A processing method and device for detecting time accuracy of intelligent switch

Abstract

The embodiment of the present invention relates to a processing method and device for detecting the time accuracy of an intelligent switch, the method comprising: a testing device receives a test temperature zone, a single-step temperature difference, a test number and a temperature adjustment mode, and sets a corresponding temperature measurement sequence; and the temperature adjustment mode traverses the temperature measurement sequence; and during the traversal process, the ambient temperature in the thermostat is adjusted to the currently traversed test temperature, and an absolute time error test is performed on the intelligent switch in the thermostat, and the current test temperature and the absolute time error form a corresponding temperature-error pair; and positive / abnormal temperature zones are identified based on all obtained temperature-error pairs; and a time accuracy detection state is set based on a positive / abnormal temperature zone set; and a detection report is formed by the obtained positive / abnormal temperature zone set and the time accuracy detection state and saved. Through the present invention, a time accuracy detection mechanism for intelligent switches related to temperature changes can be provided.

Description

Technical Field

[0001] The present invention relates to the technical field of data processing, and in particular to a processing method and device for detecting the time accuracy of an intelligent switch. Background Art

[0002] An intelligent switch is a new type of switch / circuit breaker with increased software processing, data storage and data communication capabilities. In addition to the basic functions of a conventional switch / circuit breaker, this type of new switch / circuit breaker also supports the collection and storage of local power data (such as current, voltage, power, cumulative electricity consumption, etc.) on the switch side, and can send the stored collected data to the superior control end (such as a remote server, superior concentrator, etc.), and can receive and respond to a series of remote commands sent by the superior control end (such as time synchronization commands, switch time acquisition / call commands, power data acquisition / call commands, etc.). The switch side time of the intelligent switch is provided by a built-in timing chip / module; each time the intelligent switch receives a time synchronization command, it will synchronize the local timing chip / module according to the synchronization time provided in the command, and each time the switch time acquisition / call command is received, it will feedback the real-time timing time of the local timing chip / module to the superior control end.

[0003] The time accuracy of the smart switch is actually the timing accuracy of the internal timing chip / module. If the timing accuracy is abnormal, it will cause a large error between the time information in the various collected data stored and sent by the switch side and the real time, thereby reducing the accuracy of the collected data. There are many factors that cause abnormal timing accuracy of the internal timing chip / module, and ambient temperature is one of the important factors. If you want to ensure that the smart switch does not have obvious timing error abnormalities (time accuracy abnormalities) in various temperature zones (low temperature, normal temperature, high temperature), it is necessary to perform a round of time accuracy detection related to temperature changes on the smart switch before it leaves the factory. How to perform time accuracy detection related to temperature changes on the smart switch is a technical problem that the present invention needs to solve. Summary of the invention

[0004] The purpose of the present invention is to provide a processing method, device, electronic device and computer-readable storage medium for detecting the time accuracy of intelligent switches in view of the defects of the prior art. The present invention generates a corresponding temperature measurement sequence after receiving the test temperature zone, single-step temperature difference, number of tests and temperature adjustment mode input by the tester; and traverses all the test temperatures of the temperature measurement sequence one by one according to the traversal order corresponding to the temperature adjustment mode (when the temperature adjustment mode is the first mode, the traversal order is from low temperature to high temperature, and when the temperature adjustment mode is the second mode, the traversal order is from high temperature to low temperature), and sets the ambient temperature of the thermostat based on the current test temperature during the traversal process, and performs an absolute time error test on the intelligent switch in the thermostat when the ambient temperature is stable, and forms a corresponding temperature-error data pair by the current test temperature and the corresponding absolute time error; and after the traversal, normal / abnormal temperature zones are identified according to all the obtained temperature-error data pairs to obtain a normal / abnormal temperature zone set; and the corresponding time accuracy detection state is set according to the normal / abnormal temperature zone set; and the normal / abnormal temperature zone set + time accuracy detection state form a corresponding detection report and save it. The present invention provides a time accuracy detection scheme related to temperature changes for an intelligent switch. Through the present invention, not only can the time accuracy performance (time accuracy detection status) of the intelligent switch in a test temperature zone be confirmed, but also each normal / abnormal temperature zone of the time accuracy of the intelligent switch in the test temperature zone can be identified; testing the intelligent switch based on the detection scheme of the present invention during the design / factory stage helps to improve the design / factory quality of the intelligent switch, and testing the intelligent switch based on the detection scheme of the present invention during the maintenance stage helps to improve the problem location speed of abnormal time accuracy problems.

[0005] To achieve the above object, a first aspect of an embodiment of the present invention provides a processing method for detecting the time accuracy of an intelligent switch, the method comprising:

[0006] The test device communicates data with a preset constant temperature box through a first communication method; and communicates data with an intelligent switch pre-placed in the constant temperature box through a second communication method; the first communication method includes a serial communication method, a network cable communication method, a USB communication method, a WI FI communication method and a Bluetooth communication method; the second communication method includes a serial communication method and a power line carrier communication method;

[0007] The test device receives the test temperature zone [T s ,T e ], single-step temperature difference △T, test number N and temperature adjustment mode; and based on the test temperature zone [T s ,T e ], the single-step temperature difference ΔT and the number of tests N set the corresponding temperature measurement sequence X; T sis the starting temperature, T e is the end temperature, the test number N is a positive integer, N = 1 + (T e -T s ) / △T,T s <0℃<△T <T e ; The temperature adjustment mode includes a first mode and a second mode; The temperature measurement sequence X consists of N test temperatures x i Sort by small to large, 1≤index i≤N, x i＝1 =T s 、x i+1 =x i +△T、x i＝N =T e ;

[0008] The testing device performs a traversal sequence corresponding to the temperature adjustment mode on all the test temperatures x of the temperature measurement sequence X. i Traverse one by one; and in the traversal process, the test temperature x currently traversed i as the corresponding current temperature; and adjusting the ambient temperature in the thermostat to the current temperature and confirming whether the ambient temperature in the thermostat is stable at the current temperature to obtain a corresponding confirmation result; and when the confirmation result is that the ambient temperature is stable, performing an absolute time error test on the intelligent switch to obtain an absolute time error p corresponding to the current temperature i ; and by the current temperature and the corresponding absolute time error p i Form a corresponding temperature-error data pair (x i ,p i ); when the temperature adjustment mode is the first mode, the corresponding traversal order is the forward traversal order of the index i from 1 to N; when the temperature adjustment mode is the second mode, the corresponding traversal order is the reverse traversal order of the index i from N to 1; the confirmation result includes that the ambient temperature has stabilized and the thermostat is abnormal;

[0009] After the traversal is completed, the test device obtains all the temperature-error data pairs (x i ,p i ) to identify normal and abnormal temperature zones to obtain corresponding normal temperature zone sets and abnormal temperature zone sets; and to set the time accuracy detection state of the intelligent switch according to the normal temperature zone set and the abnormal temperature zone set; and to form a corresponding time accuracy detection report based on the obtained normal temperature zone set, the abnormal temperature zone set and the time accuracy detection state and save it; when the normal temperature zone set is not empty, it includes one or more normal temperature zones S a ; When the abnormal temperature zone set is not empty, it includes one or more abnormal temperature zones S bThe time accuracy detection status includes no abnormality in time accuracy, abnormality in low temperature in time accuracy, abnormality in normal temperature in time accuracy, abnormality in high temperature in time accuracy and serious abnormality in time accuracy.

[0010] Preferably, adjusting the ambient temperature in the thermostat to the current temperature and confirming whether the ambient temperature in the thermostat is stable at the current temperature to obtain a corresponding confirmation result specifically includes:

[0011] The testing device sends a temperature adjustment instruction carrying the current temperature to the thermostat; and uses the temperature adjustment instruction feedback data sent back by the thermostat as the corresponding current instruction execution status; the current instruction execution status includes success and failure;

[0012] and identifying the current instruction execution state;

[0013] If the current instruction execution status is failure, then after waiting for a preset first delay time L de1 Then, the temperature adjustment instruction carrying the current temperature is sent to the thermostat again until the latest execution status of the current instruction is successful;

[0014] If the current instruction execution status is successful, an empty sequence is initialized as the corresponding first query temperature sequence; and a temperature query instruction is periodically sent to the thermostat according to a preset query time frequency; and the temperature query instruction feedback data sent back by the thermostat at that time is added to the first query temperature sequence as a corresponding first query temperature; and at the end of each sequence addition, the total number of the first query temperatures in the first query temperature sequence is counted and the current statistical result is used as the corresponding current sequence length L; and whether the current sequence length L exceeds the preset maximum sequence length threshold L max Identify; if the current sequence length L does not exceed the maximum sequence length threshold L max , then when the current sequence length L is greater than or equal to the preset first length threshold L 1 When the first query temperature sequence is the closest L 1 The absolute temperature difference between the first query temperature and the current temperature is calculated to obtain the corresponding L 1 The first absolute temperature difference, and the obtained L 1 When the first absolute temperature difference satisfies the preset reasonable temperature difference range, the query is stopped and the corresponding confirmation result is set as the ambient temperature is stable; if the current sequence length L exceeds the maximum sequence length threshold L max , then stop querying and set the corresponding confirmation result as the constant temperature box abnormality.

[0015] Preferably, the absolute time error test is performed on the intelligent switch to obtain an absolute time error p corresponding to the current temperature. i , specifically including:

[0016] The test device performs a time synchronization on the smart switch; and after confirming that the time synchronization is completed, the absolute time error of the smart switch is calculated every preset first time period to obtain a corresponding single absolute time error p single ; and in the single absolute time error p single When the total number of samples is equal to the preset total number threshold M, the measurement is stopped and the M single absolute time errors p are calculated. single Perform mean calculation and use the calculation result as the absolute time error p corresponding to the current temperature i .

[0017] Furthermore, the performing a time synchronization on the intelligent switch specifically includes:

[0018] The test device uses the current device time as the corresponding synchronization time t 0 ; and will carry the synchronization time t 0 The time synchronization instruction is sent to the smart switch; and the time synchronization instruction feedback data sent back by the smart switch is used as the corresponding current instruction execution state; and when the current instruction execution state is synchronization success, it is confirmed that the time synchronization is completed; the current instruction execution state includes synchronization success and synchronization failure; the synchronization time t 0 The minimum time unit is milliseconds.

[0019] Furthermore, the absolute time error of the intelligent switch is measured once every preset first time period to obtain a corresponding single absolute time error p single , specifically including:

[0020] The test device sends a switch time acquisition instruction to the intelligent switch once every preset first time period; and uses the switch time acquisition instruction feedback data sent back by the intelligent switch as the corresponding switch time t 1 ; and the device receives the switch time to obtain the instruction feedback data as the corresponding device time t 2 ; and based on the current switching time t 1 and the current device time t 2 Calculate and generate a corresponding single absolute time error p single , p single =|t 2 -t 1 |; The switching time t1 , the current installation time t 2 The minimum time unit is milliseconds.

[0021] Preferably, all the temperature-error data pairs (x i ,p i ) to identify normal and abnormal temperature zones to obtain corresponding normal temperature zone sets and abnormal temperature zone sets, specifically including:

[0022] The test device constructs a two-dimensional coordinate plane with temperature T as the horizontal axis and absolute time error p as the vertical axis, which is recorded as the corresponding temperature-error coordinate plane;

[0023] And based on each of the temperature-error data pairs (x i ,p i ) Mark the corresponding coordinate point on the temperature-error coordinate plane to obtain the corresponding first marking point d i ; and for every two adjacent first marking points d i Connect the straight line segments to obtain N-1 first straight line segments;

[0024] And based on the preset absolute time error threshold p max Mark a straight line parallel to the horizontal axis of temperature T on the temperature-error coordinate plane as the corresponding error threshold straight line;

[0025] The absolute time error p on the temperature-error coordinate plane is i Greater than or equal to the absolute time error threshold p max The first marking point d i Recorded as the corresponding first abnormal marking point; and the total number of the first abnormal marking points is counted to obtain the corresponding first total number;

[0026] and identifying the first total number;

[0027] If the first total is 0, the test temperature zone [T s ,T e ] as a unique normal temperature zone to form a corresponding normal temperature zone set; and the corresponding abnormal temperature zone set is set to empty;

[0028] If the first total number is not 0, normal and abnormal temperature zones are identified based on all the first abnormal marking points obtained to obtain the corresponding normal temperature zone set and abnormal temperature zone set.

[0029] Further, the identifying of normal and abnormal temperature zones according to all the first abnormal marking points obtained to obtain the corresponding normal temperature zone set and the abnormal temperature zone set specifically includes:

[0030] The testing device traverses all the first abnormal marking points; and during the traversal, the first abnormal marking point currently traversed is used as the corresponding current abnormal marking point; and one or two first marking points d adjacent to the current abnormal marking point are i When not all of them are the first abnormal marking points, the first marking points d that are not the first abnormal marking points are i The first straight line segment between the current abnormal marking point and the first straight line segment is sequentially used as the corresponding current straight line segment; and the coordinates of the unique intersection of the current straight line segment and the error threshold straight line are solved to obtain the corresponding first intersection coordinates; and when the first intersection coordinates do not match the point coordinates of the current abnormal marking point, the coordinate point corresponding to the first intersection coordinates on the temperature-error coordinate plane is recorded as the corresponding newly added abnormal marking point; and at the end of the traversal, each of the first abnormal marking points and each of the newly added abnormal marking points are recorded as the corresponding second abnormal marking point;

[0031] The total number of the second abnormal marking points is counted to obtain the corresponding second total number K; the temperature coordinate value and the absolute time error coordinate value corresponding to each of the second abnormal marking points are used as the corresponding first horizontal axis coordinate and the first vertical axis coordinate; and all the second abnormal marking points are sorted in the order of the first horizontal axis coordinate from low to high to obtain the corresponding second abnormal marking point sequence; the second abnormal marking point sequence consists of K second abnormal marking points e k Sort by order, 1≤index k≤K; each of the second abnormal marking points e k Corresponding to a first horizontal axis coordinate x k and a first ordinate coordinate p k ;

[0032] And every two adjacent second abnormal marking points e in the second abnormal marking point sequence k The corresponding two first horizontal axis coordinates x k As the upper and lower thresholds of a temperature range, a corresponding shard temperature zone s is formed. j , 1≤index j≤K-1; and for each of the slice temperature zones s on the temperature-error coordinate plane j The absolute time error p i is smaller than the absolute time error threshold p max The first marking point d i The total number of the corresponding slice statistics is counted; and the slice temperature zone s whose slice statistics total is not 0 is counted j Recorded as the corresponding non-abnormal slice, and the slice temperature zone s whose total number of slice statistics is 0 j Recorded as the corresponding abnormal shard;

[0033] And the adjacent slice temperature zones s j The non-abnormal slices that are all abnormal slices are regarded as a corresponding normal temperature zone S a ; and merge the adjacent plurality of non-abnormal slices to obtain a corresponding first merged temperature zone, and use each of the first merged temperature zones as a corresponding normal temperature zone S a ; and the normal temperature zone S a The total number of the corresponding normal temperature zones is obtained by counting the total number of the corresponding normal temperature zones;

[0034] And the adjacent slice temperature zones s j The abnormal slices that are all the non-abnormal slices are regarded as a corresponding abnormal temperature zone S b ; and merge the adjacent multiple abnormal slices to obtain a corresponding second merged temperature zone, and each of the second merged temperature zones is used as a corresponding abnormal temperature zone S b ; and for the abnormal temperature zone S b The total number of abnormal temperature zones is obtained by counting the total number of abnormal temperature zones.

[0035] And identify the total number of normal temperature zones; if the total number of normal temperature zones is 0, set the corresponding normal temperature zone set to be empty; if the total number of normal temperature zones is greater than 0, then all the normal temperature zones S a Forming the corresponding normal temperature zone set;

[0036] And identify the total number of abnormal temperature zones; if the total number of abnormal temperature zones is 0, set the corresponding abnormal temperature zone set to empty; if the total number of abnormal temperature zones is greater than 0, then all the abnormal temperature zones S b Forming the corresponding abnormal temperature zone set.

[0037] Preferably, the setting of the time accuracy detection state of the intelligent switch according to the normal temperature zone set and the abnormal temperature zone set specifically includes:

[0038] The testing device identifies the normal temperature zone set and the abnormal temperature zone set;

[0039] If the normal temperature zone set is empty, the corresponding time accuracy detection state is set to be a serious abnormality in time accuracy;

[0040] If the normal temperature zone set is not empty and the abnormal temperature zone set is empty, setting the corresponding time accuracy detection state to time accuracy without abnormality;

[0041] If both the normal temperature zone set and the abnormal temperature zone set are not empty, the abnormal temperature zone S in the abnormal temperature zone set that intersects with the preset low temperature zone is selected. b The number of low temperature zones is counted to obtain the corresponding total number of low temperature zones; and the abnormal temperature zones S in the abnormal temperature zone set that have an intersection with the preset high temperature zone are counted. b The number of high-temperature temperature zones is counted to obtain the corresponding total number of high-temperature temperature zones; and the total number of low-temperature and high-temperature temperature zones are identified; if the total number of low-temperature and high-temperature temperature zones are both 0, the corresponding time accuracy detection state is set to time accuracy normal temperature abnormality; if the total number of low-temperature temperature zones is greater than 0 and the total number of high-temperature temperature zones is 0, the corresponding time accuracy detection state is set to time accuracy low-temperature abnormality; if the total number of high-temperature temperature zones is greater than 0 and the total number of low-temperature temperature zones is 0, the corresponding time accuracy detection state is set to time accuracy high-temperature abnormality; if the total number of low-temperature and high-temperature temperature zones is greater than 0, the corresponding time accuracy detection state is set to time accuracy serious abnormality.

[0042] A second aspect of an embodiment of the present invention provides a device for implementing the processing method for detecting the time accuracy of an intelligent switch described in the first aspect, the device comprising: an external device communication module, a temperature measurement sequence setting module, a test execution module and a test analysis module;

[0043] The external device communication module is used to communicate data with a preset constant temperature box through a first communication method; and to communicate data with a smart switch pre-placed in the constant temperature box through a second communication method; the first communication method includes a serial communication method, a network cable communication method, a USB communication method, a WIFI communication method and a Bluetooth communication method; the second communication method includes a serial communication method and a power line carrier communication method;

[0044] The temperature measurement sequence setting module is used to receive the test temperature zone [T s ,T e ], single-step temperature difference △T, test number N and temperature adjustment mode; and based on the test temperature zone [T s ,T e ], the single-step temperature difference ΔT and the number of tests N set the corresponding temperature measurement sequence X; T s is the starting temperature, T e is the end temperature, the test number N is a positive integer, N = 1 + (T e -T s ) / △T,T s <0℃<△T <T e ; The temperature adjustment mode includes a first mode and a second mode; The temperature measurement sequence X consists of N test temperatures x iSort by small to large, 1≤index i≤N, x i＝1 =T s 、x i+1 =x i +△T、x i＝N =T e ;

[0045] The test execution module is used to perform a test on all the test temperatures x of the temperature measurement sequence X in a traversal order corresponding to the temperature adjustment mode. i Traverse one by one; and in the traversal process, the test temperature x currently traversed i as the corresponding current temperature; and adjusting the ambient temperature in the thermostat to the current temperature and confirming whether the ambient temperature in the thermostat is stable at the current temperature to obtain a corresponding confirmation result; and when the confirmation result is that the ambient temperature is stable, performing an absolute time error test on the intelligent switch to obtain an absolute time error p corresponding to the current temperature i ; and by the current temperature and the corresponding absolute time error p i Form a corresponding temperature-error data pair (x i ,p i ); when the temperature adjustment mode is the first mode, the corresponding traversal order is the forward traversal order of the index i from 1 to N; when the temperature adjustment mode is the second mode, the corresponding traversal order is the reverse traversal order of the index i from N to 1; the confirmation result includes that the ambient temperature has stabilized and the thermostat is abnormal;

[0046] The test analysis module is used to obtain all the temperature-error data pairs (x i ,p i ) to identify normal and abnormal temperature zones to obtain corresponding normal temperature zone sets and abnormal temperature zone sets; and to set the time accuracy detection state of the intelligent switch according to the normal temperature zone set and the abnormal temperature zone set; and to form a corresponding time accuracy detection report based on the obtained normal temperature zone set, the abnormal temperature zone set and the time accuracy detection state and save it; when the normal temperature zone set is not empty, it includes one or more normal temperature zones S a ; When the abnormal temperature zone set is not empty, it includes one or more abnormal temperature zones S b The time accuracy detection status includes no abnormality in time accuracy, abnormality in low temperature in time accuracy, abnormality in normal temperature in time accuracy, abnormality in high temperature in time accuracy and serious abnormality in time accuracy.

[0047] A third aspect of an embodiment of the present invention provides an electronic device, including: a memory, a processor, and a transceiver;

[0048] The processor is used to be coupled to the memory, read and execute instructions in the memory, so as to implement the method steps described in the first aspect above;

[0049] The transceiver is coupled to the processor, and the processor controls the transceiver to send and receive messages.

[0050] A fourth aspect of an embodiment of the present invention provides a computer-readable storage medium, wherein the computer-readable storage medium stores computer instructions. When the computer instructions are executed by a computer, the computer executes the instructions of the method described in the first aspect above.

[0051] The embodiment of the present invention provides a processing method, device, electronic device and computer-readable storage medium for detecting the time accuracy of an intelligent switch. As can be seen from the above content, the embodiment of the present invention generates a corresponding temperature measurement sequence after receiving the test temperature zone, single-step temperature difference, number of tests and temperature adjustment mode input by the tester; and traverses all the test temperatures of the temperature measurement sequence one by one according to the traversal order corresponding to the temperature adjustment mode (when the temperature adjustment mode is the first mode, the traversal order is from low temperature to high temperature, and when the temperature adjustment mode is the second mode, the traversal order is from high temperature to low temperature), and sets the ambient temperature of the thermostat based on the current test temperature during the traversal process, and performs an absolute time error test on the intelligent switch in the thermostat when the ambient temperature is stable, and forms a corresponding temperature-error data pair by the current test temperature and the corresponding absolute time error; and after the traversal, normal / abnormal temperature zones are identified according to all the obtained temperature-error data pairs to obtain a normal / abnormal temperature zone set; and the corresponding time accuracy detection state is set according to the normal / abnormal temperature zone set; and the normal / abnormal temperature zone set + time accuracy detection state form a corresponding detection report and save it. The embodiment of the present invention provides a time accuracy detection scheme related to temperature changes for an intelligent switch. Through the embodiment of the present invention, not only the time accuracy performance (time accuracy detection status) of the intelligent switch in a test temperature zone can be confirmed, but also each normal / abnormal temperature zone of the time accuracy of the intelligent switch in the test temperature zone can be identified; testing based on the detection scheme of the embodiment of the present invention during the design / factory stage of the intelligent switch helps to improve the design / factory quality of the intelligent switch, and testing based on the detection scheme of the embodiment of the present invention during the maintenance stage of the intelligent switch helps to improve the problem location speed of abnormal time accuracy problems. BRIEF DESCRIPTION OF THE DRAWINGS

[0052] Figure 1 A schematic diagram of a processing method for detecting time accuracy of an intelligent switch provided in the first embodiment of the present invention;

[0053] Figure 2 A first marking point d provided in the first embodiment of the present invention i, a schematic diagram of examples of the first straight line segment and the error threshold straight line;

[0054] Figure 3 An example schematic diagram of a slice / normal / abnormal temperature zone provided in the first embodiment of the present invention;

[0055] Figure 4 A module structure diagram of a processing device for detecting time accuracy of an intelligent switch provided in the second embodiment of the present invention;

[0056] Figure 5 A schematic diagram of the structure of an electronic device provided in Embodiment 3 of the present invention. DETAILED DESCRIPTION

[0057] In order to make the purpose, technical solution and advantages of the present invention clearer, the present invention will be further described in detail below in conjunction with the accompanying drawings. Obviously, the described embodiments are only part of the embodiments of the present invention, rather than all the embodiments. Based on the embodiments of the present invention, all other embodiments obtained by ordinary technicians in this field without creative work are within the scope of protection of the present invention.

[0058] Embodiment 1 of the present invention provides a processing method for detecting the time accuracy of an intelligent switch, such as Figure 1 As shown in the schematic diagram of a processing method for detecting the time accuracy of an intelligent switch provided in the first embodiment of the present invention, the method mainly includes the following steps:

[0059] Step 1: The test device communicates data with a preset constant temperature box through a first communication method; and communicates data with an intelligent switch pre-placed in the constant temperature box through a second communication method.

[0060] Here, the test device of the embodiment of the present invention is a module, device, terminal, equipment, server, system or platform that can implement the method of the embodiment of the present invention. The first communication mode includes a serial communication mode, a network cable communication mode, a USB communication mode, a WIFI communication mode and a Bluetooth communication mode; the second communication mode includes a serial communication mode and a power line carrier communication mode.

[0061] Step 2: The test device receives the test temperature zone [T s ,T e ], single-step temperature difference △T, test number N and temperature adjustment mode; and based on the test temperature zone [T s ,T e ], single-step temperature difference △T and test number N set the corresponding temperature measurement sequence X;

[0062] Among them, T s is the starting temperature, T eis the end temperature, the number of tests N is a positive integer, N = 1 + (T e -T s ) / △T,T s <0℃<△T <T e ; The temperature adjustment mode includes the first mode and the second mode; The temperature measurement sequence X consists of N test temperatures x i Sort by small to large, 1≤index i≤N, x i＝1 =T s 、x i+1 =x i +△T、x i＝N =T e .

[0063] Step 3: The test device performs a traversal sequence corresponding to the temperature adjustment mode on all test temperatures x in the temperature measurement sequence X. i Traverse one by one; and in the traversal process, the current traversal test temperature x i as the corresponding current temperature; and adjusting the ambient temperature in the thermostat to the current temperature and confirming whether the ambient temperature in the thermostat is stable at the current temperature to obtain the corresponding confirmation result; and when the confirmation result is that the ambient temperature is stable, performing an absolute time error test on the intelligent switch to obtain the absolute time error p corresponding to the current temperature i ; and the current temperature and the corresponding absolute time error p i Form a corresponding temperature-error data pair (x i ,p i );

[0064] Among them, when the temperature control mode is the first mode, the corresponding traversal order is the forward traversal order of index i from 1 to N; when the temperature control mode is the second mode, the corresponding traversal order is the reverse traversal order of index i from N to 1; the confirmation results include that the ambient temperature has stabilized and the constant temperature box is abnormal.

[0065] It should be noted that in the current step 3, the ambient temperature in the thermostat is adjusted to the current temperature and whether the ambient temperature in the thermostat is stable at the current temperature is confirmed to obtain a corresponding confirmation result, which specifically includes:

[0066] Step A1, the test device sends a temperature adjustment instruction carrying the current temperature to the thermostat; and uses the temperature adjustment instruction feedback data sent back by the thermostat as the corresponding current instruction execution status;

[0067] Among them, the current instruction execution status includes success and failure;

[0068] The temperature adjustment instruction here is a control instruction provided by the thermostatic box of the embodiment of the present invention to the outside, through which the required box environment temperature can be transmitted to the thermostatic box; after receiving the temperature adjustment instruction, the thermostatic box will set the target temperature of the box environment temperature based on the temperature parameter in the instruction, that is, the current temperature, and start the corresponding temperature adjustment process, and return a temperature adjustment instruction feedback data specifically used to identify the success or failure of the instruction execution to the sender of the current temperature adjustment instruction, that is, the test device of the embodiment of the present invention when the temperature adjustment process is successfully or unsuccessfully started;

[0069] Step A2, and identifying the current instruction execution status;

[0070] Step A3: If the current instruction execution status is failure, wait for a preset first delay time L. de1 Then, the temperature adjustment instruction carrying the current temperature is sent to the thermostat again until the latest current instruction execution status is successful;

[0071] Here, the first delay time L de1 for a preset length of time;

[0072] Step A4, if the current instruction execution status is successful, initialize an empty sequence as the corresponding first query temperature sequence; and send a temperature query instruction to the thermostat regularly according to the preset query time frequency; and add the temperature query instruction feedback data sent back by the thermostat as a corresponding first query temperature to the first query temperature sequence; and at the end of each sequence addition, count the total number of first query temperatures in the first query temperature sequence and use the current statistical result as the corresponding current sequence length L; and check whether the current sequence length L exceeds the preset maximum sequence length threshold L max Identify; if the current sequence length L does not exceed the maximum sequence length threshold L max , then when the current sequence length L is greater than or equal to the preset first length threshold L 1 When the first query temperature sequence is the nearest L 1 The absolute temperature difference between the first query temperature and the current temperature is calculated to obtain the corresponding L 1 The first absolute temperature difference, and the obtained L 1 When the first absolute temperature difference meets the preset reasonable temperature difference range, stop querying and set the corresponding confirmation result as the ambient temperature is stable; if the current sequence length L exceeds the maximum sequence length threshold L max , then stop querying and set the corresponding confirmation result as constant temperature box abnormality.

[0073] Here, the query time frequency is a preset time frequency; the maximum sequence length threshold L maxis a preset positive integer, the first length threshold L 1 is also a preset positive integer, L max >L 1 ;

[0074] The temperature query instruction is another control instruction provided by the thermostatic box of an embodiment of the present invention to the outside. The real-time ambient temperature inside the thermostatic box can be obtained through this instruction. After receiving the temperature query instruction, the thermostatic box will return the real-time ambient temperature inside the thermostatic box as the corresponding temperature query instruction feedback data to the sender of the current temperature query instruction, that is, the test device of the embodiment of the present invention.

[0075] It should be noted that in the current step 3, the absolute time error test of the intelligent switch is performed to obtain the absolute time error p corresponding to the current temperature. i , specifically including:

[0076] Step B1, the test device performs time synchronization on the intelligent switch;

[0077] Specifically, the test device uses the current device time as the corresponding synchronization time t 0 ; and will carry the synchronization time t 0 The time synchronization instruction is sent to the intelligent switch; and the time synchronization instruction feedback data sent back by the intelligent switch is used as the corresponding current instruction execution status; and when the current instruction execution status is synchronization success, it is confirmed that the time synchronization is completed;

[0078] The current instruction execution status includes synchronization success and synchronization failure; the synchronization time t 0 The minimum time unit is milliseconds;

[0079] Here, the time synchronization instruction is a control instruction provided by the intelligent switch of the embodiment of the present invention to the outside, through which the synchronization time parameters can be transmitted to the intelligent switch; after receiving the time synchronization instruction, the intelligent switch will synchronize the internal timing chip / module based on the synchronization time parameters in the instruction, and return a time synchronization instruction feedback data specifically used to identify the success or failure of the instruction execution to the sender of the current time synchronization instruction, that is, the test device of the embodiment of the present invention when the time synchronization succeeds or fails;

[0080] Step B2: After confirming that the time synchronization is completed, the absolute time error of the intelligent switch is calculated once every preset first time period to obtain a corresponding single absolute time error p single ; and in a single absolute time error p single When the total number of samples is equal to the preset sample total threshold M, the measurement is stopped and the M single absolute time errors p are obtained. singleCalculate the mean and use the result as the absolute time error p corresponding to the current temperature i ;

[0081] Here, the total sample count threshold M is a preset positive integer;

[0082] It should be noted that in the current step B2, the absolute time error of the intelligent switch is measured once every preset first time period to obtain a corresponding single absolute time error p single Specifically, the test device sends a switch time acquisition instruction to the intelligent switch every preset first time period; and uses the switch time acquisition instruction feedback data sent back by the intelligent switch as the corresponding switch time t 1 ; and the device receives the data receiving time of the switch time to obtain the instruction feedback data as the corresponding device time t 2 ; and based on the current switching time t 1 and the current installation time t 2 Calculate and generate a corresponding single absolute time error p single , p single =|t 2 -t 1 |;

[0083] Among them, the switching time t 1 , the current installation time t 2 The minimum time unit is milliseconds.

[0084] Here, the switch time acquisition instruction is another control instruction provided by the intelligent switch of the embodiment of the present invention to the outside, through which the real-time timing time in the intelligent switch can be obtained; after receiving the switch time acquisition instruction, the intelligent switch will use the real-time timing time of the internal timing chip / module as the corresponding switch time acquisition instruction feedback data to return to the sender of the current switch time acquisition instruction, that is, the test device of the embodiment of the present invention.

[0085] Step 4: After the traversal, the test device obtains all the temperature-error data pairs (x i ,p i ) performing normal and abnormal temperature zone identification to obtain corresponding normal temperature zone set and abnormal temperature zone set; and setting the time accuracy detection state of the intelligent switch according to the normal temperature zone set and the abnormal temperature zone set; and forming a corresponding time accuracy detection report from the obtained normal temperature zone set, abnormal temperature zone set and time accuracy detection state and saving it;

[0086] Specifically, step 41, after the traversal is completed, the test device obtains all temperature-error data pairs (x i ,p i) performing normal and abnormal temperature zone identification to obtain a corresponding normal temperature zone set and abnormal temperature zone set;

[0087] Among them, when the normal temperature zone set is not empty, it includes one or more normal temperature zones S a ; When the abnormal temperature zone set is not empty, it includes one or more abnormal temperature zones S b ;

[0088] Specifically, it includes: step 411, the test device constructs a two-dimensional coordinate plane with temperature T as the horizontal axis and absolute time error p as the vertical axis, which is recorded as the corresponding temperature-error coordinate plane;

[0089] Step 412, and based on each temperature-error data pair (x i ,p i ) Mark the corresponding coordinate points on the temperature-error coordinate plane to obtain the corresponding first marked point d i ; and for every two adjacent first marking points d i Connect the straight line segments to obtain N-1 first straight line segments;

[0090] Here, each first marked point d i And every two adjacent first marking points d i The first straight line segment between Figure 2 A first marking point d provided in the first embodiment of the present invention i , the first straight line segment and the error threshold straight line example schematic diagram for intuitive understanding;

[0091] Step 413, based on the preset absolute time error threshold p max Mark a straight line parallel to the horizontal axis of temperature T on the temperature-error coordinate plane as the corresponding error threshold straight line;

[0092] Here, the absolute time error threshold p max is a preset real number greater than 0; the error threshold straight line mentioned here can also refer to Figure 2 To gain intuitive understanding;

[0093] Step 414, the absolute time error p on the temperature-error coordinate plane is i Greater than or equal to the absolute time error threshold p max The first marking point d i Recorded as the corresponding first abnormal marking point; and the total number of the first abnormal marking points is counted to obtain the corresponding first total number;

[0094] Step 415, identifying the first total number;

[0095] Step 416: If the first total is 0, the test temperature zone [T s ,Te ] as a unique normal temperature zone to form a corresponding normal temperature zone set; and set the corresponding abnormal temperature zone set to empty;

[0096] Step 417, if the first total is not 0, then performing normal and abnormal temperature zone identification according to all the first abnormal marking points obtained to obtain a corresponding normal temperature zone set and abnormal temperature zone set;

[0097] Specifically, step 4171, traversing all first abnormal marking points; and during the traversal, taking the currently traversed first abnormal marking point as the corresponding current abnormal marking point; and at one or two first marking points d adjacent to the current abnormal marking point i If not all of them are first abnormal marking points, the first marking points that are not first abnormal marking points d i The first straight line segment between the current abnormal marking point and the error threshold straight line is taken as the corresponding current straight line segment in turn; and the coordinates of the only intersection of the current straight line segment and the error threshold straight line are solved to obtain the corresponding first intersection coordinates; and when the first intersection coordinates do not match the point coordinates of the current abnormal marking point, the coordinate point corresponding to the first intersection coordinates on the temperature-error coordinate plane is recorded as the corresponding newly added abnormal marking point; and at the end of the traversal, each first abnormal marking point and each newly added abnormal marking point are recorded as the corresponding second abnormal marking point;

[0098] For example, Figure 3 Taking a schematic diagram of a slicing / normal / abnormal temperature zone example provided in the first embodiment of the present invention as an example, the test temperature zone [T s ,T e ] The number of tests N = 13, the temperature measurement sequence X consists of 13 test temperatures x 1≤i≤13 Composition, each test temperature x 1≤i≤13 Corresponding to a first marking point d 1≤i≤13 ; Among them, the first marking point d i＝1、5、10、12、13 These 5 points are all first abnormal marking points, and the total number of first abnormal marking points, i.e. the first total number, is 5;

[0099] Then, for the first marked point d i＝1、5、10、12、13 To traverse:

[0100] The current abnormal marking point is the first marking point d i＝1 When the first mark point d adjacent to the current abnormal mark point i＝2 is not the first abnormal marking point, then the first marking point d i＝1 With the first marked point d i＝2 The coordinates of the only intersection of the first straight line segment between and the error threshold line are Figure 3 Middle mark point e 2 The corresponding coordinates, the e 2The coordinates do not match the current abnormal marking point, so mark point e 2 As a new abnormal marker point;

[0101] The current abnormal marking point is the first marking point d i＝5 When the two first marking points d adjacent to the current abnormal marking point i＝4、6 None of them is the first abnormal marking point, then the first marking point d i＝5 With the first marked point d i＝4 and the first marked point d i＝5 With the first marked point d i＝6 The first straight line segment between is taken as the current straight line segment in turn, and the unique intersection coordinates of the two current straight line segments and the error threshold straight line are Figure 3 Middle mark point e 3、5 The corresponding two coordinates, e 3、5 The corresponding two coordinates do not match the current abnormal marking point, so the marking point e 3 、e 5 All of them are used as new abnormal marking points;

[0102] The current abnormal marking point is the first marking point d i＝10 When the two first marking points d adjacent to the current abnormal marking point i＝9、11 None of them is the first abnormal marking point, then the first marking point d i＝10 With the first marked point d i＝9 and the first marked point d i＝10 With the first marked point d i＝11 The first straight line segment between is taken as the current straight line segment in turn, and the unique intersection coordinates of the two current straight line segments and the error threshold straight line are Figure 3 Middle mark point e 6、8 The corresponding two coordinates, e 6、8 The corresponding two coordinates do not match the current abnormal marking point, so the marking point e 6 、e 8 All of them are used as new abnormal marking points;

[0103] The current abnormal marking point is the first marking point d i＝12 When the two first marking points d adjacent to the current abnormal marking point i＝11、13 Only the first marked point d i＝11 is not the first abnormal marking point, then the first marking point d i＝12 With the first marked point d i＝11 The first straight line segment between is taken as the current straight line segment, and the coordinates of the only intersection of this current straight line segment and the error threshold straight line are Figure 3 Middle mark point e 9 The corresponding coordinates, e 9The corresponding coordinates do not match the current abnormal marking point, so the marking point e 9 As a new abnormal marker point;

[0104] The current abnormal marking point is the first marking point d i＝13 When the first mark point d adjacent to the current abnormal mark point i＝12 If it is the first abnormal marker point, then no new abnormal marker point identification will be performed;

[0105] At the first marked point d i＝1、5、10、12、13 At the end of the traversal, each first abnormal marking point and each newly added abnormal marking point are recorded as the corresponding second abnormal marking point, and 5+6=11 second abnormal marking points can be obtained;

[0106] Step 4172, the total number of the second abnormal marking points is counted to obtain the corresponding second total number K; the temperature coordinate value and the absolute time error coordinate value corresponding to each second abnormal marking point are used as the corresponding first horizontal axis coordinate and the first vertical axis coordinate; and all the second abnormal marking points are sorted in the order of the first horizontal axis coordinate from low to high to obtain the corresponding second abnormal marking point sequence;

[0107] Among them, the second abnormal marking point sequence consists of K second abnormal marking points e k Sort by order, 1≤indexk≤K; each second abnormal mark point e k Corresponding to a first horizontal axis coordinate x k and a first ordinate coordinate p k ;

[0108] For example, Figure 3 For example, if there are 11 second abnormal marking points, then K = 11, then the obtained second abnormal marking point sequence is composed of 11 second abnormal marking points e 1-11 Composition; Among them, the second abnormal mark point e k＝1、4、7、10、11 Respectively with the first marking point d i＝1、5、10、12、13 Corresponding to; the second abnormal mark point e k＝2、3、5、6、8、9 This corresponds to the 6 newly added abnormal marking points obtained in the above step 4171;

[0109] Step 4173, and every two adjacent second abnormal marking points e in the second abnormal marking point sequence k The corresponding two first horizontal axis coordinates x k As the upper and lower thresholds of a temperature range, a corresponding shard temperature zone s is formed. j , 1≤indexj≤K-1; and on the temperature-error coordinate plane, calculate each slice temperature zone s j Absolute time error p i Less than the absolute time error threshold p maxThe first marking point d i The total number of shards is counted to obtain the corresponding shard statistics; and the shard temperature zones s whose shard statistics are not 0 are counted j Record as the corresponding non-abnormal shard, and count the shard temperature zones s whose total number of shards is 0 j Recorded as the corresponding abnormal shard;

[0110] For example, Figure 3 For example, it is known that the second abnormal marker sequence consists of 11 second abnormal markers e 1-11 Then we can get 11-1=10 temperature zones. 1≤j≤10 ;

[0111] Then for each slice temperature zone s j Absolute time error p i Less than the absolute time error threshold p max The first marking point d i By counting the total number of , we can get:

[0112] Slice temperature zones 1 Total number of shard statistics = 0, shard temperature zone 2 Total number of shard statistics = 3,

[0113] Slice temperature zones 3 Total number of shard statistics = 0, shard temperature zone 4 Total number of shard statistics = 0,

[0114] Slice temperature zones 5 Total number of shards = 4, shard temperature zone 6 Total number of shard statistics = 0,

[0115] Slice temperature zones 7 Total number of shard statistics = 0, shard temperature zone 8 Total number of shard statistics = 1,

[0116] Slice temperature zones 9 Total number of shard statistics = 0, shard temperature zone 10 Total number of shard statistics = 0,

[0117] Then, the slice temperature zone s j＝1、3、4、6、7、9、10 For abnormal sharding, the sharding temperature zone is s j＝2、5、8 It is a non-abnormal shard;

[0118] Step 4174, and the adjacent slice temperature zones before and after itself j All non-abnormal shards are abnormal shards as a corresponding normal temperature zone S a; and merge multiple adjacent non-abnormal slices to obtain a corresponding first merged temperature zone, and use each first merged temperature zone as a corresponding normal temperature zone S a ; and for the normal temperature zone S a The total number of the corresponding normal temperature zones is obtained by counting the total number of the corresponding normal temperature zones;

[0119] For example, Figure 3 For example, the adjacent slice temperature zones s j There are s non-abnormal shards that are all abnormal shards. j＝2、5、8 , so j＝2、5、8 Each as a normal temperature zone S a ; There are no adjacent non-abnormal slices, that is, there are no continuous non-abnormal slices, so no non-abnormal slices are merged; the total number of normal temperature zones obtained in the end = 3;

[0120] Step 4175, and the adjacent slice temperature zones before and after itself j The abnormal shards that are all non-abnormal shards are regarded as a corresponding abnormal temperature zone S b ; and merge the adjacent multiple abnormal slices to obtain a corresponding second merged temperature zone, and each second merged temperature zone is used as a corresponding abnormal temperature zone S b ; and for abnormal temperature zone S b The total number of abnormal temperature zones is obtained by counting the total number of abnormal temperature zones.

[0121] For example, Figure 3 For example, the adjacent slice temperature zones s j The only abnormal shards that are all non-abnormal shards are s j＝1 , so j＝1 As an abnormal temperature zone S b ; There are three groups of adjacent non-abnormal shards: s j＝3、4 、s j＝6、7 、s j＝9、10 , then for s j＝3、4 Merging can get an abnormal temperature zone S b , for j＝6、7 Merging can get an abnormal temperature zone S b , for j＝9、10 Merging can get an abnormal temperature zone S b ; The total number of abnormal temperature zones obtained finally = 4;

[0122] Step 4176, and identify the total number of normal temperature zones; if the total number of normal temperature zones is 0, set the corresponding normal temperature zone set to empty; if the total number of normal temperature zones is greater than 0, then all normal temperature zones S a Form a corresponding normal temperature zone set;

[0123] For example, Figure 3 For example, if the total number of normal temperature zones is known to be 3, then the normal temperature zone set includes 3 normal temperature zones S a ;

[0124] Step 4177, and identify the total number of abnormal temperature zones; if the total number of abnormal temperature zones is 0, set the corresponding abnormal temperature zone set to empty; if the total number of abnormal temperature zones is greater than 0, then all abnormal temperature zones S b Form a corresponding abnormal temperature zone set;

[0125] For example, Figure 3 For example, if the total number of abnormal temperature zones is known to be 4, then the abnormal temperature zone set includes 4 abnormal temperature zones S b ;

[0126] Step 42, setting the time accuracy detection state of the intelligent switch according to the normal temperature zone set and the abnormal temperature zone set;

[0127] Among them, the time accuracy detection status includes time accuracy no abnormality, time accuracy low temperature abnormality, time accuracy normal temperature abnormality, time accuracy high temperature abnormality and time accuracy serious abnormality;

[0128] Specifically, it includes: step 421, identifying a normal temperature zone set and an abnormal temperature zone set;

[0129] Step 422, if the normal temperature zone set is empty, then set the corresponding time accuracy detection state to time accuracy serious abnormality;

[0130] Step 423, if the normal temperature zone set is not empty and the abnormal temperature zone set is empty, then set the corresponding time accuracy detection state to time accuracy without abnormality;

[0131] Step 424: If both the normal temperature zone set and the abnormal temperature zone set are not empty, then the abnormal temperature zone S in the abnormal temperature zone set that intersects with the preset low temperature zone is selected. b The number of low temperature zones is counted to obtain the corresponding total number of low temperature zones; and the abnormal temperature zones S in the abnormal temperature zone set that have an intersection with the preset high temperature zone are counted. b The number of high-temperature temperature zones is counted to obtain the corresponding total number of high-temperature temperature zones; and the total number of low-temperature and high-temperature temperature zones are identified; if the total number of low-temperature and high-temperature temperature zones are both 0, the corresponding time accuracy detection state is set to time accuracy normal temperature abnormality; if the total number of low-temperature temperature zones is greater than 0 and the total number of high-temperature temperature zones is 0, the corresponding time accuracy detection state is set to time accuracy low-temperature abnormality; if the total number of high-temperature temperature zones is greater than 0 and the total number of low-temperature temperature zones is 0, the corresponding time accuracy detection state is set to time accuracy high-temperature abnormality; if the total number of low-temperature and high-temperature temperature zones is greater than 0, the corresponding time accuracy detection state is set to time accuracy serious abnormality.

[0132] Here, the low temperature zone and the high temperature zone are two pre-set temperature intervals, there is no intersection between the two, and the low temperature zone < the high temperature zone;

[0133] For example, Figure 2 , Figure 3 For example, Figure 2 The abnormal temperature zones in the system are distributed at the low temperature and high temperature ends. If the low temperature zone and the high temperature zone are also set at the low temperature and high temperature ends, the time accuracy detection state obtained will be a serious abnormality of time accuracy. Figure 3 The abnormal temperature zones are not only distributed at the low and high temperature ends, but also near the middle of the test temperature zone. At this time, the time accuracy detection status obtained will also be seriously abnormal and worse than Figure 2 The abnormal situation presented is even more serious;

[0134] Step 43: A corresponding time accuracy detection report is formed by the obtained normal temperature zone set, abnormal temperature zone set and time accuracy detection status and is saved.

[0135] Figure 4 This is a module structure diagram of a processing device for detecting the time accuracy of an intelligent switch provided in the second embodiment of the present invention. The device is a terminal device or a server that implements the aforementioned method embodiment, and can also be a device that enables the aforementioned terminal device or server to implement the aforementioned method embodiment. For example, the device can be a device or chip system of the aforementioned terminal device or server. Figure 4 As shown, the apparatus includes: an external device communication module 201, a temperature measurement sequence setting module 202, a test execution module 203 and a test analysis module 204.

[0136] The external device communication module 201 is used to communicate data with a preset constant temperature box through a first communication method; and to communicate data with an intelligent switch pre-placed in the constant temperature box through a second communication method; wherein the first communication method includes a serial communication method, a network cable communication method, a USB communication method, a WI FI communication method and a Bluetooth communication method; the second communication method includes a serial communication method and a power line carrier communication method.

[0137] The temperature measurement sequence setting module 202 is used to receive the test temperature zone [T s ,T e ], single-step temperature difference △T, test number N and temperature adjustment mode; and based on the test temperature zone [T s ,T e ], single-step temperature difference △T and test number N set the corresponding temperature measurement sequence X; where T s is the starting temperature, T e is the end temperature, the number of tests N is a positive integer, N = 1 + (T e -Ts ) / △T,T s <0℃<△T <T e ; The temperature adjustment mode includes the first mode and the second mode; The temperature measurement sequence X consists of N test temperatures x i Sort by small to large, 1≤index i≤N, x i＝1 =T s 、x i+1 =x i +△T、x i＝N =T e .

[0138] The test execution module 203 is used to perform a test on all test temperatures x of the temperature measurement sequence X according to the traversal order corresponding to the temperature adjustment mode. i Traverse one by one; and in the traversal process, the current traversal test temperature x i as the corresponding current temperature; and adjusting the ambient temperature in the thermostat to the current temperature and confirming whether the ambient temperature in the thermostat is stable at the current temperature to obtain the corresponding confirmation result; and when the confirmation result is that the ambient temperature is stable, performing an absolute time error test on the intelligent switch to obtain the absolute time error p corresponding to the current temperature i ; and the current temperature and the corresponding absolute time error p i Form a corresponding temperature-error data pair (x i ,p i ); wherein, when the temperature control mode is the first mode, the corresponding traversal order is the forward traversal order of index i from 1 to N; when the temperature control mode is the second mode, the corresponding traversal order is the reverse traversal order of index i from N to 1; the confirmation results include that the ambient temperature has stabilized and the constant temperature box is abnormal.

[0139] The test analysis module 204 is used to analyze all the temperature-error data pairs (x i ,p i ) to identify normal and abnormal temperature zones to obtain corresponding normal temperature zone sets and abnormal temperature zone sets; and to set the time accuracy detection state of the intelligent switch according to the normal temperature zone set and the abnormal temperature zone set; and to form a corresponding time accuracy detection report from the obtained normal temperature zone set, abnormal temperature zone set and time accuracy detection state and save it; wherein, when the normal temperature zone set is not empty, it includes one or more normal temperature zones S a ; When the abnormal temperature zone set is not empty, it includes one or more abnormal temperature zones S b ; The time accuracy detection status includes no abnormality in time accuracy, abnormality in low temperature in time accuracy, abnormality in normal temperature in time accuracy, abnormality in high temperature in time accuracy and serious abnormality in time accuracy.

[0140] An embodiment of the present invention provides a processing device for detecting the time accuracy of an intelligent switch, which can execute the method steps in the above method embodiment. Its implementation principle and technical effect are similar and will not be repeated here.

[0141] It should be noted that it should be understood that the division of the various modules of the above device is only a division of logical functions. In actual implementation, they can be fully or partially integrated into one physical entity, or they can be physically separated. And these modules can all be implemented in the form of software called by processing elements; they can also be all implemented in the form of hardware; some modules can also be implemented in the form of software called by processing elements, and some modules can be implemented in the form of hardware. For example, the temperature measurement sequence setting module can be a separately established processing element, or it can be integrated in a chip of the above device. In addition, it can also be stored in the memory of the above device in the form of program code, and called and executed by a processing element of the above device. The function of the above-mentioned module is determined. The implementation of other modules is similar. In addition, all or part of these modules can be integrated together, or they can be implemented independently. The processing element described here can be an integrated circuit with signal processing capabilities. In the implementation process, each step of the above method or each module above can be completed by an integrated logic circuit of hardware in the processor element or instructions in the form of software.

[0142] For example, the above modules may be one or more integrated circuits configured to implement the above methods, such as: one or more specific integrated circuits (ASIC), or one or more digital signal processors (DSP), or one or more field programmable gate arrays (FPGA), etc. For another example, when a certain module above is implemented in the form of a processing element scheduling program code, the processing element may be a general-purpose processor, such as a central processing unit (CPU) or other processors that can call program codes. For another example, these modules may be integrated together and implemented in the form of a system-on-a-chip (SOC).

[0143] In the above embodiments, all or part of the embodiments may be implemented by software, hardware, firmware or any combination thereof. When implemented by software, all or part of the embodiments may be implemented in the form of a computer program product. The computer program product includes one or more computer instructions. When the computer program instructions are loaded and executed on a computer, all or part of the processes or functions described in the above method embodiments are generated. The above computer may be a general-purpose computer, a special-purpose computer, a computer network, or other programmable devices. The above-mentioned computer instructions can be stored in a computer-readable storage medium, or transmitted from one computer-readable storage medium to another computer-readable storage medium. For example, the above-mentioned computer instructions can be transmitted from one website, computer, server or data center to another website, computer, server or data center through wired (such as coaxial cable, optical fiber, digital subscriber line (DSL)) or wireless (such as infrared, wireless, Bluetooth, microwave, etc.) methods. The above-mentioned computer-readable storage medium can be any available medium that can be accessed by a computer or a data storage device such as a server or data center that includes one or more available media integrated. The above-mentioned available media can be magnetic media (such as floppy disks, hard disks, tapes), optical media (such as DVDs), or semiconductor media (such as solid-state drives (SSDs)), etc.

[0144] Figure 5 This is a schematic diagram of the structure of an electronic device provided in Embodiment 3 of the present invention. The electronic device may be a terminal device or a server for implementing the method of the aforementioned embodiment, or may be a terminal device or a server for implementing the method of the aforementioned embodiment connected to the aforementioned terminal device or server. Figure 5 As shown, the electronic device may include: a processor 301 (such as a CPU), a memory 302, and a transceiver 303; the transceiver 303 is coupled to the processor 301, and the processor 301 controls the transceiver 303. Various instructions may be stored in the memory 302 to complete various processing functions and implement the processing steps described in the aforementioned embodiment method. Preferably, the electronic device involved in the embodiment of the present invention also includes: a power supply 304, a system bus 305 and a communication port 306. The system bus 305 is used to realize the communication connection between components. The above-mentioned communication port 306 is used for connecting and communicating between the electronic device and other peripherals.

[0145] exist Figure 5The system bus 305 mentioned in the figure can be a Peripheral Component Interconnect (PCI) bus or an Extended Industry Standard Architecture (EISA) bus, etc. The system bus can be divided into an address bus, a data bus, a control bus, etc. For ease of representation, only one thick line is used in the figure, but it does not mean that there is only one bus or one type of bus. The communication interface is used to realize the communication between the database access device and other devices (such as a client, a read-write library, and a read-only library). The memory may include a random access memory (RAM), and may also include a non-volatile memory (Non-Vol at ile Memory), such as at least one disk storage.

[0146] The above-mentioned processors can be general-purpose processors, including central processing units (CPU), network processors (Network Processor, NP), graphics processing units (Graphics Processing Unit, GPU), etc.; they can also be digital signal processors DSP, application-specific integrated circuits ASIC, field programmable gate arrays FPGA or other programmable logic devices, discrete gate or transistor logic devices, discrete hardware components.

[0147] It should be noted that an embodiment of the present invention further provides a computer-readable storage medium, in which instructions are stored. When the computer-readable storage medium is run on a computer, the computer executes the method and processing process provided in the above embodiments.

[0148] An embodiment of the present invention further provides a chip for executing instructions, wherein the chip is used to execute the processing steps described in the aforementioned method embodiment.

[0149] The embodiment of the present invention provides a processing method, device, electronic device and computer-readable storage medium for detecting the time accuracy of an intelligent switch. As can be seen from the above content, the embodiment of the present invention generates a corresponding temperature measurement sequence after receiving the test temperature zone, single-step temperature difference, number of tests and temperature adjustment mode input by the tester; and traverses all the test temperatures of the temperature measurement sequence one by one according to the traversal order corresponding to the temperature adjustment mode (when the temperature adjustment mode is the first mode, the traversal order is from low temperature to high temperature, and when the temperature adjustment mode is the second mode, the traversal order is from high temperature to low temperature), and sets the ambient temperature of the thermostat based on the current test temperature during the traversal process, and performs an absolute time error test on the intelligent switch in the thermostat when the ambient temperature is stable, and forms a corresponding temperature-error data pair by the current test temperature and the corresponding absolute time error; and after the traversal, normal / abnormal temperature zones are identified according to all the obtained temperature-error data pairs to obtain a normal / abnormal temperature zone set; and the corresponding time accuracy detection state is set according to the normal / abnormal temperature zone set; and the normal / abnormal temperature zone set + time accuracy detection state form a corresponding detection report and save it. The embodiment of the present invention provides a time accuracy detection scheme related to temperature changes for an intelligent switch. Through the embodiment of the present invention, not only the time accuracy performance (time accuracy detection status) of the intelligent switch in a test temperature zone can be confirmed, but also each normal / abnormal temperature zone of the time accuracy of the intelligent switch in the test temperature zone can be identified; testing based on the detection scheme of the embodiment of the present invention during the design / factory stage of the intelligent switch helps to improve the design / factory quality of the intelligent switch, and testing based on the detection scheme of the embodiment of the present invention during the maintenance stage of the intelligent switch helps to improve the problem location speed of abnormal time accuracy problems.

[0150] The professionals should further realize that the units and algorithm steps of each example described in conjunction with the embodiments disclosed herein can be implemented by electronic hardware, computer software, or a combination of the two. In order to clearly illustrate the interchangeability of hardware and software, the composition and steps of each example have been generally described in the above description according to the function. Whether these functions are performed in hardware or software depends on the specific application and design constraints of the technical solution. Professionals and technicians can use different methods to implement the described functions for each specific application, but such implementation should not be considered to be beyond the scope of the present invention.

[0151] The steps of the method or algorithm described in conjunction with the embodiments disclosed herein may be implemented using hardware, a software module executed by a processor, or a combination of the two. The software module may be placed in a random access memory (RAM), a memory, a read-only memory (ROM), an electrically programmable ROM, an electrically erasable programmable ROM, a register, a hard disk, a removable disk, a CD-ROM, or any other form of storage medium known in the art.

[0152] The specific implementation methods described above further illustrate the objectives, technical solutions and beneficial effects of the present invention in detail. It should be understood that the above description is only a specific implementation method of the present invention and is not intended to limit the scope of protection of the present invention. Any modifications, equivalent substitutions, improvements, etc. made within the spirit and principles of the present invention should be included in the scope of protection of the present invention.

Claims

1. A processing method for detecting the time accuracy of an intelligent switch, characterized in that: The method comprises: The test device communicates data with a preset constant temperature box through a first communication method; and communicates data with an intelligent switch pre-placed in the constant temperature box through a second communication method; the first communication method includes a serial communication method, a network cable communication method, a USB communication method, a WIFI communication method and a Bluetooth communication method; the second communication method includes a serial communication method and a power line carrier communication method; The test device receives the test temperature zone [T s ,T e ], single-step temperature difference △T, test number N and temperature adjustment mode; and based on the test temperature zone [T s ,T e ], the single-step temperature difference ΔT and the number of tests N set the corresponding temperature measurement sequence X; T s is the starting temperature, T e is the end temperature, the test number N is a positive integer, N = 1 + (T e -T s ) / △T,T s <0℃<△T <T e ; The temperature adjustment mode includes a first mode and a second mode; The temperature measurement sequence X consists of N test temperatures x i Sort by small to large, 1≤index i≤N, x i＝1 =T s 、x i+1 =x i +△T、x i＝N =T e ; The testing device performs a traversal sequence corresponding to the temperature adjustment mode on all the test temperatures x of the temperature measurement sequence X. i Traverse one by one; and in the traversal process, the test temperature x currently traversed i as the corresponding current temperature; and adjusting the ambient temperature in the thermostat to the current temperature and confirming whether the ambient temperature in the thermostat is stable at the current temperature to obtain a corresponding confirmation result; and when the confirmation result is that the ambient temperature is stable, performing an absolute time error test on the intelligent switch to obtain an absolute time error p corresponding to the current temperature i ; and by the current temperature and the corresponding absolute time error p i Form a corresponding temperature-error data pair (x i ,p i ); when the temperature adjustment mode is the first mode, the corresponding traversal order is the forward traversal order of the index i from 1 to N; when the temperature adjustment mode is the second mode, the corresponding traversal order is the reverse traversal order of the index i from N to 1; the confirmation result includes that the ambient temperature has stabilized and the thermostat is abnormal; After the traversal is completed, the test device obtains all the temperature-error data pairs (x i ,p i ) to identify normal and abnormal temperature zones to obtain corresponding normal temperature zone sets and abnormal temperature zone sets; and to set the time accuracy detection state of the intelligent switch according to the normal temperature zone set and the abnormal temperature zone set; and to form a corresponding time accuracy detection report based on the obtained normal temperature zone set, the abnormal temperature zone set and the time accuracy detection state and save it; when the normal temperature zone set is not empty, it includes one or more normal temperature zones S a ; When the abnormal temperature zone set is not empty, it includes one or more abnormal temperature zones S b ; The time accuracy detection status includes no abnormality in time accuracy, abnormality in low temperature in time accuracy, abnormality in normal temperature in time accuracy, abnormality in high temperature in time accuracy and serious abnormality in time accuracy; Wherein, all the temperature-error data pairs (x i ,p i ) to identify normal and abnormal temperature zones to obtain corresponding normal temperature zone sets and abnormal temperature zone sets, specifically including: The test device constructs a two-dimensional coordinate plane with temperature T as the horizontal axis and absolute time error p as the vertical axis, which is recorded as the corresponding temperature-error coordinate plane; And based on each of the temperature-error data pairs (x i ,p i ) Mark the corresponding coordinate point on the temperature-error coordinate plane to obtain the corresponding first marking point d i ; and for every two adjacent first marking points d i Connect the straight line segments to obtain N-1 first straight line segments; And based on the preset absolute time error threshold p max Mark a straight line parallel to the horizontal axis of temperature T on the temperature-error coordinate plane as the corresponding error threshold straight line; The absolute time error p on the temperature-error coordinate plane is i Greater than or equal to the absolute time error threshold p max The first marking point d i Recorded as the corresponding first abnormal marking point; and the total number of the first abnormal marking points is counted to obtain the corresponding first total number; and identifying the first total number; If the first total is 0, the test temperature zone [T s ,T e ] as a unique normal temperature zone to form a corresponding normal temperature zone set; and the corresponding abnormal temperature zone set is set to empty; If the first total number is not 0, performing normal and abnormal temperature zone identification according to all the first abnormal marking points obtained to obtain the corresponding normal temperature zone set and the abnormal temperature zone set; The step of performing normal and abnormal temperature zone identification according to all the first abnormal marking points to obtain the corresponding normal temperature zone set and abnormal temperature zone set specifically includes: The testing device traverses all the first abnormal marking points; and during the traversal, the first abnormal marking point currently traversed is used as the corresponding current abnormal marking point; and one or two first marking points d adjacent to the current abnormal marking point are i When not all of them are the first abnormal marking points, the first marking points d that are not the first abnormal marking points are i The first straight line segment between the current abnormal marking point and the first straight line segment is sequentially used as the corresponding current straight line segment; and the coordinates of the unique intersection of the current straight line segment and the error threshold straight line are solved to obtain the corresponding first intersection coordinates; and when the first intersection coordinates do not match the point coordinates of the current abnormal marking point, the coordinate point corresponding to the first intersection coordinates on the temperature-error coordinate plane is recorded as the corresponding newly added abnormal marking point; and at the end of the traversal, each of the first abnormal marking points and each of the newly added abnormal marking points are recorded as the corresponding second abnormal marking point; The total number of the second abnormal marking points is counted to obtain the corresponding second total number K; the temperature coordinate value and the absolute time error coordinate value corresponding to each of the second abnormal marking points are used as the corresponding first horizontal axis coordinate and the first vertical axis coordinate; and all the second abnormal marking points are sorted in the order of the first horizontal axis coordinate from low to high to obtain the corresponding second abnormal marking point sequence; the second abnormal marking point sequence consists of K second abnormal marking points e k Sort by order, 1≤index k≤K; each of the second abnormal marking points e k Corresponding to a first horizontal axis coordinate x k and a first ordinate coordinate p k ; And every two adjacent second abnormal marking points e in the second abnormal marking point sequence k The corresponding two first horizontal axis coordinates x k As the upper and lower thresholds of a temperature range, a corresponding shard temperature zone s is formed. j , 1≤index j≤K-1; and for each of the slice temperature zones s on the temperature-error coordinate plane j The absolute time error p i is smaller than the absolute time error threshold p max The first marking point d i The total number of the corresponding slice statistics is counted; and the slice temperature zone s whose slice statistics total is not 0 is counted j Recorded as the corresponding non-abnormal slice, and the slice temperature zone s whose total number of slice statistics is 0 j Recorded as the corresponding abnormal shard; And the adjacent slice temperature zones s j The non-abnormal slices that are all abnormal slices are regarded as a corresponding normal temperature zone S a ; and merge the adjacent plurality of non-abnormal slices to obtain a corresponding first merged temperature zone, and use each of the first merged temperature zones as a corresponding normal temperature zone S a ; and the normal temperature zone S a The total number of the corresponding normal temperature zones is obtained by counting the total number of the corresponding normal temperature zones; And the adjacent slice temperature zones s j The abnormal slices that are all the non-abnormal slices are regarded as a corresponding abnormal temperature zone S b ; and merge the adjacent multiple abnormal slices to obtain a corresponding second merged temperature zone, and each of the second merged temperature zones is used as a corresponding abnormal temperature zone S b ; and for the abnormal temperature zone S b The total number of abnormal temperature zones is obtained by counting the total number of abnormal temperature zones. And identify the total number of normal temperature zones; if the total number of normal temperature zones is 0, set the corresponding normal temperature zone set to be empty; if the total number of normal temperature zones is greater than 0, then all the normal temperature zones S a Forming the corresponding normal temperature zone set; And identify the total number of abnormal temperature zones; if the total number of abnormal temperature zones is 0, set the corresponding abnormal temperature zone set to empty; if the total number of abnormal temperature zones is greater than 0, then all the abnormal temperature zones S b Forming a corresponding set of abnormal temperature zones; The setting of the time accuracy detection state of the intelligent switch according to the normal temperature zone set and the abnormal temperature zone set specifically includes: The testing device identifies the normal temperature zone set and the abnormal temperature zone set; If the normal temperature zone set is empty, the corresponding time accuracy detection state is set to be a serious abnormality in time accuracy; If the normal temperature zone set is not empty and the abnormal temperature zone set is empty, setting the corresponding time accuracy detection state to time accuracy without abnormality; If both the normal temperature zone set and the abnormal temperature zone set are not empty, the abnormal temperature zone S in the abnormal temperature zone set that intersects with the preset low temperature zone is selected. b The number of low temperature zones is counted to obtain the corresponding total number of low temperature zones; and the abnormal temperature zones S in the abnormal temperature zone set that have an intersection with the preset high temperature zone are counted. b The number of high-temperature temperature zones is counted to obtain the corresponding total number of high-temperature temperature zones; and the total number of low-temperature and high-temperature temperature zones are identified; if the total number of low-temperature and high-temperature temperature zones are both 0, the corresponding time accuracy detection state is set to time accuracy normal temperature abnormality; if the total number of low-temperature temperature zones is greater than 0 and the total number of high-temperature temperature zones is 0, the corresponding time accuracy detection state is set to time accuracy low-temperature abnormality; if the total number of high-temperature temperature zones is greater than 0 and the total number of low-temperature temperature zones is 0, the corresponding time accuracy detection state is set to time accuracy high-temperature abnormality; if the total number of low-temperature and high-temperature temperature zones is greater than 0, the corresponding time accuracy detection state is set to time accuracy serious abnormality.

2. The processing method for detecting the time accuracy of an intelligent switch according to claim 1, characterized in that: The step of adjusting the ambient temperature in the thermostat to the current temperature and confirming whether the ambient temperature in the thermostat is stable at the current temperature to obtain a corresponding confirmation result specifically includes: The testing device sends a temperature adjustment instruction carrying the current temperature to the thermostat; and uses the temperature adjustment instruction feedback data sent back by the thermostat as the corresponding current instruction execution status; the current instruction execution status includes success and failure; and identifying the current instruction execution state; If the current instruction execution status is failure, then after waiting for a preset first delay time L de1 Then, the temperature adjustment instruction carrying the current temperature is sent to the thermostat again until the latest execution status of the current instruction is successful; If the current instruction execution status is successful, an empty sequence is initialized as the corresponding first query temperature sequence; and a temperature query instruction is periodically sent to the thermostat according to a preset query time frequency; and the temperature query instruction feedback data sent back by the thermostat at that time is added to the first query temperature sequence as a corresponding first query temperature; and at the end of each sequence addition, the total number of the first query temperatures in the first query temperature sequence is counted and the current statistical result is used as the corresponding current sequence length L; and whether the current sequence length L exceeds the preset maximum sequence length threshold L max Identify; if the current sequence length L does not exceed the maximum sequence length threshold L max , when the current sequence length L is greater than or equal to the preset first length threshold L1, the absolute temperature differences between the nearest L1 first query temperatures in the first query temperature sequence and the current temperature are calculated to obtain corresponding L1 first absolute temperature differences, and when the obtained L1 first absolute temperature differences all meet the preset reasonable temperature difference range, the query is stopped and the corresponding confirmation result is set as the ambient temperature is stable; if the current sequence length L has exceeded the maximum sequence length threshold L max , then stop querying and set the corresponding confirmation result as the constant temperature box abnormality.

3. The processing method for detecting the time accuracy of an intelligent switch according to claim 1, characterized in that: The absolute time error test is performed on the intelligent switch to obtain an absolute time error p corresponding to the current temperature. i , specifically including: The test device performs a time synchronization on the smart switch; and after confirming that the time synchronization is completed, the absolute time error of the smart switch is calculated every preset first time period to obtain a corresponding single absolute time error p single ; and in the single absolute time error p single When the total number of samples is equal to the preset total number threshold M, the measurement is stopped and the M single absolute time errors p are calculated. single Perform mean calculation and use the calculation result as the absolute time error p corresponding to the current temperature i .

4. The processing method for detecting the time accuracy of an intelligent switch according to claim 3 is characterized in that: The performing time synchronization on the intelligent switch specifically includes: The test device uses the current device time as the corresponding synchronization time t0; and sends a time synchronization instruction carrying the synchronization time t0 to the intelligent switch; and uses the time synchronization instruction feedback data sent back by the intelligent switch as the corresponding current instruction execution status; and confirms that the time synchronization is completed when the current instruction execution status is synchronization success; the current instruction execution status includes synchronization success and synchronization failure; the minimum time unit of the synchronization time t0 is milliseconds.

5. The processing method for detecting the time accuracy of an intelligent switch according to claim 3, characterized in that: The absolute time error of the intelligent switch is measured once every preset first time period to obtain a corresponding single absolute time error p single , specifically including: The test device sends a switch time acquisition instruction to the intelligent switch once every preset first time period; and uses the switch time acquisition instruction feedback data sent back by the intelligent switch as the corresponding switch time t1; and uses the data receiving time when the device receives the switch time acquisition instruction feedback data as the corresponding device time t2; and calculates and generates a corresponding single absolute time error p based on the switch time t1 and the device time t2. single , p single =|t2-t1|; the minimum time unit of the current switch time t1 and the current device time t2 is milliseconds.

6. A device for executing the processing method for detecting the time accuracy of an intelligent switch according to any one of claims 1 to 5, characterized in that: The device comprises: an external device communication module, a temperature measurement sequence setting module, a test execution module and a test analysis module; The external device communication module is used to communicate data with a preset constant temperature box through a first communication method; and to communicate data with a smart switch pre-placed in the constant temperature box through a second communication method; the first communication method includes a serial communication method, a network cable communication method, a USB communication method, a WIFI communication method and a Bluetooth communication method; the second communication method includes a serial communication method and a power line carrier communication method; The temperature measurement sequence setting module is used to receive the test temperature zone [T s ,T e ], single-step temperature difference △T, test number N and temperature adjustment mode; and based on the test temperature zone [T s ,T e ], the single-step temperature difference ΔT and the number of tests N set the corresponding temperature measurement sequence X; T s is the starting temperature, T e is the end temperature, the test number N is a positive integer, N = 1 + (T e -T s ) / △T,T s <0℃<△T <T e ; The temperature adjustment mode includes a first mode and a second mode; The temperature measurement sequence X consists of N test temperatures x i Sort by small to large, 1≤index i≤N, x i＝1 =T s 、x i+1 =x i +△T、x i＝N =T e ; The test execution module is used to perform a test on all the test temperatures x of the temperature measurement sequence X in a traversal order corresponding to the temperature adjustment mode. i Traverse one by one; and in the traversal process, the test temperature x currently traversed i as the corresponding current temperature; and adjusting the ambient temperature in the thermostat to the current temperature and confirming whether the ambient temperature in the thermostat is stable at the current temperature to obtain a corresponding confirmation result; and when the confirmation result is that the ambient temperature is stable, performing an absolute time error test on the intelligent switch to obtain an absolute time error p corresponding to the current temperature i ; and by the current temperature and the corresponding absolute time error p i Form a corresponding temperature-error data pair (x i ,p i ); when the temperature adjustment mode is the first mode, the corresponding traversal order is the forward traversal order of the index i from 1 to N; when the temperature adjustment mode is the second mode, the corresponding traversal order is the reverse traversal order of the index i from N to 1; the confirmation result includes that the ambient temperature has stabilized and the thermostat is abnormal; The test analysis module is used to obtain all the temperature-error data pairs (x i ,p i ) to identify normal and abnormal temperature zones to obtain corresponding normal temperature zone sets and abnormal temperature zone sets; and to set the time accuracy detection state of the intelligent switch according to the normal temperature zone set and the abnormal temperature zone set; and to form a corresponding time accuracy detection report based on the obtained normal temperature zone set, the abnormal temperature zone set and the time accuracy detection state and save it; when the normal temperature zone set is not empty, it includes one or more normal temperature zones S a ; When the abnormal temperature zone set is not empty, it includes one or more abnormal temperature zones S b The time accuracy detection status includes no abnormality in time accuracy, abnormality in low temperature in time accuracy, abnormality in normal temperature in time accuracy, abnormality in high temperature in time accuracy and serious abnormality in time accuracy.

7. An electronic device, characterized in that: include: memory, processors, and transceivers; The processor is used to couple with the memory, read and execute instructions in the memory, so as to implement the method according to any one of claims 1 to 5; The transceiver is coupled to the processor, and the processor controls the transceiver to send and receive messages.

8. A computer-readable storage medium, characterized in that: The computer-readable storage medium stores computer instructions, and when the computer instructions are executed by a computer, the computer is enabled to execute the method according to any one of claims 1 to 5.

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