Method for testing immunity of electronic transformer under multi-physical field coupling effect
By implementing the antipity test method under the action of multi -physical field coupling on the electronic intestines, the problem of poor reliability and lack of detection technology in operation, improve the detection ability and product quality, and enhance the resistance ability.
Patent Information
- Application Number
- CN202411511185.2
- Authority / Receiving Office
- CN · China
- Patent Type
- Applications(China)
- Current Assignee / Owner
- Filing Date
- 2024-10-28
- Publication Date
- 2025-01-28
AI Technical Summary
The electronic transformers have poor reliability, high operation and maintenance difficulties, current standards are difficult to meet their actual operating technical requirements and lack of detection technology, resulting in limited promotion and application in power systems.
Under multi -physical field coupling, the electronic intestinal transformers' antipity test method is used to conduct an electromagnetic harassment module and the temperature and humidity condition module by building electricity transitional vein generator, surge generator and radio frequency induction. Combined with the online monitoring system, the reliability test under the action of multiple physical fields of electronic intestines is performed.
Improving the detection capacity of electronic transformers, improving the quality of the product in the network, enhancing its ability to resist the resistance in multiple physical fields, and solving the problem that the existing technology is difficult to meet its actual operating needs.
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Figure CN119375586A_ABST
Abstract
Description
Technical Field
[0001] The invention relates to the technical field of electronic mutual inductors, and in particular to a method for testing the anti-interference performance of electronic mutual inductors under multi-physical field coupling. Background Art
[0002] Electronic instrument transformers are key equipment for the intelligentization, digitization and informatization of power grids. Their safe and stable operation is of great significance to the construction of digital power grids and the building of new power systems. According to the summary of the operation of electronic instrument transformers over the years, the following outstanding problems currently exist in electronic instrument transformers:
[0003] 1) Poor operational reliability and difficult operation and maintenance: According to recent statistics, the failure rate of electronic transformers is 0.107 times / (100 units / year), which is 30 times that of conventional transformers. Among them, the failure / defect problem of the acquisition unit is the most prominent, accounting for 62% of the total number of defects / failures. However, the current on-site detection technology of electronic transformers is limited, and some product manufacturers have closed down and lack of technical support, resulting in the difficulty of electronic transformer operation and maintenance. There is a lack of basis for the reliability improvement of the operating electronic transformers.
[0004] 2) The current standards are difficult to meet the actual technical requirements for the operation of electronic transformers: Electronic transformers are devices that integrate primary and secondary technologies. Their installation location is closer to the switchyard than traditional secondary equipment. Existing equipment still has frequent failures during operation while meeting national standards, indicating that its operating environment is worse than the current standards. The current standards are difficult to meet the actual technical requirements for the operation of electronic transformers.
[0005] 3) Lack of detection technology and insufficient detection effectiveness: At present, there is a lack of technical means for on-site detection of electronic transformers in operation. The current power equipment maintenance and test regulations stipulate only 6 maintenance and test items for electronic transformers (appearance inspection, infrared inspection, primary lead inspection, measurement lead inspection, grounding inspection and tap ratio inspection). There are limited methods for performance detection of electronic transformers in operation, which cannot effectively simulate the actual operating environment on site, and the detection effectiveness is insufficient.
[0006] At present, both the IEC standard and the national standard require that the test requirements for each part of the electronic transformer be to test the electromagnetic compatibility and environmental reliability separately, but do not assess the impact of other possible factors. It is precisely because the existing assessment standards do not adequately simulate the actual situation of the electronic transformer in the substation that the reliability of the electronic transformer that has been put into operation is not high, which seriously affects the promotion and application of this advanced technology in the power system. In order to improve the reliability of the electronic transformer, it is necessary to consider the temperature, humidity and other environmental factors to re-conduct the electronic transformer immunity test under the action of multiple interference sources. Summary of the invention
[0007] In view of the above existing problems, the present invention is proposed.
[0008] Therefore, the present invention provides an anti-interference test method for an electronic transformer under the coupling of multiple physical fields, provides a reliability inspection method for an electronic transformer under the simultaneous action of multiple physical fields, improves the detection capability of the electronic transformer, and improves the network access quality of the product.
[0009] In order to solve the above technical problems, the present invention provides the following technical solutions: a method for testing the immunity of an electronic transformer under multi-physical field coupling, comprising:
[0010] Analyze the influence mechanism of electronic transformer under the coupling of multiple physical fields;
[0011] Based on the impact mechanism obtained by analysis, an electrical fast transient pulse group generator, a surge generator and a radio frequency induction conducted disturbance generator are built respectively to construct an electromagnetic disturbance module;
[0012] An electronic transformer immunity test system under multi-physical fields is constructed, including an electromagnetic disturbance module, a coupling and decoupling network, a temperature and humidity condition module and an online monitoring system. The immunity of the electronic transformer under multi-physical field coupling is tested to obtain the corresponding standard electromagnetic interference under different temperature and humidity conditions.
[0013] As a preferred solution of the method for testing the immunity of electronic transformers under the action of multi-physical field coupling described in the present invention, the analysis of the influencing mechanism of the electronic transformer under the action of multi-physical field coupling includes changing the physical field parameters, using Rogowski coil induction to obtain the differential signal of the current, and restoring it to a voltage signal proportional to the measured current through integration, analyzing the performance change of the primary circuit under different physical field couplings, and obtaining the influencing factor of the electronic transformer under the action of multi-physical field coupling.
[0014] As a preferred scheme of the method for testing the anti-interference of electronic transformers under the action of multi-physical field coupling described in the present invention, wherein: the analysis of the influencing mechanism of the electronic transformer under the action of multi-physical field coupling includes, the influencing factors of the electronic transformer under the action of multi-physical field coupling include: the influence of circuit stability and reliability, the influence of integrator, the influence of ambient temperature and humidity, and the influence of electromagnetic interference.
[0015] As a preferred solution of the method for testing the immunity of electronic transformers under multi-physical field coupling described in the present invention, the internal environment temperature range of the temperature and humidity condition module is -50°C to +85°C, and the humidity is less than or equal to 95%.
[0016] As a preferred solution of the electronic transformer immunity test method under the multi-physical field coupling action described in the present invention, wherein: the construction of the electronic transformer immunity test system under the multi-physical field action includes: placing an electrical fast transient pulse group generator independently outside the temperature and humidity condition module, connecting it to the corresponding coupling and decoupling network through a coaxial cable, placing the coupling and decoupling network and the device under test in the temperature and humidity condition module, and placing the device under test on an insulating support; the generated electrical fast transient pulse group interference voltage is output to the coupling and decoupling network through a coaxial cable, and is directly coupled to the working power supply of the device under test through the coupling and decoupling network;
[0017] According to the working environment of the device under test, multiple groups of temperature and humidity test ranges are set. The humidity of each temperature and humidity test range is fixed. Multiple temperature test points are set for each group of temperature and humidity test ranges. At each temperature test point, electrical fast transient pulse group disturbance voltage is applied to each port of the device under test in turn. During the voltage application process, the protection current error, measurement error current, voltage amplitude error and voltage phase error are monitored to determine whether the device under test is damaged, communication is interrupted, packet is lost, quality output changes and output waveform distortion occurs;
[0018] For the experimental power line test circuit, a filter is used as a coupling / decoupling network to perform an electrical fast transient pulse group immunity test; for the signal line test circuit, a capacitive coupling clamp or CDN is used as a coupling / decoupling network to perform an electrical fast transient pulse group immunity test.
[0019] As a preferred solution of the electronic transformer immunity test method under multi-physical field coupling described in the present invention, the electrical fast transient pulse group generator includes a high-voltage power supply U, an energy storage capacitor C c , switch Switch, pulse duration adjustment resistor R S , impedance matching resistor R m and the DC blocking capacitor C d ; High voltage power supply U continuously supplies energy storage capacitor C c When the voltage reaches the preset value, the switch is closed to charge the energy storage capacitor C c The voltage across the two ends is released, and the resistance R is adjusted during the pulse duration. S A fast transient pulse signal is formed on the m and the DC blocking capacitor C d The signal is output to the coupling-decoupling network through a 50Ω coaxial cable, and the electrical fast transient pulse group disturbance voltage is directly coupled to the working power supply of the device under test through the coupling-decoupling network.
[0020] As a preferred solution of the electronic transformer immunity test method under the multi-physical field coupling described in the present invention, wherein: a surge generator is independently placed outside the temperature and humidity condition module, connected to the corresponding coupling and decoupling network through a coaxial cable, the coupling and decoupling network and the device under test are placed in the temperature and humidity condition module, and the device under test is placed on an insulating support; the generated surge pulse is output to the coupling and decoupling network through the coaxial cable, and is directly coupled to the working power supply of the device under test through the coupling and decoupling network;
[0021] According to the working environment of the device under test, multiple groups of temperature and humidity test ranges are set, and multiple temperature and humidity test points are set for each group of temperature and humidity test ranges. In the process of alternating damp heat heating and cooling, different coupling modes and voltages of different polarities are used to apply multiple surge pulses to each port of the device under test in turn. During the voltage application process, the protection current error, measurement error current, voltage amplitude error and voltage phase error are monitored to determine whether the device under test is damaged, communication is interrupted, packet is lost, quality output changes and output waveform distortion occurs;
[0022] The type of surge generator is selected according to the type of tested port. For ports connected to outdoor symmetrical communication lines, the surge generator uses a 10 / 700us combination wave generator. For other cases, the surge generator uses a 1.2 / 50us combination wave generator. The ratio of the open-circuit voltage peak to the short-circuit output current peak of the same output port of the combination wave generator is regarded as the effective output impedance.
[0023] The coupling element is selected according to the type of signal line. For AC or DC power lines, the coupling element uses a high-voltage capacitor; for I / O lines and communication lines, the coupling element uses capacitors, clamping devices and lightning arresters.
[0024] As a preferred solution of the electronic transformer immunity test method under the multi-physical field coupling action described in the present invention, wherein: the construction of the electronic transformer immunity test system under the multi-physical field action includes: placing the radio frequency induction conducted interference generator independently outside the temperature and humidity condition module, connecting it to the corresponding coupling and decoupling network through a coaxial cable, placing the coupling and decoupling network and the device under test in the temperature and humidity condition module, and placing the device under test on an insulating support; the generated conducted interference voltage is output to the coupling and decoupling network through the coaxial cable, and is directly coupled to the working power supply of the device under test through the coupling and decoupling network;
[0025] Set multiple groups of temperature and humidity test ranges according to the working environment of the device under test, set multiple temperature and humidity test points for each group of temperature and humidity test ranges, apply conducted interference voltage to each port of the device under test, monitor the protection current error, measurement error current, voltage amplitude error and voltage phase error during the voltage application process, and judge whether the device under test is damaged, communication interrupted, packet lost, quality output changed and output waveform distorted.
[0026] A computer device comprises a memory and a processor, wherein the memory stores a computer program, and is characterized in that when the processor executes the computer program, steps of a method for testing the immunity of an electronic mutual inductor under the action of multi-physical field coupling are implemented.
[0027] A computer-readable storage medium stores a computer program, wherein the computer program, when executed by a processor, implements the steps of a method for testing the immunity of an electronic transformer under the action of multi-physical field coupling.
[0028] Beneficial effects of the present invention: The anti-interference test method of the electronic transformer under the multi-physical field coupling of the present invention realizes the reliability verification of the electronic transformer by studying the reliability inspection method under the simultaneous action of multiple physical fields. BRIEF DESCRIPTION OF THE DRAWINGS
[0029] In order to more clearly illustrate the technical solutions of the embodiments of the present invention, the accompanying drawings required for use in the description of the embodiments will be briefly introduced below. Obviously, the accompanying drawings described below are only some embodiments of the present invention. For ordinary technicians in this field, other accompanying drawings can be obtained based on these accompanying drawings without paying creative work.
[0030] Figure 1 A schematic flow chart of a method for testing the immunity of an electronic transformer under multi-physical field coupling is provided for one embodiment of the present invention.
[0031] Figure 2 A test block diagram of an electrical fast transient pulse group EFT / B of an electronic transformer immunity test method under multi-physical field coupling provided by an embodiment of the present invention.
[0032] Figure 3 A schematic diagram of an EFT / B electromagnetic disturbance module for an electronic transformer immunity testing method under multi-physical field coupling provided by an embodiment of the present invention.
[0033] Figure 4 A three-phase EFT / B CDN block diagram of a method for testing the immunity of an electronic transformer under multi-physical field coupling provided by an embodiment of the present invention.
[0034] Figure 5A schematic diagram of a fast-transient power line test circuit for a method for testing the immunity of an electronic transformer under multi-physical field coupling provided by an embodiment of the present invention.
[0035] Figure 6 A schematic diagram of a fast-transient signal line test circuit for a method for testing the immunity of an electronic transformer under multi-physical field coupling provided by an embodiment of the present invention.
[0036] Figure 7 A Surge test block diagram of a method for testing the immunity of an electronic transformer under multi-physical field coupling provided by an embodiment of the present invention.
[0037] Figure 8 A schematic diagram of a 1.2 / 50us-8 / 20us electromagnetic disturbance module for an electronic transformer immunity test method under multi-physical field coupling provided by an embodiment of the present invention.
[0038] Fig. 9 A schematic diagram of CDN selection for a method for testing the immunity of an electronic transformer under multi-physical field coupling provided by an embodiment of the present invention.
[0039] Fig.10 A power line conducted disturbance test block diagram of a method for testing immunity of an electronic transformer under multi-physical field coupling provided by an embodiment of the present invention.
[0040] Fig.11 A signal line conduction disturbance test block diagram of a method for testing immunity of an electronic transformer under multi-physical field coupling provided by an embodiment of the present invention.
[0041] Fig.12 A schematic diagram of the configuration of a CS electromagnetic disturbance module of a method for testing the immunity of an electronic transformer under multi-physical field coupling provided by an embodiment of the present invention. DETAILED DESCRIPTION
[0042] In order to make the above-mentioned purposes, features and advantages of the present invention more obvious and easy to understand, the specific implementation methods of the present invention are described in detail below in conjunction with the drawings of the specification. Obviously, the described embodiments are part of the embodiments of the present invention, but not all of the embodiments. Based on the embodiments of the present invention, all other embodiments obtained by ordinary persons in the art without creative work should fall within the scope of protection of the present invention.
[0043] In the following description, many specific details are set forth to facilitate a full understanding of the present invention, but the present invention may also be implemented in other ways different from those described herein, and those skilled in the art may make similar generalizations without violating the connotation of the present invention. Therefore, the present invention is not limited to the specific embodiments disclosed below.
[0044] Secondly, the term "one embodiment" or "embodiment" as used herein refers to a specific feature, structure, or characteristic that may be included in at least one implementation of the present invention. The term "in one embodiment" that appears in different places in this specification does not necessarily refer to the same embodiment, nor does it refer to a separate or selective embodiment that is mutually exclusive with other embodiments.
[0045] The present invention is described in detail with reference to schematic diagrams. When describing the embodiments of the present invention, for the sake of convenience, the cross-sectional diagrams showing the device structure will not be partially enlarged according to the general scale, and the schematic diagrams are only examples, which should not limit the scope of protection of the present invention. In addition, in actual production, the three-dimensional dimensions of length, width and depth should be included.
[0046] At the same time, in the description of the present invention, it should be noted that the directions or positional relationships indicated by the terms "upper, lower, inner and outer" are based on the directions or positional relationships shown in the drawings, and are only for the convenience of describing the present invention and simplifying the description, rather than indicating or implying that the device or element referred to must have a specific direction, be constructed and operated in a specific direction, and therefore cannot be understood as limiting the present invention. In addition, the terms "first, second or third" are only used for descriptive purposes and cannot be understood as indicating or implying relative importance.
[0047] In the present invention, unless otherwise clearly specified and limited, the terms "install, connect, connect" should be understood in a broad sense, for example: it can be a fixed connection, a detachable connection or an integral connection; it can also be a mechanical connection, an electrical connection or a direct connection, or it can be indirectly connected through an intermediate medium, or it can be the internal communication of two components. For ordinary technicians in this field, the specific meanings of the above terms in the present invention can be understood according to specific circumstances.
[0048] Example 1, reference Figure 1-Figure 12 , which is the first embodiment of the present invention, provides a method for testing the immunity of an electronic transformer under multi-physical field coupling, comprising:
[0049] S1, analyze the influence mechanism of electronic transformer under the coupling of multi-physical fields;
[0050] S2, based on the impact mechanism obtained by analysis, build an electrical fast transient pulse group generator, a surge generator and a radio frequency induction conduction disturbance generator respectively to construct an electromagnetic disturbance module;
[0051] S3, constructs an electronic transformer anti-interference test system under the action of multiple physical fields, including an electromagnetic interference module, a coupling and decoupling network, a temperature and humidity condition module and an online monitoring system, tests the electronic transformer anti-interference under the action of multiple physical fields coupling, and obtains the corresponding standard electromagnetic interference under different temperature and humidity conditions.
[0052] The multi-physics field mainly includes the following modules: electromagnetic disturbance module, coupling and decoupling network, temperature and humidity condition module and online monitoring system. The modules interact with each other to form the entire multi-physics field test system.
[0053] Judging from the current application of smart substations, active electronic current transformers are mainly based on Rogowski coil type and low power current transformer (LPCT) type.
[0054] The overall principle structure block diagram of the active electronic current transformer measuring current with the Rogowski coil as the sensor is shown in the figure below. The Rogowski coil sensor first converts the bus current signal into a voltage signal and then performs phase compensation through an integrator and a phase shifter. The integrator can be either analog or digital. After that, the conditioned signal is converted into a digital optical signal through A / D and E / O conversion and transmitted to the low-voltage circuit in the control room. The biggest advantage of this structure is that it effectively solves the high-voltage insulation problem, and the digital transmission signal greatly improves its anti-interference ability.
[0055] The primary conversion circuit of the Rogowski coil contains multiple links such as analog signal processing, A / D conversion, CPU control and electro-optical conversion, and its environment is harsh. The stability and reliability of the components and circuits after operation directly affect the measurement performance of the transformer. With the change of time, temperature and external electromagnetic environment, the performance of the primary circuit will inevitably change. In particular, the DC bias and AC noise and changes of the electronic circuit have a certain impact on the power measurement under light load and no load.
[0056] Under normal working conditions of the power system, the electrical signal output by the Rogowski coil is the differential of the measured current, which must be integrated to restore the measured current. The integrator actually used and the subsequent analog-to-digital conversion, electro-optical conversion and other links are all implemented by electronic circuits, and electronic circuits and components are easily affected by temperature, and the accuracy of the mutual inductor will also be affected by temperature changes.
[0057] Taking the Rogowski coil electronic current transformer as an example, the differential signal of the current is first obtained by induction of the Rogowski coil, and then restored to a voltage signal proportional to the measured current through integration. The primary conversion circuit of the Rogowski coil contains multiple links such as analog signal processing, A / D conversion, CPU control and electro-optical conversion, and its environment is harsh. After being put into operation, the stability and reliability of the components and circuits directly affect the measurement performance of the transformer. With the change of time, ambient temperature and humidity, and external electromagnetic environment, the performance of the primary circuit will inevitably change.
[0058] Influence on circuit stability and reliability. From the principle structure diagram of the Rogowski coil electronic transformer, we can see that there are many electronic components on the primary side, and their stability will directly affect the normal operation of the electronic transformer.
[0059] Influence of integrator. For active integrators, DC components can easily lead to saturation of the integrator output. First-order inertia links or corresponding improved methods are often used to suppress the saturation of the integrator output caused by DC components. This leads to non-ideal integration, resulting in phase error, and the introduction of related phase shift links to produce additional phase errors. The amplitude-frequency characteristics of digital integration are poor, and changes in signal frequency may lead to different integration results. It is more suitable for steady-state industrial frequency AC measurements, but for harmonic components that contain changes, its measurement performance needs to be evaluated in many aspects.
[0060] The influence of ambient temperature and humidity. Under normal working conditions of the power system, the output electrical signal of the Rogowski coil is the differential of the measured current, which must be integrated to restore the measured current. The integrator actually used and the subsequent analog-to-digital conversion, electro-optical conversion and other links are all implemented by electronic circuits, and electronic circuits and components are easily affected by temperature and humidity. The accuracy of the mutual inductor will also be affected by changes in temperature and humidity.
[0061] The influence of electromagnetic interference.
[0062] After years of research and development, many influencing factors of Rogowski coil sensors have been reduced to a controllable range. By using the digital integrator of the Simpson integration algorithm and increasing the sampling frequency, the measurement accuracy requirements of each harmonic can be met; in the design process of the transformer, the temperature compensation of the error after the -50℃~+85℃ temperature test can greatly eliminate the influence of temperature changes on the error of the electronic transformer; however, the humidity field has not yet been added to the research, and humidity plays a decisive role in the insulation performance of the entire circuit, so the research on multi-physical fields is urgent.
[0063] c(1.1) Experimental plan
[0064] ——Environmental conditions: Temperature range: -50~80℃; Humidity range: ≤95%RH
[0065] ——Type of experiment: Experiment
[0066] ——Experimental level: Level 4;
[0067] ——Peak voltage: auxiliary power supply: ±6kV; analog input: ±3kV;
[0068] ——Coupled mode:
[0069] ——Polarity of test voltage: Both polarities are required;
[0070] ——Experiment duration for each port: 1min
[0071] ——Group period: 300ms
[0072] ——Repetition frequency: 100kHz
[0073] ——Test port: auxiliary power port, analog input port
[0074] ——Typical working environment of the equipment under test:
[0075] Auxiliary power port: AC220V or DC220V
[0076] Analog input port: measurement current input 1.5V, protection current input 0.15V, sent to the sampling data merging unit tester for monitoring via optical fiber communication;
[0077] ——Apply the test voltage to each port of the equipment under test in turn;
[0078] ——Required auxiliary equipment (AE): small signal generator, waveform analyzer
[0079] ——Cyclic damp heat test
[0080] (1.2) Experimental results evaluation
[0081] During the experiment, the EUT should not be damaged, and there should be no communication interruption, packet loss, quality output change, or output waveform distortion.
[0082] Sampling value output characteristics:
[0083] a) During the experiment: the protection current error should meet the original technical index requirements; the measurement current error variable requirements; the change in amplitude error and phase error should not be greater than 200% of the accuracy grade index;
[0084] B) After the experiment: EUT should work normally;
[0085] Take 5 points at a temperature between 25 and 55°C (humidity maintained at 95% RH), and test the power line 100kHz±6kV and signal line 100kHz±3kV fast transient tests respectively. Table 1 is the test results of the electronic transformer electrical fast transient pulse group disturbance immunity test considering temperature and humidity factors.
[0086] Table 1
[0087]
[0088] Surge test block diagram Figure 7 As shown, the electromagnetic disturbance module is placed outside the temperature and humidity module, connected to the CDN through a high-voltage line, and the CDN and the device under test are placed in a temperature and humidity environment box.
[0089] There are two types of combination wave generators for surge generators. Choose one based on the type of port being tested. For ports connected to outdoor symmetrical communication lines, use a 10 / 700us combination wave generator. For other cases, use a 1.2 / 50us combination wave generator. We selected a 1.2 / 50us combination wave generator for testing.
[0090] The surge waveform produced by the generator is:
[0091] ——Open circuit voltage wavefront time: 1.2us
[0092] ——Open circuit voltage duration: 50us
[0093] ——Short-circuit current wavefront time: 8us
[0094] ——Short circuit current duration: 20us
[0095] Figure 8 This is the circuit schematic diagram of the 1.2 / 50us combination wave generator. Select different components R s1 , R s2 , R m , L r , C c The value of makes the generator produce a voltage surge of 1.2 / 50us (open circuit condition) and a current surge of 8 / 20us (short circuit condition). The ratio of the open circuit voltage peak value to the short circuit output current peak value of the same output port of the combination wave generator is regarded as the effective output impedance. The effective output impedance of this generator is 2Ω.
[0096] On the AC or DC power line, the decoupling network presents a high impedance to the surge wave, but at the same time allows current to pass through the EUT. This impedance can cause a voltage wave to be generated at the output of the CDN, while also preventing the reverse flow of the surge current back to the AC or DC power supply. The coupling element is designed with a high-voltage capacitor.
[0097] For I / O lines and communication lines, the series impedance of the decoupling network will limit the bandwidth of data transmission. The coupling elements used are capacitors, clamping devices and lightning arresters.
[0098] according to Fig. 9 Choose a suitable CDN for testing. Fig.10 This is the power line conducted disturbance test block diagram; Fig.11 This is the signal line conducted interference test block diagram.
[0099] (2.1) Experimental plan
[0100] ——Environmental conditions: Temperature range: -50~80℃; Humidity range: ≤95%RH
[0101] ——Experimental level: Level 4;
[0102] ——Peak voltage:
[0103] Line-ground: ±6kV
[0104] Line-to-line: ±3kV
[0105] ——Pulse repetition frequency: 1 time / 30s;
[0106] ——Number of tests: 5 times for each circuit under test and each level;
[0107] ——Coupling network: line-to-ground 12Ω / 9uF, line-to-line 2Ω / 18uF;
[0108] ——Test port: auxiliary power port
[0109] ——Typical working environment of the equipment under test:
[0110] Auxiliary power port: AC220V or DC220V
[0111] Analog input port: measurement current input 1.5V, protection current input 0.15V, sent to the sampling data merging unit tester for monitoring via optical fiber communication;
[0112] ——Apply the test voltage to each port of the equipment under test in turn;
[0113] ——Required auxiliary equipment (AE): small signal generator, waveform analyzer
[0114] ——Cyclic humidity and heat test.
[0115] (2.2) Experimental results evaluation
[0116] During the experiment, the EUT should not be damaged, and there should be no communication interruption, packet loss, quality output change, or output waveform distortion.
[0117] Sampling value output characteristics:
[0118] a) During the experiment: the protection current error should meet the original technical index requirements; the measurement current error variable requirements; the change in amplitude error and phase error should not be greater than 200% of the accuracy grade index;
[0119] b) After the experiment: EUT should work normally;
[0120] During the alternating damp heat heating and cooling process, 5 temperature and humidity levels are tested. Several groups of tests are required for each temperature and humidity point: 5 surge tests are performed for each coupling mode and each polarity voltage. (Since AC 220V is used as the power supply, the phases are required: 0°, 90°, 180°, 270°)
[0121] Table 2 is the test results of the conducted disturbance immunity of the electronic transformer RF induction considering the temperature and humidity factors.
[0122] Table 2
[0123]
[0124]
[0125] Fig.12 This is a configuration diagram of the CS electromagnetic disturbance module.
[0126] (3.1) The experimental plan is as follows:
[0127] ——Environmental conditions: Temperature range: -50~80℃; Humidity range: ≤95%RH
[0128] ——Experiment level: Level 3, disturbance level 10V;
[0129] ——Sweep frequency test parameters:
[0130] Frequency: 150kHz~80MHz;
[0131] Sweep step: 0.9%;
[0132] Dwell time: 1s;
[0133] Modulation mode: 1kHz sine wave, 80% amplitude modulation;
[0134] ——Test port: auxiliary power port, analog input port
[0135] ——Typical working environment of the equipment under test:
[0136] Auxiliary power port: AC220V or DC220V
[0137] Analog input port: measurement current input 1.5V, protection current input 0.15V, sent to the sampling data merging unit tester for monitoring via optical fiber communication;
[0138] ——Apply the test voltage to each port of the equipment under test in turn;
[0139] ——Required auxiliary equipment (AE): small signal generator, waveform analyzer
[0140] ——Cyclic humidity and heat test.
[0141] (3.2) Experimental results evaluation
[0142] During the experiment, the EUT should not be damaged, and there should be no communication interruption, packet loss, quality output change, or output waveform distortion.
[0143] Sampling value output characteristics:
[0144] a) During the experiment: the protection current error should meet the original technical index requirements; the measurement current error variable requirements; the change in amplitude error and phase error should not be greater than 200% of the accuracy grade index;
[0145] b) After the experiment: EUT should work normally.
[0146] Table 3 is the test result table of conducted disturbance immunity of electronic transformer RF induction considering temperature and humidity factors.
[0147] Table 3
[0148]
[0149]
[0150] It should be noted that the above embodiments are only used to illustrate the technical solutions of the present invention rather than to limit it. Although the present invention has been described in detail with reference to the preferred embodiments, those skilled in the art should understand that the technical solutions of the present invention may be modified or replaced by equivalents without departing from the spirit and scope of the technical solutions of the present invention, which should all be included in the scope of the claims of the present invention.
[0151] Example 2
[0152] The second embodiment of the present invention is different from the previous embodiment in that:
[0153] If the functions are implemented in the form of software functional units and sold or used as independent products, they can be stored in a computer-readable storage medium. Based on this understanding, the technical solution of the present invention, or the part that contributes to the prior art or the part of the technical solution, can be embodied in the form of a software product. The computer software product is stored in a storage medium, including several instructions for a computer device (which can be a personal computer, a server, or a network device, etc.) to perform all or part of the steps of the methods described in each embodiment of the present invention. The aforementioned storage medium includes: U disk, mobile hard disk, read-only memory (ROM, Read-Only Memory), random access memory (RAM, Random Access Memory), disk or optical disk, etc., which can store program codes.
[0154] The present application is described with reference to the flowcharts and / or block diagrams of the methods, devices (systems), and computer program products according to the embodiments of the present application. It should be understood that each process and / or box in the flowchart and / or block diagram, as well as the combination of the processes and / or boxes in the flowchart and / or block diagram, can be implemented by computer program instructions. These computer program instructions can be provided to a processor of a general-purpose computer, a special-purpose computer, an embedded processor, or other programmable data processing device to generate a machine, so that the instructions executed by the processor of the computer or other programmable data processing device generate instructions for implementing the processes in the flowchart and / or block diagram. Figure 1 A process or multiple processes and / or boxes Figure 1 A device that provides the functions specified in a block or multiple blocks.
[0155] These computer program instructions may also be stored in a computer-readable memory capable of directing a computer or other programmable data processing device to operate in a specific manner, so that the instructions stored in the computer-readable memory produce an article of manufacture comprising an instruction device, which implements the process Figure 1 A process or multiple processes and / or boxes Figure 1 A function specified in one or more boxes.
[0156] These computer program instructions can also be loaded onto a computer or other programmable data processing device so that a series of operating steps are executed on the computer or other programmable device to produce a computer-implemented process, thereby providing instructions for implementing the process. Figure 1 A process or multiple processes and / or boxes Figure 1 The steps for the functions specified in one or more boxes.
[0157] Although the preferred embodiments of the present application have been described, those skilled in the art may make other changes and modifications to these embodiments once they have learned the basic creative concept. Therefore, the appended claims are intended to be interpreted as including the preferred embodiments and all changes and modifications falling within the scope of the present application.
[0158] Obviously, those skilled in the art can make various changes and modifications to the present application without departing from the spirit and scope of the present application. Thus, if these modifications and variations of the present application fall within the scope of the claims of the present application and their equivalents, the present application is also intended to include these modifications and variations.
Claims
1. A method for testing the immunity of an electronic transformer under multi-physical field coupling, characterized in that: include, Analyze the influence mechanism of electronic transformer under the coupling of multiple physical fields; Based on the impact mechanism obtained by analysis, an electrical fast transient pulse group generator, a surge generator and a radio frequency induction conducted disturbance generator are built respectively to construct an electromagnetic disturbance module; An electronic transformer immunity test system under multi-physical fields is constructed, including an electromagnetic disturbance module, a coupling and decoupling network, a temperature and humidity condition module and an online monitoring system. The immunity of the electronic transformer under multi-physical field coupling is tested to obtain the corresponding standard electromagnetic interference under different temperature and humidity conditions.
2. The method for testing the immunity of an electronic transformer under multi-physical field coupling as claimed in claim 1, characterized in that: The analysis of the influence mechanism of the electronic transformer under the coupling of multiple physical fields includes changing the physical field parameters, using the Rogowski coil to sense the differential signal of the current, and restoring it to a voltage signal proportional to the measured current through integration, analyzing the performance change of the primary circuit under the coupling of different physical fields, and obtaining the influence factor of the electronic transformer under the coupling of multiple physical fields.
3. The method for testing the immunity of an electronic transformer under multi-physical field coupling as claimed in claim 2, characterized in that: The analysis of the influencing mechanism of the electronic mutual inductor under the coupling of multiple physical fields includes that the influencing factors of the electronic mutual inductor under the coupling of multiple physical fields include: the influence of circuit stability and reliability, the influence of integrator, the influence of ambient temperature and humidity, and the influence of electromagnetic interference.
4. The method for testing the immunity of an electronic transformer under multi-physical field coupling as claimed in claim 3, characterized in that: The internal environment temperature range of the temperature and humidity condition module is -50°C to +85°C, and the humidity is less than or equal to 95%.
5. The method for testing the immunity of an electronic transformer under multi-physical field coupling as claimed in claim 4, characterized in that: The construction of the electronic transformer immunity test system under the action of multiple physical fields comprises: independently placing an electrical fast transient pulse group generator outside a temperature and humidity condition module, connecting it to a corresponding coupling and decoupling network through a coaxial cable, placing the coupling and decoupling network and a device under test in the temperature and humidity condition module, and placing the device under test on an insulating support; The generated electrical fast transient pulse group disturbance voltage is output to the coupling-decoupling network through the coaxial cable, and is directly coupled to the working power supply of the device under test through the coupling-decoupling network; According to the working environment of the device under test, multiple groups of temperature and humidity test ranges are set. The humidity of each temperature and humidity test range is fixed. Multiple temperature test points are set for each group of temperature and humidity test ranges. At each temperature test point, electrical fast transient pulse group disturbance voltage is applied to each port of the device under test in turn. During the voltage application process, the protection current error, measurement error current, voltage amplitude error and voltage phase error are monitored to determine whether the device under test is damaged, communication is interrupted, packet is lost, quality output changes and output waveform distortion occurs; For the experimental power line test circuit, a filter is used as a coupling / decoupling network to perform an electrical fast transient pulse group immunity test; for the signal line test circuit, a capacitive coupling clamp or CDN is used as a coupling / decoupling network to perform an electrical fast transient pulse group immunity test.
6. The method for testing the immunity of an electronic transformer under multi-physical field coupling as claimed in claim 5, characterized in that: The electrical fast transient pulse group generator comprises a high voltage power supply U, an energy storage capacitor C c , switch Switch, pulse duration adjustment resistor R S , Impedance matching resistor R m and DC blocking capacitor C d ; High voltage power supply U continuously supplies energy storage capacitor C c When the voltage reaches the preset value, the switch is closed to charge the energy storage capacitor C c The voltage across the two ends is released, and the resistance R is adjusted during the pulse duration. S A fast transient pulse signal is formed on the m and DC blocking capacitor C d The signal is output to the coupling-decoupling network through a 50Ω coaxial cable, and the electrical fast transient pulse group disturbance voltage is directly coupled to the working power supply of the device under test through the coupling-decoupling network.
7. The method for testing the immunity of an electronic transformer under multi-physical field coupling as claimed in claim 6, characterized in that: The surge generator is independently placed outside the temperature and humidity condition module, connected to the corresponding coupling and decoupling network through a coaxial cable, the coupling and decoupling network and the device under test are placed inside the temperature and humidity condition module, and the device under test is placed on an insulating support; The generated surge pulse is output to the coupling-decoupling network through the coaxial cable, and is directly coupled to the working power supply of the device under test through the coupling-decoupling network; According to the working environment of the device under test, multiple groups of temperature and humidity test ranges are set, and multiple temperature and humidity test points are set for each group of temperature and humidity test ranges. In the process of alternating damp heat heating and cooling, different coupling modes and voltages of different polarities are used to apply multiple surge pulses to each port of the device under test in turn. During the voltage application process, the protection current error, measurement error current, voltage amplitude error and voltage phase error are monitored to determine whether the device under test is damaged, communication is interrupted, packet is lost, quality output changes and output waveform distortion occurs; The type of surge generator is selected according to the type of tested port. For ports connected to outdoor symmetrical communication lines, the surge generator uses a 10 / 700us combination wave generator. For other cases, the surge generator uses a 1.2 / 50us combination wave generator. The ratio of the open-circuit voltage peak to the short-circuit output current peak of the same output port of the combination wave generator is regarded as the effective output impedance. The coupling element is selected according to the type of signal line. For AC or DC power lines, the coupling element uses a high-voltage capacitor; for I / O lines and communication lines, the coupling element uses capacitors, clamping devices and lightning arresters.
8. The method for testing the immunity of an electronic transformer under multi-physical field coupling as claimed in claim 7, characterized in that: The construction of the electronic transformer immunity test system under the action of multiple physical fields includes: The RF induction conducted disturbance generator is independently placed outside the temperature and humidity condition module, connected to the corresponding coupling and decoupling network through a coaxial cable, the coupling and decoupling network and the device under test are placed inside the temperature and humidity condition module, and the device under test is placed on an insulating support; the generated conducted disturbance voltage is output to the coupling and decoupling network through the coaxial cable, and is directly coupled to the working power supply of the device under test through the coupling and decoupling network; Set multiple groups of temperature and humidity test ranges according to the working environment of the device under test, set multiple temperature and humidity test points for each group of temperature and humidity test ranges, apply conducted interference voltage to each port of the device under test, monitor the protection current error, measurement error current, voltage amplitude error and voltage phase error during the voltage application process, and judge whether the device under test is damaged, communication interrupted, packet lost, quality output changed and output waveform distorted.
9. A computer device comprising a memory and a processor, wherein the memory stores a computer program, wherein: When the processor executes the computer program, the steps of the method according to any one of claims 1 to 8 are implemented.
10. A computer-readable storage medium having a computer program stored thereon, characterized in that: When the computer program is executed by a processor, the steps of the method according to any one of claims 1 to 8 are implemented.
Citation Information
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