A wavelength calibration and measurement method based on a measuring device

Abstract

The application provides a wavelength calibration and measurement method based on a measuring device, comprising: obtaining full-waveband light intensity information of a sample to be measured, and processing to obtain a measured Fourier coefficient corresponding to each wavelength; fitting and iteratively obtaining a first system parameter corresponding to each wavelength, a sample thickness and an incident angle according to the measured Fourier coefficient and a theoretical Fourier coefficient of each wavelength; fitting and iteratively obtaining a global sample thickness and a global incident angle through a specific function; fixing the global sample thickness and the global incident angle, and fitting and iteratively obtaining a second system parameter corresponding to each wavelength again; and calculating a full-waveband spectral Mueller matrix of the sample to be measured according to the measured Fourier coefficient corresponding to each wavelength and the second system parameter. The application obtains parameters such as the global sample thickness and the global incident angle which do not change with the wavelength through an iterative fitting mode, and then calibrates other parameters, which is more accurate compared with the prior art of determining the global sample thickness and the global incident angle according to experience.

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