Test circuit, test method, test system and storage medium

Abstract

The invention relates to the technical field of diode testing, in particular to a testing circuit, a testing method, a testing system and a storage medium. The test circuit at least comprises a base 1 and a base 2, and the base 1 and the base 2 are respectively connected with a plurality of light emitting diodes in series; one end of the seat 1 and one end of the seat 2 are respectively connected to the positive electrode of a direct-current power supply through a current-limiting resistor (R2) and a current-limiting resistor (R4), and the other ends of the seat 1 and the seat 2 are respectively connected with the collectors of a triode (Q1) and a triode (Q2) and are simultaneously connected with one end of a capacitor (C1) and one end of a capacitor (C2). By optimizing the circuit structure and introducing the algorithm, the precision, efficiency and coverage range of the performance test of the light-emitting diode are improved.

Description

Technical Field

[0001] The present invention relates to the technical field of diode testing, and in particular to a testing circuit, a testing method, a testing system and a storage medium. Background Art

[0002] As an efficient and energy-saving solid-state light source, light-emitting diodes are widely used in display, lighting, communication and other fields. With the continuous innovation of light-emitting diode technology, the accurate evaluation of its performance parameters will directly affect the quality of the product. However, the current light-emitting diode performance test methods and equipment have several limitations, mainly manifested in low test accuracy, complex operation and limited dynamic range.

[0003] In the traditional light-emitting diode testing process, most circuit structures are complex in design, difficult to quickly adapt to a variety of testing requirements, and there are many problems in parameter adjustment and stability. In addition, the functions of related test equipment in terms of strobe frequency, brightness adjustment and safety protection are relatively simple, and cannot fully cover the various performance testing requirements of LEDs.

[0004] In terms of test circuit design, existing technologies often ignore the important role of capacitors in the periodic charge and discharge process, resulting in inaccurate analog voltage changes, which in turn affects the accuracy of test data. At the same time, for the calculation of luminous brightness, traditional linear models often cannot accurately describe the nonlinear luminous characteristics of LEDs under different current conditions, resulting in inconsistencies and errors in test results. Summary of the invention

[0005] The present invention provides a test circuit, a test method, a test system and a storage medium to improve the test accuracy, operation convenience and system safety of a light emitting diode.

[0006] The technical solution of the present invention to solve the above technical problems is as follows:

[0007] On the one hand, a test circuit is provided for verifying the performance of a light emitting diode, the test circuit comprising at least a seat 1 and a seat 2, wherein a plurality of light emitting diodes are connected in series on each of the seat 1 and the seat 2;

[0008] One end of the seat 1 and the seat 2 is connected to the positive electrode of the DC power supply through a current limiting resistor (R2) and a current limiting resistor (R4), respectively, and the other end is connected to the collector of the transistor (Q1) and the transistor (Q2), respectively, and the other end is simultaneously connected to one end of the capacitor (C1) and the capacitor (C2), respectively;

[0009] The base of the transistor (Q1) is connected to the positive electrode of the DC power supply via a current limiting resistor (R1), the base of the transistor (Q2) is connected to the positive electrode of the DC power supply via a current limiting resistor (R3) and the other end of the capacitor (C1), and the emitters of the transistor (Q1) and the transistor (Q2) are both connected to the negative electrode of the DC power supply and grounded;

[0010] The test circuit is controlled by a single-pole switch (S1), and the stroboscopic frequency of the light-emitting diode is changed by adjusting the capacitance values ​​of the capacitor (C1) and the capacitor (C2), and the brightness of the light-emitting diode is adjusted by changing the resistance value of the current-limiting resistor (R4) from the current-limiting resistor (R1) to the current-limiting resistor (R4) or the input voltage of the direct current power supply.

[0011] On the other hand, a test method is provided for verifying the performance of a light emitting diode, the test method comprising the steps of:

[0012] S100. Provide a test circuit as described above, wherein the test circuit is equipped with multiple light-emitting diodes (LED1, LED2, LED3, LED4), current-limiting resistors (R1, R2, R3, R4), capacitors (C1, C2), transistors (Q1, Q2), and a DC power supply combined with a single-pole switch (S1).

[0013] S200, connect the plurality of light emitting diodes (LED1, LED2, LED3, LED4) in series to the current limiting resistors (R1, R2, R3, R4) and the positive terminal of the DC power supply respectively to form a node-based current path, ensuring that the current passes through each light emitting diode to achieve a current limiting effect.

[0014] S300, using the capacitor (C1, C2) connected in parallel with the light-emitting diodes (LED1, LED2, LED3, LED4), designed to generate periodic charge and discharge phenomena in the test circuit to simulate and realize the periodic lighting and extinguishing of multiple light-emitting diodes (LED1, LED2, LED3, LED4).

[0015] S400, adjusting the resistance value of the current limiting resistor (R1, R2, R3, R4) to change the current passing through the light-emitting diode (LED1, LED2, LED3, LED4) and achieve the required luminous brightness, and obtaining data of different brightness parameters without affecting the stability of the test circuit.

[0016] S500, changing the capacitance value of the capacitor (C1, C2) to affect the charging and discharging time constant of the capacitor (C1, C2), realizing lighting of the light-emitting diodes (LED1, LED2, LED3, LED4) at different cycles and frequencies, and realizing adjustment of the stroboscopic effect.

[0017] S600, record, measure and analyze the working indicators of the light emitting diodes (LED1, LED2, LED3, LED4) under different conditions, wherein the working indicators include brightness, current load and strobe frequency, for verifying the performance parameters of the light emitting diodes (LED1, LED2, LED3, LED4).

[0018] Furthermore, the periodic charge and discharge phenomenon in the test circuit is achieved by the following expression:

[0019] Among them, V(t) is the voltage at time t, V0 is the initial voltage, R is the resistance of the current limiting resistor, C is the capacitance of the charge storage capacitor, and e is a natural constant.

[0020] Furthermore, the calculation formula of the luminous brightness is:

[0021] L=a×I b , where L is the brightness of the LED, I is the current flowing through the LED, and a and b are adjustment constants.

[0022] Furthermore, the test method also includes measuring the luminous intensity of the light emitting diodes (LED1, LED2, LED3, LED4) at different currents through multiple sampling points to obtain the adjustment constant.

[0023] Furthermore, the capacitor (C1, C2) increases or decreases the flickering frequency by continuously changing the capacitance value, and the corresponding frequency-capacitance relationship is mapped by adjusting the capacitance value.

[0024] Furthermore, the test method further comprises the steps of using a microcontroller to monitor the current, voltage and time parameters of the test circuit in real time, wherein the microcontroller is configured with a module for data acquisition, storage and processing, and contains an algorithm unit including a PID control algorithm for adjusting circuit parameters to ensure stable performance of the light-emitting diode;

[0025] The PID control algorithm performs parameter adjustment via a defined error value, and the error calculation formula is E(t)=SP-PV, where SP is a set value and PV is a process value, which is used to improve the control accuracy of the test circuit.

[0026] Furthermore, the test method further comprises the steps of automatically recording the overheating state of the light emitting diode during the test, and actively cutting off the circuit according to a preset temperature threshold condition by using a logic circuit or an automatic switch module, so as to protect the light emitting diode (LED1, LED2, LED3, LED4) and the test circuit;

[0027] The single-pole switch (S1) is set as a programmable switch for programming a variety of test scenarios, wherein the programming includes switching of different voltage levels and load conditions;

[0028] A DC power supply with different electromotive force is set to test the voltage tolerance of the light emitting diodes (LED1, LED2, LED3, LED4) under changing voltage conditions, so as to evaluate the stability of the light emitting diodes (LED1, LED2, LED3, LED4) under conditions exceeding the rated voltage.

[0029] In another aspect, a test system is provided for verifying the performance of a light emitting diode and implementing the test method as described above, the system comprising:

[0030] The power module provides a stable DC voltage and adjusts the voltage output through a voltage regulator to ensure that the LED can withstand a variety of voltage conditions during the test;

[0031] A current control module, including a plurality of current limiting resistors (R1, R2, R3, R4) with character identifiers, for limiting the current flowing through the light emitting diodes (LED1, LED2, LED3, LED4) to control the brightness thereof and providing a high-precision current regulation function;

[0032] A charge storage module, equipped with capacitors (C1, C2), which ensures the periodic lighting of the light-emitting diodes (LED1, LED2, LED3, LED4) by periodic energy storage and release, and provides test conditions of different frequencies by adjusting the capacitance value;

[0033] A switch control module, comprising a plurality of single-pole switches (S1) connected to a controller interface to achieve rapid closing and disconnection of the circuit, and is used for switching and managing the light-emitting diodes (LED1, LED2, LED3, LED4) under various test conditions;

[0034] A data acquisition and monitoring module uses a microcontroller to monitor the test system in real time and collect the working status data of the light emitting diodes (LED1, LED2, LED3, LED4);

[0035] User interface module, which integrates human-computer interaction interface, displays test data and reports, and allows users to set test parameters and design and control automated test processes;

[0036] The protection module includes a temperature sensor and an automatic circuit breaker protection circuit. When the light-emitting diode is detected to be overheated or the current is abnormal, the power supply is automatically cut off to protect the safety of the test system and the device under test.

[0037] On the other hand, a storage medium is provided, on which a program is stored. When the program is executed by a computer device, the computer device executes the test method as described above.

[0038] The beneficial effects of the present invention are:

[0039] The present invention improves the accuracy, efficiency and coverage of light-emitting diode performance testing by optimizing the circuit structure and introducing algorithms. Specifically, the present invention realizes accurate simulation of the periodic lighting and extinguishing of light-emitting diodes by introducing multiple series light-emitting diodes and parallel capacitors, ensuring dynamic adjustment and stability control of voltage and current parameters under various test conditions. Not only does it improve the accuracy of the test, but it also enhances the adaptability of the test circuit, so that reliable testing can be performed under a variety of complex conditions.

[0040] Furthermore, the present invention uses capacitors to control periodic charge and discharge, providing a new frequency adjustment method, which greatly improves the accuracy and adjustable range of the stroboscopic frequency. At the same time, the voltage change during the capacitor discharge process is accurately described by a mathematical model, providing a scientific basis and verification method for the test. This method effectively solves the problem of inaccurate and difficult to adjust stroboscopic frequency in traditional test methods.

[0041] Furthermore, the present invention adopts a nonlinear model when calculating the brightness of the light-emitting diode, accurately describes the light-emitting characteristics of the light-emitting diode under different current conditions, and improves the accuracy and consistency of the test results. By calibrating the parameters of the model, the test data can more truly reflect the performance of the light-emitting diode, thereby providing reliable data support for product design and optimization.

[0042] The above description is only an overview of the technical solution of the present invention. In order to more clearly understand the technical means of the present invention and implement it according to the contents of the specification, the following is a detailed description of the preferred embodiments of the present invention in conjunction with the accompanying drawings. BRIEF DESCRIPTION OF THE DRAWINGS

[0043] Figure 1 is a schematic diagram of a test circuit in one embodiment of the present invention;

[0044] Figure 2 Flow chart of a testing method in one embodiment of the present invention. DETAILED DESCRIPTION

[0045] In order to make the purpose, technical scheme and advantages of the present invention clearer, the present invention is further described in detail below in conjunction with the accompanying drawings and embodiments. Examples of the embodiments are shown in the accompanying drawings, wherein the same or similar reference numerals throughout represent the same or similar elements or elements with the same or similar functions. The embodiments described below with reference to the accompanying drawings are exemplary and are only used to explain the present invention, and should not be construed as limiting the present invention. In addition, it should be understood that the specific embodiments described herein are only used to explain the present invention and are not intended to limit the present invention.

[0046] The disclosure below provides many different embodiments or examples for implementing different structures of the present invention. In order to simplify the disclosure of the present invention, the components and settings of specific examples are described below. Of course, they are merely examples and are not intended to limit the present invention. In addition, the present invention may repeat reference numbers and / or reference letters in different examples, and such repetition is for the purpose of simplicity and clarity, and does not itself indicate the relationship between the various embodiments and / or settings discussed. In addition, the present invention provides various specific brand models and series of examples, but those of ordinary skill in the art can be aware of the use scenarios of other brand models and series.

[0047] The present invention provides the following preferred embodiments:

[0048] In order to solve the problems of operation simplicity, cost-effectiveness and verification efficiency in the performance test of light-emitting diodes, the present embodiment proposes functional features of a test circuit, a test method, a test system and a storage medium to improve the reliability of the test process. Specifically, the test circuit uses a PCB board as a basic platform, and is provided with the following components: triode Q1, triode Q2, single-pole switch S1, light-emitting diode LED1, light-emitting diode LED2, light-emitting diode LED3, light-emitting diode LED4, and multiple current-limiting resistors and capacitors (current-limiting resistor R1, current-limiting resistor R2, current-limiting resistor R3, current-limiting resistor R4, capacitor C1, capacitor C2). The layout design of these components together constitutes a light-emitting diode performance test system.

[0049] Furthermore, the LED diode holder 1 and holder 2 are designed to contain multiple light-emitting diodes, wherein holder 1 is configured with LED1 and LED2 in series, and holder 2 is connected with LED3 and LED4 in series. This design allows users to flexibly increase or decrease the number of light-emitting diodes in series according to specific needs when performing performance tests to meet different test requirements. For example, when verifying different models and types of LEDs, users only need to simply replace the light-emitting diodes on the holder without redesigning the circuit, thereby greatly improving the efficiency and flexibility of the test.

[0050] It should be understood that the socket 1 and the socket 2 are connected to the transistors Q1 and Q2, as well as the related resistors and capacitors through a specific circuit connection method. Specifically, one end of the socket 1 is connected to the positive pole of the DC power supply through the current limiting resistor R2, and the other end is connected to the collector of the transistor Q1, and is also connected to one end of the capacitor C1. This structure allows the current to pass through the light-emitting diodes LED1 and LED2 when the transistor Q1 is turned on, making them emit light. One end of the socket 2 is connected to the positive pole of the DC power supply through the current limiting resistor R4, and the other end is connected to the collector of the transistor Q2 and the capacitor C2, ensuring that when the transistor Q2 is turned on, the light-emitting diodes LED3 and LED4 can also be lit. Obviously, this alternating conduction design can effectively achieve the fixed-frequency flashing of the light-emitting diodes, increasing the visual effect and recognition during the test process.

[0051] Furthermore, by reasonably designing each component in the circuit, this embodiment realizes the fixed-frequency flashing function of the light-emitting diode. Specifically, by changing the capacitance values ​​of capacitors C1 and C2, the speed and frequency of the LED flashing can be adjusted, and by changing the resistance value of the current-limiting resistor or the input voltage of the DC power supply, the brightness of the light-emitting diode can be adjusted. Such a design not only improves the flexibility of the test equipment, but also gives the user the ability to accurately test the characteristics of various types of light-emitting diodes.

[0052] It can be understood that the optimized test device provides a low-cost, simple-to-operate, and high-performance solution, which improves the rapid and effective verification of light-emitting diode performance during the product design stage. Compared with the traditional test method, the test device of this embodiment adopts a simplified circuit design, which minimizes the number of peripheral components, reduces hardware costs, and also reduces the possibility of failure.

[0053] The benefit of this embodiment is that it not only provides engineers with an efficient and economical means to verify the performance of light-emitting diodes, helping to promptly discover and solve design problems, but also can be widely used in different application scenarios. Since the test device has high scalability, it can be used for various types of light-emitting diode tests, which is suitable for the development of electronic products and quality control before mass production. Through simple PCB board connection and standard component configuration, the device can quickly respond to the market's performance test needs for different LED products, providing strong support for the fast-paced consumer electronics market.

[0054] Through this embodiment, engineers can quickly and effectively verify the performance of light-emitting diodes during the product design stage. First, the test device allows users to flexibly configure the number and type of light-emitting diodes according to actual needs through sockets 1 and 2, thereby greatly improving the adaptability of the test. Secondly, through the fixed-frequency flashing function, the test device can not only intuitively display the working status of the LED, but also finely control the flashing frequency and brightness of the LED by adjusting the capacitance of the capacitor and the resistance of the resistor, which is used to evaluate the performance of the LED under different working conditions.

[0055] Furthermore, the design of the test device also includes cost control considerations. The use of standardized components and simplified circuit structure reduces the production cost of the entire device. In addition, due to the use of fewer components, the volume of the entire test device is also reduced accordingly, making it easier for engineers to operate and store it in the laboratory or production line. This means that companies can not only save on initial equipment investment, but also reduce overall R&D costs by improving the efficiency of the testing process.

[0056] It is understandable that the test device of this embodiment is not only suitable for standard LED performance testing, but can also be extended to other related applications. For example, by adding more sockets and capacitor-resistor combinations, the device can be configured to test larger or more complex LED arrays for display screens, lighting systems, or other occasions where multiple light-emitting diodes need to work together. This scalability allows the device to not only meet current needs, but also adapt to future technological developments and expansion of application scenarios.

[0057] From the perspective of practical operation, the benefit of this embodiment lies in its simplicity. Engineers only need to install the LED to be tested on the corresponding holder, connect the DC power supply and control the power supply switch through the single-pole switch to quickly start the test. This process does not require complicated setup or debugging steps, which greatly facilitates the test work of engineers. At the same time, since the device adopts a modular design, when the test configuration needs to be replaced or upgraded, only some components or expansion circuits need to be replaced, without the need to redesign and manufacture the entire test platform.

[0058] Furthermore, this simplicity and flexibility not only improves the work efficiency of engineers, but also provides support for production and quality control. For example, in the LED quality inspection link on the production line, the test device can quickly verify whether the performance of mass-produced LEDs meets the standards, thereby reducing the outflow of defective products and improving the overall quality of the product. In addition, the simplified operating process and low maintenance requirements also reduce the time and labor costs in the production link, further improving the economic benefits of the enterprise.

[0059] It can be understood that this embodiment provides an efficient, economical and flexible LED performance test solution suitable for a variety of application scenarios through the optimized test device structure and functional design. It not only meets the current requirements for light-emitting diode performance verification, but also provides solid support for future technological development and application expansion, and has significant practical application value and market prospects.

[0060] The principle of this embodiment is:

[0061] When the DC power supply is turned on, the two transistors Q1 and Q2 will compete to be turned on first, but due to the difference in components, only one transistor is turned on first. If transistor Q1 is turned on first, then the collector voltage of transistor Q1 will drop, and the light-emitting diodes LED1 and LED2 on the seat 1 will be lit. The left end of capacitor C1 is directly close to zero voltage due to the conduction of transistor Q1. Since the voltage at both ends of the capacitor cannot change suddenly, the base of transistor Q2 is also pulled to approximately zero voltage, making transistor Q2 cut off, and the light-emitting diodes LED3 and LED4 on the seat 2 are not lit. As the power supply charges capacitor C1 through the current limiting resistor R3, the base voltage of transistor Q2 gradually increases. When it exceeds about 0.6 volts, transistor Q2 changes from the cut-off state to the on state, the collector voltage drops, and the light-emitting diodes LED3 and LED4 on the seat 2 are lit. At the same time, the drop in the collector voltage of transistor Q2 causes the base voltage of transistor Q1 to drop through the action of capacitor C2, and transistor Q1 changes from on to off, and the light-emitting diodes LED1 and LED2 on seat 1 go out. In this way, the two transistors Q1 and Q2 in the circuit are turned on and off in turn, and the light-emitting diodes on the two seats continuously emit light in a cycle. This realizes the function of the light-emitting diodes on the two seats to flash at a fixed frequency. Changing the capacity of capacitors C1 and C2 can change the speed and frequency of the light-emitting diode cycle; changing the current-limiting resistor or changing the input voltage can change the brightness of the light-emitting diode, and the number of light-emitting diodes connected in series on the two seats can be increased or decreased according to the actual needs of the user;

[0062] Furthermore, when using this system for verification, first solder the LED light-emitting diode to be tested to the socket 1 and the socket 2. Currently, the WR-PB1608G-L08-5L light-emitting diode of Wenrun Optoelectronics is used as verification. Close the single-pole switch S1, and the DC power supply supplies power to the test fixture. The two transistors Q1 and Q2 will compete to be turned on first, but due to the difference in components, only one transistor is turned on first. If Q1 is turned on first, then the collector voltage of transistor Q1 drops, and the light-emitting diodes LED1 and LED2 on the socket 1 are lit. The left end of capacitor C1 is directly close to zero voltage due to the conduction of transistor Q1. Due to the characteristic that the voltage at both ends of the capacitor cannot change suddenly, the base of transistor Q2 is also pulled to approximately zero voltage, so that transistor Q2 is cut off, and the light-emitting diodes LED3 and LED4 on the socket 2 are not lit. As the power supply charges C1 through resistor R3, the base voltage of transistor Q2 gradually increases. When it exceeds about 0.6 volts, transistor Q2 changes from the cut-off state to the on state, the collector voltage drops, and the light-emitting diodes LED3 and LED4 on seat 2 are lit. At the same time, the drop in the collector voltage of transistor Q2 causes the base voltage of transistor Q1 to drop through the action of capacitor C2, and transistor Q1 changes from on to off, and the light-emitting diodes LED1 and LED2 on seat 1 are extinguished. In this way, the two transistors Q1 and Q2 in the circuit are turned on and off in turn, and the light-emitting diodes on the two seats continuously emit light in a cycle. This realizes the function of the light-emitting diodes on the two seats to flash at a fixed frequency. Changing the capacity of capacitors C1 and C2 can change the speed and frequency of the light-emitting diode cycle; changing the current limiting resistor or changing the input voltage can change the brightness of the light-emitting diode, and the number of light-emitting diodes in series on the two seats can be increased or decreased according to the actual needs of the user.

[0063] The test circuit and method of the present invention are used to solve the problem of rapid and effective verification of light-emitting diode performance and are used in hardware circuit applications. The performance of light-emitting diodes can be quickly and effectively verified in the product design stage, so that the diodes can be used to the maximum extent in the circuit. The method is suitable for the product development stage, has a simple circuit, fewer components, can be reused, and has low cost and high cost performance. A low-cost and easy-to-operate solution is provided.

[0064] The beneficial effects of the present invention are specifically embodied in that the above description is only a preferred embodiment of the present invention and is not intended to limit the present invention. Any modifications, equivalent substitutions, improvements, etc. made within the spirit and principles of the present invention should be included in the protection scope of the present invention.

Claims

1. A test circuit for verifying the performance of a light emitting diode, characterized in that: The test circuit at least comprises a seat 1 and a seat 2, and a plurality of the light emitting diodes are connected in series on the seat 1 and the seat 2 respectively; One end of the seat 1 and the seat 2 is connected to the positive electrode of the DC power supply through a current limiting resistor (R2) and a current limiting resistor (R4), respectively, and the other end is connected to the collector of the transistor (Q1) and the transistor (Q2), respectively, and the other end is simultaneously connected to one end of the capacitor (C1) and the capacitor (C2), respectively; The base of the transistor (Q1) is connected to the positive electrode of the DC power supply via a current limiting resistor (R1), the base of the transistor (Q2) is connected to the positive electrode of the DC power supply via a current limiting resistor (R3) and the other end of the capacitor (C1), and the emitters of the transistor (Q1) and the transistor (Q2) are both connected to the negative electrode of the DC power supply and grounded; The test circuit is controlled by a single-pole switch (S1), and the stroboscopic frequency of the light-emitting diode is changed by adjusting the capacitance values ​​of the capacitor (C1) and the capacitor (C2), and the brightness of the light-emitting diode is adjusted by changing the resistance value of the current-limiting resistor (R4) from the current-limiting resistor (R1) to the current-limiting resistor (R4) or the input voltage of the direct current power supply.

2. A test method for verifying the performance of a light emitting diode, characterized in that: The steps of the test method include: Provided is a test circuit as claimed in claim 1, wherein the test circuit is equipped with a plurality of light emitting diodes (LED1, LED2, LED3, LED4), current limiting resistors (R1, R2, R3, R4), capacitors (C1, C2), transistors (Q1, Q2), and a DC power supply combined with a single-pole switch (S1); Connecting the plurality of light-emitting diodes (LED1, LED2, LED3, LED4) in series to the current-limiting resistors (R1, R2, R3, R4) and the positive terminal of a DC power supply to form a node-based current path, thereby ensuring that the current passes through each light-emitting diode to achieve a current limiting effect; Using the capacitor (C1, C2) connected in parallel with the light emitting diodes (LED1, LED2, LED3, LED4), it is designed to generate periodic charge and discharge phenomena in the test circuit to simulate and realize the periodic lighting and extinguishing of the plurality of light emitting diodes (LED1, LED2, LED3, LED4); The resistance value of the current limiting resistor (R1, R2, R3, R4) is adjusted to change the current passing through the light emitting diode (LED1, LED2, LED3, LED4) and achieve the required light emitting brightness, and obtain data of different brightness parameters without affecting the stability of the test circuit; Changing the capacitance value of the capacitor (C1, C2) to affect the charging and discharging time constant of the capacitor (C1, C2), realizing the lighting of the light-emitting diodes (LED1, LED2, LED3, LED4) at different cycles and frequencies, and realizing the adjustment of the stroboscopic effect; The working indicators of the light emitting diodes (LED1, LED2, LED3, LED4) under different conditions are recorded, measured and analyzed, wherein the working indicators include brightness, current load and strobe frequency, so as to verify the performance parameters of the light emitting diodes (LED1, LED2, LED3, LED4).

3. The testing method according to claim 2, characterized in that: The periodic charge and discharge phenomenon in the test circuit is realized by the following expression: Among them, V(t) is the voltage at time t, V0 is the initial voltage, R is the resistance of the current limiting resistor, C is the capacitance of the charge storage capacitor, and e is a natural constant.

4. The testing method according to claim 2, characterized in that: The calculation formula of the luminous brightness is: L=a×I b , where L is the brightness of the LED, I is the current flowing through the LED, and a and b are adjustment constants.

5. The testing method according to claim 4, characterized in that: The test method also includes measuring the luminous intensity of the light emitting diodes (LED1, LED2, LED3, LED4) at different currents through multiple sampling points to obtain the adjustment constant.

6. The testing method according to claim 2, characterized in that: The capacitors (C1, C2) increase or decrease the flickering frequency by continuously changing the capacitance value, and the corresponding frequency-capacitance relationship is mapped by adjusting the capacitance value.

7. The testing method according to claim 6, characterized in that: The test method also includes using a microcontroller to monitor the current, voltage and time parameters of the test circuit in real time, wherein the microcontroller is configured with a module for data acquisition, storage and processing, and includes an algorithm unit including a PID control algorithm for adjusting circuit parameters to ensure stable performance of the light emitting diode; The PID control algorithm performs parameter adjustment via a defined error value, and the error calculation formula is E(t)=SP-PV, where SP is a set value and PV is a process value, which is used to improve the control accuracy of the test circuit.

8. The testing method according to claim 2, characterized in that: The test method further comprises the steps of automatically recording the overheating state of the light emitting diode during the test, and actively cutting off the circuit according to a preset temperature threshold condition by using a logic circuit or an automatic switch module to protect the light emitting diode (LED1, LED2, LED3, LED4) and the test circuit; The single-pole switch (S1) is set as a programmable switch for programming a variety of test scenarios, wherein the programming includes switching of different voltage levels and load conditions; A DC power supply with different electromotive force is set to test the voltage tolerance of the light emitting diodes (LED1, LED2, LED3, LED4) under changing voltage conditions, so as to evaluate the stability of the light emitting diodes (LED1, LED2, LED3, LED4) under conditions exceeding the rated voltage.

9. A test system for verifying the performance of a light emitting diode and implementing the test method according to any one of claims 2 to 8, characterized in that: The system comprises: The power module provides a stable DC voltage and adjusts the voltage output through a voltage regulator to ensure that the LED can withstand a variety of voltage conditions during the test; A current control module, including a plurality of current limiting resistors (R1, R2, R3, R4) with character identifiers, for limiting the current flowing through the light emitting diodes (LED1, LED2, LED3, LED4) to control the brightness thereof and providing a high-precision current regulation function; A charge storage module, equipped with capacitors (C1, C2), which ensures the periodic lighting of the light-emitting diodes (LED1, LED2, LED3, LED4) by periodic energy storage and release, and provides test conditions of different frequencies by adjusting the capacitance value; A switch control module, comprising a plurality of single-pole switches (S1) connected to a controller interface to achieve rapid closing and disconnection of the circuit, and is used for switching and managing the light-emitting diodes (LED1, LED2, LED3, LED4) under various test conditions; A data acquisition and monitoring module uses a microcontroller to monitor the test system in real time and collect the working status data of the light emitting diodes (LED1, LED2, LED3, LED4); User interface module, which integrates human-computer interaction interface, displays test data and reports, and allows users to set test parameters and design and control automated test processes; The protection module includes a temperature sensor and an automatic circuit breaker protection circuit. When the light-emitting diode is detected to be overheated or the current is abnormal, the power supply is automatically cut off to protect the safety of the test system and the device under test.

10. A storage medium having a program stored thereon, characterized in that: When the program is executed by a computer device, the computer device executes the testing method according to any one of claims 2 to 8.

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