Method, device, computer equipment and storage medium for sending operation instruction information

Abstract

The present invention relates to the field of switch testing technology, and discloses a method, apparatus, computer equipment, and storage medium for sending operation instruction information, including: receiving first failure test information; determining, based on the model of a first switch, the communication address of a first processing object that matches the model of the first switch, and sending the first failure test information to the first processing object; receiving first operation instruction information corresponding to the first failure test information sent by the first processing object; determining, based on the location information of the first switch, the communication address of a second processing object that matches the location information of the first switch, and sending the first operation instruction information to the second processing object. The present invention can promptly notify a manager when a switch failure occurs, allowing the manager to provide operation instruction information, and promptly send the operation instruction information to an operator so that the operator can promptly handle the failure, thereby improving testing efficiency and product quality.

Description

Technical Field

[0001] The present invention relates to the technical field of switch testing, and in particular to a method, device, computer equipment and storage medium for sending operation instruction information. Background Art

[0002] In modern industrial production, switch production lines usually involve multiple models of switches, and each switch needs to undergo testing to ensure the quality of the switch.

[0003] During the testing process, if a test failure occurs, the production line operator is usually responsible for detecting and initially locating the switch fault. However, due to their limited technical understanding of switches, they may not be able to resolve the problem in a timely manner. Furthermore, management personnel are not on-site. Therefore, the operator needs to inform the management personnel of the switch failure information. The management personnel will then analyze the information, determine the cause and appropriate solution, and then inform the operator. The operator will then handle the problem according to the solution provided by the researchers.

[0004] Because operators may miss important information when relaying fault information, management personnel may be unable to provide the correct solution, requiring multiple rounds of communication. This increases communication costs between management personnel and operators, further affecting switch production efficiency and quality. Summary of the Invention

[0005] In view of this, the present invention provides a method, apparatus, computer device, storage medium and program product for sending operation instruction information to solve the problem that the high communication cost between managers and operators affects the production efficiency and quality of switches.

[0006] In a first aspect, the present invention provides a method for sending operation instruction information, comprising receiving first failure test information, wherein the first failure test information is generated when a target industrial computer fails to execute a target item test on a first switch, the first failure test information including model and location information of the first switch, the target industrial computer being any one of at least one of the industrial computers, the first switch being a switch controlled by the target industrial computer among the at least one of the switches, and the target item test being any one of at least one test executed by the target industrial computer on the first switch;

[0007] determining, based on the model of the first switch, a communication address of a first processing object that matches the model of the first switch, wherein the first processing object is a terminal where an administrator of the first switch is located;

[0008] sending the first failure test information to the first processing object according to the communication address of the first processing object;

[0009] receiving first operation instruction information corresponding to the first failure test information and sent by the first processing object, wherein the first operation instruction information is input into the first processing object by a manager of the first switch;

[0010] determining, based on the location information of the first switch, a communication address of a second processing object that matches the location information of the first switch, wherein the second processing object is a terminal where an operator responsible for operating the first switch on the production line is located;

[0011] The first operation instruction information is sent to the second processing object according to the communication address of the second processing object.

[0012] The method for sending operation instruction information provided by the present invention has the following advantages:

[0013] When the management server receives the first failure test information, it can promptly forward the first failure test information to the corresponding management personnel based on the model of the first switch in the first failure test information, and the management personnel can promptly provide the first operation instruction information based on the first failure test information. Furthermore, the management server forwards the first operation instruction information to the corresponding operator based on the location information of the first switch in the first failure test information, and the operator can promptly perform operations to repair the fault and restart the test based on the first operation instruction information. In the above-mentioned interactive process, the first failure test information can be provided to the management personnel in its entirety without any information loss, allowing the management personnel to provide correct operation suggestions based on the complete test information. In this way, the communication cost between management personnel and operators is low, which can improve testing efficiency and product quality.

[0014] In an optional implementation, the first failure test message further includes a first alarm level;

[0015] After receiving the first failure test information, the method further includes:

[0016] Obtaining an unprocessed failed test information database, a processing progress weight value, a target processing stage in which the first failed test information is currently located, and a first actual duration of processing the first failed test information to the target processing stage, wherein the unprocessed failed test information database includes multiple failed test information;

[0017] Obtaining the current status level of each piece of failed test information;

[0018] Determining a target weight value corresponding to the first alarm level according to the first alarm level and a correspondence between the alarm level and the weight value;

[0019] Obtaining, according to the model of the first switch and the first alarm level, an estimated total processing time corresponding to the first failure test information;

[0020] Determining an estimated remaining processing time for the first failed test information based on the first failed test information, the target processing stage, the first actual processing time, and the estimated total processing time;

[0021] determining a first status level of the first failure test information according to the target weight value, the estimated remaining processing time, the estimated total processing time, and the processing progress weight value;

[0022] determining a target ranking of the first failure test information according to a current status level of each piece of the failure test information and the first status level;

[0023] The first failed test information is added to the failed test information library at a position corresponding to the target ranking.

[0024] Specifically, the alarm level indicates the severity of the fault corresponding to the failed test information, while the estimated remaining processing time indicates the processing speed of the failed test information. Combining these two factors together to determine the status level of the failed test information indicates how urgently the failed test information needs to be addressed. Furthermore, sorting failed test information by status level allows managers and operators to understand which tests require priority processing, thereby optimizing resource allocation and improving processing efficiency.

[0025] In an optional implementation, the first failed test information further includes a first test item name;

[0026] The determining, based on the first failure test information, the target processing stage, the first actual processing time, and the estimated total processing time, of an estimated remaining processing time for the first failure test information includes:

[0027] Extracting, according to the first test item name, at least one target failure test information corresponding to the first test item name from a pre-built processed failure test information library, and the actual duration of processing each target failure test information to the target processing stage;

[0028] determining a processing efficiency of the first failed test information according to an actual time duration for processing each piece of the target test information to the target processing stage and the first actual time duration;

[0029] The estimated remaining processing time is determined according to the first actual time, the processing efficiency of the first failed test information, and the estimated total processing time.

[0030] Specifically, by combining historical data and the actual processing situation of the current first failed test information to calculate the estimated remaining processing time, the prediction result can be made more accurate.

[0031] In an optional implementation, the first status level of the first failure test information is determined based on the target weight value, the estimated remaining processing time, the estimated total processing time, and the processing progress weight value, using the following expression:

[0032] L=K1+K2(1-R / T)

[0033] Among them, L is the first status level, K1 is the target weight value, K2 is the processing progress weight value, R is the estimated remaining processing time, and T is the estimated total processing time.

[0034] In an optional implementation, the first failure test information further includes a first log path;

[0035] The method further comprises:

[0036] Obtaining a first log file from the target industrial computer according to the first log path;

[0037] Sending the first log file to the first processing target.

[0038] Specifically, since the first log file carries more operation information, it is convenient for the management personnel to make more accurate first operation instruction information, and further, it can enable the operators to make more accurate operations, thereby improving the test efficiency and product quality.

[0039] In an optional embodiment, the method further includes:

[0040] When all tests on each switch in the switch management system are completed, determining at least one switch model appearing in the unprocessed failure test information base and the number of occurrences of each switch model according to the switch model included in each piece of failure test information in the unprocessed failure test information base;

[0041] Determine the model of the second switch that appears the most times;

[0042] determining, based on the model of the second switch, a communication address of a third processing object that matches the model of the second switch, wherein the third processing object is a terminal where an administrator of the second switch is located;

[0043] The second switch model and second failure test information including the model of the second switch are sent to the third processing object according to the communication address of the third processing object.

[0044] Specifically, this solution can determine which switch has more problems, allowing management personnel to conduct comprehensive analysis based on multiple pieces of second failure test information before taking action, making the analysis results more accurate.

[0045] In an optional implementation, the failure test information further includes location information of the switch, and the method further includes:

[0046] When all tests on each switch in the switch management system are completed, determining at least one type of location information appearing in the unprocessed failure test information base and the number of occurrences of each type of location information based on the switch location information included in each piece of failure test information in the unprocessed failure test information base;

[0047] Determine the first position information that appears the most times;

[0048] determining, based on the first location information, a communication address of a fourth processing object that matches the first location information;

[0049] A first alarm notification is sent to the fourth processing object according to the communication address of the fourth processing object, wherein the first alarm notification is used to indicate that an abnormality exists in equipment of the production line corresponding to the first location information.

[0050] Specifically, this solution can determine which location has more problems, allowing operators to promptly check whether other equipment at the corresponding location has faults and repair them, thereby reducing the impact on the testing process and improving testing efficiency.

[0051] In a second aspect, the present invention provides a device for sending operation instruction information, the device being applied to a switch management system, the switch management system including at least one industrial computer, at least one switch, and a management server, the device comprising:

[0052] Receive first failure test information, where the first failure test information is generated when a target industrial computer fails to execute a target test on a first switch, the first failure test information includes model and location information of the first switch, the target industrial computer is any one of the at least one industrial computer, the first switch is a switch controlled by the target industrial computer among the at least one switches, and the target test is any one of at least one test executed by the target industrial computer on the first switch;

[0053] determining, based on the model of the first switch, a communication address of a first processing object that matches the model of the first switch, wherein the first processing object is a terminal where an administrator of the first switch is located;

[0054] sending the first failure test information to the first processing object according to the communication address of the first processing object;

[0055] receiving first operation instruction information corresponding to the first failure test information and sent by the first processing object, wherein the first operation instruction information is input into the first processing object by the administrator;

[0056] determining, based on the location information of the first switch, a communication address of a second processing object that matches the location information of the first switch, wherein the second processing object is a terminal where an operator responsible for operating the first switch on the production line is located;

[0057] The first operation instruction information is sent to the second processing object according to the communication address of the second processing object.

[0058] In a third aspect, the present invention provides a computer device comprising: a memory and a processor, the memory and the processor being communicatively connected to each other, computer instructions being stored in the memory, and the processor executing the computer instructions to thereby execute the method for sending operation instruction information of the above-mentioned first aspect or any corresponding embodiment thereof.

[0059] In a fourth aspect, the present invention provides a computer-readable storage medium having computer instructions stored thereon, the computer instructions being used to enable a computer to execute the method for sending operation instruction information of the above-mentioned first aspect or any corresponding embodiment thereof.

[0060] In a fifth aspect, the present invention provides a computer program product comprising computer instructions, wherein the computer instructions are used to enable a computer to execute the method for sending operation instruction information according to the first aspect or any corresponding embodiment thereof. BRIEF DESCRIPTION OF THE DRAWINGS

[0061] In order to more clearly illustrate the specific embodiments of the present invention or the technical solutions in related technologies, the following briefly introduces the drawings required for use in the specific embodiments or related technical descriptions. Obviously, the drawings described below are some embodiments of the present invention. For ordinary technicians in this field, other drawings can be obtained based on these drawings without paying any creative work.

[0062] Figure 1 is a schematic diagram of the architecture of a switch management system according to an embodiment of the present invention;

[0063] Figure 2 is a flowchart of a method for sending operation instruction information according to an embodiment of the present invention;

[0064] Figure 3 is a flowchart of a method for adding failed test information according to an embodiment of the present invention;

[0065] Figure 4 is a structural block diagram of an apparatus for sending operation instruction information according to an embodiment of the present invention;

[0066] Figure 5 Schematic diagram of the hardware structure of a computer device according to an embodiment of the present invention. DETAILED DESCRIPTION

[0067] To make the purpose, technical solutions, and advantages of the embodiments of the present invention more clear, the technical solutions in the embodiments of the present invention will be clearly and completely described below in conjunction with the accompanying drawings in the embodiments of the present invention. Obviously, the described embodiments are part of the embodiments of the present invention, not all of the embodiments. Based on the embodiments of the present invention, all other embodiments obtained by those skilled in the art without making creative efforts shall fall within the scope of protection of the present invention.

[0068] The embodiment of the present invention provides a switch management system, such as Figure 1 As shown, the switch management system includes at least one industrial computer, at least one switch, a serial port server, a management server, and a power management device. Each industrial computer can establish a communication connection with one or more switches via the serial port server. The management server can establish a communication connection with each industrial computer. The management server can also establish a communication connection with the power management device, and the power management device can be electrically connected to each switch.

[0069] The industrial computer can be a computer running Linux and installed with production test software. Production line operators can use this production test software to control the switch testing process and complete at least one test on the switch to determine whether the switch meets preset quality standards. For example, the testing process may include pre-test 1, pre-test 2, burn-in testing, environmental stress screening (ESS), post-testing, and outgoing quality control (OQC). Pre-test 1 primarily involves installing the switch operating system and testing basic switch functions, such as programming the field replaceable unit (FRU) and media access control (MAC) addresses. Pre-test 2 primarily involves upgrading the switch firmware and performing comprehensive power testing. ESS testing primarily involves long-term testing at a fixed temperature of 45°C and in a variable temperature environment between 0 and 45°C. Post-testing is primarily used for installation in customer systems. OQC primarily involves manual screening. The management server can be installed with production management software and provide a corresponding web page service. Researchers and production line operators can log in to the web page service from their terminals. The management server can then send real-time information to the terminals via the Socket communication protocol, providing real-time page displays for researchers and production line workers. The power management device can be an intelligent power distribution unit (PDU).

[0070] An embodiment of the present invention provides a method for sending operation instruction information. By promptly notifying management personnel when failed test information is detected, the comprehensiveness of fault information can be ensured, and the communication cost between management personnel and operators can be reduced, thereby improving the production efficiency and quality of switches.

[0071] According to an embodiment of the present invention, an embodiment of a method for sending operation instruction information is provided. It should be noted that the steps shown in the flowchart of the accompanying drawings can be executed in a computer system such as a set of computer executable instructions, and although a logical order is shown in the flowchart, in some cases, the steps shown or described can be executed in an order different from that shown here.

[0072] In this embodiment, a method for sending operation instruction information is provided, which can be executed by the above-mentioned management server. Figure 2 FIG. 1 is a flow chart of a method for sending operation instruction information according to an embodiment of the present invention. Figure 2 As shown, the process includes the following steps:

[0073] Step S201: Receive first failure test information.

[0074] The first failure test information is generated when the target industrial computer fails to perform a target item test on the first switch, indicating that the first switch has failed. The first failure test information may include the model, location information, communication address, serial number of the first switch, as well as the first log path, the name of the first test item, the test result, the first alarm level, and the like. The location information may be used to indicate the physical location of the switch on the production line. The test result may include failure or success. The alarm level may include high, medium, or low. The target industrial computer may be any one of at least one industrial computer, and the first switch may be any one of at least one switch controlled by the target industrial computer. The target item test may be any one of the at least one test performed by the target industrial computer on the first switch.

[0075] Specifically, each industrial computer can perform at least one test on at least one switch it is responsible for. During the test, the switch's own data acquisition module can collect its own test information in real time and transmit it promptly to the corresponding industrial computer. The industrial computer can be equipped with a monitoring service to subscribe to the Redis message channel. That is, when receiving test information, it determines whether the test result in the test information is a failure. If so, it transmits the test information to the management server. The management server can receive the failed test information and perform subsequent processing.

[0076] In addition, the industrial computer can also store detailed logs generated during the switch testing process. Accordingly, after detecting failed test information, it can extract the log path from the failed test information and obtain the corresponding log file based on the log path. When sending the test information to the management server, it can also send the corresponding log file to the management server at the same time. In this way, the management server can receive both the failed test information and the log file.

[0077] The failure test information may include the switch's location information, serial number, communication address, model, as well as the test item name, log path, failure information, test results, alarm level, etc. For example, the data structure of the failure test information may be as follows:

[0078] {pos: "location information"

[0079] {

[0080] Dut_ip: "communication address",

[0081] Dut_sn: "serial number",

[0082] log_path: "log path",

[0083] machine_type: "model",

[0084] fail_item: "test item name",

[0085] fail_info: "failure information",

[0086] Status: "Test results",

[0087] warnig_level: "warning level",

[0088] }

[0089] }

[0090] Step S202: Determine, according to the model of the first switch, a communication address of a first processing object that matches the model of the first switch.

[0091] The first processing object is a terminal where a manager who develops the first switch is located.

[0092] Specifically, the management server may store a first correspondence between switch models and management personnel identification information. Upon receiving the first failure test information, the management server may extract the first switch model from the first failure test information and, based on the first switch model and the first correspondence, determine the identification information of the first management personnel corresponding to the first switch model. Furthermore, based on the identification information of the first management personnel, the management server may determine the communication address of the corresponding first processing target.

[0093] Step S203: Send first failure test information to the first processing object according to the communication address of the first processing object.

[0094] Specifically, the management server can use the first failure test information as the body of the email and send the email to the first processing object. In this way, the researcher can receive the first failure test information on their terminal, make a preliminary judgment based on the test item name and failure information in the first failure test information, enter the first operation instruction information into the first processing object, and the first processing object will send the first operation instruction information to the management server. The first operation instruction information may include identification information of the first failure test information, as well as repair operation instruction information, test instruction information, etc.

[0095] Step S204: Receive first operation instruction information corresponding to the first failure test information sent by the first processing object.

[0096] Specifically, after receiving the first operation instruction information, the management server can extract the identification information of the first failure test information from the first operation instruction information to determine the first failure test information in its failure test information database, and obtain the location information of the first switch from the first failure test information.

[0097] Step S205: Determine, based on the location information of the first switch, a communication address of a second processing object that matches the location information of the first switch.

[0098] The second processing object may be a terminal where an operator responsible for the first switch on the production line is located.

[0099] Specifically, the management server may store a second correspondence between a physical location and identification information of an operator. After receiving the first operation instruction information, the management server determines the identification information of the operator corresponding to the first physical location based on the first physical location in the first failure test information and the second correspondence. Furthermore, the management server determines the communication address of the second processing target based on the identification information of the operator.

[0100] Step S206: Send the first operation instruction information to the second processing object according to the communication address of the second processing object.

[0101] Specifically, the management server can determine the communication address of the second processing target based on its identification information and send the information to the second processing target based on its communication address. This allows the second operator to perform the corresponding repair operation on the first switch according to the repair operation instruction information and retest the first switch on the target industrial computer according to the test instruction information. In some optional implementations, the first operation instruction information can be sent via email.

[0102] In some optional implementations, the management server may also extract the first log path from the first failure test information after receiving the first failure test information, obtain the corresponding first log file from the target industrial computer according to the first log path, and send the first log file to the first processing object at the same time as sending the first failure test information.

[0103] Alternatively, in some optional implementations, if the administrator is unable to provide operational recommendations based on the first failure test information, the administrator can click on the first log path in the first failure test information. In this way, the first processing object can send a log acquisition instruction to the management server, which can then acquire the first log file from the target industrial computer based on the first log path and feed it back to the first processing object.

[0104] Since the first log file carries more operation information, it is convenient for the management personnel to make more accurate first operation instruction information, and further allows the operators to make more accurate operations, thereby improving the test efficiency and product quality.

[0105] In the method for sending operation instruction information provided in this embodiment, upon receiving the first failure test information, the management server can promptly forward the first failure test information to the corresponding management personnel based on the model of the first switch in the first failure test information, and the management personnel can promptly provide the first operation instruction information based on the first failure test information. Furthermore, the management server forwards the first operation instruction information to the corresponding operator based on the location information of the first switch in the first failure test information, and the operator can promptly perform operations to repair the fault and restart the test based on the first operation instruction information. In the above-mentioned interactive process, the first failure test information can be fully provided to the management personnel without any information loss, allowing the management personnel to provide correct operation suggestions based on the complete test information. In this way, the communication cost between management personnel and operators is low, which can improve testing efficiency and product quality.

[0106] Since managers and operators may not receive failure test information and operation suggestions in a timely manner, the management server can add the failure test information to the failure test information database after receiving each failure test information. In this way, managers and operators can query the failure test information database for the switches they are responsible for after logging into the web page and handle them in a timely manner. Accordingly, this embodiment provides a method for adding failure test information, which can be executed by the above-mentioned management server. Figure 3 is a flow chart of a method for adding failed test information according to an embodiment of the present invention. Figure 3 As shown, the process includes the following steps:

[0107] Step S301: Obtain an unprocessed failed test information database, a processing progress weight value, a target processing stage where the first failed test information is currently located, and a first actual duration from processing the first failed test information to the target processing stage.

[0108] The unprocessed failure test information database includes multiple failure test information. The processing progress of each failure test information may include a failure test information sending stage, a failure test information pending stage, an operation instruction information sending stage, a switch fault repair stage, etc. The target processing stage is one of the failure test information sending stage, the failure test information pending stage, the operation instruction information sending stage, and the switch fault repair stage.

[0109] Specifically, each time the management server receives a piece of failure test information, it can determine the status level of the failure test information based on multiple dimensions such as processing progress and alarm level. Among them, the processing progress weight value is fixed, that is, no matter which dimension it is in, it corresponds to a processing progress weight value. For the alarm level, different alarm levels correspond to different weight values. Then, according to the status level of the failure test information, the received failure test information is added to the corresponding position in the unprocessed failure test information library. Moreover, as the processing progress of the failure test information changes, the status level of the failure test information can be updated in real time, thereby changing the position of the failure test information in the unprocessed failure test information library.

[0110] Step S302: Obtain the current status level of each piece of failed test information.

[0111] Specifically, the management server may also extract the current status level of each piece of failed test information from the unprocessed failed test information database.

[0112] Step S303: Determine a target weight value corresponding to the first alarm level according to the first alarm level and the correspondence between the alarm level and the weight value.

[0113] Step S304: Obtain an estimated total processing time corresponding to the first failure test information according to the model of the first switch and the first alarm level.

[0114] Specifically, because different models require different total processing times at different alarm levels, the management server can first determine a third correspondence corresponding to the first switch based on the model of the first switch, namely, a correspondence between the alarm level and the processing time. Then, based on the first alarm level and the third correspondence, the management server can determine the estimated total processing time corresponding to the first alarm level, that is, the estimated total processing time corresponding to the first failure test information. The correspondence between the alarm level and the processing time in the third correspondence can be determined by technicians based on historical data and experience.

[0115] Step S305 : determining the estimated remaining processing time of the first failed test information according to the first failed test information, the target processing stage, the first actual time, and the estimated total processing time.

[0116] Specifically, step S305 may include:

[0117] Step 1: According to the first test item name, extract at least one target failure test information corresponding to the first test item name from a pre-built processed failure test information library, as well as the actual time for processing each target failure test information to the target processing stage.

[0118] The management server also stores a processed failed test information library, and the historical failed test information library includes multiple pieces of processed failed test information. The management server can match at least one target failed test information including the first test item name in the historical failed test information library based on the first test item name.

[0119] Moreover, for each target failure test information, the management server can obtain the processing flow information corresponding to the target failure test information based on the target failure test information, and then determine the first start time when the management server receives the target failure test information and the second start time of starting the target processing stage in the processing flow information, and determine the actual duration from processing the target failure test information to the target processing stage by the difference between the second start time and the first start time.

[0120] Step 2: Determine the processing efficiency of the first failed test information according to the actual time taken to process each piece of target test information to the target processing stage and the first actual time.

[0121] Specifically, the management server may calculate the average actual duration based on the actual duration from each target failure test information to the target processing stage and the number of target failure test information, and then determine the processing efficiency of the first failure test information as the ratio of the first actual duration to the average actual duration. Alternatively, the management server may calculate the ratio of the actual duration from each target failure test information to the target processing stage to the first actual duration, determine the processing efficiency of the first failure test information compared to each target failure test information, and then calculate the sum of all processing efficiencies, and determine the ratio of the sum to the number of target failure test information as the processing efficiency of the first failure test information.

[0122] Step three: determining an estimated remaining processing time according to the first actual time, the processing efficiency of the first failed test information, and the estimated total processing time.

[0123] Specifically, the management server may subtract the first actual time from the expected total processing time to obtain a first remaining processing time, and further determine the sum of the first remaining processing time and the processing efficiency of the first failed test information as the expected remaining processing time.

[0124] Step S306 : determining a first status level of the first failed test information according to the target weight value, the estimated remaining processing time, the estimated total processing time, and the processing progress weight value.

[0125] Specifically, the management server may first calculate the ratio of the estimated remaining processing time to the estimated total processing time, and further calculate the first status level of the first failure test information based on the ratio, the processing progress weight value, and the target weight value. Accordingly, the above process may use the following expression:

[0126] L=K1+K2(1-R / T)

[0127] Among them, L is the first status level, K1 is the target weight value, K2 is the processing progress weight value, R is the estimated remaining processing time, and T is the estimated total processing time.

[0128] Step S307 : determining a target ranking of the first failed test information according to the current status level and the first status level of each piece of failed test information.

[0129] Specifically, the management server can sort each failure test information and the first failure test information in the failure test information library according to the current status level and the first status level of each failure test information, from high to low according to the status level. In this way, the sorting of each failure test information and the target sorting of the first failure test information can be obtained.

[0130] Step S308: Add the first failed test information to the position corresponding to the target order in the failed test information database.

[0131] Specifically, the management server may add the first failed test information to a corresponding location in the failed test information database. In this way, after logging into the corresponding Web service through a terminal, the management staff and the operator can view the failed test information in the order of update. Since the failed test information in the front row is more urgent, the management staff and the operator can focus on the failed test information in the front row to confirm whether they have completed the corresponding task in time.

[0132] The management server can reorder the failure test information in the unprocessed failure information database according to the above method after the stage of any failure test information changes.

[0133] In some optional implementations, upon receiving the first failure test information, the management server determines a target ranking for the first failure test information based on the first alarm level and the alarm level of each piece of failure test information among the unprocessed failure test information. Specifically, failure test information with an alarm level higher than the first alarm level is ranked before the first failure test information, and failure test information with an alarm level lower than the first alarm level is ranked after the first failure test information. Failure test information with an alarm level equal to the first alarm level may be ranked based on the order of receipt time.

[0134] In the method for adding failed test information provided in this embodiment, the alarm level can indicate the severity of the fault corresponding to the failed test information, and the estimated remaining processing time can indicate the processing speed of the failed test information. Combining the two to determine the status level of the failed test information can indicate the urgency with which the failed test information needs to be processed. Furthermore, by sorting the failed test information by status level, managers and operators can understand which tests need to be processed first, thereby optimizing resource allocation and improving processing efficiency. In addition, as the progress of test information processing changes, its status level will also be updated in real time, which means that test information with higher importance or urgency will be processed in a timely manner, improving the timeliness of problem solving.

[0135] In some optional embodiments, when the number of failure test information with the same serial number of the switch in the monitored unprocessed failure test information library is equal to a preset threshold, the first power serial port information is extracted from any failure test information (third failure test information) in the failure test information with the same serial number. The first power serial port information is sent to the power management device, wherein the power management device adjusts the first power serial port corresponding to the first power serial port information to the target state based on the first power serial port information, so as to disconnect the power supply of the power management device to the switch corresponding to the switch serial number. The corresponding management personnel is determined based on the model of the switch included in the third failure test information, and the corresponding operator is determined based on the location information included in the third failure test information, and a second alarm notification is sent to the terminal where the management personnel is located and the terminal where the operator is located, prompting them to handle the matter as soon as possible.

[0136] Since the serial number indicates a specific switch, when a switch has too many failed test messages, it means that the fault of the switch is more serious and may cause a serious failure of the switch. Therefore, in order to avoid a serious failure of the switch, the power supply to the switch can be promptly disconnected through the power management device to stop the test process.

[0137] In some optional implementations, when all tests on each switch in the switch management system are completed, the management server can determine the model of at least one switch appearing in the unprocessed failure test information library and the number of occurrences of each switch model based on the switch model included in each failure test information in the unprocessed failure test information library, and select the model of the second switch with the largest number of occurrences. Based on the model of the second switch, the communication address of a third processing object that matches the model of the second switch is determined, wherein the third processing object is the terminal where the manager who develops the second switch is located. Based on the communication address of the third processing object, the second switch model and the second failure test information (including multiple failure test information) including the model of the second switch are sent to the third processing object. In this way, it can be determined which switch has more problems, allowing the manager to conduct a comprehensive analysis based on the multiple second failure test information before processing, so that the analysis results are more accurate.

[0138] In some optional implementations, when all tests on each switch in the switch management system are completed, the management server can determine at least one type of location information and the number of occurrences of each type of location information in the unprocessed failure test information library based on the location information of the switch included in each piece of failure test information in the unprocessed failure test information library, and select the first location information with the largest number of occurrences. Based on the first location information, the communication address of the fourth processing object that matches the first location information is determined. Based on the communication address of the fourth processing object, a first alarm notification is sent to the fourth processing object, wherein the first alarm notification is used to indicate that there is an abnormality in the equipment of the production line corresponding to the first location information. In this way, it can be determined which location has more problems, allowing operators to promptly check whether other equipment at the corresponding location has faults and repair them, thereby reducing the impact on the testing process, that is, improving testing efficiency.

[0139] In some optional implementations, for each piece of failed test information, the management server can provide a web page with the failed test information, so that managers and operators matching the failed test information can make real-time comments on the web page, exchange messages in a timely manner, complete repair operations, etc.

[0140] In some optional implementations, managers can log in to the Web page service to learn about the test status of each switch without having to communicate with operators, which is more convenient.

[0141] This embodiment also provides a device for sending operation instruction information, which is used to implement the above-mentioned embodiments and preferred embodiments. Details already described will not be repeated here. As used below, the term "module" may refer to a combination of software and / or hardware that implements a predetermined function. Although the devices described in the following embodiments are preferably implemented in software, implementation using hardware, or a combination of software and hardware, is also possible and contemplated.

[0142] This embodiment provides a device for sending operation instruction information, such as Figure 4 As shown, including:

[0143] Receiving module 401 is configured to receive first test failure information, where the first test failure information is generated when a target industrial computer fails to execute a target test on a first switch, the first test failure information including model and location information of the first switch, the target industrial computer being any one of the at least one industrial computer, the first switch being a switch controlled by the target industrial computer, and the target test being any one of the at least one test executed by the target industrial computer on the first switch;

[0144] The determining module 401 is configured to determine, based on the model of the first switch, a communication address of a first processing object that matches the model of the first switch, wherein the first processing object is a terminal where an administrator of the first switch is located;

[0145] A sending module 403 is configured to send the first failure test information to the first processing object according to the communication address of the first processing object;

[0146] The receiving module 401 is further configured to receive first operation instruction information corresponding to the first failure test information sent by the first processing object, wherein the first operation instruction information is input into the first processing object by the administrator of the first switch;

[0147] The determination module 402 is further configured to determine, based on the location information of the first switch, a communication address of a second processing object that matches the location information of the first switch, wherein the second processing object is a terminal of an operator on the production line responsible for the first switch;

[0148] The sending module 403 is further configured to send the first operation instruction information to the second processing object according to the communication address of the second processing object.

[0149] In some optional implementations, the first failure test message further includes a first alarm level, and the apparatus further includes an adding module 404 configured to:

[0150] Obtaining an unprocessed failed test information library, a processing progress weight value, a target processing stage where the first failed test information is currently located, and a first actual duration from processing the first failed test information to the target processing stage, wherein the unprocessed failed test information library includes multiple failed test information;

[0151] Get the current status level of each failed test information;

[0152] Determining a target weight value corresponding to the first alarm level according to the first alarm level and the correspondence between the alarm level and the weight value;

[0153] Obtaining, according to the model of the first switch and the first alarm level, an estimated total processing time corresponding to the first failure test information;

[0154] Determine an estimated remaining processing time for the first failed test information based on the first failed test information, the target processing stage, the first actual processing time, and the estimated total processing time;

[0155] Determining a first status level of the first failed test information according to the target weight value, the estimated remaining processing time, the estimated total processing time, and the processing progress weight value;

[0156] determining a target ranking of the first failed test information according to the current status level and the first status level of each piece of failed test information;

[0157] The first failed test information is added to a position corresponding to the target order in the failed test information library.

[0158] In an optional implementation manner, the first failed test information further includes the name of the first test item;

[0159] Add module 404, specifically for:

[0160] Extracting, according to the first test item name, at least one target failure test information corresponding to the first test item name from a pre-built processed failure test information library, and the actual duration of processing each target failure test information to the target processing stage;

[0161] Determining a processing efficiency of the first failed test information based on an actual duration of processing each target test information to the target processing stage and the first actual duration;

[0162] An estimated remaining processing time is determined according to the first actual time, the processing efficiency of the first failed test information, and the estimated total processing time.

[0163] In an optional implementation, the first status level of the first failure test information is determined based on the target weight value, the estimated remaining processing time, the estimated total processing time, and the processing progress weight value, using the following expression:

[0164] L=K1+K2(1-R / T)

[0165] Among them, L is the first status level, K1 is the target weight value, K2 is the processing progress weight value, R is the estimated remaining processing time, and T is the estimated total processing time.

[0166] In an optional implementation, the first failure test information further includes a first log path;

[0167] The apparatus further includes an acquisition module 405, configured to:

[0168] Obtaining a first log file from the target industrial computer according to the first log path;

[0169] The receiving module 401 is further configured to send the first log file to the first processing target.

[0170] In an optional implementation, the sending module 403 is further configured to:

[0171] When all tests on each switch in the switch management system are completed, determining at least one switch model appearing in the unprocessed failed test information base and the number of occurrences of each switch model based on the switch model included in each piece of failed test information in the unprocessed failed test information base;

[0172] Determine the model of the second switch that appears the most times;

[0173] Determine, based on the model of the second switch, a communication address of a third processing object that matches the model of the second switch, wherein the third processing object is a terminal where an administrator of the second switch is located;

[0174] The second switch model and second failure test information including the model of the second switch are sent to the third processing object according to the communication address of the third processing object.

[0175] In an optional implementation, the failure test information also includes the location information of the switch, and the sending module 403 is further configured to:

[0176] When all tests on each switch in the switch management system are completed, determining at least one type of location information appearing in the unprocessed failed test information base and the number of occurrences of each type of location information based on the switch location information included in each piece of failed test information in the unprocessed failed test information base;

[0177] Determine the first position information that appears the most times;

[0178] determining, based on the first location information, a communication address of a fourth processing object that matches the first location information;

[0179] A first alarm notification is sent to the fourth processing object according to the communication address of the fourth processing object, wherein the first alarm notification is used to indicate that an abnormality exists in equipment of the production line corresponding to the first location information.

[0180] The further functional description of each of the above modules and units is the same as that of the above corresponding embodiments and will not be repeated here.

[0181] The device for sending operation instruction information in this embodiment is presented in the form of a functional unit, where the unit refers to an ASIC (Application Specific Integrated Circuit) circuit, a processor and memory that executes one or more software or fixed programs, and / or other devices that can provide the above functions.

[0182] The embodiment of the present invention also provides a computer device having the above Figure 4 The device for sending operation instruction information is shown.

[0183] See also Figure 5 , Figure 5 is a structural diagram of a computer device provided by an optional embodiment of the present invention, such as Figure 5 As shown, the computer device includes: one or more processors 10, memory 20, and interfaces for connecting various components, including high-speed interfaces and low-speed interfaces. Various components utilize different buses to communicate with each other and can be installed on a common mainboard or installed in other ways as needed. The processor can process the instructions executed in the computer device, including instructions stored in or on the memory to display the graphical information of a GUI on an external input / output device (such as, a display device coupled to an interface). In some optional embodiments, if necessary, multiple processors and / or multiple buses can be used together with multiple memories and multiple memories. Equally, multiple computer devices can be connected, and each device provides part of the necessary operations (for example, as a server array, a group of blade servers, or a multi-processor system). Figure 5 A processor 10 is taken as an example.

[0184] The processor 10 may be a central processing unit, a network processor, or a combination thereof. The processor 10 may further include an application-specific integrated circuit, a programmable logic device, or a combination thereof. The programmable logic device may be a complex programmable logic device, a field programmable gate array, a general purpose array logic, or any combination thereof.

[0185] The memory 20 stores instructions that can be executed by at least one processor 10, so that the at least one processor 10 executes the method shown in the above embodiment.

[0186] The memory 20 may include a program storage area and a data storage area, wherein the program storage area may store an operating system and application programs required for at least one function; the data storage area may store data created based on the use of the computer device, etc. In addition, the memory 20 may include a high-speed random access memory, and may also include a non-transient memory, such as at least one disk storage device, a flash memory device, or other non-transient solid-state storage device. In some optional embodiments, the memory 20 may optionally include a memory remotely located relative to the processor 10, and these remote memories may be connected to the computer device via a network. Examples of the above-mentioned network include, but are not limited to, the Internet, an intranet, a local area network, a mobile communication network, and combinations thereof.

[0187] The memory 20 may include a volatile memory, such as a random access memory; the memory may also include a non-volatile memory, such as a flash memory, a hard disk or a solid-state drive; the memory 20 may also include a combination of the above types of memory.

[0188] The computer device further includes a communication interface 30 for the computer device to communicate with other devices or a communication network.

[0189] The embodiment of the present invention also provides a computer-readable storage medium. The above-mentioned method according to the embodiment of the present invention can be implemented in hardware, firmware, or implemented as a computer code that can be recorded in a storage medium, or implemented as a computer code that is originally stored in a remote storage medium or a non-temporary machine-readable storage medium and downloaded through a network and will be stored in a local storage medium, so that the method described herein can be stored in such software processing on a storage medium using a general-purpose computer, a dedicated processor, or programmable or dedicated hardware. Among them, the storage medium can be a magnetic disk, an optical disk, a read-only storage memory, a random access memory, a flash memory, a hard disk or a solid-state drive, etc.; further, the storage medium can also include a combination of the above-mentioned types of memory. It can be understood that a computer, a processor, a microprocessor controller or programmable hardware includes a storage component that can store or receive software or computer code. When the software or computer code is accessed and executed by a computer, a processor or hardware, the method shown in the above embodiment is implemented.

[0190] A portion of the present invention may be applied as a computer program product, such as a computer program instruction, which, when executed by a computer, can call or provide the method and / or technical solution according to the present invention through the operation of the computer. Those skilled in the art should understand that the form in which the computer program instruction exists in a computer-readable medium includes, but is not limited to, a source file, an executable file, an installation package file, etc. Accordingly, the way in which the computer program instruction is executed by the computer includes, but is not limited to: the computer directly executes the instruction, or the computer compiles the instruction and then executes the corresponding compiled program, or the computer reads and executes the instruction, or the computer reads and installs the instruction and then executes the corresponding installed program. Here, the computer-readable medium may be any available computer-readable storage medium or communication medium that can be accessed by the computer.

[0191] Although the embodiments of the present invention have been described with reference to the accompanying drawings, those skilled in the art may make various modifications and variations without departing from the spirit and scope of the present invention. Such modifications and variations are all within the scope defined by the appended claims.

Claims

1. A method for sending operation instruction information, characterized in that: The method is applied to a switch management system, which includes at least one industrial computer, at least one switch, and a management server. The method is executed by the management server and includes: Receive first failure test information, where the first failure test information is generated when a target industrial computer fails to execute a target test on a first switch, the first failure test information includes model and location information of the first switch, the target industrial computer is any one of the at least one industrial computer, the first switch is a switch controlled by the target industrial computer among the at least one switches, and the target test is any one of at least one test executed by the target industrial computer on the first switch; determining, based on the model of the first switch, a communication address of a first processing object that matches the model of the first switch, wherein the first processing object is a terminal where an administrator of the first switch is located; sending the first failure test information to the first processing object according to the communication address of the first processing object; receiving first operation instruction information corresponding to the first failure test information and sent by the first processing object, wherein the first operation instruction information is input into the first processing object by a manager of the first switch; determining, based on the location information of the first switch, a communication address of a second processing object that matches the location information of the first switch, wherein the second processing object is a terminal where an operator responsible for operating the first switch on the production line is located; The first operation instruction information is sent to the second processing object according to the communication address of the second processing object.

2. The method according to claim 1, characterized in that The first failure test information also includes a first alarm level; After receiving the first failure test information, the method further includes: Obtaining an unprocessed failed test information database, a processing progress weight value, a target processing stage in which the first failed test information is currently located, and a first actual duration of processing the first failed test information to the target processing stage, wherein the unprocessed failed test information database includes multiple failed test information; Obtaining the current status level of each piece of failed test information; Determining a target weight value corresponding to the first alarm level according to the first alarm level and a correspondence between the alarm level and the weight value; Obtaining, according to the model of the first switch and the first alarm level, an estimated total processing time corresponding to the first failure test information; Determining an estimated remaining processing time for the first failed test information based on the first failed test information, the target processing stage, the first actual processing time, and the estimated total processing time; determining a first status level of the first failure test information according to the target weight value, the estimated remaining processing time, the estimated total processing time, and the processing progress weight value; determining a target ranking of the first failure test information according to a current status level of each piece of the failure test information and the first status level; The first failed test information is added to the failed test information library at a position corresponding to the target ranking.

3. The method according to claim 2, characterized in that The first failed test information also includes a first test item name; The determining, based on the first failure test information, the target processing stage, the first actual processing time, and the estimated total processing time, of an estimated remaining processing time for the first failure test information includes: Extracting, according to the first test item name, at least one target failure test information corresponding to the first test item name from a pre-built processed failure test information library, and the actual duration of processing each target failure test information to the target processing stage; determining a processing efficiency of the first failure test information according to an actual duration of processing each piece of the target failure test information to the target processing stage and the first actual duration; The estimated remaining processing time is determined according to the first actual time, the processing efficiency of the first failed test information, and the estimated total processing time.

4. The method according to claim 2 or 3, characterized in that The first status level of the first failure test information is determined according to the target weight value, the estimated remaining processing time, the estimated total processing time, and the processing progress weight value, using the following expression: L=K1+K2(1-R / T) Among them, L is the first status level, K1 is the target weight value, K2 is the processing progress weight value, R is the estimated remaining processing time, and T is the estimated total processing time.

5. The method according to any one of claims 1 to 3, characterized in that The first failure test information also includes a first log path; The method further comprises: Obtaining a first log file from the target industrial computer according to the first log path; Sending the first log file to the first processing target.

6. The method according to claim 2 or 3, characterized in that The method further comprises: When all tests on each switch in the switch management system are completed, determining at least one switch model appearing in the unprocessed failure test information base and the number of occurrences of each switch model according to the switch model included in each piece of failure test information in the unprocessed failure test information base; Determine the model of the second switch that appears the most times; determining, based on the model of the second switch, a communication address of a third processing object that matches the model of the second switch, wherein the third processing object is a terminal where an administrator of the second switch is located; The second switch model and second failure test information including the model of the second switch are sent to the third processing object according to the communication address of the third processing object.

7. The method according to claim 2 or 3, characterized in that The failure test information also includes location information of the switch, and the method further includes: When all tests on each switch in the switch management system are completed, determining at least one type of location information appearing in the unprocessed failure test information base and the number of occurrences of each type of location information based on the switch location information included in each piece of failure test information in the unprocessed failure test information base; Determine the first position information that appears the most times; determining, based on the first location information, a communication address of a fourth processing object that matches the first location information; A first alarm notification is sent to the fourth processing object according to the communication address of the fourth processing object, wherein the first alarm notification is used to indicate that an abnormality exists in equipment of the production line corresponding to the first location information.

8. A device for sending operation instruction information, characterized in that: The device is applied to a switch management system, which includes at least one industrial computer, at least one switch, and a management server. The device includes: a receiving module, configured to receive first test failure information, wherein the first test failure information is generated when a target industrial computer fails to execute a target test on a first switch, the first test failure information including model and location information of the first switch, the target industrial computer being any one of the at least one industrial computer, the first switch being a switch controlled by the target industrial computer among the at least one switches, and the target test being any one of at least one test executed by the target industrial computer on the first switch; a determination module, configured to determine, based on the model of the first switch, a communication address of a first processing object that matches the model of the first switch, wherein the first processing object is a terminal where an administrator of the first switch is located; a sending module, configured to send the first failure test information to the first processing object according to the communication address of the first processing object; The receiving module is further configured to receive first operation instruction information corresponding to the first failure test information and sent by the first processing object, wherein the first operation instruction information is input into the first processing object by a manager of the first switch; The determining module is further configured to determine, based on the location information of the first switch, a communication address of a second processing object that matches the location information of the first switch, wherein the second processing object is a terminal where an operator responsible for operating the first switch on the production line is located; The sending module is further configured to send the first operation instruction information to the second processing object according to the communication address of the second processing object.

9. A computer device, characterized in that: include: A memory and a processor, wherein the memory and the processor are communicatively connected to each other, the memory stores computer instructions, and the processor executes the method for sending operation instruction information according to any one of claims 1 to 7 by executing the computer instructions.

10. A computer-readable storage medium, characterized in that The computer-readable storage medium stores computer instructions, and the computer instructions are used to enable a computer to execute the method for sending operation instruction information according to any one of claims 1 to 7.

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