Static electrical characteristic testing device for hardware circuit

Abstract

The embodiment of the invention discloses a hardware circuit static electrical characteristic testing device. In a specific embodiment, the device comprises a processor, a matrix switch card and a digital multimeter: the processor is used for acquiring a node relation table of a hardware circuit to be tested, extracting test delay time and a test standard solution of a node pair to be tested from the node relation table, and outputting a test instruction of a specified test node pair; the matrix switch card responds to the test instruction and connects the test end of the digital multimeter with the specified to-be-tested node pair, so that the digital multimeter tests the impedance value of the specified to-be-tested node pair after delaying the corresponding test delay time and outputs the impedance value to the processor; and the processor is also used for judging whether the impedance value is a test standard solution of the specified to-be-tested node pair or not to obtain a test result. According to the embodiment, the static electrical characteristics of the hardware circuit can be automatically measured and evaluated.

Description

Technical Field

[0001] The present invention relates to the field of static electrical characteristic testing, and more specifically, to a static electrical characteristic testing device for a hardware circuit. Background Art

[0002] Static electrical characteristics evaluation is an important way to evaluate the performance of hardware circuits without applying external power to the hardware circuits, so as to determine whether there are hidden dangers such as performance degradation or abnormal operation in the hardware circuits, and effectively avoid irreversible damage to the hardware circuits when powered on or damage to functional modules of key working processes of the hardware circuits, thereby causing greater losses.

[0003] At present, the hardware circuit detection methods in the prior art are mostly to test the key functional indicators of the hardware circuit after applying an external power supply to drive the hardware circuit to work, lacking static testing links and evaluation methods for hardware performance degradation. In addition, the testing process of the hardware circuit in the prior art is mostly manual, and the testing efficiency is low. Summary of the invention

[0004] The object of the present invention is to provide a static electrical characteristics testing device for a hardware circuit to solve at least one of the problems existing in the prior art.

[0005] In order to achieve the above object, the present invention adopts the following technical solutions:

[0006] The first aspect of the present invention provides a static electrical characteristic test device for a hardware circuit, comprising a processor, a matrix switch card and a digital multimeter:

[0007] The processor is used to obtain a node relationship table of a hardware circuit to be tested, extract a test delay time and a test standard solution of a node pair to be tested from the node relationship table, and output a test instruction for specifying a test node pair;

[0008] The matrix switch card, in response to the test instruction, connects the test terminal of the digital multimeter to the specified pair of nodes to be tested, so that the digital multimeter tests the impedance value of the specified pair of test nodes after a delay corresponding to the test delay time and outputs the impedance value to the processor;

[0009] The processor is further configured to determine whether the impedance value is a test standard solution for a specified pair of nodes to be tested, and obtain a test result.

[0010] Furthermore, the node pairs to be tested include related node pairs to be tested and unrelated node pairs to be tested.

[0011] Furthermore, the static electrical characteristics testing device also includes a calibration module;

[0012] The processor is used to send a self-test instruction to the calibration module;

[0013] The calibration module, in response to the self-test instruction, performs a self-test on the processor, matrix switch card and digital multimeter in the static electrical characteristics test device and calibrates the measurement accuracy of the digital multimeter, and outputs the self-test result and the calibration result to the processor.

[0014] Furthermore, the calibration module, in response to the self-test instruction, performs open circuit self-test and short circuit self-test on the processor, matrix switch card and digital multimeter in the static electrical characteristic testing device.

[0015] Furthermore, the static electrical characteristics testing device further includes a status indication module;

[0016] The processor is further used to identify the operating state of the static electrical characteristics testing device and control the state indicating module to indicate the operating state.

[0017] Furthermore, the operating state includes a self-test and calibration state, a test state, a communication state, and a fault state of the static electrical characteristic testing device.

[0018] Furthermore, the status indication module includes a digital quantity IO module and a plurality of status indicator lights; each of the status indicator lights corresponds to the operating status one by one;

[0019] The processor lights up a corresponding status indicator light through a digital quantity IO module based on the operating status.

[0020] Furthermore, the processor module is also used to adjust the measurement gear of the digital multimeter based on a test standard solution of a specified pair of nodes to be tested.

[0021] Furthermore, the static electrical characteristics testing device also includes a display module;

[0022] The processor is used to generate a test report based on the test result and control the display module to display the test report.

[0023] Furthermore, the static electrical characteristics testing device also includes a local control module and a remote control module;

[0024] The remote control module remotely controls the processor in response to a control instruction sent by a remote terminal;

[0025] The local control module controls the processor in response to local operations.

[0026] The beneficial effects of the present invention are as follows:

[0027] The present invention can efficiently measure and evaluate the static electrical characteristics of the hardware circuit, automatically obtain the node relationship table of the hardware circuit to be tested through the processor, extract the test parameters (such as test delay time and test standard solution) according to this information, and then send the test instruction. This process greatly reduces manual intervention, improves the test efficiency, and is particularly suitable for the test requirements of large-scale or complex hardware circuits. At the same time, the connection between the digital multimeter and the specified node pair to be tested is quickly and accurately established by using the matrix switch card, ensuring the accuracy of the test. At the same time, by setting the test delay time to wait for the device such as the capacitor to charge and enter a stable state, the test result is made more accurate. In addition, the combined use of the processor, the matrix switch card and the digital multimeter in the present invention enables the device to easily expand the test range, adapt to the test requirements of hardware circuits of different scales and types, and improve the versatility and adaptability of the test equipment. The processor is not only responsible for sending the test instruction, but also responsible for receiving the impedance value output by the digital multimeter, and comparing it with the test standard solution, and automatically determining the test result. This intelligent determination method reduces the possibility of human misjudgment and improves the reliability and consistency of the test result. Through the automated testing process, the present invention not only improves the testing efficiency, but also reduces the requirements for the professional skills of the testers, thereby reducing the testing costs. At the same time, the scalability and flexibility of the device also mean that it can serve the testing needs of different projects for a long time, further improving its cost-effectiveness. BRIEF DESCRIPTION OF THE DRAWINGS

[0028] The specific implementation modes of the present invention are further described in detail below in conjunction with the accompanying drawings.

[0029] Figure 1 A diagram showing an exemplary system architecture in which one embodiment of the present invention may be applied.

[0030] Figure 2 A schematic diagram showing the structure of a static electrical characteristics testing device for a hardware circuit according to a first embodiment of the present invention is shown.

[0031] Figure 3 A schematic diagram showing the structure of a static electrical characteristics testing device for a hardware circuit according to a second embodiment of the present invention is shown.

[0032] Figure 4 A schematic structural diagram of a static electrical characteristic testing device for a hardware circuit according to a third embodiment of the present invention is shown.

[0033] Figure 5 A schematic diagram showing the structure of a static electrical characteristics testing device for a hardware circuit according to a fourth embodiment of the present invention is shown. DETAILED DESCRIPTION

[0034] In order to explain the present invention more clearly, the present invention is further described below in conjunction with embodiments and drawings. Similar components in the drawings are represented by the same reference numerals. It should be understood by those skilled in the art that the content specifically described below is illustrative rather than restrictive, and the protection scope of the present invention should not be limited thereto.

[0035] like Figure 1 and Figure 2 As shown, an embodiment of the present invention provides a static electrical characteristics test device for a hardware circuit, including a processor, a matrix switch card and a digital multimeter:

[0036] The processor is used to obtain a node relationship table of the hardware circuit to be tested, extract the test delay time and the test standard solution of the node pair to be tested from the node relationship table, and output a test instruction for specifying the test node pair;

[0037] The matrix switch card, in response to the test instruction, connects the test terminal of the digital multimeter to the specified pair of nodes to be tested, so that the digital multimeter tests the impedance value of the specified pair of test nodes after a delay corresponding to the test delay time and outputs it to the processor;

[0038] The processor is further used to determine whether the impedance value is a test standard solution for a specified pair of nodes to be tested, and obtain a test result.

[0039] The present invention automatically obtains the node relationship table of the hardware circuit to be tested through a processor, extracts test parameters (such as test delay time and test standard solution) according to this information, and then sends a test instruction. This process greatly reduces manual intervention and improves test efficiency, and is particularly suitable for the test requirements of large-scale or complex hardware circuits. At the same time, the connection between the digital multimeter and the specified node pair to be tested is quickly and accurately established by using a matrix switch card, ensuring the accuracy of the test. At the same time, the purpose of setting the test delay time is to wait for the process of charging the capacitor to enter a stable state, so that the test result is more accurate. In addition, the combined use of the processor, the matrix switch card and the digital multimeter in the present invention enables the device to easily expand the test range, adapt to the test requirements of hardware circuits of different scales and types, and improve the versatility and adaptability of the test equipment. The processor is not only responsible for sending test instructions, but also responsible for receiving the impedance value output by the digital multimeter, and comparing it with the test standard solution to automatically determine the test result. This intelligent determination method reduces the possibility of human misjudgment and improves the reliability and consistency of the test results. Through the automated test process, the present invention not only improves the test efficiency, but also reduces the requirements for the professional skills of the tester, thereby reducing the test cost. At the same time, the scalability and flexibility of the device also means that it can serve the testing needs of different projects in the long term, further improving its cost-effectiveness.

[0040] In a possible implementation, the node pairs to be tested include related node pairs to be tested and unrelated node pairs to be tested.

[0041] In this embodiment, the relevant test nodes refer to two nodes with a certain impedance value on the hardware circuit to be tested (ie, not completely open circuit). By measuring the relevant test nodes, the working status and performance of the circuit and whether there is a fault can be understood.

[0042] Irrelevant test nodes: refers to two nodes on the hardware circuit to be tested that are almost insulated from each other (i.e., the impedance value is very high, close to an open circuit). Testing irrelevant test nodes can ensure the safety and reliability of the circuit.

[0043] In one possible implementation, Figure 3 As shown, the static electrical characteristics testing device also includes a calibration module;

[0044] A processor, configured to send a self-test instruction to the calibration module;

[0045] The calibration module, in response to the self-check instruction, performs a self-check on the inside of the static electrical characteristic test device and calibrates the measurement accuracy of the digital multimeter, and outputs the self-check result and the calibration result to the processor.

[0046] In one possible implementation, the calibration module, in response to a self-test instruction, performs an open circuit self-test and a short circuit self-test on a processor, a matrix switch card, and a digital multimeter in a static electrical characteristic test device.

[0047] In one possible implementation, Figure 4 As shown, the static electrical characteristics testing device also includes a status indication module;

[0048] The processor is also used to identify the operating status of the static electrical characteristics testing device and control the status indication module to indicate the operating status.

[0049] In a possible implementation, the operating state includes a self-test and calibration state, a test state, a communication state, and a fault state of the static electrical characteristic test device.

[0050] In a possible implementation, the status indication module includes a digital quantity IO module and a plurality of status indicator lights; each status indicator light corresponds to an operating state one by one;

[0051] The processor lights up the corresponding status indicator through the digital IO module based on the operating status.

[0052] In a possible implementation, the processor module is further configured to adjust the measurement range of the digital multimeter based on a test standard solution of a specified pair of nodes to be tested.

[0053] In a possible implementation, the static electrical characteristics testing device further includes a display module;

[0054] The processor is used to generate a test report based on the test results and control the display module to display the test report.

[0055] In one possible implementation, Figure 5 As shown, the static electrical characteristics test device also includes a local control module and a remote control module;

[0056] A remote control module, which remotely controls the processor in response to a control instruction sent by a remote terminal;

[0057] The local control module controls the processor in response to local operations.

[0058] In a specific example, the present invention provides a hardware circuit static electrical characteristics testing device, the device comprising:

[0059] Processor, matrix switch card, digital multimeter, calibration module and status indication module:

[0060] The processor is the system control center, responsible for calling all other internal functional modules and for information interaction with external terminals; the processor is used to obtain the node relationship table of the hardware circuit to be tested and create the file in a specified folder, extract the test delay time and test standard solution of the node pair to be tested from the node relationship table, and output the test instructions of the specified test node pair; among which, the node pairs to be tested include related node pairs to be tested and irrelevant node pairs to be tested.

[0061] The matrix switch card is a special switch device, whose structure is similar to a matrix in mathematics, and can realize multi-channel input and output, and each input terminal can be connected to multiple output terminals. In this embodiment, the matrix switch card, in response to the test instruction, controls the matrix switch card to close the two relays corresponding to the specified node pair to be tested, so that the test terminal of the digital multimeter is connected to the specified node pair to be tested, and a test loop is formed between the digital multimeter and the specified node pair to be tested. The function of the digital multimeter module is to complete the actual measurement of various impedance characteristics. After the test loop is formed, the impedance value of the specified test node pair can be tested by the digital multimeter after a delay corresponding to the test delay time and output to the processor;

[0062] The processor is further used to determine whether the impedance value is a test standard solution for a specified pair of nodes to be tested, and obtain a test result.

[0063] In a possible implementation, the static electrical characteristics testing device further includes a calibration module;

[0064] A processor, configured to send a self-test instruction to the calibration module;

[0065] The calibration module, in response to the self-test instruction, performs open circuit self-test and short circuit self-test on the processor, matrix switch card and digital multimeter in the static electrical characteristic test device and calibrates the measurement accuracy of the digital multimeter, and outputs the self-test result and the calibration result to the processor.

[0066] The calibration process of the calibration module is as follows: Connect the standard source to the digital multimeter through the calibration module through appropriate connections. Make sure the connection is correct and stable to avoid introducing additional errors.

[0067] Start automatic calibration and calibrate according to the preset calibration sequence (such as DC current → AC current → DC resistance → DC voltage → AC voltage, etc.). The calibration module will automatically switch the output value of the standard source and record the indication of the digital multimeter. At each calibration point, the calibration module will automatically calculate and evaluate the uncertainty. After the calibration is completed, the calibration module will generate a calibration report, including the indication error, uncertainty and other information of each calibration point, and send the calibration result to the processor. The processor will display the calibration result through the drive display module. The operator can judge whether the digital multimeter meets the technical requirements based on the calibration result.

[0068] The static electrical characteristics test device also includes a status indication module;

[0069] The processor is also used to identify the operating status of the static electrical characteristics testing device and control the status indication module to indicate the operating status.

[0070] The operating status includes the self-test and calibration status, test status, communication status and fault status of the static electrical characteristic test device.

[0071] Furthermore, the status indication module includes a digital quantity IO module and a plurality of status indicator lights; each status indicator light corresponds to a running status one by one;

[0072] The processor lights up the corresponding status indicator light through the digital IO module based on the operating status to indicate the current operating status of the device.

[0073] The processor module is also used to adjust the measurement gear of the digital multimeter based on the test standard solution of the specified node pair to be tested. The measurement gear of the digital multimeter is adjusted according to the unit of the standard solution and the maximum value of the test standard solution. For example, when the unit in the standard solution is f and the maximum value of the test standard solution is 500μf, the measurement gear of the digital multimeter is adjusted to the RX10 gear of the capacitance measurement gear, which can measure the capacitance value between 100 and 1000μF.

[0074] The static electrical characteristics testing device also includes a display module; the function of the display module is to display the execution process information; in a specific implementation, the processor generates a test report based on the test results and controls the display module to display the test report.

[0075] In a possible implementation, the circuit static electrical characteristics test device in this embodiment can work in two control working modes: local and remote. In the local working mode, the user completes the work process through the operation control of the local control module, and the work process in the remote working mode is controlled by external command information.

[0076] The static electrical characteristics test device also includes a local control module and a remote control module;

[0077] A remote control module, which remotely controls the processor in response to a control instruction sent by a remote terminal;

[0078] The local control module controls the processor in response to local operations. The main function of the local control module is to cooperate with the display module to control the processor to perform operations such as function selection, execution control, data query, etc.

[0079] This embodiment also includes a power module, which is mainly used to supply power to other functional modules.

[0080] In addition, in this embodiment, the hardware circuit static electrical characteristics test device is configured on the CPCI bus backplane. The function of the CPCI bus backplane is to provide a working environment and a transmission path for electrical signals for each functional module;

[0081] The working principle of the present invention is as follows:

[0082] When the local user selects the relevant contact test through the operation interface or remote control, the processor will operate according to the test information provided by the node relationship table of the hardware circuit to be tested, wherein the specified test node pair can be operated by the user through the local control module or the remote control module, or the order of the test sequence table of the nodes preset in the processor is specified in sequence, and there is no restriction here; the processor controls the matrix switch card to close the two relays corresponding to the specified test node pair, so that it forms a test loop, and then the processor issues instructions to configure the digital multimeter based on the test standard solution, selects the appropriate gear and delays the specified time, and reads the impedance value between the specified test node pair, and finally the processor displays the measurement results on the display module and generates a test report. When the local user selects an irrelevant contact test through the operation interface or remote control, the process is similar to the above process, which will not be repeated here. During the test execution, the processor will control the status indicator light through the digital quantity IO module, and the status indicator light will represent the different working states of the measurement.

[0083] Compared with the traditional manual measurement method, the present invention achieves versatility through contact configuration, and realizes automated testing, automatic process interpretation and automatic generation of result reports through software-controlled hardware, which provides the possibility for further data comparison and envelope analysis, and can be promoted and used in batches by referring to the design ideas.

[0084] In the description of the present invention, it should be noted that the terms "upper", "lower", etc. indicate positions or positional relationships based on the positions or positional relationships shown in the accompanying drawings, and are only for the convenience of describing the present invention and simplifying the description, rather than indicating or implying that the device or element referred to must have a specific position, be constructed and operated in a specific position, and therefore cannot be understood as a limitation on the present invention. Unless otherwise clearly specified and limited, the terms "installed", "connected", and "connected" should be understood in a broad sense, for example, it can be a fixed connection, a detachable connection, or an integral connection; it can be a mechanical connection or an electrical connection; it can be a direct connection, or it can be an indirect connection through an intermediate medium, or it can be a connection between the two elements. For those of ordinary skill in the art, the specific meanings of the above terms in the present invention can be understood according to the specific circumstances.

[0085] It should also be noted that, in the description of the present invention, relational terms such as first and second, etc., are only used to distinguish one entity or operation from another entity or operation, and do not necessarily require or imply any such actual relationship or order between these entities or operations. Moreover, the terms "comprise", "include" or any other variants thereof are intended to cover non-exclusive inclusion, so that a process, method, article or device including a series of elements includes not only those elements, but also other elements not explicitly listed, or also includes elements inherent to such process, method, article or device. In the absence of further restrictions, an element defined by the statement "comprises a ..." does not exclude the presence of other identical elements in the process, method, article or device including the element.

[0086] Obviously, the above embodiments of the present invention are merely examples for clearly illustrating the present invention, and are not limitations on the embodiments of the present invention. For those skilled in the art, other different forms of changes or modifications can be made based on the above description. It is impossible to list all the embodiments here. All obvious changes or modifications derived from the technical solution of the present invention are still within the protection scope of the present invention.

Claims

1. A static electrical characteristics test device for a hardware circuit, characterized in that: Includes processor, matrix switch card and DMM: The processor is used to obtain a node relationship table of a hardware circuit to be tested, extract a test delay time and a test standard solution of a node pair to be tested from the node relationship table, and output a test instruction for specifying a test node pair; The matrix switch card, in response to the test instruction, connects the test terminal of the digital multimeter to the specified pair of nodes to be tested, so that the digital multimeter tests the impedance value of the specified pair of test nodes after a delay corresponding to the test delay time and outputs it to the processor; The processor is further configured to determine whether the impedance value is a test standard solution for a specified pair of nodes to be tested, and obtain a test result.

2. The static electrical characteristics testing device according to claim 1, characterized in that: The node pairs to be tested include related node pairs to be tested and irrelevant node pairs to be tested.

3. The static electrical characteristics testing device according to claim 1, characterized in that: The static electrical characteristics testing device also includes a calibration module; The processor is used to send a self-test instruction to the calibration module; The calibration module, in response to the self-test instruction, performs a self-test on the processor, matrix switch card and digital multimeter in the static electrical characteristics test device and calibrates the measurement accuracy of the digital multimeter, and outputs the self-test result and the calibration result to the processor.

4. The static electrical characteristics testing device according to claim 3, characterized in that: The calibration module, in response to the self-test instruction, performs open circuit self-test and short circuit self-test on the processor, matrix switch card and digital multimeter in the static electrical characteristic test device.

5. The static electrical characteristics testing device according to claim 3, characterized in that: The static electrical characteristics testing device also includes a status indication module; The processor is further used to identify the operating state of the static electrical characteristics testing device and control the state indicating module to indicate the operating state.

6. The static electrical characteristics testing device according to claim 5, characterized in that: The operating state includes a self-test and calibration state, a test state, a communication state, and a fault state of the static electrical characteristic test device.

7. The static electrical characteristics testing device according to claim 5 or 6, characterized in that: The status indication module includes a digital quantity IO module and a plurality of status indicator lights; each of the status indicator lights corresponds to the operating status one by one; The processor lights up a corresponding status indicator light through a digital quantity IO module based on the operating status.

8. The static electrical characteristics testing device according to claim 1, characterized in that: The processor module is further configured to adjust the measurement gear of the digital multimeter based on a test standard solution of a specified pair of nodes to be tested.

9. The static electrical characteristics testing device according to claim 1, characterized in that: The static electrical characteristics testing device also includes a display module; The processor is used to generate a test report based on the test result and control the display module to display the test report.

10. The static electrical characteristics testing device according to claim 1, characterized in that: The static electrical characteristics testing device also includes a local control module and a remote control module; The remote control module remotely controls the processor in response to a control instruction sent by a remote terminal; The local control module controls the processor in response to local operations.

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