Temperature rise detection device and detection method for LED lamp

Abstract

The invention discloses a temperature rise detection device and method for an LED lamp, and the device comprises a workbench, the workbench is provided with a mounting table, a to-be-detected LED lamp is disposed on the mounting table and communicates with an external power supply through the mounting table, and the detection device further comprises an infrared image obtaining module and a detection terminal. Wherein the infrared image acquisition module is used for acquiring a detection infrared temperature image set of a to-be-detected LED lamp, the detection terminal is used for acquiring a standard infrared temperature image set and the detection infrared temperature image set, and whether the temperature change of the to-be-detected LED lamp meets the requirement or not is judged according to the standard infrared temperature image set and the detection infrared temperature image set; according to the method, the temperature distribution curve is obtained in the color change area on the infrared image, so that the distribution condition of a certain narrow temperature range or a certain accurate temperature value is identified more accurately and clearly, and the accuracy of temperature rise detection of the LED lamp is improved; and secondly, curve comparison is simpler, the comparison procedure can be effectively simplified, and the detection efficiency is improved.

Description

Technical Field

[0001] The present application relates to the technical field of lamp detection equipment, and in particular to a temperature rise detection device and a detection method for LED lamps. Background Art

[0002] LED lamps have the advantages of using low-voltage power supply, strong applicability, high stability, short response time, no pollution to the environment, and multi-color light emission. During the electro-optical conversion process of LED lamp beads, part of the electrical energy will be converted into heat energy, which will increase the temperature of the LED lamp beads. The increase in temperature will affect the service life of the LED lamp. Therefore, the temperature rise test is an important test content of LED lamps; In the prior art, the temperature of an LED lamp is generally measured directly by a temperature sensor, and whether the LED lamp is qualified is determined by observing whether the temperature change meets the requirements. However, the temperature change range of an LED lamp is relatively narrow when it is in operation, and the sensitivity of the temperature detection device and other reasons result in limited detection accuracy of the detection device. Summary of the invention

[0003] The main purpose of the present application is to provide a temperature rise detection device and a detection method for an LED lamp, aiming to solve the defect of low detection accuracy existing in the prior art.

[0004] This application achieves the above objectives through the following technical solutions: A temperature rise detection device for an LED lamp, comprising a workbench; A mounting platform, the mounting platform is arranged on the workbench, the mounting platform is used to mount the LED lamp to be detected, and electrically connect the LED lamp to be detected with an external power supply; An infrared image acquisition module, wherein the infrared image acquisition module is used to acquire a detection infrared temperature image set of the LED lamp to be detected; The detection terminal is used to obtain a standard infrared temperature image set and a detection infrared temperature image set, determine whether the temperature change of the LED lamp to be detected meets the requirements based on the standard infrared temperature image set and the detection infrared temperature image set, and output the detection result.

[0005] Optionally, the infrared imaging module includes a plurality of infrared imagers, and the infrared imagers are evenly arranged around the edge of the mounting platform.

[0006] Correspondingly, the present application also discloses a detection method based on the above detection device, comprising the following steps: Setting a sampling frequency, and acquiring a standard infrared temperature image set and a detection infrared temperature image set according to the sampling frequency, wherein the standard infrared temperature image set is a plurality of infrared temperature images of a qualified LED lamp in a temperature rise test, and the detection infrared temperature image set is a plurality of infrared temperature images of an LED lamp to be detected in a temperature rise test; Pairing the standard infrared temperature image set with the detection infrared temperature image set to obtain a plurality of infrared temperature image comparison sets, wherein each infrared temperature image comparison set includes only one standard infrared temperature image and one detection infrared temperature image; Obtain any infrared temperature image comparison set, set at least one comparison temperature value for the infrared temperature image comparison set, and obtain a standard temperature distribution curve and a detection temperature distribution curve on the infrared temperature image comparison set according to the comparison temperature value; Comparing the standard temperature distribution curve with the detection temperature distribution curve to determine whether the detection temperature distribution curve is qualified; Repeat the steps of setting at least one comparison temperature value, obtaining any infrared temperature image comparison set, and obtaining a standard temperature distribution curve and a detection temperature distribution curve on the infrared temperature image comparison set according to the comparison temperature value, to determine whether the temperature change of the LED lamp to be detected meets the requirements.

[0007] Optionally, a sampling frequency is set, and a standard infrared temperature image set and a detection infrared temperature image set are acquired according to the sampling frequency, wherein the standard infrared temperature image set is a plurality of infrared temperature images of a qualified LED lamp in a temperature rise test, and the detection infrared temperature image set is a plurality of infrared temperature images of an LED lamp to be detected in a temperature rise test; Set the sampling frequency; Perform a temperature rise test on a qualified LED lamp, obtain a number of standard infrared temperature images according to the sampling frequency, and group the standard infrared temperature images into the same set to obtain a standard infrared temperature image set {A1, A2, ..., A n}, where n represents the number assigned to each standard infrared temperature image in the order of sampling; Perform a temperature rise test on the LED lamp to be detected, obtain a number of detection infrared temperature images according to the sampling frequency, and group the detection infrared temperature images into the same set to obtain a detection infrared temperature image set {B1, B2, ..., B n}, where n represents the number assigned to each detected infrared temperature image according to the sampling order.

[0008] Optionally, pairing the standard infrared temperature image set with the detection infrared temperature image set according to a sampling frequency to obtain a plurality of infrared temperature image comparison sets, wherein each infrared temperature image comparison set includes only one standard infrared temperature image and one detection infrared temperature image, comprises the following steps: Respectively acquiring the standard infrared temperature image set and the detection infrared temperature image set; The standard infrared temperature images and the detected infrared temperature images with the same number are grouped into the same set to obtain an infrared temperature image comparison set {A i , B i}, where i is the number; Repeat the above steps to obtain all infrared temperature image comparison sets {A1, B2}, ..., {A i , B i}, ..., {A n , B n}, wherein each infrared temperature image comparison set includes only one standard infrared temperature image and one detection infrared temperature image.

[0009] Optionally, obtaining any infrared temperature image comparison set, setting at least one comparison temperature value for the infrared temperature image comparison set, and obtaining a standard temperature distribution curve and a detection temperature distribution curve on the infrared temperature image comparison set according to the comparison temperature value, respectively, comprises the following steps: Get any infrared temperature image comparison set {A i , B i}; According to the infrared temperature image comparison set, the standard infrared temperature image A i Set at least one comparison temperature value T i ; Retrieve standard infrared temperature image A i , according to the comparison temperature value T i Randomly selecting a number of standard feature points on the standard infrared temperature image; Connecting the standard characteristic points in series through a smooth curve to obtain a standard temperature distribution curve; Retrieve the detected infrared temperature image B i , according to the comparison temperature value T i Randomly selecting a number of detection feature points on the detected infrared temperature image; The detection characteristic points are connected in series through a smooth curve to obtain a detection temperature distribution curve.

[0010] Optionally, comparing the standard temperature distribution curve with the detection temperature distribution curve to determine whether the detection temperature distribution curve is qualified; Establish polar coordinate system; Importing the standard temperature distribution curve and the detection temperature distribution curve into the polar coordinate system respectively; Randomly establish a number of screening lines in the polar coordinate system, take the intersection point of each screening line with the standard temperature distribution curve as the standard point, and take the intersection point of each screening line with the detection temperature distribution curve as the detection point; Obtain the standard polar coordinates (R j ,θ j ) and the detection polar coordinates of each detection point (r j ,θ j ), where j represents the number of the screening line; Whether the detected temperature distribution curve is qualified is judged according to each of the standard polar coordinates and each of the comparison polar coordinates.

[0011] Optionally, judging whether the detected temperature distribution curve is qualified according to each of the standard polar coordinates and each of the comparison polar coordinates comprises the following steps: Get the standard polar coordinates (R j ,θ j ) and each detection polar coordinate (r j ,θ j ); Pairing the standard polar coordinates and the detection polar coordinates on the same screening line; Set the deviation redundancy Q and the number of allowable deviation points P, and calculate the actual deviation q of each detection point respectively; Obtain any set of paired standard polar coordinates and detection polar coordinates, and if q≤Q, determine that the detection point is not offset; if q>Q, determine that the detection point is offset; The number p of the detection points where the deviation occurs is counted. If p≤P, the detection temperature distribution curve is determined to be qualified, otherwise it is unqualified.

[0012] Optionally, the expression for the actual deviation q is .

[0013] Optionally, repeatedly setting at least one comparison temperature value, obtaining any infrared temperature image comparison set, and obtaining a standard temperature distribution curve and a detection temperature distribution curve on the infrared temperature image comparison set according to the comparison temperature value, and judging whether the temperature change of the LED lamp to be detected meets the requirements, comprises the following steps: Set the safety factor D; Count the number of unqualified test temperature distribution curves d; If d≤D is satisfied, the temperature change of the LED lamp to be detected meets the requirements, otherwise it is determined that it does not meet the requirements.

[0014] Compared with the prior art, this application has the following beneficial effects: The present application includes a workbench, on which a mounting table is arranged, the mounting table is used to mount an LED lamp to be detected, and electrically connect the LED lamp to be detected to an external power supply; the detection device also includes an infrared image acquisition module and a detection terminal, wherein the infrared image acquisition module is used to acquire a detection infrared temperature image set of the LED lamp to be detected, and the detection terminal is used to acquire a standard infrared temperature image set and a detection infrared temperature image set, and judge whether the temperature change of the LED lamp to be detected meets the requirements according to the standard infrared temperature image set and the detection infrared temperature image set, and output the detection result; Correspondingly, the present application also discloses a detection method based on the above detection device, firstly obtaining a standard infrared temperature image set and a detection infrared temperature image set, then converting the standard infrared temperature image set and the detection infrared temperature image set into a plurality of infrared temperature image comparison sets, then obtaining a standard temperature distribution curve and a detection temperature distribution curve respectively according to the infrared temperature image comparison sets, and finally determining whether the LED lamp to be detected is qualified by comparing the deviation degree of the detection temperature distribution curve relative to the standard temperature distribution curve; On the infrared temperature image, different temperatures are represented by different colors, and there will be obvious color changes in the transition area of ​​different color bands. By capturing the above color changes, a temperature distribution curve can be accurately obtained, that is, the distribution of the edge area of ​​a certain temperature band around the LED lamp. Compared with the thermal infrared image, the present application no longer distinguishes by color, but directly determines the temperature offset of the LED lamp by the offset of the curve, so as to more accurately and clearly identify the distribution of a narrow temperature range or a precise temperature value, thereby improving the accuracy of the LED lamp temperature rise detection; Secondly, the graphical representation of the detection temperature distribution curve and the standard temperature distribution curve is simpler. By visually observing the offset between the two, it is possible to determine whether the temperature is abnormal. This is conducive to simplifying the subsequent comparison procedures, thereby simplifying the entire detection method and improving detection efficiency and accuracy.

[0015] Finally, in the technical solution of the present application, the detected infrared temperature images at different sampling time points are continuously compared with the corresponding standard infrared temperature images, that is, the present application can obtain the detection results at multiple time points, so as to have a more intuitive understanding of the temperature rise change process of the LED lamp to be detected, and at the same time, it can accurately determine the abnormal temperature rise point and abnormal temperature drop point, and can also accurately display the temperature deviation range, further improving the accuracy of the detection; At the same time, the present application compares the detected temperature distribution curve with the standard temperature distribution curve, and the standard temperature distribution curve can be obtained under normal working conditions without excessive temperature, thereby protecting the LED lamp to be detected. BRIEF DESCRIPTION OF THE DRAWINGS

[0016] Figure 1 A schematic diagram of the structure of a temperature rise detection device for an LED lamp provided in Example 1 of the present application; Figure 2 This is a flow chart of the detection method disclosed in Example 2 of the present application; Figure 3 This is the principle diagram for comparing the standard point with the test point; Figure numerals: 1-working table, 2-installing table, 3-detection terminal, 4-infrared imager.

[0017] The purpose, features and advantages of this application will be further described in conjunction with embodiments and with reference to the accompanying drawings. DETAILED DESCRIPTION

[0018] The following will be combined with the drawings in the embodiments of the present invention to clearly and completely describe the technical solutions in the embodiments of the present invention. Obviously, the described embodiments are only part of the embodiments of the present invention, not all of the embodiments. Based on the embodiments of the present invention, all other embodiments obtained by ordinary technicians in this field without creative work are within the scope of protection of the present invention.

[0019] It should be noted that all directional indications (such as up, down, left, right, front, back, etc.) in the embodiments of the present invention are only used to explain the relative position relationship, movement status, etc. between the components under a certain specific posture (as shown in the accompanying drawings). If the specific posture changes, the directional indication will also change accordingly.

[0020] In the present invention, unless otherwise clearly specified and limited, the terms "connection", "fixation", etc. should be understood in a broad sense. For example, "fixation" can be a fixed connection, a detachable connection, or an integral connection; it can be a mechanical connection or an electrical connection; it can be a direct connection or an indirect connection through an intermediate medium, it can be the internal connection of two elements or the interaction relationship between two elements, unless otherwise clearly defined. For ordinary technicians in this field, the specific meanings of the above terms in the present invention can be understood according to specific circumstances.

[0021] In addition, if there are descriptions involving "first", "second", etc. in the embodiments of the present invention, the descriptions of "first", "second", etc. are only used for descriptive purposes and cannot be understood as indicating or implying their relative importance or implicitly indicating the number of technical features indicated. Therefore, the features defined as "first" and "second" may explicitly or implicitly include at least one of the features. In addition, the meaning of "and / or" appearing in the full text includes three parallel schemes. Taking "robot coordinate system and / or m" as an example, it includes the robot coordinate system scheme, or the m scheme, or the scheme that the robot coordinate system and m satisfy at the same time. In addition, the technical solutions between the various embodiments can be combined with each other, but it must be based on the ability of ordinary technicians in this field to implement. When the combination of technical solutions is contradictory or cannot be implemented, it should be deemed that such a combination of technical solutions does not exist and is not within the scope of protection required by the present invention.

[0022] Example 1 Reference Figure 1 , this embodiment is an optional embodiment of the present application, which discloses a temperature rise detection device for LED lamps, including a workbench 1; A mounting platform 2 is arranged on the workbench 1. A plurality of lamp holders are arranged in parallel in the mounting platform 2. The models of the lamp holders can be the same or different. The lamp holders are respectively adapted to the LEDs to be detected.

[0023] It should be noted that a certain distance must be maintained between the lamp holders on the mounting platform 2 to avoid interference when multiple LED lamps are tested at the same time; the above distance is determined according to the heat generated by the LED lamps; The detection device further comprises an infrared image acquisition module and a detection terminal 3, wherein the infrared image acquisition module comprises a plurality of infrared imagers 4, each of the infrared imagers 4 is connected to a support frame; It should be noted that the number of the infrared imagers 4 is 2-3; When in use, the infrared imagers 4 are evenly arranged around the edge of the mounting platform 2, and after acquiring the corresponding infrared images, a complete infrared temperature image is acquired by splicing; Meanwhile, one infrared imager 4 may be provided. When one infrared imager 4 is provided, the infrared imager 4 is provided just above the mounting platform 2 , and the camera is facing the mounting platform 2 .

[0024] The detection terminal 3 is a computer, and the detection terminal 3 is respectively connected to each infrared imager 4 for communication to obtain a detection infrared temperature image set. At the same time, the detection terminal 3 is also connected to a database, in which standard infrared temperature image sets of different models of LED lamps are stored; the detection terminal 3 determines whether the temperature change of the LED lamp to be detected meets the requirements based on the standard infrared temperature image set and the detection infrared temperature image set, and outputs the detection result.

[0025] Example 2 Reference Figure 2 and Figure 3 This embodiment discloses a detection method for the temperature rise detection device for LED lamps based on the embodiment 1, comprising the following steps: S1. Set a sampling frequency, and acquire a standard infrared temperature image set and a detection infrared temperature image set according to the sampling frequency, wherein the standard infrared temperature image set is a plurality of infrared temperature images of a qualified LED lamp in a temperature rise test, and the detection infrared temperature image set is a plurality of infrared temperature images of a LED lamp to be detected in a temperature rise test; S11, set the sampling frequency; It should be noted that the sampling frequency needs to be determined according to the total duration of the temperature rise test, the parameters of the infrared imager and the detection accuracy; the number of infrared temperature images included in the standard infrared temperature image set and the detection infrared temperature image set can be controlled by setting the sampling frequency, thereby realizing the control of the detection accuracy and meeting different detection requirements; S12, perform a temperature rise test on the qualified LED lamp, obtain a number of standard infrared temperature images according to the sampling frequency, and group the standard infrared temperature images into the same set to obtain a standard infrared temperature image set {A1, A2, ..., A n}, where n represents the number assigned to each standard infrared temperature image in the order of sampling; It should be pointed out that the standard infrared temperature image set can be obtained by temporarily testing a qualified LED lamp, or the corresponding infrared temperature image set can be retrieved from the database as the standard infrared temperature image set; however, it should be pointed out that no matter which method is used, except for the different LED lamps, other conditions must remain the same, such as test current, voltage, sampling frequency, etc., and the model of the LED lamp must also be the same to ensure that the single variable test principle is met; Secondly, n represents the number assigned to each standard infrared temperature image according to the sampling order, that is, if an infrared temperature image is acquired every 1 second according to the sampling frequency, the sampling time of the image numbered 1 is the power-on moment, the sampling time of the image numbered 2 is 1 second after power-on, and the sampling time of the remaining photos is similar.

[0026] S13, perform a temperature rise test on the LED lamp to be detected, obtain a number of detected infrared temperature images according to the sampling frequency, and group the detected infrared temperature images into the same set to obtain a detected infrared temperature image set {B1, B2, . . . , B n}, where n represents the number assigned to each detected infrared temperature image according to the sampling order; The LED lamp to be tested is installed on the lamp holder of the mounting table, and then the equipment is started to perform a temperature test. Under the same sampling frequency, voltage, current and other experimental parameters as step S12, a detection infrared temperature image set {B1, B2, ..., B n}; It should be noted that step S12 and step S13 are numbered using the same numbering method.

[0027] S2, pairing the standard infrared temperature image set with the detection infrared temperature image set to obtain a plurality of infrared temperature image comparison sets, wherein each infrared temperature image comparison set includes only one standard infrared temperature image and one detection infrared temperature image; S21, respectively acquiring the standard infrared temperature image set and the detection infrared temperature image set; S22, grouping the standard infrared temperature image and the detected infrared temperature image with the same number into the same set, and obtaining an infrared temperature image comparison set {A i , B i}, where i is the number; A standard infrared temperature image is randomly selected from the standard infrared temperature image set, and then its number is retrieved, and the detection infrared temperature image with the same number is retrieved from the detection infrared temperature image set according to the principle of the same number; Then, the standard infrared temperature images and the detected infrared temperature images with the same number are grouped into the same set to obtain an infrared temperature image comparison set {A i , B i}; Based on the relevant statements in step S1, it can be known that when the standard infrared temperature image set and the detection infrared temperature image set have the same number, the standard infrared temperature image and the detection infrared temperature image have the same time detection as the starting point of the detection, and based on common knowledge, it can be known that during the heating process of the LED lamp, its temperature is different at different times. Therefore, the above measures can ensure that the corresponding standard infrared temperature image and the detection infrared temperature image are in the same temperature change stage, thereby avoiding detection errors caused by mismatching and improving the reliability and stability of detection; S23, repeat the above steps to obtain all infrared temperature image comparison sets {A1, B2}, ..., {A i , Bi}, ..., {A n , B n}, wherein each infrared temperature image comparison set includes only one standard infrared temperature image and one detection infrared temperature image.

[0028] Repeating the above step S22 can achieve one-to-one pairing of the standard infrared temperature image set and the detected infrared temperature image set, and all infrared temperature image comparison sets {A1, B2}, ..., {A i , B i}, ..., {A n , B n}, wherein each infrared temperature image comparison set includes only one standard infrared temperature image and one detection infrared temperature image; S3, obtaining any infrared temperature image comparison set, setting at least one comparison temperature value for the infrared temperature image comparison set, and obtaining a standard temperature distribution curve and a detection temperature distribution curve on the infrared temperature image comparison set according to the comparison temperature value; S31, obtain any infrared temperature image comparison set {A i , B i}; The plurality of infrared temperature image comparison sets {A1, B2}, ..., {A i , B i}, ..., {A n , B n}Call any one, such as infrared temperature image comparison set {A i , B i}; S32, comparing the infrared temperature image with the standard infrared temperature image A in the set i Set at least one comparison temperature value T i ; Retrieve the standard infrared temperature image A in the infrared temperature image comparison set i The computer automatically identifies the temperature value in each area, and then sets the required comparison temperature value T manually or automatically according to the identified temperature. i ; It should be noted that the comparison temperature value T i The temperature value of the transition zone of the color bands with different colors is preferably i Multiple values ​​can be set to improve the accuracy of the comparison.

[0029] S33, retrieve standard infrared temperature image A i , according to the comparison temperature value T i Randomly selecting a number of standard feature points on the standard infrared temperature image; Retrieve standard infrared temperature image A i The computer compares the temperature value T i Automatically and randomly selecting a number of standard feature points on the standard infrared temperature image; it should be noted that, under the premise of ensuring detection efficiency, the number of standard feature points should be increased as much as possible, preferably, the number of standard feature points is not less than 5000; S34, connecting the standard characteristic points in series through a smooth curve to obtain a standard temperature distribution curve; All standard characteristic points are connected in series through a smooth curve, and the connected curve is the standard temperature distribution curve; S35, retrieve the detected infrared temperature image B i , according to the comparison temperature value T i Randomly selecting a number of detection feature points on the detected infrared temperature image; Retrieve the detected infrared temperature image B i , according to the comparison temperature value T in step S32 i A number of detection feature points are randomly selected on the detected infrared temperature image; it should be noted that the number of the detection feature points is the same as the number of the standard feature points; S36, connecting the detection feature points in series through a smooth curve to obtain a detection temperature distribution curve.

[0030] S4, comparing the standard temperature distribution curve with the detection temperature distribution curve, and judging whether the detection temperature distribution curve is qualified; S41, establishing a polar coordinate system; First, construct a polar coordinate system; S42, importing the standard temperature distribution curve and the detection temperature distribution curve into the polar coordinate system respectively; It should be noted that in the process of generating the standard temperature distribution curve and the detection temperature distribution curve, it is necessary to set a reference point based on the same structure, such as setting a special mark on the mounting table as a reference point; Preferably, the center of the LED lamp at the center point is selected as the reference point; When importing the standard temperature distribution curve and the detection temperature distribution curve, the reference point is overlapped with the origin of the polar coordinate system to ensure the accuracy of the comparison; S43, randomly establishing a number of screening lines in the polar coordinate system, taking the intersection point of each screening line with the standard temperature distribution curve as the standard point, and taking the intersection point of each screening line with the detection temperature distribution curve as the detection point; A number of screening lines are randomly established in the polar coordinate system, with the origin of the polar coordinates as the center, and the screening lines are arranged radially, and the intersection points of the screening lines and the standard temperature distribution curve are taken as standard points, and the intersection points of the screening lines and the detection temperature distribution curve are taken as detection points; It should be noted that the number of screening lines is determined according to actual needs, but the number of screening lines cannot be less than 20; Secondly, the angles between two adjacent screening lines can be equal or unequal, that is, the arrangement density of the screening lines can be controlled by adjusting the angles; The distribution of the screening lines needs to be determined according to the shapes of the standard temperature distribution curve and the detection temperature distribution curve, that is, in the area with large curvature changes, as many screening lines as possible should be arranged, and in the area with small curvature changes, the arrangement of screening lines should be reduced, and manual adjustment should be made according to the actual situation; For circular or oval structures, you can choose to evenly arrange the screening lines.

[0031] S44, respectively obtain the standard polar coordinates (R j ,θ j ) and the detection polar coordinates of each detection point (r j ,θ j ), where j represents the number of the screening line; After the screening line is arranged, it must be consistent with the standard temperature distribution curve and the detection temperature distribution curve, and the standard polar coordinates (R j ,θ j ) and the detection polar coordinates of each detection point (r j ,θ j ), where j represents the number of the screening line; If there are 20 screening lines, the parameters of the standard polar coordinates are (R1, θ1), (R2, θ2), ..., (R 20 ,θ 20 ); S45, judging whether the detected temperature distribution curve is qualified according to each of the standard polar coordinates and each of the comparison polar coordinates.

[0032] S451, respectively obtain each standard polar coordinate (R j ,θ j ) and each detection polar coordinate (r j ,θ j ); S452, pairing the standard polar coordinates and the detection polar coordinates on the same screening line; According to the above description, the coordinates with the same number are located on the same screening line, and the standard polar coordinates and the detection polar coordinates on the same screening line are paired according to the principle of the same number; S453, setting the deviation redundancy Q and the number of allowable deviation points P, and calculating the actual deviation q of each detection point respectively; The deviation redundancy Q is set according to actual needs. For example, if the deviation redundancy Q is 5%, that is, with the standard temperature distribution curve as the center, 5% in each radial direction can be considered qualified. The above setting can effectively avoid calculation errors caused by equipment measurement errors, which is conducive to improving detection accuracy. At the same time, the standard temperature distribution curve comes from a qualified LED lamp, and its accuracy is relative. By setting the above deviation redundancy, the standard temperature distribution curve can be converted into a change trend, thereby weakening the relativity of the standard temperature distribution curve and improving the accuracy of detection.

[0033] The number of allowable deviation points P is determined according to needs, but the allowable deviation points P is not greater than 3. The allowable deviation points can further reduce the judgment errors caused by the measurement error and improve the measurement accuracy. Furthermore, we can also j -r j | is limited. When it is greater than a certain set value, the detection point cannot be calculated within the allowable deviation point range; thereby eliminating the possibility of misjudgment due to a small amount of large deviation and improving the accuracy of judgment.

[0034] The expression of the actual deviation q is: , calculate the actual deviation of each detection point according to the above formula; S454, obtaining any set of the standard polar coordinates and the detection polar coordinates that are paired with each other, and if q≤Q, determining that the detection point is not offset; if q>Q, determining that the detection point is offset; Obtain any actual deviation q, if q≤Q, then determine that the detection point does not deviate; if q>Q, then determine that the detection point deviates; S455. Count the number p of detection points where deviation occurs. If p≤P, the detection temperature distribution curve is determined to be qualified, otherwise it is unqualified.

[0035] Repeat step S454 to judge all the detection points, count the number p of the detection points that are offset, if p≤P, then the detection temperature distribution curve is judged to be qualified, otherwise it is unqualified; S5. Repeat setting at least one comparison temperature value, obtaining any infrared temperature image comparison set, and obtaining a standard temperature distribution curve and a detection temperature distribution curve on the infrared temperature image comparison set according to the comparison temperature value, to determine whether the temperature change of the LED lamp to be detected meets the requirements.

[0036] S5. Set the safety factor D; The safety factor is determined according to actual needs; S5, counting the number d of unqualified test temperature distribution curves; Repeat step S4 to judge all the detected temperature distribution curves, and count the number d of unqualified detected temperature distribution curves; S5. If d≤D is satisfied, the temperature change of the LED lamp to be detected meets the requirement, otherwise it is determined that it does not meet the requirement.

[0037] The LED lamp will generate heat during operation, and the heat will diffuse along the spherical surface with the LED lamp as the center, and the temperature will gradually decrease during the diffusion process; In an infrared temperature image, different temperatures appear as different colors, so the infrared image of an LED lamp includes several concentric rings with different colors; in the transition area of ​​different color bands, there will be obvious color changes. By capturing the above color changes, a temperature distribution curve can be accurately obtained, that is, the distribution of the edge area of ​​a certain temperature band around the LED lamp. Compared with thermal infrared images, this application no longer distinguishes by color, but directly determines the temperature offset of the LED lamp by the offset of the curve, so as to more accurately and clearly identify the distribution of a narrow temperature range or a precise temperature value, thereby improving the accuracy of LED lamp temperature rise detection; Secondly, the graphical representation of the detection temperature distribution curve and the standard temperature distribution curve is simpler. By visually observing the offset between the two, it is possible to determine whether the temperature is abnormal. This is conducive to simplifying the subsequent comparison procedures, thereby simplifying the entire detection method and improving detection efficiency and accuracy.

[0038] Finally, in the technical solution of the present application, the detected infrared temperature images at different sampling time points are continuously compared with the corresponding standard infrared temperature images, that is, the present application can obtain the detection results at multiple time points, so as to have a more intuitive understanding of the temperature rise change process of the LED lamp to be detected, and at the same time, it can accurately determine the abnormal temperature rise point and abnormal temperature drop point, and can also accurately display the temperature deviation range, further improving the accuracy of the detection; At the same time, the present application compares the detected temperature distribution curve with the standard temperature distribution curve, and the standard temperature distribution curve can be obtained under normal working conditions without excessive temperature, thereby protecting the LED lamp to be detected.

[0039] The above are only preferred embodiments of the present application, and are not intended to limit the patent scope of the present application. Any equivalent structure or equivalent process transformation made using the contents of the present application specification and drawings, or directly or indirectly applied in other related technical fields, are also included in the patent protection scope of the present application.

Claims

1. A temperature rise detection device for LED lamps, characterized in that: comprising a workbench (1); A mounting platform (2), the mounting platform (2) being arranged on the workbench (1), the mounting platform (2) being used to mount the LED lamp to be detected and to electrically connect the LED lamp to be detected with an external power supply; An infrared image acquisition module, wherein the infrared image acquisition module is used to acquire a detection infrared temperature image set of the LED lamp to be detected; A detection terminal (3) is used to obtain a standard infrared temperature image set and a detection infrared temperature image set, determine whether the temperature change of the LED lamp to be detected meets the requirements based on the standard infrared temperature image set and the detection infrared temperature image set, and output the detection result.

2. A temperature rise detection device for LED lamp according to claim 1, characterized in that: The infrared image module comprises a plurality of infrared imagers (4), and the infrared imagers (4) are evenly arranged around the axis of the LED lamp to be detected.

3. A detection method for a temperature rise detection device for an LED lamp according to any one of claims 1 to 2, comprising the following steps: Setting a sampling frequency, and acquiring a standard infrared temperature image set and a detection infrared temperature image set according to the sampling frequency, wherein the standard infrared temperature image set is a plurality of infrared temperature images of a qualified LED lamp in a temperature rise test, and the detection infrared temperature image set is a plurality of infrared temperature images of an LED lamp to be detected in a temperature rise test; Pairing the standard infrared temperature image set with the detection infrared temperature image set to obtain a plurality of infrared temperature image comparison sets, wherein each infrared temperature image comparison set includes only one standard infrared temperature image and one detection infrared temperature image; Obtain any infrared temperature image comparison set, set at least one comparison temperature value for the infrared temperature image comparison set, and obtain a standard temperature distribution curve and a detection temperature distribution curve on the infrared temperature image comparison set according to the comparison temperature value; Comparing the standard temperature distribution curve with the detection temperature distribution curve to determine whether the detection temperature distribution curve is qualified; Repeat the steps of setting at least one comparison temperature value, obtaining any infrared temperature image comparison set, and obtaining a standard temperature distribution curve and a detection temperature distribution curve on the infrared temperature image comparison set according to the comparison temperature value, to determine whether the temperature change of the LED lamp to be detected meets the requirements.

4. The detection method according to claim 3, characterized in that: The set sampling frequency is used to obtain a standard infrared temperature image set and a detection infrared temperature image set according to the sampling frequency, wherein the standard infrared temperature image set is a plurality of infrared temperature images of a qualified LED lamp in a temperature rise test, and the detection infrared temperature image set is a plurality of infrared temperature images of a LED lamp to be detected in a temperature rise test; Set the sampling frequency; Perform a temperature rise test on a qualified LED lamp, obtain a number of standard infrared temperature images according to the sampling frequency, and group the standard infrared temperature images into the same set to obtain a standard infrared temperature image set {A1, A2, ..., A n }, where n represents the number assigned to each standard infrared temperature image in the order of sampling; Perform a temperature rise test on the LED lamp to be detected, obtain a number of detection infrared temperature images according to the sampling frequency, and group the detection infrared temperature images into the same set to obtain a detection infrared temperature image set {B1, B2, ..., B n }, where n represents the number assigned to each detected infrared temperature image according to the sampling order.

5. The detection method according to claim 3, characterized in that: The step of pairing the standard infrared temperature image set with the detected infrared temperature image set to obtain a plurality of infrared temperature image comparison sets, wherein each infrared temperature image comparison set includes only one standard infrared temperature image and one detected infrared temperature image, comprises the following steps: Respectively acquiring the standard infrared temperature image set and the detection infrared temperature image set; The standard infrared temperature images and the detected infrared temperature images with the same number are grouped into the same set to obtain an infrared temperature image comparison set {A i , B i }, where i is the number; Repeat the above steps to obtain all infrared temperature image comparison sets {A1, B2}, ..., {A i , B i }, ..., {A n , B n }, wherein each infrared temperature image comparison set includes only one standard infrared temperature image and one detection infrared temperature image.

6. The detection method according to claim 3, characterized in that: The method of obtaining any infrared temperature image comparison set, setting at least one comparison temperature value for the infrared temperature image comparison set, and obtaining a standard temperature distribution curve and a detection temperature distribution curve on the infrared temperature image comparison set according to the comparison temperature value, comprises the following steps: Get any infrared temperature image comparison set {A i , B i }; According to the infrared temperature image comparison set, the standard infrared temperature image A i Set at least one comparison temperature value T i ; Retrieve standard infrared temperature image A i , according to the comparison temperature value T i Randomly selecting a number of standard feature points on the standard infrared temperature image; Connecting the standard characteristic points in series through a smooth curve to obtain a standard temperature distribution curve; Retrieve the detected infrared temperature image B i , according to the comparison temperature value T i Randomly selecting a number of detection feature points on the detected infrared temperature image; The detection characteristic points are connected in series through a smooth curve to obtain a detection temperature distribution curve.

7. The detection method according to claim 6, characterized in that: The standard temperature distribution curve is compared with the detection temperature distribution curve to determine whether the detection temperature distribution curve is qualified; Establish polar coordinate system; Importing the standard temperature distribution curve and the detection temperature distribution curve into the polar coordinate system respectively; Randomly establish a number of screening lines in the polar coordinate system, take the intersection point of each screening line with the standard temperature distribution curve as the standard point, and take the intersection point of each screening line with the detection temperature distribution curve as the detection point; Obtain the standard polar coordinates (R j ,θ j ) and the detection polar coordinates of each detection point (r j ,θ j ), where j represents the number of the screening line; Whether the detected temperature distribution curve is qualified is judged according to each of the standard polar coordinates and each of the comparison polar coordinates.

8. The detection method according to claim 7, characterized in that: The method of judging whether the detected temperature distribution curve is qualified according to each of the standard polar coordinates and each of the comparison polar coordinates comprises the following steps: Get the standard polar coordinates (R j ,θ j ) and each detection polar coordinate (r j ,θ j ); Pairing the standard polar coordinates and the detection polar coordinates on the same screening line; Set the deviation redundancy Q and the number of allowable deviation points P, and calculate the actual deviation q of each detection point respectively; Obtain any set of paired standard polar coordinates and detection polar coordinates, and if q≤Q, determine that the detection point is not offset; if q>Q, determine that the detection point is offset; The number p of the detection points where the deviation occurs is counted. If p≤P, the detection temperature distribution curve is determined to be qualified, otherwise it is unqualified.

9. The detection method according to claim 8, characterized in that: The expression of the actual deviation q is: 。 10. The detection method according to claim 3, characterized in that: The step of repeatedly setting at least one comparison temperature value, obtaining any infrared temperature image comparison set, and obtaining a standard temperature distribution curve and a detection temperature distribution curve on the infrared temperature image comparison set according to the comparison temperature value, and judging whether the temperature change of the LED lamp to be detected meets the requirements includes the following steps: Set the safety factor D; Count the number of unqualified test temperature distribution curves d; If d≤D is satisfied, the temperature change of the LED lamp to be detected meets the requirements, otherwise it is determined that it does not meet the requirements.

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