Test method of SMJ320F2812 digital signal processor

Abstract

The invention relates to the technical field of chip testing, in particular to a testing method of an SMJ320F2812 digital signal processor, which comprises the following steps of: 1, connecting an upper computer and a testing tool by using an SEED-XDS560 simulator, and programming an SMJ320F2812 testing program in Code Compound Studio software; step 2, randomly modifying any address data in an IDT70V28 storage range of the DPRAM chip on line, accessing the address through STM32F103ZET6 in the upper computer DSP test software, and returning the read data in the upper computer DSP test software; 3, transmitting the data to an AD conversion unit in the SMJ320F2812 through a D / A conversion chip and a control switch on the test tool, displaying the data through a display screen, and detecting whether the ADC conversion unit and an SPI interface in the chip work normally; and step 4, checking whether the returned data are consistent or not. According to the SMJ320F2812 chip fault diagnosis method, detection and fault diagnosis of the SMJ320F2812 chip can be rapidly completed, the manpower and time cost is greatly reduced, and the working efficiency is improved. And the structure is simple, the working reliability is high, and the applicability is good.

Description

Technical Field

[0001] The invention relates to the technical field of chip testing, in particular to a testing method for a SMJ320F2812 digital signal processor. Background Art

[0002] With the development of microelectronics technology, the integration of chips is getting higher and higher, and avionics products are also developing in the direction of miniaturization, integration and complexity. Therefore, DSP (Digital Signal Processing) digital signal processor technology is widely used in various occasions. DSP chips have the advantages of high-speed computing power, rich on-chip memory and external interface, special instruction set, etc., complete tasks such as audio, video encoding and decoding and wireless communication, and can quickly realize complex signal processing tasks and algorithms. However, the price of this type of chip is relatively high, and performance screening and detection are required before use. At the same time, with the increase of the service life of airborne electronic products, the failure rate of DSP chips is also relatively increased. In order to solve the above problems, taking the chip SMJ320F2812 as an example, the present invention designs a chip testing method, which can quickly and easily complete the performance detection of the chip. The method can complete the online burning and replacement of the chip program, and detect the integrity of the output / input function of each pin of the chip in real time. Summary of the invention

[0003] In order to solve the above technical problems, the present invention proposes a test method for SMJ320F2812 digital signal processor, which enables online programming of chip programs, quickly detects whether the output / input functions of each pin of the chip are normal, improves chip function detection efficiency, and saves manpower and time costs.

[0004] The technical problem to be solved by the present invention is achieved by adopting the following technical solutions:

[0005] A test method for a SMJ320F2812 digital signal processor comprises the following steps:

[0006] Step 1. Place the chip to be tested on the chip test fixture in the test fixture, use the SEED-XDS560 simulator to connect the host computer and the test fixture, and burn the SMJ320F2812 test program in the Code Composer Studio software;

[0007] Step 2, use the simulator to modify the data of any address in the storage range of DPRAM chip IDT70V28 randomly online in the host computer Code Composer Studio software, then access the address through STM32F103ZET6 in the host computer DSP test software, and transmit the read data back in the host computer DSP test software, repeat this process multiple times to check whether the transmitted data is consistent with the modified data;

[0008] Step 3, use STM32F103ZET6 to send a digital quantity to DSP, transmit it to the AD conversion unit inside SMJ320F2812 through the D / A conversion chip and control switch on the test tooling, and then connect it to a display screen through the SPI interface of SMJ320F2812, and display the value on the display screen to detect whether the ADC conversion unit and SPI interface inside the chip are working normally;

[0009] Step 4. Use a serial port line to connect the host computer to the test fixture, complete the communication between the host computer and SMJ320F2812, check whether the UART interface is normal, send data at will on the test software, and check whether the returned data is consistent.

[0010] As a further improvement of the present invention, in step 1, it is required that each pin on the installed chip maintains an effective connection with the test pin on the chip test fixture.

[0011] As a further improvement of the present invention, the SMJ320F2812 test program in step 1 is mainly used to complete the A / D conversion and display the converted digital quantity on the display screen through the SPI interface, and then communicate with the host computer to transmit back the data sent by the host computer.

[0012] As a further improvement of the present invention, in step 2, the host computer DSP test software is responsible for controlling STM32F103ZET6 to complete the sending of relevant instructions and data reading, and sends data to the SMJ320F2812 chip under test through UART, and displays the data sent back by the SMJ320F2812 chip.

[0013] The beneficial effects of the present invention are:

[0014] The present invention provides a test method for a SMJ320F2812 digital signal processor, which can quickly complete the detection and fault diagnosis of the SMJ320F2812 chip, greatly reducing the manpower and time costs, and improving the work efficiency. The method has a simple structure, high working reliability, and good applicability. BRIEF DESCRIPTION OF THE DRAWINGS

[0015] The present invention is further described below in conjunction with the accompanying drawings and embodiments:

[0016] Figure 1 It is a flowchart of the SMJ320F2812 test program of the present invention;

[0017] Figure 2 It is a flowchart of the STM32F103ZET6 test program of the present invention;

[0018] Figure 3 It is a flowchart of the host computer DSP test program of the present invention. DETAILED DESCRIPTION

[0019] In order to make the technical means, creative features, objectives and effects achieved by the present invention easy to understand, the present invention is further described below with reference to the accompanying drawings and embodiments.

[0020] The SMJ320F2812 generally includes the following hardware resources: a high-performance 32-bit C28X CPU core, 256KB of Flash memory, a 16-channel high-performance 12-bit ADC analog-to-digital conversion unit, and a multi-processor interface.

[0021] A test method for a SMJ320F2812 digital signal processor comprises the following steps:

[0022] Step 1. Place the chip to be tested on the chip test fixture in the test fixture. It is required that each pin on the installed chip maintains effective connection with the test pins on the chip test fixture. Use the SEED-XDS560 simulator to connect the host computer and the test fixture, and burn the SMJ320F2812 test program in the Code Composer Studio software.

[0023] The flow chart of SMJ320F2812 test program is as follows: Figure 1 The SMJ320F2812 test program is mainly used to complete the A / D conversion and display the converted digital quantity on the display screen through the SPI interface, and then communicate with the host computer to transmit the data sent by the host computer back.

[0024] Step 2. Use the simulator to randomly modify the data of any address within the storage range of the DPRAM chip IDT70V28 online in the host computer Code Composer Studio software, then access the address through STM32F103ZET6 in the host computer DSP test software, and transmit the read data back in the host computer DSP test software. Repeat this process multiple times to check whether the transmitted data is consistent with the modified data.

[0025] Furthermore, the internal test program of STM32F103ZET6 has been solidified to complete the internal address access of DPRAM, communication with the host computer and chip selection, enable and control and sending of related signals. The flow chart of STM32F103ZET6 test program is as follows: Figure 2 shown.

[0026] Furthermore, the flow chart of the host computer DSP test software is as follows: Figure 3 As shown, it is responsible for controlling STM32F103ZET6 to complete the sending of related instructions and data reading, and sends data to the SMJ320F2812 chip under test through UART, and displays the data sent back by the SMJ320F2812 chip.

[0027] Step 3. Use STM32F103ZET6 to send a digital quantity to DSP, which is transmitted to the AD conversion unit inside SMJ320F2812 through the D / A conversion chip and control switch on the test fixture. Then, it is connected to a display screen through the SPI interface of SMJ320F2812, and the value is displayed on the display screen to detect whether the ADC conversion unit and SPI interface inside the chip are working normally.

[0028] Step 4. Use a serial port line to connect the host computer to the test fixture, complete the communication between the host computer and SMJ320F2812, check whether the UART interface is normal, send data at will on the test software, and check whether the returned data is consistent.

[0029] The above shows and describes the basic principles, main features and advantages of the present invention. Those skilled in the art should understand that the present invention is not limited to the above embodiments. The above embodiments and descriptions only describe the principles of the present invention. Without departing from the spirit and scope of the present invention, the present invention may have various changes and improvements, which fall within the scope of the present invention. The scope of protection of the present invention is defined by the attached claims and their equivalents.

Claims

1. A test method for a SMJ320F2812 digital signal processor, characterized in that: The following steps are involved: Step 1. Place the chip to be tested on the chip test fixture in the test fixture, use the SEED-XDS560 simulator to connect the host computer and the test fixture, and burn the SMJ320F2812 test program in the Code Composer Studio software; Step 2, use the simulator to modify the data of any address in the storage range of DPRAM chip IDT70V28 randomly online in the host computer Code Composer Studio software, then access the address through STM32F103ZET6 in the host computer DSP test software, and transmit the read data back in the host computer DSP test software, repeat this process multiple times to check whether the transmitted data is consistent with the modified data; Step 3, use STM32F103ZET6 to send a digital quantity to DSP, transmit it to the AD conversion unit inside SMJ320F2812 through the D / A conversion chip and control switch on the test tooling, and then connect it to a display screen through the SPI interface of SMJ320F2812, and display the value on the display screen to detect whether the ADC conversion unit and SPI interface inside the chip are working normally; Step 4. Use a serial port line to connect the host computer to the test fixture, complete the communication between the host computer and SMJ320F2812, check whether the UART interface is normal, send data at will on the test software, and check whether the returned data is consistent.

2. The test method of a SMJ320F2812 digital signal processor according to claim 1, characterized in that: In step 1, it is required that each pin on the installed chip maintains effective connection with the test pins on the chip test fixture.

3. The test method of a SMJ320F2812 digital signal processor according to claim 1, characterized in that: The SMJ320F2812 test program in step 1 is mainly used to complete the A / D conversion and display the converted digital quantity on the display screen through the SPI interface, and then communicate with the host computer to transmit the data sent by the host computer back.

4. The test method of a SMJ320F2812 digital signal processor according to claim 1, characterized in that: In step 2, the host computer DSP test software is responsible for controlling the STM32F103ZET6 to complete the sending of relevant instructions and data reading, and sends data to the SMJ320F2812 chip under test through UART, and displays the data sent back by the SMJ320F2812 chip.

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