Durability test fixture and method for direct-current converter

Abstract

The invention discloses a DC converter durability test fixture and method, and the method achieves the cable-free connection of a to-be-tested product and an external power supply through directly integrating a wiring layer on the front surface of a cover body and electrically connecting the wiring layer with a copper bar, simplifies the complexity of electrical connection in the durability test of a DC converter, and improves the durability of the DC converter. The problems of poor contact, abrasion and short circuit possibly caused by a traditional cable are avoided, and the stability and reliability of connection are improved. And the wiring layer is directly integrated on the front surface of the cover body and is electrically connected with the copper bar, so that cable-free connection between the to-be-tested product and the external power supply is realized. By means of the design, electrical connection in the testing process is effectively simplified, the fault risk caused by poor contact or abrasion in a traditional cable connection mode is eliminated, and particularly the situation that a cable sheath is damaged in a high-temperature testing environment is avoided. The cable-free connection not only improves the stability and reliability of the connection, but also significantly reduces the test building time, and improves the overall test efficiency.

Description

Technical Field

[0001] The present invention relates to the technical field of electrical testing equipment, and in particular to a DC converter durability testing fixture and method. Background Art

[0002] In the prior art, electrical test devices generally rely on traditional cable connection methods to connect the product under test to an external power supply. However, this method has many problems in practical applications:

[0003] 1. Traditional cable connections are easily affected by the external environment, especially in high-temperature test environments. The cable sheath contacts the high-temperature outer casing of the test sample, which can easily cause damage to the cable sheath, leading to short circuits and other safety hazards.

[0004] 2. To circumvent this problem, the industry usually avoids direct contact between the cable and the high-temperature casing by adding a thermal insulation layer to the cable or taking additional protective measures during the test process.

[0005] However, these measures not only increase the complexity of design and operation, but also cannot completely eliminate the risk of poor contact or cable wear, which affects test stability and reliability.

[0006] In addition, in order to ensure that the test sample can be effectively tested in the test housing, a fixed structure and a complex wiring design are usually adopted, which to some extent limits the flexibility and space utilization efficiency of the test device.

[0007] In order to solve the above problems, the industry has also tried to increase the adaptability of the equipment through modular design and adjustment of the test card placement platform. However, this improvement method still faces challenges such as complex wiring and difficult maintenance, and cannot fundamentally improve the test efficiency and reliability of the device.

[0008] Therefore, how to simplify the electrical connection in a high temperature environment and improve the reliability of the test device has become a technical problem to be solved by the present invention. Summary of the invention

[0009] The technical problem solved by the present invention is to provide a DC converter durability test fixture and method in view of the defects existing in the above-mentioned prior art, so as to solve the problems of cable connection complexity and insufficient test stability proposed in the above-mentioned background technology.

[0010] In order to solve the above technical problems, the technical solution adopted by the present invention is as follows:

[0011] A DC converter durability test fixture comprises a test housing and a test card placement platform arranged inside the test housing, wherein the test card placement platform is formed by a combination of a plurality of columns and has at least two test card placement positions, a cover body is arranged on one side of the outside of the test housing, the cover body comprises a front side and a back side, a copper busbar is fixed on the back side of the cover body, the copper busbar corresponds to an electrical connection position of a product to be tested in a test card placement position, and a wiring layer electrically connected to the copper busbar is arranged on the front side of the cover body;

[0012] The electrical connection position of the product to be tested includes a conductive structure matched with the copper busbar, and the conductive structure is electrically connected to an external power source through a wiring layer on the cover;

[0013] A clamping hole matched with the column is arranged on the product to be tested, and the product to be tested is clamped on the test clamping platform through the clamping hole.

[0014] As a further solution of the present invention, the test shell is an aluminum alloy test shell.

[0015] As a further solution of the present invention, the column is a stainless steel column.

[0016] As a further solution of the present invention, the column and the test housing are fixedly connected by a snap connection.

[0017] The DC converter durability test fixture also includes a protective cover, which is fixedly connected to the front side of the cover body, and a wiring cavity is formed between the protective cover and the cover body, and the wiring layer is located in the wiring cavity.

[0018] As a further solution of the present invention, the test housing includes a housing cavity, and the test card placement platform is located in the housing cavity.

[0019] A method for endurance testing of a DC converter, the method comprising the following steps:

[0020] Step 1, providing a test fixture with a modular design, the test fixture comprising a test housing, a detachable cover, a plurality of test card placement platforms, and at least two or more test card placement positions;

[0021] Step 2, placing the DC converter to be tested on the test card placement position, wherein the electrical connection position of the DC converter to be tested includes a conductive structure that matches the copper busbar on the cover;

[0022] Step 3, by installing the cover body on the test housing, the conductive structure is electrically connected to the copper busbar, and the DC converter is electrically connected to the external power supply through the wiring layer on the cover body, thereby achieving stable electrical connection of the DC converter to be tested without using a cable;

[0023] Step 4: According to the internal space of the test housing and the position of the air outlet, the position of the modularly designed test card placement platform is adjusted so that multiple DC converters to be tested can be stacked and placed in the area near the air outlet in the test housing, and each DC converter is ensured to be connected to the power supply through a fixed power interface;

[0024] Step 5, performing durability test on the DC converter under different environmental conditions, wherein the environmental conditions include but are not limited to normal temperature, low temperature and high temperature conditions.

[0025] As a further solution of the present invention, the test housing of the test fixture is made of aluminum alloy material, the test card placement platform is composed of a stainless steel column, and the column and the test housing are fixedly connected by a snap connection.

[0026] As a further solution of the present invention, after the conductive structure and the copper busbar are connected, the conductive structure and the wiring layer are shielded through a wiring cavity formed between the cover body and the copper busbar to reduce electromagnetic interference and improve test accuracy.

[0027] Compared with the prior art, the present invention has the following beneficial effects:

[0028] 1. The wiring layer is directly integrated into the front of the cover and electrically connected to the copper busbar, realizing a cable-free connection between the product to be tested and the external power supply. This design effectively simplifies the electrical connection during the test process and eliminates the risk of failure caused by poor contact or wear in traditional cable connections, especially in high-temperature test environments, avoiding damage to the cable sheath. Cable-free connection not only improves the stability and reliability of the connection, but also significantly reduces the test setup time and improves overall test efficiency.

[0029] 2. Since the test fixture of the present invention has a completely cable-free design inside, during the test process, no current from the cable will flow in the test cavity, thereby greatly reducing electromagnetic interference in the test environment. This design avoids the signal interference caused by cables in traditional tests, making the test data more stable and accurate, and is particularly suitable for high-precision testing occasions. At the same time, under high-temperature test conditions, the temperature of the test shell of the product to be tested is relatively high. Since there is no cable inside the fixture, the problem of damage caused by the contact between the cable and the high-temperature test shell is completely eliminated. This cable-free design effectively avoids failures and safety hazards caused by cable damage, ensures the continuity and safety of the test, and is a major improvement over the prior art.

[0030] 3. In a high-temperature test environment, the temperature of the test housing of the product to be tested often rises significantly. However, due to the internal cable-free design, the present invention completely avoids the risk of damage caused by the contact between the cable and the high-temperature test housing. This design effectively prevents short circuits, safety hazards and test interruptions caused by melting or damage to the cable sheath, significantly improves the reliability and safety of the test device, and ensures that the test can be carried out continuously and stably under high temperature conditions.

[0031] Additional aspects and advantages of the present invention will be given in part in the following description and in part will be obvious from the following description, or will be learned through practice of the present invention. BRIEF DESCRIPTION OF THE DRAWINGS

[0032] In order to more clearly illustrate the embodiments of the present invention or the technical solutions in the prior art, the drawings required for use in the embodiments or the description of the prior art will be briefly introduced below. Obviously, the drawings described below are only some embodiments of the present invention. For ordinary technicians in this field, other drawings can be obtained based on these drawings without paying creative labor.

[0033] Figure 1 It is a structural schematic diagram of the present invention.

[0034] Figure 2 for Figure 1 Schematic diagram of the structure from another perspective.

[0035] Figure 3 for Figure 1 Schematic diagram of the structure from another perspective.

[0036] Figure 4 It is a schematic diagram of the structure of the copper busbar of the present invention.

[0037] Figure 5 Schematic diagram of the location structure of the wiring layer.

[0038] Figure 6 It is a schematic diagram of the structure of the test housing and the DC converter of the present invention.

[0039] Figure 7 for Figure 6 Schematic diagram of the structure from another perspective.

[0040] Figure 8 It is a structural schematic diagram of the DC converter of the present invention.

[0041] Fig. 9 It is an enlarged schematic diagram of the column of the present invention.

[0042] The reference numerals and names in the figures are as follows:

[0043] Test housing 1, test card placement platform 2, column 3, cover 4, front 5, back 6, copper bus 7, electrical connection position 8, wiring layer 9, conductive structure 10, test housing internal space 12, air outlet 13, DC converter 14, card hole 15 and shell cavity 16. DETAILED DESCRIPTION

[0044] The technical solutions in the embodiments of the present invention are described clearly and completely below. Obviously, the described embodiments are only part of the embodiments of the present invention, not all of them. Based on the embodiments of the present invention, all other embodiments obtained by ordinary technicians in this field without creative work are within the scope of protection of the present invention.

[0045] See also Figure 1 —9. In an embodiment of the present invention, a DC converter durability test fixture includes a test housing 1 and a test card placement platform 2 arranged inside the test housing 1, wherein the test card placement platform 2 is formed by a combination of multiple columns 3 and has at least two test card placement positions; a cover body 4 is provided on one side of the outside of the test housing 1, and the cover body 4 includes a front side 5 and a back side 6, a copper bus 7 is fixed to the back side 6 of the cover body 4, and the copper bus 7 corresponds to an electrical connection position 8 of a product to be tested in the test card placement position, and a wiring layer 9 electrically connected to the copper bus 7 is provided on the front side 5 of the cover body 4; the electrical connection position 8 of the product to be tested includes a conductive structure 10 matched with the copper bus 7, and the conductive structure 10 is electrically connected to an external power supply through the wiring layer 9 on the cover body 4 for achieving stable electrical connection of the product to be tested without using a cable and reducing the risk of cable failure.

[0046] The test housing 1 is an aluminum alloy test housing. The column 3 is a stainless steel column. The column 3 is fixedly connected to the test housing 1 by a snap connection. The DC converter durability test fixture also includes a protective cover, which is fixedly connected to the front side 5 of the cover body 4, and a wiring cavity is formed between the protective cover and the cover body 4, and the wiring layer 9 is located in the wiring cavity.

[0047] A method for endurance testing of a DC converter, the method comprising the following steps:

[0048] Step 1, providing a test fixture with a modular design, the test fixture comprising a test housing 1, a detachable cover 4, a plurality of test card placement platforms 2 and at least two or more test card placement positions;

[0049] Step 2, placing the DC converter 14 to be tested on the test card placement position, the electrical connection position 8 of the DC converter 14 to be tested includes a conductive structure 10 that matches the copper bus 7 on the cover 4;

[0050] Step 3, by installing the cover body 4 on the test housing 1, the conductive structure 10 is electrically connected to the copper bus 7, and the DC converter 14 is electrically connected to the external power supply through the wiring layer 9 on the cover body 4, so as to achieve a stable electrical connection of the DC converter 14 to be tested without using a cable;

[0051] Step 4: According to the positions of the internal space 12 and the air outlet 13 of the test housing, by adjusting the position of the modularly designed test card placement platform 2, multiple DC converters 14 to be tested can be stacked and placed in the area of ​​the air outlet 13 of the test housing, and ensure that each DC converter 14 is connected to the power supply through a power connection interface at a fixed position;

[0052] Step 5, performing durability test on the DC converter 14 under different environmental conditions, the environmental conditions including but not limited to normal temperature, low temperature and high temperature conditions.

[0053] The test housing 1 of the test fixture is made of aluminum alloy material, the test card placement platform 2 is composed of a stainless steel column, and the column 3 is fixedly connected to the test housing 1 by a snap connection. After the conductive structure 10 and the copper bus 7 are docked, the conductive structure 10 and the wiring layer 9 are shielded through the wiring cavity formed between the cover 4 and the copper bus 7 to reduce electromagnetic interference and improve test accuracy.

[0054] The test shell 1 of the product to be tested is provided with a card hole 15 matching with the column 3. The number of the card holes 15 can be 4 and they are respectively located at the four corners of the test shell 1, so that when multiple columns 3 are card-connected, a stable use effect can be achieved. At this time, the test card placement platform 2 refers to a combination of multiple columns 3 corresponding to the test shell 1 for carding the test shell 1; the product to be tested is carded on the test card placement platform 2 through the card hole; the test shell includes a shell cavity 16, and the test card placement platform 2 is located in the shell cavity 16.

[0055] Embodiment 1:

[0056] In the actual high temperature environment test process, the present invention solves many problems existing in traditional technologies through a set of innovative electrical connections and test devices. The specific application scenario is to test an electronic product that needs to perform electrical performance tests in a high temperature environment. The electronic product needs to be tested in a test housing for a long time at high temperature to verify its electrical performance and stability under extreme conditions.

[0057] In traditional testing solutions, cables are usually used to connect the product to be tested to an external power source. However, due to the high temperature environment inside the test housing, the cable sheath often becomes damaged after contacting the high temperature outer shell of the test sample, which in turn causes short circuits and other safety hazards. To avoid these problems, the industry often uses additional insulation measures or protective devices, but these measures increase the complexity of the test and still cannot completely avoid poor contact and wear problems of cable connections.

[0058] The present invention realizes a cable-free connection by directly integrating the wiring layer 9 into the front face 5 of the cover 4 and electrically connecting it to the copper bus 7, thereby reducing the failures caused by poor contact or wear in the traditional cable connection method. In specific operation, the electronic product to be tested is directly connected to the external power supply through its conductive contacts connected to the copper bus 7, avoiding the problem of cable sheath damage that is inevitable in the traditional cable connection method. The high temperature environment in the test housing no longer poses a threat to the cable, and the safety and reliability of the test are improved.

[0059] At the same time, the products to be tested can be freely stacked and placed in the air outlet 13 area in the test shell. The modular design of the fixture and the fixed-position power interface allow the wiring harness to be neatly led out from a fixed position, avoiding contact between the cable and other sample shells. Through this arrangement, the risk of damage to the cable by the high-temperature shell is further avoided, eliminating the hidden danger of short circuit. In addition, this design also improves the utilization rate of the test shell space, and multiple samples can be tested simultaneously in a limited space, greatly improving the test efficiency.

[0060] Embodiment 2:

[0061] In Example 2 of the present invention, the durability test of the DC converter is carried out in a high temperature environment, and a cable-free electrical access method is achieved by directly integrating the wiring layer on the front of the fixture cover and electrically connecting it to the copper busbar. This design greatly simplifies the electrical connection during the test and avoids the risk of failure caused by poor contact, wear and tear of the traditional cable connection and damage to the cable sheath in a high temperature environment.

[0062] For example, in a certain actual test application, multiple DC converters need to undergo long-term durability testing in an environment where the temperature reaches above 80°C. The traditional method relies on cable connection, which not only requires frequent inspection and maintenance of the cable connection status, but also causes the cable sheath to soften and break due to high temperature, often resulting in short circuits and test interruptions, which not only reduces the safety and reliability of the test, but also significantly increases the test cost and time. These problems have been thoroughly solved through the cable-free design of the present invention. The direct contact between the conductive structure and the copper busbar not only ensures a stable electrical connection, but also avoids contact between the cable and the high-temperature surface, greatly improving the safety of the test and ensuring the stability of the test process.

[0063] In addition, since there are no cables inside the fixture, there is no cable current flowing in the test cavity, which significantly reduces the source of electromagnetic interference. In high-precision tests, such as testing the voltage fluctuations and current characteristics of the converter under different loads, the electromagnetic interference of the cable often has an adverse effect on the accuracy of the test data. The cable-free design of the present invention ensures the "electromagnetic cleanliness" of the test environment, making the test data more stable and accurate. In a high-precision electrical performance test, compared with the traditional cable connection method, the present invention reduced the data deviation rate by about 30%, significantly improved the credibility of the test results, and provided more reliable data support for subsequent analysis.

[0064] In addition, the problem of cable sheath melting caused by contact between traditional cables and the high-temperature shell of the product to be tested in extremely high temperature environments is also completely avoided in the present invention. In a simulated high-temperature environment test, the traditional cable connection method caused the cable sheath to soften and deform significantly when the surface temperature of the test shell exceeded 120°C, seriously affecting the test safety and equipment life; the cable-free design of the present invention completely avoids this risk, allowing the test device to work continuously for more than 1,000 hours in a high-temperature environment without any failure or interruption caused by cable damage, significantly improving the reliability and service life of the equipment.

[0065] It can be seen from the above demonstration that the present invention not only optimizes the design of the test equipment and improves the test efficiency, but also greatly improves the test safety and data accuracy, especially achieving better durability test results under high temperature and extreme environments.

[0066] In the present invention, unless otherwise clearly stipulated and limited, the terms such as "installation", "setting", "connection", "fixation" and "screw-on" should be understood in a broad sense. For example, it can be a fixed connection, a detachable connection, or an integral one; it can be a mechanical connection or an electrical connection; it can be a direct connection or an indirect connection through an intermediate medium; it can be the internal connection of two elements or the interaction relationship between two elements. Unless otherwise clearly defined, ordinary technicians in this field can understand the specific meanings of the above terms in the present invention according to the specific circumstances.

[0067] It will be apparent to those skilled in the art that the present invention is not limited to the details of the exemplary embodiments described above and that the present invention can be implemented in other specific forms without departing from the spirit or essential features of the present invention. Therefore, the embodiments should be considered exemplary and non-restrictive in all respects, and the scope of the present invention is defined by the appended claims rather than the above description, and it is intended that all changes falling within the meaning and scope of the equivalent elements of the claims be included in the present invention.

Claims

1. A DC converter durability test fixture, characterized in that: It comprises a test housing and a test card placement platform arranged inside the test housing, wherein the test card placement platform is formed by a combination of a plurality of columns and has at least two or more test card placement positions; A cover body is provided on one side of the exterior of the test housing, the cover body comprising a front side and a back side, a copper busbar is fixed to the back side of the cover body, the copper busbar corresponds to the electrical connection position of the product to be tested in the test card placement position, and a wiring layer electrically connected to the copper busbar is provided on the front side of the cover body; The electrical connection position of the product to be tested includes a conductive structure matched with the copper busbar, and the conductive structure is electrically connected to an external power source through a wiring layer on the cover; A clamping hole matched with the column is arranged on the product to be tested, and the product to be tested is clamped on the test clamping platform through the clamping hole.

2. A DC converter durability test fixture according to claim 1, characterized in that: The test housing is an aluminum alloy test housing.

3. The DC converter durability test fixture according to claim 1, characterized in that: The column is a stainless steel column.

4. The DC converter durability test fixture according to claim 1, characterized in that: The column and the test housing are fixedly connected by means of a snap connection.

5. The DC converter durability test fixture according to claim 1, characterized in that: The DC converter durability test fixture also includes a protective cover, which is fixedly connected to the front side of the cover body, and a wiring cavity is formed between the protective cover and the cover body, and the wiring layer is located in the wiring cavity.

6. The DC converter durability test fixture according to claim 1, characterized in that: The test housing comprises a housing cavity, and the test card placing platform is located in the housing cavity.

7. A method for endurance testing of a DC converter, characterized in that: The method comprises the following steps: Step 1, providing a test fixture with a modular design, the test fixture comprising a test housing, a detachable cover, a plurality of test card placement platforms, and at least two or more test card placement positions; Step 2, placing the DC converter to be tested on the test card placement position, wherein the electrical connection position of the DC converter to be tested includes a conductive structure that matches the copper busbar on the cover; Step 3, by installing the cover body on the test housing, the conductive structure is electrically connected to the copper busbar, and the DC converter is electrically connected to the external power supply through the wiring layer on the cover body, thereby achieving stable electrical connection of the DC converter to be tested without using a cable; Step 4: According to the internal space of the test housing and the position of the air outlet, the position of the modularly designed test card placement platform is adjusted so that multiple DC converters to be tested can be stacked and placed in the area near the air outlet in the test housing, and each DC converter is ensured to be connected to the power supply through a fixed power interface; Step 5, performing durability test on the DC converter under different environmental conditions, wherein the environmental conditions include but are not limited to normal temperature, low temperature and high temperature conditions.

8. A method for endurance testing of a DC converter according to claim 7, characterized in that: The test housing of the test fixture is made of aluminum alloy material, the test card placement platform is composed of a stainless steel column, and the column and the test housing are fixedly connected by a snap connection.

9. A method for endurance testing of a DC converter according to claim 7, characterized in that: After the conductive structure and the copper busbar are butted, the conductive structure and the wiring layer are shielded through the wiring cavity formed between the cover body and the copper busbar to reduce electromagnetic interference and improve test accuracy.

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