A system device and method for testing laser battery array chip

Abstract

The present invention belongs to the field of laser technology. The present invention provides a system device and method for testing laser battery array chips, wherein the system device for testing laser battery array chips comprises a laser unit, a detection unit, a control unit and a processing unit; the detection unit comprises a probe, and the probe switches between a source meter, an oscilloscope and an electronic load to realize multiple detection functions; the control unit comprises a signal synchronization control and triggering module to realize the coordinated work of the laser, the source meter and other detection equipment terminals; the present invention realizes multiple testing needs of laser battery array chips through a systematic device, and can realize accurate testing of high-power density laser energy conversion battery array chips.

Description

Technical Field

[0001] The invention belongs to the field of laser technology and relates to a system device and method for testing a laser battery array chip. Background Art

[0002] High-energy lasers can be used as a technology for long-distance wireless energy transmission and are regarded as the commanding heights of future high-tech competition and a field of disruptive innovation. They are not only expected to provide wireless power transmission for my country's aerospace equipment (such as aerospace drones, in-orbit satellites, deep space probes, lunar base stations and space elevators, etc.), but can also solve major engineering problems such as power supply in extremely harsh scenarios such as the deep sea, fire, explosion, ultra-high voltage and strong magnetism. They have important national defense and socio-economic value.

[0003] The principle of laser wireless energy transmission technology is to directly convert high-energy laser radiation into electrical energy based on the photoelectric effect. The laser energy conversion battery chip (battery array chip) manufactured based on integrated circuit technology is the core component of the entire system, and its performance directly determines the energy transmission efficiency and stability of the entire system. The laser battery chip with a special structural design can directly convert high-energy-density laser energy into high-voltage electrical energy. Its energy conversion efficiency, current-voltage (IV) output characteristics, and response time to laser energy input under high-energy laser irradiation are key indicators for measuring the performance of laser battery chips.

[0004] Testing of laser battery chips can help accurately understand the performance characteristics of laser battery chips, thereby providing an important scientific basis for the design and optimization of laser battery chips, and selecting the best battery solution to improve the conversion efficiency of laser battery chips. In addition, by analyzing the IV characteristic curve of laser battery chips, problems in the battery chip manufacturing process can be discovered and solved in a timely manner, providing a guarantee for the manufacture of laser battery chips that meet the requirements. Therefore, accurately characterizing the performance of laser battery chips such as energy conversion efficiency and energy output characteristics under high-energy laser irradiation is the technical key to realizing the design and application of high-performance laser energy conversion chip batteries.

[0005] In the existing technology, the IV test system of solar cells is a solution with reference significance. The principle and solution of solar cell IV test are as follows: under standard sunlight irradiation, a four-quadrant source meter and a variable electronic load are used to perform voltage-current (IV) scanning on solar cells, gradually increasing from zero voltage to a certain voltage value, then gradually decreasing to zero voltage, and finally increasing to negative voltage. By measuring the current and voltage values ​​at each voltage point, the IV characteristic curve is obtained. According to the measured current and voltage values, the key parameters of the solar cell, such as open circuit voltage, short circuit current, maximum power point and energy conversion efficiency, are calculated.

[0006] Although the IV test of solar cells is similar to the IV test of laser cell chips, the specific test requirements and test problems that need to be solved are very different. For example, the standard uniformly distributed sunlight (continuous wide wave) is used in the IV test of solar cells, while the high-energy laser (single wave) is used in the test of laser cell chips, which is a typical Gaussian beam. In addition, the related test procedures and signal circuits are different, which makes the existing solar cell test system unable to be directly used for the test characterization of laser cell chips.

[0007] Given that domestic laser wireless energy transmission technology is still in a fragmented and initial stage, laser energy conversion and its related characterization technologies are still insufficient, especially the lack of mature characterization systems and evaluation standards. There is also a lack of instruments on the market that are specifically designed to perform effective performance characterization tests on laser battery chips. Therefore, it is necessary to research and develop a solution that can meet the various testing needs of laser battery chips, especially to achieve and accurately test, and especially to achieve accurate testing of high-power density laser energy conversion battery chips, to provide support for the development of laser wireless energy transmission technology. Summary of the invention

[0008] In view of the problems existing in the prior art, the purpose of the present invention is to provide a system device and method for testing laser battery array chips, which can realize various testing needs of laser battery array chips through a systematic device and can achieve accurate testing of high power density laser energy conversion battery array chips.

[0009] To achieve this object, the present invention adopts the following technical solutions:

[0010] In a first aspect, the present invention provides a system device for testing a laser battery array chip, comprising:

[0011] A laser unit, including a laser;

[0012] The detection unit includes a probe, a source meter, an oscilloscope and an electronic load; the probe is switchably electrically connected with the source meter, the oscilloscope and the electronic load;

[0013] A control unit, including a signal synchronization control and triggering module, electrically connected to the laser unit and the detection unit, for realizing the coordinated work of the laser unit and the detection unit;

[0014] The processing unit includes a data calculation and storage module and is electrically connected to the control unit.

[0015] The test system device for laser energy conversion battery array chip proposed in the present invention can accurately perform output voltage-current (IV) scanning on high power density laser energy conversion battery array chip, switch the connection between source meter, oscilloscope and electronic load through probe, form different test circuits to obtain multiple test functions, realize signal synchronization and triggering of laser and source meter and other equipment through signal synchronization control and triggering module, so that various equipment can automatically cooperate and work together, so as to obtain IV output characteristic curve of laser energy conversion battery array chip and response time of battery array chip to laser and battery performance attenuation and other data, and can calculate and store the obtained data through processing unit, so as to provide theoretical data support for laser battery array chip structure design and provide characterization instrument equipment for the development of laser wireless energy transmission technology.

[0016] The present invention utilizes the signal synchronization control and triggering module to realize the signal synchronization control triggering technology of the system device, aiming to realize the synchronization control and data acquisition of each instrument, and can control and process the data acquisition, recording and processing of each instrument under different time scales (single point acquisition time is greater than 0.1s), so as to achieve the purpose of accurately measuring the IV output characteristic curve of the laser battery array chip, and then realize the energy conversion efficiency, output characteristics and pulse laser transient energy input transient electrical response of the laser battery array chip. Since various different signal acquisition sensors (such as temperature sensors, voltage and current acquisition sensors, laser output controllers, etc.) are integrated in each instrument in the test system, the signal acquisition start time scales between different instruments and the signal acquisition sensors they contain are inconsistent, making it difficult to realize in-situ control and synchronous measurement. Therefore, the present invention uses a signal synchronization control and triggering module (for example, which can be obtained through the development and customization of FPGA circuits) according to the output characteristics of the laser battery array chip to realize high-speed synchronous triggering, recording and acquisition of signals.

[0017] The following are preferred technical solutions of the present invention, but are not intended to be limitations of the technical solutions provided by the present invention. Through the following technical solutions, the technical objectives and beneficial effects of the present invention can be better achieved and realized.

[0018] As a preferred technical solution of the present invention, the laser unit also includes a homogenizing and shaping optical element lens, which is optically connected to the laser through an optical fiber and is used to convert a Gaussian distributed laser beam into a beam with uniform energy distribution.

[0019] In the present invention, in order to accurately test the output characteristic curve of the laser battery array chip, it is crucial to ensure that the output beam of the laser has a uniform energy distribution on the laser battery array chip. However, the laser energy generated by a conventional laser is Gaussian distributed, with high energy in the center and low energy at both ends. In response to this problem, the present invention preferably adopts a high-energy laser beam homogenization and shaping technology based on the size and structural characteristics of the laser battery array chip. By adding a specially customized optical element lens to the front end of the laser's output optical fiber, the energy of the laser output beam is homogenized and shaped, thereby ensuring that the laser battery array chip is accurately measured under laser irradiation with uniform energy distribution.

[0020] The present invention does not limit the wavelength of the laser, which should be reasonably adjusted according to the needs of the laser battery array chip to be tested, or at least two lasers can be set in a system device to facilitate switching testing. Exemplarily, the wavelength of the laser includes 808nm and / or 1064nm.

[0021] Preferably, the laser unit further comprises a signal generator, which is electrically connected to the laser via a laser control circuit, so as to realize remote control of the laser.

[0022] The present invention does not limit the specific wire materials and transmission standards for forming electrical connections for power supply functions and electrical signal transmission, and they should be reasonably adjusted and selected according to needs.

[0023] Exemplarily, the signal generator is electrically connected to the laser control circuit and the signal synchronization control and trigger module via an RS232 control communication line and a signal line.

[0024] As a preferred technical solution of the present invention, the detection unit further includes a temperature detection device, which is electrically connected to the control unit and is used to detect the temperature of the laser battery array chip.

[0025] Preferably, the temperature detection device comprises a high-speed infrared camera.

[0026] As a preferred technical solution of the present invention, the detection unit further includes an amplifier, and the probe is electrically connected to the oscilloscope via the amplifier.

[0027] Preferably, the amplifier comprises a current amplifier and / or a voltage amplifier.

[0028] Because the transient tiny electrical signals generated by the laser battery array chip under pulse laser irradiation are weak and difficult to collect. In order to study the response time of the laser battery array chip to the laser input energy, it is necessary to accurately distinguish and collect these weak transient electrical signals. In response to this problem, the present invention preferably adopts the integrated technology of weak voltage / weak current amplifier, combined with an oscilloscope and a high-speed signal acquisition module (which can be integrated into the control unit) to achieve accurate collection of transient tiny electrical signals of the laser battery array chip under pulse laser energy irradiation. In this way, the response time of the laser battery array chip to transient laser energy input can be successfully and more accurately tested.

[0029] Preferably, the probe comprises a magnetic Calvin probe.

[0030] Preferably, the source meter comprises a four-quadrant source meter.

[0031] Exemplarily, the Calvin probe is connected to a high-precision four-quadrant source meter via a cable with a banana head, and the four-quadrant source meter is connected to a signal synchronization control and trigger module via an RS232 control communication line.

[0032] Exemplarily, the Calvin probe is connected to a low-noise current amplifier and a low-noise voltage amplifier via a cable with a banana head, and the current amplifier and the voltage amplifier are connected to an oscilloscope via a BNC line; the oscilloscope is connected to a signal synchronization control and trigger module via an RS232 control communication line.

[0033] Exemplarily, the Calvin probe is connected to the electronic load via a cable with a banana head, and the electronic load is connected to the signal synchronization control and trigger module via an RS232 control communication line.

[0034] As a preferred technical solution of the present invention, the control unit includes an FPGA circuit, and the FPGA circuit contains the signal synchronization control and trigger module.

[0035] Preferably, the FPGA circuit further comprises a data transmission module for transmitting data to the processing unit.

[0036] Preferably, the FPGA circuit also includes a high-speed signal acquisition module.

[0037] The present invention forms a signal synchronization control and trigger module (logic circuit) by customizing FPGA, and combines serial communication to connect and integrate instruments of various time scales (such as lasers, four-quadrant source meters, electronic loads, voltage amplifiers, current amplifiers, oscilloscopes, and high-speed infrared cameras). This integrated design aims to achieve synchronous control and data acquisition of various instruments and equipment, and can control and process data acquisition, recording, and processing of various instruments at different time scales (single-point acquisition time is greater than 0.1s), thereby achieving the purpose of accurately measuring the IV output characteristic curve of the laser battery array chip and other tests.

[0038] As a preferred technical solution of the present invention, the processing unit includes a host, the host contains the data calculation and storage module, and the data calculation and storage module contains a corresponding algorithm program.

[0039] Preferably, the host also includes a display and operation module.

[0040] Exemplarily, the FPGA circuit is connected to the host computer via an RS232 control communication line. This integration enables synchronous automatic control of each instrument as well as synchronous data acquisition, recording, automatic analysis, calculation and storage.

[0041] As a preferred technical solution of the present invention, the system device for testing the laser battery array chip further includes a carrying unit, and the carrying unit is used for placing and adjusting the positions of the laser unit and the detection unit.

[0042] As a preferred technical solution of the present invention, the bearing unit includes a movable adjustment component, the movable adjustment component includes a base plate, a slide rail is installed on the base plate, a bearing is arranged on the slide rail, and the bearing is used to place a laser battery array chip, a laser, a probe or a detection equipment terminal.

[0043] Preferably, the carrier comprises a magnetic carrier plate.

[0044] Preferably, the movable adjustment components used to place the laser cell array chip, the laser, the probe or the detection device terminal share the same base plate.

[0045] In the present invention, the mobile adjustment component can realize three-axis adjustment (XYZ axis) or four-axis adjustment (XYZ axis and rotation axis R) of the installed laser battery array chip, laser, probe or detection equipment terminal in space, so as to adjust the optical path, irradiation range and detection range.

[0046] Preferably, the adjustment accuracy of the movable adjustment component in each direction is 0.1 mm.

[0047] As a preferred technical solution of the present invention, the carrying unit includes a modular sample table for carrying a laser cell array chip. The modular sample table includes a clamping plate and a replaceable environmental control component detachably connected thereto. The laser cell array chip is arranged on the clamping plate or the replaceable environmental control component, and cooperates with the clamping plate through a clamping member to clamp and fix the laser cell array chip.

[0048] Preferably, the replaceable environmental control component comprises a heating component and / or a cooling component; the heating component comprises an electric thermal insulation component, and the cooling component comprises an air cooling component and / or a water cooling component.

[0049] Preferably, the clamping plate comprises a gold-plated material having thermal conductivity.

[0050] Preferably, the modular sample stage is arranged on the carrier.

[0051] In the present invention, by arranging the modular sample stage on the carrier of the movable adjustment component, it has the characteristics of movable adjustment and modular function selection, and by equipping a variety of environmental control components, such as water-cooling components, air-cooling components and heating components, etc., environmental simulation and temperature control can be performed, and the components can be conveniently switched at will, aiming to meet the research needs on the power output characteristics of laser battery array chips in different service environments and different temperature conditions, and provide an experimental basis and research equipment for the thermal management of future aerospace laser wireless energy transmission and ground laser wireless energy transmission technologies.

[0052] In a second aspect, the present invention provides a method for testing a laser battery array chip, using the system device described in the first aspect to perform at least one of a steady-state test, a transient test, and an attenuation test on the laser battery array chip.

[0053] In the present invention, when the probe in the system device is switched to the line where the source meter is located, this integration can realize the function of collecting and recording the output electrical signal of the laser battery array chip under steady-state continuous laser irradiation. Specifically, by combining the control unit and the processing unit to realize automatic control and data analysis, the laser is remotely controlled and output. The IV output characteristic curve of the laser battery array chip under steady-state continuous laser irradiation is scanned and tested, and the corresponding IV relationship curve is automatically drawn. Through the data analysis algorithm program built into the data calculation and storage module, the open circuit voltage, short circuit current, fill factor, maximum power point voltage and maximum output power of the battery array chip can be automatically calculated, and the energy conversion efficiency of the battery array chip can be automatically evaluated and calculated by combining the laser energy value input by the laser and the maximum output power of the laser battery array chip.

[0054] In the present invention, when the probe in the system device is switched to the circuit where the oscilloscope is located, this integration can realize the acquisition and recording of the transient electrical signal of the laser battery array chip under the pulse laser irradiation, so as to test the electrical response of the laser battery array chip to the pulse laser energy input. Specifically, by combining the control unit and the processing unit to realize the synchronous triggering of the pulse laser signal output generated by the laser, and by cooperating with the weak voltage / current monitoring module (referring to the above-mentioned voltage amplifier / current amplifier) ​​and the oscilloscope, the system can realize the high-speed synchronous acquisition of the pulse electrical signal output by the laser battery array chip with a minimum time interval of 1μs, and can accurately test the response time of the laser battery array chip to the pulse laser energy input.

[0055] In the present invention, when the probe in the system device is switched to the circuit where the electronic load is located, this integration can simulate the working conditions of the laser battery array chip under different load modes and long-term stable continuous laser irradiation, collect and record the time curves of the output power, voltage and current of the laser battery array chip, so as to monitor the performance changes and attenuation aging of the battery array chip under long-term stable laser irradiation conditions.

[0056] Exemplarily, the present invention can be used to solve the following scientific and technological problems:

[0057] (1) Research on the structural and functional integrated design of laser battery array chips:

[0058] Focusing on the forefront of the development of laser wireless energy transmission technology, the system device described in the present invention is used to conduct in-depth characterization tests on the IV characteristics of laser battery array chips with different structures and parameters, which helps to reveal the relationship between the structure of the laser battery array chip and its performance, deeply understand the key influencing factors of the energy conversion efficiency of the laser battery array chip, and obtain the structure-activity relationship of the laser battery array chip, thereby providing a scientific basis for the structural and functional design of high-performance laser battery array chips.

[0059] (2) Research on the interaction and damage mechanism between high-energy laser and laser battery array chip:

[0060] As a core component in the laser energy transmission system, the performance of the laser battery array chip under high-energy laser irradiation is crucial. When the high-energy laser energy exceeds the tolerance of the battery array chip, it may cause irreversible damage to the battery array chip. By testing and analyzing the output IV characteristics of the laser battery array chip under laser irradiation of different energy densities through the system device described in the present invention, the interaction and damage mechanism between the laser battery array chip and the high-energy laser can be better revealed.

[0061] (3) Study on the influence mechanism of temperature on the performance of laser battery array chips:

[0062] Under high-energy laser irradiation, the surface of the laser battery array chip will be subjected to huge instantaneous energy. Part of the energy will be converted into electrical energy output, while the remaining energy will accumulate on the chip surface in the form of heat, causing the temperature to rise. Through the system device described in the present invention, the IV output characteristics of the chip under different temperature conditions can be tested, thereby revealing the influence mechanism of temperature on the energy conversion efficiency of the laser battery array chip.

[0063] (4) Research on the performance aging and degradation of laser battery array chips under long-term service conditions:

[0064] By regularly testing the IV characteristic curve of the laser battery array chip through the system device of the present invention, the output power-time, voltage-time and current-time curves of the laser battery array chip can be obtained, and then the performance changes of the laser battery array chip under long-term stable laser irradiation conditions can be studied, which can provide a scientific basis for the design and optimization of the laser battery array chip.

[0065] Compared with the prior art solutions, the present invention has at least the following beneficial effects:

[0066] The test system device for laser energy conversion battery array chip proposed in the present invention is a multifunctional comprehensive evaluation test system and device, which can accurately perform output voltage-current (IV) scanning on high power density laser energy conversion battery array chip, and switch the connection between source meter, oscilloscope and electronic load through the probe to form different test circuits to obtain multiple test functions, such as steady-state test, transient test and attenuation test, etc. The signal synchronization and triggering of laser and source meter and other equipment are realized through the signal synchronization control and triggering module, so that each device can automatically cooperate and work together, so as to obtain the IV output characteristic curve of the laser energy conversion battery array chip. The system can collect data such as the response time of the laser and battery array chips to the laser and the battery performance attenuation, and can calculate, process and store the obtained data through the processing unit; the system device can realize the structural and functional integrated design of the laser battery array chip, the interaction and damage mechanism of high-energy lasers, the influence of environmental conditions, especially temperature, on the performance, and the performance aging attenuation mechanism under long-term service conditions, etc., to provide mature systematic characterization instrument devices and evaluation standards for laser wireless energy transmission technology, thereby providing theoretical data support for the structural design of laser battery array chips, and providing strong support for promoting the application and development of laser wireless energy transmission technology. BRIEF DESCRIPTION OF THE DRAWINGS

[0067] Figure 1 Schematic diagram of the system device for testing the laser battery array chip in Example 1.

[0068] Figure 2is a schematic diagram of a moving adjustment component in a system device for testing a laser battery array chip in Example 1;

[0069] Figure 3 It is a three-dimensional schematic diagram of a part of the movable adjustment components carrying the probe and the laser cell array chip in the system device for testing the laser cell array chip of Example 1;

[0070] Figure 4 It is a front view and a top view of a part of the movable adjustment component carrying the probe and the laser cell array chip in the system device for testing the laser cell array chip of Example 1;

[0071] Figure 5 1 is a top view and a front view of a modular sample stage using an insulating electric heating element as a replaceable environmental control component in Example 2;

[0072] Figure 6 1 is a top view and a front view of a modular sample stage in which an insulating electric heating element with a fan is used as a replaceable environmental control component in Example 3;

[0073] Figure 7 are a top view and a front view of a modular sample stage with an air cooling element as a replaceable environmental control component in Example 4;

[0074] Figure 8 This is a test result diagram of IV testing of a laser battery array chip using the system device for testing the laser battery array chip of the present invention;

[0075] Fig. 9 This is a test result diagram of a laser battery array chip subjected to a transient test using the system device for testing a laser battery array chip according to the present invention;

[0076] Fig.10 This is a test result diagram of attenuation test of a laser battery array chip using the system device for testing the laser battery array chip of the present invention;

[0077] Figure 1-3 Among them, 10-laser, 11-optical fiber, 12-homogenizing and shaping optical element lens, 13-signal generator, 14-laser control circuit, 20-probe, 21-source meter, 22-oscilloscope, 23-electronic load, 24-current amplifier, 25-voltage amplifier, 30-FPGA circuit, 31-host, 32-high-speed infrared camera, 40-movable adjustment component, 41-base plate, 42-slide rail, 43-carrier, 50-modular sample stage, 51-replaceable environmental control component, 52-clamping plate, 53-clamping member, 60-laser battery array chip.

[0078] Figure 4-7The unit of dimension marking is mm. DETAILED DESCRIPTION

[0079] The technical solution of the present invention is further illustrated below through specific implementation methods.

[0080] It should be clear to those skilled in the art that the embodiments are only intended to help understand the present invention and should not be considered as specific limitations of the present invention.

[0081] Example 1

[0082] This embodiment provides a system device for testing laser battery array chips. Figure 1-4 As shown, the system device includes a laser unit, a detection unit, a control unit, a processing unit and a carrying unit, wherein:

[0083] The laser unit includes one 808nm laser and one 1064nm laser 10, and an optical fiber 11, a homogenizing and shaping optical element lens 12, a laser control circuit 14 and a signal generator 13 corresponding to each laser 10; the homogenizing and shaping optical element lens 12 forms an optical connection with the laser 10 through the optical fiber 11, and is used to convert a Gaussian distributed laser beam into a beam with uniform energy distribution;

[0084] The detection unit includes a probe 20, a source meter 21, an oscilloscope 22 and an electronic load 23; the probe 20 is switchably electrically connected to the source meter 21, the oscilloscope 22 and the electronic load 23; the detection unit also includes an amplifier, through which the probe 20 is electrically connected to the oscilloscope 22; the amplifier is a 100kHz low-noise current amplifier 24 and a voltage amplifier 25; the probe 20 is a magnetic Calvin probe; the source meter 21 is a high-precision four-quadrant source meter (SUM); the electronic load 23 is 10Hz programmable; the detection unit also includes a temperature detection device, which is a non-contact high-speed infrared temperature acquisition camera (referred to as high-speed infrared camera 32) with a frequency of 60Hz, used to detect the temperature of the laser battery array chip 60;

[0085] The control unit includes an FPGA circuit 30, and the FPGA circuit 30 contains a signal synchronization control and triggering module and a data transmission module; the synchronization control and triggering module is electrically connected to the laser 10, the high-speed infrared camera 32, the source meter 21, the oscilloscope 22, the current amplifier 24, the voltage amplifier 25, and the electronic load 23; wherein, the laser 10 is electrically connected to the signal synchronization control and triggering module through the laser control circuit 14 and the signal generator 13; specifically, the signal generator 13 is connected to the laser 10 control circuit and the signal synchronization control and triggering module through the RS232 control communication line and the signal line. The probe 20 is connected to the source meter 21 through a cable with a banana head, and the source meter 21 is connected to the signal synchronization control and trigger module through an RS232 control communication line; or the probe 20 is connected to a low-noise current amplifier 24 and a low-noise voltage amplifier 25 through a cable with a banana head, and the current amplifier 24 and the voltage amplifier 25 are connected to an oscilloscope 22 through a BNC line, and the oscilloscope 22 is connected to the signal synchronization control and trigger module through an RS232 control communication line; or the probe 20 is connected to an electronic load 23 through a cable with a banana head, and the electronic load 23 is connected to the signal synchronization control and trigger module through an RS232 control communication line.

[0086] The processing unit includes a host 31, which includes a data calculation and storage module and a display and operation module. The host 31 is electrically connected to the FPGA circuit 30, and transmits data to the processing unit through the data transmission module of the FPGA circuit 30;

[0087] The carrying unit includes a moving adjustment component 40, such as Figure 2-4 As shown, the mobile adjustment component 40 includes a common base plate 41, on which 5 groups of slide rails 42 are installed, and each group of the slide rails 42 is provided with a bearing 43, and the bearing 43 is used to place the laser battery array chip 60, the laser 10, the probe 20 and the high-speed infrared camera 32; wherein the probe 20 and the laser battery array chip 60 are installed on the same group of slide rails 42, and two groups are provided in total, each group corresponds to a group of slide rails 42 installed with the laser 10, and the center is the slide rail 42 installed with the high-speed infrared camera 32; the slide rail 42 and the bearing 43 of the high-speed infrared camera 32 make the position of the high-speed infrared camera 32 adjustable in four axes ( Figure 2 The blue arc arrow in the middle represents the rotation axis); the other four groups of slide rails 42 and bearings 43 make the positions of the laser battery array chip 60, the laser 10, and the probe 20 biaxially adjustable (such as Figure 3 The carrier 43 of the probe 20 is a magnetic plate to realize the placement of the magnetic Calvin probe;

[0088] The laser cell array chip 60 is mounted on the carrier 43 via a modular sample stage 50. Figure 3 and 4 As shown, the modular sample stage 50 includes a clamping plate 52 and a replaceable environmental control component 51 detachably connected thereto, wherein the replaceable environmental control component 51 is a water-cooling component, and the laser cell array chip 60 is disposed on the water-cooling component and cooperates with the clamping plate 52 through a clamping component 53 to clamp and fix the laser cell array chip 60.

[0089] Example 2

[0090] This embodiment provides a system device for testing laser battery array chips, wherein the system device uses a new modular sample stage 50, such as Figure 5 As shown, the modular sample stage 50 includes a clamping plate 52 and a replaceable environmental control component 51 detachably connected to one side thereof, wherein the replaceable environmental control component 51 is an electric thermal insulation component, and the laser cell array chip 60 is arranged on the other side of the clamping plate 52 and cooperates with the clamping plate 52 through a clamping member 53 to clamp and fix the laser cell array chip 60.

[0091] Example 3

[0092] This embodiment provides a system device for testing laser battery array chips, wherein the system device uses a new modular sample stage 50, such as Figure 6 As shown, the modular sample stage 50 includes a clamping plate 52 and a replaceable environmental control component 51 detachably connected to one side thereof, wherein the replaceable environmental control component 51 is an electric thermal insulation component with a fan, and the laser cell array chip 60 is arranged on the other side of the clamping plate 52 and cooperates with the clamping plate 52 through a clamping member 53 to clamp and fix the laser cell array chip 60.

[0093] Example 4

[0094] This embodiment provides a system device for testing laser battery array chips, wherein the system device uses a new modular sample stage 50, such as Figure 7 As shown, the modular sample stage 50 includes a clamping plate 52 and a replaceable environmental control component 51 detachably connected to one side thereof, wherein the replaceable environmental control component 51 is an air-cooling component, and the laser cell array chip 60 is arranged on the same side of the clamping plate 52 and the air-cooling component, and cooperates with the clamping plate 52 through a clamping component 53 to clamp and fix the laser cell array chip 60.

[0095] Application Example 1

[0096] The system device for testing the laser battery array chip provided in Examples 1-4 is used to perform IV testing on the 6*7 laser battery array chip. The specific testing steps include:

[0097] (1) Hardware connection. The specific operation is as follows: first install the laser battery array chip, install and fix the laser battery array chip on the modular sample stage through thermal conductive silicone grease and clamp it; then, connect the probe to the positive and negative electrodes of the laser battery array chip (this process can use a multimeter or the open circuit voltage monitoring function of the test software to verify whether the connection is successful); finally, turn on the replaceable environmental control component in the modular sample stage for cooling (water cooling, air cooling, semiconductor cooling, etc.), and adjust and control the temperature.

[0098] (2) Turn on the laser light source (using software control). The specific operation is as follows: first turn on the laser switch; then open the port and select the appropriate port, click the preset read; adjust the laser power button value to the maximum value; click to turn on the remote control; turn the laser switch key to ON; enter the light intensity setting value;

[0099] (3) Select the test mode as IV test, set the test parameters, and start the test. The test results are as follows: Figure 8 shown.

[0100] Application Example 2

[0101] Follow steps (1) and (2) in Application Example 1, select the transient test mode in step (3), adjust the test parameters, and start the laser response test of the laser battery array chip. The test results are as follows: Fig. 9 shown.

[0102] Application Example 3

[0103] Follow steps (1) and (2) in Application Example 1, select the attenuation test as the test mode in step (3), adjust the test parameters, and start the aging attenuation test of the laser cell array chip. The test results are as follows: Fig.10 shown.

[0104] From the above, it can be seen that the system devices for testing laser battery array chips provided by Examples 1-4 can realize and accurately test high-power density laser energy conversion battery array chips. The test items include steady-state testing, transient testing and attenuation testing under different simulated service environments to obtain test results such as open circuit voltage, short circuit current, fill factor, maximum power point voltage, maximum output power, response time, etc. This provides theoretical data support for the design of laser battery array chip structures and provides strong support for promoting the application and development of laser wireless energy transmission technology.

[0105] The present invention illustrates the detailed test process of the present invention through the above-mentioned implementation mode, but the present invention is not limited to the above-mentioned test process, that is, it does not mean that the present invention must rely on the above-mentioned test process to be implemented. Those skilled in the art should understand that any improvement of the present invention, equivalent replacement of each unit, module or device in the system device of the present invention, addition of auxiliary structures or auxiliary devices, selection of specific methods, etc., all fall within the protection scope and disclosure scope of the present invention.

[0106] The preferred embodiments of the present invention are described in detail above. However, the present invention is not limited to the specific details in the above embodiments. Within the technical concept of the present invention, a variety of simple modifications can be made to the technical solution of the present invention, and these simple modifications all belong to the protection scope of the present invention.

[0107] It should also be noted that the various specific technical features described in the above specific embodiments can be combined in any suitable manner without contradiction. In order to avoid unnecessary repetition, the present invention will not further describe various possible combinations.

[0108] In addition, various embodiments of the present invention may be arbitrarily combined, and as long as they do not violate the concept of the present invention, they should also be regarded as the contents disclosed by the present invention.

Claims

1. A system device for testing laser battery array chips, characterized in that: include: A laser unit, comprising a laser (10); the laser unit also comprises a homogenizing and shaping optical element lens (12), which is optically connected to the laser (10) via an optical fiber (11) and is used to convert a laser beam with a Gaussian distribution into a beam with uniform energy distribution; the laser unit also comprises a signal generator (13), which is electrically connected to the laser (10) via a laser control circuit (14); the laser unit is used to provide continuous laser irradiation with high power density; A detection unit, comprising a probe (20), a source meter (21), an oscilloscope (22) and an electronic load (23); the probe (20) forms a switchable electrical connection with the source meter (21), the oscilloscope (22) and the electronic load (23); the detection unit further comprises an amplifier, the probe (20) forms an electrical connection with the oscilloscope (22) via the amplifier; the amplifier comprises a current amplifier (24) and a voltage amplifier (25); A control unit, comprising a signal synchronization control and triggering module, electrically connected to the laser unit and the detection unit, wherein the signal generator (13) is connected to the signal synchronization control and triggering module; the probe (20) is connected to a source meter (21), and the source meter (21) is connected to the signal synchronization control and triggering module; or, the probe (20) is connected to a current amplifier (24) and a voltage amplifier (25), and the current amplifier (24) and the voltage amplifier (25) are connected to the oscilloscope (22), and the oscilloscope (22) is connected to the signal synchronization control and triggering module; or, the probe (20) is connected to an electronic load (23), and the electronic load (23) is connected to the signal synchronization control and triggering module; The processing unit includes a data calculation and storage module and is electrically connected to the control unit.

2. The system device for testing laser battery array chips according to claim 1, characterized in that: The detection unit further comprises a temperature detection device, the temperature detection device being electrically connected to the control unit and being used to detect the temperature of the laser battery array chip (60); The temperature detection device comprises a high-speed infrared camera (32).

3. The system device for testing laser battery array chips according to claim 1, characterized in that: The probe (20) comprises a magnetic Calvin probe; and the source meter (21) comprises a four-quadrant source meter.

4. The system device for testing laser battery array chips according to claim 1, characterized in that: The control unit comprises an FPGA circuit (30), and the FPGA circuit (30) contains the signal synchronization control and triggering module; The FPGA circuit (30) also includes a data transmission module, which is used to transmit data to the processing unit.

5. The system device for testing laser battery array chips according to claim 1, characterized in that: The processing unit comprises a host (31), wherein the host (31) contains the data calculation and storage module; The host (31) also includes a display and operation module.

6. The system device for testing laser battery array chips according to claim 1, characterized in that: The system device further comprises a carrying unit, and the carrying unit is used for placing and adjusting the positions of the laser unit and the detection unit.

7. The system device for testing laser battery array chips according to claim 6, characterized in that: The bearing unit comprises a movable adjustment component (40), the movable adjustment component (40) comprises a base plate (41), a slide rail (42) is mounted on the base plate (41), a bearing member (43) is arranged on the slide rail (42), and the bearing member (43) is used to place a laser battery array chip (60), a laser (10), a probe (20) or a detection device terminal; The bearing member (43) comprises a magnetic bearing plate.

8. The system device for testing laser battery array chips according to claim 7, characterized in that: The carrying unit comprises a modular sample stage (50) for carrying a laser cell array chip (60); the modular sample stage (50) comprises a clamping plate (52) and a replaceable environmental control component (51) detachably connected thereto; the laser cell array chip (60) is arranged on the clamping plate (52) or the replaceable environmental control component (51), and cooperates with the clamping plate (52) via a clamping member (53) to clamp and fix the laser cell array chip (60); The replaceable environmental control component (51) comprises a heating component and / or a cooling component; the heating component comprises an electric heat insulating component, and the cooling component comprises an air cooling component and / or a water cooling component; The modular sample stage (50) is arranged on the carrier (43).

9. A method for testing a laser battery array chip, characterized in that: Using the system device described in any one of claims 1 to 8, at least one of a steady-state test, a transient test and an attenuation test is performed on the laser battery array chip (60).

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