Circuit arrangement with diagnostic function for ASIC and method for diagnosting asic

Abstract

The invention relates to a circuit arrangement with a diagnostic function, in particular for use in a position measuring device, comprising: a superordinate ASIC with an electronic circuit for performing a specified function; and at least one subordinate ASIC having an electronic circuit for performing a specified function, the at least one subordinate ASIC comprising a parameter measuring unit and the superordinate ASIC comprising a diagnostic unit, the parameter measuring unit and the diagnostic unit being connected to one another via a data transmission channel. The parameter measuring unit is designed to determine a plurality of functional parameters of the electronic circuit of the subordinate ASIC and to transmit the functional parameters to the diagnostic unit via the data transmission channel, and the diagnostic unit is designed to determine a functional preparation state of the electronic circuit of the respective subordinate ASIC by evaluating the functional parameters. The invention also relates to a corresponding method and a position measuring device.

Description

Technical Field

[0001] The invention relates to a circuit arrangement with a diagnostic function for an ASIC according to claim 1 and to a method for diagnosing an ASIC according to claim 8. The invention also relates to a position measuring device according to claim 15. Background Art

[0002] As the degree of digitalization in automation technology required by Industry 4.0 continues to increase, the complexity of measuring devices in automation technology, such as rotary encoders and length measuring devices, is also increasing. In order to minimize the space requirements of the resulting large number of electronic circuits, there is a trend to integrate more and more functional groups of these electronic circuits into application-specific integrated circuits (ASICs).

[0003] DE 102008051083 A1 thus describes a gear-based multiturn rotary encoder having a single-turn stage with a single-turn scanning unit for measuring the angular position of a shaft and a plurality of multiturn stages, the single-turn stage having a single-turn scanning unit for measuring the angular position of a shaft, the multiturn stages each having a multiturn scanning unit for determining the number of revolutions of the shaft. The single-turn scanning unit and each multiturn scanning unit can include an ASIC.

[0004] Another requirement of Industry 4.0 is that the measuring device is capable of independently determining the functional readiness. For this reason, ASICs are often equipped with self-diagnostic functions. These self-diagnostic functions are based on measuring the functional parameters of the integrated electronic circuit and evaluating the measurement results. The evaluation results are then output by the individual ASICs of the circuit to a central point, where the functional readiness of the entire circuit is then determined. However, in order to implement the self-diagnostic functions of the ASICs, additional significant circuit expenditure is required, which leads to a higher complexity of these modules. Summary of the invention

[0005] It is an object of the present invention to create an improved circuit arrangement for determining the functional readiness of a circuit having a plurality of ASICs.

[0006] This object is achieved by a circuit arrangement with diagnostic functionality, in particular for use in a position-measuring device, according to claim 1 .

[0007] The circuit arrangement comprises: a circuit for executing a predetermined and at least one subordinate ASIC having an electronic circuit for performing a prescribed function, wherein the at least one subordinate ASIC comprises a parameter measuring unit and the superior ASIC comprises a diagnostic unit, wherein the parameter measuring unit and the diagnostic unit are connected to each other via a data transmission channel, wherein the parameter measuring unit is designed to determine a plurality of functional parameters of the electronic circuit of the subordinate ASIC and transmit them to the diagnostic unit via the data transmission channel, and wherein the diagnostic unit is designed to determine the functional readiness state of the electronic circuit of the corresponding subordinate ASIC by evaluating the functional parameters.

[0008] Furthermore, it is an object of the present invention to create an improved method for determining the functional readiness of a circuit having a plurality of ASICs.

[0009] This object is achieved by a method for operating a circuit arrangement with diagnostic functions, in particular for use in a position-measuring device, according to claim 8 .

[0010] The circuit arrangement on which the method is based comprises: a superordinate ASIC having an electronic circuit for executing a prescribed function; and at least one subordinate ASIC having an electronic circuit for executing a prescribed function, wherein the at least one subordinate ASIC comprises a parameter measuring unit and the superordinate ASIC comprises a diagnostic unit, wherein the parameter measuring unit and the diagnostic unit are connected to each other via a data transmission channel. According to the proposed method, a plurality of functional parameters of the electronic circuit of the subordinate ASIC are determined by the parameter measuring unit and transmitted to the diagnostic unit via the data transmission channel, and the functional readiness of the electronic circuit of the corresponding subordinate ASIC is determined by the diagnostic unit by evaluating the functional parameters.

[0011] A further object of the present invention is to create a position-measuring device having improved possibilities for determining a functional readiness.

[0012] This object is achieved by a position-measuring device according to claim 15 .

[0013] Further advantages of the invention emerge from the dependent claims of independent claims 1 and 8 and from the following description of exemplary embodiments. BRIEF DESCRIPTION OF THE DRAWINGS

[0014] Figure 1 A first embodiment of a circuit arrangement in combination with a multi-turn rotary encoder according to the invention is shown.

[0015] Figure 2 shows a flow chart of the method according to the present invention,

[0016] Figure 3 shows a block diagram of a parameter measurement unit according to the present invention,

[0017] Figure 4 shows a block diagram of a diagnostic unit according to the present invention,

[0018] Figure 5 A second embodiment of a circuit arrangement according to the invention in combination with a multi-turn rotary encoder is shown, and

[0019] Figure 6 A third exemplary embodiment of a circuit arrangement according to the invention is shown in combination with a single-turn rotary encoder having an additional sensor. DETAILED DESCRIPTION

[0020] In the following description of advantageous embodiments, the reference numerals of components whose function has already been described with reference to the figures remain unchanged in the subsequent figures. Dashed lines respectively indicate advantageous variants of the embodiments mentioned in the description.

[0021] Figure 1 A first exemplary embodiment of a circuit arrangement according to the invention is shown in combination with a multi-turn rotary encoder. The multi-turn rotary encoder essentially has a single-turn measuring device for measuring a position value representing the angular position of a shaft W and a multi-turn measuring device for counting the number of revolutions that the shaft W travels.

[0022] The single-turn measuring device consists of a single-turn code disc 10, which is connected to the shaft to be measured in a rotationally fixed manner with a center point M and carries an annular code track 11 arranged concentrically with the center point M. In addition, a single-turn position recorder 12 is provided for reading the code track 11 and determining an absolute position value corresponding to the angular position of the single-turn code disc 10. If the optical scanning principle is used for position detection, the code track 11 consists, for example, of a line pattern from areas with different optical properties (e.g. translucent / opaque or reflecting / non-reflecting). Light from a light source is emitted in the direction of the code track 11, is modulated by the code track 11 and finally strikes a photodetector, which is advantageously arranged in the single-turn position recorder 12. For the sake of clarity, the light source is not shown here. The code track 11 can be absolutely coded and / or incrementally coded and can possibly consist of a plurality of tracks arranged adjacent to one another.

[0023] Alternatively, instead of the optical scanning principle, an inductive, magnetic or capacitive scanning principle can also be used.

[0024] The multi-turn measuring device is used to measure rotational speed data (Umdrehungsdaten) suitable for determining the number of rotations of the shaft W. In the example shown, the multi-turn measuring device includes three multi-turn stages. Each of these multi-turn stages includes: a multi-turn code disk 20, 30, 40 having a coding element 21, 31, 41, and a multi-turn position recorder 22, 32, 42 for measuring the angular position of the coding element 21, 31, 41. These multi-turn code disks 20, 30, 40 are driven by the shaft W to be measured through a three-stage reduction gearing (Untersetzungsgetriebe) 23, 33, 43, wherein when the shaft W rotates, the first multi-turn code disk 20 driven by the first gearing stage (Getriebestufe) 23 has the highest number of rotations, and the third multi-turn code disk 40 driven by the third gearing stage and simultaneously by the last gearing stage 43 has the lowest number of rotations. The reduction ratio of the gearing stages 23, 33, 43 For example, it is 16:1, ie every sixteen revolutions of the input shaft of the respective transmission stage 23 , 33 , 43 result in one revolution of the output shaft.

[0025] In order to realize the multi-turn level, the magnetic scanning principle is usually used. In this case, the code elements (Codeelemente) 21, 31, 41 consist of disk-shaped permanent magnets, which are connected to the multi-turn code disk 20, 30, 40 in a rotationally fixed manner and each have a dipole Dipol, i.e. a magnetic north pole N and a south pole S. The dipoles are scanned using a magnetic sensor (e.g. Hall sensor, MR sensor, etc.) arranged in the corresponding multi-turn position recorder 22, 32, 42 to determine the angular position of the code element 21, 31, 41. The resolution of the multi-turn position recorder 22, 32, 42 is, for example, 8 bits, i.e. one revolution of the multi-turn code disk 20, 30, 40 is resolved with 256 absolute position values ​​and provided in the form of a data word. By combining the data words, the number of revolutions that the shaft W has traveled can be determined.

[0026] Alternatively, instead of the magnetic scanning principle, an inductive, optical or capacitive scanning principle can also be used.

[0027] In single-turn position recorder 12 , the position value of the single-turn measuring device and the multi-turn data word are combined to form an overall position value, wherein the overall position value includes both the angular position of shaft W and the number of revolutions that shaft W has travelled.

[0028] Furthermore, the single-turn position sensor 12 is designed to communicate with subsequent electronics 80 via an external data transmission channel 52 . This communication includes, for example, the output of a total position value to the subsequent electronics 80 .

[0029] The main component of the single-turn position recorder 12 is an application-specific integrated circuit (ASIC), in which the electronic circuit 14 of a plurality of main functional blocks of the single-turn position recorder 12 is integrated. Here, the following are mentioned by way of example: photodetector, evaluation electronics, output interface, internal interface and combination unit. The electronic circuit 14 is used to perform the functions specified by the ASIC. Within the scope of this exemplary embodiment, this ASIC is referred to as a superordinate ASIC 15.

[0030] The intended functions of the higher-level ASIC 15 in this exemplary embodiment are, for example:

[0031] Determination of absolute position value,

[0032] Determination of the total position value, and

[0033] Communication with subsequent electronic devices 80.

[0034] Each multi-turn position recorder 22, 32, 42 consists essentially of an application-specific integrated module (ASIC), in which the electronic circuits 24, 34, 44 of a plurality of main functional blocks of the respective multi-turn position recorder 22, 32, 42 are integrated. In this example, these can be magnetic sensors, evaluation electronics and output interfaces. The electronic circuits 24, 34, 44 are used to perform the functions specified by the ASIC. Within the scope of this embodiment, these ASICs are referred to as subordinate ASICs 25, 35, 45.

[0035] In this exemplary embodiment, the intended function of the subordinate ASIC 25 , 35 , 45 is to determine a data word which indicates the absolute angular position of the respective multi-turn code disk 20 , 30 , 40 .

[0036] The superior ASIC 15 is connected to the subordinate ASICs 25, 35, 45 for the purpose of communicating via at least one data transmission channel 50. Any interface connection that enables bidirectional transmission of digital data can be used as the data transmission channel 50. Both point-to-point and bus interfaces are suitable. Serial or parallel data transmission can be used. In a preferred embodiment, the data transmission channel 50 is formed by a bidirectional serial interface, in particular an I2C interface.

[0037] According to the invention, the superordinate ASIC 15 has a diagnostic unit 16 and each subordinate ASIC 25, 35, 45 has a parameter measuring unit 28, 38, 48. The diagnostic unit 16 is designed to communicate with the parameter measuring units 28, 38, 48 via a data transmission channel 50.

[0038] The communication between electronic circuits 14 of superordinate ASIC 15 and electronic circuits 24 , 34 , 44 of subordinate ASICs 25 , 35 , 45 also advantageously takes place via data transmission channel 50 , so that only one interface connection has to be provided for the overall communication between superordinate ASIC 15 and subordinate ASICs 25 , 35 , 45 .

[0039] Each parameter measuring unit 28, 38, 48 is expediently designed to determine, in particular by measurement, a plurality of functional parameters Fn1, Fn2, Fn3 of the respective subordinate ASIC 25, 35, 45. Functional parameters are parameters which allow conclusions to be drawn about the proper functioning of the electronic circuit 24, 34, 44 of the subordinate ASIC 25, 35, 45, for example:

[0040] the voltage value at a defined measuring point of the electronic circuit 24 , 34 , 44 of the downstream ASIC 25 , 35 , 45 ,

[0041] the current consumption of the subcircuits of the subordinate ASICs 25, 35, 45 and / or of the entire electronic circuit 24, 34, 44,

[0042] Resistance value,

[0043] Characteristic values ​​of digital signals, such as edge distance, frequency, duty cycle, jitter, etc.

[0044] The processing time of the sub-circuit of the electronic circuit 24, 34, 44 of the lower-level ASIC 25, 35, 45.

[0045] In order to determine the functional parameters Fn1, Fn2, Fn3, the parameter measuring unit 28, 38, 48 comprises suitable measuring means, such as an A / D converter, a timer (in particular a counter), a comparator. In addition, the parameter measuring unit 28, 38, 48 may comprise a signal generator, such as a current and / or voltage source, a clock generator, a D / A converter. The parameter measuring unit 28, 38, 48 may also comprise a switching device in order to connect the measuring device and / or the signal generator to a node of the electronic circuit 24, 34, 44 of the downstream ASIC 25, 35, 45. The measuring device, the signal generator and the switching device may be exclusively allocated or at least partially allocated to the parameter measuring unit 28, 38, 48 only for the purpose of performing the self-test function of the parameter measuring unit 28, 38, 48, and in other cases for performing the prescribed functions of the downstream ASIC 25, 35, 45. In the latter case, these are subcircuits of the electronic circuit 24, 34, 44.

[0046] The determination of the function parameters Fn1 , Fn2 , Fn3 advantageously begins after receiving a self-test start command ST, which reaches the subordinate ASIC 25 , 35 , 45 via a data transmission channel 50 .

[0047] The determined function parameters Fn1, Fn2, Fn3 can be transmitted to the superordinate ASIC 15 via the data transmission channel 50. Advantageously, the transmission does not take place immediately after the determination, but a memory is provided in the parameter measuring unit 28, 38, 48, in which the function parameters Fn1, Fn2, Fn3 can be stored. The transmission then takes place as a result of receiving a data request command RD1, RD2, RD3, which is sent from the superordinate ASIC 15 to the respective subordinate ASIC 25, 35, 45 via the data transmission channel.

[0048] In the simplest case, the time at which the determined function parameters Fn1, Fn2, Fn3 become available in the respective subordinate ASIC 25, 35, 45 can be determined by waiting for a defined period of time. Alternatively, a special command can be provided by which the superior ASIC 15 can request the status of the determination of the function parameters Fn1, Fn2, Fn3 from the subordinate ASIC 25, 35, 45 via the data transmission channel 50 ("polling"). As a further alternative, it can be provided that the subordinate ASIC 25, 35, 45 indicates that the function parameters Fn1, Fn2, Fn3 are available by sending an completion message via the data transmission channel 50.

[0049] In the superordinate ASIC 15, the function parameters Fn1, Fn2, Fn3 can be fed to a diagnostic unit 16, which is suitably designed to evaluate the functional readiness of the respective subordinate ASIC 25, 35, 45 by evaluating the function parameters Fn1, Fn2, Fn3. This evaluation can include a check whether the individual function parameters and / or mutually dependent function parameters are within predefined limit values. If the evaluation shows that each of the subordinate ASICs 25, 35, 45 is functionally ready, the system switches to normal operation, otherwise to error operation.

[0050] In a manner known per se, the superordinate ASIC 15 can also include a parameter measuring unit 18. The parameter measuring unit is used to determine internal functional parameters of the superordinate ASIC 15, which are evaluated in the diagnostic unit in a manner comparable to the functional parameters Fn1, Fn2, Fn3 of the subordinate ASICs 25, 35, 45. In this case, the superordinate ASIC 15 has a self-diagnostic function. The diagnostic unit can be a diagnostic unit 16, in which the functional parameters Fn1, Fn2, Fn3 of the subordinate ASICs 25, 35, 45 are also evaluated. The superordinate ASIC 15 can also include an additional diagnostic unit for this purpose.

[0051] The evaluation results of the functional parameters Fn1, Fn2, Fn3 of the subordinate ASICs 25, 35, 45 and (possibly) the superordinate ASIC 15 are stored in the status information STAT, which can be output to the subsequent electronics 80 via the external data transmission channel 52 and can thus indicate the functional readiness of the multi-turn rotary encoder.

[0052] Subsequent electronic device 80 is an external, independent device, which is arranged to be spatially separated from the multi-turn rotary encoder of this embodiment. For example, it is a numerical control device of a machine tool or other control device in automation technology. Subsequent electronic device 80 is not part of the present invention.

[0053] Figure 2 The flowchart of the method according to the invention is shown. The method can be carried out at any time during the operation of the multi-turn rotary encoder. It is advantageously carried out immediately after the device is switched on in order to determine the functional readiness. If necessary, the initialization of the ASIC 15, 25, 35, 45 is carried out before the start of the method.

[0054] In step S100, the superordinate ASIC 15 sends a self-test start command ST to at least one subordinate ASIC 25, 35, 45. Depending on the test strategy, it may be advantageous to send the self-test start command ST to only one of the subordinate ASICs 25, 35, 45, i.e., if the functional readiness of one of the subordinate ASICs 25, 35, 45 is to be determined in a targeted manner. However, the self-test start command ST is preferably sent to all subordinate ASICs 25, 35, 45 designed according to the invention, so that the operational readiness of all subordinate ASICs 25, 35, 45 can be determined quasi-simultaneously.

[0055] In step S110, those lower-level ASICs 25, 35, 45 that have received the self-test start command ST determine a plurality of function parameters Fn1, Fn2, Fn3 required to determine the operational readiness state. The upper-level ASIC 15 waits until the determination of the function parameters Fn1, Fn2, Fn3 is completed. As described above, this can be done by waiting for a defined period of time, by querying the status of the determination of the function parameters Fn1, Fn2, Fn3, or by waiting for the completion message of the lower-level ASIC 25, 35, 45 to arrive.

[0056] In step S120, the function parameters Fn1, Fn2, Fn3 are transmitted to the superordinate ASIC 15, in particular the diagnostic unit 16, via the data transmission channel 50. The transmission can be initiated by sending a data request command RD1, RD2, RD3 to the respective subordinate ASIC 25, 35, 45.

[0057] In step S130, the diagnostic unit 16 evaluates the functional parameters Fn1, Fn2, Fn3 and assesses the functional readiness of the corresponding subordinate ASIC 25, 35, 45. The evaluation result is stored in the status information STAT.

[0058] In step S140 , a decision is made based on the status information STAT as to whether a switch to normal operation (step S150A) or a switch to error operation (step S150B) can be made.

[0059] Figure 3 FIG. 1 is a block diagram of a parameter measurement unit according to the present invention. Figure 1 The parameter measuring unit 28 is described herein, but the parameter measuring units 28 , 38 , 48 are advantageously designed identically.

[0060] The parameter measurement unit 28 includes a process controller 280, a measuring device 281, a memory 282 and an interface unit 283. The parameter measurement unit 28 may further include at least one signal generator 284.

[0061] The sequence controller 280 controls the sequence of the self-test function. The sequence controller is advantageously constructed as a digital state machine. The sequence controller 280 controls the measuring device 281, the signal generator 284 and, if necessary, the memory 282 according to the command supplied to it by the superior ASIC 15 via the signal transmission channel 50 and the interface unit 283. The sequence controller 280 is also appropriately designed to display the completion of the self-test function or the provision of the function parameter Fn1 to the superior ASIC 15 via the interface unit 283 and the data transmission channel 50.

[0062] The measuring devices 281 are used to measure the functional parameter Fn1. For this purpose, these measuring devices are connected to at least one measuring point MPx of the electronic circuit 24 of the downstream ASIC 25. The measuring devices 281 can include an A / D converter, a time measurement unit or a comparator for performing the measurement. In addition, these measuring devices 281 can include switching elements in order to connect a plurality of measuring points MPx to the unit performing the measurement during the measurement duration.

[0063] The functional parameter Fn1 measured by the measuring device 281 can be stored in the memory 282 and can be transmitted from the interface unit 283 to the higher-level ASIC 15 via the data transmission channel 50 .

[0064] The signal generator 284 is suitably designed to generate at least one electrical signal and feed it to at least one feed point EPx of the electronic circuit 24 of the lower-level ASIC 25. The signal generator 284 may include a signal generating unit, such as a voltage source, a D / A converter, and a clock generator. Examples of electrical signals are constant voltage and / or current, alternating voltage in any signal form, such as a sinusoidal voltage, a square wave voltage, etc. Switching elements may also be provided in the signal generator 284 so as to connect a plurality of feed points MPx to the unit in the signal generator 284 that generates the signal to be fed during the measurement duration of the functional parameter Fn1.

[0065] The communication unit 283 is used to communicate the parameter measuring unit 28 with the superordinate ASIC 15 via the data transmission channel 50. The communication is bidirectional, so that commands and / or data can be received from the superordinate ASIC 15 and data, in particular the function parameter Fn1, can be transmitted to the superordinate ASIC 15.

[0066] As indicated by the dashed line, it is particularly advantageous if the electronic circuit 24 of the subordinate ASIC 25 also communicates with the electronic circuit 14 of the superordinate ASIC 15 via the interface unit 283. In this way, only a single interface connection between the subordinate ASIC 25 and the superordinate ASIC 15 is required for the self-test operation and the proper operation of the ASIC.

[0067] Figure 4 1 shows a block diagram of a diagnosis unit 16 according to the present invention, which includes a diagnosis controller 160, an interface unit 162 and a device interface 163. The diagnosis unit 16 may further include a memory 161.

[0068] The diagnostic controller 160 controls the flow of the self-test function. To this end, it starts determining the function parameters Fn1, Fn2, Fn3 in the parameter measurement units 28, 38, 48 of the lower-level ASICs 25, 35, 45 by sending a self-test start command ST, and starts the transmission of the function parameters Fn1, Fn2, Fn3 by sending a data request command RD1, RD2, RD3. The transmission of commands and data is carried out via the interface unit 162, the data transmission channel 50 and the interface unit 283 of the self-test unit 28, 38, 48 to be addressed, respectively.

[0069] The diagnostic controller 160 is suitably designed to check whether the functional parameters Fn1, Fn2, Fn3 arriving from the subordinate ASIC 25, 35, 45 meet the limit values, and thereby evaluate the functional readiness of the subordinate ASIC 25, 35, 45 and thereby decide whether to switch to normal operation or error operation. These limit values ​​can include upper and / or lower limits of the individual functional parameters, but can also include dependencies between two or more functional parameters. For example, the dependency is the ratio of the input and output signals of an amplifier circuit, or the dependency of an instantaneous value on signals that are phase-shifted with respect to one another, in particular on sinusoidal sensor signals that are usually phase-shifted with respect to one another by 90° in position measurement technology.

[0070] The inspection result can be stored in the state information STAT and output to the subsequent electronic device 80 via the device interface 163 and the external data transmission channel 52 .

[0071] As indicated by the dashed line and described above with reference to the interface unit 283 of the subordinate ASIC 25 , it is particularly advantageous if the electronic circuit 14 of the superordinate ASIC 15 also communicates with the electronic circuits 24 , 34 , 44 of the respective subordinate ASIC 25 , 35 , 45 via the interface unit 162 .

[0072] It is also advantageous if device interface 163 is designed in such a way that not only communication from diagnostic unit 16 but also communication from electronic circuit 14 of superordinate ASIC 15 to subsequent electronics 80 takes place via it.

[0073] The memory 161 can be used to store the function parameters Fn1, Fn2, Fn3 before they are evaluated by the diagnosis control 160. It can also be provided that the function parameters Fn1, Fn2, Fn3 can be transferred from the memory 161 to the subsequent electronics 80 so that the error state can be further analyzed there.

[0074] In another advantageous embodiment, it can be provided that limit values ​​and possibly further rules for evaluating functional parameters Fn1, Fn2, Fn3 in diagnostic control unit 160 can be stored in memory 161. If memory 161 is also designed to be writable, diagnostic unit 16 can adapt to various subordinate ASICs and can perform self-tests.

[0075] As a further advantageous functionality, it may be provided that the memory 282 of the subordinate ASIC can be written to and / or deleted by the diagnostic unit 15 via the data transmission channel 50. In this way, the functionality of the memory 282 can be checked.

[0076] Figure 5 A second exemplary embodiment of a circuit arrangement according to the invention is shown in combination with a multi-turn rotary encoder. However, in contrast to the first exemplary embodiment, the multi-turn measuring device of the multi-turn rotary encoder does not have a gear-based revolution counter, but an electronic revolution counter.

[0077] The single-turn measurement device corresponds to Figure 1 In the single-turn measuring device, it should be noted that the electronic circuit 14 of the upper ASIC 15 can be connected with Figure 1 The electronic circuits in are different.

[0078] The multi-turn measuring device comprises a multi-turn code disc 200 with a coding element 210, which is connected to the shaft W in a rotationally fixed manner, and a multi-turn position recorder 220 for measuring the number of revolutions travelled by the shaft W by measuring and evaluating the angular position of the coding element 210. The measuring principle is thus similar to Figure 1 The principle of the multi-turn level of the multi-turn rotary encoder is equivalent to that of the multi-turn level of the multi-turn rotary encoder.

[0079] The multi-turn position sensor 220 consists essentially of an ASIC 225 in which an electronic circuit 224 is integrated for carrying out the intended functions of the ASIC, in particular for determining the number of revolutions travelled by the shaft W (revolution data) and for transmitting it to the single-turn position sensor 12 of the ASIC via the data transmission channel 50. This ASIC is therefore a subordinate ASIC 225 according to the invention.

[0080] In order to be able to measure the number of revolutions even when the multi-turn rotary encoder is switched off, a battery can be provided in the multi-turn position recorder 220, which supplies at least part of the electronic circuit 224 with the required current for the revolution counting. Instead of using a battery, the multi-turn position recorder 220 can be implemented according to the energy harvesting principle, for example by using a Wiegand line.

[0081] The lower-level ASIC 225 now has a parameter measuring unit 228, which is suitably designed to determine a plurality of functional parameters Fn4 and transmit them to the diagnostic unit 16 in the upper-level ASIC 15 via the data transmission channel 50. For this purpose, the parameter measuring unit 228 can be similar to the reference Figure 3 The parameters described are measured using a unit construction.

[0082] Figure 6 A third embodiment of a circuit arrangement according to the invention in combination with a single-turn rotary encoder with an additional sensor is shown. Additional sensors are used if, in addition to the primary measuring task (in automation technology, for example, measuring the angular position of a shaft W and / or the number of revolutions travelled, or measuring a linear movement of a machine part), the measuring device is to measure additional parameters internal and / or external to the measuring device. Prominent examples of such parameters are temperature, acceleration, vibration and air humidity.

[0083] The single-turn measuring device corresponds to Figure 1 In the device, it should be noted that the electronic circuit 14 of the upper ASIC 15 can be connected with Figure 1 The electronic circuit in is different because it has different prescribed functions.

[0084] A sensor data recorder 320 is provided for recording the measured values ​​of at least one additional sensor, to which at least one, but advantageously a plurality of additional sensors 330 , 331 , 332 can be connected.

[0085] The sensor data recorder 320 in turn consists essentially of an ASIC 325 in which an electronic circuit 324 is integrated for carrying out the intended functions of the ASIC, in particular for querying and, if necessary, processing the measurement data of the additional sensors 330, 331, 332 and for transmitting the measurement data to the single-turn position recorder 12 via the data transmission channel 50. This ASIC is therefore a subordinate ASIC 325 according to the invention.

[0086] The lower-level ASIC 325 now also has a parameter measuring unit 328, which is suitably designed to determine a plurality of functional parameters Fn5 and transmit them to the diagnostic unit 16 in the upper-level ASIC 15 via the data transmission channel 50. For this purpose, the parameter measuring unit 328 can be similar to the reference Figure 3 The parameter measuring unit 28 described above is constructed.

[0087] It should be noted that, refer to Figure 1 and Figure 5 The described exemplary embodiment can also be supplemented by a sensor data logger 320. This means that the present invention is also suitable for a circuit arrangement comprising a plurality of different subordinate ASICs.

[0088] It is therefore particularly advantageous if the superordinate ASIC 15, in particular its electronic circuit 14, is designed in such a way that it can be used in a variety of device variants and in combination with different subordinate ASICs, for example in Figure 1 , Figure 5 and Figure 6 embodiments and combinations thereof.

[0089] Of course, the invention is not limited to the described embodiments but can be appropriately modified by a person skilled in the art within the scope of protection of the patent claims.

Claims

1. A circuit arrangement with diagnostic functionality, in particular for use in a position measuring device, comprising: A superordinate ASIC (15) having an electronic circuit (14) for executing the prescribed functions; and at least one subordinate ASIC (25, 35, 45, 225, 325) having an electronic circuit (24, 34, 44, 224, 324) for carrying out a prescribed function, The at least one subordinate ASIC (25, 35, 45, 225, 325) comprises a parameter measuring unit (28, 38, 48, 228, 328) and the superior ASIC (15) comprises a diagnostic unit (16), the parameter measuring unit and the diagnostic unit being connected to one another via a data transmission channel (50), and The parameter measuring unit (28, 38, 48, 228, 328) is designed to determine a plurality of functional parameters (Fn1, Fn2, Fn3, Fn4, Fn5) of the electronic circuit (24, 34, 44, 224, 324) of the subordinate ASIC (25, 35, 45, 225, 325) and transmit them to the diagnosis unit (16) via the data transmission channel (50); and The diagnostic unit (16) is designed to determine the functional readiness of the electronic circuit (24, 34, 44, 224, 324) of the corresponding subordinate ASIC (25, 35, 45, 225, 325) by evaluating the functional parameters (Fn1, Fn2, Fn3, Fn4, Fn5).

2. A circuit device according to claim 1, wherein the parameter measurement unit (28, 38, 48, 228, 328) comprises a flow controller (280), a measuring device (281) and an interface unit (283), wherein the flow controller is used to control the flow of a self-test function, the measuring device is used to determine the functional parameters (Fn1, Fn2, Fn3, Fn4, Fn5) at at least one measuring point (MPx) of the electronic circuit (24, 34, 44, 224, 324) by measurement, and the interface unit is used to communicate with the superior ASIC (15) via the data transmission channel (50).

3. The circuit arrangement according to claim 1, wherein the parameter measuring unit (28, 38, 48, 228, 328) comprises a memory (282) in which the functional parameters (Fn1, Fn2, Fn3, Fn4, Fn5) can be stored.

4. The circuit arrangement as claimed in claim 3, wherein the memory (282) is writable and / or erasable by the diagnostic unit (15).

5. A circuit arrangement according to any of the preceding claims, wherein the parameter measuring unit (28, 38, 48, 228, 328) has at least one signal generator (284) for generating at least one electrical signal and feeding it into at least one feed point (EPx) of the electronic circuit (24, 34, 44, 224, 324).

6. The circuit arrangement according to claim 1 , wherein the diagnostic unit ( 16 ) comprises: A diagnostic controller (160), an interface unit (162) and a device interface (163), wherein the diagnostic controller is used to control the process of the self-test function, the interface unit is used to communicate with the corresponding parameter measurement unit (28, 38, 48, 228, 328) via the data transmission channel (50), and the device interface is used to communicate with the subsequent electronic device (80) via the external data transmission channel (52).

7. A circuit device according to any of the preceding claims, wherein the diagnostic unit (16) comprises a memory (161) in which the functional parameters (Fn1, Fn2, Fn3, Fn4, Fn5) and / or limit values ​​for evaluating the functional parameters (Fn1, Fn2, Fn3, Fn4, Fn5) and / or other rules for evaluating the functional parameters (Fn1, Fn2, Fn3, Fn4, Fn5) can be stored.

8. A method for operating a circuit arrangement with diagnostic functionality, in particular for use in a position measuring device, the circuit arrangement comprising: A superordinate ASIC (15) having an electronic circuit (14) for executing the prescribed functions; at least one subordinate ASIC (25, 35, 45, 225, 325) having an electronic circuit (24, 34, 44, 224, 324) for carrying out a prescribed function, The at least one subordinate ASIC (25, 35, 45, 225, 325) comprises a parameter measuring unit (28, 38, 48, 228, 328), and the superior ASIC (15) comprises a diagnostic unit (16), the parameter measuring unit and the diagnostic unit being connected to each other via a data transmission channel (50), and The parameter measurement unit (28, 38, 48, 228, 328) determines a plurality of functional parameters (Fn1, Fn2, Fn3, Fn4, Fn5) of the electronic circuit (24, 34, 44, 224, 324) of the subordinate ASIC (25, 35, 45, 225, 325) and transmits them to the diagnosis unit (16) via the data transmission channel (50), and The diagnostic unit (16) determines the functional readiness of the electronic circuit (24, 34, 44, 224, 324) of the corresponding subordinate ASIC (25, 35, 45, 225, 325) by evaluating the functional parameters (Fn1, Fn2, Fn3, Fn4, Fn5).

9. The method according to claim 8, wherein the parameter measurement unit (28, 38, 48, 228, 328) comprises a process controller (280), a measuring device (281) and an interface unit (283), wherein The process controller (280) controls the process of the self-test function. determining, by the measuring device (281), a functional parameter (Fn1, Fn2, Fn3, Fn4, Fn5) at at least one measuring point (MPx) of the electronic circuit (24, 34, 44, 224, 324), and Communicate with a higher-level ASIC (15) via the interface unit (283) via the data transmission channel (50).

10. The method according to any one of claims 8 or 9, wherein the parameter measurement unit (28, 38, 48, 228, 328) comprises a memory (282) in which the functional parameters (Fn1, Fn2, Fn3, Fn4, Fn5) are stored.

11. The method according to claim 10, wherein the memory (282) is written and / or deleted by the diagnostic unit (15).

12. A method according to any one of claims 8 to 11, wherein the parameter measurement unit (28, 38, 48, 228, 328) comprises at least one signal generator (284), which generates at least one electrical signal and feeds it into at least one feed point (EPx) of the electronic circuit (24, 34, 44, 224, 324).

13. The method according to any one of claims 8 to 12, wherein the diagnostic unit (16) comprises a diagnostic controller (160), an interface unit (162) and a device interface (163), wherein The process of controlling the self-test function by the diagnostic controller, communicating with the corresponding parameter measurement unit (28, 38, 48, 228, 328) via the data transmission channel (50) through the interface unit (162), and Communicate with subsequent electronic devices (80) via the external data transmission channel (52) through the device interface (163).

14. The method according to any one of claims 8 to 13, wherein: The diagnostic unit (16) comprises a memory (161) in which the functional parameters (Fn1, Fn2, Fn3, Fn4, Fn5) and / or limit values ​​for evaluating the functional parameters (Fn1, Fn2, Fn3, Fn4, Fn5) and / or other rules for evaluating the functional parameters (Fn1, Fn2, Fn3, Fn4, Fn5) are stored. 15 . A position measuring device comprising a circuit arrangement according to claim 1 .

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