AOI device non-stop automatic inspection correction method and system

Abstract

The application discloses an AOI equipment non-stop automatic inspection correction method and system, and relates to the technical field of production line production optimization. The method comprises the following steps: based on an equidistant sampling mode, after a set number of silicon-based OLED products are produced, a target electronic sample is obtained, the target electronic sample is displayed, a product display result corresponding to the target electronic sample is obtained, the product display result corresponding to the target electronic sample is detected by an AOI equipment, and an electronic sample detection parameter corresponding to the target electronic sample is obtained. The electronic sample detection parameter comprises the length, width, area and gray scale of the electronic sample. The stability of the AOI equipment is determined according to the electronic sample detection parameter corresponding to the target electronic sample and an allowable range of the electronic sample. The stability of the AOI equipment is used to determine whether the AOI equipment needs to be adjusted. The application realizes the AOI equipment non-stop automatic inspection correction.

Description

TECHNICAL FIELD

[0001] The present application relates to the technical field of production line production optimization, in particular to an AOI equipment non-stop automatic inspection correction method and system. BACKGROUND

[0002] The organic light emitting diode (silicon-based OLED) has subpixel level bright spot defects (um level), and the defects require high detection stability of the automatic optical inspection machine (AOI). However, during the automatic operation of the AOI equipment, factors such as motor jitter cause the camera to be unstable, affecting the detection result, so the camera system of the equipment needs to be inspected regularly. However, the existing inspection system uses physical inspection, which requires the equipment to be shut down for inspection and correction of each camera, and the shutdown inspection affects the equipment utilization rate and production line production. Therefore, an AOI equipment non-stop automatic inspection correction method is urgently needed. SUMMARY

[0003] The purpose of the present application is to provide an AOI equipment non-stop automatic inspection correction method and system, which can realize AOI equipment non-stop automatic inspection correction and avoid affecting the equipment utilization rate and production line production.

[0004] To achieve the above purpose, the present application provides the following solutions:

[0005] In a first aspect, the present application provides an AOI equipment non-stop automatic inspection correction method, comprising:

[0006] In the mass production process of silicon-based OLED products, based on the equidistant sampling method, after producing a set number of silicon-based OLED products, a target electronic sample is obtained; the target electronic sample is used to represent the silicon-based OLED product;

[0007] The target electronic sample is displayed to obtain a product display result corresponding to the target electronic sample;

[0008] The product display result corresponding to the target electronic sample is detected by the AOI equipment to obtain an electronic sample detection parameter corresponding to the target electronic sample; the electronic sample detection parameter includes the length, width, area and gray scale of the electronic sample;

[0009] The stability of the AOI equipment is determined according to the electronic sample detection parameter corresponding to the target electronic sample and the allowable range of the electronic sample; the allowable range of the electronic sample is a set threshold range of the electronic sample detection parameter; the stability of the AOI equipment is used to determine whether the AOI equipment needs to be adjusted.

[0010] Optionally, determining the stability of the AOI equipment according to the electronic sample detection parameter corresponding to the target electronic sample and the allowable range of the electronic sample specifically includes:

[0011] When any target detection parameter exceeds the set threshold range corresponding to the target detection parameter in the allowable range of the electronic sample, the result of the stability of the AOI equipment is unstable; the target detection parameter is length, width, area or gray scale;

[0012] When the result of the stability of the AOI equipment is unstable, the camera of the AOI equipment is automatically adjusted.

[0013] Optionally, the automatic adjustment of the camera of the AOI equipment specifically includes:

[0014] The Z axis of the camera of the AOI equipment or the camera exposure is automatically adjusted;

[0015] The target electronic sample is detected by using the adjusted AOI equipment, and a secondary detection parameter is obtained;

[0016] It is judged whether the secondary detection parameter is within the allowable range of the electronic sample, if yes, the correction is ended; if no, the step of automatically adjusting the Z axis of the camera of the AOI equipment or the camera exposure is returned.

[0017] Optionally, before determining the stability of the AOI equipment according to the electronic sample detection parameter corresponding to the target electronic sample and the allowable range of the electronic sample, the AOI equipment non-stop automatic point inspection correction method further includes:

[0018] An initial electronic sample set is obtained; the initial electronic sample set includes a plurality of initial electronic samples; the initial electronic sample is used to represent a silicon-based OLED product;

[0019] For each initial electronic sample, the initial electronic sample is displayed to obtain a product display result corresponding to the initial electronic sample;

[0020] The product display result corresponding to the initial electronic sample is detected by the AOI equipment to obtain an electronic sample detection parameter corresponding to the initial electronic sample;

[0021] The allowable range of the electronic sample is determined according to the electronic sample detection parameters corresponding to all the initial electronic samples.

[0022] Optionally, the target electronic sample is obtained, specifically including:

[0023] The target electronic sample is determined based on the set area and the set gray scale by using python.

[0024] Optionally, the AOI equipment non-stop automatic point inspection correction method further includes:

[0025] When the result of the stability of the AOI device is unstable, an alarm is given.

[0026] Optionally, the target electronic sample is displayed, specifically comprising: displaying the target electronic sample through a PG display.

[0027] In a second aspect, the present application provides an AOI device non-stop automatic inspection correction system, comprising:

[0028] The target electronic sample acquisition module is configured to: in a process of mass production of the silicon-based OLED product, acquire a target electronic sample based on an equidistant sampling method after producing a set number of silicon-based OLED products; the target electronic sample is used to represent the silicon-based OLED product.

[0029] The product display module is configured to: display the target electronic sample to obtain a product display result corresponding to the target electronic sample.

[0030] The detection module is configured to: detect the product display result corresponding to the target electronic sample through an AOI device to obtain an electronic sample detection parameter corresponding to the target electronic sample; the electronic sample detection parameter comprises a length, a width, an area and a gray scale of the electronic sample.

[0031] The stability judgment module is configured to: determine the stability of the AOI device according to the electronic sample detection parameter corresponding to the target electronic sample and an allowable range of the electronic sample; the allowable range of the electronic sample is a set threshold range of the electronic sample detection parameter; and the stability of the AOI device is used to judge whether the AOI device needs to be adjusted.

[0032] According to the specific embodiments provided in the present application, the following technical effects are disclosed:

[0033] The application provides an AOI device non-stop automatic inspection correction method and system. Based on the equidistant sampling mode, after a set number of silicon-based OLED products are produced, a target electronic sample is obtained, the target electronic sample is displayed, the product display result corresponding to the target electronic sample is obtained, the product display result corresponding to the target electronic sample is detected by the AOI device, and the electronic sample detection parameter corresponding to the target electronic sample is obtained. The electronic sample detection parameter includes the length, width, area and gray scale of the electronic sample. The stability of the AOI device is determined according to the electronic sample detection parameter corresponding to the target electronic sample and the allowable range of the electronic sample. The stability of the AOI device is used to determine whether the AOI device needs to be adjusted. By using a standard electronic sample for AOI detection, camera adjustment can be realized without manual intervention, and the camera automatic compensation function is realized. By using the electronic sample inspection, the personnel sample selection time and the use of the device investment verification piece are avoided. The application ensures that the AOI device completes automatic inspection without stopping, saves manpower and resources, and solves the problem of stopping and affecting device production in the existing AOI device correction method. BRIEF DESCRIPTION OF DRAWINGS

[0034] In order to more clearly illustrate the technical solutions in the embodiments of the application or the prior art, the drawings needed in the embodiments will be briefly introduced below. Obviously, the drawings in the following description are only some embodiments of the application, and other drawings can be obtained by those skilled in the art without creative labor.

[0035] Figure 1 A flowchart of an AOI device non-stop automatic inspection correction method provided by an embodiment of the application is shown in the figure.

[0036] Figure 2 A schematic diagram of the principle of the existing AOI inspection method provided by an embodiment of the application is shown in the figure.

[0037] Figure 3 A schematic diagram of the principle of the existing AOI inspection reference output provided by an embodiment of the application is shown in the figure.

[0038] Figure 4 A schematic diagram of the principle of the AOI non-stop inspection provided by an embodiment of the application is shown in the figure.

[0039] Figure 5 A schematic diagram of the principle of the electronic sample display provided by an embodiment of the application is shown in the figure.

[0040] Figure 6 A schematic diagram of the advantages of the AOI non-stop inspection method provided by an embodiment of the application compared with the existing AOI inspection is shown in the figure.

[0041] Figure 7An AOI automatic inspection correction schematic diagram provided by an embodiment of the present application;

[0042] Figure 8 A functional module schematic diagram of an AOI device non-stop automatic inspection correction system provided by an embodiment of the present application. DETAILED DESCRIPTION

[0043] The technical solutions in the embodiments of the present application will be described clearly and completely below with reference to the drawings in the embodiments of the present application. Obviously, the described embodiments are only part of the embodiments of the present application, rather than all the embodiments of the present application. Based on the embodiments in the present application, all other embodiments obtained by those skilled in the art without creative work fall within the scope of protection of the present application.

[0044] The above purposes, features and advantages of the present application can be more obvious and easy to understand. The present application will be described in further detail below with reference to the drawings and specific embodiments.

[0045] In an exemplary embodiment, as shown in Figure 1 An AOI device non-stop automatic inspection correction method is provided, including the following steps 101 to 104. Wherein:

[0046] Step 101: In the process of mass production of silicon-based OLED products, based on the equidistant sampling method, after producing a set number of silicon-based OLED products, a target electronic sample is obtained; the target electronic sample is used to represent the silicon-based OLED product.

[0047] Step 102: Display the target electronic sample to obtain the product display result corresponding to the target electronic sample.

[0048] Step 103: Detect the product display result corresponding to the target electronic sample by the AOI device to obtain the electronic sample detection parameter corresponding to the target electronic sample; the electronic sample detection parameter includes the length, width, area and gray scale of the electronic sample.

[0049] Step 104: Determine the stability of the AOI device according to the electronic sample detection parameter corresponding to the target electronic sample and the allowable range of the electronic sample; the allowable range of the electronic sample is a set threshold range of the electronic sample detection parameter; the stability of the AOI device is used to determine whether the AOI device needs to be adjusted.

[0050] The steps 101-104 are implemented, and the camera adjustment is realized without manual intervention by using the standard electronic sample for AOI detection, thereby realizing the camera automatic compensation function. The electronic sample point inspection is used to avoid the personnel sample selection time and the use of the equipment investment verification piece. The application ensures that the AOI equipment completes the automatic point inspection without stopping, saves manpower and material resources, and solves the problem of stopping and affecting the production of the existing AOI equipment correction method.

[0051] The existing AOI point inspection method principle and the reference output principle are shown in Figure 2 and Figure 3 The AOI equipment automatic point inspection correction method principle provided by the application is shown in Figures 4-7 : a. Standard piece making: making good and bad electronic samples respectively, such as good specifications 20*20um, making 20*20um OK limit sample and 21*21um NG limit sample respectively, to ensure that the corresponding limit sample outputs the corresponding result, OK limit sample represents good product, and NG limit sample represents bad electronic sample; b. Data quantization: quantizing the values of good and bad electronic samples, outputting the length / width / area / brightness / gray four-dimensional parameter range, and alarming the equipment when the range is exceeded, notifying the user to confirm whether to perform camera compensation; c. Data comparison: in the production process, the electronic sample detection parameters of the electronic sample are confirmed according to the equidistant sampling method (such as testing the electronic sample once every 1000 pieces), and the difference between the detected parameters (length / width / area / brightness / contrast four dimensions) and the allowable range of the electronic sample is compared; d. Data compensation: when it is confirmed that the production state has deviated from the standard range, the standard value is automatically compensated.

[0052] In another exemplary embodiment of the application, the AOI equipment automatic point inspection correction method further includes the following steps 301-304:

[0053] Step 301: obtaining an initial electronic sample set; the initial electronic sample set includes a plurality of initial electronic samples; the initial electronic samples are used to represent the silicon-based OLED product;

[0054] Step 302: for each initial electronic sample, displaying the initial electronic sample to obtain the product display result corresponding to the initial electronic sample;

[0055] Step 303: detecting the product display result corresponding to the initial electronic sample by using the AOI equipment to obtain the electronic sample detection parameter corresponding to the initial electronic sample;

[0056] Step 304: determining the electronic sample allowable range according to the electronic sample detection parameters corresponding to all the initial electronic samples.

[0057] Specifically, a. an initial electronic sample 1 is made, the area of the initial electronic sample is 4 pixels (length 2* width 2), and the gray scale is 30 gray scales; b. the electronic sample is displayed in the PG display, and the electronic sample parameter standard value is confirmed by the AOI equipment, for example: length 2.0, width 2.0, area 4.0, and gray scale 30 gray scales; c. 100 different products are selected, and step b is performed on each of the 100 different products to obtain an electronic sample allowable range, for example, the set threshold range of the target detection parameter is: length 2.0±0.2, width 2.0±0.2, area 4.0±0.4, and gray scale 30±3 gray scales.

[0058] In another example embodiment of the present application, the electronic sample value is confirmed in the mass production process in the equidistant sampling mode, and the set number can be 1000, that is, the electronic sample can be tested once every 1000 pieces in step 101.

[0059] In step 101, the target electronic sample is obtained, specifically including: determining the target electronic sample based on the set area and the set gray scale through python.

[0060] Step 102 specifically includes: displaying the target electronic sample through the PG display to obtain the product display result corresponding to the target electronic sample.

[0061] Every 1000 pieces of normal production equipment, the equipment does not need to be stopped, the target electronic sample is automatically displayed through the PG display, the target electronic sample result is automatically tested through the AOI equipment, and the electronic sample detection parameter of the target electronic sample is obtained, for example, the electronic sample detection parameter of the target electronic sample can be: length 2.4, width 2.4, area 5.76, and gray scale 35 gray scales.

[0062] In another example embodiment of the present application, the above step 104 can be replaced by the following steps 401-402:

[0063] Step 401: when any target detection parameter exceeds the set threshold range of the target detection parameter corresponding to the electronic sample allowable range, the stability result of the AOI equipment is unstable; the target detection parameter is length, width, area or gray scale;

[0064] Step 402: when the stability result of the AOI equipment is unstable, the camera of the AOI equipment is automatically adjusted. When the stability result of the AOI equipment is unstable, an alarm can also be given to confirm whether to perform camera compensation.

[0065] In step 402, the camera of the AOI equipment is automatically adjusted, specifically including the following steps 501-503:

[0066] Step 501: automatically adjusting the Z axis of the camera or the camera exposure of the AOI device;

[0067] Step 502: detecting the target electronic sample by using the adjusted AOI device to obtain secondary detection parameters;

[0068] Step 503: determining whether the secondary detection parameters are within the allowable range of the electronic sample, if yes, ending the correction; if no, returning to the step of automatically adjusting the Z axis of the camera or the camera exposure of the AOI device.

[0069] Device stability result confirmation, for example: length 2.4>2.0±0.2, width 2.4>2.0±0.2, area 5.76>2.0±0.2, and gray scale 35>30±3 gray scale. If the result of the stability of the AOI device is unstable, the camera of the AOI device needs to be automatically adjusted, the Z axis of the camera or the camera exposure is adjusted, the target electronic sample is tested again, for example: length 2.0, width 2.0, area 4.0, and gray scale 30 gray scale. At this time, the electronic sample test result after the device automatic correction is OK, which means that the result of the stability of the AOI device is stable, and the silicon-based OLED product production device is normal. The AOI device does not need to find physical samples during the point inspection process, which saves labor costs; and the automatic correction process does not need to stop, which saves equipment time.

[0070] The application also provides an application scenario of the above-mentioned AOI device non-stop automatic point inspection and correction method. Specifically, the AOI device non-stop automatic point inspection and correction method provided in the embodiment can be applied in a silicon-based OLED product production scene. The silicon-based OLED product production scene includes an electronic sample manufacturing link and an AOI device non-stop automatic point inspection and correction link. The target electronic sample enters the AOI device non-stop automatic point inspection and correction link from the electronic sample manufacturing link, and obtains a corresponding AOI device stability result. The AOI device non-stop automatic point inspection and correction method provided in the embodiment belongs to the AOI device non-stop automatic point inspection and correction link. Specifically, in the process of the AOI device non-stop automatic point inspection and correction link for the target electronic sample, the target electronic sample can be obtained based on the equidistant sampling method after a set number of silicon-based OLED products are produced, the target electronic sample is displayed to obtain a product display result corresponding to the target electronic sample, the product display result corresponding to the target electronic sample is detected by the AOI device to obtain electronic sample detection parameters corresponding to the target electronic sample; the electronic sample detection parameters include the length, width, area and gray scale of the electronic sample; the stability of the AOI device is determined according to the electronic sample detection parameters corresponding to the target electronic sample and the allowable range of the electronic sample; and whether the AOI device needs to be adjusted is determined according to the stability of the AOI device.

[0071] Based on the same inventive concept, the embodiments of the present application also provide an AOI device non-stop automatic point inspection correction system for implementing the above-mentioned AOI device non-stop automatic point inspection correction method. The implementation scheme for solving the problem provided by the system is similar to the implementation scheme described in the above method, so the specific limitations in one or more AOI device non-stop automatic point inspection correction system embodiments provided below can refer to the limitations of the AOI device non-stop automatic point inspection correction method described above, and will not be described here.

[0072] In one exemplary embodiment, as shown in Figure 8 An AOI device non-stop automatic point inspection correction system is provided, including:

[0073] A target electronic sample acquisition module T1 is configured to: in a process of mass production of the silicon-based OLED product, acquire a target electronic sample based on an equidistant sampling method after a set number of silicon-based OLED products are produced; the target electronic sample is used to represent the silicon-based OLED product.

[0074] A product display module T2 is configured to: display the target electronic sample to obtain a product display result corresponding to the target electronic sample.

[0075] A detection module T3 is configured to: detect the product display result corresponding to the target electronic sample by using an AOI device to obtain an electronic sample detection parameter corresponding to the target electronic sample; the electronic sample detection parameter includes a length, a width, an area, and a grayscale of the electronic sample.

[0076] A stability judgment module T4 is configured to: determine stability of the AOI device according to the electronic sample detection parameter corresponding to the target electronic sample and an allowable range of the electronic sample; the allowable range of the electronic sample is a set threshold range of the electronic sample detection parameter; and the stability of the AOI device is used to determine whether the AOI device needs to be adjusted.

[0077] The technical features of the above embodiments can be combined in any manner. To make the description concise, not all possible combinations of the technical features in the above embodiments are described, however, as long as the combinations of the technical features do not exist contradictions, they should be considered as the scope of the present application.

[0078] The principles and implementation modes of the present application are described by using specific examples, and the above embodiment descriptions are only used to help understand the method and its core idea of the present application; meanwhile, for those skilled in the art, according to the idea of the present application, the specific implementation mode and application range can be changed. In conclusion, the content of the present application should not be understood as a limitation.

Claims

1. A method for automatic inspection and calibration of AOI equipment without stopping the machine, characterized in that, The method for automatic inspection and calibration of AOI equipment without shutdown includes: During the mass production of silicon-based OLED products, a target electronic sample is obtained after each set number of silicon-based OLED products are produced, based on an equidistant sampling method; the target electronic sample is used to characterize the silicon-based OLED products. The target electronic sample is displayed to obtain the product display result corresponding to the target electronic sample; The product display result corresponding to the target electronic sample is detected by an AOI device to obtain the electronic sample detection parameters corresponding to the target electronic sample; the electronic sample detection parameters include the length, width, area, and grayscale of the electronic sample; The stability of the AOI device is determined based on the electronic sample detection parameters and the allowable range of the electronic sample corresponding to the target electronic sample; the allowable range of the electronic sample is the set threshold range of the electronic sample detection parameters; the stability of the AOI device is used to determine whether the AOI device needs to be adjusted.

2. The AOI equipment automatic inspection and calibration method without shutdown according to claim 1, characterized in that, The stability of the AOI device is determined based on the electronic sample detection parameters and the allowable range of the electronic sample corresponding to the target electronic sample, specifically including: When any target detection parameter exceeds the set threshold range corresponding to the target detection parameter within the allowable range of the electronic sample, the stability result of the AOI device is unstable; the target detection parameter is length, width, area, or grayscale. When the stability result of the AOI device is unstable, the camera of the AOI device is automatically adjusted.

3. The AOI equipment automatic inspection and calibration method without shutdown according to claim 2, characterized in that, Automatic adjustment of the camera in the AOI device specifically includes: Automatically adjust the Z-axis or camera exposure of the AOI device's camera; The target electronic sample was detected using the adjusted AOI equipment to obtain secondary detection parameters; Determine whether the secondary detection parameters are within the allowable range of the electronic sample. If yes, end the calibration; otherwise, return to the "Automatically adjust the Z-axis or camera exposure of the AOI device's camera" step.

4. The method for automatic inspection and calibration of AOI equipment without stopping operation according to claim 1, characterized in that, Before determining the stability of the AOI equipment based on the electronic sample detection parameters and allowable range of the target electronic sample, the AOI equipment automatic inspection and calibration method without shutdown further includes: Obtain an initial set of electron samples; the initial set of electron samples includes several initial electron samples; the initial electron samples are used to characterize silicon-based OLED products; For each initial electronic sample, the initial electronic sample is displayed to obtain the product display result corresponding to the initial electronic sample; The product display results corresponding to the initial electronic sample are detected by AOI equipment to obtain the electronic sample detection parameters corresponding to the initial electronic sample; The permissible range of electronic samples is determined based on the electronic sample detection parameters corresponding to all the initial electronic samples.

5. The method for automatic inspection and calibration of AOI equipment without stopping operation according to claim 1, characterized in that, Obtaining the target electronic sample specifically includes: Using Python, the target electronic sample is determined based on a set area and a set gray level.

6. The AOI equipment automatic inspection and calibration method without shutdown according to claim 2, characterized in that, The method for automatic inspection and calibration of AOI equipment without shutdown also includes: An alarm is triggered when the stability result of the AOI device is unstable.

7. The method for automatic inspection and calibration of AOI equipment without stopping operation according to claim 1, characterized in that, Displaying the target electronic sample specifically includes: The target electronic sample is displayed using a PG display.

8. An automatic inspection and calibration system for AOI equipment without stopping operation, characterized in that, The AOI equipment non-stop automatic inspection and calibration system includes: The target electronic sample acquisition module is used to: acquire target electronic samples after producing a set number of silicon-based OLED products during the mass production process of silicon-based OLED products, based on an equidistant sampling method; the target electronic samples are used to characterize the silicon-based OLED products. The product display module is used to: display the target electronic sample and obtain the product display result corresponding to the target electronic sample; The detection module is used to: detect the product display result corresponding to the target electronic sample using an AOI device, and obtain the electronic sample detection parameters corresponding to the target electronic sample; the electronic sample detection parameters include the length, width, area, and grayscale of the electronic sample; The stability assessment module is used to: determine the stability of the AOI device based on the electronic sample detection parameters and the allowable range of the electronic sample corresponding to the target electronic sample; the allowable range of the electronic sample is a set threshold range of the electronic sample detection parameters; the stability of the AOI device is used to determine whether the AOI device needs to be adjusted.

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