Method for determining scattering parameters of transmission lines in circuit test board and circuit board

Abstract

The invention discloses a method for determining scattering parameters of transmission lines in a circuit test board and a circuit board, and relates to the field of circuit boards. At least one group of replica lines and one group of standard lines are arranged in the circuit test board; each replica line comprises an extension line and a replica transmission line which are connected through a connection point, the replica transmission line is consistent with a transmission line to be tested in the circuit board, and each end of each replica line is connected with a connector; the layout of the standard lines is consistent with the layout of extension lines in the replica lines, each standard line is composed of two reference lines, the reference lines and the extension lines in the replica lines have the same parameters, and each end of each standard line is connected with a connector; the connector is used for being connected with test equipment.

Description

Technical Field

[0001] The present application relates to the field of circuit boards, and in particular to a method for determining scattering parameters of transmission lines in a circuit test board and a circuit board. Background Art

[0002] In the high-speed signal consistency test of the circuit board, TX (transmission text, transmission test) needs to obtain the waveform at the pad (connection point) position in the circuit board to evaluate its quality. And RX (Receive text, receiving test) needs to ensure that the waveform at the pad meets the corresponding standards and constraints to accurately evaluate the performance of RX.

[0003] However, in actual testing, the Pad needs to be extended to the coaxial connector through a board-level transmission line (Breakout Trace) before it can be connected to the oscilloscope for testing.

[0004] Because of the existence of this transmission line, during the consistency test of the circuit's high-speed signal, the waveform measured is the waveform at the coaxial interface. There is a difference between the two, especially when the signal rate is high, which will affect the determination of the test results. Therefore, in order to ensure the accuracy of the test results, it is necessary to obtain the scattering parameters (S parameters) of the transmission line and de-embed its influence to obtain the waveform at the Pad.

[0005] When designing a high-speed signal test board, the transmission line is usually copied to obtain a replica transmission line (ReplicaTrace). By testing the replica transmission line, the S parameters of the board-level transmission line are obtained, and de-embedded during the consistency test to eliminate the impact it brings.

[0006] Figure 1 Schematic diagram of an existing circuit board and a circuit test board. In the circuit board, a board-level transmission line 103 (Breakout Trace) between Pad 101 and a coaxial connector 102 has one end of a coaxial structure and the other end of a non-coaxial structure. Figure 1 In the circuit test board, a replica line 104 is set for the transmission line 103 .

[0007] Since the HSIO (High-Speed ​​Input / Output) interface in the circuit board mostly uses differential signals, therefore, during the test process, the DFT (Design For Test) needs to be considered in the design of the replica line. The transmission line needs to be copied intact first, and the non-coaxial end of the copied replica transmission line needs to be extended to a through-axis structure to obtain the replica line. The S parameters of the replica line are obtained through vector network testing, and the S parameters of the replica line are used as the S parameters of the transmission line. Figure 1 The structure of the replica line is shown in FIG. , which includes a replica transmission line 1041 and an extended transmission line 1042 .

[0008] HSIO is a differential output and input. Due to the large physical size of the coaxial connector, the extended transmission line design cannot maintain a differential structure near the connector, introducing impedance discontinuities, and the extended transmission line introduces additional losses. As the signal rate of the HSIO interface continues to increase, it is necessary to obtain accurate S parameters of the transmission line. The loss and impedance discontinuity caused by the additional extension of the replica line compared to the transmission line cannot be simply ignored. The existing test method cannot accurately obtain the S parameters of the transmission line in the circuit board. Summary of the invention

[0009] A first aspect of the present application provides a circuit testing board, wherein at least one group of replica lines and one group of standard lines are provided in the circuit testing board;

[0010] Each replica line includes: an extension line and a replica transmission line connected by a connection point, the replica transmission line is consistent with the transmission line to be tested in the circuit board, and each end of each replica line is connected to a connector;

[0011] The layout of the standard line is consistent with the layout of the extension line in the replica line, and each standard line is composed of two reference lines, the reference line and the extension line in the replica line have the same parameters, and each end of each standard line is connected to a connector;

[0012] The connector is used for connecting with a testing device.

[0013] In a possible implementation, the number of standard lines in each group of standard lines and the number of replica lines in each group of replica lines are respectively consistent with the number of transmission lines to be tested in the circuit board.

[0014] In a possible implementation, the length of the standard line is determined based on a specific multiple value of a wavelength corresponding to the highest frequency of a signal used for testing by the circuit testing board.

[0015] In a possible implementation, each group of standard lines includes two standard lines, and the two standard lines are arranged in mirror symmetry; each group of replica lines includes two replica lines, and the two replica lines are arranged in mirror symmetry.

[0016] In a possible implementation, the circuit testing board includes at least two groups of replica lines;

[0017] The replica transmission lines in any two sets of replica lines are different;

[0018] The replica transmission lines are different, which includes at least one of the following: the signal transmission paths are at least partially different, and the devices arranged on the signal transmission paths are at least partially different.

[0019] A second aspect of the present application provides a method for determining a scattering parameter of a transmission line in a circuit board, comprising:

[0020] Controlling the test signal to pass through a replica line in the circuit test board to obtain scattering parameters of the replica line, wherein the replica line includes an extension line and a replica transmission line connected through a connection point, the replica transmission line is consistent with the transmission line to be tested in the circuit board, and each end of each replica line is connected to a connector;

[0021] Controlling the test signal to pass through a standard line in a circuit test board to obtain scattering parameters of the standard line, wherein the layout of the standard line in the circuit test board is consistent with the layout of the extension line in the replica line, and each standard line is composed of two reference lines, the reference line and the extension line in the replica line have the same parameters, and each end of each standard line is connected to a connector;

[0022] Based on the scattering parameters of the replica line and the scattering parameters of the standard line, the scattering parameters of the transmission line to be tested are determined.

[0023] In a possible implementation, determining the scattering parameters of the transmission line to be tested based on the scattering parameters of the replica line and the scattering parameters of the standard line includes:

[0024] Based on the scattering parameters of the standard line, determining the scattering parameters of the extended line in the replica line;

[0025] Based on the scattering parameters of the extended line in the replica line and the scattering parameters of the replica line, the scattering parameters of the replica transmission line are determined, and the scattering parameters of the replica transmission line are used as the scattering parameters of the transmission line to be tested.

[0026] In a possible implementation, determining the scattering parameters of the replica transmission line based on the scattering parameters of the extended line in the replica line and the scattering parameters of the replica line includes:

[0027] Converting the scattering parameters of the extended line in the replica line and the scattering parameters of the replica line into transmission parameters respectively;

[0028] Determining transmission parameters of a replica transmission line in the replica line based on transmission parameters of the extended line in the replica line and transmission parameters of the replica line;

[0029] Based on the transmission parameters of the replica transmission line in the replica line, the scattering parameters of the transmission line to be tested are obtained by conversion.

[0030] In a possible implementation, determining the scattering parameter of the extended line in the replica line based on the scattering parameter of the standard line includes:

[0031] interpolating the scattering parameters of the standard line based on the set frequency to obtain an interpolation result;

[0032] Determining a DC point based on the interpolation result;

[0033] According to the DC point, a specific time domain threshold, and a signal flow determined by the DC point, a target scattering parameter of half the length of the standard line is determined, and the target scattering parameter is used as a scattering parameter of an extended line in the replica line.

[0034] A third aspect of the present application provides a device for determining scattering parameters of a transmission line in a circuit board, comprising:

[0035] A first control module is used to control the test signal to pass through a replica line in the circuit test board to obtain a scattering parameter of the replica line, wherein the replica line includes an extension line and a replica transmission line connected by a connection point, the replica transmission line is consistent with the transmission line to be tested in the circuit board, and each end of each replica line is connected to a connector;

[0036] A second control module is used to control the test signal to pass through the standard line in the circuit test board to obtain the scattering parameters of the standard line, wherein the layout of the standard line in the circuit test board is consistent with the layout of the extension line in the replica line, and each standard line is composed of two reference lines, the reference line and the extension line in the replica line have the same parameters, and each end of each standard line is connected to a connector;

[0037] The determination module is used to determine the scattering parameters of the transmission line to be tested based on the scattering parameters of the replica line and the scattering parameters of the standard line.

[0038] A fourth aspect of the present application provides a computer program product, comprising computer-readable instructions. When the computer-readable instructions are executed on an electronic device, the electronic device implements the method for determining the scattering parameters of a transmission line in a circuit board according to the first aspect or any implementation of the first aspect.

[0039] A fifth aspect of the present application provides an electronic device, comprising at least one processor and a memory connected to the processor, wherein:

[0040] The memory is used to store computer programs;

[0041] The processor is used to execute the computer program so that the electronic device can implement the method for determining the scattering parameters of the transmission line in the circuit board according to the first aspect or any implementation manner of the first aspect.

[0042] In a sixth aspect, the present application provides a computer storage medium, which carries one or more computer programs. When the one or more computer programs are executed by an electronic device, the electronic device can implement the method for determining the scattering parameters of the transmission lines in the circuit board of the above-mentioned first aspect or any implementation of the first aspect. BRIEF DESCRIPTION OF THE DRAWINGS

[0043] The above and other features, advantages and aspects of the embodiments of the present disclosure will become more apparent with reference to the following detailed description in conjunction with the accompanying drawings. Throughout the accompanying drawings, the same or similar reference numerals represent the same or similar elements. It should be understood that the drawings are schematic and the originals and elements are not necessarily drawn to scale.

[0044] Figure 1 It is the schematic diagram of the existing circuit board and the test board;

[0045] Figure 2 is a structural schematic diagram of a circuit testing board provided in an embodiment of the present application;

[0046] Figure 3 is another structural schematic diagram of a circuit testing board provided in an embodiment of the present application;

[0047] Figure 4 It is another structural schematic diagram of a circuit testing board provided in an embodiment of the present application;

[0048] Figure 5 It is a flow chart of a method for determining scattering parameters of a transmission line in a circuit board provided in an embodiment of the present application;

[0049] Figure 6 is a schematic diagram of a flow chart of determining the scattering parameters of the transmission line to be tested based on the scattering parameters of the replica line and the scattering parameters of the standard line provided by an embodiment of the present application;

[0050] Figure 7 is a schematic diagram of a process for determining the scattering parameters of the replica transmission line based on the scattering parameters of the extended line in the replica line and the scattering parameters of the replica line provided by an embodiment of the present application;

[0051] Figure 8 is a schematic diagram of a process for determining the scattering parameters of the extended line in the replica line based on the scattering parameters of the standard line provided in an embodiment of the present application;

[0052] Fig. 9 It is a signal flow diagram provided by an embodiment of the present application;

[0053] Fig.10 It is a schematic diagram of an application scenario of a method for determining scattering parameters of a transmission line in a circuit board provided in an embodiment of the present application;

[0054] Fig.11 It is a schematic diagram of the interface in the application scenario provided by the embodiment of the present application;

[0055] Fig.12 It is a structural schematic diagram of a device for determining scattering parameters of a transmission line in a circuit board provided in an embodiment of the present application;

[0056] Fig.13 It is a schematic diagram of the structure of an electronic device provided in an embodiment of the present application. DETAILED DESCRIPTION

[0057] The following describes the embodiments of the present application in conjunction with the drawings in the embodiments of the present application. The terms used in the implementation method section of the present application are only used to explain the specific embodiments of the present application, and are not intended to limit the present application.

[0058] The embodiments of the present application are described below in conjunction with the accompanying drawings. Those skilled in the art will appreciate that, with the development of technology and the emergence of new scenarios, the technical solutions provided in the embodiments of the present application are also applicable to similar technical problems.

[0059] The terms "first", "second", etc. in the specification and claims of the present application and the above-mentioned drawings are used to distinguish similar objects, and need not be used to describe a specific order or sequential order. It should be understood that the terms used in this way can be interchangeable under appropriate circumstances, which is only to describe the distinction mode adopted by the objects of the same attributes when describing in the embodiments of the present application. In addition, the terms "including" and "having" and any of their variations are intended to cover non-exclusive inclusions, so that the process, method, system, product or equipment comprising a series of units need not be limited to those units, but may include other units that are not clearly listed or inherent to these processes, methods, products or equipment.

[0060] Figure 2 1 is a schematic diagram of a circuit test board provided in an embodiment of the present application, wherein at least one set of replica lines 201 and one set of standard lines 202 are provided in the circuit test board;

[0061] The circuit testing board also includes a plurality of connectors 203 .

[0062] Each replica line 201 includes: an extension line 2012 and a replica transmission line 2013 connected by a connection point 2011, the replica transmission line is consistent with the transmission line to be tested in the circuit board, and each end of each replica line is connected to a connector 203;

[0063] The layout of the standard line 202 is consistent with the layout of the extension line 2012 in the replica line, and each standard line 202 is composed of two reference lines 2021, the reference lines 2021 and the extension line 2012 in the replica line have the same parameters, and each end of each standard line is connected to a connector 203;

[0064] The connector 203 is used to connect to a testing device.

[0065] The test equipment is used to detect the S parameters (Scattering Parameters) of the line to which it is connected.

[0066] Among them, the Figure 2 The following example uses one dungeon line and one standard line as an example. For the specific structure of a group of dungeon lines and a group of standard lines, please refer to the following Figure 3-4 Explanation in .

[0067] In one possible implementation, a connector is provided for one end of the replica transmission line. In order to facilitate the test equipment to obtain the S parameters of the replica transmission line, the non-coaxial section in the replica transmission line is extended to a coaxial structure. The extended portion is named as an extension line in this embodiment, and coaxial connectors are provided at both ends of the replica line consisting of the replica transmission line and the extension line. The test equipment tests the scattering parameters of the replica line through the coaxial connector, and then determines the scattering parameters of the extension line in the replica line in combination with the standard line. The scattering parameters of the replica transmission line can be determined based on the scattering parameters of the extension line in the replica line and the scattering parameters of the replica line.

[0068] Each group of replica lines may include one or more replica lines, and accordingly, the number of standard lines included in each group of standard lines is the same as the number of replica lines included in the replica line.

[0069] The replica trace is a copy of the test trace in the circuit board (Breakout trace), and the two are exactly the same.

[0070] In a possible implementation, the replica transmission line and the transmission line to be tested in the circuit board have completely the same geometric parameters, material parameters, etc.

[0071] The transmission line to be tested in the circuit board is connected to other lines via a connection point (pad). Accordingly, in the circuit test board, a connection point 2011 is set in the replica line 201, and the connection point connects the extension line 2012 and the replica transmission line 2013 to achieve an approximately complete replication of the transmission line to be tested.

[0072] Since the replica transmission line is exactly the same as the transmission line to be tested in the circuit board, the scattering parameters obtained by the detection of the replica transmission line are also the scattering parameters of the transmission line to be tested in the circuit board.

[0073] The scattering parameters (S parameters) may include S11, S21, S12 and S22, wherein S11 represents S_reflection, S21 represents S_transmission, S12 represents reverse transmission, and S22 represents reverse reflection.

[0074] The standard line is composed of two symmetrical reference lines. The reference line has the same parameters as the extended line in the copy line. The reference line is a copy of the extended line in the copy line, and the two reference lines form a standard line.

[0075] The circuit test board is also provided with a connector 203 , and each end of each replica line 201 and each end of the standard line 202 is connected to a connector 203 .

[0076] Among them, the test equipment is connected to the replica line 201 and the standard line 202 through the connector 203 to realize the testing of the scattering parameters of the replica line and the standard line respectively. In the subsequent method embodiments, the process of how to use the scattering parameter test of the replica line and the standard line to determine the scattering parameters of the transmission line to be tested in the circuit board is described in detail, which is not described in detail in this embodiment.

[0077] In a possible implementation, the connector may be a coaxial connector, which is consistent with the coaxial connector in the circuit board.

[0078] In one possible implementation, the replica transmission line is consistent with the transmission line to be tested in the circuit board, including the vias (including "via hole", "through-hole", "viaduct") and other designs for the transmission line to be tested, which are also copied intact.

[0079] The via of the transmission line to be tested includes a conductive channel for connecting different layers in a multi-layer printed circuit board (PCB), such as a through hole, a blind hole, a buried hole, etc.

[0080] Among them, the extension line of each replica line in each group of replica lines in the circuit test board is the same, and the two reference lines contained in each standard line have the same parameters as the extension line. The standard line serves as the standard for each replica line in the circuit test board and is used to determine the scattering parameters of the extension line of each replica line.

[0081] Since the reference line in the standard line is the same as the extension line of each replica line, only one set of standard lines may be provided in the circuit test board, thereby reducing the structural complexity of the circuit test board.

[0082] Among them, the extension line in the replica line is used to extend the non-coaxial structure (replica transmission line) into a coaxial structure, and its routing is shorter.

[0083] In a possible implementation, the length of the standard line is determined based on a specific multiple value of a wavelength corresponding to the highest frequency of a signal used by the circuit testing board for testing.

[0084] In the process of determining the scattering parameters of the transmission line to be tested, the test signal is input into the replica line through a coaxial connector according to the requirements, and the minimum length of the extension line in the replica line is designed to be a set multiple of the highest test frequency. Correspondingly, the length of the standard line is twice the length of the extension line. The length of the standard line is a specific multiple value of the wavelength corresponding to the highest frequency of the signal used for testing, and the specific multiple value is twice the set multiple.

[0085] In a specific implementation, the length of the total extension line of the copy line can be determined linearly, and then the length of the extension line is multiplied by 2 to obtain the standard line length.

[0086] As an example, the highest frequency of the signal used for testing the test circuit board is 50GHz (gigahertz, billion hertz), the dielectric constant ( ) is 4F / m (Far / meter), it can be estimated that the length of the extension line is about 9mm (millimeter), and further determined that the length of the standard line is 18mm.

[0087] In a possible implementation, the number of standard lines in each group of standard lines and the number of replica lines in each group of replica lines are respectively consistent with the number of transmission lines to be tested in the circuit board.

[0088] Figure 3 3 is another structural schematic diagram of a circuit test board provided in an embodiment of the present application, in which at least one group of replica lines 301 and one group of standard lines 302 are provided.

[0089] The circuit test board is set up to copy the transmission line to be tested in the circuit board to the circuit test board, so as to determine the scattering parameters of the transmission line to be tested in the circuit board by testing the corresponding copy transmission line in the circuit test board.

[0090] Among them, the transmission lines to be tested in the circuit board can be divided into groups. A group of transmission lines to be tested can be one, two or even more, which is specifically set according to actual needs. This application does not limit the number of transmission lines to be tested in each group.

[0091] The replica transmission line is a copy of the transmission line to be tested in the circuit board, and is completely consistent with the transmission line to be tested. Accordingly, the scattering parameters of the replica transmission line are the same as those of the transmission line to be tested in the circuit board.

[0092] Accordingly, the number, structure, parameters, etc. of the replica transmission lines need to be the same as those of the transmission lines to be tested in the circuit board, and the number of the replica lines is also the same as the number of the transmission lines to be tested in the circuit board.

[0093] Among them, the Figure 3 In the example, each set of copy lines contains two copy lines, and each set of standard lines contains two standard lines. In the specific implementation, the number of copy lines contained in each set of copy lines can be set according to the actual situation, and there is no restriction in this application.

[0094] In a possible implementation, each group of standard lines includes two standard lines, and the two standard lines are arranged in mirror symmetry; each group of replica lines includes two replica lines, and the two replica lines are arranged in mirror symmetry.

[0095] The two standard lines included in each set of standard lines are arranged in mirror symmetry to ensure that the two standard lines are exactly the same; the two copy lines included in each set of copy lines are arranged in mirror objects to ensure that the two copy lines are exactly the same.

[0096] Among them, by ensuring that the standard lines / replica lines in the same group are exactly the same, a basis is provided for the subsequent use of the circuit test board to analyze the scattering parameters of the transmission lines to be tested symmetrically arranged in the circuit board, so that the extended lines in the replica lines can be de-embedded to obtain the scattering parameters of the replica transmission lines in the replica lines.

[0097] In one possible implementation, the circuit test board includes at least two groups of replica lines; the replica transmission lines in any two groups of replica lines are different; wherein the replica transmission lines are different, including at least one of the following: the signal transmission paths are at least partially different, and the devices arranged on the signal transmission paths are at least partially different.

[0098] Among them, when there are any two identical transmission lines to be tested in the circuit board, the similarity may be that they have the same signal transmission path and the devices on the signal transmission path are exactly the same, then a group of replica lines can be set on the circuit test board, and the scattering parameters of the two transmission lines to be tested can be determined through the group of replica lines.

[0099] Among them, the circuit test board can be used to test each transmission line to be tested in a certain circuit board or multiple circuit boards. The transmission lines to be tested in the circuit board are different. Therefore, corresponding replica transmission lines are respectively set for transmission lines to be tested with various structures in the circuit test board, so that the scattering parameters of each transmission line to be tested in the circuit board can be tested and determined.

[0100] Wherein, for each different transmission line to be tested on the circuit board, corresponding groups of replica lines are set on the circuit test board.

[0101] The replica transmission line in the replica line is consistent with the transmission line to be tested, and accordingly, the signal transmission path of the transmission line to be tested is the same as the device arranged thereon.

[0102] Among them, different replica transmission lines may have different signal transmission paths, or different devices arranged on the signal transmission paths.

[0103] The different signal transmission paths may be different in one or more of the length, through hole position, bending position, etc. of the signal transmission path.

[0104] The different devices arranged on the signal transmission path may be different in one or more of the types and locations of the devices arranged on the signal transmission path.

[0105] Figure 4 This is another structural schematic diagram of a circuit test board provided in an embodiment of the present application. Three groups of replica lines 401 - 403 and one group of standard lines 404 are provided in the circuit test board.

[0106] Among them, no devices are set in a group of replica lines 401. This group of replica lines is a mirror-symmetrically arranged replica line. Connectors 405 are connected to both ends of the replica line. The replica transmission line 4011 and the extension line 4012 in the replica line are connected through a connection point 4013.

[0107] Among them, a device capacitor 4021 is set in a group of replica lines 402, and the group of replica lines is a mirror-symmetrically arranged replica line. The two ends of the replica line are connected to the connector 405, and the replica transmission line 4022 and the extension line 4023 in the replica line are connected through the connection point 4024.

[0108] Among them, a group of replica lines 403 is provided with conductive channels vias 4031 connecting different layers. This group of replica lines is a mirror-symmetrically arranged replica line. Connectors 405 are connected to both ends of the replica line. The replica transmission line 4032 and the extension line 4033 in the replica line are connected through a connection point 4034.

[0109] In one possible implementation, in order to reduce the structural complexity of the circuit test board, when only the parameters of the devices in any two transmission lines to be tested are different, such as only the capacitance of the capacitor is different, the remaining signal transmission paths and the devices arranged on the signal transmission paths are exactly the same, the devices in the circuit test board can be dismantled and modified to achieve the scattering parameters of the two transmission lines to be tested by using a set of replica lines in the circuit test board combined with standard lines.

[0110] In one possible implementation, during the process of disassembling and modifying the devices in the circuit test board, the tester needs to manually disassemble and weld the devices. The welding effect of manually welding the devices is different from the welding effect of using welding equipment on the devices in the circuit board, which may cause different resistances at the welding positions. Therefore, in order to improve the accuracy of the test, a group of replica lines can be set for each of the two transmission lines to be tested, and the replica lines corresponding to the transmission lines to be tested are used to determine the scattering parameters.

[0111] In this embodiment, in order to determine the scattering parameters of the transmission line to be tested in the circuit board, a circuit test board is set for the transmission line to be tested, and at least one group of replica lines and one group of standard lines are set in the circuit test board, each replica line includes an extension line and a replica transmission line connected by a connection point, the replica transmission line is consistent with the transmission line to be tested in the circuit board, and each end of each replica line is connected to a connector, the layout of the standard line is consistent with the layout of the extension line in the replica line, each standard line is composed of two reference lines, and each reference line has the same parameters as the extension line in the replica line, and each end of each standard line is connected to a connector, and the connector is used to connect to the test equipment. By copying the transmission line to be tested in the circuit board to the circuit test board, using the replica transmission line and standard line with the same parameters, and using the standard line composed of two reference lines with the same parameters as the replica extension line as the detection standard of the extension line in the replica, the scattering parameters of the replica extension line can be determined, and according to the scattering parameters of the replica line itself and the scattering parameters of the replica extension line, the scattering parameters of the replica transmission line can be accurately determined. Therefore, the circuit test board can provide a basis for determining the scattering parameters of the transmission line to be tested.

[0112] Figure 5 It is a flow chart of a method for determining scattering parameters of a transmission line in a circuit board provided in an embodiment of the present application. A data processing method provided in an embodiment of the present application may include steps 501 to 503, and these steps are described in detail below.

[0113] 501. Controlling a test signal to pass through a replica line in a circuit test board to obtain a scattering parameter of the replica line, wherein the replica line includes an extension line and a replica transmission line connected through a connection point, the replica transmission line is consistent with a transmission line to be tested in the circuit board, and each end of each replica line is connected to a connector;

[0114] Among them, a replica line is set in the circuit test board, and the replica transmission line in the replica line is to copy the transmission line to be tested in the circuit board to the circuit test board. The replica line also includes an extension line. The extension line and the replica transmission line are connected through a connection point, and a connector is connected to each end of the replica line. The non-coaxial section in the replica transmission line is extended to a coaxial structure through the extension line.

[0115] For the structure and corresponding explanation of the replica line, please refer to the explanation in the aforementioned circuit test board embodiment, which will not be repeated here.

[0116] Among them, the test signal passes through the replica line in the circuit test board, and the transmission condition of the test signal on the replica line in the circuit test board can characterize the scattering parameters of the replica line. Since the replica line is composed of a replica transmission line through a connection point and an extension line, the obtained scattering parameters are parameters that characterize the test signal passing through the replica transmission line and the extension line.

[0117] In a possible implementation, the test device inputs a test signal into the replica line through a connector of the replica line. The test signal is transmitted in the replica line, and the test device detects and obtains the scattering parameters of the replica line.

[0118] 502. Control the test signal to pass through the standard line in the circuit test board to obtain the scattering parameters of the standard line, wherein the layout of the standard line in the circuit test board is consistent with the layout of the extension line in the replica line, and each standard line is composed of two reference lines, the reference line and the extension line in the replica line have the same parameters, and each end of each standard line is connected to a connector;

[0119] Among them, the circuit test board is also provided with a standard line, the layout of the standard line is consistent with the layout of the extension line in the copy line, each standard line is composed of two reference lines, each reference line has the same parameters as the extension line in the copy line, each reference line is a copy of the extension line in the copy line, and the standard line is a double copy of the extension line in the copy line.

[0120] Among them, for the structure and corresponding explanation of the standard line, please refer to the explanation in the aforementioned circuit test board embodiment, which will not be repeated here.

[0121] Among them, the test signal is controlled to pass through the standard line in the circuit test board. The test signal is the same as the test signal passing through the replica line. The transmission condition of the test signal on the standard line in the circuit test board can characterize the scattering parameters of the standard line. Since the standard line is composed of two identical reference lines, the obtained scattering parameters are parameters that characterize the test signal passing through the two identical reference lines.

[0122] In a possible implementation, the test device is connected to the connector at each end of the replica line to test and obtain the scattering parameters of the replica line; the test device is connected to the connector at each end of the standard line to test and obtain the scattering parameters of the standard line.

[0123] 503. Determine the scattering parameters of the transmission line to be tested based on the scattering parameters of the replica line and the scattering parameters of the standard line.

[0124] Among them, the replica line includes a replica transmission line and an extension line, the standard line includes two reference lines, the layout of the standard line is consistent with the layout of the extension line, the replica transmission line is consistent with the transmission line to be tested in the circuit board, and the parameters of the reference line and the extension line are the same. Then, the scattering parameters of the standard line can be used to determine the scattering parameters of the extension line, and then the replica line is de-embedded, and the extension line is de-embedded. The scattering parameters of the replica line and the scattering parameters of the extension line can be used to determine the scattering parameters of the replica transmission line in the replica line, thereby realizing the determination of the scattering parameters of the transmission line to be tested.

[0125] Among them, by testing the scattering parameters of the standard line, the scattering parameters of the extended line in the replica line can be accurately determined without ignoring the influence of the extended line, and the scattering parameters of the transmission line to be tested can be accurately determined.

[0126] In a possible implementation, the scattering parameters of the reference line of half its length can be first determined using the scattering parameters of the standard component, and the scattering parameters of the reference line are used as the scattering parameters of the extended line in the replica line. The scattering parameters of the replica line and the scattering parameters of the extended line are then used to determine the scattering parameters of the replica transmission line in the replica line. The scattering parameters of the replica transmission line are the scattering parameters of the transmission line to be tested. Figure 6 The specific process of determining the scattering parameters of the transmission line to be tested is described in detail.

[0127] In this embodiment, the scattering parameters of the transmission line to be tested in the circuit board are determined by a circuit testing board. The circuit testing board includes a replica line and a standard line. The replica line includes an extension line and a replica transmission line connected by a connection point. The replica transmission line is consistent with the transmission line to be tested in the circuit board. Each end of each replica line is connected to a connector. The layout of the standard line in the circuit testing board is consistent with the layout of the extension line in the replica line, and each standard line is composed of two reference lines. The reference line and the extension line in the replica line have the same parameters. Each end of each standard line is connected to a connector. During the test process, the test signal is controlled to pass through the replica line and the standard line in the circuit testing board respectively, and the scattering parameters of the replica line and the scattering parameters of the standard line are obtained respectively; based on the scattering parameters of the replica line and the scattering parameters of the standard line, the scattering parameters of the transmission line to be tested are determined. The scattering parameters of the standard line are twice the scattering parameters of the extension line, so that the scattering parameters of the extension line in the replica line are accurately determined. Therefore, the scattering parameters of the transmission line to be tested can be accurately determined by using the scattering parameters of the replica line and the scattering parameters of the standard line.

[0128] Figure 6 It is a flowchart of determining the scattering parameters of the transmission line to be tested based on the scattering parameters of the replica line and the scattering parameters of the standard line provided in an embodiment of the present application, which may include steps 601 to 602, and these steps are described in detail below.

[0129] 601. Determine a scattering parameter of an extended line in the replica line based on the scattering parameter of the standard line;

[0130] The standard line is composed of two reference lines, which are the same as the extension lines in the copy line.

[0131] Among them, the scattering parameters of the entire standard line are obtained by testing in the above steps. In this embodiment, the scattering parameters of one of the reference lines are determined based on the scattering parameters of the standard line. The reference line is the same as the extended line in the replica line, and the scattering parameters of the reference line can be used as the scattering parameters of the extended line in the replica line.

[0132] In a possible implementation, an interpolation algorithm can be used to determine the scattering parameters of a reference line of half the length of the standard line. The scattering parameters of the reference line can be used as the scattering parameters of the extended line in the replica line. Figure 8 The process of determining the scattering parameters of the extended lines in the replica lines is described in detail.

[0133] 602. Determine scattering parameters of the replica transmission line based on scattering parameters of the extended line in the replica line and scattering parameters of the replica line, and use the scattering parameters of the replica transmission line as scattering parameters of the transmission line to be tested.

[0134] The replica line includes an extension line and a replica transmission line.

[0135] The scattering parameters of the entire replica line are obtained through testing in the aforementioned steps, and the scattering parameters of the extended line in the replica line are determined based on the aforementioned step 602. Then, the scattering parameters of the extended line in the replica line and the scattering parameters of the entire replica line can be calculated to determine the scattering parameters of the replica transmission line in the replica line.

[0136] Among them, a de-embedding process can be adopted for the replica line, and the extension line in the replica line is de-embedded to obtain the scattering parameters of the replica transmission line.

[0137] In a possible implementation, the de-embedding process can be to convert the scattering parameters into T parameters (TransmissionParameters, transmission parameters), calculate and de-embed the extended line for the replica line through the transmission parameters, obtain the transmission parameters of the replica transmission line, and then convert the transmission parameters of the replica transmission line back to scattering parameters, and then Figure 7 The process of determining the scattering parameters of the replica transmission line in the replica line is described in detail.

[0138] In this embodiment, the scattering parameters of the extended line in the replica line are first determined based on the scattering parameters of the standard line, and then the scattering parameters of the replica transmission line in the replica line are determined based on the scattering parameters of the extended line and the scattering parameters of the replica line, thereby achieving the purpose of using the replica line and the standard line to detect and determine the scattering parameters of the transmission line to be tested in the circuit board. In this process, the influence of the extended line part in the replica line is removed, so that the scattering parameters of the transmission line to be tested can be accurately determined.

[0139] Figure 7 It is a flowchart of determining the scattering parameters of the replica transmission line based on the scattering parameters of the extended line in the replica line and the scattering parameters of the replica line provided by an embodiment of the present application, which may include steps 701 to 703, and these steps are described in detail below.

[0140] 701. Convert the scattering parameters of the extended line in the replica line and the scattering parameters of the replica line into transmission parameters respectively;

[0141] When de-embedding the extended line in the replica line, the transmission parameters are used for intermediate processing, and the scattering parameters of the extended line in the replica line and the scattering parameters of the replica line need to be converted into transmission parameters respectively.

[0142] Among them, the scattering parameter is used to describe the reflection and transmission characteristics of the signal between the two ends of the line, and the transmission parameter is used to describe the relationship between the voltage and current between the two ends of the line. The reflection and transmission characteristics of the signal are converted into the relationship between voltage and current for analysis.

[0143] 702. Determine a transmission parameter of a replica transmission line in the replica line based on a transmission parameter of an extended line in the replica line and a transmission parameter of the replica line;

[0144] The transmission parameters of the extended line in the replica line and the transmission parameters of the replica line are de-embedded to obtain the transmission parameters of the replica transmission line.

[0145] The scattering parameters of the replica line are S M Indicates that the scattering parameters of the extended line in the replica line are S F Indicates that the two are converted into transmission parameters, which are the transmission parameters T of the replica line respectively. M and the transmission parameter T of the extended line in the replica line F .

[0146] The transmission parameter T of the replica transmission line can be determined using the following formula (1): DUT :

[0147] (1)

[0148] 703. Based on the transmission parameters of the replica transmission line in the replica line, convert and obtain the scattering parameters of the transmission line to be tested.

[0149] After the transmission parameters of the replica transmission line are determined, the transmission parameters are converted back into scattering parameters. The replica transmission line is a copy of the transmission line to be tested in the circuit board, and the scattering parameters of the replica transmission line are the scattering parameters of the transmission line to be tested.

[0150] As an example, a 4-port replica line is used as an example for explanation. The 4 ports refer to a group of replica lines including two replica lines, where ports 1 and 3 connect the two ends of one replica line, and ports 2 and 4 connect the two ends of another replica line.

[0151] Among them, the scattering parameters include: s 11 、s 22 、s 33 、s 44 、s 31 、s 13 、s 24 、s 42 、s 12 、s 21 、s 43 、s 43 、s 14 、s 41 、s 23 、s 32 .

[0152] Among them, s 11 、s 22 、s 33、s 44 Respectively represent the return loss (reflection coefficient), s 31 、s 13 、s 24 、s 42 Respectively represent the insertion loss (transmission coefficient), s 12 、s 21 、s 43 、s 43 They represent near-end crosstalk, s 14 、s 41 、s 23 、s 32 They represent far-end crosstalk respectively.

[0153] Since the replica lines are often in differential form, the following formulas (2)-(17) are used to convert the scattering parameters of the four ports into transmission parameters.

[0154] (2)

[0155] (3)

[0156] (4)

[0157] (5)

[0158] (6)

[0159] (7)

[0160] (8)

[0161] (9)

[0162] (10)

[0163] (11)

[0164] (12)

[0165] (13)

[0166] (14)

[0167] (15)

[0168] (16)

[0169] (17)

[0170] Using the above formula (1), the transmission parameters of the replica line and the extended line in the replica line determined by the above formulas (2)-(17) are used to determine the transmission parameter T of the replica transmission line. DUT .

[0171] Among them, the transmission parameter T DUT The terms in the equation can be converted back to scattering parameters. The following formulas (18)-(33) can be used to convert the scattering parameters of the four ports into transmission parameters.

[0172] (18)

[0173] (19)

[0174] (20)

[0175] (twenty one)

[0176] (twenty two)

[0177] (twenty three)

[0178] (twenty four)

[0179] (25)

[0180] (26)

[0181] (27)

[0182] (28)

[0183] (29)

[0184] (30)

[0185] (31)

[0186] (32)

[0187] (33)

[0188] The above formulas (1)-(33) can be used to implement the de-embedding process, thereby de-embedding the replica line to remove the extended line and obtain the scattering parameters of the replica transmission line in the replica line.

[0189] In this embodiment, the scattering parameters of the extended line in the replica line and the scattering parameters of the replica line are respectively converted into transmission parameters; based on the transmission parameters of the extended line in the replica line and the transmission parameters of the replica line, the transmission parameters of the replica transmission line in the replica line are determined; based on the transmission parameters of the replica transmission line in the replica line, the scattering parameters of the transmission line to be tested are converted.

[0190] When de-embedding the extension line in the replica line, intermediate processing is performed through the transmission parameters, and the scattering parameters of the extension line in the replica line and the scattering parameters of the replica line are respectively converted into transmission parameters. After de-embedding processing using the transmission parameters, the transmission parameters of the replica transmission line are obtained, and then the transmission parameters of the replica transmission line are converted into scattering parameters to obtain the scattering parameters of the transmission line to be tested, thereby realizing the process of accurately determining the scattering parameters of the transmission line to be tested.

[0191] Figure 8 This is a flow chart of determining the scattering parameters of the extended line in the replica line based on the scattering parameters of the standard line provided in an embodiment of the present application, which may include steps 801 to 803, and these steps are described in detail below.

[0192] 801. Interpolate the scattering parameters of the standard line based on the set frequency to obtain an interpolation result;

[0193] In this embodiment, an interpolation method is adopted to use the scattering parameters of the standard line to determine the scattering parameters of the extended line.

[0194] The interpolation algorithm may be an In-House 2X-Thru algorithm, where 2X-Thru represents two completely identical reference lines.

[0195] The scattering parameters of the standard line obtained by the test are interpolated using the set frequency to obtain an interpolation result, so as to provide a basis for subsequent analysis of the scattering parameters of the standard line.

[0196] In a possible implementation, the set frequency may be 1 MHz, and interpolation is performed at 1 MHz intervals to obtain an interpolation result.

[0197] 802. Determine a DC point based on the interpolation result;

[0198] The interpolation result is used to determine the distribution of the scattering parameter, and the DC point (DCPoint) is determined based on the interpolation result to ensure that most of the signal flows are included in the DC point range.

[0199] The scattering parameters of the standard line obtained by the test are interpolated using the set frequency, and a DC point is obtained. The purpose of interpolating and obtaining the DC point by setting the frequency is to ensure the resolution and correctness of the time domain.

[0200] 803. Based on the DC point, a specific time domain threshold, and a signal flow determined by the DC point, a target scattering parameter of half the length of the standard line is determined, and the target scattering parameter is used as a scattering parameter of an extended line in the replica line.

[0201] The specific time domain threshold is the threshold corresponding to the time domain gate. Through the specific time domain threshold, the interpolation result can be processed to obtain a value that satisfies the time domain gate range, so as to further determine the intermediate parameters using the value within the time domain gate range, thereby providing a basis for the subsequent determination of the scattering parameters of the reference line.

[0202] The interpolation result obtained by interpolation is combined with the DC point determined in the above steps, the specific time domain threshold and the signal flow determined by the DC point to determine the parameters in the signal flow. The parameters are used as intermediate parameters to provide a basis for the subsequent calculation of scattering parameters.

[0203] Among them, due to the structural symmetry of the standard line, it is composed of two completely identical extended lines. The signal flow graph in the standard line can be combined to determine that the intermediate parameters of the standard line include 5 unknowns, 2 unknowns are determined by the time domain gate, and the remaining three unknowns are obtained through the signal flow graph. Finally, the scattering parameters of the two extended lines can be obtained based on the unknowns.

[0204] Among them, by using the intermediate parameter, the target scattering parameter of each reference line in the standard line can be determined according to the set calculation rule, and the target scattering parameter is also the scattering parameter of the extended line in the replica line.

[0205] Fig. 9 is a signal flow diagram provided in an embodiment of the present application, which includes 8 DC points, namely a1 T 、b1 T 、b2 A 、a2 A 、a1 B 、b1 B 、b2 T 、a2 T , for each DC point, determine the parameters between any two adjacent DC points.

[0206] Among them, through a specific time domain threshold, s can be determined 11 T 、s 12 T 、s 21 T 、s 22 T Moreover, in the signal flow diagram, through the specific time domain threshold, the s 11 A、s 22 B .

[0207] The following formulas (34)-(36) can be used to determine the remaining three unknowns s 11 B 、s 22 A 、s 12 A :

[0208] (34)

[0209] (35)

[0210] (36)

[0211] Among them, using the intermediate parameter s determined above 11 A 、s 22 B 、s 11 B 、s 22 A 、s 12 A , calculate and obtain the scattering parameters of each extended line in the standard line.

[0212] In this embodiment, the scattering parameters of the standard line are interpolated based on the set frequency to obtain an interpolation result; the DC point is determined based on the interpolation result; the target scattering parameters of half the length of the standard line are determined according to the DC point and a specific time domain threshold and a signal flow determined by the DC point; the scattering parameters of the standard line are processed through interpolation and a time domain gate to obtain the target scattering parameters of a reference line of half its length, and the reference line is consistent with the extended line in the replica line, thereby realizing accurate determination of the scattering parameters of the extended line in the replica line.

[0213] Fig.10 It is a schematic diagram of an application scenario of the method for determining the scattering parameters of the transmission line in the circuit board provided in the embodiment of the present application, and the application scenario includes a circuit test board 1001 and a test device 1002. Among them, the circuit test board 1001 includes a group of replica lines 10011 and a group of standard lines 10012, a group of replica lines includes two replica lines, and a group of standard lines includes two standard lines. During the test process, the test device 1002 simultaneously connects the coaxial connectors at both ends of the two replica lines 10011 to determine the scattering parameters of the two replica lines, and the test device 1002 simultaneously connects the coaxial connectors at both ends of the two standard lines 10012 to determine the scattering parameters of the two standard lines.

[0214] Fig.10The connection method of the test equipment and the replica line shown in the figure is for reference only. In the specific implementation, the connection can be made according to the settings of the test equipment.

[0215] During the test, the test device inputs test signals to the replica line / standard line in turn through the four connected connectors to obtain the scattering parameters of each end, and then determines the scattering parameters of each replica line / standard line.

[0216] In an application scenario, the method for determining the scattering parameters of a transmission line in a circuit board provided in an embodiment of the present application can be implemented in an APP (application), and an interface can be set in the APP to facilitate testers to implement detection of the scattering parameters of the transmission line through the interface.

[0217] Fig.11 It is an interface diagram in the application scenario provided in an embodiment of the present application, and the interface diagram includes two step interfaces 1101-1102.

[0218] Among them, step 1 interface 1101 is the process of determining the scattering parameters of each reference line in the standard line. Fig.11 In the step 1, "Fixture+Fixture'" is used to represent the standard line (port 1---3, 2---4), Fixture is a reference line, and Fixture' represents another reference line. In the step 1, the scattering parameters of the fixture (port 1---3, 2---4) and the scattering parameters of the fixture' (port 1---3, 2---4) are determined using the scattering parameters of the standard line.

[0219] Among them, step 2 interface 1102 is the process of determining the scattering parameters of the replica transmission line in the replica line. Fig.11 In the example, "DUT+Fixture" is used to represent the replica line (ports 1---3, 2---4), and Fixture represents the extended line in the replica line. The scattering parameters of the extended line (ports 1---3, 2---4) are used to embed the scattering parameters of the replica line (ports 1---3, 2---4). Fig.11 The minus sign is used to represent de-embedding, and the scattering parameters of the replica transmission line (DUT) (ports 1---3, 2---4) in the replica line are obtained.

[0220] A method for determining scattering parameters of a transmission line in a circuit board provided in an embodiment of the present application is introduced above. A device for executing the method for determining scattering parameters of a transmission line in a circuit board will be introduced below.

[0221] Fig.12It is a structural schematic diagram of a device for determining scattering parameters of a transmission line in a circuit board provided in an embodiment of the present application. The device 1200 for determining scattering parameters of a transmission line in a circuit board includes: a first control module 1201, a second control module 1202 and a determination module 1203;

[0222] The first control module 1201 is used to control the test signal to pass through the replica line in the circuit test board to obtain the scattering parameters of the replica line, the replica line includes an extension line and a replica transmission line connected by a connection point, the replica transmission line is consistent with the transmission line to be tested in the circuit board, and each end of each replica line is connected to a connector;

[0223] The second control module 1202 is used to control the test signal to pass through the standard line in the circuit test board to obtain the scattering parameters of the standard line. The layout of the standard line in the circuit test board is consistent with the layout of the extension line in the replica line, and each standard line is composed of two reference lines. The reference line and the extension line in the replica line have the same parameters, and each end of each standard line is connected to a connector.

[0224] The determination module 1203 is used to determine the scattering parameters of the transmission line to be tested based on the scattering parameters of the replica line and the scattering parameters of the standard line.

[0225] In a possible implementation, the determining module includes:

[0226] A first determining unit, configured to determine a scattering parameter of an extended line in the replica line based on the scattering parameter of the standard line;

[0227] The second determining unit is used to determine the scattering parameters of the replica transmission line based on the scattering parameters of the extended line in the replica line and the scattering parameters of the replica line, and the scattering parameters of the replica transmission line are used as the scattering parameters of the transmission line to be tested.

[0228] In a possible implementation, the second determining unit is specifically configured to:

[0229] converting the scattering parameters of the extended line in the replica line and the scattering parameters of the replica line into transmission parameters respectively;

[0230] Determine the transmission parameters of the replica transmission line in the replica line based on the transmission parameters of the extended line in the replica line and the transmission parameters of the replica line;

[0231] Based on the transmission parameters of the replica transmission line in the replica line, the scattering parameters of the transmission line to be tested are obtained by conversion.

[0232] In a possible implementation, the first determining unit is specifically configured to:

[0233] Interpolating the scattering parameters of the standard line based on the set frequency to obtain an interpolation result;

[0234] determining a DC point based on the interpolation result;

[0235] According to the DC point, a specific time domain threshold, and a signal flow determined by the DC point, a target scattering parameter of half the length of the standard line is determined, and the target scattering parameter is used as a scattering parameter of an extended line in the replica line.

[0236] It should be noted that for the functional explanation of each structure of the device for determining the scattering parameters of a transmission line in a circuit board provided in this embodiment, please refer to the explanation in the aforementioned method embodiment, and it will not be repeated in this embodiment.

[0237] In this embodiment, the scattering parameters of the transmission line to be tested in the circuit board are determined by a circuit testing board. The circuit testing board includes a replica line and a standard line. The replica line includes an extension line and a replica transmission line connected by a connection point. The replica transmission line is consistent with the transmission line to be tested in the circuit board. Each end of each replica line is connected to a connector. The layout of the standard line in the circuit testing board is consistent with the layout of the extension line in the replica line, and each standard line is composed of two reference lines. The reference line and the extension line in the replica line have the same parameters. Each end of each standard line is connected to a connector. During the test process, the test signal is controlled to pass through the replica line and the standard line in the circuit testing board respectively, and the scattering parameters of the replica line and the scattering parameters of the standard line are obtained respectively; based on the scattering parameters of the replica line and the scattering parameters of the standard line, the scattering parameters of the transmission line to be tested are determined. The scattering parameters of the standard line are twice the scattering parameters of the extension line, so that the scattering parameters of the extension line in the replica line are accurately determined. Therefore, the scattering parameters of the transmission line to be tested can be accurately determined by using the scattering parameters of the replica line and the scattering parameters of the standard line.

[0238] The present application also provides an electronic device in an embodiment. Fig.13 As shown, it shows a schematic diagram of the structure of an electronic device suitable for implementing the device for determining the scattering parameters of the transmission line in the circuit board in the embodiment of the present application. The electronic device in the embodiment of the present application may include but is not limited to fixed terminals such as mobile phones, laptops, PDAs (personal digital assistants), PADs (tablet computers), desktop computers, etc. Fig.13 The electronic device shown is merely an example and should not bring any limitation to the functions and scope of use of the embodiments of the present application.

[0239] like Fig.13As shown, the electronic device may include a processing device (e.g., a central processing unit, a graphics processing unit, etc.) 1301, which can perform various appropriate actions and processes according to a program stored in a read-only memory (ROM) 1302 or a program loaded from a storage device 1308 to a random access memory (RAM) 1303. When the electronic device is powered on, various programs and data required for the operation of the electronic device are also stored in the RAM 1303. The processing device 1301, the ROM 1302, and the RAM 1303 are connected to each other via a bus 1304. An input / output (I / O) interface 1305 is also connected to the bus 1304.

[0240] Typically, the following devices may be connected to the I / O interface 1305: an input device 1306 including, for example, a touch screen, a touch pad, a keyboard, a mouse, a camera, a microphone, an accelerometer, a gyroscope, etc.; an output device 1307 including, for example, a liquid crystal display (LCD), a speaker, a vibrator, etc.; a storage device 1308 including, for example, a memory card, a hard disk, etc.; and a communication device 1309. The communication device 1309 may allow the electronic device to communicate with other devices wirelessly or by wire to exchange data. Although Fig.13 An electronic device having various devices is shown, but it should be understood that it is not required to implement or possess all the devices shown. More or fewer devices may be implemented or possessed instead.

[0241] An embodiment of the present application also provides a computer program product including computer-readable instructions. When the computer-readable instructions are executed on an electronic device, the electronic device implements a method for determining the scattering parameters of a transmission line in any circuit board provided in the embodiment of the present application.

[0242] A computer-readable storage medium is also provided in an embodiment of the present application. The storage medium carries one or more computer programs. When the one or more computer programs are executed by an electronic device, the electronic device can implement a method for determining the scattering parameters of a transmission line in any circuit board provided in an embodiment of the present application.

[0243] It should also be noted that the device embodiments described above are merely schematic, wherein the units described as separate components may or may not be physically separated, and the components displayed as units may or may not be physical units, that is, they may be located in one place, or they may be distributed over multiple network units. Some or all of the modules may be selected according to actual needs to achieve the purpose of the scheme of this embodiment. In addition, in the drawings of the device embodiments provided by the present application, the connection relationship between the modules indicates that there is a communication connection between them, which may be specifically implemented as one or more communication buses or signal lines.

[0244] Through the description of the above implementation mode, the technicians in the field can clearly understand that the present application can be implemented by means of software plus necessary general hardware, and of course, it can also be implemented by special hardware including special integrated circuits, special CPUs, special memories, special components, etc. In general, all functions completed by computer programs can be easily implemented by corresponding hardware, and the specific hardware structure used to implement the same function can also be various, such as analog circuits, digital circuits or special circuits. However, for the present application, software program implementation is a better implementation mode in more cases. Based on such an understanding, the technical solution of the present application is essentially or the part that contributes to the prior art can be embodied in the form of a software product, which is stored in a readable storage medium, such as a computer floppy disk, a U disk, a mobile hard disk, a ROM, a RAM, a disk or an optical disk, etc., including a number of instructions to enable a computer device (which can be a personal computer, a training device, or a network device, etc.) to execute the methods described in each embodiment of the present application.

[0245] In the above embodiments, all or part of the embodiments may be implemented by software, hardware, firmware or any combination thereof. When implemented by software, all or part of the embodiments may be implemented in the form of a computer program product.

[0246] The computer program product includes one or more computer instructions. When the computer program instructions are loaded and executed on a computer, the process or function described in the embodiment of the present application is generated in whole or in part. The computer may be a general-purpose computer, a special-purpose computer, a computer network, or other programmable devices. The computer instructions may be stored in a computer-readable storage medium, or transmitted from one computer-readable storage medium to another computer-readable storage medium. For example, the computer instructions may be transmitted from a website site, a computer, a training device, or a data center by wired (e.g., coaxial cable, optical fiber, digital subscriber line (DSL)) or wireless (e.g., infrared, wireless, microwave, etc.) mode to another website site, computer, training device, or data center. The computer-readable storage medium may be any available medium that a computer can store or a data storage device such as a training device, a data center, etc. that includes one or more available media integrations. The available medium may be a magnetic medium, (e.g., a floppy disk, a hard disk, a tape), an optical medium (e.g., a DVD), or a semiconductor medium (e.g., a solid-state drive (SSD)), etc.

Claims

1. A circuit testing board, wherein at least one set of replica lines and one set of standard lines are provided in the circuit testing board; Each quest line includes: An extension line and a replica transmission line connected by a connection point, the replica transmission line being consistent with the transmission line to be tested in the circuit board, and each end of each replica line being connected to a connector; The layout of the standard line is consistent with the layout of the extension line in the replica line, and each standard line is composed of two reference lines, the reference line and the extension line in the replica line have the same parameters, and each end of each standard line is connected to a connector; The connector is used for connecting with a testing device.

2. According to the circuit testing board of claim 1, the number of standard lines in each group of standard lines and the number of replica lines in each group of replica lines are respectively consistent with the number of transmission lines to be tested in the circuit board.

3. The circuit testing board according to claim 1, wherein the length of the standard line is determined based on a specific multiple value of a wavelength corresponding to the highest frequency of a signal used for testing by the circuit testing board.

4. According to the circuit testing board of claim 2, each group of standard lines comprises two standard lines, and the two standard lines are arranged in mirror symmetry; each group of replica lines comprises two replica lines, and the two replica lines are arranged in mirror symmetry.

5. The circuit testing board according to claim 1, comprising at least two sets of replica lines; The replica transmission lines in any two sets of replica lines are different; in, The replica transmission lines are different, which includes at least one of the following: the signal transmission paths are at least partially different, and the devices arranged on the signal transmission paths are at least partially different.

6. A method for determining scattering parameters of a transmission line in a circuit board, comprising: Controlling the test signal to pass through a replica line in the circuit test board to obtain scattering parameters of the replica line, wherein the replica line includes an extension line and a replica transmission line connected through a connection point, the replica transmission line is consistent with the transmission line to be tested in the circuit board, and each end of each replica line is connected to a connector; Controlling the test signal to pass through a standard line in a circuit test board to obtain scattering parameters of the standard line, wherein the layout of the standard line in the circuit test board is consistent with the layout of the extension line in the replica line, and each standard line is composed of two reference lines, the reference line and the extension line in the replica line have the same parameters, and each end of each standard line is connected to a connector; Based on the scattering parameters of the replica line and the scattering parameters of the standard line, the scattering parameters of the transmission line to be tested are determined.

7. The method for determining the scattering parameters of a transmission line in a circuit board according to claim 6, wherein the step of determining the scattering parameters of the transmission line to be tested based on the scattering parameters of the replica line and the scattering parameters of the standard line comprises: Based on the scattering parameters of the standard line, determining the scattering parameters of the extended line in the replica line; Based on the scattering parameters of the extended line in the replica line and the scattering parameters of the replica line, the scattering parameters of the replica transmission line are determined, and the scattering parameters of the replica transmission line are used as the scattering parameters of the transmission line to be tested.

8. The method for determining scattering parameters of a transmission line in a circuit board according to claim 7, wherein determining the scattering parameters of the replica transmission line based on the scattering parameters of the extended line in the replica line and the scattering parameters of the replica line comprises: Converting the scattering parameters of the extended line in the replica line and the scattering parameters of the replica line into transmission parameters respectively; Determining transmission parameters of a replica transmission line in the replica line based on transmission parameters of the extended line in the replica line and transmission parameters of the replica line; Based on the transmission parameters of the replica transmission line in the replica line, the scattering parameters of the transmission line to be tested are obtained by conversion.

9. The method for determining scattering parameters of a transmission line in a circuit board according to claim 7, wherein determining the scattering parameters of the extended line in the replica line based on the scattering parameters of the standard line comprises: interpolating the scattering parameters of the standard line based on the set frequency to obtain an interpolation result; Determining a DC point based on the interpolation result; According to the DC point, a specific time domain threshold, and a signal flow determined by the DC point, a target scattering parameter of half the length of the standard line is determined, and the target scattering parameter is used as a scattering parameter of an extended line in the replica line.

10. A device for determining scattering parameters of a transmission line in a circuit board, comprising: A first control module is used to control the test signal to pass through a replica line in the circuit test board to obtain a scattering parameter of the replica line, wherein the replica line includes an extension line and a replica transmission line connected by a connection point, the replica transmission line is consistent with the transmission line to be tested in the circuit board, and each end of each replica line is connected to a connector; A second control module is used to control the test signal to pass through the standard line in the circuit test board to obtain the scattering parameters of the standard line, wherein the layout of the standard line in the circuit test board is consistent with the layout of the extension line in the replica line, and each standard line is composed of two reference lines, the reference line and the extension line in the replica line have the same parameters, and each end of each standard line is connected to a connector; The determination module is used to determine the scattering parameters of the transmission line to be tested based on the scattering parameters of the replica line and the scattering parameters of the standard line.

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