Method, system and device for determining optical module test influence factors

Abstract

The invention discloses an optical module test influence factor determination method, system and device, and the method comprises the steps: firstly, judging whether the number of error codes in any test time period exceeds a first set threshold value or not; if yes, at least one target sampling period with the number of error codes exceeding a second set threshold value is searched in the corresponding test time period, and any test time period comprises n continuous sampling periods; then, traversing the test control log based on the timestamp of any target sampling period to obtain at least one target log item corresponding to any target sampling period; and finally, establishing a corresponding table of the error code number of the target sampling period and at least one target log item corresponding to the target sampling period to determine the test influence factor of the tested optical module, thereby positioning the design defect of the optical module and assisting a user to carry out later improvement on the optical module.

Description

Technical Field

[0001] The present invention belongs to the field of communication technology, and in particular relates to a method, system and device for determining influencing factors of optical module testing. Background Art

[0002] An optical module is a device used for fiber-optic communication. It is responsible for transmitting optical signals between network devices (such as switches, routers or servers) and is widely used in data centers, telecommunication networks and various fiber-optic communication scenarios.

[0003] The purpose of testing the optical module is to ensure the stability and efficiency of the optical module in actual use. The bit error rate is an important indicator to measure the transmission quality of the optical module. By testing the bit error rate, the signal integrity of the optical module during the transmission process can be evaluated to prevent the generation of erroneous data due to noise, jitter or attenuation.

[0004] Usually, in a bit error test, the bit error meter reads the number of bit errors every 200ms. For example, if 100 bit errors are detected during a certain reading, it means that 100 bit errors occurred within 200ms. However, it is impossible to locate the specific distribution of the 100 bit errors within 200ms, whether 100 bit errors suddenly occurred in a very short period of time, or if one bit error occurred every 2ms on average. Therefore, it is very difficult to locate the specific factors that cause the bit errors. Summary of the invention

[0005] The embodiments of the present invention provide a method, system and device for determining influencing factors of optical module testing, so as to solve the problem that the prior art cannot confirm the influencing factors that cause bit errors.

[0006] In order to solve the above technical problems, the embodiments of the present invention disclose the following technical solutions:

[0007] One aspect of the present invention provides a method for determining an influencing factor of an optical module test, which is used to determine an influencing factor of a tested optical module test, and the determination method comprises:

[0008] Determine whether the number of bit errors in any test time period exceeds a first set threshold;

[0009] If yes, then searching for at least one target sampling period in which the number of bit errors exceeds the second set threshold value within the corresponding test time period, wherein any of the test time periods includes n consecutive sampling periods, where n≥10;

[0010] Traversing the test control log based on the timestamp of any of the target sampling periods to obtain at least one target log entry corresponding to any of the target sampling periods;

[0011] A corresponding table of the number of bit errors in the target sampling period and at least one target log item corresponding to the target sampling period is established to determine the test influencing factors of the optical module under test.

[0012] Optionally, before executing the step of determining whether the number of bit errors in any test time period exceeds a first set threshold, the determination method further includes the following steps:

[0013] Based on direct memory access technology, the number of bit errors is collected according to the preset sampling interval;

[0014] For any test time period, the sampling period corresponding to the i-th sampling period is determined according to the timestamp of the i-1th sampling and the timestamp of the i-th sampling, 1≤i≤n, wherein the timestamp of the 0th sampling corresponds to the initial moment of the test time period;

[0015] The number of bit errors obtained from the i-th sampling is taken as the number of bit errors in the i-th sampling period;

[0016] The sum of the number of bit errors in all sampling periods within the test time period is calculated as the number of bit errors within the test time period.

[0017] Optionally, traversing the test control log based on the timestamp of any of the target sampling periods to obtain at least one target log item corresponding to any of the target sampling periods includes:

[0018] Obtaining a sampling period corresponding to each target sampling period based on the timestamp;

[0019] For any sampling period of the target sampling cycle, it is determined whether there is a log entry recorded in the test control log.

[0020] If so, the log item is used as the target log item corresponding to the target sampling period.

[0021] Optionally, the determination method further includes:

[0022] Based on the automated testing software, each test action is recorded and a test control log is generated. Any data in the test control log is composed of a log item corresponding to the content of a test action and the time when the test action occurs.

[0023] Optionally, the determination method further includes:

[0024] Repeat the test action corresponding to any target log item;

[0025] Recording the number of bit errors within a sampling period corresponding to any of the test actions;

[0026] The number of bit errors is added to a corresponding table and matched with the corresponding target log item.

[0027] Optionally, the first set threshold is greater than or equal to the second set threshold.

[0028] Optionally, before executing the step of determining whether the number of bit errors in any test time period exceeds a first set threshold, the following steps are performed:

[0029] Monitor whether the level state of the module in-position pin on the test board is low level.

[0030] If yes, make sure the optical module is connected to the test board.

[0031] Optionally, after confirming that the optical module is connected to the test board, perform the following steps:

[0032] Monitor whether the level of the module's in-position pin is high.

[0033] If so, make sure the optical module is disconnected from the test board;

[0034] The number of connection and disconnection between the optical module and the test board is recorded, and an alarm signal for replacing the test board is issued when the number of connection and disconnection exceeds a preset upper limit.

[0035] Another aspect of the present invention provides a system for determining influencing factors of optical module testing, which is used for determining influencing factors of the optical module being tested. The determination system includes a bit error meter for collecting the number of bit errors, a microcontroller unit for reading and transmitting the number of bit errors, and a host computer for receiving and analyzing the number of bit errors, wherein:

[0036] The host computer is configured as:

[0037] Determine whether the number of bit errors in any test time period exceeds a first set threshold;

[0038] If yes, then searching for at least one target sampling period in which the number of bit errors exceeds the second set threshold value within the corresponding test time period, wherein any of the test time periods includes n consecutive sampling periods, where n≥10;

[0039] Traversing the test control log based on the timestamp of any of the target sampling periods to obtain at least one target log entry corresponding to any of the target sampling periods;

[0040] A corresponding table of the number of bit errors in the target sampling period and at least one target log item corresponding to the target sampling period is established to determine the test influencing factors of the optical module under test.

[0041] Optional,

[0042] The host computer is communicatively connected to the system external device and is configured to receive the test action signal sent by the external device, and to record each test action and generate a test control log based on the automated testing software. Any data in the test control log consists of a log item corresponding to a test action content and the time when the test action occurs.

[0043] Another aspect of the present invention provides a device for determining an influencing factor of an optical module test, which is used to determine an influencing factor of a tested optical module test, and the determining device includes:

[0044] A judging module, configured to judge whether the number of bit errors in any test time period exceeds a first set threshold;

[0045] The current sampling period search module is configured to search for at least one target sampling period in which the number of bit errors exceeds the second set threshold value within the corresponding test time period when there is a test time period in which the number of bit errors exceeds the first set threshold value, and any of the test time periods includes n consecutive sampling periods, where n≥10;

[0047] A target log item acquisition module is configured to traverse the test control log based on the timestamp of any of the target sampling periods to obtain at least one target log item corresponding to any of the target sampling periods;

[0048] The test influencing factor determination module is configured to establish a corresponding table of the number of bit errors in the target sampling period and at least one target log item corresponding to the target sampling period to determine the test influencing factor of the optical module under test.

[0049] The embodiments of the present invention provide a method, system and device for determining factors affecting the test of an optical module. First, it is determined whether the number of bit errors in any test time period exceeds a first set threshold value. If so, at least one target sampling period in which the number of bit errors exceeds a second set threshold value is searched within the corresponding test time period, and any test time period includes n consecutive sampling periods. Then, based on the timestamp of any target sampling period, a test control log is traversed to obtain at least one target log item corresponding to any target sampling period. Finally, a corresponding table of the number of bit errors in the target sampling period and at least one target log item corresponding to the target sampling period is established to determine the test factors affecting the optical module under test, thereby locating the design defects of the optical module and assisting the user in making subsequent improvements to the optical module. BRIEF DESCRIPTION OF THE DRAWINGS

[0050] Figure 1 A flow chart of a method for determining factors affecting optical module testing provided by an embodiment of the present invention;

[0051] Figure 2A flow chart of another method for determining factors affecting optical module testing provided by an embodiment of the present invention;

[0052] Figure 3 A flow chart of another method for determining factors affecting optical module testing provided by an embodiment of the present invention;

[0053] Figure 4 An implementation provided for an embodiment of the present invention Figure 1 Schematic diagram of the process of step S300;

[0054] Figure 5 A flow chart of another method for determining factors affecting optical module testing provided by an embodiment of the present invention;

[0055] Figure 6 A flow chart of another method for determining factors affecting optical module testing provided by an embodiment of the present invention;

[0056] Figure 7 A flow chart of another method for determining factors affecting optical module testing provided by an embodiment of the present invention;

[0057] Figure 8 A schematic diagram of the structure of a system for determining factors affecting optical module testing provided by an embodiment of the present invention;

[0058] Fig. 9 A schematic diagram of the structure of a device for determining factors affecting optical module testing provided by an embodiment of the present invention. DETAILED DESCRIPTION

[0059] In order to enable those skilled in the art to better understand the technical solution of the present invention, the present invention is further described in detail below in conjunction with the accompanying drawings and specific implementation methods.

[0060] Figure 1 The present invention is a flowchart of a method for determining an optical module test influencing factor disclosed in an embodiment of the present invention, which is used to determine the test influencing factor of the optical module under test. Figure 1 As shown, the determination method includes the following

[0061] step:

[0062] Step S100: Determine whether the number of bit errors in any test time period exceeds a first set threshold.

[0063] In one embodiment of the present invention, before executing step S100 to determine whether the number of bit errors in any test time period exceeds a first set threshold, Figure 2 As shown, the following steps are also included:

[0064] Step S011: Based on the direct memory access technology, the number of bit errors is collected according to a preset sampling interval.

[0065] The method for determining the influencing factors of the optical module test disclosed in the embodiment of the present invention can be implemented by the system for determining the influencing factors of the optical module test disclosed in the subsequent embodiments, and the determination system includes a bit error meter for collecting the number of bit errors, a micro control unit for reading and transmitting the number of bit errors, and a host computer for receiving and analyzing the number of bit errors.

[0066] When the optical module under test is undergoing a bit error test, a high-precision bit error sampling mode is started.

[0067] In a specific embodiment disclosed in the present invention, a microcontroller unit MCU sets a timer, and the timeout period of the timer is set to 10ms. Each time the timer reaches 10ms, the number of bit errors is collected once by a bit error meter, and the number of bit errors is placed in a queue in a memory. For example: when the timer times out for the first time, the collected number of bit errors is placed in the first position of the queue; when the timer times out for the Nth time, the collected number of bit errors is placed in the Nth position of the queue.

[0068] After the time for collecting the number of bit errors reaches a test time period (for example, 100ms), the MCU uploads each number of bit errors collected in the test time period to the host computer, and at the same time, starts the next test time period and continues to collect the number of bit errors according to the preset sampling interval. The host computer counts the sum of the number of bit errors in the test time period and determines whether the sum exceeds a first set threshold. In a specific embodiment disclosed in the present invention, the first set threshold is 100.

[0069] When MCU transmits data to the upper device, it uses direct memory access technology DMA. Normally, data transmission is controlled by the CPU, which needs to read data from the source address, store it in the register, and then write the data to the target address. This process takes up a lot of CPU processing time and reduces system performance. The working mechanism of DMA is to introduce an independent DMA controller, which is responsible for directly transmitting data between memory and external devices, completely bypassing the CPU, and performing data transmission without occupying CPU resources, so that the CPU can handle other tasks and improve the overall performance of the system.

[0070] After setting the data source, data length and destination (corresponding to the communication interface of the host computer) in advance, DMA will start to move data in the background without the intervention of the MCU.

[0071] Without using DMA technology, it takes a certain amount of time, such as 20ms, for the MCU to send data to the host computer using the traditional method, and the error code meter cannot collect the number of bit errors during this period. Therefore, when the MCU needs to interrupt the collection task to transfer data, the interval between two samples is at least 20ms, which cannot be considered high-precision error sampling.

[0072] After adopting DMA technology, even if the DMA takes 20ms to transfer data, there is no need for MCU intervention within this 20ms. The MCU can continue sampling when the next sampling time comes, achieving a stable 10ms sampling interval.

[0073] Step S012: For any test time period, a sampling period corresponding to the i-th sampling period is determined according to the timestamp of the i-1-th sampling and the timestamp of the i-th sampling.

[0074] Where, 1≤i≤n. When i is equal to 1, the timestamp of the i-1th sampling, that is, the 0th sampling, corresponds to the initial time of the corresponding test time period.

[0075] In the embodiment disclosed in the present invention, n sampling periods can be completely collected in each test time period. For example, the start time of a test time period is the start time of the first sampling period, and the end time of the test time period is the end time of the nth sampling period. In a specific embodiment disclosed in the present invention, n can be 10.

[0076] Take a test time period T = [T_start, T_end] as an example. The start time of the test time period is T_start, the end time is T_end, the sampling interval is 10ms, and the test time period includes 10 sampling periods S1, S2, ..., S10, wherein the start time of the first sampling period S1 is T_start, and the time and end time of collecting the number of bit errors are T_start+10ms, which are used as the timestamp of the first sampling period; the start time of the second sampling period S2 is T_start+10ms, and the time and end time of collecting the number of bit errors are T_start+10ms*2, which are used as the timestamp of the second sampling period; and so on, the start time of the tenth sampling period S10 is T_start+10ms*9, and the time and end time of collecting the number of bit errors are T_start+10ms*10, which are used as the timestamp of the tenth sampling period.

[0077] Step S013: The number of bit errors obtained by the i-th sampling is used as the number of bit errors in the i-th sampling period.

[0078] For example, if the bit error data obtained by the first sampling in a certain test time period is 50, then the number of bit errors in the first sampling period in the test time period is 50.

[0079] Step S014: Calculate the sum of the bit error numbers of all sampling periods within the test time period as the bit error number within the test time period.

[0080] After obtaining the bit error numbers of all sampling periods within the test time period, these bit error numbers are added together, and the sum obtained is used as the bit error number within the test time period.

[0081] When it is determined that there is a test time period in which the number of bit errors exceeds the first set threshold, the test time period is used as the test time period to be detected, and step S200 is continued to be executed; if there is no test time period in which the number of bit errors exceeds the first set threshold, step S100 is re-executed to continue to determine whether the number of bit errors in the next test time period exceeds the first set threshold.

[0082] Step S200: searching for at least one target sampling period in which the number of bit errors exceeds a second set threshold value within a corresponding test time period.

[0083] In the embodiments disclosed in the present invention, any test time period includes n consecutive sampling periods, where n≥10. For example, if the test time period is 100 ms, the duration of each sampling period in the test time period is at most 10 ms.

[0084] In the test time period to be detected, it is checked whether there are one or more target sampling periods in which the number of bit errors exceeds the second set threshold. In one embodiment disclosed in the present invention, the first set threshold is greater than or equal to the second set threshold, for example, the first set threshold is 100 and the second set threshold is 90.

[0085] If there is such a target sampling period, it is considered that the number of bit errors is large during the target sampling period, and the optical module is likely to be abnormal during this period. Generally, the problems that are prone to exist in optical modules mainly include the following aspects:

[0086] 1. Optical performance defects: loss of optical signals due to unreasonable internal structure design or material problems; degradation of signal quality due to poor interface matching or internal reflection; different wavelengths of light have different propagation speeds, resulting in delay differences in signals during long-distance transmission; inconsistent transmission performance of optical signals in different polarization states, affecting signal stability and integrity.

[0087] 2. Electrical performance issues: Signal interference caused by unreasonable internal circuit layout; signal distortion caused by unstable power supply or improper internal power management; insufficient heat dissipation design leading to increased temperature, affecting module performance and life, etc.

[0088] Step S300: traverse the test control log based on the timestamp of any target sampling period to obtain at least one target log item corresponding to any target sampling period.

[0089] The data returned by the MCU to the host computer only contains the number of bit errors, but not the time information. Therefore, the host computer attaches a timestamp to the number of bit errors collected each time, that is, to match the corresponding sampling time. The timestamp is the end time of the corresponding sampling period.

[0090] In one embodiment disclosed in the present invention, Figure 3 As shown, the method for determining the factors affecting the optical module test also includes the following step S600.

[0091] Step S600: Record each test action based on the automated testing software and generate a test control log.

[0092] When testing the optical module, the content and time of each test action are recorded using automated test software (e.g., ATE) and saved in the test control log. Each data in the test control log consists of a log item corresponding to the content of a test action and the time when the test action occurs.

[0093] The test actions used when testing the optical module mainly include: switching the channel of the optical switch, adjusting the attenuation value of the optical attenuation, adjusting the temperature of the optical module, etc.

[0094] In one embodiment disclosed in the present invention, Figure 4 As shown, step S300 can be completed by the following sub-steps:

[0095] Step S301: obtaining a sampling period corresponding to each target sampling cycle based on a timestamp.

[0096] The timestamp of the sampling period may indicate the end time of the sampling period. The sampling period of the sampling period may be obtained according to the end time and the duration of the sampling period. For the specific method, please refer to the above embodiment and will not be described again here.

[0097] Step S302: for any sampling period of the target sampling cycle, it is determined whether there is a log entry recorded in the test control log.

[0098] Taking a target sampling period as an example, after knowing its sampling period [t-10ms, t], determine whether there is a log entry recorded in the test control log during this period. For example, if there is a log entry corresponding to the time t-5ms in the test control log, it is considered that a test action has occurred during this sampling period. By analyzing the content in the log entry, the specific test action can be determined.

[0099] If it is determined that there is a log entry that meets the determination condition, step S303 is executed. If there is no log entry that meets the determination condition, step S100 is re-executed to continue to determine whether the number of bit errors in the next test time period exceeds the first set threshold.

[0100] Step S303: taking the log item as the target log item corresponding to the target sampling period.

[0101] There may be more than one target log item in the same target sampling period. If there are multiple log items in the test control log corresponding to the sampling period of a target sampling period, each log item is the target log item of the target sampling period.

[0102] In an embodiment disclosed in the present invention, after obtaining a target log item, it is taken as a suspect, and the test influencing factors of the optical module under test are further determined by executing the test actions in the target log item multiple times.

[0103] Step S400: establishing a corresponding table of the number of bit errors in a target sampling period and at least one target log item corresponding to the target sampling period to determine the test influencing factors of the optical module under test.

[0104] After obtaining the number of bit errors in any target sampling period and all corresponding target log items, a correspondence table between the two is constructed using the above data, so that the user can determine the test influencing factors of the optical module under test according to the correspondence table.

[0105] For example, the correspondence table shows that after each execution of test action A, the bit error data of the corresponding sampling period exceeds the second set threshold, then it can be determined that test action A is a test influencing factor of the optical module under test, which will cause the optical module under test to be abnormal.

[0106] In one embodiment disclosed in the present invention, Figure 5 As shown, the method for determining the test influencing factors of the optical module under test also includes the following steps:

[0107] Step S510: Repeat the test action corresponding to any target log item.

[0108] For example, if the test action corresponding to a target log item is switching the channel of an optical switch, the test action is repeated multiple times on the optical module under test.

[0109] If there are multiple corresponding test actions, each test action is repeatedly executed respectively.

[0110] Step S520: Record the number of bit errors in a sampling period corresponding to any test action.

[0111] According to the time when the test action is performed, the sampling period corresponding to each test action is obtained, and then the number of bit errors corresponding to each test action is determined.

[0112] Step S530: Add the number of bit errors to the corresponding table and match it with the corresponding target log item.

[0113] For example, after repeatedly executing test action A three times, three bit error numbers are obtained. These three bit error numbers are added to the corresponding table established in step S400 and matched with the target log item associated with test action A to enrich the data of the bit error number corresponding to the target log item, and further verify whether an abnormality will occur after the optical module executes test action A.

[0114] In one embodiment of the present invention, before executing step S100 to determine whether the number of bit errors in any test time period exceeds a first set threshold, Figure 6 As shown, perform the following steps:

[0115] Step S021: monitor whether the level state of the module in-position pin on the test board is a low level.

[0116] The level state of the module's in-place pin is monitored at a preset monitoring interval (e.g., 100ms), where the level state includes a low level and a high level. When monitoring the level state of the in-place pin, two variables, lastPlug and nowPlug, are introduced. NowPlug represents the current level state of the module's in-place pin, and lastPlug represents the level state of the module's in-place pin at the last monitoring. Both variables have values ​​of 0 or 1, with the number 1 representing a low level and the number 0 representing a high level.

[0117] The initial state of the optical module when it is not connected to the test board is set to lastPlug = 0 and nowPlug = 0. The state of the optical module when it is not connected to the test board is set to the initial state, and the lastPlug and nowPlug in this state are both assigned to 0.

[0118] In the process of continuously monitoring the level state of the module presence pin at a preset monitoring interval, it is determined whether the level state of the module presence pin is a low level, that is, whether the optical module is connected to the test board.

[0119] If the level state of the module in place pin on the test board is low, execute step S022; if the level state of the module in place pin on the test board is not low, re-execute step S021 and continue monitoring until the level state of the module in place pin is low.

[0120] Step S022: Determine whether the optical module is connected to the test board.

[0121] When the level state of the module in-position pin is at a low level, the current state of the optical module is updated to lastPlug=0 and nowPlug=1, and it is determined that the optical module is connected to the test board.

[0122] After confirming that the optical module is connected to the test board, the level state of the module's in-position pin is continuously monitored. If the level state is always low, the current state of the optical module is updated to lastPlug=1 and nowPlug=1.

[0123] In one embodiment disclosed in the present invention, after determining that the optical module is connected to the test board, Figure 7 As shown, perform the following steps:

[0124] Step S023: monitoring whether the level state of the module in-position pin is high level.

[0125] In the process of continuously monitoring the level state of the module presence pin at a preset monitoring interval, it is determined whether the level state of the module presence pin is a high level.

[0126] If the level state of the module in-position pin on the test board is high, execute step S024; if the level state of the module in-position pin on the test board is not high, re-execute step S023 to continue monitoring the level state of the in-position pin.

[0127] Step S024: Determine whether the optical module is disconnected from the test board.

[0128] The current state of the optical module is updated to lastPlug=1 and nowPlug=0, and it is determined that the optical module is disconnected from the test board.

[0129] Step S025: Record the number of connection and disconnection times between the optical module and the test board, and send out an alarm signal for replacing the test board when the number of connection and disconnection times exceeds a preset upper limit.

[0130] In the embodiment disclosed in the present invention, the connection and disconnection times are stored in the EEPROM and are not lost when the power is off; each time the system is started, the current connection and disconnection times are read from the EEPROM, and then based on this, after detecting that the optical module completes a round of connection and disconnection actions with the test board, the current connection and disconnection times are increased by 1. If it is not saved, then each time it is started, the current connection and disconnection times start from 0, and the statistical data is invalid.

[0131] When the optical module is detected to be connected and then disconnected from the test board, that is, when the current state of the optical module is detected to be updated to lastPlug = 1 and nowPlug = 0, it is considered that a connection and disconnection action is completed, the current connection and disconnection times are increased by 1 and saved in the EEPROM, and then the next time the level state of the module in-position pin is monitored, the current state is updated to the initial state, lastPlug = 0 and nowPlug = 0. Since the monitoring interval is short, it is basically unlikely that the optical module is disconnected and then connected to the test board within the same monitoring period.

[0132] When testing, the optical module needs to be plugged into a special test board, which is equipped with gold fingers that can connect to the optical module. Since the gold fingers have a certain plug-in life, after the optical module is frequently plugged in and out (connected and disconnected from the test board), the gold fingers may become thinner or damaged due to wear, resulting in poor contact, reducing the quality of signal transmission, and thus affecting the test results of the optical module.

[0133] When the test results deteriorate, the test board usually needs to be replaced. However, the test results in the period before the test results deteriorate significantly have actually begun to deteriorate. It is too late to replace the test board when the test results deteriorate significantly. Many optical modules tested previously may need to be retested. Since it is impossible to predict in advance when the test results will deteriorate, it has a great impact on the test efficiency.

[0134] According to the service life of the gold finger on the test board, an upper limit value is preset. If the current number of disconnections exceeds the preset upper limit value, it means that the test board at this time is likely to cause poor test results, and an alarm signal for replacing the test board is issued.

[0135] The alarm signal can prompt the user to replace the test board in time. After the test board is replaced, the current connection and disconnection times will be re-counted. The alarm signal can be an audio and visual signal, for example, an alarm LED light is pre-set, and the MCU controls the alarm LED light to light up after receiving the alarm signal.

[0136] In the disclosed embodiment of the present invention, the frequency of the system detecting the level state of the pin in the module needs to be fast enough, which is much less than the time required for a plug-in and pull-out. In practice, the time for connecting and disconnecting the optical module and the test board is in the second level, so 100ms is selected as the detection period. If the detection frequency is very slow, such as once every 10 seconds, then before the next detection, if a connection or disconnection action occurs, a statistical data will be missed.

[0137] Figure 8 The present invention discloses a system for determining influencing factors of optical module testing, which is used to determine influencing factors of optical module testing. Figure 8As shown, the determination system includes a bit error meter 1 for collecting the number of bit errors, a micro control unit 2 for reading and transmitting the number of bit errors, and a host computer 3 for receiving and analyzing the number of bit errors, wherein:

[0138] The host computer 3 is configured to execute the following method:

[0139] Determine whether the number of bit errors in any test time period exceeds a first set threshold;

[0140] If yes, then searching for at least one target sampling period in which the number of bit errors exceeds the second set threshold value within the corresponding test time period, wherein any test time period includes n consecutive sampling periods, where n≥10;

[0141] traversing the test control log based on the timestamp of any target sampling period to obtain at least one target log entry corresponding to any target sampling period;

[0142] A corresponding table of the number of bit errors in a target sampling period and at least one target log item corresponding to the target sampling period is established to determine the test influencing factors of the optical module under test.

[0143] In one embodiment disclosed in the present invention, the host computer 3 is communicatively connected to the system external device 4, and is configured to receive a test action signal sent by the external device 4, and to record each test action based on the automated testing software and generate a test control log, wherein any data in the test control log is composed of a log item corresponding to a test action content and the time when the test action occurs.

[0144] During the test, the performance data of the optical module (such as bit error rate, transmission power, receiving sensitivity, etc.) will be transmitted back to the host computer 3 through the micro control unit 2. The host computer 3 collects, stores and processes these data in real time.

[0145] The bit error detector 1 sends known data to the transmitting end of the optical module, undergoes photoelectric conversion and signal processing inside the optical module, and then receives it at the receiving end and compares it with the original data, thereby detecting whether error bits are generated during the transmission process and determining the number of bit errors.

[0146] In one embodiment disclosed by the present invention, the determination system of the factors affecting the test of the optical module also includes a test board. The test board is used to carry the optical module and provide a signal interface for it, and can provide a standardized connection environment for the optical module. The optical module is usually electrically connected to the test equipment through the gold finger set on the test board. In the optical module test, the test board is connected to the optical module through its module in-position pin ModPrsL, and the electrical signal is accurately transmitted to the corresponding pin of the optical module. The level of the pin can indicate whether the optical module is plugged into the test board (connected to the test board). When the optical module is plugged into the test board, the pin is low level, and when the optical module is not plugged into the test board (disconnected from the test board), the pin is high level. In the embodiment disclosed by the present invention, the connection and disconnection of the optical module and the test board are judged by monitoring the pin. When it is detected that the optical module is pulled out after being inserted into the test board, it is considered that a plug-in action (connection and disconnection action) has been generated. At this time, the number of plug-ins (connection and disconnection times) increases by 1, and the number of plug-ins is saved in the electrically erasable programmable read-only memory EEPROM.

[0147] Fig. 9 The present invention is a schematic diagram of a structure of a device for determining an influencing factor of an optical module test disclosed in an embodiment of the present invention, which is used to determine the influencing factor of the optical module under test. Fig. 9 As shown, the determination device includes the following modules:

[0148] The judging module 11 is configured to judge whether the number of bit errors in any test time period exceeds a first set threshold;

[0149] At present, the sampling period search module 12 is configured to search for at least one target sampling period in which the number of bit errors exceeds the second set threshold value within the corresponding test time period when there is a test time period in which the number of bit errors exceeds the first set threshold value, and any test time period includes n consecutive sampling periods, where n≥10;

[0150] A target log item acquisition module 13 is configured to traverse the test control log based on the timestamp of any target sampling period to obtain at least one target log item corresponding to any target sampling period;

[0151] The test influencing factor determination module 14 is configured to establish a corresponding table of the number of bit errors in a target sampling period and at least one target log item corresponding to the target sampling period to determine the test influencing factor of the optical module under test.

[0152] It is to be understood that the above embodiments are merely exemplary embodiments used to illustrate the principles of the present invention, but the present invention is not limited thereto. For those of ordinary skill in the art, various modifications and improvements can be made without departing from the spirit and essence of the present invention, and these modifications and improvements are also considered to be within the scope of protection of the present invention.

Claims

1. A method for determining influencing factors of optical module testing, used for determining influencing factors of optical module testing under test, characterized in that: The determination method comprises: Determine whether the number of bit errors in any test time period exceeds a first set threshold; If yes, then searching for at least one target sampling period in which the number of bit errors exceeds the second set threshold value within the corresponding test time period, wherein any of the test time periods includes n consecutive sampling periods, where n≥10; Traversing the test control log based on the timestamp of any of the target sampling periods to obtain at least one target log entry corresponding to any of the target sampling periods; A corresponding table of the number of bit errors in the target sampling period and at least one target log item corresponding to the target sampling period is established to determine the test influencing factors of the optical module under test.

2. The determination method according to claim 1, characterized in that: Before executing the step of determining whether the number of bit errors in any test time period exceeds the first set threshold, the determination method further includes the following steps: Based on direct memory access technology, the number of bit errors is collected according to the preset sampling interval; For any test time period, the sampling period corresponding to the i-th sampling period is determined according to the timestamp of the i-1th sampling and the timestamp of the i-th sampling, 1≤i≤n, wherein the timestamp of the 0th sampling corresponds to the initial moment of the test time period; The number of bit errors obtained from the i-th sampling is taken as the number of bit errors in the i-th sampling period; The sum of the number of bit errors in all sampling periods within the test time period is calculated as the number of bit errors within the test time period.

3. The determination method according to claim 1, characterized in that: The traversing the test control log based on the timestamp of any of the target sampling periods to obtain at least one target log item corresponding to any of the target sampling periods includes: Obtaining a sampling period corresponding to each target sampling period based on the timestamp; For any sampling period of the target sampling cycle, it is determined whether there is a log entry recorded in the test control log. If so, the log item is used as the target log item corresponding to the target sampling period.

4. The determination method according to claim 1, characterized in that: The determination method further comprises: Based on the automated testing software, each test action is recorded and a test control log is generated. Any data in the test control log is composed of a log item corresponding to the content of a test action and the time when the test action occurs.

5. The determination method according to claim 1, characterized in that: The determination method further comprises the following steps: Repeat the test action corresponding to any target log item; Recording the number of bit errors within a sampling period corresponding to any of the test actions; The number of bit errors is added to the corresponding table and matched with the corresponding target log item.

6. The determination method according to claim 1, characterized in that: The first set threshold is greater than or equal to the second set threshold.

7. The determination method according to claim 1, characterized in that: Before executing the step of determining whether the number of bit errors in any test time period exceeds a first set threshold, the following steps are executed: Monitor whether the level state of the module in-position pin on the test board is low level. If yes, make sure the optical module is connected to the test board.

8. The determination method according to claim 7, characterized in that: After confirming that the optical module is connected to the test board, perform the following steps: Monitor whether the level of the module's in-position pin is high. If so, make sure the optical module is disconnected from the test board; The number of connection and disconnection between the optical module and the test board is recorded, and an alarm signal for replacing the test board is issued when the number of connection and disconnection exceeds a preset upper limit.

9. A system for determining influencing factors of optical module testing, used for determining influencing factors of tested optical modules, characterized in that: The determination system includes a bit error meter for collecting the number of bit errors, a micro control unit for reading and transmitting the number of bit errors, and a host computer for receiving and analyzing the number of bit errors, wherein: The host computer is configured as: Determine whether the number of bit errors in any test time period exceeds a first set threshold; If yes, then searching for at least one target sampling period in which the number of bit errors exceeds the second set threshold value within the corresponding test time period, wherein any of the test time periods includes n consecutive sampling periods, where n≥10; Traversing the test control log based on the timestamp of any of the target sampling periods to obtain at least one target log entry corresponding to any of the target sampling periods; A corresponding table of the number of bit errors in the target sampling period and at least one target log item corresponding to the target sampling period is established to determine the test influencing factors of the optical module under test.

10. The determination system according to claim 9, characterized in that The host computer is communicatively connected to the system external device and is configured to receive the test action signal sent by the external device, and to record each test action and generate a test control log based on the automated testing software. Any data in the test control log consists of a log item corresponding to a test action content and the time when the test action occurs.

11. A device for determining influencing factors of optical module testing, used for determining influencing factors of optical module testing under test, characterized in that: The determining device comprises: A judging module, configured to judge whether the number of bit errors in any test time period exceeds a first set threshold; The current sampling period search module is configured to search for at least one target sampling period in which the number of bit errors exceeds the second set threshold value within the corresponding test time period when there is a test time period in which the number of bit errors exceeds the first set threshold value, and any of the test time periods includes n consecutive sampling periods, where n≥10; A target log item acquisition module is configured to traverse the test control log based on the timestamp of any of the target sampling periods to obtain at least one target log item corresponding to any of the target sampling periods; The test influencing factor determination module is configured to establish a corresponding table of the number of bit errors in the target sampling period and at least one target log item corresponding to the target sampling period to determine the test influencing factor of the optical module under test.

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