Laser film detection method and system

Abstract

The present invention discloses a method and system for detecting laser films, which define multiple defect segments for defect detection of the tiled image, so as to facilitate stretching of the multiple defect segments to define intersections, and thus define static defect areas according to the multiple defect segments and the intersections, so as to facilitate determination of the static defect areas. At the same time, dynamic detection of the laser film is triggered based on the area of ​​the static defect area, so as to facilitate further triggering of dynamic detection, thereby making the static detection and dynamic detection of the laser film compatible. Therefore, the laser film is dynamically detected based on the next level of the tension level, and multiple dynamic detection images of the laser film are collected; dynamic defect areas are defined based on comparison of the multiple dynamic detection images, and defects of the laser film are determined based on the dynamic defect areas and the static defect areas, thereby ensuring static detection and dynamic detection of the laser film, fully considering the static and dynamic effects of the laser film, and ensuring the accuracy and comprehensiveness of the defects of the laser film.

Description

Technical Field

[0001] The present invention relates to the technical field of underground parking lot lighting, and in particular to a laser film detection method and system. Background Art

[0002] With the rapid economic development, laser film is gradually applied to products and used as a part of packaging. Laser film is being mass-produced. Laser film is gradually completing automated production and cutting in the industrial field. In the prior art, laser film needs to be inspected after production. In the past, defect detection was performed on the surface of the laser film. The laser film was gradually inspected in a static state without considering the dynamic impact, resulting in a low accuracy rate of defects in the existing laser film. Summary of the invention

[0003] The purpose of the present invention is to overcome the shortcomings of the prior art. The present invention provides a method and system for detecting laser films, which obtain a tiled image of the laser film in a static state, and define multiple defect segments for defect detection of the tiled image, so as to stretch the multiple defect segments to define intersections, thereby defining static defect areas according to the multiple defect segments and the intersections, so as to determine the static defect areas. At the same time, dynamic detection of the laser film is triggered based on the area of ​​the static defect area, so as to further trigger dynamic detection, thereby making the static detection and dynamic detection of the laser film compatible. Therefore, the laser film is dynamically detected based on the next level of the tension level, and multiple dynamic detection images of the laser film are collected; the dynamic defect area is defined according to the comparison of the multiple dynamic detection images, and the defects of the laser film are determined according to the dynamic defect area and the static defect area, thereby ensuring the static detection and dynamic detection of the laser film, fully considering the static and dynamic effects of the laser film, and ensuring the accuracy and comprehensiveness of the defects of the laser film.

[0004] In order to solve the above technical problems, an embodiment of the present invention provides a method for detecting laser films, which is applied to the detection scenario of laser films;

[0005] The laser film detection method comprises:

[0006] Acquire a tiled image of the laser film in a static state, and at the same time, the laser film is clamped by the detection platform;

[0007] Defect detection based on tiled images defines multiple defect sections, and marks the multiple defect sections;

[0008] defining an intersection based on the stretching of the plurality of defect segments, and defining a static defect area based on the plurality of defect segments and the intersection;

[0009] Collect the area parameters, thickness parameters and material parameters of the laser film, and trigger the dynamic detection of the laser film based on the area of ​​the static defect area;

[0010] In the dynamic detection of laser film, the tension level is determined based on the area parameters, thickness parameters and material parameters of the laser film;

[0011] Performing dynamic detection on the laser film based on the next level of the tension level, and collecting multiple dynamic detection images of the laser film;

[0012] A dynamic defect area is defined based on the comparison of multiple dynamic detection images, and defects of the laser film are determined based on the dynamic defect area and the static defect area.

[0013] Optionally, the step of acquiring a tiled image of the laser film in a static state, while the laser film is clamped by a detection platform, includes:

[0014] Transferring the laser film to the inspection platform and acquiring the laser film image;

[0015] Perform image acquisition based on the laser film image, and determine the bending position in the laser film image;

[0016] Triggering local adsorption of the detection platform based on the position coordinates of the bend;

[0017] The bending angle of the bend is collected, and different adsorption forces of the detection platform are triggered based on the change rate of the bending angle, until the bending angle of the bend reaches the preset bending angle, and the bend is flattened;

[0018] After being laid flat at the bend, the position offset of the laser film within a preset time is collected;

[0019] If the position offset is less than the preset offset, the laser film is in a stationary state, and a tiled image of the laser film in a stationary state is obtained. At the same time, the laser film is clamped by the detection platform, and the adsorption of the detection platform on the laser film is cancelled.

[0020] Optionally, the defect detection based on tiled images defines a plurality of defect sections, and marks the plurality of defect sections, including:

[0021] Collect tiled images;

[0022] Performing stripe processing based on the tiled image and determining a first stripe portion and a second stripe portion;

[0023] Performing a synchronous test on the first stripe portion and the second stripe portion, and detecting the stripe lines in the first stripe portion and the stripe lines in the second stripe portion;

[0024] In the grain lines in the first stripe portion, sequentially traverse along the direction of the grain lines and collect the first line breakage points; define the first defective section according to the first line breakage points;

[0025] In the grain lines in the second stripe portion, traverse in sequence along the direction of the grain lines and collect the second line breakage points; define the second defect section according to the second line breakage points;

[0026] Calculate the distance between the first defective section and the second defective section, and define the section distance between the first defective section and the second defective section;

[0027] If the distance between the first defective section and the second defective section is less than the preset distance, a transition portion between the first stripe portion and the second stripe portion is defined, and a transitional defective section is defined based on the transitional portion. At this time, the transitional defective section is within the area enclosed by the first defective section and the second defective section.

[0028] Optionally, the step of defining an intersection based on the stretching of multiple defective sections, and defining a static defective area based on the multiple defective sections and the intersection, includes:

[0029] Freeze multiple defective paragraphs;

[0030] Extend each defective section along the direction of the defective section and form a plurality of stretching virtual lines;

[0031] determining a plurality of intersections based on a plurality of stretched virtual lines;

[0032] Determine the positions of multiple intersections and freeze the intersections in the transition section;

[0033] Static defect areas are defined based on the intersection of multiple defect segments and transition sections.

[0034] Optionally, the method of defining an intersection based on the stretching of multiple defective sections, and defining a static defect area based on the multiple defective sections and the intersection, further includes:

[0035] If there are multiple static defect areas, the distances between the multiple static defect areas are measured;

[0036] Define a distance level according to the distance, and mark the distance level to the corresponding two static defect areas;

[0037] The merging strategy is triggered according to the distance level, and the corresponding two static defect areas are merged along the merging direction indicated in the merging strategy. Therefore, regional integration is performed based on multiple static defect areas to form an overall defect area with a continuous state.

[0038] Optionally, the collecting of area parameters, thickness parameters and material parameters of the laser film and triggering dynamic detection of the laser film based on the area of ​​the static defect region includes:

[0039] Acquire a tiled image and a peripheral image of the laser film;

[0040] The area parameter of the laser film is defined according to the tiled image of the laser film, and the thickness parameter of the laser film is defined according to the peripheral image of the laser film;

[0041] Define material parameters according to the model of the laser film, associate area parameters, thickness parameters and material parameters, and define associated parameters based on the area parameters, thickness parameters and material parameters;

[0042] Collect the area of ​​static defect area;

[0043] If the area of ​​the static defect region is larger than the preset area, the dynamic detection of the laser film is triggered, and the detection scene of the dynamic detection is defined according to the associated parameters.

[0044] Optionally, in the dynamic detection of the laser film, determining the tension level based on the area parameter, thickness parameter and material parameter of the laser film includes:

[0045] In the dynamic detection of laser film, the area parameters, thickness parameters and material parameters of the laser film are fixed;

[0046] Determine the tension parameter according to the area parameter, thickness parameter and material parameter;

[0047] Collect the state of the laser film;

[0048] Determine the tension level according to the state of the laser film and the tension parameters;

[0049] Collect the outline of the laser film;

[0050] The pulling direction is determined according to the outer contour of the laser film, and the pulling direction is associated with the pulling level.

[0051] Optionally, the next level based on the tension level is dynamically tested on the laser film, and a plurality of dynamic test images of the laser film are collected, including:

[0052] Set the gravity level;

[0053] Based on the tensile strength level and the material parameters of the laser film, the tensile strength grade table is traced back;

[0054] The next level of the tension level is determined according to the tension level table and the positioning of the tension level. At this time, the magnitude of the tension level is sorted in an upward direction;

[0055] Triggering dynamic detection of the laser film according to the next level of tension level;

[0056] In the dynamic detection of the laser film, the laser film is stretched in the horizontal direction and multiple dynamic detection images are output according to the preset time.

[0057] Optionally, the step of defining a dynamic defect region based on comparison of a plurality of dynamic detection images, and determining defects of the laser film based on the dynamic defect region and the static defect region, includes:

[0058] Obtain multiple dynamic detection images;

[0059] Sort multiple dynamic detection images in chronological order;

[0060] Compare multiple dynamic detection images in sequence along the time sequence, and mark the change features during the comparison process;

[0061] Define the change area based on the change characteristics and the direction of the pulling force;

[0062] defining dynamic defect regions based on region identification of changing regions;

[0063] Correlating the dynamic defect area with the static defect area;

[0064] Defining a repeating region based on a comparison between the dynamic defect region and the static defect region, and determining the repeating region as a first defect region of the laser film;

[0065] defining a non-repeating region based on a comparison between the dynamic defect region and the static defect region, and further region-identifying the non-repeating region to determine a second defect region;

[0066] The defects of the laser film are determined according to the second defect area and the first defect area.

[0067] In addition, an embodiment of the present invention further provides a laser film detection system, the laser film detection system comprising:

[0068] An image module is used to obtain a tiled image of the laser film in a static state, and at the same time, the laser film is clamped by the detection platform;

[0069] A static detection module, used for defining a plurality of defective sections based on defect detection of a tiled image, and marking the plurality of defective sections;

[0070] A static defect region module, for defining an intersection based on the stretching of multiple defect segments, and defining a static defect region based on the multiple defect segments and the intersection;

[0071] A dynamic detection module is used to collect area parameters, thickness parameters and material parameters of the laser film, and trigger dynamic detection of the laser film based on the area of ​​the static defect area;

[0072] The tension module is used to determine the tension level based on the area parameter, thickness parameter and material parameter of the laser film during the dynamic detection of the laser film;

[0073] A dynamic detection image module is used to perform dynamic detection on the laser film based on the next level of the tension level, and collect multiple dynamic detection images of the laser film;

[0074] The defect module is used to define a dynamic defect area according to the comparison of multiple dynamic detection images, and determine the defects of the laser film according to the dynamic defect area and the static defect area.

[0075] In an embodiment of the present invention, a tiled image of a laser film in a static state is obtained through the method in the embodiment of the present invention, and a plurality of defect segments are defined for defect detection of the tiled image, so as to facilitate stretching of the plurality of defect segments to define intersections, thereby defining a static defect area according to the plurality of defect segments and the intersections, so as to facilitate determination of the static defect area, and at the same time, dynamic detection of the laser film is triggered based on the area of ​​the static defect area, so as to facilitate further triggering of dynamic detection, thereby making the static detection and dynamic detection of the laser film compatible, and therefore, the laser film is dynamically detected based on the next level of the tension level, and a plurality of dynamic detection images of the laser film are collected; a dynamic defect area is defined based on comparison of the plurality of dynamic detection images, and the defects of the laser film are determined based on the dynamic defect area and the static defect area, thereby ensuring static detection and dynamic detection of the laser film, fully considering the static and dynamic effects of the laser film, and ensuring the accuracy and comprehensiveness of the defects of the laser film. BRIEF DESCRIPTION OF THE DRAWINGS

[0076] In order to more clearly illustrate the embodiments of the present invention or the technical solutions in the prior art, the drawings required for use in the embodiments or the description of the prior art will be briefly introduced below. Obviously, the drawings described below are only some embodiments of the present invention. For ordinary technicians in this field, other drawings can be obtained based on these drawings without paying creative work.

[0077] Figure 1 is a schematic flow chart of a method for detecting a laser film in an embodiment of the present invention;

[0078] Figure 2 is a schematic flow chart of S11 in the laser film detection method in the embodiment of the present invention;

[0079] Figure 3 is a schematic flow chart of S12 in the laser film detection method in an embodiment of the present invention;

[0080] Figure 4 is a schematic flow chart of S13 in the laser film detection method in an embodiment of the present invention;

[0081] Figure 5 is a schematic flow chart of S14 in the laser film detection method in an embodiment of the present invention;

[0082] Figure 6 is a schematic flow chart of S15 in the laser film detection method in an embodiment of the present invention;

[0083] Figure 7 is a schematic flow chart of S16 in the laser film detection method in an embodiment of the present invention;

[0084] Figure 8 Schematic diagram of the structure of the laser film detection system in the embodiment of the present invention;

[0085] Fig. 9 The figure is a hardware diagram of an electronic device according to an exemplary embodiment. DETAILED DESCRIPTION

[0086] The following will be combined with the drawings in the embodiments of the present invention to clearly and completely describe the technical solutions in the embodiments of the present invention. Obviously, the described embodiments are only part of the embodiments of the present invention, not all of the embodiments. Based on the embodiments of the present invention, all other embodiments obtained by ordinary technicians in this field without creative work are within the scope of protection of the present invention.

[0087] Example

[0088] See also Figures 1 to 9 , a laser film detection method is applied to the laser film detection scene; the laser film detection method includes:

[0089] Step S11: acquiring a tiled image of the laser film in a static state, while the laser film is clamped by the detection platform;

[0090] Step S12: defining a plurality of defective sections based on defect detection of the tiled image, and marking the plurality of defective sections;

[0091] Step S13: defining an intersection based on the stretching of the plurality of defective sections, and defining a static defect area according to the plurality of defective sections and the intersection;

[0092] Step S14: collecting area parameters, thickness parameters and material parameters of the laser film, and triggering dynamic detection of the laser film based on the area of ​​the static defect area;

[0093] Step S15: in the dynamic detection of the laser film, the tension level is determined based on the area parameter, thickness parameter and material parameter of the laser film;

[0094] Step S16: performing dynamic detection on the laser film based on the next level of the tension level, and collecting a plurality of dynamic detection images of the laser film;

[0095] Step S17: defining a dynamic defect region based on comparison of a plurality of dynamic detection images, and determining defects of the laser film based on the dynamic defect region and the static defect region.

[0096] In an embodiment of the present invention, a tiled image of a laser film in a static state is obtained through the method in the embodiment of the present invention, and a plurality of defect segments are defined for defect detection of the tiled image, so as to facilitate stretching of the plurality of defect segments to define intersections, thereby defining a static defect area according to the plurality of defect segments and the intersections, so as to facilitate determination of the static defect area, and at the same time, dynamic detection of the laser film is triggered based on the area of ​​the static defect area, so as to facilitate further triggering of dynamic detection, thereby making the static detection and dynamic detection of the laser film compatible, and therefore, the laser film is dynamically detected based on the next level of the tension level, and a plurality of dynamic detection images of the laser film are collected; a dynamic defect area is defined based on comparison of the plurality of dynamic detection images, and the defects of the laser film are determined based on the dynamic defect area and the static defect area, thereby ensuring static detection and dynamic detection of the laser film, fully considering the static and dynamic effects of the laser film, and ensuring the accuracy and comprehensiveness of the defects of the laser film.

[0097] See also Figure 2 In step S11, a tiled image of the laser film in a static state is obtained, and at the same time, the laser film is clamped by the detection platform;

[0098] In the specific implementation process of the present invention, the specific steps may be:

[0099] S111: transferring the laser film to a detection platform and acquiring an image of the laser film;

[0100] S112: performing image acquisition based on the laser film image, and determining a bending position in the laser film image;

[0101] S113: triggering local adsorption of the detection platform based on the position coordinates of the bend;

[0102] S114: collecting the bending angle of the bending part, and triggering different adsorption forces of the detection platform based on the change rate of the bending angle, until the bending angle of the bending part reaches a preset bending angle, and the tiling process of the bending part is completed;

[0103] S115: After the bending part is flattened, the position offset of the laser film within a preset time is collected;

[0104] S116: If the position offset is less than the preset offset, the laser film is in a stationary state, and a tiled image of the laser film in a stationary state is obtained. Meanwhile, the laser film is clamped by the detection platform, and the adsorption of the detection platform on the laser film is cancelled.

[0105] In an embodiment of the present application, the laser film is inspected after production is completed. At this time, the laser film is transferred to the inspection platform, and the inspection platform is fully utilized to inspect the laser film. At this time, the camera based on the inspection platform photographs the laser film and obtains the laser film image for further processing based on the laser film image.

[0106] At this time, image acquisition is performed based on the laser film image to highlight the traces of the laser film image, thereby determining the bending point in the laser film image and positioning the bending point of the laser film image, thereby determining the position of the bending point, so as to trigger the local adsorption of the detection platform based on the position coordinates of the bending point, thereby realizing the local adsorption treatment of the laser film, and then performing flattening treatment on the bending point of the laser film.

[0107] Furthermore, the bending angle of the bend is collected to introduce the bending angle of the bend, and the bending degree of the bend is evaluated through the bending angle of the bend. At this time, different adsorption forces of the detection platform are triggered based on the change rate of the bending angle, so that the adsorption force adapts to the bending degree of the bend, thereby ensuring the tiling of the bend in local adsorption. Therefore, until the bending angle of the bend reaches the preset bending angle, the tiling processing of the bend is completed, and the tiling effect of the laser film image is achieved.

[0108] At this time, after being flattened at the bend, the position offset of the laser film within the preset time is collected to facilitate state observation of the laser film, and the position offset is compared with the preset offset. At this time, if the position offset is less than the preset offset, the laser film is in a static state, and a flattened image of the laser film in a static state is obtained, ensuring that the laser film meets the static state and flattening effects. At the same time, the laser film is clamped by the detection platform, and the adsorption of the detection platform on the laser film is cancelled, thereby realizing the adjustment of the laser film for subsequent dynamic testing.

[0109] See also Figure 3 , in step S12, a plurality of defective sections are defined based on defect detection of the tiled image, and the plurality of defective sections are marked;

[0110] In the specific implementation process of the present invention, the specific steps may be:

[0111] S121: Collect tiled images;

[0112] S122: performing stripe processing based on the tiled image, and determining a first stripe portion and a second stripe portion;

[0113] S123: performing a synchronous test on the first stripe portion and the second stripe portion, and detecting the grain lines in the first stripe portion and the grain lines in the second stripe portion;

[0114] S124: traverse the grain lines in the first stripe portion in sequence along the direction of the grain lines and collect first line break points; define a first defective section according to the first line break points;

[0115] S125: traversing the grain lines in the second stripe portion in sequence along the direction of the grain lines and collecting the second line break points; defining the second defective section according to the second line break points;

[0116] S126: Calculate the distance between the first defective section and the second defective section, and define the section distance between the first defective section and the second defective section;

[0117] S127: If the distance between the first defective section and the second defective section is less than the preset distance, a transition portion between the first stripe portion and the second stripe portion is defined, and a transitional defective section is defined based on the transitional portion. At this time, the transitional defective section is within the area enclosed by the first defective section and the second defective section.

[0118] In an embodiment of the present application, a tiled image is collected and further controlled. At this time, stripe processing is performed based on the tiled image, the tiled image is converted into a grayscale image, and further stripe processing is performed in the grayscale image to highlight the stripes of the tiled image. The first stripe portion and the second stripe portion are determined by identifying the stripes, the accuracy of the first stripe portion and the second stripe portion is ensured, and the stripes are controlled for the tiled image.

[0119] At this time, the first stripe part and the second stripe part are tested synchronously, and the grain lines in the first stripe part and the grain lines in the second stripe part are detected, so as to use the grain lines in the first stripe part and the grain lines in the second stripe part. Therefore, in the grain lines in the first stripe part, the direction of the grain lines is traversed in sequence, and the first line break is collected; the first defective section is defined according to the first line break. In the grain lines in the second stripe part, the direction of the grain lines is traversed in sequence, and the second line break is collected; the second defective section is defined according to the second line break.

[0120] Furthermore, the distance between the first defective section and the second defective section is measured, and the section distance between the first defective section and the second defective section is defined. At this time, the section distance between the first defective section and the second defective section is introduced, and the section distance between the first defective section and the second defective section is further controlled. Therefore, if the section distance between the first defective section and the second defective section is less than the preset distance, a transition section between the first stripe section and the second stripe section is defined, and a transition defective section is defined based on the transition section. At this time, the transition defective section is within the area enclosed by the first defective section and the second defective section, and the first defective section, the second defective section and the transition defective section are fully utilized, and a full range of detection processing is performed on the tiled image to facilitate subsequent defect detection.

[0121] See also Figure 4 , in step S13, an intersection is defined based on the stretching of the plurality of defective sections, and a static defect area is defined based on the plurality of defective sections and the intersection;

[0122] In the specific implementation process of the present invention, the specific steps may be:

[0123] S131: freeze multiple defective sections;

[0124] S132: Extend each defective section along the direction of the defective section to form a plurality of stretching virtual lines;

[0125] S133: determining a plurality of intersections based on a plurality of stretched virtual lines;

[0126] S134: determining the positions of the plurality of intersections, and fixing the intersections in the transition part;

[0127] S135: defining a static defect area according to a plurality of defect sections and an intersection in a transition portion;

[0128] S136: If there are multiple static defect areas, measure the distances between the multiple static defect areas;

[0129] S137: defining a distance level according to the distance, and marking the distance level to two corresponding static defect areas;

[0130] S138: triggering a merging strategy according to the distance level, and merging the corresponding two static defect regions along the merging direction indicated in the merging strategy, thereby performing regional integration based on multiple static defect regions to form an overall defect region with a continuous state.

[0131] In an embodiment of the present application, multiple defective sections are frozen, and include a first defective section, a second defective section, and a transition defective section. At this time, each defective section is extended along the direction of the defective section, and multiple stretching virtual lines are formed. The defective section is extended during the stretching process so as to fully consider the detection of the parts outside the defective section. At the same time, multiple intersections are determined based on the multiple stretching virtual lines, and further control is focused on the multiple intersections.

[0132] At this time, the positions of multiple intersections are determined, and the intersections in the transition part are fixed, so as to further process the intersections in the transition part. Therefore, static defect areas are defined according to multiple defect sections and intersections in the transition part, and quantity control is performed on the static defect areas. At this time, if there are multiple static defect areas, the distance between the multiple static defect areas is calculated; the distance level is defined according to the distance, and the distance level is marked to the corresponding two static defect areas; the merging strategy is triggered according to the distance level, and the corresponding two static defect areas are merged along the merging direction indicated in the merging strategy. Therefore, regional integration is performed according to multiple static defect areas to form an overall defect area with a continuous state, which ensures the continuity of the overall defect area, so that defect detection is fully performed on the overall defect area, and the influence of adjacent parts of the defect section is fully considered.

[0133] See also Figure 5 , S14: collecting area parameters, thickness parameters and material parameters of the laser film, and triggering dynamic detection of the laser film based on the area of ​​the static defect area;

[0134] In the specific implementation process of the present invention, the specific steps may be:

[0135] S141: Acquire a tiled image and a peripheral image of the laser film;

[0136] S142: defining an area parameter of the laser film according to the tiled image of the laser film, and defining a thickness parameter of the laser film according to the peripheral image of the laser film;

[0137] S143: defining material parameters according to the model of the laser film, associating the area parameter, the thickness parameter and the material parameter, and defining associated parameters based on the area parameter, the thickness parameter and the material parameter;

[0138] S144: Collecting the area of ​​the static defect area;

[0139] S145: If the area of ​​the static defect region is larger than the preset area, dynamic detection of the laser film is triggered, and a detection scene of the dynamic detection is defined according to the associated parameters;

[0140] In an embodiment of the present application, a flat image and a circumferential side image of the laser film are obtained to facilitate image detection on the flat image and the circumferential side image, thereby defining the area parameters of the laser film according to the flat image of the laser film, and defining the thickness parameters of the laser film according to the circumferential side image of the laser film, thereby enabling real-time collection of the area parameters and thickness parameters of the laser film, thereby ensuring the data accuracy of the laser film.

[0141] At this time, the model of the laser film is introduced to define the material parameters according to the model of the laser film, and to associate the area parameters, thickness parameters and material parameters, and to define the associated parameters based on the area parameters, thickness parameters and material parameters. The association between the area parameters, thickness parameters and material parameters is reflected as a whole through the associated parameters, so as to facilitate further processing of the associated parameters.

[0142] Furthermore, the area of ​​the static defect area is collected to freeze the area of ​​the static defect area, so as to compare the area of ​​the static defect area with the preset area. At this time, if the area of ​​the static defect area is larger than the preset area, the dynamic detection of the laser film is triggered, and the detection scene of the dynamic detection is defined according to the associated parameters to control the detection scene of the dynamic detection, so as to adapt to the current processing of the laser film and ensure the dynamic testing and dynamic control of the laser film.

[0143] See also Figure 6 , S15: in the dynamic detection of the laser film, determining the tension level based on the area parameter, thickness parameter and material parameter of the laser film;

[0144] In the specific implementation process of the present invention, the specific steps may be:

[0145] S151: In the dynamic detection of the laser film, the area parameter, thickness parameter and material parameter of the laser film are fixed;

[0146] S152: Determine a tension parameter according to an area parameter, a thickness parameter, and a material parameter;

[0147] S153: collecting the state of the laser film;

[0148] S154: determining a tension level according to the state of the laser film and the tension parameter;

[0149] S155: Collecting the outline of the laser film;

[0150] S156: Determine the tension direction according to the outer contour of the laser film, and associate the tension direction with the tension level.

[0151] In the embodiments of the present application, dynamic detection of laser film and static detection of laser film are introduced, so as to control the defects of laser film in dynamic detection and static detection, fully consider the static and dynamic effects of laser film, and ensure the accuracy and comprehensiveness of defects of laser film.

[0152] At this time, in the dynamic detection of the laser film, the area parameters, thickness parameters and material parameters of the laser film are frozen; the tension parameters are determined according to the area parameters, thickness parameters and material parameters, and then the tension parameters are introduced to further control the tension of the laser film.

[0153] Therefore, the state of the laser film is collected; the tension level is determined according to the state of the laser film and the tension parameters, so as to set the tension level, thereby dynamically detecting the laser film through the tension strength represented by the tension level. In addition, the outer contour of the laser film is collected; the tension direction is determined according to the outer contour of the laser film, and the tension direction is associated with the tension level.

[0154] See also Figure 7 , S16: dynamically detecting the laser film based on the next level of the tension level, and collecting a plurality of dynamic detection images of the laser film;

[0155] In the specific implementation process of the present invention, the specific steps may be:

[0156] S161: Fixed gravity level;

[0157] S162: Tensile grade table based on tensile grade and material parameters of laser film;

[0158] S163: determining the next level of the tension level according to the tension level table and the positioning of the tension level, and at this time, the tension levels are sorted in an upward direction;

[0159] S164: triggering dynamic detection of the laser film according to the next level of the tension level;

[0160] S165: In the dynamic detection of the laser film, the laser film is stretched in the horizontal direction, and a plurality of dynamic detection images are output according to a preset time.

[0161] In an embodiment of the present application, the tension level is fixed so as to trace back the tension level table based on the tension level and the material parameters of the laser film, thereby determining the next level of the tension level through the tension level table and the positioning of the tension level. At this time, the size of the tension level is sorted in an upward direction.

[0162] In order to avoid damage to the laser film, the corresponding tensile level is not used in the dynamic test of the laser film. Instead, the dynamic detection of the laser film is triggered according to the next level of the tensile level, thereby ensuring the protection of the laser film and presenting the defects of the laser film exposed in the dynamic test. In the dynamic detection of the laser film, the laser film is stretched in the horizontal direction and multiple dynamic detection images are output according to the preset time.

[0163] S17: defining a dynamic defect area according to a comparison of a plurality of dynamic detection images, and determining defects of the laser film according to the dynamic defect area and the static defect area;

[0164] In the specific implementation process of the present invention, multiple dynamic detection images are obtained; the multiple dynamic detection images are sorted in chronological order; the multiple dynamic detection images are compared in chronological order, and the change characteristics are marked during the comparison process; the change area is defined based on the change characteristics and the tension direction; the dynamic defect area is defined according to the regional identification of the change area; the dynamic defect area and the static defect area are associated; based on the comparison between the dynamic defect area and the static defect area, a repeated area is defined, and the repeated area is determined as the first defect area of ​​the laser film; based on the comparison between the dynamic defect area and the static defect area, a non-repeated area is defined, and the non-repeated area is further regionally identified to determine the second defect area; the defect of the laser film is determined according to the second defect area and the first defect area.

[0165] In an embodiment of the present application, a tiled image of a laser film in a static state is obtained, and a plurality of defect segments are defined for defect detection of the tiled image, so as to facilitate stretching of the plurality of defect segments to define intersections, thereby defining a static defect area based on the plurality of defect segments and the intersections, so as to facilitate determination of the static defect area, and at the same time, dynamic detection of the laser film is triggered based on the area of ​​the static defect area, so as to facilitate further triggering of dynamic detection, thereby making the static detection and dynamic detection of the laser film compatible, and therefore, the laser film is dynamically detected based on the next level of the tension level, and a plurality of dynamic detection images of the laser film are collected; a dynamic defect area is defined based on comparison of the plurality of dynamic detection images, and the defects of the laser film are determined based on the dynamic defect area and the static defect area, thereby ensuring static detection and dynamic detection of the laser film, fully considering the static and dynamic effects of the laser film, and ensuring the accuracy and comprehensiveness of the defects of the laser film.

[0166] At this time, dynamic lighting is carried out according to the movement of dynamic objects and the movement of people, so as to realize the intelligent and energy-saving operation of basement lighting and reduce the energy cost of the property.

[0167] Example

[0168] See also Figure 8 , Figure 8It is a schematic diagram of the structural composition of the laser film detection system in an embodiment of the present invention.

[0169] like Figure 8 As shown, a laser film detection system, the laser film detection system comprises:

[0170] The image module 21 is used to obtain a tiled image of the laser film in a static state, and at the same time, the laser film is clamped by the detection platform;

[0171] A static detection module 22, used for defining a plurality of defective sections based on defect detection of a tiled image, and marking the plurality of defective sections;

[0172] A static defect region module 23, for defining an intersection based on the stretching of a plurality of defect segments, and defining a static defect region based on the plurality of defect segments and the intersection;

[0173] A dynamic detection module 24 is used to collect area parameters, thickness parameters and material parameters of the laser film, and trigger dynamic detection of the laser film based on the area of ​​the static defect area;

[0174] The tension module 25 is used to determine the tension level based on the area parameter, thickness parameter and material parameter of the laser film during the dynamic detection of the laser film;

[0175] A dynamic detection diagram module 26 is used to perform dynamic detection on the laser film based on the next level of the tension level, and collect multiple dynamic detection diagrams of the laser film;

[0176] The defect module 27 is used to define a dynamic defect area according to the comparison of multiple dynamic detection images, and determine the defects of the laser film according to the dynamic defect area and the static defect area.

[0177] Example

[0178] See also Fig. 9 , refer to the following Fig. 9 The electronic device 40 according to this embodiment of the present invention will be described. Fig. 9 The electronic device 40 shown is only an example and should not bring any limitation to the functions and scope of use of the embodiments of the present invention.

[0179] like Fig. 9 As shown, the electronic device 40 is in the form of a general computing device. The components of the electronic device 40 may include but are not limited to: at least one processing unit 41, at least one storage unit 42, and a bus 43 connecting different system components (including the storage unit 42 and the processing unit 41).

[0180] The storage unit stores program codes, which can be executed by the processing unit 41, so that the processing unit 41 executes the steps according to various exemplary embodiments of the present invention described in the above “Embodiment Method” section of this specification.

[0181] The storage unit 42 may include a readable medium in the form of a volatile storage unit, such as a random access memory unit (RAM) 421 and / or a cache memory unit 422 , and may further include a read-only memory unit (ROM) 423 .

[0182] The storage unit 42 may also include a program / utility 424 having a set (at least one) of program modules 425, such program modules 425 including but not limited to: an operating system, one or more application programs, other program modules, and program data, each of which or some combination may include an implementation of a network environment.

[0183] Bus 43 may represent one or more of several types of bus structures, including a memory unit bus or memory unit controller, a peripheral bus, an accelerated graphics port, a processing unit, or a local bus using any of a variety of bus architectures.

[0184] The electronic device 40 may also communicate with one or more external devices (e.g., keyboards, pointing devices, Bluetooth devices, etc.), one or more devices that enable a user to interact with the electronic device 40, and / or any device that enables the electronic device 40 to communicate with one or more other computing devices (e.g., routers, modems, etc.). Such communication may be performed via an input / output (I / O) interface 44. Furthermore, the electronic device 40 may also communicate with one or more networks (e.g., a local area network (LAN), a wide area network (WAN), and / or a public network, such as the Internet) via a network adapter 45. Fig. 9 As shown, the network adapter 45 communicates with other modules of the electronic device 40 via the bus 43. It should be understood that although Fig. 9 Not shown, other hardware and / or software modules may be used in conjunction with the electronic device 40, including but not limited to: microcode, device drivers, redundant processing units, external disk drive arrays, RAID systems, tape drives, and data backup planning systems.

[0185] Through the description of the above implementation, it is easy for those skilled in the art to understand that the example implementation described here can be implemented by software, or by software combined with necessary hardware. Therefore, the technical solution according to the implementation of the present disclosure can be embodied in the form of a software product, which can be stored in a non-volatile storage medium (which can be a CD-ROM, a USB flash drive, a mobile hard disk, etc.) or on a network, including several instructions to enable a computing device (which can be a personal computer, a server, a terminal device, or a network device, etc.) to execute the method according to the implementation of the present disclosure.

[0186] Those skilled in the art can understand that all or part of the steps in the various methods of the above embodiments can be completed by instructing related hardware through a program, and the program can be stored in a computer-readable storage medium, and the storage medium can include: a read-only memory (ROM), a random access memory (RAM), a disk or an optical disk, etc. In addition, it stores computer program instructions, and when the computer program instructions are executed by a computer, the computer executes the above method.

[0187] In addition, the above is a detailed introduction to the laser film detection method and system provided in the embodiments of the present invention. Specific examples are used herein to illustrate the principles and implementation methods of the present invention. The description of the above embodiments is only used to help understand the method of the present invention and its core idea; at the same time, for those skilled in the art, according to the ideas of the present invention, there will be changes in the specific implementation methods and application scopes. In summary, the content of this specification should not be understood as a limitation on the present invention.

Claims

1. A method for detecting laser film, characterized in that: Applied to the detection scene of laser film; The laser film detection method comprises: Acquire a tiled image of the laser film in a static state, and at the same time, the laser film is clamped by the detection platform; Defect detection based on tiled images defines multiple defect sections, and marks the multiple defect sections; defining an intersection based on the stretching of the plurality of defect segments, and defining a static defect area based on the plurality of defect segments and the intersection; Collect the area parameters, thickness parameters and material parameters of the laser film, and trigger the dynamic detection of the laser film based on the area of ​​the static defect area; In the dynamic detection of laser film, the tension level is determined based on the area parameters, thickness parameters and material parameters of the laser film; Performing dynamic detection on the laser film based on the next level of the tension level, and collecting multiple dynamic detection images of the laser film; Defining a dynamic defect area according to the comparison of multiple dynamic detection images, and determining the defects of the laser film according to the dynamic defect area and the static defect area; The method of collecting the area parameter, thickness parameter and material parameter of the laser film and triggering the dynamic detection of the laser film based on the area of ​​the static defect area includes: obtaining a tiled image and a peripheral image of the laser film; defining the area parameter of the laser film according to the tiled image of the laser film, and defining the thickness parameter of the laser film according to the peripheral image of the laser film; defining the material parameter according to the model of the laser film, and associating the area parameter, thickness parameter and material parameter, and defining the associated parameter based on the area parameter, thickness parameter and material parameter; collecting the area of ​​the static defect area; if the area of ​​the static defect area is larger than the preset area, triggering the dynamic detection of the laser film, and defining the detection scene of the dynamic detection according to the associated parameter; The method of determining the tension level based on the area parameter, thickness parameter and material parameter of the laser film in the dynamic detection of the laser film includes: freezing the area parameter, thickness parameter and material parameter of the laser film in the dynamic detection of the laser film; determining the tension parameter according to the area parameter, thickness parameter and material parameter; collecting the state of the laser film; determining the tension level according to the state of the laser film and the tension parameter; collecting the outer contour of the laser film; determining the tension direction according to the outer contour of the laser film, and associating the tension direction with the tension level.

2. The method for detecting laser film according to claim 1, characterized in that: The step of obtaining a tiled image of the laser film in a static state, wherein the laser film is clamped by a detection platform, includes: Transferring the laser film to the inspection platform and acquiring the laser film image; Perform image acquisition based on the laser film image, and determine the bending position in the laser film image; Triggering local adsorption of the detection platform based on the position coordinates of the bend; The bending angle of the bend is collected, and different adsorption forces of the detection platform are triggered based on the change rate of the bending angle, until the bending angle of the bend reaches the preset bending angle, and the bend is flattened; After being laid flat at the bend, the position offset of the laser film within a preset time is collected; If the position offset is less than the preset offset, the laser film is in a stationary state, and a tiled image of the laser film in a stationary state is obtained. At the same time, the laser film is clamped by the detection platform, and the adsorption of the detection platform on the laser film is cancelled.

3. The method for detecting laser film according to claim 2, characterized in that: The tiled image-based defect detection defines a plurality of defect sections and marks the plurality of defect sections, including: Collect tiled images; Performing stripe processing based on the tiled image and determining a first stripe portion and a second stripe portion; Performing a synchronous test on the first stripe portion and the second stripe portion, and detecting the stripe lines in the first stripe portion and the stripe lines in the second stripe portion; In the grain lines in the first stripe portion, sequentially traverse along the direction of the grain lines and collect the first line breakage points; define the first defective section according to the first line breakage points; In the grain lines in the second stripe portion, traverse in sequence along the direction of the grain lines and collect the second line breakage points; define the second defect section according to the second line breakage points; Calculate the distance between the first defective section and the second defective section, and define the section distance between the first defective section and the second defective section; If the distance between the first defective section and the second defective section is less than the preset distance, a transition portion between the first stripe portion and the second stripe portion is defined, and a transitional defective section is defined based on the transitional portion. At this time, the transitional defective section is within the area enclosed by the first defective section and the second defective section.

4. The method for detecting laser film according to claim 3, characterized in that: The method of defining an intersection based on the stretching of multiple defective sections and defining a static defect area based on the multiple defective sections and the intersection includes: Freeze multiple defective paragraphs; Extend each defective section along the direction of the defective section and form a plurality of stretching virtual lines; determining a plurality of intersections based on a plurality of stretched virtual lines; Determine the positions of multiple intersections and freeze the intersections in the transition section; Static defect areas are defined based on the intersection of multiple defect segments and transition sections.

5. The method for detecting laser film according to claim 4, characterized in that: The method further includes: defining an intersection based on the stretching of multiple defective sections, and defining a static defective area based on the multiple defective sections and the intersection. If there are multiple static defect areas, the distances between the multiple static defect areas are measured; Define a distance level according to the distance, and mark the distance level to the corresponding two static defect areas; The merging strategy is triggered according to the distance level, and the corresponding two static defect areas are merged along the merging direction indicated in the merging strategy. Therefore, regional integration is performed based on multiple static defect areas to form an overall defect area with a continuous state.

6. The method for detecting laser film according to claim 1, characterized in that: The next level based on the tension level is dynamically tested on the laser film, and multiple dynamic test images of the laser film are collected, including: Set the gravity level; Based on the tensile strength level and the material parameters of the laser film, the tensile strength grade table is traced back; The next level of the tension level is determined according to the tension level table and the positioning of the tension level. At this time, the magnitude of the tension level is sorted in an upward direction; Triggering dynamic detection of the laser film according to the next level of tension level; In the dynamic detection of the laser film, the laser film is stretched in the horizontal direction and multiple dynamic detection images are output according to the preset time.

7. The method for detecting laser film according to claim 6, characterized in that: The method of defining a dynamic defect area according to the comparison of a plurality of dynamic detection images, and determining the defect of the laser film according to the dynamic defect area and the static defect area, comprises: Obtain multiple dynamic detection images; Sort multiple dynamic detection images in chronological order; Compare multiple dynamic detection images in sequence along the time sequence, and mark the change features during the comparison process; Define the change area based on the change characteristics and the direction of the pulling force; defining dynamic defect regions based on region identification of changing regions; Correlating the dynamic defect area with the static defect area; Defining a repeating region based on a comparison between the dynamic defect region and the static defect region, and determining the repeating region as a first defect region of the laser film; defining a non-repeating region based on a comparison between the dynamic defect region and the static defect region, and further region-identifying the non-repeating region to determine a second defect region; The defects of the laser film are determined according to the second defect area and the first defect area.

8. A laser film detection system, characterized in that: The laser film detection system is applied to the laser film detection method as described in any one of claims 1 to 7, and the laser film detection system includes: An image module is used to obtain a tiled image of the laser film in a static state, and at the same time, the laser film is clamped by the detection platform; A static detection module, used for defining a plurality of defective sections based on defect detection of a tiled image, and marking the plurality of defective sections; A static defect region module, for defining an intersection based on the stretching of multiple defect segments, and defining a static defect region based on the multiple defect segments and the intersection; A dynamic detection module is used to collect area parameters, thickness parameters and material parameters of the laser film, and trigger dynamic detection of the laser film based on the area of ​​the static defect area; The tension module is used to determine the tension level based on the area parameter, thickness parameter and material parameter of the laser film during the dynamic detection of the laser film; A dynamic detection image module is used to perform dynamic detection on the laser film based on the next level of the tension level, and collect multiple dynamic detection images of the laser film; A defect module, used to define a dynamic defect area according to the comparison of multiple dynamic detection images, and determine the defects of the laser film according to the dynamic defect area and the static defect area; The method of collecting the area parameter, thickness parameter and material parameter of the laser film and triggering the dynamic detection of the laser film based on the area of ​​the static defect area includes: obtaining a tiled image and a peripheral image of the laser film; defining the area parameter of the laser film according to the tiled image of the laser film, and defining the thickness parameter of the laser film according to the peripheral image of the laser film; defining the material parameter according to the model of the laser film, and associating the area parameter, thickness parameter and material parameter, and defining the associated parameter based on the area parameter, thickness parameter and material parameter; collecting the area of ​​the static defect area; if the area of ​​the static defect area is larger than the preset area, triggering the dynamic detection of the laser film, and defining the detection scene of the dynamic detection according to the associated parameter; The method of determining the tension level based on the area parameter, thickness parameter and material parameter of the laser film in the dynamic detection of the laser film includes: freezing the area parameter, thickness parameter and material parameter of the laser film in the dynamic detection of the laser film; determining the tension parameter according to the area parameter, thickness parameter and material parameter; collecting the state of the laser film; determining the tension level according to the state of the laser film and the tension parameter; collecting the outer contour of the laser film; determining the tension direction according to the outer contour of the laser film, and associating the tension direction with the tension level.

Images