A testing method, system, equipment and medium for a protection device in a power supply system

Abstract

The present application relates to a testing method, system, equipment and medium for protection devices in a power supply system, and the method includes: step a, obtaining a current test sequence; step b, constructing a current test scenario based on the current test sequence; step c, calculating the current simulated fault data in the current test scenario based on a trained fault simulation model; step d, sending the current simulated fault data to multiple test devices so that each test device tests its corresponding protection device under test; step e, obtaining the current action behavior generated by the test of each protection device under test, and comparing each current action behavior with its corresponding target action behavior to obtain the test result corresponding to the current test sequence. The fault data in the present application is more in line with the real data when a fault actually occurs, and can automatically complete the fault simulation of the fault point corresponding to the current test sequence, thereby improving the safe and stable operation level of power supply systems such as traction substations.

Description

Technical Field

[0001] The present application relates to the technical field of power supply systems, and in particular to a testing method, system, equipment, and medium for a protection device in a power supply system. Background Art

[0002] The AT (Auto-Transformer) power supply method has been widely used in traction power supply systems due to its advantages, such as effectively increasing the supply voltage level, reducing power loss, and enhancing power supply capacity. However, the traction power supply system under the AT method is complex in structure, involving a variety of stations, including traction substations, AT stations (auto-transformer stations), and substations. The transmission and distribution of power between these stations is achieved through complex electrical connections. This complexity not only increases the difficulty of system operation but also places higher demands on the flexibility and reliability of the power supply operation method.

[0003] Traction power supply systems operate in a variety of modes, including fully parallel AT power supply, direct power supply with fully decoupled AT, power supply using a single feeder circuit breaker at a substation with two feeders, parallel power supply with decoupled AT stations and substations, and single-line AT. While these diverse operating modes improve system flexibility and adaptability, they often make it difficult to quickly and accurately locate the fault point when a fault occurs, due to the complexity of the system structure and the diversity of operating modes. This impacts repair efficiency and power restoration time.

[0004] Currently, traction power supply systems include protection devices such as transformers, feeders, and autotransformers. Functional verification of each protection device is performed independently. While this verification method can ensure the correct function of a single protection device, it cannot fully assess the coordination between multiple protection devices or the rationality of their setting settings. Improper coordination between protection devices or irrational setting settings can lead to false or non-operational protection, potentially compromising the safe and stable operation of the traction power supply system.

[0005] Furthermore, during the annual routine maintenance of protective devices, in order to shorten outages and restore power as quickly as possible, some devices may not be fully and thoroughly tested for their functionality, creating a risk of incomplete verification. This risk can accumulate over the long term, ultimately leading to protection failure or malfunction, posing a threat to the safety of the traction power supply system. Summary of the Invention

[0006] In order to check the coordination between multiple protection devices in a power supply system such as a traction substation and improve the safe and stable operation level of the traction power supply system, the present application provides a testing method, system, equipment and medium for protection devices in a power supply system.

[0007] In a first aspect, the present application provides a method for testing a protection device in a power supply system, comprising:

[0008] Step a: obtaining a current test sequence, wherein the current test sequence includes multiple fault test contents corresponding to the power supply system;

[0009] Step b: constructing a current test scenario based on the current test sequence, wherein the current test scenario is a parameter set of electrical parameters and operating status of the power supply system under the fault state corresponding to the current test sequence;

[0010] Step c: calculating current simulated fault data in the current test scenario based on the trained fault simulation model, wherein the current simulated fault data includes simulation data of multiple analog channels corresponding to each protection device under test;

[0011] Step d: sending the current simulated fault data to a plurality of test devices, so that each of the test devices tests the protection device under test corresponding to the test device;

[0012] Step e: obtaining the current action behaviors generated by the test of each of the protection devices under test, and comparing each of the current action behaviors with the corresponding target action behaviors to obtain the test results corresponding to the current test sequence.

[0013] The beneficial effects of this application are: based on the constructed current test scenario, fault data is generated, and the fault data is more consistent with the actual data when the fault occurs. Fault simulation can be automatically completed for the fault point corresponding to the current test sequence. The fault point corresponding to the current test sequence can be any fault point, ensuring that fault simulation can be performed at any fault location, thereby improving the safe and stable operation of power supply systems such as traction substations.

[0014] Furthermore, the sending of the current simulated fault data to a plurality of test devices includes:

[0015] For the simulation data of each analog channel in the current simulation fault data, based on the corresponding relationship between each test device and each analog channel, the simulation data of the analog channel is sent to the corresponding test device.

[0016] The beneficial effect of adopting this further solution is that by sending simulation data directly to the corresponding test equipment, it can ensure that each test equipment receives simulation data for its specific analog channel, thus avoiding the possibility of data confusion or miscommunication, and improving the accuracy and reliability of the test. The accurate transmission of simulation data to the corresponding test equipment helps shorten the test cycle and improve the overall efficiency of the test work.

[0017] Further, after sending the current simulated fault data to a plurality of test devices, the method further includes:

[0018] It is determined whether each of the test devices is in a clock synchronization state. If so, a same test output time is sent to each of the test devices. The test output time is the time when each of the test devices starts testing the corresponding protection device under test.

[0019] The beneficial effect of adopting the above further solution is that when all test devices are in clock synchronization state, it can ensure that the clock errors of all test devices are within the allowable range, achieve high coordination of operations between the test devices, and improve the accuracy of test results.

[0020] Furthermore, the step a comprises:

[0021] The current test sequence is acquired based on a test sequence set, where the test sequence set includes a plurality of different test sequences, and different test sequences correspond to different fault test contents.

[0022] The beneficial effect of adopting this further solution is that by generating a test sequence set that includes all test sequences, it provides test conditions for subsequent automatic fault testing, ensuring comprehensiveness and systematic testing and reducing potential risks caused by missed tests. The test master station can directly select the test sequences to be tested from the pre-built full-scenario test sequence set, greatly improving testing efficiency.

[0023] Further, after step e, the method further includes:

[0024] If the current test sequence is not the last test sequence to be tested in the test sequence set, the test sequence next to the current test sequence in the test sequence set is used as the new current test sequence, and the method of steps b to e is repeatedly performed until all test sequences in the test sequence set are tested.

[0025] The beneficial effect of adopting the above further scheme is: by looping the method of step b to step e, the fault simulation of all fault points in the test sequence set can be automatically completed, ensuring that fault simulation can be performed when a fault occurs at any fault location, and automatically traversing all test sequences in the test sequence set to ensure that each fault scenario is fully simulated and tested, greatly improving the comprehensiveness of the test and reducing the possibility of missing fault points due to human negligence.

[0026] Further, after step e, the method further includes:

[0027] Based on the test results, a test report for the current test sequence is generated.

[0028] The beneficial effect of adopting the above further solution is that by generating a test report corresponding to the test sequence, the test results corresponding to each test sequence can be traced, providing an important basis for subsequent troubleshooting and performance analysis.

[0029] Further, the step b comprises:

[0030] Acquire a target test scenario based on basic information corresponding to the current test sequence, the basic information including power supply mode, fault location, fault type, and fault duration;

[0031] Identifying a current power supply scenario based on current position status information of each circuit breaker in the power supply system;

[0032] If the current power supply scenario is inconsistent with the target test scenario, each current position state information is adjusted until the current power supply scenario is consistent with the target scenario, and the current power supply scenario is used as the current test scenario.

[0033] The beneficial effect of adopting this further solution is that by constructing a test scenario that is consistent with the target scenario, the authenticity of the test scenario is guaranteed. By flexibly adjusting the position and status information of the circuit breaker, a variety of test scenarios can be quickly generated to meet various testing requirements, helping to fully cover all test sequences and improve the comprehensiveness and effectiveness of the test.

[0034] In a second aspect, the present application provides a testing system for a protection device in a power supply system, comprising:

[0035] An engineering management module is used to obtain a current test sequence, wherein the current test sequence includes multiple fault test contents corresponding to the power supply system;

[0036] A construction module, configured to construct a current test scenario based on the current test sequence, wherein the current test scenario is a parameter set of electrical parameters and operating status of the power supply system under a fault state corresponding to the current test sequence;

[0037] A simulation data calculation and generation module, configured to calculate the current simulation fault data in the current test scenario based on the trained fault simulation model, wherein the current simulation fault data includes simulation data of multiple analog channels corresponding to each protection device under test;

[0038] A simulation data transmission module, configured to send the current simulation fault data to a plurality of test devices, so that each of the test devices tests the protection device under test corresponding to the test device;

[0039] The test result judgment module is used to obtain the current action behavior generated by the test of each of the tested protection devices, compare each of the current action behaviors with the corresponding target action behavior, and obtain the test result corresponding to the current test sequence.

[0040] In a third aspect, the present application provides an electronic device, comprising a processor and a memory, wherein the processor is coupled to the memory;

[0041] The processor is configured to execute a computer program stored in the memory, so that the electronic device executes the method according to any one of the first aspects.

[0042] In a fourth aspect, the present application provides a computer-readable storage medium comprising a computer program or instructions, which, when executed on a computer, causes the computer to execute the method as described in any one of the first aspects. BRIEF DESCRIPTION OF THE DRAWINGS

[0043] Figure 1 This is a flow chart of a method for testing a protection device in a power supply system according to an embodiment of the present application;

[0044] Figure 2 This is a block diagram of the test master station connection structure of the embodiment of the present application;

[0045] Figure 3 This is a schematic diagram of the primary system of the power supply system according to an embodiment of the present application;

[0046] Figure 4 This is a structural block diagram of a testing system for a protection device in a power supply system according to an embodiment of the present application;

[0047] Figure 5 This is a structural block diagram of an electronic device according to an embodiment of the present application. DETAILED DESCRIPTION

[0048] The present application is further described in detail below with reference to the accompanying drawings.

[0049] Embodiments of the present application provide a method for testing a protective device in a power supply system. The method can be performed by a device, which can be a server or a terminal device. The server can be a standalone physical server, a server cluster or distributed system composed of multiple physical servers, or a cloud server providing cloud computing services. The terminal device can be, but is not limited to, a smartphone, a tablet computer, or a desktop computer.

[0050] like Figure 1 As shown, a method for testing a protection device in a power supply system is performed by a test master station. The main process of the method is described as follows (steps a to e):

[0051] Step a: obtaining a current test sequence, where the current test sequence includes multiple fault test contents corresponding to the power supply system.

[0052] In this embodiment, the power supply system includes a primary system and a secondary system. The power supply system can be a traction power supply system. The primary system is composed of equipment such as generators, transmission lines, transformers, and circuit breakers for power generation, transmission, transformation, and distribution. The power equipment in the primary system directly participates in the generation, transmission, transformation, and distribution of electrical energy. The secondary system is composed of protection devices, automatic safety controls, system communications, and dispatch automation. The primary system's primary function is to monitor, control, protect, and manage the primary system, ensuring its safe, stable, and economical operation.

[0053] Protection devices are an important component of the secondary system. They monitor the operating status of power equipment in the primary system in real time and quickly disconnect the faulty equipment or issue an alarm when a fault or abnormality is detected, thereby ensuring the safe and stable operation of the primary system. In this embodiment, the protection devices may include transformer protection devices, feeder protection devices, and autotransformer protection devices.

[0054] like Figure 2 As shown, the test master station is installed in a portable computer, which is connected to multiple test devices via wired Ethernet to perform networking tests on the protection devices corresponding to the multiple test devices.

[0055] The test sequence also includes a test number, which indicates the order in which the test sequence is run. The fault test content describes possible fault conditions in the primary system. The current test sequence corresponds to a single fault point, which can be located inside the traction transformer, at the outlet of the traction power arm, in the middle of the traction power arm, at the end of the traction power arm, or inside the autotransformer.

[0056] Step b: constructing a current test scenario based on the current test sequence, wherein the current test scenario is a parameter set of electrical parameters and operating status of the power supply system under the fault state corresponding to the current test sequence.

[0057] Prior to step b, the test master station may first obtain the primary system's equipment parameters. The primary system's equipment parameters may include system voltage, equivalent parameters of the traction transformer, autotransformer, and traction power supply arm. In this embodiment, the primary system's equipment parameters may be input by the user into the test master station during testing, or may be parameters stored in the test master station.

[0058] The current test scenario is the specific environment and conditions corresponding to the primary system, which may include the layout of the power plant, the direction of the transmission line, the configuration of the substation, and the distribution of the distribution network.

[0059] Based on the equipment parameters of the primary system and the current test sequence, the current test scenario can be constructed, so that the simulated current fault data can better fit the real data when the fault actually occurs, thereby improving the accuracy of subsequent test results.

[0060] Step c: calculating current simulated fault data in the current test scenario based on the trained fault simulation model, wherein the current simulated fault data includes simulation data of multiple analog channels corresponding to each protection device under test.

[0061] In this embodiment, the fault simulation model may be ATPDraw, which is a circuit simulation software developed based on the ATP-EMTP (The Alternative Transients Program-Electromagnetic Transients Program) program.

[0062] The current test scenario is used as the input of the trained fault simulation model, and the trained fault simulation model can output the current simulated fault data.

[0063] Multiple analog channels can include voltage and current channels. Analog channels are channels capable of receiving, converting, and processing analog signals. Analog signals are continuously changing physical quantities, such as voltage, current, temperature, and pressure. Analog signals are converted into electrical signals by sensors or transmitters and then further processed through analog channels. Analog channels are primarily used to acquire and process analog signals (such as voltage and current) from primary systems and convert them into digital signals for use in monitoring, control, and protection devices.

[0064] like Figure 3 As shown, in this embodiment, the voltage channel may include four high-voltage side voltages (UA, UB, UC, and U0), four low-voltage side voltages (UT1, UF1, UT2, and UF2), an upstream feeder voltage (UT2 and UF2), and a downstream feeder voltage (UT1 and UF1); the current channel may include four high-voltage side currents (IA, IB, IC, and I0), four low-voltage side currents (IT1, IF1, IT2, and IF2), an upstream feeder current (IT2 and IF2), a downstream feeder current (IT1 and IF1), an absorption current (IAT1 and IAT2), and a parallel line current (ITb and IFb).

[0065] Step d: sending the current simulated fault data to a plurality of test devices, so that each of the test devices tests the protection device under test corresponding to the test device.

[0066] like Figure 2 As shown, in this embodiment, the protection device under test can be installed on the corresponding tooling cabinet according to the actual installation position. The test equipment can test the corresponding protection device under test according to the current simulated fault data.

[0067] Step e: obtaining the current action behaviors generated by the test of each of the protection devices under test, and comparing each of the current action behaviors with the corresponding target action behaviors to obtain the test results corresponding to the current test sequence.

[0068] In this embodiment, the current action behavior may include the switch position and action SOE information. The switch position can be expressed as "closed" or "open". The action SOE information refers to the time sequence record of various events in the power system (such as switch position changes and protection actions, etc.), which is used to record the specific time of the event (accurate to milliseconds) and the event type.

[0069] According to the test purpose of the current test sequence, the target action behavior corresponding to each tested protection device is obtained. Each target action behavior can comply with the action result of the corresponding test content in response to the "Q / CR687 Technical Guidelines for Configuration and Setting Calculation of Relay Protection of Traction Power Supply System".

[0070] By comparing each current action behavior with its corresponding target action behavior, a plurality of comparison results are obtained, and then a test result corresponding to the current test sequence is obtained based on the plurality of comparison results.

[0071] Based on the constructed current test scenario, fault data is generated, which better reflects the actual data when a fault occurs. Fault simulation can be automatically completed for any fault point corresponding to the current test sequence, ensuring that fault simulation can be performed regardless of the fault location, improving the safe and stable operation of power supply systems such as traction substations.

[0072] In this embodiment, there is no need to pre-compile multiple test schemes and manually set the voltage and current data of the test sequence. It is independent of the function and setting value of the protection device under test, and the functional correctness of the protection device under test and the rationality of the setting value can be verified. It can also check the coordination between multiple protection devices in the power supply system such as the traction substation, reduce the requirements for testers, do not need to manually change the test data on site, and the on-site testing process is simple.

[0073] In this embodiment, the step a specifically includes the following processing: based on a test sequence set, obtaining the current test sequence, the test sequence set including a plurality of different test sequences, and different test sequences correspond to different fault test contents.

[0074] Each test sequence corresponds to basic information, which includes fault test content. The fault test content includes power supply mode, fault point location, transition resistance size, fault type and fault duration. The fault type of the fault point can include single-phase grounding, two-phase short circuit and two-phase short circuit grounding. The fault type of each fault point can set the transition resistance size. The fault duration of the fault type of each fault point can include instantaneous and permanent.

[0075] By setting the power supply mode, all fault points that need to be tested, the fault type of each fault point, the transition resistance of each fault type, and the fault duration, a test sequence set containing all test items in the full scenario of the test project can be formed.

[0076] By generating a test sequence set that includes all configured fault points, fault types, and fault durations, it provides the test conditions for subsequent automated fault testing, ensuring comprehensive and systematic testing and reducing potential risks caused by missed tests. The test master station can directly select the test sequence to be tested from the pre-built full-scenario test sequence set, greatly improving testing efficiency.

[0077] like Figure 3 As shown, in this embodiment, the locations where the fault point can be set include: the inside of the traction transformer (such as fault point K1), the low-voltage busbar of the traction substation (such as fault point K2), the outlet of the upward traction power supply arm (such as fault point K3), the middle of the upward traction power supply arm (such as fault point K4), the end of the upward traction power supply arm (such as fault point K5), the outlet of the downward traction power supply arm (such as fault point K6), the middle of the downward traction power supply arm (such as fault point K7), the end of the downward traction power supply arm (such as fault point K8) and the inside of the autotransformer (such as fault points K9, K10).

[0078] The fault types for each fault point include single-phase grounding (such as TR fault and FR fault), two-phase short circuit (such as TF fault), and two-phase short circuit grounding (such as TFR fault). Each fault point's fault type can be configured with a transition resistance, including metallic short circuit and high-resistance grounding. The fault duration for each fault point includes instantaneous (fault duration 500ms) and permanent (fault duration 10s).

[0079] In this embodiment, after step e, the following processing is also included: if the current test sequence is not the last test sequence to be tested in the test sequence set, the next test sequence of the current test sequence in the test sequence set is used as the new current test sequence, and the method of steps b to e is repeatedly executed until all test sequences in the test sequence set are tested.

[0080] By looping through steps b to e, fault simulation of all fault points in the test sequence set can be automatically completed, ensuring that fault simulation can be performed whenever a fault occurs at any fault location. All test sequences in the test sequence set are automatically traversed, ensuring that each fault scenario is fully simulated and tested, greatly improving the comprehensiveness of the test and reducing the possibility of missing a fault point due to human negligence.

[0081] Automatically complete fault simulation of all fault types to ensure the reliability of fault simulation, and automatically complete fault simulation of all power supply modes to ensure the comprehensiveness of fault simulation. During the entire fault simulation process, all tasks can be completed automatically by computer. Automated testing can greatly shorten the test cycle, reduce the repetitive work of testers, and thus save test time and labor costs.

[0082] In this embodiment, the method for automatically testing a set of test sequences for the entire scenario includes: obtaining the test content of the first test sequence, namely, the first power supply mode (such as a full parallel AT power supply mode), the first fault point (such as fault point K1), the first fault type (such as a TR fault), the first transition resistance (such as a metallic short circuit) and the duration (such as a transient fault time of 500ms), and testing the first test sequence.

[0083] After the first test sequence is completed, the test content of the second test sequence is obtained, that is, the duration is set (permanent fault time 10s). Other test contents are the same as the test contents of the first test sequence, and the second test sequence is tested.

[0084] If all test sequences with the same power supply mode, fault point, fault type, and transition resistance but different fault durations are completed, proceed to the next test sequence and obtain the test content of the next test sequence, that is, set the next transition resistance (high-resistance grounding), the power supply mode is still the full parallel AT power supply mode, the fault point is still the fault point K1, and the fault type is still the TR fault, and test this test sequence. After the test sequence is completed, continue to obtain new test sequences until the power supply mode is the full parallel AT power supply mode, the fault point is the fault point K1, the fault type is the TR fault, and the test sequences for all fault durations and all transition resistances are completed. Then, the test sequence for the next fault type can be tested, and so on, until all test sequences are completed.

[0085] In this embodiment, sending the current simulation fault data to multiple test devices includes the following processing: for the simulation data of each analog channel in the current simulation fault data, based on the correspondence between each test device and each analog channel, sending the simulation data of the analog channel to the corresponding test device.

[0086] The test master station stores the correspondence between the test equipment and the analog channels. Based on this correspondence, the test master station can send the simulation data of each analog channel in the current simulated fault data to the corresponding test equipment. Figure 2 and Figure 3 As shown, illustratively, the multiple test devices include test cabinet 1, test cabinet 2, and test cabinet 3. The corresponding relationship between test cabinet 1, test cabinet 2, and test cabinet 3 and each analog channel is shown in Table 1:

[0087] Table 1

[0088]

[0089] Under the fault state of the current test sequence, the electrical quantities of each part of the power supply system (especially the analog channels listed in Table 1) will respond to this fault, that is, simulate which channels (that is, which electrical quantities) will be affected by the fault. The current simulated fault data includes how each analog channel is affected by the current test sequence.

[0090] In this embodiment, after sending the current simulated fault data to multiple test devices, the following processing is also included: judging whether each of the test devices is in a clock synchronization state, and if so, sending the same test output time to each of the test devices, and the test output time is the time when each of the test devices starts testing the corresponding protection device under test.

[0091] After all test devices have received the corresponding simulation data, the operations between each test device and each protection device under test need to be highly coordinated. Slight differences in time may lead to inaccurate test results. Therefore, it is necessary to ensure that the clocks between each test device and each protection device under test are synchronized.

[0092] like Figure 2 As shown, multiple test devices can be communicated and connected with the Beidou time-synchronized clock server respectively, and each protection device under test can also be communicated and connected with the clock server respectively. By synchronizing with the clock server, it is ensured that the clock errors of all test devices and protection devices under test are within the allowable range, so that each test device and each protection device under test can achieve clock synchronization, so that the same test output time can be set.

[0093] In this embodiment, for each test device or each protection device under test, the test device or the protection device under test itself will have its own clock that changes normally. After successfully synchronizing with the Beidou standard clock, its own clock will be rewritten as Beidou time for the first time. Subsequently, the time will be read from the Beidou standard clock once every 1 second and compared with the clock of the test device or the protection device under test. If the difference is less than 0.1ms, the clock is considered to be synchronized, that is, the test device or the protection device under test is in a clock synchronization state.

[0094] When each test device and each protection device under test are in a clock synchronization state, each test device simulates the changes in various electrical quantities in the power system under actual fault conditions based on the received simulation data, and simultaneously outputs corresponding test signals to the corresponding protection device under test. The test signals are used to test the action behavior of the protection device under test under specific fault conditions.

[0095] In this embodiment, after step e, the following processing is further included: generating a test report of the current test sequence based on the test results.

[0096] The content recorded in the test report may include the electrical quantity applied to each tested protection device, the target action behavior corresponding to each tested protection device, the actual current action behavior of each tested device and the comparison results of each automatically determined current action behavior, so that the test results corresponding to each test sequence can be traced, providing an important basis for subsequent troubleshooting and performance analysis.

[0097] In this embodiment, the step b includes the following processing: obtaining a target test scenario based on the basic information corresponding to the current test sequence, the basic information including the power supply mode, fault point location, fault type and fault duration; identifying the current power supply scenario based on the current position status information of each circuit breaker in the power supply system; if the current power supply scenario is inconsistent with the target test scenario, adjusting each current position status information until the current power supply scenario is consistent with the target scenario, and using the current power supply scenario as the current test scenario.

[0098] According to the current position status information of each circuit breaker in the primary system, the current topology of the primary system is identified. The current topology is the current power supply scenario. The current position status information of the circuit breaker can be the closed position or the open position. Figure 3 As shown, for example, multiple circuit breakers include QF101, QF201, QF211, QF212, QF221, QF222, QF224, QF231, QF232, QF234, QF225 and QF235, and the circuit breakers whose current position status information is the closed position include: QF101, QF201, QF211, QF212, QF221, QF222, QF224, QF231, QF232 and QF234, and the circuit breakers whose current position status information is the open position include QF225 and QF235.

[0099] By directly reflecting the actual position status of the circuit breaker in the power system (closed or open), a test scenario consistent with the target scenario can be constructed, ensuring the authenticity of the test scenario. Different test sequences correspond to different basic information such as power supply mode and fault type, requiring the construction of different test scenarios. By flexibly adjusting the position status information of the circuit breaker, a variety of test scenarios can be quickly generated to meet various testing needs, helping to fully cover all test sequences and improve the comprehensiveness and effectiveness of the test.

[0100] In this embodiment, the testing method for protection devices in power supply systems is applicable not only to functional testing of secondary system protection devices in power supply systems such as traction substations, but also to testing of relay protection and automation devices in substations. In addition to on-site delivery testing of protection automation devices, this method is also applicable to specialized testing by certification bodies and functional verification testing during the R&D phase of suppliers, among other functional testing stages.

[0101] Based on the same technical concept, the present application also provides a testing system for a protection device in a power supply system, such as Figure 4 As shown, the testing system 200 for the protection device in the power supply system mainly includes:

[0102] The engineering management module 201 is used to obtain a current test sequence, where the current test sequence includes multiple fault test contents corresponding to the power supply system;

[0103] A construction module 202 is configured to construct a current test scenario based on the current test sequence, wherein the current test scenario is a parameter set of electrical parameters and operating status of the power supply system under a fault state corresponding to the current test sequence;

[0104] A simulation data calculation and generation module 203 is configured to calculate current simulation fault data in the current test scenario based on the trained fault simulation model, wherein the current simulation fault data includes simulation data of multiple analog channels corresponding to each protection device under test;

[0105] A simulation data transmission module 204 is configured to send the current simulation fault data to a plurality of test devices, so that each of the test devices tests the protection device under test corresponding to the test device;

[0106] The test result judgment module 205 is used to obtain the current action behavior generated by the test of each protection device under test, and compare each current action behavior with its corresponding target action behavior to obtain the test result corresponding to the current test sequence.

[0107] Optionally, the simulation data transmission module 204 includes:

[0108] The corresponding sending submodule is used to send the simulation data of each analog channel in the current simulated fault data to the corresponding test device based on the corresponding relationship between each test device and each analog channel.

[0109] Optionally, after the simulation data transmission module 204, the method further includes:

[0110] The judgment and sending module is used to judge whether each of the test devices is in a clock synchronization state. If so, the same test output time is sent to each of the test devices. The test output time is the time when each of the test devices starts testing the corresponding protection device under test.

[0111] Optionally, the project management module 201 includes:

[0112] The first acquisition submodule is configured to acquire the current test sequence based on a test sequence set, where the test sequence set includes a plurality of different test sequences, and different test sequences correspond to different fault test contents.

[0113] Optionally, after the test result judgment module 205, the method further includes:

[0114] A repeated execution module is used to use the next test sequence of the current test sequence in the test sequence set as the new current test sequence when the current test sequence is not the last test sequence to be tested in the test sequence set, and repeatedly execute the processing from the construction module 202 to the test result judgment module 205 until all test sequences in the test sequence set are tested.

[0115] Optionally, after the test result judgment module 205, the method further includes:

[0116] A report generation module is used to generate a test report for the current test sequence based on the test results.

[0117] Optionally, the building module 202 includes:

[0118] A second acquisition submodule is configured to acquire a target test scenario based on basic information corresponding to the current test sequence, wherein the basic information includes a power supply mode, a fault point location, a fault type, and a fault duration;

[0119] an identification submodule, configured to identify a current power supply scenario based on current position status information of each circuit breaker in the power supply system;

[0120] The adjustment submodule is used to adjust the current position status information when the current power supply scenario is inconsistent with the target test scenario until the current power supply scenario is consistent with the target scenario, and use the current power supply scenario as the current test scenario.

[0121] In one example, the module in any of the above devices can be one or more integrated circuits configured to implement the above methods, such as: one or more application specific integrated circuits (ASICs), or one or more digital signal processors (DSPs), or one or more field programmable gate arrays (FPGAs), or a combination of at least two of these integrated circuit forms.

[0122] For another example, when the modules in the device can be implemented in the form of a processing element scheduling program, the processing element can be a general-purpose processor, such as a central processing unit (CPU) or other processor capable of calling programs. For another example, these modules can be integrated together and implemented in the form of a system-on-a-chip (SOC).

[0123] Various objects such as various messages / information / equipment / network elements / systems / devices / actions / operations / processes / concepts that may appear in this application are named. It can be understood that these specific names do not constitute a limitation on the relevant objects. The names assigned may change with factors such as scenarios, contexts or usage habits. The understanding of the technical meaning of the technical terms in this application should be mainly determined from the functions and technical effects embodied / executed in the technical solutions.

[0124] Those skilled in the art will clearly understand that, for the convenience and brevity of description, the specific working processes of the systems, devices and modules described above can refer to the corresponding processes in the aforementioned method embodiments and will not be repeated here.

[0125] Those skilled in the art will appreciate that the modules and algorithm steps of each example described in conjunction with the embodiments disclosed herein can be implemented in electronic hardware, or a combination of computer software and electronic hardware. Whether these functions are performed in hardware or software depends on the specific application and design constraints of the technical solution. Professional and technical personnel can use different methods to implement the described functions for each specific application, but such implementation should not be considered beyond the scope of this application.

[0126] Based on the same technical concept, the present application also provides an electronic device, such as Figure 5 As shown, the electronic device 300 includes a processor 301 and a memory 302 , and may further include an information input / information output (I / O) interface 303 , one or more communication components 304 , and a communication bus 305 .

[0127] The processor 301 is used to control the overall operation of the electronic device 300 to complete all or part of the steps in the above-mentioned method for testing a protection device in a power supply system; the memory 302 is used to store various types of data to support the operation of the electronic device 300. For example, these data may include instructions for any application or method operating on the electronic device 300, as well as application-related data. The memory 302 can be implemented by any type of volatile or non-volatile storage device or a combination thereof, such as one or more of static random access memory (SRAM), electrically erasable programmable read-only memory (EEPROM), erasable programmable read-only memory (EPROM), programmable read-only memory (PROM), read-only memory (ROM), magnetic memory, flash memory, magnetic disk, or optical disk.

[0128] The I / O interface 303 provides an interface between the processor 301 and other interface modules, which may be a keyboard, a mouse, buttons, etc. These buttons may be virtual buttons or physical buttons. The communication component 304 is used to test wired or wireless communication between the electronic device 300 and other devices. Wireless communication, such as Wi-Fi, Bluetooth, Near Field Communication (NFC), 2G, 3G or 4G, or a combination of one or more thereof, may include: Wi-Fi components, Bluetooth components, and NFC components.

[0129] Communication bus 305 may include a path for transmitting information between the aforementioned components. Communication bus 305 may be a PCI (Peripheral Component Interconnect) bus or an EISA (Extended Industry Standard Architecture) bus, for example. Communication bus 305 may be divided into an address bus, a data bus, a control bus, and the like.

[0130] The electronic device 300 can be implemented by one or more application-specific integrated circuits (ASICs), digital signal processors (DSPs), digital signal processing devices (DSPDs), programmable logic devices (PLDs), field programmable gate arrays (FPGAs), controllers, microcontrollers, microprocessors, or other electronic components, and is used to execute the test method for the protection device in the power supply system given in the above embodiment.

[0131] The electronic device 300 may include but is not limited to mobile terminals such as digital broadcast receivers, PDAs (personal digital assistants), PMPs (portable multimedia players), and fixed terminals such as digital TVs and desktop computers, and may also be servers.

[0132] Based on the same technical concept, the present application also provides a computer-readable storage medium, on which a computer program is stored. When the computer program is executed by a processor, the steps of the above-mentioned method for testing a protection device in a power supply system are implemented.

[0133] The computer-readable storage medium may include: a USB flash drive, a mobile hard disk, a read-only memory (ROM), a random access memory (RAM), a magnetic disk, or an optical disk, etc., which can store program codes.

[0134] The terms "comprises," "comprising," or any other variations thereof are intended to cover non-exclusive inclusion such that a process, method, article, or apparatus that comprises a list of elements includes not only those elements but also other elements not expressly listed or inherent to such process, method, article, or apparatus.

[0135] Furthermore, the terms "first" and "second" are used for descriptive purposes only and should not be construed as indicating or implying relative importance or implicitly specifying the number of the technical features being referred to. Thus, a feature defined as "first" or "second" may explicitly or implicitly include at least one of such features. Throughout the description of this application, "plurality" means at least two, for example, two, three, etc., unless otherwise specifically defined.

[0136] In the description of this specification, the description with reference to the terms "one embodiment", "some embodiments", "example", "specific example", or "some examples" means that the specific features, structures, materials or characteristics described in conjunction with the embodiment or example are included in at least one embodiment or example of the present application. In this specification, the schematic representations of the above terms do not necessarily refer to the same embodiment or example. Moreover, the specific features, structures, materials or characteristics described can be combined in any one or more embodiments or examples in a suitable manner. In addition, those skilled in the art can combine and combine different embodiments or examples described in this specification and features of different embodiments or examples without contradiction.

[0137] Although the embodiments of the present application have been shown and described above, it can be understood that the above embodiments are exemplary and cannot be understood as limitations on the present application. Ordinary technicians in this field can change, modify, replace and modify the above embodiments within the scope of the present application.

Claims

1. A method for testing a protection device in a power supply system, characterized in that: include: Step a: obtaining a current test sequence, wherein the current test sequence includes multiple fault test contents corresponding to the power supply system, wherein the power supply system is a traction power supply system; Step b: constructing a current test scenario based on the current test sequence, wherein the current test scenario is a parameter set of electrical parameters and operating status of the power supply system under the fault state corresponding to the current test sequence; Step c: calculating current simulated fault data in the current test scenario based on the trained fault simulation model, wherein the current simulated fault data includes simulation data of multiple analog channels corresponding to each protection device under test; Step d: sending the current simulated fault data to a plurality of test devices, so that each of the test devices tests the protection device under test corresponding to the test device; Step e: obtaining the current action behavior generated by the test of each of the protection devices under test, and comparing each of the current action behaviors with the corresponding target action behavior to obtain the test result corresponding to the current test sequence; The sending of the current simulated fault data to a plurality of test devices comprises: For the simulation data of each analog channel in the current simulated fault data, based on the corresponding relationship between each test device and each analog channel, the simulation data of the analog channel is sent to the corresponding test device; After sending the current simulated fault data to a plurality of test devices, the method further includes: Determine whether each of the test devices is in a clock synchronization state. If so, send the same test output time to each of the test devices, where the test output time is the time when each of the test devices starts testing the corresponding protection device under test; When all test equipment and each tested protection device are in a clock-synchronized state, each test equipment simulates the changes of various electrical quantities in the power system under actual fault conditions based on the received simulation data, and simultaneously outputs corresponding test signals to the corresponding tested protection device. The test signals are used to test the action behavior of the tested protection device under the specified fault condition. The step b comprises: Acquire a target test scenario based on basic information corresponding to the current test sequence, the basic information including power supply mode, fault location, fault type, and fault duration; Identifying a current power supply scenario based on current position status information of each circuit breaker in the power supply system; If the current power supply scenario is inconsistent with the target test scenario, each current position state information is adjusted until the current power supply scenario is consistent with the target scenario, and the current power supply scenario is used as the current test scenario.

2. A method for testing a protection device in a power supply system according to claim 1, characterized in that: The step a comprises: The current test sequence is acquired based on a test sequence set, where the test sequence set includes a plurality of different test sequences, and different test sequences correspond to different fault test contents.

3. The method for testing a protection device in a power supply system according to claim 2, wherein: After step e, the method further includes: If the current test sequence is not the last test sequence to be tested in the test sequence set, the test sequence next to the current test sequence in the test sequence set is used as the new current test sequence, and the method of steps b to e is repeatedly performed until all test sequences in the test sequence set are tested.

4. A method for testing a protection device in a power supply system according to claim 3, characterized in that: After step e, the method further includes: Based on the test results, a test report for the current test sequence is generated.

5. A testing system for a protection device in a power supply system, characterized in that: include: An engineering management module is configured to obtain a current test sequence, wherein the current test sequence includes multiple fault test contents corresponding to a power supply system, wherein the power supply system is a traction power supply system; A construction module, configured to construct a current test scenario based on the current test sequence, wherein the current test scenario is a parameter set of electrical parameters and operating status of the power supply system under a fault state corresponding to the current test sequence; A simulation data calculation and generation module, configured to calculate the current simulation fault data in the current test scenario based on the trained fault simulation model, wherein the current simulation fault data includes simulation data of multiple analog channels corresponding to each protection device under test; A simulation data transmission module, configured to send the current simulation fault data to a plurality of test devices, so that each of the test devices tests the protection device under test corresponding to the test device; A test result judgment module is used to obtain the current action behavior generated by the test of each of the tested protection devices, compare each of the current action behaviors with the corresponding target action behavior, and obtain the test result corresponding to the current test sequence; The simulation data transmission module includes: A corresponding sending submodule is used to send the simulation data of each analog channel in the current simulated fault data to the corresponding test device based on the corresponding relationship between each test device and each analog channel; After the simulation data transmission module, it also includes: a judging and sending module, configured to judge whether each of the test devices is in a clock synchronization state, and if so, to send a same test output time to each of the test devices, wherein the test output time is the time when each of the test devices starts testing the corresponding protection device under test; When all test equipment and each tested protection device are in a clock-synchronized state, each test equipment simulates the changes of various electrical quantities in the power system under actual fault conditions based on the received simulation data, and simultaneously outputs corresponding test signals to the corresponding tested protection device. The test signals are used to test the action behavior of the tested protection device under the specified fault condition. The building blocks include: A second acquisition submodule is configured to acquire a target test scenario based on basic information corresponding to the current test sequence, wherein the basic information includes a power supply mode, a fault point location, a fault type, and a fault duration; an identification submodule, configured to identify a current power supply scenario based on current position status information of each circuit breaker in the power supply system; The adjustment submodule is used to adjust the current position status information when the current power supply scenario is inconsistent with the target test scenario until the current power supply scenario is consistent with the target scenario, and use the current power supply scenario as the current test scenario.

6. An electronic device, characterized in that: comprising a processor and a memory, wherein the processor is coupled to the memory; The processor is configured to execute the computer program stored in the memory, so that the electronic device performs the method according to any one of claims 1 to 4.

7. A computer-readable storage medium, characterized in that The method comprises a computer program or an instruction, which, when executed on a computer, causes the computer to execute the method according to any one of claims 1 to 4.

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