LED lamp aging test device

Abstract

The invention relates to an LED lamp aging test device, which belongs to the technical field of lamp test devices, and comprises a test box body, a cover body is slidably clamped on the test box body, a test platform is installed in the test box body through a support part, the test platform is provided with regularly arranged air holes, and the bottom of the test platform is provided with a sliding groove. A sliding groove is formed in the cover body, two power supply assemblies are clamped in the sliding groove in a sliding mode, a downward pressing mechanism used for limiting the position of a tested lamp is fixed to the top of the cover body, each power supply assembly comprises a sliding block clamped in the sliding groove in a sliding mode, a clamping seat is fixed to the bottom of each sliding block, and an extension arm is rotationally clamped to each clamping seat. According to the LED lamp aging test platform, adaptive power supply can be carried out on LED lamps of different specifications and sizes, the tested LED lamp can be better fixed in cooperation with the downward pressing mechanism, a pin fixing assembly in the test platform can carry out a fixed test on the pin type LED lamp inserted into the insertion hole, and the test environment can be changed according to requirements in the aging test so as to accelerate the test speed.

Description

Technical Field

[0001] The present invention relates to the technical field of lamp testing devices, and in particular to an LED lamp aging testing device. Background Art

[0002] LED lamp is a lighting device made by the electroluminescence principle of semiconductor materials. Compared with traditional incandescent lamps and fluorescent lamps, LED lamps are highly efficient and energy-saving, and LED lamps are small in size and rich in colors. Therefore, they are widely used in modern society. LED lamps are small in size, so they are very convenient to integrate into various products. In the production process of LED lamps, it is necessary to perform aging tests on some finished or semi-finished products of LED lamps to ensure the quality of LED lamps. Since a lot of time is needed to wait during regular use, people often use rapid aging tests to obtain the quality of LED lamps in the test batch.

[0003] For example, a Chinese invention patent document with announcement number CN104076297B discloses an LED lamp aging test device, which is used to electrically connect an external power supply and a pin-type LED lamp to simulate the aging process of the pin-type LED lamp. The LED lamp aging test device includes a box, and a potentiometer, a positive connector, a plurality of LED lamp sockets and a negative connector all arranged on the box, and the negative connector is arranged corresponding to the LED lamp socket; the positive connector is used to connect the positive pole of the power supply with the first end of the potentiometer, and the second end of the potentiometer is sequentially connected in series with a plurality of the LED lamp sockets and a negative connector, and the negative connector is used to electrically connect the negative pole of the power supply.

[0004] The above-mentioned testing device has a simple structure and low cost, and can perform aging tests on multiple LED lamps at the same time with high efficiency. However, in the above-mentioned testing device, wire connection is still required after the LED lamp pins are plugged in. It is troublesome to repeatedly operate and process when testing multiple LED lamps. In addition, the adaptability of the above-mentioned testing device is poor. In the production process of LED lamps, there are still some semi-finished lamps welded on circuit boards. The above-mentioned testing device cannot be well adapted for testing. Therefore, further improvement is needed, and thus the technical solution of the present invention is proposed. Summary of the invention

[0005] In order to overcome the technical defects of the prior art, the present invention provides an LED lamp aging test device, which can adapt the power supply to LED lamps of different specifications and sizes, including semi-finished LED lamps and LED lamps with pins that are not integrated on circuit boards for aging testing, and it is convenient to fix the position of the LED lamp being tested.

[0006] The technical solution adopted by the present invention is: it includes a test box body, a cover body is slidably connected to the test box body, the cover body and the test box body together constitute an independent environment, a test platform is installed in the test box body through a support part, a heating device can be arranged at the bottom of the test platform to quickly increase the temperature in the test box body, and increasing the ambient temperature can accelerate the aging of the LED lamp. At the same time, when supplying electricity, the size of the supply current can be increased according to demand, thereby accelerating the aging of the LED lamp by increasing the load condition of the LED lamp. At the same time, it is necessary to set up necessary control modules to realize various variables and control the power on and off of the LED lamp. During the test, a vibrator can be arranged on the support part to slightly shake the LED lamp at a certain time, so as to better simulate the natural aging of the conventional LED lamp. The test platform is provided with a regular arrangement of A series of air holes will generate heat during the power-on operation of the LED lamp, and the air holes can facilitate the dissipation of heat. A sliding groove is provided at the bottom of the test platform, and two power supply components are slidably clamped in the sliding groove. The power supply components are used to power the LED lamp. When in use, the contact electrode part directly contacts the electrical connection point of the LED lamp for power supply. A pressing mechanism for limiting the position of the tested lamp is fixed on the top of the cover body. When in use, the LED lamp is simply placed on the test platform after adjusting its position. The pressing mechanism is used to fix the position of the LED lamp. The power supply component includes a slider slidably clamped in the sliding groove, a clamping seat is fixed at the bottom of the slider, an extension arm is rotatably clamped on the clamping seat, one end of the extension arm is provided with a contact electrode part, and a power connector is provided on one side of the test box body through a wire.

[0007] Preferably, in order to better obtain the temperature data inside the test box body, the bottom of the test platform and the top of the cover body are provided with external temperature detectors, the supporting part includes a rubber seat fixed to the bottom of the test platform, a support rod is fixedly connected between the bottom of the rubber seat and the bottom of the test box body, and the rubber seat can isolate the current and reduce the influence range of vibration.

[0008] Preferably, in order to facilitate the adjustment of the position of one end of the extension arm and better adjust the position of the contact electrode part according to needs, so that the contact electrode part can better correspond to the bottom of the electrical connection part of the LED lamp, the extension arm includes a rotating part and an elastic part connected to the rotating part, the rotating part is rotatably mounted on the clamping seat, and one end extends horizontally toward the outside of the test platform, and the elastic part is made of elastic material, and the part close to the rotating part is bent and extended upward, the upper surface of the elastic part is in contact with the bottom of the test platform, and the elastic part can push up the test platform by relying on its own elasticity when stationary, thereby fixing itself.

[0009] Preferably, in order to facilitate the contact between the electrode block and the electrically connecting part of the LED lamp at all times, the contact electrode part includes an outer tube fixed on the elastic part, a buffer spring is fixed on the elastic part, the buffer spring is located inside the outer tube, an electrode rod is slidably clamped inside the outer tube, a bottom block for fitting with the outer inner wall is fixed at the bottom of the electrode rod, and an electrode block extending to the top of the outer tube is fixed at the top of the electrode rod.

[0010] Preferably, in order to improve the stability of the electrical connection and the operating stability of the electrode rod, the top of the electrode block is provided with grooves arranged parallel to each other, the bottom block and the outer tube are both made of insulating materials, and a limiting ring block for limiting the position of the electrode rod is also fixed on the inner wall of the outer tube, and the external charged electrode needs to be electrically connected to the electrode rod through a wire.

[0011] Preferably, in order to facilitate aging testing of LED lamps with pins, and to facilitate fixing and powering of LED lamps with pins, it also includes a pin fixing assembly installed in the test platform, a column cavity extending inwardly is opened on the side wall of the test platform, and the pin fixing assembly includes a fitting column rotatably clamped in the column cavity, a rotating rod is fixed between the fitting columns, an inner ring body that can follow the rotation is arranged on the outer sleeve of the rotating rod, a winding spring is connected to the outer wall of the inner ring body, an eccentric ring shell is connected at the outer end of the winding spring, a part of the eccentric ring shell gradually approaches the inner wall of the column cavity, and a plug-in hole is vertically opened on the test platform, the bottom end of the plug-in hole extends into the column cavity and is located on one side of the eccentric ring shell, the outer end of the winding spring extends in an opposite direction to the rotation direction of the rotating rod, and when the rotating rod is not subjected to force, the protruding part of the eccentric ring shell is located on the other side of the plug-in hole.

[0012] Preferably, in order to facilitate manual operation to fix the LED lamp, one end of the fitting column extends outside the test platform, the length of the column cavity is greater than the overall length of the pin fixing assembly, a relay rod is fixed to one end of the fitting column, the relay rod is threadedly connected to the test platform via a thread on the outer wall, an operating handle is fixed to one end of the relay rod, and the eccentric ring shell needs to be connected to a suitable external power source.

[0013] Preferably, in order to facilitate the fixing of the LED lamp, a transparent observation window is provided on one side of the cover body, and the pressing mechanism includes a pressing telescopic rod fixed on the top of the cover body, the bottom end of the pressing telescopic rod extends to the bottom of the cover body, and a frame plate is fixed to the bottom of the frame plate, and a downward extending range block is fixed to the bottom of the frame plate, and a buffer part is connected between the range blocks. In the semi-finished product of the LED lamp, the LED lamp beads are simply welded on the circuit board and are provided with an externally exposed electrical connection part.

[0014] Preferably, in order to avoid damaging the LED lamp, elastic blocks are fixed to the bottom of the buffer part and the range block, a receiving groove is provided at the bottom of the frame plate, a receiving spring is fixed to the top of the receiving groove, a floating cover is fixed to the bottom of the receiving spring, an internal temperature detector is fixed to the bottom of the floating cover, a through hole is provided at the bottom of the buffer part corresponding to the internal temperature detector, and when fixing the LED lamp, the internal temperature detector is used to directly detect the working temperature of the LED lamp.

[0015] Preferably, in order to facilitate the control of the ambient temperature inside the test box body, an air flow fan is fixed on the side wall of the test box body, an exhaust strip hole is opened on the inner wall of the test box body on the opposite side of the air flow fan, a baffle is provided outside the exhaust strip hole, and the top of the baffle is hinged on the outer wall of the test box body.

[0016] The beneficial effects of the present invention are as follows: the test device has strong applicability and can adapt power supply to LED lamps of different specifications and sizes. When the position of the contact electrode part on the extension arm needs to be adjusted, the elastic part is pressed down to make the elastic part disengage from the contact test platform. At this time, the extension arm can be rotated, and the slider at one end of the extension arm can be operated to slide at the bottom of the test platform. After the adjustment is completed, the elastic part can contact the test platform again, and the electrode block can keep in contact with the electrical connection part of the LED lamp at all times under the push of the buffer spring. The LED lamp being tested can be better fixed in cooperation with the downward pressing mechanism, and the deformation of the buffer part makes the floating cover The internal temperature detector is close to the LED lamp to be tested for aging, so it is convenient to detect the working temperature of the LED lamp. The pin fixing component in the test platform can perform fixed test on the pin-type LED lamp inserted into the plug hole. When in use, the LED lamp with pins is directly inserted into the plug hole. At this time, the operating handle is used to rotate the rotating rod. At this time, the inner ring body is rotated first, and the eccentric ring shell can be indirectly rotated under the elastic support of the winding spring, so that the eccentric ring shell squeezes the pin of the LED lamp, thereby fixing the position of the LED lamp. In the aging test, the test environment can be changed according to needs to speed up the test. BRIEF DESCRIPTION OF THE DRAWINGS

[0017] Figure 1 It is a schematic diagram of the three-dimensional structure of the present invention.

[0018] Figure 2 This is a schematic diagram of the cover body of the present invention when it is opened.

[0019] Figure 3 It is a schematic diagram of the structure of the test platform of the present invention.

[0020] Figure 4 It is a schematic diagram of the bottom structure of the test platform of the present invention.

[0021] Figure 5 This is a schematic diagram of the structure of the power supply component of the present invention.

[0022] Figure 6 for Figure 5 Schematic diagram of the enlarged structure at point A in the middle.

[0023] Figure 7 It is a schematic diagram of the structure of the pin fixing assembly of the present invention.

[0024] Figure 8 It is a schematic diagram of the rotating rod structure of the present invention.

[0025] Fig. 9 It is a schematic diagram of the cross-sectional structure of the test platform of the present invention.

[0026] Fig.10 for Fig. 9 Schematic diagram of the enlarged structure at point B in the middle.

[0027] Fig.11 It is a schematic diagram of the bottom structure of the cover body of the present invention.

[0028] Fig.12 It is a schematic diagram of the structure of the pressing mechanism of the present invention.

[0029] Explanation of reference numerals: In the figure: 1, test box body; 101, air flow fan; 102, baffle; 2, cover body; 3, test platform; 301, air vent; 302, slide groove; 4, power supply component; 41, slider; 42, clamping seat; 43, extension arm; 431, rotating part; 432, elastic part; 44, contact electrode part; 441, outer tube; 442, buffer spring; 443, electrode rod; 444, electrode block; 5, Pressing mechanism; 501, pressing telescopic rod; 502, shelf; 503, range block; 504, buffer; 505, elastic block; 506, accommodating spring; 507, floating cover; 508, internal temperature detector; 6, pin fixing assembly; 601, fitting column; 602, rotating rod; 603, inner ring body; 604, winding spring; 605, eccentric ring shell; 606, relay rod; 607, operating handle; 7, plug-in hole. DETAILED DESCRIPTION

[0030] The present invention will be further described below in conjunction with the accompanying drawings: like Figure 1-Figure 12As shown, the present embodiment provides an LED lamp aging test device, including a test box body 1, a cover body 2 is slidably connected to the test box body 1, the cover body 2 and the test box body 1 together constitute an independent environment, a test platform 3 is installed in the test box body 1 through a support portion, a heating device can be arranged at the bottom of the test platform 3 to quickly increase the temperature in the test box body 1, and increasing the ambient temperature can accelerate the aging of the LED lamp. At the same time, when power is supplied, the magnitude of the supply current can be increased according to demand, thereby accelerating the aging of the LED lamp by increasing the load condition of the LED lamp. At the same time, it is necessary to set necessary control modules to realize various variables and control the power on and off of the LED lamp, and a vibrator can be arranged on the support portion to determine the temperature during the test. The LED lamp is slightly shaken from time to time, so as to better simulate the natural aging of conventional LED lamps. Regularly arranged air holes 301 are provided on the test platform 3. Heat is generated during the power-on operation of the LED lamp. The air holes 301 can facilitate the dissipation of heat. A sliding groove 302 is provided at the bottom of the test platform 3. Two power supply components 4 are slidably connected in the sliding groove 302. The power supply component 4 is used to supply power to the LED lamp. When in use, the contact electrode part 44 directly contacts the electrical connection point of the LED lamp for power supply. A pressing mechanism 5 for limiting the position of the tested lamp is fixed on the top of the cover body 2. When in use, the LED lamp is simply placed on the test platform 3 after adjusting its position. The pressing mechanism 5 is used to fix the LED lamp. The power supply component 4 includes a slider 41 which is slidably engaged in the slide groove 302, a mounting seat 42 is fixed at the bottom of the slider 41, an extension arm 43 is rotatably engaged on the mounting seat 42, and a contact electrode portion 44 is provided at one end of the extension arm 43, a power connector is provided on one side of the test box body 1 through a wire, an external temperature detector is provided at the bottom of the test platform 3 and the top of the cover body 2, the support portion includes a rubber seat fixed at the bottom of the test platform 3, a support rod is fixedly connected between the bottom of the rubber seat and the bottom of the test box body 1, the rubber seat can isolate the current and reduce the influence range of vibration, so that the temperature data in the test box body 1 can be better obtained, an airflow fan 101 is fixed on the side wall of the test box body 1, and a temperature sensor is provided on the opposite side of the airflow fan 101. An exhaust strip hole is opened on the inner wall of the box body 1, and a baffle 102 is arranged outside the exhaust strip hole. The top of the baffle 102 is hinged on the outer wall of the test box body 1, so that the ambient temperature in the test box body 1 can be easily controlled. When in use, the present device can control the ambient temperature in the test box body 1 according to the requirements of the aging test. The external temperature detector mainly detects the temperature in the test box body 1. At this time, when cooling is required, the airflow fan 101 can be started to work, and the airflow in the external environment is introduced into the test shell, so as to cool the LED lamp. The airflow can push the baffle 102 on one side of the exhaust strip hole. When it is necessary to maintain a high temperature environment, the airflow fan 101 and the baffle 102 are only in a stationary state, and the airflow is relatively difficult to circulate, thereby playing a role in heat preservation.

[0031] The extension arm 43 includes a rotating portion 431 and an elastic portion 432 connected to the rotating portion 431. The rotating portion 431 is rotatably mounted on the clamping seat 42, and one end thereof extends horizontally to the outside of the test platform 3. The elastic portion 432 is made of an elastic material, and the portion close to the rotating portion 431 bends and extends upward. The upper surface of the elastic portion 432 contacts the bottom of the test platform 3. When stationary, the elastic portion 432 can push up the test platform 3 by relying on its own elasticity, thereby fixing itself, so that the extension arm 43 can be easily adjusted. The position of one end of the contact electrode portion 44 can be adjusted according to the needs, so that the contact electrode portion 44 can better correspond to the lower part of the electrical connection part of the LED lamp. The contact electrode portion 44 includes an outer tube 441 fixed on the elastic portion 432, and a buffer spring 442 is fixed on the elastic portion 432. The buffer spring 442 is located inside the outer tube 441. An electrode rod 443 is slidably connected in the outer tube 441. A bottom block for fitting with the outer inner wall is fixed at the bottom of the electrode rod 443. An electrode block 444 extending to the top of the outer tube 441 is fixed on the top, so that the electrode block 444 and the electrical connection part of the LED lamp can be contacted at all times. The top of the electrode block 444 is provided with grooves arranged parallel to each other. The bottom block and the outer tube 441 are both made of insulating materials. A limiting ring block for limiting the position of the electrode rod 443 is also fixed on the inner wall of the outer tube 441. The external charged electrode needs to be electrically connected to the electrode rod 443 through a wire, which can improve the stability of the electrical connection and the operation stability of the electrode rod 443. When in use, when it is necessary to adjust the position of the contact electrode part 44 on the extension arm 43, press down the elastic part 432 to make the elastic part 432 disengage from the contact test platform 3. At this time, the extension arm 43 can be rotated, and the slider 41 at one end of the extension arm 43 can be operated to slide at the bottom of the test platform 3. After the adjustment is completed, the elastic part 432 can contact the test platform 3 again, and the electrode block 444 can keep in contact with the electrical connection part of the LED lamp at all times under the push of the buffer spring 442.

[0032] The test platform 3 further comprises a pin fixing assembly 6 installed in the test platform 3, a column cavity extending inward is provided on the side wall of the test platform 3, the pin fixing assembly 6 comprises a fitting column 601 rotatably clamped in the column cavity, a rotating rod 602 is fixed between the fitting column 601, an inner ring body 603 capable of following the rotation is provided on the outer sleeve of the rotating rod 602, a winding spring 604 is connected to the outer wall of the inner ring body 603, an eccentric ring shell 605 is connected to the outer end of the winding spring 604, a part of the eccentric ring shell 605 gradually approaches the inner wall of the column cavity, a plug hole 7 is vertically provided on the test platform 3, the bottom end of the plug hole 7 extends into the column cavity and is located on one side of the eccentric ring shell 605, the outer end of the winding spring 604 extends in the opposite direction to the rotation direction of the rotating rod 602, and when the rotating rod 602 is not subjected to force, the protruding part of the eccentric ring shell 605 is located on the other side of the plug hole 7, so that it is convenient to carry out the pin fixing assembly 6 in the test platform 3. The aging test of the LED lamp with pins is carried out, and it is convenient to fix and power the LED lamp with pins. One end of the fitting column 601 extends outside the test platform 3. The length of the column cavity is greater than the overall length of the pin fixing component 6. A relay rod 606 is fixed to one end of the fitting column 601. The relay rod 606 is threadedly connected to the test platform 3 through the thread on the outer wall. An operating handle 607 is fixed to one end of the relay rod 606. The eccentric ring shell 605 needs to be connected to a suitable external power source, so that it is convenient to manually operate and fix the LED lamp. When in use, the LED lamp with pins is directly inserted into the socket hole 7. At this time, the operating handle 607 is used to rotate the rotating rod 602. At this time, the inner ring body 603 is rotated first, and the eccentric ring shell 605 can be indirectly rotated under the elastic support of the winding spring 604, so that the eccentric ring shell 605 squeezes the pin of the LED lamp, thereby fixing the position of the LED lamp.

[0033] A transparent observation window is provided on one side of the cover body 2. The pressing mechanism 5 includes a pressing telescopic rod 501 fixed on the top of the cover body 2. The bottom end of the pressing telescopic rod 501 extends to the bottom of the cover body 2. A frame plate 502 is fixed to the bottom of the frame plate 502. A range block 503 extending downward is fixed to the bottom of the frame plate 502. A buffer portion 504 is connected between the range blocks 503, so that it is convenient to fix the LED lamp. In the semi-finished product of the LED lamp, the LED lamp beads are simply welded on the circuit board and are provided with an externally exposed electrical connection portion. The buffer portion 504 and the bottom of the range block 503 are both fixed with an elastic block 505. The bottom of the frame plate 502 is provided with a receiving groove. The top of the receiving groove is fixed with a receiving spring 506. The receiving spring 506 A floating cover 507 is fixed at the bottom, and an internal temperature detector 508 is fixed at the bottom of the floating cover 507. A through hole is provided at the bottom of the buffer portion 504 corresponding to the internal temperature detector 508. When fixing the LED lamp, the internal temperature detector 508 is used to directly detect the working temperature of the LED lamp, which can avoid damaging the LED lamp. After placing the LED lamp, the telescopic rod 501 is pressed down to drive the frame plate 502 to descend, so that the buffer portion 504 and the range block 503 are close to the LED lamp, and then the elastic block 505 presses and fixes the LED lamp. During the continuous descent, the buffer portion 504 is deformed to make the internal temperature detector 508 on the floating cover 507 close to the LED lamp to be tested for aging, thereby facilitating the detection of the working temperature of the LED lamp.

[0034] In the aging test, the test environment can be changed according to the needs to speed up the test. The device can control the ambient temperature in the test box body 1 according to the needs of the aging test. The external temperature detector mainly detects the temperature in the test box body 1. At this time, when cooling is required, the airflow fan 101 can start working to introduce the airflow in the external environment into the test shell, thereby cooling the LED lamp. The airflow can push the baffle 102 on one side of the exhaust strip hole. When it is necessary to maintain a high temperature environment, the airflow fan 101 and the baffle 102 are only in a static state, and the airflow is relatively difficult to circulate, thereby playing a role in heat preservation. The applicability of this test device is strong, and it can adapt power supply to LED lamps of different specifications and sizes. When the position of the contact electrode part 44 on the extension arm 43 needs to be adjusted, the elastic part 432 is pressed down to make the elastic part 432 disengage from the contact test platform 3. At this time, the extension arm 43 can be rotated, and the slider 41 at one end of the extension arm 43 can be operated to slide at the bottom of the test platform 3. After the adjustment is completed, the elastic part 432 can be re-adjusted to the test platform The test platform 3 is in contact with the electrode block 444, and the electrode block 444 can keep in contact with the electrical connection part of the LED lamp at all times under the push of the buffer spring 442. The LED lamp being tested can be better fixed by cooperating with the pressing mechanism 5. The telescopic rod is pressed to drive the frame plate 502 to descend, so that the buffer part 504 and the range block 503 are close to the LED lamp, and then the elastic block 505 presses and fixes the LED lamp. During the continuous descent, the buffer part 504 is deformed to make the internal temperature detector 508 on the floating cover 507 close to the LED lamp being tested for aging, thereby facilitating the detection of the working temperature of the LED lamp. Moreover, the pin fixing component 6 in the test platform 3 can perform a fixed test on the pin-type LED lamp inserted into the plug hole 7. When in use, the LED lamp with pins is directly inserted into the plug hole 7. At this time, the operating handle 607 is used to rotate the rotating rod 602. At this time, the inner ring body 603 is rotated first, and the eccentric ring shell 605 can be indirectly rotated under the elastic support of the winding spring 604, so that the eccentric ring shell 605 squeezes the pin of the LED lamp, thereby fixing the position of the LED lamp.

[0035] The above shows and describes the basic principles, main features and advantages of the present invention. Those skilled in the art should understand that the present invention is not limited to the above embodiments. The above embodiments and descriptions are only for illustrating the principles of the present invention. Without departing from the spirit and scope of the present invention, the present invention may have various changes and improvements, which shall fall within the scope of the present invention to be protected. The scope of protection of the present invention shall be defined by the attached claims and their equivalents.

Claims

1. An LED lamp aging test device, comprising a test box body (1), a cover body (2) slidably engaged with the test box body (1), characterized in that: A test platform (3) is installed in the test box body (1) via a support portion, the test platform (3) is provided with regularly arranged air holes (301), a sliding groove (302) is provided at the bottom of the test platform (3), two power supply components (4) are slidably engaged in the sliding groove (302), a downward pressing mechanism (5) for limiting the position of the tested lamp is fixed on the top of the cover body (2), the power supply component (4) comprises a slider (41) slidably engaged in the sliding groove (302), a clamping seat (42) is fixed at the bottom of the slider (41), an extension arm (43) is rotatably engaged in the clamping seat (42), one end of the extension arm (43) is provided with a contact electrode portion (44), and a power supply connector is provided on one side of the test box body (1) via a wire.

2. The LED lamp aging test device according to claim 1, characterized in that: The bottom of the test platform (3) and the top of the cover (2) are both provided with external temperature detectors, the support portion comprises a rubber seat fixed to the bottom of the test platform (3), and a support rod is fixedly connected between the bottom of the rubber seat and the bottom of the test box body (1).

3. The LED lamp aging test device according to claim 1, characterized in that: The extension arm (43) comprises a rotating portion (431) and an elastic portion (432) connected to the rotating portion (431); the rotating portion (431) is rotatably mounted on the clamping seat (42), and one end of the rotating portion extends horizontally toward the outside of the test platform (3); the elastic portion (432) is made of elastic material, and a portion close to the rotating portion (431) bends and extends upward, and an upper surface of the elastic portion (432) contacts the bottom of the test platform (3).

4. The LED lamp aging test device according to claim 3, characterized in that: The contact electrode portion (44) comprises an outer tube (441) fixed on the elastic portion (432), a buffer spring (442) fixed on the elastic portion (432), the buffer spring (442) being located inside the outer tube (441), an electrode rod (443) being slidably engaged inside the outer tube (441), a bottom block for fitting with the outer inner wall being fixed at the bottom of the electrode rod (443), and an electrode block (444) extending to the top of the outer tube (441) being fixed at the top of the electrode rod (443).

5. The LED lamp aging test device according to claim 4, characterized in that: The top of the electrode block (444) is provided with grooves arranged in parallel with each other, the bottom block and the outer tube (441) are both made of insulating materials, and a limiting ring block for limiting the position of the electrode rod (443) is also fixed on the inner wall of the outer tube (441).

6. The LED lamp aging test device according to claim 1, characterized in that: It also includes a pin fixing assembly (6) installed in the test platform (3), wherein a column cavity extending inward is opened on the side wall of the test platform (3), and the pin fixing assembly (6) includes a fitting column (601) rotatably clamped in the column cavity, a rotating rod (602) is fixed between the fitting columns (601), and the rotating rod (602) is provided with an inner ring body (603) capable of following rotation, and a winding spring (604) is connected to the outer wall of the inner ring body (603), and an eccentric ring shell (605) is connected to the outer end of the winding spring (604), and a part of the eccentric ring shell (605) gradually approaches the inner wall of the column cavity. A plug hole (7) is vertically opened on the test platform (3), and the bottom end of the plug hole (7) extends into the column cavity and is located on one side of the eccentric ring shell (605).

7. The LED lamp aging test device according to claim 6, characterized in that: One end of the fitting column (601) extends outside the test platform (3); the length of the column cavity is greater than the overall length of the pin fixing assembly (6); a relay rod (606) is fixed to one end of the fitting column (601); the relay rod (606) is threadedly connected to the test platform (3) via threads on the outer wall; and an operating handle (607) is fixed to one end of the relay rod (606).

8. The LED lamp aging test device according to claim 1, characterized in that: A transparent observation window is provided on one side of the cover body (2), and the pressing mechanism (5) comprises a pressing telescopic rod (501) fixed to the top of the cover body (2), the bottom end of the pressing telescopic rod (501) extends to the bottom of the cover body (2), a frame plate (502) is fixed to the bottom end of the pressing telescopic rod (501), a downwardly extending range block (503) is fixed to the bottom of the frame plate (502), and a buffer portion (504) is connected between the range blocks (503).

9. The LED lamp aging test device according to claim 8, characterized in that: The bottom of the buffer portion (504) and the range block (503) are both fixed with elastic blocks (505), the bottom of the frame plate (502) is provided with a receiving groove, the top of the receiving groove is fixed with a receiving spring (506), the bottom of the receiving spring (506) is fixed with a floating cover (507), the bottom of the floating cover (507) is fixed with an internal temperature detector (508), and the bottom of the buffer portion (504) is provided with a through hole corresponding to the internal temperature detector (508).

10. The LED lamp aging test device according to claim 9, characterized in that: An air flow fan (101) is fixed on the side wall of the test box body (1), an exhaust strip hole is opened on the inner wall of the test box body (1) on the opposite side of the air flow fan (101), a baffle (102) is arranged outside the exhaust strip hole, and the top of the baffle (102) is hinged on the outer wall of the test box body (1).

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