Device testing method, system and electronic equipment

Abstract

The embodiment of the present application discloses a device testing method, system and electronic device, which may include: obtaining the current rotation angle of the first device under test in the test darkroom; determining the target phase parameter based on the current rotation angle and the phase parameter set of the first antenna of the first device under test, the phase parameter set of the first antenna including the phase parameter corresponding to the maximum power parameter of the first antenna measured at each preset rotation angle; performing measurement control based on the target phase parameter to obtain the radiation power of the first antenna at the current rotation angle; determining the total radiation power of the first antenna based on the radiation power of the first antenna at each preset rotation angle. It can be seen that the measured antenna is effectively locked according to the phase parameter set of each antenna of the device under test, so as to accurately measure the RF performance of the device under normal use, and there is no need for the device under test to enter the engineering mode, which effectively reduces the complexity of the test.

Description

Technical Field

[0001] The present application relates to the field of automated testing technology, and in particular to a device testing method, system and electronic equipment. Background Art

[0002] Accurate testing of the RF performance of wireless communication equipment can provide a reference for design optimization in the R&D and production processes. The Over the Air (OTA) test method uses an over-the-air radiation connection instead of a traditional cable connection to test the entire wireless communication device. It can accurately evaluate the overall RF performance of wireless communication equipment in real scenarios and has become a standard test method for mobile phones and other wireless communication devices. The international standards organization stipulates that the standard test items in the single input single output (SISO) scenario include total radiated power (TRP) and total isotropic sensitivity (TIS).

[0003] Among them, for the TRP test, since wireless communication devices such as mobile phones generally switch the transmitting antenna when transmitting signals, such as dynamically selecting the antenna with the largest signal, the TRP test usually requires flashing engineering software or using an unlock code to put the device into engineering mode to measure a stable TRP value. However, this test method is complicated to operate, and there are certain differences between the engineering mode and the normal mode of the device, and it is impossible to measure the RF performance of the device under normal use. Summary of the invention

[0004] The embodiments of the present application provide a device testing method, system and electronic device, which can effectively lock the measured antenna according to the phase parameter set of each antenna of the device under test, so as to accurately measure the RF performance of the device under normal use, and there is no need for the device under test to enter the engineering mode, thereby effectively reducing the complexity of the test.

[0005] In a first aspect, an embodiment of the present application provides a device testing method, the method comprising: obtaining a current rotation angle of a first device under test in a test chamber; determining a target phase parameter based on the current rotation angle and a phase parameter set of a first antenna of the first device under test, the phase parameter set of the first antenna including a phase parameter corresponding to a maximum power parameter of the first antenna measured at each preset rotation angle, the first antenna being any antenna of the first device under test; performing measurement control based on the target phase parameter to obtain the radiation power of the first antenna at the current rotation angle; in the case where the radiation power of the first antenna at each preset rotation angle is obtained, determining the total radiation power of the first antenna based on the radiation power of the first antenna at each preset rotation angle. It can be seen that in this technical solution, in the antenna testing phase, the measured antenna can be effectively locked according to the phase parameter set of each antenna of the device under test, for example, in the process of the first device under test rotating with the turntable of the test chamber, for the currently measured antenna (such as the first antenna), the measured antenna can be effectively locked according to the phase parameter set of the first antenna at each rotation angle, thereby accurately measuring the RF performance of each antenna of the device under normal use, and there is no need for the device under test to enter the engineering mode, effectively reducing the complexity of the test.

[0006] In combination with the first aspect, in a possible manner, measurement control is performed based on a target phase parameter to obtain the radiation power of the first antenna at the current rotation angle, including: setting the phase parameter of a signal adjustment device to the target phase parameter, the signal adjustment device is used to control one of the multiple communication antennas to communicate with the first antenna, and when the phase parameter of the signal adjustment device is the target phase parameter, the signal strength of the first antenna is greater than the signal strength of other antennas of the first device under test; obtaining the radiation power of the first antenna at the current rotation angle; the radiation power of the first antenna at the current rotation angle is obtained by the first measuring device measuring the transmission signal of the first antenna through the measuring antenna. It can be seen that for each rotation angle of the device under test, the target phase parameter corresponding to the antenna under test at each rotation angle is obtained from the phase parameter set of the antenna under test (such as the first antenna), and by setting the phase parameter of the signal adjustment device to the target phase parameter, the signal strength of the antenna under test of the device under test can be made greater than the signal strength of other antennas of the device under test, that is, the currently measured antenna can be locked without the device under test entering the engineering mode, thereby effectively obtaining the radiation power of the currently measured antenna at each rotation angle.

[0007] In combination with the first aspect, in one possible manner, the above method also includes: for each preset rotation angle, obtaining the power parameter of the second antenna of the second device under test based on multiple preset phase parameters; the device parameters of the second device under test are the same as the device parameters of the first device under test; based on the obtained power parameter of the second antenna of the second device under test, determining the phase parameter corresponding to the maximum power parameter of the second antenna at each preset rotation angle; the position of the second antenna on the second device under test is the same as the position of the first antenna on the first device under test; based on the phase parameter corresponding to the maximum power parameter of the second antenna at each preset rotation angle, determining the phase parameter set of the first antenna. It can be seen that in the antenna calibration stage, a second device under test with the same parameters as the first device under test is used. When the phase parameter set of the first antenna of the first device under test is obtained, the power parameters of the second antenna on the second device under test with the same position as the above-mentioned first antenna can be measured, and the second device under test is rotated to each preset rotation angle. For example, the turntable of the test darkroom can be controlled to drive the second device under test to rotate to each preset rotation angle respectively, so that the second device under test rotates one circle with the turntable. Whenever the second device under test rotates to a preset rotation angle, the power parameters of the second antenna under different phase parameters are obtained by adjusting the phase parameters, and the phase parameters corresponding to the maximum power parameters of the second antenna at each preset rotation angle are determined, and then the phase parameter set of the first antenna is determined. By calibrating and measuring each antenna of the second device under test, the phase parameter set of each antenna of the first device under test can be accurately obtained, so that in the antenna measurement stage, the phase parameter set of each antenna can be used to effectively lock the currently measured antenna.

[0008] In combination with the first aspect, in a possible manner, the second device under test and the first device under test are the same device under test. It can be seen that the same device can be used to complete the calibration and test of the antenna, which helps to reduce the test cost.

[0009] In combination with the first aspect, in a possible manner, for each preset rotation angle, the power parameter of the second antenna of the second device under test is obtained based on multiple preset phase parameters, including: controlling the second measuring device to be electrically connected to the second antenna of the second device under test; controlling the rotation angle of the second device under test to be each preset rotation angle; when the rotation angle of the second device under test is any preset rotation angle, adjusting the phase parameter of the signal adjustment device based on multiple preset phase parameters; each time the phase parameter of the signal adjustment device is adjusted to a preset phase parameter, the power parameter of the second antenna measured by the second measuring device is obtained. It can be seen that the second measuring device can be electrically connected to the antenna currently to be calibrated (such as the second antenna of the second device under test mentioned above) through control, each time the rotation angle of the second device under test is adjusted to a preset rotation angle, the phase parameter of the signal adjustment device is adjusted based on multiple preset phase parameters, each time the phase parameter of the signal adjustment device is adjusted, the power parameter of the second antenna is measured by the second measuring device, thereby accurately obtaining the power parameter of the second antenna at each preset phase parameter under each preset rotation angle.

[0010] In combination with the first aspect, in a possible manner, the power parameter may be an S21 parameter in the transmission parameter S, and the S21 parameter may accurately evaluate the signal strength of the antenna at different phase parameters.

[0011] In combination with the first aspect, in one possible manner, the second measuring device is electrically connected to the switch module, and each antenna of the second device to be tested is electrically connected to the switch module; controlling the second measuring device to be electrically connected to the second antenna of the second device to be tested includes: sending a switching control instruction to the switch module, the switching control instruction is used to trigger the switch module to connect the second measuring device to the second antenna of the second device to be tested, and disconnect the second measuring device from the other antennas of the second device to be tested. It can be seen that the switch module can be electrically connected to the second measuring device and each antenna of the second device to be tested. When a certain antenna needs to be calibrated, the certain antenna can be connected to the second measuring device by controlling the switch module, and other antennas can be disconnected from the second measuring device, thereby effectively locking the corresponding antenna for calibration, and realizing automatic locking of the calibration antenna through the switch module, which helps to improve the efficiency of antenna calibration.

[0012] In a second aspect, an embodiment of the present application provides a device testing system, the system comprising a test darkroom, an electronic device, a signal conditioning device, a first measuring device, and a plurality of communication antennas, the electronic device being electrically connected to the signal conditioning device and the first measuring device, respectively, and the signal conditioning device being electrically connected to the plurality of communication antennas, wherein:

[0013] An electronic device, used for obtaining a current rotation angle of a first device under test in a test darkroom; determining a target phase parameter based on the current rotation angle and a phase parameter set of a first antenna of the first device under test; the phase parameter set of the first antenna includes a phase parameter corresponding to a maximum power parameter of the first antenna measured at each preset rotation angle; the first antenna is any antenna of the first device under test; and setting the phase parameter of a signal conditioning device to the target phase parameter;

[0014] a signal conditioning device, configured to control a communication antenna among the plurality of communication antennas to communicate with the first antenna;

[0015] A first measuring device is used to measure the transmission signal of the first antenna through a measuring antenna included in the test chamber to obtain the radiation power of the first antenna at a current rotation angle;

[0016] The electronic device is also used to obtain the radiation power of the first antenna at the current rotation angle measured by the first measuring device, and when the radiation power of the first antenna at each preset rotation angle is obtained, determine the total radiation power of the first antenna based on the radiation power of the first antenna at each preset rotation angle.

[0017] It can be seen that in this technical solution, during the antenna test phase, the electronic device can control the phase parameter of the signal adjustment device according to the phase parameter set of each antenna of the device under test. At each rotation angle, by setting the phase parameter of the signal adjustment device to the target phase parameter corresponding to the rotation angle in the phase parameter set, the signal adjustment device can use the target phase parameter to control one of the multiple communication antennas to communicate with the currently measured antenna (such as the first antenna), so that the signal strength of the currently measured antenna is greater than that of other antennas, thereby effectively locking the currently measured antenna. The first measuring device can accurately measure the radiation power of the currently locked antenna at each rotation angle. The electronic device determines the total radiation power TRP of the currently locked antenna based on the radiation power of the currently locked antenna at each preset rotation angle. By effectively locking the measured antenna according to the phase parameter set of the currently measured antenna at each rotation angle, the RF performance of each antenna of the device under normal use can be accurately measured, and the device under test does not need to enter the engineering mode, effectively reducing the complexity of the test.

[0018] In conjunction with the second aspect, in one possible manner, the electronic device is further used for:

[0019] For each preset rotation angle, a power parameter of a second antenna of a second device under test is obtained based on a plurality of preset phase parameters; the device parameters of the second device under test are the same as the device parameters of the first device under test;

[0020] Based on the acquired power parameter of the second antenna of the second device under test, determining the phase parameter corresponding to the maximum power parameter of the second antenna at each preset rotation angle; the position of the second antenna on the second device under test is the same as the position of the first antenna on the first device under test;

[0021] A phase parameter set of the first antenna is determined based on the phase parameter corresponding to the maximum power parameter of the second antenna at each preset rotation angle.

[0022] It can be seen that in the antenna calibration stage, a second device under test with the same parameters as the first device under test is used. When the phase parameter set of the first antenna of the first device under test is obtained, the power parameter of the second antenna on the second device under test with the same position as the above-mentioned first antenna can be measured. The electronic device rotates the second device under test to each preset rotation angle by controlling the test darkroom. For example, the turntable of the test darkroom can be controlled to drive the second device under test to rotate to each preset rotation angle respectively, so that the second device under test rotates one circle with the turntable. Whenever the second device under test rotates to a preset rotation angle, the power parameter of the second antenna under different phase parameters is obtained by adjusting the phase parameter, and the phase parameter corresponding to the maximum power parameter of the second antenna at each preset rotation angle is determined, and then the phase parameter set of the first antenna is determined. The electronic device can accurately obtain the phase parameter set of each antenna of the first device under test by performing calibration measurement on each antenna of the second device under test, so that in the antenna measurement stage, the phase parameter set of each antenna is used to effectively lock the currently measured antenna.

[0023] In conjunction with the second aspect, in one possible manner, the system further includes a second measuring device, wherein:

[0024] The electronic device is further used to control the second measuring device to be electrically connected to the second antenna of the second device under test; control the rotation angle of the second device under test to be each preset rotation angle; and when the rotation angle of the second device under test is any preset rotation angle, adjust the phase parameters of the signal conditioning device based on multiple preset phase parameters respectively;

[0025] a second measuring device, used to measure a power parameter of the second antenna;

[0026] The electronic device is also used to adjust the phase parameter of the signal adjustment device to a preset phase parameter each time, and obtain the power parameter of the second antenna measured by the second measuring device.

[0027] It can be seen that the electronic device controls the second measuring device to be electrically connected to the antenna that currently needs to be calibrated (such as the second antenna of the second device to be tested mentioned above). Each time the rotation angle of the second device to be tested is adjusted to a preset rotation angle, the electronic device adjusts the phase parameters of the signal adjustment device based on multiple preset phase parameters. Each time the phase parameters of the signal adjustment device are adjusted, the second measuring device measures the power parameters of the second antenna, thereby accurately obtaining the power parameters of the second antenna at each preset phase parameter under each preset rotation angle.

[0028] In combination with the second aspect, in a possible manner, the system further includes a switch module, the switch module is electrically connected to the second measuring device and the electronic device, and the switch module is also electrically connected to each antenna of the second device to be tested, wherein:

[0029] The electronic device is also used to send a switching control instruction to the switch module;

[0030] The switch module is used to respond to the switching control instruction to connect the second measuring device with the second antenna of the second device under test, and disconnect the second measuring device from other antennas of the second device under test.

[0031] It can be seen that by setting the switch module to be electrically connected to the second measuring device and also to each antenna of the second device to be tested, when a certain antenna needs to be calibrated, the electronic device controls the switch module to connect the certain antenna to the second measuring device, and disconnects other antennas from the second measuring device, thereby effectively locking the corresponding antenna for calibration, and realizing automatic locking of the calibration antenna through the switch module, which helps to improve the efficiency of antenna calibration.

[0032] In combination with the second aspect, in a possible manner, the plurality of communication antennas are evenly distributed around a turntable in the test chamber, and the turntable is used to drive the first device under test or the second device under test to rotate.

[0033] It can be seen that by evenly distributing multiple communication antennas around the turntable in the test chamber, it is possible to avoid the phase parameters corresponding to the maximum power parameters measured for different antennas being close during the antenna calibration phase, which helps to improve the effectiveness of using phase parameters to lock the antenna during the measurement phase, thereby improving the accuracy of the antenna RF performance test.

[0034] In a third aspect, the present application provides an electronic device, comprising: one or more processors, a memory and a communication module; the memory is coupled to the one or more processors, the memory is used to store computer program code, the computer program code includes computer instructions, and the one or more processors call the computer instructions to enable the electronic device to execute any method described in any one of the first aspects above.

[0035] In a fourth aspect, the present application provides a computer-readable storage medium, which stores a computer program. When the computer program is executed by a processor, it implements the method described in any one of the first aspects above.

[0036] In a fifth aspect, the present application provides a computer program product comprising instructions, which, when executed on an electronic device, enables the electronic device to execute any of the methods described in the first aspect above. BRIEF DESCRIPTION OF THE DRAWINGS

[0037] Figure 1 A schematic diagram of the structure of a device testing system provided in an embodiment of the present application;

[0038] Figure 2 A schematic diagram of the structure of an antenna calibration system provided in an embodiment of the present application;

[0039] Figure 3a A schematic diagram of the structure of another device testing system provided in an embodiment of the present application;

[0040] Figure 3b A schematic diagram of the structure of another device testing system provided in an embodiment of the present application;

[0041] Figure 4 A schematic diagram of a flow chart of a device testing method provided in an embodiment of the present application;

[0042] Figure 5 A schematic diagram of another device testing method provided in an embodiment of the present application;

[0043] Figure 6 A flowchart of another device testing method provided in an embodiment of the present application;

[0044] Figure 7 A schematic diagram of the software structure of an electronic device provided in an embodiment of the present application;

[0045] Figure 8 A schematic diagram of the hardware structure of an electronic device provided in an embodiment of the present application. DETAILED DESCRIPTION

[0046] The following will be combined with the drawings in the embodiments of the present application to clearly and completely describe the technical solutions in the embodiments of the present application. Obviously, the described embodiments are only part of the embodiments of the present application, not all of the embodiments. Based on the embodiments in the present application, all other embodiments obtained by ordinary technicians in this field without creative work are within the scope of protection of this application.

[0047] The terms "first", "second", "third", etc. in the embodiments of the present application are distinguished from different objects, rather than being used to describe a specific order. In addition, the terms "include" and "have" and any variation thereof are intended to cover non-exclusive inclusions. For example, a series of steps or units are included, or alternatively, steps or units not listed are also included, or other steps or units inherent to these processes, methods, products or devices are optionally included. The terms "one embodiment" or "some embodiments", etc. mean that the specific features, structures or characteristics described in conjunction with the embodiment are included in one or more embodiments of the present application. Thus, the statements "in one embodiment", "in some embodiments", "in some other embodiments", "in some other embodiments", etc. that appear in the differences in the embodiments of the present application are not necessarily all with reference to the same embodiment, but mean "one or more but not all embodiments", unless otherwise particularly emphasized.

[0048] In the embodiments of the present application, words such as "exemplary", "for example", or "for example" are used to indicate examples, illustrations, or descriptions. Any embodiment or design described as "exemplary", "for example", or "for example" in the embodiments of the present application should not be interpreted as being more preferred or more advantageous than other embodiments or designs. Specifically, the use of words such as "exemplary", "for example", or "for example" is intended to present related concepts in a specific way.

[0049] In addition, "at least one" means one or more, and "plurality" means two or more. "And / or" describes the association relationship of associated objects, indicating that three relationships may exist. For example, A and / or B can mean: A exists alone, A and B exist at the same time, and B exists alone, where A and B can be singular or plural. The character " / " generally indicates that the objects before and after the association are in an "or" relationship. "At least one of the following" or similar expressions refers to any combination of these items, including any combination of single or plural items. For example, at least one of a, b and c can mean: a, or b, or c, or a and b, or a and c, or b and c, or a, b and c, where a, b, c can be single or plural.

[0050] Usually, wireless communication devices such as mobile phones are equipped with multiple antennas. When mobile phones and other wireless communication devices are in normal mode, they are affected by many factors such as the user's usage environment, the user's holding posture, the distribution of antennas, etc. Take mobile phones as an example. During the communication process, mobile phones generally have switching operations of transmitting antennas. For example, multiple antennas of mobile phones work simultaneously when receiving signals. When transmitting signals to the outside, the strongest antenna is dynamically selected according to the size of the received signal of each antenna and the transmission power of each antenna. If the TRP test is performed in normal mode, due to the switching of the antenna of the mobile phone, it is impossible to effectively lock a specific antenna for TRP testing, and it is difficult to obtain a stable and effective TRP value.

[0051] Considering that the engineering mode of a device is usually used to debug, test and configure the hardware and software of the device, many advanced functions can be accessed by entering the engineering mode, such as network settings, hardware testing and performance optimization. In some related technologies, the engineering software can be flashed to the mobile phone or the unlock code can be used to put the mobile phone into the engineering mode. In the engineering mode, the antenna is locked by software to perform TRP testing, so as to measure a stable TRP value. However, this test method is complicated to operate, and there are certain differences between the engineering mode and the normal mode of the device, and it is impossible to measure the RF performance of the device under normal use.

[0052] Based on this, the device testing method and system provided by the embodiment of the present application can be applied to any test scenario of the RF performance (such as TRP) of a wireless communication device with multiple switching antennas. The device testing method provided by the embodiment of the present application can effectively lock the measured antenna according to the phase parameter set of each antenna of the device under test, and the phase parameter set includes the phase parameter corresponding to the maximum power parameter of the antenna measured at each preset rotation angle. For example, during the rotation of the turntable of the test darkroom with the first device under test, for the currently measured antenna (such as the first antenna, the first antenna is any antenna of the first device under test), the measured antenna can be effectively locked according to the target phase parameter corresponding to the phase parameter set of the first antenna at each rotation angle. When the radiation power of the first antenna at each preset rotation angle is obtained, the total radiation power of the first antenna is determined based on the radiation power of the first antenna at each preset rotation angle, thereby accurately measuring the RF performance of each antenna of the device under normal use, and there is no need for the device under test to enter the engineering mode, effectively reducing the complexity of the test, and having strong universality.

[0053] See also Figure 1 , Figure 1 A schematic diagram of the structure of a device testing system provided in an embodiment of the present application, the system may include: a test darkroom 1001, an electronic device 1002, a signal conditioning device 1003, a first measuring device 1004 and a plurality of communication antennas 1005, wherein:

[0054] The electronic device 1002 is electrically connected to the signal conditioning device 1003 and the first measuring device 1004 respectively, and the signal conditioning device 1003 is electrically connected to the plurality of communication antennas 1005. The electronic device 1002 is also electrically connected to the darkroom control module 1011 of the test darkroom 1001, and the darkroom control module 1011 is used to control the rotation of the turntable. The electronic device 1002 can control the rotation angle of the turntable in the test darkroom 1001 through the darkroom control module 1011.

[0055] The electronic device 1002 can be used as a control terminal of the device test system, and can also be called an industrial computer. The first measuring device 1004 can be a comprehensive tester, which is used to communicate with the antenna of the device under test through the communication antenna 1005, and measure the radiation power of the antenna of the device under test through the measuring antenna 1009 in the test darkroom 1001. In one embodiment, the first measuring device 1004 can also be a measuring instrument such as a spectrum analyzer and a power meter.

[0056] The signal adjustment device 1003 may be a phase shift attenuator, which is used to adjust the phases of the multiple communication antennas 1005 so that the signal strength of a certain antenna of the device under test is greater than that of other antennas.

[0057] Multiple communication antennas 1005 are used to maintain communication with the antenna of the device under test. For the signal transmitted by the antenna of the device under test, the first measuring device 1004 sends an acknowledgment message (Acknowledge character, ACK) to the device under test through the communication antenna 1005. When the device under test receives the ACK signal, it transmits the signal through the antenna. In addition, the signal conditioning device 1003 can control the strength of the signal sent by each communication antenna 1005 to the device under test by setting the phase parameter. For example, it can control one of the communication antennas 1005 to send the signal to the device under test with the maximum power, so that the antenna of the device under test communicates with the communication antenna 1005 with the maximum power.

[0058] For example, the device under test is the first device under test. When the RF performance test is performed on the first device under test, the first device under test is placed on a turntable in the test darkroom 1001, and the first device under test can rotate synchronously with the turntable. Multiple rotation angles can be set for the turntable, that is, the turntable corresponds to multiple preset rotation angles, and the turntable is controlled to rotate along a preset direction (for example, a horizontal direction) to the multiple preset rotation angles, respectively, so that the first device under test rotates one circle or 360 degrees in the preset direction.

[0059] The electronic device 1002 is used to obtain the current rotation angle of the first device under test in the test darkroom 1001. The current rotation angle can be any one of the above-mentioned multiple preset rotation angles.

[0060] The electronic device 1002 is also used to determine the target phase parameter based on the current rotation angle and the phase parameter set of the first antenna of the first device under test; the phase parameter set of the first antenna includes the phase parameter corresponding to the maximum power parameter of the first antenna measured at each preset rotation angle; the first antenna is any antenna of the first device under test.

[0061] The electronic device 1002 is further configured to set the phase parameter of the signal adjustment device 1003 to a target phase parameter.

[0062] Among them, at the current rotation angle, by setting the phase parameter of the signal adjustment device 1003 to the target phase parameter, the signal strength of the communication between the first antenna and the communication antenna 1005 among the multiple antennas of the first device under test is greater than the signal strength of the communication between other antennas and the communication antenna 1005, that is, the first device under test uses the first antenna to communicate with the communication antenna, thereby achieving the locking of the first antenna.

[0063] The signal adjustment device 1003 is used to control one communication antenna 1005 among the multiple communication antennas 1005 to communicate with the first antenna.

[0064] Compared with the OTA test solution using a single communication antenna, the embodiment of the present application can effectively lock the antenna currently measured by the device under test when performing antenna testing through OTA through phase control of multiple communication antennas 1005 and the signal adjustment device 1003. There is no need to first put the device under test into engineering mode before locking the antenna for measurement, thereby effectively reducing the complexity of the test and effectively testing the RF performance of the device under normal use.

[0065] The first measuring device 1004 is used to measure the transmission signal of the first antenna through the measuring antenna 1009 included in the test chamber 1001 to obtain the radiation power of the first antenna at the current rotation angle.

[0066] The measuring antenna 1009 may be an antenna with a slide rail, and the measuring antenna 1009 can achieve multi-point measurement of the antenna to be measured by sliding to different positions on the slide rail, such as Figure 1 Alternatively, the measuring antenna 1009 may also adopt multiple probe-type antennas, and multi-point measurement of the antenna to be measured can be achieved by switching different measuring antennas.

[0067] The electronic device 1002 is also used to obtain the radiation power of the first antenna at the current rotation angle measured by the first measuring device 1004, and when the radiation power of the first antenna at each preset rotation angle is obtained, determine the total radiation power of the first antenna based on the radiation power of the first antenna at each preset rotation angle.

[0068] Wherein, when the electronic device 1002 obtains the radiation power of the first antenna at the current rotation angle measured by the first measuring device 1004, it can control the turntable to rotate to the next preset rotation angle through the darkroom control module 1011 to change the current rotation angle of the first device to be tested. When the turntable rotates to the next preset rotation angle, the phase parameter corresponding to the maximum power parameter of the first antenna at the next preset rotation angle is determined according to the phase parameter set of the first antenna, and the phase of the signal adjustment device 1003 is set by using the phase parameter to achieve locking of the first antenna at the next preset rotation angle, thereby obtaining the radiation power of the first antenna at the next preset rotation angle measured by the first measuring device 1004. When the radiation power of the first antenna at each preset rotation angle is obtained, the electronic device 1002 can calculate the total radiation power TRP of the first antenna according to the radiation power of the first antenna at each preset rotation angle.

[0069] In one embodiment, after completing the TRP test of the first antenna of the first device under test, the darkroom control module 1011 can be used to control the turntable to rotate to an initial rotation angle, and then in the same manner, the electronic device 1002 can effectively lock other antennas for measurement based on the current rotation angle of the first device under test and the phase parameter set of other antennas of the first device under test, thereby obtaining the total radiated power TRP of each antenna of the first device under test.

[0070] In one embodiment, during the antenna testing phase, the device testing system can be simplified as follows: Figure 3a The structure of the device test system is shown.

[0071] In one embodiment, during the antenna testing phase, the device testing system can be simplified as follows: Figure 3b The structure of the device test system shown in FIG. 1 may further include a third measuring device 1012, which is electrically connected to the measuring antenna 1009 of the test chamber 1001 and the electronic device 1002, wherein:

[0072] The first measuring device 1004 is used to communicate with the antenna of the device under test through the communication antenna 1005 .

[0073] The third measuring device 1012 is used to measure the radiated power of the antenna of the device under test through the measuring antenna 1009 in the test chamber 1001. In one embodiment, the third measuring device 1012 can be any one of a comprehensive tester, a spectrum analyzer, and a power meter. It can be seen that the first measuring device 1004 is specifically responsible for communicating with the antenna of the device under test, and the third measuring device 1012 is specifically responsible for measuring the radiated power of the antenna of the device under test. Using multiple measuring devices can efficiently perform antenna test tasks, which helps to improve the TRP test efficiency of the device antenna.

[0074] It can be seen that in the device testing system provided by the embodiment of the present application, the electronic device 1002 controls the phase parameter of the signal conditioning device 1003 according to the phase parameter set of each antenna of the device to be tested. At each rotation angle, by setting the phase parameter of the signal conditioning device 1003 to the target phase parameter corresponding to the rotation angle in the phase parameter set, the signal conditioning device 1003 can control one of the multiple communication antennas 1005 to communicate with the currently measured antenna (such as the first antenna) using the target phase parameter, so that the signal strength of the currently measured antenna is greater than that of other antennas, thereby effectively locking the currently measured antenna. The first measuring device 1004 can accurately measure the radiation power of the currently locked antenna at each rotation angle, and the electronic device 1002 determines the total radiation power TRP of the currently locked antenna according to the radiation power of the currently locked antenna at each preset rotation angle. By effectively locking the measured antenna according to the phase parameter set of the currently measured antenna at each rotation angle, the RF performance of each antenna of the device under normal use is accurately measured, and the device to be tested does not need to enter the engineering mode, effectively reducing the complexity of the test.

[0075] In addition, after the device testing system provided in the embodiment of the present application completes the TRP test on one antenna of the device under test, it can automatically switch to other antennas of the device under test for TRP testing until all antennas of the device under test complete the TRP test, thereby realizing the automated execution of the device test and the continuity of the test, which helps to improve the test efficiency of the device's RF performance.

[0076] In one embodiment, the system may further include: a second measuring device 1007 and a switch module 1008, the switch module 1008 is electrically connected to the second measuring device 1007 and the electronic device 1002, the switch module 1008 is also electrically connected to each antenna of the device under test (such as the second device under test), the second measuring device 1007 is electrically connected to the electronic device 1002 and the signal conditioning device 1003, wherein:

[0077] Before performing a TRP test on the first device under test, antenna calibration can be performed first to obtain a set of phase parameters of each antenna of the first device under test. For example, a second device under test with the same device parameters as the first device under test is selected. Taking a mobile phone as an example, the first device under test and the second device under test can be mobile phones of the same brand and model. When performing antenna calibration, each antenna of the second device under test is electrically connected to the switch module 1008. For example, the back panel of the second device under test can be opened to make each antenna of the second device under test visible. Then, each antenna of the second device under test (taking 4 antennas as an example) is connected to the switch module 1008 using cables. Figure 1 shown.

[0078] The second measuring device 1007 may be a vector network analyzer (VNA), which is used to measure power parameters of the antenna, such as S parameters, to evaluate the power of the antenna.

[0079] Among them, the antenna of the device under test and the communication antenna 1005 form a dual-port network, and the antenna of the device under test can be used as the transmitting end and the communication antenna 1005 as the receiving end, or the antenna of the device under test can be used as the receiving end and the communication antenna 1005 as the transmitting end. The second measuring device 1007 measures the power parameters of the antenna of the device under test through the dual-port network.

[0080] For the first antenna of the first device under test, the electronic device 1002 can use the switch module 1008 to control the second measuring device 1007 to be electrically connected to the second antenna of the second device under test, and the position of the second antenna on the second device under test is the same as that of the first antenna on the first device under test.

[0081] The electronic device 1002 is further used to control the rotation angle of the second device under test to be each preset rotation angle.

[0082] The electronic device 1002 controls the turntable to rotate to each preset rotation angle through the darkroom control module 1011, so that the rotation angle of the second device under test is each preset rotation angle.

[0083] The electronic device 1002 is further configured to adjust the phase parameters of the signal conditioning device based on a plurality of preset phase parameters respectively when the rotation angle of the second device under test is any preset rotation angle.

[0084] Whenever the turntable rotates to a preset rotation angle, the electronic device 1002 uses multiple preset phase parameters to adjust the phase parameters of the signal adjustment device 1003 respectively. For example, the phase parameters of the signal adjustment device 1003 can be adjusted from 0 degrees and increased by 15 degrees each time until the phase parameters of the signal adjustment device 1003 are adjusted to 360 degrees.

[0085] The second measuring device 1007 is used to measure the power parameter of the second antenna during the process of the electronic device 1002 adjusting the phase parameter of the signal regulating device 1003. For example, each time the electronic device 1002 adjusts the phase parameter of the signal regulating device 1003 to a preset phase parameter, the second measuring device 1007 sends the measured power parameter of the second antenna to the electronic device 1002, and the electronic device 1002 obtains the power parameter of the second antenna corresponding to each preset phase parameter at each preset rotation angle.

[0086] Electronic device 1002 is used to determine the phase parameter corresponding to the maximum power parameter of the second antenna at each preset rotation angle based on the acquired power parameter of the second antenna of the second device to be tested, and determine the phase parameter set of the first antenna according to the phase parameter corresponding to the maximum power parameter of the second antenna at each preset rotation angle.

[0087] In one embodiment, the electronic device 1002 is further configured to send a switching control instruction to the switch module 1008 .

[0088] The switch module 1008 is used to respond to the switching control instruction to connect the second measuring device 1007 with the second antenna of the second device under test, and disconnect the second measuring device 1007 from other antennas of the second device under test.

[0089] The switch module 1008 may specifically include a programmable single-pole multi-throw switch.

[0090] It can be seen that when a certain antenna needs to be calibrated, the antenna can be connected to the second measuring device 1007 by controlling the switch module 1008, and other antennas can be disconnected from the second measuring device 1007, thereby effectively locking the corresponding antenna for calibration, and automatically locking the calibration antenna through the switch module 1008, which helps to improve the efficiency of antenna calibration.

[0091] In one embodiment, multiple communication antennas 1005 are evenly distributed around the turntable of the test chamber 1001. In the embodiment of the present application, multiple communication antennas 1005 are evenly distributed around the turntable of the test chamber 1001, so that the phase parameters corresponding to the maximum power parameters measured for different antennas are not close to each other during the antenna calibration phase, which helps to improve the effectiveness of antenna locking using phase parameters during the measurement phase, thereby improving the accuracy of antenna RF performance testing.

[0092] In one embodiment, the system may further include a signal processing module 1006 , wherein the plurality of communication antennas 1005 are electrically connected to a first end of the signal processing module 1006 , and a second end of the signal processing module 1006 is electrically connected to the signal conditioning device 1003 .

[0093] Specifically, the signal processing module 1006 may include multiple power amplifier units, each of which is electrically connected to a communication antenna 1005, and is used to amplify the signal of the communication antenna 1005 to improve the signal-to-noise ratio, thereby helping to improve the accuracy of antenna calibration and antenna testing.

[0094] In one embodiment, for other antennas of the first device under test, the electronic device 1002 can use the switch module 1008 to control the second measuring device 1007 to be electrically connected to the corresponding antenna of the second device under test, and determine the phase parameter set of other antennas of the first device under test in the same way.

[0095] In one embodiment, during the antenna calibration phase, the device test system can be simplified as follows: Figure 2 The structure of the antenna calibration system is shown.

[0096] It can be seen that in the antenna calibration stage, a second device under test with the same parameters as the first device under test is used. By calibrating and measuring each antenna of the second device under test, the phase parameter set of each antenna of the first device under test can be accurately obtained, so that in the antenna measurement stage, the phase parameter set of each antenna can be used to effectively lock the antenna currently being measured.

[0097] In one embodiment, the placement posture of the second device under test on the turntable is the same as that of the first device under test on the turntable, so as to ensure that the antenna can be effectively locked by calling the phase parameter set corresponding to the antenna during antenna testing, thereby helping to improve the accuracy of antenna testing.

[0098] In one embodiment, the second device under test and the first device under test are the same device under test, and the antenna calibration and test can be completed using the same device, which helps to reduce the test cost.

[0099] in, Figure 1 , Figure 2 , Figure 3a , Figure 3b The system shown is taken as an example including four communication antennas 1005. In one embodiment, the device testing system or the antenna calibration system may also include three communication antennas 1005 or two communication antennas 1005, which is not limited in the embodiment of the present application.

[0100] Based on the device testing system and antenna calibration system introduced in the above content, the device testing method provided by the embodiment of the present application is described below. Figure 4 , Figure 4 A schematic diagram of a device testing method provided in an embodiment of the present application, the method may include but is not limited to the following steps:

[0101] 401. Control a second measuring device to be electrically connected to a second antenna of a second device under test.

[0102] In one embodiment, the second device under test can be placed on a turntable in a test darkroom, and the electronic device can rotate the second device under test to each preset rotation angle in sequence by controlling the rotation of the turntable. For each preset rotation angle, the electronic device performs phase adjustment based on multiple preset phase parameters, and obtains the power parameter corresponding to the second antenna of the second device under test at each preset phase parameter, thereby accurately obtaining the power parameter corresponding to the second antenna at different phase parameters when the second device under test is at each preset rotation angle, that is, the signal strength of the antenna.

[0103] The second measuring device is used to measure power parameters of the antenna, such as S parameters.

[0104] Specifically, the second device under test includes multiple antennas, and the electronic device can control the second measuring device to be electrically connected to one of the antennas of the second device under test (such as the second antenna), so that the second measuring device can measure the power parameter of the second antenna.

[0105] In one embodiment, the second measuring device is electrically connected to the switch module, and each antenna of the second device under test is electrically connected to the switch module. The specific implementation of the electronic device controlling the second measuring device to be electrically connected to the second antenna of the second device under test may include:

[0106] The electronic device sends a switching control instruction to the switch module, and the switching control instruction is used to trigger the switch module to connect the second measuring device with the second antenna of the second device under test, and disconnect the second measuring device from other antennas of the second device under test.

[0107] It can be seen that when a certain antenna needs to be calibrated, the electronic device can connect the certain antenna to the second measuring device by controlling the switch module, and disconnect other antennas from the second measuring device, thereby effectively locking the corresponding antenna for calibration, and realizing automatic locking of the calibration antenna through the switch module, which helps to improve the efficiency of antenna calibration.

[0108] 402. Control the rotation angle of the second device under test to be each preset rotation angle respectively, and when the rotation angle of the second device under test is any preset rotation angle, adjust the phase parameters of the signal conditioning device respectively based on multiple preset phase parameters.

[0109] 403. Each time a phase parameter of the signal adjustment device is adjusted to a preset phase parameter, a power parameter of the second antenna measured by a second measuring device is obtained.

[0110] The signal adjustment device is used to adjust the phases of multiple communication antennas so that the signal strength of a certain antenna of the second device under test is greater than that of other antennas. The signal adjustment device can control the strength of the signal sent by each communication antenna to the second device under test by setting the phase parameters. For example, the signal adjustment device can control the power of one of the communication antennas to send the signal to the second device under test to be the maximum, so that the antenna of the second device under test communicates with the communication antenna with the maximum power.

[0111] Specifically, whenever the turntable rotates to a preset rotation angle, the electronic device uses a plurality of preset phase parameters to adjust the phase parameters of the signal adjustment device respectively. For example, the phase parameters of the signal adjustment device can be adjusted from 0 degrees and increased by 15 degrees each time until the phase parameters of the signal adjustment device are adjusted to 360 degrees. In the process of the electronic device adjusting the phase parameters of the signal adjustment device, the second measuring device can measure the power parameters of the second antenna. For example, each time the electronic device adjusts the phase parameters of the signal adjustment device to a preset phase parameter, the second measuring device sends the measured power parameters of the second antenna to the electronic device, and the electronic device obtains the power parameters of the second antenna corresponding to each preset phase parameter at each preset rotation angle.

[0112] 404. Determine a phase parameter corresponding to a maximum power parameter of the second antenna at each preset rotation angle based on the acquired power parameter of the second antenna of the second device under test.

[0113] 405 . Determine a phase parameter set of the first antenna of the first device under test based on the phase parameter corresponding to the maximum power parameter of the second antenna at each preset rotation angle.

[0114] The position of the second antenna on the second device under test is the same as the position of the first antenna on the first device under test. The device parameters of the second device under test are the same as the device parameters of the first device under test. The first antenna is any one of the multiple antennas included in the first device under test.

[0115] Specifically, during the antenna calibration stage, a second device under test having the same parameters as the first device under test is used. When a phase parameter set of the first antenna of the first device under test is obtained, power parameters of a second antenna on the second device under test that is located at the same position as the first antenna can be measured. The second device under test is rotated to each preset rotation angle, and the power parameters of the second antenna under different phase parameters at each preset rotation angle are obtained by adjusting the phase parameters. The phase parameters corresponding to the maximum power parameters of the second antenna at each preset rotation angle are determined, and then the phase parameter set of the first antenna is determined. By performing calibration measurements on each antenna of the second device under test, the phase parameter set of each antenna of the first device under test can be accurately obtained, so that during the antenna measurement stage, the phase parameter set of each antenna can be used to effectively lock the currently measured antenna.

[0116] In one embodiment, since the device parameters of the second device under test are the same as those of the first device under test, for each antenna of the first device under test, the electronic device can accurately obtain a phase parameter set of each antenna through the above steps 401-405.

[0117] 406. Obtain a current rotation angle of the first device under test in the test darkroom.

[0118] 407 . Determine a target phase parameter based on the current rotation angle and a phase parameter set of the first antenna of the first device under test.

[0119] The phase parameter set of the first antenna includes phase parameters corresponding to the maximum power parameters of the first antenna measured at each preset rotation angle.

[0120] 408. Set the phase parameter of the signal conditioning device to the target phase parameter.

[0121] The signal adjustment device is used to control one of the multiple communication antennas to communicate with the first antenna. When the phase parameter of the signal adjustment device is the target phase parameter, the signal strength of the first antenna is greater than the signal strength of other antennas of the first device under test.

[0122] 409. Obtain the radiation power of the first antenna at the current rotation angle.

[0123] In one embodiment, the electronic device performs measurement control based on the target phase parameter to obtain the radiation power of the first antenna at the current rotation angle. The electronic device can use the target phase parameter to control the signal strength of the first antenna to be greater than the signal strength of other antennas of the first device under test at the current rotation angle, so that the first antenna is used as a transmitting antenna at the current rotation angle to lock the first antenna, thereby effectively measuring the radiation power of the first antenna at the current rotation angle.

[0124] The radiation power of the first antenna at the current rotation angle is obtained by measuring the transmission signal of the first antenna by the first measuring device through the measuring antenna.

[0125] It can be seen that in the antenna testing stage, the measured antenna can be effectively locked according to the phase parameter set of each antenna of the first device under test. For example, during the rotation of the first device under test along with the turntable of the test chamber, for the antenna currently measured (such as the first antenna), at each rotation angle, the phase parameter of the signal adjustment device can be set to the target phase parameter of the first antenna corresponding to each angle according to the phase parameter set of the first antenna, so that at each rotation angle, the signal strength of the first antenna of the first device under test is greater than the signal strength of other antennas of the first device under test, effectively locking the measured antenna, thereby accurately measuring the RF performance of each antenna of the device under normal use, and there is no need for the device under test to enter the engineering mode, effectively reducing the complexity of the test.

[0126] 410. When the radiation power of the first antenna at each preset rotation angle is obtained, determine the total radiation power of the first antenna based on the radiation power of the first antenna at each preset rotation angle.

[0127] Specifically, the electronic device may perform an integration operation on the radiation power of the first antenna at each preset rotation angle to obtain the total radiation power of the first antenna.

[0128] In one embodiment, the electronic device performs integration operation on the radiation power of the first antenna at each preset rotation angle, and a specific method of obtaining the total radiation power of the first antenna can be shown in the following formula.

[0129]

[0130] Among them, TRP represents the total radiated power of the antenna, EIRP is the radiated power value measured at each angle (including the horizontal and vertical angles θ and φ), N refers to the number of times the turntable needs to rotate for one circle, and M refers to the number of times the measurement antenna needs to slide on the slide rail to complete the entire stroke or the number of times each measurement probe needs to be switched once. For each turntable angle, switch each measurement antenna or change the position of the measurement antenna on the slide rail, and measure the radiated power value respectively, so as to obtain M radiated power values ​​corresponding to each turntable angle.

[0131] For each antenna of the first device under test, the electronic device can accurately obtain the total radiated power of each antenna through the above steps 406-410, and the total radiated power of each antenna of the first device under test can be used to accurately evaluate the overall RF performance of this type of device with the same device parameters as the first device under test under normal use.

[0132] The specific implementation of the above steps 401-410 can refer to the relevant description in the above embodiments, which will not be repeated here.

[0133] See also Figure 5 , Figure 5 A flow chart of another device testing method provided in an embodiment of the present application, the method may include but is not limited to the following steps:

[0134] 501. Place the mobile phone on a turntable in a test darkroom, and control an antenna of the mobile phone to connect to a vector network analyzer.

[0135] The mobile phone may correspond to the aforementioned device under test. The vector network analyzer may correspond to the aforementioned second measuring device.

[0136] Specifically, the mobile phone can be manually placed on a turntable in a test darkroom, and each antenna of the mobile phone can be electrically connected to the vector network analyzer through a switch module. The electronic device controls the switch module so that one antenna of the mobile phone is connected to the vector network analyzer and the other antennas are disconnected from the vector network analyzer.

[0137] 502. Set B=0, C=0.

[0138] 503. The turntable angle is adjusted to B*30°, and the phase of the phase shifter attenuator is set to C*15°.

[0139] Among them, the phase shift attenuator can correspond to the aforementioned signal conditioning device.

[0140] Specifically, the electronic device sets B=0, C=0, sets the turntable angle to an initial angle (which can be understood as 0°), and the phase of the phase shift attenuator is initialized to 0°.

[0141] 504. The vector network analyzer measures the S21 parameters of the antenna.

[0142] 505. When C is less than 24, add 1 to C and execute step 503.

[0143] Specifically, the vector network analyzer obtains the S21 parameter of the antenna when the phase of the phase shifter is 0° by measurement. When C is less than 24, the electronic device adds 1 to C, that is, adjusts the phase of the phase shifter to 15°. The vector network analyzer obtains the S21 parameter of the antenna when the phase of the phase shifter is 15° by measurement, until C is equal to 24, indicating that the phase of the phase shifter has been adjusted.

[0144] 506. When C is equal to 24 and B is less than 12, add 1 to B, reset C to 0, and execute step 503.

[0145] 507. Record the phase corresponding to the maximum S21 parameter at each angle until B is equal to 12.

[0146] Specifically, when the turntable angle is the initial angle and the phase of the phase-shift attenuator has been adjusted, the electronic device adds 1 to B, that is, changes the turntable angle, adjusts the turntable angle by 30°, and resets C to 0, that is, when the turntable angle is adjusted to 30°, continues to adjust the phase of the phase-shift attenuator from 0°, and similarly measures the S21 parameter corresponding to each adjustment of the phase of the phase-shift attenuator by the vector network analyzer until B is equal to 12, that is, the turntable completes one circle. In addition, at each turntable angle, the electronic device determines the phase corresponding to the maximum S21 parameter based on the S21 parameter of the antenna corresponding to each phase, and records the phase corresponding to the maximum S21 parameter at each angle.

[0147] 508. During measurement, the recorded phase is called at each angle to set the phase of the phase shift attenuator and measure the radiated power of the antenna.

[0148] Specifically, when measuring the antenna, for each antenna, the turntable angle is first adjusted to the initial angle. Then, in the process of controlling the rotation of the turntable, the phase setting of the phase shifter attenuator corresponding to the maximum recorded S21 parameter is directly called according to the current angle of the turntable (including the initial angle) to lock the currently measured antenna and measure the antenna's radiated power.

[0149] 509. Calculate the TRP of the antenna based on the radiated power of the antenna at each angle.

[0150] The specific implementation of the above steps 501-509 can refer to the relevant description in the above embodiments, which will not be repeated here.

[0151] Combined with the internal module interaction of electronic devices, the process of performing device testing on electronic devices is introduced. Figure 6 As shown, the following steps may be included but are not limited to:

[0152] 601. In response to a calibration start instruction, a control module controls a second measuring device to be electrically connected to a second antenna of a second device under test.

[0153] 602. The control module controls the rotation angle of the second device under test to be each preset rotation angle, and when the rotation angle of the second device under test is any preset rotation angle, adjusts the phase parameters of the signal conditioning device based on multiple preset phase parameters.

[0154] 603. Each time the phase parameter of the signal adjustment device is adjusted to a preset phase parameter, the acquisition module acquires the power parameter of the second antenna measured by the second measurement device.

[0155] 604. Based on the acquired power parameter of the second antenna of the second device under test, the determination module determines a phase parameter corresponding to a maximum power parameter of the second antenna at each preset rotation angle.

[0156] 605 . Based on the phase parameter corresponding to the maximum power parameter of the second antenna at each preset rotation angle, the determination module determines a phase parameter set of the first antenna of the first device under test.

[0157] 606. In response to the test start instruction, the control module controls the first device under test to rotate in the test darkroom and obtains a current rotation angle.

[0158] 607. Based on the current rotation angle and the phase parameter set of the first antenna of the first device under test, the control module determines a target phase parameter, and sets the phase parameter of the signal conditioning device to the target phase parameter.

[0159] 608. The acquisition module acquires the radiation power of the first antenna at the current rotation angle.

[0160] 609. When the radiation power of the first antenna at each preset rotation angle is obtained, the determination module determines the total radiation power of the first antenna based on the radiation power of the first antenna at each preset rotation angle.

[0161] The specific implementation of the above steps 601-609 can refer to the relevant description in the above embodiments, which will not be repeated here.

[0162] An embodiment of the present application also provides a software architecture for an electronic device.

[0163] In one embodiment, the software structure of the electronic device may adopt a layered architecture, an event-driven architecture, a micro-core architecture, a micro-service architecture, or a cloud architecture. The following takes a Windows system with a layered architecture as an example to introduce a software structure of an electronic device.

[0164] like Figure 7 As shown, the layered architecture of the electronic device can be divided into several layers by software, and each layer has a clear role and division of labor. The layers communicate with each other through software interfaces. In some embodiments, the system is divided into an application layer, an application framework layer, and a kernel layer from top to bottom.

[0165] The application layer may include a series of application packages, which may include camera, gallery, video playback, map, calendar, music, call, AI assistant and other applications. In the embodiment of the present application, the application layer may also include a TRP test application. The TRP test application can provide TRP automated testing services by controlling the above-mentioned device test system / antenna calibration system / antenna test system to evaluate the RF performance of the device under test.

[0166] The application framework layer provides an application programming interface (API) and programming framework for the applications in the application layer. The application framework layer includes some predefined functions.

[0167] The application framework layer may include a window manager. The window manager is used to manage window programs. The window manager can obtain the display screen size, determine whether there is a status bar, lock the screen, capture the screen, etc.

[0168] The application framework layer can also include a view system, a notification manager, etc.

[0169] The view system includes visual controls, such as controls for displaying text, controls for displaying images, etc. The view system can be used to build applications. A display interface can be composed of one or more views. For example, a display interface including a message notification icon can include a view for displaying text and a view for displaying images.

[0170] The notification manager enables applications to display notification information in the status bar, which can be used to convey notification-type messages and disappear automatically after a short stay without user interaction.

[0171] The kernel layer is the layer between hardware and software. The kernel layer includes at least display driver, camera driver, audio driver, network card driver, processor driver, etc.

[0172] It should be noted that the various functional modules included in the above software structure are only exemplary and do not constitute a specific limitation on the software architecture of the present application. In other embodiments, the various functional modules included in the above software structure may be more or less, and the present application does not limit this. Although the embodiments of the present application are described using the Windows system as an example, the basic principles are also applicable to electronic devices based on operating systems such as iOS or Android.

[0173] In the embodiments of the present application, the electronic device may be a mobile phone, a tablet computer, a laptop computer, a PDA, a mobile internet device (MID), a wearable device, a virtual reality (VR) device, an augmented reality (AR) device, a wireless terminal in industrial control, a wireless terminal in self driving, a wireless terminal in remote medical surgery, a wireless terminal in a smart grid, a wireless terminal in transportation safety, a wireless terminal in a smart city, a wireless terminal in a smart home, a personal digital assistant (PDA), etc., and the embodiments of the present application are not limited to this.

[0174] Exemplarily, the hardware structure of the electronic device in the embodiment of the present application is introduced below.

[0175] like Figure 8As shown, the electronic device may include: a processor 110, an external memory interface 120, an internal memory 121, a universal serial bus (USB) interface 130, a charging management module 140, a power management module 141, a battery 142, an antenna 1, an antenna 2, a mobile communication module 150, a wireless communication module 160, an audio module 170, a speaker 170A, a receiver 170B, a microphone 170C, an earphone interface 170D, a sensor module 180, a button 190, a motor 191, an indicator 192, a camera 193, a display screen 194, a subscriber identification module (SIM) card interface 195, and a wired communication module 196, etc. Among them, the sensor module 180 may include a pressure sensor 180A, a gyroscope sensor 180B, an air pressure sensor 180C, a magnetic sensor 180D, an acceleration sensor 180E, a distance sensor 180F, a proximity light sensor 180G, a fingerprint sensor 180H, a temperature sensor 180J, a touch sensor 180K, an ambient light sensor 180L, a bone conduction sensor 180M, etc.

[0176] The processor 110 may include one or more processing units, for example, the processor 110 may include an application processor (AP), a modem processor, a graphics processor (GPU), an image signal processor (ISP), a controller, a memory, a video codec, a digital signal processor (DSP), a baseband processor, and / or a neural network processing unit (NPU), etc. Different processing units may be independent devices or integrated into one or more processors.

[0177] NPU is a neural network computing processor. It can quickly process input information and continuously self-learn by drawing on the structure of biological neural networks, such as the transmission mode between neurons in the human brain. NPU can realize applications such as intelligent cognition of electronic devices, such as image recognition, face recognition, voice recognition, text understanding, etc.

[0178] The processor 110 may also be provided with a memory for storing instructions and data. In some embodiments, the memory in the processor 110 is a cache memory. The memory may store instructions or data that the processor 110 has just used or cyclically used. If the processor 110 needs to use the instruction or data again, it may be directly called from the memory. This avoids repeated access, reduces the waiting time of the processor 110, and thus improves the efficiency of the system.

[0179] The electronic device implements the display function through a GPU, a display screen 194, and an application processor. The GPU is a microprocessor for image processing, which connects the display screen 194 and the application processor. The GPU is used to perform mathematical and geometric calculations for graphics rendering. The processor 110 may include one or more GPUs that execute program instructions to generate or change display information.

[0180] The wireless communication function of the electronic device can be implemented through antenna 1, antenna 2, mobile communication module 150, wireless communication module 160, modem processor and baseband processor.

[0181] Antenna 1 and antenna 2 are used to transmit and receive electromagnetic wave signals. Each antenna in the electronic device can be used to cover a single or multiple communication frequency bands. Different antennas can also be reused to improve the utilization of the antennas. For example, antenna 1 can be reused as a diversity antenna for a wireless local area network. In some other embodiments, the antenna can be used in combination with a tuning switch.

[0182] The mobile communication module 150 can provide solutions for wireless communications including 2G / 3G / 4G / 5G, etc., applied to electronic devices. The mobile communication module 150 may include at least one filter, a switch, a power amplifier, a low noise amplifier (LNA), etc. The mobile communication module 150 can receive electromagnetic waves from the antenna 1, and filter, amplify, and process the received electromagnetic waves, and transmit them to the modulation and demodulation processor for demodulation. The mobile communication module 150 can also amplify the signal modulated by the modulation and demodulation processor, and convert it into electromagnetic waves for radiation through the antenna 1. In some embodiments, at least some of the functional modules of the mobile communication module 150 can be set in the processor 110. In some embodiments, at least some of the functional modules of the mobile communication module 150 can be set in the same device as at least some of the modules of the processor 110.

[0183] The wireless communication module 160 can provide wireless communication solutions including wireless local area networks (WLAN) (such as WiFi networks), Bluetooth (Blue Tooth, BT), BLE broadcasting, global navigation satellite system (GNSS), frequency modulation (FM), near field communication technology (NFC), infrared technology (IR), etc., which are applied to electronic devices. The wireless communication module 160 can be one or more devices integrating at least one communication processing module. The wireless communication module 160 receives electromagnetic waves via the antenna 2, modulates the frequency of the electromagnetic wave signal and performs filtering, and sends the processed signal to the processor 110. The wireless communication module 160 can also receive the signal to be sent from the processor 110, modulate the frequency of it, amplify it, and convert it into electromagnetic waves for radiation through the antenna 2.

[0184] The wired communication function of the electronic device can be implemented through the wired communication module 196, the modem processor and the baseband processor.

[0185] The wired communication module 196 may include a network interface card (NIC) for providing wired communication solutions such as local area networks (LAN) applied to electronic devices, such as establishing communication connections between electronic devices and other devices through cables such as network cables. In some embodiments, the electronic device may establish an electrical connection with the devices or modules in the above-mentioned device test system / antenna calibration system / antenna test system through cables, and use the wired communication module 196 to send data / instructions to these devices or modules, such as sending switching control instructions to the switch module, sending target phase parameters to the signal adjustment device, and sending turntable rotation control instructions to the darkroom control module. The electronic device can also use the wired communication module 196 to receive data sent by these devices or modules, such as receiving the power parameters (such as S21 parameters) of the antenna measured by the second measuring device in the antenna calibration stage, and receiving the radiation power of the antenna sent by the first measuring device or the third measuring device in the antenna test stage.

[0186] The electronic device implements the display function through a GPU, a display screen 194, and an application processor. The GPU is a microprocessor for image processing, which connects the display screen 194 and the application processor. The GPU is used to perform mathematical and geometric calculations for graphics rendering. The processor 110 may include one or more GPUs that execute program instructions to generate or change display information.

[0187] The display screen 194 is used to display images, videos, etc. The display screen 194 includes a display panel. The display panel can be a liquid crystal display (LCD), an organic light emitting diode (OLED), an active matrix organic light emitting diode or an active matrix organic light emitting diode (AMOLED), a flexible light emitting diode (FLED), Miniled, MicroLed, MicrooLed, a quantum dot light emitting diode (QLED), etc. In some embodiments, the electronic device may include 1 or N display screens 194, where N is a positive integer greater than 1. In some embodiments, the electronic device may display the total radiated power TRP of each antenna of the first device under test through the display screen 194.

[0188] The touch sensor 180K is also called a "touch panel". The touch sensor 180K can be set on the display screen 194, and the touch sensor 180K and the display screen 194 form a touch screen, also called a "touch screen". The touch sensor 180K is used to detect touch operations acting on or near it. The touch sensor 180K can pass the detected touch operation to the application processor to determine the type of touch event. Visual output related to the touch operation can be provided through the display screen 194. In other embodiments, the touch sensor 180K can also be set on the surface of the electronic device, which is different from the position of the display screen 194.

[0189] It is to be understood that the structure illustrated in this embodiment does not constitute a specific limitation on the electronic device. In other embodiments, the electronic device may include more or fewer components than shown in the figure, or combine some components, or split some components, or arrange the components differently. The components shown in the figure may be implemented in hardware, software, or a combination of software and hardware.

[0190] In the above embodiments, it can be implemented in whole or in part by software, hardware, firmware or any combination thereof. When implemented using software, it can be implemented in whole or in part in the form of a computer program product. The computer program product includes one or more computer instructions. When the computer program instructions are loaded and executed on a computer, the process or function described in this application is generated in whole or in part. The computer can be a general-purpose computer, a special-purpose computer, a computer network, or other programmable device. The computer instructions can be stored in a computer-readable storage medium, or transmitted from one computer-readable storage medium to another computer-readable storage medium. For example, the computer instructions can be transmitted from a website site, computer, server or data center to another website site, computer, server or data center by wired (e.g., coaxial cable, optical fiber, digital subscriber line) or wireless (e.g., infrared, wireless, microwave, etc.) mode. The computer-readable storage medium can be any available medium that a computer can access or a data storage device such as a server or data center that includes one or more available media integration. The available medium can be a magnetic medium (e.g., a floppy disk, a hard disk, a tape), an optical medium (e.g., a DVD), or a semiconductor medium (e.g., a solid-state hard disk Solid State Disk), etc.

[0191] It should be noted that, for the above-mentioned various method embodiments, for the sake of simplicity of description, they are all expressed as a series of action combinations, but those skilled in the art should be aware that this application is not limited by the order of the actions described, because according to this application, some steps can be performed in other orders or simultaneously. Secondly, those skilled in the art should also be aware that the embodiments described in the specification are all preferred embodiments, and the actions and modules involved are not necessarily required by this application.

[0192] The steps in the method of the embodiment of the present application can be adjusted in order, combined and deleted according to actual needs.

[0193] The modules in the device of the embodiment of the present application can be merged, divided and deleted according to actual needs.

[0194] A person of ordinary skill in the art may understand that all or part of the steps in the various methods of the above-mentioned embodiments may be completed by instructing the relevant hardware through a program, and the program may be stored in a computer-readable storage medium, which may include a flash drive, ROM, RAM, a magnetic disk or an optical disk, etc.

[0195] The above disclosure is only a preferred embodiment of the present application, which is only a part of the embodiments of the present application and cannot be used to limit the scope of rights of the present application.

Claims

1. A device testing method, characterized in that: The method comprises: Obtaining a current rotation angle of the first device under test in the test darkroom; Determine a target phase parameter based on the current rotation angle and a phase parameter set of the first antenna of the first device under test; the phase parameter set of the first antenna includes a phase parameter corresponding to a maximum power parameter of the first antenna measured at each preset rotation angle; the first antenna is any antenna of the first device under test; Performing measurement control based on the target phase parameter to obtain the radiation power of the first antenna at the current rotation angle; When the radiation power of the first antenna at each preset rotation angle is obtained, determining the total radiation power of the first antenna based on the radiation power of the first antenna at each preset rotation angle; The performing measurement control based on the target phase parameter to obtain the radiation power of the first antenna at the current rotation angle includes: Setting a phase parameter of a signal conditioning device to the target phase parameter; the signal conditioning device is used to control one of a plurality of communication antennas to communicate with the first antenna, and when the phase parameter of the signal conditioning device is the target phase parameter, the signal strength of the first antenna is greater than the signal strength of other antennas of the first device under test; The radiation power of the first antenna at the current rotation angle is obtained; the radiation power of the first antenna at the current rotation angle is obtained by measuring the transmission signal of the first antenna by a first measuring device through a measuring antenna.

2. The method according to claim 1, characterized in that The method further comprises: For each preset rotation angle, a power parameter of a second antenna of a second device under test is obtained based on a plurality of preset phase parameters; the device parameters of the second device under test are the same as the device parameters of the first device under test; Based on the acquired power parameter of the second antenna of the second device under test, determining the phase parameter corresponding to the maximum power parameter of the second antenna at each preset rotation angle; the position of the second antenna on the second device under test is the same as the position of the first antenna on the first device under test; A phase parameter set of the first antenna is determined based on the phase parameter corresponding to the maximum power parameter of the second antenna at each preset rotation angle.

3. The method according to claim 2, characterized in that The step of obtaining the power parameter of the second antenna of the second device under test based on a plurality of preset phase parameters for each preset rotation angle includes: Controlling the second measuring device to be electrically connected to the second antenna of the second device under test; Controlling the rotation angle of the second device under test to be each preset rotation angle; When the rotation angle of the second device under test is any preset rotation angle, respectively adjusting the phase parameters of the signal conditioning device based on a plurality of preset phase parameters; Each time the phase parameter of the signal adjustment device is adjusted to a preset phase parameter, the power parameter of the second antenna measured by the second measuring device is obtained.

4. The method according to claim 3, characterized in that The second measuring device is electrically connected to the switch module, and each antenna of the second device under test is electrically connected to the switch module; The controlling the second measuring device to be electrically connected to the second antenna of the second device under test comprises: A switching control instruction is sent to the switch module, where the switching control instruction is used to trigger the switch module to connect the second measuring device with the second antenna of the second device under test, and disconnect the second measuring device from other antennas of the second device under test.

5. A device testing system, characterized in that: The system includes a test darkroom, an electronic device, a signal conditioning device, a first measuring device, and a plurality of communication antennas, wherein the electronic device is electrically connected to the signal conditioning device and the first measuring device, respectively, and the signal conditioning device is electrically connected to the plurality of communication antennas, wherein: The electronic device is used to obtain the current rotation angle of the first device under test in the test darkroom; The electronic device is further used to determine a target phase parameter based on the current rotation angle and a phase parameter set of a first antenna of the first device under test; the phase parameter set of the first antenna includes a phase parameter corresponding to a maximum power parameter of the first antenna measured at each preset rotation angle; the first antenna is any antenna of the first device under test; The electronic device is further used to set the phase parameter of the signal adjustment device to the target phase parameter; The signal conditioning device is used to control one of the plurality of communication antennas to communicate with the first antenna; The first measuring device is used to measure the transmission signal of the first antenna through the measuring antenna included in the test chamber to obtain the radiation power of the first antenna at the current rotation angle; The electronic device is also used to obtain the radiation power of the first antenna at the current rotation angle measured by the first measuring device, and when the radiation power of the first antenna at each preset rotation angle is obtained, determine the total radiation power of the first antenna based on the radiation power of the first antenna at each preset rotation angle.

6. The system according to claim 5, characterized in that The electronic device is further used for: For each preset rotation angle, a power parameter of a second antenna of a second device under test is obtained based on a plurality of preset phase parameters; the device parameters of the second device under test are the same as the device parameters of the first device under test; Based on the acquired power parameter of the second antenna of the second device under test, determining the phase parameter corresponding to the maximum power parameter of the second antenna at each preset rotation angle; the position of the second antenna on the second device under test is the same as the position of the first antenna on the first device under test; A phase parameter set of the first antenna is determined based on the phase parameter corresponding to the maximum power parameter of the second antenna at each preset rotation angle.

7. The system according to claim 6, characterized in that The system further comprises a second measuring device, wherein: The electronic device is further used to control the second measuring device to be electrically connected to the second antenna of the second device under test; The electronic device is further used to control the rotation angle of the second device under test to be each preset rotation angle; The electronic device is further used to adjust the phase parameters of the signal adjustment device based on a plurality of preset phase parameters respectively when the rotation angle of the second device under test is any preset rotation angle; The second measuring device is used to measure a power parameter of the second antenna; The electronic device is further used to adjust the phase parameter of the signal adjustment device to a preset phase parameter each time, and obtain the power parameter of the second antenna measured by the second measuring device.

8. The system according to claim 7, characterized in that The system further includes a switch module, the switch module is electrically connected to the second measuring device and the electronic device, and the switch module is also electrically connected to each antenna of the second device under test, wherein: The electronic device is further used to send a switching control instruction to the switch module; The switch module is used to respond to the switching control instruction to connect the second measuring device with the second antenna of the second device under test, and disconnect the second measuring device from other antennas of the second device under test.

9. The system according to any one of claims 5 to 8, characterized in that: The multiple communication antennas are evenly distributed around a turntable in the test darkroom, and the turntable is used to drive the first device under test or the second device under test to rotate.

10. An electronic device, characterized in that: The electronic device comprises: one or more processors, a memory and a communication module; the memory is used to store program code; the processor is used to run the program code, so that the electronic device implements the method according to any one of claims 1-4.

11. A computer-readable storage medium, characterized in that: The computer-readable storage medium stores a computer program, and when the computer program is executed by a processor, the method according to any one of claims 1 to 4 is implemented.

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