Method and device for testing dynamic extinction ratio of electro-optical Q switch in wide temperature range

Abstract

The invention discloses a wide temperature range electro-optical Q switch dynamic extinction ratio test method and device, and relates to the optical measurement and detection technology, and the device comprises a test box which provides a temperature environment; the electro-optical crystal to be tested is arranged between the polarizer and the polarization analyzer, and the coupling mirror is output to a power meter outside the test box; the electro-optical crystal to be tested is connected to a power supply module outside the test box through a wire; the collimating mirror and the coupling mirror are respectively arranged based on corresponding optical fiber flanges; the laser device is arranged outside the test box, and laser emitted by the laser device is input to the collimating mirror through a transmission optical fiber; and the power meter is used for detecting the power of the output laser after focusing of the coupling mirror. The embodiment of the invention provides a device and a method for testing the dynamic extinction ratio of an electro-optical Q switch in a wide temperature range, and solves the problems that a measurement result cannot be quantified and the dynamic extinction ratio can only be measured at normal temperature in the conventional conoscopic interference technology.

Description

Technical Field

[0001] The present application relates to the field of optical measurement and detection technology, and in particular to a method and device for testing the dynamic extinction ratio of an electro-optical Q switch over a wide temperature range. Background Art

[0002] Electro-optical Q-switching technology is a key technology for achieving narrow pulse width and high peak power pulse laser. Electro-optical Q-switches are widely used in Q-switched lasers. Electro-optical crystals are key components that determine the performance of electro-optical Q-switches, and their extinction ratio has a great influence on the Q-switching performance of lasers. In practical applications, the residual stress inside the electro-optical crystal and the stress caused by thermal inhomogeneity will cause the electro-optical crystal to have a certain degree of depolarization, thereby reducing the extinction ratio of the electro-optical Q-switch. Therefore, testing the extinction ratio of the electro-optical Q-switch can intuitively judge the quality of its performance. In addition, many crystal optical devices often experience a wide temperature range in practical applications, especially in the military field, where the operating temperature range is generally -50℃~70℃. Due to the existence of multiple effects such as electro-optical effect and piezoelectric effect in crystals, temperature changes may cause changes in crystal performance, which in turn leads to temperature instability of device performance. For example, based on the electro-optical Q-switched military pulse solid-state laser of rubidium titanyl phosphate (RTP) crystal, it was found in its actual application that the laser had problems such as poor closing ability and reduced dynamic output energy in high and low temperature environments. Therefore, analyzing the changes in electro-optical switch performance under high and low temperature environments is an effective means to detect the degradation of laser performance.

[0003] As a biaxial crystal, RTP needs to be paired with two crystals to compensate for natural birefringence. Currently, the conoscopic interference technique is widely used to detect the optical quality of the crystal and the matching degree of the two crystals. The conoscopic interference patterns of different areas in the light-passing surface are observed to judge the optical uniformity of a single crystal and the matching quality of the two crystals. However, the use of conoscopic interference technology to characterize the performance of electro-optical Q switches can only be qualitatively analyzed, with many influencing factors, and the test results cannot be quantified, making it difficult to correspond one-to-one with the effects of the closing conditions in laser experiments. Summary of the invention

[0004] The embodiments of the present application provide a method and device for testing the dynamic extinction ratio of an electro-optical Q switch in a wide temperature range, which are used to provide a reliable method for testing the dynamic extinction ratio of an electro-optical Q switch in high and low temperature environments.

[0005] The present application provides a device for testing the dynamic extinction ratio of an electro-optical Q switch in a wide temperature range, comprising:

[0006] The test box provides a temperature environment and can be placed in an optical flat plate, the optical flat plate serves as a mounting plane for optical devices, wherein a collimator, an aperture, a polarizer, an analyzer and a coupling mirror are arranged on the optical flat plate along the optical path direction;

[0007] The electro-optical crystal to be tested is arranged between the polarizer and the analyzer, and the coupling mirror outputs to a power meter outside the test box;

[0008] The electro-optical crystal to be tested is connected to a power supply module outside the test box through a wire;

[0009] The collimating mirror and the coupling mirror are respectively arranged based on corresponding optical fiber flanges;

[0010] A laser is placed outside the test box, and the emitted laser is input into the collimating mirror;

[0011] The power meter is used to detect the power of the laser output after focusing by the coupling mirror.

[0012] Optionally, including: the laser is a laser with a set wavelength;

[0013] The electro-optical crystal to be tested is a rubidium titanyl phosphate (RTP) crystal and has set specifications.

[0014] The embodiment of the present application further provides a method for testing the dynamic extinction ratio of an electro-optical Q switch in a wide temperature range, which is implemented based on the aforementioned electro-optical Q switch dynamic extinction ratio testing device in a wide temperature range, and includes:

[0015] Perform optical path alignment to determine the reference optical path;

[0016] Under normal temperature environment, connect the optical path and adjust the optical devices on the optical path;

[0017] Without inserting the electro-optical crystal to be tested into the optical path, the vibration transmission direction of the analyzer is adjusted to be parallel or perpendicular to the vibration transmission direction of the polarizer, and the extinction ratio of the system is determined;

[0018] Adjust the transmission directions of the analyzer and the polarizer to be perpendicular to each other, install the electro-optical crystal to be tested on the optical plate of the test box, and adjust the pitch, yaw and position so that the laser light path passes through the center of the electro-optical crystal to be tested and the red light reflected by the electro-optical crystal to be tested coincides with the red light emission end;

[0019] The optical plate is placed in a test box, and the test box is turned on to measure the dynamic extinction ratio of the electro-optical crystal to be tested at different temperatures.

[0020] Optionally, performing optical path alignment to determine a reference optical path includes:

[0021] A He-Ne red laser is used for optical path alignment, and the He-Ne red laser is adjusted so that its output light is parallel to the optical platform to serve as a reference optical path.

[0022] Optionally, the electro-optical crystal to be tested is not inserted into the optical path first, so as to adjust the transmission direction of the analyzer to be parallel or perpendicular to the transmission direction of the polarizer, and determine the system extinction ratio including:

[0023] Record the power P transmitted when parallel max The power P transmitted when perpendicular to min , power P max With power P min The ratio is the extinction ratio.

[0024] Optionally, measuring the dynamic extinction ratio of the electro-optical crystal to be tested at different temperatures includes:

[0025] Based on the test chamber, setting a temperature control program;

[0026] The dynamic extinction ratio of the electro-optical crystal to be tested is measured at different temperatures, and the transmitted laser power P is measured respectively when a continuous half-wave voltage is applied to the electro-optical crystal to be tested and when a continuous half-wave voltage is not applied to the electro-optical crystal to be tested. 1 , P 2 , laser power P 1 , P 2 The ratio is the dynamic extinction ratio E of the electro-optic Q switch. xt .

[0027] Optionally, the electro-optical crystal to be tested is not inserted into the optical path first, so as to adjust the transmission direction of the analyzer to be parallel or perpendicular to the transmission direction of the polarizer, and determine the system extinction ratio including:

[0028] Record the energy E transmitted when parallel max The energy transmitted perpendicular to the min , energy E max With energy E min The ratio is the system extinction ratio.

[0029] Optionally, measuring the dynamic extinction ratio of the electro-optical crystal to be tested at different temperatures includes:

[0030] Based on the test chamber, setting a temperature control program;

[0031] The dynamic extinction ratio of the electro-optical crystal to be tested is measured at different temperatures, and the transmitted laser energy E is measured respectively when a pulse half-wave voltage is applied to the electro-optical crystal to be tested and when no pulse half-wave voltage is applied to the electro-optical crystal to be tested. 1 、E 2 , laser energy E 1 、E 2 The ratio is the dynamic extinction ratio E of the electro-optic Q switch. xt .

[0032] The embodiments of the present application propose a device and method for testing the dynamic extinction ratio of an electro-optical Q switch in a wide temperature range, which solves the problem that the current conoscopic interferometry technology cannot quantify the measurement results and the dynamic extinction ratio can only be measured at room temperature.

[0033] The above description is only an overview of the technical solution of the present application. In order to more clearly understand the technical means of the present application, it can be implemented in accordance with the contents of the specification. In order to make the above and other purposes, features and advantages of the present application more obvious and easy to understand, the specific implementation methods of the present application are listed below. BRIEF DESCRIPTION OF THE DRAWINGS

[0034] Various other advantages and benefits will become apparent to those of ordinary skill in the art by reading the detailed description of the preferred embodiments below. The accompanying drawings are only for the purpose of illustrating the preferred embodiments and are not to be considered as limiting the present application. Also, the same reference symbols are used throughout the accompanying drawings to represent the same components. In the accompanying drawings:

[0035] Figure 1 This is a schematic diagram of the structure of the electro-optical Q switch dynamic extinction ratio test device according to an embodiment of the present application;

[0036] Figure 2 A schematic diagram of the connection relationship of the electro-optical Q-switch dynamic extinction ratio test device according to an embodiment of the present application;

[0037] Figure 3 A schematic diagram of the structure of another electro-optical Q-switch dynamic extinction ratio test device according to an embodiment of the present application;

[0038] Figure 4 A schematic diagram of the connection relationship of another electro-optical Q-switch dynamic extinction ratio test device according to an embodiment of the present application. DETAILED DESCRIPTION

[0039] The exemplary embodiments of the present disclosure will be described in more detail below with reference to the accompanying drawings. Although the exemplary embodiments of the present disclosure are shown in the accompanying drawings, it should be understood that the present disclosure can be implemented in various forms and should not be limited by the embodiments set forth herein. On the contrary, these embodiments are provided to enable a more thorough understanding of the present disclosure and to fully convey the scope of the present disclosure to those skilled in the art.

[0040] The present application embodiment provides a wide temperature range electro-optical Q switch dynamic extinction ratio test device, such as Figure 1 As shown, including:

[0041] The test chamber provides a temperature environment and can be placed in an optical flat plate, which serves as a mounting surface for optical devices. Figure 1 As shown, in a specific example, the test chamber can be a high and low temperature test chamber with a temperature control program, and the optical flat plate can be used to install optical components. Figure 1 As shown, a collimator, an aperture, a polarizer, an analyzer and a coupling mirror are arranged on the optical flat plate along the light path direction;

[0042] The electro-optical crystal to be tested is arranged between the polarizer and the analyzer, and the coupling mirror outputs to a power meter outside the test box.

[0043] The electro-optical crystal to be tested is connected to a power supply module outside the test box through a wire;

[0044] The collimating mirror and the coupling mirror are respectively arranged based on corresponding optical fiber flanges;

[0045] The laser is placed outside the test box, and the emitted laser is input into the collimating mirror.

[0046] The power meter is used to detect the power of the laser output after focusing by the coupling mirror.

[0047] In some embodiments, the laser is a laser with a set wavelength, and the laser may be a 1064 nm laser.

[0048] The electro-optical crystal to be tested is a rubidium titanyl phosphate (RTP) crystal with set specifications. For example, in the application example of the present application, the size of the RTP crystal is 8 mm*8 mm*15 mm.

[0049] The embodiment of the present application further provides a method for testing the dynamic extinction ratio of an electro-optical Q switch in a wide temperature range, which is implemented based on the aforementioned electro-optical Q switch dynamic extinction ratio testing device in a wide temperature range, and includes:

[0050] Perform optical path alignment to determine the reference optical path.

[0051] Under normal temperature environment, connect the optical path and adjust the optical devices on the optical path;

[0052] Without inserting the electro-optical crystal to be tested into the optical path, the vibration transmission direction of the analyzer is adjusted to be parallel or perpendicular to the vibration transmission direction of the polarizer, and the extinction ratio of the system is determined;

[0053] Adjust the transmission directions of the analyzer and the polarizer to be perpendicular to each other, install the electro-optical crystal to be tested on the optical plate of the test box, and adjust the pitch, yaw and position so that the laser light path passes through the center of the electro-optical crystal to be tested and the red light reflected by the electro-optical crystal to be tested coincides with the red light emission end;

[0054] The optical plate is placed in a test box, and the test box is turned on to measure the dynamic extinction ratio of the electro-optical crystal to be tested at different temperatures.

[0055] In some embodiments, performing optical path alignment to determine the reference optical path includes: using a He-Ne red light laser to perform optical path alignment, and adjusting the He-Ne red light laser so that its output light is parallel to the optical platform to serve as the reference optical path.

[0056] In some application examples of the present application, the laser of the present application example adopts a fiber laser. The laser emitted by the fiber laser is transmitted through the optical fiber and incident on the collimator. After the laser is intercepted by the aperture, the transmitted light beam passes through the polarizer, the crystal to be tested, and the analyzer in sequence. Then the output laser is focused into the output optical fiber through the coupling mirror and transmitted to the outside of the high and low temperature test chamber, and the power is detected by a high-precision power meter.

[0057] like Figure 1 As shown, under normal temperature environment, the optical devices connected and adjusted on the optical path include:

[0058] First, the optical fiber jumper 1 is connected to the optical fiber flange 1, and the optical fiber flange 1 is adjusted so that the laser propagates in the horizontal direction and coincides with the center of the reference optical path.

[0059] The collimator is mounted on the optical plate along the laser light path, and the pitch, yaw and position are adjusted so that the laser light path passes through the center of the collimator, and the distance between the collimator and the optical fiber flange 1 is the focal length of the collimator, and the reflected light of the red light through the collimator forms a Newton ring centered on the red light at the red light emission point.

[0060] The aperture is mounted on the optical plate, and the position is adjusted so that the light path passes through the center of the aperture; the polarizer is mounted on the optical plate, and the pitch, yaw and position are adjusted so that the laser light path passes through the center of the polarizer, and the reflected light of the red light through the polarizer coincides with the red light emission end.

[0061] The analyzer is mounted on the optical plate, and the pitch, yaw and position are adjusted so that the laser light path passes through the center of the analyzer and the reflected light of the red light passing through the analyzer coincides with the red light emission end.

[0062] The coupling mirror is mounted on the optical plate, and the pitch, yaw and position are adjusted so that the laser light path passes through the center of the coupling mirror, and the reflected light of the red light through the coupling mirror forms a Newton ring centered on the red light at the red light emission point.

[0063] The optical fiber flange 2 is fixed on the optical plate, and the distance between the optical fiber flange 2 and the coupling mirror is the focal length of the coupling mirror, and the optical fiber jumper 2 is connected to the optical fiber flange 2 .

[0064] In some embodiments, the electro-optical crystal to be tested is not inserted into the optical path first, so as to adjust the transmission direction of the analyzer to be parallel or perpendicular to the transmission direction of the polarizer, and determine the system extinction ratio, including:

[0065] Record the power P transmitted when parallel max The power P transmitted when perpendicular to min , power P max With power P min The ratio is the system extinction ratio.

[0066] Then adjust the transmission directions of the analyzer and the polarizer to be perpendicular to each other, install the electro-optical crystal to be tested on the optical plate, and adjust the pitch, yaw and position so that the laser light path passes through the center of the electro-optical crystal to be tested, and the red light reflected by the electro-optical crystal to be tested coincides with the red light emission end. Further, put the optical plate together with various components into a high and low temperature test box, with the input and output ends of the optical path close to the line transmission windows at both ends of the high and low temperature test box respectively, and transmit the optical fiber jumper and the high-voltage line of the crystal to be tested to the outside of the high and low temperature test box through the line transmission windows, such as Figure 2 shown.

[0067] In some embodiments, measuring the dynamic extinction ratio of the electro-optical crystal to be tested at different temperatures includes:

[0068] Based on the test chamber, setting a temperature control program;

[0069] The dynamic extinction ratio of the electro-optical crystal to be tested is measured at different temperatures, and the transmitted laser power P is measured respectively when a continuous half-wave voltage is applied to the electro-optical crystal to be tested and when a continuous half-wave voltage is not applied to the electro-optical crystal to be tested. 1 , P 2 , laser power P 1 , P 2 The ratio is the dynamic extinction ratio E of the electro-optic Q switch. xt , that is, E xt =P 1 / P 2 .

[0070] In some other application examples of the present application, such as Figure 3 As shown in Figure 2, this application example is for electro-optically Q-switched solid-state lasers, such as Figure 3 As shown, an optical plate is provided in the test chamber, on which an electro-optical Q-switched solid laser, an aperture, a polarizer, an electro-optical crystal to be tested, and an analyzer are provided, and a high-precision energy meter is provided outside the high and low temperature test chamber. The laser light emitted by the laser passes through the aperture, the polarizer, the crystal to be tested, and the analyzer in sequence, and then the outgoing light beam is directly received by the energy meter after passing through the observation window of the high and low temperature test chamber. Under normal temperature environment, connect the optical path and adjust the optical devices on the optical path.

[0071] In this example, a 1064nm electro-optical Q-switched solid-state laser is used. The optical path is debugged at room temperature, and the laser pitch is adjusted to make the laser propagate in the horizontal direction and be concentric and coaxial with the reference optical path. The aperture, polarizer, and analyzer are installed on the optical plate in sequence along the laser optical path, and the pitch, yaw, and position of each component are adjusted respectively to make each component concentric and coaxial with the laser optical path, and the light-transmitting surface is perpendicular to the laser optical path. After the adjustment is completed, the components on the optical plate are fixed.

[0072] In some embodiments, the electro-optical crystal to be tested is not inserted into the optical path first, so as to adjust the transmission direction of the analyzer to be parallel or perpendicular to the transmission direction of the polarizer, and determine the system extinction ratio, including:

[0073] Record the energy E transmitted when parallel max The energy transmitted perpendicular to the min , energy E max With energy E min The ratio is the system extinction ratio.

[0074] Then, the transmission directions of the analyzer and the polarizer are adjusted to be perpendicular to each other, the electro-optical crystal to be tested is mounted on the optical plate, and the pitch, yaw and position are adjusted so that the laser light path passes through the center of the electro-optical crystal to be tested, and the red light reflected by the electro-optical crystal to be tested coincides with the red light emission end.

[0075] Then, if Figure 4 As shown, the optical plate together with various components are placed in a high and low temperature test chamber, the optical path output end is close to the observation window of the high and low temperature test chamber, the high voltage line of the crystal to be tested is output to the outside of the high and low temperature chamber through the line transmission window, and the light source pulse output signal is connected to obtain a signal synchronized with the pulse laser.

[0076] In some embodiments, measuring the dynamic extinction ratio of the electro-optical crystal to be tested at different temperatures includes:

[0077] Based on the test chamber, setting a temperature control program;

[0078] The dynamic extinction ratio of the electro-optical crystal to be tested is measured at different temperatures, and the transmitted laser energy E is measured respectively when a pulse half-wave voltage is applied to the electro-optical crystal to be tested and when no pulse half-wave voltage is applied to the electro-optical crystal to be tested. 1 、E 2 , laser energy E 1 、E 2 The ratio is the dynamic extinction ratio E of the electro-optic Q switch. xt , that is, E xt =E 1 / E 2 .

[0079] The method and device of this application fill the gap in the measurement of dynamic extinction ratio of electro-optical Q-switched switches under high and low temperature environments, expand the research method of high and low temperature performance of birefringent crystals, and the measurement results can quantify the changes of electro-optical crystal birefringence characteristics, double crystal matching performance, etc. with temperature, which is helpful to analyze the reasons for the performance changes of electro-optical Q-switched lasers under high and low temperature environments. This application solves the problem that the current conoscopic interferometry technology cannot quantify the measurement results and the dynamic extinction ratio can only be measured at room temperature.

[0080] It should be noted that in the various embodiments of the present application, the terms "include", "comprise" or any other variants thereof are intended to cover non-exclusive inclusion, so that a process, method, article or device including a series of elements includes not only those elements, but also includes other elements not explicitly listed, or also includes elements inherent to such process, method, article or device. In the absence of further restrictions, an element defined by the sentence "includes a ..." does not exclude the presence of other identical elements in the process, method, article or device including the element.

[0081] The serial numbers of the above-mentioned embodiments of the present application are for description only and do not represent the advantages or disadvantages of the embodiments.

[0082] Through the description of the above implementation methods, those skilled in the art can clearly understand that the above-mentioned embodiment methods can be implemented by means of software plus a necessary general hardware platform, and of course by hardware, but in many cases the former is a better implementation method. Based on such an understanding, the technical solution of the present application, or the part that contributes to the prior art, can be embodied in the form of a software product, which is stored in a storage medium (such as ROM / RAM, a magnetic disk, or an optical disk), and includes a number of instructions for a terminal (which can be a mobile phone, a computer, a server, an air conditioner, or a network device, etc.) to execute the methods described in each embodiment of the present application.

[0083] The embodiments of the present application are described above in conjunction with the accompanying drawings, but the present application is not limited to the above-mentioned specific implementation methods. The above-mentioned specific implementation methods are merely illustrative and not restrictive. Under the guidance of the present application, ordinary technicians in this field can also make many forms without departing from the purpose of the present application and the scope of protection of the claims, all of which are within the protection of the present application.

Claims

1. A wide temperature range electro-optical Q switch dynamic extinction ratio test device, characterized in that: include: The test box provides a temperature environment and can be placed in an optical flat plate, the optical flat plate serves as a mounting plane for optical devices, wherein a collimator, an aperture, a polarizer, an analyzer and a coupling mirror are arranged on the optical flat plate along the optical path direction; The electro-optical crystal to be tested is arranged between the polarizer and the analyzer, and the coupling mirror outputs to a power meter outside the test box; The electro-optical crystal to be tested is connected to a power supply module outside the test box through a wire; The collimating mirror and the coupling mirror are respectively arranged based on corresponding optical fiber flanges; A laser is placed outside the test box, and the emitted laser is input to the collimator through a transmission optical fiber; The power meter is used to detect the power of the laser output after focusing by the coupling mirror.

2. The wide temperature range electro-optical Q switch dynamic extinction ratio test device according to claim 1, characterized in that: include: The laser is a laser with a set wavelength; The electro-optical crystal to be tested is a rubidium titanyl phosphate (RTP) crystal and has set specifications.

3. A method for testing the dynamic extinction ratio of an electro-optical Q switch in a wide temperature range, based on the device for testing the dynamic extinction ratio of an electro-optical Q switch in a wide temperature range as claimed in claim 1 or 2, characterized in that: include: Perform optical path alignment to determine the reference optical path; Under normal temperature environment, connect the optical path and adjust the optical devices on the optical path; Without inserting the electro-optical crystal to be tested into the optical path, the vibration transmission direction of the analyzer is adjusted to be parallel or perpendicular to the vibration transmission direction of the polarizer, and the extinction ratio of the system is determined; Adjust the transmission directions of the analyzer and the polarizer to be perpendicular to each other, install the electro-optical crystal to be tested on the optical plate of the test box, and adjust the pitch, yaw and position so that the laser light path passes through the center of the electro-optical crystal to be tested and the red light reflected by the electro-optical crystal to be tested coincides with the red light emission end; The optical plate is placed in a test box, and the test box is turned on to measure the dynamic extinction ratio of the electro-optical crystal to be tested at different temperatures.

4. The method for testing the dynamic extinction ratio of an electro-optical Q switch over a wide temperature range as claimed in claim 3, characterized in that: The optical path alignment to determine the reference optical path includes: A He-Ne red laser is used for optical path alignment, and the He-Ne red laser is adjusted so that its output light is parallel to the optical platform to serve as a reference optical path.

5. The method for testing the dynamic extinction ratio of an electro-optical Q switch over a wide temperature range as claimed in claim 3, characterized in that: Without inserting the electro-optical crystal to be tested into the optical path, adjust the transmission direction of the analyzer to be parallel or perpendicular to the transmission direction of the polarizer, and determine the system extinction ratio including: Record the power P transmitted when parallel max The power P transmitted when perpendicular to min , power P max With power P min The ratio is the system extinction ratio.

6. The method for testing the dynamic extinction ratio of an electro-optical Q switch over a wide temperature range as claimed in claim 5, characterized in that: Measuring the dynamic extinction ratio of the electro-optical crystal to be tested at different temperatures includes: Based on the test chamber, setting a temperature control program; The dynamic extinction ratio of the electro-optical crystal to be tested is measured at different temperatures. When a continuous half-wave voltage is applied to the electro-optical crystal to be tested and when no continuous half-wave voltage is applied to the electro-optical crystal to be tested, the transmitted laser powers P1 and P2 are measured respectively. The ratio of the laser powers P1 and P2 is the dynamic extinction ratio E of the electro-optical Q switch. xt .

7. The method for testing the dynamic extinction ratio of an electro-optical Q switch over a wide temperature range as claimed in claim 3, characterized in that: Without inserting the electro-optical crystal to be tested into the optical path, adjust the transmission direction of the analyzer to be parallel or perpendicular to the transmission direction of the polarizer, and determine the system extinction ratio including: Record the energy E transmitted when parallel max The energy transmitted perpendicular to the min , energy E max With energy E min The ratio is the system extinction ratio.

8. The method for testing the dynamic extinction ratio of an electro-optical Q switch over a wide temperature range as claimed in claim 7, characterized in that: Measuring the dynamic extinction ratio of the electro-optical crystal to be tested at different temperatures includes: Based on the test chamber, setting a temperature control program; The dynamic extinction ratio of the electro-optical crystal to be tested is measured at different temperatures. When a pulse half-wave voltage is applied to the electro-optical crystal to be tested and when no pulse half-wave voltage is applied, the transmitted laser energies E1 and E2 are measured respectively. The ratio of the laser energies E1 and E2 is the dynamic extinction ratio E of the electro-optical Q switch. xt .

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