Method for obtaining and displaying error address information, testing equipment and electronic equipment

Abstract

The present application discloses a method for acquiring and displaying error address information, a test device, and an electronic device. In response to a data read request for error address test data, a specified address range included in the data read request is acquired, and the data read request is used to indicate reading target test data corresponding to the specified address range from the error address test data of an object to be tested; based on the relationship between the specified address range and the display address range, a target data type of the target test data is determined, and the target data type includes a compressed data type and an original data type; based on the target data type, a data acquisition request is sent to a lower computer of the test device, and target test data of the target data type is acquired from the lower computer of the test device; based on the target test data of the target data type, error address information corresponding to the target test data of the target data type is displayed on a user interaction interface, thereby improving the acquisition and display efficiency of the error address information.

Description

Technical Field

[0001] The present disclosure relates to chip testing technology and computer technology, and in particular to a method for obtaining and displaying error address information, a testing device and an electronic device. Background Art

[0002] With the development of electronic technology, the speed of electronic equipment replacement is getting faster and faster, the demand for memory chips is also increasing, and higher requirements are put forward for the storage space of memory chips, making the design complexity of memory chips higher and higher. As a result, the requirements for memory chip testing equipment are also getting higher and higher. The test of memory chips not only requires the input and output test of conventional digital chips, but also the test of the storage address of the internal space of the memory chip to detect whether there are damaged error address bits in the storage space, so as to facilitate the later repair of damaged storage addresses and the analysis of the reasons for storage address failure. Therefore, a test tool is needed to obtain and display the error address test data in the internal space of the memory chip. Summary of the invention

[0003] The present application provides a method for acquiring and displaying error address information, a test device, and an electronic device to improve the efficiency of acquiring and displaying error address information.

[0004] In one aspect of the present application, a method for obtaining and displaying error address information is provided, comprising:

[0005] In response to a data read request for error address test data, obtaining a specified address range included in the data read request, wherein the data read request is used to instruct to read target test data corresponding to the specified address range from error address test data of an object to be tested, wherein the error address test data is test data obtained by performing an error address test on a storage space of the object to be tested;

[0006] Determining a target data type of the target test data based on a relationship between the specified address range and a display address range, wherein the display address range is an address range allowed to be displayed on a user interaction interface, and the target data type includes a compressed data type and an original data type;

[0007] Based on the target data type, sending a data acquisition request to the lower computer of the test device, and acquiring target test data of the target data type from the lower computer of the test device;

[0008] Based on the target test data of the target data type, error address information corresponding to the target test data of the target data type is displayed on the user interaction interface.

[0009] Another aspect of the present application provides a test device, including a host computer and at least one slave computer, wherein the host computer includes an acquisition and display device for error address information;

[0010] The device for acquiring and displaying error address information is used to respond to a data read request for error address test data, acquire a specified address range included in the data read request, the data read request is used to instruct to read target test data corresponding to the specified address range from the error address test data corresponding to the object to be tested, the error address test data is test data obtained by performing an error address test on the storage space of the object to be tested; based on the relationship between the specified address range and the display address range, determine the target data type of the target test data, the display address range is the address range allowed to be displayed on the user interaction interface, and the target data type includes a compressed data type and an original data type; based on the target data type, send a data acquisition request to a target lower computer, the target lower computer is a lower computer that tests the object to be tested; receive target test data of the target data type sent by the target lower computer, and based on the target test data of the target data type, display the error address information corresponding to the target test data of the target data type on the user interaction interface;

[0011] The target lower computer is used to send target test data of the target data type to the acquisition and display device of the error address information according to the data acquisition request.

[0012] Another aspect of the present application provides an electronic device, including:

[0013] Memory for storing computer programs;

[0014] The processor is used to execute the computer program stored in the memory, and when the computer program is executed, the method for obtaining and displaying the error address information described in any of the above embodiments of the present disclosure is implemented.

[0015] Another aspect of the present application provides a computer-readable storage medium having a computer program stored thereon, which, when executed by a processor, implements the method for obtaining and displaying error address information described in any of the above embodiments of the present disclosure.

[0016] Another aspect of the present application provides a computer program product, including a computer program, which, when executed by a processor, implements the method for obtaining and displaying error address information described in any of the above embodiments of the present disclosure.

[0017] In the present application, upon receiving a data read request for test data obtained by performing an error address test on the storage space of the object to be tested, the upper computer of the test device can obtain the specified address range to be read according to the data read request, and determine the target data type of the target test data corresponding to the specified address range based on the relationship between the specified address range and the display address range, and send a data acquisition request to the lower computer of the test device based on the target data type to obtain the target test data from the lower computer of the test device. That is, according to the relationship between the specified address range requested to be read and the address range allowed to be displayed on the user interaction interface, it is determined to obtain compressed target test data or obtain original target test data so that the lower computer of the test device provides target test data of the corresponding target data type. The error address test data of the object to be tested is obtained from the lower computer of the test device in a manner combining the original data and the compressed data, rather than directly reading and obtaining the error address test data of the object to be tested. This helps to reduce the time overhead of data reading and can improve the efficiency of obtaining and displaying error address information.

[0018] The technical solution of the present disclosure is further described in detail below through the accompanying drawings and embodiments. BRIEF DESCRIPTION OF THE DRAWINGS

[0019] The accompanying drawings, which constitute a part of the specification, illustrate embodiments of the present disclosure and, together with the description, serve to explain the principles of the present disclosure.

[0020] The present disclosure may be more clearly understood from the following detailed description with reference to the accompanying drawings, in which:

[0021] Figure 1 A schematic diagram of the structure of a testing device provided for an exemplary embodiment of the present disclosure;

[0022] Figure 2 A structural schematic diagram of a testing device provided for another exemplary embodiment of the present disclosure;

[0023] Figure 3 A flowchart of a method for obtaining and displaying error address information provided by an exemplary embodiment of the present disclosure;

[0024] Figure 4 A flowchart of a method for obtaining and displaying error address information provided by another exemplary embodiment of the present disclosure;

[0025] Figure 5 A flowchart of a method for obtaining and displaying error address information provided by another exemplary embodiment of the present disclosure;

[0026] Figure 6 A schematic diagram of the interaction between a host computer and a target slave computer during the acquisition and display of error address information provided by an exemplary embodiment of the present disclosure;

[0027] Figure 7 A schematic diagram of interaction between a host computer and a target slave computer during the acquisition and display of error address information provided by another exemplary embodiment of the present disclosure;

[0028] Figure 8 A schematic diagram of the interaction between a host computer and a target slave computer during a test process provided by an exemplary embodiment of the present disclosure;

[0029] Fig. 9 A flowchart of a method for obtaining and displaying error address information in an online mode provided by an exemplary embodiment of the present disclosure;

[0030] Fig.10 A flowchart of a method for obtaining and displaying error address information in an offline mode provided by an exemplary embodiment of the present disclosure;

[0031] Fig.11 is a structural diagram of a device for acquiring and displaying error address information provided by an exemplary embodiment of the present disclosure;

[0032] Fig.12 It is a schematic diagram of the structure of an electronic device provided by an exemplary embodiment of the present disclosure.

[0033] The reference numerals are as follows:

[0034] Upper computer-10; lower computer-20; acquisition and display device of error address information-101; target lower computer-201; user interaction unit-1011; test service unit-1013; target test engine-2011; target hardware driver unit-2013; target test board-2015. DETAILED DESCRIPTION

[0035] Various exemplary embodiments of the present disclosure will now be described in detail with reference to the accompanying drawings. It should be noted that the relative arrangement of components and steps, numerical expressions and numerical values ​​set forth in these embodiments do not limit the scope of the present disclosure unless otherwise specifically stated.

[0036] The embodiments of the present disclosure can be applied to electronic devices such as terminal devices, computer systems, servers, etc., which can operate with many other general or special computing system environments or configurations. Examples of well-known terminal devices, computing systems, environments and / or configurations suitable for use with electronic devices such as terminal devices, computer systems, servers, etc. include, but are not limited to: personal computer systems, server computer systems, thin clients, thick clients, handheld or laptop devices, microprocessor-based systems, set-top boxes, programmable consumer electronics, network personal computers, small computer systems, large computer systems, and distributed cloud computing technology environments including any of the above systems, etc.

[0037] Electronic devices such as terminal devices, computer systems, servers, etc. can be described in the general context of computer system executable instructions (such as program modules) executed by computer systems. Generally, program modules can include routines, programs, object programs, components, logic, data structures, etc., which perform specific tasks or implement specific abstract data types. Computer systems / servers can be implemented in distributed cloud computing environments, where tasks are performed by remote processing devices linked through a communication network. In a distributed cloud computing environment, program modules can be located on local or remote computing system storage media including storage devices.

[0038] The error address information acquisition and display tool (also referred to as the error address information acquisition and display device in the present disclosure) is used to display the error address test data obtained by the test equipment through the error address test on the storage space of the object to be tested in the form of a bitmap on the user interaction interface, so that the user can intuitively view the error address distribution of the object to be tested through the bitmap.

[0039] In the related art, when displaying the error address information corresponding to the error address test data, the tool for acquiring and displaying the error address information reads and displays all the error address test data obtained through the test. However, the error address test data obtained through the test may contain a large amount of data, and the time overhead caused by reading all the data is relatively large, so that the tool for acquiring and displaying the error address information takes a long time to read and display the error address test data, resulting in low efficiency.

[0040] Figure 1 A schematic diagram of the structure of a test device provided by an exemplary embodiment of the present disclosure. The test device of the embodiment of the present disclosure can be used to perform semiconductor testing on a device under test (DUT), wherein the DUT may include a wafer, a chip, etc. In the present disclosure, the device under test is also referred to as an object to be tested. Figure 1 As shown, the testing device includes a host computer 10 and at least one slave computer 20 .

[0041] The upper computer 10 runs an acquisition and display device 101 for error address information, which is used to acquire error address test data of the object to be tested from the lower computer 20 of the test equipment, and display the error address information corresponding to the acquired error address test data on the user interaction interface. Specifically, the acquisition and display device 101 for error address information is used to respond to a data read request for the error address test data, acquire the specified address range included in the data read request, the data read request is used to indicate to read the target test data corresponding to the specified address range from the error address test data corresponding to the object to be tested, the error address test data is the test data obtained by performing an error address test on the storage space of the object to be tested; based on the relationship between the specified address range and the display address range, determine the target data type of the target test data, the display address range is the address range allowed to be displayed on the user interaction interface, and the target data type includes a compressed data type and an original data type; based on the target data type, send a data acquisition request to the target lower computer, the target lower computer is the lower computer that tests the object to be tested; receive the target test data of the target data type sent by the target lower computer, and based on the target test data of the target data type, display the error address information corresponding to the target test data of the target data type on the user interaction interface.

[0042] Different lower computers in at least one lower computer 20 execute test processes for different objects to be tested. When the acquisition and display device 101 of error address information needs to acquire error address test data of the object to be tested, it is necessary to determine the target lower computer 201 for testing the object to be tested, and read the error address test data of the object to be tested from the target lower computer 201. Specifically, the target lower computer 201 is used to send target test data of a target data type to the acquisition and display device 101 of error address information according to the data acquisition request.

[0043] Figure 2A schematic diagram of the structure of a test device provided for another exemplary embodiment of the present disclosure. The device 101 for acquiring and displaying error address information includes a front-end user interaction unit 1011 and a back-end test service unit 1013. The user interaction unit 1011 is used to provide a user interaction interface with which a user can interact, and the user interaction interface is used to display the error address information corresponding to the read error address test data. The user interaction unit 1011 is also used to send a user instruction triggered by the user in the user interaction interface to the test service unit 1013, so that the test service unit 1013 controls the lower computer 20 to perform the operation corresponding to the user instruction based on the user instruction. In the disclosed embodiment, the user instruction may be a data read request. When the user interaction unit 1011 receives the data read request, the user interaction unit 1011 sends the data read request to the back-end test service unit 1013. The test service unit 1013 sends a data acquisition request to the target lower computer 201 to obtain target test data of the target data type from the target lower computer 201, that is, the test service unit 1013 obtains the specified address range from the data read request, determines the target data type of the target test data based on the relationship between the specified address range and the display address range, and then sends a data acquisition request containing the target data type to obtain the target test data of the target data type from the target lower computer 201; after reading the target test data, error address information is generated based on the target test data of the target data type, and the error address information is sent to the user interaction unit 1011 for display by the user interaction unit 1011 in the user interaction interface.

[0044] The lower computer 20 includes a test engine (TestEngine), a hardware driver unit (Driver) and a test board.

[0045] The test engine is used to receive a data acquisition request and transmit the data acquisition request to the hardware driver unit, so that the hardware driver unit obtains target test data of the target data type from the test board. Figure 2 As shown, the target lower computer 201 includes a target test engine 2011, a target hardware driver unit 2013 and a target test board 2015. In the disclosed embodiment, the target test engine 2011 receives the data acquisition request sent by the test service unit 1013 and transmits it to the target hardware driver unit 2013, the target hardware driver unit 2013 calls the data acquisition interface, and transmits the data acquisition request to the target test board 2015. After receiving the data acquisition request, the target test board 2015 operates on the target data in the specified address range to obtain target test data of the target data type, and transmits the target test data of the target data type to the target hardware driver unit 2013 through the data acquisition interface called by the target hardware driver unit 2013. The target test engine 2011 transmits the target test data of the target data type to the test service unit 1013.

[0046] Of course, it is known to those skilled in the art that, for a data acquisition request containing a target data type, the acquisition of the target test data can be realized by the test board, or it can be realized by the hardware driver unit after acquiring the test data transmitted by the test board, that is, the test board transmits the target test data of the target data type to the hardware driver unit, or the hardware driver unit processes the original target test data transmitted by the test board to obtain the target test data of the target data type. Specifically, in another embodiment, the target test engine 2011 receives the data acquisition request sent by the test service unit 1013 and transmits it to the target hardware driver unit 2013. After the target hardware driver unit 2013 calls the data acquisition interface to receive the original target test data transmitted by the target test board 2015, it acquires the target test data of the target data type based on the data acquisition request and transmits it to the target test engine 2011; the target test engine 2011 feeds back the target test data of the target data type to the test service unit 1013. In the disclosed embodiment, the device for acquiring and displaying error address information running on the upper computer can determine the target data type of the target test data to be read based on the relationship between the specified address range and the display address range in the data read request, so that the target lower computer provides target test data of the target data type instead of directly reading the target test data in the target lower computer, which can reduce the time overhead of data reading and help improve the efficiency of acquiring and displaying error address information.

[0047] In addition, the apparatus for obtaining and displaying error address information in the embodiment of the present disclosure is implemented based on a front-end and back-end separated architecture, and the user interaction unit and the test service unit are designed in layers, which facilitates the distributed deployment of the apparatus for obtaining and displaying error address information.

[0048] Figure 3 A flowchart of a method for obtaining and displaying error address information provided by an exemplary embodiment of the present disclosure, the method is used for the host computer 10 of the test device as described above, and is specifically used for the device 101 for obtaining and displaying error address information in the host computer 10, such as Figure 3 As shown, the method of this embodiment includes:

[0049] Step 310 , in response to a data read request for error address test data, obtaining a specified address range included in the data read request.

[0050] The data read request is used to instruct to read target test data corresponding to a specified address range from the error address test data of the object to be tested. The error address test data is test data obtained by performing an error address test on the storage space of the object to be tested.

[0051] Optionally, the error address test data is stored in the error address storage space (Address fail memory, AFM) and the compressed error address storage space (Compress fail memory, CFM) of the test board of the lower computer. The error address test data stored in the AFM space is the original test data obtained by testing the object to be tested, and the error address test data stored in the CFM space is the compressed test data after compressing the test data obtained by testing the object to be tested.

[0052] In a possible implementation, the method for obtaining and displaying error address information provided in the embodiment of the present disclosure is used to obtain error address test data stored in the AFM space. Since the AFM space stores original test data, the amount of original test data is large. If all test data are directly read from the AFM space according to the data read request and then the test data corresponding to the data read request is displayed, it will take a long time. In order to reduce the time overhead of data reading, the embodiment of the present disclosure provides a method for obtaining and displaying error address information, first determining the target data type of the target test data to be read, and then obtaining the target test data of the target data type from the target lower computer based on the target data type.

[0053] Optionally, a data read request for the error address test data may be generated according to an access parameter to the AFM space, the access parameter to the AFM space includes a specified address range, and the access parameter to the AFM space indicates to read target test data corresponding to the specified address range from the AFM space. When a data read request for the error address test data is received, the specified address range in the data read request is obtained to determine the target data type of the target test data to be read according to the specified address range.

[0054] Step 320 , determining the target data type of the target test data based on the relationship between the specified address range and the display address range.

[0055] The display address range is the address range allowed to be displayed on the user interaction interface, specifically the address range corresponding to the number of data points allowed to be displayed, and is also the maximum address range that can be displayed on the user interaction interface. The target data type includes a compressed data type and an original data type. The number of data points that can be displayed on the user interaction interface is limited. In a possible implementation, the target data type of the target test data can be determined based on the size relationship between the specified address range requested to be read and the display address range allowed to be displayed on the user interaction interface, that is, it is determined to read the original target test data or to read the compressed target test data.

[0056] Step 330 , based on the target data type, a data acquisition request is sent to the lower computer of the test device, and target test data of the target data type is acquired from the lower computer of the test device.

[0057] After the target data type is determined, a data acquisition request for acquiring target test data of the target data type is sent to the lower computer of the test device, so as to acquire the target test data of the target data type from the lower computer of the test device (the target lower computer corresponding to the object to be tested). The target lower computer can provide the corresponding target test data according to the data acquisition request.

[0058] Optionally, when the target data type is the original data type, a request for obtaining original data is sent to the lower computer of the test device to obtain the original target test data from the target lower computer, wherein the original target test data refers to the test data without compression of the target test data. When the target data type is the compressed data type, a request for obtaining compressed data is sent to the lower computer of the test device to obtain the compressed target test data (also called target compressed data) from the target lower computer.

[0059] In this embodiment, when the target data type is a compressed data type, based on a data acquisition request, the target lower computer obtains the original target test data from the error address storage space, i.e., the AFM space, compresses the target test data, and provides the compressed target test data to the upper computer.

[0060] Step 340 , based on the target test data of the target data type, display error address information corresponding to the target test data of the target data type on the user interaction interface.

[0061] In a possible implementation, the above steps 310 to 330 may be executed by the test service unit 1013 of the error address information acquisition and display device 101. After the test service unit 1013 acquires the target test data of the target data type from the target lower computer, the target test data of the target data type may be processed to obtain the error address information that may be displayed on the user interaction interface, and the error address information may be sent to the user interaction unit 1011 so that the user interaction unit 1011 displays the error address information on the user interaction interface.

[0062] Optionally, the error address information includes at least one of an error address list, an error address bitmap, and a test status view (the test status includes a Pass / Fail status, wherein the Pass status indicates that the address test has passed, and the Fail status indicates that the address test has not passed, and also indicates that the tested address is an error address). Among them, the error address list contains detailed error addresses within the specified address range, and location information corresponding to the detailed error addresses. The error address bitmap is a two-dimensional matrix bitmap, which contains test result values ​​corresponding to all addresses within the specified address range. Optionally, the test result value may include a value representing the Pass status or a value representing the Fail status. Schematically, the test result value may be "0" or "1", which are used to represent the Pass status and the Fail status, respectively. The error address bitmap can intuitively display the error addresses in the specified address range and the location information of the error addresses. The test status view can represent the test results corresponding to the specified address range as a whole. When the target test data indicates that there is no address test result in the Fail status among all the address test results in the specified address range, the test status indicated by the test status view is the Pass status. When the target test data indicates that there is an address test result in the Fail status among all the address test results in the specified address range, the test status indicated by the test status view is the Fail status.

[0063] In the disclosed embodiment, upon receiving a data read request for test data obtained by performing an error address test on the storage space of the object to be tested, the upper computer of the test device can obtain the specified address range to be read according to the data read request, determine the target data type of the target test data corresponding to the specified address range based on the relationship between the specified address range and the display address range, send a data acquisition request to the lower computer of the test device based on the target data type, and obtain the target test data from the lower computer of the test device, that is, determine to obtain compressed target test data or obtain original target test data based on the relationship between the specified address range requested to be read and the address range allowed to be displayed on the user interaction interface, so that the lower computer of the test device provides target test data of the corresponding target data type, and obtain the error address test data of the object to be tested from the lower computer of the test device by combining the original data and the compressed data, rather than directly reading and obtaining the error address test data of the object to be tested, thereby reducing the time overhead of data reading and improving the efficiency of obtaining and displaying error address information.

[0064] Figure 4 A flowchart of a method for obtaining and displaying error address information provided by another exemplary embodiment of the present disclosure, the method is used for the host computer 10 of the test device as described above, and is specifically used for the device 101 for obtaining and displaying error address information in the host computer 10, such as Figure 4 As shown, the method of this embodiment includes:

[0065] Step 410 , in response to a data read request for error address test data, obtaining a specified address range included in the data read request.

[0066] The implementation of step 410 may refer to the above step 310, and will not be described in detail in this embodiment.

[0067] Step 420, in response to the specified address range being larger than the displayed address range, determining that the target data type is a compressed data type.

[0068] In the case where the specified address range requested to be read is larger than the display address range allowed to be displayed on the user interaction interface, the target test data corresponding to the specified address range has a large amount of data and takes a long time to read directly. Therefore, the compressed target test data can be read to reduce the data reading time. That is, in response to the specified address range being larger than the display address range, it is determined to read the target test data of the compressed data type from the target lower computer.

[0069] Step 430: In response to the target data type being a compressed data type, a compressed data acquisition request is sent to a lower computer of the test device.

[0070] When it is determined that the target data type is a compressed data type, a compressed data acquisition request is sent to the target lower computer so that the target lower computer provides target compressed data obtained by compressing the target test data.

[0071] Specifically, the target compressed data obtained by compressing the target test data may be a target hardware driver unit or a target test board of a target slave computer.

[0072] In a possible implementation, a compressed data acquisition request is sent to a target test engine of a target lower computer. The target test engine responds to the compressed data acquisition request and transmits the compressed data acquisition request to a target hardware driver unit of the target lower computer. The target hardware driver unit responds to the compressed data acquisition request and calls a compressed data acquisition interface to acquire target compressed data obtained by compressing the target test data transmitted by the target test board of the target lower computer, and sends the target compressed data to an acquisition and display device for error address information. Specifically, the target hardware driver unit calls the compressed data acquisition interface to transmit the compressed data acquisition request to the target test board. The target test board receives the compressed data acquisition request, compresses the original target test data to obtain the target compressed data, and transmits the target compressed data to the target hardware driver unit via the compressed data acquisition interface.

[0073] Optionally, the target hardware driver unit is provided with data acquisition interfaces corresponding to different data types. When the target hardware driver unit receives a compressed data acquisition request, the compressed data acquisition interface corresponding to the compressed data type is called to acquire the target compressed data from the target test board.

[0074] In another possible implementation, a compressed data acquisition request is sent to a target test engine of a target lower computer. The target test engine transmits the compressed data acquisition request to a target hardware driver unit of the target lower computer in response to the compressed data acquisition request. The target hardware driver unit calls an original data acquisition interface to acquire the original target test data transmitted by the target test board of the target lower computer, and performs data compression on the original target test data to obtain target compressed data, so as to send the target compressed data to an acquisition and display device for error address information. During this process, the target test board receives the compressed data acquisition request and transmits the original target test data to the target hardware driver unit.

[0075] In a possible implementation manner, the process of the acquisition and display device of the error address information sending a compressed data acquisition request further includes the following steps 4301-4303:

[0076] Step 4301, determine the compression ratio parameter based on the specified address range and the display address range.

[0077] When the target data type is determined to be a compressed data type, a compression ratio parameter for compressing the target test data needs to be determined. In a possible implementation, the compression ratio parameter can be determined based on the ratio between the specified address range and the display address range, and the specified address range can be compressed into the display address range.

[0078] Step 4303, sending a compressed data acquisition request including a compression ratio parameter and a specified address range to the lower computer of the test device, so that the lower computer of the test device compresses the target test data according to the compression ratio parameter to obtain target compressed data.

[0079] In a possible implementation, taking the target test board performing data compression on the original target test data as an example, a compressed data acquisition request is generated according to a determined compression ratio parameter and a specified address range, wherein the compression ratio parameter and the specified address range in the compressed data acquisition request are parameters recognizable by the target test board in the target lower computer, so that the target test board can perform data compression on the target test data in the specified address range according to the compression ratio parameter.

[0080] After generating a compressed data acquisition request, a compressed data acquisition request including a compression ratio parameter and a specified address range can be sent to a target test engine. After receiving the compressed data acquisition request, the target test engine transmits the compressed data acquisition request to the target hardware driver unit, and the target hardware driver unit calls a compressed data acquisition interface to send a compressed data read request including a compression ratio parameter and a specified address range to the target test board. The target test board receives the compressed data read request, reads the original target test data, and compresses the original target test data based on the compression ratio parameter to obtain target compressed data; sends the target compressed data to the target hardware driver unit through the compressed data acquisition interface, and the target hardware driver unit transmits the target compressed data to the target test engine, and the target test engine sends the target compressed data to the acquisition and display device of the error address information.

[0081] In another possible implementation, after receiving the compressed data acquisition request, the target hardware driver unit obtains the original target test data from the target test board. After receiving the original target test data transmitted by the target test board, the original target test data is compressed based on the compression ratio parameter to obtain target compressed data, which is then transmitted to the target test engine.

[0082] Step 440, receiving target compressed data sent by the lower computer of the test device after compressing the target test data.

[0083] Receive target compressed data sent by a target test engine in a target lower computer, and then perform data processing on the target compressed data to obtain error address information.

[0084] Step 450: Display error address information corresponding to the target test data in a first display format on the user interaction interface.

[0085] Optionally, the first display form includes at least one of a thumbnail matrix bitmap form and a test status view. In a possible implementation, the error address information may be an error address bitmap, and the target compressed data is converted into an error address bitmap and displayed on the user interaction interface. Optionally, when the target data type is a compressed data type, the acquired data is the target compressed data after the target test data is compressed, and after processing the target compressed data, a thumbnail matrix bitmap corresponding to the specified address range can be obtained, and the error address information corresponding to the target test data is displayed in the form of a thumbnail matrix bitmap on the user interaction interface.

[0086] In a possible implementation, the test service unit may obtain the target compressed data from the target lower computer, that is, execute steps 410-440. After obtaining the target compressed data, the target compressed data is processed to obtain a corresponding thumbnail matrix bitmap, and the thumbnail matrix bitmap is sent to the user interaction unit. The user interaction unit then displays the thumbnail matrix bitmap corresponding to the target compressed data on the user interaction interface.

[0087] In another possible implementation, after the test service unit obtains the target compressed data, it can also generate a test status view based on the target compressed data, and send the test status view to the user interaction unit. The user interaction unit displays the test status view corresponding to the target compressed data on the user interaction interface, and the test status view is used to indicate the overall test results of the specified address range.

[0088] Step 460 , in response to a request to view a local matrix bitmap in a thumbnail matrix bitmap of target test data, obtain a detailed address range indicated by the viewing request.

[0089] When the first display form is a thumbnail matrix bitmap form, after displaying the thumbnail matrix bitmap corresponding to the target compressed data on the user interaction interface, the local matrix bitmap in the thumbnail matrix bitmap can also be enlarged to view the detailed error address test data corresponding to the local matrix bitmap.

[0090] In a possible implementation, a user can select a local matrix bitmap in a thumbnail matrix bitmap, and trigger a viewing request for the local matrix bitmap by zooming in on the local matrix bitmap. The test service unit obtains a detailed address range corresponding to the viewing request based on the viewing request, and the detailed address range belongs to the specified address range.

[0091] In another possible implementation, the user may also trigger a request to view the local matrix bitmap by configuring the address range, and obtain the detailed address range indicated by the viewing request, that is, obtain the detailed address range configured by the user.

[0092] Step 470: when the detailed address range is smaller than the display address range, obtain detailed test data of the detailed address range, and display the enlarged local matrix bitmap on the user interaction interface based on the detailed test data.

[0093] In the case where the detailed address range is smaller than the display address range, the user interaction interface may display detailed error address information of the detailed test data corresponding to the detailed address range. In response to the detailed address range being smaller than the display address range, the detailed test data of the detailed address range may be obtained from the target compressed data. Alternatively, in another possible implementation, the detailed test data may also be read from the target lower computer.

[0094] After obtaining the detailed test data, the error address information corresponding to the detailed test data can be displayed in the form of a detailed matrix bitmap on the user interaction interface. The detailed matrix bitmap corresponding to the detailed test data is the enlarged local matrix bitmap.

[0095] Step 480, when the detailed address range is larger than the display address range, determine the compression ratio parameter based on the detailed address range and the display address range; send a compression data acquisition request including the compression ratio parameter and the detailed address range to the lower computer of the test device to acquire the target compressed data of the detailed address range; based on the target compressed data, display the enlarged local matrix bitmap on the user interaction interface.

[0096] In the case where the detailed address range is larger than the display address range, it is necessary to redetermine the compression ratio parameter based on the detailed address range and the actual address range, and send a compressed data acquisition request including the compression ratio parameter and the detailed address range to the target lower computer. After receiving the compressed data acquisition request, the target lower computer acquires the target compressed data obtained by compressing the test data in the detailed address range, and transmits the target compressed data in the detailed address range to the acquisition and display device of the error address information. The acquisition and display device of the error address information displays the enlarged local matrix bitmap on the user interaction interface based on the target compressed data in the detailed address range. In the disclosed embodiment, in the case where the specified address range is larger than the display address range, the target test data of the compressed data type is acquired. When acquiring the target test data of the compressed data type, the compression ratio parameter and the specified address range are sent to the target test board of the lower computer, so that the target test board can compress the target test data according to the compression ratio parameter, and provide the compressed target test data, thereby reducing the amount of data transmission, reducing the data reading time, and helping to improve the efficiency of acquiring and displaying the error address information corresponding to the specified address range. In addition, after displaying the thumbnail matrix bitmap corresponding to the target compressed data, the user can also view the local matrix bitmap therein, and by viewing the detailed local matrix bitmap, the error address information corresponding to the detailed address range can be obtained, which is convenient for the user to view. Of course, after the target hardware driver unit receives the compressed data acquisition request including the compression ratio parameter and the specified address range, the original target test data can be obtained from the target test board. After receiving the original target test data transmitted by the target test board, the original target test data is compressed based on the compression ratio parameter to obtain the target compressed data.

[0097] Figure 5 A flowchart of a method for obtaining and displaying error address information provided by another exemplary embodiment of the present disclosure, the method is used for the host computer 10 of the test device as above, and specifically for the device 101 for obtaining and displaying error address information in the host computer 10, as shown in FIG. Figure 5 As shown, the method of this embodiment includes:

[0098] Step 510 , in response to a data read request for error address test data, obtaining a specified address range included in the data read request.

[0099] The implementation of step 510 may refer to the above step 310 and will not be described in detail here.

[0100] Step 520 , in response to the designated address range being less than or equal to the display address range, determining that the target data type is a primitive data type.

[0101] In the case where the specified address range requested to be read is less than or equal to the display address range allowed to be displayed on the user interaction interface, the data volume of the target test data corresponding to the specified address range is small, and the error address information corresponding to the target test data can be directly displayed on the user interaction interface, so the original target test data can be directly read. That is, in response to the specified address range being less than or equal to the display address range, it is determined to read the target test data of the original data type from the target lower computer.

[0102] Step 530 : In response to the target data type being the original data type, a request for obtaining original data is sent to the lower computer of the test device.

[0103] When it is determined that the target data type is the original data type, a request for obtaining original data is sent to the target lower computer so that the target lower computer provides original target test data.

[0104] In a possible implementation, a raw data acquisition request is sent to a target test engine of a target lower computer, and the target test engine responds to the raw data acquisition request and transmits the raw data acquisition request to a target hardware driver unit, and the target hardware driver unit calls the raw data acquisition interface of the target hardware driver unit to acquire raw target test data from a target test board, and sends the raw target test data to an acquisition and display device for error address information. When the target hardware driver unit acquires raw target test data from a target test board, it transmits a raw data acquisition request to the target test board, and the target test board responds to the raw data acquisition request and transmits the raw target test data to the target hardware driver unit.

[0105] Optionally, a raw data acquisition interface corresponding to the raw data type is set in the target hardware driver unit. When the target test engine receives a raw data acquisition request, it transmits the raw data acquisition request to the target hardware driver unit. The target hardware driver unit calls the raw data acquisition interface to obtain the original target test data from the target test board.

[0106] Step 540: Receive the original target test data sent by the lower computer of the test equipment.

[0107] The original target test data sent by the target test engine is received, and data processing is performed on the original target test data to obtain error address information.

[0108] Step 550: Display error address information corresponding to the target test data in a second display format on the user interaction interface.

[0109] Optionally, the second display form includes at least one of a detailed matrix bitmap form and an error address list. In a possible implementation, when the target data type is an original data type, the acquired data is original target test data. Since the specified address range is smaller than the display address range, the error address information of the original target test data corresponding to the specified address range can be fully displayed on the user interaction interface. After acquiring the original target test data, the original target test data can be matrix-converted to obtain a detailed error address bitmap corresponding to the target test data, and the error address information corresponding to the target test data is displayed in the form of a detailed error address bitmap on the user interaction interface.

[0110] In a possible implementation, the test service unit may obtain the original target test data from the target lower computer, that is, execute steps 510-540. After obtaining the original target test data, the original target test data is processed to obtain a corresponding detailed matrix bitmap, and the detailed matrix bitmap is sent to the user interaction unit. The user interaction unit displays the detailed matrix bitmap corresponding to the original target test data on the user interaction interface.

[0111] In another possible implementation, after the test service unit obtains the original target test data, it can generate an error address list based on the original target test data, and send the error address list to the user interaction unit, which displays the error address list corresponding to the original target test data on the user interaction interface, wherein the error address list includes detailed error addresses in a specified address range.

[0112] In the disclosed embodiment, when the specified address range is smaller than the display address range, the original target test data is obtained from the underlying target test board, and the error address information corresponding to the original target test data is displayed on the user interaction interface. The detailed error address information corresponding to the specified address range can be intuitively displayed to facilitate user query.

[0113] Figure 6A schematic diagram of the interaction between the host computer 10 and the target slave computer 201 in the test device provided for an exemplary embodiment of the present disclosure during the acquisition and display process of the error address information. The test service unit 1013 of the device 101 for acquiring and displaying the error address information runs in the debugging tool management module of the host computer 10. The host computer 10 also includes a test service module for managing the debugging tool management module. In the embodiment of the present disclosure, the test service module is used to start the test service unit 1013. In a possible implementation, a plug-in loading technology is used to start the test service unit 1013 for managing the acquisition and display device 101 of the error address information.

[0114] During the process of acquiring and displaying the error address information, the user interaction unit 1011 first starts the test service unit 1013 through the test service module. Specifically, the user interaction unit 1011 can respond to the user's start operation on the device 101 for acquiring and displaying the error address information, so that the back-end test service unit 1013 is in a running state, that is, the test service unit 1013 is started.

[0115] Optionally, the user interaction unit 1011 and the test service unit 1013 communicate with each other by protocol, and the target lower computer 201 and the test service unit communicate with each other by protocol. The specific protocol includes one of the Remote Procedure Call (RPC) protocol, the gRPC protocol, and ZeroMQ (ZMQ).

[0116] In this embodiment, the test service unit 1013 includes a service management subunit, a server and a client that are communicatively connected to each other, wherein the user interaction unit 1011 can respond to user operations and establish a communication connection with the server in the test service unit 1013 to send a data read request. The server in the test service unit 1013 receives the data read request sent by the user interaction unit 1011, and sends the data read request to the service management subunit. After receiving the data read request, the service management subunit determines the target data type of the target test data based on the relationship between the specified address range and the display address range in the data read request; based on the target data type, sends a data acquisition request to the client. In addition, the client can establish a communication connection with the target lower computer 201 and send a data acquisition request to the target lower computer 201 so that the target lower computer 201 returns the target test data of the target data type. Specifically, a communication connection is established between the client and the target test engine 2011. After receiving the data acquisition request, the client sends the data acquisition request to the target test engine 2011. The target test engine 2011 transmits the data acquisition request to the target hardware driver unit 2013. The target hardware driver unit 2013 responds to the data acquisition request and reads the target test data of the target data type from the target test board, or the target hardware driver unit 2013 responds to the data acquisition request and reads the original target test data from the target test board, processes the original target test data, and obtains the target test data of the target data type. After receiving the target test data of the target data type returned by the target lower computer 201, the client sends the target test data of the target data type to the service management subunit. The service management subunit receives the target test data of the target data type sent by the client, and can generate error address information based on the target test data of the target data type, and sends the error address information to the server. The server sends the error address information to the user interaction unit 1011, and the user interaction unit 1011 displays the error address information on the user interaction interface.

[0117] Optionally, the test service unit 1013 also includes an error address data management subunit, which is used to store the target test data read from the lower computer. In the process of saving the read target test data, the error address data management subunit and the service management subunit interact to complete the data saving, wherein the service management subunit is used to respond to the error address test data saving request and send the error address test data to be saved to the error address data management subunit; the error address data management subunit is used to receive and save the error address test data sent by the service management subunit.

[0118] Figure 7 A schematic diagram of the interaction between the host computer and the target slave computer during the acquisition and display of error address information provided by an exemplary embodiment of the present disclosure. Figure 7 As shown, the user can set access parameters through the user interaction interface of the user interaction unit. The user interaction unit generates a data read request according to the set access parameters, and sends the data read request to the server in the test service unit based on the protocol. The server parses the request to obtain the parsed data read request, and sends the parsed data read request to the service management subunit. The service management subunit determines the target data type of the target test data according to the relationship between the specified address range and the display address range in the data read request. When the target data type is a compressed data type, a compressed data acquisition request is sent to the client. When the target data type is an original data type, an original data acquisition request is sent to the client. The client is used to communicate with the target test engine in the target lower computer. After receiving the compressed data acquisition request, the client forwards the compressed data acquisition request to the target test engine. The target test engine sends the compressed data acquisition request to the target hardware driver unit. The target hardware driver unit forwards the compressed data acquisition request to the target test board. The target test board feeds back the target compressed data after compressing the target test data to the target hardware driver unit. The target hardware driver unit forwards the target compressed data to the target test engine. The target test engine forwards the target compressed data to the client of the test service unit. The client sends the target compressed data to the service management subunit. The service management subunit generates error address information according to the target compressed data, and forwards the error address information to the user interaction unit through the service end for display on the user interaction interface. It should be noted that this embodiment is described by taking the target test board compressing the target test data to obtain the target compressed data as an example, but it does not constitute a limitation to this.

[0119] After receiving the original data acquisition request, the client forwards the original data acquisition request to the target test engine in the target lower computer, the target test engine sends the original data acquisition request to the target hardware driver unit, the target hardware driver unit forwards the original data acquisition request to the target test board, the target test board feeds back the original target test data to the target hardware driver unit, the target hardware driver unit forwards the original target test data to the target test engine, the target test engine forwards the original target test data to the client of the test service unit, the client sends the original target test data to the service management subunit, the service management subunit generates error address information based on the original target test data, and forwards the error address information to the user interaction unit through the server for display on the user interaction interface.

[0120] The data read request in the disclosed embodiment is generated based on the access parameter to the AFM space. In a possible implementation, the access parameter to the AFM space can be configured by the user. Before step 310, the following steps 110-120 are included, and steps 110-120 can be specifically performed by a user interaction unit in the acquisition and display device of the error address information.

[0121] Step 110, in response to a configuration operation on the access parameter configuration window, obtaining configured access parameters, the access parameters including a specified address range.

[0122] Optionally, the user interaction interface of the embodiment of the present disclosure includes an access parameter configuration window, and the user can configure the access parameter through the access parameter configuration window. In a possible implementation, an access parameter configuration menu item is displayed on the user interaction interface, and the user interaction unit responds to the start operation of the access parameter configuration menu item and displays the access parameter configuration window on the user interaction interface for the user to configure the parameters.

[0123] Optionally, the configured access parameters include specifying an address range.

[0124] Optionally, the access parameter configuration window includes an AFM space access parameter configuration item and a CFM space access parameter configuration item, and the configuration of the AFM space access parameter can be completed through the AFM space access parameter configuration item.

[0125] Step 120: Generate a data read request based on the configured access parameters.

[0126] After receiving the configuration parameters of the access parameter configuration window, the user interaction unit can obtain the configured access parameters and generate a data read request based on the obtained access parameters. It should be noted that in this embodiment, the access parameters are access parameters for the AFM space, and the generated data read request is also a data read request for the AFM space.

[0127] In a possible implementation, before configuring the access parameters to the AFM space, it is also necessary to first configure the access rule parameters to the AFM space. The access parameter configuration window can also be used to configure the access rule parameters. The access rule parameters are used to indicate the access rules for accessing the error address test data, and are also used to indicate the access rules for accessing the storage space (including the AFM space and the CFM space). The process includes the following steps:

[0128] Step 10: In response to a configuration operation on a rule parameter configuration item in the access parameter configuration window, the configured access rule parameters are obtained.

[0129] The access parameter configuration window includes rule parameter configuration items for configuring access rule parameters. Optionally, the access rule parameters include the address space accessible in the storage space, the maximum accessible address range, the minimum accessible address range, whether the redundant mode is turned on, etc. The rule parameter configuration items may include CFM space access rule parameter configuration items and AFM space access rule parameter configuration items.

[0130] Step 20: Send the configured access rule parameters to the lower computer of the test device, so that the lower computer of the test device controls access to the error address test data based on the access rule parameters.

[0131] Taking the configuration of access rule parameters to the AFM space as an example, when a configuration operation for the AFM space access rule parameter configuration item is received, the configured access rule parameters are obtained, and then the configured access rule parameters are sent to the lower computer of the test device, so that the lower computer of the test device configures the AFM space according to the access rule parameters to the AFM space.

[0132] Specifically, the access rule parameter configuration process is completed by the interaction between the upper computer and the target lower computer. During this process, the user can configure the access rule parameters through the user interaction interface of the user interaction unit. The user interaction unit sends the access rule parameter configuration information to the server in the test service unit. The server sends the access rule parameter configuration to the service management subunit. The service management subunit sends the access rule parameter configuration to the configuration parameter management subunit in the test service unit, including the configured access rule parameters. The configuration parameter management subunit performs parameter verification cache according to the configured access rule parameters to verify whether the access rule parameters can be used. If the verification passes, the verification pass status is returned to the service management subunit. The service management subunit forwards the access rule parameter configuration to the target test engine through the client. The target test engine sends the access rule parameter configuration to the target hardware driver unit. The target hardware driver unit forwards the access rule parameter configuration to the target test board. The target test board sets the access rule parameters for the AFM space according to the access rule parameter configuration and returns the status (configuration status) to the target hardware driver unit. The target hardware driver unit sends the configuration status to the target test engine. The target test engine forwards the status to the client of the test service unit. The client sends the status to the service management subunit. The service management subunit forwards the status to the user interaction unit through the server to complete the configuration process of the access rule parameters.

[0133] The error address test data stored in the AFM space is obtained by performing an error address test on the object to be tested based on the configured AFM space capture parameters. Among them, the capture parameters are used to indicate the test data obtained by performing an error address test on the capture address range of the object to be tested. That is, the capture parameters are parameters used in the test process, and according to the AFM space capture parameters, an error address test is performed on the capture address range in the parameters to obtain test data and store it in the AFM space. After the error address test data corresponding to the capture address range is stored in the AFM space, the user can access the error address test data corresponding to the capture address range. It should be noted that when accessing the error address test data corresponding to the capture address range, the specified address range set in the access parameters must not be larger than the capture address range.

[0134] In another possible implementation, the acquisition and display tool for error address information can also automatically generate access parameters based on the capture parameters configured by the user, thereby realizing automatic generation of access parameters. The process also includes steps 210-230, which can be specifically performed by a user interaction unit in the acquisition and display device for error address information.

[0135] Step 210: In response to the configuration operation on the capture parameter configuration window, the configured capture parameters are obtained.

[0136] Optionally, in the disclosed embodiment, a capture parameter configuration window is also provided in the user interaction interface, so that the user can directly configure the capture parameters in the acquisition and display tool of the error address information without having to re-use the configuration in other tool pages. In addition, the capture parameter configuration window and the access parameter configuration window are integrated in the user interaction interface, so that the user can configure the capture parameters and the access parameters through the same user interaction interface, which can improve the efficiency of parameter configuration and facilitate the user to compare and verify the configured capture parameters and access parameters.

[0137] In a possible implementation, a capture parameter configuration menu item is displayed on the user interaction interface. In response to the start operation of the capture parameter configuration menu item, the user interaction unit displays a capture parameter configuration window on the user interaction interface for the user to configure the parameters.

[0138] Optionally, the capture parameters include a capture address range.

[0139] Optionally, the capture parameter configuration window includes an AFM space capture parameter configuration item and a CFM space capture parameter configuration item, and the configuration of the AFM space capture parameters can be completed through the AFM space capture parameter configuration item.

[0140] Step 220: Generate access parameters based on the capture parameters, wherein the specified address range included in the generated access parameters is not larger than the capture address range included in the capture parameters.

[0141] After the user interaction unit receives the AFM space capture parameters configured by the user, it can automatically generate access parameters to the AFM space, and the specified address range included in the automatically generated AFM space access parameters is smaller than the capture address range included in the capture parameters, or the specified address range included in the automatically generated AFM space access parameters is the same as the capture address range included in the capture parameters.

[0142] Step 230: Generate a data read request based on the generated access parameters.

[0143] The user interaction unit generates a data read request based on the automatically generated AFM space access parameter, and sends it to the test service unit, and the test service unit reads the target test data of the target data type according to the data read request.

[0144] In a possible implementation, before configuring the capture parameters for the AFM space, it is also necessary to first configure the capture rule parameters for the AFM space. The capture parameter configuration window can also be used to configure the capture rule parameters, which are used to indicate the capture rule for capturing the error address test data and storing it in the storage space (including the AFM space and the CFM space). The process includes the following steps:

[0145] Step 21, in response to the configuration operation on the rule parameter configuration item in the capture parameter configuration window, the configured capture rule parameters are obtained.

[0146] The capture parameter configuration window includes rule parameter configuration items, which are used to configure capture rule parameters. Optionally, the capture rule parameters include the storage space that can store test data after capturing the test data, the maximum address range that can be captured, the minimum address range, whether the redundant mode is turned on, the functional mode used, the address arrangement rules for storing the test data corresponding to each address, and the writing rules for writing test data into the storage space (such as the correspondence between the bit of the storage space and each digital input and output pin (DQpin), the data type that can be written into the storage space), etc. The rule parameter configuration items may include CFM space capture rule parameter configuration items and AFM space capture rule parameter configuration items.

[0147] Step 22: Send the configured capture rule parameters to the lower computer of the test device, so that the lower computer of the test device controls the capture and acquisition of the error address test data based on the capture rule parameters.

[0148] Taking the configuration of capture rule parameters for the AFM space as an example, when a configuration operation for the AFM space capture rule parameter configuration item is received, the configured capture rule parameters are obtained, and then the configured capture rule parameters are sent to the lower computer of the test device, so that the lower computer of the test device configures the AFM space according to the capture rule parameters for the AFM space, so that the AFM space captures error address test data based on the configured capture rule parameters.

[0149] Specifically, the capture rule parameter configuration process can be completed by the interaction between the upper computer and the target lower computer. During this process, the user can configure the capture rule parameters through the user interaction interface of the user interaction unit. The user interaction unit sends the capture rule parameter configuration to the server in the test service unit. The server sends the capture rule parameter configuration to the service management subunit. The service management subunit sends the capture rule parameter configuration to the configuration parameter management subunit in the test service unit. The configuration parameter management subunit performs parameter verification cache according to the configured capture rule parameters to verify whether the capture rule parameters can be used. If the verification passes, the verification pass status is returned to the service management subunit. The service management subunit forwards the capture rule parameter configuration to the target test engine through the client. The target test engine sends the capture rule parameter configuration to the target hardware driver unit. The target hardware driver unit forwards the capture rule parameter configuration to the target test board. The target test board sets the capture rule parameters for the AFM space according to the capture rule parameter configuration and returns the status (configuration status) to the target hardware driver unit. The target hardware driver unit sends the configuration status to the target test engine. The target test engine forwards the status to the client of the test service unit. The client sends the status to the service management subunit. The service management subunit forwards the status to the user interaction unit through the server to complete the configuration process of the capture rule parameters.

[0150] In a possible implementation, Figure 6As shown, the test service unit 1013 also includes a configuration parameter management subunit, which is used to cache configuration rule parameters, and the configuration rule parameters include at least one of the configured access rule parameters and the configured capture rule parameters. In the parameter configuration process, the configuration parameter management subunit and the service management subunit interact to complete the caching of the configuration rule parameters, wherein, in the parameter configuration process, the service management subunit sends the configuration rule parameters to the configuration parameter management subunit; the configuration parameter management subunit is used to perform parameter verification on the configuration rule parameters and cache the configuration rule parameters after the parameter verification passes. In the case where the configuration rule parameters are access rule parameters, the configuration parameter management subunit receives the access rule parameters sent by the service management subunit, verifies the access rule parameters, determines whether the access rule parameters meet the configuration requirements, and caches the access rule parameters if the verification passes; in the case where the configuration parameters are capture rule parameters, the configuration parameter management subunit receives the capture rule parameters sent by the service management subunit, verifies the capture rule parameters, determines whether the capture rule parameters meet the configuration requirements, and caches the capture rule parameters if the verification passes.

[0151] In the disclosed embodiment, the capture parameter configuration window and the access parameter configuration window are integrated in the user interaction interface, so that the user can complete the configuration of the capture parameters and the access parameters through the same user interaction interface, thereby improving the efficiency of parameter configuration. In addition, the capture parameter configuration window and the access parameter configuration window are integrated in the same user interaction interface, which is convenient for the user to compare the capture parameters and the access parameters, configure the access parameters according to the configured capture parameters, or view the relationship between the automatically generated access parameters and the configured capture parameters, thereby improving the user experience.

[0152] In the disclosed embodiment, the user can also complete the configuration of the capture rule parameters and access rule parameters of the storage space through the user interaction interface, thereby improving the configuration efficiency of the storage space capture test data rules and access rules.

[0153] The capture parameters are used in the test process. After the user configures the capture parameters, the upper computer of the test equipment sends the capture parameters to the lower computer of the test equipment, so that the lower computer of the test equipment executes the preset test vector (pattern) based on the capture parameters, obtains the test data by performing an error address test on the capture address range of the object to be tested, and stores the test data corresponding to the capture address range in the AFM space.

[0154] Optionally, a test vector, which may also be referred to as test configuration information, includes a correspondence between an input signal and an output reference signal. A test vector may include an input signal input to the object under test and its corresponding output reference signal, wherein the input signal may include 0 or 1. The output reference signal corresponding to the input signal may be understood as the output true value corresponding to the input signal, indicating the information that should be output for the input signal when the object under test meets its function.

[0155] In a possible implementation, a pre-set test vector is stored in the lower computer of the test device. After receiving the capture parameters sent by the upper computer, the pre-set test vector is executed based on the capture parameters to obtain test data corresponding to the capture address range included in the capture parameters.

[0156] Optionally, after obtaining the configured capture parameters, the user interaction unit sends the capture parameters to the test service unit; the test service unit sends the capture parameters to the lower computer of the test device (target lower computer), so that the lower computer of the test device executes the preset test vector based on the capture parameters to obtain the test data by performing an error address test on the capture address range of the object to be tested, and stores the test data corresponding to the capture address range in the AFM space.

[0157] In addition, before re-executing the test vector, the error address test data stored in the original AFM space needs to be cleared. That is, before sending the execution test vector instruction to the lower computer of the test equipment, the test service unit sends a data clearing instruction to the lower computer of the test equipment so that the lower computer of the test equipment can clear the test data in the AFM space. After the data is cleared, the test process is executed according to the pre-configured test vector to obtain the error address test data obtained by re-testing and store it in the AFM space.

[0158] like Figure 8As shown, it shows a schematic diagram of the interaction between the upper computer and the target lower computer during the test process provided by an exemplary embodiment of the present disclosure. The user can set the capture parameters through the user interaction interface of the user interaction unit. The user interaction unit sends the set capture parameters to the server in the test service unit. The server parses and obtains the configured capture parameters, and sends the capture parameters to the service management subunit. After receiving the capture parameters, the service management subunit sends a clear AFM space data instruction to the client. After receiving the clear AFM space data instruction, the client forwards the clear AFM space data instruction to the target test engine. The target test engine sends the clear AFM space data instruction to the target hardware driver unit. The target hardware driver unit forwards the clear AFM space data instruction to the target test board. The target test board clears the AFM space data and returns the clear status to the target hardware driver unit. The target hardware driver unit returns the clear status to the target test engine. The target test engine returns the status to the service management subunit through the client. After the service management subunit determines that the AFM space data is cleared, it sends an instruction to execute the test vector to the target test engine through the client, and the instruction to execute the test vector includes capture parameters. The target test engine transmits the instruction to execute the test vector to the target hardware driver unit. The target hardware driver unit calls the driver interface and sends an instruction to execute the test vector to the target test board. The target test board executes the pre-configured test vector according to the capture parameters to test the error address in the capture address range, and stores the obtained test data in the AFM space, completing the capture of the AFM data, and returning the test status to the target hardware driver unit. The target hardware driver unit returns the status to the target test engine, and the target test engine returns the status to the service management subunit through the client. The service management subunit returns the status to the user interaction unit through the server, completing the test capture process based on the capture parameters.

[0159] In the above process, after receiving the configured capture parameters, the service management subunit sends a clear AFM space data instruction to the target lower computer to clear the AFM space data, so that the AFM space can store the data obtained after retesting. In another possible implementation, the user can complete the custom clearing of the target address range data in the AFM space through the user interaction interface. The user can configure the target address range to be cleared in the user interaction interface. The user interaction unit sends the data clearing instruction carrying the target address range to the service management subunit through the client. The service management subunit then sends the data clearing instruction to the target test engine through the client. The target test engine sends the data clearing instruction to the target hardware driver unit. The target hardware driver unit calls the driver interface and sends the data clearing instruction to the target test board. The target test board clears the error address test data corresponding to the target address range specified by the user according to the data clearing instruction, and completes the automatic clearing of the error address test data.

[0160] In an exemplary embodiment, the process of reading the target test data of the object to be tested from the AFM space to display the error address information includes: the user interaction unit receives the configuration operation of the capture rule parameter configuration item in the capture parameter configuration window, obtains the configured capture rule parameters, sends the configured capture rule parameters to the test service unit, the test service unit sends the configured capture rule parameters to the target lower computer, and the target lower computer configures the rules for capturing the error address test data in the AFM space based on the configured capture rule parameters (for the specific process, please refer to the above-mentioned capture rule parameter configuration process embodiment). The user interaction unit also receives the configuration operation of the access rule parameter configuration item in the access parameter configuration window, obtains the configured access rule parameters, sends the configured access rule parameters to the test service unit, the test service unit sends the configured access rule parameters to the target lower computer, and the target lower computer configures the access rules for the error address test data in the AFM space based on the configured access rule parameters (for the specific process, please refer to the above-mentioned access rule parameter configuration process embodiment).

[0161] After completing the configuration of the capture rule parameters and access rule parameters of the AFM space, the user interaction unit can receive the configuration operation of the capture parameter configuration window, obtain the configured capture parameters, and send the configured capture parameters to the test service unit. After receiving the capture parameters, the test service unit first sends an instruction to clear the AFM space data to the target lower computer to clear the error address test data originally stored in the AFM space, and then sends the configured capture parameters to the target lower computer. After the target test board in the target lower computer receives the configured capture parameters, it executes the pre-stored test vectors and stores the error address test data to be captured indicated by the configured capture parameters in the AFM space (for the specific process, please refer to Figure 8 and its embodiments).

[0162] Afterwards, the user interaction unit may generate a data read request according to the access parameters configured in the access parameter configuration window or the automatically generated access parameters, and send the request to the test service unit. In response to the specified address range included in the data read request being larger than the display address range, the test service unit sends a compressed data acquisition request (including the specified address range and the compression ratio parameter) to the target lower computer, so that the target lower computer provides the compressed target test data. In response to the specified address range included in the data read request being not larger than the display address range, the test service unit sends an original data acquisition request to the target lower computer, so that the target lower computer provides the original target test data (for details, please refer to Figure 7and its embodiments). When the acquired data is compressed target test data (target compressed data), at least one of a test status view and a thumbnail matrix bitmap corresponding to the target compressed data may be displayed on a user interaction interface; when the acquired data is original target test data, at least one of an error address list and a detailed matrix position corresponding to the original target test data may be displayed on a user interaction interface.

[0163] The lower computer of the test device includes an AFM space and a CFM space, wherein the AFM space is an error address storage space for storing original error address test data, and the CFM space is a compressed data storage space for storing compressed error address test data. Optionally, the capture parameter configuration window of the user interaction interface may include a CFM space capture parameter configuration item and an AFM space capture parameter configuration item, respectively. In response to the configuration operation of the capture parameters in the CFM space capture parameter configuration item and the AFM space capture parameter configuration item, the CFM space capture parameter and the AFM space capture parameter may be sent to the lower computer respectively. The lower computer executes the pre-configured test vector based on the CFM space capture parameter and the AFM space capture parameter to obtain the test data corresponding to the address range indicated by the CFM space capture parameter and the test data corresponding to the address range indicated by the AFM space capture parameter, respectively. The test data corresponding to the address range indicated by the CFM space capture parameter is compressed and stored in the CFM space, and the test data corresponding to the address range indicated by the AFM space capture parameter is stored in the AFM space.

[0164] When the upper computer obtains the test data in the CFM space, the lower computer can directly provide the upper computer with the corresponding compressed test data according to the data read request, that is, the upper computer responds to the first data read request for the error address test data in the compressed data storage space, and reads the compressed error address test data in the address range included in the first data read request from the CFM space of the lower computer. The first data read request refers to a data read request to read the compressed test data from the CFM space.

[0165] When the host computer obtains the test data in the AFM space, the method for obtaining and displaying the error address information provided in the above embodiment can be used to read the test data stored in the AFM space. In response to the second data read request for the error address test data in the AFM space, the host computer obtains the specified address range included in the second data read request, and determines the target data type of the target test data based on the relationship between the specified address range and the display address range. Among them, the second data read request refers to a data read request to read the test data from the AFM space. When the host computer receives the second data read request for the error address test data in the error address storage space, based on the relationship between the specified address range included in the second data read request and the display address range, the target data type of the target test data to be read is determined, and a data acquisition request for obtaining the target test data of the target data type is sent to the lower computer, and the lower computer provides the target test data of the target data type to the upper computer based on the test data in the AFM space.

[0166] Optionally, the user may configure access parameters to the CFM space through the CFM space access parameter configuration item to trigger a first data read request. In addition, the user may also configure access parameters to the AFM space through the AFM space access parameter configuration item to trigger a second data read request.

[0167] In a possible implementation, the compressed test data stored in the CFM space and the original test data stored in the AFM space are test data corresponding to the same address range, that is, the address ranges respectively included in the CFM space capture parameters and the AFM space capture parameters are the same. The capture parameter configuration window in the user interaction interface may include CFM space capture parameter configuration items and AFM space capture parameter configuration items. The user can configure the CFM space capture parameter configuration items and the AFM space capture parameter configuration items to make the address ranges respectively included in the CFM space capture parameters and the AFM space capture parameters the same. In this case, the user can first obtain the test data in the CFM space, obtain the rough error address information of the address range, determine the local address range where the error address is located based on the rough error address information, and then obtain the detailed test data corresponding to the local address range from the AFM space.

[0168] Optionally, compressed test data of the object to be tested is stored in the compressed data storage space, and the compressed test data of the object to be tested includes test data obtained by compressing the test data corresponding to the specified address range of the object to be tested, wherein the specified address range of the object to be tested may include all addresses or partial addresses of the object to be tested. The host computer responds to the first data read request for the test data of the specified address range of the object to be tested in the compressed data storage space, and reads the compressed test data of the specified address range of the object to be tested from the compressed data storage space of the lower computer. In this process, the host computer sends a first data read request to the target lower computer for testing the object to be tested, indicating that the compressed test data of the specified address range of the object to be tested in the CFM space is read. After receiving the first data read request, the target test engine in the target lower computer sends the first data read request to the target hardware driver unit of the target lower computer, and the target hardware driver unit calls the compressed data acquisition interface to obtain the compressed test data of the specified address range of the object to be tested from the CFM space of the target test board in the target lower computer, and then sends it to the host computer.

[0169] After the host computer obtains the compressed test data of the object to be tested, it displays the thumbnail matrix bitmap corresponding to the compressed test data on the user interaction interface. The thumbnail matrix bitmap indicates the error address information of the specified address range of the object to be tested. That is, the thumbnail matrix bitmap displays the rough error address information of the object to be tested. The user can determine the local area (i.e., the local matrix bitmap) where the error address of the object to be tested is located through the thumbnail matrix bitmap, and can view the detailed error address information corresponding to the local matrix bitmap.

[0170] In response to a request to view a local matrix bitmap in a thumbnail matrix bitmap, it is determined that a second data read request for error address test data in an error address storage space is received, and a specified address range included in the second data read request is obtained, and the specified address range included in the second data read request is the same as the address range corresponding to the local matrix bitmap. Wherein, the request to view the local matrix bitmap may be a request to enlarge the local matrix bitmap. When the request to view the local matrix bitmap is received, detailed test data of the address range corresponding to the local matrix bitmap is obtained from the AFM space of the lower computer to display the corresponding detailed error address information on the user interaction interface. That is, in response to a request to view the local matrix bitmap in the thumbnail matrix bitmap, it is determined that a second data read request for error address test data in an error address storage space is received, and the steps of obtaining the specified address range included in the second data read request may be executed, and a target data type of the target test data may be determined based on the relationship between the specified address range and the display address range; based on the target data type, target test data of the target data type may be obtained from the lower computer of the test device; based on the target test data of the target data type, the error address information corresponding to the target test data of the target data type may be displayed on the user interaction interface.

[0171] In this embodiment, compressed test data in the CFM space can be first obtained to determine the rough error address information of the object to be tested, and then test data of the address range where the error address indicated in the rough error address information in the AFM space is located can be obtained. That is, the address range of the error address of the object to be tested is roughly located first, and then the detailed address information of the error address is checked, which helps to improve the efficiency of viewing the error address information of the object to be tested.

[0172] Optionally, the operation mode of the tool for obtaining and displaying the error address information includes an online mode and an offline mode. The method for obtaining and displaying the error address information provided in the above embodiment can be used in the online mode. Fig. 9 As shown, it shows a flow chart of a method for obtaining and displaying error address information in an online mode provided by an exemplary embodiment of the present disclosure. After setting to online mode, the working conditions of the AFM space and / or CFM space can be configured according to the capture rule parameters and access rule parameters of the AFM space and / or CFM space configured by the user, respectively. The working conditions include configuring the capture rule parameters and the access rule parameters. After the rule parameters are configured, the configured capture parameters and access parameters are obtained. If the capture parameters are reconfigured capture parameters, the pattern program must be executed first. During this process, the AFM and / or CFM are initialized (data in the AFM space is cleared), the test vector is executed to obtain the AFM data and / or CFM data, and then the AFM data and / or CFM data reading process is executed based on the access parameters. If the data stored in the AFM space and / or CFM space is still accessed, the AFM data and / or CFM data can be directly read according to the data read request. After reading AFM data and / or CFM data, if the read data is compressed data of AFM data, it is determined that the read data is compressed data, and at least one of a thumbnail matrix bitmap corresponding to the compressed data and a test status view can be displayed; if the read data is original data of AFM data, at least one of an error address list and a detailed matrix bitmap corresponding to the original data can be displayed; if the read data is CFM data, it is determined that the read data is compressed data, and at least one of a thumbnail matrix bitmap corresponding to the compressed data and a test status can be displayed. After the information is displayed, when the AFM and / or CFM working conditions reconfigured by the user are received, the above process is re-executed.

[0173] In a possible implementation, the upper computer may store the test data read from the lower computer in the online mode for offline reading. Since the amount of test data read from the lower computer is large, test data containing error address test data may be stored. That is, after obtaining the target test data of the target data type from the lower computer of the test device, when the target test data indicates that the error address is stored within the specified address range, the read target test data is stored in the error address data file. Optionally, the data of the error address in the target test data may be stored in the error address data file, that is, only the error address is saved. Optionally, the error address data file may be managed by the above-mentioned error address data management subunit.

[0174] When the error address information acquisition and display tool runs in offline mode, the test data can be read from the error address data file according to the user's request, and the corresponding error address information can be displayed on the user interaction interface. The error address information acquisition and display tool responds to the offline data read request and acquires the read address range in the offline data read request. The offline data read request is a data read request triggered by the user when the error address information acquisition and display tool runs in offline mode.

[0175] After obtaining the read address range, the test data of the read address range is obtained from the error address data file. In a possible implementation, it is first detected whether the error address data file stores the test data of the read address range. If the test data of the read address range is stored, the test data of the read address range is obtained from the error address data file, and then the error address information corresponding to the test data of the read address range can be displayed on the user interaction interface.

[0176] In one possible case, the read address range is smaller than the display address range, and the error address information corresponding to the test data in the read address range can be displayed in the form of a detailed matrix bitmap on the user interaction interface; in another possible case, the read address range is larger than the display address range, and the test data in the read address range needs to be compressed, and the error address information of the compressed test data is displayed in the form of a thumbnail matrix bitmap on the user interaction interface.

[0177] like Fig.10As shown, it shows a flow chart of a method for obtaining and displaying error address information in an offline mode provided by an exemplary embodiment of the present disclosure. When an offline data read request is received and test data of a read address range is stored in an error address data file, the error address data file is opened and the test data is read, that is, the test data of the read address range is obtained. When the read address range is larger than the display address range, the read test data needs to be compressed, and then at least one of a thumbnail matrix bitmap and a test status view corresponding to the compressed data can be displayed on the user interaction interface; when the read address range is smaller than the address range, at least one of a detailed matrix bitmap of the test data and an error address list is displayed on the user interaction interface according to the acquired test data. In response to receiving an offline data read request again and test data of a new read address range is stored in the error address data file, the error address data file is reopened to read the test data of the new read address range.

[0178] In one possible implementation, the process of saving AFM data includes: a user can trigger an instruction to save error address test data in a user interaction interface provided by a user interaction unit; after the user interaction unit receives the instruction to save error address test data, the user interaction unit sends the instruction to save error address test data to the service management subunit through the server; after the service management subunit receives the instruction to save error address test data, the service management subunit obtains the error address test data to be saved, sends the error address test data to be saved to the error address data management subunit, and the error address data management subunit saves the error address test data. Thereafter, the saving status is returned to the service management subunit; the service management subunit returns the saving status to the user interaction unit through the server, and the saving of the error address test data is completed, which can be used in offline mode.

[0179] Fig.11 It is a structural diagram of a device for acquiring and displaying error address information provided by an exemplary embodiment of the present disclosure. The device includes a front-end user interaction unit 1011 and a back-end test service unit 1013.

[0180] The test service unit 1013 is used to respond to a data read request for error address test data, obtain a specified address range included in the data read request, the data read request is used to instruct to read target test data corresponding to the specified address range from the error address test data corresponding to the object to be tested, the error address test data is test data obtained by performing an error address test on the storage space of the object to be tested; based on the relationship between the specified address range and the display address range, determine the target data type of the target test data, the display address range is the address range allowed to be displayed by the user interaction interface, and the target data type includes a compressed data type and an original data type; based on the target data type, send a data acquisition request to the lower computer of the test device, and obtain target test data of the target data type from the lower computer of the test device; based on the target test data of the target data type, generate error address information corresponding to the target test data of the target data type, and send the error address information to the user interaction unit 1011;

[0181] The user interaction unit 1011 is used to display the error address information on the user interaction interface.

[0182] In an exemplary embodiment, the user interaction unit 1011 includes a user interaction interface, and the user interaction interface includes an access parameter configuration window and / or a capture parameter configuration window;

[0183] The user interaction unit 1011 is used to obtain the configured access parameters in response to the configuration operation of the access parameter configuration window, the access parameters including the specified address range; generate a data read request based on the configured access parameters; and / or, in response to the configuration operation of the capture parameter configuration window, obtain the configured capture parameters, the capture parameters are used to indicate the capture of test data obtained by performing an error address test on the capture address range of the object to be tested; generate access parameters based on the capture parameters, wherein the specified address range included in the generated access parameters is not larger than the capture address range included in the capture parameters; generate a data read request based on the generated access parameters; and also used to send a data read request to the server; receive error address information corresponding to the target test data of the target data type sent by the server, and display the error address information on the user interaction interface;

[0184] The test service unit 1013 is used to obtain the specified address range based on the data read request, determine the target data type of the target test data based on the relationship between the specified address range and the display address range, send a data acquisition request containing the target data type, and obtain the target test data of the target data type from the lower computer of the test device; generate the error address information based on the target test data of the target data type; and send the error address information to the user interaction unit.

[0185] In the device of the present disclosure, the various optional embodiments, optional implementation methods and optional examples disclosed above can be flexibly selected and combined as needed to achieve corresponding functions and effects, and the present disclosure does not list them one by one.

[0186] In addition, an embodiment of the present disclosure further provides an electronic device, including:

[0187] Memory for storing computer programs;

[0188] The processor is used to execute the computer program stored in the memory, and when the computer program is executed, the method for obtaining and displaying the error address information described in any of the above embodiments of the present disclosure is implemented.

[0189] like Fig.12 As shown, the electronic device includes one or more processors and memory.

[0190] The processor may be a central processing unit (CPU) or other forms of processing units having data processing capabilities and / or instruction execution capabilities, and may control other components in the electronic device to perform desired functions.

[0191] The memory may store one or more computer program products, and the memory may include various forms of computer-readable storage media, such as volatile memory and / or non-volatile memory. The volatile memory may include, for example, a random access memory (RAM) and / or a cache memory (cache), etc. The non-volatile memory may include, for example, a read-only memory (ROM), a hard disk, a flash memory, etc. One or more computer program products may be stored on the computer-readable storage medium, and the processor may run the computer program product to implement the methods for obtaining and displaying error address information of the various embodiments of the present disclosure described above and / or other desired functions.

[0192] In one example, the electronic device may further include: an input device and an output device, and these components are interconnected via a bus system and / or other forms of connection mechanisms (not shown).

[0193] In addition, the input device may also include, for example, a keyboard, a mouse, and the like.

[0194] The output device can output various information to the outside, including determined distance information, direction information, etc. The output device can include, for example, a display, a speaker, a printer, a communication network and a remote output device connected thereto, and the like.

[0195] Of course, to simplify, Fig.12Only some of the components related to the present disclosure in the electronic device are shown, and components such as a bus, an input / output interface, etc. are omitted. In addition, according to specific application situations, the electronic device may further include any other appropriate components.

[0196] In addition to the above-mentioned methods and devices, an embodiment of the present disclosure may also be a computer program product, which includes computer program instructions, which, when executed by a processor, enable the processor to execute the steps of the method for obtaining and displaying error address information according to various embodiments of the present disclosure described in the above part of this specification.

[0197] The computer program product may be written in any combination of one or more programming languages ​​to write program code for performing the operations of the disclosed embodiments, including object-oriented programming languages ​​such as Java, C++, etc., and conventional procedural programming languages ​​such as "C" or similar programming languages. The program code may be executed entirely on the user computing device, partially on the user device, as a separate software package, partially on the user computing device and partially on a remote computing device, or entirely on a remote computing device or server.

[0198] In addition, an embodiment of the present disclosure may also be a computer-readable storage medium on which computer program instructions are stored. When the computer program instructions are executed by a processor, the processor executes the steps of the method for obtaining and displaying error address information according to various embodiments of the present disclosure described in the above part of this specification.

[0199] The computer readable storage medium can adopt any combination of one or more readable media. The readable medium can be a readable signal medium or a readable storage medium. The readable storage medium can include, for example, but is not limited to, a system, device or device of electricity, magnetism, light, electromagnetic, infrared, or semiconductor, or any combination of the above. More specific examples (non-exhaustive list) of readable storage media include: an electrical connection with one or more wires, a portable disk, a hard disk, a random access memory (RAM), a read-only memory (ROM), an erasable programmable read-only memory (EPROM or flash memory), an optical fiber, a portable compact disk read-only memory (CD-ROM), an optical storage device, a magnetic storage device, or any suitable combination of the above.

[0200] The basic principles of the present disclosure are described above in conjunction with specific embodiments. However, it should be noted that the advantages, strengths, effects, etc. mentioned in the present disclosure are only examples and not limitations, and it cannot be considered that these advantages, strengths, effects, etc. are required by each embodiment of the present disclosure. In addition, the specific details disclosed above are only for the purpose of illustration and ease of understanding, and are not limitations. The above details do not limit the present disclosure to the necessity of adopting the above specific details to be implemented.

[0201] Each embodiment in this specification is described in a progressive manner, and each embodiment focuses on the differences from other embodiments. The same or similar parts between the embodiments can be referred to each other. For the system embodiment, since it basically corresponds to the method embodiment, the description is relatively simple, and the relevant parts can be referred to the partial description of the method embodiment.

[0202] The block diagrams of the devices, apparatuses, equipment, and systems involved in the present disclosure are only illustrative examples and are not intended to require or imply that they must be connected, arranged, and configured in the manner shown in the block diagrams. The above description of the disclosed aspects is provided to enable any technician in the field to make or use the present disclosure. Various modifications to these aspects are very obvious to those skilled in the art, and the general principles defined herein can be applied to other aspects without departing from the scope of the present disclosure. Therefore, the present disclosure is not intended to be limited to the aspects shown herein, but to the widest range consistent with the principles and novel features disclosed herein.

[0203] The above description has been given for the purpose of illustration and description. In addition, this description is not intended to limit the embodiments of the present disclosure to the forms disclosed herein. Although multiple example aspects and embodiments have been discussed above, those skilled in the art will recognize certain variations, modifications, changes, additions and sub-combinations thereof.

Claims

1. A method for obtaining and displaying error address information, characterized in that: The method is used for testing the host computer of the device, and the method comprises: In response to a data read request for error address test data, obtaining a specified address range included in the data read request, wherein the data read request is used to instruct to read target test data corresponding to the specified address range from error address test data of an object to be tested, wherein the error address test data is test data obtained by performing an error address test on a storage space of the object to be tested; Determining a target data type of the target test data based on a relationship between the specified address range and a display address range, wherein the display address range is an address range allowed to be displayed on a user interaction interface, and the target data type includes a compressed data type and an original data type; Based on the target data type, a data acquisition request is sent to the lower computer of the test device, and target test data of the target data type is acquired from the lower computer of the test device, wherein the target test data of the compressed data type is target compressed data obtained after compressing the target test data, and the target test data of the original data type is original target test data; Based on the target test data of the target data type, displaying error address information corresponding to the target test data of the target data type on the user interaction interface; Wherein, determining the target data type of the target test data based on the relationship between the specified address range and the display address range includes: In response to the designated address range being larger than the display address range, the target data type is determined to be the compressed data type; in response to the designated address range being smaller than or equal to the display address range, the target data type is determined to be the original data type.

2. The method according to claim 1, characterized in that The step of sending a data acquisition request to a lower computer of the test device based on the target data type, and acquiring target test data of the target data type from the lower computer of the test device includes: In response to the target data type being the compressed data type, determining a compression ratio parameter based on the designated address range and the display address range, and sending a compressed data acquisition request including the compression ratio parameter and the designated address range to a lower computer of the test device; The target compressed data is received from the lower computer of the test device and is obtained by compressing the target test data according to the compression ratio parameter.

3. The method according to claim 1, characterized in that The step of sending a data acquisition request to a lower computer of the test device based on the target data type, and acquiring target test data of the target data type from the lower computer of the test device includes: In response to the target data type being the original data type, sending an original data acquisition request to a lower computer of the test device; Receive the original target test data sent by the lower computer of the test device.

4. The method according to any one of claims 1 to 3, characterized in that: The user interaction interface includes an access parameter configuration window, and the method further includes: In response to a configuration operation on the access parameter configuration window, acquiring configured access parameters, the access parameters including a specified address range; Based on the configured access parameters, the data read request is generated.

5. The method according to claim 4, characterized in that The access parameter configuration window is also used to configure access rule parameters, and the access rule parameters are used to indicate access rules for accessing error address test data; Before obtaining the configured access parameters in response to the configuration operation on the access parameter configuration window, the method further includes: In response to a configuration operation on a rule parameter configuration item in the access parameter configuration window, obtaining a configured access rule parameter; The configured access rule parameters are sent to a lower computer of the test device, so that the lower computer of the test device controls access to the error address test data based on the access rule parameters.

6. The method according to any one of claims 1 to 3, characterized in that: The user interaction interface also includes a capture parameter configuration window, and the method further includes: In response to a configuration operation on the capture parameter configuration window, acquiring configured capture parameters, the capture parameters being used to indicate capturing test data obtained by performing an error address test on a capture address range of the object to be tested; The capture parameters are sent to the lower computer of the test device so that the lower computer of the test device executes a preset test vector based on the capture parameters, obtains test data by performing an error address test on the capture address range of the object to be tested, and stores the test data corresponding to the capture address range in the error address storage space.

7. The method according to claim 6, characterized in that After acquiring the configured capture parameters, the method further includes: Based on the capture parameters, generating access parameters, wherein the specified address range included in the generated access parameters is not larger than the capture address range included in the capture parameters; Based on the generated access parameters, the data read request is generated.

8. The method according to claim 6, characterized in that The capture parameter configuration window is also used to configure capture rule parameters, and the capture rule parameters are used to indicate capture rules for capturing error address test data; Before obtaining the configured capture parameters in response to the configuration operation on the capture parameter configuration window, the method further includes: In response to a configuration operation on a rule parameter configuration item in the capture parameter configuration window, acquiring configured capture rule parameters; The configured capture rule parameters are sent to a lower computer of the test device, so that the lower computer of the test device controls the capture and storage of the error address test data based on the capture rule parameters.

9. The method according to claim 6, characterized in that Before sending the capture parameters to the lower computer of the test device, the method further includes: A data clearing instruction is sent to the lower computer of the test device so that the lower computer of the test device clears the test data in the error address storage space.

10. The method according to any one of claims 1 to 3, characterized in that: The displaying of error address information corresponding to target test data of the target data type on the user interaction interface includes: In response to the target data type being the compressed data type, displaying error address information corresponding to the target test data in a first display form on the user interaction interface, the first display form comprising at least one of a thumbnail matrix bitmap form and a test status view; In response to the target data type being the original data type, error address information corresponding to the target test data is displayed on the user interaction interface in a second display form, wherein the second display form includes at least one of a detailed matrix bitmap form and an error address list.

11. The method according to claim 10, characterized in that The first display form includes the thumbnail matrix bitmap form. After displaying the error address information corresponding to the target test data in the first display form on the user interaction interface, the method further includes: In response to a request for viewing a local matrix bitmap in the thumbnail matrix bitmap of the target test data, acquiring a detailed address range indicated by the viewing request; When the detailed address range is smaller than the display address range, obtaining detailed test data of the detailed address range; and displaying an enlarged local matrix bitmap on the user interaction interface based on the detailed test data; When the detailed address range is larger than the display address range, a compression ratio parameter is determined based on the detailed address range and the display address range; a compression data acquisition request including the compression ratio parameter and the detailed address range is sent to a lower computer of the test device to acquire target compressed data of the detailed address range; and based on the target compressed data, an enlarged local matrix bitmap is displayed on the user interaction interface.

12. The method according to any one of claims 1 to 3, characterized in that: After acquiring the target test data of the target data type from the lower computer of the test device, the method further includes: In the case where the target test data indicates that an error address exists within the specified address range, storing data of the error address in the target test data to an error address data file, wherein the error address data file is used to store error address test data read from a lower computer of the test device; The method further comprises: In response to an offline data read request, obtaining a read address range in the offline data read request; The test data of the read address range is acquired from the error address data file, and the error address information corresponding to the test data of the read address range is displayed on the user interaction interface.

13. The method according to any one of claims 1 to 3, characterized in that: The lower computer of the test device comprises an error address storage space and a compressed data storage space, wherein the error address storage space is used to store original error address test data, and the compressed data storage space is used to store compressed error address test data; The method further comprises: In response to a first data read request for error address test data in the compressed data storage space, reading compressed error address test data in an address range included in the first data read request from the compressed data storage space of the lower computer; The step of obtaining, in response to a data read request for error address test data, a specified address range included in the data read request, and determining a target data type of the target test data based on a relationship between the specified address range and a display address range includes: In response to a second data read request for error address test data in the error address storage space, a specified address range included in the second data read request is obtained, and a target data type of the target test data is determined based on a relationship between the specified address range and the display address range.

14. The method according to claim 13, characterized in that The method of responding to a first data read request for error address test data in the compressed data storage space, reading compressed error address test data in an address range included in the first data read request from the compressed data storage space of the lower computer, comprises: In response to a first data read request for test data in a specified address range of the object to be tested in the compressed data storage space, compressed test data corresponding to the specified address range of the object to be tested is read from the compressed data storage space of the lower computer, wherein the compressed test data includes test data obtained by compressing the test data in the specified address range of the object to be tested; The method further comprises: Displaying a thumbnail matrix bitmap corresponding to the compressed test data on the user interaction interface, wherein the thumbnail matrix bitmap indicates error address information in a specified address range of the object to be tested; In response to a request to view a local matrix bitmap in the thumbnail matrix bitmap, it is determined that a second data read request for error address test data in the error address storage space is received, and a specified address range included in the second data read request is obtained, and the specified address range included in the second data read request is the same as the address range corresponding to the local matrix bitmap.

15. A testing device, characterized in that: It includes a host computer and at least one slave computer, wherein the host computer includes a device for obtaining and displaying error address information; The error address information acquisition and display device is used to respond to a data read request for error address test data and acquire a specified address range included in the data read request, wherein the data read request is used to instruct to read target test data corresponding to the specified address range from the error address test data corresponding to the object to be tested, and the error address test data is test data obtained by performing an error address test on the storage space of the object to be tested; Determining a target data type of the target test data based on a relationship between the specified address range and a display address range, wherein the display address range is an address range allowed to be displayed on a user interaction interface, and the target data type includes a compressed data type and an original data type; Based on the target data type, sending a data acquisition request to a target lower computer, wherein the target lower computer is a lower computer that tests the object to be tested; receiving target test data of a target data type sent by the target lower computer, and displaying error address information corresponding to the target test data of the target data type on the user interaction interface based on the target test data of the target data type, wherein the target test data of the compressed data type is target compressed data obtained by compressing the target test data, and the target test data of the original data type is original target test data; The device for acquiring and displaying the error address information is specifically used to determine that the target data type is the compressed data type in response to the specified address range being larger than the display address range; and to determine that the target data type is the original data type in response to the specified address range being smaller than or equal to the display address range; The target lower computer is used to send target test data of the target data type to the acquisition and display device of the error address information according to the data acquisition request.

16. The device according to claim 15, characterized in that The lower computer includes a test engine, a hardware drive unit and a test board; The acquisition and display device of the error address information is used to send a compressed data acquisition request to the target test engine of the target lower computer in response to the target data type being the compressed data type; and receive the target compressed data sent by the target test engine; In response to the target data type being the original data type, sending an original data acquisition request to the target test engine; Receiving original target test data sent by the target test engine; When the target test engine responds to the compressed data acquisition request, the compressed data acquisition request is transmitted to the target hardware driver unit of the target lower computer, so that the target hardware driver unit acquires the target compressed data transmitted by the target test board of the target lower computer, and the target test board receives the compressed data acquisition request, compresses the original target test data to acquire the target compressed data; When the target test engine responds to the original data acquisition request, the original data acquisition request is transmitted to the target hardware driver unit, so that the target hardware driver unit acquires the original target test data transmitted by the target test board.

17. The device according to claim 15, characterized in that The lower computer includes a test engine, a hardware drive unit and a test board; The acquisition and display device of the error address information is used to send a compressed data acquisition request to the target test engine of the target lower computer in response to the target data type being the compressed data type; and receive the target compressed data sent by the target test engine; In response to the target data type being the original data type, sending an original data acquisition request to the target test engine; Receiving original target test data sent by the target test engine; When the target test engine responds to the compressed data acquisition request, the compressed data acquisition request is transmitted to the target hardware driver unit, so that the target hardware driver unit obtains the original target test data transmitted by the target test board, compresses the original target test data to obtain the target compressed data, and the target test board receives the compressed data acquisition request and transmits the original target test data to the target hardware driver unit; When the target test engine responds to the original data acquisition request, the original data acquisition request is transmitted to the target hardware driver unit, so that the target hardware driver unit acquires the original target test data transmitted by the target test board.

18. The device according to any one of claims 16-17, characterized in that: The compressed data acquisition request includes a compression ratio parameter and the designated address range, and the compression ratio parameter is determined based on the designated address range and the display address range.

19. The device according to any one of claims 15 to 17, characterized in that: The acquisition and display device of the error address information comprises a front-end user interaction unit and a back-end test service unit, wherein the user interaction unit comprises the user interaction interface, and the user interaction interface comprises an access parameter configuration window and / or a capture parameter configuration window; The user interaction unit is used to obtain the configured access parameters in response to the configuration operation of the access parameter configuration window, the access parameters including the specified address range; generate the data read request based on the access parameters; and / or, in response to the configuration operation of the capture parameter configuration window, obtain the configured capture parameters, the capture parameters are used to indicate the capture of test data obtained by performing an error address test on the capture address range of the object to be tested; generate access parameters based on the capture parameters, wherein the specified address range included in the generated access parameters is not larger than the capture address range included in the capture parameters; generate the data read request based on the generated access parameters; and send the data read request to the test service unit; receive the error address information corresponding to the target test data of the target data type sent by the test service unit, and display the error address information on the user interaction interface; The test service unit is used to obtain the specified address range based on the data read request, determine the target data type of the target test data based on the relationship between the specified address range and the display address range, send a data acquisition request containing the target data type, and obtain the target test data of the target data type from the lower computer of the test device; generate the error address information based on the target test data of the target data type; and send the error address information to the user interaction unit.

20. The device according to claim 19, characterized in that The test service unit includes a service management subunit, a server and a client, a communication connection is established between the server and the user interaction unit, and a communication connection is established between the client and the target lower computer; The server is configured to receive and analyze the data reading request sent by the user interaction unit, and send the data reading request to the service management subunit; receiving the error address information sent by the service management subunit, and sending the error address information to the user interaction unit; The service management subunit is used to determine the target data type of the target test data based on the relationship between the specified address range and the display address range in the data read request; Based on the target data type, sending the data acquisition request to the client; Receive target test data of a target data type sent by the client, generate the error address information based on the target test data of the target data type, and send the error address information to the server; The client is used to send the data acquisition request to the target lower computer, so that the target lower computer returns the target test data of the target data type.

21. The device according to claim 20, characterized in that The test service unit further includes a configuration parameter management subunit, and / or an error address data management subunit; The service management subunit is further used to send configuration rule parameters to the configuration parameter management subunit during parameter configuration, wherein the configuration rule parameters include at least one of the configured access rule parameters and the configured capture rule parameters; the configuration parameter management subunit is further used to perform parameter verification on the configuration rule parameters and cache the configuration rule parameters after the parameter verification passes; and / or, The service management subunit is further used to respond to a request to save the error address test data and send the error address test data to be saved to the error address data management subunit; the error address data management subunit is further used to receive and save the error address test data sent by the service management subunit.

22. An electronic device, characterized in that: include: Memory for storing computer programs; A processor is used to execute the computer program stored in the memory, and when the computer program is executed, the method for obtaining and displaying the error address information described in any one of claims 1 to 14 is implemented.

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