Test method, system and equipment for mos tube and medium

Abstract

The invention relates to a test method, system and device for an mos transistor, and a medium. The method comprises the steps of determining a target phase of a motor and a voltage conduction direction of the target phase based on a to-be-tested mos transistor of the motor; according to a preset voltage application requirement, applying a voltage to the target phase in the voltage conduction direction to obtain a plurality of inflow currents flowing into the mos transistor to be measured; and obtaining a current trigger threshold value of the mos transistor to be measured based on the plurality of inflow currents. The problem that in the prior art, when a motor controller adopting the foc algorithm is used for testing a motor, not only the software of the foc algorithm needs to be tested, but also the hardware mos tube of the motor needs to be tested, and consequently the testing difficulty of the motor is increased is solved.

Description

Background Art

[0002] The motor is the heart of industrial control and the basis of power. The growth of the overall demand for the motor market comes from the synchronous growth brought about by the growth of power installed capacity, power and other energy consumption, as well as the demand for motors driven by automation needs and the replacement demand brought about by the application of high-efficiency motors. Therefore, the demand for motors has increased, and at the same time, the demand for testing motors has arisen. In the prior art, a motor controller using the foc algorithm is often used to test the motor. However, in the development process of a motor controller using the foc algorithm, many problems will be encountered in the early stage, such as whether the foc algorithm is correct and whether the bottom software and hardware functions are normal. Whether the bottom software and hardware functions are normal includes whether the hardware MOS tube is burned out, whether the bottom software output phase is wrong, whether the application layer logic is wrong, etc. Therefore, when using a motor controller using the foc algorithm to test the motor, it is necessary not only to test the software problems of the foc algorithm itself, but also to test the hardware MOS tube problems of the motor, which increases the difficulty of testing the motor. Summary of the invention

[0003] In order to overcome the problem that when a motor controller using the FOC algorithm is used to test a motor in the prior art, not only the software problem of the FOC algorithm itself needs to be tested, but also the hardware MOS tube problem of the motor needs to be tested, which increases the difficulty of testing the motor, the present application provides a testing method, system, device and medium for MOS tubes.

[0004] In the first aspect, in order to solve the above technical problems, the present application provides a testing method for MOS tubes, comprising:

[0005] Determine the target phase of the motor and the voltage conduction direction of the target phase based on the MOS tube to be tested of the motor;

[0006] According to the preset voltage application requirements, voltage is applied to the target phase through the voltage conduction direction to obtain multiple inflow currents flowing into the MOS tube to be tested;

[0007] Based on the multiple inflow currents, the current triggering threshold of the MOSFET to be tested is obtained.

[0008] In a second aspect, the present application also provides a testing system for MOS tubes, comprising:

[0009] A determination module, used to determine the target phase of the motor and the voltage conduction direction of the target phase based on the MOS tube to be tested of the motor;

[0010] A voltage application module is used to apply voltage to the target phase through the voltage conduction direction according to the preset voltage application requirements to obtain multiple inflow currents flowing into the MOS tube to be tested;

[0011] The module is used to obtain the current trigger threshold of the MOSFET to be tested based on multiple inflow currents.

[0012] In a third aspect, the present application also provides a computing device, including a memory, a processor, and a program stored in the memory and running on the processor, and when the processor executes the program, the steps of a testing method for MOS tubes as described above are implemented.

[0013] In a fourth aspect, the present application also provides a computer-readable storage medium, in which instructions are stored. When the instructions are executed on a terminal device, the terminal device executes the steps of a testing method for a MOS tube.

[0014] The beneficial effect of the present application is: according to the preset voltage application requirements, voltage is applied through the target phase and voltage conduction direction corresponding to the MOSFET to be tested of the motor, multiple inflow currents flowing into the MOSFET to be tested are obtained, and the current trigger threshold of the MOSFET to be tested is obtained directly based on the multiple inflow currents. In this way, compared with the method of testing the motor by the motor controller using the foc algorithm in the prior art, the method of the present application does not need to locate the software problem of the motor, but only needs to directly test the current of the motor to realize the test of the hardware MOSFET of the motor, which simplifies the test process and reduces the test difficulty. BRIEF DESCRIPTION OF THE DRAWINGS

[0015] Figure 1 A schematic flow chart of a testing method for MOS tubes shown as an exemplary embodiment of the present application;

[0016] Figure 2 This is a schematic diagram of the connection structure of the A phase, the B phase and the C phase of the motor in an exemplary embodiment of the present application;

[0017] Figure 3 is a schematic diagram of a current variation curve in an exemplary embodiment of the present application;

[0018] Figure 4 The present invention is a schematic structural diagram of a testing system for MOS tubes according to an exemplary embodiment of the present invention. DETAILED DESCRIPTION

[0019] The following examples are provided to further explain and supplement the present application and do not constitute any limitation to the present application.

[0020] The following describes a testing method, system, equipment and medium for MOS tubes according to an embodiment of the present application in conjunction with the accompanying drawings.

[0021] A testing method for a MOS tube in an embodiment of the present application is applied to a terminal device. In the present application scheme, the terminal device is used as the execution subject to illustrate the present application scheme. The terminal device is used to execute the steps of a testing method for a MOS tube.

[0022] See also Figure 1 , Figure 1 A testing method for MOS tubes is shown as an exemplary embodiment of the present application. Figure 1 As shown, the present application provides a testing method for MOS tubes, comprising:

[0023] Step S11, determining the target phase of the motor and the voltage conduction direction of the target phase based on the MOS tube to be tested of the motor;

[0024] Step S12, applying voltage to the target phase in the voltage conduction direction according to the preset voltage application requirement, to obtain multiple inflow currents flowing into the MOS tube to be tested;

[0025] Step S13, obtaining a current trigger threshold of the MOSFET to be tested based on the multiple inflow currents.

[0026] A test method for MOS tubes in this embodiment applies voltage through the target phase and voltage conduction direction corresponding to the MOS tube to be tested of the motor according to the preset voltage application requirements, obtains multiple inflow currents flowing into the MOS tube to be tested, and directly obtains the current trigger threshold of the MOS tube to be tested based on the multiple inflow currents. In this way, compared with the method of testing the motor by the motor controller using the foc algorithm in the prior art, the method of this embodiment does not need to locate the software problem of the motor, but only needs to directly test the current of the motor, so as to realize the test of the hardware MOS tube of the motor, simplifying the test process and reducing the test difficulty.

[0027] Optionally, determining a target phase of the motor and a voltage conduction direction of the target phase based on a MOS tube to be tested of the motor includes:

[0028] Get the phase connected in series with the MOS tube to be tested, and use this phase as the target phase of the motor;

[0029] The unidirectional conduction direction of the MOS tube to be tested is obtained, and the unidirectional conduction direction is used as the voltage conduction direction of the target phase.

[0030] In this embodiment, the unidirectional conduction direction is a forward conduction direction or a negative conduction direction, and each phase of the motor is respectively connected in series with a forward conduction MOSFET and a negative conduction MOSFET. When the MOSFET to be tested is subjected to a current test, only the phase connected in series with the MOSFET to be tested can transmit current, and the phase serves as the target phase of the MOSFET to be tested. At the same time, since the MOSFET to be tested is unidirectionally conducted, only when the direction of the current transmitted by the target phase is the same as the unidirectional conduction direction of the MOSFET to be tested, the transmitted current can pass through the MOSFET to be tested to complete the test of the MOSFET to be tested, so as to facilitate the subsequent acquisition of the current trigger threshold of the MOSFET to be tested.

[0031] Optionally, according to the preset voltage application requirement, a voltage is applied to the target phase through the voltage conduction direction to obtain multiple inflow currents flowing into the MOS tube to be tested, including:

[0032] Obtaining a preset base voltage corresponding to the preset voltage application requirement, and obtaining a dynamic voltage based on the preset base voltage, wherein the value of the dynamic voltage increases by a set value at intervals of a preset time length based on the preset base voltage;

[0033] Apply dynamic voltage to the target phase through the voltage conduction direction to obtain multiple inflow currents flowing into the MOS tube to be tested;

[0034] Among them, the inflow current corresponding to the preset base voltage is less than the current trigger threshold of the MOSFET to be tested.

[0035] In this embodiment, based on the dynamic voltage obtained by increasing the set value at intervals of a preset time on the basis of a preset base voltage, and applying the dynamic voltage to the target phase through the voltage conduction direction, a voltage transformation test can be realized in which the MOSFET to be tested performs regular current transformation with the same time variable and voltage variable, so that the multiple inflow currents obtained into the MOSFET to be tested can reflect the current changes of the MOSFET to be tested, which is convenient for the subsequent direct determination of the current trigger threshold of the MOSFET to be tested based on the current changes of the multiple inflow currents. Wherein, the preset base voltage is greater than or equal to 0V.

[0036] Optionally, according to the preset voltage application requirement, a voltage is applied to the target phase through the voltage conduction direction to obtain multiple inflow currents flowing into the MOS tube to be tested, including:

[0037] Control the d-axis of the motor to coincide with the target phase winding;

[0038] According to the preset voltage application requirements, voltage is applied to the d-axis through the voltage conduction direction to apply voltage to the target phase to obtain multiple inflow currents flowing into the MOS tube to be tested.

[0039] In this embodiment, when the d-axis of the motor coincides with the target phase winding, the current generated by the voltage applied to the target phase can all flow into the MOSFET to be tested, thereby avoiding the current flowing into the MOSFET to be tested due to the shunting interference caused by the q-axis voltage division of the motor, thereby improving the stability of the multiple inflow currents flowing into the MOSFET to be tested, and further improving the accuracy of the current trigger threshold of the MOSFET to be tested that is subsequently determined based on the multiple inflow currents.

[0040] See also Figure 2 , Figure 2 In an exemplary embodiment of the present application, the connection structure of the A phase, the B phase and the C phase of the motor. Figure 2 As shown, the motor includes phase A, phase B, phase C, d-axis and q-axis. Phase A, phase B and phase C are on the same plane of the motor, and phase A, phase B and phase C intersect at the same center point and are spaced 120° apart. The d-axis and the q-axis are arranged at 90°, and the first plane formed by the d-axis and the q-axis is parallel to the second plane formed by the A-phase, the B-phase and the C-phase, and the perpendicular bisectors of the first plane and the second plane coincide. The rotation direction ω of the d-axis and the q-axis is r The angle between the d-axis and the A-phase is θ r To express.

[0041] In an exemplary embodiment, the input signals Ud, Uq and θ of SVPWM (Space Vector Pulse Width Modulation) are used as calibration quantities that can be manually set, where Ud is represented by the dynamic voltage applied to the d-axis and Uq is the q-axis voltage. r When the θ is 0° and the d-axis of the motor overlaps with the target phase, the target phase is phase A and Uq is 0V. At this time, all the voltage applied to the d-axis is loaded to phase A. r When the angle is 120° and the d-axis of the motor overlaps with the target phase, the target phase is the B phase and Uq is 0V. At this time, the voltage applied to the d-axis is all loaded to the B phase. r When the d-axis of the motor overlaps with the target phase winding, the target phase is C phase, Uq is 0V, and the voltage applied to the d-axis is all loaded to C phase. In this application, the resistances of the A phase, B phase, and C phase of the motor are equal. When the voltage applied to the d-axis is all loaded to one of the A phase, B phase, and C phase (the target phase), the generated current flows into the target phase winding and flows out from the other two phase windings, and the magnitude of the outflow current is 1 / 2 of the inflow current.

[0042] Optionally, based on multiple inflow currents, a current trigger threshold of the MOSFET to be tested is obtained, including:

[0043] Plot multiple inflow currents in time sequence to obtain a current variation curve;

[0044] The current peak value of the current variation curve is used as the current trigger threshold of the MOSFET to be tested.

[0045] In this embodiment, multiple inflow currents can reflect the current changes flowing into the MOS tube to be tested, and the current change curve obtained by plotting the curves in time sequence based on multiple inflow currents can intuitively reflect the current change law in the current change situation. Since the dynamic voltage applied to the target phase is obtained by increasing the set value at each preset time interval based on the preset base voltage, that is, the applied voltage is gradually increased, the current flowing into the MOS tube to be tested also shows a trend of gradual growth before reaching the current trigger threshold. At the same time, when the current flowing to the MOS tube to be tested exceeds the current trigger threshold, the protection of the MOS tube to be tested will be triggered to turn off the MOS tube to be tested. At this time, the circuit where the MOS tube to be tested is located is open, and the measured inflow current is 0. Therefore, the moment when the current change curve gradually rises to a sudden drop of 0 indicates that the shutdown protection of the MOS tube to be tested is triggered, and the current peak before the sudden drop is the current trigger threshold of the MOS tube to be tested. This embodiment can intuitively and quickly determine the current trigger threshold of the MOSFET to be tested by analyzing the intuitive current change curve, thereby simplifying the test process of the MOSFET and improving the efficiency of determining the current trigger threshold of the MOSFET to be tested.

[0046] In an exemplary embodiment, the first upper MOS tube of the A phase of the motor is used as the MOS tube to be tested for example, and the angle θ between the d axis and the A phase is r Set to 0°, set the preset base voltage to 0V, set the dynamic voltage range to 1V-6V, use an oscilloscope and current clamp to detect the inflow current flowing into the first upper MOS tube on phase A. The oscilloscope directly plots the measured inflow current in chronological order, as shown below Figure 3 The current variation curve is shown. Figure 3 In the figure, the horizontal axis is time t, the left vertical axis is the inflow current detected by the oscilloscope and the current clamp in phase A, and the right vertical and horizontal axes are dynamic voltages. The measured current trigger threshold of the first upper MOS tube is 250V.

[0047] Optionally, the method further comprises:

[0048] Get the test voltage of the motor;

[0049] A test input current of the MOS tube to be tested is obtained based on the test voltage, and the test input current is less than the current trigger threshold;

[0050] Based on the test input current, the MOSFET fault condition of the motor is obtained.

[0051] In this embodiment, the MOS tube to be tested of the motor is tested using a test voltage to obtain a test input current, which can reflect the current flowing into the MOS tube to be tested, and can intuitively reflect the fault condition of the MOS tube of the motor based on the current condition corresponding to the test input current, so as to complete the fault test of the MOS tube of the motor. Therefore, when a problem occurs in the motor controller using the foc algorithm and the problem cannot be quickly located, the method of this embodiment is used to perform a fault test on the MOS tube of the motor, which can not only shorten the debugging time, but also reduce the debugging difficulty, and has low experience requirements for the debugging personnel.

[0052] Optionally, the motor includes phase A, phase B and phase C, and the test input current includes multiple test currents; based on the test input current, the MOS tube fault condition of the motor is obtained, including:

[0053] When the resistances of phase A, phase B, and phase C are all equal, and multiple test currents are all equal, it is determined that the MOS tube failure of the motor is normal;

[0054] When the resistances of phase A, phase B and phase C are all equal, and at least two test currents among the multiple test currents are equal, it is determined that the MOSFET fault of the motor is a MOSFET fault corresponding to other test currents except the equal test current.

[0055] In this embodiment, the A phase is respectively connected in series with the first upper MOS tube for forward conduction and the first lower MOS tube for negative conduction, the B phase is respectively connected in series with the second upper MOS tube for forward conduction and the second lower MOS tube for negative conduction, and the C phase is respectively connected in series with the third upper MOS tube for forward conduction and the third lower MOS tube for negative conduction. Then the test input current includes the test currents corresponding to the first upper MOS tube, the first lower MOS tube, the second upper MOS tube, the second lower MOS tube, the third upper MOS tube and the third lower MOS tube, respectively. When the resistances of the A phase, the B phase and the C phase are equal, since the values ​​of the applied test voltages are also the same, the six test currents should also be equal. Based on this, when the resistances of phase A, phase B and phase C are equal and the six test currents are equal, it is determined that the fault condition of the MOSFET of the motor is that the MOSFETs are normal; when the resistances of phase A, phase B and phase C are equal and there are at least two test currents that are equal among the multiple test currents, it is determined that the fault condition of the MOSFET of the motor is a MOSFET fault corresponding to other test currents except the equal test current, thereby completing the fault test of the MOSFET to be tested.

[0056] See also Figure 4 , Figure 4 A test system for MOS tubes is shown as an exemplary embodiment of the present application. Figure 4 As shown, the present application provides a testing system for MOS tubes, comprising:

[0057] A determination module, used to determine the target phase of the motor and the voltage conduction direction of the target phase based on the MOS tube to be tested of the motor;

[0058] A voltage application module is used to apply voltage to the target phase through the voltage conduction direction according to the preset voltage application requirements to obtain multiple inflow currents flowing into the MOS tube to be tested;

[0059] The module is used to obtain the current trigger threshold of the MOSFET to be tested based on multiple inflow currents.

[0060] In a test system for MOS tubes of this embodiment, in a voltage application module, a voltage is applied according to a preset voltage application requirement, by applying a voltage to a target phase and a voltage conduction direction corresponding to the MOS tube to be tested of the motor obtained in the determination module, so as to obtain a plurality of inflow currents flowing into the MOS tube to be tested, and a current triggering threshold of the MOS tube to be tested is directly obtained based on the plurality of inflow currents by using the obtaining module. In this way, compared with the method of testing the motor by using a motor controller using a foc algorithm in the prior art, the system of this embodiment does not need to locate the software problem of the motor, but only needs to directly perform a current test on the motor, so as to realize the test of the hardware MOS tube of the motor, simplifying the test process and reducing the test difficulty.

[0061] Optionally, a module is determined, specifically for:

[0062] Get the phase connected in series with the MOS tube to be tested, and use this phase as the target phase of the motor;

[0063] The unidirectional conduction direction of the MOS tube to be tested is obtained, and the unidirectional conduction direction is used as the voltage conduction direction of the target phase.

[0064] Optionally, the voltage applying module is specifically used for:

[0065] Obtaining a preset base voltage corresponding to the preset voltage application requirement, and obtaining a dynamic voltage based on the preset base voltage, wherein the value of the dynamic voltage increases by a set value at intervals of a preset time length based on the preset base voltage;

[0066] Apply dynamic voltage to the target phase through the voltage conduction direction to obtain multiple inflow currents flowing into the MOS tube to be tested;

[0067] Among them, the inflow current corresponding to the preset base voltage is less than the current trigger threshold of the MOSFET to be tested.

[0068] Optionally, the voltage applying module is specifically used for:

[0069] Control the d-axis of the motor to coincide with the target phase winding;

[0070] According to the preset voltage application requirements, voltage is applied to the d-axis through the voltage conduction direction to apply voltage to the target phase to obtain multiple inflow currents flowing into the MOS tube to be tested.

[0071] Optionally, get the module, specifically for:

[0072] Plot multiple inflow currents in time sequence to obtain a current variation curve;

[0073] The current peak value of the current variation curve is used as the current trigger threshold of the MOSFET to be tested.

[0074] Optionally, the system further includes a fault testing module, the fault testing module being specifically configured to:

[0075] Get the test voltage of the motor;

[0076] A test input current of the MOS tube to be tested is obtained based on the test voltage, and the test input current is less than the current trigger threshold;

[0077] Based on the test input current, the MOSFET fault condition of the motor is obtained.

[0078] Optionally, the motor includes a phase A, a phase B and a phase C, and the test input current includes a plurality of test currents; the fault test module is specifically used for:

[0079] When the resistances of phase A, phase B, and phase C are all equal, and multiple test currents are all equal, it is determined that the MOS tube failure of the motor is normal;

[0080] When the resistances of phase A, phase B and phase C are all equal, and at least two test currents among the multiple test currents are equal, it is determined that the MOSFET fault of the motor is a MOSFET fault corresponding to other test currents except the equal test current.

[0081] A computing device according to an embodiment of the present application includes a memory, a processor, and a program stored in the memory and running on the processor. When the processor executes the program, part or all of the steps of the above-mentioned test method for MOS tubes are implemented.

[0082] Among them, the computing device can be a computer, and correspondingly, its program is computer software. The above-mentioned parameters and steps in a computing device of the present application can refer to the parameters and steps in an embodiment of a testing method for MOS tubes mentioned above, and will not be repeated here.

[0083] In an embodiment of the present application, a computer-readable storage medium is provided, in which instructions are stored. When the instructions are executed, the steps of the above-mentioned test method for MOS tubes are executed.

[0084] The computer-readable storage medium may be a transient computer-readable storage medium or a non-transitory computer-readable storage medium.

[0085] The technical solution of the embodiment of the present disclosure can be embodied in the form of a software product, which is stored in a storage medium and includes one or more instructions for causing a computer device (which may be a personal computer, a server, or a network device, etc.) to perform all or part of the steps of the method of the embodiment of the present disclosure. The aforementioned computer-readable storage medium may be a non-transitory computer-readable storage medium, including: a USB flash drive, a mobile hard disk, a read-only memory (ROM, Read-Only Memory), a random access memory (RAM, Random Access Memory), a disk or an optical disk, and other media that can store program codes, or a transient computer-readable storage medium.

[0086] The flowchart and block diagram in the accompanying drawings illustrate the possible architecture, functions and operations of the system, method and computer program product according to various embodiments of the present application. Wherein, each box in the flowchart or block diagram can represent a module, a program segment, or a part of the code, and the above-mentioned module, program segment, or a part of the code contains one or more executable instructions for realizing the specified logical function. It should also be noted that in some alternative implementations, the functions marked in the box can also occur in a different order from the order marked in the accompanying drawings. For example, two boxes represented in succession can actually be executed substantially in parallel, and they can sometimes be executed in the opposite order, depending on the functions involved. It should also be noted that each box in the block diagram or flowchart, and the combination of boxes in the block diagram or flowchart can be implemented with a dedicated hardware-based system that performs a specified function or operation, or can be implemented with a combination of dedicated hardware and computer instructions.

[0087] Those skilled in the art know that the present application can be implemented as a system, method or computer program product. Therefore, the present disclosure can be specifically implemented in the following forms, namely: it can be complete hardware, it can be complete software (including firmware, resident software, microcode, etc.), or it can be a combination of hardware and software, generally referred to as "circuit", "module" or "system" herein. In addition, in some embodiments, the present application can also be implemented in the form of a computer program product in one or more computer-readable media, and the computer-readable medium contains computer-readable program code. Computer-readable storage media can be, for example, but not limited to - electrical, magnetic, optical, electromagnetic, infrared, or semiconductor systems, devices or devices, or any combination of the above.

[0088] In the description of this specification, the description with reference to the terms "one embodiment", "some embodiments", "example", "specific example", or "some examples" etc. means that the specific features, structures, materials or characteristics described in conjunction with the embodiment or example are included in at least one embodiment or example of the present application. In this specification, the schematic representations of the above terms do not necessarily refer to the same embodiment or example. Moreover, the specific features, structures, materials or characteristics described may be combined in any one or more embodiments or examples in a suitable manner. In addition, those skilled in the art may combine and combine the different embodiments or examples described in this specification and the features of the different embodiments or examples, without contradiction.

[0089] Although the embodiments of the present application have been shown and described above, it can be understood that the above embodiments are exemplary and cannot be understood as limitations on the present application. Ordinary technicians in this field can change, modify, replace and modify the above embodiments within the scope of the present application.

Claims

1. A testing method for MOS tubes, characterized in that: include: Determine the target phase of the motor and the voltage conduction direction of the target phase based on the MOS tube to be tested of the motor; According to the preset voltage application requirement, a voltage is applied to the target phase through the voltage conduction direction to obtain a plurality of inflow currents flowing into the MOS tube to be tested; Based on the multiple inflow currents, a current triggering threshold of the MOSFET to be tested is obtained.

2. The method according to claim 1, characterized in that The method of determining the target phase of the motor and the voltage conduction direction of the target phase based on the MOS tube to be tested of the motor includes: Obtaining a phase connected in series with the MOS tube to be tested, and using the phase as a target phase of the motor; The unidirectional conduction direction of the MOS tube to be tested is obtained, and the unidirectional conduction direction is used as the voltage conduction direction of the target phase.

3. The method according to claim 1, characterized in that The step of applying a voltage to the target phase in accordance with a preset voltage application requirement through the voltage conduction direction to obtain a plurality of inflow currents flowing into the MOS tube to be tested includes: Obtaining a preset base voltage corresponding to the preset voltage application requirement, and obtaining a dynamic voltage based on the preset base voltage, wherein the value of the dynamic voltage increases by a set value at intervals of a preset time length based on the preset base voltage; Applying the dynamic voltage to the target phase in the voltage conduction direction to obtain a plurality of inflow currents flowing into the MOSFET to be tested; Among them, the inflow current corresponding to the preset base voltage is less than the current trigger threshold of the MOSFET to be tested.

4. The method according to claim 3, characterized in that The step of applying a voltage to the target phase in accordance with a preset voltage application requirement through the voltage conduction direction to obtain a plurality of inflow currents flowing into the MOS tube to be tested includes: Controlling the d-axis of the motor to perform winding overlap with the target phase; According to the preset voltage application requirement, a voltage is applied to the d-axis through the voltage conduction direction to apply a voltage to the target phase to obtain a plurality of inflow currents flowing into the MOS tube to be tested.

5. The method according to claim 1, characterized in that The step of obtaining the current triggering threshold of the MOS tube to be tested based on the multiple inflow currents includes: Plotting the multiple inflow currents in time sequence to obtain a current variation curve; The current peak value of the current variation curve is used as the current trigger threshold of the MOSFET to be tested.

6. The method according to any one of claims 1 to 5, characterized in that: The method further comprises: Obtaining a test voltage of the motor; Obtaining a test input current of the MOSFET to be tested based on the test voltage, wherein the test input current is less than the current trigger threshold; Based on the test input current, the MOSFET fault condition of the motor is obtained.

7. The method according to claim 6, characterized in that The motor includes a phase A, a phase B and a phase C, and the test input current includes a plurality of test currents; and obtaining the MOS tube fault condition of the motor based on the test input current includes: When the resistances of the A phase, the B phase, and the C phase are all equal, and the multiple test currents are all equal, it is determined that the MOS tube failure condition of the motor is that the MOS tubes are all normal; When the resistances of the A phase, the B phase and the C phase are all equal, and at least two of the multiple test currents are equal, it is determined that the MOSFET failure of the motor is a MOSFET failure corresponding to other test currents except the equal test currents.

8. A testing system for MOS tubes, characterized in that: include: A determination module, used to determine a target phase of the motor and a voltage conduction direction of the target phase based on a MOS tube to be tested of the motor; A voltage application module, used for applying voltage to the target phase through the voltage conduction direction according to a preset voltage application requirement, to obtain a plurality of inflow currents flowing into the MOS tube to be tested; The obtaining module is used to obtain the current triggering threshold of the MOSFET to be tested based on the multiple inflow currents.

9. A computing device comprising a memory, a processor, and a program stored in the memory and running on the processor, characterized in that: When the processor executes the program, the steps of a testing method for MOS tubes as described in any one of claims 1 to 7 are implemented.

10. A computer-readable storage medium, characterized in that: The computer-readable storage medium stores instructions, and when the instructions are executed on a terminal device, the terminal device executes the steps of a method for testing a MOS tube as described in any one of claims 1 to 7.

Images