Equipment detection device

Abstract

The invention provides an equipment detection device, and belongs to the technical field of equipment detection. The device comprises a control unit, a plurality of detection units, an interaction unit, a calibration unit, a compensation unit and a storage unit. The detection units are configured to collect voltage data and current data of the to-be-detected equipment and convert the voltage data and the current data into electrical parameter data, and the to-be-detected equipment is detected through one or more detection units; the control unit is configured to initialize the working parameter configuration of the detection unit, obtain the electrical parameter data from the control unit and store the electrical parameter data to the storage unit; the interaction unit is configured to obtain the electrical parameter data from the control unit and display the power consumption; the calibration unit is configured to calibrate the electrical parameter data in the control unit; and the compensation unit is configured to compensate the electrical parameter data in the control unit.

Description

Technical Field

[0001] The present invention belongs to the technical field of equipment detection, and in particular relates to an equipment detection device. Background Art

[0002] With the development of modern electronic technology, integrated circuit technology and sensor technology, various electronic devices have been widely integrated into people's lives.

[0003] In the process of technical research and development of electronic equipment, it is necessary to test various parameters of electronic equipment, among which power consumption test is an indispensable process to verify whether various technical parameters in electronic equipment meet the expected index requirements, especially in devices with high circuit integration such as AP (application processor) system, whose periphery needs multiple power supplies and testing. At present, the most widespread and simple test method is to use a multimeter to perform various voltage and current tests. When measuring the current, the circuit needs to be disconnected and the instrument needs to be connected to the circuit for current measurement. On the one hand, this method is not accurate enough and has large errors. On the other hand, it is cumbersome to perform multi-channel measurements, which consumes a lot of time for testing and calculation, seriously affecting work efficiency. Summary of the invention

[0004] Some embodiments of the present disclosure provide a device detection apparatus, the apparatus comprising: a control unit, a plurality of detection units, an interaction unit, a calibration unit, a compensation unit, and a storage unit;

[0005] The detection unit is configured to collect voltage data and current data of the device under test and convert the voltage data and the current data into electrical parameter data. The device under test is detected by one or more of the detection units;

[0006] The control unit is configured to initialize the working parameter configuration of the detection unit, obtain the electrical parameter data from the detection unit, and store the electrical parameter data in the storage unit;

[0007] The interaction unit is configured to obtain the electrical parameter data from the control unit and display the power consumption;

[0008] The calibration unit is configured to calibrate the electrical parameter data in the control unit;

[0009] The compensation unit is configured to compensate the electrical parameter data in the control unit.

[0010] Optionally, the detection unit includes: a first connection circuit, a second connection circuit, a detection resistor, and a detection circuit; the electrical parameter data at least includes: power consumption data;

[0011] The first connection circuit is configured to be electrically connected to a power supply terminal of the device under test;

[0012] The second connection circuit is configured to be electrically connected to a load end of the device under test;

[0013] The detection resistor is configured to detect the circuit to be tested of the device to be tested;

[0014] The detection circuit is configured to monitor the voltage value of the detection resistor to obtain current data of the circuit to be tested; monitor the voltage of the first connection circuit to obtain voltage data of the circuit to be tested.

[0015] Optionally, when there are at least two detection units, the first connection circuit of each detection unit is electrically connected to the power supply end of the device under test, and the second connection circuit of each detection unit is electrically connected to the load end of the device under test;

[0016] The control unit is further configured to perform averaging processing on the voltage data obtained from at least two of the detection units, perform summing processing on the current data obtained from at least two of the detection units, and perform summing processing on the power consumption data obtained from at least two of the detection units.

[0017] Optionally, the control unit is further configured to:

[0018] Calculating an actual detection resistance value based on the current data and voltage data sent by the detection unit;

[0019] Calculating a load voltage value at the load end based on the detection resistance value, the actual supply voltage value at the power supply end, and the actual supply current value;

[0020] The power consumption data of the device under test is obtained by calculation based on the load voltage value and the actual power supply current value.

[0021] Optionally, when there are multiple devices under test, each of the detection units detects electrical parameter data of one device under test;

[0022] The control unit is further configured to perform polling access to the plurality of detection units to respectively obtain electrical parameter data of the plurality of devices under test.

[0023] Optionally, the interaction unit includes at least: a display module, a setting module, and an alarm module;

[0024] The display module is configured to display the electrical parameter data of the device under test;

[0025] The setting module is configured to configure the setting parameters of the detection unit;

[0026] The alarm module is configured to output abnormal operation alarm information of the device when the electrical parameter data meets the preset alarm requirements.

[0027] Optionally, the control unit is communicatively connected to a host computer, and the transmission data between the control unit and the host computer at least includes: an instruction packet, a received data packet, and a returned data packet;

[0028] The instructions include a request for the host computer to control the function setting of the control unit and to read back the collected data;

[0029] The receiving data packet is used for the host computer to send function setting data to the control unit;

[0030] The return data packet is used by the control unit to return the response and request data of the host computer.

[0031] Optionally, the instruction packet includes at least: a frame header, a function instruction, a data length, and a check bit; the received data packet includes at least: a frame header, sent data, and a check bit; the return data packet includes at least: a frame header, read-back data, and a check bit.

[0032] Optionally, the calibration unit is further configured to output a standard current source signal to the detection unit;

[0033] The detection unit is further configured to send the test data to the control unit;

[0034] The control unit is further configured to calculate actual detection parameters based on the test data;

[0035] The compensation unit is further configured to compensate the actual detection parameter based on a compensation curve;

[0036] The control unit is further configured to calculate and obtain the electrical parameter data of the device under test based on the actual detection parameters of the compensated data.

[0037] Optionally, the interaction unit is further configured to: display a chart interface and a report interface; the icon interface is used to display the electrical parameter data in a curve form, and the report interface is used to export and archive the electrical parameter data.

[0038] The present disclosure provides a device detection apparatus, which, by setting up multiple detection circuits, can test the same device to be tested through multiple detection units, and can also test multiple different devices to be tested simultaneously through multiple detection units, which not only improves the flexibility of device detection, but also improves the efficiency of device detection. A calibration unit and a compensation unit are added to the device to make up for the defects of detection errors caused by circuit loss, thereby improving the accuracy of device detection.

[0039] The above description is only an overview of the technical solution of the present disclosure. In order to more clearly understand the technical means of the present disclosure, it can be implemented according to the contents of the specification. In order to make the above and other purposes, features and advantages of the present disclosure more obvious and easy to understand, the specific implementation methods of the present disclosure are listed below. BRIEF DESCRIPTION OF THE DRAWINGS

[0040] In order to more clearly illustrate the embodiments of the present disclosure or the technical solutions in the prior art, the drawings required for use in the embodiments or the description of the prior art will be briefly introduced below. Obviously, the drawings described below are some embodiments of the present disclosure. For ordinary technicians in this field, other drawings can be obtained based on these drawings without paying any creative work.

[0041] Figure 1 The structure diagram of a device detection apparatus provided by some embodiments of the present disclosure is schematically shown;

[0042] Figure 2 The circuit diagram of a detection unit in a device detection apparatus provided by some embodiments of the present disclosure is schematically shown;

[0043] Figure 3 The structure diagram of a detection unit in a device detection apparatus provided by some embodiments of the present disclosure is schematically shown;

[0044] Figure 4 The circuit diagram of a main chip in a device detection apparatus provided by some embodiments of the present disclosure is schematically shown;

[0045] Figure 5 One of the connection diagrams of a device detection apparatus provided by some embodiments of the present disclosure is schematically shown;

[0046] Figure 6 A schematic diagram of a compensation curve of a device detection apparatus provided by some embodiments of the present disclosure is schematically shown;

[0047] Figure 7 The second connection diagram of a device detection apparatus provided by some embodiments of the present disclosure is schematically shown;

[0048] Figure 8The structure diagram of an interaction unit in a device detection apparatus provided by some embodiments of the present disclosure is schematically shown;

[0049] Fig. 9 A schematic diagram of a protocol data packet between a device detection apparatus and a host computer provided in some embodiments of the present disclosure is schematically shown;

[0050] Fig.10 A schematic diagram of a chart interface in a device detection apparatus provided in some embodiments of the present disclosure is schematically shown;

[0051] Fig.11 A schematic diagram of a report interface in a device detection apparatus provided in some embodiments of the present disclosure is schematically shown. DETAILED DESCRIPTION

[0052] In order to make the purpose, technical solution and advantages of the embodiments of the present disclosure clearer, the technical solution in the embodiments of the present disclosure will be clearly and completely described below in conjunction with the drawings in the embodiments of the present disclosure. Obviously, the described embodiments are part of the embodiments of the present disclosure, not all of the embodiments. Based on the embodiments in the present disclosure, all other embodiments obtained by ordinary technicians in this field without creative work are within the scope of protection of the present disclosure.

[0053] Figure 1 The schematic diagram of the structure of a device detection device provided by the present disclosure is schematically shown, and the device includes: a control unit 101, a detection unit 102, an interaction unit 103, a calibration unit 104, a compensation unit 105, and a storage unit 106;

[0054] The detection unit 102 is configured to collect voltage data and current data of the device under test 20, and convert the voltage data and the current data into electrical parameter data. The device under test is detected by one or more of the detection units;

[0055] The control unit 101 is configured to initialize the working parameter configuration of the detection unit 102, obtain the electrical parameter data from the detection unit 102, and store the electrical parameter data in the storage unit 106;

[0056] The interaction unit 103 is configured to obtain the electrical parameter data from the control unit 101 and display the power consumption;

[0057] The calibration unit 104 is configured to calibrate the electrical parameter data in the control unit 101;

[0058] The compensation unit 105 is configured to compensate the electrical parameter data in the control unit 101 .

[0059] It should be noted that the device under test can be an independent electronic device or a circuit with a complete electrical circuit. It can be set according to actual needs and is not limited here. Electrical parameter data refers to various index parameters that can be obtained by processing the current and voltage data obtained by the device under test, such as resistance value, power, energy consumption, etc.

[0060] In the disclosed embodiment, the detection unit is a functional unit for detecting voltage and current at the power supply end and the load end of the device to be tested, which can realize the conversion process of current and voltage data into electrical parameter data internally, and can report the detected electrical parameter data to the control unit. On the one hand, the control unit can configure the working parameters such as the functional mode, path data, and connection mode of the detection unit, and obtain the electrical parameter data from the detection unit in real time, and store the obtained electrical parameter data in the storage unit, which is convenient for subsequent data analysis, and then assists the optimization and improvement of the device to be tested. On the other hand, it can also communicate with the interactive unit to display the electrical parameter data in real time in the interactive unit. In addition, the control unit can also interact with the calibration unit and the compensation unit to calibrate and compensate the detection data provided by the detection unit, so as to achieve more accurate data collection and feedback display. In addition to real-time display of electrical parameter data, the interactive unit can also display a configuration interface for the user to switch the acquisition mode of the control unit.

[0061] Furthermore, when multiple detection units are connected to the device under test, one detection unit can be used to connect to one device under test, so that multiple devices under test can be tested simultaneously, thereby improving the efficiency of device testing; of course, two, three, etc. multiple detection units can be used for one device under test, and multiple groups of detection data for a single device under test can be used to ensure the accuracy of device testing.

[0062] Reference Figure 2The equipment detection device can use the GD32F303CCT6 single-chip microcomputer as the control core, which includes a storage unit, a control unit and a compensation unit. The single-chip microcomputer supports 256k flash and 64k SRAM storage space. In addition to the space occupied by programming, a certain area can be configured for data power-off retention storage to facilitate the device to memorize function settings, and includes parameters and algorithms in the compensation unit; the device is equipped with 6 I2C buses, which can sample power consumption data of up to 96 power buses; in the device, the single chip communicates with the interactive unit through the serial port UART, the serial port baud rate is 115200, the interactive unit is the host computer monitoring software, and the single chip needs to be connected to the host computer through the USB to UART bridge chip to communicate; in addition, the device has two LED indicator lights on board, which detect and indicate the working status by being always on, flashing at different frequencies and flashing alternately. Of course, this is only an exemplary description, and it can be set according to actual needs, and it is not limited here.

[0063] The embodiment of the present disclosure sets multiple detection circuits, and can test the same device under test through multiple detection units, and can also test multiple different devices under test through multiple detection units at the same time, which not only improves the flexibility of device detection, but also improves the efficiency of device detection. A calibration unit and a compensation unit are added to the device to make up for the defects of detection errors caused by circuit loss, thereby improving the accuracy of device detection.

[0064] Optionally, refer to Figure 3 , the detection unit 102 includes: a first connection circuit 1021, a second connection circuit 1022, a detection resistor 1023, and a detection circuit 1024; the electrical parameter data at least includes: power consumption data;

[0065] The first connection circuit 1021 is configured to be electrically connected to the power supply terminal 201 of the device under test 20;

[0066] The second connection circuit 1022 is configured to be electrically connected to the load terminal 202 of the device under test 20;

[0067] The detection resistor 1023 is configured to detect the circuit to be tested of the device to be tested 20;

[0068] The detection circuit 1024 is configured to monitor the voltage value of the detection resistor to obtain current data of the circuit to be tested; and monitor the voltage of the first connection circuit to obtain voltage data of the circuit to be tested.

[0069] In an embodiment of the present application, the device under test may include a power supply unit 203, a load unit 204, a power supply end 201, and a load end 202, and the first connection circuit is electrically connected to the power supply end of the power supply unit of the device under test, and the second connection circuit is electrically connected to the load end of the load unit of the device under test. The detection resistor is used to detect and sample the current of the load in the current electrical circuit of the device under test. The detection circuit detects the voltage difference across the resistor in real time, and then calculates according to the preset sampling resistor group value parameters to obtain the current of the load end. At the same time, the detection circuit can also detect the power supply voltage of the power supply end in real time, and then the detection circuit can obtain the real-time power consumption data of the current load device. Among them, the detection unit transmits the test data to the control unit, and the communication interface of the detection unit can be one of the peripheral interfaces such as I2C (Inter-Integrated Circuit), SPI (Serial Peripheral Interface), EIA-485 or other non-standard interfaces, which can be set according to actual needs and are not limited here.

[0070] Further, see Figure 4 The detection circuit can be based on the INA226 digital current shunt monitor as the detection core, and its operating voltage is 2.7V to 5.5V. The chip can detect the sampling resistor shunt voltage drop and the bus power supply voltage. The detectable bus voltage range is 0V to 36V. Its programmable calibration value, conversion time and average value can directly read the current value and power value of the power supply; In addition, the chip supports I2C bus and SMBus bus interface, and the bus rate supports fast mode (1k ~ 400kHz) and high-speed mode (1k ~ 2.94MHz). It only works in I2C slave mode, and supports 16 address selections through A0 and A1 pin configuration. 16-channel device power consumption data monitoring and sampling can be performed on one I2C bus; Figure 4 Rs is the current sampling resistor with a value of 0.05 ohms. The sampling voltage range of INA226 is -81.9175 to 81.92mV, that is, the sampling current is -1.638 to 1.638A. R1 and R2 are 10 ohm resistors, C1 is a 0.1uF ceramic capacitor to offset the high-frequency noise at the sampling voltage input end, and R3, R4, and R5 are 10k ohm pull-up resistors. Figure 4 Pin 1 of the connector P1 is the first connection circuit, and pin 2 of the connector P2 is the second connection circuit.

[0071] The embodiment of the present application realizes current and voltage sampling of the power supply end and the load end of the device under test by setting up a detection unit including a first connection circuit, a second connection circuit, a detection resistor and a detection circuit, and connecting them to the power supply end and the load end of the device under test, so as to obtain the power consumption data of the device under test by calculating the test data obtained by sampling, thereby improving the detection accuracy of the power consumption data.

[0072] Optionally, when there are at least two detection units 102, the first connection circuit 1021 of each detection unit 102 is electrically connected to the power supply end 201 of the device under test 20, and the second connection circuit of each detection unit 102 is electrically connected to the load end 202 of the device under test 20;

[0073] The control unit 101 is further configured to perform averaging processing on the voltage data obtained from at least two of the detection units 102, perform summing processing on the current data obtained from at least two of the detection units 102, and perform summing processing on the power consumption data obtained from at least two of the detection units 102.

[0074] In the embodiment of the present disclosure, different circuits to be tested in the same device to be tested can be tested by at least two detection units, specifically, the power supply end of the power supply unit of the device to be tested is electrically connected to the first connection circuits of multiple detection units respectively, and the load end of the load unit of the device to be tested is electrically connected to the second connection circuits of multiple detection units respectively. Figure 5 , wherein the power supply end of the power supply unit of the device under test is electrically connected to the first connection circuits of the detection unit 1 and the detection unit 2, respectively, and the load end of the load unit of the device under test is electrically connected to the second connection circuits of the detection unit 1 and the detection unit 2, respectively. Of course, this is only an exemplary description, and the specific number of detection units can be set according to actual needs. The connection method is similar to the above description and is not limited here.

[0075] In addition, a mode can be set in the interaction unit to treat multiple detection units that detect the same device under test as the same collection item, and the control unit can perform the same type of processing on the detection data for the same device under test provided by multiple detection units according to the setting information of the interaction unit, that is, take the average value of the device voltage data, and sum the device current data and power consumption data as the actual test data of the device under test, thereby avoiding the occurrence of inaccurate test data due to a single detection.

[0076] In the embodiment of the present disclosure, after using multiple detection units to detect the same device under test, the detection data provided by the multiple detection units are processed to obtain electrical parameter data of the device under test, thereby improving the accuracy of device detection.

[0077] Optionally, the control unit 101 is further configured to:

[0078] Calculating an actual detection resistance value based on the current data and voltage data sent by the detection unit 102;

[0079] Calculating a load voltage value at the load end based on the detection resistance value, the actual supply voltage value at the power supply end, and the actual supply current value;

[0080] The power consumption data of the device under test 20 is obtained by calculation based on the load voltage value and the actual power supply current value.

[0081] In the disclosed embodiment, the detection resistor in the detection unit often has sampling errors due to accuracy issues, which will directly lead to test errors in the current and power consumption of the device under test, and data calibration and compensation are required through the calibration unit and the compensation unit. First, the calibration unit outputs the standard current source signal and the detection unit, and the standard current signal is Is. The detection unit transmits the test data to the control unit, and the collected current signal is Is' and the sampled voltage is Vs'. The control unit calculates the actual detection parameter of the detection unit as RS', and RS' is the following formula (1):

[0082] RS'=Vs' / Is' (1)

[0083] It is stored as a constant parameter in the storage unit; Figure 6 Curve 1 is the actual supply voltage collected by the first connection circuit of the detection unit, and curve 2 is the voltage collected by the second connection circuit of the detection unit at the load end. The relationship between them is as follows:

[0084] V curve 2 = V curve 1 - RS'*I (2)

[0085] Where I is the current real-time detection current, and its parameter value is the following formula (3):

[0086] I=Vs / Rs” (3)

[0087] Vs is the current sampled voltage value across the detection resistor.

[0088] The final measured load power consumption is the following formula (4):

[0089] P=V curve 2*I=V curve 1*Vs / Rs-Vs*I (4)

[0090] V curve 1 is a constant, and the actual current and power consumption parameters of the load end can be finally obtained.

[0091] Optionally, when there are multiple devices under test 20, each of the detection units 102 detects electrical parameter data of one device under test 20;

[0092] The control unit 101 is further configured to perform polling access to the plurality of detection units 102 to respectively obtain electrical parameter data of the plurality of devices under test 20 .

[0093] In the embodiments of this application, refer to Figure 7 When there are N devices to be tested, N detection units can be set, that is, the same number of detection units as the number of devices to be tested, so that the nth detection unit can detect the nth device to be tested, and n is a positive integer from 1 to N. The control unit can poll and access multiple detection units, and obtain electrical parameter data such as current, voltage, power consumption data, etc. of multiple devices to be tested from the multiple detection units.

[0094] The embodiment of the present application detects different devices under test by using different detection units, thereby achieving simultaneous detection of multiple devices under test and improving the efficiency of device detection.

[0095] Optionally, refer to Figure 8 , the interaction unit 103 at least includes: a display module 1031, a setting module 1032, and an alarm module 1033;

[0096] The display module is configured to display electrical parameter data of the device under test 20;

[0097] The setting module is configured to configure the setting parameters of the detection unit 102;

[0098] The alarm module is configured to output abnormal operation alarm information of the device when the electrical parameter data meets the preset alarm requirements.

[0099] In the disclosed embodiment, the control unit and the interactive unit communicate with each other by wire, and the communication interface may be a peripheral interface such as UART (Universal Asynchronous Receiver / Transmitter), USB (Universal Serial Bus), Ethernet (ethernet), etc.; similarly, the control unit and the interactive unit may communicate with each other wirelessly, including Bluetooth, WLAN wireless local area network, etc., so as to facilitate testing and use of mobile devices such as mobile phones and tablets; the display module displays the collected voltage, current, power consumption and other information uploaded by the control unit, and the information display may be in different modes such as digital display and curve chart display, so as to facilitate real-time monitoring by the user end; the setting module may configure the number of information collection channels of the detection unit, the collection of the same device by multiple detection units, the display mode, the alarm threshold information, etc.; the alarm module may include alarm information such as sound and light, and issue an alarm prompt after detecting abnormal operation of the equipment, so as to protect the equipment from working in an abnormal state.

[0100] The disclosed embodiment utilizes an interactive unit to display electrical parameter data, allowing users to understand the electrical parameter data more intuitively, and provides a setting module so that users can flexibly configure device detection, and provides an alarm module so that users can promptly learn of abnormalities in the device under test to avoid device detection in an abnormal state of the device under test.

[0101] Optionally, the control unit 101 is in communication connection with the host computer 30, and the transmission data between the control unit 101 and the host computer 30 at least includes: an instruction packet, a received data packet, and a returned data packet;

[0102] The instructions include a request for the host computer 30 to control the function setting of the control unit 101 and to read back the collected data;

[0103] The receiving data packet is used for the host computer 30 to send function setting data to the control unit 101;

[0104] The return data packet is used by the control unit 101 to return the response and request data of the host computer 30.

[0105] Optionally, the instruction packet includes at least: a frame header, a function instruction, a data length, and a check bit; the received data packet includes at least: a frame header, sent data, and a check bit; the return data packet includes at least: a frame header, read-back data, and a check bit.

[0106] In the embodiments of the present disclosure, refer to Fig. 9 , the instruction packet includes a frame header, function instruction, data length and check bit, which is used for the host computer software to request different function settings of the control unit or read back the collected data; the received data packet includes a frame header, sent data and check bit, which enables the host computer to send the function setting data of the control unit; the return data packet includes a frame header, read-back data and check bit, which enables the control unit to respond to the host computer software and return the relevant request data. The check bit in the above is obtained by XOR processing the frame packet data except the check bit according to the byte. The frame headers of the three data frame packets are 0xAA and 0x55, which are two bytes to determine whether they are data packets received and sent by the device.

[0107] Optionally, the calibration unit 104 is further configured to output a standard current source signal to the detection unit 102;

[0108] The detection unit 102 is further configured to send the test data to the control unit 101;

[0109] The control unit 101 is further configured to calculate actual detection parameters based on the test data;

[0110] The compensation unit 105 is further configured to compensate the actual detection parameter based on the compensation curve;

[0111] The control unit 101 is further configured to calculate and obtain the electrical parameter data of the device under test 20 based on the actual detection parameters of the compensated data.

[0112] Optionally, the interaction unit is further configured to: display a chart interface and a report interface; the icon interface is used to display the electrical parameter data in a curve form, and the report interface is used to export and archive the electrical parameter data.

[0113] In the embodiment of the present disclosure, the interactive unit can provide four interface displays: display, setting, chart and report. Fig.10 The chart interface can read back and monitor the current, voltage, and power consumption sampling data of some channels in real time according to the needs, and display the data in curves to facilitate visual monitoring of the dynamic trend of power consumption; refer to Fig.11 The report interface can export the currently collected data for archiving and reservation with one click, and set archiving information such as testers, test time, and test devices to facilitate subsequent data management and optimized design of the equipment under test.

[0114] It should be understood that, although the steps in the flowchart of the accompanying drawings are displayed in sequence as indicated by the arrows, these steps are not necessarily executed in sequence in the order indicated by the arrows. Unless otherwise specified herein, there is no strict order restriction on the execution of these steps, and they can be executed in other orders. Moreover, at least a part of the steps in the flowchart of the accompanying drawings may include multiple sub-steps or multiple stages, and these sub-steps or stages are not necessarily executed at the same time, but can be executed at different times, and their execution order is not necessarily sequential, but can be executed in turn or alternately with other steps or at least a part of the sub-steps or stages of other steps.

[0115] References herein to "one embodiment," "embodiment," or "one or more embodiments" mean that a particular feature, structure, or characteristic described in conjunction with the embodiment is included in at least one embodiment of the present disclosure. In addition, please note that examples of the term "in one embodiment" do not necessarily all refer to the same embodiment.

[0116] In the description provided herein, a large number of specific details are described. However, it is understood that the embodiments of the present disclosure can be practiced without these specific details. In some instances, well-known methods, structures and techniques are not shown in detail so as not to obscure the understanding of this description.

[0117] In the claims, any reference signs placed between brackets shall not be construed as limiting the claims. The word "comprising" does not exclude the presence of elements or steps not listed in the claims. The word "a" or "an" preceding an element does not exclude the presence of a plurality of such elements. The present disclosure may be implemented by means of hardware comprising a number of different elements and by means of a suitably programmed computer. In a unit claim enumerating a number of means, several of these means may be embodied by the same item of hardware. The use of the words first, second, and third, etc. does not indicate any order. These words may be interpreted as names.

[0118] Finally, it should be noted that the above embodiments are only used to illustrate the technical solutions of the present disclosure, rather than to limit them. Although the present disclosure has been described in detail with reference to the aforementioned embodiments, those skilled in the art should understand that they can still modify the technical solutions described in the aforementioned embodiments, or make equivalent replacements for some of the technical features therein. However, these modifications or replacements do not deviate the essence of the corresponding technical solutions from the spirit and scope of the technical solutions of the embodiments of the present disclosure.

Claims

1. A device detection device, characterized in that: The device comprises: a control unit, a plurality of detection units, an interaction unit, a calibration unit, a compensation unit, and a storage unit; The detection unit is configured to collect voltage data and current data of the device under test and convert the voltage data and the current data into electrical parameter data. The device under test is detected by one or more of the detection units; The control unit is configured to initialize the working parameter configuration of the detection unit, obtain the electrical parameter data from the detection unit, and store the electrical parameter data in the storage unit; The interaction unit is configured to obtain the electrical parameter data from the control unit and display the power consumption; The calibration unit is configured to calibrate the electrical parameter data in the control unit; The compensation unit is configured to compensate the electrical parameter data in the control unit.

2. The device detection device according to claim 1, characterized in that: The detection unit includes: a first connection circuit, a second connection circuit, a detection resistor, and a detection circuit; the electrical parameter data at least includes: power consumption data; The first connection circuit is configured to be electrically connected to a power supply terminal of the device under test; The second connection circuit is configured to be electrically connected to a load end of the device under test; The detection resistor is configured to detect the circuit to be tested of the device to be tested; The detection circuit is configured to monitor the voltage value of the detection resistor to obtain current data of the circuit to be tested; monitor the voltage of the first connection circuit to obtain voltage data of the circuit to be tested.

3. The device detection device according to claim 2, characterized in that: When there are at least two detection units, the first connection circuit of each detection unit is electrically connected to the power supply end of the device under test, and the second connection circuit of each detection unit is electrically connected to the load end of the device under test; The control unit is further configured to perform averaging processing on the voltage data obtained from at least two of the detection units, perform summing processing on the current data obtained from at least two of the detection units, and perform summing processing on the power consumption data obtained from at least two of the detection units.

4. The equipment detection device according to claim 2, characterized in that: The control unit is further configured as: Calculating an actual detection resistance value based on the current data and voltage data sent by the detection unit; Calculating a load voltage value at the load end based on the detection resistance value, the actual supply voltage value at the power supply end, and the actual supply current value; The power consumption data of the device under test is obtained by calculation based on the load voltage value and the actual power supply current value.

5. The equipment detection device according to claim 1, characterized in that: When there are multiple devices under test, each of the detection units detects electrical parameter data of one device under test; The control unit is further configured to perform polling access to the plurality of detection units to respectively obtain electrical parameter data of the plurality of devices under test.

6. The equipment detection device according to claim 1, characterized in that: The interaction unit at least includes: a display module, a setting module, and an alarm module; The display module is configured to display the electrical parameter data of the device under test; The setting module is configured to configure the setting parameters of the detection unit; The alarm module is configured to output abnormal operation alarm information of the device when the electrical parameter data meets the preset alarm requirements.

7. The device detection device according to claim 1, characterized in that: The control unit is connected to the host computer for communication, and the transmission data between the control unit and the host computer at least includes: instruction packets, received data packets, and returned data packets; The instructions include a request for the host computer to control the function setting of the control unit and to read back the collected data; The receiving data packet is used for the host computer to send function setting data to the control unit; The return data packet is used by the control unit to return the response and request data of the host computer.

8. The equipment detection device according to claim 6, characterized in that: The instruction packet at least includes: a frame header, a function instruction, a data length, and a check bit; the received data packet; the received data packet at least includes: a frame header, sent data, and a check bit; the return data packet at least includes: a frame header, read-back data, and a check bit.

9. The equipment detection device according to claim 1, characterized in that: The calibration unit is further configured to output a standard current source signal to the detection unit; The detection unit is further configured to send the test data to the control unit; The control unit is further configured to calculate actual detection parameters based on the test data; The compensation unit is further configured to compensate the actual detection parameter based on a compensation curve; The control unit is further configured to calculate and obtain the electrical parameter data of the device under test based on the actual detection parameters of the compensated data.

10. The equipment detection device according to claim 1, characterized in that: The interactive unit is further configured to: display a chart interface and a report interface; the chart interface is used to display the electrical parameter data in a curve form, and the report interface is used to export and archive the electrical parameter data.

Images