Memory stick power consumption detection method and system based on high-precision current sensor

Abstract

The present invention discloses a memory stick power consumption detection method and system based on a high-precision current sensor, and relates to the technical field of memory stick detection, including: S1, label information reception and processing, S2, memory stick detection, and S3, detection data analysis. By analyzing the label information of the memory stick to be tested to obtain the detection execution constraint parameter, flexible and adaptive adjustment of the detection execution mode is achieved, which makes up for the deficiency that the current memory stick detection usually only detects the memory stick in a solid state. The detection execution constraint parameter obtained by analysis can be adapted to the actual performance characteristics of the memory stick, which not only promotes the effective use of memory stick detection resources, but also improves the overall flexibility and accuracy of the detection. The user can also clearly understand the specific situation and overall evaluation result of each detection, so as to make adjustment measures based on the basis, and avoid the performance bottleneck or instability of the memory stick in actual use.

Description

Technical Field

[0001] The present invention relates to the technical field of memory bar detection, and in particular to a method and system for detecting power consumption of a memory bar based on a high-precision current sensor. Background Art

[0002] The memory stick is an important component of the computer, responsible for storing and processing computer-related data. If there is a problem with the memory stick, it may cause the entire computer system to crash, program errors and other problems, affecting the normal use of the computer. By testing the memory stick, you can ensure the normal operation of the memory stick, thereby ensuring the overall stable operation of the computer system.

[0003] Prior art, such as the invention patent with announcement number: CN114461476B, is a memory stick fault detection method, device and system, including: setting a memory stick fault detection device, and connecting the detection device to a memory stick installation device to construct a memory stick monitoring channel; through the memory stick monitoring channel, the integrated slices of the memory stick chip are graded to obtain grade slices; the addresses of the bit storage cells in the grade slices are calibrated, and the grade slices and the bit storage cells are numbered and sorted to obtain numbering results; according to the numbering results, whether the information processing work of the memory stick number address is normal, the judgment result is obtained, and an alarm is displayed for abnormal results. This invention can quickly display the detection results through the memory stick monitoring channel, saving detection time and avoiding the loss of memory stick information due to inaccurate fault detection and other reasons.

[0004] The prior art, such as the invention patent with announcement number: CN106055438B, is a method and system for quickly locating abnormal memory bars on a motherboard, including the following steps: Step S1, start the BIOS (Basic Input Output System) and initialize the general input and output interface connected to the memory bar slot; Step S2, initialize the memory bar, read the configuration information data of the memory bar one by one, and detect the memory bar status in the memory bar slot; Step S3, determine whether the memory bar status is normal, and send feedback information until the memory bars in all memory bar slots are detected; Step S4, send the memory bar status in all memory bar slots to the baseboard management controller. Once the motherboard detects any of the problems of no memory bar, damaged memory bar, and unsupported memory bar type, the user can intuitively locate the specific abnormal memory bar through this invention, thereby greatly reducing the technical difficulty of troubleshooting motherboard errors, which is simple and convenient.

[0005] Based on the above solution, it is found that the current memory stick detection usually only detects the memory stick in a solid state manner. The detection process has the problems of strong stereotypes and low precision. Due to the diverse specifications of memory sticks, there are usually differences in the degree of demand for detection. A single stereotyped detection method cannot fully adapt to the actual performance characteristics of the memory stick. This not only affects the accuracy and reliability of the test results, but may also cause performance bottlenecks or instability in the memory stick during actual use. Summary of the invention

[0006] In view of the deficiencies in the prior art, the present invention provides a method and system for detecting power consumption of a memory stick based on a high-precision current sensor, which can effectively solve the problems involved in the above-mentioned background technology.

[0007] To achieve the above objectives, the present invention is implemented through the following technical solutions: First, a memory stick power consumption detection method based on a high-precision current sensor is provided, including: a detection terminal receives label information of the memory stick to be tested transmitted by an upload port, and imports it into a preprocessor for processing to obtain the label feature value of the memory stick to be tested.

[0008] Based on the label feature value of the memory bar to be tested, the detection execution constraint parameters of the memory bar to be tested are matched, and based on the detection execution constraint parameters, the memory bar to be tested is tested by a high-precision current sensor to obtain the detection data of the memory bar to be tested, and then the detection data is transmitted to the central processor of the detection terminal.

[0009] The central processor of the detection terminal responds to receiving the detection data of the memory bar to be tested, analyzes and obtains the power consumption detection and determination result of the memory bar to be tested, and then transmits the power consumption detection and determination result to the user visual interface of the detection terminal for display.

[0010] As a preferred technical solution, the label information of the memory stick to be tested specifically includes: capacity, frequency, number of channels and timing parameters.

[0011] As a preferred technical solution, the processing obtains the label characteristic value of the memory bar to be tested, and the specific process is: obtaining the type of the memory bar to be tested, and matching it one by one with the verification information corresponding to each type of sample memory bar predefined in the database, and marking the verification information corresponding to the sample memory bar that is consistent with the type of the memory bar to be tested as the pre-verification information of the memory bar to be tested, wherein the pre-verification information includes the verification capacity, verification frequency, number of verification channels and verification timing parameters.

[0012] Based on the label information of the memory stick to be tested, it is compared with the pre-verification information of the memory stick to be tested to obtain a label information comparison value set of the memory stick to be tested, the label information comparison value set includes a capacity verification comparison value, a frequency verification comparison value, a channel verification comparison value and a timing parameter verification comparison value, and through weighted summation processing, a label feature value of the memory stick to be tested is obtained, and the label feature value is used to quantitatively evaluate the specification performance of the memory stick to be tested.

[0013] As an optimal technical solution, the matching obtains the detection execution constraint parameters of the memory stick to be tested, specifically including: based on the label feature value of the memory stick to be tested, importing them into the detection number constraint linear model and the test voltage step value constraint linear model defined in the database for mapping and matching, and obtaining the detection number of the memory stick to be tested and the test voltage step value of the memory stick to be tested in turn.

[0014] Based on the detection times of the memory bar to be tested and the test voltage step value of the memory bar to be tested, they are combined as the detection execution constraint parameters of the memory bar to be tested.

[0015] As a preferred technical solution, the memory stick to be tested is tested by a high-precision current sensor based on the detection execution constraint parameters. The specific process is: the memory stick to be tested is placed in the memory stick slot area of ​​the motherboard, and the memory stick slot area of ​​the motherboard is respectively connected to two power supplies, and the two power supplies are respectively VDD power supply and VPP power supply. The VDD power supply and VPP power supply are respectively installed with a high-precision current sensor, and the high-precision current sensor is connected to the BMC through the I²C bus, and the BMC communicates with each high-precision current sensor through the I²C bus.

[0016] The number of detections of the memory bar to be detected and the test voltage step value of the memory bar to be detected are recorded as the designated number of detections and the designated test voltage step value respectively.

[0017] Get the VDD power supply detection voltage range and VPP power supply detection voltage range of the memory stick to be tested, control the BMC to initialize the I²C bus, and synchronously initialize the VDD power supply and VPP power supply to the starting upper limit value of the corresponding detection voltage range. The VDD power supply and VPP power supply are adjusted and tested by the BMC with the specified number of tests and the specified test voltage step value. The BMC also drives the I²C bus to read the current value of each high-precision current sensor and transmit it to the current register.

[0018] As an optimal technical solution, the detection data of the memory stick to be tested is obtained and then transmitted to the central processor of the detection terminal, specifically including: the current register receives and counts the sensor current values ​​of each detection of the VDD power supply and the VPP power supply and transmits them to the power register.

[0019] The voltage register reads the injected voltage value of each detection of the VDD power supply and the VPP power supply and transmits it to the power register.

[0020] The power register receives the sensed current value and the injected voltage value of each detection of the VDD power supply and the VPP power supply, thereby processing to obtain the power consumption value of each detection of the VDD power supply and the VPP power supply, and marks it as the detection data of the memory stick to be tested and then transmits it to the central processor of the detection terminal.

[0021] As a preferred technical solution, the analysis obtains the power consumption detection and determination results of the memory bar to be tested, wherein the power consumption detection and determination results include a first determination result and a second determination result. The specific analysis process is as follows: based on the power consumption values ​​of each detection of the VDD power supply and the VPP power supply, and by accumulating, the first determination result of the memory bar to be tested is obtained.

[0022] The first determination result of the memory bar to be tested is the actual power consumption value of each detection of the memory bar to be tested, and the actual power consumption value of each detection of the memory bar to be tested is specifically the accumulated power consumption value of each detection of the VDD power supply and the VPP power supply.

[0023] Based on the actual power consumption values ​​of each test of the memory bar to be tested, the power consumption comprehensive quality inspection coefficient of the memory bar to be tested is obtained by processing, and compared with the power consumption comprehensive quality inspection threshold in the database to obtain the second judgment result of the memory bar to be tested.

[0024] The second judgment result of the memory stick to be tested is that the power consumption quality is compliant or the power consumption quality is not compliant. If the comprehensive power consumption quality inspection coefficient of the memory stick to be tested is higher than the comprehensive power consumption quality inspection threshold, the second judgment result is defined as the power consumption quality is compliant; otherwise, the second judgment result is defined as the power consumption quality is not compliant.

[0025] As a preferred technical solution, the specific analysis conditions of the label feature value of the memory stick to be tested are:

[0026] ;

[0027] ;

[0028] In the formula, is the label feature value of the memory bar to be tested, X is the weighted sum of the label features of the memory bar to be tested, e is a natural constant, , , and It represents the capacity check comparison value, frequency check comparison value, channel check comparison value and timing parameter check comparison value in turn. , , and They represent capacity check weight, frequency check weight, channel check weight and timing parameter check weight respectively.

[0029] As an optimal technical solution, the memory stick power consumption detection method based on a high-precision current sensor also includes: counting the injected voltage value of each VDD power supply detection, importing it into the VDD power supply injection electrical volt-ampere curve stored in the database, locating and extracting the expected sensing current value corresponding to the injected voltage value of each VDD power supply detection, and performing difference processing with the sensing current value of each VDD power supply detection, extracting the sensing current difference of each VDD power supply detection, if the sensing current difference of a certain VDD power supply detection is higher than the predefined VDD power supply allowable sensing current difference, then marking the VDD power supply circuit as abnormal, and transmitting a warning signal to the user visual interface of the detection terminal for display.

[0030] The injected voltage value of each detection of the VPP power supply is synchronously counted and imported into the VPP power supply injection electrical volt-ampere curve stored in the database, the expected sensor current value corresponding to the injected voltage value of each detection of the VPP power supply is located and extracted, and the difference processing is performed with the sensor current value of each detection of the VPP power supply to extract the sensor current difference of each detection of the VPP power supply. If the sensor current difference of a certain detection of the VPP power supply is higher than the predefined VPP power supply allowable sensor current difference, the VPP power supply line is marked as abnormal, and a warning signal is transmitted to the user visual interface of the detection terminal for display.

[0031] Secondly, a memory stick power consumption detection system based on a high-precision current sensor is provided, including: a label information receiving and processing module, which is used to receive the label information of the memory stick to be tested transmitted by the upload port through the detection terminal, and import it into the preprocessor for processing to obtain the label characteristic value of the memory stick to be tested.

[0032] The memory stick detection module is used to match the detection execution constraint parameters of the memory stick to be tested based on the label feature value of the memory stick to be tested, and to detect the memory stick to be tested through a high-precision current sensor based on the detection execution constraint parameters to obtain the detection data of the memory stick to be tested, and then transmit the detection data to the central processing unit of the detection terminal.

[0033] The detection data analysis module is used to receive the detection data of the memory bar to be tested through the central processor response of the detection terminal, analyze and obtain the power consumption detection and judgment result of the memory bar to be tested, and then transmit the power consumption detection and judgment result to the user visual interface of the detection terminal for display.

[0034] Compared with the prior art, the embodiments of the present invention have at least the following beneficial effects:

[0035] (1) The present invention provides a method and system for detecting power consumption of a memory stick based on a high-precision current sensor. By analyzing the tag information of the memory stick to be tested to obtain the detection execution constraint parameters, the detection execution mode can be adjusted flexibly and adaptively, which makes up for the deficiency that the current memory stick detection usually only detects the memory stick in a solid-state manner. At the same time, the detection execution constraint parameters obtained through analysis can be adapted to the actual performance characteristics of the memory stick, which not only promotes the effective use of memory stick detection resources, but also improves the overall flexibility and accuracy of the detection.

[0036] (2) The present invention obtains the label feature value of the memory stick to be tested by numerically quantifying the label information of the memory stick to be tested, thereby providing a strong data support basis for the analysis and matching of the detection execution constraint parameters, and also making the detection process more automated and standardized, reducing the time for human intervention and manual processing, thereby not only improving the detection efficiency of the memory stick, but also providing data guarantee for the accuracy and reliability of the detection results.

[0037] (3) The present invention analyzes and obtains the power consumption detection and determination results of the memory stick to be inspected, and then transmits the power consumption detection and determination results to the user visual interface of the inspection terminal for display. The power consumption detection and determination results obtained by analyzing the inspection data of the memory stick to be inspected include two dimensions: the actual power consumption of each inspection and the comprehensive quality inspection of the power consumption, thereby ensuring the comprehensiveness and meticulousness of the inspection results. Through multiple inspections, the error impact caused by a single inspection can also be effectively reduced, thereby ensuring the credibility of the final determination result. At the same time, through the visual interface, the user can clearly understand the specific situation of each inspection and the overall evaluation result, so that adjustment measures can be made based on the basis to avoid performance bottlenecks or instability of the memory stick in actual use.

[0038] Of course, any product implementing the present invention does not necessarily need to achieve all of the advantages described above at the same time. BRIEF DESCRIPTION OF THE DRAWINGS

[0039] Figure 1 It is a schematic diagram of the method flow of the present invention.

[0040] Figure 2 It is a schematic diagram of the system module of the present invention.

[0041] Figure 3 Schematic diagram of a linear model constrained by the number of detections involved in an embodiment of the present invention.

[0042] Figure 4 Schematic diagram of a test voltage step value constraint linear model involved in an embodiment of the present invention. DETAILED DESCRIPTION

[0043] The following will be combined with the drawings in the embodiments of the present invention to clearly and completely describe the technical solutions in the embodiments of the present invention. Obviously, the described embodiments are only part of the embodiments of the present invention, not all of the embodiments. Based on the embodiments of the present invention, all other embodiments obtained by ordinary technicians in this field without creative work are within the scope of protection of the present invention.

[0044] In the description of the present invention, it should be understood that the terms "opening", "upper", "lower", "thickness", "top", "middle", "length", "inside", "all around" and the like indicating orientation or positional relationship are only for the convenience of describing the present invention and simplifying the description, rather than indicating or implying that the components or elements referred to must have a specific orientation, be constructed and operated in a specific orientation, and therefore should not be understood as limiting the present invention.

[0045] See also Figure 1 As shown, the first aspect of an embodiment of the present invention provides a memory stick power consumption detection method based on a high-precision current sensor, including: S1, tag information reception and processing: the detection terminal receives the tag information of the memory stick to be tested transmitted by the upload port, and imports it into the preprocessor for processing to obtain the tag feature value of the memory stick to be tested, wherein the preprocessor is a software module for processing and parsing the tag information received from the upload port, and the main task of the preprocessor is to convert the original tag information into a feature value that is easy to analyze and use.

[0046] The detection terminal is a device that performs detection operations and is responsible for receiving data transmitted from the upload port and processing and analyzing the data. The detection terminal can be a computer or a special detection device, and is usually equipped with software for parsing and verifying the label information of the memory stick.

[0047] The upload port is an interface for transmitting the label information of the memory stick to be tested, which can be a physical port (such as a USB interface, serial port, etc.) or a network port (such as a TCP or IP port). Through the upload port, the label information of the memory stick can be quickly uploaded to the detection terminal.

[0048] It should be noted that the label information of the memory stick to be inspected is descriptive data about the memory stick, usually including performance information such as the specifications, capacity, and transmission speed of the memory stick. These label information is stored in the electronic label of the memory stick and can be read by scanning barcodes, QR codes, etc.

[0049] Specifically, the label information of the memory stick to be tested includes: capacity (indicating the maximum amount of data that the memory stick can store, usually in gigabytes), frequency (indicating the maximum clock frequency at which the memory stick can run, that is, how many data transmissions can be completed per second, usually in megahertz), number of channels (the number of memory channels supported by the memory stick, usually determined by the memory controller and the motherboard, such as dual-channel, quad-channel, etc.), and timing parameters.

[0050] It should be noted that the timing parameters are a set of parameters that describe the access speed of the memory stick, usually expressed as a group of four numbers, mainly including CL (also known as CAS latency, which is the number of clock cycles required from the memory controller issuing a command to the memory module starting to respond to data, that is, when accessing the memory, the time delay from issuing a read or write command to the data being available), tRCD (also known as RAS row address strobe time, which is the delay from row address selection to column address selection, that is, how long after the memory controller issues a row address, the memory module starts responding to read or write operations), tRP (also known as RAS precharge time, which is the time required for memory row precharge, that is, the time interval before the memory module performs the next row operation after the previous row operation ends, indicating how long it takes to precharge the row address line), tRAS (the minimum number of clock cycles required from the memory controller issuing a row activation command to the ability to issue a row precharge command, indicating how long after the memory controller issues a row address, the memory module starts responding to the request for the next row address, reflecting the response speed of the memory module when switching row addresses). In short, the lower the timing parameters, the faster the memory access speed.

[0051] Specifically, the processing obtains the label characteristic value of the memory bar to be tested, and the specific process is: obtain the type of the memory bar to be tested, and match it one by one with the verification information corresponding to each type of sample memory bar predefined in the database, and mark the verification information corresponding to the sample memory bar that is consistent with the type of the memory bar to be tested as pre-verification information of the memory bar to be tested, wherein the pre-verification information includes verification capacity, verification frequency, number of verification channels and verification timing parameters.

[0052] The verification timing parameters also include four numbers, namely verification CL, verification tRCD, verification tRP and verification tRAS.

[0053] The types of memory modules to be tested include, but are not limited to, DIMM (Dual In-line Memory), SO-DIMM (Small Outline Dual In-line Memory), LRDIMM (Load Reduced Dual In-line Memory), and the like.

[0054] Based on the label information of the memory stick to be tested, a comparison is performed with the pre-verification information of the memory stick to be tested to obtain a label information comparison value set of the memory stick to be tested, wherein the label information comparison value set includes a capacity verification comparison value (a ratio of the capacity of the memory stick to be tested to the verification capacity), a frequency verification comparison value (a ratio of the frequency of the memory stick to be tested to the verification frequency), a channel verification comparison value (a ratio of the number of channels of the memory stick to be tested to the verification number of channels), and a timing parameter verification comparison value (a ratio of the timing parameters of the memory stick to be tested to the verification timing parameters), and through weighted summation processing, a label feature value of the memory stick to be tested is obtained, and the label feature value is used to quantitatively evaluate the specification performance of the memory stick to be tested.

[0055] It should be further explained that the timing parameter verification comparison value is the ratio between the cumulative value of the four groups of values ​​in the timing parameters of the memory module to be tested and the cumulative value of the four groups of values ​​in the verification timing parameters.

[0056] Furthermore, the specific analysis conditions of the label characteristic value of the memory stick to be tested are:

[0057] ;

[0058] ;

[0059] In the formula, is the label feature value of the memory bar to be tested, X is the weighted sum of the label features of the memory bar to be tested, e is a natural constant, and it should be understood that Tanh[] represents a hyperbolic tangent function, and ln() represents a logarithmic function; , , and It represents the capacity check comparison value, frequency check comparison value, channel check comparison value and timing parameter check comparison value in turn. , , and They represent capacity check weight, frequency check weight, channel check weight and timing parameter check weight respectively.

[0060] It should be noted that the capacity verification weight, frequency verification weight, channel verification weight, and timing parameter verification weight can all be directly extracted from the database, and the value range is usually between 0 and 1. It can also be verified by sampling the label information of multiple groups of memory sticks and performing test fitting verification to obtain a mapping comparison set of label information and weights. In actual applications, the individual parameters in the label information collected this time are imported into the corresponding mapping comparison set. For example, the capacity of the memory stick to be tested collected in this embodiment is input into the mapping comparison set of capacity and weight, and the capacity verification weight can be extracted. In this way, the frequency verification weight, channel verification weight, and timing parameter verification weight can be obtained one by one, and brought into the analysis conditions for analysis to obtain the label feature value of the memory stick to be tested.

[0061] The following uses the five groups of memory sticks to be tested involved in this embodiment as an example, and assigns the capacity check weights, frequency check weights, channel check weights, and timing parameter check weights of 0.6, 0.4, 0.8, and 0.2, respectively. The final specific label feature values ​​are as follows:

[0062] Table 1 Tag feature value examples

[0063]

[0064] According to the above table, the label characteristic value of the memory stick to be tested No. 5 is the highest, which means that in this group of data, the performance of the memory stick to be tested No. 5 is the best. This embodiment can systematically evaluate the label characteristic values ​​of each group of memory sticks to be tested by calculating the verification comparison values ​​of different combinations, and can determine which group of data has the most prominent performance under the same weighted conditions. Generally speaking, memory sticks to be tested with higher performance often bear higher loads in actual applications. For such memory sticks, the detection conditions should be more stringent. This is because high-performance memory usually works in a high-frequency and low-latency environment, requiring the memory stick to complete data reading and writing operations in a very short time to ensure that the memory stick can run stably under various workloads and avoid data transmission errors or system instability due to frequency or latency issues. In view of this, the memory stick to be tested No. 5 requires more stringent testing compared with other groups.

[0065] In an embodiment, the present invention processes and obtains the label characteristic value of the memory stick to be inspected, and numerically quantifies the label information of the memory stick to be inspected, thereby providing a strong data support basis for the analysis and matching of the detection execution constraint parameters, and also making the detection process more automated and standardized, reducing the time for human intervention and manual processing, which not only improves the detection efficiency of the memory stick, but also provides data guarantee for the accuracy and reliability of the detection results.

[0066] S2. Memory stick detection: Based on the label feature value of the memory stick to be tested, the detection execution constraint parameters of the memory stick to be tested are matched, and based on the detection execution constraint parameters, the memory stick to be tested is tested by a high-precision current sensor to obtain the detection data of the memory stick to be tested, and then the detection data is transmitted to the central processing unit of the detection terminal. The central processing unit is a core component responsible for receiving, processing and managing the detection data.

[0067] In this embodiment, the high-precision current sensor has a resolution of 1 mA and is used to detect actual current values ​​of two power supplies of the memory module to be tested.

[0068] Specifically, the matching obtains the detection execution constraint parameters of the memory stick to be tested, which specifically include: based on the label feature value of the memory stick to be tested, importing them into the detection number constraint linear model and the test voltage step value constraint linear model defined in the database for mapping and matching, and obtaining the detection number of the memory stick to be tested and the test voltage step value of the memory stick to be tested in turn, and the test voltage step value refers to the power supply voltage adjustment increment value for each detection.

[0069] like Figure 3 As shown, it is a schematic diagram of the linear model of the number of detection constraints involved in this embodiment. By inputting the label feature value of the memory stick to be tested as the horizontal axis, the corresponding vertical axis, that is, the number of detections, can be mapped and extracted, and the number of detections follows the rounding principle, that is, if the vertical axis of the located number of detections is 6.4, then the number of detections adopted is 6 times.

[0070] like Figure 4 , which is a schematic diagram of a test voltage step value constraint linear model involved in this embodiment. By inputting the label feature value of the memory stick to be tested as the horizontal axis, the corresponding vertical axis, ie, the test voltage step value, can be mapped and extracted.

[0071] Based on the detection times of the memory bar to be tested and the test voltage step value of the memory bar to be tested, they are combined as the detection execution constraint parameters of the memory bar to be tested.

[0072] In this embodiment, the number of detection times of the memory stick to be tested and the test voltage step value of the memory stick to be tested are analyzed respectively according to the label characteristic value of the memory stick to be tested. Firstly, the appropriate number of detection times and voltage step value can be set in advance according to the label characteristic value of the memory stick to be tested, so as to reduce tentative operations and improve the overall detection efficiency. Secondly, by setting the detection parameters according to the label characteristic value of the memory stick to be tested, the false detection or missed detection caused by inappropriate test conditions can be effectively reduced, which can greatly improve the accuracy and reliability of the detection.

[0073] It is also worth mentioning that setting the number of tests according to the label characteristic value of the memory stick to be tested can avoid the consumption of the memory stick caused by excessive testing, thereby extending the service life. Setting an appropriate voltage step value can avoid using a test voltage with a span that is too high during the detection process and causing potential damage to the memory stick. The two-dimensional detection parameter setting can effectively reduce the cost of manpower and equipment use, and avoid repeated and invalid detection operations.

[0074] Furthermore, the memory stick to be tested is tested by a high-precision current sensor based on the detection execution constraint parameter. The specific process is: the memory stick to be tested is placed in the memory stick slot area of ​​the motherboard, and the memory stick slot area of ​​the motherboard is respectively connected to two power supplies, and the two power supplies are respectively VDD power supply (main power supply voltage, which is the main power supply voltage of the memory chip and is used to power most circuits of the memory chip) and VPP power supply (programming voltage, which is an additional power supply voltage of the memory chip). The VDD power supply and the VPP power supply are respectively installed with a high-precision current sensor, and the high-precision current sensor is connected to the BMC (mainboard controller) through an I²C (communication bus between integrated circuits) bus, and the BMC communicates with each high-precision current sensor through the I²C bus.

[0075] In this embodiment, the motherboard is used to test and verify the performance and compatibility of the memory stick. Using the motherboard to perform quality inspection on the memory stick can ensure that the memory stick can pass strict performance and compatibility tests.

[0076] The number of detections of the memory bar to be detected and the test voltage step value of the memory bar to be detected are recorded as the designated number of detections and the designated test voltage step value respectively.

[0077] Preferably, according to the type of the memory stick to be tested, the VDD power supply detection voltage interval and the VPP power supply detection voltage interval corresponding to each type of sample memory stick stored in the database are matched to obtain the VDD power supply detection voltage interval and the VPP power supply detection voltage interval of the memory stick to be tested, and the VDD power supply detection voltage interval and the VPP power supply detection voltage interval of the memory stick to be tested are, that is, the VDD power supply detection voltage interval and the VPP power supply detection voltage interval corresponding to the sample memory stick consistent with the type of the memory stick to be tested.

[0078] The VDD power supply detection voltage interval and the VPP power supply detection voltage interval of the memory stick to be tested are obtained, the BMC is controlled to initialize the I²C bus, the VDD power supply and the VPP power supply are synchronously initialized to the starting upper limit value of the corresponding detection voltage interval, and the VDD power supply and the VPP power supply are respectively adjusted and tested by the BMC with a specified number of tests and a specified test voltage step value. The BMC simultaneously drives the I²C bus to read the current value of each high-precision current sensor and transmits it to the current register, and the current register is used to record the current value in the circuit.

[0079] As an example, if the specified number of detection times and the specified test voltage step value are 5 times and 0.2V respectively, and the starting upper limit value of the corresponding detection voltage range of the VDD power supply is 1.2V, then the VDD power supply is adjusted and detected, specifically: the VDD power supply is detected 5 times, and the adjustment execution voltage of each detection is 1.2V, 1.4V, 1.6V, 1.8V and 2.0V respectively. At the same time, it should be noted that if the adjustment execution voltage of a certain time exceeds the range of the VDD power supply detection voltage range, then the adjustment execution voltage of that time and the subsequent adjustment execution voltages will automatically execute the termination lower limit value of the VDD power supply detection voltage range. In this detection method, the adjustment detection of the VDD power supply and the VPP power supply can be completed.

[0080] Furthermore, the detection data of the memory stick to be tested is obtained, and then the detection data is transmitted to the central processor of the detection terminal, specifically including: the current register receives and counts the sensor current values ​​of each detection of the VDD power supply and the VPP power supply and transmits them to the power register, and the power register is used to measure and record the power value in the circuit.

[0081] The voltage register reads the injected voltage value of each detection of the VDD power supply and the VPP power supply and transmits it to the power register. The voltage register is used to record the voltage value in the circuit.

[0082] The power register receives the sensed current value and the injected voltage value of each detection of the VDD power supply and the VPP power supply, thereby processing to obtain the power consumption value of each detection of the VDD power supply and the VPP power supply, and marks it as the detection data of the memory stick to be tested and then transmits it to the central processor of the detection terminal.

[0083] The power consumption value is the product of the sensing current value and the injection voltage value. In this embodiment, the power consumption values ​​of the VDD power supply and the VPP power supply detected each time are specifically the products of the sensing current values ​​and the injection voltage values ​​of the VDD power supply and the VPP power supply detected each time. The numerical forms are:

[0084] ;

[0085] ;

[0086] in, Indicates the power consumption value of the VDD power supply detected for the jth time, Represents the sensing current value of the VDD power supply detected for the jth time, It represents the injected voltage value of the VDD power supply detected for the jth time. Indicates the power consumption value of the VPP power supply detected for the jth time, represents the sensing current value detected by the VPP power supply for the jth time, It represents the injected voltage value of the jth test of the VPP power supply, and j represents the number of each test. , n is the total number of detections.

[0087] S3. Detection data analysis: The central processing unit of the detection terminal responds to the detection data received from the memory stick to be tested, and analyzes and obtains the power consumption detection and determination result of the memory stick to be tested, and then transmits the power consumption detection and determination result to the user visual interface of the detection terminal for display, wherein the user visual interface refers to an interface environment on a computer or other electronic device in which the user can operate through visual interaction.

[0088] Specifically, the analysis obtains the power consumption detection and determination result of the memory bar to be tested, wherein the power consumption detection and determination result includes a first determination result and a second determination result. The specific analysis process is as follows: based on the power consumption values ​​of each detection of the VDD power supply and the VPP power supply, and by accumulation, the first determination result of the memory bar to be tested is obtained.

[0089] The first determination result of the memory bar to be tested is the actual power consumption value of each detection of the memory bar to be tested, and the actual power consumption value of each detection of the memory bar to be tested is specifically the accumulated power consumption value of each detection of the VDD power supply and the VPP power supply.

[0090] For ease of understanding, the actual power consumption values ​​of each test of the memory stick to be tested are specifically in the following form:

[0091] ;

[0092] in, Indicates the actual power consumption value of the memory bank to be tested for the jth time. Indicates the power consumption value of the VDD power supply detected for the jth time, Indicates the power consumption value of the VPP power supply detected for the jth time, where j indicates the number of each detection. , n is the total number of detections.

[0093] Based on the actual power consumption values ​​of each test of the memory bar to be tested, the power consumption comprehensive quality inspection coefficient of the memory bar to be tested is obtained by processing, and compared with the power consumption comprehensive quality inspection threshold in the database to obtain the second judgment result of the memory bar to be tested.

[0094] It is worth noting that the power consumption comprehensive quality inspection coefficient of the memory bar to be inspected is used to quantitatively characterize the power consumption comprehensive quality of the memory bar to be inspected. In this embodiment, the power consumption comprehensive quality inspection coefficient of the memory bar to be inspected is obtained using the following analysis conditions:

[0095] ;

[0096] in, Indicates the comprehensive quality inspection coefficient of the power consumption of the memory module to be inspected. Indicates the actual power consumption value of the memory bank to be tested for the jth time. Indicates the actual power consumption value of the memory module to be tested for the j+1th test, where j indicates the number of each test. , n is the total number of detections.

[0097] The second judgment result of the memory stick to be tested is that the power consumption quality is compliant or the power consumption quality is not compliant. If the comprehensive power consumption quality inspection coefficient of the memory stick to be tested is higher than the comprehensive power consumption quality inspection threshold, the second judgment result is defined as compliant power consumption quality. Conversely, if the comprehensive power consumption quality inspection coefficient of the memory stick to be tested is lower than or equal to the comprehensive power consumption quality inspection threshold, the second judgment result is defined as non-compliant power consumption quality.

[0098] In an embodiment, the present invention analyzes and obtains the power consumption detection and determination result of the memory stick to be inspected, and then transmits the power consumption detection and determination result to the user visual interface of the detection terminal for display. The power consumption detection and determination result obtained by analyzing the detection data of the memory stick to be inspected includes two dimensions: the actual power consumption of each detection and the comprehensive quality inspection of power consumption, thereby ensuring the comprehensiveness and meticulousness of the detection result. Through multiple detections, the error impact caused by a single detection can also be effectively reduced to ensure the credibility of the final determination result. At the same time, through the visual interface, the user can clearly understand the specific circumstances of each detection and the overall evaluation results, so that adjustment measures can be made based on the basis to avoid performance bottlenecks or instability in the memory stick during actual use.

[0099] As a preferred embodiment, the memory stick power consumption detection method based on a high-precision current sensor also includes: counting the injected voltage value of each VDD power supply detection, importing it into the VDD power supply injection electrical volt-ampere curve stored in the database, locating and extracting the expected sensing current value corresponding to the injected voltage value of each VDD power supply detection, and performing difference processing with the sensing current value of each VDD power supply detection, extracting the sensing current difference of each VDD power supply detection, if the sensing current difference of a certain VDD power supply detection is higher than the predefined VDD power supply allowable sensing current difference, then marking the VDD power supply circuit as abnormal, and transmitting a warning signal to the user visual interface of the detection terminal for display.

[0100] The VDD power supply permission sensing current difference can directly extract the set value from the database.

[0101] In an embodiment, the VDD power supply injection electrical volt-ampere curve has the injection voltage value as the horizontal axis and the expected sensing current value as the vertical axis. By inputting the injection voltage value of each detection of the VDD power supply, the expected sensing current value corresponding to the injection voltage value of each detection of the VDD power supply can be extracted.

[0102] The injected voltage value of each detection of the VPP power supply is synchronously counted and imported into the VPP power supply injection electrical volt-ampere curve stored in the database, the expected sensor current value corresponding to the injected voltage value of each detection of the VPP power supply is located and extracted, and the difference processing is performed with the sensor current value of each detection of the VPP power supply to extract the sensor current difference of each detection of the VPP power supply. If the sensor current difference of a certain detection of the VPP power supply is higher than the predefined VPP power supply allowable sensor current difference, the VPP power supply line is marked as abnormal, and a warning signal is transmitted to the user visual interface of the detection terminal for display.

[0103] In an embodiment, the VPP power supply injection electrical volt-ampere curve has the injection voltage value as the horizontal axis and the expected sensing current value as the vertical axis. By inputting the injection voltage value of each detection of the VPP power supply, the expected sensing current value corresponding to the injection voltage value of each detection of the VPP power supply can be extracted.

[0104] The VPP power supply allows sensing of current differences, and a set value can be directly extracted from a database.

[0105] What needs to be distinguished is that the predicted sensing current value and the sensing current value, wherein the predicted sensing current value is the ideal current value that should be sensed and collected based on the injected voltage value detected each time, while the sensing current value of each detection is the current value actually sensed by the high-precision current sensor.

[0106] See also Figure 2 As shown, the second aspect of an embodiment of the present invention provides a memory stick power consumption detection system based on a high-precision current sensor, including: a label information receiving and processing module, which is used to receive the label information of the memory stick to be tested transmitted by the upload port through the detection terminal, and import it into the preprocessor for processing to obtain the label characteristic value of the memory stick to be tested.

[0107] The memory stick detection module is used to match the detection execution constraint parameters of the memory stick to be tested based on the label feature value of the memory stick to be tested, and to detect the memory stick to be tested through a high-precision current sensor based on the detection execution constraint parameters to obtain the detection data of the memory stick to be tested, and then transmit the detection data to the central processing unit of the detection terminal.

[0108] The detection data analysis module is used to receive the detection data of the memory bar to be tested through the central processor response of the detection terminal, analyze and obtain the power consumption detection and judgment result of the memory bar to be tested, and then transmit the power consumption detection and judgment result to the user visual interface of the detection terminal for display.

[0109] In this embodiment, the memory stick power consumption detection system based on high-precision current sensors also uses a database, which is used to store various control indicator data, such as the verification information corresponding to each type of sample memory stick, the detection number constrained linear model, and the test voltage step value constrained linear model.

[0110] The various control index numbers can be verified by personnel through data collection during the testing phase and uploaded and stored in the database.

[0111] In an embodiment, the present invention provides a memory stick power consumption detection method and system based on a high-precision current sensor, which obtains detection execution constraint parameters by analyzing the label information of the memory stick to be tested, thereby achieving flexible and adaptive adjustment of the detection execution mode, and making up for the shortcoming that the current memory stick detection usually only detects the memory stick in a solid-state manner. At the same time, the detection execution constraint parameters obtained through analysis can be adapted to the actual performance characteristics of the memory stick, which not only promotes the effective use of memory stick detection resources, but also improves the overall flexibility and accuracy of the detection.

[0112] It should be noted that, in this article, relational terms such as first and second, etc. are only used to distinguish one entity or operation from another entity or operation, and do not necessarily require or imply any such actual relationship or order between these entities or operations. Moreover, the terms "include", "comprise" or any other variants thereof are intended to cover non-exclusive inclusion, so that a process, method, article or device including a series of elements includes not only those elements, but also other elements not explicitly listed, or also includes elements inherent to such process, method, article or device.

[0113] The preferred embodiments of the present invention disclosed above are only used to help explain the present invention. The preferred embodiments do not describe all the details in detail, nor do they limit the invention to the specific implementation methods described. Obviously, many modifications and changes can be made according to the content of this specification. This specification selects and specifically describes these embodiments in order to better explain the principles and practical applications of the present invention, so that technicians in the relevant technical field can understand and use the present invention well. As long as they do not deviate from the structure of the present invention or exceed the scope defined by the present invention, they should all belong to the protection scope of the present invention.

Claims

1. A memory bar power consumption detection method based on a high-precision current sensor, characterized in that: include: The detection terminal receives the label information of the memory bar to be tested transmitted by the upload port, and imports it into the preprocessor for processing to obtain the label feature value of the memory bar to be tested; Based on the label feature value of the memory bar to be tested, the detection execution constraint parameters of the memory bar to be tested are matched, and based on the detection execution constraint parameters, the memory bar to be tested is tested by a high-precision current sensor to obtain the detection data of the memory bar to be tested, and then the detection data is transmitted to the central processor of the detection terminal; The central processing unit of the detection terminal responds to receiving the detection data of the memory bar to be tested, and analyzes and obtains the power consumption detection and determination result of the memory bar to be tested, and then transmits the power consumption detection and determination result to the user visual interface of the detection terminal for display; The processing obtains the tag feature value of the memory bar to be inspected, and the specific process is as follows: Obtain the type of the memory bar to be tested, and match it one by one with the verification information corresponding to each type of sample memory bar predefined in the database, and mark the verification information corresponding to the sample memory bar consistent with the type of the memory bar to be tested as the pre-verification information of the memory bar to be tested, wherein the pre-verification information includes the verification capacity, verification frequency, verification channel number and verification timing parameters; Based on the label information of the memory stick to be tested, it is compared with the pre-verification information of the memory stick to be tested to obtain a label information comparison value set of the memory stick to be tested, the label information comparison value set includes a capacity verification comparison value, a frequency verification comparison value, a channel verification comparison value and a timing parameter verification comparison value, and through weighted summation processing, a label feature value of the memory stick to be tested is obtained, and the label feature value is used to quantitatively evaluate the specification performance of the memory stick to be tested.

2. The method for detecting power consumption of a memory stick based on a high-precision current sensor according to claim 1, characterized in that: The label information of the memory stick to be tested specifically includes: capacity, frequency, number of channels and timing parameters.

3. The method for detecting power consumption of a memory stick based on a high-precision current sensor according to claim 1, characterized in that: The matching obtains the detection execution constraint parameters of the memory bank to be tested, specifically including: Based on the label feature value of the memory stick to be tested, the feature value is respectively imported into the detection number constraint linear model and the test voltage step value constraint linear model defined in the database for mapping and matching, and the detection number of the memory stick to be tested and the test voltage step value of the memory stick to be tested are obtained in turn; Based on the detection times of the memory bar to be tested and the test voltage step value of the memory bar to be tested, they are combined as the detection execution constraint parameters of the memory bar to be tested.

4. The method for detecting power consumption of a memory stick based on a high-precision current sensor according to claim 3, characterized in that: The memory bank to be tested is tested by a high-precision current sensor based on the detection execution constraint parameter, and the specific process is as follows: The memory stick to be tested is placed in the memory stick slot area of ​​the mainboard, and the memory stick slot area of ​​the mainboard is respectively connected to two power supplies, the two power supplies are respectively a VDD power supply and a VPP power supply, and the VDD power supply and the VPP power supply are respectively installed with a high-precision current sensor, the high-precision current sensor is connected to the BMC through the I²C bus, and the BMC communicates with each high-precision current sensor through the I²C bus; The number of times the memory bar to be tested is tested and the test voltage step value of the memory bar to be tested are recorded as the designated number of times of testing and the designated test voltage step value respectively; Get the VDD power supply detection voltage range and VPP power supply detection voltage range of the memory stick to be tested, control the BMC to initialize the I²C bus, and synchronously initialize the VDD power supply and VPP power supply to the starting upper limit value of the corresponding detection voltage range. The VDD power supply and VPP power supply are adjusted and tested by the BMC with the specified number of tests and the specified test voltage step value. The BMC also drives the I²C bus to read the current value of each high-precision current sensor and transmit it to the current register.

5. The method for detecting power consumption of a memory stick based on a high-precision current sensor according to claim 4, characterized in that: The obtaining of the detection data of the memory bank to be inspected and then transmitting the detection data to the central processor of the detection terminal specifically includes: The current register receives and counts the sensed current values ​​of each detection of the VDD power supply and the VPP power supply and transmits them to the power register; The voltage register reads the injected voltage value of each detection of the VDD power supply and the VPP power supply and transmits it to the power register; The power register receives the sensed current value and the injected voltage value of each detection of the VDD power supply and the VPP power supply, thereby processing to obtain the power consumption value of each detection of the VDD power supply and the VPP power supply, and marks it as the detection data of the memory stick to be tested and then transmits it to the central processor of the detection terminal.

6. The method for detecting power consumption of a memory stick based on a high-precision current sensor according to claim 5, characterized in that: The analysis obtains the power consumption detection and determination result of the memory bank to be tested, wherein the power consumption detection and determination result includes a first determination result and a second determination result. The specific analysis process is as follows: Based on the power consumption values ​​of the VDD power supply and the VPP power supply detected each time, a first determination result of the memory bank to be inspected is obtained by accumulation; The first determination result of the memory bar to be tested is the actual power consumption value of each detection of the memory bar to be tested, and the actual power consumption value of each detection of the memory bar to be tested is specifically the accumulated power consumption value of each detection of the VDD power supply and the VPP power supply; Based on the actual power consumption values ​​of each detection of the memory bar to be tested, the power consumption comprehensive quality inspection coefficient of the memory bar to be tested is obtained by processing, and compared with the power consumption comprehensive quality inspection threshold in the database to obtain the second determination result of the memory bar to be tested; The second judgment result of the memory stick to be tested is that the power consumption quality is compliant or the power consumption quality is not compliant. If the comprehensive power consumption quality inspection coefficient of the memory stick to be tested is higher than the comprehensive power consumption quality inspection threshold, the second judgment result is defined as the power consumption quality is compliant; otherwise, the second judgment result is defined as the power consumption quality is not compliant.

7. The method for detecting power consumption of a memory bar based on a high-precision current sensor according to claim 1, characterized in that: The specific analysis conditions of the label characteristic value of the memory stick to be tested are: ； ； In the formula, is the label feature value of the memory stick to be tested, X is the weighted sum of the label features of the memory stick to be tested, e is a natural constant, R, P, D and S represent the capacity verification comparison value, frequency verification comparison value, channel verification comparison value and timing parameter verification comparison value respectively, b1, b2, b3 and b4 represent the capacity verification weight, frequency verification weight, channel verification weight and timing parameter verification weight respectively.

8. The method for detecting power consumption of a memory stick based on a high-precision current sensor according to claim 5, characterized in that: Also includes: The injected voltage values ​​of each VDD power supply detection are counted and imported into the VDD power supply injection electrical volt-ampere curve stored in the database, the estimated sensing current value corresponding to the injected voltage value of each VDD power supply detection is located and extracted, and the difference is processed with the sensing current value of each VDD power supply detection, and the sensing current difference of each VDD power supply detection is extracted. If the sensing current difference of a certain VDD power supply detection is higher than the predefined VDD power supply allowable sensing current difference, the VDD power supply circuit is marked as abnormal, and a warning signal is transmitted to the user visual interface of the detection terminal for display; The injected voltage value of each detection of the VPP power supply is synchronously counted and imported into the VPP power supply injection electrical volt-ampere curve stored in the database, the expected sensor current value corresponding to the injected voltage value of each detection of the VPP power supply is located and extracted, and the difference processing is performed with the sensor current value of each detection of the VPP power supply to extract the sensor current difference of each detection of the VPP power supply. If the sensor current difference of a certain detection of the VPP power supply is higher than the predefined VPP power supply allowable sensor current difference, the VPP power supply line is marked as abnormal, and a warning signal is transmitted to the user visual interface of the detection terminal for display.

9. A system using the method for detecting power consumption of a memory bar based on a high-precision current sensor as claimed in any one of claims 1 to 8, characterized in that: include: The tag information receiving and processing module is used to receive the tag information of the memory bar to be tested transmitted by the upload port through the detection terminal, and import it into the preprocessor for processing to obtain the tag feature value of the memory bar to be tested; A memory bar detection module, used for matching and obtaining detection execution constraint parameters of the memory bar to be tested based on the tag feature value of the memory bar to be tested, and detecting the memory bar to be tested through a high-precision current sensor based on the detection execution constraint parameters to obtain detection data of the memory bar to be tested, and then transmitting the detection data to the central processor of the detection terminal; The detection data analysis module is used to receive the detection data of the memory bar to be tested through the central processor response of the detection terminal, analyze and obtain the power consumption detection and judgment result of the memory bar to be tested, and then transmit the power consumption detection and judgment result to the user visual interface of the detection terminal for display.

Images