Telescope reflecting surface positioning measurement system and method

Abstract

The invention relates to the technical field of telescope measurement, and particularly discloses a telescope reflecting surface positioning measurement system and method, and the system comprises a reflecting surface module which collects the light of a measured object and reflects the light to a target focus to form a light spot; the camera module calibrates and records a current light spot position measurement image through an industrial camera, and obtains a light spot measurement position change parameter in a target time period; the sensor module detects and acquires actual contour information of a light spot area of the reflecting surface, and determines a light spot actual position change parameter in combination with a light spot measurement position change parameter acquired by the camera module; the control module generates a control instruction according to the actual position change parameter of the light spot acquired by the sensor module and calculates a target adjustment amount; the execution module calibrates the position of the reflecting surface according to the control instruction of the control module; and the feedback module feeds back the reflecting surface measurement result adjusted by the execution module and transmits the result to the signal control center, so that the measurement precision of the reflecting surface measurement position of the measurement system is improved.

Description

Technical Field

[0001] The present invention relates to the technical field of telescope measurement, and in particular to a telescope reflection surface positioning measurement system and method. Background Art

[0002] With the development of deep space exploration and cosmic radio astronomical object exploration, the requirements for the performance of astronomical telescopes are becoming higher and higher. Astronomical telescopes usually consist of a reflective surface structure, a measurement system, and a positioning control system, and are often used for the reception and positioning of high-precision astronomical radio wave signals.

[0003] The existing fixed binocular vision measurement system composed of fixed cameras realizes the measurement process. Due to the limitations of the camera's field of view and resolution, it can ensure high measurement accuracy, but the measurement range is often small. During the next measurement process, it is necessary to spend time to recalibrate the position of the camera. Moreover, since the performance of the telescope is mostly limited by the accuracy of its reflector surface, only one point can be measured at a time for the measured object, and the measurement efficiency is low. Therefore, it is generally limited to measurement accuracy calibration during installation.

[0004] With the development of data intelligence, the telescope reflection surface positioning measurement system uses visual measurement technology combined with imaging models to perform the conversion and calibration process between spatial coordinates. However, due to the need for complex image processing and three-dimensional control processes, and the huge amount of calculation, the measurement accuracy of three-dimensional control points is low, and the extraction and conversion efficiency of measurement image points is low, which seriously affects the accuracy of calibration. Summary of the invention

[0005] The purpose of the present invention is to provide a telescope reflecting surface positioning measurement system and method to solve the following technical problems: How to improve the measurement accuracy of the reflective surface measurement position of the measurement system and promote the efficient conversion of measured three-dimensional information.

[0006] The purpose of the present invention can be achieved through the following technical solutions: A telescope reflecting surface positioning and measuring system, comprising: The reflective surface module is used to collect the light of the measuring object and reflect it to the target focus to form a light spot; a detector is arranged at the target focus; a controller is arranged at the bottom of the reflective surface module; The camera module is used to record the current spot position measurement image through industrial camera calibration and obtain the spot measurement position change parameters within the target time period; The sensor module is used to detect and obtain the actual contour information of the light spot area of ​​the reflective surface, and determine the actual position change parameters of the light spot in combination with the light spot measurement position change parameters obtained by the camera module; A control module, used to generate a control instruction and calculate a target adjustment amount according to the actual position change parameters of the light spot acquired by the sensor module; The execution module is used to calibrate the position of the reflection surface according to the control instruction of the control module.

[0007] Preferably, the camera module includes: Calculate the camera parameters based on the spot image matrix obtained by detecting camera corner points in different orientations; Determine the current spot measurement position image according to the camera parameters and the three-dimensional model; Obtaining the three-dimensional coordinate system position change data of the light spot measurement profile within the target time period; The three-dimensional coordinate system position change data set of the spot measurement profile at different times and the target time period information are input into the linear projection model to obtain the projection coefficient and output the spot measurement position change parameters.

[0008] Preferably, the sensor module determines the actual position change parameter of the light spot in the following manner: Obtaining an electrical signal of contour information of the light spot area of ​​the reflecting surface through an optical sensor; Converting the contour information electrical signal into contour digital signal parameters through frequency domain; The light spot measurement position change parameters and the corresponding contour digital signal parameters are obtained and input into the perspective projection simulation model to output the light spot actual position change parameters.

[0009] Preferably, the control module comprises: By formula Calculate the adjustment factor ; in, is the total number of focal spots, ∈ ; For the front The actual position deviation of each light spot; For the front The standard deviation of the actual position of each light spot; For the front The average value of the actual position deviation of each light spot; For the front A preset weight coefficient for the influence of the actual position deviation in each focal spot on the position deviation of the reflecting surface; The preset adjustment function.

[0010] Preferably, the generation process of the control instruction is: The adjustment factor With the preset adjustment factor threshold To compare: like ≥ , it is judged that the focus position deviation of the reflecting surface is large, and a control instruction is generated; like < , it is judged that the deviation of the focus position of the reflecting surface is small, and the measurement process continues.

[0011] Preferably, the front The actual position deviation of the light spot Before the combination All actual position change parameters of all key points of the contour of different spot areas The following results were obtained from the analysis: By formula Before calculation The actual position deviation of the light spot ,in is the total number of key points of the spot area contour, ∈ ; is the target time interval, and 0< < ; is the position coefficient of the key point of the contour of the current spot area; For the The contour of the spot area on the spot The actual position change parameters of key points; For the The contour of the spot area on the spot The standard value of the actual position change parameter of each key point; For preset The contour of the spot area on the spot The actual position change parameter deviation value of each key point.

[0012] Preferably, the control module obtains the calculation method of the key point target adjustment amount as follows: By formula Calculate key points Target adjustment amount ;in, is the mapping function from the actual position to the measured position; For point The preset position coefficients.

[0013] Preferably, the process of the execution module calibrating the position of the reflective surface according to the control instruction includes: Start the self-calibration mode; Adjust amount according to target Determine the measurement position information of each key point of the light spot to form a measurement position coordinate set; The three-dimensional coordinates of the light spot measured on the initial reflection surface and the measurement position coordinate set are transmitted to the control model of the controller for three-dimensional simulation, and the control parameters are output; The controller controls the reflecting surface to adjust the angle or shift the position according to the control parameters.

[0014] Preferably, it also includes a feedback module, which is used to transmit the reflection surface measurement result adjusted by the execution module to the signal control center.

[0015] A method for measuring the positioning of a telescope reflecting surface comprises the following steps: Step 1: Collect the light of the measuring object and reflect it to the target focus to form a light spot; a detector is arranged at the target focus; a controller is arranged at the bottom of the reflection surface module; Step 2: record the current spot position measurement image through industrial camera calibration, and obtain the spot measurement position change parameters within the target time period; Step 3: Detect and obtain the actual contour information of the light spot area on the reflecting surface, and determine the actual position change parameters of the light spot in combination with the light spot measurement position change parameters; Step 4: Generate control instructions based on the actual position change parameters of the light spot and calculate the target adjustment amount; Step 5: Calibrate the position of the reflective surface according to the control instruction; Step 6: The feedback-adjusted reflective surface measurement result is transmitted to the signal control center.

[0016] Beneficial effects of the present invention: (1) The present invention records the current spot position measurement image calibrated by the industrial camera through the camera module, obtains the spot measurement position change parameters within the target time period, and obtains the actual contour information of the spot area on the reflective surface through the sensor module, and determines the actual spot position change parameters in combination with the spot measurement position change parameters obtained by the camera module; the sensor can fully detect the actual contour of the spot area on the reflective surface, provide more accurate position change parameters, and ensure the accuracy of subsequent position adjustment.

[0017] (2) The present invention uses a control module to generate control instructions and calculate the target adjustment amount according to the actual position change parameters of the light spot obtained by the sensor module; generates adjustment instructions according to the data provided by the sensor module, calculates the precise adjustment amount that needs to be controlled on the reflective surface through the control instructions, analyzes the change of the actual position deviation of the light spot during the measurement process, and determines the position deviation of each key point of the light spot in the focal area of ​​the reflective surface to obtain the adjustment coefficient. This step avoids the process of analyzing the specific position of each measurement point one by one, and can avoid excessive position deviation of each measurement point to a certain extent.

[0018] Of course, any product implementing the present invention does not necessarily need to achieve all of the advantages described above at the same time. BRIEF DESCRIPTION OF THE DRAWINGS

[0019] In order to more clearly illustrate the technical solutions of the embodiments of the present invention, the accompanying drawings required for describing the embodiments will be briefly introduced below. Obviously, the accompanying drawings described below are only some embodiments of the present invention. For ordinary technicians in this field, other accompanying drawings can be obtained based on these accompanying drawings without paying creative work.

[0020] Figure 1 This is a module flow chart of a telescope reflection surface positioning and measurement system of the present invention; Figure 2 This is a step diagram of a method for positioning and measuring a telescope reflecting surface according to the present invention. DETAILED DESCRIPTION

[0021] The following will be combined with the drawings in the embodiments of the present invention to clearly and completely describe the technical solutions in the embodiments of the present invention. Obviously, the described embodiments are only part of the embodiments of the present invention, not all of the embodiments. Based on the embodiments of the present invention, all other embodiments obtained by ordinary technicians in this field without creative work are within the scope of protection of the present invention.

[0022] See also Figure 1 As shown, the present invention is a telescope reflection surface positioning and measurement system, comprising: The reflective surface module is used to collect the light of the measuring object and reflect it to the target focus to form a light spot; a detector is arranged at the target focus; a controller is arranged at the bottom of the reflective surface module; The camera module is used to record the current spot position measurement image through industrial camera calibration and obtain the spot measurement position change parameters within the target time period; The sensor module is used to detect and obtain the actual contour information of the light spot area of ​​the reflective surface, and determine the actual position change parameters of the light spot in combination with the light spot measurement position change parameters obtained by the camera module; A control module, used to generate a control instruction and calculate a target adjustment amount according to the actual position change parameters of the light spot acquired by the sensor module; The execution module is used to calibrate the position of the reflection surface according to the control instruction of the control module.

[0023] In the above technical solution, a telescope reflection surface positioning and measurement system is designed, specifically by designing five modules, namely, reflection surface module, camera module, sensor module, control module and execution module, to realize the measurement, analysis and calibration process of the reflection surface position.

[0024] First, the reflective surface module is used to collect the light from the measuring object and reflect it to the target focus to form a light spot; by capturing and reflecting the light from the target object, the light is precisely focused to a point to form a light spot, and the position of the light spot is confirmed to ensure subsequent detailed judgment based on measurement analysis and position adjustment; a detector is set at the target focus; the detector located at the focus of the reflective surface can capture the light spot, which is the direct source of the measurement system to obtain the reflective surface status information.

[0025] A controller is provided at the bottom of the reflective surface module; the controller is installed at the bottom of the reflective surface to receive instructions from the control module and fine-tune the position of the reflective surface to ensure that the light spot can fall on the detector accurately.

[0026] Secondly, the camera module is used to record the current light spot position measurement image through industrial camera calibration, and obtain the light spot measurement position change parameters within the target time period; use the industrial camera to record the real-time position of the light spot, and obtain the position change parameters of the light spot within the target time period through image analysis, which is an important basis for system adjustment.

[0027] Specifically, as an embodiment of the present invention, the camera module includes: Calculate the camera parameters based on the spot image matrix obtained by detecting camera corner points in different orientations; Determine the current spot measurement position image according to the camera parameters and the three-dimensional model; Obtaining the three-dimensional coordinate system position change data of the light spot measurement profile within the target time period; The three-dimensional coordinate system position change data set of the spot measurement profile at different times and the target time period information are input into the linear projection model to obtain the projection coefficient and output the spot measurement position change parameters.

[0028] In the above technical scheme, the camera module first obtains the spot image matrix by corner point detection through cameras set at different orientations, and specifically determines the camera parameters through camera calibration technology. The camera parameters mainly include internal parameters (such as focal length, principal point coordinates, distortion coefficient, etc.) and external parameters (rotation and translation matrix). Existing commonly used calibration methods include Zhang Zhengyou calibration method, which is a process of shooting multiple images with known patterns (such as chessboard) and solving them by detecting corner points in the images.

[0029] Then, the current light spot measurement position image is determined according to the camera parameters and the three-dimensional model; the current light spot measurement position image is obtained by projecting the points in the three-dimensional space onto the two-dimensional image plane and performing coordinate transformation according to the internal and external parameter matrix of the camera.

[0030] Then, the three-dimensional coordinate system position change data of the light spot measurement profile within the target time period is obtained; the position change of the light spot in the image sequence is tracked through image processing technology, and the two-dimensional position change is converted into a position change in three-dimensional space.

[0031] Finally, the three-dimensional coordinate system position change data set of the light spot measurement profile at different times and the target time period information are input into the linear projection model to obtain the projection coefficient and output the light spot measurement position change parameters. The three-dimensional coordinate system position change data set of the light spot measurement profile at different times and the target time period information are input into the linear projection model, and the projection coefficient can be obtained by the least squares optimization technology; the projection coefficient refers to the projection coefficient required when projecting a three-dimensional point onto a two-dimensional plane in the linear projection model, and these coefficients are related to the internal and external parameters of the camera and the geometric characteristics of the three-dimensional model; by obtaining the projection coefficient, the light spot measurement position change parameters can be output to represent the movement trajectory and change of the light spot in three-dimensional space. It should be noted that the nonlinear distortion of the camera involved in the above calculation process is an existing technology, and it needs to be corrected during the calibration process to improve the accuracy of the measurement. In addition, the robustness and accuracy of the image processing algorithm should be considered in practical applications to ensure the reliability of spot detection and tracking. The linear projection model maps high-dimensional data to a low-dimensional space through a linear transformation. This transformation is usually achieved through matrix multiplication, that is, multiplying the original data matrix by a projection matrix to obtain the projected data matrix.

[0032] Thirdly, the sensor module is used to detect and obtain the actual contour information of the light spot area on the reflecting surface, and determine the actual position change parameters of the light spot in combination with the light spot measurement position change parameters obtained by the camera module; the sensor can fully detect the actual contour of the light spot area on the reflecting surface, provide more accurate position change parameters, and ensure the accuracy of subsequent position adjustments.

[0033] Specifically, as an implementation of the present invention, the sensor module determines the actual position change parameter of the light spot in the following manner: Obtaining an electrical signal of contour information of the light spot area of ​​the reflecting surface through an optical sensor; Converting the contour information electrical signal into contour digital signal parameters through frequency domain; The light spot measurement position change parameters and the corresponding contour digital signal parameters are obtained and input into the perspective projection simulation model to output the light spot actual position change parameters.

[0034] In the above technical solution, the method for determining the actual position change parameters of the light spot includes first obtaining the contour information electrical signal of the light spot area on the reflecting surface through the optical sensor, capturing the contour information of the light spot on the reflecting surface through the optical sensor, and outputting the shape and position of the light spot in the form of an electrical signal; the sensor used in this embodiment can be a CCD (charge coupled device) or a CMOS (complementary metal oxide semiconductor) sensor, as long as the sensor can convert the light intensity change into an electrical signal, without limiting the specific type of use.

[0035] Then, the contour information electrical signal is converted into contour digital signal parameters through the frequency domain; the electrical signal is converted into a digital signal through the general frequency domain, and features are extracted from the digital signal: the contour information electrical signal is converted into contour digital signal parameters using technologies such as fast Fourier transform (FFT) to facilitate feature calculation and processing, such as the contour shape and edge information of the light spot, and then converted into a digital signal that can be recognized and analyzed by the computing system.

[0036] Finally, the light spot measurement position change parameters and their corresponding contour digital signal parameters are obtained and input into the perspective projection simulation model to output the light spot actual position change parameters; the perspective projection simulation model is based on the principle of perspective geometry, and can simulate and calculate the actual changes of the light spot at different positions; the light spot measurement position change parameters and the contour digital signal parameters are input into the preset perspective projection simulation model for machine training, and the precise parameters of the actual position change of the light spot are output after considering the position and angle of the camera and the actual geometric shape of the light spot; the output light spot actual position change parameters include the precise displacement, rotation and scaling information of the light spot in three-dimensional space, and the actual position change parameters of the light spot can be used to ensure the adjustment accuracy of the reflecting surface, which can effectively improve the observation accuracy of the telescope equipment. The perspective projection simulation model is a prior art, which is a mathematical model used to simulate the perspective projection effect, and is usually used in computer graphics, computer vision, photogrammetry and other fields.

[0037] Fourthly, the control module is used to generate control instructions and calculate the target adjustment amount according to the actual position change parameters of the light spot obtained by the sensor module; generate adjustment instructions according to the data provided by the sensor module, and calculate the precise adjustment amount that needs to be controlled on the reflective surface through the control instructions.

[0038] Specifically, as an implementation of the present invention, the control module includes: By formula Calculate the adjustment factor ; in, is the total number of focal spots, ∈ ; For the front The actual position deviation of each light spot; For the front The standard deviation of the actual position of each light spot; For the front The average value of the actual position deviation of each light spot; For the front A preset weight coefficient for the influence of the actual position deviation in each focal spot on the position deviation of the reflecting surface; The preset adjustment function.

[0039] In the above technical solution, the control module generates the control quality and judges the position of the reflective surface. The specific judgment and analysis method is through the formula Calculate the adjustment factor , according to the adjustment factor The size of the focal point determines the accuracy of the reflective surface, specifically by analyzing the actual position deviation of the light spot. The change during the measurement process is determined by judging the position deviation of the key points of each light spot in the focal area of ​​the reflecting surface to obtain the adjustment coefficient. This step avoids the process of analyzing the specific position of each measuring point one by one, and can avoid excessive position deviation of each measuring point to a certain extent.

[0040] It needs to be explained that The standard deviation of the actual position of the light spot The standard data value is obtained based on historical experience, ensuring that the previous The historical values ​​of the actual position deviation of each spot are input into the analysis model for machine training, and the simulation calculation result is output. This result is the result obtained by simulating the historical experience data as a comparison of the actual measurement deviation; the weight coefficient is preset It is pre-fitted and set according to historical experience data, so it will not be described in detail here; preset adjustment function It is an adjustment function set according to historical data to ensure that the adjustment coefficient result is within a specific reasonable range.

[0041] As an implementation mode of the present invention, the generation process of the control instruction is as follows: The adjustment factor With the preset adjustment factor threshold To compare: like ≥ , it is judged that the focus position deviation of the reflecting surface is large, and a control instruction is generated; like < , it is judged that the deviation of the focus position of the reflecting surface is small, and the measurement process continues.

[0042] In the above technical solution, this embodiment obtains the control instruction based on the comparison of the adjustment coefficient. Specifically, the adjustment coefficient With the preset adjustment factor threshold Compare the sizes, if ≥ , then it is judged that the focus position deviation of the reflecting surface is large and a control instruction is generated; if < , it is judged that the deviation of the focus position of the reflecting surface is small, and the measurement process is continued. By judging that the deviation of the focus position of the reflecting surface is large, a control instruction is generated to achieve the generation of the control instruction.

[0043] As an embodiment of the present invention, The actual position deviation of the light spot Before the combination All actual position change parameters of all key points of the contour of different spot areas The following results were obtained from the analysis: By formula Before calculation The actual position deviation of the light spot ,in is the total number of key points of the spot area contour, ∈ ; is the target time period, and 0< < ; is the position coefficient of the key point of the contour of the current spot area; For the The contour of the spot area on the spot The actual position change parameters of key points; For the The contour of the spot area on the spot The standard value of the actual position change parameter of each key point; For preset The contour of the spot area on the spot The actual position change parameter deviation value of each key point.

[0044] In the above technical solution, by The comprehensive actual position change parameters of all key points of the contours of different spot areas To determine the corresponding front The actual position deviation of the light spot Specifically, through the formula Before calculation The actual position deviation of the light spot By analyzing the actual position change parameters, the previous measurement is performed within the target time period. The cumulative dynamic changes of the number of light spots are determined before The actual position deviation of the light spot , to achieve measurement adjustment of actual position changes, and to achieve accurate measurement of different spot positions of the focus of the reflection surface. Generally speaking, for the selection of the number of key points of the spot area contour, the number of points to be measured varies according to the shape of the measured object, and the overall selection needs to be based on the external contour and shape complexity of the measured object; therefore, the higher the shape complexity, the more key points are selected, and the minimum number of key points in this design is no less than three points.

[0045] As an implementation mode of the present invention, the control module obtains the calculation method of the key point target adjustment amount as follows: By formula Calculate key points Target adjustment amount ;in, is the mapping function from the actual position to the measured position; For point The preset position coefficients.

[0046] In the above technical solution, the control module obtains the target adjustment amount of the key point position by formula calculation. Specifically, by formula Calculate key points Target adjustment amount According to the analysis before The actual position deviation of the light spot The accumulation and setting of the transformation function of the actual position and the measured position are used to adjust the amount that needs to be controlled, thereby achieving the acquisition of the size of the target adjustment amount.

[0047] It should be further explained that the mapping function It is a calculation function set in the process of mapping the two-dimensional data of the actual position deviation value into the three-dimensional space for transformation. The specific form is relatively complicated, but it can generally be calculated by capturing the characteristics of the data in the feature space through the existing kernel function, which will not be described in detail here.

[0048] Fifth, the execution module is used to calibrate the position of the reflecting surface according to the control instructions of the control module; according to the instructions of the control module, the fine adjustment of the reflecting surface is performed to ensure the accuracy of the light spot position, thereby ensuring the measurement accuracy of the entire telescope system.

[0049] As an implementation mode of the present invention, the process of the execution module calibrating the position of the reflective surface according to the control instruction includes: Start the self-calibration mode; Adjust amount according to target Determine the measurement position information of each key point of the light spot to form a measurement position coordinate set; The three-dimensional coordinates of the light spot measured on the initial reflection surface and the measurement position coordinate set are transmitted to the control model of the controller for three-dimensional simulation, and the control parameters are output; The controller controls the reflecting surface to adjust the angle or shift the position according to the control parameters.

[0050] In the above technical solution, the execution module is calibrated to respond to the control command. The specific calibration process is: first, the self-calibration mode is started; then, the target adjustment amount is calculated and obtained. Determine the measurement position information of each key point of the current light spot to form a set of measurement position coordinates; then, based on the three-dimensional coordinates of the light spot measured in the initial reflection surface and the set of measurement position coordinates, transmit them to the control model of the controller for three-dimensional simulation machine calculation and output control parameters; finally, the controller controls the reflection surface to adjust the angle or offset the position according to the control parameters.

[0051] It needs to be explained that the control parameters received by the controller are a series of position determination processes performed after the self-calibration mode is started according to the control instructions, which are all within the scope of the existing technology, and the specific method in which the controller selects regulation according to the size of the control parameters is pre-set according to the historical regulation size, which will not be elaborated here.

[0052] As an embodiment of the present invention, it also includes a feedback module, which is used to transmit the reflection surface measurement result adjusted by the execution module to the signal control center.

[0053] In the above technical solution, in order to allow the measurement system to adjust the input according to the deviation between the actual output and the expected output, the overall stability and accuracy of the measurement system are ensured.

[0054] The feedback module in this embodiment generally includes a sensor, a signal processing circuit and a communication interface. The sensor is used to collect the actual output of the system or the state of the execution module and convert this information into an electrical signal; the signal processing circuit amplifies, filters and converts the output signal of the sensor to meet the requirements of the control system; and the communication interface is responsible for sending the processed signal back to the signal control center.

[0055] In the signal control center, the feedback signal is compared with the reference input signal (desired output) to generate an error signal; the control algorithm (such as the PID controller) calculates the control action based on the error signal, and these control actions adjust the system behavior through the execution module to reduce the error and make the system output approach or reach the desired state.

[0056] Combining the reflective surface module, camera module, sensor module, control module, and execution module designed in the above measurement system, the feedback mechanism of the feedback module can improve the anti-disturbance ability of the entire measurement system, reduce the impact of external interference on system performance, and compensate for the deviation caused by changes in measurement system parameters and aging to a certain extent. In addition, feedback control can also realize the adaptive and optimized control of the system and improve the overall control effect.

[0057] See also Figure 2 As shown, the present invention provides a telescope reflection surface positioning measurement method based on the telescope reflection surface positioning measurement system, which specifically includes the following steps: Step 1: Collect the light of the measuring object and reflect it to the target focus to form a light spot; a detector is arranged at the target focus; a controller is arranged at the bottom of the reflection surface module; Step 2: record the current spot position measurement image through industrial camera calibration, and obtain the spot measurement position change parameters within the target time period; Step 3: Detect and obtain the actual contour information of the light spot area on the reflecting surface, and determine the actual position change parameters of the light spot in combination with the light spot measurement position change parameters; Step 4: Generate control instructions based on the actual position change parameters of the light spot and calculate the target adjustment amount; Step 5: Calibrate the position of the reflective surface according to the control instruction; Step 6: The feedback-adjusted reflective surface measurement result is transmitted to the signal control center.

[0058] Each embodiment in this specification is described in a progressive manner, and the same or similar parts between the embodiments can be referred to each other, and each embodiment focuses on the differences from other embodiments. In particular, for the device, equipment, and non-volatile computer storage medium embodiments, since they are basically similar to the method embodiments, the description is relatively simple, and the relevant parts can be referred to the partial description of the method embodiment.

[0059] The above specific embodiments of this specification are described. Other embodiments are within the scope of the attached documents. In some cases, the actions or steps recorded in this application can be performed in an order different from that in the embodiments and still achieve the desired results. In addition, the process depicted in the accompanying drawings does not necessarily require the specific order or continuous order shown to achieve the desired results. In some embodiments, multitasking and parallel processing are also possible or may be advantageous.

[0060] The above contents are merely examples and explanations of the concept of the present invention. Those skilled in the art may make various modifications or additions to the specific embodiments described or replace them in a similar manner. As long as they do not deviate from the concept of the invention or exceed the scope defined in this application, they shall all fall within the protection scope of the present invention.

Claims

1. A telescope reflection surface positioning measurement system, characterized in that: include: A reflective surface module is used to collect the light of the measuring object and reflect it to the target focus to form a light spot; a detector is arranged at the target focus, and a controller is arranged at the bottom of the reflective surface module; The camera module is used to record the current spot position measurement image through industrial camera calibration and obtain the spot measurement position change parameters within the target time period; The sensor module is used to detect and obtain the actual contour information of the light spot area of ​​the reflective surface, and determine the actual position change parameters of the light spot in combination with the light spot measurement position change parameters obtained by the camera module; A control module, used to generate a control instruction and calculate a target adjustment amount according to the actual position change parameters of the light spot acquired by the sensor module; The control module comprises: By formula Calculate the adjustment factor ; in, is the total number of focal spots, ∈ ; For the front The actual position deviation of each light spot; For the front The standard deviation of the actual position of each light spot; For the front The average value of the actual position deviation of each light spot; For the front A preset weight coefficient for the influence of the actual position deviation in each focal spot on the position deviation of the reflecting surface; is the preset adjustment function; The generation process of the control instruction is as follows: The adjustment factor With the preset adjustment factor threshold To compare: like ≥ , it is judged that the focus position deviation of the reflecting surface is large, and a control instruction is generated; like < , it is judged that the deviation of the focus position of the reflecting surface is small, and the measurement process continues; The execution module is used to calibrate the position of the reflection surface according to the control instruction of the control module.

2. A telescope reflection surface positioning and measurement system according to claim 1, characterized in that: The camera module comprises: Calculate the camera parameters based on the spot image matrix obtained by detecting camera corner points in different orientations; Determine the current spot measurement position image according to the camera parameters and the three-dimensional model; Obtaining the three-dimensional coordinate system position change data of the light spot measurement profile within the target time period; The three-dimensional coordinate system position change data set of the spot measurement profile at different times and the target time period information are input into the linear projection model to obtain the projection coefficient and output the spot measurement position change parameters.

3. A telescope reflection surface positioning and measurement system according to claim 2, characterized in that: The sensor module determines the actual position change parameters of the light spot in the following manner: Obtaining an electrical signal of contour information of the light spot area of ​​the reflecting surface through an optical sensor; Converting the contour information electrical signal into contour digital signal parameters through frequency domain; The light spot measurement position change parameters and the corresponding contour digital signal parameters are obtained and input into the perspective projection simulation model to output the light spot actual position change parameters.

4. A telescope reflection surface positioning and measurement system according to claim 1, characterized in that: The former The actual position deviation of the light spot The method to obtain is: By formula Before calculation The actual position deviation of the light spot ,in is the total number of key points of the spot area contour, ∈ ; is the target time interval, and 0< < ; is the position coefficient of the key point of the contour of the current spot area; For the The contour of the spot area on the spot The actual position change parameters of key points; For the The contour of the spot area on the spot The standard value of the actual position change parameter of each key point; For preset The contour of the spot area on the spot The actual position change parameter deviation value of each key point.

5. A telescope reflection surface positioning and measuring system according to claim 4, characterized in that: The control module obtains the calculation method of the key point target adjustment amount as follows: By formula Calculate key points Target adjustment amount ;in, is the mapping function from the actual position to the measured position; For point The preset position coefficients.

6. A telescope reflection surface positioning and measuring system according to claim 5, characterized in that: The process of the execution module calibrating the position of the reflective surface according to the control instruction includes: Start the self-calibration mode; Adjust amount according to target Determine the measurement position information of each key point of the light spot to form a measurement position coordinate set; The three-dimensional coordinates of the light spot measured on the initial reflection surface and the measurement position coordinate set are transmitted to the control model of the controller for three-dimensional simulation, and the control parameters are output; The controller controls the reflecting surface to adjust the angle or shift the position according to the control parameters.

7. A telescope reflection surface positioning and measuring system according to claim 1, characterized in that: It also includes a feedback module, which is used to transmit the reflection surface measurement result adjusted by the execution module to the signal control center.

8. A method for measuring the positioning of a telescope reflecting surface, characterized in that: Based on the telescope reflection surface positioning and measurement system according to any one of claims 1 to 7, the method comprises the following steps: Step 1: Collect the light of the measuring object and reflect it to the target focus to form a light spot; a detector is arranged at the target focus; a controller is arranged at the bottom of the reflection surface module; Step 2: record the current spot position measurement image through industrial camera calibration, and obtain the spot measurement position change parameters within the target time period; Step 3: Detect and obtain the actual contour information of the light spot area on the reflecting surface, and determine the actual position change parameters of the light spot in combination with the light spot measurement position change parameters; Step 4: Generate control instructions based on the actual position change parameters of the light spot and calculate the target adjustment amount; Step 5: Calibrate the position of the reflective surface according to the control instruction; Step 6: The feedback-adjusted reflective surface measurement result is transmitted to the signal control center.

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