A testing method for perovskite battery

Abstract

The present invention discloses a method for testing a perovskite battery, and relates to the technical field of perovskite batteries. The method for testing a perovskite battery comprises: performing a performance test on a perovskite battery test piece to obtain first initial test data; when determining that the perovskite battery test piece is a battery piece with abnormal performance, cutting it to form multiple sub-test pieces of equal size and performing performance tests respectively to obtain second initial test data; electrically connecting at least part of the sub-test pieces to form a recombined perovskite battery piece and performing performance tests to obtain recombined test data; testing the film coating thickness of each sub-test piece respectively to determine the film coating uniformity of the perovskite battery test piece. The technical solution of the present invention can accurately test the perovskite battery, so as to accurately determine the cause of the abnormal performance of the perovskite battery piece according to the test results.

Description

Technical Field

[0001] The embodiments of the present invention relate to the technical field of perovskite batteries, and in particular to a testing method for perovskite batteries. Background Art

[0002] As a new generation of solar cell technology, perovskite cells have the advantages of high-efficiency energy conversion, low-cost production and wide availability. They have broad application prospects in the photovoltaic field and are regarded as an important breakthrough in the field of sustainable energy.

[0003] In the process of mass production of perovskite cells, the performance of perovskite cells needs to be tested to ensure that the mass-produced perovskite cells can have good performance. If the performance test of mass-produced perovskite cells shows that the conversion efficiency of perovskite cells is significantly reduced, the specific cause of the problem needs to be found. At present, the elimination method is usually used to determine the reasons for the reduction in the conversion efficiency of perovskite cells, and the priority is to consider whether the film thickness of the perovskite cell meets the requirements.

[0004] However, the film thickness testing method of the existing technology cannot accurately determine the corresponding relationship between the conversion efficiency of the perovskite battery and the film thickness, and thus cannot solve the problem of reduced conversion efficiency of the perovskite battery. Therefore, how to accurately determine the relationship between the reasons for the reduction in the conversion efficiency of the perovskite battery and the coating thickness of the perovskite battery film has become a technical problem that needs to be solved urgently. Summary of the invention

[0005] The present invention provides a testing method for a perovskite battery, so as to accurately determine the relationship between the coating of a perovskite battery film and the performance of the perovskite battery, thereby being able to quickly determine the cause of abnormal performance of mass-produced perovskite batteries.

[0006] The present invention provides a method for testing a perovskite battery, and the method for testing a perovskite battery comprises:

[0007] Providing at least one perovskite battery test sheet, and performing a performance test on the perovskite battery test sheet to obtain first initial test data of the perovskite battery test sheet;

[0008] When it is determined that the perovskite battery test sheet is a battery sheet with abnormal performance according to the first initial test data, the perovskite battery test sheet is cut to form multiple sub-test sheets of equal size N×M sheets, and a performance test is performed on each of the sub-test sheets respectively to obtain second initial test data of each of the sub-test sheets; one of N and M is a positive integer greater than or equal to 2, and the other is a positive integer;

[0009] Electrically connecting at least part of the sub-test sheets according to a first setting rule to form a recombinant perovskite cell, and performing a performance test on the recombinant perovskite cell to obtain recombinant test data of the recombinant perovskite cell;

[0010] When it is determined that each of the sub-test pieces includes a sub-test piece with abnormal performance and a sub-test piece with normal performance based on the second initial test data of each sub-test piece and the reconstructed test data, the film coating thickness of each sub-test piece is tested respectively to determine the film coating uniformity of the perovskite battery test piece based on the film coating thickness of each sub-test piece.

[0011] Optionally, electrically connecting at least part of the sub-test sheets according to a first setting rule to form a recombinant perovskite cell, and performing a performance test on the recombinant perovskite cell to obtain recombinant test data of the recombinant perovskite cell, comprises:

[0012] According to the first setting rule, N×M pieces of the sub-test pieces are electrically connected to form an initial recombinant perovskite cell, and a performance test is performed on the initial recombinant perovskite cell to obtain initial recombinant test data of the initial recombinant perovskite cell;

[0013] When it is determined that the sub-test piece with abnormal performance exists in each of the sub-test pieces according to the second initial data of each of the sub-test pieces in the initial recombinant perovskite cell, a verification recombinant perovskite cell is formed after removing the first sub-test piece and the second sub-test piece in the initial recombinant perovskite cell, and a performance test is performed on the verification recombinant perovskite cell to obtain verification recombination test data of the verification recombinant perovskite cell;

[0014] Wherein, the test data at least includes conversion efficiency; among the sub-test pieces of the initial recombinant perovskite cell, the first sub-test piece has the largest conversion efficiency, and the second sub-test piece has the smallest conversion efficiency.

[0015] Optionally, each of the sub-test sheets in the initial recombinant perovskite cell is electrically connected via a conductive substrate having a first size;

[0016] The first size is S1, and the size of the sub-test piece is S0; (1 / 4)×S0≤S1≤(1 / 2)×S0.

[0017] Optionally, a conductive substrate having a second size is arranged at the positions of the first sub-test piece and the second sub-test piece in the verification recombinant perovskite cell;

[0018] The second size is S2, and the size of the sub-test piece is S0; S0≤S2≤(3 / 2)×S0.

[0019] Optionally, the test method of the perovskite battery further includes:

[0020] When it is determined that there is a sub-test piece with abnormal thickness among the sub-test pieces according to the film coating thickness of each of the sub-test pieces, adjusting the film coating thickness of the perovskite battery piece according to the second setting rule to form an adjusted perovskite battery test piece;

[0021] Cutting the adjusted perovskite battery test sheet to form a plurality of adjusted sub-test sheets of equal size, M×N sheets, and performing performance tests on each of the adjusted sub-test sheets respectively to obtain third initial test data of each of the adjusted sub-test sheets;

[0022] When it is determined that the adjusted sub-test piece is the normal performance sub-test piece according to the third initial test data, the film coating thickness of the adjusted sub-test piece is tested to determine the film coating uniformity of the perovskite battery test piece according to the film coating thickness of the adjusted sub-test piece.

[0023] Optionally, the test method of the perovskite battery further includes:

[0024] According to the third setting rule, the M×N adjusted sub-test pieces are electrically connected to form an adjusted recombinant perovskite cell, and a performance test is performed on the adjusted recombinant perovskite cell to obtain adjusted recombination test data of the adjusted recombinant perovskite cell.

[0025] Optionally, determining the film coating uniformity of the perovskite battery test piece according to the adjusted film coating thickness of the sub-test piece includes:

[0026] When it is determined that the adjusted recombinant perovskite battery test piece is a battery piece with normal performance according to the adjusted recombinant test data, the maximum film coating thickness among the film coating thicknesses of each of the adjusted sub-test pieces in the adjusted recombinant perovskite battery piece is used to determine the upper limit of the film coating thickness of the perovskite battery piece, and / or, the minimum film coating thickness among the film coating thicknesses of each of the adjusted sub-test pieces in the adjusted recombinant perovskite battery piece is used to determine the lower limit of the film coating thickness of the perovskite battery piece;

[0027] The uniformity of the film coating of the perovskite cell is determined according to the upper limit of the film coating thickness and / or the lower limit of the film coating thickness.

[0028] Optionally, at least one perovskite battery test sheet is provided, comprising:

[0029] M×N pieces of perovskite battery test pieces with different film coating thicknesses are provided; the film coating uniformity of each of the perovskite battery test pieces is within a preset uniformity range.

[0030] Optionally, electrically connecting at least part of the sub-test sheets according to a first setting rule to form a recombinant perovskite cell sheet includes:

[0031] M×N pieces of the sub-test pieces with different film coating thicknesses are selected, and the selected M×N pieces of the sub-test pieces are electrically connected according to the first setting rule to form a recombinant perovskite cell.

[0032] Optionally, the film coating thickness of each of the sub-test sheets is tested respectively to determine the film coating uniformity of the perovskite battery test sheet according to the film coating thickness of each of the sub-test sheets, including:

[0033] Determine any one of the normal performance sub-test pieces as a standard sub-test piece;

[0034] Determining a coating thickness value range according to a height difference between the standard sub-test piece and other normal performance sub-test pieces;

[0035] The uniformity of the film coating of the perovskite battery test piece is determined according to the film coating thickness of the performance abnormality sub-test piece and the coating thickness value range.

[0036] The technical solution provided by the present invention performs a performance test on a perovskite battery test piece to obtain first initial test data of the perovskite battery test piece, and when it is determined that the perovskite battery test piece is a battery piece with abnormal performance according to the first initial test data, the perovskite battery test piece is cut to form multiple sub-test pieces of equal size N×M pieces, and a performance test is performed on each sub-test piece respectively to obtain second initial test data of each sub-test piece, and then at least part of the sub-test pieces are electrically connected according to a first setting rule to form a recombinant perovskite battery piece, and the recombinant perovskite battery piece is performance tested to obtain the recombinant test data of the recombinant perovskite battery piece, and when there is a sub-test piece in the N×M sub-test pieces whose second initial test data is greatly different from the second initial test data of other sub-test pieces, and the recombinant test data of the recombinant perovskite battery piece after the sub-test pieces are electrically connected is similar to the first initial test data of the perovskite battery test piece before cutting, the sub-test piece with a large difference in the second initial test data can be considered as an abnormal sub-test piece, so that the abnormal performance of the sub-test piece can be accurately judged. At the same time, by testing the film coating thickness of each sub-test piece respectively, the film coating uniformity of the perovskite battery test piece is determined according to the film coating thickness of each sub-test piece, and further combined with the second initial test data of each sub-test piece, it is possible to accurately determine whether the cause of the abnormal performance of the perovskite battery test piece is related to the film coating uniformity, thereby quickly determining the cause of the abnormal performance of mass-produced perovskite batteries.

[0037] It should be understood that the contents described in this section are not intended to identify the key or important features of the embodiments of the present invention, nor are they intended to limit the scope of the present invention. Other features of the present invention will become easily understood through the following description. BRIEF DESCRIPTION OF THE DRAWINGS

[0038] In order to more clearly illustrate the technical solutions in the embodiments of the present invention, the following briefly introduces the drawings required for use in the description of the embodiments. Obviously, the drawings described below are only some embodiments of the present invention. For ordinary technicians in this field, other drawings can be obtained based on these drawings without creative work.

[0039] Figure 1 It is a schematic flow chart of a method for testing a perovskite battery provided by an embodiment of the present invention;

[0040] Figure 2 It is a schematic diagram of a process of cutting and reassembling a perovskite battery test sheet provided by an embodiment of the present invention;

[0041] Figure 3 It is a schematic diagram of another process of cutting and reassembling a perovskite battery test sheet provided by an embodiment of the present invention;

[0042] Figure 4 It is a schematic flow chart of a method for testing a recombinant perovskite cell provided in an embodiment of the present invention;

[0043] Figure 5 It is a schematic diagram of another process of cutting and reassembling a perovskite battery test sheet provided by an embodiment of the present invention;

[0044] Figure 6 It is a schematic flow chart of another method for testing a perovskite battery provided by an embodiment of the present invention;

[0045] Figure 7 It is a flow chart of a method for determining coating uniformity of a perovskite cell provided in an embodiment of the present invention. DETAILED DESCRIPTION

[0046] In order to enable those skilled in the art to better understand the scheme of the present invention, the technical scheme in the embodiments of the present invention will be clearly and completely described below in conjunction with the drawings in the embodiments of the present invention. Obviously, the described embodiments are only part of the embodiments of the present invention, not all of the embodiments. Based on the embodiments of the present invention, all other embodiments obtained by ordinary technicians in this field without creative work should fall within the scope of protection of the present invention.

[0047] It should be noted that the terms "first", "second", etc. in the specification and claims of the present invention and the above-mentioned drawings are used to distinguish similar objects, and are not necessarily used to describe a specific order or sequence. It should be understood that the data used in this way can be interchanged where appropriate, so that the embodiments of the present invention described herein can be implemented in an order other than those illustrated or described herein. In addition, the terms "including" and "having" and any variations thereof are intended to cover non-exclusive inclusions, for example, a process, method, system, product or device that includes a series of steps or units is not necessarily limited to those steps or units that are clearly listed, but may include other steps or units that are not clearly listed or inherent to these processes, methods, products or devices.

[0048] Figure 1 is a flow chart of a method for testing a perovskite battery provided in Example 1 of the present invention. This embodiment can accurately determine the relationship between the coating uniformity of the perovskite battery film layer and the performance abnormality, such as Figure 1 As shown, the testing method of the perovskite battery may include:

[0049] S101. Provide at least one perovskite battery test sheet, and perform a performance test on the perovskite battery test sheet to obtain first initial test data of the perovskite battery test sheet.

[0050] It can be understood that the film structure of the perovskite battery test piece usually includes multiple film layers, for example, it may include a substrate, and a first electrode layer, an electron transport layer, a perovskite light absorption layer, a hole transport layer, and a second electrode layer located on one side of the substrate. Among them, the substrate can be a substrate with high light transmittance such as a glass substrate or a plastic substrate to provide support for other film layers, meet the coating requirements of other film layers, and ensure that light from the external environment can pass through to meet the photoelectric conversion requirements of the perovskite battery test piece; the first electrode layer may include a transparent conductive layer, which may include a conductive oxide material, such as tin oxide or indium tin oxide; the second electrode layer may include a metal conductive layer; the perovskite light absorption layer is the core part of the perovskite battery test piece, which is used to absorb light energy and generate electron-hole pairs, and the perovskite material may include methylamine lead iodide perovskite (CH3NH3PbI3) and the like; the electron transport layer located between the first electrode layer and the perovskite light absorption layer can transfer the electrons generated by the perovskite light absorption layer to the first electrode layer, and the hole transport layer located between the second electrode layer and the perovskite light absorption layer can transfer the holes generated by the perovskite light absorption layer to the second electrode layer, thereby generating photogenerated carriers between the first electrode layer and the second electrode layer.

[0051] It is also understandable that Figure 2 As shown, the first electrode layer or the second electrode layer of the perovskite battery test piece 10 may include electrode structures 01 and 02 that cross horizontally and vertically. The electrode structures 01 and 02 that cross horizontally and vertically can be converged to facilitate subsequent performance testing of the perovskite battery test piece.

[0052] It should be noted that providing at least one perovskite battery test sheet may be providing one or more perovskite battery test sheets, and one or more perovskite battery test sheets may be subjected to performance tests to determine first initial test data of each perovskite battery sheet. The first initial test data may include at least one of the maximum power, open circuit voltage, fill factor, and conversion efficiency of the perovskite battery test sheet.

[0053] In an optional embodiment, when a perovskite battery test piece is provided each time, the performance test of the perovskite battery test piece can be performed. If there is a large deviation between the first initial test data of the perovskite battery test piece and the expected test data, for example, compared with the preset conversion efficiency, the conversion efficiency of the perovskite battery test piece is lower, it can be determined that the perovskite battery test piece is a battery piece with abnormal performance; conversely, if the first initial test data of the perovskite battery test piece is equivalent to or has a small difference with the expected test data, it can be determined that the perovskite battery test piece is a battery piece with normal performance. At this time, other perovskite battery test pieces can be additionally provided until the perovskite battery test piece with abnormal performance is determined.

[0054] In another optional embodiment, providing at least one perovskite battery test sheet may include: providing M×N perovskite battery test sheets with different film coating thicknesses; the film coating uniformity of each perovskite battery test sheet is within a preset uniformity range.

[0055] Specifically, M×N perovskite battery test pieces with different film coating thicknesses are provided, and the film coating uniformity of the M×N perovskite battery test pieces is within a preset uniformity range. For example, Figure 3 As shown, the film coating uniformity of the provided M×N perovskite battery test pieces should be within 3%. Taking M×N equal to 4 as an example, the four perovskite battery test pieces are perovskite battery test pieces 110, 120, 130 and 140, respectively. The film coating thickness of the perovskite battery test piece 110 can be 485nm, the film coating thickness of the perovskite battery test piece 120 can be 490nm, the film coating thickness of the perovskite battery test piece 130 can be 510nm, and the film coating thickness of the perovskite battery test piece 140 can be 515nm, etc. At this time, the perovskite battery test pieces 110, 120, 130 and 140 can be tested for performance respectively, so as to obtain the perovskite battery test pieces 110, 120, 130, respectively. and 140, thereby being able to determine whether there are battery cells with abnormal performance among the perovskite battery test sheets 110, 120, 130 and 140 according to the first initial test data of the perovskite battery test sheet 110, the first initial test data of the perovskite battery test sheet 120, the first initial test data of the perovskite battery test sheet 130 and the first initial test data of the perovskite battery test sheet 140; if there are no battery cells with abnormal performance among the perovskite battery test sheets 110, 120, 130 and 140, the upper limit and / or lower limit of the film coating thickness of the four perovskite battery test sheets with abnormal performance can be adjusted until there are battery cells with abnormal performance among the perovskite battery test sheets 110, 120, 130 and 140.

[0056] S102. When it is determined that the perovskite battery test piece is a battery piece with abnormal performance according to the first initial test data, the perovskite battery test piece is cut to form multiple sub-test pieces of equal size N×M pieces, and performance tests are performed on each sub-test piece respectively to obtain second initial test data of each sub-test piece.

[0057] It is understandable that after the performance test of mass-produced perovskite cells, if it is found that the test data of the currently produced perovskite cells no longer meet the expected test data, it is necessary to find the reason for the test data not meeting the expected test data. At this time, the same preparation process and the same film coating thickness as the perovskite cell that does not meet the expected test data can be used to prepare the perovskite cell test piece, and after the performance test of the perovskite cell test piece is performed, if it is determined that the difference between the first initial test data of the perovskite cell test piece and the expected test data is large, the perovskite cell test piece can be determined as a cell with abnormal performance.

[0058] For example, taking the first initial test data including the conversion efficiency of the perovskite battery test piece as an example, when the conversion efficiency of the perovskite battery test piece increases significantly, it may be because the film coating thickness of the perovskite battery test piece just meets the film coating thickness required when the perovskite battery conversion efficiency is higher, or, when the conversion efficiency of the perovskite battery test piece drops sharply, it may be because the film coating thickness of the perovskite battery test piece hinders the photoelectric conversion of the perovskite.

[0059] It can also be understood that in the process of mass production of perovskite cells, the size and uniformity of the film coating thickness will affect the conversion efficiency of the perovskite cells, etc. Usually, through a large number of experiments, the film coating thickness of the perovskite cell that can meet the expected test data requirements can be determined. In the subsequent production and preparation process, the film coating thickness of the perovskite cell needs to be strictly controlled, but this requires sophisticated film coating equipment and operation methods, which is not conducive to the low cost of large-scale perovskite cells. In view of this, by providing N×M pieces of perovskite battery test pieces with different film coating thicknesses, after the perovskite battery test pieces are respectively tested for performance, it can be determined whether each perovskite battery test piece itself meets the expected performance requirements; when there are perovskite battery test pieces that do not meet the expected performance in the perovskite battery test pieces after different film layers are coated, the film coating thickness of the perovskite battery test piece that does not meet the expected performance may be the upper limit or lower limit of the film coating thickness during mass production and preparation, which can be determined by further testing.

[0060] Specifically, when the perovskite battery test piece is determined to be a battery piece with abnormal performance according to the first initial test data, in order to verify the cause of the abnormal performance of the battery piece with abnormal performance, the perovskite battery test piece with abnormal performance is cut into multiple sub-test pieces of equal size N×M pieces, wherein the cutting method may include cutting with a glass knife or cutting at a fixed point with a laser, and performing performance tests on each sub-test piece respectively to obtain the second initial test data of each sub-test piece, that is, each sub-test piece corresponds to a set of second initial test data. The second initial test data of the sub-test piece may include at least one of the maximum power, open circuit voltage, fill factor and conversion efficiency of the sub-test piece.

[0061] In addition, continue to refer to Figure 2 As shown, a perovskite battery test piece 10 with a larger size is cut into multiple sub-test pieces. For example, the perovskite battery test piece with a larger size can be cut into four small-sized sub-test pieces, and the four small-sized sub-test pieces can be respectively a first sub-test piece 11, a second sub-test piece 12, a third sub-test piece 13 and a fourth sub-test piece 14; the sub-test pieces after cutting have the same length and width, so that the sub-test pieces are of equal size, ensuring that the multiple sub-test pieces have the same area, so that when the sub-test pieces have the same film coating thickness, the second initial test data of each sub-test piece can be kept consistent; therefore, when there are significant differences in the second initial test data of each sub-test piece, the difference caused by the different photoelectric conversion areas of each sub-test piece can be ruled out.

[0062] Or, if Figure 3As shown, when multiple perovskite battery test sheets with different film coating thicknesses are provided, each perovskite battery test sheet can be cut separately so that each perovskite battery test sheet can be divided into N×M sub-test sheets of equal size to ensure that the performance of each sub-test sheet of the same perovskite battery test sheet remains consistent. For example, when four perovskite battery test pieces with different film coating thicknesses are provided, and the four perovskite battery test pieces are perovskite battery test pieces 110, 120, 130 and 140 respectively, the perovskite battery test piece 110 can be cut into a first first sub-test piece 111, a first second sub-test piece 112, a first third sub-test piece 113 and a first fourth sub-test piece 114, the perovskite battery test piece 120 can be cut into a second first sub-test piece 121, a second second sub-test piece 122, a second third sub-test piece 123 and a second fourth sub-test piece 124, the perovskite battery test piece 130 can be cut into a third first sub-test piece 131, a third second sub-test piece 132, a third third sub-test piece 133 and a third fourth sub-test piece 134, and the perovskite battery test piece 140 can be cut into a fourth first sub-test piece 141, a fourth second sub-test piece 142, a fourth third sub-test piece 143 and a fourth fourth sub-test piece 144.

[0063] It should be noted that one of N and M is a positive integer greater than or equal to 2, and the other is a positive integer. N and M may be the same or different, and may be specifically designed according to actual needs. For example, the perovskite battery test piece with abnormal performance may be cut into 9 sub-test pieces of equal size of 3×3 pieces, or, in another embodiment, the perovskite battery test piece with abnormal performance may be cut into 4 sub-test pieces of equal size of 2×2 pieces, or, in other embodiments, the perovskite battery test piece with abnormal performance may be cut into 6 sub-test pieces of equal size of 3×2 pieces. On the premise of ensuring that the sizes of multiple sub-test pieces are the same, the embodiment of the present invention does not limit the cutting division method and the number of sub-test pieces after cutting. For the convenience of description, without special limitations, the embodiment of the present invention takes N and M equal to 2 as an example to exemplify the technical solution of the embodiment of the present invention.

[0064] S103, electrically connecting at least part of the sub-test sheets according to the first setting rule to form a recombinant perovskite cell, and performing a performance test on the recombinant perovskite cell to obtain recombinant test data of the recombinant perovskite cell.

[0065] Among them, the first setting rule can be specifically understood as, after cutting the perovskite battery test sheet into multiple sub-test sheets of N×M pieces of equal size, the N×M sub-test sheets are electrically reconnected according to the set rules to form a recombinant perovskite battery sheet.

[0066] In an optional embodiment, sub-test pieces of equal size N×M pieces may be electrically connected through a conductive substrate, and the conductive substrate may have a first size S1. If the size of the sub-test piece is S0, the first size S1 may satisfy (1 / 4)×S0≤S1≤(1 / 2)×S0.

[0067] Among them, the conductive substrate can be specifically understood as a material with good conductive properties, which is used to provide electrical connection for each sub-test piece. The conductive substrate has the same film structure as the base and the first conductive layer of the perovskite battery test piece, so that the reconstituted perovskite battery piece can more accurately simulate the perovskite battery test piece before cutting, thereby improving the accuracy of the test of the perovskite battery test piece. It can be understood that compared with the use of wires for electrical connection, the use of a conductive substrate of the first size to electrically connect each sub-test piece can better restore the situation of the perovskite battery test piece before cutting, which helps to reduce contact resistance, improve current transmission efficiency, and ensure that each sub-test piece can obtain a stable electrical connection during the test process, thereby improving the accuracy of the test of the perovskite battery test piece. At the same time, by setting the first size of the conductive substrate between 1 / 4 and 1 / 2 of the size S0 of the sub-test piece, it can prevent the first size of the conductive substrate from being too small, and the role of the conductive substrate is similar to that of a wire, resulting in unstable electrical connection and increased contact resistance, which affects the performance of each sub-test piece; at the same time, it can also prevent the first size of the conductive substrate from being too large, resulting in short circuits between each sub-test piece, affecting the safety and stability of each sub-test piece. Therefore, by reasonably setting the first size of the conductive substrate, the accuracy of the electrical connection of each sub-test piece is ensured, thereby improving the accuracy of the test of the perovskite battery test piece.

[0068] In an optional embodiment, when providing at least one perovskite battery test sheet is to provide a perovskite battery test sheet, the perovskite battery test sheet is cut to form N×M sub-test sheets, and the N×M sub-test sheets can be arranged according to the positions before cutting and then electrically reconnected through a conductive substrate having a first size to form a recombinant perovskite battery sheet.

[0069] For example, continue to refer to Figure 2When the perovskite battery test piece 10 with abnormal performance is cut into 4 sub-test pieces of equal size of 2×2 pieces, the sub-test piece in the upper left corner can be numbered as the first sub-test piece 11, the sub-test piece in the upper right corner can be numbered as the second sub-test piece 12, the sub-test piece in the lower left corner can be numbered as the third sub-test piece 13, and the sub-test piece in the lower right corner can be numbered as the fourth sub-test piece 14. After the performance tests are performed on the 4 sub-test pieces respectively, the first sub-test piece 11 is located in the upper left corner, the second sub-test piece 12 is located in the upper right corner, the third sub-test piece 13 is located in the lower left corner, and the fourth sub-test piece 14 is located in the lower right corner. 4 is located in the lower right corner, and the four sub-test pieces are arranged in a manner such that the first sub-test piece 11 is electrically connected to the second sub-test piece 12, and the third sub-test piece 13 is electrically connected to the fourth sub-test piece 14 through the conductive substrate 2 having the first size to form a recombinant perovskite cell; when the performance of the recombinant perovskite cell is tested, the positive electrode interface 3 of the test equipment can be electrically connected to the first sub-test piece 11 and the third sub-test piece 13, and the negative electrode interface 4 of the test equipment can be electrically connected to the second sub-test piece 12 and the fourth sub-test piece 14, so as to obtain the recombinant test data of the recombinant perovskite cell. The recombinant test data includes at least one of the maximum power, open circuit voltage, fill factor and conversion efficiency of the recombinant perovskite cell.

[0070] In another optional embodiment, when at least one perovskite battery test sheet provided includes N×M perovskite battery test sheets with different film coating thicknesses, when at least part of the sub-test sheets are electrically connected according to a first setting rule to form a recombinant perovskite battery sheet, M×N sub-test sheets with different film coating thicknesses can be selected, and the selected M×N sub-test sheets can be electrically connected according to the first setting rule to form a recombinant perovskite battery sheet.

[0071] Among them, selecting M×N test pieces with different film coating thicknesses can be specifically understood as selecting M×N test pieces with different film coating thicknesses and intact appearance without cracks, so as to avoid the impact of cutting damage on the test results and ensure the accuracy of subsequent tests. The selected M×N test pieces are electrically connected through a conductive substrate to form a recombinant perovskite cell, that is, the recombinant perovskite cell is composed of M×N sub-test pieces with film coating thicknesses within a preset uniformity range, avoiding abnormal conversion efficiency caused by the film coating uniformity in the sub-test pieces not meeting performance requirements, and performing performance tests on the recombinant perovskite cell to obtain recombinant test data of the recombinant perovskite cell.

[0072] For example, continue to refer to Figure 3, the perovskite battery test piece 110 with a film coating thickness of 485nm is cut into a first sub-test piece 111, a first second sub-test piece 112, a first third sub-test piece 113 and a first fourth sub-test piece 114 of 2×2 pieces of equal size, the perovskite battery test piece 120 with a film coating thickness of 490nm is cut into a second first sub-test piece 121, a second second sub-test piece 122, a second third sub-test piece 123 and a second fourth sub-test piece 124 of 2×2 pieces of equal size, the perovskite battery test piece 130 with a film coating thickness of 510nm is cut into a third first sub-test piece 131, a third second sub-test piece 132, a third third sub-test piece 133 and a third fourth sub-test piece 134 of 2×2 pieces of equal size, the perovskite battery test piece 140 with a film coating thickness of 515nm is cut into a fourth first sub-test piece 141, a fourth second sub-test piece 142, a fourth third sub-test piece 143 and a fourth fourth sub-test piece 144 of 2×2 pieces of equal size. Four second sub-test pieces 142, a fourth third sub-test piece 143 and a fourth fourth sub-test piece 144, and select 2×2 pieces of the first first sub-test piece 111, the second second sub-test piece 122, the third third sub-test piece 133 and the fourth fourth sub-test piece 144, according to which the first first sub-test piece 111 is located in the upper left corner, the second second sub-test piece 122 is located in the upper right corner, the third third sub-test piece 133 is located in the lower left corner, and the fourth fourth sub-test piece 144 is located in the lower right corner, and the 4 sub-test pieces are electrically connected through a conductive substrate to form a recombinant perovskite cell, and the positive electrode interface 3 of the test equipment is electrically connected to the first first sub-test piece 111 and the third third sub-test piece 133, and the negative electrode interface 4 of the test equipment is electrically connected to the sub-second second sub-test piece 122 and the fourth fourth sub-test piece 144, so as to test the performance of the recombinant perovskite cell and obtain the recombinant test data of the recombinant perovskite cell.

[0073] S104. When it is determined that each sub-test piece includes a sub-test piece with abnormal performance and a sub-test piece with normal performance based on the second initial test data and the reorganized test data of each sub-test piece, the film coating thickness of each sub-test piece is tested respectively to determine the film coating uniformity of the perovskite battery test piece based on the film coating thickness of each sub-test piece.

[0074] Among them, the sub-test piece with abnormal performance has a large difference in the second initial test data from the other N×M-1 sub-test pieces. When the recombined test data of the recombined perovskite battery piece after the sub-test pieces are electrically connected is similar to the first initial test data of the perovskite battery test piece before cutting, it can be ruled out that the large difference between the second initial test data of the sub-test piece with abnormal performance and the second initial test data of other sub-test pieces is caused by cutting. At this time, the sub-test piece with a large difference in the second initial test data from other sub-test pieces can be directly regarded as the sub-test piece with abnormal performance. By further testing the film coating thickness of each sub-test piece, it can be further determined whether each sub-test piece has a problem with the uniformity of the film coating thickness.

[0075] In an exemplary embodiment, when the film coating thickness of the perovskite battery test piece is unknown, the film coating thickness of each sub-test piece can be tested by a step meter or a film thickness tester to obtain the film coating thickness of each sub-test piece. If the film coating thickness of the sub-test piece with abnormal performance is thicker or thinner than the film coating thickness of the other sub-test pieces with normal performance, it can be considered that the performance abnormality of the sub-test piece is due to the abnormal film coating thickness, and the performance abnormality of the perovskite battery test piece may be caused by its uneven film coating. If the film coating thickness of the sub-test piece with abnormal performance is not much different from the film coating thickness of the other sub-test pieces with normal performance, it can be considered that the performance abnormality of the sub-test piece may be unrelated to the film coating thickness, the film coating thickness of the perovskite battery test piece is uniform, and the performance abnormality of the perovskite battery test piece may be unrelated to the uniformity of the film coating thickness.

[0076] In another exemplary embodiment, if each sub-test piece is cut from a perovskite battery test piece with a different known film coating thickness, the film coating thickness of each sub-test piece can be directly obtained or obtained through software call. At this time, if the recombined test data of the recombined perovskite battery cell meets the expected test data of the perovskite battery cell, it can be considered that the uniformity of the film coating thickness of the recombined perovskite battery test piece composed of M×N sub-test pieces with different film coating thicknesses meets the preset uniformity range, so that the tolerance range of the film coating thickness of the perovskite battery cell can be determined according to the film coating thickness of each sub-test piece, and the film coating uniformity of the perovskite battery cell can be determined at the same time, and it is helpful to adjust and optimize the film coating thickness of the perovskite battery test piece, which is conducive to simplifying the preparation process of the perovskite battery cell, improving the production efficiency of the perovskite battery cell, and reducing the production cost of the perovskite battery cell. On the contrary, if the recombinant test data of the recombinant perovskite cell meets the expected test data of the perovskite cell, and the recombinant test data of the recombinant perovskite cell is within the value range formed by the first initial test data of each perovskite cell test cell before cutting, it can be determined that each sub-test cell in the recombinant perovskite cell test cell may not meet the fault tolerance range of the film coating thickness of the perovskite cell, and the film coating thickness of each sub-test cell needs to be readjusted until the fault tolerance range of the film coating thickness of the perovskite cell is determined.

[0077] It is understandable that after determining the tolerance range of the film coating thickness of the perovskite cell, the film coating uniformity of the perovskite cell test piece can be determined according to the upper and lower limits of the film coating of the perovskite cell. For example, if the film coating thickness of the normal performance sub-test piece is 500nm, the lower limit of the determined film coating thickness is 450nm and the upper limit is 550nm, it can be calculated that the film coating uniformity of the perovskite cell test piece is 10%. It can be considered that when producing perovskite cells, the film uniformity of the perovskite cell is limited to 10%, so that the perovskite cell can meet the expected performance requirements.

[0078] In an embodiment of the present invention, a performance test is performed on a perovskite battery test piece to obtain first initial test data of the perovskite battery test piece, and when the perovskite battery test piece is determined to be a battery piece with abnormal performance according to the first initial test data, the perovskite battery test piece is cut to form multiple sub-test pieces of equal size N×M pieces, and a performance test is performed on each sub-test piece to obtain second initial test data of each sub-test piece, and then at least part of the sub-test pieces are electrically connected according to a first setting rule to form a recombinant perovskite battery piece, and a performance test is performed on the recombinant perovskite battery piece to obtain recombinant test data of the recombinant perovskite battery piece, and when there is a sub-test piece in the N×M sub-test pieces whose second initial test data differs greatly from the second initial test data of other sub-test pieces, and the recombinant test data of the recombinant perovskite battery piece after the sub-test pieces are electrically connected is similar to the first initial test data of the perovskite battery test piece before cutting, the sub-test piece with a large difference in the second initial test data can be considered as an abnormal sub-test piece, so that the abnormal performance of the sub-test piece can be accurately judged. At the same time, by testing the film coating thickness of each sub-test piece respectively, the film coating uniformity of the perovskite battery test piece is determined according to the film coating thickness of each sub-test piece, and further combined with the second initial test data of each sub-test piece, it is possible to accurately determine whether the cause of the abnormal performance of the perovskite battery test piece is related to the film coating uniformity, thereby quickly determining the cause of the abnormal performance of mass-produced perovskite batteries.

[0079] Optional, Figure 4 is a flow chart of a method for testing a recombinant perovskite cell provided by an embodiment of the present invention, such as Figure 4 As shown, at least part of the sub-test sheets are electrically connected according to a first setting rule to form a recombinant perovskite cell sheet, and a performance test is performed on the recombinant perovskite cell sheet to obtain recombinant test data of the recombinant perovskite cell sheet, including:

[0080] S1031, electrically connecting N×M test pieces to form an initial recombinant perovskite cell according to a first setting rule, and performing a performance test on the initial recombinant perovskite cell to obtain initial recombinant test data of the initial recombinant perovskite cell.

[0081] Specifically, a perovskite battery test piece with abnormal performance is cut into multiple sub-test pieces of equal size of N×M pieces, and electrically connected through a conductive substrate with the same film structure as the base and the first conductive layer of the perovskite battery test piece according to the position of each sub-test piece before cutting to form an initial recombinant perovskite battery piece, and a performance test is performed on the initial recombinant perovskite battery piece to obtain initial recombinant test data of the initial recombinant perovskite battery piece, wherein the initial recombinant test data includes at least one of the maximum power, open circuit voltage, fill factor and conversion efficiency of the initial recombinant perovskite battery piece.

[0082] For example, continue to refer to Figure 2 When the perovskite battery test piece 10 with abnormal performance is cut into 4 sub-test pieces of equal size of 2×2 pieces, the sub-test piece in the upper left corner can be numbered as the first sub-test piece 11, the sub-test piece in the upper right corner can be numbered as the second sub-test piece 12, the sub-test piece in the lower left corner can be numbered as the third sub-test piece 13, and the sub-test piece in the lower right corner can be numbered as the fourth sub-test piece 14. After the performance tests are performed on the 4 sub-test pieces respectively, the first sub-test piece 11 is located in the upper left corner, the second sub-test piece 12 is located in the upper right corner, and the third sub-test piece is located in the lower right corner. 13 is located at the lower left corner, and the fourth sub-test piece 14 is located at the lower right corner. The four sub-test pieces are electrically connected through a conductive substrate having a first size between 1 / 4 and 1 / 2 of the size of the sub-test piece to form a recombinant perovskite cell. The positive electrode interface 3 of the test equipment is electrically connected to the first sub-test piece 11 and the third sub-test piece 13, and the negative electrode interface 4 of the test equipment is electrically connected to the second sub-test piece 12 and the fourth sub-test piece 14. The performance of the recombinant perovskite cell is tested to obtain the recombinant test data of the recombinant perovskite cell.

[0083] S1032. When it is determined that there is a sub-test piece with abnormal performance in each sub-test piece according to the second initial data of each sub-test piece in the initial recombinant perovskite cell, the first sub-test piece and the second sub-test piece in the initial recombinant perovskite cell are removed to form a verified recombinant perovskite cell, and a performance test is performed on the verified recombinant perovskite cell to obtain verified recombination test data of the verified recombinant perovskite cell.

[0084] The test data at least includes conversion efficiency; among the sub-test pieces of the initial recombinant perovskite cell, the first sub-test piece has the largest conversion efficiency, and the second sub-test piece has the smallest conversion efficiency.

[0085] Specifically, when there is a sub-test piece in each sub-test piece in the initial recombinant perovskite cell whose second initial data differs greatly from the second initial data of other sub-test pieces, the sub-test piece can be determined as an abnormal sub-test piece, and the abnormal sub-test piece can be the sub-test piece with the highest or lowest conversion efficiency among the sub-test pieces. At this time, by removing the first sub-test piece with the highest conversion efficiency and the second sub-test piece with the lowest conversion efficiency, the conversion efficiencies of the remaining sub-test pieces can be made equivalent; at the same time, the remaining sub-test pieces are electrically connected according to their positions before cutting to form a verified recombinant perovskite cell, and a performance test is performed on the verified recombinant perovskite cell to obtain verified recombination test data of the verified recombinant perovskite cell, wherein the verified recombination test data includes at least one of the maximum power, open circuit voltage, fill factor and conversion efficiency of the verified recombinant perovskite cell.

[0086] It can be understood that if the performance of the recombinant perovskite battery cell is verified to be normal, it can be considered that the abnormal performance of the perovskite battery test piece is due to the abnormal performance of the first sub-test piece and / or the second sub-test piece, thereby realizing the verification and precise testing of the abnormal performance location of the perovskite battery test piece and improving the accuracy of the perovskite battery test piece testing.

[0087] Optionally, verify that a conductive substrate with a second size is set at the positions of the first sub-test piece and the second sub-test piece in the recombinant perovskite cell; wherein the second size is S2, the size of the sub-test piece is S0; S0≤S2≤(3 / 2)×S0.

[0088] Specifically, after removing the first sub-test piece with the highest conversion efficiency and the second sub-test piece with the lowest conversion efficiency, a conductive substrate with a second size can be arranged at the position after the first sub-test piece and the second sub-test piece are removed to fill the vacant position, ensure good electrical connection between the remaining sub-test pieces and verify that the overall performance of the recombinant perovskite cell is not affected, thereby improving the accuracy of the perovskite cell test piece test. For example, Figure 5 As shown, after the first sub-test piece 11 with the largest conversion efficiency and the third sub-test piece 13 with the smallest conversion efficiency are removed, a conductive substrate 2 with a second size is set at the position after the first sub-test piece 11 and the third sub-test piece 13 are removed to fill the vacant positions of the first sub-test piece 11 and the third sub-test piece 13, thereby forming a verification of the recombinant perovskite cell.

[0089] It can also be understood that the second size of the conductive substrate is set between 1 and 3 / 2 times the size of the sub-test piece, which can avoid the second size of the conductive substrate being too small, and the conductive substrate cannot completely cover the position of the removed first sub-test piece and the second sub-test piece, resulting in incomplete or unstable electrical connection, thereby failing to effectively replace the first sub-test piece and the second sub-test piece; at the same time, it can also avoid the second size of the conductive substrate being too large, resulting in a short circuit between adjacent sub-test pieces, affecting the performance and safety of verifying the recombinant perovskite cell. Therefore, the reasonable setting of the second size of the conductive substrate ensures that the conductive substrate can effectively replace the vacant position, improves the performance and reliability of verifying the recombinant perovskite cell, and thus improves the accuracy of testing the perovskite cell test piece.

[0090] Based on the above embodiment, optionally, Figure 6 is a flow chart of another method for testing a perovskite battery provided by an embodiment of the present invention. Figure 6 As shown, the testing method of the perovskite battery also includes:

[0091] S105. When it is determined that there is a sub-test piece with abnormal thickness among the sub-test pieces according to the film coating thickness of each sub-test piece, the film coating thickness of the perovskite battery piece is adjusted according to the second setting rule to form an adjusted perovskite battery test piece.

[0092] Among them, the thickness abnormal sub-test piece can be specifically understood as a performance abnormal sub-test piece whose film coating thickness is thicker or thinner than the film coating thickness of other normal performance sub-test pieces, and the second setting rule can be specifically understood as if the thickness of the thickness abnormal sub-test piece is thin, then the film coating thickness of the perovskite battery piece is increased by adjusting the process means; if the thickness of the thickness abnormal sub-test piece is thicker, then the film coating thickness of the perovskite battery piece is reduced by adjusting the process means to form a perovskite battery test piece after adjusting the film coating thickness. By adjusting the film coating thickness of the perovskite battery test piece according to the film coating thickness of the abnormal sub-test piece, it is helpful to improve the performance of the perovskite battery test piece, and further determine the uniformity of the film coating of the perovskite battery test piece, thereby improving the accuracy of the test of the perovskite battery test piece.

[0093] Optionally, the adjustment range of the coating thickness of the film layer of the perovskite cell can be determined according to actual needs, and the present invention is not limited to this. In an exemplary embodiment, the adjustment range of the coating thickness of the film layer of the perovskite cell can be between 10nm and 50nm.

[0094] S106, cutting the adjusted perovskite battery test piece to form multiple adjusted sub-test pieces of equal size M×N pieces, and performing performance tests on each adjusted sub-test piece respectively to obtain third initial test data of each adjusted sub-test piece.

[0095] Specifically, after adjusting the film coating thickness of the perovskite battery test piece according to the film coating thickness of the abnormal sub-test piece, the adjusted perovskite battery test piece is cut, wherein the cutting method may include cutting with a glass knife or fixed-point cutting with a laser to form multiple adjusted sub-test pieces of equal size of M×N pieces, and performance tests are performed on each adjusted sub-test piece respectively to obtain third initial test data of each adjusted sub-test piece, wherein the third initial test data may include at least one of the maximum power, open circuit voltage, fill factor and conversion efficiency of multiple adjusted sub-test pieces of equal size of M×N pieces.

[0096] S107. When it is determined that the adjusted sub-test piece is a normal performance sub-test piece according to the third initial test data, the film coating thickness of the adjusted sub-test piece is tested to determine the film coating uniformity of the perovskite battery test piece according to the film coating thickness of the adjusted sub-test piece.

[0097] Among them, the normal performance sub-test piece can be specifically understood as a sub-test piece after the film coating thickness is adjusted, and after the performance test, the third initial test data of the adjusted sub-test piece is similar to the performance data of the normal performance sub-test piece. In another optional embodiment, if the performance data of the adjusted sub-test piece is still abnormal, it is necessary to adjust the film coating thickness of the perovskite battery piece again to form an adjusted perovskite battery test piece, and cut the adjusted perovskite battery test piece again to form a sub-test piece until the performance data of the adjusted sub-test piece meets the normal performance data.

[0098] Specifically, the method for testing the film coating thickness of the adjusted normal performance sub-test piece may include but is not limited to testing the film coating thickness through a step meter or a film thickness tester, or, if the adjusted film coating thickness of the sub-test piece is known, the adjusted film coating thickness of the sub-test piece may be directly acquired by calling software or the like. It is understandable that the tolerance range of the film coating thickness of the normal performance perovskite battery test piece can be determined based on the adjusted film coating thickness of the sub-test piece, thereby determining the film coating uniformity of the perovskite battery test piece, and helping to adjust and optimize the film coating thickness of the perovskite battery test piece.

[0099] S108, electrically connecting the M×N adjusted sub-test sheets to form an adjusted recombinant perovskite cell sheet according to the third setting rule, and performing a performance test on the adjusted recombinant perovskite cell sheet to obtain adjusted recombination test data of the adjusted recombinant perovskite cell sheet.

[0100] The third setting rule can be specifically understood as cutting the adjusted perovskite battery test piece into M×N adjusted sub-test pieces, electrically connecting them according to the positions before cutting, to form an adjusted recombinant perovskite battery piece. The adjusted recombinant perovskite battery piece is subjected to a performance test to obtain adjusted recombinant perovskite battery piece adjustment and recombinant test data, wherein the adjusted recombinant test data includes at least one of the maximum power, open circuit voltage, fill factor and conversion efficiency of the adjusted recombinant perovskite battery piece.

[0101] It is understandable that the normal performance data of the adjusted sub-test piece may be due to cutting. The adjusted sub-test pieces are electrically connected to form an adjusted recombinant perovskite cell. If the performance of the adjusted recombinant perovskite cell is normal, it can be considered that the normal data of the adjusted sub-test piece is due to the film coating thickness of the adjusted sub-test piece meeting the normal performance requirements, rather than the cutting error caused by cutting, thereby improving the accuracy of the third initial test data, and at the same time improving the accuracy of the performance judgment of the adjusted perovskite cell test piece.

[0102] S109. When it is determined that the adjusted recombinant perovskite battery test piece is a battery piece with normal performance based on the adjusted recombinant test data, the maximum film coating thickness among the film coating thicknesses of each adjusted sub-test piece in the adjusted recombinant perovskite battery piece is used to determine the upper limit of the film coating thickness of the perovskite battery piece, and / or, the minimum film coating thickness among the film coating thicknesses of each adjusted sub-test piece in the adjusted recombinant perovskite battery piece is used to determine the lower limit of the film coating thickness of the perovskite battery piece.

[0103] S1010, determining the uniformity of the film coating of the perovskite cell according to the upper limit of the film coating thickness and / or the lower limit of the film coating thickness.

[0104] Specifically, when the adjusted recombinant test data of the adjusted recombinant perovskite battery test piece is similar to the performance data of the normal performance perovskite battery piece, the adjusted recombinant perovskite battery test piece can be considered to be a battery piece with normal performance. According to the film thickness of the adjusted sub-test piece, at this time, the maximum film coating thickness among the film coating thicknesses of each adjusted sub-test piece in the adjusted recombinant perovskite battery piece can be determined as the upper limit of the film coating thickness of the perovskite battery piece, and the minimum film coating thickness among the film coating thicknesses of each adjusted sub-test piece in the adjusted recombinant perovskite battery piece can be determined as the lower limit of the film coating thickness of the perovskite battery piece, that is, when the film coating thickness of the perovskite battery piece is between the upper and lower limits, it can be considered that the film coating thickness of the perovskite battery piece meets the uniformity requirement of the film coating thickness.

[0105] It can be understood that according to the upper and lower limits of the film coating thickness, the film coating uniformity of the perovskite cell can be determined. Exemplarily, the film coating thickness of the normal performance sub-test piece is 500nm, the upper limit of the film coating thickness is 515nm, and the lower limit of the film coating thickness is 485nm. It can be calculated that the film coating uniformity of the perovskite cell is 3%. By determining the upper and lower limits of the film coating thickness of the perovskite cell, it is helpful to determine the film coating uniformity of the perovskite cell, improve the accuracy of the test of the perovskite cell test piece, and make the production process of the perovskite cell more controllable, which can improve the quality of the perovskite cell product and ensure that the performance of the perovskite cell meets the requirements.

[0106] Optional, Figure 7 is a flow chart of a method for determining coating uniformity of a perovskite cell provided in an embodiment of the present invention, such as Figure 7 As shown, the film coating thickness of each of the sub-test pieces is tested respectively to determine the film coating uniformity of the perovskite battery test piece according to the film coating thickness of each of the sub-test pieces, including:

[0107] S1041. Determine any normal performance sub-test piece as a standard sub-test piece.

[0108] Specifically, when there is a sub-test piece among each sub-test piece whose second initial test data is significantly different from the second initial test data of other sub-test pieces, and the recombined test data of the recombined perovskite battery piece after the sub-test pieces are electrically connected is close to the first initial test data of the perovskite battery test piece before cutting, the sub-test piece whose second initial test data is significantly different from that of the other sub-test pieces can be considered as a sub-test piece with abnormal performance, and the other sub-test pieces are sub-test pieces with normal performance, and any sub-test piece with normal performance can be determined as a standard sub-test piece.

[0109] Exemplarily, when each sub-test piece includes a first sub-test piece with a film coating thickness of 550nm, a second sub-test piece with a film coating thickness of 500nm, a third sub-test piece with a film coating thickness of 485nm, and a fourth sub-test piece with a film coating thickness of 515nm, the first sub-test piece is determined to be a sub-test piece with abnormal performance, and the second sub-test piece, the third sub-test piece and the fourth sub-test piece are sub-test pieces with normal performance according to the second initial test data and the reconstructed test data. At this time, the second sub-test piece can be determined as a standard sub-test piece.

[0110] S1042. Determine a coating thickness value range based on a height difference between the standard sub-test piece and other normal performance sub-test pieces.

[0111] Specifically, the value range of the film coating thickness of the perovskite battery test piece can be determined according to the height difference between the film coating thickness of the standard sub-test piece and the film coating thickness of other normal performance sub-test pieces.

[0112] Exemplarily, the second sub-test piece serves as a standard sub-test piece, and its film coating thickness is 500nm. The film coating thicknesses of the other normal performance sub-test pieces, the third sub-test piece and the fourth sub-test piece, are 485nm and 515nm respectively. It can be calculated that the height difference between the film coating thickness of the standard sub-test piece and other normal performance sub-test pieces is 15nm. Therefore, it can be determined that the value range of the film coating thickness of the perovskite battery test piece is 500±15nm.

[0113] S1043. Determine the film coating uniformity of the perovskite battery test piece according to the film coating thickness and coating thickness value range of the performance abnormality sub-test piece.

[0114] Specifically, based on the film coating thickness of the performance abnormality sub-test piece and the calculated film coating thickness value range of the perovskite battery test piece, the film coating uniformity of the perovskite battery test piece can be determined, so as to accurately determine whether the cause of the performance abnormality of the perovskite battery test piece is related to the film coating uniformity, thereby being able to quickly determine the cause of the performance abnormality of mass-produced perovskite batteries.

[0115] Exemplarily, the film coating thickness of the perovskite battery test piece ranges from 500±15nm. It can be calculated that the film coating uniformity requirement of the perovskite battery test piece with normal performance should meet 3%. The film coating thickness of the abnormal performance sub-test piece, that is, the first sub-test piece, is 550nm, and the film coating uniformity is 10%. At this time, the film coating uniformity of the perovskite battery cell is 10%, which does not meet the film coating uniformity requirement of normal performance. The film coating thickness of the perovskite battery cell should be adjusted by adjusting the process.

[0116] Specific examples of testing methods for perovskite cells applicable to the above-mentioned embodiments will be further described below.

[0117] As a feasible embodiment, when performing performance tests on mass-produced perovskite cells with a size of 300mm×300mm, abnormal perovskite cells with conversion efficiency significantly different from other perovskite cells were found. After eliminating the abnormality of the detection equipment, a perovskite cell test piece was prepared using the same preparation process as the abnormal perovskite cell, the perovskite cell test piece was tested, and the first initial test data of the perovskite cell test piece was obtained, as shown in Table 1 below.

[0118] Table 1 The first initial test data of the perovskite battery test piece

[0119]

[0120] It can be seen from the above table that the conversion efficiency of the perovskite battery test piece is lower than 10%. The perovskite battery test piece may be a battery piece with abnormal performance. At this time, the perovskite battery test piece can be cut into 2×2 sub-test pieces with a size of 150mm×150mm. The second initial test data of each sub-test piece is shown in Table 2 below.

[0121] Table 2 Second initial test data of each sub-test piece

[0122]

[0123] It can be found from Table 2 that among the 2×2 sub-test pieces with a size of 150mm×150mm, the maximum power, open circuit voltage, fill factor and conversion efficiency of the sub-test piece located in the upper left corner are significantly inferior to those of other sub-test pieces. The sub-test piece in the upper left corner is determined to be a sub-test piece with abnormal performance. After thickness tests are performed on each sub-test piece, it is determined that the film coating thickness of the sub-test piece with abnormal performance is significantly different from that of other sub-test pieces. Therefore, after checking the film coating head, it is found that the film coating head is slightly blocked. After cleaning the film coating head, the perovskite battery test piece is re-prepared as the adjusted perovskite battery test piece. The adjusted perovskite battery test piece is subjected to performance tests. The test data is shown in Table 3 below.

[0124] Table 3 Performance test data of adjusted perovskite battery test piece

[0125]

[0126] It can be seen from Table 3 above that the performance of the adjusted perovskite battery test piece meets the expected performance requirements, and it is cut into 2×2 sub-test pieces with a size of 150mm×150mm as adjusted sub-test pieces. The test data of each adjusted sub-test piece are as follows:

[0127] Table 4 Performance test data of the adjusted sub-test piece

[0128]

[0129] At this point, the conversion efficiency of each adjusted sub-test piece is normal, and the perovskite cell can continue to be mass-produced using this process. It can be determined that the reason for the abnormal performance of the perovskite cell is the blockage of the coating head. After the film coating head is cleaned, the conversion efficiency of the perovskite battery test piece after re-film coating exceeds 10%, which is higher than the perovskite battery test piece produced before the film coating head is cleaned. The performance level has been improved. In this way, the technical solution of this embodiment can quickly determine the cause of the abnormal performance of the mass-produced perovskite battery, so that the film coating process can be adjusted in time, thereby effectively improving the production efficiency and performance level of the perovskite cell.

[0130] As another feasible embodiment, when producing and preparing perovskite cells, it is necessary to strictly follow the requirements for the film coating thickness of the perovskite cells, which will increase the difficulty of the process. In order to determine the film coating tolerance range of the perovskite cell, 4 perovskite cell test pieces with different film coating thicknesses and film coating uniformity within 3% can be first provided, and each perovskite cell test piece can be cut into 2×2 sub-test pieces. For example, a perovskite cell with a size of 300mm×300mm and a film coating thickness of 490nm, 495nm, 500nm and 505nm can be cut into 2×2 sub-test pieces with a size of 150mm×150mm, and one sub-test piece can be selected therefrom. The film coating thickness of each selected sub-test piece is 490nm, 495nm, 500nm and 505nm, and the size is 150mm×150mm. Performance tests are performed on the selected 2×2 sub-test pieces with a size of 150mm×150mm, and the second initial test data of each sub-test piece is obtained as shown in Table 5 below.

[0131] Table 5 Second initial test data of each sub-test piece

[0132]

[0133] It can be found from Table 5 above that the high power, open circuit voltage, fill factor and conversion efficiency of the sub-test piece with a film coating thickness of 505nm located in the lower right corner are significantly inferior to those of other sub-test pieces. At this time, according to the arrangement of the sub-test piece with a film coating thickness of 490nm located in the upper left corner, the sub-test piece with a film coating thickness of 495nm located in the upper right corner, the sub-test piece with a film coating thickness of 500nm located in the lower left corner, and the sub-test piece with a film coating thickness of 505nm located in the lower right corner, the sub-test pieces are electrically connected through a conductive substrate to form a recombinant perovskite cell. The recombinant test data for the performance test of the recombinant perovskite cell are shown in Table 6 below.

[0134] Table 6 Recombination test data of recombinant perovskite cells

[0135]

[0136] It can be seen from Table 6 above that the performance of the recombinant perovskite cell is correct. At this time, the film coating thickness of the sub-test piece can be further adjusted, that is, the sub-test piece with a film coating thickness of 505nm located in the lower right corner is removed and replaced with another sub-test piece with a film coating thickness of 500nm as the adjusted sub-test piece. At this time, the performance of the adjusted sub-test pieces is tested, and the third initial test data of each adjusted sub-test piece are shown in Table 7 below.

[0137] Table 7 The third initial test data of each adjusted sub-test piece

[0138]

[0139] It can be seen from Table 7 above that the performance test data of each adjusted sub-test piece are normal. The adjusted sub-test pieces are electrically connected to form an adjusted recombinant perovskite cell, and the performance of the adjusted recombinant perovskite cell is tested. The specific test data are shown in Table 8 below.

[0140] Table 8 Performance test data of adjusted recombinant perovskite cells

[0141]

[0142] As can be seen from the above table, the conversion efficiency of the adjusted recombinant perovskite cell is significantly improved. At this time, the film coating thickness of 500nm can be used as the upper limit of the thickness of the perovskite cell. In this way, by electrically connecting sub-test pieces of different thicknesses to recombinant perovskite cells through a conductive substrate, and performing performance tests on the recombinant perovskite cells, the tolerance range of the film coating thickness of the perovskite cell can be determined based on the test data and film coating thickness of each sub-test piece and the test data of the recombinant perovskite cell, which helps to adjust and optimize the film coating thickness of the perovskite cell test piece and effectively improve the production efficiency and performance level of the perovskite cell.

[0143] It should be understood that the various forms of processes shown above can be used to reorder, add or delete steps. For example, the steps described in the present invention can be executed in parallel, sequentially or in different orders, as long as the desired results of the technical solution disclosed in the present invention can be achieved, and this document does not limit this.

[0144] The above specific implementations do not constitute a limitation on the protection scope of the present invention. It should be understood by those skilled in the art that various modifications, combinations, sub-combinations and substitutions can be made according to design requirements and other factors. Any modification, equivalent substitution and improvement made within the spirit and principle of the present invention should be included in the protection scope of the present invention.

Claims

1. A method for testing a perovskite battery, characterized in that: include: Providing at least one perovskite battery test sheet, and performing a performance test on the perovskite battery test sheet to obtain first initial test data of the perovskite battery test sheet; When it is determined that the perovskite battery test sheet is a battery sheet with abnormal performance according to the first initial test data, the perovskite battery test sheet is cut to form multiple sub-test sheets of equal size N×M sheets, and a performance test is performed on each of the sub-test sheets respectively to obtain second initial test data of each of the sub-test sheets; one of N and M is a positive integer greater than or equal to 2, and the other is a positive integer; Electrically connecting at least part of the sub-test sheets according to a first setting rule to form a recombinant perovskite cell, and performing a performance test on the recombinant perovskite cell to obtain recombinant test data of the recombinant perovskite cell; When it is determined that each of the sub-test pieces includes a sub-test piece with abnormal performance and a sub-test piece with normal performance based on the second initial test data of each sub-test piece and the reconstructed test data, the film coating thickness of each sub-test piece is tested respectively to determine the film coating uniformity of the perovskite battery test piece based on the film coating thickness of each sub-test piece.

2. The method for testing a perovskite battery according to claim 1, characterized in that: Electrically connecting at least part of the sub-test sheets according to a first setting rule to form a recombinant perovskite cell sheet, and performing a performance test on the recombinant perovskite cell sheet to obtain recombinant test data of the recombinant perovskite cell sheet, including: According to the first setting rule, N×M pieces of the sub-test pieces are electrically connected to form an initial recombinant perovskite cell, and a performance test is performed on the initial recombinant perovskite cell to obtain initial recombinant test data of the initial recombinant perovskite cell; When it is determined that the sub-test piece with abnormal performance exists in each of the sub-test pieces according to the second initial data of each of the sub-test pieces in the initial recombinant perovskite cell, a verification recombinant perovskite cell is formed after removing the first sub-test piece and the second sub-test piece in the initial recombinant perovskite cell, and a performance test is performed on the verification recombinant perovskite cell to obtain verification recombination test data of the verification recombinant perovskite cell; Wherein, the test data at least includes conversion efficiency; among the sub-test pieces of the initial recombinant perovskite cell, the first sub-test piece has the largest conversion efficiency, and the second sub-test piece has the smallest conversion efficiency.

3. The method for testing a perovskite battery according to claim 2, characterized in that: Each of the sub-test sheets in the initial recombinant perovskite cell is electrically connected via a conductive substrate having a first size; The first size is S1, and the size of the sub-test piece is S0; (1 / 4)×S0≤S1≤(1 / 2)×S0.

4. The method for testing a perovskite battery according to claim 2, characterized in that: A conductive substrate having a second size is arranged at the positions of the first sub-test piece and the second sub-test piece in the verification recombinant perovskite cell; The second size is S2, and the size of the sub-test piece is S0; S0≤S2≤(3 / 2)×S0.

5. The method for testing a perovskite battery according to claim 1, characterized in that: Also includes: When it is determined that there is a sub-test piece with abnormal thickness among the sub-test pieces according to the film coating thickness of each of the sub-test pieces, adjusting the film coating thickness of the perovskite battery piece according to the second setting rule to form an adjusted perovskite battery test piece; Cutting the adjusted perovskite battery test sheet to form a plurality of adjusted sub-test sheets of equal size, M×N sheets, and performing performance tests on each of the adjusted sub-test sheets respectively to obtain third initial test data of each of the adjusted sub-test sheets; When it is determined that the adjusted sub-test piece is the normal performance sub-test piece according to the third initial test data, the film coating thickness of the adjusted sub-test piece is tested to determine the film coating uniformity of the perovskite battery test piece according to the film coating thickness of the adjusted sub-test piece.

6. The method for testing a perovskite battery according to claim 5, characterized in that: Also includes: According to the third setting rule, the M×N adjusted sub-test pieces are electrically connected to form an adjusted recombinant perovskite cell, and a performance test is performed on the adjusted recombinant perovskite cell to obtain adjusted recombination test data of the adjusted recombinant perovskite cell.

7. The method for testing a perovskite battery according to claim 6, characterized in that: Determining the film coating uniformity of the perovskite battery test piece according to the adjusted film coating thickness of the sub-test piece includes: When it is determined that the adjusted recombinant perovskite battery test piece is a battery piece with normal performance according to the adjusted recombinant test data, the maximum film coating thickness among the film coating thicknesses of each of the adjusted sub-test pieces in the adjusted recombinant perovskite battery piece is used to determine the upper limit of the film coating thickness of the perovskite battery piece, and / or, the minimum film coating thickness among the film coating thicknesses of each of the adjusted sub-test pieces in the adjusted recombinant perovskite battery piece is used to determine the lower limit of the film coating thickness of the perovskite battery piece; The uniformity of the film coating of the perovskite cell is determined according to the upper limit of the film coating thickness and / or the lower limit of the film coating thickness.

8. The method for testing a perovskite battery according to claim 1, characterized in that: Provide at least one perovskite battery test piece, including: M×N perovskite battery test pieces with different film coating thicknesses are provided; the film coating uniformity of each of the perovskite battery test pieces is within a preset uniformity range.

9. The method for testing a perovskite battery according to claim 8, characterized in that: Electrically connecting at least part of the sub-test sheets according to the first setting rule to form a recombinant perovskite cell sheet includes: M×N pieces of the sub-test pieces with different film coating thicknesses are selected, and the selected M×N pieces of the sub-test pieces are electrically connected according to the first setting rule to form a recombinant perovskite cell.

10. The method for testing a perovskite battery according to claim 1, characterized in that: The film coating thickness of each of the sub-test sheets is tested respectively to determine the film coating uniformity of the perovskite battery test sheet according to the film coating thickness of each of the sub-test sheets, including: Determine any one of the normal performance sub-test pieces as a standard sub-test piece; Determining a coating thickness value range according to a height difference between the standard sub-test piece and other normal performance sub-test pieces; The uniformity of the film coating of the perovskite battery test piece is determined according to the film coating thickness of the performance abnormality sub-test piece and the coating thickness value range.

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