Crystal oscillator quality monitoring system based on artificial intelligence
By introducing time zone division, frequency stability, sensitivity degree and environmental stability parameter acquisition modules into the crystal oscillator quality detection system, the comprehensive evaluation coefficient is calculated, and the problem of insufficient temperature monitoring of traditional systems is solved, and the multi-dimensionality of the crystal oscillator is realized Quality monitoring provides a more accurate basis for quality optimization.
Patent Information
- Application Number
- CN202411612348.6
- Authority / Receiving Office
- CN · China
- Patent Type
- Applications(China)
- Current Assignee / Owner
- Filing Date
- 2024-11-13
- Publication Date
- 2024-12-17
- Estimated Expiration
- 2044-11-13
AI Technical Summary
The traditional crystal oscillator quality detection system lacks consideration of internal temperature during monitoring, which leads to insufficient comprehensive frequency stability monitoring, especially in high-temperature and high-pressure environments, which have serious problems in aircraft applications.
A crystal oscillator quality monitoring system based on artificial intelligence was designed, through time zone division module, frequency stability parameter acquisition module, sensitivity degree parameter acquisition module and environmental stability parameter acquisition module, respectively collect and analyze frequency stability, sensitivity degree and environment. Stable data, calculate the comprehensive evaluation coefficient, and conduct multi-dimensional quality evaluation.
The multi-dimensional comprehensive evaluation of crystal oscillators is realized, more accurate quality monitoring results are provided, the accuracy of single-dimensional evaluation is avoided, and the accuracy of the single-dimensional evaluation is provided, and the quality optimization reference is provided.
Smart Images

Figure CN119147872A_ABST
Abstract
Description
Technical Field
[0001] The present invention relates to the field of artificial intelligence technology, and more specifically, to a crystal oscillator quality monitoring system based on artificial intelligence. Background Art
[0002] As a high-precision and high-stability oscillator, crystal oscillator is widely used in various oscillation circuits such as color TVs and computers, as well as in frequency generators in communication systems, to generate clock signals for data processing equipment and provide reference signals for specific systems. It has a significant position in the field of modern electronic technology. Its excellent clock signal generation capability enables it to play a key role in various applications. Therefore, quality monitoring of crystal oscillators has become a vital issue.
[0003] Traditional crystal oscillator quality detection systems generally include a time zone division module, a sub-zone parameter acquisition module, and a sub-zone data analysis and processing module. The time zone division module is used to divide the working time of the crystal oscillator into n equal parts, which is convenient for studying the information generated by the crystal oscillator in each time period; the sub-zone parameter acquisition module is used to obtain the parameters in the divided time sub-zones, and it is convenient and accurate to collect through multimeters, oscilloscopes, etc., and provide a large amount of data; the sub-zone data analysis and processing module analyzes and processes the collected data through artificial intelligence to understand key information such as the frequency stability of the crystal oscillator and the temperature during operation, providing a scientific basis for quality monitoring.
[0004] However, there are still some shortcomings in its actual use. For example, in the sub-region parameter acquisition module, the data accuracy is not enough, and the parameters acquired are often a single frequency. Therefore, in the sub-region data analysis and processing module, most of the traditional artificial intelligence crystal oscillator quality monitoring methods only monitor the frequency stability and power consumption, and rarely mention the internal temperature of the crystal oscillator. In fact, the internal temperature of the crystal oscillator is extremely important. For example, with the needs of scientific and technological development, crystal oscillators are used more and more in aircraft. When flying at high altitudes, aircraft often experience drastic changes in external high and low temperatures, which seriously affects the stability of the crystal oscillator. Summary of the invention
[0005] In order to overcome the above-mentioned defects of the prior art, an embodiment of the present invention provides a crystal oscillator quality monitoring system based on artificial intelligence, which solves the problems raised in the above-mentioned background technology through the following scheme.
[0006] To achieve the above object, the present invention provides the following technical solution: a crystal oscillator quality monitoring system based on artificial intelligence, comprising: The monitoring time division area module is used to determine the monitoring time of the target crystal oscillator as the target time area, divide the target time area into various sub-time areas by equal time division, and mark them as 1, 2, ..., i in sequence.
[0007] The frequency stability parameter acquisition module is used for collecting frequency, including the frequency deviation range of the crystal oscillator and the capacitance and inductance values when the crystal oscillator starts oscillating, and transmits the collected data to the frequency stability data analysis module.
[0008] The frequency stability data analysis module is used to establish a crystal oscillator frequency stability data analysis model, import the crystal oscillator frequency data transmitted by the frequency stability parameter acquisition module into the crystal oscillator frequency data analysis model, calculate the frequency stability evaluation coefficient, and transmit the analysis result to the comprehensive analysis module.
[0009] The sensitivity parameter acquisition module is used to collect the load capacitance data and sensitivity data of each sub-time zone of the crystal oscillator, and transmit the collected data to the sensitivity data analysis module.
[0010] The sensitivity data analysis module is used to analyze the data transmitted by the sensitivity parameter acquisition module, calculate the sensitivity evaluation coefficient, and transmit the analysis result to the comprehensive analysis module.
[0011] The environmental stability parameter acquisition module is used to collect the internal temperature data of the crystal oscillator in each sub-time zone, and transmit the collected data to the environmental stability data analysis module.
[0012] The environmental stability data analysis module is used to establish an environmental stability data analysis model, analyze the data transmitted by the environmental stability parameter acquisition module, calculate the environmental stability evaluation coefficient, and transmit the analysis result to the comprehensive analysis module.
[0013] The comprehensive analysis module is used to establish a comprehensive analysis model, import the data transmitted by the frequency stability data analysis module, the sensitivity data analysis module and the environmental stability data analysis module into the comprehensive analysis model, and calculate the comprehensive evaluation coefficient of the target time area.
[0014] Preferably, the frequency stability parameter acquisition module first collects the frequency when the crystal oscillator starts working, and the time at this time is set as t0, and the frequency of the crystal oscillator at this time is expressed as α0, and then collects the frequency of the crystal oscillator after a period of time, and the time at this time is set as t i , the frequency of the crystal oscillator is expressed as α i ;The capacitance value of the crystal oscillator when it starts oscillating is represented by C, and the inductance value is represented by L.
[0015] Preferably, the frequency stability evaluation coefficient includes the frequency deviation rate and the reactance stability rate; the frequency stability parameter acquisition module from t0 to t i The frequency deviation range within time is set to A=(α0,α i ), the crystal oscillator is preset from t0 to t i The frequency deviation range within the time is set to B = (β0, β i ), at this time the frequency offset of the crystal oscillator is A∩B, if A∩B= , then the frequency deviation rate is y=100%, if A∩B=(α i ‘ , β i ’ ), the frequency deviation rate is , if A∩B=(α0,α i ), at this time the offset range is within the preset offset range, then the offset rate is y=0, if A∩B=(β0,β i ), at this time the preset offset range is within the offset range, then the offset rate is ; The capacitance value and inductance value in the frequency stability parameter acquisition module and the reactance formula are used to obtain the reactance value, and then the reactance value is imported into the reactance stability rate analysis model to obtain the reactance stability rate. The specific analysis formula is as follows: , where x i represents the reactance value of the ith sub-time zone, Represents the allowable error value of the reactance. The frequency deviation and reactance stability of the crystal oscillator are introduced into the frequency stability evaluation coefficient analysis model to calculate the frequency stability analysis coefficient of the i-th sub-time zone, which is specifically expressed as , where λ1 and λ2 represent the influencing factors of frequency stability and reactance stability, respectively. Indicates different offset rates selected in different situations.
[0016] Preferably, the load capacitance data and sensitivity data need to be obtained by adding an external circuit and measuring and calculating with a multimeter. The load capacitance reflects the sensitivity of the crystal oscillator to the external capacitance. The smaller the load capacitance, the lower the crystal oscillator's requirements for the capacitive reactance of the external components, and the easier it is to match the external circuit. The sensitivity data includes the starting frequency and the gravitational acceleration. The obtained load capacitance is expressed as C i The resulting starting frequency is expressed as f i , the acceleration due to gravity is represented by G i , i represents the i-th sub-time zone.
[0017] Preferably, the sensitivity data analysis unit is used to establish a sensitivity data analysis model, import the load capacitance data and frequency data transmitted by the sensitivity parameter acquisition module into the sensitivity analysis model, and calculate the sensitivity evaluation coefficient of each sub-time zone. The sensitivity evaluation coefficient includes capacitive reactance sensitivity and sensitivity. The capacitive reactance sensitivity is specifically expressed as ,in represents the capacitive reactance of the capacitance value measured in the i-th sub-time zone, It represents the capacitive reactance sensitivity of the ith sub-time zone. The sensitivity is specifically expressed as , the capacitive reactance sensitivity and sensitivity of the crystal oscillator are introduced into the sensitivity evaluation coefficient analysis model, and the sensitivity analysis coefficient of the i-th sub-time zone is calculated, which is specifically expressed as , where λ3 and λ4 represent the influencing factors of capacitive reactance sensitivity and sensitivity respectively.
[0018] Preferably, the environmental stability evaluation coefficient includes temperature fluctuation and loss, and the temperature fluctuation is specifically expressed as , where q i represents the internal temperature of the crystal oscillator in the ith sub-time region, represents the temperature fluctuation of the crystal oscillator in the i-th sub-time region, Δt represents the unit time; the loss degree is specifically expressed as , where t 下限 and t 上限 They represent the most suitable lower and upper temperature limits of the crystal oscillator during operation, T 低 and T 高 They represent the average minimum and average maximum external temperatures of the crystal oscillator when it is working. When the most suitable temperature of the crystal oscillator is greatly different from the external average temperature, the loss of the crystal oscillator will be greater. The temperature fluctuation and loss are introduced into the analysis model of the environmental stability evaluation coefficient to obtain the environmental stability evaluation coefficient. The specific analysis formula is: , where λ5 represents the influencing factor of environmental stability.
[0019] Preferably, the evaluation coefficients of the crystal oscillator in the frequency stability dimension, the sensitivity dimension and the environmental stability dimension are the comprehensive evaluation coefficients corresponding to the crystal oscillators of the same level, and the analytical formula thereof is expressed as follows: , where Z represents the comprehensive evaluation coefficient of the crystal oscillator, a, b, and c represent the weight coefficients corresponding to the frequency stability dimension, sensitivity dimension, and environmental stability dimension, respectively, and a+b+c=1.
[0020] Technical effects and advantages of the present invention: The present invention evaluates the quality of the crystal oscillator from the dimensions of frequency stability, sensitivity and environmental stability, so as to obtain evaluation coefficients of the frequency stability, sensitivity and environmental stability dimensions corresponding to the crystal oscillator, and combines the above-obtained evaluation coefficients to statistically calculate the comprehensive evaluation coefficients corresponding to the crystal oscillator quality monitoring. This evaluation method realizes a multi-dimensional comprehensive evaluation of the quality of the crystal oscillator, greatly avoiding the disadvantage of low quality monitoring accuracy caused by a single-dimensional evaluation, and thus provides a real and reliable reference basis for the quality optimization of the crystal oscillator. BRIEF DESCRIPTION OF THE DRAWINGS
[0021] Figure 1 It is a schematic diagram of the overall structure of the present invention. DETAILED DESCRIPTION
[0022] The following will be combined with the drawings in the embodiments of the present invention to clearly and completely describe the technical solutions in the embodiments of the present invention. Obviously, the described embodiments are only part of the embodiments of the present invention, not all of the embodiments. Based on the embodiments of the present invention, all other embodiments obtained by ordinary technicians in this field without creative work are within the scope of protection of the present invention.
[0023] As attached Figure 1 The crystal oscillator quality monitoring system based on artificial intelligence shown in the figure includes a time division area module, a frequency stability parameter acquisition module, a frequency stability data analysis module, a sensitivity rate parameter acquisition module, a sensitivity rate data analysis module, an environmental stability parameter acquisition module, an environmental stability data analysis module, and a comprehensive evaluation module.
[0024] The output end of the time division area module is connected to the input ends of the frequency stability parameter acquisition module, the sensitivity parameter acquisition module and the environmental stability parameter acquisition module; the output end of the frequency stability parameter acquisition module is connected to the input end of the frequency stability data analysis module; the output end of the sensitivity rate parameter acquisition module is connected to the input end of the sensitivity rate data analysis module; the output end of the environmental stability parameter acquisition module is connected to the input end of the environmental stability data analysis module; and the input end of the comprehensive evaluation module is connected to the output ends of the frequency stability data analysis module, the sensitivity rate data analysis module and the environmental stability data analysis module, respectively.
[0025] The monitoring time division area module is used to determine the monitoring time of the target crystal oscillator as the target time area, divide the target time area into various sub-time areas by equal time division, and mark them as 1, 2, ..., i in sequence.
[0026] The frequency stability parameter acquisition module is used for collecting frequency, including the frequency deviation range of the crystal oscillator and the capacitance and inductance values when the crystal oscillator starts oscillating, and transmits the collected data to the frequency stability data analysis module.
[0027] In this embodiment, it should be specifically explained that the frequency stability parameter acquisition module first collects the frequency when the crystal oscillator starts working, and the time at this time is set to t0, and the frequency of the crystal oscillator at this time is represented by α0, and then collects the frequency of the crystal oscillator after a period of time, and the time at this time is set to t i , the frequency of the crystal oscillator is expressed as α i ;The capacitance value of the crystal oscillator when it starts oscillating is represented by C, and the inductance value is represented by L.
[0028] The frequency stability data analysis module is used to establish a crystal oscillator frequency stability data analysis model, import the crystal oscillator frequency data transmitted by the frequency stability parameter acquisition module into the crystal oscillator frequency data analysis model, calculate the frequency stability evaluation coefficient, and transmit the analysis result to the comprehensive analysis module.
[0029] In this embodiment, it should be specifically explained that the frequency stability evaluation coefficient includes the frequency deviation rate and the reactance stability rate; the frequency stability parameter acquisition module from t0 to t i The frequency deviation range within time is set to A=(α0,α i ), the crystal oscillator is preset from t0 to t i The frequency deviation range within the time is set to B = (β0, β i ), at this time the frequency offset of the crystal oscillator is A∩B, if A∩B= , then the frequency deviation rate is y=100%, if A∩B=(α i ‘ , β i ’ ), the frequency deviation rate is , if A∩B=(α0,α i ), at this time the offset range is within the preset offset range, then the offset rate is y=0, if A∩B=(β0,β i ), at this time the preset offset range is within the offset range, then the offset rate is ; The capacitance value and inductance value in the frequency stability parameter acquisition module and the reactance formula are used to obtain the reactance value, and then the reactance value is imported into the reactance stability rate analysis model to obtain the reactance stability rate. The specific analysis formula is as follows: , where x i represents the reactance value of the ith sub-time zone, Represents the allowable error value of the reactance. The frequency deviation and reactance stability of the crystal oscillator are introduced into the frequency stability evaluation coefficient analysis model to calculate the frequency stability analysis coefficient of the i-th sub-time zone, which is specifically expressed as , where λ1 and λ2 represent the influencing factors of frequency stability and reactance stability, respectively. Indicates different offset rates selected in different situations.
[0030] The sensitivity parameter acquisition module is used to collect the load capacitance data and sensitivity data of each sub-time zone of the crystal oscillator, and transmit the collected data to the sensitivity data analysis module.
[0031] In this embodiment, it should be specifically noted that the load capacitance data and sensitivity data need to be measured and calculated by an additional external circuit and a multimeter. The load capacitance reflects the sensitivity of the crystal oscillator to the external capacitance. The smaller the load capacitance, the lower the crystal oscillator's requirements for the capacitive reactance of the external components, and the easier it is to match the external circuit. The sensitivity data includes the starting frequency and the gravity acceleration. The obtained load capacitance is expressed as C i The resulting starting frequency is expressed as f i , the acceleration due to gravity is represented by G i , i represents the i-th sub-time zone.
[0032] The sensitivity data analysis module is used to analyze the data transmitted by the sensitivity parameter acquisition module, calculate the sensitivity evaluation coefficient, and transmit the analysis result to the comprehensive analysis module.
[0033] In this embodiment, it should be specifically explained that the sensitivity data analysis unit is used to establish a sensitivity data analysis model, import the load capacitance data and frequency data transmitted by the sensitivity parameter acquisition module into the sensitivity analysis model, and calculate the sensitivity evaluation coefficient of each sub-time zone. The sensitivity evaluation coefficient includes capacitive reactance sensitivity and sensitivity. The capacitive reactance sensitivity is specifically expressed as ,in represents the capacitive reactance of the capacitance value measured in the i-th sub-time zone, It represents the capacitive reactance sensitivity of the ith sub-time zone. The sensitivity is specifically expressed as , the capacitive reactance sensitivity and sensitivity of the crystal oscillator are introduced into the sensitivity evaluation coefficient analysis model, and the sensitivity analysis coefficient of the i-th sub-time zone is calculated, which is specifically expressed as , where λ3 and λ4 represent the influencing factors of capacitive reactance sensitivity and sensitivity respectively.
[0034] The environmental stability parameter acquisition module is used to collect the internal temperature data of the crystal oscillator in each sub-time zone, and transmit the collected data to the environmental stability data analysis module.
[0035] The environmental stability data analysis module is used to establish an environmental stability data analysis model, analyze the data transmitted by the environmental stability parameter acquisition module, calculate the environmental stability evaluation coefficient, and transmit the analysis result to the comprehensive analysis module.
[0036] In this embodiment, it should be specifically explained that the environmental stability evaluation coefficient includes temperature fluctuation and loss. The temperature fluctuation is specifically expressed as , where q i represents the internal temperature of the crystal oscillator in the ith sub-time region, represents the temperature fluctuation of the crystal oscillator in the i-th sub-time region, Δt represents the unit time; the loss degree is specifically expressed as , where t 下限 and t 上限 They represent the most suitable lower and upper temperature limits of the crystal oscillator during operation, T 低 and T 高 They represent the average minimum and average maximum external temperatures of the crystal oscillator when it is working. When the most suitable temperature of the crystal oscillator is greatly different from the external average temperature, the loss of the crystal oscillator will be greater. The temperature fluctuation and loss are introduced into the analysis model of the environmental stability evaluation coefficient to obtain the environmental stability evaluation coefficient. The specific analysis formula is: , where λ5 represents the influencing factor of environmental stability.
[0037] The comprehensive analysis module is used to establish a comprehensive analysis model, import the data transmitted by the frequency stability data analysis module, the sensitivity data analysis module and the environmental stability data analysis module into the comprehensive analysis model, and calculate the comprehensive evaluation coefficient of the target time area.
[0038] In this embodiment, it is necessary to specifically explain that the evaluation coefficients of the crystal oscillator in the frequency stability dimension, the sensitivity dimension and the environmental stability dimension are the comprehensive evaluation coefficients corresponding to the crystal oscillators of the same level, and the analysis formula thereof is expressed as follows: , where Z represents the comprehensive evaluation coefficient of the crystal oscillator, a, b, and c represent the weight coefficients corresponding to the frequency stability dimension, sensitivity dimension, and environmental stability dimension, respectively, and a+b+c=1.
[0039] The present invention evaluates the quality of the crystal oscillator from the dimensions of frequency stability, sensitivity and environmental stability, so as to obtain evaluation coefficients of the frequency stability, sensitivity and environmental stability dimensions corresponding to the crystal oscillator. This evaluation method realizes a multi-dimensional comprehensive evaluation of the quality of the crystal oscillator, greatly avoiding the disadvantage of low quality monitoring accuracy caused by a single-dimensional evaluation, and thus provides a real and reliable reference basis for the quality optimization of the crystal oscillator.
[0040] Secondly: In the drawings of the embodiments disclosed in the present invention, only the structures related to the embodiments disclosed in the present invention are involved, and other structures can refer to the general design. In the absence of conflict, the same embodiment and different embodiments of the present invention can be combined with each other; Finally: The above description is only a preferred embodiment of the present invention and is not intended to limit the present invention. Any modifications, equivalent substitutions, improvements, etc. made within the spirit and principles of the present invention should be included in the protection scope of the present invention.
Claims
1. A crystal oscillator quality monitoring system based on artificial intelligence, comprising a time division area module, a frequency stability parameter acquisition module, a frequency stability data analysis module, a sensitivity range rate parameter acquisition module, a sensitivity range rate data analysis module, an environmental stability parameter acquisition module, an environmental stability data analysis module, and a comprehensive evaluation module, characterized in that: The monitoring time division area module is used to determine the monitoring time of the target crystal oscillator as the target time area, and divide the target time area into various sub-time areas by equal time division, and mark them as 1, 2, ..., i in sequence. The frequency stability parameter acquisition module is used to collect the frequency, including the frequency offset range of the crystal oscillator and the capacitance and inductance values when the crystal oscillator starts oscillating, and transmit the collected data to the frequency stability data analysis module.
2. The frequency stability data analysis module is used to establish a crystal oscillator frequency stability data analysis model, import the crystal oscillator frequency data transmitted by the frequency stability parameter acquisition module into the crystal oscillator frequency data analysis model, calculate the frequency stability evaluation coefficient, and transmit the analysis results to the comprehensive analysis module.
3. The sensitivity parameter acquisition module is used to collect the load capacitance data and sensitivity data of each sub-time zone of the crystal oscillator, and transmit the collected data to the sensitivity data analysis module.
4. The sensitivity data analysis module is used to analyze the data transmitted by the sensitivity parameter acquisition module, calculate the sensitivity evaluation coefficient, and transmit the analysis results to the comprehensive analysis module.
5. The environmental stability parameter acquisition module is used to collect the internal temperature data of the crystal oscillator in each sub-time zone, and transmit the collected data to the environmental stability data analysis module.
6. The environmental stability data analysis module is used to establish an environmental stability data analysis model, analyze the data transmitted by the environmental stability parameter acquisition module, calculate the environmental stability evaluation coefficient, and transmit the analysis results to the comprehensive analysis module.
7. The comprehensive analysis module is used to establish a comprehensive analysis model, import the data transmitted by the frequency stability data analysis module, the sensitivity data analysis module and the environmental stability data analysis module into the comprehensive analysis model, and calculate the comprehensive evaluation coefficient of the target time area.
8. The crystal oscillator quality monitoring system based on artificial intelligence according to claim 1, characterized in that: The frequency stability parameter acquisition module uses a multimeter, an external circuit, an oscilloscope and other acquisition parameters. First, the frequency of the crystal oscillator when it starts working is acquired. The time at this time is set as t0. The frequency of the crystal oscillator at this time is expressed as α0. Secondly, the frequency of the crystal oscillator after a period of time is acquired. The time at this time is set as t i , the frequency of the crystal oscillator is expressed as α i ;The capacitance value of the crystal oscillator when it starts oscillating is represented by C, and the inductance value is represented by L.
9. The crystal oscillator quality monitoring system based on artificial intelligence according to claim 1, characterized in that: In the frequency stability data analysis module, the frequency stability evaluation coefficient includes the frequency deviation rate and the reactance stability rate; the frequency stability parameter acquisition module from t0 to t i The frequency deviation range within time is set to A=(α0,α i ), the crystal oscillator is preset from t0 to t i The frequency deviation range within the time is set to B = (β0, β i ), at this time the frequency offset of the crystal oscillator is A∩B, if A∩B= , then the frequency deviation rate is y=100%, if A∩B=(α i ‘ , β i ’ ), the frequency deviation rate is , if A∩B=(α0,α i ), at this time the offset range is within the preset offset range, then the offset rate is y=0, if A∩B=(β0,β i ), at this time the preset offset range is within the offset range, then the offset rate is ; The capacitance value and inductance value in the frequency stability parameter acquisition module and the reactance formula are used to obtain the reactance value, and then the reactance value is imported into the reactance stability rate analysis model to obtain the reactance stability rate. The specific analysis formula is as follows: , where x i represents the reactance value of the ith sub-time zone, Represents the allowable error value of the reactance. The frequency deviation and reactance stability of the crystal oscillator are introduced into the frequency stability evaluation coefficient analysis model to calculate the frequency stability analysis coefficient of the i-th sub-time zone, which is specifically expressed as , where λ1 and λ2 represent the influencing factors of frequency stability and reactance stability, respectively. Indicates different offset rates selected in different situations.
10. The crystal oscillator quality monitoring system based on artificial intelligence according to claim 1, characterized in that: In the sensitivity parameter acquisition module, the sensitivity parameters include load capacitance and sensitivity data. The load capacitance reflects the sensitivity of the crystal oscillator to the external capacitance. The smaller the load capacitance, the lower the crystal oscillator's requirements for the capacitive reactance of the external components, and the easier it is to match the external circuit. The sensitivity data includes the starting frequency and the gravitational acceleration. The obtained load capacitance is expressed as C i The resulting starting frequency is expressed as f i , the acceleration due to gravity is represented by G i , i represents the i-th sub-time zone. .
11. The crystal oscillator quality monitoring system based on artificial intelligence according to claim 1, characterized in that: The sensitivity data analysis unit is used to establish a sensitivity data analysis model, import the load capacitance data and frequency data transmitted by the sensitivity parameter acquisition module into the sensitivity analysis model, and calculate the sensitivity evaluation coefficient of each sub-time zone. The sensitivity evaluation coefficient includes capacitive reactance sensitivity and sensitivity. The capacitive reactance sensitivity is specifically expressed as ,in represents the capacitive reactance of the capacitance value measured in the i-th sub-time zone, It represents the capacitive reactance sensitivity of the ith sub-time zone. The sensitivity is specifically expressed as , the capacitive reactance sensitivity and sensitivity of the crystal oscillator are introduced into the sensitivity evaluation coefficient analysis model, and the sensitivity analysis coefficient of the i-th sub-time zone is calculated, which is specifically expressed as , where λ3 and λ4 represent the influencing factors of capacitive reactance sensitivity and sensitivity respectively.
12. The crystal oscillator quality monitoring system based on artificial intelligence according to claim 1, characterized in that: The environmental stability evaluation coefficient includes temperature fluctuation and loss. The temperature fluctuation is specifically expressed as: , where q i represents the internal temperature of the crystal oscillator in the ith sub-time region, represents the temperature fluctuation of the crystal oscillator in the i-th sub-time region, and Δt represents the unit time; The loss is specifically expressed as , where t 下限 and t 上限 They represent the most suitable lower and upper temperature limits of the crystal oscillator during operation, T 低 and T 高 They represent the average minimum and average maximum external temperatures of the crystal oscillator when it is working. When the most suitable temperature of the crystal oscillator is greatly different from the external average temperature, the loss of the crystal oscillator will be greater. The temperature fluctuation and loss are introduced into the analysis model of the environmental stability evaluation coefficient to obtain the environmental stability evaluation coefficient. The specific analysis formula is: , where λ5 represents the influencing factor of environmental stability.
13. The crystal oscillator quality monitoring system based on artificial intelligence according to claim 1, characterized in that: The evaluation coefficients of the crystal oscillator in the frequency stability dimension, sensitivity dimension and environmental stability dimension are the comprehensive evaluation coefficients corresponding to the crystal oscillator of the same level, and the analysis formula is expressed as follows: , where Z represents the comprehensive evaluation coefficient of the crystal oscillator, a, b, and c represent the weight coefficients corresponding to the frequency stability dimension, sensitivity dimension, and environmental stability dimension, respectively, and a+b+c=1.
Citation Information
Patent Citations
Power grid operation mode voltage intelligent adjustment method and device
CN112003288A
High-stability crystal oscillator circuit and implementation method
CN113904626A
Frequency fine tuning system of quartz crystal resonator and fine tuning method thereof
CN113949359A
Frequency control method and system of electronic oscillator
CN117254774A
Performance analysis method of micro electro mechanical system
CN118211398A
