A gravity-type low-temperature testing production method and equipment

Abstract

The present invention discloses a gravity-type low-temperature test production method and equipment, and relates to the field of low-temperature test production equipment. It includes a test box, on which a product feeding system is provided, and a low-temperature sealing and defrosting system is also installed in the test box, and a track conveying system is installed at the discharge end of the product feeding system, and a visual screening system is provided above the track conveying system, and the visual screening system is used to detect products with deformed pins, and the track conveying system is used to send products with qualified pins into the low-temperature sealing and defrosting system. In this application, by arranging a product feeding system and a track conveying system on the test box, it is easy to stably and orderly supply products from the feeding system to the track conveying system during test production, and the first feeding track device and the second feeding track device in the track conveying system are inclined, which is easy for the product to be directional by its own gravity.

Description

Technical Field

[0001] The invention relates to the technical field of low-temperature testing production equipment, and in particular to a gravity-type low-temperature testing production method and equipment. Background Art

[0002] In a low-temperature environment, the chip material may become brittle due to the low temperature, making the chip fragile and easy to damage. Low temperature may also affect the electronic components in the chip circuit, causing them to fail. Therefore, low-temperature testing is required during chip production to verify its low-temperature resistance, performance stability and reliability to ensure that the chip can work normally in a low-temperature environment.

[0003] The existing Chinese patent with publication number CN117686886A discloses a chip high and low temperature testing and AOI detection equipment and detection method. The detection equipment includes a base, a low temperature probe testing mechanism, a high temperature probe testing mechanism, an AOI detection mechanism and a conveying mechanism. The AOI detection mechanism includes a front detection module, a front face detection module, a rear face detection module, a back face detection module and an AOI turntable module. The AOI turntable module is installed on the base and is located on the left side of the high temperature probe testing mechanism. The front detection module is arranged above the AOI turntable module.

[0004] With regard to the above-mentioned related technologies, it is found that existing low-temperature testing production equipment usually adopts a mechanical suction nozzle mechanism to transfer chip products using a translational motion method. This method has high requirements on the factory's vacuum air source. When the vacuum is insufficient, it is easy to cause problems such as misalignment or loss of the material.

[0005] At the same time, during the chip testing and production process in a low-temperature chamber, once the chip pins are deformed, it is easy to cause a jamming failure. It is very difficult to handle product jamming failures in a low-temperature and closed environment, and it is necessary to restore the temperature to normal before processing, resulting in a long processing cycle.

[0006] In addition, the low-temperature systems of low-temperature testing production equipment mostly use liquid nitrogen for refrigeration operations. The storage, transportation and management costs of liquid nitrogen are relatively high, and liquid nitrogen is a consumable. Long-term use will increase the unit cost of production. Summary of the invention

[0007] In order to achieve the effect of transferring chips without using a vacuum air source and refrigerating without using liquid nitrogen, the present application provides a gravity-type low-temperature testing production method and equipment.

[0008] The present invention is achieved in that:

[0009] A gravity-type low-temperature testing production method and equipment, including a test box, a product feeding system is arranged on the test box, and a low-temperature sealing and defrosting system is also installed in the test box, a track conveying system is installed at the discharge end of the product feeding system, a visual screening system is arranged above the track conveying system, the visual screening system is used to detect products with deformed pins, the track conveying system is used to feed products with qualified pins into the low-temperature sealing and defrosting system, a product classification and recovery system is arranged at the lower end of the low-temperature sealing and defrosting system, the product classification and recovery system is used to classify and grade the products according to the low-temperature test data, and also includes a refrigerator control system for controlling the temperature of the low-temperature sealing and defrosting system.

[0010] By adopting the above technical scheme, the test box is used as the main structure of the test equipment. When it is easy to use, a product feeding system can be set on the test box to ensure that the product feeding system is used as the chip feeding end. When the chips are put into the product feeding system during use, the product feeding system can sort the chips and automatically sort them and then stably output them to the track conveying system. After the chips enter the track conveying system, the visual screening system can first be used to eliminate and recycle the products with deformed chip pins, and the products with normal pins can be used to slide down to the low-temperature sealed defrosting system at the lower end by their own gravity. The products entering the low-temperature sealed defrosting system are first soaked in low-temperature preheating, and then undergo low-temperature testing and production in a low-temperature environment. After the test, they are heated to restore to normal temperature, and then the product classification and recycling system can classify and recycle them according to the low-temperature test data.

[0011] Furthermore, the product feeding system includes a feeding control cabinet, a vibrating automatic feeding device and a feeding ion fan. The feeding control cabinet and the vibrating automatic feeding device are fixedly mounted on the upper end surface of the test box, and a sorting discharge rail is installed on the vibrating automatic feeding device. The feeding ion fan is arranged directly above the vibrating automatic feeding device.

[0012] By adopting the above technical scheme, the structural setting of the product feeding system can ensure that the vibration automatic feeding device can be controlled by the feeding control cabinet during the production and processing process, and ensure that the chips put into the vibration automatic feeding device can be moved in an orderly manner along the track through vibration, and finally the chips can be slid out in an orderly manner along the sorting and discharging track. At the same time, during the process of chip placement and sorting, the processing environment can be electrostatically treated by the feeding ion fan, which can effectively prevent electrostatic pollution.

[0013] Furthermore, the track conveying system includes a linear feeding track device, a track slide platform device and a mobile shuttle device, one end of the linear feeding track device is connected to the lower end of the sorting and discharging track, the track slide platform device is fixedly installed at the other end of the linear feeding track device, and the mobile shuttle device is slidably installed on the track slide platform device.

[0014] By adopting the above technical scheme, the structure of the track conveying system is set to ensure that the linear feed track device can be connected with the sorting and discharging track during use, ensuring that the chips on the sorting and discharging track can stably flow into the linear feed track device, and a track slide platform device is set at the lower position of the linear feed track device, and the mobile shuttle device is installed through the track slide platform device. The mobile shuttle device can move horizontally on the track slide platform device, so as to realize the selection of discharging the chips on the linear feed track device to any track or removing the chips.

[0015] Furthermore, a full material detection sensor and a lack of material detection sensor are installed on the linear feeding track device.

[0016] By adopting the above technical solution, by installing full material detection sensors and lack of material detection sensors on the linear feeding track device, the purpose of automatic detection of lack of material in the full material box can be achieved. In this way, during the test production process, if the full material is detected, the vibrating automatic feeding device will automatically stop supplying chips, and when the lack of material is detected, the automatic feeding device can be started to automatically start supplying chips.

[0017] Furthermore, a defective product recovery device is provided on the track slide platform device, and a guide shell corresponding to the mobile shuttle device is fixedly installed on the upper end of the defective product recovery device.

[0018] By adopting the above technical solution, a defective product recovery device is arranged on the track slide platform device, which can be easily used by cooperating with the mobile shuttle device through the guide shell. When the mobile shuttle device needs to remove unqualified chips, it can be moved to the position corresponding to the guide shell, and the unqualified chips can be slid from the guide shell into the defective product recovery device, thereby realizing the rapid recovery of defective products.

[0019] Furthermore, the track slide platform device is obliquely provided with a first feed track device and a second feed track device corresponding to the mobile shuttle device, the first feed track device and the second feed track device are both arranged as arc structures, and the lower ends of the first feed track device and the second feed track device are both connected to the low-temperature sealing defrosting system.

[0020] By adopting the above technical solution, by tilting the first feed track device and the second feed track device on the track slide platform device, visually qualified products can be diverted, so that the qualified products can slide down from the first feed track device and the second feed track device into the low-temperature sealing defrost system at the lower end respectively, and at the same time, two sets of low-temperature sealing defrost systems are arranged in the test box corresponding to the first feed track device and the second feed track device at the upper end, so that the purpose of simultaneous testing of the two parts can be achieved in the actual production process, thereby greatly improving the efficiency of the test.

[0021] Furthermore, the low-temperature sealed defrost system includes a pre-temperature track device, a low-temperature testing device, a heating and temperature recovery device and a movable material distribution device, the pre-temperature track device is connected to the lower end of the first feeding track device or the second feeding track device, the low-temperature testing device is arranged at the lower end of the pre-temperature track device, the heating and temperature recovery device is arranged at the lower end of the low-temperature testing device, and the movable material distribution device is horizontally installed at the lower end of the heating and temperature recovery device.

[0022] By adopting the above technical scheme, through the structural setting of the low-temperature sealed defrosting system, it is easy to test the chip by firstly preheating the chip through the preheating track device, and then perform low-temperature testing through the low-temperature testing device. This can avoid the situation where the temperature difference of the chip is too large and the test data is not accurate. After the low-temperature test is completed, the chip can be restored to normal temperature through the heating and temperature return device. Finally, the mobile material distribution device can classify and recycle according to the low-temperature test data of each chip.

[0023] Furthermore, the refrigerator control system is provided with a cooling liquid supply return system connected to the low-temperature sealed defrosting system.

[0024] By adopting the above technical solution, the temperature in the low-temperature sealed defrosting system is controlled by setting up a refrigerator control system and a coolant supply return system.

[0025] A gravity-type low-temperature test production method comprises the following steps:

[0026] S1: Automatic product feeding, the product is automatically sorted and directed to the linear feeding track device through the product feeding system;

[0027] S2: Visual appearance inspection, qualified products proceed to the next step, and unqualified products are recycled through the defective product recycling device;

[0028] S3: Divide qualified products of external tubes into Group A and Group B;

[0029] S4: Low temperature test operation, the products of group A and group B are subjected to pre-temperature track, low temperature test and heating and temperature return treatment respectively;

[0030] S5: Product classification and recycling, according to the low temperature test data, the products are classified and recycled by mobile material separation device

[0031] Furthermore, the defective products in S2 are removed by moving the shuttle device to send the defective products to the defective product recovery device.

[0032] Compared with the prior art, the present invention has the following beneficial effects:

[0033] (1) The present application sets a product feeding system and a track conveying system on the test box, so that the products can be stably and orderly supplied from the feeding system to the track conveying system during the test production. The first feeding track device and the second feeding track device in the track conveying system are inclined, so that the products can be directed by their own gravity to achieve the purpose of stably transferring the products to the low-temperature sealed defrosting system. This operation method does not require the factory's vacuum air source, and can eliminate the problem of misalignment or loss of materials due to insufficient vacuum, thereby achieving stable position transfer of products.

[0034] (2) The present application sets a visual screening system above the track conveying system to ensure that the visual screening system can screen the appearance of the product before the product enters the low-temperature sealed defrost system, thereby enabling the timely removal of products with deformed pins and collecting them together through a defective product recovery device. Only products that pass the visual screening can stably enter the low-temperature sealed defrost system at the lower end, thereby reducing or avoiding the occurrence of product jamming failures in the low-temperature sealed defrost system.

[0035] (3) The present application uses a coolant supply and return system to control the temperature of the low-temperature sealed defrost system. The coolant supply and return system adopts a compressor refrigeration system. When in use, the coolant circulation tank is first cooled and refrigerated, and then the coolant is transferred to the pre-heating area and test area of ​​the low-temperature sealed cavity through a hydraulic pump and the coolant supply and return system 8, so that the production and test product track in the cavity reaches the set low temperature, thereby achieving a liquid nitrogen-free refrigeration effect. BRIEF DESCRIPTION OF THE DRAWINGS

[0036] In order to more clearly illustrate the technical solutions of the embodiments of the present invention, the following briefly introduces the drawings required for use in the embodiments. It should be understood that the following drawings only show certain embodiments of the present invention and therefore should not be regarded as limiting the scope. For ordinary technicians in this field, other related drawings can be obtained based on these drawings without creative work.

[0037] Figure 1is a three-dimensional diagram of the overall structure of the device embodiment of the present invention;

[0038] Figure 2 is a front view of the overall structure of the device embodiment of the present invention;

[0039] Figure 3 is a top view of the overall structure of the device embodiment of the present invention;

[0040] Figure 4 It is a three-dimensional diagram of the coordination of the product feeding system and the track conveying system in the embodiment of the device of the present invention;

[0041] Figure 5 yes Figure 4 a side view of the device shown;

[0042] Figure 6 yes Figure 4 a top view of the device shown;

[0043] Figure 7 It is a working principle diagram of an embodiment of the device of the present invention;

[0044] Figure 8 It is a flow chart of the low temperature test production method of the present invention.

[0045] In the figure: 1. Test box; 2. Product feeding system; 21. Feed control cabinet; 22. Vibrating automatic feeding device; 221. Sorting and discharging rail; 23. Feeding ion fan; 3. Low-temperature sealing and defrosting system; 31. Pre-temperature track device; 32. Low-temperature testing device; 33. Heating and temperature return device; 34. Mobile material distribution device; 4. Track transmission system; 41. Linear feeding track device; 411. Full material inspection sensor; 412. Lack of material inspection sensor; 42. Track slide platform device; 421. First feeding track device; 422. Second feeding track device; 43. Mobile shuttle device; 44. Defective product recovery device; 441. Guide shell; 5. Visual screening system; 6. Product classification and recovery system; 7. Refrigeration machine control system; 8. Cooling liquid supply and return system. DETAILED DESCRIPTION

[0046] In order to make the purpose, technical solutions and advantages of the embodiments of the present invention clearer, the technical solutions in the embodiments of the present invention will be clearly and completely described below in conjunction with the drawings in the embodiments of the present invention. Obviously, the described embodiments are part of the embodiments of the present invention, not all of the embodiments. Based on the embodiments of the present invention, all other embodiments obtained by ordinary technicians in this field without creative work are within the scope of protection of the present invention. Therefore, the following detailed description of the embodiments of the present invention provided in the drawings is not intended to limit the scope of the invention claimed for protection, but merely represents selected embodiments of the present invention.

[0047] Reference Figure 1 , Figure 2 and Figure 3 As shown, a gravity-type low-temperature testing production method and equipment include a test box 1, a product feeding system 2 is arranged on the test box 1, and a low-temperature sealing and defrosting system 3 is also installed in the test box 1, a track conveying system 4 is installed at the discharge end of the product feeding system 2, a visual screening system 5 is arranged above the track conveying system 4, the visual screening system 5 is used to detect products with deformed pins, the track conveying system 4 is used to feed products with qualified pins into the low-temperature sealing and defrosting system 3, a product classification and recovery system 6 is arranged at the lower end of the low-temperature sealing and defrosting system 3, the product classification and recovery system 6 is used to classify and grade the products according to the low-temperature test data, and also includes a refrigerator control system 7 for controlling the temperature of the low-temperature sealing and defrosting system 3. The test box 1 is used as the main structure of the test equipment. When it is easy to use, a product feeding system 2 can be set on the test box 1 to ensure that the product feeding system 2 is used as the chip feeding end. When the chip is put into the product feeding system 2, the product feeding system 2 can sort the chips and automatically sort them and then stably output them to the track conveying system 4. After the chips enter the track conveying system 4, the visual screening system 5 can be used to eliminate and recycle the products with deformed chip pins, and the products with normal pins can be made to slide down to the low-temperature sealing and defrosting system 3 at the lower end by their own gravity. The products entering the low-temperature sealing and defrosting system 3 are first soaked in low-temperature preheating, and then subjected to low-temperature testing and production in a low-temperature environment. After the test, they are heated to restore to normal temperature, and then the product classification and recycling system 6 can classify and recycle them according to the low-temperature test data.

[0048] Reference Figure 3 and Figure 4 As shown, the product feeding system 2 includes a feeding control cabinet 21, a vibration automatic feeding device 22 and a feeding ion fan 23. The feeding control cabinet 21 and the vibration automatic feeding device 22 are both fixedly mounted on the upper end surface of the test box 1, and a sorting and discharging track 221 is mounted on the vibration automatic feeding device 22. The feeding ion fan 23 is arranged just above the vibration automatic feeding device 22. The structural setting of the product feeding system 2 ensures that the vibration automatic feeding device 22 can be controlled by the feeding control cabinet 21 during the production and processing process, and ensures that the chips put into the vibration automatic feeding device 22 can be moved in an orderly manner along the track through vibration, and finally the chips can slide out in an orderly manner along the sorting and discharging track 221. At the same time, during the process of chip placement and sorting, the processing environment can be electrostatically treated by the feeding ion fan 23, which can effectively prevent electrostatic pollution.

[0049] Reference Figure 4 , Figure 5 and Figure 6 As shown, the track conveying system 4 includes a linear feeding track device 41, a track slide platform device 42 and a mobile shuttle device 43. One end of the linear feeding track device 41 is connected to the lower end of the sorting and discharging track 221, the track slide platform device 42 is fixedly installed at the other end of the linear feeding track device 41, and the mobile shuttle device 43 is slidably installed on the track slide platform device 42. The structural setting of the track conveying system 4 ensures that the linear feeding track device 41 can be used to cooperate with the sorting and discharging track 221 to ensure that the chips on the sorting and discharging track 221 can stably flow into the linear feeding track device 41, and the track slide platform device 42 is set at the lower section of the linear feeding track device 41, and the mobile shuttle device 43 is installed through the track slide platform device 42. The mobile shuttle device 43 can move horizontally on the track slide platform device 42 to select to discharge the chips on the linear feeding track device 41 to any track or to remove the chips.

[0050] Reference Figure 4 and Figure 5 As shown, a full material check sensor 411 and a short material check sensor 412 are installed on the linear feed track device 41. By installing the full material check sensor 411 and the short material check sensor 412 on the linear feed track device 41, the purpose of automatically detecting the short material of the full material box is achieved. In this way, in the test production process, if the full material is detected, the vibration automatic feeder 22 will automatically stop supplying chips, and when the short material is detected, the automatic feeder 22 can be started to automatically start supplying chips.

[0051] Reference Figure 5 and Figure 6As shown, a defective product recovery device 44 is provided on the track slide platform device 42, and a guide shell 441 corresponding to the mobile shuttle device 43 is fixedly installed on the upper end of the defective product recovery device 44. By providing the defective product recovery device 44 on the track slide platform device 42, the guide shell 441 can be used to cooperate with the mobile shuttle device 43 when it is easy to use. When the mobile shuttle device 43 needs to remove unqualified chips, it can be moved to the position corresponding to the guide shell 441, and the unqualified chips can be slid from the guide shell 441 into the defective product recovery device 44, so as to achieve rapid recovery of defective products. A first feed track device 421 and a second feed track device 422 corresponding to the mobile shuttle device 43 are obliquely provided on the track slide platform device 42, and the first feed track device 421 and the second feed track device 422 are both arranged as arc structures, and the lower ends of the first feed track device 421 and the second feed track device 422 are both connected to the low-temperature sealing defrosting system 3. By obliquely setting the first feed track device 421 and the second feed track device 422 on the track slide platform device 42, visually qualified products can be diverted so that the qualified products can slide down from the first feed track device 421 and the second feed track device 422 to the low-temperature sealing defrost system 3 at the lower end respectively. At the same time, two sets of low-temperature sealing defrost systems 3 are arranged in the test box 1 to correspond to the first feed track device 421 and the second feed track device 422 at the upper end. In this way, the purpose of simultaneous testing of two parts can be achieved in the actual production process, thereby greatly improving the efficiency of the test.

[0052] Reference Figure 2 As shown, the low-temperature sealed defrosting system 3 includes a pre-temperature track device 31, a low-temperature testing device 32, a heating and temperature recovery device 33 and a moving material distribution device 34. The pre-temperature track device 31 is connected to the lower end of the first feeding track device 421 or the second feeding track device 422, the low-temperature testing device 32 is arranged at the lower end of the pre-temperature track device 31, the heating and temperature recovery device 33 is arranged at the lower end of the low-temperature testing device 32, and the moving material distribution device 34 is horizontally installed at the lower end of the heating and temperature recovery device 33. By setting the structure of the low-temperature sealed defrosting system 3, it is easy to test the chip by firstly performing low-temperature pre-temperature treatment on the chip through the pre-temperature track device 31, and then performing low-temperature testing through the low-temperature testing device 32, which can avoid the situation that the temperature difference of the chip changes too much and causes the test data to be inaccurate. After the low-temperature test is completed, the chip can be restored to a normal temperature state through the heating and temperature recovery device 33. Finally, the moving material distribution device 34 can classify and recycle according to the low-temperature test data of each chip.

[0053] Reference Figure 1 and Figure 3As shown, the refrigerator control system 7 is provided with a coolant supply and return system 8 connected to the low-temperature sealed defrosting system 3. The temperature in the low-temperature sealed defrosting system 3 is controlled by the setting of the refrigerator control system 7 and the coolant supply and return system 8. The low-temperature system in the refrigerator control system 7 adopts a compressor refrigeration system, which first cools the coolant circulation tank, and transmits it to the pre-heating area and test area of ​​the low-temperature sealed cavity through a hydraulic pump in conjunction with the coolant supply and return system 8, so that the production and test product track in the cavity reaches the set low temperature, and the temperature is monitored by the temperature sensor set in the track.

[0054] Working principle: when testing is actually needed, the vibrating automatic feeding device 22 and the feeding ion fan 23 are turned on through the feeding control cabinet 21, and then the product is directly put into the automatic feeding device to be sorted and then stably flow out from the sorting discharge rail 221 to the linear feeding track device 41, and then the visual screening system 5 is used to identify the deformed pins of the products, and the mobile shuttle device 43 can discharge the products with deformed pins into the defective product recovery device 44, and the mobile shuttle device 43 can send the qualified products of the visual monitoring into the first feeding track device 421 and the second feeding track device 422, and the product is transported to the low-temperature sealing defrosting system 3 along the feeding track by its own gravity, and is successively passed through the pre-temperature track device 31, the low-temperature test device 32 and the heating and temperature return device 33 to pre-cool the product, perform low-temperature test and heat and temperature return treatment, and the treated product can be sent to the product classification and recovery system 6 by the mobile dividing device 34 according to the low-temperature test data.

[0055] A gravity-type low-temperature test production method comprises the following steps:

[0056] S1: Automatic product feeding, the products are automatically sorted and directed to the linear feeding track device through the product feeding system.

[0057] S2: Visual appearance inspection, qualified products enter the next step, and unqualified products are recycled through the defective product recycling device, which is sent to the defective product recycling device by moving the shuttle device.

[0058] S3: The qualified products of the outer tube are divided into Group A and Group B.

[0059] S4: Low temperature testing operation, the products of group A and group B are subjected to pre-temperature track, low temperature testing and heating and temperature return treatment respectively.

[0060] S5: Product classification and recycling: According to the low-temperature test data, the products are classified and recycled by mobile sorting devices.

[0061] The above description is only a preferred embodiment of the present invention and is not intended to limit the present invention. For those skilled in the art, the present invention may have various modifications and variations. Any modification, equivalent replacement, improvement, etc. made within the spirit and principle of the present invention shall be included in the protection scope of the present invention.

Claims

1. A gravity-type low-temperature testing device, comprising a testing box (1), characterized in that: The test box (1) is provided with a product feeding system (2), and a low-temperature sealing and defrosting system (3) is also installed in the test box (1). A track conveying system (4) is installed at the discharge end of the product feeding system (2). A visual screening system (5) is arranged above the track conveying system (4). The visual screening system (5) is used to detect products with deformed pins. The track conveying system (4) is used to send products with qualified pins into the low-temperature sealing and defrosting system (3). A product classification and recovery system (6) is arranged at the lower end of the low-temperature sealing and defrosting system (3). The product classification and recovery system (6) is used to classify products according to low-temperature test data. The invention relates to a method for recycling by sorting and grading, and also includes a refrigerator control system (7) for controlling the temperature of the low-temperature sealed defrosting system (3). The track conveying system (4) includes a linear feeding track device (41), a track slide platform device (42) and a mobile shuttle device (43). One end of the linear feeding track device (41) is connected to the lower end of the sorting and discharging track (221), the track slide platform device (42) is fixedly installed at the other end of the linear feeding track device (41), the mobile shuttle device (43) is slidably installed on the track slide platform device (42), and a full material detection sensor (43) is installed on the linear feeding track device (41). 411) and a material shortage detection sensor (412), a defective product recovery device (44) is arranged on the track slide platform device (42), a guide shell (441) corresponding to the mobile shuttle device (43) is fixedly installed on the upper end of the defective product recovery device (44), a first feed track device (421) and a second feed track device (422) corresponding to the mobile shuttle device (43) are obliquely arranged on the track slide platform device (42), the first feed track device (421) and the second feed track device (422) are both arranged in an arc structure, and the first feed track device (421) and the second feed track device (422) The lower ends of the two feeding rails (421 and 422) are connected to a low-temperature sealed defrosting system (3), wherein the low-temperature sealed defrosting system (3) comprises a pre-heating track device (31), a low-temperature testing device (32), a heating and temperature return device (33) and a movable material distribution device (34), wherein the pre-heating track device (31) is connected to the lower end of the first feeding track device (421) or the second feeding track device (422), the low-temperature testing device (32) is arranged at the lower end of the pre-heating track device (31), the heating and temperature return device (33) is arranged at the lower end of the low-temperature testing device (32), and the movable material distribution device (34) is horizontally installed at the lower end of the heating and temperature return device (33).

2. A gravity-type low-temperature testing device according to claim 1, characterized in that: The product feeding system (2) comprises a feeding control cabinet (21), a vibrating automatic feeding device (22) and a feeding ion fan (23); the feeding control cabinet (21) and the vibrating automatic feeding device (22) are both fixedly mounted on the upper end surface of the test box (1); a sorting discharge rail (221) is mounted on the vibrating automatic feeding device (22); and the feeding ion fan (23) is arranged directly above the vibrating automatic feeding device (22).

3. A gravity-type low-temperature testing device according to claim 2, characterized in that: The refrigerator control system (7) is provided with a cooling liquid supply and return system (8) connected to the low-temperature sealing defrosting system (3).

4. A gravity-type low-temperature test production method using the gravity-type low-temperature test equipment according to any one of claims 1 to 3, characterized in that: The steps include: S1: Automatic product feeding, the product is automatically sorted and directed to the linear feeding track device through the product feeding system; S2: Visual appearance inspection, qualified products proceed to the next step, and unqualified products are recycled through the defective product recycling device; S3: Divide qualified products of external tubes into Group A and Group B; S4: Low temperature test operation, the products of group A and group B are subjected to pre-temperature track, low temperature test and heating and temperature return treatment respectively; S5: Product classification and recycling: According to the low-temperature test data, the products are classified and recycled by mobile sorting devices.

5. A gravity-type low-temperature testing production method according to claim 4, characterized in that: The defective products in S2 are removed by moving the shuttle device to send the defective products to the defective product recovery device.

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