Embedded test data report process architecture and test data report structure design method
Through the design of the embedded test data report process architecture and the data structure of the JSON format, the test data report in the industrial manufacturing field is difficult to meet the problem of multiple demand, realized efficient storage and display, and provided a standardized data structure for the big data analysis system.
Patent Information
- Application Number
- CN202411418384.9
- Authority / Receiving Office
- CN · China
- Patent Type
- Applications(China)
- Current Assignee / Owner
- Filing Date
- 2024-10-11
- Publication Date
- 2025-01-24
AI Technical Summary
The prior art is difficult to design a data structure and process architecture for test data reports in the field of industrial manufacturing, which can meet the requirements of easy storage, lightweight, strong readability, high scalability, strong versatility and high data accuracy at the same time. .
An embedded test data reporting process architecture is designed, including a data organization layer, a data transmission layer and a data storage layer. It adopts a JSON format data structure and achieves efficient test data reporting through a hierarchical process architecture and cloud database design. Storage and display.
The easy storage, lightweight, readability, high scalability, strong versatility, and high accuracy of the data of the test data report have reduced the database memory space overhead, and provided a standardized data structure for the establishment of a big data analysis system for enterprises to establish a big data analysis system. Base.
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Figure CN119357144A_ABST
Abstract
Description
Technical Field
[0001] The present invention relates to the field of embedded product testing, and in particular to an embedded test data report flow architecture and a test data report structure design method. Background Art
[0002] In the field of industrial manufacturing, product quality is the guarantee for the survival and development of enterprises, and test data reports are key information reflecting the quality of enterprise products. As customers have higher and higher requirements for product quality, some industrial customers require enterprises to provide full-process test data reports for products, making enterprises in the industrial production field more aware of the importance of test data reports. Since the test data report in the industrial manufacturing field needs to be easy to store, lightweight, highly readable, highly scalable, highly versatile, and highly accurate in data structure design, and all of the above features are indispensable. However, most companies in the industrial manufacturing field do not have relevant talents and knowledge reserves in the direction of test data structure design, so many companies abandon the test data report related modules in the process of implementing the test system. Only a small number of companies invest relevant manpower and material resources, but the final results are not satisfactory.
[0003] Since test data reports in the industrial manufacturing field need to be easy to store, lightweight, highly readable, highly scalable, versatile, and have high data accuracy, etc., the difficulty of data structure design for test data reports has increased significantly. Some existing data structure design schemes in other fields can meet some of the conditions and have certain reference value, but the data structure design scheme for test data reports in the industrial manufacturing field cannot play a key role in breaking through barriers. Summary of the invention
[0004] The technical problem to be solved by the present invention is to overcome the shortcomings of the prior art and provide an embedded test data report process architecture and a test data report structure design method, which enable the output test data report in the industrial manufacturing field to have the characteristics of easy storage, lightweight, strong readability, high scalability, strong versatility, and high data value and high accuracy, so as to help enterprises in the industrial manufacturing field solve the shortcomings of test data reports in data structure design and process execution, and at the same time provide a relevant standardized data structure foundation for enterprises to establish big data analysis systems.
[0005] The technical solution adopted by the embedded test data reporting process architecture of the present invention is that the process architecture includes a data organization layer, a data transmission layer and a data storage layer.
[0006] The data organization layer composes relevant test data reports based on the product basic information and test stimulus information provided by the data transmission layer and the test process information generated by itself, and sends the test data reports to the data transmission layer;
[0007] The data transmission layer is connected between the data organization layer and the data storage layer. The data transmission layer obtains basic product information from the data storage layer and sends it to the data organization layer, provides test stimulus data for the data organization layer, and forwards the test data report sent by the data organization layer to the data storage layer.
[0008] The data storage layer provides basic product information data for product testing, stores product test data reports, and provides basic test data reports for later data applications.
[0009] Furthermore, the data organization layer is provided with
[0010] A test data report object generation module for generating a test data report object rpt;
[0011] A test item data object generation module for generating a test item data object data;
[0012] A test item information object generation module for generating a test item information object itemInfo;
[0013] A process and result generation module for generating each test item process and result res according to the test process;
[0014] A test item data packaging generation module for packaging test item data to generate test data ch; and
[0015] A data sending module for filling the real-time test data lev into the test data ch and finally sending it to the transport layer.
[0016] Furthermore, the data storage layer is provided with a cloud database, and the data structure of the cloud database is consistent with that of the test data report, each product basic information data is a column, the test process data is a column, and the error information is a column to form the entire database table.
[0017] More specifically, the error information is classified according to the information content, and the type is set to int to distinguish the relevant information that caused the test failure.
[0018] The method for designing a test data report structure using the above embedded test data report process architecture includes the following steps:
[0019] a. Product basic information data structure design: Product basic information data includes basic product information, providing basic classification information data for data analysis. Product basic information includes each tested product information, test methods and environment, and test results;
[0020] b. Test process data structure design: The test process data structure records the important information and data generated by the entire test item during the test process according to the product test items. The storage method of the test process data structure is designed based on JSON strings. The test process data includes the performance data of each module of the product during the test process. This performance data provides a basis for product quality control, failure analysis, product iteration and upgrade, product development direction, and product data model establishment;
[0021] c. Test data report format design: Set the test data report process data uploading structure based on JSON string. The test data report includes test process data, test data report object, test item data object, test item information object, test process and results of each test item, test item specific test data and real-time test data. The object content of the test data report includes name, value type, value content and meaning.
[0022] More specifically, in step a, the basic product information includes serial number, model, version, test software package, test case serial number, test bench hardware number, whether the automatic mode is selected, test results, tester name, tester number and test time.
[0023] The beneficial effects of the present invention are:
[0024] 1. The data flow architecture of the present invention is clearly divided into different levels, each level has a clear positioning, and the coupling between the layers is low;
[0025] 2. The data structure of the present invention is based on the JSON format, which is beneficial to data transmission, storage and parsing. At the same time, it inherits the compression form of JSON and effectively helps the test data report save storage space when stored in the cloud database, reduces the database memory space overhead, and the formatted form effectively helps the test data report to clearly express the entire test process during display and viewing;
[0026] 3. The address pointing method is used in the product basic information data structure to effectively reduce the resource overhead of the test system when the product information data is transmitted during the test process;
[0027] 4. The unified test data report is consistent with the cloud database format, which can effectively prevent differences in data implementation in the data structure and storage method of different products;
[0028] 5. The present invention has good scalability and versatility. The product basic information data structure and cloud database design solution can be used directly by the enterprise or added or deleted according to the enterprise itself. The test process data structure can obtain test data reports of different products according to the test items of different products. At the same time, the test data report is consistent in data organization, and the enterprise can build its own big data analysis system based on this;
[0029] 6. The data collected by the test data report of the present invention is unified and standardized. Since all data are generated and provided by the test system, the authenticity and accuracy of the data are maintained, the research and analysis value of the test data is guaranteed, and the basis for enterprises to conduct quality analysis and improvement directions as well as big data analysis systems is provided;
[0030] 7. The present invention is a standardized data structure design. Analysts can extract the same test item data from different products to summarize and analyze and draw the required conclusions, which can effectively help enterprises conduct quality analysis and summary across products. BRIEF DESCRIPTION OF THE DRAWINGS
[0031] Figure 1 is a general architecture diagram of the embedded test data reporting process architecture;
[0032] Figure 2 is an architectural diagram of the data organization layer;
[0033] Figure 3 It is a flow chart for generating test data report at the data organization layer. DETAILED DESCRIPTION
[0034] like Figure 1 As shown, the embedded test data reporting process architecture of the present invention includes a data organization layer 1, a data transmission layer 2 and a data storage layer 3.
[0035] The data organization layer 1 forms a related test data report with the product basic information and test stimulus information provided by the data transmission layer 2 and the test process information generated by itself, and sends the test data report to the data transmission layer 2;
[0036] The data transmission layer 2 is connected between the data organization layer 1 and the data storage layer 3. The data transmission layer 2 obtains basic product information from the data storage layer 3 and sends it to the data organization layer 1, provides test stimulus data for the data organization layer 1, and forwards the test data report sent by the data organization layer 1 to the data storage layer 3.
[0037] The data storage layer 3 provides basic product information data for product testing, stores product test data reports, and provides basic test data reports for later data applications.
[0038] Specifically, the data organization layer 1 is provided with
[0039] A test data report object generating module 11 for generating a test data report object rpt;
[0040] A test item data object generating module 12 for generating a test item data object data;
[0041] A test item information object generating module 13 for generating a test item information object itemInfo;
[0042] A process and result generating module 14 for generating each test item process and result res according to the test process;
[0043] A test item data packaging generating module 15 for packaging the test item data to generate test data ch; and
[0044] The data sending module 16 is used to fill the real-time test data lev into the test data ch and finally send it to the transmission layer 2.
[0045] The data storage layer 3 is provided with a cloud database, and the data structure of the cloud database is consistent with that of the test data report. Each product basic information data is a column, the test process data is a column, and the error information is a column to form the entire database table. The error information is classified according to the information content, and the type is set to int, which is used to distinguish the relevant information that caused the test failure. The final cloud database table is designed with reference to the following contents, and the enterprise can also add, delete or modify the corresponding information according to its own needs.
[0046]
[0047] The method for designing a test data report structure using the above-mentioned embedded test data report process architecture includes the following steps:
[0048] a. Product basic information data structure design: Product basic information data includes basic product information, providing basic classification information data for data analysis. Product basic information includes each tested product information, test method and environment, and test results; here, product basic information includes serial number, model, version, test software package, test case serial number, test bench hardware number, whether it is automatic mode selection, test results, tester name, tester number and test time.
[0049] Typical test product basic information includes the following, as shown in the following table.
[0050]
[0051] b. Design of test process data structure: The test process data structure records the important information and data generated by the entire test item during the test process according to the product test items. The storage method of the test process data structure is designed based on JSON strings. The test process data includes the performance data of each module during the test process. This performance data provides a basis for product quality control, failure analysis, product iteration and upgrade, product development direction, and product data model establishment; the test process data structure data storage is based on JSON strings, which conforms to the string type data in JSON format. Therefore, it follows the JSON syntax rules.
[0052] c. Test data report format design: Set the test data report process data uploading structure based on JSON string. The test data report includes test process data, test data report object, test item data object, test item information object, test process and results of each test item, test item specific test data and real-time test data. The object content of the test data report includes name, value type, value content and meaning.
[0053] The data upload structure of the test data report process is based on a JSON string. The content of the object consists of "name / value" pairs. The specific data structure content is shown in Tables 1 to 7:
[0054] Test process data, the corresponding object content is:
[0055]
[0056] Table 1 "rpt": test data report object, the corresponding object content is:
[0057] name Type of value Value Content meaning rptVer Numeric 1 / 2 / 3…… Test Data Report Format Version
[0058] Table 2 "data": test item data object, the corresponding object content is:
[0059]
[0060] Table 3 "itemInfo": test item information object, the corresponding object content is:
[0061]
[0062] Table 4 "res": test process and results of each test item. The corresponding object contents in the array are:
[0063] name Type of value Value Content meaning ch Arrays See Table 6 Specific test data of the test item
[0064] Table 5
[0065] "ch": specific test data of the test item. This requires the enterprise to define the test items according to its own products. For example, the object content in the corresponding array designed with the power system AC quantity test item process as the data template is:
[0066] name Type of value Value Content meaning No Numeric 1 Channel number chName String "ADIN1" Channel Name Tp Numeric 0 / 1 / 2 / …… Channel Type lev Arrays An array of test data objects for each test point
[0067] Table 6 "lev": real-time test data, the corresponding object content in the array is:
[0068] name Type of value Value Content meaning stdAmp Numeric 60.000 Standard value actAmp Numeric 60.001 Error value ampErr String 0.001% Actual error stdAng Numeric 180 Standard value actAng Numeric 181 Actual value angErr Numeric 1 Actual difference
[0069] Table 7
[0070] The format of the test data report is presented in the following code:
[0071]
[0072] The present invention helps enterprises in the field of industrial manufacturing solve the problem that test data reporting cannot be realized in the test system due to test data flow and data structure design problems. The present invention adopts a hierarchical design in the data flow architecture, and each level has a clear positioning and low coupling between layers. The core data design inherits the JSON format, which is conducive to data transmission, storage and parsing while allowing data to have good display and accessibility. In order to ensure the problem of test system overhead, the present invention adopts the principle of compressing data information to the simplest level. At the same time, the present invention has good scalability and versatility. Different products of different enterprises only need to replace their test item content to obtain the desired test data report. Since the test data report is consistent in data organization, the enterprise can establish its own big data analysis system based on this. The purpose of the present invention can help enterprises in the field of industrial manufacturing solve the shortcomings of test data reports in data structure design, and at the same time provide a relevant standardized data structure foundation for enterprises to establish a big data analysis system.
[0073] Finally, it should be emphasized that the above is only a preferred embodiment of the present invention and is not intended to limit the present invention. For those skilled in the art, the present invention may have various changes and modifications. Any modifications, equivalent substitutions, improvements, etc. made within the spirit and principles of the present invention should be included in the scope of protection of the present invention.
Claims
1. An embedded test data reporting process architecture, characterized in that: The architecture includes a data organization layer (1), a data transmission layer (2) and a data storage layer (3). The data organization layer (1) forms a relevant test data report based on the product basic information and test stimulus information provided by the data transmission layer (2) and the test process information generated by itself, and sends the test data report to the data transmission layer (2); The data transmission layer (2) is connected between the data organization layer (1) and the data storage layer (3); the data transmission layer (2) obtains basic product information from the data storage layer (3) and sends it to the data organization layer (1), provides test stimulus data for the data organization layer (1), and forwards the test data report sent by the data organization layer (1) to the data storage layer (3); The data storage layer (3) provides basic product information data for product testing, stores product test data reports, and provides basic test data reports for later data applications.
2. The embedded test data reporting process architecture according to claim 1, characterized in that: The data organization layer (1) is provided with A test data report object generating module (11) for generating a test data report object rpt; A test item data object generation module (12) for generating a test item data object data; A test item information object generation module (13) for generating a test item information object itemInfo; A process and result generation module (14) for generating each test item process and result res according to the test process; A test item data packaging generation module (15) for packaging test item data to generate test data ch; as well as A data sending module (16) for filling the real-time test data lev into the test data ch and finally sending the real-time test data lev to the transmission layer (2).
3. The embedded test data reporting process architecture according to claim 1, characterized in that: The data storage layer (3) is provided with a cloud database, and the data structure of the cloud database is consistent with that of the test data report, wherein each product basic information data is a column, the test process data is a column, and the error information is a column to form the entire database table.
4. The embedded test data reporting process architecture according to claim 3, characterized in that: Error information is classified according to the information content, and the type is set to int to distinguish the relevant information that caused the test failure.
5. A method for designing a test data report structure using the embedded test data report process architecture as claimed in claim 1, characterized in that: The method comprises the following steps: a. Product basic information data structure design: Product basic information data includes basic product information, providing basic classification information data for data analysis. Product basic information includes each tested product information, test methods and environment, and test results; b. Test process data structure design: The test process data structure records the important information and data generated by the entire test item during the test process according to the product test items. The storage method of the test process data structure is designed based on JSON strings. The test process data includes the performance data of each module of the product during the test process. This performance data provides a basis for product quality control, failure analysis, product iteration and upgrade, product development direction, and product data model establishment; c. Test data report format design: Set the test data report process data uploading structure based on JSON string. The test data report includes test process data, test data report object, test item data object, test item information object, test process and results of each test item, test item specific test data and real-time test data. The object content of the test data report includes name, value type, value content and meaning.
6. The method according to claim 5, characterized in that: In step a, the basic product information includes serial number, model, version, test software package, test case serial number, test bench hardware number, whether the automatic mode is selected, test results, tester name, tester number and test time.