Sound box testing method and device

Abstract

The invention discloses a sound box test method and device. The method comprises the following steps: acquiring a first temperature and a corresponding sampling time of a target test point of a target sound box working in a set test environment in a set time period; determining the predicted temperature of the target test point at the target time according to the first temperature and the corresponding sampling time; and carrying out reliability detection on the target loudspeaker box according to the predicted temperature.

Description

Technical Field

[0001] The present invention relates to the field of testing technology, and more specifically, to a speaker testing method and device. Background Art

[0002] Smart speakers combine emerging technologies such as speech recognition and natural language processing with traditional speakers, making them capable of playing audio resources, intelligent voice interaction, and smart home control. Smart speakers are regarded as the control center of smart homes due to their rich product functions, and have become one of the fastest-growing electronic products.

[0003] In the manufacturing industry, reliability testing is an important step in verifying whether smart speakers can operate stably and efficiently in different environments such as high and low temperatures, salt spray, dust and sand. Among them, one of the important signs of the normal operation of smart speakers is that all electronic components operate within a limited temperature range, because electronic components have their normal operating temperature range. Once the limit is exceeded, it will affect the parameter characteristics of the components, and then affect the performance of the smart speaker.

[0004] In the existing reliability test of smart speakers, it is necessary to test the highest temperature / temperature range of the test point of the speaker under the test environment and after it has been working at full power for a period of time. This detection method requires waiting until the components are fully working and heating up, and the temperature continues to rise until it reaches a steady-state value before collecting temperature data. This makes the waiting time for each test very long, seriously affecting the detection efficiency. Summary of the invention

[0005] An object of an embodiment of the present invention is to provide a speaker testing method and device.

[0006] According to a first aspect of the present disclosure, a speaker testing method is provided, comprising:

[0007] Obtaining a first temperature and a corresponding sampling time of a target test point of a target speaker operating under a set test environment within a set period of time;

[0008] Determining a predicted temperature of the target test point at a target time according to the first temperature and the corresponding sampling time;

[0009] The reliability of the target speaker is detected according to the predicted temperature.

[0010] Optionally, determining the predicted temperature of the target test point at a target time according to the first temperature and the corresponding sampling time includes:

[0011] Obtaining, according to the first temperature and the corresponding sampling time, a first mapping function between the time when the target speaker works under the set test environment and the temperature of the target test point;

[0012] The predicted temperature of the target speaker at the target time is determined according to the first mapping function.

[0013] Optionally, obtaining, according to the first temperature and the corresponding sampling time, a first mapping function between the time at which the target speaker operates at full power under the set test environment and the temperature of the target test point includes:

[0014] Taking the undetermined parameter of the first mapping function as a variable, determining a predicted temperature expression for each sampling time;

[0015] Constructing a loss function based on the predicted temperature expression and the first temperature at each sampling time;

[0016] Solve the loss function, determine the value of the undetermined function, and obtain the first mapping function.

[0017] Optionally, constructing a loss function according to the predicted temperature expression at each sampling time and the first temperature includes:

[0018] Determine the difference between the predicted temperature expression and the first temperature at each sampling time to obtain a residual expression corresponding to the sampling time;

[0019] The sum of squares of the residual expression at each sampling time is determined to obtain the loss function.

[0020] Optionally, solving the loss function, determining the value of the undetermined function, and obtaining the first mapping function includes:

[0021] Obtaining the initial value of the pending parameter;

[0022] Substituting the initial value of the undetermined parameter into the loss function and performing iterative processing;

[0023] When the undetermined parameter meets the convergence condition, the iterative process is terminated to determine the value of the undetermined parameter; otherwise, the iterative process is continued.

[0024] Optionally, the convergence condition is:

[0025] The number of iterative processing reaches a preset number threshold; and / or,

[0026] The result value of the loss function obtained by the iterative processing is less than a preset result threshold;

[0027] The result value of the loss function is determined by substituting the value of the undetermined parameter obtained by the iterative process into the loss function.

[0028] Optionally, obtaining the initial value of the undetermined parameter includes:

[0029] According to the set test environment, the model of the target speaker and the target test point, obtaining a corresponding second mapping function;

[0030] An initial value of the undetermined parameter is determined according to the second mapping function.

[0031] Optionally, the performing reliability detection on the target speaker according to the predicted temperature includes:

[0032] When the predicted temperature is within the set operating temperature range, the test on the target speaker is stopped, and the reliability test result of the target speaker is determined to be qualified.

[0033] Optionally, the performing reliability detection on the target speaker according to the predicted temperature includes:

[0034] When the predicted temperature is within a set operating temperature range, obtaining the actual temperature of the target test point at the target time;

[0035] In the case where the actual temperature exceeds the set operating temperature range, determining that the reliability test result of the target speaker is unqualified, and obtaining a second temperature of the target test point collected before the target time;

[0036] The reason why the target speaker reliability test result is unqualified is determined according to the second temperature.

[0037] According to a second aspect of the present disclosure, there is provided a speaker testing device, comprising:

[0038] A temperature acquisition module, used to acquire a first temperature and a corresponding sampling time of a target test point of a target speaker operating under a set test environment within a set period of time;

[0039] A temperature prediction module, used to determine a predicted temperature of the target test point at a target time according to the first temperature and the corresponding sampling time;

[0040] A speaker detection module is used to perform reliability detection on the target speaker according to the predicted temperature.

[0041] According to a third aspect of the present disclosure, a computer-readable storage medium is provided, on which a computer program is stored. When the computer program is executed by a processor, the method described in the first aspect of the present disclosure is implemented.

[0042] Through this embodiment, the detection time of the speaker can be greatly shortened, the detection efficiency of the speaker can be improved, the detection resources of the reliability laboratory can be released, and the quality of the speaker can be guaranteed.

[0043] Further features and advantages of the present invention will become apparent from the following detailed description of exemplary embodiments of the present invention with reference to the attached drawings. BRIEF DESCRIPTION OF THE DRAWINGS

[0044] The accompanying drawings, which are incorporated in and constitute a part of the specification, illustrate embodiments of the invention and, together with the description, serve to explain the principles of the invention.

[0045] Figure 1 is a flow chart of a speaker detection method provided according to an embodiment of the present disclosure;

[0046] Figure 2 is a schematic diagram of a heating curve provided according to an embodiment of the present disclosure;

[0047] Figure 3 is a flowchart of an example of a speaker detection method provided according to another embodiment of the present disclosure;

[0048] Figure 4 It is a block diagram of a speaker detection device provided according to an embodiment of the present disclosure. DETAILED DESCRIPTION

[0049] Various exemplary embodiments of the present invention will now be described in detail with reference to the accompanying drawings. It should be noted that the relative arrangement of components and steps, numerical expressions and numerical values ​​set forth in these embodiments do not limit the scope of the present invention unless otherwise specifically stated.

[0050] The following description of at least one exemplary embodiment is merely illustrative in nature and is in no way intended to limit the invention, its application, or uses.

[0051] Technologies, methods, and equipment known to ordinary technicians in the relevant art may not be discussed in detail, but where appropriate, the technologies, methods, and equipment should be considered as part of the specification.

[0052] In all examples shown and discussed herein, any specific values ​​should be interpreted as merely exemplary and not as limiting. Therefore, other examples of the exemplary embodiments may have different values.

[0053] It should be noted that like reference numerals and letters refer to similar items in the following figures, and therefore, once an item is defined in one figure, it need not be further discussed in subsequent figures.

[0054] This embodiment provides a method for testing a speaker. Figure 1 As shown, it includes steps S1100 to S1300 as shown below:

[0055] Step S1100, obtaining a first temperature and a corresponding sampling time of a target test point of a target speaker operating under a set test environment within a set time period.

[0056] In this embodiment, a target test point on the target speaker can be predetermined according to the test requirements. The target test point can be, for example, a test point exposed on a circuit board of the target speaker, or a test point reserved on a system on chip (SOC).

[0057] In this embodiment, since the temperature reliability test is often carried out in a high and low temperature environment, other environmental factors that have little effect on temperature, such as salt spray, dust, etc., are generally not considered. Therefore, a high and low temperature test chamber is generally selected as the test equipment to simulate severe cold, normal room temperature, and hot temperature environments to test whether the components in the target speaker can always work within a limited temperature range. Therefore, the set test environment can be a set temperature test environment, wherein the set temperature can be set in advance according to the test requirements of the target speaker, for example, the set temperature can be 40 degrees Celsius.

[0058] In one example, the target speaker may be placed in a designated position of a high and low temperature test box in advance, and the temperature of the high and low temperature test box may be adjusted to a set temperature required for this test.

[0059] In one example, the target speaker may be operated at full power to achieve a rapid temperature rise effect under extreme conditions.

[0060] In this embodiment, the first temperature of the target test point collected at multiple sampling times can be collected by means of a preset temperature sensor or temperature probe, and then the temperature data can be transmitted to an electronic device that executes the method of this embodiment through a wired communication serial port or wireless transmission, so as to detect the temperature reliability of the target speaker.

[0061] In this embodiment, after starting the temperature reliability test on the target speaker, the first temperature of the target test point can be collected according to the set sampling frequency. The time when the first temperature is collected relative to the start time of the test is the sampling time corresponding to the first temperature.

[0062] In this embodiment, the set time period may be pre-set according to an application scenario or specific requirements. For example, the set time period may be 20 seconds before executing step S1100.

[0063] Step S1200, determining a predicted temperature of a target test point at a target time according to a first temperature and a corresponding sampling time.

[0064] In this embodiment, the target time may be the time after step S1200 is executed and relative to the detection start time.

[0065] The predicted temperature of the target test point at the target time may be predicted before the target time is reached.

[0066] In one embodiment of the present disclosure, determining the predicted temperature of the target test point at the target time according to the first temperature and the corresponding sampling time may include: inputting the first temperature and the corresponding sampling time into a preset neural network to obtain the predicted temperature of the target test point at the target time. The neural network may be pre-trained.

[0067] In another embodiment of the present disclosure, determining the predicted temperature of the target test point at the target time based on the first temperature and the corresponding sampling time may include: obtaining a first mapping function between the working time of the target speaker under the set test environment and the temperature of the target test point based on the first temperature and the corresponding sampling time; and determining the predicted temperature of the target test point at the target time based on the first mapping function.

[0068] In this embodiment, under most of the test conditions, the temperature rise curve of the components meets the following Figure 2 The rule shown is: after a monotonous, continuous, and smooth rapid heating period, the temperature rises to a certain maximum point and then tends to stabilize. The shape of this type of heating curve is relatively close to the sigmoid function. Due to different test environments, and the heat dissipation capacity of the speaker, component performance, etc., there will be corresponding differences in the heating curve, so the first mapping function can be expressed by the following expression:

[0069]

[0070] Among them, L represents the temperature that the target test point can rise to, k represents the slope of the control function (i.e., the temperature change rate), x0 represents the center of the function (i.e., the time point with the fastest temperature rise), m represents the vertical axis offset (related to the initial temperature), x represents the time that the target speaker works under the set test environment, and f(x) represents the temperature of the target test point when the target speaker works under the set test environment for a time of x.

[0071] In one embodiment of the present disclosure, a first mapping function between the working time of the target speaker under a set test environment and the temperature of the target test point is obtained based on the first temperature and the corresponding sampling time, which may include: determining the predicted temperature expression for each sampling time with the undetermined parameter of the first mapping function as a variable; constructing a loss function based on the predicted temperature expression for each sampling time and the first temperature; solving the loss function, determining the value of the undetermined function, and obtaining the first mapping function.

[0072] In this embodiment, L, k, x0, and m are all undetermined parameters of the first mapping function. The sampling time can be expressed as xi , the corresponding first temperature can be expressed as y i .

[0073] For the i-th sampling time, the unknown parameter of the first mapping function is used as a variable. According to the i-th sampling time, the predicted temperature expression of the i-th sampling time can be determined as follows:

[0074]

[0075] In one embodiment of the present disclosure, constructing a loss function based on the predicted temperature expression and the first temperature at each sampling time may include: determining the difference between the predicted temperature expression and the first temperature at each sampling time to obtain the residual expression of the corresponding sampling time; determining the sum of the squares of the residual expression at each sampling time to obtain the loss function.

[0076] For the i-th sampling time, determine the difference between the predicted temperature expression at the i-th sampling time and the first temperature, and obtain the residual expression for the i-th sampling time, which can be expressed as y i -f(x i ).

[0077] The loss function can be expressed as

[0078] In one embodiment of the present disclosure, the loss function may be solved by nonlinear least squares optimization, and the optimization goal is to adjust the undetermined parameters of the first mapping function so that the sum of squares of the residuals between the predicted temperature and the first temperature after optimizing the undetermined parameters is minimized.

[0079] Commonly used solution methods include gradient descent method (gradually adjusting the value of the unknown parameter along the gradient direction to reduce the value Q of the loss function) and Gauss-Newton method (updating the value of the unknown parameter by iteratively solving the incremental equation).

[0080] In one embodiment of the present disclosure, the loss function is solved, the value of the unknown function is determined, and the first mapping function is obtained, including: obtaining the initial value of the unknown parameter; substituting the initial value of the unknown parameter into the loss function and performing iterative processing; when the unknown parameter meets the convergence condition, terminating the iterative processing and determining the value of the unknown parameter, otherwise, continuing the iterative processing.

[0081] In this embodiment, the value range of the unknown parameter can be pre-set according to objective physical laws to prevent unreasonable parameter values ​​from appearing during the fitting process.

[0082] In one embodiment of the present disclosure, obtaining the initial value of the undetermined parameter may be to set the initial value of the undetermined parameter to be a random number within a corresponding value range.

[0083] In another embodiment of the present disclosure, obtaining the initial value of the parameter to be determined includes: obtaining a corresponding second mapping function according to a set test environment, a target speaker model, and a target test point; and determining the initial value of the parameter to be determined according to the second mapping function. The second mapping function is obtained according to historical detection data.

[0084] In this embodiment, the parameter value of the undetermined parameter in the second mapping function may be used as the initial value of the undetermined parameter in the first mapping function.

[0085] In this embodiment, the historical detection data used to determine the second mapping function can be complete temperature data collected during a test process with the highest similarity between the test environment, speaker model, and test point and the current test. The historical detection data includes historical temperatures at multiple historical sampling times.

[0086] This embodiment can facilitate rapid convergence in subsequent solutions, improve fitting accuracy, reduce calculation complexity, and improve detection efficiency.

[0087] In one embodiment of the present disclosure, an iterative process may be performed once every set time period, and the first temperature and the corresponding sampling time used in each iterative process may be all the first temperatures and the corresponding sampling times acquired before this iterative process, or may be the first temperature and the corresponding sampling time within the set time period before this iterative process.

[0088] In this embodiment, the convergence condition can be set according to a specific application scenario or application requirement.

[0089] For example, the convergence condition is that the number of iterative processing is greater than a preset number threshold. The preset number threshold can be set according to engineering experience or experimental simulation results, for example, it can be set to 300. Correspondingly, assuming that the number of iterative processing is k and the number threshold is n, the corresponding convergence condition is: k≥n.

[0090] For another example, the convergence condition is that the result value of the loss function obtained by iterative processing is less than a preset result threshold, wherein the result value of the loss function is obtained by substituting the value of the undetermined parameter obtained by iterative processing into the loss function.

[0091] In one example, the convergence condition is to satisfy any one of the convergence conditions in the above two examples. The specific convergence condition has been described in the above two examples and will not be repeated here.

[0092] Assuming that the undetermined parameters obtained by the k-th iterative processing meet the convergence condition, the iterative processing is terminated to obtain the value of the undetermined parameters, otherwise, the iterative processing is continued until the undetermined parameters meet the convergence condition.

[0093] In one embodiment of the present disclosure, on the basis of obtaining the first mapping function, the target time may be substituted into the first mapping function to obtain the predicted temperature of the target test point at the target time.

[0094] In this embodiment, the target time may be set in advance according to the test requirements of the speaker, for example, the target time may be 10 minutes.

[0095] Through the method of this embodiment, according to the first temperatures collected at the target test point at multiple sampling times, the predicted temperature of the target test point at the target time can be determined before the target time is reached.

[0096] Step S1300: Perform reliability detection on the target speaker according to the predicted temperature.

[0097] In one embodiment of the present disclosure, reliability detection is performed on a target speaker according to a predicted temperature, including: when the predicted temperature is within a set operating temperature range, stopping the test on the target speaker, and determining that the reliability detection result of the target speaker is qualified.

[0098] In this embodiment, the operating temperature range can be preset according to the actual

[0099] Normally, when the target time is 10 minutes, the complete detection time takes 10 minutes, that is, the target speaker needs to be placed in the target test environment and work for at least 10 minutes. However, through the method of this embodiment, it may only take 1-3 minutes to complete the detection in advance, thereby greatly shortening the detection time.

[0100] In this embodiment, if the predicted temperature is within the set operating temperature range, it can be determined that the reliability test result of the target speaker is qualified, and there is no need to continue to test the target speaker, that is, there is no need to continue to place the target speaker in the target test environment and wait for the target speaker to heat up. In this way, the detection time of the speaker can be greatly shortened, the detection efficiency of the speaker can be improved, the reliability laboratory testing resources can be released, and the quality of the speaker can be guaranteed.

[0101] In one embodiment of the present disclosure, a reliability test is performed on a target speaker based on a predicted temperature, including: when the predicted temperature is within a set operating temperature range, obtaining the actual temperature of the target test point at a target time; when the actual temperature of the target test point at the target time exceeds the set operating temperature range, determining that the reliability test result of the target speaker is unqualified, and obtaining a second temperature of the target test point collected before the target time; and determining the reason why the reliability test result of the target speaker is unqualified based on the second temperature.

[0102] In this embodiment, the target speaker may continue to be placed in the target test environment and wait for the target speaker to heat up until the actual temperature of the target test point at the target time is obtained. The actual temperature may be collected by a preset temperature sensor or temperature probe.

[0103] In this embodiment, the second temperature may be the temperature collected at the target test point at all sampling times before (including) the target time.

[0104] Furthermore, the reason why the target speaker reliability test result is unqualified can also be determined based on the historical test data of other speakers of the same model as the target speaker and the production test data of the target speaker. The production test data of the target speaker can include all production and test data of the target speaker.

[0105] Furthermore, the reasons why the target speaker reliability test result is unqualified may include any one or more of batch design anomalies caused by PCB routing design, structural design (heat dissipation), and occasional anomalies caused by component quality and assembly errors.

[0106] On this basis, the reasons why the reliability test results of the target speaker are unqualified can be displayed, so that the staff can repair, change the design or other processes of the target speaker according to the reasons, so as to achieve coordination among R&D, manufacturing and testing.

[0107] In one embodiment of the present disclosure, when the actual temperature of the target test point at the target time is within the set operating temperature range, it can be determined that the reliability test result of the target speaker is qualified.

[0108] Figure 3 FIG. 1 is a flow chart of an example of a speaker detection method provided according to another embodiment of the present disclosure. Figure 3 As shown, the method may include:

[0109] Step S3001, obtaining a first temperature and a corresponding sampling time of a target test point of a target speaker operating under a set test environment within a set time period.

[0110] Step S3002, using the undetermined parameters of the first mapping function as variables, determining the predicted temperature expression for each sampling time.

[0111] Step S3003, constructing a loss function according to the predicted temperature expression at each sampling time and the first temperature.

[0112] Step S3004, according to the set test environment, the model of the target speaker and the target test point, obtain the corresponding second mapping function, and determine the initial value of the parameter to be determined according to the second mapping function.

[0113] Step S3005, substitute the initial value of the undetermined parameter into the loss function and perform iterative processing.

[0114] Step S3006, determine whether the undetermined parameters meet the convergence conditions, if yes, execute step S3007; if not, continue to execute step S3001.

[0115] Step S3007, terminate the iterative process, determine the value of the undetermined parameter, and obtain the first mapping function.

[0116] Step S3008: determining the predicted temperature of the target test point at the target time according to the first mapping function.

[0117] Step S3009, determine whether the predicted temperature is within the set operating temperature range, if yes, execute step S3010; if not, execute step S3011.

[0118] Step S3010, stop testing the target speaker, and determine that the reliability test result of the target speaker is qualified.

[0119] Step S3011, obtaining the actual temperature of the target test point at the target time, and stopping the test on the target speaker.

[0120] Step S3012, determine whether the actual temperature is within the set working temperature range, if yes, execute step S3013; if not, execute step S3014.

[0121] Step S3013, determining that the reliability test result of the target speaker is qualified.

[0122] Step S3014, obtaining a second temperature of the target test point collected before the target time, and determining the reason why the reliability test result of the target speaker is unqualified according to the second temperature.

[0123] The present disclosure also provides a speaker testing device. Figure 4 As shown, the speaker testing device 4000 may include a temperature acquisition module 4100 , a temperature prediction module 4200 and a speaker detection module 4300 .

[0124] The temperature acquisition module 4100 is used to acquire the first temperature and the corresponding sampling time of the target test point of the target speaker operating under the set test environment within a set time period.

[0125] The temperature prediction module 4200 is used to determine the predicted temperature of the target test point at the target time according to the first temperature and the corresponding sampling time.

[0126] The speaker detection module 4300 is used to perform reliability detection on the target speaker according to the predicted temperature.

[0127] In one embodiment of the present disclosure, the temperature prediction module 4200 is used to:

[0128] Obtaining, according to the first temperature and the corresponding sampling time, a first mapping function between the time when the target speaker works under the set test environment and the temperature of the target test point;

[0129] The predicted temperature of the target speaker at the target time is determined according to the first mapping function.

[0130] In one embodiment of the present disclosure, obtaining, according to the first temperature and the corresponding sampling time, a first mapping function between the time when the target speaker operates at full power under the set test environment and the temperature of the target test point includes:

[0131] Taking the undetermined parameter of the first mapping function as a variable, determining a predicted temperature expression for each sampling time;

[0132] Constructing a loss function based on the predicted temperature expression and the first temperature at each sampling time;

[0133] Solve the loss function, determine the value of the undetermined function, and obtain the first mapping function.

[0134] In one embodiment of the present disclosure, constructing a loss function according to the predicted temperature expression at each sampling time and the first temperature includes:

[0135] Determine the difference between the predicted temperature expression and the first temperature at each sampling time to obtain a residual expression corresponding to the sampling time;

[0136] The sum of squares of the residual expression at each sampling time is determined to obtain the loss function.

[0137] In one embodiment of the present disclosure, solving the loss function, determining the value of the undetermined function, and obtaining the first mapping function includes:

[0138] Obtaining the initial value of the pending parameter;

[0139] Substituting the initial value of the undetermined parameter into the loss function and performing iterative processing;

[0140] When the undetermined parameter meets the convergence condition, the iterative process is terminated to determine the value of the undetermined parameter; otherwise, the iterative process is continued.

[0141] In one embodiment of the present disclosure, the convergence condition is:

[0142] The number of iterative processing reaches a preset number threshold; and / or,

[0143] The result value of the loss function obtained by the iterative processing is less than a preset result threshold;

[0144] The result value of the loss function is determined by substituting the value of the undetermined parameter obtained by the iterative process into the loss function.

[0145] In one embodiment of the present disclosure, obtaining the initial value of the undetermined parameter includes:

[0146] According to the set test environment, the model of the target speaker and the target test point, obtaining a corresponding second mapping function;

[0147] An initial value of the undetermined parameter is determined according to the second mapping function.

[0148] In one embodiment of the present disclosure, the speaker detection module 4300 is used to:

[0149] When the predicted temperature is within the set operating temperature range, the test on the target speaker is stopped, and the reliability test result of the target speaker is determined to be qualified.

[0150] In one embodiment of the present disclosure, the speaker detection module 4300 is used to:

[0151] When the predicted temperature is within a set operating temperature range, obtaining the actual temperature of the target test point at the target time;

[0152] In the case where the actual temperature exceeds the set operating temperature range, determining that the reliability test result of the target speaker is unqualified, and obtaining a second temperature of the target test point collected before the target time;

[0153] The reason why the target speaker reliability test result is unqualified is determined according to the second temperature.

[0154] The present disclosure also provides a computer-readable storage medium having a computer program stored thereon. When the computer program is executed by a processor, the method described in any embodiment of the present disclosure is implemented.

[0155] The above embodiments mainly focus on describing the differences from other embodiments, but it should be clear to those skilled in the art that the above embodiments can be used alone or in combination with each other as needed.

[0156] Each embodiment in this specification is described in a progressive manner, and the same or similar parts between the embodiments can be referred to each other. Each embodiment focuses on the differences from other embodiments, but it should be clear to those skilled in the art that the above embodiments can be used alone or in combination with each other as needed. In addition, for the device embodiment, since it corresponds to the method embodiment, the description is relatively simple, and the relevant parts can be referred to the description of the corresponding part of the method embodiment. The system embodiment described above is merely illustrative, and the modules described as separate components may or may not be physically separated.

[0157] This embodiment provides an electronic device, including a processor and a memory, wherein the memory 5200 is used to store a computer program, and the processor is used to run the computer program so that the method described in any embodiment of the present disclosure is executed.

[0158] The present invention may be an apparatus, a method and / or a computer program product. The computer program product may include a computer-readable storage medium carrying computer-readable program instructions for causing a processor to implement various aspects of the present invention.

[0159] A computer-readable storage medium may be a tangible device that can hold and store instructions used by an instruction execution device. A computer-readable storage medium may be, for example, but not limited to, an electrical storage device, a magnetic storage device, an optical storage device, an electromagnetic storage device, a semiconductor storage device, or any suitable combination of the foregoing. More specific examples of computer-readable storage media (a non-exhaustive list) include: a portable computer disk, a hard disk, a random access memory (RAM), a read-only memory (ROM), an erasable programmable read-only memory (EPROM or flash memory), a static random access memory (SRAM), a portable compact disk read-only memory (CD-ROM), a digital versatile disk (DVD), a memory stick, a floppy disk, a mechanical compression device, such as a punch card or a raised structure in a groove on which instructions are stored, and any suitable combination of the foregoing. As used herein, a computer-readable storage medium is not to be interpreted as a transient signal per se, such as a radio wave or other freely propagating electromagnetic wave, an electromagnetic wave propagating through a waveguide or other transmission medium (e.g., a light pulse through a fiber optic cable), or an electrical signal transmitted through a wire.

[0160] The computer-readable program instructions described herein can be downloaded from a computer-readable storage medium to each computing / processing device, or downloaded to an external computer or external storage device via a network, such as the Internet, a local area network, a wide area network, and / or a wireless network. The network can include copper transmission cables, optical fiber transmissions, wireless transmissions, routers, firewalls, switches, gateway computers, and / or edge servers. The network adapter card or network interface in each computing / processing device receives the computer-readable program instructions from the network and forwards the computer-readable program instructions for storage in the computer-readable storage medium in each computing / processing device.

[0161] The computer program instructions for performing the operation of the present invention may be assembler instructions, instruction set architecture (ISA) instructions, machine instructions, machine-dependent instructions, microcode, firmware instructions, state setting data, or source code or object code written in any combination of one or more programming languages, including object-oriented programming languages, such as Smalltalk, C++, etc., and conventional procedural programming languages, such as "C" language or similar programming languages. Computer-readable program instructions may be executed entirely on a user's computer, partially on a user's computer, as an independent software package, partially on a user's computer, partially on a remote computer, or entirely on a remote computer or server. In the case of a remote computer, the remote computer may be connected to the user's computer via any type of network, including a local area network (LAN) or a wide area network (WAN), or may be connected to an external computer (e.g., using an Internet service provider to connect via the Internet). In some embodiments, an electronic circuit, such as a programmable logic circuit, a field programmable gate array (FPGA), or a programmable logic array (PLA), may be personalized by utilizing the state information of the computer-readable program instructions, and the electronic circuit may execute the computer-readable program instructions, thereby realizing various aspects of the present invention.

[0162] Various aspects of the present invention are described herein with reference to the flow charts and / or block diagrams of the methods, devices (systems) and computer program products according to embodiments of the present invention. It should be understood that each box of the flow chart and / or block diagram and the combination of each box in the flow chart and / or block diagram can be implemented by computer-readable program instructions.

[0163] These computer-readable program instructions can be provided to a processor of a general-purpose computer, a special-purpose computer, or other programmable data processing device, thereby producing a machine, so that when these instructions are executed by the processor of the computer or other programmable data processing device, a device that implements the functions / actions specified in one or more boxes in the flowchart and / or block diagram is generated. These computer-readable program instructions can also be stored in a computer-readable storage medium, and these instructions cause the computer, programmable data processing device, and / or other equipment to work in a specific manner, so that the computer-readable medium storing the instructions includes a manufactured product, which includes instructions for implementing various aspects of the functions / actions specified in one or more boxes in the flowchart and / or block diagram.

[0164] Computer-readable program instructions may also be loaded onto a computer, other programmable data processing apparatus, or other device so that a series of operating steps are performed on the computer, other programmable data processing apparatus, or other device to produce a computer-implemented process, thereby causing the instructions executed on the computer, other programmable data processing apparatus, or other device to implement the functions / actions specified in one or more boxes in the flowchart and / or block diagram.

[0165] The flow charts and block diagrams in the accompanying drawings show the possible architecture, functions and operations of the systems, methods and computer program products according to multiple embodiments of the present invention. In this regard, each box in the flow chart or block diagram can represent a part of a module, a program segment or an instruction, and a part of the module, a program segment or an instruction contains one or more executable instructions for realizing the specified logical function. In some alternative implementations, the functions marked in the box can also occur in a different order from the order marked in the accompanying drawings. For example, two consecutive boxes can actually be executed substantially in parallel, and they can sometimes be executed in the opposite order, depending on the functions involved. It should also be noted that each box in the block diagram and / or flow chart, and the combination of the boxes in the block diagram and / or flow chart can be implemented by a dedicated hardware-based system that performs the specified function or action, or can be implemented by a combination of dedicated hardware and computer instructions. It is well known to those skilled in the art that it is equivalent to implement it by hardware, implement it by software, and implement it by combining software and hardware.

[0166] Embodiments of the present invention have been described above, and the above description is exemplary, not exhaustive, and is not limited to the disclosed embodiments. Many modifications and variations will be apparent to those of ordinary skill in the art without departing from the scope and spirit of the described embodiments. The choice of terms used herein is intended to best explain the principles of the embodiments, practical applications, or technical improvements to the technology in the marketplace, or to enable other persons of ordinary skill in the art to understand the embodiments disclosed herein. The scope of the present invention is defined by the appended claims.

Claims

1. A speaker testing method, characterized in that: include: Obtaining a first temperature and a corresponding sampling time of a target test point of a target speaker operating under a set test environment within a set period of time; Determining a predicted temperature of the target test point at a target time according to the first temperature and the corresponding sampling time; The reliability of the target speaker is detected according to the predicted temperature.

2. The method according to claim 1, characterized in that The step of determining the predicted temperature of the target test point at the target time according to the first temperature and the corresponding sampling time includes: Obtaining, according to the first temperature and the corresponding sampling time, a first mapping function between the time when the target speaker works under the set test environment and the temperature of the target test point; The predicted temperature of the target speaker at the target time is determined according to the first mapping function.

3. The method according to claim 2, characterized in that The obtaining, according to the first temperature and the corresponding sampling time, a first mapping function between the time when the target speaker operates at full power under the set test environment and the temperature of the target test point comprises: Taking the undetermined parameter of the first mapping function as a variable, determining a predicted temperature expression for each sampling time; Constructing a loss function based on the predicted temperature expression and the first temperature at each sampling time; Solve the loss function, determine the value of the undetermined function, and obtain the first mapping function.

4. The method according to claim 3, characterized in that The loss function is constructed according to the predicted temperature expression at each sampling time and the first temperature, including: Determine the difference between the predicted temperature expression and the first temperature at each sampling time to obtain a residual expression corresponding to the sampling time; The sum of squares of the residual expression at each sampling time is determined to obtain the loss function.

5. The method according to claim 3, characterized in that: The step of solving the loss function, determining the value of the undetermined function, and obtaining the first mapping function includes: Obtaining the initial value of the pending parameter; Substituting the initial value of the undetermined parameter into the loss function and performing iterative processing; When the undetermined parameter meets the convergence condition, the iterative process is terminated to determine the value of the undetermined parameter; otherwise, the iterative process is continued.

6. The method according to claim 5, characterized in that The convergence condition is: The number of iterative processing reaches a preset number threshold; and / or, The result value of the loss function obtained by the iterative processing is less than a preset result threshold; The result value of the loss function is determined by substituting the value of the undetermined parameter obtained by the iterative process into the loss function.

7. The method according to claim 5, characterized in that The obtaining of the initial value of the undetermined parameter comprises: According to the set test environment, the model of the target speaker and the target test point, obtaining a corresponding second mapping function; An initial value of the undetermined parameter is determined according to the second mapping function.

8. The method according to claim 1, characterized in that The performing reliability detection on the target speaker according to the predicted temperature includes: When the predicted temperature is within the set operating temperature range, the test on the target speaker is stopped, and the reliability test result of the target speaker is determined to be qualified.

9. The method according to claim 1, characterized in that: The performing reliability detection on the target speaker according to the predicted temperature includes: When the predicted temperature is within a set operating temperature range, obtaining the actual temperature of the target test point at the target time; In the case where the actual temperature exceeds the set operating temperature range, determining that the reliability test result of the target speaker is unqualified, and obtaining a second temperature of the target test point collected before the target time; The reason why the target speaker reliability test result is unqualified is determined according to the second temperature.

10. A speaker testing device, characterized in that: include: A temperature acquisition module, used to acquire a first temperature and a corresponding sampling time of a target test point of a target speaker operating under a set test environment within a set period of time; A temperature prediction module, used to determine a predicted temperature of the target test point at a target time according to the first temperature and the corresponding sampling time; A speaker detection module is used to perform reliability detection on the target speaker according to the predicted temperature.

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