Probe self-cleaning system and cleaning method

Abstract

The application discloses a kind of probe self-cleaning system and cleaning method, it is characterized by: including measuring package machine, controller, measuring instrument and probe component, multiple groups of probes are equipped on the probe component, the probe component drives the probe to stretch out and retract;It is also equipped with the cleaning signal generating loop and conversion loop electrically connected with the controller, the probe component is electrically connected with the cleaning signal generating loop or measuring instrument through the conversion loop, the conversion loop is electrically connected with the cleaning signal generating loop or the measuring instrument with the probe component, or the conversion loop is electrically connected with the cleaning signal generating loop with the probe component;When the conversion loop is electrically connected with the cleaning signal generating loop with the probe component, the cleaning signal generating loop gives the probe power through the conversion loop, so that probe and product contact place generates spark and high temperature, realize the self-cleaning of probe.The application improves test precision, reduces false detection, reduces cost.

Description

Technical Field

[0001] This invention relates to the field of CHIP element detection, and more particularly to a probe self-cleaning system and cleaning method. Background Technology

[0002] A test packaging machine is a device that uses machinery to test and package electronic components. It is used to perform final testing on electronic components during the production process to determine whether they are ready for use.

[0003] In product testing, such as testing chip components, a probe is typically used to contact the two electrodes of the chip component to check its capacitance. However, using probes for product testing presents the following problems: 1. Due to the presence of foreign objects in the environment, some foreign objects will be adsorbed onto the surface of the probe, resulting in dirt on the probe tip surface; 2. When the probe contacts the CHIP element, the electrode material of the element sticks together, which will cause dirt on the probe tip surface.

[0004] Dirt on the probe tip surface can lead to changes in test accuracy, a gradual increase in false readings, and affect test efficiency and accuracy. At the same time, the high frequency of probe grinding increases the wear and tear on spare parts, resulting in high costs. In addition, it requires frequent handling by personnel, which also increases the labor intensity of operators. Summary of the Invention

[0005] The purpose of this invention is to provide a probe self-cleaning system and cleaning method. By using this system and method, the probe can be automatically cleaned, which can effectively ensure the stability and quality of detection, reduce the occurrence of detection errors and retests, improve detection efficiency, and reduce consumable costs.

[0006] To achieve the above objectives, the technical solution adopted by the present invention is: a probe self-cleaning system, including a package testing machine, a controller, a measuring instrument, and a probe assembly. The probe assembly is provided with multiple sets of probes. The measuring instrument, the package testing machine, and the probe assembly are electrically connected to the controller. The controller controls the operation of the probe assembly, and the probe assembly drives the probes to extend and retract. It also includes a cleaning signal generation circuit and a conversion circuit that are electrically connected to the controller. The probe assembly is electrically connected to the cleaning signal generation circuit or the measuring instrument via the conversion circuit. The conversion circuit electrically connects the probe assembly to the cleaning signal generation circuit or to the measuring instrument. When the conversion circuit electrically connects the cleaning signal generation circuit to the probe assembly, the cleaning signal generation circuit powers the probe through the conversion circuit.

[0007] In the above technical solution, the probes are in even arrays. When the cleaning signal generation circuit is electrically connected to the probe assembly via the conversion circuit, the cleaning signal generation circuit discharges the probes. The two sets of probes contact the electrodes on one side of the product and form a circuit, generating sparks and high temperatures on the probes. The probe surfaces are cleaned by the sparks and high temperatures.

[0008] The above technical solution also includes a display component and a host computer, which are electrically connected to the controller.

[0009] In the above technical solution, the controller controls the conversion circuit to be electrically connected to the cleaning signal generation circuit or to the measuring instrument, and controls the cleaning signal generation circuit to be powered on or off.

[0010] In the above technical solution, there are four sets of probes, two sets of probes contact the electrode on one side of the product for detection, and the other two sets of probes contact the electrode on the other side of the product for detection.

[0011] The present invention also provides a probe self-cleaning method, the steps of which are as follows: ① The controller sends a control signal to the probe assembly, which drives the probe to extend; ②The probe assembly simultaneously drives four sets of probes to extend, with two sets of probes contacting one side electrode of the product and the other two sets of probes contacting the other side electrode of the product; ③ The controller first determines whether the probe needs to be cleaned. In the initial state, the switching circuit will electrically connect the measuring instrument and the probe assembly. ④ In step ③, if cleaning is not required, the measurement is triggered directly, the probe performs measurement work on the product, and the measuring instrument feeds back the measurement data to the controller; ⑤ In step ③, if cleaning is required, the switching circuit switches the channel and electrically connects the cleaning signal generation circuit and the probe assembly. ⑥ In step ⑤, after the cleaning signal generation circuit and the probe assembly are electrically connected, the cleaning signal generation circuit charges the probe with a charging voltage of V1, a charging current of A1, and a charging time of S1. A circuit is formed between the two sets of probes and the electrode on one side of the product, which will generate sparks and high temperatures on the probe to clean the probe surface and tip. During the cleaning process, the probe assembly will drive the probe to retract and detach from the product. In step ⑥, after the probe cleaning is completed, the controller controls the conversion circuit to electrically connect the measuring instrument and the probe assembly, and then returns to step ④ to use the probe to measure the product.

[0012] In the above technical solution, when the probe is cleaning the product, or when the probe is cleaning, the controller will feed back the current working status to the host computer and the display component. The host computer can perform statistical analysis on it, the display component can directly display the working status, and the probe cleaning cycle or time can be adjusted through the display component.

[0013] In the above technical solution, in step ⑥, the charging time is 0.1 milliseconds to 50 milliseconds, the charging voltage is 5V to 220V, and the charging current is 0.1mA to 50mA.

[0014] In the above technical solution, after the probe extends into position, the controller sends a channel switching signal after a delay of T1. The switching circuit switches the electrical connection between the probe assembly and the measuring instrument to the electrical connection between the probe assembly and the cleaning signal generation circuit. After sending the channel switching signal, the controller sends a charging signal after a delay of T2. The cleaning signal generation circuit then charges the probe for a duration of S1. After time S2, where S2 is less than S1, the probe assembly controls the probe to retract and detach from the product's electrode. Once the probe has retracted to its position, the controller delays for time T3 and sends a signal to shut off probe charging. Then, the cleaning signal generation circuit stops charging. After issuing the signal to turn off probe charging, after a delay of T4, a signal to switch measurement channels is issued, and the switching circuit switches the electrical connection between the probe assembly and the cleaning signal generation circuit to the electrical connection between the probe assembly and the measuring instrument. After sending the signal to switch measurement channels, there is a delay of T5. The controller sends a signal to the measuring instrument, and at the same time, the probe assembly controls the probe to extend. The measuring instrument can then detect the extension of the probe and perform the measurement.

[0015] Due to the application of the above technical solution, the present invention has the following advantages compared with the prior art: 1. In this invention, by setting up a conversion circuit and a cleaning signal generation circuit, the probe assembly and the measuring instrument or the cleaning signal generation circuit are electrically connected. When the probe assembly and the measuring instrument are connected, the measuring operation can be realized. When the probe assembly and the cleaning signal generation circuit are connected, the probe can be charged through the cleaning signal generation circuit, and the probe tip is exposed to sparks and high temperatures to burn off or melt the dirt on the probe tip and surface. This ensures the accuracy of the measurement, reduces the occurrence of detection errors and retests, improves the detection efficiency, reduces the frequency of probe replacement, reduces consumable costs, and reduces the overall cost. At the same time, reducing the frequency of replacement can reduce the labor intensity of the operators. Attached Figure Description

[0016] Figure 1 This is a schematic diagram of the structure in Embodiment 1 of the present invention; Figure 2This is a flowchart of the measurement and probe self-cleaning process in Embodiment 1 of the present invention.

[0017] The components include: 1. Packaging tester; 2. Controller; 3. Measuring instrument; 4. Probe assembly; 5. Probe; 6. Cleaning signal generation circuit; 7. Conversion circuit; 8. CHIP element; 9. Electrode; 10. Display assembly; 11. Host computer. Detailed Implementation

[0018] The present invention will be further described below with reference to the accompanying drawings and embodiments: Example 1: See Figure 1 , 2 As shown, a probe self-cleaning system includes a package testing machine 1, a controller 2, a measuring instrument 3, and a probe assembly 4. The probe assembly is equipped with multiple sets of probes 5. The measuring instrument, the package testing machine, and the probe assembly are electrically connected to the controller. The controller controls the operation of the probe assembly, and the probe assembly drives the probes to extend and retract. It also includes a cleaning signal generating circuit 6 and a conversion circuit 7 that are electrically connected to the controller. The probe assembly is electrically connected to the cleaning signal generating circuit or the measuring instrument via the conversion circuit. The conversion circuit electrically connects the probe assembly to the cleaning signal generating circuit or to the measuring instrument. When the conversion circuit electrically connects the cleaning signal generation circuit to the probe assembly, the cleaning signal generation circuit powers the probe through the conversion circuit.

[0019] In this embodiment, each set of probes is fitted with a spring, which pushes the probe to extend. The probe assembly has multiple sets of electromagnets, each set positioned opposite a set of probes. By energizing the electromagnets, the probes are attracted, causing them to retract. When the electromagnets are de-energized, the springs push the probes to extend, thus achieving the extension and retraction of the probes. The probe assembly has a first proximity switch and a second proximity switch. When the first proximity switch detects a probe, it indicates that the electromagnets are working, causing the probes to retract to their positions. When the second proximity switch detects a probe, it indicates that the springs are pushing the probes to extend, and the probes are fully extended.

[0020] When the testing machine provides a detection signal, it sends the signal to the controller. The controller controls the operation of the measuring instrument, probe assembly, conversion circuit, and cleaning signal generation circuit, and collects and feeds back data from each mechanism. In practical use, it is mainly used for the detection of CHIP element 8; in this embodiment, it is used for capacitance detection.

[0021] The probes are arranged in an even array, specifically four groups. Two groups of probes contact and detect the electrode on one side of the product, while the other two groups contact and detect the electrode 9 on the other side of the product. When the cleaning signal generation circuit is electrically connected to the probe assembly via the conversion circuit, the cleaning signal generation circuit discharges the probes. The two groups of probes contact the electrode on one side of the product and form a circuit, generating sparks and high temperatures on the probes. The sparks and high temperatures clean the probe surface.

[0022] In this embodiment, under normal conditions, the conversion circuit connects the measuring instrument and the probe assembly electrically. When the controller controls the probe assembly to operate, the probes extend and contact the electrodes of the capacitor, thereby detecting the capacitance and feeding the data back to the measuring instrument. The measuring instrument then feeds the data back to the controller, completing the product measurement. After measurement, the probes retract and detach from the capacitor, and the tested product is removed until a new product is measured. The conversion circuit can be configured with a conversion time or a set measurement quantity before switching to self-cleaning of the probes. For example, self-cleaning can be performed after 10 or 15 minutes, or after measuring 100 or 200 products, or either option can be chosen: if the required time is reached before the required measurement quantity is reached, self-cleaning can proceed after the required time is reached. If the required measurement quantity is reached before the required time is reached, self-cleaning can proceed after the required measurement quantity is reached. The settings can be adjusted according to the actual situation. When the set value is reached and self-cleaning of the probe is required, the switching circuit activates, disconnecting the electrical control connection between the probe assembly and the measuring instrument, and electrically connecting the probe assembly to the cleaning signal generation circuit. Once the probe and capacitor electrodes contact, a circuit is formed between the two sets of probes and capacitor electrodes. The controller then controls the cleaning signal generation circuit to charge the probe. After this circuit is energized, sparks and high temperatures are generated at the probe tip, which self-clean the probe surface and tip, burning away dirt and other contaminants. After self-cleaning is complete, the cleaning signal generation circuit disconnects the charging of the probe, and the switching circuit disconnects the electrical control connection between the cleaning signal generation circuit and the probe assembly, electrically connecting the probe assembly to the measuring instrument. Subsequent measurements of the product can then be performed using the probe and measuring instrument.

[0023] See Figure 1 As shown, a display component 10 and a host computer 11 are also provided, and the display component and the host computer are electrically connected to the controller. In this embodiment, the host computer is a computer or server, which enables the host computer to perform big data statistics and analysis on the device. The display component can directly display the probe's detection information and self-cleaning information. At the same time, the self-cleaning cycle of the probe can also be adjusted and switched through the display component.

[0024] The controller controls the electrical connection between the conversion circuit and the cleaning signal generation circuit or the measuring instrument, and controls the power supply or power cut-off of the cleaning signal generation circuit.

[0025] This invention also provides a probe self-cleaning method, the steps of which are as follows: ① The controller sends a control signal to the probe assembly, which drives the probe to extend; ②The probe assembly simultaneously drives four sets of probes to extend, with two sets of probes contacting one side electrode of the product and the other two sets of probes contacting the other side electrode of the product; ③ The controller first determines whether the probe needs to be cleaned. In the initial state, the switching circuit will electrically connect the measuring instrument and the probe assembly. ④ In step ③, if cleaning is not required, the measurement is triggered directly, the probe performs measurement work on the product, and the measuring instrument feeds back the measurement data to the controller; ⑤ In step ③, if cleaning is required, the switching circuit switches the channel and electrically connects the cleaning signal generation circuit and the probe assembly. ⑥ In step ⑤, after the cleaning signal generation circuit and the probe assembly are electrically connected, the cleaning signal generation circuit charges the probe with a charging voltage of V1, a charging current of A1, and a charging time of S1. A circuit is formed between the two sets of probes and the electrode on one side of the product, which will generate sparks and high temperatures on the probe to clean the probe surface and tip. During the cleaning process, the probe assembly will drive the probe to retract and detach from the product. In step ⑥, after the probe cleaning is completed, the controller controls the conversion circuit to electrically connect the measuring instrument and the probe assembly, and then returns to step ④ to use the probe to measure the product.

[0026] When the probe cleans the product, or when the probe is cleaning, the controller will feed back the current working status to the host computer and the display component. The host computer can perform statistical analysis on it, and the display component can directly display the working status. The probe cleaning cycle or time can also be adjusted through the display component.

[0027] In step ⑥, the charging time is 0.1 milliseconds to 50 milliseconds, the charging voltage is 5V to 220V, and the charging current is 0.1mA to 50mA.

[0028] After the probe extends into position, the controller sends a channel switching signal after a delay of T1. The switching circuit switches the electrical connection between the probe assembly and the measuring instrument to the electrical connection between the probe assembly and the cleaning signal generation circuit. After sending the channel switching signal, the controller sends a charging signal after a delay of T2. The cleaning signal generation circuit then charges the probe for a duration of S1. After time S2, where S2 is less than S1, the probe assembly controls the probe to retract and detach from the product's electrode. Once the probe has retracted to its position, the controller delays for time T3 and sends a signal to shut off probe charging. Then, the cleaning signal generation circuit stops charging. After issuing the signal to turn off probe charging, after a delay of T4, a signal to switch measurement channels is issued, and the switching circuit switches the electrical connection between the probe assembly and the cleaning signal generation circuit to the electrical connection between the probe assembly and the measuring instrument. After sending the signal to switch measurement channels, there is a delay of T5. The controller sends a signal to the measuring instrument, and at the same time, the probe assembly controls the probe to extend. The measuring instrument can then detect the extension of the probe and perform the measurement.

[0029] In this invention, after a circuit is formed between the probe and the electrode of the product, and after the cleaning signal generation circuit charges the probe, the circuit formed between the two sets of probes and electrodes will cause sparks and high temperatures to be generated on the probe. Since the discharge time is very short, the probe has already heated up. Therefore, before the cleaning signal generation circuit is de-energized, the probe will retract and detach from the product. At this time, the circuit is broken, but the probe surface still has temperature. Therefore, it is given time to dissipate heat.

[0030] In this invention, the time T1-T5 can be adjusted by the display component, as can the magnitude of the charging voltage V1, the magnitude of the charging current A1, and the duration of the charging time S1.

[0031] In this embodiment, by setting up a switching circuit and a cleaning signal generation circuit, when the probe needs to be self-cleaned, the switching circuit switches the connection channel of the probe assembly, electrically connecting the probe assembly and the cleaning signal generation circuit. The cleaning signal generation circuit can give the probe an instantaneous discharge, generating sparks and high temperatures through the circuit between the probe and the product electrode, burning off the dirt on the probe surface and achieving self-cleaning. This can ensure the probe's testing accuracy for the product, reduce false tests, improve testing stability, reduce probe damage, lower costs, and reduce the labor intensity of operators when replacing probes.

[0032] In the description of this invention, it should be understood that the terms "upper," "lower," "top," "bottom," "inner," and "outer," etc., indicate the orientation or positional relationship based on the orientation or positional relationship shown in the accompanying drawings, and are only for the convenience of describing the invention and simplifying the description, and do not indicate or imply that the device or element referred to must have a specific orientation, or be constructed and operated in a specific orientation, and therefore should not be construed as a limitation of the invention. In the description of this invention, "a plurality of" means two or more, unless otherwise explicitly specified.

[0033] In this invention, unless otherwise explicitly specified and limited, the terms "installation," "connection," "linking," and "fixing," etc., should be interpreted broadly. For example, they can refer to a fixed connection, a detachable connection, or an integral part; they can refer to a mechanical connection or an electrical connection; they can refer to a direct connection or an indirect connection through an intermediate medium. For instance, the two components can be mechanically connected by contact or abutting; they can also be directly hooked or connected by an intermediate medium; or they can refer to the internal communication of two components or the interaction between two components. Those skilled in the art can understand the specific meaning of the above terms in this invention according to the specific circumstances.

Claims

1. A probe self-cleaning system, characterized in that: The device includes a package testing machine, a controller, a measuring instrument, and a probe assembly. The probe assembly is equipped with multiple sets of probes. The measuring instrument, the package testing machine, and the probe assembly are electrically connected to the controller. The controller controls the operation of the probe assembly, and the probe assembly drives the probes to extend and retract. It also includes a cleaning signal generation circuit and a conversion circuit that are electrically connected to the controller. The probe assembly is electrically connected to the cleaning signal generation circuit or the measuring instrument via the conversion circuit. The conversion circuit electrically connects the probe assembly to the cleaning signal generation circuit or to the measuring instrument. When the conversion circuit electrically connects the cleaning signal generation circuit to the probe assembly, the cleaning signal generation circuit powers the probe through the conversion circuit. The probes are in four groups. Two groups of probes contact the electrodes on one side of the product for detection, and the other two groups of probes contact the electrodes on the other side of the product for detection. When the cleaning signal generation circuit is electrically connected to the probe assembly via the conversion circuit, the cleaning signal generation circuit discharges the probes. The two groups of probes contact the electrodes on one side of the product and form a circuit, generating sparks and high temperatures on the probes. The sparks and high temperatures clean the probe surface. It also includes a display component and a host computer, which are electrically connected to the controller.

2. The probe self-cleaning system according to claim 1, characterized in that: The controller controls the electrical connection between the conversion circuit and the cleaning signal generation circuit or the measuring instrument, and controls the power supply or power cut-off of the cleaning signal generation circuit.

3. A probe self-cleaning method, using the probe self-cleaning system as described in any one of claims 1-2, comprising the following steps: ① The controller sends a control signal to the probe assembly, which drives the probe to extend; ②The probe assembly simultaneously drives four sets of probes to extend, with two sets of probes contacting one side electrode of the product and the other two sets of probes contacting the other side electrode of the product; ③ The controller first determines whether the probe needs to be cleaned, among which, In the initial state, the conversion circuit will electrically connect the measuring instrument to the probe assembly; ④ In step ③, if cleaning is not required, the measurement is triggered directly, the probe performs measurement work on the product, and the measuring instrument feeds back the measurement data to the controller; ⑤ In step ③, if cleaning is required, the switching circuit switches the channel and electrically connects the cleaning signal generation circuit and the probe assembly. ⑥ In step ⑤, after the cleaning signal generation circuit and the probe assembly are electrically connected, the cleaning signal generation circuit charges the probe with a charging voltage of V1, a charging current of A1, and a charging time of S1. A circuit is formed between the two sets of probes and the electrode on one side of the product, which will generate sparks and high temperatures on the probe to clean the probe surface and tip. During the cleaning process, the probe assembly will drive the probe to retract and detach from the product. In step ⑥, after the probe cleaning is completed, the controller controls the conversion circuit to electrically connect the measuring instrument and the probe assembly, and then returns to step ④ to use the probe to measure the product.

4. The probe self-cleaning method according to claim 3, characterized in that: When the probe cleans the product, or when the probe is cleaning, the controller will feed back the current working status to the host computer and the display component. The host computer can perform statistical analysis on it, and the display component can directly display the working status and adjust the probe cleaning cycle or time through the display component.

5. The probe self-cleaning method according to claim 3, characterized in that: In step ⑥, the charging time is 0.1 milliseconds to 50 milliseconds, the charging voltage is 5V to 220V, and the charging current is 0.1mA to 50mA.

6. The probe self-cleaning method according to claim 3, characterized in that: After the probe extends into position, the controller sends a channel switching signal after a delay of T1. The switching circuit switches the electrical connection between the probe assembly and the measuring instrument to the electrical connection between the probe assembly and the cleaning signal generation circuit. After sending the channel switching signal, the controller sends a charging signal after a delay of T2. The cleaning signal generation circuit then charges the probe for a duration of S1. After time S2, where S2 is less than S1, the probe assembly controls the probe to retract and detach from the product's electrode. Once the probe has retracted to its position, the controller delays for time T3 and sends a signal to shut off probe charging. Then, the cleaning signal generation circuit stops charging. After issuing the signal to turn off probe charging, after a delay of T4, a signal to switch measurement channels is issued, and the switching circuit switches the electrical connection between the probe assembly and the cleaning signal generation circuit to the electrical connection between the probe assembly and the measuring instrument. After sending the signal to switch measurement channels, there is a delay of T5. The controller sends a signal to the measuring instrument, and at the same time, the probe assembly controls the probe to extend. The measuring instrument can then detect the extension of the probe and perform the measurement.

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