NED equipment detection device and method

Abstract

The present application belongs to the field of equipment detection, and specifically discloses a NED equipment detection device and method, the device comprising: at least one first station and at least one second station; the first station is used to carry a first test device and a NED device to be detected, so as to adjust the posture of the NED device to be detected relative to the first test device at the first station according to a preset test alignment requirement, and obtain the posture parameters of the NED device when the preset test alignment requirement is met; the second station is used to carry a second test device and the NED device after the posture is adjusted at the first station, so as to adjust the posture of the NED device at the second station according to the posture parameters, so that the second test device obtains the screen displayed by the NED device after the posture is adjusted at the second station, thereby realizing the detection of the NED device. Through this application, the testing efficiency of the NED device can be improved and the testing time can be reduced.

Description

Technical Field

[0001] The present application relates to the field of device detection, and more specifically, to a near-eye display (NED) device detection apparatus and method. Background Art

[0002] In the production process of near-eye display devices such as Virtual Reality (VR), Augmented Reality (AR) and Mixed Reality (MR), accurate testing of optical properties and image quality is a key step in ensuring product quality. Optical property evaluation parameters such as brightness uniformity, field of view (FOV), modulation transfer function (MTF), distortion, contrast, virtual image distance, and eyebox size all need to be rigorously tested. Traditional testing methods involve placing the front aperture of the test device in the eyebox and adjusting the device to a specific eye relief position (the distance from the pupil to the NED glasses lens) to capture and evaluate the complete virtual image. This process is not only complicated and time-consuming, but also requires fine adjustment so that the test device can accurately capture the virtual image, which significantly affects manufacturing efficiency.

[0003] On existing NED equipment production lines, NED devices are typically tested using optical property detection equipment such as imaging colorimeters or rotating spot colorimeters. In these devices, test alignment must first be completed before testing can begin. This alignment process includes multiple steps, such as adjusting the test device to the center of the eyebox and ensuring that the test angle and virtual image quality meet standard requirements. However, this process typically takes up to 10 minutes or more to complete the test of a device, significantly extending the processing time of each device on the production line, posing a major challenge to efficient large-scale production. Summary of the Invention

[0004] In view of the defects of the prior art, the purpose of this application is to provide a NED equipment detection device and method, aiming to solve the problems of long time-consuming and low detection efficiency in the existing NED equipment test alignment process.

[0005] To achieve the above-mentioned object, in a first aspect, the present application provides a detection device for NED equipment, comprising: at least one first station and at least one second station;

[0006] The first station is used to carry the first test device and the NED device to be tested, so as to adjust the posture of the NED device to be tested relative to the first test device at the first station according to the preset test alignment requirements, and obtain the posture parameters of the NED device when the preset test alignment requirements are met;

[0007] The second workstation is used to carry a second test device and the NED device after its posture is adjusted at the first workstation, so as to adjust the posture of the NED device at the second workstation according to the posture parameters, so that the second test device obtains the picture displayed by the NED device after the posture is adjusted at the second workstation to realize the detection of the NED device; the position of the second test device at the second workstation is consistent with the position of the first test device at the first workstation, and the position refers to the relative position of the test device and the NED device on the same workstation.

[0008] The NED device to be tested may also be referred to as the device under test (DUT). According to the functions of the first station and the second station, the first station may be referred to as a pre-alignment station or a pre-installation station, and the second station may be referred to as a test station.

[0009] It can be understood that this application completes the posture adjustment of the DUT at the pre-alignment station, and then transfers the DUT directly to the test station to start testing directly. This can significantly improve test efficiency, reduce production costs, increase the overall throughput of the production line, and achieve more efficient NED equipment testing and production.

[0010] In some embodiments, the position of the second testing device at the second station is consistent with the position of the first testing device at the first station, including:

[0011] The first test device and the second test device both include an optical lens, and a diaphragm is provided at the front end of the optical lens;

[0012] The position of the aperture of the second testing device at the second working station is consistent with the position of the aperture of the first testing device at the first working station.

[0013] It is understandable that the position of the aperture corresponds to the position of the lens entrance pupil. Typically, the position of the test equipment primarily refers to the position of the lens aperture. When the entrance pupil positions of the first and second test equipment are consistent, after adjusting the DUT's posture according to the test alignment requirements at the pre-alignment station, the DUT's posture is then replicated at the test station according to the corresponding posture parameters. This can avoid the time spent repeatedly adjusting the DUT's posture at the test station, improve the test station's testing efficiency, and enable efficient testing at the test station.

[0014] Specifically, the posture parameters mentioned in this application include: the position, orientation, placement angle, etc. of the DUT on the workstation.

[0015] In some embodiments, the reference planes of the first station and the second station are consistent.

[0016] In some embodiments, the at least one first station includes: a carrier and a first carrier base;

[0017] The carrier is used to carry the NED device;

[0018] The first carrier base is used to support the carrier and adjust the carrier's posture according to the preset test alignment requirements;

[0019] After the NED device completes posture adjustment at the first station, it is moved to the second station and is carried and moved synchronously by the carrier.

[0020] In some embodiments, the at least one first station includes: a carrier;

[0021] The carrier is used to carry the NED device, so that the posture of the NED device can be adjusted according to the preset test alignment requirements through the carrier;

[0022] After the NED device completes posture adjustment at the first station, it is moved to the second station and is carried and moved synchronously by the carrier.

[0023] In some embodiments, the at least one second station includes: a second stage base;

[0024] The second carrier base is used to carry the carrier carrying the NED device transferred from the first workstation, so as to adjust the posture of the transferred carrier according to the posture parameters.

[0025] In a second aspect, the present application provides a method for detecting a NED device, comprising:

[0026] A first test device and an NED device to be tested are carried on a first workstation, so that a posture of the NED device to be tested relative to the first test device is adjusted at the first workstation according to a preset test alignment requirement, and posture parameters of the NED device are obtained when the preset test alignment requirement is met;

[0027] A second workstation is used to carry a second test device and the NED device after the posture is adjusted at the first workstation, so as to adjust the posture of the NED device at the second workstation according to the posture parameters, so that the second test device can obtain the picture displayed by the NED device after the posture is adjusted at the second workstation, thereby realizing the detection of the NED device; the position of the second test device at the second workstation is consistent with the position of the first test device at the first workstation, and the position refers to the relative position of the test device and the NED device on the same workstation.

[0028] In some embodiments, the position of the second testing device at the second station is consistent with the position of the first testing device at the first station, including:

[0029] The first test device and the second test device both include an optical lens, and a diaphragm is provided at the front end of the optical lens;

[0030] The position of the aperture of the second testing device at the second working station is consistent with the position of the aperture of the first testing device at the first working station.

[0031] In some embodiments, the reference planes of the first station and the second station are consistent.

[0032] In some embodiments, the first station and the second station carry the NED device via a carrier, and the posture of the NED device is adjusted via the carrier or the carrier base; when the NED device is transferred from the first station to the second station, it is carried and moved synchronously by the corresponding carrier.

[0033] In general, the above technical solutions conceived by this application have at least the following beneficial effects compared with the prior art:

[0034] The present application provides a NED equipment detection device and method. By completing the posture adjustment of a batch of DUTs at a pre-alignment station and then transferring the DUTs directly to the test station to start testing directly, this can significantly improve testing efficiency, reduce production costs, increase the overall throughput of the production line, and achieve more efficient NED equipment production. Because the reference planes of the pre-installation station and the test station are consistent, and the positions of the pre-alignment camera and the test camera are consistent, after the pre-installation station completes the alignment, the DUTs can be directly transferred to the test station without the need to adjust the test camera again, which greatly simplifies the testing process.

[0035] The present application provides a NED equipment detection device and method. When the pre-installation station does not include a carrier base, since the DUT end of the pre-installation station only includes a DUT carrier, that is, the DUT fixation and posture adjustment functions need to be implemented by the DUT carrier, after the installation and alignment adjustment are completed, the DUT carrier needs to be transferred to the test station, so each DUT needs to be equipped with a set of DUT carriers. This design allows only the test process to be completed at the test station machine, and the error in the DUT posture reproduction is small. Compared with the solution in which the pre-installation station includes a carrier base and a DUT carrier, the design that does not include a carrier base allows the dual-station machine to be smaller in size and more suitable for use in environments with limited space.

[0036] In summary, the NED equipment detection device provided in this application can improve the testing efficiency of NED equipment, simplify the testing process, reduce testing errors, and save equipment space. This technical solution is suitable for both mass production and testing of single NED equipment, and has strong adaptability. BRIEF DESCRIPTION OF THE DRAWINGS

[0037] Figure 1 This is an architectural diagram of a NED device detection apparatus provided in an embodiment of the present application;

[0038] Figure 2 This is a specific double-station schematic diagram of a NED equipment detection device provided in an embodiment of the present application;

[0039] Figure 3 This is a specific double-station schematic diagram of another NED equipment detection device provided in an embodiment of the present application;

[0040] Figure 4 This is a method flow chart of a NED device detection device provided in an embodiment of the present application. DETAILED DESCRIPTION

[0041] In order to make the purpose, technical solutions and advantages of this application more clear, the following further describes this application in detail with reference to the accompanying drawings and embodiments. It should be understood that the specific embodiments described herein are only used to explain this application and are not intended to limit this application.

[0042] The term "and / or" as used herein describes an association between related objects, indicating that three possible relationships exist. For example, "A and / or B" can represent: A exists alone, A and B exist simultaneously, or B exists alone. The symbol " / " as used herein indicates that the related objects are in an "or" relationship, for example, A / B means either A or B.

[0043] In the specification and claims herein, the terms "first" and "second" are used to distinguish between different objects, rather than to describe a specific order of objects. For example, "first station" and "second station" are used to distinguish between different stations, rather than to describe a specific order of the stations.

[0044] In the embodiments of this application, words such as "exemplary" or "for example" are used to indicate examples, illustrations, or descriptions. Any embodiment or design described as "exemplary" or "for example" in the embodiments of this application should not be interpreted as being preferred or advantageous over other embodiments or designs. Rather, the use of words such as "exemplary" or "for example" is intended to present the relevant concepts in a concrete manner.

[0045] In the description of the embodiments of the present application, unless otherwise specified, "at least one" means one or more than one, for example, at least one first workstation means one or more first workstations, etc.; at least one second workstation means one or more second workstations, etc.

[0046] Next, the technical solutions provided in the embodiments of this application are introduced.

[0047] Figure 1 This is an architecture diagram of a NED device detection device provided in an embodiment of the present application; Figure 1 As shown, it includes: at least one first station and at least one second station;

[0048] The first station is used to carry the first test device and the NED device to be tested, so as to adjust the posture of the NED device to be tested relative to the first test device at the first station according to the preset test alignment requirements, and obtain the posture parameters of the NED device when the preset test alignment requirements are met;

[0049] The second workstation is used to carry a second test device and the NED device after its posture is adjusted at the first workstation, so as to adjust the posture of the NED device at the second workstation according to the posture parameters, so that the second test device obtains the picture displayed by the NED device after the posture is adjusted at the second workstation to realize the detection of the NED device; the position of the second test device at the second workstation is consistent with the position of the first test device at the first workstation, and the position refers to the relative position of the test device and the NED device on the same workstation.

[0050] It is understood that the test equipment mentioned in this application refers to equipment used to test the optical characteristics and image quality of NED devices. For example, the test equipment can be a device such as a camera that can capture images of the NED device display.

[0051] Optionally, the position of the second test device at the second station is consistent with the position of the first test device at the first station, that is, the relative position of the NED device to the first test device at the first station is consistent with the relative position of the NED device to the second test device at the second station, specifically including:

[0052] The first test device and the second test device both include an optical lens, and a diaphragm is provided at the front end of the optical lens;

[0053] The position of the front end aperture of the lens of the second testing device at the second working position is consistent with the position of the front end aperture of the lens of the first testing device at the first working position.

[0054] Optionally, the reference planes of the first workstation and the second workstation are consistent.

[0055] Among them, the reference surfaces of the two stations are consistent, so as to facilitate the control of the positions of the first test equipment and the second test equipment. This ensures that after the posture adjustment of the DUT is completed at the first station, the test can be started directly after transferring to the second station without adjusting the DUT again.

[0056] It should be noted that a workstation's datum plane typically refers to a plane used as a reference during machining, assembly, or measurement. This datum plane can be an actual physical surface or a theoretical virtual plane. The selection of the datum plane is crucial to ensuring machining accuracy and product quality.

[0057] In some embodiments, the at least one first station includes: a carrier and a first carrier base;

[0058] The carrier is used to carry the NED device;

[0059] The first carrier base is used to support the carrier and adjust the carrier's posture according to the preset test alignment requirements;

[0060] After the NED device completes posture adjustment at the first station, it is moved to the second station and is carried and moved synchronously by the carrier.

[0061] This application designs a simple and easy-to-use DUT carrier and DUT carrier base to facilitate the fixation and posture adjustment of the DUT, and also facilitate the automation of the entire test process.

[0062] In some embodiments, the at least one first station includes: a carrier;

[0063] The carrier is used to carry the NED device, so that the posture of the NED device can be adjusted according to the preset test alignment requirements through the carrier;

[0064] After the NED device completes posture adjustment at the first station, it is moved to the second station and is carried and moved synchronously by the carrier.

[0065] It should be noted that when the first station only includes a carrier, after adjusting the DUT posture through the carrier at the first station, it is only necessary to move the carrier and the DUT to the second station without adjusting the DUT posture again; then the error in reproducing the posture of the DUT when moving from the pre-installation station to the test station is smaller, and there is no electric control structure, so the device is smaller.

[0066] In some embodiments, the at least one second station includes: a second stage base;

[0067] The second carrier base is used to carry the carrier carrying the NED device transferred from the first workstation, and adjust the posture of the transferred carrier according to the posture parameters.

[0068] In a specific embodiment, the first station and the second station can be understood as a pre-alignment station and a test station, respectively; the first test device and the second test device can be understood as a pre-alignment camera and a test camera, respectively. The technical solution provided in the embodiment of the present application mainly adopts the following technical means:

[0069] 1. Set up a pre-alignment station and a test station. The reference surfaces of the two stations are kept consistent to facilitate the control of the position of the pre-alignment camera and the test camera. This ensures that after the DUT posture adjustment is completed at the pre-alignment station, it can be transferred to the test station without adjusting the test camera again and the test can be started directly.

[0070] 2. At the pre-alignment station, set up a DUT carrier and a DUT carrier base. The DUT carrier only serves to secure the DUT, while the DUT's posture is controlled by the DUT carrier base. This allows the DUT carrier's posture coordinates, such as three-degree-of-freedom rotational coordinates and even three-degree-of-freedom displacement coordinates, to be bound to the corresponding DUT number after alignment is completed at the pre-assembly station.

[0071] 3. At the test station, set up the same DUT carrier base as the pre-installation station. Then, after the DUT is fixed by the DUT carrier, it can be directly transferred to the test station. Then, the alignment posture corresponding to the DUT under test is read and reproduced on the DUT carrier base at the test station. Then, the test can be started directly. This design can simplify the axis control on the camera side to reduce the size of the station machine. The DUT carrier base is electrically controlled, which facilitates the automation of the entire test process and the pre-alignment time is controllable. The double-station schematic diagram of this design is shown below. Figure 2 shown.

[0072] 4. Another solution is to only set up a DUT carrier at the DUT end of the pre-installation station, that is, the DUT carrier is required to implement both the DUT fixation and posture adjustment functions. After the installation and alignment adjustment are completed, the DUT carrier needs to be transferred to the test station, so each DUT needs to be equipped with a set of DUT carriers. This design can complete the test process at the test station machine without having to reproduce the DUT posture again. Therefore, the error in reproducing the DUT posture from the pre-installation station to the test station is small, and there is no electric control structure, so the size of the dual-station machine can be made smaller. The schematic diagram of this solution is as follows Figure 3 shown.

[0073] 5. Through the above technical means, it is possible to complete the posture adjustment of a batch of DUTs at the pre-alignment station so that testing can be started at the test station, thereby improving the utilization efficiency of the test station machine and the detection efficiency of the NED equipment, reducing test time and improving production efficiency.

[0074] Specifically, based on the above Figure 2In the given embodiment, the NED device testing method provided in the embodiment of the present application may include the following steps:

[0075] Step 1: Set up a pre-alignment station and a test station. The reference surfaces of these two stations are kept consistent to facilitate the control of the positions of the pre-alignment camera and the test camera.

[0076] Step 2: Set up the DUT carrier and DUT carrier base at the pre-alignment station. The DUT carrier can be made of hard plastic and is used to fix the DUT.

[0077] For example, the DUT carrier base may be an electric control platform for controlling the posture of the DUT carrier. The DUT carrier base may control the posture of the DUT carrier through three degrees of freedom of rotation coordinates and three degrees of freedom of displacement coordinates.

[0078] Step 3: Set up the same DUT carrier base at the test station as the one at the pre-installation station. The DUT carrier base at the test station is exactly the same as the one at the pre-installation station, so that the DUT can be directly transferred from the pre-installation station to the test station.

[0079] Step 4: Complete the posture adjustment of a batch of DUTs at the pre-alignment station.

[0080] Specifically, the DUT is first fixed on the DUT carrier, and then the DUT carrier base adjusts the DUT's posture to a predetermined posture. Then, the DUT carrier base controls the DUT carrier's posture coordinates and binds them to the corresponding DUT number.

[0081] Step 5: Secure the DUT on the DUT carrier and transfer it directly to the test station. After reading the corresponding alignment posture of the DUT under test, it is replicated on the DUT carrier base at the test station, and then testing can begin directly.

[0082] Through the above steps, the posture adjustment of a batch of DUTs can be completed at the pre-alignment station so that testing can be started at the test station. This improves the utilization efficiency of the test station equipment and the detection efficiency of the NED equipment, reduces test time, and improves production efficiency.

[0083] The above solution provided by this application can improve test efficiency: by completing the posture adjustment of a batch of DUTs at the pre-alignment station, and then transferring the DUTs directly to the test station to start testing directly, this can significantly improve test efficiency, reduce production costs, increase the overall throughput of the production line, and achieve more efficient NED equipment production. Simplify the test process: Since the reference planes of the pre-installation station and the test station are consistent, and the positions of the pre-alignment camera and the test camera are consistent, after the alignment is completed at the pre-installation station, the DUT can be directly transferred to the test station without adjusting the test camera again, which greatly simplifies the test process.

[0084] Due to the advanced nature of the technical solution provided by this application, it can be widely used in application fields such as NED equipment manufacturing, optical inspection equipment research and development, and production efficiency optimization. With the development of technologies such as VR and AR, the demand for NED equipment is increasing, and efficient testing methods and equipment are the key to ensuring product quality and output. The solution provided by this application is particularly suitable for manufacturers who need to quickly and mass-produce NED products. With the continuous development and popularization of AR, VR, and MR technologies, the efficient and accurate testing method provided by this application will become an important tool for market competitiveness, helping manufacturers improve production efficiency, shorten product time to market, and enhance market competitiveness. Therefore, this application has broad market prospects and application needs.

[0085] Figure 4 This is a method flow chart of a NED device detection device provided by an embodiment of the present application; Figure 4 As shown, the following steps are included:

[0086] Step S101: Using a first station to carry a first test device and a NED device to be tested, so as to adjust the posture of the NED device to be tested relative to the first test device at the first station according to a preset test alignment requirement, and obtain posture parameters of the NED device when the preset test alignment requirement is met;

[0087] Step S102: Use the second workstation to carry the second test device and the NED device after the posture is adjusted at the first workstation, so as to adjust the posture of the NED device at the second workstation according to the posture parameters, so that the second test device obtains the screen displayed by the NED device after the posture is adjusted at the second workstation, thereby realizing the detection of the NED device; the position of the second test device at the second workstation is consistent with the position of the first test device at the first workstation, and the position refers to the relative position of the test device and the NED device on the same workstation.

[0088] It should be understood that the above method is used to execute the scheme in the above device embodiment. The corresponding steps in the method, their implementation principles and technical effects are similar to those described in the above device. The implementation process of the method can refer to the corresponding introduction in the above device, and will not be repeated here.

[0089] It should be understood that expressions such as "include" and "may include" used in this application indicate the existence of the disclosed functions, operations, or constituent elements, and do not limit one or more additional functions, operations, and constituent elements. In this application, terms such as "include" and / or "have" may be interpreted as indicating specific characteristics, numbers, operations, constituent elements, components, or combinations thereof, but may not be interpreted as excluding the existence or possibility of adding one or more other characteristics, numbers, operations, constituent elements, components, or combinations thereof.

[0090] In addition, in this application, the expression "and / or" includes any and all combinations of the associated listed words. For example, the expression "A and / or B" may include A, may include B, or may include both A and B.

[0091] In the description of the embodiments of the present application, it should be noted that, unless otherwise clearly specified and limited, the term "connection" should be understood in a broad sense. For example, "connection" can be a detachable connection or a non-detachable connection; it can be a direct connection or an indirect connection through an intermediate medium. Among them, "fixed connection" means that the two are connected to each other and the relative position relationship after the connection remains unchanged. "Rotational connection" means that the two are connected to each other and can rotate relative to each other after the connection. "Sliding connection" means that the two are connected to each other and can slide relative to each other after the connection. The directional terms mentioned in the embodiments of the present application, such as "top", "bottom", "inside", "outside", "left", "right", etc., are only reference to the directions of the accompanying drawings. Therefore, the directional terms used are for better and clearer explanation and understanding of the embodiments of the present application, rather than indicating or implying that the device or element referred to must have a specific orientation, be constructed and operated in a specific orientation, and therefore cannot be understood as a limitation on the embodiments of the present application.

[0092] In addition, in the embodiments of the present application, the mathematical concepts mentioned include symmetry, equality, parallelism, and perpendicularity. These limitations are all for the current state of the art, rather than being absolutely strict definitions in a mathematical sense. A small amount of deviation is allowed, and it is possible to be approximately symmetric, approximately equal, approximately parallel, or approximately perpendicular. For example, A and B are parallel, which means that A and B are parallel or approximately parallel, and the angle between A and B can be between 0 and 10 degrees. A and B are perpendicular, which means that A and B are perpendicular or approximately perpendicular, and the angle between A and B can be between 80 and 100 degrees.

[0093] It will be understood that the various numerical numbers involved in the embodiments of the present application are merely distinctions for the convenience of description and are not intended to limit the scope of the embodiments of the present application.

[0094] It is easy for those skilled in the art to understand that the above is only a preferred embodiment of the present application and is not intended to limit the present application. Any modifications, equivalent substitutions and improvements made within the spirit and principles of the present application should be included in the scope of protection of the present application.

Claims

1. A detection device for a near-eye display (NED) device, characterized in that: include: at least one first station and at least one second station; The first station is used to carry the first test device and the NED device to be tested, so as to adjust the posture of the NED device to be tested relative to the first test device at the first station according to the preset test alignment requirements, and obtain the posture parameters of the NED device when the preset test alignment requirements are met; The second station is used to carry a second test device and the NED device after the posture is adjusted at the first station, so as to adjust the posture of the NED device at the second station according to the posture parameter, so that the second test device can obtain the image displayed by the NED device after the posture is adjusted at the second station, thereby realizing the detection of the NED device; the position of the second test device at the second station is consistent with the position of the first test device at the first station, and the position refers to the relative position of the test device and the NED device at the same station; The position of the second test device at the second station is consistent with the position of the first test device at the first station, including: The first test device and the second test device both include an optical lens, and a diaphragm is provided at the front end of the optical lens; The position of the aperture of the second testing device at the second station is consistent with the position of the aperture of the first testing device at the first station; The reference planes of the first workstation and the second workstation are consistent.

2. The device according to claim 1, characterized in that At least one first workstation includes: a carrier and a first carrier base; The carrier is used to carry the NED device; The first carrier base is used to support the carrier and adjust the carrier's posture according to the preset test alignment requirements; After the NED device completes posture adjustment at the first station, it is moved to the second station and is carried and moved synchronously by the carrier.

3. The device according to claim 1, characterized in that The at least one first station comprises: a carrier; The carrier is used to carry the NED device, so that the posture of the NED device can be adjusted according to the preset test alignment requirements through the carrier; After the NED device completes posture adjustment at the first station, it is moved to the second station and is carried and moved synchronously by the carrier.

4. The device according to claim 2, characterized in that The at least one second station includes: a second stage base; The second carrier base is used to carry the carrier carrying the NED device transferred from the first workstation, so as to adjust the posture of the transferred carrier according to the posture parameters.

5. A method for detecting a near-eye display (NED) device, characterized in that: include: A first test device and an NED device to be tested are carried on a first workstation, so that a posture of the NED device to be tested relative to the first test device is adjusted at the first workstation according to a preset test alignment requirement, and posture parameters of the NED device are obtained when the preset test alignment requirement is met; A second test device and the NED device after the posture adjustment at the first workstation are carried on the second workstation, so that the posture of the NED device at the second workstation is adjusted according to the posture parameters, so that the second test device obtains an image displayed by the NED device after the posture adjustment at the second workstation, thereby realizing testing of the NED device; the position of the second test device at the second workstation is consistent with the position of the first test device at the first workstation, and the position refers to the relative position of the test device and the NED device at the same workstation; The position of the second test device at the second station is consistent with the position of the first test device at the first station, including: The first test device and the second test device both include an optical lens, and a diaphragm is provided at the front end of the optical lens; The position of the aperture of the second testing device at the second station is consistent with the position of the aperture of the first testing device at the first station; The reference planes of the first workstation and the second workstation are consistent.

6. The method according to claim 5, characterized in that The first station and the second station carry the NED device via a carrier, and the posture of the NED device is adjusted via the carrier or the carrier base; when the NED device is transferred from the first station to the second station, it is carried and moved synchronously by the corresponding carrier.

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