A test method and device for CT detector package performance

Abstract

The application discloses a kind of test method and device for the packaging performance of CT detector, the method is applied to first equipment;Specifically include: for any target pixel point on CT detector after filling optical glue: obtain the first light response data corresponding to target pixel point at different acquisition time, generate first light response data set;First light response data set is carried out denoising processing, generate the second light response data set corresponding to optical glue at target pixel point;Determine the packaging performance of optical glue at target pixel point based on second light response data set;The packaging performance between CT detector scintillator and photodiode is determined based on the packaging performance of optical glue at each target pixel point in CT detector after filling optical glue.Therefore, whether there is bubble and gap between scintillator and photodiode can be effectively detected, solve the material loss problem caused by poor packaging of CT detector due to lack of detection control in prior art.

Description

TECHNICAL FIELD

[0001] The present application belongs to the technical field of CT detector packaging, and particularly relates to a CT detector packaging performance testing method and device. BACKGROUND

[0002] The detector is a key device for collecting image data of a CT system, and plays a vital role in the entire CT system. During the scanning process of the CT system, the X-ray emitted by the ball tube passes through a certain part of the human body, the detector collects the X-ray, converts it into an electrical signal, and then converts it into digital information through a data acquisition and conversion unit, and stores it in an image processing system. The image processing system generates an image through a series of correction algorithms and image reconstruction algorithms, and displays the image on a display.

[0003] In the detector, the scintillator emits visible light after receiving the X-ray, and the PD (Photo-Diode) can convert the visible light into an electrical signal through photoelectric conversion, which is output by the output circuit. In the detector assembly process, the scintillator and the PD are bonded by optical glue. The specific process is to first use a machine to point UV glue on the PD, then paste the scintillator sheet on the PD, pre-cure the UV glue, then fill the optical glue, and then perform heating and curing for several hours to complete the packaging step. The detector requires that there should be no gap or bubble in the optical glue, because even a small bubble can cause poor light output uniformity of the detector, and the bubble will change due to temperature changes, affecting the long-term working stability of the detector; therefore, the packaging of the scintillator and the PD is one of the difficulties in the detector assembly process, and is also the process link most prone to detector failure.

[0004] Once the optical glue is completed in the packaging process of the scintillator and the PD, it is difficult to rework the packaging between the scintillator and the PD in the detector, and there is a lack of detection of the packaging process in the prior art. When the defect is finally found, the detector can only be scrapped. Therefore, there is an urgent need for a detection means for detecting whether there is a gap or bubble between the scintillator and the PD. SUMMARY

[0005] In view of the above problems existing in the prior art, the present application provides a CT detector packaging performance testing method and device, which can detect and control the packaging performance between the scintillator and the photodiode of the CT detector in the packaging process, and avoid the problem of material scrapping due to difficult rework caused by poor packaging.

[0006] According to a first aspect of an embodiment of the present application, a method for testing the packaging performance of a CT detector is provided. The CT detector includes a CT detector scintillator and a photodiode. A plurality of pixel points are distributed on the CT detector. The method is applied to a first device. For any target pixel point on the CT detector after the optical glue is filled, first light response data corresponding to the target pixel point at different collection times is obtained to generate a first light response data set. The first light response data set is denoised to generate a second light response data set corresponding to the optical glue at the target pixel point. The packaging performance of the optical glue at the target pixel point is determined based on the second light response data set. The packaging performance between the CT detector scintillator and the photodiode is determined based on the packaging performance of the optical glue at each target pixel point on the CT detector after the optical glue is filled.

[0007] Optionally, the denoising of the first light response data set to generate the second light response data set corresponding to the optical glue at the target pixel point includes: obtaining third light response values of the target pixel point on the CT detector after the pre-cured UV glue at different collection times to generate a third light response data set; and correcting the first light response data set using the third light response data set to generate the second light response data set corresponding to the optical glue at the target pixel point.

[0008] Optionally, the correction of the first light response data set using the third light response data set to generate the second light response data set corresponding to the optical glue at the target pixel point includes: normalizing the third light response data set to generate a normalized third light response data set; normalizing the first light response data set to generate a normalized first light response data set; and correcting the normalized first light response data set using the normalized third light response data set to generate the second light response data set corresponding to the optical glue at the target pixel point.

[0009] Optionally, the normalization of the third light response data set to generate the normalized third light response data set includes: determining a third light response mean vector corresponding to the time direction along the collection time based on the third light response data corresponding to different collection times in the third light response data set; determining a third light response total vector corresponding to the CT detector after the pre-cured UV glue according to the third light response mean vector corresponding to each target pixel point; and correcting the third light response mean vector using the third light response total vector to generate the normalized third light response data set.

[0010] Optionally, the normalization processing on the first light response data set to generate a normalized first light response data set comprises: determining a first light response mean vector corresponding to a time direction along the acquisition time based on the first light response data corresponding to different acquisition times in the first light response data set; determining a first light response total vector corresponding to the CT detector after the optical glue is filled based on the first light response mean vector corresponding to each target pixel point; and correcting the first light response mean vector based on the first light response total vector to generate the normalized first light response data set.

[0011] Optionally, the determination of the packaging performance of the optical glue at the target pixel point based on the second light response data comprises: detecting the second light response data set; if the detection result indicates that the second light response data set is within a preset threshold range, determining that the packaging of the optical glue at the target pixel point is qualified; and if the detection result indicates that the second light response data set is not within the preset threshold range, determining that the packaging of the optical glue at the target pixel point is unqualified.

[0012] Optionally, the determination of the packaging performance between the CT detector scintillator and the photodiode based on the packaging performance of the optical glue at each target pixel point in the CT detector after the optical glue is filled comprises: if the packaging of the optical glue at each target pixel point in the CT detector after the optical glue is filled is qualified, determining that the packaging between the CT detector scintillator and the photodiode is good; and if the packaging of the optical glue at at least one target pixel point in the CT detector after the optical glue is filled is unqualified, determining that the packaging between the CT detector scintillator and the photodiode is abnormal, and sending a prompt information of re-packaging.

[0013] According to the second aspect of the embodiment of the present application, a testing system for the packaging performance of a CT detector is further provided. The detector comprises a CT detector scintillator and a photodiode. A plurality of pixel points are distributed on the CT detector. The testing system is applied to a first device. A first determination module is configured to, for any target pixel point on the CT detector after the optical glue is filled: acquire first light response data corresponding to the target pixel point at different acquisition times to generate a first light response data set; perform denoising processing on the first light response data set to generate a second light response data set corresponding to the optical glue at the target pixel point; and determine the packaging performance of the optical glue at the target pixel point based on the second light response data set. A second determination module is configured to determine the packaging performance between the CT detector scintillator and the photodiode based on the packaging performance of the optical glue at each target pixel point in the CT detector after the optical glue is filled.

[0014] According to a third aspect of the embodiments of the present application, a test device for detecting the packaging performance of a detector is provided, comprising: a shell for shielding external stray light; a test platform arranged inside the shell; the test platform comprises a positioning part, a flat light source, and a main control part; the positioning part is used for fixing a detector sample; the flat light source is installed on the positioning part and is used for providing a parallel light beam for the detector sample on the positioning part; the main control part is electrically connected with the flat light source and the detector sample respectively; the main control part is used for controlling the flat light source to turn on based on a target operation triggered by a target object, and collecting light response data of the detector sample after determining that the flat light source has been turned on for a preset time.

[0015] According to a fourth aspect of the embodiments of the present application, a computer readable medium having a computer program stored thereon is provided, the program being executed by a processor to implement the method according to the first aspect.

[0016] The embodiments of the present application provide a test method and device for the packaging performance of a CT detector, the CT detector comprising a CT detector scintillator and a photodiode; a plurality of pixel points are distributed on the CT detector; the method is applied to a first device; the method comprises the following steps: firstly, for any target pixel point on the CT detector after filling with optical glue: acquiring first light response data corresponding to the target pixel point at different acquisition times to generate a first light response data set; performing denoising processing on the first light response data set to generate a second light response data set corresponding to the optical glue at the target pixel point; determining the packaging performance of the optical glue at the target pixel point based on the second light response data set; secondly, determining the packaging performance between the CT detector scintillator and the photodiode based on the packaging performance of the optical glue at each target pixel point in the CT detector after filling with optical glue. In the embodiments, the light response data set corresponding to the target pixel point on the CT detector after filling with optical glue is denoised, and the packaging performance of the optical glue at the target pixel point is determined based on the denoised light response data set; thus, whether there is a bubble or gap between the CT detector scintillator and the photodiode can be effectively detected, and the problem of material scrapping due to poor packaging of the CT detector and the inability to rework in the prior art is solved. BRIEF DESCRIPTION OF DRAWINGS

[0017] Some specific embodiments of the present application will be described in detail hereinafter with reference to the accompanying drawings, which are presented by way of illustration and not of limitation. The same reference numbers in the drawings indicate the same or similar components or parts. It should be understood by those skilled in the art that the drawings are not necessarily drawn to scale. In the drawings:

[0018] Figure 1A structural schematic diagram of a test device for detector packaging performance provided by an embodiment of the present application is shown in the figure, wherein a shell 10, a test platform 20, a detector sample 30, a positioning part 201, a flat light source 202, a main control part 203, and a leveling structure 204 are shown in the figure.

[0019] Figure 2 A flowchart of a test method for CT detector packaging performance provided by an embodiment of the present application is shown in the figure.

[0020] Figure 3 A flowchart of denoising processing of a first light response data set provided by an embodiment of the present application is shown in the figure.

[0021] Figure 4 A structural schematic diagram of a test system for CT detector packaging performance provided by an embodiment of the present application is shown in the figure. DETAILED DESCRIPTION

[0022] In order to make the objectives, characteristics and advantages of the present application more obvious and easy to understand, the technical solutions in the embodiments of the present application will be described clearly and completely below with reference to the drawings in the embodiments of the present application. Obviously, the described embodiments are only a part of the embodiments of the present application, rather than all the embodiments of the present application. Based on the embodiments in the present application, all other embodiments obtained by those skilled in the art without creative labor fall within the scope of protection of the present application.

[0023] As shown in the figure, a structural schematic diagram of a test device for detector packaging performance provided by an embodiment of the present application is shown in the figure. Figure 1

[0024] A test device for detector packaging performance comprises:

[0025] A shell 10 is used to shield external stray light.

[0026] A test platform 20 is arranged inside the shell 10. The test platform 20 comprises a positioning part 201, a flat light source 202, and a main control part 203. The positioning part 201 is used to fix a detector sample 30. The flat light source 202 is installed on the positioning part 201 and is used to provide parallel light beams for the detector sample 30 on the positioning part 201. The main control part 203 is electrically connected to the flat light source 202 and the detector sample 30, respectively. The main control part 203 is used to control the flat light source 202 to be turned on based on a target operation triggered by a target object, and to collect light response data from the detector sample 30 after determining that the flat light source 202 has been turned on for a preset time.

[0027] ​In the preferred embodiment of the present application, the test platform 20 further comprises a leveling structure 204, which is arranged on the positioning part 201 and used to adjust the detector sample 30 so that the detector sample 30 and the flat light source 202 are kept parallel.

[0028] In the preferred embodiment of the present application, the main control part comprises a control circuit board, an acquisition circuit board and a power supply, the power supply is used to supply power to the detector sample and the flat light source, the control circuit board is electrically connected with the acquisition circuit board and the flat light source respectively, and the acquisition circuit board is electrically connected with the detector sample.

[0029] The control circuit board is used to control the flat light source to be turned on based on a target operation triggered by a target object, control the acquisition circuit board to start collecting light response data of the detector sample after determining that the flat light source has been turned on for a preset time, and control the acquisition circuit board to end the collection after a preset collection time is reached. The acquisition circuit board is used to process the collected light response data and output the packaging performance between the CT detector scintillator and the photodiode.

[0030] In the preferred embodiment of the present application, the main control part comprises a control circuit board, an acquisition circuit board and a power supply, the power supply is used to supply power to the detector sample and the flat light source, the control circuit board is electrically connected with the acquisition circuit board and the flat light source respectively, and the acquisition circuit board is electrically connected with the detector sample.

[0031] A data processor is electrically connected with the acquisition circuit board.

[0032] The control circuit board is used to control the flat light source to be turned on based on a target operation triggered by a target object, control the acquisition circuit board to start collecting light response data of the detector sample after determining that the flat light source has been turned on for a preset time, and control the acquisition circuit board to end the collection after a preset collection time is reached. The acquisition circuit board is used to process the collected light response data and output the packaging performance between the CT detector scintillator and the photodiode.

[0033] As shown in Figure 2 Fig. 1 is a flowchart of a method for testing the packaging performance of a CT detector according to an embodiment of the present application.

[0034] A test method for CT detector packaging performance, the CT detector comprising a CT detector scintillator and a photodiode; a plurality of pixel points are distributed on the CT detector; applied to a first device; the method at least comprises:

[0035] S201, for any target pixel point on the CT detector after filling the optical glue: obtaining the first light response data corresponding to the target pixel point at different acquisition time, generating the first light response data set; denoising the first light response data set to generate the second light response data set corresponding to the optical glue at the target pixel point; determining the packaging performance of the optical glue at the target pixel point based on the second light response data set;

[0036] S202, determining the packaging performance between the CT detector scintillator and the photodiode based on the packaging performance of the optical glue at each target pixel point in the CT detector after filling the optical glue.

[0037] The first device can be a data processor, and can also be an acquisition circuit board; the data processor can be arranged in the main control part or arranged outside the main control part.

[0038] In S201, the purpose of denoising is to exclude the influence of UV glue on parallel light source and the influence of scintillator material on the penetration difference of parallel light source. Here, the denoising method is not limited, as long as the above purpose can be achieved.

[0039] After filling the optical glue, the CT detector is installed in the positioning part of the test device;

[0040] The main control part outputs a control signal to turn on the flat light source in response to receiving a target operation triggered by a target object, and collects the first light response data corresponding to the CT detector at different acquisition time after determining that the flat light source is turned on for a preset time; wherein the first light response data is used to indicate the light response data of the target pixel point on the CT detector corresponding to different acquisition time. For example: the first light response data F0(x, y, t) is the light response data of the target pixel point on the n x m CT detector, wherein each group of third light response data corresponds to each time t, a total of T times, x represents the xth channel in the channel direction of the CT detector, n is the total number of channels in the channel direction of the CT detector, y represents the yth row in the row direction of the CT detector, and m is the total number of channels in the row direction of the CT detector.

[0041] The second light response data set is input into a pre-trained model for prediction processing, and the packaging performance of the optical glue at the target pixel point is output. Alternatively, the second light response data set is processed based on a preset rule, and the packaging performance of the optical glue at the target pixel point is output.

[0042] For example: the second light response dataset is detected; if the detection result indicates that the second light response dataset is within a preset threshold range, then the encapsulation of the optical adhesive at the target pixel is determined to be qualified; if the detection result indicates that the second light response dataset is not within the preset threshold range, then the encapsulation of the optical adhesive at the target pixel is determined to be unqualified.

[0043] For example, the statistical test formula for the CT detector channel labeled (x, y) is Equation (1):

[0044] R (x，y) =judge(F3(x,y),baseline);

[0045] Equation (1);

[0046] Where, baseline represents the criterion for judgment, which is a constant range; R (x，y) The statistical test results are for the (x, y) channel of the CT detector; F3(x, y) is the second photoresponse dataset.

[0047] If F3(x, y) is within the baseline range, then R (x，y) If the result is 0, then it is 1; otherwise, it is 1. If the test result R... (x，y) A value of 0 indicates that the CT detector pixel labeled (x, y) is well-packaged and meets the standard; if the test result R... (x，y) If the value is 1, it indicates that the optical adhesive encapsulation of the CT detector pixel labeled (x, y) is abnormal and needs to be re-encapsulated.

[0048] In S202, if the encapsulation of the optical adhesive at each target pixel in the CT detector is qualified after the optical adhesive is applied, then the encapsulation between the scintillator and the photodiode in the CT detector is determined to be good; if the encapsulation of the optical adhesive at at least one target pixel in the CT detector is unqualified after the optical adhesive is applied, then the encapsulation between the scintillator and the photodiode in the CT detector is determined to be abnormal, and a re-encapsulation prompt message is sent.

[0049] This embodiment performs noise reduction processing on the light response dataset corresponding to the target pixel on the CT detector after the optical adhesive is poured, and determines the encapsulation performance of the optical adhesive at the target pixel based on the noise-reduced light response dataset. As a result, it can effectively detect whether there are air bubbles and gaps between the scintillator and the photodiode, and solves the problem of material scrap caused by poor encapsulation of CT detectors due to the lack of detection and control in the encapsulation process in the prior art, which makes it impossible to rework them.

[0050] like Figure 3 The diagram shown is a schematic diagram of the process for denoising a first optical response dataset provided in one embodiment of the present invention.

[0051] The first light response data set is denoised, at least including the following steps:

[0052] S301, obtaining third light response values of target pixel points on the CT detector at different acquisition times after the pre-cured UV glue, and generating a third light response data set;

[0053] S302, correcting the first light response data set using the third light response data set to generate a second light response data set corresponding to the optical glue at the target pixel point.

[0054] In S301, the pre-cured UV glue CT detector is installed on the positioning part of the test device;

[0055] The main control part outputs a control signal to turn on the flat light source in response to receiving a target operation triggered by the target object, and collects third light response data corresponding to the CT detector at different acquisition times after determining that the flat light source is turned on for a predetermined time; wherein the third light response data is used to indicate the light response data of the target pixel points on the CT detector at different acquisition times. For example, the third light response data I0(x, y, t) is the light response data of the target pixel points on the n x m CT detector, wherein each set of third light response data corresponds to each time t, there are T times, x represents the xth channel in the channel direction of the CT detector, n is the total number of channels in the channel direction of the CT detector, y represents the yth row in the row direction of the CT detector, and m is the total number of channels in the row direction of the CT detector.

[0056] In S302, the third light response data set and the first light response data set are input into the pre-trained model for model training, and the second light response data set corresponding to the optical glue at the target pixel point is output; or, the first light response data set is corrected based on a predetermined rule using the third light response data set, and the second light response data set corresponding to the optical glue at the target pixel point is generated.

[0057] For example, the third light response data set is normalized to generate a normalized third light response data set; the first light response data set is normalized to generate a normalized first light response data set; and the normalized third light response data set is used to correct the normalized first light response data set to generate the second light response data set corresponding to the optical glue at the target pixel point.

[0058] The third light response data set is normalized to generate a normalized third light response data set; including: based on the third light response data corresponding to different collection time in the third light response data set, determining the third light response mean vector corresponding to the time direction along the collection time; according to the third light response mean vector corresponding to each target pixel point, determining the third light response total vector corresponding to the CT detector after the pre-cured UV glue; based on the third light response total vector, the third light response mean vector is corrected to generate a normalized third light response data set.

[0059] The first light response data set is normalized to generate a normalized first light response data set; including: based on the first light response data corresponding to different collection time in the first light response data set, determining the first light response mean vector corresponding to the time direction along the collection time; based on the first light response mean vector corresponding to each target pixel point, determining the first light response total vector corresponding to the CT detector after the optical glue is perfused; based on the first light response total vector, the first light response mean vector is corrected to generate a normalized first light response data set.

[0060] For example: for all third light response data I0(x, y, t), the third light response mean vector V0(x, y) is calculated in the collection time T direction; the calculation formula is shown as formula (2):

[0061]

[0062] The third light response mean vector V0(x, y) of all target pixel points of the CT detector is summed to obtain the third light response total vector S0; the calculation formula is shown as formula (3):

[0063]

[0064] The third light response mean vector V0(x, y) corresponding to each target pixel point is divided by the third light response total vector S0 to generate a normalized third light response data set I1(x, y).

[0065] For all first light response data F0(x, y, t), the first light response mean vector V1(x, y) is calculated in the collection time T direction; the calculation formula is shown as formula (4):

[0066]

[0067] The first light response mean vector V1(x, y) of all target pixel points of the CT detector is summed to obtain the first light response total vector S1; the calculation formula is shown as formula (5):

[0068]

[0069] Divide the first light response mean vector V1(x, y) corresponding to each target pixel point by the first light response total vector S1 to generate a normalized first light response data set F1(x, y).

[0070] Divide the normalized first light response data set F1(x, y) by the normalized third light response data set I1(x, y) to obtain a second light response data set F3(x, y).

[0071] The embodiment can effectively reduce the influence of the non-uniformity of the parallel light source on the light response data through normalization processing, thereby improving the accuracy of the correction of the third light response data set on the first light response data set, so that the second light response data set corresponding to the optical glue at the target pixel point can be accurately obtained, and a reliable basis is provided for the packaging performance judgment of the optical glue at the target point; it is conducive to the detection of the packaging performance between the scintillator and the photodiode; the material scrap caused by poor packaging of the CT detector is reduced, and the yield of the CT detector assembly is improved.

[0072] The test method for the packaging performance of the CT detector provided by the application will be described in detail in combination with specific application scenarios.

[0073] A test method for the packaging performance of a CT detector, the CT detector comprising a CT detector scintillator and a photodiode; a plurality of pixel points are distributed on the CT detector; applied to a first device; at least comprising the following steps:

[0074] For any target pixel point on the CT detector after pre-curing UV glue: obtaining third light response values corresponding to the target pixel point on the CT detector after pre-curing UV glue at different collection times to generate a third light response data set;

[0075] Based on the third light response data corresponding to different collection times in the third light response data set, a third light response mean vector corresponding to the time direction along the collection time is determined; based on the third light response mean vector corresponding to each target pixel point, a third light response total vector corresponding to the CT detector after pre-curing UV glue is determined; based on the third light response total vector, the third light response mean vector is corrected to generate a normalized third light response data set;

[0076] Based on the first light response data corresponding to different collection times in the first light response data set, a first light response mean vector corresponding to the time direction along the collection time is determined; based on the first light response mean vector corresponding to each target pixel point, a first light response total vector corresponding to the CT detector after filling the optical glue is determined; based on the first light response total vector, the first light response mean vector is corrected to generate a normalized first light response data set;

[0077] The third normalized light response data set is used to correct the first normalized light response data set, so as to generate a second light response data set corresponding to the optical glue at the target pixel point.

[0078] The second light response data set is detected, and if the detection result indicates that the second light response data set is within a preset threshold range, it is determined that the encapsulation of the optical glue at the target pixel point is qualified, and if the detection result indicates that the second light response data set is not within the preset threshold range, it is determined that the encapsulation of the optical glue at the target pixel point is unqualified.

[0079] The encapsulation performance of the optical glue at each target pixel point in the CT detector after the optical glue is filled is detected, and if the detection result indicates that the encapsulation of the optical glue at each target pixel point in the CT detector after the optical glue is filled is qualified, it is determined that the encapsulation between the scintillator and the photodiode of the CT detector is good, and if the detection result indicates that the encapsulation of the optical glue at at least one target pixel point in the CT detector after the optical glue is filled is unqualified, it is determined that the encapsulation between the scintillator and the photodiode of the CT detector is abnormal, and a prompt information of re-encapsulation is sent.

[0080] The application utilizes the principle that the attenuation of light in different media is different, and provides a test method and device for detecting the good encapsulation performance between the scintillator and the photodiode of the CT detector, and detecting whether there is a bubble and a gap between the scintillator and the photodiode; and solves the technical problem of material scrapping due to the lack of detection and control of the good encapsulation performance between the scintillator and the photodiode in the prior art.

[0081] As shown in Figure 4 Fig. 1 is a structural schematic diagram of a test system for the encapsulation performance of a CT detector provided by an embodiment of the application.

[0082] A test system for the encapsulation performance of a CT detector, the detector comprising a CT detector scintillator and a photodiode; the CT detector is distributed with a plurality of pixel points; and the system is applied to a first device; the system 400 comprises: a first determination module 401 configured to, for any target pixel point on the CT detector after the optical glue is filled: acquire first light response data corresponding to the target pixel point at different acquisition time points, to generate a first light response data set; perform denoising processing on the first light response data set, to generate a second light response data set corresponding to the optical glue at the target pixel point; and determine the encapsulation performance of the optical glue at the target pixel point based on the second light response data set; and a second determination module 402 configured to determine the encapsulation performance between the scintillator and the photodiode of the CT detector based on the encapsulation performance of the optical glue at each target pixel point in the CT detector after the optical glue is filled.

[0083] In the preferred implementation of the embodiment, the first determining module comprises: an acquisition unit, configured to acquire third light response values corresponding to the target pixel points on the CT detector at different acquisition time points after the pre-cured UV glue, and generate a third light response data set; and a correction unit, configured to correct the first light response data set by using the third light response data set, and generate a second light response data set corresponding to the optical glue at the target pixel points.

[0084] In the preferred implementation of the embodiment, the correction unit comprises: a first normalization subunit, configured to perform normalization processing on the third light response data set, and generate a normalized third light response data set; a second normalization subunit, configured to perform normalization processing on the first light response data set, and generate a normalized first light response data set; and a correction processing subunit, configured to perform correction processing on the normalized first light response data set by using the normalized third light response data set, and generate the second light response data set corresponding to the optical glue at the target pixel points.

[0085] In the preferred implementation of the embodiment, the first normalization subunit comprises: a first determining unit, configured to determine a third light response mean vector corresponding to the time direction of the acquisition time points based on the third light response data corresponding to the different acquisition time points in the third light response data set; a second determining unit, configured to determine a third light response total vector corresponding to the CT detector after the pre-cured UV glue based on the third light response mean vector corresponding to each target pixel point; and a first correction unit, configured to perform correction processing on the third light response mean vector based on the third light response total vector, and generate the normalized third light response data set.

[0086] In the preferred implementation of the embodiment, the second normalization subunit comprises: a first determining unit, configured to determine a first light response mean vector corresponding to the time direction of the acquisition time points based on the first light response data corresponding to the different acquisition time points in the first light response data set; a second determining unit, configured to determine a first light response total vector corresponding to the CT detector after the optical glue is filled based on the first light response mean vector corresponding to each target pixel point; and a second correction unit, configured to perform correction processing on the first light response mean vector based on the first light response total vector, and generate the normalized first light response data set.

[0087] In the preferred implementation of the embodiment, the first determining module further comprises: a detection unit, configured to detect the second light response data set; a first determining subunit, configured to determine that the packaging of the optical glue at the target pixel points is qualified if the detection result indicates that the second light response data set is within a preset threshold range; and a second determining subunit, configured to determine that the packaging of the optical glue at the target pixel points is unqualified if the detection result indicates that the second light response data set is not within the preset threshold range.

[0088] In the preferred implementation of the embodiment, the second determining module comprises: a first determining unit configured to determine that the packaging between the scintillator and the photodiode of the CT detector is good if the packaging of the optical glue at each of the target pixel points in the CT detector after the optical glue is filled is qualified; and a second determining unit configured to determine that the packaging between the scintillator and the photodiode of the CT detector is abnormal and send a re-packaging prompt if the packaging of the optical glue at at least one of the target pixel points in the CT detector after the optical glue is filled is unqualified.

[0089] The system described above can execute the method for testing the packaging performance of the CT detector provided in the embodiment, and has the corresponding functional modules and beneficial effects of executing the method for testing the packaging performance of the CT detector. Technical details not described in the embodiment can be referred to the method for testing the packaging performance of the CT detector provided in the embodiment.

[0090] The embodiment of the application further provides an electronic device, comprising: a processor; a memory for storing executable instructions of the processor; and the processor is configured to read the executable instructions from the memory and execute the instructions to implement the method for testing the packaging performance of the CT detector.

[0091] In addition to the above method and device, the embodiment of the application can also be a computer program product, which comprises computer program instructions, and the computer program instructions enable the processor to execute the steps of the method according to various embodiments of the application described in the above “Exemplary Method” section of the specification when the computer program instructions are run by the processor.

[0092] The computer program product can be written in any combination of one or more programming languages, including object-oriented programming languages, such as Java, C++, and conventional procedural programming languages, such as the “C” language or similar programming languages, to perform the operations of the embodiments of the application. The program code can be executed entirely on the user computing device, partially on the user device, as an independent software package, partially on the user computing device and partially on a remote computing device, or entirely on a remote computing device or server.

[0093] In addition, the embodiment of the application can also be a computer readable storage medium, which stores computer program instructions, and the computer program instructions enable the processor to execute the steps of the method according to various embodiments of the application described in the above “Exemplary Method” section of the specification when the computer program instructions are run by the processor.

[0094] The computer readable storage medium can be a combination of one or more computer readable media. The computer readable media can be a computer readable signal medium or a computer readable storage medium. The computer readable storage medium can include, for example, but is not limited to, an electronic, magnetic, optical, electromagnetic, infrared, or semiconductor system, apparatus, or device, or any suitable combination of the foregoing. More specific examples (a non-exhaustive list) of the computer readable storage medium include the following: an electrical connection having one or more wires, a portable disk, a hard disk, a random access memory (RAM), a read-only memory (ROM), an erasable programmable read-only memory (EPROM or Flash memory), an optical fiber, a portable compact disc read-only memory (CD-ROM), an optical storage device, a magnetic storage device, or any suitable combination of the foregoing.

[0095] The above description of the disclosed aspects is merely exemplary in nature and is not intended to limit the present disclosure, application, and uses. The description of the aspects together with the accompanying drawings are intended to provide further instruction to persons skilled in the art on the use and operation of the aspects of the application. It is not intended to be exhaustive or complete to all possible aspects of the application or to all examples of the aspects of the application. Various modifications, equivalents, and alternatives to the aspects of the application as described herein can be apparent to a person skilled in the art and can be derived from the description of the aspects of the application without deviating from the scope of the application. The description of the aspects of the application is thus not intended to limit the aspects of the application to the examples described herein. The examples are provided to describe the aspects of the application and to enable a person skilled in the art to make and use the aspects of the application.

[0096] The block diagrams of the devices, apparatuses, systems, and methods involved in the present application are merely illustrative examples and are not intended to require or imply that the connections, arrangements, configurations are as shown in the block diagrams. These devices, apparatuses, systems, and methods can be connected, arranged, configured in any manner as will be appreciated by those skilled in the art. Words such as "include", "contain", "have", etc. are open-ended words, mean "including but not limited to", and can be used interchangeably with each other. The words "or" and "and" as used herein mean the word "and / or", and can be used interchangeably with each other, unless the context clearly indicates otherwise. The word "such as" as used herein means the phrase "such as but not limited to", and can be used interchangeably with each other.

[0097] It is also important to note that the devices, apparatuses, and methods of the present application can be embodied in a variety of other forms; from the foregoing disclosure and detailed description of the application it is intended that the application be understood as both specific and broad. Although specific embodiments of the application have been described in detail, those skilled in the art understand that various modifications can be made to the above-described embodiments without departing from the scope of the application and the general principles of the application. The examples are intended to be illustrative only and should not be considered as limiting the scope of the application in any way. Accordingly, the disclosure is intended to embrace all such alternatives, modifications and variations as can fall within the scope of the present application, as defined by the appended claims.

[0098] The above description of the disclosed aspects is merely exemplary in nature and is not intended to limit the present disclosure, application, and uses. The description of the aspects together with the accompanying drawings are intended to provide further instruction to persons skilled in the art on the use and operation of the aspects of the application. It is not intended to be exhaustive or complete to all possible aspects of the application or to all examples of the aspects of the application. Various modifications, equivalents, and alternatives to the aspects of the application as described herein can be apparent to a person skilled in the art and can be derived from the description of the aspects of the application without deviating from the scope of the application. The description of the aspects of the application is thus not intended to limit the aspects of the application to the examples described herein. The examples are provided to describe the aspects of the application and to enable a person skilled in the art to make and use the aspects of the application.

[0099] The foregoing description has been set forth for the purpose of exemplification and description. It is not intended to be exhaustive or to limit the embodiments of the application to the precise forms disclosed. Although a few embodiments have been discussed with some particularity, one skilled in the relevant art will appreciate that many modifications, changes, substitutions, additions, or rearrangements are possible, without departing from the application.

[0100] In the description of the present specification, the description of the terms "one embodiment", "some embodiments", "an example", "a specific example", or "some examples" etc. means that the specific features, structures, materials or characteristics described in connection with the embodiment or example are included in at least one embodiment or example of the present application. Moreover, the specific features, structures, materials or characteristics described can be combined in any appropriate manner in any one or more embodiments or examples. In addition, the person skilled in the art can combine and combine the different embodiments or examples described in the present specification and the features of the different embodiments or examples, without contradiction.

[0101] In addition, the terms "first", "second" are only for the purpose of description, and cannot be understood as indicating or implying relative importance or implicitly indicating the number of the indicated technical features. Therefore, the features defined with "first", "second" can explicitly or implicitly include at least one of the features. In the description of the present application, the meaning of "a plurality of" is two or more, unless otherwise specifically limited.

[0102] The above description is only a specific embodiment of the present application, but the protection scope of the present application is not limited thereto, and any person skilled in the art can easily think of changes or replacements within the technical scope disclosed by the present application, which should be covered by the protection scope of the present application. Therefore, the protection scope of the present application should be subject to the protection scope of the claims.

Claims

1. A method of testing for CT detector package performance, characterized by, The CT detector comprises a CT detector scintillator and a photodiode; a plurality of pixel points are distributed on the CT detector; The acquisition circuit board is applied to a testing device for detector packaging performance; The testing device for detector packaging performance comprises a shell, a test platform, a positioning portion, a flat light source, and a main control portion; the shell is used for shielding external stray light; the test platform is arranged inside the shell; the positioning portion is used for fixing a detector sample; the flat light source is installed on the positioning portion and is used for providing parallel light beams for the detector sample on the positioning portion; the main control portion is electrically connected with the flat light source and the detector sample, respectively; The main control portion is electrically connected with the flat light source and the detector sample, respectively; The main control portion comprises a control circuit board, an acquisition circuit board, and a power supply; the power supply is used for supplying power to the detector sample and the flat light source; the control circuit board is electrically connected with the acquisition circuit board and the flat light source, respectively; the acquisition circuit board is electrically connected with the detector sample; The control circuit board is used for controlling the flat light source to be turned on based on a target operation triggered by a target object; after determining that the flat light source is turned on for a preset time, the control circuit board controls the acquisition circuit board to start collecting light response data of the detector sample; after reaching a preset collection time, the control circuit board controls the acquisition circuit board to end the collection; the acquisition circuit board is used for performing data processing on the collected light response data and outputting packaging performance between a CT detector scintillator and a photodiode; the test platform further comprises a leveling structure; the leveling structure is arranged on the positioning portion and is used for adjusting the detector sample so that the detector sample and the flat light source are kept parallel; For any target pixel point on the CT detector after the optical glue is filled, first light response data corresponding to the target pixel point at different collection time points are acquired to generate a first light response data set; the first light response data set is denoised to generate a second light response data set corresponding to the optical glue at the target pixel point; the packaging performance of the optical glue at the target pixel point is determined based on the second light response data set; The packaging performance between the CT detector scintillator and the photodiode is determined based on the packaging performance of the optical glue at each target pixel point in the CT detector after the optical glue is filled; The first light response data set is denoised to generate a second light response data set corresponding to the optical glue at the target pixel point; the third light response data set is acquired; the first light response data set is corrected by using the third light response data set to generate the second light response data set corresponding to the optical glue at the target pixel point; The third light response data set is acquired; the first light response data set is corrected by using the third light response data set to generate the second light response data set corresponding to the optical glue at the target pixel point; ​ ​ normalizing the third light response data set to generate a normalized third light response data set; normalizing the first light response data set to generate a normalized first light response data set; correcting the normalized first light response data set by using the normalized third light response data set to generate a second light response data set corresponding to the optical glue at the target pixel point; The normalization of the third light response data set to generate a normalized third light response data set comprises: determining a third light response mean vector corresponding to the time direction of the acquisition time based on the third light response data corresponding to different acquisition times in the third light response data set; determining a third light response total vector corresponding to the CT detector after the pre-cured UV glue based on the third light response mean vector corresponding to each target pixel point; and correcting the third light response mean vector by using the third light response total vector to generate a normalized third light response data set. The normalization of the first light response data set to generate a normalized first light response data set comprises: determining a first light response mean vector corresponding to the time direction of the acquisition time based on the first light response data corresponding to different acquisition times in the first light response data set; determining a first light response total vector corresponding to the CT detector after the optical glue is filled based on the first light response mean vector corresponding to each target pixel point; and correcting the first light response mean vector by using the first light response total vector to generate a normalized first light response data set.

2. The method of claim 1, wherein, The determination of the packaging performance of the optical glue at the target pixel point based on the second light response data comprises: detecting the second light response data set; if the detection result indicates that the second light response data set is within the preset threshold range, it is determined that the packaging of the optical glue at the target pixel point is qualified; if the detection result indicates that the second light response data set is not within the preset threshold range, it is determined that the packaging of the optical glue at the target pixel point is unqualified.

3. The method of claim 1, wherein, The determination of the packaging performance between the CT detector scintillator and the photodiode based on the packaging performance of the optical glue at each target pixel point in the CT detector after the optical glue is filled comprises: if the packaging of the optical glue at each target pixel point in the CT detector after the optical glue is filled is qualified, it is determined that the packaging between the CT detector scintillator and the photodiode is good; if the packaging of the optical glue at at least one target pixel point in the CT detector after the optical glue is filled is unqualified, it is determined that the packaging between the CT detector scintillator and the photodiode is abnormal, and a prompt information of re-packaging is sent.

4. A test system for CT detector package performance, characterized by, The detector comprises a CT detector scintillator and a photodiode; the CT detector is distributed with a plurality of pixel points; and the application is applied to a first device. The first determining module is configured to, for any target pixel point on the CT detector after the optical glue is filled: acquire first light response data corresponding to the target pixel point at different acquisition time points to generate a first light response data set; perform denoising processing on the first light response data set to generate a second light response data set corresponding to the optical glue at the target pixel point; and determine the packaging performance of the optical glue at the target pixel point based on the second light response data set. The second determining module is configured to determine the packaging performance between the CT detector scintillator and the photodiode based on the packaging performance of the optical glue at each target pixel point in the CT detector after the optical glue is filled. 5.A computer readable medium having stored thereon a computer program which, when executed by a processor, carries out the method of any one of claims 1 to 3.

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