A device and method for measuring the off-axisness of a bundled jumper

Abstract

The application discloses a kind of bundle jumper's off-axis measurement device and method.The device includes beam quality analyzer, assembler and guide rail;The assembler has with bundle jumper light outlet end sleeve pipe matching assembly interface, the assembler is matched with guide rail, so that the assembly interface axial with guide rail parallel, and the bundle jumper of assembly in the assembly interface its light outlet end sleeve pipe central axis with guide rail parallel;The beam quality analyzer, its detection surface is perpendicular to guide rail;The beam quality analyzer and assembler move along guide rail, change the distance between them.The bundle jumper's off-axis measurement method provided by the application uses single optical fiber as test item, avoids the instrument error caused by the fact that the beam quality analyzer exceeds the linear response range due to the fact that the total optical test optical power is too large, further reduces measurement error, saves labor and time cost.

Description

Technical Field

[0001] The present invention belongs to the field of cluster jumpers, and more particularly, relates to a device and method for measuring the eccentricity of cluster jumpers. Background Art

[0002] The cluster patch cord is composed of multiple optical fibers, which are stacked in the metal core of the cluster patch cord. The light-emitting end faces of all optical fibers together form the combined end of the cluster patch cord, and the optical fibers are flush at the combined end face. The multiple optical fibers are wrapped with a protective sheath.

[0003] In the field of laser imaging, cluster patch cables are widely used in industrial laser projection, UV printing, 3D printing, laser lighting, and other applications. Currently, UV cluster patch cables on the market are primarily used in laser direct imaging (LDI). Applications require that the cluster patch cables have a small, suitable off-axis range to facilitate their adaptation to the output.

[0004] However, existing off-axis testing for cluster patch cords treats them as equivalent optical fibers and performs off-axis testing through spot analysis under full-beam conditions. Under full-beam conditions, cluster patch cords emit a hundred times more energy than a single optical fiber, and the spot size also far exceeds that of a single optical fiber. Existing beam quality analyzers, under high-power, large-spot conditions, exhibit significant instrumental error in off-axis testing. Directly applying existing fiber off-axis testing methods can also introduce systematic errors.

[0005] In addition, considering that the number of optical fibers in a cluster patch cord is generally dozens or even hundreds, the method of measuring the eccentricity of the fully-passed optical fiber of the cluster patch cord as an equivalent optical fiber requires a laser group to connect the numerous branch optical fibers. The cost of testing the eccentricity is high, and each optical fiber must be connected to a laser, which is time-consuming and labor-intensive, and requires a lot of labor and time costs. Summary of the Invention

[0006] In response to the above defects or improvement needs of the prior art, the present invention provides a device and method for measuring the eccentricity of a cluster jumper, the purpose of which is to test the angle between the light beam emitted from the end face of the cluster jumper in the assembled state and the cluster jumper sleeve as the eccentricity, thereby reducing the error of the test system; using the light beam emitted by a single optical fiber instead of the full-pass optical equivalent optical fiber test to reduce the error of the test instrument and save labor and time costs, thereby solving the technical problems of the existing cluster jumper eccentricity test method of the full-pass optical equivalent optical fiber, which has large system errors and instrument errors, and ultimately large cumulative errors and consumes a lot of labor and time costs.

[0007] To achieve the above object, according to one aspect of the present invention, there is provided an eccentricity measurement device for a cluster jumper, comprising a beam quality analyzer, an assembler, and a guide rail;

[0008] The assembler has an assembly interface that cooperates with the light-emitting end sleeve of the cluster jumper. The assembler cooperates with the guide rail so that the axial direction of the assembly interface is parallel to the guide rail, and the central axis of the light-emitting end sleeve of the cluster jumper assembled on the assembly interface is parallel to the guide rail;

[0009] The detection surface of the beam quality analyzer is perpendicular to the guide rail;

[0010] The beam quality analyzer and the assembler move along the guide rail to change the distance between them.

[0011] Preferably, in the device for measuring the eccentricity of the cluster jumper, the assembly interface of the assembler is an interface adapted to the cluster jumper; or

[0012] The assembly interface includes a base with a V-shaped groove in its cross section and a pressing piece that movably cooperates with the base. The pressing piece cooperates with the V-groove base and the light-emitting end sleeve of the cluster jumper placed between the two applies a pre-tightening force, thereby fixing the light-emitting end of the cluster jumper.

[0013] Preferably, in the device for measuring the eccentricity of the cluster jumpers, a motion mechanism is provided between the assembler and the guide rail for adjusting the position of the assembler in a plane perpendicular to the guide rail.

[0014] Preferably, the eccentricity measuring device for the cluster jumper, wherein the beam quality analyzer is provided with a motion mechanism for adjusting the position of the assembler in a plane perpendicular to the guide rail.

[0015] Preferably, the eccentricity measuring device of the cluster jumper, the beam quality analyzer and / or the assembler are in sliding cooperation with a guide rail.

[0016] According to another aspect of the present invention, a method for measuring the eccentricity of a bundled jumper is provided, which comprises the following steps:

[0017] (1) Determine the geometric center axis of the outer sleeve of the cluster jumper according to the specifications and dimensions of the cluster jumper to be tested, so that the geometric center axis of the outer sleeve of the cluster jumper is directly opposite the beam quality analyzer;

[0018] (2) Select the optical fiber closest to the geometric center axis of the outer sleeve of the cluster jumper at the light-emitting end of the cluster jumper as the light-passing optical fiber, and connect the test laser to the light-passing optical fiber;

[0019] (3) Adjust the position of the beam quality analyzer relative to the outer sleeve of the cluster jumper to obtain the light spot of the light-passing optical fiber, and analyze the angle of the light beam emitted by the light-passing optical fiber relative to the geometric center axis of the outer sleeve of the cluster jumper as the eccentricity of the cluster jumper to be tested.

[0020] Preferably, in the method for measuring the eccentricity of the bundled jumper, in step (2), when multiple optical fibers are at equal and closest distances to the geometric center axis of the outer sleeve of the bundled jumper, any one of the multiple optical fibers is used as the light-passing optical fiber.

[0021] Preferably, the method for measuring the eccentricity of a cluster jumper uses the device for measuring the eccentricity of a cluster jumper provided by the present invention;

[0022] The cluster jumper is assembled on the assembler of the eccentricity measuring device of the cluster jumper provided by the present invention.

[0023] Preferably, the method for measuring the eccentricity of the bundled jumper, step (3) is as follows:

[0024] (3-1) Calibration: Adjust the relative position of the beam quality analyzer and the light spot in the plane perpendicular to the geometric axis of the outer sleeve of the cluster jumper so that the center of the light spot of the light-passing fiber falls on the preset position. This position is recorded as the reference position. The center position of the light spot of the light-passing fiber of the beam quality analyzer is (x1, y1);

[0025] (3-2) Test: Keep the beam quality analyzer facing the geometric center axis of the outer sleeve of the cluster jumper. Adjust the distance between the beam quality analyzer and the light-emitting end face of the cluster jumper within the linear response range of the beam quality analyzer so that the beam quality analyzer moves to the test position with a distance L from the reference position in the direction of the geometric center axis of the outer sleeve of the cluster jumper. At this time, read the center position of the light spot of the light-passing fiber of the beam quality analyzer as (x2, y2);

[0026] (3-3) Analysis: Based on the change in the center position of the light spot of the light-transmitting optical fiber at the reference position and the test position, the angle of the light beam emitted by the light-transmitting optical fiber relative to the geometric center axis of the outer sleeve of the bundled patch cord is calculated as the eccentricity of the bundled patch cord to be tested; the details are as follows:

[0027] The eccentricity of the cluster jumper is:

[0028]

[0029] Preferably, in the method for measuring the eccentricity of the cluster jumper, the step (3-1) is to make the light spot of the light-passing optical fiber fall on the origin position of the beam quality analyzer;

[0030] In a preferred embodiment, the relative position of the beam quality analyzer and the light spot in a plane perpendicular to the geometric center axis of the outer sleeve of the cluster jumper is adjusted as follows:

[0031] The motion mechanism of the beam quality analyzer and / or the assembler of the eccentricity measuring device of the cluster jumper adjusts the position of the beam quality analyzer and / or the assembler in a plane perpendicular to the guide rail.

[0032] In general, the above technical solutions conceived by the present invention can achieve the following beneficial effects compared with the prior art:

[0033] 1. The eccentricity measurement device for the cluster jumper provided by the present invention takes the processing and assembly errors of the sleeve into consideration, and measures the angle between the emitted light beam and the geometric center of the outer sleeve of the cluster jumper as the eccentricity test result. It truly reflects the offset between the light beam emitted by the cluster jumper and the geometric center axis of the cluster jumper in the assembled state, eliminates the systematic error of the eccentricity test, and facilitates the adaptation of the output end.

[0034] 2. The eccentricity measurement method of the cluster jumper provided by the present invention uses a single optical fiber as the test item, avoiding the instrument error caused by the beam quality analyzer exceeding the linear response range due to the excessive power of the full-pass test light, further reducing the measurement error while saving labor and time costs. BRIEF DESCRIPTION OF THE DRAWINGS

[0035] Figure 1 This is a schematic structural diagram of the eccentricity measurement device for cluster jumpers provided by the present invention;

[0036] Figure 2 This is a partial enlarged view of the assembler of the eccentricity measurement device of the bundled jumper provided by the present invention;

[0037] Figure 3 This is a schematic diagram showing the principle of the method for measuring the eccentricity of the bundled jumper provided by the present invention;

[0038] Figure 4 It is a partial schematic diagram of the center of the optical end face of the cluster jumper to be tested provided by an embodiment of the present invention.

[0039] In all the drawings, the same reference numerals are used to represent the same elements or structures, where: 1 is a beam quality analyzer, 2 is a cluster jumper, 21 is the light-emitting end of the cluster jumper, 211 is the geometric center axis of the outer sleeve of the cluster jumper, 212 is the light-passing optical fiber, 3 is an assembler, 4 is a guide rail, and 5 is a laser. DETAILED DESCRIPTION

[0040] In order to make the objectives, technical solutions and advantages of the present invention more clearly understood, the present invention is further described in detail below with reference to the following embodiments. It should be understood that the specific embodiments described herein are merely for the purpose of explaining the present invention and are not intended to limit the present invention. In addition, the technical features involved in the various embodiments of the present invention described below may be combined with each other as long as they do not conflict with each other.

[0041] The eccentricity measuring device of the bundled jumper provided by the present invention is as follows: Figure 1 As shown, it includes a beam quality analyzer, an assembler, and a guide rail;

[0042] The assembler has an assembly interface that matches the sleeve at the optical end of the cluster jumper. The assembler cooperates with the guide rail so that the axial direction of the assembly interface is parallel to the guide rail. The central axis of the optical end sleeve of the cluster jumper assembled on the assembly interface is parallel to the guide rail. When used for batch testing of cluster jumpers of specific specifications, the assembly interface of the assembler can be designed to be an interface compatible with the cluster jumpers, such as a plug-in interface. The preferred solution is as follows: Figure 2 As shown, when adapting to cluster jumpers of different specifications, the assembly interface includes a base with a V-shaped groove in its cross section and a pressure piece that flexibly cooperates with the base. The pressure piece cooperates with the V-groove base to apply a preload force to the optical end sleeve of the cluster jumper placed between the two, thereby securing the optical end of the cluster jumper. Preferably, a motion mechanism is provided between the assembler and the guide rail for adjusting the position of the assembler within a plane perpendicular to the guide rail.

[0043] The detection surface of the beam quality analyzer is perpendicular to the guide rail; preferably, the beam quality analyzer is provided with a motion mechanism for adjusting the position of the assembler in a plane perpendicular to the guide rail.

[0044] The beam quality analyzer and the assembler move along the guide rail to change the distance between them. The beam quality analyzer and / or the assembler are in sliding cooperation with the guide rail.

[0045] The geometric dimensions of the outer sleeve of the cluster jumper are 8 to 20 mm, and the inner diameter of the sleeve is 1 to 5 mm, while the size of the light-emitting end of the optical fiber bundle is 1 to 2 mm, and the size of the optical fiber is about 100 to 200 um. The processing error of the cluster jumper is one of the sources of eccentricity, and the method of measuring the eccentricity of the cluster jumper by fully passing light through the cluster jumper does not take into account the processing error of the cluster jumper, including the center deviation of the multi-core stacking of the cluster jumper. The eccentricity measuring device for the cluster jumper provided by the present invention measures the deflection of the center of the light beam emitted by the cluster jumper in the assembled state relative to the geometric center axis of the cluster jumper by fixing the posture of the outer sleeve of the cluster jumper and the beam quality analyzer. It covers the eccentricity caused by the processing error of the cluster jumper and the deflection of the light beam, and can be directly applied to the assembly of the cluster jumper.

[0046] Meanwhile, the method of measuring the off-axis degree of the full-pass light of the bundle jumper as an equivalent optical fiber does not consider the problem of the decline of the measurement accuracy caused by the full-pass light power. The general beam quality analyzer adopts a CCD or a CMOS as a photosensitive element. At present, when the output spot of a single optical fiber is analyzed, the light power is in the linear range of the photosensitive element, and the measurement accuracy is high. When the measured light power is significantly increased, the measurement accuracy is decreased because the light power exceeds the linear range of the photosensitive element. The bundle jumper is composed of a plurality of optical fibers. When the full-pass light is in the case, the light power and the spot size of the spot are several times of those of the single optical fiber. Especially when the number of integrated optical fibers of the bundle jumper is large, the problem is particularly prominent. Common bundle jumpers have specifications of 104 cores, 138 cores, 208 cores and the like. The energy of the single-core spot is 3w-5w. After the bundle, the light power can reach 1000W, which exceeds the linear response range of the general beam quality analyzer.

[0047] Repeated experimental tests show that the off-axis degree of the optical fiber at the geometric center of the fiber array at the light output end relative to the geometric central axis of the bundle jumper is used as the off-axis degree of the output light beam of the bundle jumper. The off-axis degree can effectively represent the output direction of the laser light beam in the assembled state, so as to control the product quality of the bundle jumper and facilitate the adaptation of the output end.

[0048] The off-axis degree measuring device of the bundle jumper provided by the application is used for measuring the off-axis degree of the bundle jumper. Figure 3 The specific steps for measuring the off-axis degree of the bundle jumper are as follows:

[0049] (1) The geometric central axis of the bundle jumper outer sleeve tube is determined according to the specifications and sizes of the bundle jumper to be measured, so that the geometric central axis of the bundle jumper outer sleeve tube is directly opposite the beam quality analyzer;

[0050] Preferably, the bundle jumper is assembled on the assembler of the off-axis degree measuring device of the bundle jumper provided by the application.

[0051] (2) The optical fiber closest to the geometric central axis of the bundle jumper outer sleeve tube at the light output end of the bundle jumper is selected as the light-passing optical fiber, and the test laser is connected to the light-passing optical fiber. When a plurality of optical fibers have equal and closest distances from the geometric central axis of the bundle jumper outer sleeve tube, any one of the plurality of optical fibers is selected as the light-passing optical fiber;

[0052] (3) The position of the beam quality analyzer relative to the bundle jumper outer sleeve tube is adjusted to obtain the spot of the light-passing optical fiber. The angle between the light beam emitted by the light-passing optical fiber and the geometric central axis of the bundle jumper outer sleeve tube is analyzed as the off-axis degree of the bundle jumper to be measured.

[0053] Step (3) is specifically as follows:

[0054] (3-1) Calibration: Adjust the relative position of the beam quality analyzer and the light spot in the plane perpendicular to the geometric axis of the outer sleeve of the cluster jumper so that the center of the light spot of the light-passing fiber falls on the preset position. This position is recorded as the reference position. The center position of the light spot of the light-passing fiber of the beam quality analyzer is (x1, y1). It is more convenient to make the light spot of the light-passing fiber fall on the origin position of the beam quality analyzer.

[0055] In a preferred embodiment, the relative position of the beam quality analyzer and the light spot in a plane perpendicular to the geometric center axis of the outer sleeve of the cluster jumper is adjusted as follows:

[0056] The motion mechanism of the beam quality analyzer and / or the assembler of the eccentricity measuring device of the cluster jumper adjusts the position of the beam quality analyzer and / or the assembler in a plane perpendicular to the guide rail.

[0057] (3-2) Test: Keep the beam quality analyzer facing the geometric center axis of the outer sleeve of the cluster jumper. Adjust the distance between the beam quality analyzer and the light-emitting end face of the cluster jumper within the linear response range of the beam quality analyzer so that the beam quality analyzer moves to the test position with a distance L from the reference position in the direction of the geometric center axis of the outer sleeve of the cluster jumper. At this time, read the center position of the light spot of the light-passing fiber of the beam quality analyzer as (x2, y2);

[0058] (3-3) Analysis: Based on the change in the center position of the light spot of the light-transmitting optical fiber at the reference position and the test position, the angle of the light beam emitted by the light-transmitting optical fiber relative to the geometric center axis of the outer sleeve of the bundled patch cord is calculated as the eccentricity of the bundled patch cord to be tested; the details are as follows:

[0059] The eccentricity of the cluster jumper is:

[0060]

[0061] The following are examples:

[0062] The eccentricity measurement device of the bundled jumper provided in this embodiment is as follows: Figure 1 As shown, it includes a beam quality analyzer, an assembler, and a guide rail;

[0063] The assembler has an assembly interface that cooperates with the light-emitting end sleeve of the cluster jumper. The assembler cooperates with the guide rail to make the assembly interface axially parallel to the guide rail. The central axis of the light-emitting end sleeve of the cluster jumper assembled on the assembly interface is parallel to the guide rail.

[0064] like Figure 2 As shown, the assembly interface provided in this embodiment includes a base with a V-shaped groove in the cross section and a pressing piece that movably cooperates with the base. The pressing piece cooperates with the V-groove base and the light-emitting end sleeve of the cluster jumper placed between the two applies a pre-tightening force, thereby fixing the light-emitting end of the cluster jumper.

[0065] The assembler is arranged on a displacement platform and is used to adjust the position of the assembler in a plane perpendicular to the guide rail.

[0066] The detection surface of the beam quality analyzer is perpendicular to the guide rail; the beam quality analyzer is provided with a displacement platform for adjusting the position of the assembler in a plane perpendicular to the guide rail.

[0067] The beam quality analyzer and the assembler move along the guide rail to change the distance between them. The beam quality analyzer and / or the assembler are in sliding cooperation with the guide rail.

[0068] This embodiment takes the eccentricity test of a 138-core cluster jumper as an example. The local arrangement of the optical fiber center of the end face of the 138-core cluster jumper is shown as follows: Figure 4 .

[0069] The specific steps for testing the eccentricity of cluster jumpers are as follows:

[0070] (1) Determine the geometric center axis of the outer sleeve of the cluster jumper according to the specifications and dimensions of the cluster jumper to be tested, that is, the center of the light-emitting end face, so that the geometric center axis of the outer sleeve of the cluster jumper is facing the beam quality analyzer;

[0071] In this embodiment, the cluster jumper is assembled on the assembler of the eccentricity measuring device of the cluster jumper provided by the present invention, the outer sleeve of the cluster jumper is placed on the base with a V-shaped groove, and the pressing piece is fixed and pre-tightened with screws so that the central axis of the outer sleeve of the cluster jumper is parallel to the guide rail.

[0072] (2) Select the optical fiber whose light-emitting end of the cluster jumper is closest to the geometric center axis of the outer sleeve of the cluster jumper as the light-passing optical fiber, and connect the test laser to the light-passing optical fiber; when there are multiple optical fibers that are at the same and closest distance to the geometric center axis of the outer sleeve of the cluster jumper, any one of the multiple optical fibers is used as the light-passing optical fiber;

[0073] The cross section of the inner wall of the cluster jumper ferrule is rectangular. The optical fiber closest to the center point is selected as the center optical fiber of the cluster jumper and the light-passing optical fiber. Figure 4 As shown in the figure. First, find the center point of the light-emitting end face of the combined end. The center fiber of the cluster jumper is the fiber whose core is closest to the center point. If there are multiple center fibers, that is, multiple fibers equidistant from the center point, you can select any one of them. Use a flange to connect the light source to the laser pigtail. When the laser is powered on, a light spot emitted by the light-emitting fiber of the cluster jumper will appear on the beam analyzer. The combined end of the cluster jumper is composed of the light-emitting end faces of all optical fibers. The light-emitting surface of the combined end of the cluster jumper is perpendicular to the center of the receiving surface of the beam quality analyzer.

[0074] (3) Adjust the position of the beam quality analyzer relative to the outer sleeve of the cluster jumper to obtain the light spot of the light-passing optical fiber, and analyze the angle of the light beam emitted by the light-passing optical fiber relative to the geometric center axis of the outer sleeve of the cluster jumper as the eccentricity of the cluster jumper to be tested.

[0075] Step (3) is as follows:

[0076] (3-1) Calibration: Adjust the relative position of the beam quality analyzer and the light spot in a plane perpendicular to the geometric axis of the outer sleeve of the cluster jumper so that the center of the light spot of the light-passing fiber falls on a preset position. This position is recorded as the reference position. The center position of the light spot of the light-passing fiber of the beam quality analyzer is (x1, y1). In this embodiment, the light spot of the light-passing fiber falls on the origin position of the beam quality analyzer.

[0077] The adjustment of the relative position of the beam quality analyzer and the light spot in the plane perpendicular to the geometric center axis of the outer sleeve of the cluster jumper is specifically as follows:

[0078] The motion mechanism of the beam quality analyzer and the assembler of the eccentricity measuring device of the cluster jumper adjusts the position of the beam quality analyzer and the assembler in a plane perpendicular to the guide rail.

[0079] The reference position is obtained by adjusting the center position of the central optical fiber light spot to coincide with the origin of the beam quality analyzer, and the optical fiber light-emitting end face is located 10 mm away from the beam quality analyzer.

[0080] (3-2) Test: Keep the beam quality analyzer facing the geometric center axis of the outer sleeve of the cluster jumper, and adjust the distance between the beam quality analyzer and the light-emitting end face of the cluster jumper within the linear response range of the beam quality analyzer, so that the beam quality analyzer moves to the test position with a distance of L from the reference position in the direction of the geometric center axis of the outer sleeve of the cluster jumper. The center position of the light spot of the light-passing fiber of the beam quality analyzer at this time is read as (x2, y2); the test position is 5 mm away from the reference position in the direction away from the light source.

[0081] (3-3) Analysis: Based on the change in the center position of the light spot of the light-transmitting optical fiber at the reference position and the test position, the angle of the light beam emitted by the light-transmitting optical fiber relative to the geometric center axis of the outer sleeve of the bundled patch cord is calculated as the eccentricity of the bundled patch cord to be tested; the details are as follows:

[0082] The eccentricity of the cluster jumper is:

[0083]

[0084] The test results are shown in the following table:

[0085]

[0086] It will be easily understood by those skilled in the art that the above description is merely a preferred embodiment of the present invention and is not intended to limit the present invention. Any modifications, equivalent substitutions, and improvements made within the spirit and principles of the present invention should be included in the scope of protection of the present invention.

Claims

1. A device for measuring the eccentricity of a bundled jumper, characterized in that: Includes beam quality analyzer, assembler, and guide rails; The assembler has an assembly interface that cooperates with the light-emitting end sleeve of the cluster jumper. The assembler cooperates with the guide rail so that the axial direction of the assembly interface is parallel to the guide rail, and the central axis of the light-emitting end sleeve of the cluster jumper assembled on the assembly interface is parallel to the guide rail; The detection surface of the beam quality analyzer is perpendicular to the guide rail; The beam quality analyzer and the assembler move along the guide rail to change the distance between them.

2. The eccentricity measuring device for a cluster jumper according to claim 1, wherein: The assembly interface of the assembler is an interface adapted to the bundled jumper; or The assembly interface includes a base with a V-shaped groove in its cross section and a pressing piece that movably cooperates with the base. The pressing piece cooperates with the V-groove base to apply a pre-tightening force to the light-emitting end sleeve of the cluster jumper placed between the two, thereby fixing the light-emitting end of the cluster jumper.

3. The eccentricity measuring device for a cluster jumper according to claim 1, wherein: A motion mechanism is provided between the assembler and the guide rail for adjusting the position of the assembler in a plane perpendicular to the guide rail.

4. The eccentricity measuring device for a cluster jumper according to claim 1, wherein: The beam quality analyzer is provided with a motion mechanism for adjusting the position of the beam quality analyzer in a plane perpendicular to the guide rail.

5. The eccentricity measuring device for a cluster jumper according to claim 1, wherein: The beam quality profiler and / or the assembler are in sliding engagement with the guide rail.

6. A method for measuring the eccentricity of a bundled jumper, characterized in that: The following steps are involved: (1) Determine the geometric center axis of the sleeve at the optical output end of the cluster jumper according to the specifications of the cluster jumper to be tested, so that the geometric center axis of the sleeve at the optical output end of the cluster jumper is facing the beam quality analyzer; (2) Select the optical fiber closest to the geometric center axis of the sleeve at the light-emitting end of the cluster jumper as the light-passing optical fiber, and connect the test laser to the light-passing optical fiber; (3) Adjust the position of the beam quality analyzer relative to the sleeve at the light-emitting end of the cluster jumper, obtain the light spot of the light-passing optical fiber, and analyze the angle of the light beam emitted by the light-passing optical fiber relative to the geometric center axis of the sleeve at the light-emitting end of the cluster jumper as the eccentricity of the cluster jumper to be tested.

7. The method for measuring the eccentricity of a cluster jumper according to claim 6, wherein: In step (2), when multiple optical fibers are at the same and closest distances to the geometric center axis of the light-emitting end sleeve of the bundled jumper, any one of the multiple optical fibers is used as the light-passing optical fiber.

8. The method for measuring the eccentricity of a cluster jumper according to claim 6, wherein: An eccentricity measuring device for a cluster jumper according to any one of claims 1 to 5 is used; The cluster jumper is assembled on an assembler of an eccentricity measurement device for the cluster jumper.

9. The method for measuring the eccentricity of a cluster jumper according to claim 8, wherein: Step (3) is as follows: (3-1) Calibration: Adjust the relative position of the beam quality analyzer and the light spot in the plane perpendicular to the geometric axis of the sleeve at the light-emitting end of the cluster jumper, so that the center of the light spot of the light-passing fiber falls on the preset position. This position is recorded as the reference position. The center position of the light spot of the light-passing fiber of the beam quality analyzer is ; (3-2) Test: Keep the beam quality analyzer facing the geometric center axis of the sleeve at the light-emitting end of the cluster jumper. Adjust the distance between the beam quality analyzer and the light-emitting end face of the cluster jumper within the linear range of the beam quality analyzer so that the beam quality analyzer moves to a position 1 / 4 of the distance from the reference position in the direction of the geometric center axis of the sleeve at the light-emitting end of the cluster jumper. The test position of the optical fiber is read as the center position of the light spot of the beam quality analyzer. ; (3-3) Analysis: Based on the change in the center position of the light spot of the light-transmitting optical fiber between the reference position and the test position, the angle between the light beam emitted by the light-transmitting optical fiber and the geometric center axis of the sleeve at the light-emitting end of the bundled jumper is calculated as the eccentricity of the bundled jumper to be tested; the details are as follows: The eccentricity of the cluster jumper is: ； 。 10. The method for measuring the eccentricity of a cluster jumper according to claim 9, wherein: The step (3-1) causes the light spot of the light-passing optical fiber to fall at the origin position of the beam quality analyzer.

11. The method for measuring the eccentricity of a cluster jumper according to claim 10, wherein: The adjustment of the relative position of the beam quality analyzer and the light spot in the plane perpendicular to the geometric center axis of the sleeve at the light output end of the cluster jumper is specifically as follows: The movement mechanism of the beam quality analyzer and / or the assembler of the eccentricity measuring device of the cluster jumper is used to adjust the position of the beam quality analyzer and / or the assembler in a plane perpendicular to the guide rail.

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