Device and method for testing thermal state deformation quantity of electronic glass

Abstract

The invention belongs to the field of electronic glass detection, and relates to a device and a method for testing deformation quantity of electronic glass during high-temperature heat treatment. Comprising a furnace body, a heating element, a temperature measuring element and a sample supporting frame are arranged in the furnace body, a sample is placed on the sample supporting frame, the interior of the furnace body is heated through the heating element, a laser sensor is arranged on one side of the furnace body, the length of the sample is measured, measured data are transmitted to a PC terminal, and the measured data are displayed on a liquid crystal display screen. The laser sensor is used for measuring the length of the sample, the problem that an existing scribing method is large in measuring error is solved, the measuring precision is improved, the heating element and the PID controller are used for controlling the temperature to rise evenly, the problem that deformation difference is large is solved, and the yield is improved.

Description

Technical Field

[0001] The invention belongs to the field of electronic glass detection, and in particular relates to a device and method for testing the deformation amount of electronic glass during high-temperature heat treatment. Background Art

[0002] With the rapid development of the display technology industry, people's demand for various display devices is growing. In the display manufacturing process, multiple treatments are required at higher temperatures. For example, in the production process of amorphous silicon (a-Si) TFT, multiple treatments are required at 300-450°C, while for polycrystalline silicon (p-Si) TFT, multiple treatments are required at 450-600°C. This requires that the electronic glass used in the display must not be significantly deformed during multiple high-temperature treatments, thus placing higher requirements on the thermal stability and dimensional stability of the glass.

[0003] The processing of display modules requires lamination and other processes under high temperature and heat, so it is necessary to know the deformation of electronic glass under heat. The current method for testing thermal shrinkage in the industry is mainly the scribing method, which uses an instrument that can scribble on the glass surface, such as a Vickers hardness tester indenter, a glass cutter, or sandpaper, to scribble marks at both ends of the sample. The sample is then divided into two pieces, one as the substrate without treatment, and the other as the treated sample after being treated and cooled under test conditions. The treated sample and the substrate sample are spliced ​​together, and the difference between the scribing at both ends of the sample is tested under a microscope to calculate the thermal shrinkage of the sample. This method will cause the glass to have a large error in the calculation result due to uneven force when scribing, and this method is a test conducted in a cold state after the electronic glass has undergone heating-insulation-cooling, and cannot simulate the user's process under high temperature and heat. Summary of the invention

[0004] The purpose of the present invention is to overcome the problems of large measurement errors caused by the scribing method in existing testing methods, as well as low yield rate in the display module processing process caused by the difference between the test results in the cold state and the deformation amount in the hot state, and provide a testing device and method for the thermal deformation of electronic glass.

[0005] In order to achieve the above object, the present invention adopts the following technical solution:

[0006] A device for testing the thermal deformation of electronic glass, comprising a furnace body, a laser sensor, a heating element, a temperature measuring element, a liquid crystal display, a sample support frame and a PC end equipped with data processing software, wherein the laser sensor is arranged on one side of the furnace body, the heating element and the sample support frame are arranged inside the furnace body, the sample support frame is used to place the sample, the temperature measuring element extends into the furnace body, and the PC end is connected with the laser sensor and the liquid crystal display;

[0007] The heating element is connected to a PID controller, which is used to accurately control the temperature of the heating element;

[0008] The laser sensor is used to measure the length change rate of the sample, obtain the measurement data, and send the measurement data to the PC for processing, and output the processed data to the LCD display for display.

[0009] A cavity is arranged inside the furnace body, the cavity is made of refractory material, and a heat insulation layer is formed between the cavity and the furnace body.

[0010] A plurality of holes are provided on the top of the furnace cavity, and the heating elements are arranged through the holes.

[0011] The temperature measuring element is arranged through the furnace body and the cavity.

[0012] A sample stage is arranged inside the furnace body, and a sample support frame is fixed on the sample stage.

[0013] The sample support frame is H-shaped and connected by spherical connection points.

[0014] The furnace body is installed on the base, and the liquid crystal display screen is arranged on the side of the base.

[0015] A heat preservation plug is arranged on the other side of the furnace body, and the heat preservation plug is located at the sample inlet.

[0016] A method for testing the thermal deformation of electronic glass comprises the following steps:

[0017] S1: Cut the sample into appropriate size, put it into the furnace, and place it on the sample support frame, with one side of the sample aligned with the furnace mouth;

[0018] S2: Set up the program on the LCD screen, turn on the laser sensor and the data processing software on the PC, and the laser sensor will feedback the initial length L of the sample. 0 ;

[0019] S3: According to the set program, the heating element starts heating, the temperature measuring element measures the temperature, and the laser sensor feeds back the length L of the sample to the data processing software on the PC in real time, recording the measured temperature and sample length;

[0020] S4: After the experiment, the sample is slowly cooled, and the data processing software processes the data to obtain the processing results, which are sent to the PID controller and output to the LCD screen by the PID controller.

[0021] The data processing software in S4 uses the following formula to process the data:

[0022]

[0023] Where: δ is the length change rate of the sample; L 0 is the initial length of the sample; L a is the length of the electronic glass that will be deformed by heat; L is the sample length at the corresponding temperature.

[0024] Compared with the prior art, the present invention has the following beneficial effects:

[0025] The present invention provides a testing device and method for the thermal deformation of electronic glass, comprising a furnace body, wherein a heating element, a temperature measuring element and a sample support frame are arranged inside the furnace body, a sample is placed on the sample support frame, the furnace body is heated by the heating element, a laser sensor is arranged on one side of the furnace body, the length of the sample is measured, and the measurement data is transmitted to a PC end, and the data is displayed on a liquid crystal display screen. By using a laser sensor to measure the length of the sample, the problem of large measurement error in the existing scribing method is solved, and the measurement accuracy is improved. By controlling the temperature to rise evenly by the heating element and the PID controller, the problem of large deformation difference is solved, and the yield rate is improved.

[0026] Furthermore, the sample support frame is H-shaped, and the connection is spherical, which is in point contact with the sample, reducing the resistance of the sample during deformation, improving the test accuracy, meeting the sample deformation parameters required by the user during the thermal processing, and improving the yield of the display module. BRIEF DESCRIPTION OF THE DRAWINGS

[0027] Figure 1 Schematic diagram of the testing device for the thermal deformation of electronic glass in the present invention.

[0028] Figure 2 Schematic diagram of the H-type sample support frame in the present invention.

[0029] Explanation of the reference numerals in the figure: 1. furnace body; 2. laser sensor; 3. cavity; 4. thermal insulation layer; 5. heating element; 6. temperature measuring element; 7. liquid crystal display; 8. sample table; 9. sample support frame; 10. insulation plug; 11. sample; 12. spherical connection point; 13. base. DETAILED DESCRIPTION

[0030] In order to further understand the content of the present invention, the present invention is described in detail below in conjunction with the accompanying drawings and specific embodiments. It should be understood that the embodiments are only for explaining the present invention and are not intended to limit it.

[0031] A device for testing the thermal deformation of electronic glass, the composition structure of which is as follows:

[0032] like Figures 1-2As shown, a testing device for the thermal deformation of electronic glass comprises a furnace body 1, a cavity 3 made of refractory material is arranged inside the furnace body 1, a thermal insulation layer 4 is formed between the cavity 3 and the furnace body 1, a plurality of holes are opened through the top of the cavity 3, a heating element 5 is arranged through the holes, a temperature measuring element 6 is arranged through the furnace body 1 and the cavity 3, a sample table 8 is arranged at the bottom of the furnace body 1, a sample support frame 9 is fixed on the sample table 8, a sample 11 is placed on the sample support frame 9, the furnace body 1 is placed on a base 13, a liquid crystal display screen 7 is arranged on the base 13, a laser sensor 2 is arranged on one side of the furnace body 1, the laser sensor 2 is connected to the PC end and the liquid crystal display screen 7, and a heat preservation plug 10 is arranged at the entrance on the other side of the furnace body 1;

[0033] The heating element 5 has a PID controller, and the PID controller is used to accurately control the temperature of the heating element 5;

[0034] The laser sensor is used to measure the length change rate of the sample 11, and the measured data is sent to the PC for processing, and the processed data is output to the LCD display 7 for output.

[0035] Preferably, the laser sensor 2 covers the sample 11 extending out of the furnace body 1 .

[0036] Preferably, an H-shaped sample support frame 9 is placed on the sample stage 8, and the connection point thereof is a spherical connection point 12, so that the sample and the sample support frame are in point contact, thereby reducing the resistance of the sample when it is deformed by heat.

[0037] A method for testing the thermal deformation of electronic glass comprises the following steps:

[0038] S1: Cut the sample 11 into a suitable size, put it into the furnace 1, and place it on the sample support frame 9, with one side of the sample 11 aligned with the furnace opening;

[0039] S2: Set up a program on the LCD screen 7, open the laser sensor 2 and the data processing software on the PC, and the laser sensor 9 feeds back the initial length L of the sample 11 0 ;

[0040] S3: According to the set program, the heating element 5 starts heating, the temperature measuring element 6 measures the temperature, and the laser sensor 9 feeds back the length L of the sample to the data processing software on the PC in real time, and records the measured temperature and sample length;

[0041] S4: After the experiment is finished, the sample 11 is slowly cooled, and the data processing software processes the data to obtain the processing result, which is sent to the PID controller and outputted to the LCD screen 7 by the PID controller.

[0042] The data processing software in S4 uses the following formula to process the data:

[0043]

[0044] Where: δ is the length change rate of sample (11); L 0 is the initial length of the sample; L a is the length of the electronic glass that will be deformed by heat; L is the sample length at the corresponding temperature.

[0045] Embodiment 1:

[0046] S1: Cut the test sample of about 600mm×100mm, use the precision engraving machine to grind and polish the two ends of the sample, the grinding and polishing process takes about 1min; open the insulation plug 10, put the sample 11 and the sample support frame 9 on the sample table 8 of the furnace, and gently push the sample 11 and the sample support frame 9 with the insulation plug 10 to ensure that one side of the sample is flush with the furnace mouth. The total length of the furnace is 500mm, and the part of the sample extending out of the furnace body is 100mm;

[0047] S2: Set the program on the LCD 7 of the furnace base 13, raise the temperature to 600°C at a heating rate of 10°C / min, and keep it warm for 20 minutes. Turn on the laser sensor 2 and the PC software, and the laser sensor 2 feedbacks the initial length of the sample as 600mm;

[0048] S3: The temperature starts to rise according to the set program. The laser sensor feeds back the length L of the sample to the PC software in real time, and records the temperature and sample length in real time.

[0049] S4: After the experiment, the sample is slowly cooled in the furnace 1, and the data is processed on the PC data processing software. If the sample length fed back by the laser sensor is 600.10mm when the temperature rises to 600℃, the length change rate of the sample when it rises from room temperature to 600℃ is calculated according to the following formula:

[0050]

[0051] That is, when the temperature rises from room temperature to 600°C, the length change rate of the sample is 0.0002, or 200 ppm.

[0052] Embodiment 2:

[0053] S1: Cut the test sample of about 650mm×100mm, use the precision engraving machine to grind and polish the two ends of the sample, the grinding and polishing process takes about 1min; open the insulation plug 10, put the sample 11 and the sample support frame 9 on the sample table 8 of the furnace, and gently push the sample 11 and the sample support frame 9 with the insulation plug 10 to ensure that one side of the sample is flush with the furnace mouth. The total length of the furnace is 500mm, and the part of the sample extending out of the furnace body is 150mm;

[0054] S2: Set the program on the LCD 7 of the furnace base 13, raise the temperature to 600°C at a heating rate of 10°C / min, and keep it warm for 20 minutes. Turn on the laser sensor 2 and the PC software, and the laser sensor 2 feedbacks the initial length of the sample as 650mm;

[0055] S3: The temperature starts to rise according to the set program. The laser sensor feeds back the length L of the sample to the PC software in real time, and records the temperature and sample length in real time.

[0056] S4: After the experiment, the sample is slowly cooled in the furnace 1, and the data is processed on the PC data processing software. If the sample length fed back by the laser sensor is 650.25mm when the temperature rises to 600℃, the length change rate of the sample when it rises from room temperature to 600℃ is calculated according to the following formula:

[0057]

[0058] That is, when the temperature rises from room temperature to 600°C, the length change rate of the sample is 0.0005, or 500 ppm.

[0059] Finally, it should be noted that the above embodiments are only used to illustrate the technical solutions of the present invention rather than to limit it. Although the present invention has been described in detail with reference to the above embodiments, ordinary technicians in the relevant field should understand that the specific implementation methods of the present invention can still be modified or replaced by equivalents. Any modification or equivalent replacement that does not depart from the spirit and scope of the present invention should be covered within the scope of protection of the claims of the present invention.

Claims

1. A device for testing the thermal deformation of electronic glass, characterized in that: The invention comprises a furnace body (1), a laser sensor (2), a heating element (5), a temperature measuring element (6), a liquid crystal display (7), a sample support frame (9) and a PC end equipped with data processing software, wherein the laser sensor (2) is arranged on one side of the furnace body (1), the heating element (5) and the sample support frame (9) are arranged inside the furnace body (1), the sample support frame (9) is used to place a sample (11), the temperature measuring element (6) extends into the furnace body (1), and the PC end is connected to the laser sensor (2) and the liquid crystal display (7); The heating element (5) is connected to a PID controller, and the PID controller is used to accurately control the temperature of the heating element (5); The laser sensor (2) is used to measure the length change rate of the sample (11), obtain measurement data, send the measurement data to the PC for processing, and output the processed data to the liquid crystal display (7) for display.

2. The device for testing the thermal deformation of electronic glass according to claim 1, characterized in that: A cavity (3) is arranged inside the furnace body (1); the cavity (3) is made of a refractory material; and a heat insulation layer (4) is formed between the cavity (3) and the furnace body (1).

3. The device for testing the thermal deformation of electronic glass according to claim 2, characterized in that: The top of the furnace cavity (3) is provided with a plurality of holes, and the heating elements (5) are arranged through the holes.

4. The device for testing the thermal deformation of electronic glass according to claim 2, characterized in that: The temperature measuring element (6) is arranged through the furnace body (1) and the cavity (3).

5. The device for testing the thermal deformation of electronic glass according to claim 1, characterized in that: A sample stage (8) is arranged inside the furnace body (1), and a sample support frame (9) is fixed on the sample stage (8).

6. The device for testing the thermal deformation of electronic glass according to claim 5, characterized in that: The sample support frame (9) is H-shaped and connected using spherical connection points (12).

7. The device for testing the thermal deformation of electronic glass according to claim 1, characterized in that: The furnace body (1) is installed on a base (13), and the liquid crystal display screen (7) is arranged on the side of the base (13).

8. The device for testing the thermal deformation of electronic glass according to claim 1, characterized in that: A heat preservation plug (10) is arranged on the other side of the furnace body (1), and the heat preservation plug (10) is located at the entrance of the sample (11).

9. A method for testing the thermal deformation of electronic glass, characterized in that: The steps include: S1: Cut the sample (11) into a suitable size, put it into the furnace body (1), and place it on the sample support frame (9), with one side of the sample (11) aligned with the furnace opening; S2: Set up a program on the LCD screen (7), open the laser sensor (2) and the data processing software on the PC, and the laser sensor (9) feeds back the initial length L0 of the sample (11); S3: According to the set program, the heating element (5) starts heating, the temperature measuring element (6) measures the temperature, and the laser sensor (9) feeds back the length L of the sample to the data processing software on the PC in real time, and records the measured temperature and sample length; S4: After the experiment is finished, the sample (11) is slowly cooled, and the data processing software processes the data to obtain the processing results, which are sent to the PID controller and outputted to the liquid crystal display (7) by the PID controller.

10. The method for testing the thermal deformation of electronic glass according to claim 9, characterized in that: The data processing software in S4 uses the following formula to process the data: Where: δ is the length change rate of sample (11); L0 is the initial length of sample (11); L a is the length of the electronic glass that will be deformed by heat; L is the sample length at the corresponding temperature.

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