Test method, test system, control equipment and test tool equipment

Abstract

The invention provides a test method, a test system, control equipment and test tool equipment, and relates to the technical field of communication. The method comprises the following steps: acquiring target test related information of to-be-tested equipment; wherein the target test related information comprises to-be-tested equipment parameters and test process information corresponding to the to-be-tested equipment parameters; according to the target test related information, a control instruction is sent to the test tool equipment; wherein the control instruction is used for indicating the test tool equipment to adjust the uplink or downlink channel state of the equipment to be tested; controlling the test instrument to execute a test process of the to-be-tested equipment according to the test flow information; the test instrument comprises a signal source used for testing an input signal of the to-be-tested equipment and / or a signal analyzer used for testing an output signal of the to-be-tested equipment. According to the invention, the problems of high requirements on testers, low test efficiency, unstable test result, high test cost and the like of a current test mode can be solved.

Description

Technical Field

[0001] The present application relates to the field of communication technology, and in particular to a testing method, a testing system, a control device, and a testing tooling device. Background Art

[0002] With the rapid development of wireless communication, in order to ensure the quality and performance of communication, it is necessary to accurately test and analyze the device signals, such as testing and analyzing the signals of repeater equipment, so as to facilitate the deployment and adjustment of uplink and / or downlink communication. The traditional manual testing method requires testers to have a basic understanding of testing and a certain understanding of specific instrument models. They also need to understand the product operation status, index requirements, etc., to manually operate the instrument settings and switch the test products. This manual testing method has high requirements for testers, low test efficiency, unstable test results, high test costs and other problems. Summary of the invention

[0003] The purpose of this application is to provide a testing method, a testing system, a control device and a testing tooling equipment, which can solve the problems of the current testing method having high requirements for testers, low testing efficiency, unstable test results, high testing costs, etc.

[0004] To achieve the above object, an embodiment of the present application provides a testing method, which is applied to a control device, and the method includes:

[0005] Acquire target test related information of the device under test; wherein the target test related information includes: parameters of the device under test and test process information corresponding to the parameters of the device under test;

[0006] Sending a control instruction to the test fixture equipment according to the target test related information; wherein the control instruction is used to instruct the test fixture equipment to adjust the uplink or downlink channel state of the device under test;

[0007] The test instrument is controlled to execute the test process of the device under test according to the test flow information; wherein the test instrument comprises: a signal source for testing the input signal of the device under test and / or a signal analyzer for testing the output signal of the device under test.

[0008] Optionally, obtaining target test related information of the device under test includes:

[0009] receiving a selection instruction from a user to select target test related information from a plurality of preconfigured test related information;

[0010] According to the selection instruction, target test related information of the device under test is determined.

[0011] Optionally, controlling the test instrument to execute a test process on the device under test according to the test flow information includes:

[0012] After sending a control instruction to the test fixture equipment, verifying connectivity among the test fixture equipment, the device under test, and the test instrument;

[0013] When the connectivity verification between the test fixture equipment, the device under test and the test instrument is passed, the test instrument is controlled to execute the test process of the device under test according to the test flow information.

[0014] Optionally, the testing method further includes:

[0015] Display the test process and test results of the device under test;

[0016] and / or,

[0017] The test results of the device under test are uploaded to the server.

[0018] To achieve the above object, an embodiment of the present application provides a testing method, which is applied to testing tooling equipment, and the method includes:

[0019] Receive control instructions sent by the control device;

[0020] According to the control instruction, the uplink or downlink channel state of the device under test is adjusted.

[0021] Optionally, adjusting the uplink or downlink channel state of the device under test according to the control instruction includes:

[0022] According to the control instruction, power is supplied to the device under test and the switch matrix in the test fixture, and the switch matrix is ​​controlled to adjust the uplink or downlink channel state of the device under test;

[0023] The switch matrix connects the communication port of the device under test and a test instrument, and the test instrument includes: a signal source for testing an input signal of the device under test and / or a signal analyzer for testing an output signal of the device under test.

[0024] To achieve the above-mentioned purpose, an embodiment of the present application provides a test system, including: a control device, a test fixture, and a test instrument; wherein:

[0025] The control device is connected to the test fixture device and is used to send control instructions to the test fixture device;

[0026] The communication port of the test fixture equipment is connected to the communication port of the device under test, and the radio frequency port of the test fixture equipment is connected to the test instrument, and is used to adjust the uplink or downlink channel state of the device under test according to the control instruction;

[0027] The control device is connected to the test instrument and is used to control the test instrument to perform a test process on the device under test;

[0028] Wherein, the test instrument comprises: a signal source for testing the input signal of the device under test and / or a signal analyzer for testing the output signal of the device under test.

[0029] Optionally, the control device supports configuring multiple test related information of the device under test, supports a user to visually select the test related information, and supports displaying at least one of a test process and a test result of the device under test;

[0030] The test related information includes: parameters of the device under test, and / or test process information corresponding to the parameters of the device under test.

[0031] Optionally, the test fixture equipment includes: a main control chip and a switch matrix;

[0032] The switch matrix has a first RF channel, a second RF channel, a third RF channel and a fourth RF channel; wherein the first RF channel connects the RF input port of the test fixture equipment and the base station communication port, the second RF channel connects the RF output port of the test fixture equipment and the terminal communication port, the third RF channel connects the RF input port and the terminal communication port, and the fourth RF channel connects the RF output port and the base station communication port; the RF input port is connected to the signal source, the RF output port is connected to the signal analyzer, the base station communication port is connected to the base station communication port of the device under test, and the terminal communication port is connected to the terminal communication port of the device under test;

[0033] The main control chip is connected to the switch matrix, and is used to receive a control instruction of the control device, and according to the control instruction, adjust the device under test to a downlink channel state while controlling the first radio frequency channel and the second radio frequency channel to be turned on and the third radio frequency channel and the fourth radio frequency channel to be turned off; or adjust the device under test to an uplink channel state while controlling the third radio frequency channel and the fourth radio frequency channel to be turned on and the first radio frequency channel and the second radio frequency channel to be turned off.

[0034] Optionally, the test fixture equipment further includes: a power supply module and an indication module;

[0035] The main control chip is connected to the power module and the indication module respectively, and is used to control the power module to supply power to the switch matrix and / or the device under test, and to control the indication module to display the uplink or downlink channel status of the device under test.

[0036] Optionally, the test system further includes: a switch and a server;

[0037] The control device is connected to the test instrument through the switch, and is used to control the test instrument to execute the test process on the device under test through the switch;

[0038] The control device is connected to the server, and the control device reports the measurement result of the device under test to the server.

[0039] To achieve the above object, an embodiment of the present application provides a control device, including:

[0040] An acquisition module, used to acquire target test related information of the device under test; wherein the target test related information includes: parameters of the device under test and test process information corresponding to the parameters of the device under test;

[0041] A sending module, used to send a control instruction to the test fixture equipment according to the target test related information; wherein the control instruction is used to instruct the test fixture equipment to adjust the uplink or downlink channel state of the device under test;

[0042] A control module is used to control the test instrument to execute the test process of the device under test according to the test flow information; wherein the test instrument includes: a signal source for testing the input signal of the device under test and / or a signal analyzer for testing the output signal of the device under test.

[0043] To achieve the above-mentioned purpose, an embodiment of the present application provides a control device, including: a transceiver, a processor, a memory, and a program or instruction stored in the memory and executable on the processor; when the processor executes the program or instruction, the steps of the test method described above are implemented.

[0044] To achieve the above-mentioned purpose, an embodiment of the present application provides a test tooling device, comprising:

[0045] A receiving module, used for receiving control instructions sent by a control device;

[0046] The adjustment module is used to adjust the uplink or downlink channel state of the device under test according to the control instruction.

[0047] To achieve the above-mentioned objectives, an embodiment of the present application provides a test tooling equipment, including: a transceiver, a processor, a memory, and a program or instruction stored in the memory and executable on the processor; when the processor executes the program or instruction, the steps of the test method described above are implemented.

[0048] To achieve the above objectives, an embodiment of the present application provides a readable storage medium on which a program or instruction is stored. When the program or instruction is executed by a processor, the steps of the testing method described above are implemented.

[0049] To achieve the above objectives, an embodiment of the present application provides a computer program product, including computer instructions, which implement the steps of the above-mentioned testing method when executed by a processor.

[0050] The beneficial effects of the above technical solution of the present application are as follows:

[0051] In an embodiment of the present application, by obtaining target test related information such as the device parameters of the device under test and the test process information corresponding to the device parameters under test, and based on the target test related information, the test tooling equipment can be controlled to adjust the uplink channel state and the downlink channel state of the device under test, that is, when the device under test is tested, the automatic switching of the uplink channel state and the downlink channel state can be achieved, reducing the tedious operation of manual switching, and the test instrument can be controlled to execute the corresponding test process for the uplink channel state and the downlink channel state of the device under test, thereby realizing the automated testing process of the device under test, reducing the manual operation process, reducing the cost and manual requirements of manual testing, improving the testing efficiency, and avoiding the inaccurate test results caused by manual operation. BRIEF DESCRIPTION OF THE DRAWINGS

[0052] Figure 1 A flowchart of a control device side testing method according to an embodiment of the present application;

[0053] Figure 2 A flowchart of a test tool equipment side test method according to an embodiment of the present application;

[0054] Figure 3 This is one of the schematic diagrams of the architecture of the test system according to an embodiment of the present application;

[0055] Figure 4 This is a second schematic diagram of the architecture of the test system according to an embodiment of the present application;

[0056] Figure 5 A flowchart of the test system working according to an embodiment of the present application;

[0057] Figure 6 A schematic diagram of the architecture of the automated testing software of an embodiment of the present application;

[0058] Figure 7 A schematic diagram of a test sequence flow generated by a test flow editor in an embodiment of the present application;

[0059] Figure 8 This is a schematic diagram of the structure of the test fixture equipment of the embodiment of the present application;

[0060] Fig. 9 A schematic diagram of the structure of a switch matrix according to an embodiment of the present application;

[0061] Fig.10 One of the block diagrams of the control device of the embodiment of the present application;

[0062] Fig.11 This is the second block diagram of the control device of the embodiment of the present application;

[0063] Fig.12 This is one of the block diagrams of the test fixture equipment of the embodiment of the present application;

[0064] Fig.13 This is the second block diagram of the test tooling equipment according to an embodiment of the present application. DETAILED DESCRIPTION

[0065] In order to make the technical problems, technical solutions and advantages to be solved by the present application clearer, a detailed description will be given below with reference to the accompanying drawings and specific embodiments.

[0066] It should be understood that the references to "one embodiment" or "an embodiment" throughout the specification mean that the specific features, structures, or characteristics associated with the embodiment are included in at least one embodiment of the present application. Therefore, the references to "in one embodiment" or "in an embodiment" appearing throughout the specification do not necessarily refer to the same embodiment. In addition, these specific features, structures, or characteristics may be combined in any suitable manner in one or more embodiments.

[0067] In the various embodiments of the present application, it should be understood that the size of the serial numbers of the following processes does not mean the order of execution. The execution order of each process should be determined by its function and internal logic, and should not constitute any limitation on the implementation process of the embodiments of the present application.

[0068] Additionally, the terms "system" and "network" are often used interchangeably herein.

[0069] In the embodiments provided in the present application, it should be understood that "B corresponding to A" means that B is associated with A, and B can be determined according to A. However, it should also be understood that determining B according to A does not mean determining B only according to A, and B can also be determined according to A and / or other information.

[0070] like Figure 1As shown, an embodiment of the present application provides a testing method, which is applied to a control device, and the method includes the following steps:

[0071] Step 1-1: Obtain target test related information of the device under test; wherein the target test related information includes: parameters of the device under test and test process information corresponding to the parameters of the device under test.

[0072] Optionally, the target test related information may be pre-configured on the control device, or may be selected and determined by the user from one or more pre-configured test related information based on a visual interface supported by the control device, or may be input by the user based on a visual interface supported by the control device, etc. The embodiments of the present application are not limited to this.

[0073] Optionally, the device under test may be a repeater type device, and the parameters of the device under test include but are not limited to at least one of the following: device model of the device under test, test index items and index requirements of the device under test, test environment of the device under test, test time of the device under test, and related information of the test instrument of the device under test.

[0074] Optionally, the test process information includes, but is not limited to: the logic of the test method (or the strategy of the test process, etc.), but the embodiments of the present application are not limited thereto.

[0075] Step 1-2: Send a control instruction to a test fixture device according to the target test related information; wherein the control instruction is used to instruct the test fixture device to adjust the uplink or downlink channel status of the device under test.

[0076] Optionally, the device under test may have a base station communication port (BTS) and a terminal communication port (ANT), wherein the base station communication port is used to communicate with the base station side and can be used as the downlink input port and uplink output port of the device under test; the terminal communication port is used to communicate with the user terminal and can be used as the uplink input port and downlink output port of the device under test.

[0077] Optionally, the test fixture equipment may have an automatic switching function between an uplink channel and a downlink channel, and the test fixture equipment has a base station communication port corresponding to the base station communication port of the device under test, and a terminal communication port corresponding to the terminal communication port of the device under test, and a radio frequency input port (RFIN) and a radio frequency output port (RFOUT) for connecting to a test instrument. Wherein, the test instrument includes: a signal source for testing the input signal of the device under test and / or a signal analyzer for testing the output signal of the device under test, then the signal source can be connected to the radio frequency input port, and the signal analyzer can be connected to the radio frequency output port.

[0078] Optionally, the control device may be a personal computer (PC) or computer installed with an automated test system including a process editor, or the control device may also be an industrial computer installed with an automated test system including a process editor or may also be referred to as a host computer, etc. Specifically, based on the control instructions of the control device, the test fixture equipment may adjust the uplink or downlink channel state of the device under test by adjusting the conduction relationship between its internal base station communication port, terminal communication port, RF input port and RF output port. For example, the downlink channel state may be: from the signal source through the RF input port and the base station communication port to the device under test, and from the device under test through the terminal communication port and the RF output port to the signal analyzer; wherein, the process from the signal source through the RF input port and the base station communication port to the device under test may also be referred to as the downlink receiving state of the device under test, and the process from the device under test through the terminal communication port and the RF output port to the signal analyzer may also be referred to as the downlink transmitting state of the device under test. For example, the uplink channel state can be: from the signal source through the RF input port and the terminal communication port to the device under test, and from the device under test through the base station communication port and the RF output port to the signal analyzer; wherein, the process from the signal source through the RF input port and the terminal communication port to the device under test can also be called the uplink receiving state of the device under test, and the process from the device under test through the base station communication port and the RF output port to the signal analyzer can also be called the uplink transmitting state of the device under test.

[0079] Step 1-3: Control the test instrument to execute the test process on the device under test according to the test flow information.

[0080] Optionally, the test process information includes a test method process for testing the device under test, and the control device can control the test instrument to perform the test according to the test process of the device under test and obtain the test result.

[0081] In an embodiment of the present application, by obtaining target test related information such as device parameters of the device under test and / or test process information corresponding to the device under test parameters, and based on the target test related information, the test tooling equipment can be controlled to adjust the uplink channel state and the downlink channel state of the device under test, that is, when the device under test is tested, the uplink channel state and the downlink channel state can be automatically switched, reducing the tedious operation of manual switching, and the test instrument can be controlled to execute the corresponding test process for the uplink channel state and the downlink channel state of the device under test, thereby realizing the automated test process of the device under test, reducing the manual operation process, reducing the cost and manual requirements of manual testing, improving the test efficiency, and avoiding the inaccurate test results caused by manual operation.

[0082] Optionally, obtaining target test related information of the device under test includes:

[0083] receiving a selection instruction from a user to select target test related information from a plurality of preconfigured test related information;

[0084] According to the selection instruction, target test related information of the device under test is determined.

[0085] For example: the control device can support the configuration of multiple test-related information of the device under test and support the user to visually select the test-related information. In this way, the control device can pre-configure multiple types of devices under test and corresponding multiple test-related information, etc., and provide users (or testers) with selection or input through a visual interface. It has high flexibility and high expansion and usability, strong versatility, and can be compatible with multiple types of devices under test for testing, avoiding the need for users to manually input test-related information of the device under test or the single type of device under test corresponding to the pre-configured test-related information, resulting in limited testing and low testing efficiency.

[0086] For example, the control device can provide different types of test-related information for users to choose from, such as: for the device model of the device to be tested, multiple device models can be pre-configured for the user to select or input according to the actual type of the device to be tested; for the test index items and index requirements of the device to be tested, multiple test index items and index requirements are pre-configured for each device signal, for the user to select or input according to the actual test index items and index requirements; for the test environment and test time of the device to be tested, multiple test environments can be pre-configured for the user to select according to the actual test environment and test time (or the test environment and test time can also be customized by the user, etc.) or input; for the test instrument-related information of the device to be tested, multiple test instrument-related information can be pre-configured for the user to select or input according to the actual device to be tested and / or the test index items and index requirements to be tested.

[0087] Optionally, the information related to the test instruments includes, but is not limited to: the number of test instruments, the type or function of the test instruments, the capability parameters of the test instruments, etc., but the embodiments of the present application are not limited thereto.

[0088] Optionally, controlling the test instrument to execute a test process on the device under test according to the test flow information includes:

[0089] After sending a control instruction to the test fixture equipment, verifying connectivity among the test fixture equipment, the device under test, and the test instrument;

[0090] When the connectivity verification between the test fixture equipment, the device under test and the test instrument is passed, the test instrument is controlled to execute the test process of the device under test according to the test flow information.

[0091] Specifically, the control device is connected to the test fixture device, and is used to send control instructions to the test fixture device to adjust the uplink or downlink channel state of the device under test, and the control device is connected to the test meter, and is used to control the test meter to perform the test process of the device under test. Among them, the test fixture device is connected to the device under test and the test meter respectively, and is used to adjust the uplink or downlink channel state between the device under test and the test meter. After the control device sends the control instruction to the test fixture device, the test fixture device adjusts the corresponding uplink or downlink channel state. When the control device verifies that the test fixture device, the device under test, and the test meter meet the connectivity requirements (i.e., the verification is passed), the test meter is controlled to perform the test process of the device under test according to the test process information, so as to avoid the test result error caused by the test fixture device, the device under test, and the test meter being not connected, and reduce the occurrence of test errors.

[0092] Optionally, the testing method further includes:

[0093] Display the test process and test results of the device under test;

[0094] and / or,

[0095] The test results of the device under test are uploaded to the server.

[0096] For example, the control device can support a visual interface to display the test process and test results of the device under test, so that when the control device controls the test instrument to perform the test on the device under test according to the test process information, it can provide the user with information about the test progress and intuitively obtain the test results. Alternatively, the control device can also upload the test results of the device under test to a server for storage or data analysis, etc., and the embodiments of the present application are not limited thereto.

[0097] like Figure 2 As shown, an embodiment of the present application provides a testing method, which is applied to testing tooling equipment, and the method includes the following steps:

[0098] Step 2-1: Receive a control instruction sent by a control device;

[0099] Step 2-2: According to the control instruction, adjust the uplink or downlink channel state of the device under test.

[0100] It should be noted that the above-mentioned testing method in the embodiment of the present application and the testing method on the above-mentioned control device side are based on the same inventive concept. The two embodiments can refer to each other and can achieve the same technical effect. The repetitive parts of the two will not be repeated.

[0101] Optionally, adjusting the uplink or downlink channel state of the device under test according to the control instruction includes:

[0102] According to the control instruction, power is supplied to the device under test and the switch matrix in the test fixture, and the switch matrix is ​​controlled to adjust the uplink or downlink channel state of the device under test;

[0103] The switch matrix connects the communication port of the device under test and a test instrument, and the test instrument includes: a signal source for testing an input signal of the device under test and / or a signal analyzer for testing an output signal of the device under test.

[0104] Optionally, the device under test may have a base station communication port (BTS) and a terminal communication port (ANT), wherein the base station communication port is used to communicate with the base station side and can be used as the downlink input port and uplink output port of the device under test; the terminal communication port is used to communicate with the user terminal and can be used as the uplink input port and downlink output port of the device under test.

[0105] The test fixture equipment has a base station communication port corresponding to the base station communication port of the device under test, and a terminal communication port corresponding to the terminal communication port of the device under test, and has a radio frequency input port (RFIN) and a radio frequency output port (RFOUT) for connecting to a test instrument. Wherein, the switch matrix in the test fixture equipment has a first radio frequency channel, a second radio frequency channel, a third radio frequency channel and a fourth radio frequency channel; the first radio frequency channel connects the radio frequency input port of the test fixture equipment and the base station communication port, the second radio frequency channel connects the radio frequency output port of the test fixture equipment and the terminal communication port, the third radio frequency channel connects the radio frequency input port and the terminal communication port, and the fourth radio frequency channel connects the radio frequency output port and the base station communication port.

[0106] Wherein, the test instrument includes: a signal source for testing the input signal of the device under test and / or a signal analyzer for testing the output signal of the device under test, and the signal source can be connected to the RF input port, and the signal analyzer can be connected to the RF output port.

[0107] Specifically, based on the control instructions of the control device, the test fixture equipment can adjust the uplink or downlink channel state of the device under test by adjusting the switch states of the first RF channel, the second RF channel, the third RF channel and the fourth RF channel in the switch matrix. For example, when the first RF channel and the second RF channel are turned on, and the third RF channel and the fourth RF channel are turned off, the device under test is in the downlink channel state, and the specific transmission path is: signal source → RF input port → first RF channel → base station communication port → device under test → terminal communication port → second RF channel → RF output port → signal analyzer; wherein, the process from signal source → RF input port → first RF channel → base station communication port → device under test can also be called the downlink receiving state of the device under test, and the process from device under test → terminal communication port → second RF channel → RF output port → signal analyzer can also be called the downlink transmitting state of the device under test. For example, when the first RF channel and the second RF channel are turned off, and the third RF channel and the fourth RF channel are turned on, the device under test is in the uplink channel state, and the specific transmission path can be: signal source→RF input port→third RF channel→terminal communication port→device under test→base station communication port→fourth RF channel→RF output port→signal analyzer; wherein, the process from signal source→RF input port→third RF channel→terminal communication port→device under test can also be referred to as the uplink receiving state of the device under test, and the process from device under test→base station communication port→fourth RF channel→RF output port→signal analyzer can also be referred to as the uplink transmitting state of the device under test.

[0108] like Figure 3 As shown, the embodiment of the present application provides a test system, including: a control device 31, a test tooling device 32, and a test instrument 33; wherein,

[0109] The control device 31 is connected to the test fixture device 32 and is used to send control instructions to the test fixture device 32;

[0110] The communication port of the test fixture equipment 32 is connected to the communication port of the device under test 30, and the radio frequency port of the test fixture equipment 32 is connected to the test instrument 33, which is used to adjust the uplink or downlink channel state of the device under test 30 according to the control instruction;

[0111] The control device 31 is connected to the test instrument 33 and is used to control the test instrument 33 to perform a test process on the device under test;

[0112] The test instrument 33 includes: a signal source for testing the input signal of the device under test and / or a signal analyzer for testing the output signal of the device under test. Figure 4As shown, the signal source may also be referred to as a first test instrument 331 , and the signal analyzer may also be referred to as a second test instrument 332 .

[0113] Alternatively, if Figure 4 As shown, the test system further includes: a switch 34 and a server 35;

[0114] The control device 31 is connected to the test instrument 33 via the switch 34, and is used to control the test instrument 33 to perform a test process on the device under test 30 via the switch 34;

[0115] The control device 31 is connected to the server 35 , and the control device 31 reports the measurement result of the device under test 30 to the server 35 .

[0116] For example, the server 35 may be a local area network server or a cloud server, but the embodiments of the present application are not limited thereto.

[0117] Specifically, the base station communication port and the terminal communication port of the device under test 30 can be connected to the test fixture device 32 by using a radio frequency cable. Optionally, the device under test 30 can also be connected to the control device 31 through a universal serial bus (USB); the first test instrument 331 and the second test instrument 332 can be connected to the test fixture device 32 by using a radio frequency cable, and the test fixture device 32 can be connected to the control device 31 by using a USB to serial port cable; the control device 31 can be connected to the server 35 by using a network cable or WIFI, and the control device 31 can control the first test instrument 331 and the second test instrument 332 through a switch 34. Among them, the control device 31 and the switch 34, the first test instrument 331 and the second test instrument 332 can all be connected by network cables.

[0118] The automated test software (or program code) can be installed in the control device 31, and the control device 31 can control the first test instrument 331 and the second test instrument 332 through the switch 34 in the form of network port communication to set the test parameters; the control device 31 can be connected to the test fixture device 32 through the serial port protocol to control the test fixture device 32 to switch the uplink or downlink channel state of the device under test 30. Optionally, the control device 31 can also control the device under test 30 through the USB control line, set the device under test to enter different test states (such as uplink or downlink channel state), and after the test is completed, the automated test software (or program code) in the control device 31 can save the data to the server 35 through the network connection.

[0119] like Figure 5As shown, a flowchart of the test system operation is given, with the control device 31 as the center, installing the automated test software (or program code), and visualizing the operation interface. Specifically, the following steps are included:

[0120] Step 5-1: The test starts, input the model of the repeater equipment to be tested;

[0121] Specifically, the control device 31 may pre-configure multiple types of repeater device models and provide user selection through a visual interface, that is, the user may input the repeater device model to be tested through a selection operation in the visual interface of the control device 31 .

[0122] Step 5-2: Confirm the test index items and index requirements of the equipment to be tested;

[0123] Specifically, the control device 31 can pre-configure a variety of test index items and index requirements corresponding to the repeater type equipment model, and provide user selection through a visual interface, that is, the user can input the test index items and index requirements corresponding to the repeater type equipment model to be tested determined in step 5-1 through selection operations in the visual interface of the control device 31.

[0124] Step 5-3: The control device 31 verifies the connectivity among the test fixture device 32, the first test instrument 331 and the second test instrument 332, and the device under test 30;

[0125] Step 5-4: Retrieve the test process of the corresponding indicator of the corresponding device model in the process editor;

[0126] Specifically, the control device 31 can retrieve the corresponding test process information in the process editor according to the repeater device model to be tested determined in step 5-1 and the test index items and index requirements determined in step 5-2.

[0127] Step 5-5: the device under test 30 switches the test state (i.e., the uplink or downlink channel state), the test fixture 32 locks the test channel, and the first test instrument 331 and the second test instrument 332 run according to the test flow in step 5-4 to perform the test process on the device under test 30;

[0128] Step 5-6: The control device 31 reads the test result and uploads the test result to the server 35 for storage;

[0129] Furthermore, the control device 31 controls the test tooling equipment 32 to switch the test state of the device under test 30 (for example, switching from the downlink channel state to the uplink channel state, or from the uplink channel state to the downlink channel state, etc.), and calls the test process of the corresponding test channel in the process editor; repeats steps 5-5 and 5-6, and the test ends.

[0130] Optionally, the control device 31 supports configuring multiple test related information of the device under test, supports a user to visually select the test related information, and supports displaying at least one of a test process and a test result of the device under test;

[0131] The test related information includes: parameters of the device under test, and / or test process information corresponding to the parameters of the device under test.

[0132] For example, the control device 31 can configure multiple test-related information of the device under test, support users to visually select the test-related information, and support displaying at least one of the test process and test results of the device under test through the installed automated testing software (or program code).

[0133] like Figure 6 As shown, the automated testing software (or program code) consists of a basic platform, a business logic module, an application management module, and a user operation module; among them,

[0134] The basic platform is the lowest-level service program of the automated testing software (or program code), with built-in multiple protocol parsing codes and testing tool codes;

[0135] The business logic module is the middleware of the automated testing software (or program code), which implements test method management, product management, etc. It includes the logic of the test method, the graphical visualization operation interface code and component design; as well as the code support for the management of the full set of product indicators and requirements, and the test method call logic support;

[0136] The application management module provides code support for test items and instrument allocation to cope with the different test index items and index requirements of different repeater equipment, and can reasonably allocate test time and test instruments according to different test environments;

[0137] The user operation module provides code and logic support for test management and data management, and provides a visual operation interface for intuitively viewing the test process and test results.

[0138] The control device 31 on which the automated testing software (or program code) is installed is used as the center, and the automated testing realized can be performed by software programmers to maintain the basic platform, and the testers to operate and maintain the business logic module, application management module, and user operation module, thereby reducing the maintenance cost of developers and the requirements for manual operation. Specifically, software programmers can use the test process editor at the business logic layer to define specific test methods and test logic, and in product management, the established test process is matched one by one with the test items, so that in the subsequent test process, the program can call the test process at the user operation layer.

[0139] like Figure 7 As described above, a schematic diagram of a test flow editor generating a test sequence flow is provided. Specifically, the test flow editor can adopt a visual interface, which mainly includes the following functions:

[0140] Controls for interactive commands with test instruments, such as supporting network port protocols and scalable support for GPIB protocols, etc.

[0141] String processing controls, for example, can support serial port protocols, southbound interface protocols, and multiple custom interface protocols, and can be used for string parsing and processing;

[0142] Mathematical processing tools, such as simple mathematical calculations, logical calculations, array definitions, and data processing functions;

[0143] Variable definition tools, such as: constants, variables and global variables can be defined;

[0144] Conditional and looping functions.

[0145] The test flow editor uses a visual interface. Through the visual interface, testers only need to focus on the test business logic, without having to have high programming skills. Through the toolbar of the visual test flow editor, testers can achieve complex logical functions through simple operations. Testers only need to drag the corresponding test controls to the workspace according to the test requirements, fill in simple control instructions, and then make full use of conditions and loop functions to complete the programming of complex logic. They can also call different string processing controls to adapt to different serial port protocols of different devices, and even use the message window to realize pop-up prompts during the test process.

[0146] Optionally, the test flow editor can also support the real-time debugging function of the editing interface, and the tester can promptly discover and correct the errors in the programming process, and can track the variables in the test, so that the tester can intuitively understand the progress of the test execution, and save the log data in the debugging in real time to avoid missing some occasional vulnerabilities (BUG). For example: for the test items that there are no personnel to watch during the test process, the tester can also design a simple test program through the test flow editor, use the flow editor to perform simple tests, and reduce the cost of personnel supervision. Optionally, the test flow editor can support the execution of the test in the editing interface and save the data, such as the data format can be EXCEL format. Of course, the test flow editor can also support the output of multiple test results, such as multiple groups of data, strings, arrays and EXCEL tables, etc., and can also support the tester according to the test requirements, select different data output methods, save data, and the embodiment of the present application is not limited thereto.

[0147] Taking into account the similarity of the test types of repeater-type equipment, the test system in the embodiment of the present application has a relatively stable basic platform when applied to the test of repeater-type equipment. During the long-term use of the system, the number and difficulty of maintenance can be reduced. The test personnel only need to modify the test process and test instruments through the test process editor to adapt to the testing requirements of different products and reduce maintenance costs.

[0148] Alternatively, if Figure 8 and Fig. 9 As shown, the test fixture equipment 32 includes: a main control chip (MCU) 321 and a switch matrix 322;

[0149] The switch matrix 322 has a first RF channel RF1, a second RF channel RF2, a third RF channel RF3 and a fourth RF channel RF4; wherein the first RF channel RF1 is connected to the RF input port RFIN of the test fixture equipment 32 and the base station communication port BTS, the second RF channel RF2 is connected to the RF output port RFOUT of the test fixture equipment 32 and the terminal communication port ANT, the third RF channel RF3 is connected to the RF input port RFIN and the terminal communication port ANT, and the fourth RF channel RF4 is connected to the RF output port RFOUT and the base station communication port BTS; the RF input port RFIN is connected to the signal source (i.e., the first test instrument 331), the RF output port RFOUT is connected to the signal analyzer (i.e., the second test instrument 332), the base station communication port BTS is connected to the base station communication port of the device under test 30, and the terminal communication port ANT is connected to the terminal communication port of the device under test 30;

[0150] The main control chip 321 is connected to the switch matrix 322, and is used to receive a control instruction from the control device 31, and according to the control instruction, adjust the device under test 30 to a downlink channel state while controlling the first radio frequency channel RF1 and the second radio frequency channel RF2 to be turned on and the third radio frequency channel RF3 and the fourth radio frequency channel RF4 to be turned off; or, adjust the device under test 30 to an uplink channel state while controlling the third radio frequency channel RF3 and the fourth radio frequency channel RF4 to be turned on and the first radio frequency channel RF1 and the second radio frequency channel RF2 to be turned off.

[0151] Optionally, the test fixture equipment 32 further includes: a power supply module 323 and an indication module 324;

[0152] The main control chip 321 is connected to the power module 323 and the indication module 324 respectively, and is used to control the power module 323 to supply power to the switch matrix 322 and / or the device under test 30, and to control the indication module 324 to display the uplink or downlink channel status of the device under test 30.

[0153] Specifically, the main control chip 321 can receive the serial port command of the automated test software (or program code) of the control device 31 through a USB to serial port cable, so as to control the RF channel switch state of the switch matrix 322 in the test fixture equipment 32; when the main control chip 321 receives the serial port command, it controls the power supply module 323 to supply power to the corresponding RF channel (or switch) in the switch matrix 322, and / or controls the power supply module 323 to supply power to the device; the indication module 324 can also be controlled by the main control chip 321 to synchronously indicate the channel state of the test fixture equipment 32 (that is, to indicate the current uplink channel state or downlink channel state of the device under test 30).

[0154] Among them, the switch matrix 322 can cope with a variety of test environments, ensure accurate and stable testing, and adopt a low insertion loss, high isolation active RF switch cascade mode to achieve the switching of the device under test 30 between the uplink channel state or the downlink channel state. For example: the switch matrix 322 has a state where RF1 and RF2 are turned on and RF3 and RF4 are turned off; and a state where RF1 and RF2 are turned off when RF3 and RF4 are turned on; the connection switching of the switch matrix 322 realizes the automatic conversion of the test of the repeater type equipment in different uplink and downlink states.

[0155] For example, when testing the downlink channel of the device under test, the transmission path of the RF signal is:

[0156] Signal source → RFIN → RF1 → BTS → device under test → ANT → RF2 → RFOUT → signal analyzer;

[0157] For example, when testing the uplink channel of the device under test, the transmission path of the RF signal is:

[0158] Signal source → RFIN → RF3 → ANT → device under test → BTS → RF4 → RFOUT → signal analyzer.

[0159] Optionally, when designing the switch matrix 322 , the isolation between each RF channel can be designed to be greater than 150 dB, so as to prevent the device under test 30 from being affected by the test fixture equipment 32 and causing self-excitation during the test process.

[0160] In the test system in the embodiment of the present application, a tooling structure of a multi-stage cascade switch with a simple structure and low cost is adopted to avoid the use of complex circuits and high-cost devices, ensure the isolation requirements between the test ports, avoid self-excitation of the upstream and downstream channels, and achieve the test effect of automatic switching of the upstream and downstream ports of the device under test, which can avoid the shortcomings of frequent manual line changes, low test efficiency, and excessive personnel investment, and provide a reliable hardware foundation for efficient automated testing. In addition, the test system also reduces the difficulty of test process editing operations through a simple process editing mode implemented by a test process editor, provides various protocol support and external interfaces, can support various types of test instruments, and reduce the maintenance and development costs of subsequent automated test programs, realizing the high modularity of the automated test system and the subsequent scalability and applicability, and reducing the technical requirements for programmers.

[0161] like Fig.10 As shown, a control device 1000 in an embodiment of the present application includes:

[0162] The acquisition module 1010 is used to acquire target test related information of the device under test; wherein the target test related information includes: parameters of the device under test and test process information corresponding to the parameters of the device under test;

[0163] The sending module 1020 is used to send a control instruction to the test fixture equipment according to the target test related information; wherein the control instruction is used to instruct the test fixture equipment to adjust the uplink or downlink channel state of the device under test;

[0164] The control module 1030 is used to control the test instrument to execute the test process of the device under test according to the test process information; wherein the test instrument includes: a signal source for testing the input signal of the device under test and / or a signal analyzer for testing the output signal of the device under test.

[0165] Optionally, the acquisition module 1010 is further used for:

[0166] receiving a selection instruction from a user to select target test related information from a plurality of preconfigured test related information;

[0167] According to the selection instruction, target test related information of the device under test is determined.

[0168] Optionally, the control module 1030 is further configured to:

[0169] After sending a control instruction to the test fixture equipment, verifying connectivity among the test fixture equipment, the device under test, and the test instrument;

[0170] When the connectivity verification between the test fixture equipment, the device under test and the test instrument is passed, the test instrument is controlled to execute the test process of the device under test according to the test flow information.

[0171] Optionally, the control device 1000 further includes:

[0172] A display module, used to display the test process and test results of the device under test;

[0173] and / or,

[0174] The uploading module is used to upload the test result of the device under test to the server.

[0175] It should be noted that the control device of the embodiment of the present application can implement the various embodiments of the above-mentioned control device side testing method and can achieve the same technical effect. In order to avoid repetition, it will not be repeated here.

[0176] A control device according to another embodiment of the present application, such as Fig.11 As shown, it includes a transceiver 1110, a processor 1100, a memory 1120, and a program or instruction stored in the memory 1120 and executable on the processor 1100; when the processor 1100 executes the program or instruction, the steps of the above-mentioned test method applied to the control device side are implemented, and the same technical effect can be achieved. To avoid repetition, it will not be repeated here.

[0177] The transceiver 1110 is used to receive and send data under the control of the processor 1100 .

[0178] Among them, Fig.11 In the embodiment, the bus architecture may include any number of interconnected buses and bridges, specifically linking together various circuits of one or more processors represented by processor 1100 and memory represented by memory 1120. The bus architecture may also link together various other circuits such as peripherals, voltage regulators, and power management circuits, which are well known in the art and are therefore not further described herein. The bus interface provides an interface. The transceiver 1110 may be a plurality of components, namely, a transmitter and a receiver, providing a unit for communicating with various other devices over a transmission medium.

[0179] The processor 1100 is responsible for managing the bus architecture and general processing, and the memory 1120 can store data used by the processor 1100 when performing operations.

[0180] like Fig.12 As shown, the embodiment of the present application provides a test tooling device 1200, including:

[0181] The receiving module 1210 is used to receive a control instruction sent by a control device;

[0182] The adjustment module 1220 is used to adjust the uplink or downlink channel state of the device under test according to the control instruction.

[0183] Optionally, the adjustment module 1220 is further configured to:

[0184] According to the control instruction, power is supplied to the device under test and the switch matrix in the test fixture, and the switch matrix is ​​controlled to adjust the uplink or downlink channel state of the device under test;

[0185] The switch matrix connects the communication port of the device under test and a test instrument, and the test instrument includes: a signal source for testing an input signal of the device under test and / or a signal analyzer for testing an output signal of the device under test.

[0186] It should be noted that the test fixture equipment of the embodiment of the present application can implement the various embodiments of the above-mentioned test fixture equipment side test method and can achieve the same technical effect. In order to avoid repetition, it will not be repeated here.

[0187] A test tooling device according to another embodiment of the present application, such as Fig.13 As shown, it includes a transceiver 1310, a processor 1300, a memory 1320, and a program or instruction stored in the memory 1320 and executable on the processor 1300; when the processor 1300 executes the program or instruction, the steps of the test method applied to the test tooling equipment side are implemented, and the same technical effect can be achieved. To avoid repetition, it will not be repeated here.

[0188] The transceiver 1310 is used to receive and send data under the control of the processor 1300 .

[0189] Among them, Fig.13 In the embodiment, the bus architecture may include any number of interconnected buses and bridges, specifically linking together various circuits of one or more processors represented by processor 1300 and memory represented by memory 1320. The bus architecture may also link together various other circuits such as peripherals, voltage regulators, and power management circuits, which are well known in the art and are therefore not further described herein. The bus interface provides an interface. The transceiver 1310 may be a plurality of components, namely, a transmitter and a receiver, providing a unit for communicating with various other devices on a transmission medium. The processor 1300 is responsible for managing the bus architecture and general processing, and the memory 1320 may store data used by the processor 1300 when performing operations.

[0190] A readable storage medium according to an embodiment of the present application stores a program or instruction thereon, which, when executed by a processor, implements the steps in the test method on the control device side as described above, or, when executed by a processor, implements the steps in the test method on the test fixture equipment side as described above, and can achieve the same technical effect. To avoid repetition, it will not be repeated here.

[0191] An embodiment of the present application also provides a computer program product, including computer instructions, which, when executed by a processor, implement the steps in the test method on the control device side, or, when executed by a processor, implement the steps in the test method on the test tooling equipment side, and can achieve the same technical effect. To avoid repetition, it will not be repeated here.

[0192] The processor is a processor in the control device or test fixture device described in the above embodiments. The readable storage medium includes a computer readable storage medium, such as a computer read-only memory (ROM), a random access memory (RAM), a magnetic disk or an optical disk, etc.

[0193] It should be further explained that the terminals described in this specification include but are not limited to smart phones, tablet computers, etc., and many of the functional components described are called modules in order to more particularly emphasize the independence of their implementation methods.

[0194] In the embodiment of the present application, module can be implemented with software so that it can be executed by various types of processors. For example, an executable code module of an identification can include one or more physical or logical blocks of computer instructions, for example, it can be constructed as an object, process or function. Nevertheless, the executable code of the identified module does not need to be physically located together, but can include different instructions stored in different positions, and when these instructions are logically combined together, it constitutes a module and realizes the specified purpose of the module.

[0195] In fact, executable code module can be a single instruction or many instructions, and can even be distributed on a plurality of different code segments, distributed among different programs, and distributed across a plurality of memory devices. Similarly, operating data can be identified in the module, and can be implemented and organized in the data structure of any appropriate type according to any appropriate form. The operating data can be collected as a single data set, or can be distributed in different locations (including on different storage devices), and can only be present on a system or network as an electronic signal at least in part.

[0196] When a module can be implemented by software, considering the level of existing hardware technology, a person skilled in the art can build a corresponding hardware circuit to implement the corresponding function of the module that can be implemented by software without considering the cost. The hardware circuit includes a conventional very large scale integration (VLSI) circuit or gate array and existing semiconductors such as logic chips, transistors, or other discrete components. The module can also be implemented by a programmable hardware device, such as a field programmable gate array, a programmable array logic, a programmable logic device, etc.

[0197] The above exemplary embodiments are described with reference to the accompanying drawings, and many different forms and embodiments are feasible without departing from the spirit and teachings of the present application. Therefore, the present application should not be constructed as a limitation of the exemplary embodiments proposed herein. More specifically, these exemplary embodiments are provided so that the present application will be perfect and complete, and the scope of the present application will be conveyed to those who are familiar with the technology. In these figures, the component sizes and relative sizes may be exaggerated for clarity. The terms used here are only based on the purpose of describing specific exemplary embodiments and are not intended to be limiting. As used herein, unless the text clearly indicates otherwise, the singular forms "one", "an" and "the" are intended to include these multiple forms. It will be further understood that the terms "comprising" and / or "including" when used in this specification indicate the presence of the features, integers, steps, operations, components and / or components, but do not exclude the presence or increase of one or more other features, integers, steps, operations, components, components and / or their groups. Unless otherwise indicated, when stated, a range of values ​​includes the upper and lower limits of that range and any subranges therebetween.

[0198] The above is a preferred embodiment of the present application. It should be pointed out that for ordinary technicians in this technical field, several improvements and modifications can be made without departing from the principles described in the present application. These improvements and modifications should also be regarded as the scope of protection of the present application.

Claims

1. A testing method, characterized in that: Applied to a control device, the method comprises: Obtaining target test related information of the device under test; wherein the target test related information includes: parameters of the device under test and test process information corresponding to the parameters of the device under test; Sending a control instruction to the test fixture equipment according to the target test related information; wherein the control instruction is used to instruct the test fixture equipment to adjust the uplink or downlink channel state of the device under test; The test instrument is controlled to execute the test process of the device under test according to the test flow information; wherein the test instrument comprises: a signal source for testing the input signal of the device under test and / or a signal analyzer for testing the output signal of the device under test.

2. The testing method according to claim 1, characterized in that: The obtaining of target test related information of the device under test includes: receiving a selection instruction from a user to select target test related information from a plurality of preconfigured test related information; According to the selection instruction, target test related information of the device under test is determined.

3. The testing method according to claim 1, characterized in that: Controlling the test instrument to perform a test process on the device under test according to the test process information includes: After sending a control instruction to the test fixture equipment, verifying connectivity among the test fixture equipment, the device under test, and the test instrument; When the connectivity verification between the test fixture equipment, the device under test and the test instrument is passed, the test instrument is controlled to execute the test process of the device under test according to the test flow information.

4. The testing method according to claim 1, characterized in that: Also includes: Display the test process and test results of the device under test; and / or, The test results of the device under test are uploaded to the server.

5. A testing method, characterized in that: Applied to testing tooling equipment, the method comprises: Receive control instructions sent by the control device; According to the control instruction, the uplink or downlink channel state of the device under test is adjusted.

6. The testing method according to claim 5, characterized in that: According to the control instruction, adjusting the uplink or downlink channel state of the device under test includes: According to the control instruction, power is supplied to the device under test and the switch matrix in the test fixture, and the switch matrix is ​​controlled to adjust the uplink or downlink channel state of the device under test; The switch matrix connects the communication port of the device under test and a test instrument, and the test instrument includes: a signal source for testing an input signal of the device under test and / or a signal analyzer for testing an output signal of the device under test.

7. A testing system, characterized in that: include: Control equipment, test fixtures and equipment, test instruments; among which, The control device is connected to the test fixture device and is used to send control instructions to the test fixture device; The communication port of the test fixture equipment is connected to the communication port of the device under test, and the radio frequency port of the test fixture equipment is connected to the test instrument, and is used to adjust the uplink or downlink channel state of the device under test according to the control instruction; The control device is connected to the test instrument and is used to control the test instrument to perform a test process on the device under test; Wherein, the test instrument comprises: a signal source for testing the input signal of the device under test and / or a signal analyzer for testing the output signal of the device under test.

8. The test system according to claim 7, characterized in that: The control device supports configuring multiple test related information of the device under test, supports a user to visually select the test related information, and supports displaying at least one of a test process and a test result of the device under test; The test related information includes: parameters of the device under test, and / or test process information corresponding to the parameters of the device under test.

9. The test system according to claim 7, characterized in that: The test fixture equipment includes: a main control chip and a switch matrix; The switch matrix has a first RF channel, a second RF channel, a third RF channel and a fourth RF channel; wherein the first RF channel connects the RF input port of the test fixture equipment and the base station communication port, the second RF channel connects the RF output port of the test fixture equipment and the terminal communication port, the third RF channel connects the RF input port and the terminal communication port, and the fourth RF channel connects the RF output port and the base station communication port; the RF input port is connected to the signal source, the RF output port is connected to the signal analyzer, the base station communication port is connected to the base station communication port of the device under test, and the terminal communication port is connected to the terminal communication port of the device under test; The main control chip is connected to the switch matrix, and is used to receive a control instruction of the control device, and according to the control instruction, adjust the device under test to a downlink channel state while controlling the first radio frequency channel and the second radio frequency channel to be turned on and the third radio frequency channel and the fourth radio frequency channel to be turned off; or adjust the device under test to an uplink channel state while controlling the third radio frequency channel and the fourth radio frequency channel to be turned on and the first radio frequency channel and the second radio frequency channel to be turned off.

10. The test system according to claim 9, characterized in that: The test fixture equipment also includes: a power module and an indication module; The main control chip is connected to the power module and the indication module respectively, and is used to control the power module to supply power to the switch matrix and / or the device under test, and to control the indication module to display the uplink or downlink channel status of the device under test.

11. The test system according to claim 7, characterized in that: Also includes: Switches and servers; The control device is connected to the test instrument through the switch, and is used to control the test instrument to execute the test process on the device under test through the switch; The control device is connected to the server, and the control device reports the measurement result of the device under test to the server.

12. A control device, characterized in that: include: An acquisition module, used to acquire target test related information of the device under test; wherein the target test related information includes: parameters of the device under test and test process information corresponding to the parameters of the device under test; A sending module, used to send a control instruction to the test fixture equipment according to the target test related information; wherein the control instruction is used to instruct the test fixture equipment to adjust the uplink or downlink channel state of the device under test; A control module is used to control the test instrument to execute the test process of the device under test according to the test flow information; wherein the test instrument includes: a signal source for testing the input signal of the device under test and / or a signal analyzer for testing the output signal of the device under test.

13. A control device comprising: A transceiver, a processor, a memory, and a program or instruction stored in the memory and executable on the processor; wherein the processor implements the steps of the test method as described in any one of claims 1 to 4 when executing the program or instruction.

14. A test tooling device, characterized in that: include: A receiving module, used for receiving control instructions sent by a control device; The adjustment module is used to adjust the uplink or downlink channel state of the device under test according to the control instruction.

15. A test tooling device, comprising: A transceiver, a processor, a memory, and a program or instruction stored in the memory and executable on the processor; characterized in that the processor implements the steps of the test method as described in any one of claims 5 to 6 when executing the program or instruction.

16. A readable storage medium having a program or instruction stored thereon, characterized in that: When the program or instruction is executed by a processor, the steps of the testing method according to any one of claims 1 to 6 are implemented.

17. A computer program product, characterized in that The method comprises computer instructions, which, when executed by a processor, implement the steps of the testing method according to any one of claims 1 to 6.

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