Method for quickly testing analog-digital mixed signal module based on boundary scanning

Abstract

The invention relates to the technical field of aviation airborne electronic equipment maintenance test guarantee, in particular to an analog-digital mixed signal module rapid test method based on boundary scanning, which comprises the following steps: step 1, forming a network list; 2, acquiring a simulation boundary scanning unit control information table production specific test model and a test vector table; 3, connecting the test equipment to the tested module; 4, testing a digital circuit in the tested module; and 5, testing the analog circuit in the tested module. The problem that an analog-digital mixed signal module cannot be directly tested is solved, automatic testing of the module is achieved, the working intensity of workers is greatly relieved, and the testing and maintaining capacity of aviation airborne products is improved; according to the method, the automatic test program is designed by calling the interface of the boundary scan controller based on the boundary scan controller in combination with the external resources, so that the rapid test diagnosis of the module is realized, and the test efficiency is greatly improved.

Description

Technical Field

[0001] The invention relates to the technical field of maintenance test and support of aviation airborne electronic equipment, in particular to a rapid test method for analog-digital mixed signal modules based on boundary scanning. Background Art

[0002] At present, airborne equipment is becoming more and more complex and integrated in terms of functions, and the maintenance costs are also increasing. Since each airborne module is the basic component unit of electronic products, its functions are complex, its usage characteristics vary, and its failure mode uncertainty is high. The outstanding problem is that the performance intervention test diagnosis method is difficult to quickly and accurately test the module performance and diagnose module failures. Analog signals cannot be completely replaced by digital signals in electronic circuits. The mixed signal technology of digital circuits and analog circuits is also developing rapidly and being widely used. According to the statistics of module failures, the failure rate of analog circuits is relatively high.

[0003] In modules that mix digital circuits and analog circuits based on large-scale integrated circuits, the analog circuit part is difficult to test, has a high failure rate, and requires high reliability. It is also indirectly controlled by digital circuits, making it difficult to test directly based on ATE.

[0004] Chinese patent CN201210296485.4 (published on December 12, 2012) discloses a mixed-signal circuit boundary scan test system, including a microcomputer, a microprocessor and an analog instrument platform. Its characteristics are based on digital devices supporting IEEE 1149.1 and analog devices supporting IEEE 1149.4, building a test platform to achieve online testing of mixed-signal circuits.

[0005] Boundary scan test technology has formed a series of IEEE1149.X standards. IEEE 1149.1 is a digital circuit bus standard issued by the IEEE organization, and IEEE 1149.4 is a mixed signal test bus standard. This standard uses the boundary scan mechanism to implement analog devices in mixed analog modules.

[0006] However, there are basically no IEEE 1149.4 analog devices in aviation airborne electronic equipment modules. The analog signals are directly or indirectly controlled by the digital part and cannot be tested independently. In addition, the architecture of each module is inconsistent, and there are many control methods. Most digital chips are also subject to restrictions such as chip software encryption. Summary of the invention

[0007] In order to solve the above technical problems, the present invention proposes a rapid testing method for analog-digital mixed signal modules based on boundary scan. The present invention can test modules containing analog devices associated with boundary scan digital device modules supporting the IEEE 1149.1 protocol. At the same time, based on the constructed analog signal platform, rapid testing of mixed signal modules is achieved, and fully automatic testing of modules is achieved.

[0008] The technical problem to be solved by the present invention is achieved by adopting the following technical solutions:

[0009] A rapid testing method for an analog-digital mixed signal module based on boundary scanning comprises the following steps:

[0010] Step 1: Arrange the drawings and data of the tested module, analyze the circuit composition, and form a network table;

[0011] Step 2: compile the circuit netlist file to obtain circuit board information, analyze and obtain the analog boundary scan unit control information table to produce a specific test model and test vector table;

[0012] Step 3: Connect the boundary scan controller to the boundary scan interface of the boundary scan support device on the module under test and the industrial computer, connect the test resource system to the module under test, the industrial computer, and the FPGA digital resource board, and connect the FPGA digital resource board to the industrial computer;

[0013] Step 4: Test the digital circuit in the module under test:

[0014] Including boundary scan support device testing and non-boundary scan support device testing;

[0015] Step 5: Test the analog circuit in the module under test:

[0016] Includes analog quantity acquisition test and analog quantity output test.

[0017] As a further improvement of the present invention, the boundary scan support device test in step 4 is specifically as follows:

[0018] Step 1: Send control signals to boundary scan support devices through boundary scan controller to perform relevant tests;

[0019] Step 2: Receive the test output data of the boundary scan support device, and determine whether the boundary scan support device is faulty based on the analysis result of the test output data.

[0020] As a further improvement of the present invention, the non-boundary scan supported device test in step 4 is specifically as follows:

[0021] Step 1: Use the surrounding network outside the boundary scan supporting device to control the non-boundary scan supporting device;

[0022] Step 2: Simultaneously receive the test output data generated by the boundary scan supporting device signal to form the test output data to determine whether the non-boundary scan supporting device has a fault.

[0023] As a further improvement of the present invention, the analog quantity acquisition test in step 5 is specifically as follows:

[0024] Step 1: First, the industrial computer controls the test resource system through PXI, LAN, VX, and USB buses to send out the analog quantity required for the test, and inputs the analog signal from the port of the module under test;

[0025] Step 2: Use boundary scan support devices to provide control signals to devices with analog switches, AD conversion, optoelectronic isolation, and axis-angle conversion by calling the boundary scan controller;

[0026] Step 3: Complete the action according to the set timing and obtain the processed data of the input analog quantity converted by the tested module;

[0027] Step 4: Call the boundary scan controller again to use the boundary scan support device to read the relevant data and analyze the results to determine whether there is a fault in the boundary scan support device.

[0028] As a further improvement of the present invention, the analog output test in step 5 is specifically as follows:

[0029] Step 1: First, the industrial computer controls the test resource system through PXI, LAN, VX, and USB buses to set the analog quantity parameters that need to be collected and connects to the analog signal output port of the module under test;

[0030] Step 2: Use boundary scan support devices to provide control signals to devices with switches, DA conversion, and optoelectronic isolation by calling the boundary scan controller;

[0031] Step 3: Complete the action according to the set timing, and the module under test responds with an analog output;

[0032] Step 4: Call the test resource system again to read the analog output data of the module under test and analyze the results to determine whether there is a fault in the boundary scan support device.

[0033] The beneficial effects of the present invention are:

[0034] The present invention provides a method for rapid testing of analog-digital mixed signal modules based on boundary scan, which solves the problem that analog-digital mixed signal modules cannot be directly tested, realizes automated testing of modules, greatly reduces the workload of personnel, and improves the testing and maintenance capabilities of aviation airborne products; by adopting a boundary scan controller in combination with external resources, an automated testing program is designed by calling a boundary scan controller interface, thereby realizing rapid testing and diagnosis of modules, ensuring the implementation of automated testing, and greatly improving testing efficiency. BRIEF DESCRIPTION OF THE DRAWINGS

[0035] The present invention is further described below in conjunction with the accompanying drawings and embodiments:

[0036] Figure 1 It is the structural block diagram of the module under test;

[0037] Figure 2 This is a schematic diagram of equipment connection during testing of the present invention;

[0038] Figure 3 This is a digital circuit test flow chart of the present invention;

[0039] Figure 4 This is a flow chart of the simulation circuit test of the present invention.

[0040] In the figure: 1. Digital circuit; 2. Analog circuit; 3. Interconnection circuit; 4. Direct connection circuit; 5. Test module; 6. Boundary scan controller; 7. Industrial computer; 8. Test resource system; 9. FPGA digital resource board. DETAILED DESCRIPTION

[0041] In order to make the technical means, creative features, objectives and effects achieved by the present invention easy to understand, the present invention is further described below with reference to the accompanying drawings and embodiments.

[0042] like Figure 1 As shown in FIG. 1 , it is a block diagram of the module under test, which includes the following four parts: digital circuit 1, including a core controller and peripheral basic digital devices that support IEEE1149.1 boundary scan (does not support IEEE1149.1 boundary scan devices); analog circuit 2, including various voltages, currents, switching quantities, shaft angles, waveforms, etc.; interactive connection circuit 3, including various DA, AD conversions, analog switches, bus converters, waveform converters, etc.; direct connection circuit 4, including various optocouplers, relays, isolators, etc.

[0043] This embodiment proposes a boundary scan-based analog-digital mixed signal module rapid testing method for the above-mentioned tested module, including the following steps:

[0044] Step 1: Arrange the drawings of the module under test 5, analyze the circuit composition, and form a network table.

[0045] Step 2: compile the circuit netlist file to obtain circuit board information, analyze and obtain the analog boundary scan unit control information table to produce a specific test model and test vector table.

[0046] Step 3: Figure 2 As shown, the boundary scan controller 6 is connected to the boundary scan interface of the boundary scan support device on the tested module 5 and the industrial computer 7, which can support the simultaneous connection of 1-6 devices (DSP, FPGA, ARM, etc.), and the test resource system 8 is connected to the tested module 5, the industrial computer 7, and the FPGA digital resource board 9. The test resource system 8 is used to provide corresponding excitation signals and output signal collectors and other test resources. In this embodiment, it can be various types of computer boards, programmable instruments, self-developed test resources, etc. The FPGA digital resource board 9 is connected to the industrial computer 7, and the FPGA digital resource board 9 is used for other digital excitation signals required for work.

[0047] Step 4: Test the digital circuit 1 in the module under test 5, such as Figure 3 shown.

[0048] Includes boundary scan supported device testing and non-boundary scan supported device testing.

[0049] For boundary scan support device testing, a control signal is sent to the boundary scan support device through the boundary scan controller 6 to perform relevant tests, receive the test output data of the boundary scan support device, and determine whether the boundary scan support device has a fault based on the analysis results of the test output data.

[0050] For testing of non-boundary scan supported devices, a boundary scan supported device outer surround network is utilized to control the non-boundary scan supported device, and test output data generated by the boundary scan supported device signal is received at the same time to form test output data to determine whether the non-boundary scan supported device has a fault.

[0051] Step 5: Test the analog circuit 2 in the module under test 5, such as Figure 4 shown.

[0052] Includes analog quantity acquisition test and analog quantity output test.

[0053] For analog quantity acquisition test, first, the industrial computer 7 controls the test resource system 8 through the PXI / LAN / VX / USB bus to send out the analog quantity required for the test, and inputs the analog signal from the port of the module under test 5; then, the boundary scan controller 6 is called to use the boundary scan support device to provide control signals (such as analog switch channel switching control, AD converter chip selection, AD conversion start control, etc.) to the devices with analog switches, AD conversion, optoelectronic isolation, and axis-angle conversion; the action is completed according to the set timing, and the processed data (such as AD converted data) of the input analog quantity converted by the module under test 5 is obtained. The boundary scan controller 6 is called again to use the boundary scan support device to read the relevant data and analyze the results to determine whether the boundary scan support device has a fault.

[0054] For analog output test, first, the industrial computer 7 controls the test resource system 8 through the PXI / LAN / VX / USB bus to set the analog parameters to be collected, and connects to the analog signal output port of the module under test 5; by calling the boundary scan controller 6, the boundary scan support device is used to first provide control signals (such as analog switch channel switching, DA converter chip selection, DA conversion start control, etc.) to the switch, DA conversion, and optoelectronic isolation devices; and the action is completed according to the set timing, and the module under test 5 responds with the output analog quantity (such as DA converted data); the test resource system 8 is called again to read the analog output data of the module under test 5 and analyze the results to determine whether there is a fault in the boundary scan support device.

[0055] All boundary scan controls in the above tests are completed based on the boundary scan controller API interface control program. This part is used as a virtual instrument for testing. By designing an automated test program, the automated rapid diagnosis and testing of the entire module can be completed.

[0056] The above shows and describes the basic principles, main features and advantages of the present invention. Those skilled in the art should understand that the present invention is not limited to the above embodiments. The above embodiments and descriptions only describe the principles of the present invention. Without departing from the spirit and scope of the present invention, the present invention may have various changes and improvements, which fall within the scope of the present invention. The scope of protection of the present invention is defined by the attached claims and their equivalents.

Claims

1. A rapid test method for analog-digital mixed signal modules based on boundary scan, characterized in that: The following steps are involved: Step 1: Arrange the drawings and data of the module under test (5), analyze the circuit composition, and form a network table; Step 2: compile the circuit netlist file to obtain circuit board information, analyze and obtain the analog boundary scan unit control information table to produce a specific test model and test vector table; Step 3: Connect the boundary scan controller (6) to the boundary scan interface of the boundary scan support device on the module under test (5) and the industrial computer (7), connect the test resource system (8) to the module under test (5), the industrial computer (7), and the FPGA digital resource board (9), and connect the FPGA digital resource board (9) to the industrial computer (7); Step 4: Test the digital circuit (1) in the module under test (5): Including boundary scan support device testing and non-boundary scan support device testing; Step 5: Test the analog circuit (2) in the module under test (5): Includes analog quantity acquisition test and analog quantity output test.

2. The method for rapid testing of analog-digital mixed signal modules based on boundary scan according to claim 1, characterized in that: The boundary scan support device test in step 4 is as follows: The first step: sending a control signal to the boundary scan support device through the boundary scan controller (6) to perform relevant tests; Step 2: Receive the test output data of the boundary scan support device, and determine whether the boundary scan support device is faulty based on the analysis result of the test output data.

3. The method for rapid testing of analog-digital mixed signal modules based on boundary scan according to claim 1, characterized in that: The non-boundary scan supported device test in step 4 is as follows: Step 1: Use the surrounding network outside the boundary scan supporting device to control the non-boundary scan supporting device; Step 2: Simultaneously receive the test output data generated by the boundary scan supporting device signal to form the test output data to determine whether the non-boundary scan supporting device has a fault.

4. The method for rapid testing of analog-digital mixed signal modules based on boundary scan according to claim 1, characterized in that: The analog quantity acquisition test in step 5 is as follows: Step 1: First, the industrial computer (7) controls the test resource system (8) through PXI, LAN, VX, and USB buses to send out the analog quantity required for the test, and inputs the analog signal from the port of the module under test (5); Step 2: Calling the boundary scan controller (6) and using the boundary scan support device to provide control signals to devices with analog switches, AD conversion, photoelectric isolation, and axis-angle conversion; Step 3: Complete the action according to the set timing and obtain the processed data of the input analog quantity converted by the tested module (5); Step 4: Call the boundary scan controller (6) again to use the boundary scan support device to read the relevant data and analyze the results to determine whether the boundary scan support device has a fault.

5. The method for rapid testing of analog-digital mixed signal modules based on boundary scan according to claim 1, characterized in that: The analog output test in step 5 is as follows: Step 1: First, the industrial computer (7) controls the test resource system (8) through PXI, LAN, VX, USB bus to set the analog quantity parameters to be collected, and connects to the analog signal output port of the module under test (5); Step 2: Using the boundary scan support device to first provide control signals to the switch, DA conversion, and optoelectronic isolation devices by calling the boundary scan controller (6); Step 3: The action is completed according to the set timing, and the module under test (5) responds with an output analog quantity; Step 4: Call the test resource system (8) again to read the analog output data of the module under test (5) and analyze the result to determine whether there is a fault in the boundary scan support device.

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