Photovoltaic module IV test device and photovoltaic module detection equipment

Abstract

The invention provides a photovoltaic module IV testing device and photovoltaic module detection equipment. The photovoltaic module IV testing device comprises an IV tester, a transportation assembly and a grabbing assembly, the top of the IV tester is provided with a functional board; the transportation assembly is in sliding connection with the IV tester, so that the transportation assembly can be switched between a first position and a second position in a reciprocating manner, the first position is located above the functional surface, the second position is located, and the vertical projection of the transportation assembly is located outside the surface of the functional surface; the grabbing assembly is connected with the IV tester, and the grabbing assembly can grab the non-test surface part of the to-be-tested component; wherein the transportation assembly is located at the first position, the transportation assembly transports the to-be-detected component to the position above the functional board in the first direction, the grabbing assembly grabs the to-be-detected component, and the transportation assembly moves towards the second position. The problem that in the prior art, due to the fact that assemblies or testing equipment are damaged, operators often slow down the speed, and the testing efficiency is reduced is solved.

Description

Technical Field

[0001] The present disclosure relates to the technical field of photovoltaic component detection, and in particular to a photovoltaic component IV test device and a photovoltaic component detection equipment. Background Art

[0002] With the widespread application of renewable energy, the solar photovoltaic industry is booming. As a key component, the performance of crystalline silicon cell photovoltaic modules directly affects the power generation efficiency and reliability of the system. Therefore, during the production process of modules, strict power performance tests must be carried out to ensure that they meet the standards.

[0003] Currently, the performance test of crystalline silicon cell photovoltaic modules mainly relies on IV testers. Such testers use xenon lamps to simulate sunlight and evaluate the performance of the modules by measuring the current and voltage characteristics of the modules. However, since the surface of the test platform is made of transparent glass material so that the xenon lamp can fully illuminate the modules, it is necessary to be particularly careful when placing the modules. Operators must handle the modules with care to prevent any accidental collisions, because even a slight impact may cause damage to the glass surface of the module or the tester.

[0004] Operators often slow down due to concerns about damage to components or test equipment, resulting in reduced test efficiency. This situation not only prolongs the test time of a single component, but also has a negative impact on the production efficiency of the entire production line. Therefore, there is an urgent need for a method to improve the safety and efficiency of operations during the component testing phase, thereby optimizing the performance of the overall production line. Summary of the invention

[0005] A technical problem to be solved by the present disclosure is that in the prior art, operators often slow down due to concerns about damage to components or test equipment, resulting in reduced test efficiency.

[0006] In order to solve the above technical problems, the present disclosure provides a photovoltaic module IV test device, which includes:

[0007] IV tester, the top of the IV tester has a functional panel;

[0008] A transport assembly, the transport assembly is slidably connected to the IV tester so that the transport assembly can switch back and forth between a first position and a second position, the first position being above the functional surface, and in the second position, a vertical projection of the transport assembly is outside the functional panel surface;

[0009] A grabbing component, the grabbing component is connected to the IV tester, and the grabbing component can grab the non-test surface part of the component to be tested;

[0010] Among them, the transport component is in the first position, the transport component transports the component to be tested along the first direction to above the functional board surface, the grabbing component grabs the component to be tested, the transport component moves to the second position, the IV tester tests the component to be tested, and the first direction is parallel to the functional board surface.

[0011] Furthermore, the transport component includes: two transport parts, the two transport parts are slidably connected to the top of the IV tester and are arranged at intervals along the second direction, the two transport parts can move closer to each other along the second direction to the first position, or move away from each other along the second direction to the second position, the second direction is parallel to the functional panel surface and perpendicular to the first direction.

[0012] Further, the transport component comprises:

[0013] A slideway structure, wherein two slideway structures are symmetrically arranged on both sides of the functional panel along the first direction and are fixedly connected to the IV tester;

[0014] Shipping parts include:

[0015] A load-bearing beam, the load-bearing beam extends along a first direction, and two ends of the load-bearing beam are respectively slidably connected to the two slideway structures;

[0016] Rollers, multiple pairs of rollers are arranged at intervals along the first direction, and two rollers in each pair of rollers are arranged opposite to each other on two bearing beams.

[0017] Furthermore, the crawling component includes:

[0018] A first telescopic structure, the first telescopic structure is connected to the IV tester, and the first telescopic structure can be telescoped in a vertical direction;

[0019] The vacuum suction cup structure is located in the middle position above the functional panel surface, and the vacuum suction cup structure is connected to the telescopic end of the first telescopic structure, so that the vacuum suction cup can be close to or away from the functional panel surface.

[0020] Furthermore, the vacuum cup structure comprises:

[0021] A first connecting rod and a second connecting rod, wherein a middle portion of the first connecting rod is rotatably connected to a middle portion of the second connecting rod;

[0022] The first suction cup and the second suction cup are respectively arranged at two ends of the first connecting rod and two ends of the second connecting rod, and the suction end of the first suction cup is flush with the suction end of the second suction cup.

[0023] Furthermore, the crawling component includes:

[0024] A second telescopic structure, wherein the two second telescopic structures are symmetrically arranged on both sides of the IV tester along a second direction, and the second telescopic structure can be telescoped along the second direction;

[0025] The clamping block is located above the IV tester, and the two clamping blocks are respectively connected to the telescopic ends of the two second telescopic structures so that the two second telescopic structures can be relatively close to or away from each other along the second direction.

[0026] Furthermore, the photovoltaic module IV test device also includes:

[0027] A cleaning assembly is provided with a plurality of cleaning rollers spaced apart along a first direction, the cleaning assembly is arranged on one side of the transport assembly along the first direction, and the cleaning assembly can transfer the cleaned components to be tested to the transport assembly.

[0028] Further, the second telescopic structure comprises:

[0029] A first sub-telescopic rod, the first sub-telescopic rod extends in a vertical direction, the first sub-telescopic rod is connected to a surface of the IV tester, and a telescopic end of the first sub-telescopic rod can be telescoped in a vertical direction;

[0030] The second sub-telescopic rod extends along the second direction, one end of the second sub-telescopic rod is connected to the telescopic end of the first sub-telescopic rod, and the other end of the second sub-telescopic rod is connected to the clamping block.

[0031] Furthermore, the photovoltaic module IV test device also includes:

[0032] A detection module, which is arranged on the transport component and is used to detect the position information of the component to be tested;

[0033] A processing module, the processing module is connected with the detection module and the IV tester;

[0034] A driving module, the driving module is connected with the processing module, the transport component and the grabbing component;

[0035] The processing module controls the driving module to drive the transport component and the grabbing component according to the position information and the information of the IV tester.

[0036] A second aspect of the present disclosure provides a photovoltaic panel detection device, which includes the photovoltaic component IV test device provided by the first aspect of the present disclosure.

[0037] A photovoltaic panel detection device provided in the second aspect of the present disclosure can directly use a photovoltaic module IV test device provided in the first aspect above. The specific implementation structure can refer to the relevant content described in the first aspect above, which will not be repeated here.

[0038] A first aspect of the present disclosure provides a photovoltaic component IV test device, which includes: an IV tester, a transport component and a grabbing component; the top of the IV tester is provided with a functional panel; the transport component is slidably connected to the IV tester, driving the transport component to slide relative to the IV tester so that the transport component switches between a first position and a second position; the grabbing component is connected to the IV tester; during the operation of the device, the test surface of the component to be tested is arranged on the transport component, the transport component is in the first position, the transport component transports the component to be tested to above the functional panel, then the grabbing component grabs the component to be tested, the transport component moves to the second position, the functional surface of the IV tester is facing the test surface of the component to be tested, and tests it.

[0039] With this arrangement, the transport and testing process of the component to be tested do not come into contact with the functional panel surface, effectively avoiding damage to the functional surface due to operation, thus speeding up the transport speed and improving production efficiency. Since during the testing process of the component to be tested, the transport component is in the second position, the vertical projection of the transport component is outside the functional panel surface, and the gripping component grips the non-test surface portion of the component to be tested, the influence of the transport component and the gripping component on the test can be effectively avoided. BRIEF DESCRIPTION OF THE DRAWINGS

[0040] In order to more clearly illustrate the embodiments of the present disclosure or the technical solutions in the prior art, the drawings required for use in the embodiments or the description of the prior art will be briefly introduced below. Obviously, the drawings described below are only some embodiments of the present disclosure. For ordinary technicians in this field, other drawings can be obtained based on these drawings without paying any creative work.

[0041] Figure 1 is a structural schematic diagram of a first photovoltaic module IV test device disclosed in an embodiment of the present disclosure from a first viewing angle;

[0042] Figure 2 is a structural schematic diagram of the first photovoltaic module IV test device disclosed in the embodiment of the present disclosure from a second viewing angle;

[0043] Figure 3 is a structural schematic diagram of a second photovoltaic module IV test device disclosed in an embodiment of the present disclosure from a first viewing angle;

[0044] Figure 4 It is a structural schematic diagram of the second photovoltaic module IV testing device disclosed in the embodiment of the present disclosure from a second viewing angle.

[0045] Description of reference numerals:

[0046] 1. IV tester; 11. Functional panel;

[0047] 2. transport assembly; 21. transport component; 211. load beam; 212. roller; 22. slideway structure;

[0048] 3. Grabbing assembly; 31. First telescopic structure; 311. Third sub-telescopic rod; 312. Mounting frame; 32. Vacuum suction cup structure; 321. First connecting rod; 322. Second connecting rod; 323. First suction cup; 324. Second suction cup; 33. Second telescopic structure; 331. First sub-telescopic rod; 332. Second sub-telescopic rod; 34. Clamping block;

[0049] 4. Cleaning assembly; 41. Cleaning roller;

[0050] 5. Components to be tested; A. first direction; B. second direction. DETAILED DESCRIPTION

[0051] The following is a further detailed description of the embodiments of the present disclosure in conjunction with the accompanying drawings and examples. The detailed description of the following embodiments and the accompanying drawings are used to exemplarily illustrate the principles of the present disclosure, but cannot be used to limit the scope of the present disclosure. The present disclosure can be implemented in many different forms and is not limited to the specific embodiments disclosed herein, but includes all technical solutions that fall within the scope of the claims.

[0052] The present disclosure provides these embodiments to make the present disclosure thorough and complete, and to fully express the scope of the present disclosure to those skilled in the art. It should be noted that unless otherwise specifically stated, the relative arrangement of the parts and steps, the composition of the materials, the numerical expressions and the numerical values ​​set forth in these embodiments should be interpreted as being merely exemplary, and not as limiting.

[0053] It should be noted that, in the description of the present disclosure, unless otherwise specified, the meaning of "multiple" is greater than or equal to two; the terms "upper", "lower", "left", "right", "inner", "outer", etc., indicating the orientation or positional relationship, are only for the convenience of describing the present disclosure and simplifying the description, and do not indicate or imply that the device or element referred to must have a specific orientation, be constructed and operated in a specific orientation, and therefore cannot be understood as a limitation of the present disclosure. When the absolute position of the object being described changes, the relative positional relationship may also change accordingly.

[0054] In addition, the words "first", "second" and similar words used in the present disclosure do not indicate any order, quantity or importance, but are only used to distinguish different parts. "Vertical" does not mean vertical in the strict sense, but is within the tolerance range. "Parallel" does not mean parallel in the strict sense, but is within the tolerance range. "Include" or "comprising" and similar words mean that the elements before the word include the elements listed after the word, and do not exclude the possibility of including other elements.

[0055] It should also be noted that in the description of the present disclosure, unless otherwise clearly specified and limited, the terms "installed", "connected", and "connected" should be understood in a broad sense. For example, it can be a fixed connection, a detachable connection, or an integral connection; it can be directly connected or indirectly connected through an intermediate medium. For ordinary technicians in this field, the specific meanings of the above terms in the present disclosure can be understood according to the specific circumstances. When a specific device is described as being located between a first device and a second device, there may or may not be an intermediate device between the specific device and the first device or the second device.

[0056] All terms used in the present disclosure have the same meanings as those understood by those of ordinary skill in the art to which the present disclosure belongs, unless otherwise specifically defined. It should also be understood that terms defined in general dictionaries, for example, should be interpreted as having meanings consistent with their meanings in the context of the relevant technology, and should not be interpreted in an idealized or extremely formal sense, unless explicitly defined as such herein.

[0057] Technologies, methods, and equipment known to ordinary technicians in the relevant art may not be discussed in detail, but where appropriate, the technologies, methods, and equipment should be considered part of the specification.

[0058] Embodiment 1

[0059] like Figure 1 , 2 As shown, embodiment 1 of the first aspect of the present disclosure provides a first photovoltaic module IV testing device, which includes: an IV tester 1, a transport component 2 and a grabbing component 3; the top of the IV tester 1 has a functional panel 11; the transport component 2 is slidably connected to the IV tester 1 so that the transport component 2 can switch back and forth between a first position and a second position, the first position is located above the functional panel 11, and in the second position, the vertical projection of the transport component 2 is located outside the functional panel 11; the grabbing component 3 is connected to the IV tester 1, and the grabbing component 3 can grab the non-test surface portion of the component to be tested 5; wherein, the transport component 2 is in the first position, the transport component 2 transports the component to be tested 5 along the first direction A to above the functional panel 11, the grabbing component 3 grabs the component to be tested 5, the transport component 2 moves to the second position, the IV tester 1 tests the component to be tested, and the first direction A is parallel to the functional panel 11.

[0060] Specifically, the IV tester 1 can be a standard IV tester in the prior art, and is not specifically limited thereto. The functional panel 11 on the top of the IV tester 1 can be a glass surface of the IV tester 1, and the xenon lamp inside it can emit test light through the glass panel surface to illuminate the test surface of the component to be tested 5. The component to be tested 5 can be a conventional photovoltaic component, that is, a photovoltaic panel. The test surface of the component to be tested 5 can be understood as the surface of the photovoltaic panel for receiving light.

[0061] The transport assembly 2 may be a plurality of assemblies with transmission rollers, and the transport of the component to be tested 5 is realized by placing the component to be tested 5 on the transmission roller of the transport assembly 2. The transport assembly 2 may also be a transmission belt assembly, which is not specifically limited. The surface to be tested of the component to be tested 5 is directed toward the transport surface of the transport assembly 2, and then placed on the transport assembly 2, so as to realize the transport of the component to be tested 5. The sliding connection between the transport assembly 2 and the IV tester 1 may be realized by a ball screw, which is not specifically limited. When in the first position, the transport assembly 2 is above the functional panel 11, and it can be understood that the vertical downward projection of the transport assembly 2 can be located in the functional panel 11, and the transport assembly 2 can transport the component to be tested 5 to the preset position of the functional panel 11, and the preset position is above the functional panel 11, and the vertical downward projection of the component to be tested 5 is all located in the functional panel 11, and the test surface of the component to be tested 5 is facing the functional panel 11. When in the second position, the vertical projection of the transport assembly 2 is located outside the functional panel 11, that is, the transport assembly 2 is no longer located above the functional panel 11.

[0062] The gripping component 3 is not specifically limited, and the gripping component 3 and the IV tester 1 can be fixedly connected. The non-test surface portion of the component to be tested 5 can be the side adjacent to the test surface of the component to be tested 5, or the surface opposite to the test surface. The first direction A is the transport direction of the transport component 2. In this embodiment, the functional panel 11 of the IV tester 1 can be a rectangular panel, and the first direction A is parallel to the length direction of the functional panel 11.

[0063] When the transport component 2 transports the component to be tested 5 to the preset position, the grabbing component 3 grabs the component to be tested 5. At this time, the grabbing component 3 can drive the component to be tested 5 to move in the vertical direction, but does not have the ability to move in the first direction A and the second direction B. After the grabbing component 3 fixes the component to be tested 5, the transport component 2 moves in the second direction B or the first direction A, so that the transport component 2 is no longer above the functional panel 11. At this time, the test surface of the component to be tested 5 is facing the functional panel without any obstruction, and the IV tester 1 tests the component to be tested 5.

[0064] Embodiment 1 of the first aspect of the present disclosure provides a photovoltaic module IV test device, which includes: an IV tester 1, a transport component 2 and a grabbing component 3; the top of the IV tester 1 has a functional panel 11; the transport component 2 is slidably connected to the IV tester 1, driving the transport component 2 to slide relative to the IV tester 1, so that the transport component 2 switches between a first position and a second position; the grabbing component 3 is connected to the IV tester 1; during the operation of the device, the test surface of the component to be tested 5 is arranged on the transport component 2, the transport component 2 is in the first position, the transport component 2 transports the component to be tested to above the functional panel 11, and then the grabbing component 3 grabs the component to be tested 5, the transport component 2 moves to the second position, the functional surface of the IV tester 1 is facing the test surface of the component to be tested 5, and tests it.

[0065] With such arrangement, the transport and testing process of the component to be tested 5 do not contact the functional panel surface 11, effectively avoiding damage to the functional surface due to operation, thus speeding up the transport speed and improving production efficiency. Since during the testing process of the component to be tested 5, the transport component 2 is in the second position, the vertical projection of the transport component 2 is outside the functional panel surface 11, and the gripping component 3 grips the non-test surface portion of the component to be tested, the influence of the transport component 2 and the gripping component 3 on the test can be effectively avoided.

[0066] like Figure 1 , 2 As shown, in some embodiments, the transport component 2 includes: two transport parts 21, the two transport parts 21 are slidably connected to the top of the IV tester 1, and are arranged at intervals along the second direction B. The two transport parts 21 can move closer to each other along the second direction B to the first position, or move away from each other along the second direction B to the second position. The second direction B is parallel to the functional panel 11 and perpendicular to the first direction A.

[0067] Specifically, the two transport components 21 can be two transmission belts capable of synchronous transmission, and are not specifically limited. The sliding connection between the two transport components 21 and the IV tester 1 can be achieved through a ball screw pair, so that the two transport components 21 can be relatively close or relatively far away along the second direction B. The second direction B is parallel to the functional panel 11 and perpendicular to the first direction A. In this embodiment, the second direction B can be the width direction of the functional panel 11. During operation, the two transport components 21 are in the first position, that is, above the functional panel 11, and the component to be tested 5 is transported to a preset position. After the component to be tested 5 is subsequently captured by the grasping component 3, the two transport components 2 move away from each other in the second direction B to move to the second position, thereby avoiding interference with the test process of the component to be tested 5. When the test is completed, the two transport components 21 approach each other to the first position along the second direction B, and the grasping component places the component to be tested 5 that has completed the test on the two transport components 21, and the two transport components 21 transport it to the next step.

[0068] By moving the two transport components 21 closer to or farther away from each other along the second direction B, the transport component 2 can be switched between the first position and the second position, which can effectively reduce the time required for the transport component 2 to move, speed up the production cycle, and improve production efficiency.

[0069] like Figure 1 , 2 As shown, in some embodiments, the transport component 2 includes: a slide structure 22, two slide structures 22 are symmetrically arranged on both sides of the functional panel 11 along the first direction A, and are fixedly connected to the IV tester 1; the transport component 21 includes: a load-bearing beam 211 and a roller 212; the load-bearing beam 211 extends along the first direction A, and the two ends of the load-bearing beam 211 are respectively slidably connected to the two slide structures 22; a plurality of pairs of rollers 212 are arranged at intervals along the first direction A, and the two rollers 212 in each pair of rollers 212 are respectively arranged on the two load-bearing beams 211 opposite to each other.

[0070] Specifically, the slideway structure 22 can be an electromagnetically driven slideway or a motor-driven slideway, and its specific type is not limited. The slideway structure 22 extends along the second direction B, and the connection between the two slideway structures 22 and the IV tester 1 can be fixed by bolts or clamped by a slot, and its specific connection method is not limited.

[0071] The connection between the two ends of the load-bearing beam 211 and the two slideway structures 22 can be achieved through sliders, which is not specifically limited. The load-bearing beam 211 can be a hollow metal beam to facilitate the internal arrangement of a drive motor for driving the roller 212 to rotate. The specific number of rollers 212 is not limited and can be selected according to the size of the load-bearing beam 211, the roller 212, and the size of the component 5 to be tested. The roller 212 and the load-bearing beam 211 can be connected through bearings and a rotating shaft. Such a configuration is simple in structure and low in cost.

[0072] like Figure 1 , 2 As shown, in some embodiments, the grabbing assembly 3 includes: a first telescopic structure 31 and a vacuum suction cup structure 32; the first telescopic structure 31 is connected to the IV tester 1, and the first telescopic structure 31 can be telescoped in the vertical direction; the vacuum suction cup structure 32 is located in the middle position above the functional panel surface 11, and the vacuum suction cup structure 32 is connected to the telescopic end of the first telescopic structure 31, so that the vacuum suction cup can be close to or away from the functional panel surface 11.

[0073] Specifically, the first telescopic structure 31 can be a matching structure between a sliding telescopic and mounting bracket 312, which is not specifically limited. In the present embodiment, the first telescopic structure 31 can be a combination structure of a third sub-telescopic rod 311 and a mounting bracket 312. The mounting bracket can be a bending bracket, one end of which is fixedly connected to the IV tester 1 by welding or bolting, and one end of the third sub-telescopic rod 311 is mounted on the other end of the mounting bracket so that the third sub-telescopic rod 311 is in a vertical state and is located at the center above the functional panel 11. The vacuum suction cup structure 32 is connected to the other end of the third sub-telescopic rod 311, and the suction end of the vacuum suction cup structure 32 is facing the functional panel 11.

[0074] During operation, when the transport component 2 transports the component to be tested 5 to the preset position, the third sub-telescopic rod 311 drives the vacuum suction cup structure 32 to move vertically downward, and holds the plane of the component to be tested 5 opposite to the test surface. After the holding is stable, the third telescopic rod drives the vacuum suction cup structure 32 to move vertically upward, and the two transport components 21 move relatively away from each other along the second direction B to the second position, and the third telescopic rod drives the vacuum suction cup structure 32 to move vertically downward, so that the test surface of the component to be tested 5 is as close to the functional surface as possible, but the two do not contact. After the test of the component to be tested 5 is completed, the third telescopic rod drives the vacuum suction cup structure 32 to move vertically upward, and when the two transport components 21 are relatively close to the first position along the second direction B, the third telescopic rod drives the vacuum suction cup structure 32 to place the component to be tested 5 that has completed the test on the transport component 2, so that the component to be tested 5 that has completed the test is transported to the next process.

[0075] like Figure 1 , 2As shown, in some embodiments, the photovoltaic component IV testing device also includes: a cleaning component 4, in which a plurality of cleaning rollers 41 are arranged at intervals along a first direction A, and the cleaning component 4 is arranged on one side of the transport component 2 along the first direction A, and the cleaning component 4 can transfer the cleaned component 5 to be tested to the transport component 2.

[0076] Specifically, the cleaning component 4 can be a conventional cleaning table, in which a plurality of cleaning rollers 41 are arranged, and a cleaning flannel strip is arranged on the plurality of cleaning rollers 41, so as to clean the components to be tested while transporting the components to be tested 5. The cleaning component 4 and the IV tester 1 are arranged in sequence along the first direction A, and the rotation direction of the plurality of cleaning rollers 41 is the same as the rotation direction of the plurality of rollers 212. In this embodiment, the highest points of the plurality of cleaning rollers 41 and the highest points of the plurality of rollers 212 are in the same plane, so that the components to be tested 5 transported on the plurality of cleaning rollers 41 can be transferred to the transport component 2. The cleaning component 4 can clean the covering and stains on the test surface of the components to be tested 5 to avoid affecting the test results of the components to be tested 5.

[0077] like Figure 1 , 2 As shown, in some embodiments, the photovoltaic component IV test device also includes: a detection module, a processing module and a driving module; the detection module is arranged on the transport component 2, and is used to detect the position information of the component to be tested 5; the processing module is connected to the detection module and the IV tester 1; the driving module is connected to the processing module, the transport component 2 and the grasping component 3; wherein the processing module controls the driving module to drive the transport component 2 and the grasping component 3 according to the position information and the information of the IV tester 1.

[0078] Specifically, the detection module can be a position sensor, and the processing module can be a computer or a processor, which is not specifically limited. The driving module can have multiple driving devices to drive the transport component 2 and the grabbing component 3 respectively. The position sensor is arranged on the transport component 2, and the position sensor can detect the position information of the component to be tested 5. When the component to be tested 5 is in a preset position, the detection module continuously sends the position information to the processing module, and the processing module controls the driving module, and the driving module drives the roller 212 to rotate to transport the component to be tested 5.

[0079] After the detection component detects that the component to be tested 5 moves to the preset position, the processing module controls the driving module to stop the rotation of the driving roller 212, drives the grabbing component 3 to grab the component to be tested 5, and then drives the transport component 2 to the second position, and tests the component to be tested 5 through the IV tester 1. When the test is completed, the IV tester 1 sends a test completion message to the processing module, and the processing module controls the driving module to drive the transport component 2 to move to the first position, and drives the grabbing component 3 to place the component to be processed that has completed the test on the transport component 2 and transport it to the next process.

[0080] like Figure 1 , 2 As shown, in some embodiments, the vacuum suction cup structure 32 includes: a first connecting rod 321, a second connecting rod 322, a first suction cup 323 and a second suction cup 324; the middle part of the first connecting rod 321 is rotatably connected to the middle part of the second connecting rod 322; two first suction cups 323 and two second suction cups 324 are respectively arranged at both ends of the first connecting rod 321 and at both ends of the second connecting rod 322, and the suction end of the first suction cup 323 is flush with the suction end of the second suction cup 324.

[0081] Specifically, the first connecting rod 321 and the second connecting rod 322 can be conventional straight rods, and the rotational connection between the middle parts of the first connecting rod 321 and the second connecting rod 322 can be achieved by inserting a rotating shaft in the middle parts of the two, which is not specifically limited, so that the first connecting rod 321 and the second connecting rod 322 have a certain damping during the relative rotation. The connection relationship between the first suction cup 323 and the first connecting rod 321 and the second suction cup 324 and the second connecting rod 322 can be fixed by bolts or rivets, which is not specifically limited. The flushing of the suction ends of the first suction cup 323 and the second suction cup 324 can be understood as that the suction ends of the two are in the same plane, and a pad can be set between the first suction cup 323 and the first connecting rod 321 or the second suction cup 324 and the second connecting rod 322 to achieve the flushing of the suction ends of the first suction cup 323 and the suction ends of the second suction cup 324.

[0082] Embodiment 2

[0083] like Figure 3 , 4 As shown, the first embodiment provided by the first aspect of the present disclosure provides a second photovoltaic module IV test device, and its gripping device includes: a second telescopic structure 33 and a clamping block 34; the two second telescopic structures 33 are symmetrically arranged on both sides of the IV tester 1 along the second direction B, and the second telescopic structure 33 can be telescoped along the second direction B; the clamping block 34 is located above the IV tester 1, and the two clamping blocks 34 are respectively connected to the telescopic ends of the two second telescopic structures 33, so that the two second telescopic structures 33 can be relatively close to or away from each other along the second direction B.

[0084] Specifically, the second telescopic structure 33 can be a combination of a telescopic rod and a second mounting bracket 312. One end of the second mounting bracket 312 is fixedly connected to the IV tester 1 by bolts or welding, and the other end is connected to one end of the telescopic rod. The other end of the telescopic rod is provided with a clamping block 34. The two clamping blocks 34 can be relatively approached or moved away from each other by extending and retracting the telescopic rod.

[0085] During operation, when the component to be tested 5 moves to the preset position, the two symmetrically arranged clamping blocks 34 can be relatively close to each other along the second direction B, so that the two clamping blocks 34 respectively abut against two adjacent surfaces of the test surface of the component to be tested 5 along the second direction B, so as to clamp the component to be tested 5. When the test of the component to be tested 5 is completed, the two clamping blocks 34 are relatively separated along the second direction B, so that the tested component to be tested 5 is placed on the transport assembly 2.

[0086] like Figure 3 , 4 As shown, in some embodiments, the second telescopic structure 33 includes: a first sub-telescopic rod 331 and a second sub-telescopic rod 332; the first sub-telescopic rod 331 extends in a vertical direction, the first sub-telescopic rod 331 is connected to the surface of the IV tester 1, and the telescopic end of the first sub-telescopic rod 331 can be telescoped in a vertical direction; the second sub-telescopic rod 332 extends in a second direction B, one end of the second sub-telescopic rod 332 is connected to the telescopic end of the first sub-telescopic rod 331, and the other end thereof is connected to the clamping block 34.

[0087] Specifically, the first sub-telescopic rod 331 extends in the vertical direction, and the side wall of the first sub-telescopic rod 331 can be connected to the side wall of the IV tester 1, and the connection method can be bolted or welded, which is not specifically limited. One end of the second sub-telescopic rod 332 is connected to the telescopic end of the first sub-telescopic rod 331, so that the first sub-telescopic rod 331 can drive the second sub-telescopic rod 332 to move in the vertical direction when the first sub-telescopic rod 331 is extended. The other end of the second sub-telescopic rod 332 is connected to the clamping block 34, and the connection method can be clamped or threaded, which is not specifically limited. The telescopic process of the two second sub-telescopic rods 332 can drive the two clamping blocks 34 to be relatively close or relatively far away, so as to achieve the clamping or release of the component 5 to be tested. The first sub-telescopic rod 331 can adjust the height of the clamping block 34, so that the clamping block 34 can be located at different heights to adapt to the components 5 to be tested of different thicknesses.

[0088] Except for the above-mentioned features, the other features of the second embodiment provided by the first aspect of the present disclosure are the same as those of the first embodiment provided by the first aspect of the present disclosure. For details, please refer to the description of the first embodiment, which will not be repeated here.

[0089] Embodiment 3

[0090] Embodiment 3 of the second aspect of the present disclosure provides a photovoltaic panel detection device, which includes the photovoltaic component IV test device described in any one of Embodiment 1 or Embodiment 2 of the present disclosure.

[0091] Specifically, the photovoltaic module IV test device described in this embodiment three can directly use the photovoltaic module IV test device provided in the above embodiment one or embodiment two. The specific implementation structure can refer to the relevant content described in the above embodiment one or embodiment two, which will not be repeated here.

[0092] The photovoltaic panel detection equipment provided in the second aspect of the present disclosure adopts the photovoltaic module IV testing device provided in the first or second embodiment of the present disclosure. The components 5 to be tested do not come into contact with the functional panel surface 11 during transportation and testing, and there is no need to worry about damage to the functional panel surface 11 of the IV tester 1. This can speed up the transportation speed, thereby speeding up the detection rate of the photovoltaic panel detection equipment.

[0093] So far, various embodiments of the present disclosure have been described in detail. In order to avoid obscuring the concept of the present disclosure, some details known in the art are not described. Based on the above description, those skilled in the art can fully understand how to implement the technical solution disclosed here.

[0094] Although some specific embodiments of the present disclosure have been described in detail by way of examples, it should be understood by those skilled in the art that the above examples are for illustration only and are not intended to limit the scope of the present disclosure. It should be understood by those skilled in the art that the above embodiments may be modified or some technical features may be replaced by equivalents without departing from the scope and spirit of the present disclosure. In particular, the various technical features mentioned in the various embodiments may be combined in any manner as long as there is no structural conflict.

Claims

1. A photovoltaic module IV test device, characterized in that: include: An IV tester (1), wherein the top of the IV tester (1) has a functional panel (11); A transport component (2), the transport component (2) being slidably connected to the IV tester (1) so that the transport component (2) can switch back and forth between a first position and a second position, the first position being located above the functional panel (11), and the second position being a vertical projection of the transport component (2) being located outside the functional panel (11); A gripping assembly (3), the gripping assembly (3) being connected to the IV tester (1), the gripping assembly (3) being capable of gripping a non-test surface portion of the component to be tested (5); The transport component (2) is in a first position, the transport component (2) transports the component to be tested along a first direction (A) to above the functional panel (11), the grabbing component (3) grabs the component to be tested (5), the transport component (2) moves to the second position, the IV tester (1) tests the component to be tested (5), and the first direction (A) is parallel to the functional panel (11).

2. The photovoltaic module IV test device according to claim 1, characterized in that: The transport component (2) comprises: Two transport components (21), the two transport components (21) are slidably connected to the top of the IV tester (1), and are arranged at intervals along a second direction (B), the two transport components (21) can move towards each other along the second direction (B) to the first position, or move away from each other along the second direction (B) to the second position, and the second direction (B) is parallel to the functional panel (11) and perpendicular to the first direction (A).

3. The photovoltaic module IV test device according to claim 1, characterized in that: The transport component (2) comprises: A slideway structure (22), wherein two slideway structures (22) are symmetrically arranged on both sides of the functional panel (11) along the first direction (A) and are fixedly connected to the IV tester (1); The transport component (21) comprises: A load-bearing beam (211), the load-bearing beam (211) extending along a first direction (A), two ends of the load-bearing beam (211) being slidably connected to the two slideway structures (22) respectively, and the two load-bearing beams (211) being arranged at intervals along a second direction (B); Rollers (212), wherein a plurality of pairs of the rollers (212) are arranged at intervals along the first direction (A), and two rollers (212) in each pair of rollers (212) are arranged oppositely on the two bearing beams (211) respectively.

4. The photovoltaic module IV test device according to claim 1, characterized in that: The grabbing component (3) comprises: A first telescopic structure (31), the first telescopic structure (31) is connected to the IV tester (1), and the first telescopic structure (31) can be telescoped in a vertical direction; A vacuum suction cup structure (32), wherein the vacuum suction cup structure (32) is located in the middle position above the functional panel surface (11), and the vacuum suction cup structure (32) is connected to the telescopic end of the first telescopic structure (31), so that the vacuum suction cup can be close to or away from the functional panel surface (11).

5. The photovoltaic module IV test device according to claim 4, characterized in that: The vacuum suction cup structure (32) comprises: A first connecting rod (321) and a second connecting rod (322), wherein a middle portion of the first connecting rod (321) is rotatably connected to a middle portion of the second connecting rod (322); A first suction cup (323) and a second suction cup (324), wherein the two first suction cups (323) and the two second suction cups (324) are respectively arranged at two ends of the first connecting rod (321) and two ends of the second connecting rod (322), and the suction end of the first suction cup (323) and the suction end of the second suction cup (324) are flush.

6. The photovoltaic module IV test device according to claim 2, characterized in that: The grabbing component (3) comprises: A second telescopic structure (33), wherein two second telescopic structures (33) are symmetrically arranged on both sides of the IV tester (1) along the second direction (B), and the second telescopic structure (33) can be telescoped along the second direction (B); A clamping block (34), wherein the clamping block (34) is located above the IV tester (1), and the two clamping blocks (34) are respectively connected to the telescopic ends of the two second telescopic structures (33), so that the two second telescopic structures (33) can be relatively close to or away from each other along the second direction (B).

7. The photovoltaic module IV test device according to claim 1, characterized in that: Also includes: A cleaning component (4), wherein a plurality of cleaning rollers (41) are arranged at intervals along the first direction (A), and the cleaning component (4) is arranged on one side of the transport component (2) along the first direction (A), and the cleaning component (4) is capable of transferring the cleaned component to be tested (5) to the transport component (2).

8. The photovoltaic module IV test device according to claim 6, characterized in that: The second telescopic structure (33) comprises: A first sub-telescopic rod (331), the first sub-telescopic rod (331) extending in a vertical direction, the first sub-telescopic rod (331) being connected to a surface of the IV tester (1), and the telescopic end of the first sub-telescopic rod (331) being capable of telescoping in a vertical direction; A second sub-telescopic rod (332), the second sub-telescopic rod (332) extends along the second direction (B), one end of the second sub-telescopic rod (332) is connected to the telescopic end of the first sub-telescopic rod (331), and the other end thereof is connected to the clamping block (34).

9. The photovoltaic module IV test device according to claim 1, characterized in that: Also includes: a detection module, the detection module being arranged on the transport component (2) and being used for detecting position information of the component to be tested (5); a processing module connected to the detection module and the IV tester (1); A driving module, the driving module being connected to the processing module, the transport component (2) and the grabbing component (3); Wherein, the processing module controls the driving module to drive the transport component (2) and the grabbing component (3) according to the position information and the information of the IV tester (1).

10. A photovoltaic module detection device, characterized in that: A photovoltaic module IV testing device comprising any one of claims 1 to 9.

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