Metasurface structure and refractive index detector

By constructing a metasurface structure of nanopillar arrays on the substrate surface, the problems of unintuitive detection results and limited detection range of nanophotonic material refractive index sensors are solved, realizing miniaturized and intuitive refractive index detection and simplifying the detection process.

CN119493197BActive Publication Date: 2026-03-03SUZHOU SUNA OPTOELECTRONICS CO LTD
View PDF 2 Cites 0 Cited by

Patent Information

Application Number
CN202411627503.1
Authority / Receiving Office
CN · China
Patent Type
Patents(China)
Current Assignee / Owner
Filing Date
2024-11-14
Publication Date
2026-03-03
Estimated Expiration
2044-11-14

AI Technical Summary

Technical Problem

Existing nanophotonic material refractive index sensors provide unintuitive results, require complex analytical components, have limited detection range, and involve complex manufacturing processes.

Method used

A metasurface structure is designed by constructing an array of nanopillars on a substrate surface and defining the correspondence between the orientation angle of the nanopillars and the focal position and spatial refractive index. This allows the metasurface structure to form focal points at different positions on the focal plane, and the spatial refractive index can be inferred by reading the focal position.

Benefits of technology

A miniaturized refractive index detector has been achieved, with a freely configurable detection range. The results are clearly presented on the focal plane, eliminating the need for a complex spectral analysis module and supporting the miniaturization of refractive index detectors.

✦ Generated by Eureka AI based on patent content.

Smart Images

  • Figure CN119493197B_ABST
    Figure CN119493197B_ABST
Patent Text Reader

Abstract

This invention discloses a metasurface structure and a refractive index detector. The metasurface structure is simple, consisting only of a substrate and an array of nanopillars disposed on the first surface of the substrate. By defining the orientation angle of each nanopillar in the array, the metasurface structure can obtain spatial refractive index information by reading the focal position information on the focal plane, which is then used for refractive index detection. The metasurface structure of this invention has a size of only tens of micrometers, a flexible detection range, and its results can be clearly presented on the focal plane without requiring complex spectral analysis and calculation modules. This invention has significant implications for the miniaturization of refractive index detectors.
Need to check novelty before this filing date? Find Prior Art

Citation Information

Patent Citations

  • True three-dimensional imaging technology based on metasurface micro lens array

    CN110879477A

  • Full Stokes infrared polarization imager based on metasurface

    CN110954974A