An aging test method, system, electronic device and medium for an audio power amplifier device

Abstract

The present application provides an aging test method, system, electronic device and medium for an audio power amplifier device, belonging to the technical field of device testing. This method is applied to an aging production line provided with a main power supply line, an AC contactor, a timer and multiple audio power amplifier devices, and the AC contactor is used to control the on / off of the main power supply line; the method includes: calibrating the time of the timer according to the current time; generating several aging test time periods according to the current time and a preset aging test strategy; controlling the timer to trigger the AC contactor to be in a closed state when the timer counts to the start time point of each aging test time period so that each audio power amplifier device is powered on and started via the main power supply line, and then controlling the timer to trigger the AC contactor to switch from the closed state to the open state when the timer continues to count to the end time point of the aging test time period so that each audio power amplifier device is powered off and shut down. The present application can improve the efficiency of device aging test and save labor costs.

Description

Technical Field

[0001] The present application relates to the technical field of equipment testing, and particularly to an aging test method, system, electronic device and medium for audio power amplifier equipment. Background Art

[0002] In the prior art, a manual test method is usually adopted to perform continuous multiple manual power-on and power-off operations on audio power amplifier equipment to complete the aging test task of the audio power amplifier equipment. When a tester is responsible for aging testing a small batch of audio power amplifier equipment, it is necessary to perform power-on and power-off operations on each audio power amplifier equipment one by one, resulting in low overall test efficiency. Summary of the Invention

[0003] The main purpose of the present application is to propose an aging test method, system, electronic device and medium for audio power amplifier equipment, which can synchronously perform automatic aging test operations on multiple audio power amplifier equipment provided on an aging production line, improve test efficiency, save labor costs, and avoid non-standard operations prone to occur in manual testing.

[0004] To achieve the above object, on the one hand, the present application proposes an aging test method for audio power amplifier equipment, which is applied to an aging production line provided with a main power supply line, an AC contactor, a timer and multiple audio power amplifier equipment. The timer is used to control the on-off of the AC contactor, and the AC contactor is used to control the on-off of the main power supply line. Each audio power amplifier equipment serves as a load of the main power supply line. The method includes:

[0005] Calibrate the time of the timer according to the current time;

[0006] Generate a plurality of aging test time periods according to the current time and a preset aging test strategy;

[0007] For each aging test time period, control the timer to trigger the AC contactor to be in a closed state when it counts to the start time point of the aging test time period, so that each audio power amplifier equipment is powered on and started via the main power supply line, and then control the timer to trigger the AC contactor to switch from the closed state to an open state when it continues to count to the end time point of the aging test time period, so that each audio power amplifier equipment is powered off and shut down.

[0008] Further, the preset aging test strategy includes a first aging test strategy and a second aging test strategy. The first aging test strategy records multiple device test time periods set within a day, and the length of each device test time period is one hour. The second aging test strategy records multiple device aging test time periods set within one hour.

[0009] Further, the multiple device test time periods are consecutive.

[0010] Further, the time period between every two adjacent device aging test time periods is denoted as a non - test time period. The lengths of all the non - test time periods included between the multiple device aging test time periods are equal, and the lengths of the multiple device aging test time periods are not equal.

[0011] Further, the device aging test time period with the minimum length included in the multiple device aging test time periods is denoted as the minimum device aging test time period, and the length of each non - test time period is less than the length of the minimum device aging test time period.

[0012] Further, the number of the multiple device aging test time periods is three. The length of the device aging test time period in the middle is the smallest, and the length of the device aging test time period at the later time is the largest.

[0013] Further, the generating a plurality of aging test time periods according to the current time and the preset aging test strategy includes:

[0014] Dividing each device test time period recorded in the first aging test strategy according to the second aging test strategy to obtain a plurality of first device aging test time periods;

[0015] Updating the plurality of first device aging test time periods included in each device test time period according to the current time to obtain the corresponding plurality of aging test time periods;

[0016] Statistically summarizing the plurality of aging test time periods corresponding to each device test time period recorded in the first aging test strategy to obtain a plurality of aging test time periods.

[0017] To achieve the above object, another aspect of the present application proposes an aging test system for audio power amplifier devices, which is applied to an aging production line provided with a main power supply line, an AC contactor, a timer, and a plurality of audio power amplifier devices. The timer is used to control the on - off of the AC contactor, and the AC contactor is used to control the on - off of the main power supply line. Each audio power amplifier device serves as a load of the main power supply line. The system includes:

[0018] A calibration module, configured to calibrate the time of the timer according to the current time;

[0019] A generation module, configured to generate a plurality of aging test time periods according to the current time and the preset aging test strategy;

[0020] A test module is configured to, for each of the aging test time periods, control the timer to trigger the AC contactor to be in a closed state when the timer counts to the start time point of the aging test time period, so that each audio power amplifier device is powered on and started via the main power supply line, and then control the timer to trigger the AC contactor to switch from the closed state to an open state when the timer continues to count to the end time point of the aging test time period, so that each audio power amplifier device is powered off and shut down.

[0021] To achieve the above object, another aspect of the present application provides an electronic device, which includes a memory and a processor. The memory stores a computer program, and when the processor executes the computer program, the above method is implemented.

[0022] To achieve the above object, another aspect of the present application provides a computer-readable storage medium, which stores a computer program, and when the computer program is executed by a processor, the above method is implemented.

[0023] The present application has at least the following beneficial effects: By arranging a main power supply line, an AC contactor, a timer, and multiple audio power amplifier devices on an aging production line, using the timer to control the on / off of the AC contactor, and using the AC contactor to control the on / off of the main power supply line, each audio power amplifier device can be powered on and started relying on the connected main power supply line. After this hardware foundation is set up, a preset aging test strategy is introduced and combined with the current time to formulate a number of reasonable and orderly aging test time periods, and then the timer responds to each aging test time period in a timely manner, so as to realize the automatic aging test operation of multiple audio power amplifier devices synchronously, which can improve the test efficiency and save labor costs, and avoid the non-standard operations that are prone to occur when using the original manual test method. Description of the Drawings

[0024] Figure 1 is a schematic flow chart of a method for aging test of an audio power amplifier device provided by an embodiment of the present application;

[0025] Figure 2 is a schematic structural diagram of an aging test system for an audio power amplifier device provided by an embodiment of the present application;

[0026] Figure 3 is a schematic hardware structure diagram of an electronic device provided by an embodiment of the present application. Detailed Embodiments

[0027] In order to make the objectives, technical solutions, and advantages of this application clearer, the following further details this application in conjunction with the accompanying drawings and embodiments. It should be understood that the specific embodiments described herein are merely used to explain this application and are not used to limit this application. When the following description refers to the accompanying drawings, unless otherwise indicated, the same numerals in different drawings represent the same or similar elements. The implementation manners described in the following exemplary embodiments do not represent all implementation manners consistent with the embodiments of this application. They are merely examples of systems and methods that are consistent with some aspects of the embodiments of this application as detailed in the appended claims.

[0028] It can be understood that the terms "first", "second", etc. used in this application may be used herein to describe various concepts, but unless otherwise specified, these concepts are not limited by these terms. These terms are only used to distinguish one concept from another. For example, without departing from the scope of the embodiments of this application, the first information may also be referred to as the second information. Similarly, the second information may also be referred to as the first information. Depending on the context, the words "if", "when" as used herein may be interpreted as "when...", "while...", or "in response to determining".

[0029] The terms "at least one", "multiple", "each", "any one", etc. used in this application, at least one includes one, two, or more than two, multiple includes two or more than two, each refers to each of the corresponding multiple, and any one refers to any one of the multiple.

[0030] Unless otherwise defined, all technical and scientific terms used herein have the same meaning as commonly understood by those skilled in the technical field to which this application belongs. The terms used herein are only for the purpose of describing the embodiments of this application and are not intended to limit this application.

[0031] When an audio power amplifier device is just powered on and turned on, it is in an unstable working state and needs to go through a certain period of time before it can enter a stable working state. During this process, the probability of the audio power amplifier device being abnormal or damaged is relatively high. Therefore, during the aging process, the audio power amplifier device needs to be powered on and off (turned on and off) multiple times to test the shock resistance and stability of the audio power amplifier device.

[0032] In the prior art, an artificial test method is usually adopted to perform continuous multiple manual power-on and power-off operations on an audio power amplifier device to complete the aging test task of the audio power amplifier device. When a tester is responsible for aging testing a small batch of audio power amplifier devices, it is necessary to perform power-on and power-off operations on each audio power amplifier device one by one, resulting in low overall test efficiency.

[0033] In view of this, the embodiments of the present application provide a method, a system, an electronic device, and a medium for aging test of audio power amplifier devices. In this solution, a main power supply line, an AC contactor, a timer, and multiple audio power amplifier devices are arranged on an aging production line. The timer is used to control the on / off of the AC contactor, and the AC contactor is used to control the on / off of the main power supply line, so that each audio power amplifier device can be powered on and started depending on the connected main power supply line. After this hardware foundation is set up, a preset aging test strategy is introduced and combined with the current time to formulate several reasonable and orderly aging test time periods. Then, the timer responds to each aging test time period in a timely manner, thereby realizing the automatic aging test operation for multiple audio power amplifier devices synchronously, which can improve the test efficiency, save labor costs, and avoid the non-standard operations that are prone to occur when using the original manual test method.

[0034] Figure 1 FIG. 4 is an optional flowchart of a method for aging test of audio power amplifier devices provided by an embodiment of the present application. This method is mainly applied to an aging production line provided with a timer, an AC contactor, a main power supply line, and multiple audio power amplifier devices. The timer is connected to the AC contactor, and the AC contactor is connected in series on the main power supply line. Each audio power amplifier device serves as a load on the main power supply line. The timer is used to control the on / off of the AC contactor, and the AC contactor is used to control the on / off of the main power supply line. On this basis, Figure 1 the method in FIG. 4 may but is not limited to include steps S101 to S103:

[0035] Step S101: Calibrate the time of the timer according to the current time;

[0036] Step S102: Generate several aging test time periods according to the current time and a preset aging test strategy;

[0037] Step S103: For each aging test time period, control the timer to trigger the AC contactor to be in a closed state when the timer counts to the start time point of the aging test time period, so that each audio power amplifier device is powered on and started via the main power supply line, and then control the timer to trigger the AC contactor to switch from the closed state to the open state when the timer continues to count to the end time point of the aging test time period, so that each audio power amplifier device is powered off and shut down.

[0038] Steps S101 to S103 shown in the embodiments of the present application can improve the test efficiency, save labor costs, and avoid non-standard operations prone to occur in manual tests by performing automatic aging test operations on multiple audio power amplifier devices provided on the aging production line synchronously.

[0039] In step S101 of some embodiments, calibrating the timer actually adjusts the starting recording time of the timer when it is officially started to cooperate with the aging test operation to the current time, which can make the subsequent entire aging test process reasonable and orderly.

[0040] In step S102 of some embodiments, the preset aging test strategy includes a first aging test strategy and a second aging test strategy. The first aging test strategy mainly records multiple device test time periods set within one day, and the length of each device test time period is one hour. The second aging test strategy mainly records multiple device aging test time periods set within one hour.

[0041] In the first aging test strategy, the multiple device test time periods recorded are continuous. The number of set multiple device test time periods can be 8 or 12 or 24, that is, each audio power amplifier device needs to be continuously tested for 8 hours or 12 hours or 24 hours, thereby simulating the long-term operation of the audio power amplifier device in actual use and ensuring the reliability and stability of the audio power amplifier device.

[0042] Exemplarily, assume that the number of set multiple device test time periods is 8, and the test starts at 09:00 within one day. At this time, the first test needs to be carried out in the time period from 09:00 to 10:00, the second test in the time period from 10:00 to 11:00, the third test in the time period from 11:00 to 12:00, the fourth test in the time period from 12:00 to 13:00, the fifth test in the time period from 13:00 to 14:00, the sixth test in the time period from 14:00 to 15:00, the seventh test in the time period from 15:00 to 16:00, and the eighth test in the time period from 16:00 to 17:00, thereby achieving 8-hour continuous testing for each audio power amplifier device.

[0043] It should be noted that the one-day time mentioned in the first aging test strategy only emphasizes 24 hours. It can start from 00:00 of a certain day until 24 hours are reached, or it can start from other moments of a certain day until 24 hours are reached. For example, it can start from 09:00 of the first day and end at 09:00 of the adjacent second day. The present application does not make any limitations on this.

[0044] In this second aging test strategy, the lengths of the multiple device aging test time periods recorded are not equal. The device aging test time period with the smallest length among the multiple device aging test time periods is defined as the minimum device aging test time period. The time period between every two adjacent device aging test time periods is recorded as a non-test time period. The lengths of all the non-test time periods included between the multiple device aging test time periods are equal, and it is specified that the length of each non-test time period should be less than the length of the minimum device aging test time period.

[0045] As a preferred implementation, the number of set multiple device aging test time periods is 3. The length of the device aging test time period in the middle is the smallest, and the length of the device aging test time period at the later time is the largest. The length of the non-test time period between every two adjacent device aging test time periods is set to two minutes. By setting different working cycles for the audio power amplifier device to conduct phased repeated tests, it is possible to observe whether the working performance of the audio power amplifier device remains stable under different temperature change conditions, and to minimize the length of each non-test time period to ensure that the audio power amplifier device starts and runs for the next time with residual heat, thereby testing the timely response of the audio power amplifier device when it resumes work in a short time.

[0046] By setting the length of the device aging test time period at the earlier time to be greater than the length of the device aging test time period in the middle but less than the length of the device aging test time period at the later time, it is mainly considered that the audio power amplifier device needs to raise its working temperature to a certain level when it starts and runs at the beginning, which can cooperate to complete the test on whether the audio power amplifier device can respond promptly to restart under relatively high temperature conditions in the subsequent process; by setting the length of the device aging test time period in the middle to be the smallest, it can cooperate to complete the short-time continuous operation performance test of the audio power amplifier device; by setting the length of the device aging test time period at the later time to be the largest, it can cooperate to complete the long-time continuous operation performance test of the audio power amplifier device; thus, regular interval tests on the audio power amplifier device are achieved.

[0047] Exemplarily, the test starts at the 0th minute within one hour. At this time, each audio power amplifier device is controlled to power on and start at the 0th minute, power off and shut down at the 15th minute, power on and start at the 17th minute, power off and shut down at the 25th minute, power on and start at the 27th minute, and power off and shut down at the 58th minute. That is, the length of the first device aging test time period (i.e., the time period from the 0th minute to the 15th minute) with a relatively early time is 15 minutes, the length of the second device aging test time period (i.e., the time period from the 17th minute to the 25th minute) in the middle is 8 minutes, and the length of the third device aging test time period (i.e., the time period from the 27th minute to the 58th minute) with a relatively late time is 31 minutes. The lengths of the two non-test time periods (i.e., the time period from the 15th minute to the 17th minute and the time period from the 25th minute to the 27th minute) are both 2 minutes.

[0048] It should be noted that the one hour mentioned in this second aging test strategy only emphasizes 60 minutes. It can start from the 0th minute of a certain hour until 60 minutes are reached, or it can start from other minutes of a certain hour until 60 minutes are reached. For example, it can start from the 20th minute of the first hour and end at the 20th minute of the adjacent second hour. The present application does not make any limitations in this regard.

[0049] In step S102 of some embodiments, regarding the generation process of several aging test time periods, it specifically includes the following steps: According to this second aging test strategy, each device test time period recorded in the first aging test strategy is divided to obtain multiple first device aging test time periods; according to the current time, each of the multiple first device aging test time periods included in each device test time period is updated to obtain corresponding multiple aging test time periods; the multiple aging test time periods corresponding to each device test time period recorded in the first aging test strategy are statistically summarized to obtain several aging test time periods.

[0050] Exemplarily, assume that the set number of multiple device test time periods recorded in the first aging test strategy is 8, and the three device aging test time periods recorded in the second aging test strategy are the time period from the 0th minute to the 15th minute, the time period from the 17th minute to the 25th minute, and the time period from the 27th minute to the 58th minute respectively;

[0051] In this first aging test strategy, the test is set to start at 00:00 within a day. The three first device aging test time periods divided within the first device test time period (i.e., the time period from 00:00 to 01:00) are respectively the time period from 00:00 to 00:15, the time period from 00:17 to 00:25, and the time period from 00:27 to 00:58. The three first device aging test time periods divided within the second device test time period (i.e., the time period from 01:00 to 02:00) are respectively the time period from 01:00 to 01:15, the time period from 01:17 to 01:25, and the time period from 01:27 to 01:58. By analogy, all the first device aging test time periods corresponding to the remaining six device test time periods are obtained;

[0052] If the current time is 10:30, then the three first device aging test time periods included in the first device test time period are updated to obtain the corresponding three aging test time periods, which are respectively the time period from 10:30 to 10:45, the time period from 10:47 to 10:55, and the time period from 10:57 to 11:28. The three first device aging test time periods included in the second device test time period are updated to obtain the corresponding three aging test time periods, which are respectively the time period from 11:30 to 11:45, the time period from 11:47 to 11:55, and the time period from 11:57 to 12:28. By analogy, all the aging test time periods corresponding to the remaining six device test time periods are obtained.

[0053] In some embodiments, during the execution of step S103 above, the following operations can also be synchronously executed:

[0054] Taking any audio power amplifier device as an example, when the audio power amplifier device is tested in each aging test time period, the response of the audio power amplifier device is synchronously detected, and a test result corresponding to the audio power amplifier device in the aging test time period is generated. The test result mainly records whether the audio power amplifier device can be normally started at the start time point of the aging test time period, whether the audio power amplifier device can be normally shut down at the end time point of the aging test time period, and whether the audio power amplifier device can stably maintain the operating state within the aging test time period. Thus, several test results corresponding to the audio power amplifier device in several aging test time periods are obtained. Subsequently, the several test results are summarized to form a device test report named after the product number of the audio power amplifier device for the staff to view.

[0055] An aging test method for an audio power amplifier device proposed in an embodiment of the present application. By arranging a main power supply line, an AC contactor, a timer, and multiple audio power amplifier devices on an aging production line, the timer is used to control the on / off of the AC contactor, and the AC contactor is used to control the on / off of the main power supply line, so that each audio power amplifier device can be powered on and started depending on the connected main power supply line. After this hardware foundation is set up, a preset aging test strategy is introduced and combined with the current time to formulate a number of reasonable and orderly aging test time periods. Then, the timer responds in a timely manner to each aging test time period, thereby realizing the automatic aging test operation for multiple audio power amplifier devices synchronously, which can improve the test efficiency and save labor costs, and avoid the non-standard operations that are prone to occur when using the original manual test method.

[0056] Please refer to Figure 2 , an embodiment of the present application also provides a schematic structural diagram of an aging test system for an audio power amplifier device. This system is mainly applied to an aging production line provided with a timer, an AC contactor, a main power supply line, and multiple audio power amplifier devices. The timer is connected to the AC contactor, and the AC contactor is connected in series on the main power supply line. Each audio power amplifier device serves as a load of the main power supply line. The timer is used to control the on / off of the AC contactor, and the AC contactor is used to control the on / off of the main power supply line; on this basis, the system includes:

[0057] A calibration module 201, configured to calibrate the time of the timer according to the current time;

[0058] A generation module 202, configured to generate a number of aging test time periods according to a preset aging test strategy and the current time;

[0059] A test module 203, configured to control the timer to trigger the AC contactor to be in a closed state when the timing reaches the start time point of each aging test time period, so that each audio power amplifier device is powered on and started via the main power supply line, and then control the timer to trigger the AC contactor to switch from the original closed state to an open state when the timing continues to reach the end time point of the aging test time period, so that each audio power amplifier device is powered off and shut down.

[0060] It can be understood that the content in the above method embodiments is applicable to the system embodiments of the present application. The functions specifically implemented by the system embodiments of the present application are the same as those of the above method embodiments, and the beneficial effects achieved are also the same as those of the above method embodiments.

[0061] An embodiment of the present application further provides an electronic device, which includes a memory and a processor. The memory stores a computer program, and when the processor executes the computer program, the above-mentioned aging test method for the audio power amplifier device is implemented. The electronic device may include any intelligent terminal such as a tablet computer or an in-vehicle computer.

[0062] It can be understood that the content in the above method embodiments is applicable to the device embodiments of the present application. The functions specifically implemented by the device embodiments of the present application are the same as those of the above method embodiments, and the beneficial effects achieved are also the same as those of the above method embodiments.

[0063] Please refer to Figure 3 , Figure 3 which shows the hardware structure of an electronic device in another embodiment. The electronic device includes:

[0064] A processor 301, which can be implemented in ways such as a general-purpose CPU (Central Processing Unit), a microprocessor, an application-specific integrated circuit (ASIC), or one or more integrated circuits, and is used to execute relevant programs to implement the technical solutions provided by the embodiments of the present application;

[0065] A memory 302, which can be implemented in forms such as a read-only memory (ROM), a static storage device, a dynamic storage device, or a random access memory (RAM). The memory 302 can store an operating system and other application programs. When implementing the technical solutions provided by the embodiments of the present application through software or firmware, the relevant program codes are stored in the memory 302 and are called by the processor 301 to execute the technical solutions provided by the embodiments of the present application;

[0066] An input / output interface 303, which is used to implement information input and output;

[0067] A communication interface 304, which is used to implement communication and interaction between the device and other devices, and can implement communication through wired means (such as USB, network cable, etc.) or wireless means (such as mobile network, WIFI, Bluetooth, etc.);

[0068] A bus 305, which transmits information between various components of the device (such as the processor 301, the memory 302, the input / output interface 303, and the communication interface 304);

[0069] Among them, the processor 301, the memory 302, the input / output interface 303, and the communication interface 304 are communicatively connected to each other inside the device through the bus 305.

[0070] The embodiment of the present application also provides a computer-readable storage medium. The computer-readable storage medium stores a computer program, and when the computer program is executed by a processor, the above-mentioned aging test method for the audio power amplifier device is implemented.

[0071] It can be understood that the content in the above method embodiments is applicable to the present storage medium embodiments. The functions specifically implemented by the present storage medium embodiments are the same as those of the above method embodiments, and the beneficial effects achieved are also the same as those of the above method embodiments.

[0072] As a non-transitory computer-readable storage medium, the memory can be used to store non-transitory software programs and non-transitory computer-executable programs. In addition, the memory may include high-speed random access memory, and may also include non-transitory memory, such as at least one magnetic disk storage device, a flash memory device, or other non-transitory solid-state storage devices. In some embodiments, the memory may optionally include a memory remotely provided relative to the processor, and these remote memories can be connected to the processor through a network. Examples of the above network include but are not limited to the Internet, an enterprise intranet, a local area network, a mobile communication network, and combinations thereof.

[0073] The embodiments described in the embodiments of the present application are for more clearly explaining the technical solutions of the embodiments of the present application, and do not constitute a limitation on the technical solutions provided by the embodiments of the present application. Those skilled in the art know that with the evolution of technology and the emergence of new application scenarios, the technical solutions provided by the embodiments of the present application are equally applicable to similar technical problems.

[0074] Those skilled in the art can understand that the technical solutions shown in the figures do not constitute a limitation on the embodiments of the present application, and may include more or fewer steps than those shown, or combine certain steps, or different steps.

[0075] The system embodiments described above are merely illustrative. The units described as separate components may or may not be physically separated, that is, they may be located in one place, or may be distributed to multiple network units. Some or all of the modules can be selected according to actual needs to achieve the purpose of the solution of the present embodiment.

[0076] Those of ordinary skill in the art can understand that all or some of the steps in the methods disclosed above, and the functional modules / units in the systems and devices can be implemented as software, firmware, hardware, and appropriate combinations thereof.

[0077] In the description of this application and the above-mentioned accompanying drawings, terms such as "first", "second", "third", "fourth", etc. (if any) are used to distinguish similar objects and do not necessarily describe a specific order or sequence. It should be understood that the data used in this way can be interchanged under appropriate circumstances so that the embodiments of this application described here can be implemented in an order other than those illustrated or described here. In addition, the terms "comprising" and "having" and any variations thereof are intended to cover non-exclusive inclusion. For example, a process, method, system, product or device comprising a series of steps or units does not necessarily have to be limited to those steps or units clearly listed, but may include other steps or units not clearly listed or inherent to these processes, methods, products or devices.

[0078] It should be understood that in this application, "at least one (item)" means one or more, and "a plurality" means two or more. "And / or" is used to describe the association relationship of associated objects and indicates that three relationships can exist. For example, "A and / or B" can mean: only A exists, only B exists, and both A and B exist at the same time. Among them, A and B can be singular or plural. The character " / " generally means that the associated objects before and after are in an "or" relationship. "At least one (one) of the following" or its similar expression refers to any combination of these items, including any combination of single items (ones) or plural items (ones). For example, at least one (one) of a, b or c can mean: a, b, c, "a and b", "a and c", "b and c", or "a and b and c", where a, b, c can be single or multiple.

[0079] In several embodiments provided in this application, it should be understood that the disclosed systems and methods can be implemented in other ways. For example, the system embodiments described above are only illustrative. For example, the above-mentioned division of units is only a logical function division. In actual implementation, there may be other division methods. For example, multiple units or components can be combined or integrated into another system, or some features can be ignored or not executed. Another point is that the displayed or discussed coupling or direct coupling or communication connection to each other can be through some interfaces. The indirect coupling or communication connection of systems or units can be in electrical, mechanical or other forms.

[0080] The units described above as separate components may or may not be physically separated. The components shown as units may or may not be physical units, that is, they can be located in one place or distributed to multiple network units. Some or all of the units can be selected according to actual needs to achieve the purpose of the solution of this embodiment.

[0081] In addition, in each embodiment of the present application, the functional units may be integrated into one processing unit, or each unit may exist physically alone, or two or more units may be integrated into one unit. The above integrated unit may be implemented in the form of hardware or in the form of a software functional unit.

[0082] If the integrated unit is implemented in the form of a software functional unit and sold or used as an independent product, it may be stored in a computer-readable storage medium. Based on such an understanding, the technical solution of the present application, in essence, or the part that contributes to the prior art, or all or part of the technical solution, may be embodied in the form of a software product. The computer software product is stored in a storage medium and includes multiple instructions for causing a computer device (which may be a personal computer, a server, or a network device, etc.) to execute all or part of the steps of the methods in the various embodiments of the present application. The foregoing storage medium includes: various media such as USB flash drives, mobile hard disks, read-only memory (ROM), random access memory (RAM), magnetic disks, or optical discs that can store programs.

[0083] The preferred embodiments of the embodiments of the present application have been described above with reference to the accompanying drawings. However, this does not limit the scope of the rights of the embodiments of the present application. Any modifications, equivalent replacements, and improvements made by those skilled in the art without departing from the scope and essence of the embodiments of the present application shall fall within the scope of the rights of the embodiments of the present application.

Claims

1. A method for testing aging of an audio power amplifier device, characterized in that: The method is applied to an aging production line provided with a main power supply line, an AC contactor, a timer and a plurality of audio power amplifier devices, wherein the timer is used to control the on and off of the AC contactor, the AC contactor is used to control the on and off of the main power supply line, and each of the audio power amplifier devices serves as a load of the main power supply line; the method comprises: Calibrate the timer according to the current time; Generate a number of aging test time periods according to the current time and the preset aging test strategy; For each of the aging test time periods, control the timer to trigger the AC contactor to be in a closed state when the timer reaches the start time point of the aging test time period so that each of the audio power amplifier devices is powered on and started via the main power supply line, and then control the timer to trigger the AC contactor to switch from the closed state to the open state when the timer continues to count to the end time point of the aging test time period so that each of the audio power amplifier devices is powered off and shut down; Among them, the preset aging test strategy includes a first aging test strategy and a second aging test strategy, the first aging test strategy records multiple equipment test time periods set within one day, and the length of each equipment test time period is one hour, and the second aging test strategy records multiple equipment aging test time periods set within one hour; the time period between each two adjacent equipment aging test time periods is recorded as a non-test time period, the lengths of all the non-test time periods included in the multiple equipment aging test time periods are equal, and the lengths of the multiple equipment aging test time periods are not equal; the equipment aging test time period with the smallest length included in the multiple equipment aging test time periods is recorded as the minimum equipment aging test time period, and the length of each non-test time period is less than the length of the minimum equipment aging test time period.

2. The aging test method for audio power amplifier equipment according to claim 1, characterized in that: A plurality of the device testing time periods are continuous.

3. The aging test method for audio power amplifier equipment according to claim 1, characterized in that: The number of the plurality of equipment aging test time periods is three, the equipment aging test time period in the middle has the shortest length, and the equipment aging test time period at the end has the longest length.

4. The aging test method for audio power amplifier equipment according to claim 1, characterized in that: The generating of a plurality of aging test time periods according to the current time and the preset aging test strategy comprises: According to the second aging test strategy, each of the device test time periods recorded in the first aging test strategy is divided to obtain a plurality of first device aging test time periods; According to the current time, updating a plurality of the first device aging test time periods contained in each of the device test time periods to obtain a corresponding plurality of the aging test time periods; A plurality of the aging test time periods corresponding to each of the device test time periods recorded in the first aging test strategy are statistically summarized to obtain a plurality of the aging test time periods.

5. An audio power amplifier equipment aging test system, characterized in that: Applicable to an aging production line provided with a main power supply line, an AC contactor, a timer and a plurality of audio power amplifier devices, wherein the timer is used to control the on and off of the AC contactor, the AC contactor is used to control the on and off of the main power supply line, and each of the audio power amplifier devices serves as a load of the main power supply line; the system comprises: A calibration module, used for calibrating the timer according to the current time; A generating module, used for generating a plurality of aging test time periods according to the current time and a preset aging test strategy; A test module, for each of the aging test time periods, controlling the timer to trigger the AC contactor to be in a closed state when the timer counts to the start time point of the aging test time period so that each of the audio power amplifier devices is powered on and started via the main power supply line, and then controlling the timer to trigger the AC contactor to switch from the closed state to the open state when the timer continues to count to the end time point of the aging test time period so that each of the audio power amplifier devices is powered off and shut down; Among them, the preset aging test strategy includes a first aging test strategy and a second aging test strategy, the first aging test strategy records multiple equipment test time periods set within one day, and the length of each equipment test time period is one hour, and the second aging test strategy records multiple equipment aging test time periods set within one hour; the time period between each two adjacent equipment aging test time periods is recorded as a non-test time period, the lengths of all the non-test time periods included in the multiple equipment aging test time periods are equal, and the lengths of the multiple equipment aging test time periods are not equal; the equipment aging test time period with the smallest length included in the multiple equipment aging test time periods is recorded as the minimum equipment aging test time period, and the length of each non-test time period is less than the length of the minimum equipment aging test time period.

6. An electronic device, characterized in that: The electronic device comprises a memory and a processor, the memory stores a computer program, and the processor implements the method according to any one of claims 1 to 4 when executing the computer program.

7. A computer-readable storage medium storing a computer program, characterized in that: When the computer program is executed by a processor, the method according to any one of claims 1 to 4 is implemented.

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