A method for reliability modeling and prediction of electronic assemblies

Abstract

The application provides a reliability modeling and prediction method for electronic combination, relates to the field of reliability design analysis of electronic equipment, and solves the problem that the existing method cannot effectively carry out reliability analysis of electronic combination based on a public information processing resource pool; the method comprises the following steps: S1, obtaining structure information and use information of the electronic combination, and determining an information propagation path of the electronic combination; S2, based on the information propagation path, carrying out function and failure influence analysis of the electronic combination, and establishing a "pool type resource" reliability model of the electronic combination; S3, obtaining reliability information of each functional component of an internal electronic module of the electronic combination; S4, calculating task reliability of each functional component of a single electronic module, and obtaining task reliability of the electronic combination; and S5, calculating an average serious failure time of the electronic combination; the application can improve the integrity and accuracy of reliability analysis work of the electronic combination, and ensure that reliability risks in the future can be predicted and avoided in the design stage of the electronic product.

Description

TECHNICAL FIELD

[0001] The present application relates to the field of electronic equipment reliability design and analysis, and particularly relates to a reliability modeling and prediction method for electronic assembly. BACKGROUND

[0002] Under the background of rapid progress of current technology, the integration and development of electronic technology, high-performance real-time computing technology and software radio technology have brought revolutionary changes to the field of electronic product design. The leap of this series of technologies has promoted the product design to be more multifunctional, highly flexible and reliable. In order to adapt to this trend, designers have adopted advanced design concepts such as modularization, assembly and serialization, so that electronic products can form a complex and efficient system structure by integrating multiple standardized or customized electronic modules. These modules work together to build a flexible and expandable common information processing resource pool, the core of which is to dynamically allocate and optimize the use of information processing resources to flexibly respond to diverse task requirements while ensuring the overall efficiency, cost-effectiveness and stability of the system.

[0003] However, although this design concept and technical path shows great potential and advantages, it still faces key technical challenges in practical application, especially the reliability evaluation problem of "pool-type resources". Traditional reliability modeling and prediction methods often focus on the level of single components or systems, and fail to fully consider the complex interaction and dynamics of electronic assembly in a highly integrated and resource-sharing environment. Specifically, existing methods tend to analyze each electronic module as an independent and homogeneous unit, ignoring the detailed consideration of design differences within the module and their contribution to the overall system reliability. This simplified approach, while facilitating model construction and preliminary calculation, fails to accurately capture the system reliability improvement effect brought about by resource sharing and task scheduling among modules, resulting in an underestimation of the final reliability evaluation results, affecting the understanding and judgment of the true reliability of the system, and limiting the possibility of further optimization design.

[0004] Therefore, it is urgent to develop an innovative reliability analysis method that needs to go deep into the "pool-type resource" architecture of electronic assembly, carefully examine the information flow, resource sharing mechanism among modules and their impact on system reliability. By introducing more accurate models and algorithms, not only can the comprehensive integration characteristics of electronic assembly design be fully reflected, but also the reliability gain brought by resource sharing can be accurately quantified, thereby providing scientific and reliable decision support for the design optimization, function upgrade, performance improvement and reliability guarantee of electronic assembly and the upper-layer electronic products composed of it. Such innovative research not only fills the gap in existing reliability analysis technology, but also greatly improves the efficiency and quality of electronic product research and development, and promotes the sustained innovation and development of the field of electronic information technology. SUMMARY

[0005] Based on the status in the background art, the present application proposes an electronic combination reliability modeling and prediction method to overcome the deficiencies of the existing reliability modeling and prediction methods. The method can solve the problem that the existing technology cannot effectively carry out electronic combination reliability analysis based on a public information processing resource pool, thereby successfully improving the integrity and accuracy of electronic combination reliability analysis work.

[0006] The present application achieves the purpose by adopting the following technical solutions:

[0007] An electronic combination reliability modeling and prediction method comprises the following steps:

[0008] S1, obtaining the structure information and use information of the electronic combination, and determining the information propagation path of the electronic combination;

[0009] S2, based on the information propagation path, carrying out function and failure influence analysis of the electronic combination, and establishing a "pool resource" reliability model of the electronic combination;

[0010] S3, obtaining the reliability information of each functional component of the internal electronic module of the electronic combination;

[0011] S4, calculating the task reliability of each functional component of the single electronic module, thereby obtaining the task reliability of the electronic combination.

[0012] The structure information in step S1 includes the internal electronic module name of the electronic combination, the number of electronic modules, and the number of resource channels of a single electronic module; the use information includes the total number of minimum resource channel requirements and task time of the electronic combination working on demand.

[0013] The reliability information in step S3 includes the component type, number, and failure rate of each functional component in the electronic module.

[0014] Further, in step S2, the "pool resource" reliability structure model and the "pool resource" reliability mathematical model of the electronic combination are established in sequence, specifically comprising the following steps:

[0015] S21, carrying out function and failure influence analysis of the electronic combination, dividing the internal electronic module of the electronic combination into single-point link, redundant link, and resource link, and establishing a function structure model of the electronic combination;

[0016] S22, establishing a "pool resource" reliability structure model of the electronic combination according to the function structure model of the electronic combination;

[0017] S23, establishing a "pool resource" reliability mathematical model of the electronic combination according to the "pool resource" reliability structure model of the electronic combination;

[0018] In step S21, the single-point link is composed of a part of the corresponding single electronic module which cannot work normally when the single-point link fails; the redundant link is composed of multiple redundant channels which are hot backup to each other, and the corresponding single electronic module cannot work normally only when all the redundant channels fail; the resource link includes multiple independent resource channels, and the resource channel of the single electronic module and the resource channels of the remaining electronic modules together form a common resource pool; in the task time, the electronic combination allocates all the resource channels in the common resource pool, and maintains the normal work of the electronic combination under the condition of the minimum number of resource channels.

[0019] Further, in step S22, the "pool resource" reliability structure model of the electronic combination is represented as a k / M[n|(D+B)] voting model; wherein k represents the minimum total number of resource channels required to ensure that the electronic combination works as needed; M represents the number of electronic modules; n represents the number of resource channels of a single electronic module; D represents the single-point link in a single electronic module; B represents the redundant link in a single electronic module; and n|(D+B) represents the known conditions of voting, including the internal structure of the electronic module being a single-point link, a redundant link, and a resource link composed of n resource channels.

[0020] Further, in step S23, the "pool resource" reliability mathematical model of the electronic combination is established by the following expression:

[0021]

[0022] In the formula, R s (t) represents the task reliability of the electronic combination at time t; M represents the number of electronic modules; n represents the number of resource channels of a single electronic module; J represents the minimum number of electronic modules required to ensure that the electronic combination works normally; k represents the minimum total number of resource channels required to ensure that the electronic combination works as needed; R D (t) represents the task reliability of the single-point link in a single electronic module at time t; R B (t) represents the task reliability of the redundant link in a single electronic module at time t; R Z (t) represents the task reliability of a single resource channel in a single electronic module at time t; x and y represent intermediate calculation parameters of the model expression.

[0023] Further, the k / M[n|(D+B)] voting model has a simplified I-type model, a II-type model and a III-type model, which are respectively:

[0024] When the single electronic module is only composed of the redundant link and the resource link, and the redundant link is composed of a plurality of redundant channels which are backup to each other, and the resource link is composed of a plurality of same resource channels, the k / M[n|(D+B)] voting model is simplified into the I-type model, and the I-type model is expressed as a k / M(n|B) voting model; wherein, n|B represents a known condition of the I-type model voting, that is, the internal structure of the electronic module includes the redundant link composed of a plurality of redundant channels, and the resource link composed of n resource channels;

[0025] When the single electronic module is only composed of the single-point link and the resource link, and the resource link is composed of a plurality of same resource channels, the k / M[n|(D+B)] voting model is simplified into the II-type model, and the II-type model is expressed as a k / M(n|D) voting model; wherein, n|D represents a known condition of the II-type model voting, that is, the internal structure of the electronic module includes the single-point link and the resource link composed of n resource channels;

[0026] When the single electronic module is only composed of the single-point link and the redundant link, and the redundant link is composed of a plurality of redundant channels which are backup to each other, the k / M[n|(D+B)] voting model is simplified into the III-type model, and the III-type model is expressed as a k / M|(D+B) voting model; wherein, (D+B) represents a known condition of the voting, that is, the internal structure of the electronic module includes the single-point link and the redundant link.

[0027] Preferably, after the step S4, the method further comprises: S5, calculating the electronic assembly average serious failure interval time; in the step S5, the electronic assembly average serious failure interval time MTBCF is calculated by using the following formula S :

[0028]

[0029] In the formula, R s (t) represents the electronic assembly task reliability at t moment.

[0030] In summary, due to the adoption of the technical solution, the beneficial effects of the present application are as follows:

[0031] Through the in-depth analysis of the electronic assembly and the "pool resource" composed of the electronic assembly, the method can more accurately identify the potential failure point and performance bottleneck, and then improve the accuracy and integrity of the reliability evaluation, so that the reliability risk in the future can be predicted and avoided in the design stage.

[0032] The method provides a systematic reliability analysis and processing flow for product designers, so that they can make more scientific and reasonable decisions based on reliable data support in the early design stage, effectively shorten the product development cycle, and reduce the rework cost caused by the reliability problem in the later stage.

[0033] The method of the present application is not limited to a specific type of electronic assembly, and the innovative modeling and prediction technology is also applicable to electronic systems and even single machine devices with similar structural and functional characteristics, showing high universality and expansibility, and providing a powerful tool for reliability evaluation of a wide range of electronic products.

[0034] The present application successfully fills some key gaps in the comprehensive reliability analysis of existing electronic assemblies and the upper-layer electronic products composed of the electronic assemblies, and also points out the direction for the reliability optimization strategy of future electronic product design, and has important theoretical significance and broad application prospects. BRIEF DESCRIPTION OF DRAWINGS

[0035] Figure 1 The figure is a schematic diagram of the overall process of the method of the present application;

[0036] Figure 2 The figure is a schematic diagram of the functional structure model (general) of the electronic assembly;

[0037] Figure 3 The figure is a schematic diagram of the functional structure model (I type) of the electronic assembly;

[0038] Figure 4 The figure is a schematic diagram of the functional structure model (II type) of the electronic assembly;

[0039] Figure 5 The figure is a schematic diagram of the functional structure model (III type) of the electronic assembly;

[0040] Figure 6 The figure is a schematic diagram of the "pool resource" reliability structure model (general) of the electronic assembly;

[0041] Figure 7 The figure is a schematic diagram of the "pool resource" reliability structure model (I type) of the electronic assembly;

[0042] Figure 8 The figure is a schematic diagram of the "pool resource" reliability structure model (II type) of the electronic assembly;

[0043] Figure 9 The figure is a schematic diagram of the "pool resource" reliability structure model (III type) of the electronic assembly. DETAILED DESCRIPTION

[0044] In order to make the purpose, technical scheme and advantages of the embodiments of the present application clearer, the technical scheme of the embodiments of the present application will be described clearly and completely below in conjunction with the drawings in the embodiments of the present application. Obviously, the described embodiments are part of the embodiments of the present application, not all the embodiments. The components of the embodiments of the present application described and shown in the drawings here can be arranged and designed in various different configurations.

[0045] Therefore, the following detailed description of embodiments of the application provided in the accompanying drawings is not intended to limit the scope of the application claimed, but merely represents selected embodiments of the application. Based on the embodiments in the present application, all other embodiments obtained by those of ordinary skill in the art without creative labor are within the scope of protection of the present application.

[0046] Embodiment 1

[0047] A reliability modeling and prediction method of electronic assembly, which takes electronic assembly based on public information processing resource pool as analysis object, first acquires structure information and use information of electronic assembly, establishes "pool resource" reliability model of electronic assembly by carrying out function and failure influence analysis based on information propagation path; further acquires reliability information of each functional component of internal electronic module of electronic assembly, calculates task reliability of each functional component of single electronic module, and further calculates task reliability and mean time between critical failures of electronic assembly.

[0048] Reference can be made to Figure 1 The method of the embodiment is summarized as follows according to steps:

[0049] S1, acquire structure information and use information of electronic assembly, and determine information propagation path of electronic assembly;

[0050] S2, carry out function and failure influence analysis of electronic assembly based on information propagation path, and establish "pool resource" reliability model of electronic assembly;

[0051] S3, acquire reliability information of each functional component of internal electronic module of electronic assembly;

[0052] S4, calculate task reliability of each functional component of single electronic module, so as to obtain task reliability of electronic assembly;

[0053] S5, calculate mean time between critical failures of electronic assembly.

[0054] In the embodiment, by carrying out function and failure influence analysis based on information propagation path, "pool resource" reliability model of electronic assembly is established, failure rate of each component of single electronic module inside electronic assembly is obtained, and reliability of each component of single electronic module, task reliability and mean time between critical failures of electronic assembly are calculated. The method solves the problem that reliability analysis of electronic assembly cannot correctly reflect its design, and improves comprehensiveness, sufficiency and effectiveness of reliability analysis work of electronic products with high functional integration, flexible resource demand and diversified application environment. In addition, the method of the embodiment is not only suitable for electronic assembly, but also suitable for electronic system and single machine.

[0055] This embodiment will follow the above steps in sequence, detailed and specific to introduce the details of each step.

[0056] In step S1, the structure information and use information of the electronic combination are acquired, the structure information including the names of the electronic modules inside the electronic combination, the number of the electronic modules and the number of resource channels of a single electronic module; the use information including the total number of the minimum resource channel requirements for the on-demand work of the electronic combination and the task time.

[0057] In step S2, the "pool resource" reliability structure model and the "pool resource" reliability mathematical model of the electronic combination are established in sequence, specifically including the following steps:

[0058] S21, the function and failure influence analysis of the electronic combination is carried out, the electronic modules inside the electronic combination are divided into single-point links, redundant links and resource links, and the function structure model of the electronic combination is established;

[0059] S22, the "pool resource" reliability structure model of the electronic combination is established according to the function structure model of the electronic combination;

[0060] S23, the "pool resource" reliability mathematical model of the electronic combination is established according to the "pool resource" reliability structure model of the electronic combination.

[0061] The specific content of step S21 carried out in this embodiment is as follows: based on the function and failure influence analysis of the information propagation path in the electronic combination and the division, the function structure model of the electronic combination as shown in Figure 2 is obtained; wherein the single-point link is composed of the part that will cause the corresponding single electronic module to be unable to work normally when a failure occurs; the redundant link is composed of multiple redundant channels that are hot backups to each other, and the corresponding single electronic module cannot work normally only when all the redundant channels fail at the same time; the resource link includes multiple independent resource channels, and the resource channel of a single electronic module and the resource channels of the remaining electronic modules together constitute a common resource pool; within the task time, the electronic combination allocates all the resource channels in the common resource pool, and maintains the normal work of the electronic combination under the condition of the minimum number of resource channels.

[0062] Next, referring to the schematic of Figure 6 , the "pool resource" reliability structure model of the electronic combination in step S22 is represented as a k / M[n|(D+B)] voting model; wherein k represents the total number of the minimum resource channel requirements for the on-demand work of the electronic combination; M represents the number of electronic modules; n represents the number of resource channels of a single electronic module; D represents the single-point link in a single electronic module; B represents the redundant link in a single electronic module; n|(D+B) represents the known conditions of voting occurrence, including the single-point link, the redundant link and the resource link composed of n resource channels inside the electronic module structure.

[0063] In this embodiment, the k / M[n|(D+B)] voting model further includes a simplified type I model, a type II model and a type III model, corresponding to Figures 7 to 9 , the specific contents of which are as follows:

[0064] As shown in Figure 3 , when a single electronic module is composed of only a redundant link and a resource link, and the redundant link is composed of multiple redundant channels that are backups of each other, and the resource link is composed of multiple identical resource channels, the k / M[n|(D+B)] voting model is simplified into a type I model, and the type I model is expressed as a k / M(n|B) voting model, which can be referred to Figure 7 ; wherein n|B represents a known condition under which the type I model voting occurs, i.e., the internal structure of the electronic module includes a redundant link composed of multiple redundant channels and a resource link composed of n resource channels.

[0065] As shown in Figure 4 , when a single electronic module is composed of only a single-point link and a resource link, and the resource link is composed of multiple identical resource channels, the k / M[n|(D+B)] voting model is simplified into a type II model, and the type II model is expressed as a k / M(n|D) voting model, which can be referred to Figure 8 ; wherein n|D represents a known condition under which the type II model voting occurs, i.e., the internal structure of the electronic module includes a single-point link and a resource link composed of n resource channels.

[0066] As shown in Figure 5 , when a single electronic module is composed of only a single-point link and a redundant link, and the redundant link is composed of multiple redundant channels that are backups of each other, the k / M[n|(D+B)] voting model is simplified into a type III model, and the type III model is expressed as a k / M|(D+B) voting model, which can be referred to Figure 9 ; wherein |(D+B) represents a known condition under which the voting occurs, i.e., the internal structure of the electronic module includes a single-point link and a redundant link.

[0067] In this embodiment, step S23 establishes a "pool resource" reliability mathematical model of the electronic combination, and according to the "pool resource" reliability structure model of the electronic combination and its simplification, there are four corresponding cases, which are as follows:

[0068] (1) According to the k / M[n|(D+B)] voting model, the "pool resource" reliability mathematical model of the electronic combination is established by the following expression:

[0069]

[0070] In the formula, R s(t) represents the task reliability of the electronic assembly at time t; M represents the number of electronic modules; n represents the number of resource channels of a single electronic module; J represents the minimum number of electronic modules to ensure the normal operation of the electronic assembly; k represents the minimum total number of resource channels required to ensure the on-demand operation of the electronic assembly; R D (t) represents the task reliability of the single-point link inside a single electronic module at time t; R B (t) represents the task reliability of the redundant link inside a single electronic module at time t; R Z (t) represents the task reliability of a single resource channel inside a single electronic module at time t; x and y represent intermediate calculation parameters of the model expression.

[0071] (2) According to the k / M(n|B) voting model, the "pool resource" reliability mathematical model of the electronic assembly is established by the following expression:

[0072]

[0073] In the formula, R s (t) represents the task reliability of the electronic assembly at time t; J represents the minimum number of electronic modules to ensure the normal operation of the electronic assembly; R B (t) represents the task reliability of the redundant link inside a single electronic module at time t; R Z (t) represents the task reliability of a single resource channel inside a single electronic module at time t; x and y represent intermediate calculation parameters of the model expression.

[0074] (3) According to the k / M(n|D) voting model, the "pool resource" reliability mathematical model of the electronic assembly is established by the following expression:

[0075]

[0076] In the formula, R s (t) represents the task reliability of the electronic assembly at time t; J represents the minimum number of electronic modules to ensure the normal operation of the electronic assembly; R D (t) represents the task reliability of the single-point link inside a single electronic module at time t; R Z (t) represents the task reliability of a single resource channel inside a single electronic module at time t; x and y represent intermediate calculation parameters of the model expression.

[0077] (4) According to the k / M(D+B) voting model, the "pool resource" reliability mathematical model of the electronic assembly is established by the following expression:

[0078]

[0079] In the formula, R s(t) represents the electronic combination task reliability at time t; J represents the minimum number of electronic modules to ensure the normal operation of the electronic combination; R D (t) represents the single electronic module internal single-point link task reliability at time t; R B (t) represents the single electronic module internal redundant link task reliability at time t; x represents an intermediate calculation parameter of the model expression.

[0080] In step S3, the obtained reliability information includes the types, quantities and failure rates of the components of each functional component in the electronic module.

[0081] In this embodiment, the failure rate λ D of the single-point link, the failure rate λ b of the single redundant channel and the failure rate λ Z of the single resource channel in each electronic module are obtained through reliability prediction. The failure rates of the electronic components can be predicted according to the methods provided in GJB / Z 299, MIL-HDBK-217, Telcordia SR332 and the like; when the electronic components are mature products, their failure rates can also use the usage data or test data provided by the supplier, and the failure rate of the resource channel can also be obtained through quantitative analysis of failure mode, effects and criticality analysis (FMECA); therefore, the embodiment does not limit the acquisition method of the reliability information, and the specific content is well known to those skilled in the art, which will not be described here.

[0082] In step S4, the task reliability of each functional component of the single electronic module is calculated, and the calculation process is as follows:

[0083] The task reliability R D (t) of the single-point link in the single electronic module at time t is calculated as follows:

[0084]

[0085] In the formula, λ D represents the failure rate of the single-point link of the single electronic module;

[0086] The task reliability R B (t) of the redundant link in the single electronic module at time t is calculated as follows:

[0087]

[0088] In the formula, λ b represents the failure rate of the single redundant channel of the single electronic module; and l represents the number of redundant channels of the single electronic module.

[0089] Calculate the task reliability R of a single resource channel in a single electronic module at time t Z (t), as follows:

[0090]

[0091] where λ Z represents the failure rate of a single resource channel in a single electronic module;

[0092] Calculate the minimum number of electronic modules J that guarantees the normal operation of the electronic assembly, as follows:

[0093]

[0094] where the symbol represents rounding up.

[0095] In this embodiment, the reliability of the electronic assembly task is calculated in combination with the electronic assembly reliability model; when the electronic assembly reliability model can be simplified accordingly, the calculation can be performed using the simplified "pool resource" reliability mathematical model.

[0096] Finally, as a preferred embodiment of the present application, after calculating and obtaining the reliability of the electronic assembly task, in step S5, the electronic assembly mean time between critical failures MTBCF is calculated using the following formula S :

[0097]

[0098] where R s (t) represents the reliability of the electronic assembly task at time t.

[0099] The reliability modeling and prediction method of the electronic assembly proposed in the present application performs in-depth reliability analysis on the electronic assembly based on the common information processing resource pool, significantly enhancing the comprehensiveness, accuracy and practicality of such analysis. Through the method of the present application, not only can the reliability evaluation accuracy of the electronic assembly in complex and variable application environments be effectively improved, but also the analysis range can be successfully expanded to the accurate calculation of the task reliability and the mean time between critical failures, bringing innovative technological progress to the field of reliability engineering.

Claims

1. A method for reliability modeling and prediction of electronic assemblies, characterized in that, The method includes the following steps: S1. Obtain structural and usage information of the electronic assembly and determine the information propagation path of the electronic assembly; S2. Based on the information propagation path, conduct functional and fault impact analysis of the electronic assembly and establish a "pool-type resource" reliability model for the electronic assembly. S3. Obtain reliability information of each functional component of the electronic modules inside the electronic assembly; S4. Calculate the task reliability of each functional component of a single electronic module to obtain the task reliability of the electronic assembly; In step S2, the reliability structure model and the reliability mathematical model of the "pool-type resource" of the electronic combination are established sequentially, specifically including the following steps: S21. Conduct functional and fault impact analysis of the electronic assembly, divide the electronic modules inside the electronic assembly into single-point links, redundant links and resource links, and establish a functional structure model of the electronic assembly. S22. Based on the functional structure model of the electronic assembly, establish a reliability structure model of the "pool-type resources" of the electronic assembly; S23. Based on the reliability structure model of the "pool-type resource" of the electronic combination, establish a mathematical model of the reliability of the "pool-type resource" of the electronic combination. In step S21, a single-point link consists of a part that causes the corresponding single electronic module to malfunction when it fails; a redundant link consists of multiple redundant channels that serve as hot backups for each other, and the corresponding single electronic module will only malfunction when all redundant channels fail simultaneously; a resource link includes multiple independent resource channels, and the resource channels of a single electronic module and the resource channels of other electronic modules together form a common resource pool; during the task time, the electronic assembly allocates all resource channels in the common resource pool to maintain the normal operation of the electronic assembly under the condition of the minimum number of resource channels. In step S22, the reliability structure model of the "pool-like resource" of the electronic assembly is represented as follows: Voting model; in which, This represents the minimum total number of resource channels required to ensure that the electronic assembly operates on demand. Represents the number of electronic modules; The number of resource channels representing a single electronic module; Represents a single point link within a single electronic module; Represents redundant links in a single electronic module; The known conditions under which the delegate voting occurs include the internal structure of the electronic module being a single-point link, a redundant link, and a combination thereof. A resource link consisting of several resource channels; In step S23, the mathematical model for the reliability of the "pool-like resources" of the electronic assembly is established through the following expression: In the formula, represent The reliability of electronic combination tasks at any given time; Represents the number of electronic modules; The number of resource channels representing a single electronic module; This represents the minimum number of electronic modules required to ensure the proper functioning of the electronic assembly. This represents the minimum total number of resource channels required to ensure that the electronic assembly operates on demand. Represents a single point link within a single electronic module. Real-time task reliability; Represents the internal redundant links of a single electronic module. Real-time task reliability; A single resource channel representing the interior of a single electronic module Real-time task reliability; These represent intermediate calculation parameters of the model expression.

2. The reliability modeling and prediction method for electronic assemblies according to claim 1, characterized in that: In step S4, the calculation process is as follows: Calculate the single-point link within a single electronic module. Real-time task reliability As shown in the following formula: In the formula, This represents the failure rate of a single point link in a single electronic module. Calculate the internal redundancy of a single electronic module in Real-time task reliability As shown in the following formula: In the formula, The failure rate of a single redundant channel representing a single electronic module; The number of redundant channels representing a single electronic module; Calculate the value of a single resource channel in the internal resource link of a single electronic module. Real-time task reliability As shown in the following formula: In the formula, This represents the failure rate of a single resource channel within a single electronic module. Calculate the minimum number of electronic modules required to ensure the proper functioning of the electronic assembly. As shown in the following formula: In the formula, the symbol It represents rounding up.

3. The reliability modeling and prediction method for electronic assemblies according to claim 1, characterized in that: The voting model has simplified Type I, Type II, and Type III models, which are as follows: When a single electronic module consists only of redundant links and resource links, and the redundant links consist of multiple redundant channels that back each other up, and the resource links consist of multiple identical resource channels, then... The voting model simplifies to a Type I model, which is represented as follows: Voting model; in which, The known conditions for the occurrence of voting in the Type I model are that the internal structure of the electronic module includes redundant links consisting of multiple redundant channels, and... A resource link consisting of multiple resource channels; When a single electronic module consists only of a single-point link and a resource link, and the resource link consists of multiple identical resource channels, then The voting model is simplified to a Type II model, which is represented as follows: Voting model; in which, The known conditions under which voting occurs in the Type II model represent the internal structure of the electronic module, which includes single-point links and is composed of... A resource link consisting of multiple resource channels; When a single electronic module consists only of a single-point link and a redundant link, and the redundant link consists of multiple redundant channels that serve as backups for each other, then The voting model is simplified to a Type III model, which is represented as follows: Voting model; in which, The known conditions under which the vote occurs are that the internal structure of the electronic module includes single-point links and redundant links.

4. The reliability modeling and prediction method for electronic assemblies according to claim 3, characterized in that: when When the voting model is simplified to a Type I model, the mathematical model for the reliability of the "pool-like resource" of the electronic combination in step S23 is established by the following expression: In the formula, represent The reliability of electronic combination tasks at any given time; This represents the minimum number of electronic modules required to ensure the proper functioning of the electronic assembly. Represents the internal redundant links of a single electronic module. Real-time task reliability; A single resource channel representing the interior of a single electronic module Real-time task reliability; These represent intermediate calculation parameters of the model expression.

5. The reliability modeling and prediction method for electronic assemblies according to claim 3, characterized in that: when When the voting model is simplified to a Type II model, the mathematical model for the reliability of the "pool-like resource" of the electronic combination in step S23 is established by the following expression: In the formula, represent The reliability of electronic combination tasks at any given time; This represents the minimum number of electronic modules required to ensure the proper functioning of the electronic assembly. Represents a single point link within a single electronic module. Real-time task reliability; A single resource channel representing the interior of a single electronic module Real-time task reliability; These represent intermediate calculation parameters of the model expression.

6. The reliability modeling and prediction method for electronic assemblies according to claim 3, characterized in that: when When the voting model is simplified to a Type III model, the mathematical model for the reliability of the "pool-like resource" of the electronic combination in step S23 is established by the following expression: In the formula, represent The reliability of electronic combination tasks at any given time; This represents the minimum number of electronic modules required to ensure the proper functioning of the electronic assembly. Represents a single point link within a single electronic module. Real-time task reliability; Represents the internal redundant links of a single electronic module. Real-time task reliability; These represent intermediate calculation parameters of the model expression.

7. The reliability modeling and prediction method for electronic assemblies according to claim 1, characterized in that: Following step S4, the method further includes: S5, calculating the mean time between serious failures (MTBF) of the electronic assembly; in step S5, the MTBF of the electronic assembly is calculated using the following formula. : In the formula, represent The reliability of electronic assembly tasks at any given time.

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