Sensor calibration method and device, electronic equipment and storage medium

Abstract

The embodiment of the invention provides a sensor calibration method and device, electronic equipment and a storage medium. According to the scheme, a first parameter set when the internal temperature of the refrigerator changes is obtained, the first parameter set comprises a plurality of calibration parameter sets, and each calibration parameter set comprises resistance value data collected by a temperature controller for a target sensor and temperature data collected by the temperature controller for a reference sensor at the same moment; and generating a calibration relation between the resistance value and the temperature corresponding to the target sensor based on the corresponding relation between the resistance value data and the temperature data collected at the same moment. Through the technical scheme provided by the embodiment of the invention, the waste of human resources is reduced, and the accuracy of the calibration result is improved, so that the accurate control on the temperature in the operation process of the refrigerator is enhanced.

Description

Technical Field

[0001] The present application relates to the field of sensor manufacturing technology, and in particular to a sensor calibration method, device, electronic equipment and storage medium. Background Art

[0002] At present, quantum chips generally operate at extremely low temperatures due to their stringent requirements on ambient temperature. For example, quantum chips need to operate in a low-temperature environment of 10 milliKelvin (mK). The refrigerator is an important guarantee for providing an extremely low-temperature operating environment for quantum chips. A large number of temperature sensors and temperature controllers are distributed in the refrigerator to achieve precise temperature control during the operation of the refrigerator.

[0003] In order to ensure accurate control of the temperature during the operation of the refrigerator, it is necessary to calibrate each temperature sensor in the refrigerator. In the related art, the calibration of each temperature sensor in the refrigerator is achieved through manual measurement and manual calibration. This requires a large amount of human resources to be consumed during the calibration process, resulting in a waste of human resources. In addition, since manual measurement and manual calibration processes will inevitably introduce human errors, this will seriously affect the accuracy of the final calibration results, thereby affecting the accurate control of the temperature during the operation of the refrigerator. Summary of the invention

[0004] The purpose of the embodiments of the present application is to provide a sensor calibration method, device, electronic device and storage medium to reduce the waste of human resources, improve the accuracy of calibration results, and thus enhance the precise control of temperature during the operation of the refrigerator. The specific technical solution is as follows:

[0005] The present application provides a sensor calibration method, the method comprising:

[0006] Acquire a first parameter set when the internal temperature of the refrigerator changes, wherein the first parameter set includes a plurality of calibration parameter groups, each calibration parameter group includes resistance data collected by the temperature controller for the target sensor at the same time, and temperature data collected by the temperature controller for the reference sensor;

[0007] Based on the corresponding relationship between the resistance data and the temperature data collected at the same time, a calibration relationship between the corresponding resistance value and the temperature of the target sensor is generated.

[0008] Optionally, the step of generating a calibration relationship between the corresponding resistance value and temperature of the target sensor based on the corresponding relationship between the resistance value data and the temperature data collected at the same time includes:

[0009] According to the corresponding relationship between the resistance data and the temperature data in each calibration parameter group and the preset temperature data, a fitting curve indicating the change of the temperature data with the resistance data is generated as the calibration relationship between the corresponding resistance value and the temperature of the target sensor.

[0010] Optionally, the step of generating a fitting curve indicating the change of temperature data with resistance data according to the corresponding relationship between resistance data and temperature data in each calibration parameter group and preset temperature data as a calibration relationship between the corresponding resistance value and temperature of the target sensor includes:

[0011] Filtering the calibration parameter groups in the first parameter set according to the preset temperature data and the temperature data in each calibration parameter group to obtain a second parameter set;

[0012] According to the corresponding relationship between the resistance data and the temperature data included in each calibration parameter group in the second parameter set, a fitting curve indicating the change of the temperature data with the resistance data is generated as the calibration relationship between the corresponding resistance and temperature of the target sensor.

[0013] Optionally, the step of screening the calibration parameter groups in the first parameter set according to the preset temperature data and the temperature data in each calibration parameter group to obtain the second parameter set includes:

[0014] The calibration parameter groups whose temperature data do not match the preset temperature data in the first parameter set are eliminated to obtain a second parameter set.

[0015] Optionally, the step of screening the calibration parameter groups in the first parameter set according to the preset temperature data and the temperature data in each calibration parameter group to obtain the second parameter set includes:

[0016] Eliminate the calibration parameter group whose temperature data does not match the preset temperature data in the first parameter set to obtain a third parameter set;

[0017] The abnormal calibration parameter group in the third parameter set is eliminated to obtain a second parameter set; wherein the abnormal calibration parameter group is a calibration parameter group in which the temperature data and the resistance data do not satisfy monotonicity.

[0018] Optionally, the step of screening the calibration parameter groups in the first parameter set according to the preset temperature data and the temperature data in each calibration parameter group to obtain the second parameter set includes:

[0019] Eliminate the calibration parameter group whose temperature data does not match the preset temperature data in the first parameter set to obtain a third parameter set;

[0020] According to the temperature data included in each calibration parameter group in the third parameter set, a deduplication operation is performed on the calibration parameter groups in the third parameter set to obtain a second parameter set.

[0021] Optionally, the step of screening the calibration parameter groups in the first parameter set according to the preset temperature data and the temperature data in each calibration parameter group to obtain the second parameter set includes:

[0022] Eliminate the calibration parameter group whose temperature data does not match the preset temperature data in the first parameter set to obtain a third parameter set;

[0023] According to the temperature data included in each calibration parameter group in the third parameter set, performing a deduplication operation on the calibration parameter groups in the third parameter set to obtain a fourth parameter set;

[0024] Abnormal calibration parameter groups in the fourth reference set are eliminated to obtain a second parameter set; wherein the abnormal calibration parameter group is a calibration parameter group in which the temperature data and the resistance data do not satisfy monotonicity.

[0025] Optionally, the step of generating a calibration relationship between the corresponding resistance value and temperature of the target sensor based on the corresponding relationship between the resistance value data and the temperature data collected at the same time includes:

[0026] According to the corresponding relationship between the resistance data and the temperature data in each calibration parameter group, a fitting curve indicating the change of the temperature data with the resistance data is generated as the calibration relationship between the corresponding resistance value and the temperature of the target sensor.

[0027] Optionally, the method further includes:

[0028] The calibration relationship is transmitted to the temperature controller, so that the temperature controller determines the temperature data of the target sensor based on the calibration relationship and the resistance data collected for the target sensor during the operation of the refrigerator.

[0029] The present application also provides a sensor calibration device, the device comprising:

[0030] An acquisition module, used to acquire a first parameter set when the internal temperature of the refrigerator changes, wherein the first parameter set includes a plurality of calibration parameter groups, each calibration parameter group includes resistance data collected by the temperature controller for the target sensor at the same time, and temperature data collected by the temperature controller for the reference sensor;

[0031] The generating module is used to generate a calibration relationship between the corresponding resistance value and temperature of the target sensor based on the corresponding relationship between the resistance value data and the temperature data collected at the same time.

[0032] Optionally, the generation module is specifically used to generate a fitting curve indicating the change of temperature data with resistance data according to the corresponding relationship between resistance data and temperature data in each calibration parameter group and preset temperature data, as the calibration relationship between the corresponding resistance and temperature of the target sensor.

[0033] Optionally, the generating module is specifically configured to filter the calibration parameter groups in the first parameter set according to the preset temperature data and the temperature data in each calibration parameter group to obtain the second parameter set;

[0034] According to the corresponding relationship between the resistance data and the temperature data included in each calibration parameter group in the second parameter set, a fitting curve indicating the change of the temperature data with the resistance data is generated as the calibration relationship between the corresponding resistance and temperature of the target sensor.

[0035] Optionally, the generating module is specifically used to eliminate the calibration parameter groups in the first parameter set whose temperature data do not match the preset temperature data, to obtain the second parameter set.

[0036] Optionally, the generating module is specifically used to remove the calibration parameter group whose temperature data does not match the preset temperature data in the first parameter set, to obtain a third parameter set;

[0037] The abnormal calibration parameter group in the third parameter set is eliminated to obtain a second parameter set; wherein the abnormal calibration parameter group is a calibration parameter group in which the temperature data and the resistance data do not satisfy monotonicity.

[0038] Optionally, the generating module is specifically used to remove the calibration parameter group whose temperature data does not match the preset temperature data in the first parameter set, to obtain a third parameter set;

[0039] According to the temperature data included in each calibration parameter group in the third parameter set, a deduplication operation is performed on the calibration parameter groups in the third parameter set to obtain a second parameter set.

[0040] Optionally, the generating module is specifically used to remove the calibration parameter group whose temperature data does not match the preset temperature data in the first parameter set, to obtain a third parameter set;

[0041] According to the temperature data included in each calibration parameter group in the third parameter set, performing a deduplication operation on the calibration parameter groups in the third parameter set to obtain a fourth parameter set;

[0042] Abnormal calibration parameter groups in the fourth reference set are eliminated to obtain a second parameter set; wherein the abnormal calibration parameter group is a calibration parameter group in which the temperature data and the resistance data do not satisfy monotonicity.

[0043] Optionally, the generating module is specifically used to generate a fitting curve indicating the change of temperature data with resistance data according to the corresponding relationship between resistance data and temperature data in each calibration parameter group, as the calibration relationship between the corresponding resistance and temperature of the target sensor.

[0044] Optionally, the device further comprises:

[0045] The transmission module is used to transmit the calibration relationship to the temperature controller, so that the temperature controller determines the temperature data of the target sensor based on the calibration relationship and the resistance data collected for the target sensor during the operation of the refrigerator.

[0046] The embodiment of the present application also provides an electronic device, including a processor, a communication interface, a memory and a communication bus, wherein the processor, the communication interface and the memory communicate with each other via the communication bus;

[0047] Memory, used to store computer programs;

[0048] The processor is used to implement any of the above-mentioned steps of the sensor calibration method when executing the program stored in the memory.

[0049] An embodiment of the present application further provides a computer-readable storage medium, wherein the computer-readable storage medium stores a computer program, and when the computer program is executed by a processor, any of the above-mentioned steps of the sensor calibration method is implemented.

[0050] An embodiment of the present application also provides a computer program product comprising instructions, which, when executed on a computer, enables the computer to execute any of the sensor calibration methods described above.

[0051] Beneficial effects of the embodiments of the present application:

[0052] The technical solution provided in the embodiment of the present application can generate a calibration relationship between the corresponding resistance value and temperature of the target sensor based on the corresponding relationship between the resistance value data and the temperature data collected at the same time in the first parameter set when the first parameter set is obtained. Since the data included in each punctuation parameter group in the first parameter set are: the resistance value data and the temperature data collected by the temperature controller for the target sensor and the reference sensor at the same time, each calibration parameter group includes a set of corresponding relationships between the resistance value data and the temperature data. Based on this corresponding relationship, the temperature data of the reference sensor can be used in combination with the resistance value data of the target sensor itself to realize the calibration of the relationship between the resistance value and the temperature of the target sensor.

[0053] In the embodiment of the present application, since the data collection and data calibration of the calibration process are completed by electronic equipment, human participation is avoided, which effectively reduces the waste of human resources and the introduction of human errors, improves the accuracy of the calibration results, and thus enhances the precise control of the temperature during the operation of the refrigerator.

[0054] In addition, since the temperature controller, target sensor and reference sensor are all located in the refrigerator, the temperature data of the reference sensor is combined with the resistance data of the target sensor to calibrate the relationship between resistance and temperature of the target sensor. This can match the calibration result with the actual usage scenario of the target sensor, effectively improving the accuracy of the calibration result, thereby enhancing the precise control of the temperature during the operation of the refrigerator.

[0055] Of course, implementing any product or method of the present application does not necessarily require achieving all of the advantages described above at the same time. BRIEF DESCRIPTION OF THE DRAWINGS

[0056] In order to more clearly illustrate the embodiments of the present application or the technical solutions in the prior art, the drawings required for use in the embodiments or the description of the prior art will be briefly introduced below. Obviously, the drawings described below are only some embodiments of the present application. For ordinary technicians in this field, other drawings can be obtained based on these drawings without paying creative work.

[0057] Figure 1 A schematic diagram of a first flow chart of a sensor calibration method provided in an embodiment of the present application;

[0058] Figure 2 A second flow chart of the sensor calibration method provided in the embodiment of the present application;

[0059] Figure 3 A third flow chart of the sensor calibration method provided in the embodiment of the present application;

[0060] Figure 4 A fourth flow chart of the sensor calibration method provided in an embodiment of the present application;

[0061] Figure 5 A fifth flow chart of the sensor calibration method provided in the embodiment of the present application;

[0062] Figure 6 A sixth flow chart of the sensor calibration method provided in the embodiment of the present application;

[0063] Figure 7 A seventh flow chart of the sensor calibration method provided in the embodiment of the present application;

[0064] Figure 8 A resistance-temperature trend graph provided in an embodiment of the present application;

[0065] Fig. 9 An eighth flow chart of the sensor calibration method provided in the embodiment of the present application;

[0066] Fig.10 A schematic diagram of a structure of a temperature controller provided in an embodiment of the present application communicating with an electronic device;

[0067] Fig.11 A signaling diagram of a sensor calibration method provided in an embodiment of the present application;

[0068] Fig.12 A schematic diagram of the structure of a sensor calibration device provided in an embodiment of the present application;

[0069] Fig.13 A schematic diagram of the structure of an electronic device provided in an embodiment of the present application. DETAILED DESCRIPTION

[0070] The following will be combined with the drawings in the embodiments of the present application to clearly and completely describe the technical solutions in the embodiments of the present application. Obviously, the described embodiments are only part of the embodiments of the present application, not all of the embodiments. Based on the embodiments in the present application, all other embodiments obtained by ordinary technicians in this field without creative work are within the scope of protection of this application.

[0071] In order to solve the problems in the related art, the embodiment of the present application provides a sensor calibration method. The method can be applied to any electronic device connected to the temperature controller for communication, such as a host computer, a computer, etc. Here, the electronic device is not specifically limited. Figure 1 As shown, Figure 1 A first flow chart of a sensor calibration method provided in an embodiment of the present application. The method includes the following steps.

[0072] Step S101, obtaining a first parameter set when the internal temperature of the refrigerator changes, the first parameter set includes multiple calibration parameter groups, each calibration parameter group includes resistance data collected by the temperature controller for the target sensor at the same time, and temperature data collected by the temperature controller for the reference sensor.

[0073] Step S102: Based on the corresponding relationship between the resistance data and the temperature data collected at the same time, a calibration relationship between the corresponding resistance value and the temperature of the target sensor is generated.

[0074] In the embodiment of the present application, the target sensor and the reference sensor may be temperature sensors. The target sensor, the reference sensor and the temperature controller are all deployed inside the refrigerator. Since the refrigerator needs to perform cooling treatment layer by layer when providing an extremely low temperature operating environment for the quantum chip, multiple temperature sensors and temperature controllers are deployed on each layer inside the refrigerator.

[0075] The temperature controller can be used to manage and control the temperature sensors. Each temperature controller can manage and control one or more temperature sensors at the same time.

[0076] Here, there is no specific limitation on the number, deployment location, etc. of the temperature sensors and temperature controllers on the above-mentioned refrigerator.

[0077] Through the method provided in the embodiments of the present application,

[0078] When the first parameter set is obtained, a calibration relationship between the corresponding resistance value and temperature of the target sensor can be generated based on the corresponding relationship between the resistance value data and the temperature data collected at the same time in the first parameter set. Since the data included in each punctuation parameter group in the first parameter set are: the resistance value data and the temperature data collected by the temperature controller for the target sensor and the reference sensor at the same time, each calibration parameter group includes a set of corresponding relationships between the resistance value data and the temperature data. Based on the corresponding relationship, the temperature data of the reference sensor can be used in combination with the resistance value data of the target sensor itself to realize the calibration of the relationship between the resistance value and the temperature of the target sensor.

[0079] In the embodiment of the present application, since the data collection and data calibration of the calibration process are completed by electronic equipment, human participation is avoided, which effectively reduces the waste of human resources and the introduction of human errors, improves the accuracy of the calibration results, and thus enhances the precise control of the temperature during the operation of the refrigerator.

[0080] In addition, since the temperature controller, target sensor and reference sensor are all located in the refrigerator, the temperature data of the reference sensor is combined with the resistance data of the target sensor to calibrate the relationship between resistance and temperature of the target sensor. This can match the calibration result with the actual usage scenario of the target sensor, effectively improving the accuracy of the calibration result, thereby enhancing the precise control of the temperature during the operation of the refrigerator.

[0081] The embodiments of the present application are described below through specific examples.

[0082] For the above step S101, that is, obtaining the first parameter set when the internal temperature of the refrigerator changes, the first parameter set includes multiple calibration parameter groups, each calibration parameter group includes resistance data collected by the temperature controller for the target sensor at the same time, and temperature data collected by the temperature controller for the reference sensor.

[0083] In the embodiment of the present application, there are three operating states when the refrigerator is operating normally, namely, a cooling state, a constant temperature state, and a heating state. When the refrigerator is in a cooling state, the temperature inside the refrigerator will gradually decrease from room temperature until it reaches the target temperature required for the normal operation of the quantum chip. At this time, the refrigerator will be in a constant temperature state to provide environmental support for the normal operation of the quantum chip. When the staff needs to inspect or perform routine maintenance on the quantum chip or refrigerator, the refrigerator will be in a heating state, and the temperature inside the refrigerator will gradually increase from the target temperature to room temperature.

[0084] When the refrigerator is in the above-mentioned cooling state or heating state, the temperature controller can collect the resistance data of the target sensor in real time and the temperature data of the reference sensor in real time. The resistance data and temperature data collected at the same time belong to a calibration parameter group. In this process, the temperature controller can obtain a parameter set consisting of multiple calibration parameter groups, which is recorded as a first parameter set. Here, the number of calibration parameter groups included in the first parameter set is not specifically limited.

[0085] In an optional embodiment, the resistance data may be the resistance of a temperature sensor, and the temperature data may be the thermodynamic temperature of the temperature sensor. Furthermore, the temperature data may be a temperature value corresponding to a room temperature or less. Here, the representation of the resistance data and the temperature data is not specifically limited.

[0086] After obtaining the first parameter set, the temperature controller may transmit the first parameter set to the electronic device to which it is communicatively connected. At this time, the electronic device will obtain the first parameter set when the internal temperature of the refrigerator changes.

[0087] In an optional embodiment, considering that the cooling speed of the refrigerator is significantly lower than the heating speed, while ensuring that the first parameter set includes more calibration parameter groups, in order to improve the acquisition efficiency of the first parameter set, thereby improving the calibration efficiency. When acquiring the first parameter set, the temperature controller can acquire the calibration parameter group collected when the refrigerator is in a cooling state. That is, the first parameter set acquired by the electronic device when the internal temperature of the refrigerator changes is expressed as: acquiring the first parameter set when the refrigerator is in a cooling state.

[0088] In an optional embodiment, in order to improve the accuracy of the calibration result, the target sensor and the reference sensor may be located in the same temperature layer in the refrigerator, and the target sensor and the reference sensor are temperature sensors of the same type.

[0089] The reference sensor is a temperature sensor that has completed the calibration of the relationship between resistance and temperature. The calibration method of the reference sensor can adopt the manual calibration method in the relevant technology, or the calibration method provided in the embodiment of the present application. Here, the calibration method of the reference sensor is not specifically limited.

[0090] In an optional embodiment, the temperature controller may collect the resistance data of the reference sensor while collecting the temperature data of the reference sensor, and use the resistance data as a parameter in the calibration parameter group. That is, each calibration parameter group in the first parameter set may include: the resistance data collected by the temperature controller for the target sensor at the same time (for the convenience of distinction, recorded as the first resistance data), and the temperature data and resistance data collected by the temperature controller for the reference sensor (for the convenience of distinction, recorded as the second resistance data). The use of the second resistance data can be found in the description below, which will not be elaborated here.

[0091] With respect to the above step S102 , that is, based on the corresponding relationship between the resistance data and the temperature data collected at the same time, a calibration relationship between the corresponding resistance value and the temperature of the target sensor is generated.

[0092] In this step, the electronic device may generate a calibration relationship between the corresponding resistance value and temperature of the target sensor according to the corresponding relationship between the resistance value data and the temperature data included in each calibration parameter group in the first parameter set. Alternatively, the electronic device may also generate a calibration relationship between the corresponding resistance value and temperature of the target sensor according to the corresponding relationship between the resistance value data and the temperature data included in some calibration parameter groups in the first parameter set.

[0093] In an optional embodiment, the calibration relationship between the resistance value and the temperature of the target sensor is generated based on the corresponding relationship between the resistance value data and the temperature data collected at the same time in the above step S102, which can be expressed as:

[0094] According to the corresponding relationship between the resistance data and the temperature data in each calibration parameter group, a fitting curve indicating the change of the temperature data with the resistance data is generated as the calibration relationship between the corresponding resistance value and the temperature of the target sensor.

[0095] In the embodiment of the present application, a fitting curve is directly generated according to all calibration parameter groups in the first parameter set, which effectively simplifies the calibration process data processing while realizing the calibration of the target sensor.

[0096] In another optional embodiment, according to the above Figure 1 The method shown in the figure, the embodiment of the present application also provides a sensor calibration method. Figure 2 As shown, Figure 2 A second flow chart of the sensor calibration method provided in the embodiment of the present application. The method includes the following steps.

[0097] Step S201, obtaining a first parameter set when the internal temperature of the refrigerator changes, the first parameter set includes multiple calibration parameter groups, each calibration parameter group includes resistance data collected by the temperature controller for the target sensor at the same time, and temperature data collected by the temperature controller for the reference sensor.

[0098] The above step S201 is the same as the above step S101.

[0099] Step S202, based on the corresponding relationship between the resistance data and the temperature data in each calibration parameter group and the preset temperature data, a fitting curve indicating the change of the temperature data with the resistance data is generated as the calibration relationship between the corresponding resistance and temperature of the target sensor.

[0100] In the embodiment of the present application, the preset temperature data may include multiple temperature values. The preset temperature data may be set according to the temperature zone where the target sensor is located in the refrigerator, user needs, user experience, etc.

[0101] For example, the temperature region of the target sensor in the refrigerator is: [T1, T2]. When setting the above preset temperature data, the electronic device can select multiple temperature values ​​at equal intervals within the range of [T1, T2] with Δt as the unit interval to obtain the preset temperature data.

[0102] For another example, the temperature region where the target sensor is located in the refrigerator is: [T1, T2]. When setting the above preset temperature data, the electronic device can randomly select multiple temperature values ​​from the range of [T1, T2] as the preset temperature data.

[0103] Here, there is no specific limitation on the setting method of the above-mentioned preset temperature data.

[0104] The above step S202 is a refinement of the above step S102. The execution method of step S202 can be found in the following description and will not be described in detail here.

[0105] In an embodiment of the present application, after obtaining the above-mentioned first parameter set, the electronic device can filter the calibration parameter group in the first parameter set through the above-mentioned preset temperature data, thereby realizing calibration of the target sensor according to the correspondence between the resistance data and the temperature data in the retained calibration parameter group, which effectively reduces the amount of data in the first parameter set, thereby shortening the time required for the calibration process and improving the calibration efficiency; and the data in the filtered calibration parameter group is also more accurate, which effectively improves the accuracy of the calibration result.

[0106] In an optional embodiment, according to the above Figure 2 The method shown in the figure, the embodiment of the present application also provides a sensor calibration method. Figure 3 As shown, Figure 3 The third flow chart of the sensor calibration method provided in the embodiment of the present application is as follows. Figure 3 In the method shown, the above step S202 is subdivided into the following steps, namely, step S203 to step S204.

[0107] Step S203: Screening the calibration parameter groups in the first parameter set according to the preset temperature data and the temperature data in each calibration parameter group to obtain a second parameter set.

[0108] In an optional embodiment, Figure 4 As shown, Figure 4 This is a fourth flow chart of the sensor calibration method provided in the embodiment of the present application. Figure 4 In the method shown, the above step S203 is refined into the following steps, namely step S2031.

[0109] Step S2031, eliminating the calibration parameter groups whose temperature data do not match the preset temperature data in the first parameter set to obtain a second parameter set.

[0110] In this step, for each calibration parameter group in the above-mentioned first parameter set, the electronic device can compare the temperature data in the calibration parameter group with the above-mentioned preset temperature data one by one. When the temperature data in the calibration parameter group matches the above-mentioned preset temperature data, the electronic device can retain the calibration parameter group. When the temperature data in the calibration parameter group does not match the above-mentioned preset temperature data, the electronic device can remove the calibration parameter group from the first parameter set. After each calibration parameter group is compared with the preset temperature data, the set composed of the remaining calibration parameter groups in the first parameter set is the second parameter set.

[0111] In an optional embodiment, when comparing the temperature data in the above-mentioned calibration parameter group with the preset temperature data, if there is preset temperature data that is the same as the temperature data, the electronic device can determine that the temperature data in the calibration parameter group matches the preset temperature data; if there is no preset temperature data that is the same as the temperature data, the electronic device can determine that the temperature data in the calibration parameter group does not match the preset temperature data.

[0112] In another optional embodiment, when comparing the temperature data in the above-mentioned calibration parameter group with the preset temperature data, if any temperature difference corresponding to the calibration parameter group is within the preset error range, the electronic device can determine that the temperature data in the calibration parameter group matches the preset temperature data; if all temperature difference values ​​corresponding to the calibration parameter group are not within the preset error range, the electronic device can determine that the temperature data in the calibration parameter does not match the preset temperature data.

[0113] The temperature difference corresponding to the calibration parameter group is the difference between the temperature data in the calibration parameter group and each preset temperature data. Since there are multiple preset temperature data, each calibration parameter group also corresponds to multiple temperature difference values.

[0114] The above preset error range can be set according to user needs, application scenarios, etc., and is not specifically limited here.

[0115] In the embodiment of the present application, there is no specific limitation on whether the temperature data in the calibration parameter group matches or does not match the preset temperature data. For ease of understanding, the following is only an example of determining the matching situation based on the temperature difference and the preset error range, which does not serve any limiting role.

[0116] Through the above-mentioned step S2031, the electronic device implements the screening of the calibration parameter groups in the first parameter set by matching the temperature data included in the calibration parameter groups in the first parameter set with the preset temperature data, so that the temperature data included in each calibration parameter group in the screened second parameter set matches the preset temperature data, which can eliminate abnormal data in the first parameter set to a certain extent, thereby improving the accuracy of subsequent calibration results; and, reducing the number of calibration parameter groups in the first parameter set, thereby improving calibration efficiency.

[0117] In an optional embodiment, Figure 5 As shown, Figure 5 The fifth flow chart of the sensor calibration method provided in the embodiment of the present application is as follows. Figure 5 In the method shown, the above step S203 is refined into the following steps, namely step S2032-step S2033.

[0118] Step S2032: Eliminate the calibration parameter groups whose temperature data do not match the preset temperature data in the first parameter set to obtain a third parameter set.

[0119] The method for generating the third parameter set in the above step S2032 is the same as the method for generating the second parameter set in the above step S2031, and will not be described in detail here.

[0120] Step S2033, eliminating abnormal calibration parameter groups in the third parameter set to obtain a second parameter set; wherein the abnormal calibration parameter group is a calibration parameter group whose temperature data and resistance data do not satisfy monotonicity.

[0121] In this step, the electronic device can arrange each calibration parameter group in the third parameter set in the order of increasing or decreasing resistance data (or temperature data), and eliminate abnormal calibration parameter groups according to the arrangement result to obtain the second parameter set.

[0122] For ease of understanding, we will take the arrangement of temperature data as an example. Now assume that the temperature data in the third parameter set are arranged in descending order as follows: T1, T2, T3, T4, T5. Each temperature data has only one corresponding resistance data, namely R1, R2, R3, R4, R5, and R1 <R2<R4<R5<R3。

[0123] At this time, since R3 is not between R2 and R4, this will cause the resistance data to not satisfy the monotonically decreasing characteristic. Therefore, the electronic device can determine the calibration parameter group where R3 is located as an abnormal calibration parameter group and eliminate the abnormal calibration parameter group from the above-mentioned third parameter set.

[0124] In the embodiment of the present application, the above monotonicity can be expressed as: the temperature data (or resistance data) of the temperature sensor presents a monotonically increasing characteristic or a monotonically decreasing characteristic as the resistance data (or temperature data) changes.

[0125] The monotonicity is different depending on the type of the temperature sensor. For ease of understanding, the thermistor in the temperature sensor is used as an example for explanation. The resistance data of the positive temperature coefficient thermistor increases with the increase of the temperature data, while the resistance data of the negative temperature coefficient thermistor decreases with the increase of the temperature data. Therefore, depending on the type of the temperature sensor, the monotonicity is expressed differently. Here, the monotonicity is not specifically limited.

[0126] Through the above steps S2032-S2033, after the electronic device screens the calibration parameter group in the first parameter set according to the preset temperature data, it performs a secondary screening on the screened calibration parameter group according to the monotonicity of the transformation between the temperature and resistance of the temperature sensor, which can effectively eliminate abnormal calibration parameters, thereby improving the accuracy of the calibration parameter group in the above second parameter set and ensuring the accuracy of the subsequent calibration results.

[0127] In an optional embodiment, when each calibration parameter group in the first parameter set includes the second resistance data, the electronic device can perform screening in combination with the second resistance data when screening the first parameter set. For example, when the electronic device removes the abnormal calibration parameter group, it can perform a screening based on the monotonicity and the temperature data and the second resistance data in the calibration parameter group, remove the calibration parameter group that does not meet the monotonicity, and then perform the step S2033, thereby improving the accuracy of the retained calibration parameter group.

[0128] In an optional embodiment, Figure 6 As shown, Figure 6 The sixth flow chart of the sensor calibration method provided in the embodiment of the present application is as follows. Figure 6 In the method shown, the above step S203 is refined into the following steps, namely step S2034-step S2035.

[0129] Step S2034, eliminating the calibration parameter groups whose temperature data do not match the preset temperature data in the first parameter set, to obtain a third parameter set.

[0130] The above step S2034 is the same as the above step S2032.

[0131] Step S2035: De-duplicate the calibration parameter groups in the third parameter set according to the temperature data included in each calibration parameter group in the third parameter set to obtain a second parameter set.

[0132] In this step, the number of calibration parameter groups including the same temperature data in the above-mentioned third parameter set can be multiple. At this time, the electronic device can perform a deduplication operation on the calibration parameter groups with the same temperature data in the third parameter set. That is, for multiple calibration parameter groups with the same temperature data in the third parameter set, the electronic device can only retain one calibration parameter group and eliminate the remaining calibration parameter groups. The retained calibration parameter group can be any calibration parameter group among the multiple calibration parameter groups. The third parameter set after deduplication is the second parameter set.

[0133] Through the above steps S2034-S2035, after obtaining the above-mentioned third parameter set, the electronic device performs a deduplication operation on the calibration parameter group with the same temperature data in the third parameter set, so that each temperature data in the second parameter set obtained by deduplication is unique, thereby ensuring the uniqueness of the corresponding relationship between temperature data and resistance data, thereby ensuring the accuracy of the calibration relationship between resistance and temperature generated based on the corresponding relationship.

[0134] exist Figure 6 In the method shown, for multiple calibration parameter groups with the same temperature data in the third parameter set, the electronic device ensures the uniqueness of the corresponding relationship between the resistance data and the temperature data by deduplication. In addition, the electronic device can also use other methods to ensure the uniqueness of the corresponding relationship between the resistance data and the temperature data.

[0135] For example, for multiple calibration parameter groups with the same temperature data in the third parameter set, the electronic device can select the mode, average, etc. of the resistance data in the multiple calibration parameter groups as the resistance data corresponding to the temperature data, thereby obtaining the second parameter set.

[0136] In the embodiment of the present application, the method for ensuring the uniqueness of the correspondence between the resistance data and the temperature data in the third parameter set is not specifically limited.

[0137] In an optional embodiment, Figure 7 As shown, Figure 7 The seventh flow chart of the sensor calibration method provided in the embodiment of the present application. Figure 7 In the method shown, the above step S203 is refined into the following steps, namely step S2036 to step S2038.

[0138] Step S2036, eliminating the calibration parameter groups whose temperature data do not match the preset temperature data in the first parameter set, to obtain a third parameter set.

[0139] The above step S2036 is the same as the above step S2034.

[0140] Step S2037: De-duplicate the calibration parameter groups in the third parameter set according to the temperature data included in each calibration parameter group in the third parameter set to obtain a fourth parameter set.

[0141] The method for obtaining the fourth parameter set in the above step S2037 can refer to the method for obtaining the second parameter set in the above step S2035, and will not be repeated here.

[0142] Step S2038, eliminating abnormal calibration parameter groups in the fourth reference set to obtain a second parameter set; wherein the abnormal calibration parameter group is a calibration parameter group whose temperature data and resistance data do not satisfy monotonicity.

[0143] The method for eliminating abnormal calibration parameter groups in the fourth reference set in the above step S2038 can refer to the method for eliminating abnormal calibration parameter groups in the third parameter set in the above step S2033, and will not be repeated here.

[0144] Through the above steps S2036 to S2038, the electronic device performs temperature data matching, deduplication, and elimination of abnormal calibration parameter groups in sequence for the first parameter set it obtains, thereby realizing three screenings of the calibration parameter group in the first parameter set, thereby improving the accuracy of the calibration parameter group in the processed second parameter set and the uniqueness of the correspondence between the temperature data and the resistance data in the calibration parameter group, thereby improving the accuracy of the calibration result generated based on the calibration parameter group in the second parameter set.

[0145] In the embodiment of the present application, the method for screening the calibration parameter group in the above-mentioned first parameter set is not specifically limited.

[0146] Step S204, generating a fitting curve indicating the change of temperature data with resistance data according to the corresponding relationship between resistance data and temperature data included in each calibration parameter group in the second parameter set as the calibration relationship between the corresponding resistance and temperature of the target sensor.

[0147] In an optional embodiment, the electronic device may map each calibration parameter group into a coordinate point in a two-dimensional plane coordinate system based on the correspondence between the resistance data and the temperature data included in each calibration parameter group in the second parameter set, with the resistance data as the horizontal coordinate value and the temperature data as the vertical coordinate value, and generate a fitting curve indicating the change of the temperature data with the resistance data based on each coordinate point in the two-dimensional coordinate system, as the calibration relationship between the resistance and temperature corresponding to the target sensor.

[0148] In another optional embodiment, the electronic device may store each calibration parameter group in a preset table file according to the correspondence between the resistance data and the temperature data included in each calibration parameter group in the above-mentioned third parameter set, and then generate a corresponding curve file based on the table file as the calibration relationship between the corresponding resistance and temperature of the target sensor.

[0149] For ease of understanding, the calibration relationship between the corresponding resistance value and temperature of the above target sensor can be as follows: Figure 8 As shown, Figure 8A resistance-temperature trend graph is provided in an embodiment of the present application, wherein the horizontal axis represents the resistance data in ohms (Ω), the vertical axis represents the temperature data in kelvins (K), and curve 801 is a fitting curve of the temperature data of the target sensor as it changes with the resistance data, i.e., the calibration relationship corresponding to the target sensor.

[0150] Through the above Figure 3 In the method shown, the electronic device screens the calibration parameter group in the first parameter set, thereby generating a fitting curve as the calibration relationship corresponding to the target sensor based on the corresponding relationship between each resistance data and temperature data in the screened second parameter set, thereby improving the accuracy of the generated calibration relationship while realizing the generation of the calibration relationship between the resistance value and temperature of the target sensor.

[0151] In the above embodiment, the calibration relationship between the resistance value and the temperature of the target sensor is represented by a fitting curve indicating the change of temperature data with resistance data. In addition, the calibration relationship can also be represented in other forms.

[0152] For example, a known temperature controller can recognize the data of the temperature sensor corresponding to the resistance index. i Expressed as: R′ i =log 10 R i , where log 10 is the logarithm operation with base 10, R i The resistance data collected by the temperature controller for the target sensor. For the temperature sensor, the calibration relationship can be expressed as a fitting curve corresponding to the resistance index and the temperature data.

[0153] In the embodiment of the present application, the method for expressing the calibration relationship between the resistance value and temperature of the target sensor is not specifically limited.

[0154] In an optional embodiment, according to the above Figure 1 The method shown in the figure, the embodiment of the present application also provides a sensor calibration method. Fig. 9 As shown, Fig. 9 The eighth flow chart of the sensor calibration method provided in the embodiment of the present application includes the following steps.

[0155] Step S901, obtaining a first parameter set when the internal temperature of the refrigerator changes, the first parameter set includes multiple calibration parameter groups, each calibration parameter group includes resistance data collected by the temperature controller for the target sensor at the same time, and temperature data collected by the temperature controller for the reference sensor.

[0156] Step S902: Based on the corresponding relationship between the resistance data and the temperature data collected at the same time, a calibration relationship between the corresponding resistance value and the temperature of the target sensor is generated.

[0157] The above steps S901 and S902 are the same as the above steps S101 and S102.

[0158] Step S903: transmitting the calibration relationship to the temperature controller, so that the temperature controller determines the temperature data of the target sensor based on the calibration relationship and the resistance data collected for the target sensor during the operation of the refrigerator.

[0159] In the embodiments of the present application, Fig.10 As shown, the temperature controller 1001 is communicatively connected with the electronic device 1002 .

[0160] After generating the calibration relationship, the electronic device can transmit the calibration relationship to the temperature controller. The temperature controller receives and stores the calibration relationship. When the refrigerator is in operation, the temperature controller can obtain the resistance data of the target sensor in real time, and determine the temperature data corresponding to the resistance data based on the calibration relationship stored therein.

[0161] For ease of understanding, combined Figure 8 At a certain moment in the operation of the refrigerator, after obtaining the resistance data of the target sensor at the current moment, the temperature controller can Figure 8 The calibration relationship shown in FIG. 8 shows that, on curve 801 , the temperature represented by the corresponding ordinate value when the abscissa value is the resistance data is determined, thereby determining the temperature as the temperature data of the target sensor at the current moment.

[0162] In the embodiment of the present application, only the calibration relationship corresponding to the above target sensor is used as the above Figure 8 The fitting curve shown in FIG. 1 is used as an example for explanation. In addition, the above calibration relationship can also be expressed in other forms. For example, curve data for generating the above fitting curve, or a curve function corresponding to the above fitting curve, etc. Here, the representation method of the above calibration relationship is not specifically limited.

[0163] Through the above step S903, during the operation of the refrigerator, the temperature controller can determine the temperature data of the target sensor in real time according to the calibration relationship generated by the electronic device, so as to facilitate the subsequent monitoring and adjustment of the temperature by the temperature controller.

[0164] For example, after determining the temperature data of the target sensor, the temperature controller can transmit the temperature data to the above-mentioned electronic device. The electronic device displays the temperature change curve of the target sensor in real time according to the received temperature data, thereby facilitating the staff to monitor the temperature changes in real time.

[0165] In an optional embodiment, in combination with the above Fig.10 The present application also provides a sensor calibration method. Fig.11 As shown, Fig.11 A signaling diagram of a sensor calibration method provided in an embodiment of the present application. Fig.11 The method shown includes the following steps.

[0166] Step S1101: when the refrigerator is in a cooling state, the temperature controller obtains resistance data of the target sensor and temperature data of the reference sensor to obtain parameter set 1.

[0167] The resistance data and temperature data collected at the same time are a calibration parameter group in parameter set 1.

[0168] Step S1102: The temperature controller transmits parameter set 1 to the electronic device.

[0169] In step S1103 , the electronic device compares the temperature data included in each calibration parameter group in the received parameter set 1 with the preset temperature data, removes the calibration parameter groups in the parameter set 1 whose temperature data does not match the preset temperature data, and obtains the parameter set 2 .

[0170] Step S1104 , the electronic device eliminates abnormal calibration parameter groups in parameter set 2 to obtain parameter set 3 .

[0171] Step S1105 : The electronic device performs a deduplication operation on parameter set 3 according to the temperature data included in each calibration parameter group in parameter set 3 to obtain parameter set 4 .

[0172] Step S1106 , the electronic device eliminates abnormal calibration parameter groups in parameter set 4 to obtain parameter set 5 .

[0173] Step S1107 , the electronic device generates a fitting curve indicating the change of temperature data with resistance data according to the resistance data and temperature data included in each calibration parameter group in parameter set 5 , as a calibration relationship between the resistance and temperature corresponding to the target sensor.

[0174] Step S1108: The electronic device transmits the generated calibration relationship to the temperature controller.

[0175] Step S1109: the temperature controller receives and stores the calibration relationship corresponding to the target sensor.

[0176] Step S1110, when the refrigerator is in operation, the temperature controller collects the resistance data of the target sensor at the current moment as the current resistance data.

[0177] In step S1111, the temperature controller determines the temperature data corresponding to the current resistance value as the current temperature according to the current resistance value and the calibration relationship corresponding to the stored target sensor.

[0178] Step S1112: The temperature controller transmits the current temperature of the target sensor to the electronic device.

[0179] Step S1113: the electronic device displays the received current temperature.

[0180] Based on the same inventive concept, according to the sensor calibration method provided in the above embodiment of the present application, the embodiment of the present application also provides a sensor calibration device. Fig.12 As shown, Fig.12 A schematic diagram of the structure of a sensor calibration device provided in an embodiment of the present application. The device includes the following modules.

[0181] An acquisition module 1201 is used to acquire a first parameter set when the internal temperature of the refrigerator changes, wherein the first parameter set includes a plurality of calibration parameter groups, each calibration parameter group including resistance data collected by the temperature controller for the target sensor at the same time, and temperature data collected by the temperature controller for the reference sensor;

[0182] The generating module 1202 is used to generate a calibration relationship between the corresponding resistance value and temperature of the target sensor based on the corresponding relationship between the resistance value data and the temperature data collected at the same time.

[0183] Optionally, the above-mentioned generation module 1202 can be specifically used to generate a fitting curve indicating the change of temperature data with resistance data according to the corresponding relationship between resistance data and temperature data in each calibration parameter group and preset temperature data, as the calibration relationship between the corresponding resistance and temperature of the target sensor.

[0184] Optionally, the generating module 1202 may be specifically configured to filter the calibration parameter groups in the first parameter set according to the preset temperature data and the temperature data in each calibration parameter group to obtain the second parameter set;

[0185] According to the corresponding relationship between the resistance data and the temperature data included in each calibration parameter group in the second parameter set, a fitting curve indicating the change of the temperature data with the resistance data is generated as the calibration relationship between the corresponding resistance and temperature of the target sensor.

[0186] Optionally, the generating module 1202 may be specifically used to eliminate calibration parameter groups whose temperature data in the first parameter set do not match the preset temperature data, to obtain the second parameter set.

[0187] Optionally, the generating module 1202 may be specifically used to eliminate the calibration parameter group whose temperature data does not match the preset temperature data in the first parameter set, to obtain a third parameter set;

[0188] The abnormal calibration parameter group in the third parameter set is eliminated to obtain the second parameter set; wherein the abnormal calibration parameter group is a calibration parameter group whose temperature data and resistance data do not satisfy monotonicity.

[0189] Optionally, the generating module 1202 may be specifically used to eliminate the calibration parameter group whose temperature data does not match the preset temperature data in the first parameter set, to obtain a third parameter set;

[0190] According to the temperature data included in each calibration parameter group in the third parameter set, a deduplication operation is performed on the calibration parameter groups in the third parameter set to obtain a second parameter set.

[0191] Optionally, the generating module 1202 may be specifically used to eliminate the calibration parameter group whose temperature data does not match the preset temperature data in the first parameter set, to obtain a third parameter set;

[0192] According to the temperature data included in each calibration parameter group in the third parameter set, performing a deduplication operation on the calibration parameter groups in the third parameter set to obtain a fourth parameter set;

[0193] The abnormal calibration parameter groups in the fourth reference set are eliminated to obtain a second parameter set; wherein the abnormal calibration parameter group is a calibration parameter group whose temperature data and resistance data do not satisfy monotonicity.

[0194] Optionally, the generation module 1202 may be specifically used to generate a fitting curve indicating changes in temperature data with resistance data according to the corresponding relationship between resistance data and temperature data in each calibration parameter group, as a calibration relationship between the corresponding resistance and temperature of the target sensor.

[0195] Optionally, the sensor calibration device may further include:

[0196] The transmission module is used to transmit the calibration relationship to the temperature controller, so that the temperature controller can determine the temperature data of the target sensor based on the calibration relationship and the resistance data collected for the target sensor during the operation of the refrigerator.

[0197] Through the device provided in the embodiment of the present application, when the first parameter set is obtained, based on the correspondence between the resistance data and the temperature data collected at the same time in the first parameter set, a calibration relationship between the corresponding resistance value and the temperature of the target sensor can be generated. Since the data included in each punctuation parameter group in the first parameter set are: the resistance data and the temperature data collected by the temperature controller for the target sensor and the reference sensor at the same time, each calibration parameter group includes a set of correspondence between the resistance data and the temperature data. Based on this correspondence, the temperature data of the reference sensor can be used in combination with the resistance data of the target sensor itself to realize the calibration of the relationship between the resistance value and the temperature of the target sensor.

[0198] In the embodiment of the present application, since the data collection and data calibration of the calibration process are completed by electronic equipment, human participation is avoided, which effectively reduces the waste of human resources and the introduction of human errors, improves the accuracy of the calibration results, and thus enhances the precise control of the temperature during the operation of the refrigerator.

[0199] In addition, since the temperature controller, target sensor and reference sensor are all located in the refrigerator, the temperature data of the reference sensor is combined with the resistance data of the target sensor to calibrate the relationship between resistance and temperature of the target sensor. This can match the calibration result with the actual usage scenario of the target sensor, effectively improving the accuracy of the calibration result, thereby enhancing the precise control of the temperature during the operation of the refrigerator.

[0200] Based on the same inventive concept, according to the sensor calibration method provided in the above embodiment of the present application, the embodiment of the present application also provides an electronic device, such as Fig.13 As shown, it includes a processor 1301, a communication interface 1302, a memory 1303 and a communication bus 1304, wherein the processor 1301, the communication interface 1302, and the memory 1303 communicate with each other through the communication bus 1304.

[0201] Memory 1303, used for storing computer programs;

[0202] The processor 1301 is used to implement the following steps when executing the program stored in the memory 1303:

[0203] Acquire a first parameter set when the internal temperature of the refrigerator changes, the first parameter set including a plurality of calibration parameter groups, each calibration parameter group including resistance data collected by the temperature controller for the target sensor and temperature data collected by the temperature controller for the reference sensor at the same time;

[0204] Based on the corresponding relationship between the resistance data and the temperature data collected at the same time, a calibration relationship between the corresponding resistance value and temperature of the target sensor is generated.

[0205] Through the electronic device provided by the embodiment of the present application, when the first parameter set is obtained, based on the correspondence between the resistance data and the temperature data collected at the same time in the first parameter set, a calibration relationship between the corresponding resistance value and the temperature of the target sensor can be generated. Since the data included in each punctuation parameter group in the first parameter set are: the resistance data and the temperature data collected by the temperature controller for the target sensor and the reference sensor at the same time, each calibration parameter group includes a set of correspondence between the resistance data and the temperature data. Based on this correspondence, the temperature data of the reference sensor can be used in combination with the resistance data of the target sensor itself to realize the calibration of the relationship between the resistance value and the temperature of the target sensor.

[0206] In the embodiment of the present application, since the data collection and data calibration of the calibration process are completed by electronic equipment, human participation is avoided, which effectively reduces the waste of human resources and the introduction of human errors, improves the accuracy of the calibration results, and thus enhances the precise control of the temperature during the operation of the refrigerator.

[0207] In addition, since the temperature controller, target sensor and reference sensor are all located in the refrigerator, the temperature data of the reference sensor is combined with the resistance data of the target sensor to calibrate the relationship between resistance and temperature of the target sensor. This can match the calibration result with the actual usage scenario of the target sensor, effectively improving the accuracy of the calibration result, thereby enhancing the precise control of the temperature during the operation of the refrigerator.

[0208] The communication bus mentioned in the above electronic device can be a Peripheral Component Interconnect (PCI) bus or an Extended Industry Standard Architecture (EISA) bus, etc. The communication bus can be divided into an address bus, a data bus, a control bus, etc. For ease of representation, only one thick line is used in the figure, but it does not mean that there is only one bus or one type of bus.

[0209] The communication interface is used for communication between the above electronic device and other devices.

[0210] The memory may include a random access memory (RAM) or a non-volatile memory (NVM), such as at least one disk memory. Optionally, the memory may also be at least one storage device located away from the aforementioned processor.

[0211] The above-mentioned processor can be a general-purpose processor, including a central processing unit (CPU), a network processor (NP), etc.; it can also be a digital signal processor (DSP), an application specific integrated circuit (ASIC), a field programmable gate array (FPGA) or other programmable logic devices, discrete gate or transistor logic devices, discrete hardware components.

[0212] Based on the same inventive concept, according to the sensor calibration method provided in the above-mentioned embodiments of the present application, the embodiments of the present application also provide a computer-readable storage medium, which stores a computer program. When the computer program is executed by a processor, the steps of any of the above-mentioned sensor calibration methods are implemented.

[0213] Based on the same inventive concept, according to the sensor calibration method provided in the above-mentioned embodiments of the present application, the embodiments of the present application also provide a computer program product containing instructions, which, when executed on a computer, enables the computer to execute any sensor calibration method in the above-mentioned embodiments.

[0214] In the above embodiments, it can be implemented in whole or in part by software, hardware, firmware or any combination thereof. When implemented using software, it can be implemented in whole or in part in the form of a computer program product. The computer program product includes one or more computer instructions. When the computer program instructions are loaded and executed on a computer, the process or function described in the embodiment of the present application is generated in whole or in part. The computer may be a general-purpose computer, a special-purpose computer, a computer network, or other programmable device. The computer instructions may be stored in a computer-readable storage medium, or transmitted from one computer-readable storage medium to another computer-readable storage medium, for example, the computer instructions may be transmitted from a website site, computer, server or data center by wired (e.g., coaxial cable, optical fiber, digital subscriber line (DSL)) or wireless (e.g., infrared, wireless, microwave, etc.) mode to another website site, computer, server or data center. The computer-readable storage medium may be any available medium that a computer can access or a data storage device such as a server or data center that includes one or more available media integrated. The available medium may be a magnetic medium, (e.g., a floppy disk, a hard disk, a tape), an optical medium (e.g., a DVD), or a semiconductor medium (e.g., a solid-state drive Solid State Disk (SSD)), etc.

[0215] It should be noted that, in this article, relational terms such as first and second, etc. are only used to distinguish one entity or operation from another entity or operation, and do not necessarily require or imply any such actual relationship or order between these entities or operations. Moreover, the terms "include", "comprise" or any other variants thereof are intended to cover non-exclusive inclusion, so that a process, method, article or device including a series of elements includes not only those elements, but also other elements not explicitly listed, or also includes elements inherent to such process, method, article or device. In the absence of further restrictions, the elements defined by the sentence "comprise a ..." do not exclude the existence of other identical elements in the process, method, article or device including the elements.

[0216] Each embodiment in this specification is described in a related manner, and the same or similar parts between the embodiments can be referred to each other, and each embodiment focuses on the differences from other embodiments. In particular, for embodiments such as devices, electronic devices, computer-readable storage media, and computer program products, since they are basically similar to method embodiments, the description is relatively simple, and the relevant parts can be referred to the partial description of the method embodiments.

[0217] The above description is only a preferred embodiment of the present application and is not intended to limit the protection scope of the present application. Any modification, equivalent replacement, improvement, etc. made within the spirit and principle of the present application are included in the protection scope of the present application.

Claims

1. A sensor calibration method, characterized in that: The method comprises: Acquire a first parameter set when the internal temperature of the refrigerator changes, wherein the first parameter set includes a plurality of calibration parameter groups, each calibration parameter group includes resistance data collected by the temperature controller for the target sensor at the same time, and temperature data collected by the temperature controller for the reference sensor; Based on the corresponding relationship between the resistance data and the temperature data collected at the same time, a calibration relationship between the corresponding resistance value and the temperature of the target sensor is generated.

2. The method according to claim 1, characterized in that The step of generating a calibration relationship between the corresponding resistance value and temperature of the target sensor based on the corresponding relationship between the resistance value data and the temperature data collected at the same time includes: According to the corresponding relationship between the resistance data and the temperature data in each calibration parameter group and the preset temperature data, a fitting curve indicating the change of the temperature data with the resistance data is generated as the calibration relationship between the corresponding resistance value and the temperature of the target sensor.

3. The method according to claim 2, characterized in that The step of generating a fitting curve indicating the change of temperature data with resistance data as a calibration relationship between the resistance value and temperature of the target sensor according to the corresponding relationship between the resistance value data and the temperature data in each calibration parameter group and the preset temperature data, comprises: Filtering the calibration parameter groups in the first parameter set according to the preset temperature data and the temperature data in each calibration parameter group to obtain a second parameter set; According to the corresponding relationship between the resistance data and the temperature data included in each calibration parameter group in the second parameter set, a fitting curve indicating the change of the temperature data with the resistance data is generated as the calibration relationship between the corresponding resistance and temperature of the target sensor.

4. The method according to claim 3, characterized in that The step of screening the calibration parameter groups in the first parameter set according to the preset temperature data and the temperature data in each calibration parameter group to obtain the second parameter set includes: The calibration parameter groups whose temperature data do not match the preset temperature data in the first parameter set are eliminated to obtain a second parameter set.

5. The method according to claim 3, characterized in that: The step of screening the calibration parameter groups in the first parameter set according to the preset temperature data and the temperature data in each calibration parameter group to obtain the second parameter set includes: Eliminate the calibration parameter group whose temperature data does not match the preset temperature data in the first parameter set to obtain a third parameter set; The abnormal calibration parameter group in the third parameter set is eliminated to obtain a second parameter set; wherein the abnormal calibration parameter group is a calibration parameter group in which the temperature data and the resistance data do not satisfy monotonicity.

6. The method according to claim 3, characterized in that The step of screening the calibration parameter groups in the first parameter set according to the preset temperature data and the temperature data in each calibration parameter group to obtain the second parameter set includes: Eliminate the calibration parameter group whose temperature data does not match the preset temperature data in the first parameter set to obtain a third parameter set; According to the temperature data included in each calibration parameter group in the third parameter set, a deduplication operation is performed on the calibration parameter groups in the third parameter set to obtain a second parameter set.

7. The method according to claim 3, characterized in that The step of screening the calibration parameter groups in the first parameter set according to the preset temperature data and the temperature data in each calibration parameter group to obtain the second parameter set includes: Eliminate the calibration parameter group whose temperature data does not match the preset temperature data in the first parameter set to obtain a third parameter set; According to the temperature data included in each calibration parameter group in the third parameter set, performing a deduplication operation on the calibration parameter groups in the third parameter set to obtain a fourth parameter set; Abnormal calibration parameter groups in the fourth reference set are eliminated to obtain a second parameter set; wherein the abnormal calibration parameter group is a calibration parameter group in which the temperature data and the resistance data do not satisfy monotonicity.

8. The method according to claim 1, characterized in that The step of generating a calibration relationship between the corresponding resistance value and temperature of the target sensor based on the corresponding relationship between the resistance value data and the temperature data collected at the same time includes: According to the corresponding relationship between the resistance data and the temperature data in each calibration parameter group, a fitting curve indicating the change of the temperature data with the resistance data is generated as the calibration relationship between the corresponding resistance value and the temperature of the target sensor.

9. The method according to any one of claims 1 to 8, characterized in that: The method further comprises: The calibration relationship is transmitted to the temperature controller, so that the temperature controller determines the temperature data of the target sensor based on the calibration relationship and the resistance data collected for the target sensor during the operation of the refrigerator.

10. A sensor calibration device, characterized in that: The device comprises: An acquisition module, used to acquire a first parameter set when the internal temperature of the refrigerator changes, wherein the first parameter set includes a plurality of calibration parameter groups, each calibration parameter group includes resistance data collected by the temperature controller for the target sensor at the same time, and temperature data collected by the temperature controller for the reference sensor; The generating module is used to generate a calibration relationship between the corresponding resistance value and temperature of the target sensor based on the corresponding relationship between the resistance value data and the temperature data collected at the same time.

11. An electronic device, characterized in that: It includes a processor, a communication interface, a memory and a communication bus, wherein the processor, the communication interface and the memory communicate with each other through the communication bus; Memory, used to store computer programs; A processor, for implementing the method steps described in any one of claims 1 to 9 when executing a program stored in a memory.

12. A computer-readable storage medium, characterized in that: The computer-readable storage medium stores a computer program, and when the computer program is executed by a processor, the method steps described in any one of claims 1 to 9 are implemented.

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