration tubes are disposed below the fine impurity discharge layer and connected to the discharge channel to accelerate the air discharged from the discharge channel.

[0024] Furthermore, the air inlet and the air outlet are offset in the vertical direction.

[0025] A heat absorption tower includes a main body, a particle lifter, a heat absorber, and the aforementioned particle screening device. The heat absorber, the particle screening device, and the particle lifter are disposed on the top of the main body. The particle lifter is connected to the inlet end of the purification pipe of the particle screening device, and the heat absorber is connected to the outlet end of the purification pipe of the particle screening device.

[0026] The advantage of this invention is that the particle screening device and heat absorption tower provided can achieve efficient purification of particles entering the heat absorber, solving the problem of dust or tiny particles generated by wear during long-term operation affecting heat absorption efficiency, and ensuring the purity of particles and heat absorption efficiency. Attached Figure Description

[0027] To more clearly illustrate the technical solutions in the embodiments of this application or the prior art, the drawings used in the description of the embodiments or the prior art will be briefly introduced below. Obviously, the drawings described below are only some embodiments of this application. For those skilled in the art, other drawings can be obtained based on these drawings without creative effort.

[0028] Figure 1 This is a schematic diagram of a heat absorption tower according to the present invention;

[0029] Figure 2 This is a schematic diagram of a particle screening device according to the present invention;

[0030] Particle screening device 100, main body 200, particle elevator 300, heat absorber 400.

[0031] Particle screening device 100: housing 10, purification pipe 20, air inlet 21, air outlet 22, air supply assembly 30, primary unidirectional guiding layer 31, first one-way valve 311, upper surface 312, air chamber 32, fan 33, airflow converging layer 34, airflow distribution chamber 341, nozzle 342, impurity collection assembly 40, secondary unidirectional guiding layer 41, second one-way valve 411, fine impurity discharge layer 42, discharge channel 421, coarse impurity guiding channel 43, coarse impurity storage tank 44, acceleration pipe 45. Detailed Implementation

[0032] The embodiments of this application are described in detail below. Examples of the embodiments are shown in the accompanying drawings, wherein the same or similar reference numerals denote the same or similar elements or elements having the same or similar functions throughout. The embodiments described below with reference to the accompanying drawings are exemplary and intended to explain this application, and should not be construed as limiting this application.

[0033] In the description of this application, unless otherwise expressly specified and limited, the terms "connected," "linked," and "fixed" should be interpreted broadly. For example, they can refer to a fixed connection, a detachable connection, or an integral part; they can refer to a mechanical connection or an electrical connection; they can refer to a direct connection or an indirect connection through an intermediate medium; they can refer to the internal communication of two components or the interaction between two components. Those skilled in the art can understand the specific meaning of the above terms in this application based on the specific circumstances.

[0034] In this application, unless otherwise expressly specified and limited, "above" or "below" the second feature can include direct contact between the first and second features, or contact between the first and second features through another feature between them. Furthermore, "above," "over," and "on top" of the second feature includes the first feature being directly above or diagonally above the second feature, or simply indicates that the first feature is at a higher horizontal level than the second feature. "Below," "below," and "under" the second feature includes the first feature being directly below or diagonally below the second feature, or simply indicates that the first feature is at a lower horizontal level than the second feature.

[0035] like Figure 1 The diagram shows a heat absorption tower according to this application, comprising a main body 200, a particle lifter 300, a heat absorber 400, and a particle screening device 100. The heat absorber 400, particle screening device 100, and particle lifter 300 are disposed on the top of the main body 200. The particle lifter 300 is connected to the inlet end of the purification pipe 20 of the particle screening device 100, and the heat absorber 400 is connected to the outlet end of the purification pipe 20 of the particle screening device 100. Particles are lifted to the top of the main body 200 by the particle lifter 300, then transported to the particle screening device 100 for processing, and then enter the heat absorber 400 for operation.

[0036] like Figure 2 As shown, in an embodiment of this application, the particle screening device 100 includes: a housing 10, a purification pipe 20, an airflow supply assembly 30, and an impurity collection assembly 40. Specifically, the purification pipe 20 is inclined and passes through the housing 10. The inlet end of the purification pipe 20 is higher than its outlet end. After entering from its inlet end, particles move from top to bottom along the purification pipe 20 under the action of gravity until they enter the absorber 400.

[0037] The purification pipe 20 has several air inlets 21 at its upper part and several air outlets 22 at its lower part. An airflow supply assembly 30 is located at the upper part of the purification pipe 20 to provide high-pressure airflow. The airflow supply assembly 30 is connected to the purification pipe 20 through the air inlets 21 to purge particles flowing through the purification pipe 20. Powder or fine particles in the particles are discharged from the purification pipe 20 through the air outlets 22 during particle movement. An impurity collection assembly 40 is connected to the purification pipe 20 through the air outlets 22 to collect impurities such as powder or fine particles discharged from the air outlets 22.

[0038] In an embodiment of this application, the airflow supply assembly 30 includes: a primary unidirectional conduction layer 31 and an air supply section.

[0039] A primary unidirectional flow layer 31 is disposed above the purification pipe 20. An air cavity 32 is formed between the primary unidirectional flow layer 31 and the upper part of the housing 10. An air supply unit provides airflow to the air cavity 32. It is understood that the air supply unit can be disposed inside or outside the particle screening device 100. In the embodiment of this application, the air supply unit is specifically a fan 33, which is disposed within the air cavity 32. When the fan 33 is started, a high-pressure airflow is formed within the air cavity 32. A plurality of first one-way valves 311 are spaced apart within the primary unidirectional flow layer 31. One end of each first one-way valve 311 is connected to the air cavity 32, and the other end is connected to the purification pipe 20 through an air outlet 22. The high-pressure airflow within the air cavity 32 enters the purification pipe 20 unidirectionally through the first one-way valves 311. In the embodiment of this application, the first one-way valve 311 is a Tesla valve. The unidirectional nature of the Tesla valve allows airflow to flow in one direction, preventing backflow of solid impurities and blockage of the flow path.

[0040] The airflow supply assembly 30 also includes an airflow converging layer 34. The airflow converging layer 34 is disposed between the primary unidirectional conduction layer 31 and the purification pipe 20. An airflow distribution chamber 341 is provided within the airflow converging layer 34. One end of a first one-way valve 311 is connected to the air chamber 32, and the other end is connected to the airflow distribution chamber 341. The airflow distribution chamber 341 is connected to the purification pipe 20 through an air inlet 21. Specifically, the airflow converging layer 34 also has several nozzles 342 corresponding to the air inlets 21. One end of each nozzle 342 is connected to the airflow distribution chamber 341, and the other end is connected to the purification pipe 20 through the air inlet 21. The inner diameter of the nozzles 342 gradually decreases from top to bottom, thereby increasing the pressure of the airflow entering the purification pipe 20. Meanwhile, an airflow distribution chamber 341 is configured between the nozzle 342 and the first one-way valve 311. In this way, the number of nozzles 342 can be increased or decreased according to the needs of the air inlet 21, avoiding the difficulty of increasing or decreasing the first one-way valve 311. The number of first one-way valves 311 only needs to meet the basic wind force requirements.

[0041] In the embodiments of this application, the upper surface 312 of the primary unidirectional guiding layer 31 is inclined along the extension direction of the purification pipe 20, and the air supply section is disposed at the top of the air cavity 32. Preferably, in the vertical direction, the air supply section covers each first one-way valve 311. Specifically, the fan 33 is horizontally disposed at the top of the air cavity 32. The fan blades of the fan 33 cover each first one-way valve 311.

[0042] The primary unidirectional flow layer 31 is arranged obliquely following the purification pipe 20. Therefore, along the direction from the inlet to the outlet of the purification pipe 20, the vertical distance from the fan 33 to the purification pipe 20 gradually increases, and the friction resistance increases. Consequently, the airflow weakens along the direction from the inlet to the outlet of the purification pipe 20. The purging force on particles gradually decreases from the inlet to the outlet of the purification pipe 20, which is beneficial for optimizing screening. Specifically, the closer to the inlet, the higher the particle non-uniformity, requiring a higher screening level, and suitable for high-force purging. Conversely, the closer to the outlet, the better the particle uniformity. To ensure that particles with a critical point size (slightly larger than the diameter of the first one-way valve 311) can pass smoothly, the required purging force is reduced, enhancing throughput.

[0043] In an embodiment of this application, the impurity collection assembly 40 includes: a secondary unidirectional flow layer 41, a fine impurity discharge layer 42, and a coarse impurity storage tank 44. Specifically, the secondary unidirectional flow layer 41 is disposed below the purification pipe 20, and a plurality of second one-way valves 411 are spaced apart therein. The fine impurity discharge layer 42 is disposed below the secondary unidirectional flow layer 41. A plurality of discharge channels 421 are spaced apart therein in the fine impurity discharge layer 42, and a coarse impurity guiding channel 43 is formed between the fine impurity discharge layer 42 and the secondary unidirectional flow layer 41. The coarse impurity guiding channel 43 is inclined along the extension direction of the purification pipe 20. One end of each of the second one-way valves 411 is connected to the coarse impurity guiding channel 43, and the other end is connected to the purification pipe 20 through an air outlet 22. The coarse impurity storage tank 44 is connected to the lower end of the coarse impurity guiding channel 43. In this way, larger impurities fall into the coarse impurity storage tank 44 along the coarse impurity guiding channel 43. Dust and fine particles are propelled by the gas and pass through the fine impurity discharge layer 42 via the discharge channels 421. Similarly, the second check valve 411 is preferably a Tesla valve.

[0044] In a preferred embodiment, the impurity collection assembly 40 further includes a plurality of acceleration tubes 45. The plurality of acceleration tubes 45 are disposed below the fine impurity discharge layer 42 and communicate with the discharge channel 421 to accelerate the air discharged from the discharge channel 421.

[0045] In the embodiments of this application, the acceleration pipe 45 is a Laval nozzle, which accelerates the airflow discharged from the discharge channel 421 before it is discharged outside the housing 10. It is understood that dust or fine particles, after being blown into the fine impurity discharge layer 42, may, due to the decrease in wind force and their light weight, flow back into the coarse impurity guide channel 43, or accumulate in the flow channel and fail to be carried away. Therefore, a Laval nozzle is provided below the fine impurity discharge layer 42, allowing the entering fine impurities to be accelerated and discharged from the housing 10 more quickly by the acceleration effect of the Laval nozzle's own structural characteristics. In some embodiments, the acceleration pipe 45 may also be a flared pipe, or a pipe whose outlet pressure is lower than the inlet pressure by using an external suction fan or other equipment.

[0046] In the embodiments of this application, the air inlet 21 and the air outlet 22 are offset in the vertical direction.

[0047] Understandably, if the air inlet 21 and air outlet 22 are vertically aligned, they create a positive compression on the flowing solid particles, expelling smaller particles from the lower layer. However, if small particles are attached to the top of larger particles, they may pass directly through, significantly reducing screening efficiency. This can also easily cause blockages and may force solid particles slightly larger than the valve opening into the valve, resulting in significant loss of target particles. By staggering the air inlet 21 and air outlet 22 vertically, a turbulent space is created above the inlet of the secondary unidirectional flow layer 41, enhancing the mixing of solid particles between the upper and lower layers, allowing smaller particles to be expelled more evenly.

[0048] The foregoing has shown and described the basic principles, main features, and advantages of the present invention. Those skilled in the art should understand that the above embodiments do not limit the present invention in any way, and all technical solutions obtained by equivalent substitution or equivalent transformation fall within the protection scope of the present invention.

Claims

1. A particle screening device, characterized by, The particle screening device comprises: a housing; a purification pipe obliquely extending through the housing, an inlet end of the purification pipe being higher than an outlet end thereof, an upper portion of the purification pipe being provided with a plurality of air inlet holes and a lower portion of the purification pipe being provided with a plurality of air outlet holes; an air flow supply assembly arranged at the upper portion of the purification pipe, the air flow supply assembly being communicated to the purification pipe through the air inlet holes to blow the particles flowing through the purification pipe; a foreign matter collecting assembly communicated to the purification pipe through the air outlet holes to collect the foreign matter discharged from the air outlet holes. The air flow supply assembly comprises: a first one-way conducting layer arranged above the purification pipe, a wind cavity being formed between the first one-way conducting layer and an upper portion of the housing, a plurality of first one-way valves being arranged in the first one-way conducting layer, one end of each of the first one-way valves being communicated to the wind cavity and the other end thereof being communicated to the purification pipe through the air outlet holes; an air supply part providing air flow to the wind cavity. The air flow supply assembly further comprises: an air flow converging layer arranged between the first one-way conducting layer and the purification pipe, the air flow converging layer being provided with an air flow distribution cavity, one end of each of the first one-way valves being communicated to the wind cavity and the other end thereof being communicated to the air flow distribution cavity, the air flow distribution cavity being communicated to the purification pipe through the air inlet holes.

2. The particle screening device according to claim 1, wherein a plurality of nozzles corresponding to the air inlet holes are further arranged in the air flow converging layer.

3. The particle screening device according to claim 1, wherein an upper surface of the first one-way conducting layer is obliquely arranged along an extending direction of the purification pipe, and the air supply part is arranged at a top portion of the wind cavity.

4. The particle screening device according to claim 2, wherein in a vertical direction, the air supply part covers each of the first one-way valves.

5. The particle screening device according to claim 1, wherein the foreign matter collecting assembly comprises: a second one-way conducting layer arranged below the purification pipe, a plurality of second one-way valves being arranged in the second one-way conducting layer; a fine foreign matter discharging layer arranged below the second one-way conducting layer, a plurality of discharging channels being arranged in the fine foreign matter discharging layer, a coarse foreign matter guiding channel being formed between the fine foreign matter discharging layer and the second one-way conducting layer, the coarse foreign matter guiding channel being obliquely arranged along an extending direction of the purification pipe, one end of each of the second one-way valves being communicated to the coarse foreign matter guiding channel and the other end thereof being communicated to the purification pipe through the air outlet holes; a coarse foreign matter storage tank communicated to a lower end of the coarse foreign matter guiding channel.

6. The particle screening device according to claim 5, wherein the foreign matter collecting assembly further comprises: a plurality of acceleration pipes arranged below the fine foreign matter discharging layer and communicated to the discharging channels to accelerate the air discharged from the discharging channels.

7. The particle screening device according to claim 1, wherein the air inlet holes and the air outlet holes are arranged in a vertical direction in a staggered manner.

8. A heat absorption tower characterized by, The particle screening device as claimed in any one of claims 1-7, wherein the particle screening device is connected to the inlet end of the purification tube of the particle lifter. The particle screening device as claimed in any one of claims 1-7, wherein the particle screening device is connected to the outlet end of the purification tube of the particle lifter.

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