Optical device power test fixture and equipment

By designing an optical device power-up test fixture including a soft board base, an optical port base and an optical port gland, and combining a conductive member as an electrical adapter for the No. 2 probe, the problem of inconvenient operation and difficulty in power-up testing of optical devices in the prior art is solved, and an efficient and reliable test process is achieved.

CN119254316BActive Publication Date: 2025-04-25WUHAN ETERN OPTOCOM TECH CO LTD
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Patent Information

Application Number
CN202411758394.7
Authority / Receiving Office
CN · China
Patent Type
Patents(China)
Current Assignee / Owner
Filing Date
2024-12-03
Publication Date
2025-04-25
Estimated Expiration
2044-12-03

AI Technical Summary

Technical Problem

The existing power-on test fixtures for optical devices are inconvenient to operate, making it difficult to achieve reliable clamping and quick operation of optical device soft boards. Moreover, the main pad and the side pad are close to each other, making it difficult to power on the test at the same time, resulting in low testing efficiency.

Method used

A clamp including a soft plate base, an optical port base and an optical port gland is designed to absorb the optical port gland through a magnet to achieve efficient clamping of optical devices. At the same time, using conductive parts as the electrical adapter for probe No. 2 can power up the main pad and the side pad at the same time when space is limited.

Benefits of technology

Reliable clamping and efficient power-on testing of optical devices are realized, testing efficiency is improved, and the problems of inconvenience in operation and difficulty in simultaneously powering up in the prior art are solved.

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Abstract

The present invention relates to the field of optical communication technology, and provides an optical device power-on test fixture, including a soft board base for placing a soft board of an optical device to be tested, a positioning assembly for positioning the soft board is provided on the soft board base, and the fixture also includes an optical port base for mounting a flange of the optical device to be tested and an optical port pressure cover that can be covered on the optical port base, and the optical port base and the optical port pressure cover cooperate to form a fixing interval for fixing the flange. An optical device power-on test device is also provided, including a mounting table, and also including the above-mentioned optical device power-on test fixture, the soft board base and the optical port base are both arranged on the mounting table. The present invention uses a fixture to fix the optical device to be tested, and the clamping method of the optical port base and the optical port pressure cover is relatively convenient, and the optical device to be tested can be clamped more efficiently and reliably.
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Description

Technical Field

[0001] The invention relates to the technical field of optical communications, in particular to a power-on test fixture for optical devices. Background Art

[0002] Optical devices are optoelectronic devices in optical communication systems that can convert electrical signals into optical signals or vice versa. They are the heart of optical transmission systems. After the optical devices are packaged and manufactured, they need to go through a power-on test to test whether the various optoelectronic indicators of the optical devices meet the requirements. Only qualified optical devices can enter the next process. The completion of the power-on test requires a fixture that can clamp and power the optical devices. With the widespread application of optical transceiver devices in optical fiber communications, this demand is becoming more and more urgent.

[0003] Currently, most of the fixtures used for power-on testing of optical devices are inconvenient to operate, making it difficult to achieve reliable clamping and quick and convenient operation of the optical device flexible circuit board.

[0004] In addition, the main pad and the side pad of the optical device are close to each other. Due to size limitations, the existing technology usually tests the main pad and the side pad separately. It is difficult to power on the main pad and the side pad at the same time, which leads to low efficiency of the power-on test. Summary of the invention

[0005] The object of the present invention is to provide a power-on test fixture for optical devices, which can at least solve some of the defects in the prior art.

[0006] To achieve the above-mentioned purpose, an embodiment of the present invention provides the following technical solutions: an optical device power-on test fixture, comprising a soft board base for placing a soft board of the optical device to be tested, a positioning assembly for positioning the soft board is provided on the soft board base, the fixture also comprises an optical port base for installing a flange of the optical device to be tested and an optical port pressure cover that can be covered on the optical port base, the optical port base and the optical port pressure cover cooperate to form a fixing interval for fixing the flange.

[0007] Furthermore, the optical port pressure cover is rotatably mounted on the optical port base.

[0008] Furthermore, a magnet capable of adsorbing the optical port cover is provided on the optical port base.

[0009] Furthermore, there is a distance between the placement surface of the flexible board base for placing the flexible board and the optical port base, the optical port base is slidably mounted on the adapter base, and the direction in which the optical port base approaches or moves away from the placement surface is the sliding direction of the optical port base.

[0010] Furthermore, the soft board base has a slide groove, the optical port base has a boss, the boss extends into the slide groove, and the boss slides in the slide groove.

[0011] An embodiment of the present invention provides another technical solution: an optical device power-on test device, comprising a mounting platform and the above-mentioned optical device power-on test fixture, wherein the flexible board base and the optical port base are both arranged on the mounting platform.

[0012] Furthermore, the positioning assembly includes a mounting seat, and the mounting seat is provided with positioning pins for fitting the side pads of the optical device to be measured.

[0013] Furthermore, it also includes a No. 1 probe and a No. 2 probe for simultaneously energizing the main pad and the side pad of the optical device to be tested, wherein the No. 1 probe is directly opposite to the contact of the main pad, the positioning component includes a conductive part that can be conductive with the side pad, and the No. 2 probe is electrically connected to the conductive part.

[0014] Furthermore, it also includes a heat dissipation component for dissipating heat of the optical device to be tested.

[0015] Furthermore, the heat dissipation assembly includes a heat dissipation boss disposed on the mounting platform, and the heat dissipation boss contacts the optical device to be measured.

[0016] Compared with the prior art, the present invention has the following beneficial effects:

[0017] 1. The optical device to be tested can be fixed by a fixture. The clamping method of the optical port base and the optical port cover is more convenient, and the optical device to be tested can be clamped more efficiently and reliably.

[0018] 2. By using a conductive part as the electrical adapter for the No. 2 probe, even when space is limited, when the No. 1 probe powers the main pad, the No. 2 probe can also power the side pad at the same time, which solves the technical difficulty of the main pad and the side pad of the optical device in the prior art that are close to each other and it is difficult to power on the main pad and the side pad at the same time for testing, thereby improving the power-on test efficiency. BRIEF DESCRIPTION OF THE DRAWINGS

[0019] Figure 1 A schematic diagram of a power-on test fixture for an optical device provided by an embodiment of the present invention;

[0020] Figure 2 An exploded schematic diagram of an optical device power-on test fixture provided by an embodiment of the present invention;

[0021] Figure 3 It is a schematic diagram of the structure of a mounting platform of an optical device power-on test fixture provided by an embodiment of the present invention;

[0022] Figure 4It is a schematic diagram of the structure of a transfer base of an optical device power-on test fixture provided by an embodiment of the present invention;

[0023] Figure 5 It is a schematic diagram of the structure of a flexible board base of an optical device power-on test fixture provided by an embodiment of the present invention;

[0024] Figure 6 It is a schematic diagram of the copper sleeve structure of an optical device power-on test fixture provided by an embodiment of the present invention;

[0025] Figure 7 It is a schematic diagram of the guide shaft structure of a power-on test fixture for an optical device provided by an embodiment of the present invention;

[0026] Figure 8 It is a schematic diagram of the probe structure of an optical device power-on test fixture provided by an embodiment of the present invention;

[0027] Fig. 9 It is a schematic diagram of the pin plate structure of an optical device power-on test fixture provided by an embodiment of the present invention;

[0028] Fig.10 It is a schematic diagram of a bearing structure of an optical device power-on test fixture provided by an embodiment of the present invention;

[0029] Fig.11 It is a schematic diagram of the structure of a moving block of an optical device power-on test fixture provided by an embodiment of the present invention;

[0030] Fig.12 It is a schematic diagram of the structure of a fixing block of a power-on test fixture for an optical device provided by an embodiment of the present invention;

[0031] Fig.13 It is a schematic diagram of the cylinder structure of an optical device power-on test fixture provided by an embodiment of the present invention;

[0032] Fig.14 It is a schematic diagram of the connecting shaft structure of an optical device power-on test fixture provided by an embodiment of the present invention;

[0033] Fig.15 It is a schematic diagram of a mechanical valve structure of an optical device power-on test fixture provided by an embodiment of the present invention;

[0034] Fig.16 It is a schematic diagram of the structure of a fixing plate of an optical device power-on test fixture provided by an embodiment of the present invention;

[0035] Fig.17 It is a schematic diagram of the limit axis structure of a power-on test fixture for an optical device provided by an embodiment of the present invention;

[0036] Fig.18It is a schematic diagram of an optical port pressure cover structure of an optical device power-on test fixture provided by an embodiment of the present invention;

[0037] Fig.19 It is a schematic diagram of the optical device structure of an optical device power-on test fixture provided by an embodiment of the present invention;

[0038] Fig. 20 It is a schematic diagram of the structure of an optical port base of an optical device power-on test fixture provided by an embodiment of the present invention;

[0039] Fig.21 It is a schematic structural diagram of a positioning component of a power-on test fixture for an optical device provided by an embodiment of the present invention;

[0040] In the reference numerals:

[0041] 1-mounting platform; 101-first screw hole; 102-first positioning hole; 103-first threaded hole; 104-second threaded hole;

[0042] 2-adapter base; 201-second screw hole; 202-third threaded hole; 203-positioning blind hole; 204-heat dissipation boss;

[0043] 3-soft board base; 301-third screw hole; 302-first hole; 303-mounting hole; 304-slide groove;

[0044] 4-Location pin;

[0045] 5-copper sleeve; 501-first boss; 502-first hole;

[0046] 6-guide shaft; 601-fourth threaded hole;

[0047] 7-probe; 701-elastic structure;

[0048] 8-needle plate; 801-fourth screw through hole; 802-copper sleeve mounting hole; 803-first limit surface; 804-probe mounting hole; 805-soft board pressing platform;

[0049] 9-bearing; 901-second hole; 902-slot;

[0050] 10-moving block; 1001-blind hole for installation; 1002-second through hole; 1003-fifth threaded hole; 1004-third through hole; 1005-screw installation hole;

[0051] 11-C type retaining ring;

[0052] 12-fixing block; 1201-fifth screw through hole; 1202-sixth screw through hole; 1203-fourth through hole; 1204-second positioning hole;

[0053] 13-cylinder; 1301-air inlet; 1302-movable shaft; 1303-sixth threaded hole; 1304-seventh threaded hole;

[0054] 14-speed regulating joint;

[0055] 15-connecting shaft; 1501-flat hole; 1502-fifth through hole;

[0056] 16-mechanical valve; 1601-seventh screw hole; 1602-eighth threaded hole; 1603-button;

[0057] 17-fixing plate; 1701-ninth threaded hole; 1702-tenth threaded hole;

[0058] 18-Quick connector;

[0059] 19-limiting axis; 1901-threaded axis; 1902-second limiting surface;

[0060] 20-optical port pressure cover; 2001-pin through hole; 2002-flange upper slot; 2003-eleventh threaded hole; 2004-device upper slot;

[0061] 21- optical device to be tested; 2101- flange; 2102- heat sink; 2103- side pad; 21031- soft board positioning hole; 2104- main pad; 2105- soft board;

[0062] 22-magnet;

[0063] 23-optical port base; 2301-magnet mounting hole; 2302-pin mounting hole; 2303-second boss; 2304-pressure cover mounting slot; 2305-flange lower slot; 2306-device lower slot;

[0064] 24-positioning assembly; 2401-mounting seat; 2402-positioning needle; 2403-guiding surface. DETAILED DESCRIPTION

[0065] The following will be combined with the drawings in the embodiments of the present invention to clearly and completely describe the technical solutions in the embodiments of the present invention. Obviously, the described embodiments are only part of the embodiments of the present invention, not all of the embodiments. Based on the embodiments of the present invention, all other embodiments obtained by ordinary technicians in this field without creative work are within the scope of protection of the present invention.

[0066] See also Figures 1 to 21 The embodiment of the present invention provides an optical device power-on test device, which includes two parts: a fixture and a driving mechanism. The optical device to be tested is fixed by the fixture, and then the driving mechanism drives the probe to power on the flexible board for testing.

[0067] See also Figures 1 to 5 as well as Figures 18 to 21 The optical device power-on test fixture includes a soft board base 3 for placing a soft board 2105 of the optical device 21 to be tested, and a positioning component 24 for positioning the soft board 2105 is provided on the soft board base 3. The fixture also includes an optical port base 23 for mounting the flange 2101 of the optical device 21 to be tested and an optical port pressure cover 20 that can be covered on the optical port base 23. The optical port base 23 and the optical port pressure cover 20 cooperate to form a fixed interval for fixing the flange 2101. In this embodiment, the optical device 21 to be tested can be fixed by using a fixture, and the clamping method of the optical port base 23 and the optical port pressure cover 20 is relatively convenient, and the optical device 21 to be tested can be clamped more efficiently and reliably. Preferably, the optical port pressure cover 20 is rotatably installed on the optical port base 23, and the optical port base 23 is provided with a magnet 22 that can adsorb the optical port pressure cover 20. The flexible board base 3 is a non-conductive plastic part, provided with a mounting hole 303, and the positioning assembly 24 is tightly mounted in the mounting hole 303. The optical port gland 20 is made of a magnetically absorbable metal material, and is provided with a pin through hole 2001, a flange upper slot 2002, an eleventh threaded hole 2003, and a device upper slot 2004. Align the pin through hole 2001 with the pin mounting hole 2302, place it in the gland mounting slot 2304, and pass a standard pin through the pin mounting hole 2302 and the pin through hole 2001 in sequence, so that the optical port gland 20 can be rotated in the optical port base 23. Screw a standard hexagon socket screw into the eleventh threaded hole 2003 to facilitate the hand-held rotation of the optical port gland 20. The optical device to be tested 21 is provided with a flange 2101, a heat sink 2102, a side pad 2103, a flexible board positioning hole 21031, a main pad 2104, and a flexible board 2105. The center distance of the two soft board positioning holes 21031 matches the center distance of the two positioning pins 2402. The optical port base 23 is provided with a flange lower groove 2305 and a gland mounting groove 2304, and the flange 2101 is clamped in the flange lower groove 2305. The optical port base 23 is also provided with a magnet mounting hole 2301 and a pin mounting hole 2302, and the magnet 22 is mounted in the magnet mounting hole 2301. The optical port pressure cover 20 is made of a magnetically absorbable metal material and is provided with a pin through hole 2001. The pin through hole 2001 of the optical port pressure cover 20 is aligned with the pin installation hole 2302 of the optical port base 23 and placed in the pressure cover installation groove 2304 of the optical port base 23. A standard pin is sequentially passed through the pin installation hole 2302 of the optical port base 23 and the pin through hole 2001 of the optical port pressure cover 20, so that the optical port pressure cover 20 can rotate in the optical port base 23. When the optical port pressure cover 20 rotates to a horizontal position, it is attracted by the magnet 22 and the optical device 21 to be tested is clamped.

[0068] See also Figures 1 to 5 as well as Figures 18 to 21 , there is a gap between the shelf surface of the soft board base 3 for placing the soft board 2105 and the optical port base 23, the optical port base 23 is slidably mounted on the adapter base 2, and the direction in which the optical port base 23 approaches or moves away from the shelf surface is the sliding direction of the optical port base 23. In this embodiment, by setting the optical port base 23 to be slidable, when the lengths of the soft board 2105 are different, the soft board 2105 can be placed on the shelf surface by sliding, which is convenient for positioning soft boards 2105 of different lengths to adapt to the optical devices 21 to be tested of different lengths of the soft board 2105. Preferably, the soft board base 3 has a slide groove 304, and the optical port base 23 has a second boss 2303, the second boss 2303 extends into the slide groove 304, and the second boss 2303 slides in the slide groove 304. The sliding path of the optical port base 23 can be ensured by designing the slide groove 304 and the second boss 2303 to cooperate. The flexible board base 3 can be refined into a U-shape, the optical port base 23 can be arranged in the U-shaped opening, and the slide groove 304 can be arranged at the U-shaped opening. The U-shaped opening can also play a role in limiting the sliding direction of the optical port base 23.

[0069] See also Figures 1 to 17 , the soft board base 3 and the optical port base 23 in the above-mentioned clamp can both be arranged on the mounting table 1. The soft board base 3 is fixed on the adapter base 2, and two positioning pins 4 are tightly mounted on the adapter base 2, and the adapter base 2 is fixed on the mounting table 1. The mounting table 1 is provided with a first screw through hole 101, a first positioning hole 102, a first threaded hole 103, and a second threaded hole 104. The adapter base 2 is provided with a second screw through hole 201, a third threaded hole 202, a positioning blind hole 203, and a heat dissipation boss 204. Four hexagon socket screws pass through the second screw through hole 201 and are screwed into the second threaded hole 104 to fix the adapter base 2 to the mounting table 1. Two positioning pins 4 are inserted into the positioning blind hole 203 and are tightly fixed. The optical port base 23 is provided with a magnet mounting hole 2301, a pin mounting hole 2302, a second boss 2303, a gland mounting groove 2304, a flange lower slot 2305, and a device lower slot 2306. The magnet 22 is tightly fitted into the magnet mounting hole 2301. The soft board base 3 is a non-conductive plastic part, provided with a third screw through hole 301, a first through hole 302, a mounting hole 303, and a slide groove 304. The second boss 2303 is placed in the slide groove 304 of the soft board base 3 so that it can slide in the slide groove 304. The first through hole 302 of the soft board base 3 is inserted into the positioning pin 4, and four hexagon socket screws are passed through the third screw through hole 301 and screwed into the third threaded hole 202 of the adapter base 2 to fix the soft board base 3 on the adapter base 2.

[0070] See also Figures 1 to 17The positioning component 24 has two functions, one is to position the soft board 2105, and the other is to guide the flow. The positioning pin 2402 is used for positioning, and the guiding surface 2403 is used for guiding the flow, wherein the positioning pin 2402 can also be used as a conductive component. Of course, these two functions can also be separated into independent components and act separately. Specifically, the mounting seat 2401 has a guiding surface 2403 in contact with the second probe, and the guiding surface 2403 is electrically connected to the side pad 2103. Preferably, the device also includes probes for simultaneously energizing the main pad 2104 and the side pad 2103 of the optical device to be tested, which are defined as probe No. 1 and probe No. 2 according to different action positions, and the contact point of the probe No. 1 is directly opposite to the main pad 2104. The positioning component includes a conductive part that can be connected to the side pad 2103, and the probe No. 2 is electrically connected to the conductive part. The guide surface 2403 is provided with a positioning pin 2402 protruding from the guide surface 2403, and the positioning pin 2402 is arranged in contact with the side pad 2103. The mounting seat 2401 is arranged at the mounting hole 303 of the soft board base 3. The positioning component 24 is provided with a mounting seat 2401, a positioning pin 2402, and a guide surface 2403. The mounting seats 2401 of the two positioning components 24 are tightly fitted into the mounting hole 303 of the soft board base 3 (pay attention to the direction, the side with the positioning pin 2402 faces inward). During positioning, the two soft board positioning holes 21031 of the optical device 21 to be measured are respectively clamped on the two positioning pins 2402, and are close to the positioning component 24, specifically, the soft board 2105 is clamped first. The soft board positioning holes 21031 are clamped on the two positioning pins 2402 respectively, and the soft board 2105 is placed on the guide surface 2403. At this time, the two side pads 2103 are in contact with the guide surface 2403. After the soft board 2105 is assembled, the flange 2101 is inserted into the lower flange groove 2305, and the optical port cover 20 is rotated to a horizontal state. The optical port cover 20 is sucked by the magnet 22, and the optical device 21 to be tested is clamped. At this time, the upper flange groove 2002 is also aligned with the flange 2101, and the device is actually clamped by the lower device groove 2306 and the upper device groove 2004. Due to the restriction and sliding effect of the second boss 2303 in the slide groove 304, this fixture can adapt to optical devices with different soft board lengths. During the diversion, the No. 2 probe transfers electricity to the guide surface 2403, and the guide surface 2403 then transfers electricity to the side pad 2103, which can be transferred specifically through the positioning pin 2402. One of the probes is used to power the main pad 2104, and the No. 2 probe is used to power the side pad 2103. There are multiple number of No. 1 probes and No. 2 probes, such as six No. 1 probes and two No. 2 probes shown in this embodiment. The six No. 1 probes correspond to the six contacts of the main pad, and the two No. 2 probes are arranged on both sides. Due to the size limitation of the soft board and the large number of probes, it is impossible to directly power on the main pad and the side pad at the same time in the prior art.The positioning component of this embodiment is cleverly designed, which can not only play a positioning role, but also can successfully power the two No. 2 probes on the pads on both sides through its guide surface, thereby realizing the simultaneous powering of the main pad and the side pad, greatly improving the test efficiency.

[0071] See also Figures 1 to 17 , the device also includes a heat dissipation component for dissipating heat from the optical device to be tested. Preferably, the heat dissipation component includes a heat dissipation boss 204 provided on the mounting platform 1, and the heat dissipation boss 204 contacts the optical device to be tested 21. In this embodiment, the optical device to be tested 21 will generate heat during testing, and the heat dissipation component can be used to dissipate the heat in time to ensure that the product will not be damaged. The heat dissipation method can be to set a heat dissipation boss 204 on the mounting platform to conduct away the heat. A heat dissipation block 2102 can also be provided on the optical device to be tested 21 to cooperate with the heat dissipation boss 204 to dissipate heat, and the two can be butt-jointed. Both the heat dissipation block 2102 and the heat dissipation boss 204 can use thermally conductive interface materials.

[0072] See also Figures 1 to 17 The device further comprises a driving mechanism for driving the probe No. 1 and the probe No. 2 to move closer to or away from the mounting platform. In this embodiment, the driving mechanism is used to drive the probe No. 1 and the probe No. 2 to move, which can improve the test efficiency and ensure the test accuracy.

[0073] See also Figures 1 to 17, the driving mechanism includes a needle plate 8 for the installation of the No. 1 probe and the No. 2 probe, and a driving member for driving the needle plate 8 to move linearly, and the mounting platform 1 is located on the driving path of the driving member. The surface of the needle plate 8 facing the mounting platform 1 is provided with a soft plate pressing platform 805. The driving mechanism also includes a moving block 10 for the installation of the needle plate 8 and a fixed block 12 for the installation of the driving member, and the driving end of the driving member drives the moving block 10 to move. The driving mechanism also includes a guide shaft 6, the guide shaft 6 passes through the moving block 10 and is fixed on the fixed block 12, the moving block 10 is slidably arranged on the guide shaft 6, and the extension direction of the guide shaft 6 is consistent with the driving direction of the driving member. Preferably, the device also includes a mechanical valve 16 for controlling the action of the driving mechanism. In this embodiment, the guide shaft 6 and the fixed plate 17 are fixed on the mounting platform 1, and the mechanical valve 16 is fixed on the fixed plate 17. The fixed plate 17 is provided with a ninth threaded hole 1701 and a tenth threaded hole 1702. Two hexagon socket screws pass through the first screw hole 101 from the bottom and are screwed into the tenth threaded hole 1702 to fix the cylinder fixing plate 17 on the mounting table 1. The bearing 9 is sleeved on the guide shaft 6, and the moving block 10 is sleeved on the bearing 9. At both ends of the moving block 10, two C-shaped retaining rings 11 are clamped in the groove 902 of the bearing 9. The needle plate 8 is fixed on the moving block 10. The end of the probe 7 is an elastic structure, and the eight probes 7 are fixed on the needle plate 8. In this way, the bearing 9, the moving block 10, the needle plate 8, and the probe 7 become a whole and can slide freely up and down on the guide shaft 6. The copper sleeve 5 is tightly fixed on the needle plate 8, and when the needle plate 8 moves up and down, it is precisely slid with the positioning pin 4 to play a positioning role. The needle plate 8 is also provided with a soft board pressing platform 805. During the pressing process of the needle plate 8, the elastic structure of the probe 7 first contacts the pad of the soft board 2105, and then the soft board pressing platform 805 presses the soft board 2105, so that the power-on process is more stable and reliable. The fixed block 12 is fixed on the guide shaft 6, and the cylinder 13 is fixed on the fixed block 12. One end of the connecting shaft 15 is sleeved in the moving block 10, and the other end is sleeved on the movable shaft 1302 of the cylinder 13. A standard hexagon socket screw passes through the moving block 10, the connecting shaft 15, and is screwed into the movable shaft 1302 of the cylinder 13 in sequence, connecting the moving block 10 and the movable shaft 1302 of the cylinder 13 together. The up and down movement of the movable shaft 1302 of the cylinder 13 can drive the moving block 10, and then drive the needle plate 8 and the probe 7 to move up and down together. The cylinder 13 is equipped with a speed regulating joint 14, and the speed regulating joint 14 is used to adjust the speed of the up and down movement of the movable shaft 1302 of the cylinder 13. The mechanical valve 16 is provided with a quick connector 18, and the speed regulating connector 14 and the quick connector 18 are connected one to one with an air pipe (not shown). The mechanical valve 16 is a lockable mechanical valve.Press the button once, the movable shaft 1302 of the cylinder 13 moves downward and locks, and the probe 7 now contacts the pad of the soft board 2105 of the optical device 21 to be tested. In fact, among the eight probes 7, the six probes 7 in the middle contact the six contacts of the main pad 2104 respectively, and the two probes 7 on both sides contact the positioning component 24 at this time. By powering on the positioning component 24, the positioning component 24 indirectly powers the two side pads 2103 of the device through the positioning needle 2402. After the test is completed, the button 1603 of the mechanical valve 16 is rotated in the reverse direction, and the cylinder 13 retreats upward to test the next optoelectronic device. The mechanical valve 16 is provided with a seventh screw through hole 1601, an eighth threaded hole 1602 (at P, A, and B), and a button 1603. Three hexagon socket screws pass through the seventh screw through hole 1601 and are screwed into the ninth threaded hole 1701 to fix the mechanical valve 16 to the fixing plate 17. The threaded ends of the three quick connectors 18 are screwed into the eighth threaded hole 1602, and the other ends are connected to the air source and the double-acting cylinder through air pipes (P is connected to the air source, and A / B is connected to the double-acting cylinder). The guide shaft 6 is provided with a fourth threaded hole 601 at both ends. Two hexagon socket screws pass through the first positioning hole 102 from the reverse side and are screwed into the fourth threaded hole 601 to fix the two guide shafts 6 to the mounting table 1. The bearing 9 is provided with a second hole 901 and a slot 902. The moving block 10 is provided with a mounting blind hole 1001, a second through hole 1002, a fifth threaded hole 1003, a third through hole 1004, and a screw mounting hole 1005. The second hole 901 is inserted into the guide shaft 6, the second through hole 1002 is inserted into the bearing 9, and two C-shaped retaining rings 11 are inserted into the slot 902 to fix the moving block 10 and the bearing 9 together so that the moving block 10 can slide up and down along the guide shaft 6 along with the bearing 9. The needle plate 8 is provided with a fourth screw through hole 801, a copper sleeve mounting hole 802, a first limiting surface 803, a probe mounting hole 804, and a soft board pressing platform 805. The copper sleeve 5 is provided with a first boss 501 and a first hole 502. The three copper sleeves 5 are tightly fitted into the copper sleeve mounting hole 802, and the first boss 501 is close to the first limiting surface 803. One end of the probe 7 is an elastic structure, and the elastic structures of the eight probes 7 are facing downward and respectively inserted into the probe mounting holes 804. Three standard hexagonal screws are inserted into the fourth screw through hole 801 and screwed into the fifth threaded hole 1003 to fix the needle plate 8 on the moving block 10. The fixed block 12 is provided with a fifth screw through hole 1201, a sixth screw through hole 1202, a fourth through hole 1203, and a second positioning hole 1204 is provided on the back. The connecting shaft 15 is provided with a flat hole 1501 and a fifth through hole 1502. The cylinder 13 is provided with an air inlet 1301, a movable shaft 1302, a sixth threaded hole 1303, and a seventh threaded hole 1304. Four standard hexagon socket screws are passed through the sixth screw through hole 1202 from the reverse side and screwed into the seventh threaded hole 1304 to fix the cylinder 13 and the fixing block 12 together.Insert the flat hole 1501 of the connecting shaft 15 into the movable shaft 1302, and insert the other end into the fourth through hole 1203 and into the installation blind hole 1001. A standard hexagon socket screw passes through the screw installation hole 1005 at the bottom of the moving block 10 and the fifth through hole 1502 of the connecting shaft 15 in sequence, and is screwed into the sixth threaded hole 1303 of the cylinder 13, so that the movable shaft 1302 of the cylinder 13 and the moving block 10 are connected together, so that the up and down movement of the movable shaft 1302 of the cylinder 13 can drive the moving block 10, the needle plate 8, and finally the probe 7 to move up and down. Sleeve the second positioning hole 1204 on the back of the fixed block 12 on the two guide shafts 6, and two standard hexagon socket screws pass through the fifth screw through hole 1201 and are screwed into the fourth threaded hole 601 of the guide shaft 6 to fix the fixed block 12 and the guide shaft 6 together. The limit shaft 19 is provided with a threaded shaft 1901 and a second limit surface 1902. The threaded shaft 1901 is screwed into the first threaded hole 103 to an appropriate depth (the depth is adjustable). The threaded ends of the two speed regulating joints 14 are screwed into the air inlet 1301 of the cylinder 13, and the other ends are connected to the A and B air outlets of the mechanical valve 16 with air pipes. The P end of the mechanical valve 16 is connected to the air source, and the S and R ends are connected to the muffler.

[0074] The following is the working method of this device:

[0075] Step 1: Align the two soft board positioning holes 21031 of the optical device 21 to be tested with the two positioning pins 2402, and place the soft board 2105 on the guide surface 2403. Then, snap the flange 2101 into the lower flange slot 2305, and cover the optical port cover 20. The optical device 21 to be tested is clamped by the lower device slot 2306 and the upper device slot 2004.

[0076] Step 2: Press the button 1603 of the mechanical valve 16, the movable shaft 1302 of the cylinder 13 moves downward and locks, driving the moving block 10, the needle plate 8, and finally the probe 7 to move downward and lock. During the downward movement of the probe 7, the probe 7 first contacts the pad (the six probes 7 in the middle contact the main pad 2104, and the two probes 7 on both sides contact the guide surface 2403, indirectly energizing the side pad 2103). Then the soft board pressing table 805 presses the soft board 2105 to make the power-on process more stable and reliable.

[0077] Step 3: Testing the photodetector 21 to be tested.

[0078] Step 4: After the test is completed, the button 1603 of the mechanical valve 16 is rotated counterclockwise, and the movable axis of the cylinder 13 is reset upward. The probe 7 leaves the side pad 2103 and the main pad 2104 of the optical device 21 to be tested.

[0079] Step 5: Take out the optical device 21 to be tested that has been tested.

[0080] Repeat steps 1 to 5 to test the next optical device 21 to be tested.

[0081] Although embodiments of the present invention have been shown and described, it will be appreciated by those skilled in the art that various changes, modifications, substitutions and variations may be made to the embodiments without departing from the principles and spirit of the present invention, and that the scope of the present invention is defined by the appended claims and their equivalents.

Claims

1. An optical device power-on test device, comprising a mounting platform, characterized in that: The optical device power-on test fixture also includes a soft board base for placing a soft board of the optical device to be tested, and a positioning component for positioning the soft board is provided on the soft board base. The fixture also includes an optical port base for installing a flange of the optical device to be tested and an optical port pressure cover that can cover the optical port base. The optical port base and the optical port pressure cover cooperate to form a fixing interval for fixing the flange. The soft board base and the optical port base are both arranged on the mounting table. The positioning component includes an installation The mounting seat is provided with a positioning pin for fitting the side pad of the optical device to be tested, the device also includes a No. 1 probe and a No. 2 probe for simultaneously energizing the main pad and the side pad of the optical device to be tested, the No. 1 probe is directly facing the contact of the main pad, the positioning component includes a conductive member that can be conductive with the side pad, the No. 2 probe is electrically connected to the conductive member, the mounting seat has a guide surface in contact with the No. 2 probe, the guide surface is electrically connected to the side pad, and the positioning pin is arranged on the guide surface.

2. The optical device power-on test equipment according to claim 1, characterized in that: The optical port pressure cover is rotatably arranged on the optical port base.

3. The optical device power-on test equipment according to claim 1, characterized in that: The optical port base is provided with a magnet capable of adsorbing the optical port cover.

4. The optical device power-on test equipment according to claim 1, characterized in that: There is a distance between the placement surface of the soft board base for placing the soft board and the optical port base. The optical port base is slidably mounted on the adapter base, and the direction in which the optical port base approaches or moves away from the placement surface is the sliding direction of the optical port base.

5. The optical device power-on test equipment according to claim 4, characterized in that: The soft board base has a slide groove, and the optical port base has a boss, the boss extends into the slide groove, and the boss slides in the slide groove.

6. The optical device power-on test equipment according to claim 1, characterized in that: It also includes a heat dissipation component for dissipating heat from the optical device to be tested.

7. The optical device power-on test equipment according to claim 6, characterized in that: The heat dissipation assembly includes a heat dissipation boss disposed on the mounting platform, and the heat dissipation boss contacts the optical device to be measured.

Citation Information

Patent Citations

  • Optical device testing device and testing clamp

    CN209267580U