A photovoltaic module testing and sorting mechanism

Abstract

The present invention provides a photovoltaic module testing and sorting mechanism, which relates to the technical field of testing and sorting machines and includes a mounting frame. A conveying channel is formed on the top surface of the mounting frame. A test board is installed in the conveying channel, and two size measurement structures symmetrically arranged with respect to the test board are installed in the conveying channel. The present invention provides a photovoltaic module testing and sorting mechanism. By providing the mounting frame, the test board, the size measurement structure, the first amount-of-motion measuring device and the circulating pushing structure, when the solar silicon wafer reaches the distance between the two size measurement structures, through the physical displacement generated by the measurement ring in the size measurement structure, the width and thickness of the solar silicon wafer are measured, so as to judge the deformation condition of the solar silicon wafer, reduce the faults occurring in the optical image detection equipment, and can also be used in cooperation with the optical image detection equipment for mutual verification, making the testing and sorting effect better and ensuring the accuracy of the testing and sorting of the curling around the solar silicon wafer.

Description

Technical Field

[0001] The present invention relates to the technical field of test and sorting machines, and particularly to a test and sorting mechanism for photovoltaic modules. Background Art

[0002] A photovoltaic module is a device that converts solar energy into electrical energy and is widely used in solar power generation applications such as solar power plants and solar street lights. A photovoltaic module includes solar cell components, glass encapsulation, brackets, connecting wires, and connectors.

[0003] Solar cell components: They are the core components of a photovoltaic module and are key elements for converting sunlight into electrical energy. Solar cell components are usually assembled from multiple solar wafers. The solar wafers need to undergo a series of inspections and screenings to ensure their quality and performance. Common inspection and screening methods include the following aspects: 1. Appearance inspection: Visually inspect the appearance of the solar wafers to check for surface defects such as cracks, scratches, and bubbles, ensuring that the surface of the solar wafers is flat and intact; 2. Photoelectric performance detection: Use photoelectric performance testing equipment, such as a photoelectric conversion efficiency tester and a photovoltaic cell tester, to detect performance parameters such as the photoelectric conversion efficiency, open-circuit voltage, and short-circuit current of the solar wafers, and evaluate their power generation performance; 3. Dimension accuracy detection: Measure parameters such as the size and thickness accuracy of the solar wafers to ensure that the wafers meet the specified size requirements to ensure that they can be correctly assembled into solar cells; 4. Insulation resistance test: Detect the insulation performance of the solar wafers to ensure that the wafers can be used safely and reliably during operation; 5. Flexure test: Test the flexure of the solar wafers to ensure that the wafers will not be damaged or have their performance degraded due to excessive bending during installation and use.

[0004] During the production process of solar wafers, various deformation situations may occur. The most common one is edge curling. During inspection and sorting, the surface morphology and deformation of solar wafers are usually observed through optical imaging instruments such as a two-dimensional scanning electron microscope and a white light interferometer. However, the above-mentioned detection equipment will cause the accuracy and stability of the equipment (inaccurate focusing, vibration of the equipment, and change of light) due to long-term use or environmental influence, and may also malfunction, affecting the detection results and the detection results of the deformation of solar wafers. Summary of the Invention

[0005] Based on the technical problems existing in the background art, the present invention proposes a test and sorting mechanism for photovoltaic modules.

[0006] A photovoltaic module testing and sorting mechanism proposed by the present invention includes a mounting frame. A conveying channel is provided on the top surface of the mounting frame. A test board is installed in the conveying channel. Two size measuring structures symmetrically arranged with respect to the test board are installed in the conveying channel;

[0007] The size measuring structure includes a vertically arranged vertical rod. The two vertical rods are respectively located on both sides of the test board. A plurality of measuring rings are sleeved on the vertical rod. The plurality of measuring rings are stacked on top of each other from top to bottom. The measuring rings can move horizontally on the vertical rod. When the solar silicon wafer slides on the test board, both sides of the solar silicon wafer can push the measuring rings to move horizontally on the vertical rod. A first amount-of-motion measuring device capable of measuring the horizontal amount of motion of the measuring rings on the vertical rod is installed on the vertical rod;

[0008] A circulating pushing structure is installed on the mounting frame. The circulating pushing structure is used to push the solar silicon wafer on the test board through the gap between the two size measuring structures;

[0009] The size measuring structure further includes a side frame, a lifting block, a ranging sensor and a first return spring; the side frame is fixedly installed on the side of the conveying channel. An installation notch is provided on the side of the side frame close to the test board. The vertical rod is vertically installed in the installation notch. The lowermost measuring ring of the vertical rod abuts against the bottom inner wall of the installation notch;

[0010] The lifting block is slidably sleeved on the vertical rod.

[0011] Preferably, the first amount-of-motion measuring device is installed on the lifting block, the measuring ring is installed on the first amount-of-motion measuring device, the ranging sensor is installed on the top inner wall of the installation notch. A top plate is fixedly installed on the top surface of the uppermost measuring ring of the same vertical rod. The end of the output shaft of the ranging sensor is fixedly connected with a sliding sleeve on the vertical rod. The top plate abuts against the top surface of the uppermost measuring ring of the vertical rod. The first return spring is sleeved on the output shaft of the ranging sensor, and both ends of the first return spring respectively abut against the top plate and the top inner wall of the installation notch.

[0012] Preferably, an anti-jamming ring is rotatably sleeved on the outer periphery of the measuring ring, and the thickness of the anti-jamming ring is the same as the thickness of the measuring ring.

[0013] Preferably, the first amount-of-motion measuring device includes a resistance cylinder, a conductive rod and a second return spring. An installation hole is provided on the outer periphery of the lifting block. The resistance cylinder is fixedly installed in the installation hole. A motion hole slidably matched with the large end of the resistance cylinder is provided at the end of the conductive rod. The large end of the conductive rod is slidably installed in the motion hole of the resistance cylinder. The second return spring is sleeved on the resistance cylinder, and both ends of the second return spring respectively abut against the outer periphery of the lifting block and the inner circumferential wall of the measuring ring.

[0014] Preferably, the sliding direction of the conductive rod in the moving hole on the resistance cylinder is the horizontal direction.

[0015] Preferably, the cyclic pushing structure includes a linear slide rail, a vertical push plate rod, and a lifting component; a conveying movement groove is formed in the bottom inner wall of the conveying channel, the linear slide rail is fixedly installed in the conveying movement groove, the vertical push plate rod slidably penetrates through the slider on the linear slide rail, and the vertical push plate rod is vertically arranged, and the lifting component is used to drive the vertical push plate rod to move up and down on the slider of the linear slide rail.

[0016] Preferably, the lifting component includes an annular slide rail; the bottom end of the vertical push plate rod is rotatably installed on the slider of the annular slide rail.

[0017] Preferably, it further includes a first conveyor belt, a second conveyor belt, and a sorting structure; the first conveyor belt and the second conveyor belt are respectively located at both ends of the test board, the first conveyor belt is located at the upstream position of the test board, the second conveyor belt is located at the downstream position of the test board, and the sorting structure can carry down the solar wafers on the second conveyor belt.

[0018] Preferably, the sorting structure includes a moving frame, an electric push rod, and a U-shaped frame; the moving frame is located below the downstream of the second conveyor belt, the electric push rod is slidably installed on the moving frame, the U-shaped frame is fixedly installed on the output shaft of the electric push rod, and the two bent sections on both sides of the U-shaped frame are respectively located on both sides of the second conveyor belt.

[0019] Preferably, a corrugated pipe is connected to the top plate, and the top end of the corrugated pipe is fixedly connected to the top inner wall of the installation notch.

[0020] A photovoltaic module test and sorting mechanism proposed by the present invention has the following beneficial effects: through the provided mounting frame, test board, dimension measurement structure, first movement amount measurement device, and cyclic pushing structure, when the solar wafer reaches the distance between the two dimension measurement structures, through the physical displacement generated by the measurement ring in the dimension measurement structure, the width and thickness of the solar wafer are measured, so as to judge the deformation condition of the solar wafer, reduce the faults that occur in the optical image detection equipment, and can also be used in cooperation with the optical image detection equipment for mutual verification, making the test and sorting effect better, and ensuring the accuracy of the test and sorting of the curling around the four sides of the solar wafer. BRIEF DESCRIPTION OF THE DRAWINGS

[0021] Figure 1 It is a schematic diagram of the overall structure of a photovoltaic module test and sorting mechanism proposed by the present invention.

[0022] Figure 2 It is the front view of the mounting frame in a photovoltaic module test and sorting mechanism proposed by the present invention.

[0023] Figure 3 A side sectional view of the first movement amount measuring device in a photovoltaic module testing and sorting mechanism proposed by the present invention.

[0024] Figure 4 A top sectional view of the first movement amount measuring device in a photovoltaic module testing and sorting mechanism proposed by the present invention.

[0025] Figure 5 A schematic diagram of the position of the measuring ring and the solar silicon wafer when the first movement amount measuring device in a photovoltaic module testing and sorting mechanism proposed by the present invention is in contact with a normal solar silicon wafer.

[0026] Figure 6 A schematic diagram of the position of the measuring ring and the solar silicon wafer when the first movement amount measuring device in a photovoltaic module testing and sorting mechanism proposed by the present invention is in contact with a solar silicon wafer with a locally curled edge.

[0027] Figure 7 A schematic diagram of the position of the measuring ring and the solar silicon wafer when the first movement amount measuring device in a photovoltaic module testing and sorting mechanism proposed by the present invention is in contact with a solar silicon wafer with a warped corner.

[0028] Figure 8 A three-dimensional sectional view of the circulating pushing structure in a photovoltaic module testing and sorting mechanism proposed by the present invention at the mounting frame.

[0029] Figure 9 A schematic diagram of the structure of the vertical rod in a photovoltaic module testing and sorting mechanism proposed by the present invention.

[0030] Figure 10 A schematic diagram of the position between the conductive rod and the solar silicon wafer before the solar silicon wafer is about to be tested in a photovoltaic module testing and sorting mechanism proposed by the present invention.

[0031] Figure 11 A side sectional view of the first movement amount measuring device in the second embodiment of a photovoltaic module testing and sorting mechanism proposed by the present invention.

[0032] Figure 12 A top sectional view of the first movement amount measuring device in the second embodiment of a photovoltaic module testing and sorting mechanism proposed by the present invention.

[0033] In the figure: 1, mounting frame; 2, test board; 3, measuring instrument; 4, vertical rod; 5, measuring ring; 6, side frame; 7, lifting block; 8, distance measuring sensor; 9, first reset spring; 10, corrugated pipe; 11, top plate block; 12, anti-jamming ring; 13, resistance cylinder; 14, conductive rod; 15, second reset spring; 16, linear slide rail; 17, vertical push rod; 18, annular slide rail; 19, first conveyor belt; 20, second conveyor belt; 21, moving frame; 22, electric push rod; 23, U-shaped frame; 24, rotating rod; 25, third reset spring. Detailed implementation manner Embodiment

[0034] Refer to Figures 1 - 10 , the present invention provides a photovoltaic module testing and sorting mechanism, including a mounting frame 1, a first conveyor belt 19, a second conveyor belt 20 and a sorting structure; the first conveyor belt 19 and the second conveyor belt 20 are respectively located at both ends of the test board 2, the first conveyor belt 19 is located at the upstream position of the test board 2, and the second conveyor belt 20 is located at the downstream position of the test board 2. The sorting structure can carry the solar wafers on the second conveyor belt 20. A conveying channel is provided on the top surface of the mounting frame 1, and a test board 2 is installed in the conveying channel. A measuring instrument 3 is installed on the mounting frame 1. The measuring instrument 3 includes optical imaging instruments such as a camera, a two-dimensional scanning electron microscope, and a white light interferometer. The measuring instrument 3 is located above the test board 2. Two dimension measuring structures symmetrically arranged with respect to the test board 2 are installed in the conveying channel. It should be noted that the width of the solar wafer is greater than the widths of the first conveyor belt 19, the second conveyor belt 20, and the test board 2; the dimension measuring structure includes a vertically arranged vertical rod 4. The two vertical rods 4 are respectively located on both sides of the test board 2. A plurality of measuring rings 5 are sleeved on the vertical rod 4. The plurality of measuring rings 5 are stacked on top of each other from top to bottom. The measuring ring 5 can move horizontally on the vertical rod 4. When the solar wafer slides on the test board 2, both sides of the solar wafer can push the measuring ring 5 to move horizontally on the vertical rod 4. A first movement measuring device capable of measuring the horizontal movement amount of the measuring ring 5 on the vertical rod 4 is installed on the vertical rod 4. A circulating pushing structure is installed on the mounting frame 1. The circulating pushing structure is used to push the solar wafer on the test board 2 through the gap between the two dimension measuring structures. In the normal state, the axes of the plurality of measuring rings 5 on the same vertical rod 4 are in a coincident state, and the distance between the two vertical rods 4 is fixed and greater than the width of the solar wafer. Suppose Figure 5As shown in the figure, when a normal solar wafer reaches the positions of the two size measurement structures, both sides of the solar wafer push two measurement rings 5 on the two size measurement structures to move (the movement directions of the measurement rings 5 on the two size measurement structures move away from each other. In the embodiment, only the movement state of the measurement ring 5 on one side is shown). The thickness of the solar wafer is the same as that of the two measurement rings 5. In actual use, the solar wafer is placed on the first conveyor belt 19, and the first conveyor belt 19 conveys the solar wafer to the test plate 2. The circulating pushing structure pushes the solar wafer on the test plate 2 to slide along the top surface of the test plate 2. When both sides of the solar wafer abut against the measurement rings 5, the measurement rings 5 can be pushed to move. The distance between the measurement rings 5 abutting against both sides of the solar wafer is the actual width of the solar wafer. As the solar wafer moves, by measuring the change in the movement amount of the measurement rings 5, the change in the distance between the two measurement rings 5 on both sides can be calculated, and the change in the width of the solar wafer can be judged according to the test data. Since the solar wafer is usually rectangular and the distances at various places are the same, when the width of the solar wafer changes, it may be due to deformation. In addition, the thickness of the solar wafer can also be detected. For example, Figure 5 the thickness of the normal solar wafer in the figure is the same as that of the two measurement rings 5. The thickness of the measurement rings 5 can be actually designed according to the actual situation. When the corners of the solar wafer are curled, such as Figure 7 as shown in the figure, the edge of the solar wafer pushes three measurement rings 5 to move, and the thickness of the two measurement rings 5 is the same as that of the solar wafer. In this way, it can be judged whether the corners of the solar wafer are curled, warped, etc. At the same time, when the corners of the solar wafer are curled or warped, the width of the solar wafer will change, and the deformation situation of the solar wafer can be accurately tested. Record the measured values to reduce the inaccurate detection results caused by the failure of the measuring instrument 3 or other external factors. Then compare the data with the situation measured by the measuring instrument 3 to make the detection results more accurate. After the solar wafer is tested, it is pushed onto the second conveyor belt 20, and the second conveyor belt 20 conveys the qualified solar wafer after testing to the next process for measurement processing on the other two sides of the solar wafer. The unqualified solar wafers are carried down from the second conveyor belt 20 by the sorting structure to facilitate the sorting of the unqualified solar wafers.

[0035] At the same time, a pressure sensor is also installed on the test plate 2. When the solar wafer is curled around the perimeter, both sides of the solar wafer abut against the measurement rings 5, which will cause a change in the pressure of the solar wafer on the test plate 2. Thus, according to the change in the pressure of the solar wafer on the test plate 2 and the change in the movement amount of the measurement rings 5, the deformation situation of the solar wafer can be judged.

[0036] like Figure 1 , Figure 2 and Figure 3 As shown, the size measurement structure also includes a side frame 6, a lifting block 7, a distance sensor 8 and a No. 1 reset spring 9; the distance sensor 8 is a submicron contact displacement sensor, the side frame 6 is fixedly installed on the side of the conveying channel, the side frame 6 is arranged vertically, but the side inner wall of the side frame 6 and the conveying channel is arranged obliquely, and a mounting notch is opened on the side of the side frame 6 close to the test plate 2, the vertical rod 4 is vertically installed in the mounting notch, and the lowermost measuring ring 5 of the vertical rod 4 is against the bottom inner wall of the mounting notch; the lifting block 7 is slidably sleeved on the vertical rod 4, and the No. 1 motion quantity measuring device is installed on the lifting block 7, the thickness of the lifting block 7 is the same as the thickness of the measuring ring 5, and under the action of the No. 1 reset spring 9 and gravity, multiple lifting blocks 7 are stacked together from top to bottom in sequence, and the lifting blocks 7 are vertically When the rod 4 is lifted or lowered, the measuring ring 5, the lifting block 7 and the No. 1 motion measuring device are regarded as a whole and lifted or lowered synchronously. The measuring ring 5 is installed on the No. 1 motion measuring device, and the distance sensor 8 is installed on the top inner wall of the installation gap. The top surface of the measuring ring 5 at the top of the same vertical rod 4 is fixedly installed with a top plate 11. The end of the output shaft of the distance sensor 8 is fixedly connected with the top plate 11 slidably mounted on the vertical rod 4. The top plate 11 abuts against the top surface of the measuring ring 5 at the top of the vertical rod 4. The No. 1 reset spring 9 is sleeved on the output shaft of the distance sensor 8, and the two ends of the No. 1 reset spring 9 abut against the top plate 11 and the top inner wall of the installation gap respectively. Assuming that the thickness of the solar silicon wafer is the same as the thickness of the two measuring rings 5, three situations will be encountered during the actual test process, and the specific situations are as follows:

[0037] Case 1: The solar wafer is normal and has no deformation. In this case, the positional relationship between the solar wafer and the measuring ring 5 is always the same. Figure 5 As shown in;

[0038] Case 2: The edge of the solar wafer is partially deformed, while the four corners are in normal position. When the two corners of the solar wafer are against the measuring ring 5 and push the measuring ring 5 to move, the position relationship between the solar wafer and the measuring ring 5 is as follows: Figure 5 As shown in FIG. 1 , when the deformed position of the solar wafer contacts the measuring ring 5, the following will occur: Figure 6 In the position state shown in , the local edge of the solar silicon wafer is curled. Usually, the edge of the curled position and the normal position is an inclined surface or bevel. The inclined surface or bevel will gradually lift the upper measuring ring 5, so that the upper measuring ring 5 will be displaced when it is lifted. The distance measuring sensor 8 measures the upward movement displacement of the measuring ring 5, thereby judging the degree of curling of the edge of the solar silicon wafer;

[0039] Case 3: If Figure 7As shown, in the case where the solar wafer has a warped corner, the corner of the solar wafer will push the measuring rings 5 that are more than two to move. At this time, according to the number of measuring rings 5 that generate the movement amount, the situation and degree of the warped corner of the solar wafer are judged.

[0040] As Figure 1 , Figure 2 , Figure 3 , Figure 4 , Figure 5 , Figure 6 and Figure 7 As shown, an anti-jamming ring 12 is rotatably sleeved on the outer periphery of the measuring ring 5, and the thickness of the anti-jamming ring 12 is the same as that of the measuring ring 5. The rotational replacement between the anti-jamming ring 12 and the measuring ring 5 reduces the sliding friction between the measuring ring 5 and the solar wafer, and reduces damage to the edge of the solar wafer.

[0041] As Figure 4 and Figure 9 As shown, the first movement amount measuring device includes a resistance cylinder 13, a conductive rod 14 and a second return spring 15. The conductive rod 14 includes a thin rod and a large head end. An installation hole is provided on the outer periphery of the lifting block 7. The resistance cylinder 13 is fixedly installed in the installation hole. A movement hole that slidably cooperates with the large head end of the resistance cylinder 13 is provided at the end of the conductive rod 14. The large head end of the conductive rod 14 is slidably installed in the movement hole of the resistance cylinder 13. The second return spring 15 is sleeved on the resistance cylinder 13, and both ends of the second return spring 15 respectively abut against the outer periphery of the lifting block 7 and the inner wall of the inner ring of the measuring ring 5. As Figure 4 As shown, when the solar wafer abuts against the outer periphery of the anti-jamming ring 12, since the lifting block 7 cannot rotate on the vertical rod 4, the edge of the solar wafer pushes the anti-jamming ring 12 and the measuring ring 5 to move downward synchronously in Figure 4 As shown, when pushing the anti-jamming ring 12 and the measuring ring 5 to move, the large head end of the conductive rod 14 will be synchronously pushed to slide in the resistance cylinder 13, so that the energized length in the resistance cylinder 13 becomes shorter, and thus the resistance changes. According to the change situation of the resistance, the displacement amount of the movement of the anti-jamming ring 12 and the measuring ring 5 is calculated. As Figure 7 As shown, two vertical conductive rails are connected to the side of the vertical rod 4, and the circuit of the conductive rails, the resistance cylinder 13 and the conductive rod 14 is powered, and at the same time, it is ensured that there will be no power-off situation between the resistance cylinder 13 and the conductive rod 14 when the lifting block 7 moves up and down; the sliding direction of the conductive rod 14 in the movement hole on the resistance cylinder 13 is the horizontal direction, which is convenient for the sliding movement of the conductive rod 14.

[0042] In actual situations, as Figure 10 As shown, the conductive rod 14 is not arranged perpendicular to the inner wall of the side of the conveying channel, and the conductive rod 14 and the side of the solar wafer are arranged obliquely. When the solar wafer abuts against the outer periphery of the anti-jamming ring 12, it is convenient for the conductive rod 14 to telescopically slide in the resistance cylinder 13.

[0043] As shown Figure 8 in, the cyclic pushing structure includes a linear slide rail 16, a vertical push plate rod 17 and a lifting assembly. The lifting assembly includes an annular slide rail 18. A conveying movement groove is formed in the bottom inner wall of the conveying channel. The linear slide rail 16 is fixedly installed in the conveying movement groove. The vertical push plate rod 17 slidably penetrates through the slider on the linear slide rail 16, and the vertical push plate rod 17 is vertically arranged. The lifting assembly is used to drive the vertical push plate rod 17 to move up and down on the slider of the linear slide rail 16. The bottom end of the vertical push plate rod 17 is rotatably installed on the slider of the annular slide rail 18. When the solar silicon wafer is pushed, the slider on the annular slide rail 18 is located in the upper section of the annular slide rail 18. When driving the vertical push plate rod 17 to reset, the slider on the annular slide rail 18 is located in the lower section of the annular slide rail 18, so as to ensure that when the vertical push plate rod 17 pushes the solar silicon wafer, the top end of the vertical push plate rod 17 exceeds the top surface of the test plate 2. When driving the vertical push plate rod 17 to reset, it is necessary to ensure that the top end of the vertical push plate rod 17 is lower than the top surface of the test plate 2 and does not contact the solar silicon wafer during the reset process.

[0044] As shown Figure 1 in, the sorting structure includes a moving frame 21, an electric push rod 22 and a U-shaped frame 23. The moving frame 21 is located below the downstream of the second conveyor belt 20. The electric push rod 22 is slidably installed on the moving frame 21. The U-shaped frame 23 is fixedly installed on the output shaft of the electric push rod 22. The two bent sections on both sides of the U-shaped frame 23 are respectively located on both sides of the second conveyor belt 20. When the solar silicon wafer is tested as unqualified, the solar silicon wafer is conveyed to the end on the second conveyor belt 20. The electric push rod 22 works to drive the U-shaped frame 23 to rise. The U-shaped frame 23 lifts the unqualified solar silicon wafer on the second conveyor belt 20, and then the moving frame 21 drives the electric push rod 22, the U-shaped frame 23 and the unqualified solar silicon wafer to move in the side direction, and sorts out the unqualified solar silicon wafer for subsequent work.

[0045] As shown Figure 1 , Figure 2 and Figure 3 in, a bellows 10 is connected to the top plate block 11. The top end of the bellows 10 is fixedly connected to the top inner wall of the installation notch. The bellows 10 can expand and contract, playing a role in protecting the internal distance measuring sensor 8, the first reset spring 9 and the conveying conductive rail. Embodiment

[0046] As shown Figure 11 and Figure 12As shown in the figure, the difference between this embodiment and Embodiment 1 lies in the different structure of the first amount-of-exercise measuring device. The first amount-of-exercise measuring device includes a rotating rod 24 and a third return spring 25. A rotating telescopic hole for slidingly mating with the end of the rotating rod 24 is provided on the inner peripheral wall of the measuring ring 5. The third return spring 25 is located in the rotating telescopic hole, and the third return spring 25 can drive the rotating rod 24 to retract into the rotating telescopic hole. It should be noted that in this embodiment, the measuring ring 5 is rotatably mounted on the outer periphery of the lifting block 7, and the axes of the measuring ring 5 and the lifting block 7 do not coincide. The rotating rod 24 is a rigid rod. When the solar wafer abuts against the outer periphery of the anti-jamming ring 12, it will push the anti-jamming ring 12 and the measuring ring 5 to rotate around the lifting block 7. When the anti-jamming ring 12 and the measuring ring 5 rotate, they will drive the rotating rod 24 to rotate together. By detecting the change in the rotation angle of the rotating rod 24, the distance between the contact position between the outer periphery of the anti-jamming ring 12 and the side of the solar wafer and the vertical rod 4 changes, so as to calculate the change in the width of the solar wafer. The rotation angle of the rotating rod 24 is measured by a laser angle measuring instrument or an electronic angle sensor. When the solar wafer passes over the anti-jamming ring 12, under the rebound action of the third return spring 25, the rotating rod 24 retracts into the rotating telescopic hole under the rebound action of the third return spring 25 until the rotating rod 24 can no longer retract into the rotating telescopic hole, that is, the distance between the opening position of the rotating telescopic hole on the inner peripheral wall of the measuring ring 5 and the rotation connection of the rotating rod 24 and the lifting block 7 is the smallest, that is Figure 12 in the position state shown in the figure, the reset of the rotating rod 24 is completed; the rotation of the rotating rod 24 is smoother than the telescopic movement of the conductive rod 14 in the resistance cylinder 13, reducing the occurrence of jamming

[0047] The above is only a preferred specific embodiment of the present invention, but the protection scope of the present invention is not limited thereto. Any person skilled in the art within the technical scope disclosed by the present invention, according to the technical solution and inventive concept of the present invention, makes equivalent substitutions or changes, and should be covered by the protection scope of the present invention

Claims

1. A photovoltaic module testing and sorting mechanism, characterized in that: It comprises a mounting frame (1), the top surface of the mounting frame (1) is provided with a conveying channel, a test board (2) is installed in the conveying channel, and two dimension measuring structures arranged symmetrically with respect to the test board (2) are installed in the conveying channel; The dimension measurement structure comprises a vertical rod (4) arranged vertically, two of the vertical rods (4) being respectively located on both sides of the test plate (2), a plurality of measuring rings (5) being sleeved on the vertical rod (4), the plurality of measuring rings (5) being arranged in sequence from top to bottom and stacked one on the other, the measuring rings (5) being capable of moving laterally on the vertical rod (4), when the solar silicon wafer slides on the test plate (2), both sides of the solar silicon wafer can push the measuring rings (5) to move laterally on the vertical rod (4), and a No. 1 motion quantity measuring device capable of measuring the amount of lateral motion of the measuring rings (5) on the vertical rod (4) is installed on the vertical rod (4); A circulating pushing structure is installed on the mounting frame (1), and the circulating pushing structure is used to push the solar silicon wafer on the test plate (2) to pass through the gap between the two size measurement structures; The dimension measurement structure further comprises a side frame (6), a lifting block (7), a distance sensor (8) and a No. 1 return spring (9); the side frame (6) is fixedly mounted on the side of the conveying channel, a mounting notch is provided on a side of the side frame (6) close to the test plate (2), the vertical rod (4) is vertically mounted in the mounting notch, and the lowest measuring ring (5) of the vertical rod (4) abuts against the bottom inner wall of the mounting notch; The lifting block (7) is slidably mounted on the vertical rod (4), and the first motion quantity measuring device is mounted on the lifting block (7); The measuring ring (5) is mounted on a No. 1 motion quantity measuring device, the distance sensor (8) is mounted on the top inner wall of the mounting notch, a top plate (11) is fixedly mounted on the top surface of the measuring ring (5) at the top of the same vertical rod (4), the output shaft end of the distance sensor (8) is fixedly connected to a top plate (11) slidably mounted on the vertical rod (4), the top plate (11) abuts against the top surface of the measuring ring (5) at the top of the vertical rod (4), the No. 1 return spring (9) is sleeved on the output shaft of the distance sensor (8), and the two ends of the No. 1 return spring (9) abut against the top plate (11) and the top inner wall of the mounting notch respectively; The first movement quantity measuring device comprises a resistor tube (13), a conductive rod (14) and a second reset spring (15); a mounting hole is provided on the outer periphery of the lifting block (7); the resistor tube (13) is fixedly installed in the mounting hole; a movement hole is provided at the end of the conductive rod (14) for slidingly cooperating with the large end of the resistor tube (13); the large end of the conductive rod (14) is slidably installed in the movement hole of the resistor tube (13); the second reset spring (15) is sleeved on the resistor tube (13), and the two ends of the second reset spring (15) respectively abut against the outer periphery of the lifting block (7) and the inner wall of the measuring ring (5).

2. A photovoltaic module testing and sorting mechanism according to claim 1, characterized in that: An anti-snapping ring (12) is rotatably sleeved on the outer circumference of the measuring ring (5), and the thickness of the anti-snapping ring (12) is the same as that of the measuring ring (5).

3. A photovoltaic module testing and sorting mechanism according to claim 1, characterized in that: The sliding direction of the conductive rod (14) in the movement hole on the resistor cylinder (13) is a horizontal direction.

4. A photovoltaic module testing and sorting mechanism according to claim 3, characterized in that: The circulating pushing structure comprises a linear slide rail (16), a vertical push plate rod (17) and a lifting assembly; a conveying motion groove is opened on the bottom inner wall of the conveying channel, the linear slide rail (16) is fixedly installed in the conveying motion groove, the vertical push plate rod (17) slides through the slider on the linear slide rail (16), and the vertical push plate rod (17) is arranged vertically, and the lifting assembly is used to drive the vertical push plate rod (17) to rise and fall on the slider of the linear slide rail (16).

5. A photovoltaic module testing and sorting mechanism according to claim 4, characterized in that: The lifting assembly comprises an annular slide rail (18); the bottom end of the vertical push plate rod (17) is rotatably mounted on a slider of the annular slide rail (18).

6. A photovoltaic module testing and sorting mechanism according to claim 1, characterized in that: It also includes a No. 1 conveyor belt (19), a No. 2 conveyor belt (20) and a sorting structure; the No. 1 conveyor belt (19) and the No. 2 conveyor belt (20) are respectively located at two ends of the test board (2), the No. 1 conveyor belt (19) is located at an upstream position of the test board (2), and the No. 2 conveyor belt (20) is located at a downstream position of the test board (2), and the sorting structure can transport the solar silicon wafers on the No. 2 conveyor belt (20).

7. A photovoltaic module testing and sorting mechanism according to claim 6, characterized in that: The sorting structure comprises a moving frame (21), an electric push rod (22) and a U-shaped frame (23); the moving frame (21) is located below the downstream of the No. 2 conveyor belt (20), the electric push rod (22) is slidably mounted on the moving frame (21), the U-shaped frame (23) is fixedly mounted on the output shaft of the electric push rod (22), and the bending sections on both sides of the U-shaped frame (23) are respectively located on both sides of the No. 2 conveyor belt (20).

8. A photovoltaic module testing and sorting mechanism according to claim 2, characterized in that: The top plate (11) is connected to a bellows (10), and the top end of the bellows (10) is fixedly connected to the top inner wall of the installation notch.

Images