A method, system and storage medium for detecting double-axis docking deviation

By acquiring and processing the elliptical contour curve in the visual plan view, the biaxial docking deviation is calculated, which solves the problem in the existing technology of being unable to detect the biaxial docking deviation with small visual accessibility, and achieves high accuracy in a restricted space. detection.

CN118840369BActive Publication Date: 2025-01-21DONGHAI LAB
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Patent Information

Application Number
CN202411313868.7
Authority / Receiving Office
CN · China
Patent Type
Patents(China)
Current Assignee / Owner
Filing Date
2024-09-20
Publication Date
2025-01-21
Estimated Expiration
2044-09-20

AI Technical Summary

Technical Problem

The prior art cannot detect the butt deviation between two axes with less visual accessibility.

Method used

By obtaining a visual plan representing the relative positions of the first end surface and the second end surface in the focal plane projection, obtaining the first and second elliptical contour curves based on the ellipse detection algorithm, and calculating the angle deviation data and/or position deviation data to determine the dual axis Docking deviation.

Benefits of technology

It achieves accurate detection of biaxial docking deviation under the condition of small visual accessibility, avoiding the space limitations of traditional contact detection methods.

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Abstract

The present application discloses a detection method, system and storage medium for dual-axis docking deviation, and relates to the field of image processing technology. The method comprises: obtaining a visual plane map that can characterize the relative positions of the first end face and the second end face in the focal plane projection; obtaining a first elliptical contour curve characterizing the first end face and a second elliptical contour curve characterizing the second end face from the visual plane map based on an ellipse detection algorithm; obtaining docking deviation data based on the first elliptical contour curve and the second elliptical contour curve. The present application is not limited by visual accessibility, and even if the visual accessibility between the two axes is small (even 0), the docking deviation of the two axes can be obtained based on the present application.
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Description

Technical Field

[0001] The present application relates to the field of image processing technology, and specifically to a method, system and storage medium for detecting dual-axis docking deviation. Background Art

[0002] The docking deviation of the two axes refers to the difference between the actual position and the preset position of the two axes (for example, the first axis and the second axis hereinafter) after docking. The larger the docking deviation of the two axes, the larger the difference between the actual position and the preset position of the two axes after docking. In the prior art, since the docking deviation of shaft objects (cylindrical shafts or bearings, etc.) is generally transmitted through the outer cylindrical surface, inner cylindrical surface or end surface of the shaft, the docking deviation detection of shaft objects is generally also achieved by detecting the outer cylindrical surface, inner cylindrical surface or end surface of the shaft. In the prior art, a contact detection method (for example, a direct measurement method or an optical projection detection method) can be used to detect the deviation between the actual positions of the detected shaft objects, and then determine the docking deviation of the two axes. If the position of the two axes is limited (for example, the space for detection is small, etc.), it is impossible to use a contact detection method to measure the docking deviation of the two axes, and a non-contact detection method (for example, a 3D camera detection method) can also be used. In application scenarios where the operating space allows, multiple 3D cameras are arranged at appropriate positions and viewing angles to perform spatial 3D measurements of the measured shaft objects and their spatial positions. The acquired 3D measurement data is processed using professional software to establish a 3D model of the measured shaft objects and their spatial position reference, and the dual-axis docking deviation of the measured shaft objects in the 3D model is calculated.

[0003] It should be clear that the existing non-contact detection method can only be applied to application scenarios with large operating space and visual accessibility, and cannot meet the use requirements in many use environments. For example, there is a deviation in the installation position of the axis of the cockpit canopy trigger actuator (hereinafter referred to as the first axis) and the cockpit receiver axis (hereinafter referred to as the second axis) of a certain type of aircraft. Since the operating space in the cockpit and the axis at the installation position have low visual accessibility (that is, the first axis and the second axis can only be seen from certain angles), the detection methods in the existing technology are not applicable. Summary of the invention

[0004] The purpose of the present application is to provide a method, system and storage medium for detecting dual-axis docking deviation, so as to solve the technical problem in the prior art that the docking deviation between two axes with less visual accessibility cannot be detected.

[0005] To achieve the above objectives, this application provides the following technical solutions:

[0006] In a first aspect, the present application provides a method for detecting a double-axis docking deviation, wherein the double-axis includes a first axis and a second axis; a first end surface of the first axis and a second end surface of the second axis are opposite surfaces; the method includes:

[0007] Acquire a visual plane image capable of characterizing the relative positions of the first end surface and the second end surface in the focal plane projection;

[0008] Based on an ellipse detection algorithm, obtaining a first ellipse contour curve representing the first end surface and a second ellipse contour curve representing the second end surface from the visual plane image;

[0009] Based on the first elliptical contour curve and the second elliptical contour curve, docking deviation data is obtained; the docking deviation data includes angle deviation data and / or position deviation data; the angle deviation data is at least used to characterize the spatial angle between the center lines of the first axis and the second axis; the position deviation data is at least used to characterize the spatial distance between the center point of the first end face and the center point of the second end face.

[0010] As a specific solution in the technical solution of the present application, the docking deviation data includes angle deviation data; the axis centerline of the first axis is the first axis centerline; the axis centerline of the second axis is the second axis centerline; the acquisition of docking deviation data based on the first elliptical profile curve and the second elliptical profile curve includes:

[0011] Projecting the first elliptical profile curve and the second elliptical profile curve into a three-dimensional coordinate system; the first elliptical profile curve and the second elliptical profile curve are located in a plane formed by an x-axis and a y-axis in the three-dimensional coordinate system;

[0012] Obtain a first angle and a second angle; the first angle is the angle formed by the first axis line and the z-axis; the second angle is the angle formed by the major axis of the first elliptical profile curve and the x-axis;

[0013] Based on the first angle and the second angle, a first unit vector is acquired; the first unit vector is used to represent an extension direction of the first axis line in the three-dimensional coordinate system;

[0014] Obtaining a third angle and a fourth angle; the third angle is the angle formed by the second axis center line and the z-axis; the fourth angle is the angle formed by the major axis of the second elliptical profile curve and the x-axis;

[0015] Based on the third angle and the fourth angle, a second unit vector is obtained; the second unit vector is used to represent the extension direction of the second axis line in the three-dimensional coordinate system;

[0016] The angle deviation data is acquired based on the first unit vector and the second unit vector.

[0017] As a specific solution in the technical solution of the present application, the docking deviation data includes position deviation data; the center point of the first end surface is the first center point; the center point of the second end surface is the second center point; the docking deviation data is obtained based on the first elliptical contour curve and the second elliptical contour curve, including:

[0018] Projecting the first elliptical profile curve and the second elliptical profile curve into a three-dimensional coordinate system; the first elliptical profile curve and the second elliptical profile curve are located in a plane formed by an x-axis and a y-axis in the three-dimensional coordinate system;

[0019] Acquire a third center point of the first elliptical profile curve and a fourth center point of the second elliptical profile curve;

[0020] The position deviation data is acquired based on the third center point and the fourth center point.

[0021] As a specific solution in the technical solution of the present application, the calculation formula for obtaining the position deviation data based on the third center point and the fourth center point is as follows:

[0022]

[0023]

[0024] in, represents the position deviation data, δ represents the spatial angle formed by the first axis and the second axis; represents the first distance; represents the actual diameter of the first end surface; represents the length of the major axis of the first ellipse contour curve; represents the length of the minor axis of the first ellipse contour curve; represents the vector from the third center point to the fourth center point; represents the unit vector in the major axis direction of the first elliptical contour curve; Represents the unit vector in the direction of the minor axis of the first ellipse contour curve.

[0025] As a specific solution in the technical solution of the present application, the acquiring of the position deviation data based on the third center point and the fourth center point includes:

[0026] Based on the third center point and the fourth center point, a first distance is acquired; the first distance represents the distance between the projections of the first center point and the second center point in the same plane along a first direction; the first direction is parallel to the axis of the first axis;

[0027] Obtaining a spatial angle between the center lines of the first axis and the second axis;

[0028] The position deviation data is acquired based on the first distance and the spatial angle.

[0029] As a specific solution in the technical solution of the present application, the method uses a guide fixture, and the guide fixture includes at least a guide ring; the obtaining of a visual plane diagram capable of characterizing the relative positions of the first end face and the second end face in the focal plane projection includes:

[0030] A first guide fixture is arranged on the first shaft so that the axis center line of the first guide ring in the first guide fixture coincides with the axis center line of the first shaft;

[0031] and / or, a second guide fixture is provided on the second shaft so that the axis center line of the second guide ring in the second guide fixture coincides with the axis center line of the second shaft;

[0032] If the first guide fixture and the second guide fixture are used at the same time, a visual plan view including the first guide ring and the second guide ring is obtained; if only the first guide fixture is used, a visual plan view including the first guide ring and the second end face is obtained; if only the second guide fixture is used, a visual plan view including the first end face and the second guide ring is obtained.

[0033] As a specific solution in the technical solution of the present application, the guiding tool also includes a fastening ring and a plurality of connecting rods, the axial center lines of the fastening ring and the guiding ring coincide with each other, and one end of each connecting rod is connected to the fastening ring, and the other end of each connecting rod is connected to the guiding ring.

[0034] As a specific solution in the technical solution of the present application, when the first guide ring is used, the first end face is located inside the first surface; the center of gravity of the first guide ring belongs to the first surface, and the axis of the first guide ring is perpendicular to the first surface;

[0035] When the second guide ring is used, the second end face is located inside the second face; the center of gravity of the second guide ring belongs to the second face, and the axis of the second guide ring is perpendicular to the second face.

[0036] In a second aspect, the present application provides a detection system for a double-axis docking deviation, wherein the double-axis includes a first axis and a second axis; a first end surface of the first axis and a second end surface of the second axis are opposite surfaces; the system includes:

[0037] A photographing device, used for acquiring a visual plane image capable of representing the relative positions of the first end surface and the second end surface in a focal plane projection;

[0038] A processing device, based on an ellipse detection algorithm, obtains a first ellipse contour curve representing the first end surface and a second ellipse contour curve representing the second end surface from the visual plane image; the ellipse detection algorithm is pre-acquired;

[0039] And, based on the first elliptical contour curve and the second elliptical contour curve, docking deviation data is obtained; the docking deviation data includes angle deviation data and / or position deviation data; the angle deviation data is at least used to characterize the spatial angle between the center lines of the first axis and the second axis; the position deviation data is at least used to characterize the spatial distance between the center point of the first end face and the center point of the second end face.

[0040] As a specific solution in the technical solution of the present application, the docking deviation data includes angle deviation data; the axis centerline of the first axis is the first axis centerline; the axis centerline of the second axis is the second axis centerline; the processing device is also used to project the first elliptical contour curve and the second elliptical contour curve into a three-dimensional coordinate system; the first elliptical contour curve and the second elliptical contour curve are located in a plane formed by the x-axis and the y-axis in the three-dimensional coordinate system;

[0041] And, obtaining a first angle and a second angle; the first angle is the angle formed by the first axis line and the z-axis; the second angle is the angle formed by the major axis of the first elliptical profile curve and the x-axis;

[0042] And, based on the first angle and the second angle, a first unit vector is obtained; the first unit vector is used to represent the extension direction of the first axis line in the three-dimensional coordinate system;

[0043] And, obtaining a third angle and a fourth angle; the third angle is the angle formed by the second axis center line and the z-axis; the fourth angle is the angle formed by the major axis of the second elliptical profile curve and the x-axis;

[0044] And, based on the third angle and the fourth angle, a second unit vector is obtained; the second unit vector is used to represent the extension direction of the second axis line in the three-dimensional coordinate system;

[0045] And, based on the first unit vector and the second unit vector, the angle deviation data is acquired.

[0046] As a specific solution in the technical solution of the present application, the docking deviation data includes position deviation data; the center point of the first end face is the first center point; the center point of the second end face is the second center point; the processing device is also used to project the first elliptical contour curve and the second elliptical contour curve into a three-dimensional coordinate system; the first elliptical contour curve and the second elliptical contour curve are located in the plane formed by the x-axis and the y-axis in the three-dimensional coordinate system;

[0047] And, obtaining a third center point of the first elliptical profile curve and a fourth center point of the second elliptical profile curve;

[0048] And, based on the third center point and the fourth center point, the position deviation data is acquired.

[0049] As a specific solution in the technical solution of the present application, the processing device obtains the calculation formula of the position deviation data based on the third center point and the fourth center point as follows:

[0050]

[0051]

[0052] in, represents the position deviation data, δ represents the spatial angle formed by the first axis and the second axis; represents the first distance; represents the actual diameter of the first end surface; represents the length of the major axis of the first ellipse contour curve; represents the length of the minor axis of the first ellipse contour curve; represents the vector from the third center point to the fourth center point; represents the unit vector in the major axis direction of the first elliptical contour curve; Represents the unit vector in the direction of the minor axis of the first ellipse contour curve.

[0053] As a specific solution in the technical solution of the present application, the processing device is further used to obtain a first distance based on the third center point and the fourth center point; the first distance represents the distance between the projections of the first center point and the second center point in the same plane along a first direction; the first direction is parallel to the axis of the first axis;

[0054] And, obtaining a spatial angle between the center lines of the first axis and the second axis;

[0055] And, based on the first distance and the spatial angle, the position deviation data is acquired.

[0056] As a specific solution of the technical solution of the present application, it also includes a guiding tool, each guiding tool includes at least a guiding ring; the guiding tool includes: a first guiding tool and a second guiding tool;

[0057] The first guide fixture is used to be arranged on the first shaft so that the axis center line of the first guide ring in the first guide fixture coincides with the axis center line of the first shaft;

[0058] The second guide fixture is used to be arranged on the second shaft so that the axis center line of the second guide ring in the second guide fixture coincides with the axis center line of the second shaft;

[0059] The photographing device is also used to obtain a visual plan view having the first guide ring and the second guide ring if the first guide fixture and the second guide fixture are used at the same time; to obtain a visual plan view having the first guide ring and the second end face if only the first guide fixture is used; and to obtain a visual plan view having the first end face and the second guide ring if only the second guide fixture is used.

[0060] As a specific solution in the technical solution of the present application, the guiding tool also includes a fastening ring and a plurality of connecting rods, the axial center lines of the fastening ring and the guiding ring coincide with each other, and one end of each connecting rod is connected to the fastening ring, and the other end of each connecting rod is connected to the guiding ring.

[0061] In a third aspect, the present application proposes a computer-readable storage medium having a computer program stored thereon, and when the computer program is executed by a processor, the method for detecting a dual-axis docking deviation as described in any one of the first aspects is implemented.

[0062] Compared with the prior art, the beneficial effects of this application are:

[0063] The present application is not limited by visual accessibility. Even if the visual accessibility between the two axes is small (even 0), the docking deviation of the two axes can be obtained based on the present application. BRIEF DESCRIPTION OF THE DRAWINGS

[0064] Figure 1 A flow chart of a method for detecting a double-axis docking deviation proposed in an embodiment of the present application;

[0065] Figure 2 A schematic diagram of a dual-axis docking proposed in an embodiment of the present application;

[0066] Figure 3 A schematic diagram of another dual-axis docking proposed in an embodiment of the present application;

[0067] Figure 4 A schematic diagram of another dual-axis docking proposed in an embodiment of the present application;

[0068] Figure 5 This is a schematic diagram of the installation of the guide tooling proposed in the embodiment of the present application;

[0069] Figure 6 A schematic diagram of the structure of a guide tooling proposed in an embodiment of the present application;

[0070] Figure 7 A schematic diagram of camera positions for obtaining the visual plane map proposed in an embodiment of the present application;

[0071] Figure 8 A visual plan view proposed in an embodiment of the present application;

[0072] Fig. 9 A schematic diagram of an ellipse contour curve obtained based on a visual plane diagram according to an embodiment of the present application;

[0073] Fig.10 A schematic diagram of a three-dimensional structure in which a first elliptical contour curve is projected into a three-dimensional coordinate system according to an embodiment of the present application;

[0074] Fig.11 A schematic diagram of a three-dimensional structure in which a second elliptical contour curve is projected into a three-dimensional coordinate system according to an embodiment of the present application;

[0075] Fig.12 A schematic structural diagram of a dual-axis docking deviation detection system proposed in an embodiment of the present application.

[0076] In the figure: 1. first axis; 11. first axis center line; 12. first end face; 13. first center point; 2. second axis; 21. second axis center line; 22. second end face; 23. second center point; 3. obstruction; 4. guide tooling; 401. first guide tooling; 402. second guide tooling; 41. fastening ring; 42. guide ring; 421. first guide ring; 422. second guide ring; 423. first elliptical contour curve; 424. second elliptical contour curve; 43. connecting rod. DETAILED DESCRIPTION

[0077] The following will be combined with the drawings in the embodiments of the present application to clearly and completely describe the technical solutions in the embodiments of the present application. Obviously, the described embodiments are only part of the embodiments of the present application, not all of the embodiments. Based on the embodiments in the present application, all other embodiments obtained by ordinary technicians in this field without creative work are within the scope of protection of this application.

[0078] The technical solutions in the embodiments of the present application will be described clearly and completely below in conjunction with the drawings in the embodiments of the present application. Obviously, the described embodiments are only part of the embodiments of the present application, not all of the embodiments. Based on the embodiments in the present application, all other embodiments obtained by ordinary technicians in this field without creative work are within the scope of protection of this application.

[0079] The terms "first", "second", etc. in the description of the embodiment of the present application and the above-mentioned drawings are used to distinguish similar objects, and are not necessarily used to describe a specific order or sequence, such as the first center point and the second center point proposed below, which belong to different center points. It should be understood that the center points used in this way can be interchanged where appropriate, so that the embodiments described here can be implemented in an order other than the content illustrated or described here. In addition, the terms "including" and "having" and any of their variations are intended to cover non-exclusive inclusions, for example, a process, method, system, product or device that includes a series of steps or modules is not necessarily limited to those steps or modules clearly listed, but may include other steps or modules that are not clearly listed or inherent to these processes, methods, products or devices. The division of the modules that appear in the embodiment of the present application is only a logical division. There may be other division methods when implemented in actual applications, such as multiple modules can be combined or integrated into another system, or some features can be ignored, or not executed. In addition, the coupling or direct coupling or communication connection between each other shown or discussed can be through some interfaces, and the indirect coupling or communication connection between modules can be electrical or other similar forms, which are not limited in the embodiment of the present application. Furthermore, the modules or sub-modules described as separate components may or may not be physically separated, may or may not be physical modules, or may be distributed in multiple circuit modules, and some or all of the modules may be selected according to actual needs to achieve the purpose of the embodiment of the present application.

[0080] It should be clear that in order to enable those skilled in the art to clearly understand the dual-axis docking deviation proposed in the embodiment of the present application, in one embodiment of the present application, it is assumed that Figure 2 This is a schematic diagram of the preset position of the double-axis docking. Figure 3 Schematic diagram of the actual position of double-axis docking.

[0081] like Figure 2 As shown, under ideal conditions, the dual axis (i.e. Figure 2 After the first shaft 1 and the second shaft 2 are connected, the axis of the first shaft 1 (i.e. Figure 2 The first axis 11 shown in FIG. Figure 2The second axis 21 shown in FIG. 2 coincides with the first axis 11 (ie, the spatial angle between the first axis 11 and the second axis 21 is 0°); the center point of the first end surface 12 on the first axis 1 (ie, Figure 2 The first center point 13 shown in FIG. 1 and the center point of the second end surface 22 on the second axis 2 (ie, Figure 2 In this embodiment, the first end surface 12 of the first shaft 1 and the second end surface 22 of the second shaft 2 are opposite surfaces.

[0082] like Figure 3 As shown, in the actual docking process, the double axis (that is, Figure 3 After the first axis 1 and the second axis 2 are docked, since the first axis 1 and / or the second axis 2 are not in the preset position, the first axis centerline 11 and the second axis centerline 21 do not coincide, and the first center point 13 and the second center point 23 do not coincide. It is easy to understand that if the difference between the spatial angle between the first axis centerline 11 and the second axis centerline 21 and 0° is larger, the docking deviation of the two axes is larger; if the spatial distance between the first center point 13 and the second center point 23 is larger, the docking deviation of the two axes is also larger. That is to say, in the embodiments of the present application, the docking deviation of the two axes can be characterized by the spatial angle between the first axis centerline 11 and the second axis centerline 21 and / or the spatial distance between the first center point 13 and the second center point 23.

[0083] It should be noted that Figure 2 The display is only the most common dual-axis docking state in the prior art, and does not mean that the embodiments of the present application are only applicable to Figure 2 The embodiments of the present application are also applicable to the detection of the docking deviation of the double-axis in the docking state shown. The embodiments of the present application are also applicable to the detection of the docking deviation of the double-axis in the preset position where the first axis centerline and the second axis centerline do not coincide with each other (for example, the spatial angle between the first axis centerline and the second axis centerline at the preset position is 20° or 30°, etc.), and are also applicable to the detection of the docking deviation of the double-axis in the preset position where the first center point and the second center point do not coincide with each other (for example, the spatial distance between the first center point and the second center point at the preset position is 2mm or 10mm, etc.). In order to avoid redundancy, only the embodiments of the present application are described in detail. Figure 2 The various embodiments of the present application are described by taking the application scenario as an example.

[0084] In order to solve the technical problem that the prior art cannot detect the docking deviation between two axes with smaller visual accessibility, the present application proposes an embodiment of a dual-axis docking deviation detection method, such as Figure 2 and Figure 3As shown, the double shaft includes a first shaft 1 and a second shaft 2. The first end surface 12 of the first shaft 1 and the second end surface 22 of the second shaft 2 are opposite surfaces. In the embodiment of the present application, the shaft can be any part with a cylindrical shape, for example, the shaft can be a cylinder, a round tube or a bearing. Figure 1 As shown, the method for detecting the double-axis docking deviation includes steps S100 to S300.

[0085] Step S100: Acquire a visual plane image that can characterize the relative positions of the first end surface 12 and the second end surface 22 in the focal plane projection.

[0086] Specifically, in photography, the focal plane refers to the plane where the clear image is formed after the light passes through the lens. This plane is perpendicular to the optical axis of the lens, and the distance from the lens is exactly equal to the focal length of the lens. Since the focal plane is mature, the technology will not be described here.

[0087] Depend on Figure 2 and Figure 3 (The camera's shooting position and shooting angle are the same) It can be seen that if the positions of the two axes (i.e., the first axis 1 and the second axis 2) after docking are different, the relative positions of the first end surface 12 and the second end surface 22 in the visual plane image obtained based on the same shooting position and shooting angle are also different. Figure 2 As shown, if the first axis 11 and the second axis 21 coincide, the first end surface 12 and the second end surface 22 are both concentric ellipses in the visual plane view regardless of the angle from which the image is taken. Figure 3 As shown, if the first axis centerline 11 and the second axis centerline 21 do not coincide, the first end face 12 and the second end face 22 are both non-concentric ellipses in the visual plane view from any angle. It can be seen from the following text of the present application that in the embodiments of the present application, the docking deviation of the first axis 1 and the second axis 2 can be obtained based on the relative positions of the first end face 12 and the second end face 22 in the visual plane view.

[0088] In the embodiment of the present application, a visual plane view of the relative positions of the first end surface 12 and the second end surface 22 in the focal plane projection can be obtained based on any shooting angle and shooting position, as long as the visual plane view has both the first end surface 12 and the second end surface 22; or has both the first guide ring 421 representing the first end surface 12 and the second guide ring 422 representing the second end surface 22 as described below. Figure 7 As shown, in the embodiment of the present application, if the first axis 1 and the second axis 2 are arranged in sequence along the vertical downward direction, based on the lower right corner of the first end surface 12 (that is, as shown in FIG. Figure 7 A) as shown in the visual plane view, or based on the lower left corner of the first end surface 12 (that is, as shown in Figure 7The visual plane view can be obtained based on the upper left corner of the first end surface 12 (i.e., Figure 7 That is to say, the detection method of the dual-axis docking deviation proposed in the present application is not limited by visual accessibility (the specific principle is shown in step S300 below). Even if the visual accessibility is very small, as long as a visual plane view with the first end face 12 and the second end face 22 can be obtained, the docking deviation of the first axis 1 and the second axis 2 can be obtained. Of course, in other embodiments of the present application, in order to unify the detection standards of various products, it is possible to use the same visually accessible position (for example: Figure 7 A, B or C as shown, etc.) to obtain a visual plan view of each product.

[0089] As can be seen from the background technology, the application scenario of the double-axis docking deviation detection method proposed in the embodiment of the present application can be an application scenario with less visual accessibility, and of course it can also be an application scenario with greater visual accessibility. Assuming that during the assembly process, Figure 4 As shown, the first end face 12 and the second end face 22 are both blocked by the blocking object 3, that is, in this application scenario, the visual accessibility of the first axis 1 and the second axis 2 is minimized (that is, the visual accessibility is 0). In other words, the visual plan view of the first end face 12 and / or the second end face 22 cannot be obtained.

[0090] In order to be able to obtain the dual-axis docking deviation in an application scenario where the visual accessibility is 0 based on the dual-axis docking deviation detection method proposed in the embodiment of the present application. In one embodiment of the present application, the method can use a guide fixture 4, and the guide fixture 4 at least includes a guide ring 42. After using the guide fixture 4, step S100, obtain a visual plane diagram that can characterize the relative positions of the first end face 12 and the second end face 22 in the focal plane projection, including steps S110 to S130.

[0091] Step S110 : setting a first guiding fixture 401 on the first shaft 1 so that the axis center line of the first guiding ring 421 in the first guiding fixture 401 coincides with the axis center line of the first shaft 1 .

[0092] It should be clear that in the embodiments of the present application, the thickness and width of the first guide ring 421 are ignored, and the first guide ring 421 is understood as a linear ring in a three-dimensional space, and the surface enclosed by the linear ring is a circular surface. Since the axis line of the first guide ring 421 coincides with the axis line of the first axis 1, the first end face 12 is parallel to the above-mentioned circular surface, or the first end face 12 belongs to the above-mentioned circular surface. In other words, in this embodiment, the above-mentioned circular surface can be used to represent the first end face 12 in this embodiment. In other words, in the visual plan view obtained subsequently, the circular surface can represent the first end face 12.

[0093] In the embodiment of the present application, the first guide tool 401 can be set on the first shaft 1 in any manner, as long as the axis center line of the first guide ring 421 coincides with the axis center line of the first shaft 1. It should be clear that in the embodiment of the present application, the first guide ring 421 can be welded and fixed to the exposed part of the first shaft 1 through multiple support rods, and after the measurement is completed, the first guide ring 421 is cut and separated from the first shaft 1. In order to ensure that the first guide ring 421 or the first shaft 1 is not damaged, in one embodiment of the present application, if Figure 6 As shown, the guide tool 4 also includes a fastening ring 41 and a plurality of connecting rods 43. The axis lines of the fastening ring 41 and the guide ring 42 coincide with each other, and one end of each connecting rod 43 is connected to the fastening ring 41, and the other end of each connecting rod 43 is connected to the guide ring 42. The fastening ring 41 and the guide ring 42 are both provided with notches. Figure 5 As shown, the notch on the fastening ring 41 allows the fastening ring 41 to pass through the exposed portion of the first shaft 1 and then engage with the exposed portion of the first shaft 1. The fastening ring 41 is elastic. The notch on the guide ring 42 allows the guide ring 42 to pass through the shield 3 smoothly. Of course, in other embodiments of the present application, the fastening ring 41 and the guide ring 42 can both be formed by splicing two semicircular rings (for example, screwing, riveting, or bonding, etc.) (not shown in the figure).

[0094] In the embodiment of the present application, in order to make the axis center line of the fastening ring 41 and the axis center line of the shaft (that is, the first shaft 1 or the second shaft 2) coincide stably, the inner diameter of the fastening ring 41 can be equal to the outer diameter of the shaft, and the height of the fastening ring 41 along the axial direction is relatively high (for example, 5 cm, 10 cm or 20 cm, etc.), the higher the height, the larger the contact area formed by the fastening ring 41 and the exposed part of the first shaft 1, and the easier it is to keep the axis center line of the fastening ring 41 and the shaft (that is, the first shaft 1 or the second shaft 2) coincident.

[0095] . In order to adjust the position and shape of the guide ring 42, threads with opposite patterns are provided at both ends of the connecting rod 43 (not shown in the figure), and one end of the connecting rod 43 is threadedly connected to the fastening ring 41, and the other end is threadedly connected to the guide ring 42. When in use, if the connecting rod 43 is rotated in the forward direction, the length of the connecting rod 43 between the fastening ring 41 and the guide ring 42 becomes longer; if the connecting rod 43 is rotated in the reverse direction, the length of the connecting rod 43 between the fastening ring 41 and the guide ring 42 becomes shorter. Since the position of the fastening ring 41 is immutable, the position and shape of the guide ring 42 can be adjusted by rotating each connecting rod 43.

[0096] Step S120 : Disposing the second guiding fixture 402 on the second shaft 2 so that the axis center line of the second guiding ring 422 in the second guiding fixture 402 coincides with the axis center line of the second shaft 2 .

[0097] In this embodiment, the second guide fixture 402 can be the same as the first guide fixture 401, or the diameter of the second guide ring 422 in the second guide fixture 402 can be scaled proportionally (according to the diameter of the second shaft 2: the diameter of the first shaft 1 = the diameter of the second guide ring 422: the diameter of the first guide ring 421) based on the ratio of the diameters of the second shaft 2 and the first shaft 1. The function and installation method of the second guide fixture 402 are similar to those of the first guide fixture 401 described above, and will not be repeated here.

[0098] In an embodiment of the present application, if it is not possible to clearly photograph the first end face 12 and the second end face 22, the first guide fixture 401 and the second guide fixture 402 can be used at the same time, that is, steps S110 to S120 are performed. Of course, it can be seen from the following that if the diameter of the first guide ring 421 is larger than the diameter of the first end face 12, the diameter of the second guide ring 422 is larger than the diameter of the second end face 22, and there is a docking deviation between the first axis 1 and the second axis 2, the first guide ring 421 and the second guide ring 422 can magnify the error in the visual plane view obtained later, which is conducive to improving the subsequent detection accuracy, that is, it can detect the slight docking deviation between the first axis 1 and the second axis 2. That is to say, in some embodiments of the present application, even if the first end face 12 and the second end face 22 can be clearly photographed, the first guide fixture 401 and the second guide fixture 402 can be used to improve the subsequent detection accuracy.

[0099] It is easy to understand that in the embodiment of the present application, if the first end face 12 cannot be photographed due to obstruction, but the second end face 22 can be photographed, then only the first guide fixture 401 can be used, and the second guide fixture 402 is not used, that is, only step S110 is performed, and step S120 is not performed. In the embodiment of the present application, if the second end face 22 cannot be photographed due to obstruction, but the first end face 12 can be photographed, then the first guide fixture 401 can be not used, and only the second guide fixture 402 is used, that is, step S110 is not performed, and only step S120 is performed.

[0100] It should be noted that, in the embodiments of the present application, the sequence numbers of each step do not represent the order in which the steps are executed, but are only used to distinguish different steps. For example, in the embodiments of the present application, step S110 may be executed first, and then step S120; step S120 may be executed first, and then step S110; step S110 and step S120 may be executed simultaneously; step S110 may be executed only, and step S120 may not be executed, etc. In the embodiments of the present application, the sequence numbers of other steps are also the same, and will not be described in detail later.

[0101] Step S130: If the first guide fixture 401 and the second guide fixture 402 are used at the same time, a visual plan view with the first guide ring 421 and the second guide ring 422 is obtained; if only the first guide fixture 401 is used, a visual plan view with the first guide ring 421 and the second end face 22 is obtained; if only the second guide fixture 402 is used, a visual plan view with the first end face 12 and the second guide ring 422 is obtained.

[0102] It should be clear that in this embodiment, as described above, Figure 7 As shown, a visual plane view is obtained based on any visually accessible angle. In this embodiment, a first guide ring 421 is used to characterize the first end face 12, and a second guide ring 422 is used to characterize the second end face 22. Even if the visual accessibility of the first end face 12 and the second end face 22 is 0, the docking deviation of the first axis 1 and the second axis 2 can still be obtained based on the detection method of the dual-axis docking deviation proposed in the embodiment of the present application.

[0103] Step S200 : obtaining a first ellipse contour curve 423 representing the first end surface 12 and a second ellipse contour curve 424 representing the second end surface 22 from the visual plane image based on an ellipse detection algorithm.

[0104] It should be clear that in the embodiments of the present application, the ellipse detection algorithm can be obtained in advance. The ellipse detection algorithm is an important technology in computer vision and image processing, which is used to identify points in an image where the brightness changes significantly. These points are connected into a curve to reflect the boundaries of the object in the image. The ellipse detection algorithm highlights these boundaries by performing specific operations on the image, making subsequent image analysis and processing (for example: image segmentation, feature extraction, etc.) easier and more accurate. In the embodiments of the present application, any ellipse detection algorithm can be used to obtain the first ellipse contour curve 423 representing the first end face 12 and the second ellipse contour curve 424 representing the second end face 22 from the visual plane. For example: Sobel algorithm, Canny algorithm, Laplacian algorithm, Prewitt algorithm, OpenCV algorithm or Roberts Cross algorithm, etc., due to the large number of mature ellipse detection algorithms, they are not listed here one by one.

[0105] It should be noted that, in the embodiment of the present application, the ellipse detection algorithm can be used as follows: Figure 3 The first end face 12 shown may be formed by Figure 8 The first guide ring 421 shown in FIG. Fig. 9 The first ellipse contour curve 423 shown in FIG. In the embodiment of the present application, the ellipse detection algorithm can be used as follows: Figure 3 The second end face 22 shown may be formed by Figure 8 The second guide ring 422 shown in FIG. Fig. 9 A second elliptical profile curve 424 is shown.

[0106] As can be seen from the foregoing, the principle of the ellipse detection algorithm is to identify points in the image where the brightness changes significantly, and connect these points into a curve, thereby reflecting the boundary of the object in the image. That is to say, if the outline of the first end face 12, the first guide ring 421, the second end face 22 or the second guide ring 422 in the visual plane is not significant; or although the first guide ring 421 and the second guide ring 422 are more significant, but the first guide ring 421 and the second guide ring 422 are relatively thick, it is difficult to obtain the accurate first ellipse contour curve 423 and the second ellipse contour curve 424 based on the ellipse detection algorithm. In order to obtain a more accurate ellipse contour curve, in one embodiment of the present application, the corresponding circular contour can be painted on the first end face 12, the first guide ring 421, the second end face 22 or the second guide ring 422 using pigments or paints of significantly different colors.

[0107] In order to enable the first guide ring 421 to accurately characterize the spatial position of the first end face 12; the second guide ring 422 to accurately characterize the spatial position of the second end face 22, in one embodiment of the present application, when the first guide ring 421 is used, the first end face 12 is located in the first surface; the center of gravity of the first guide ring 421 belongs to the first surface, and the axis of the first guide ring 421 is perpendicular to the first surface. When the second guide ring 422 is used, the second end face 22 is located in the second surface; the center of gravity of the second guide ring 422 belongs to the second surface, and the axis of the second guide ring 422 is perpendicular to the second surface. Since the first end face 12 and the first surface are located in the same plane, and the second end face 22 and the second surface are located in the same plane, the first guide ring 421 can accurately characterize the spatial position of the first end face 12, and the second guide ring 422 can accurately characterize the spatial position of the second end face 22. Of course, in other embodiments of the present application, the first surface may have a small distance from the first end surface 12 (the same applies to the second surface and the second end surface 22 ), for example, the small distance may be 1.0 mm, 5.0 mm or 10.0 mm.

[0108] In the embodiment of the present application, there is no restriction on the diameters of the first guide ring 421 and the second guide ring 422. Figure 2 It can be seen that if there is no deviation after the first shaft 1 and the second shaft 2 are connected, the first end face 12 and the second end face 22 are located in the same plane. In order to avoid interference between the first guide ring 421 and the second guide ring 422 when the first face and the second face are located in the same plane (that is, the first end face 12 and the second end face 22 are located in the same plane), in the embodiment of the present application, the inner diameter of the first guide ring 421 can be larger than the outer diameter of the second guide ring 422, or the outer diameter of the first guide ring 421 can be smaller than the inner diameter of the second guide ring 422. When in use, Figure 7 As shown, even if the first surface and the second surface are located in the same plane, the first guide ring 421 and the second guide ring 422 will not form interference.

[0109] Step S300 : acquiring docking deviation data based on the first elliptical profile curve 423 and the second elliptical profile curve 424 .

[0110] As can be seen from the foregoing, in the embodiments of the present application, the docking deviation data is data used to characterize the docking deviation size between the first axis 1 and the second axis 2. That is to say, in the embodiments of the present application, any data related to the docking deviation size can be used as the docking deviation data. For example, the angle deviation data and / or position deviation data proposed below. In the embodiments of the present application, the angle deviation data is at least used to characterize the spatial angle between the axis center lines of the first axis 1 and the second axis 2; the position deviation data is at least used to characterize the spatial distance between the center point of the first end face 12 and the center point of the second end face 22.

[0111] As can be seen from the foregoing, if the axis lines of the first axis 1 and the second axis 2 coincide (that is, the spatial angle between the first axis line 11 and the second axis line 21 is 0°), then the major axis of the first elliptical profile curve 423 obtained should coincide with the major axis of the second elliptical profile curve 424; the center point of the first elliptical profile curve 423 and the center point of the second elliptical profile curve 424 should also basically coincide. If the degree of coincidence between the axis lines of the first axis 1 and the second axis 2 is worse (that is, the spatial angle between the first axis line 11 and the second axis line 21 is not 0°), then Fig. 9 As shown, the major axis of the first elliptical profile curve 423 obtained (such as Fig. 9 a1 shown, hereinafter referred to as the first major axis) and the major axis of the second elliptical profile curve 424 (as shown in Fig. 9 The larger the angle formed by the a2 shown in FIG. 1 (hereinafter referred to as the second major axis); the central point of the first elliptical contour curve 423 (such as Fig. 9 The point O1 shown in FIG. 1 is referred to as the third center point and the center point of the second elliptical contour curve 424 (eg Fig. 9That is to say, in the embodiment of the present application, the angle formed by the first major axis and the second major axis (that is, as shown in FIG. Fig. 9 The angle shown β ) as the angle deviation data; the distance between the third center point and the fourth center point can be used as the position deviation data.

[0112] In order to accurately calculate the spatial angle formed by the first axis 11 and the second axis 21 after the first axis 1 and the second axis 2 are connected. In one embodiment of the present application, Figure 3 As shown, the axis line of the first axis 1 is the first axis line 11; the axis line of the second axis 2 is the second axis line 21. Step S300, based on the first elliptical profile curve 423 and the second elliptical profile curve 424, obtains docking deviation data (ie, angle deviation data), including steps S310 to S360.

[0113] Step S310: Projecting the first ellipse profile curve 423 and the second ellipse profile curve 424 to a three-dimensional coordinate system.

[0114] It should be clear that in order to facilitate observation and understanding by those skilled in the art, the first elliptical profile curve 423 and the second elliptical profile curve 424 are not simultaneously displayed in the same three-dimensional coordinate system of the drawing. Fig.10 The first elliptical contour curve 423 is shown in the three-dimensional coordinate system shown in FIG. Fig.11 The second elliptical profile curve 424 is shown in the three-dimensional coordinate system shown. It should be understood that in this application, Fig.10 The three-dimensional coordinate system and Fig.11 The three-dimensional coordinate system shown is actually the same three-dimensional coordinate system.

[0115] In the embodiments of the present application, there is no restriction on the setting of the origin and the x, y and z axes in the three-dimensional coordinate system. In a specific embodiment of the present application, the origin can be the midpoint of the focal plane of the visual plane, the z axis can be the lens visual axis, and the plane formed by the x axis and the y axis can be the focal plane. Fig.10 and Fig.11 As shown, the first elliptical profile curve 423 and the second elliptical profile curve 424 are located in a plane formed by the x-axis and the y-axis in the three-dimensional coordinate system.

[0116] Step S320: Obtain the first angle and the second angle.

[0117] It should be clear that in this embodiment, the first angle is the spatial angle formed by the first axis 11 and the z-axis (that is, Fig.10 The angle shown α1). The second angle is the angle formed by the major axis of the first elliptical contour curve 423 and the x-axis (that is, Fig.10 The angle shown β 1). It is easy to understand that the angle β 1 can be directly calculated based on the major axis function of the first ellipse profile curve 423 simulated by the ellipse detection algorithm. Assume that in this embodiment, the lens visual axis is Figure 2 The first end surface 12 shown in FIG. is vertical (i.e., angle α 1 is equal to 0), then the first ellipse contour curve 423 obtained subsequently is approximately a circle, that is, the short axis length of the first ellipse contour curve 423 at this time (that is, Fig.10 b1) and the major axis length (i.e. Fig.10 The ratio a1) shown is approximately equal to 1. α 1 is larger, the shorter the minor axis length of the first elliptical profile curve 423 is, and the major axis length of the first elliptical profile curve 423 is almost unchanged. That is to say, in the embodiment of the present application, the angle can be calculated by the ratio of the minor axis length to the major axis length of the first elliptical profile curve 423. α 1. Specific, angle α 1 is approximately equal to arccos(b1 / a1), where arccos represents the inverse cosine function.

[0118] Step S330: Obtain a first unit vector based on the first angle and the second angle.

[0119] In the embodiment of the present application, the first unit vector is used to represent the extension direction of the first axis line 11 in the three-dimensional coordinate system. Specifically, according to the projection theorem, the calculation formula of the first unit vector is as follows:

[0120]

[0121] in, represents the first unit vector; α 1 represents the spatial angle formed by the first axis 11 and the z-axis; β 1 represents the angle formed by the major axis of the first elliptical profile curve 423 and the x-axis; Represents the unit vector in the x-axis direction in the three-dimensional coordinate system; Represents the unit vector in the y-axis direction in the three-dimensional coordinate system; A unit vector representing the z-axis direction in a three-dimensional coordinate system.

[0122] Specifically, due to The length of is equal to 1, so the vector is a unit vector, that is, the length of the vector is calculated as follows:

[0123]

[0124] Step S340: Obtain the third angle and the fourth angle.

[0125] It should be clear that in this embodiment, the third angle is the angle formed by the second axis 21 and the z-axis (that is, Fig.11 The angle shown α 2). The fourth angle is the angle formed by the major axis of the second elliptical contour curve 424 and the x-axis (ie Fig.11 The angle shown β 2). Similar to step S320, β 2 can be calculated directly; angle α 2 can be based on the minor axis length of the second elliptical contour curve 424 (i.e. Fig.11 b2) and the major axis length (i.e. Fig.11 The ratio of a2) shown in Figure 1 is obtained. That is, the angle α 2 is approximately equal to arccos(b2 / a2), where arccos represents the inverse cosine function.

[0126] Step S350: Obtain a second unit vector based on the third angle and the fourth angle.

[0127] In the embodiment of the present application, the second unit vector is used to represent the extension direction of the second axis line 21 in the three-dimensional coordinate system. Specifically, according to the projection theorem, the calculation formula of the second unit vector is as follows:

[0128]

[0129] in, represents the second unit vector; α 2 represents the spatial angle formed by the second axis 21 and the z-axis; β 2 represents the angle formed by the major axis of the second elliptical profile curve 424 and the x-axis; Represents the unit vector in the x-axis direction in the three-dimensional coordinate system; Represents the unit vector in the y-axis direction in the three-dimensional coordinate system; A unit vector representing the z-axis direction in a three-dimensional coordinate system.

[0130] Specifically, due to The length of is equal to 1, so the vector is a unit vector, that is, the length of the vector is calculated as follows:

[0131]

[0132] Step S360: Obtain angle deviation data based on the first unit vector and the second unit vector.

[0133] It should be clear that in this embodiment, the angle deviation data may be the spatial angle formed by the first axis line 11 and the second axis line 21. Specifically, the spatial angle formed by the first axis line 11 and the second axis line 21 may be calculated based on the first unit vector and the second unit vector. The calculation formula is as follows:

[0134]

[0135] Wherein, δ represents the space angle formed by the first axis line 11 and the second axis line 21; arccos represents the inverse cosine function; represents the first unit vector; represents the second unit vector; represents the magnitude of the first unit vector; represents the magnitude of the second unit vector; Represents the dot product of the first unit vector and the second unit vector. Specifically, the calculation formula of the dot product of the first unit vector and the second unit vector is as follows:

[0136]

[0137] That is to say, in the embodiments of the present application, compared with the use of Fig. 9 The angle shown β As angle deviation data, angle δ is closer to the real spatial angle between the first axis 11 and the second axis 21. Therefore, using angle δ as angle deviation data can more accurately reflect the spatial angle formed by the first axis 11 and the second axis 21 after the first axis 1 and the second axis 2 are docked.

[0138] In one embodiment of the present application, Figure 3 As shown, the center point of the first end surface 12 is the first center point 13, and the center point of the second end surface 22 is the second center point 23. Step S300, based on the first elliptical profile curve 423 and the second elliptical profile curve 424, obtains docking deviation data (ie, position deviation data), and may also include steps S370 to S390.

[0139] Step S370: Projecting the first ellipse contour curve and the second ellipse contour curve into a three-dimensional coordinate system.

[0140] It should be noted that, in this embodiment, step S370 is similar to step S310 and will not be described in detail here.

[0141] Step S380: Obtain the third center point of the first ellipse contour curve 423 (ie Fig. 9 and Fig.10 and the fourth center point of the second elliptical contour curve 424 (ie, point O1 shown in FIG. Fig. 9 and Fig.11 point O2 shown in the figure).

[0142] Step S390: Based on the third center point and the fourth center point, obtain position deviation data.

[0143] As can be seen from the foregoing, in the embodiments of the present application, the distance between point O1 and point O2 can be directly used as position deviation data.

[0144] In order to accurately characterize the spatial distance between the first center point 13 and the second center point 23 after the first axis 1 and the second axis 2 are docked, in one embodiment of the present application, step S390, based on the third center point and the fourth center point, obtains position deviation data, including steps S391 to S393.

[0145] Step S391: Based on the third center point and the fourth center point, obtain the first distance.

[0146] Specifically, in the embodiment of the present application, the first distance represents the distance between the projections of the first center point 13 and the second center point 23 in the same plane along the first direction, and the first direction is parallel to the axis of the first axis 1. As can be seen from the foregoing, although the shapes of the elliptical contour curves obtained from various directions (the distance between the camera and the focal plane is consistent) are different, the major axis lengths of the various elliptical contour curves are basically the same. That is to say, in the embodiment of the present application, the first distance can be obtained based on the third center point and the fourth center point through orthogonal decomposition. Specifically, the calculation formula for the first distance is as follows:

[0147]

[0148] in, represents the first distance, Indicates the actual diameter of the first end surface 12 or the first guide fixture 401; represents the major axis length of the first ellipse profile curve 423; represents the minor axis length of the first ellipse profile curve 423; represents the vector from the third center point to the fourth center point; represents a unit vector in the major axis direction of the first elliptical contour curve 423; Represents the unit vector in the minor axis direction of the first elliptical contour curve 423 .

[0149] It should be clear that in this embodiment and The calculation formulas are as follows:

[0150]

[0151]

[0152] in, Represents the unit vector in the x-axis direction in the three-dimensional coordinate system; Represents the unit vector in the y-axis direction in the three-dimensional coordinate system; β 1 represents the angle formed by the major axis of the first elliptical profile curve 423 and the x-axis.

[0153] Step S392: Obtain the spatial angle between the center lines of the first axis 1 and the second axis 2.

[0154] It should be noted that obtaining the spatial angle between the axis center lines of the first axis 1 and the second axis 2 (ie, the first axis center line 11 and the second axis center line 21 ) is as described in steps S320 to S360 above, and will not be repeated here.

[0155] Step S393: Acquire position deviation data based on the first distance and the spatial angle.

[0156] In this embodiment, the first distance mentioned above can be used as position deviation data. Of course, in order to make the position deviation data closer to the actual distance between the first center point 13 and the second center point 23 in the three-dimensional space, according to the projection theorem, the calculation formula of the position deviation data can be as follows:

[0157]

[0158] in, represents the position deviation data, δ represents the spatial angle formed by the first axis 11 and the second axis 21; Indicates the first distance.

[0159] It should be clear that the position deviation data (i.e., distance S) calculated in this embodiment is close to the actual spatial distance between the first center point 13 and the second center point 23, that is, it can accurately characterize the spatial distance between the first center point 13 and the second center point 23 after the first axis 1 and the second axis 2 are docked.

[0160] As can be seen from the foregoing, in the embodiments of the present application, the acquired position deviation data is not limited to the shooting angle or distance of the visual plane view captured by the camera. That is to say, in the embodiments of the present application, multiple position deviation data can be acquired through visual plane views at multiple different angles or distances, and the average value of the multiple position deviation data can be calculated to further improve the accuracy of dual-axis docking deviation detection.

[0161] It should be clear that the dual-axis docking deviation detection method proposed in the embodiment of the present application is not limited by visual accessibility. Even if the visual accessibility between the two axes is small (even 0), the docking deviation of the two axes can be obtained based on the dual-axis docking deviation detection method proposed in the embodiment of the present application.

[0162] After introducing the detection method of the double-axis docking deviation proposed in the embodiment of the present application, the following introduces a detection system of the double-axis docking deviation proposed in the embodiment of the present application, the double axis includes a first axis 1 and a second axis 2; the first end surface 12 of the first axis 1 and the second end surface 22 of the second axis 2 are opposite surfaces; Fig.12 As shown, the double-axis docking deviation detection system 50 includes:

[0163] A photographing device 51, used for acquiring a visual plane image capable of representing the relative positions of the first end surface 12 and the second end surface 22 in the focal plane projection;

[0164] The processing device 52 acquires a first ellipse contour curve representing the first end surface 12 and a second ellipse contour curve representing the second end surface 22 from the visual plane diagram based on an ellipse detection algorithm; the ellipse detection algorithm acquires in advance;

[0165] And, based on the first elliptical contour curve and the second elliptical contour curve, docking deviation data is obtained; the docking deviation data includes angle deviation data and / or position deviation data; the angle deviation data is at least used to characterize the spatial angle between the center lines of the first axis 1 and the second axis 2; the position deviation data is at least used to characterize the spatial distance between the center point of the first end face 12 and the center point of the second end face 22.

[0166] As a specific embodiment of the present application, the docking deviation data includes angle deviation data; the axis centerline of the first axis 1 is the first axis centerline 11; the axis centerline of the second axis 2 is the second axis centerline 21; the processing device 52 is further used to project the first elliptical contour curve and the second elliptical contour curve into a three-dimensional coordinate system; the first elliptical contour curve and the second elliptical contour curve are located in a plane formed by the x-axis and the y-axis in the three-dimensional coordinate system;

[0167] And, obtaining a first angle and a second angle; the first angle is the angle formed by the first axis line 11 and the z-axis; the second angle is the angle formed by the major axis of the first elliptical profile curve and the x-axis;

[0168] And, based on the first angle and the second angle, a first unit vector is obtained; the first unit vector is used to represent the extension direction of the first axis line 11 in the three-dimensional coordinate system;

[0169] And, obtaining a third angle and a fourth angle; the third angle is the angle formed by the second axis line 21 and the z-axis; the fourth angle is the angle formed by the major axis of the second elliptical profile curve and the x-axis;

[0170] And, based on the third angle and the fourth angle, a second unit vector is obtained; the second unit vector is used to represent the extension direction of the second axis line 21 in the three-dimensional coordinate system;

[0171] And, based on the first unit vector and the second unit vector, the angle deviation data is acquired.

[0172] As a specific embodiment of the present application, the processing device 52 obtains the angle deviation data based on the first unit vector and the second unit vector using the following calculation formula:

[0173]

[0174] Wherein, δ represents the space angle formed by the first axis line 11 and the second axis line 21; arccos represents the inverse cosine function; represents the first unit vector; represents the second unit vector; represents the magnitude of the first unit vector; represents the magnitude of the second unit vector; Represents the dot product of the first unit vector and the second unit vector.

[0175] As a specific embodiment of the present application, the docking deviation data includes position deviation data; the center point of the first end surface 12 is the first center point 13; the center point of the second end surface 22 is the second center point 23; the processing device 52 is also used to project the first elliptical contour curve and the second elliptical contour curve to a three-dimensional coordinate system; the first elliptical contour curve and the second elliptical contour curve are located in the plane formed by the x-axis and the y-axis in the three-dimensional coordinate system;

[0176] And, obtaining a third center point of the first elliptical profile curve and a fourth center point of the second elliptical profile curve;

[0177] And, based on the third center point and the fourth center point, the position deviation data is acquired.

[0178] As a specific embodiment of the present application, the processing device 52 obtains the calculation formula of the position deviation data based on the third center point and the fourth center point as follows:

[0179]

[0180]

[0181] in, represents the position deviation data, δ represents the spatial angle formed by the first axis 11 and the second axis 21; represents the first distance; represents the actual diameter of the first end surface; represents the length of the major axis of the first ellipse contour curve; represents the length of the minor axis of the first ellipse contour curve; represents the vector from the third center point to the fourth center point; represents the unit vector in the major axis direction of the first elliptical contour curve; Represents the unit vector in the direction of the minor axis of the first ellipse contour curve.

[0182] As a specific embodiment of the present application, the processing device 52 is further used to obtain a first distance based on the third center point and the fourth center point; the first distance represents the distance between the projections of the first center point 13 and the second center point 23 in the same plane along a first direction; the first direction is parallel to the axis of the first axis 1;

[0183] And, obtaining a spatial angle between the center lines of the first axis 1 and the second axis 2;

[0184] And, based on the first distance and the spatial angle, the position deviation data is acquired.

[0185] As a specific embodiment of the present application, it also includes a guide fixture 4, each of which includes at least a guide ring 42; the guide fixture 4 includes: a first guide fixture 401 and a second guide fixture 402;

[0186] The first guiding fixture 401 is used to be arranged on the first shaft 1 so that the axis center line of the first guiding ring 421 in the first guiding fixture 401 coincides with the axis center line of the first shaft 1;

[0187] The second guiding fixture 402 is used to be arranged on the second shaft 2 so that the axis center line of the second guiding ring 422 in the second guiding fixture 402 coincides with the axis center line of the second shaft 2;

[0188] The photographing device 51 is also used to obtain a visual plan view having the first guide ring 421 and the second guide ring 422 if the first guide fixture 401 and the second guide fixture 402 are used at the same time; to obtain a visual plan view having the first guide ring 421 and the second end face 22 if only the first guide fixture 401 is used; and to obtain a visual plan view having the first end face 12 and the second guide ring 422 if only the second guide fixture 402 is used.

[0189] As a specific embodiment of the present application, the guiding tool 4 also includes a fastening ring 41 and a plurality of connecting rods 43, the axis lines of the fastening ring 41 and the guiding ring 42 coincide with each other, and one end of each connecting rod 43 is connected to the fastening ring 41, and the other end of each connecting rod 43 is connected to the guiding ring 42.

[0190] It should be clear that the dual-axis docking deviation detection system proposed in the embodiment of the present application will not be limited by visual accessibility. Even if the visual accessibility between the two axes is small (even 0), the docking deviation of the two axes can be obtained based on the dual-axis docking deviation detection method proposed in the embodiment of the present application.

[0191] After introducing the dual-axis docking deviation detection system proposed in the embodiment of the present application, the following introduces a computer-readable storage medium proposed in the embodiment of the present application, which stores a computer program. When the computer program is executed by a processor, it implements the dual-axis docking deviation detection method as described in any of the above embodiments.

[0192] It should be clear that the computer-readable storage media in this application include permanent and non-permanent, removable and non-removable media that can be used to store information by any method or technology. Information can be computer-readable instructions, data structures, modules of programs or other data. Examples of computer storage media include, but are not limited to, phase change memory (PRAM), static random access memory (SRAM), dynamic random access memory (DRAM), other types of random access memory (RAM), read-only memory (ROM), electrically erasable programmable read-only memory (EEPROM), flash memory or other memory technology, read-only compact disk read-only memory (CD-ROM), digital versatile disk (DVD) or other optical storage, magnetic cassettes, magnetic tape magnetic disk storage or other magnetic storage devices or any other non-transmission media that can be used to store information that can be accessed by a computing device. As defined herein, computer-readable media does not include temporary computer-readable media (transitory media), such as modulated data signals and carrier waves.

[0193] In the above embodiments, the description of each embodiment has its own emphasis. For parts that are not described in detail in a certain embodiment, reference can be made to the relevant descriptions of other embodiments.

[0194] Those skilled in the art can clearly understand that, for the convenience and brevity of description, the specific working processes of the methods, devices and equipment described above can refer to the corresponding processes in the aforementioned method embodiments and will not be repeated here.

[0195] In the several embodiments provided in the embodiments of the present application, it should be understood that the disclosed devices, apparatuses and methods can be implemented in other ways. For example, the device embodiments described above are only schematic. For example, the division of the modules is only a logical function division. There may be other division methods in actual implementation, such as multiple modules or components can be combined or integrated into another system, or some features can be ignored or not executed. Another point is that the mutual coupling or direct coupling or communication connection shown or discussed can be an indirect coupling or communication connection through some interfaces, devices or modules, which can be electrical, mechanical or other forms.

[0196] The modules described as separate components may or may not be physically separated, and the components shown as modules may or may not be physical modules, that is, they may be located in one place or distributed on multiple network modules. Some or all of the modules may be selected according to actual needs to achieve the purpose of the solution of this embodiment.

[0197] In addition, each functional module in each embodiment of the present application can be integrated into a processing module, or each module can exist physically separately, or two or more modules can be integrated into one module. The above-mentioned integrated module can be implemented in the form of hardware or in the form of a software functional module. If the integrated module is implemented in the form of a software functional module and sold or used as an independent product, it can be stored in a computer-readable storage medium.

[0198] In the above embodiments, all or part of the embodiments may be implemented by software, hardware, firmware or any combination thereof. When implemented by software, all or part of the embodiments may be implemented in the form of a computer program product.

[0199] The computer program product includes one or more computer instructions. When the computer program is loaded and executed on a computer, the process or function described in the embodiment of the present application is generated in whole or in part. The computer may be a general-purpose computer, a special-purpose computer, a computer network, or other programmable device. The computer instructions may be stored in a computer-readable storage medium, or transmitted from one computer-readable storage medium to another computer-readable storage medium. For example, the computer instructions may be transmitted from a website site, a computer, a server, or a data center to another website site, a computer, a server, or a data center by wired (e.g., coaxial cable, optical fiber, digital subscriber line (DSL)) or wireless (e.g., infrared, wireless, microwave, etc.) means. The computer-readable storage medium may be any available medium that a computer can store or a data storage device such as a server or a data center that includes one or more available media integrated. The available medium may be a magnetic medium (e.g., a floppy disk, a hard disk, a tape), an optical medium (e.g., a DVD), or a semiconductor medium (e.g., a solid-state hard disk Solid State Disk (SSD)), etc.

[0200] Although the embodiments of the present application have been shown and described, it will be appreciated by those skilled in the art that many changes, modifications, substitutions and variations may be made to the embodiments without departing from the principles of the present application.

Claims

1. A method for detecting double-axis butt joint deviation, the double-axis comprising a first axis (1) and a second axis (2); a first end surface (12) of the first axis (1) and a second end surface (22) of the second axis (2) are opposite surfaces; characterized in that: The method comprises: Acquiring a visual plane image capable of characterizing the relative positions of the first end surface (12) and the second end surface (22) in a focal plane projection; Based on an ellipse detection algorithm, obtaining a first ellipse contour curve representing the first end surface (12) and a second ellipse contour curve representing the second end surface (22) from the visual plane image; Based on the first elliptical profile curve and the second elliptical profile curve, docking deviation data is obtained; the docking deviation data includes angle deviation data and / or position deviation data; the angle deviation data is at least used to characterize the spatial angle between the axis lines of the first axis (1) and the second axis (2); the position deviation data is at least used to characterize the spatial distance between the center point of the first end face (12) and the center point of the second end face (22); The docking deviation data comprises angle deviation data; the axis centerline of the first axis (1) is a first axis centerline (11); the axis centerline of the second axis (2) is a second axis centerline (21); and obtaining the docking deviation data based on the first elliptical profile curve and the second elliptical profile curve comprises: Projecting the first elliptical profile curve and the second elliptical profile curve into a three-dimensional coordinate system; the first elliptical profile curve and the second elliptical profile curve are located in a plane formed by an x-axis and a y-axis in the three-dimensional coordinate system; Obtaining a first angle and a second angle; the first angle being the angle formed by the first axis line (11) and the z-axis; and the second angle being the angle formed by the major axis of the first elliptical profile curve and the x-axis; Based on the first angle and the second angle, a first unit vector is obtained; the first unit vector is used to represent the extension direction of the first axis line (11) in the three-dimensional coordinate system; Obtaining a third angle and a fourth angle; the third angle being the angle formed by the second axis line (21) and the z-axis; and the fourth angle being the angle formed by the major axis of the second elliptical profile curve and the x-axis; Based on the third angle and the fourth angle, a second unit vector is obtained; the second unit vector is used to represent the extension direction of the second axis line (21) in the three-dimensional coordinate system; The angle deviation data is acquired based on the first unit vector and the second unit vector.

2. The method for detecting the double-axis docking deviation according to claim 1, characterized in that: The docking deviation data includes position deviation data; the center point of the first end surface (12) is a first center point (13); the center point of the second end surface (22) is a second center point (23); the docking deviation data is obtained based on the first elliptical profile curve and the second elliptical profile curve, including: Projecting the first elliptical profile curve and the second elliptical profile curve into a three-dimensional coordinate system; the first elliptical profile curve and the second elliptical profile curve are located in a plane formed by an x-axis and a y-axis in the three-dimensional coordinate system; Acquire a third center point of the first elliptical profile curve and a fourth center point of the second elliptical profile curve; The position deviation data is acquired based on the third center point and the fourth center point.

3. The method for detecting the double-axis docking deviation according to claim 2, characterized in that: The calculation formula for obtaining the position deviation data based on the third center point and the fourth center point is as follows: in, represents position deviation data, δ represents the spatial angle formed by the first axis line (11) and the second axis line (21); represents the first distance; represents the actual diameter of the first end surface; represents the length of the major axis of the first ellipse contour curve; represents the length of the minor axis of the first ellipse contour curve; represents the vector from the third center point to the fourth center point; represents the unit vector in the major axis direction of the first elliptical contour curve; Represents the unit vector in the direction of the minor axis of the first ellipse contour curve.

4. The method for detecting the double-axis docking deviation according to claim 2, characterized in that: The acquiring the position deviation data based on the third center point and the fourth center point includes: Based on the third center point and the fourth center point, a first distance is obtained; the first distance represents the distance between the projections of the first center point (13) and the second center point (23) in the same plane along a first direction; the first direction is parallel to the axis of the first axis (1); Obtaining a spatial angle between the center lines of the first axis (1) and the second axis (2); The position deviation data is acquired based on the first distance and the spatial angle.

5. The method for detecting the deviation of biaxial docking according to any one of claims 1 to 4, characterized in that: The visual plan includes: A first guide fixture (401) and a second end face (22); or a first end face (12) and a second guide fixture (402); or a first guide fixture (401) and a second guide fixture (402); each guide fixture comprises at least a guide ring; when in use, the first guide fixture (401) is arranged on the first shaft (1), and the axis center line of the first guide ring (421) in the first guide fixture (401) coincides with the axis center line of the first shaft (1), and the first guide fixture (401) is used to characterize the first end face (12); when in use, the second guide fixture (402) is arranged on the second shaft (2), and the axis center line of the second guide ring (422) in the second guide fixture (402) coincides with the axis center line of the second shaft (2), and the second guide fixture (402) is used to characterize the second end face (22).

6. The method for detecting the double-axis butt joint deviation according to claim 5, characterized in that: The guide tooling further comprises a fastening ring (41) and a plurality of connecting rods (43), wherein the axis lines of the fastening ring (41) and the guide ring coincide with each other, and one end of each connecting rod (43) is connected to the fastening ring (41), and the other end of each connecting rod (43) is connected to the guide ring.

7. The method for detecting the double-axis docking deviation according to claim 5, characterized in that: The visual plan also includes: The first end surface (12) is located inside the first surface; the center of gravity of the first guide ring (421) belongs to the first surface, and the axis of the first guide ring (421) is perpendicular to the first surface; The second end surface (22) is located inside the second surface; the center of gravity of the second guide ring (422) belongs to the second surface, and the axis of the second guide ring (422) is perpendicular to the second surface.

8. A double-axis butt joint deviation detection system, the double axis comprising a first axis (1) and a second axis (2); a first end surface (12) of the first axis (1) and a second end surface (22) of the second axis (2) are opposite surfaces; characterized in that: include: A photographing device, used for acquiring a visual plane image capable of representing the relative positions of the first end surface (12) and the second end surface (22) in a focal plane projection; A processing device, based on an ellipse detection algorithm, obtains a first ellipse contour curve representing the first end surface (12) and a second ellipse contour curve representing the second end surface (22) from the visual plane image; the ellipse detection algorithm is pre-acquired; And, based on the first elliptical profile curve and the second elliptical profile curve, docking deviation data is obtained; the docking deviation data includes angle deviation data and / or position deviation data; the angle deviation data is at least used to characterize the spatial angle between the axis lines of the first axis (1) and the second axis (2); the position deviation data is at least used to characterize the spatial distance between the center point of the first end face (12) and the center point of the second end face (22); The docking deviation data includes angle deviation data; the axis centerline of the first axis (1) is the first axis centerline (11); the axis centerline of the second axis (2) is the second axis centerline (21); the processing device is further used to project the first elliptical contour curve and the second elliptical contour curve into a three-dimensional coordinate system; the first elliptical contour curve and the second elliptical contour curve are located in a plane formed by an x-axis and a y-axis in the three-dimensional coordinate system; and obtaining a first angle and a second angle; the first angle being the angle formed by the first axis line (11) and the z-axis; and the second angle being the angle formed by the major axis of the first elliptical profile curve and the x-axis; and, based on the first angle and the second angle, obtaining a first unit vector; the first unit vector is used to represent the extension direction of the first axis line (11) in the three-dimensional coordinate system; and obtaining a third angle and a fourth angle; the third angle being the angle formed by the second axis line (21) and the z-axis; and the fourth angle being the angle formed by the major axis of the second elliptical profile curve and the x-axis; And, based on the third angle and the fourth angle, a second unit vector is obtained; the second unit vector is used to represent the extension direction of the second axis line (21) in the three-dimensional coordinate system; And, based on the first unit vector and the second unit vector, the angle deviation data is acquired.

9. The double-axis docking deviation detection system according to claim 8, characterized in that: The docking deviation data includes position deviation data; the center point of the first end surface (12) is a first center point (13); the center point of the second end surface (22) is a second center point (23); the processing device is further used to project the first elliptical contour curve and the second elliptical contour curve into a three-dimensional coordinate system; the first elliptical contour curve and the second elliptical contour curve are located in a plane formed by an x-axis and a y-axis in the three-dimensional coordinate system; And, obtaining a third center point of the first elliptical profile curve and a fourth center point of the second elliptical profile curve; And, based on the third center point and the fourth center point, the position deviation data is acquired.

10. The double-axis docking deviation detection system according to claim 9, characterized in that: The processing device is further used to obtain a first distance based on the third center point and the fourth center point; the first distance represents the distance between the projections of the first center point (13) and the second center point (23) in the same plane along a first direction; the first direction is parallel to the axis of the first axis (1); And, obtaining the spatial angle between the center lines of the first axis (1) and the second axis (2); And, based on the first distance and the spatial angle, the position deviation data is acquired.

11. The double-axis butt joint deviation detection system according to any one of claims 8 to 10, characterized in that: The visual plan includes: A first guide fixture (401) and a second end face (22); or a first end face (12) and a second guide fixture (402); or a first guide fixture (401) and a second guide fixture (402); each guide fixture comprises at least a guide ring; when in use, the first guide fixture (401) is arranged on the first shaft (1), and the axis center line of the first guide ring (421) in the first guide fixture (401) coincides with the axis center line of the first shaft (1), and the first guide fixture (401) is used to characterize the first end face (12); when in use, the second guide fixture (402) is arranged on the second shaft (2), and the axis center line of the second guide ring (422) in the second guide fixture (402) coincides with the axis center line of the second shaft (2), and the second guide fixture (402) is used to characterize the second end face (22).

12. The double-axis docking deviation detection system according to claim 11, characterized in that: The guide tooling further comprises a fastening ring (41) and a plurality of connecting rods (43), wherein the axis lines of the fastening ring (41) and the guide ring coincide with each other, and one end of each connecting rod (43) is connected to the fastening ring (41), and the other end of each connecting rod (43) is connected to the guide ring.

13. A computer-readable storage medium, characterized in that: A computer program is stored thereon, and when the computer program is executed by a processor, the method for detecting a double-axis butt joint deviation as claimed in any one of claims 1 to 7 is implemented.

Citation Information

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