A device and method for improving leakage current resistance and interference resistance

Abstract

The application belongs to the technical field of electrical engineering and automation control, and provides a device and method for improving anti-leakage current and anti-interference, which comprises a first instrument amplification module, a second instrument amplification module, a third instrument amplification module, a static current adjustment module and a microprocessor module; static current data and dynamic current data of a circuit are obtained; static characteristic values and dynamic characteristic values are obtained through analysis and processing; a feedback signal value is obtained through analysis and processing based on the obtained static characteristic values and dynamic characteristic values; the feedback signal value is compared with a feedback signal threshold value, and is analyzed and divided into different regions; the feedback signal value is analyzed and processed into a feedback signal of an electronic delay module, and the electronic delay module is confirmed to be connected correctly through analysis and processing, thereby completing networking; the anti-leakage current and anti-interference are effectively improved, and the data processing of a mixed signal is optimized and analyzed, and potential problems in the circuit are specifically analyzed, thereby improving the reliability and safety of equipment.

Description

Technical Field

[0001] This invention belongs to the field of electrical engineering and automation control technology, and in particular relates to power electronics technology. Specifically, it is a device and method for improving resistance to leakage current and interference. Background Technology

[0002] In the civil explosives industry, a long wire is typically used as the detonator wire to connect a number of electronic delay detonators. The detonator sends a signal to each electronic delay detonator through the detonator wire, and each electronic delay detonator responds to the instructions sent by the detonator according to a specific protocol.

[0003] Generally, communication between the detonator and the electronic delay detonator involves three stages: networking, charging, and detonation. Networking is time-consuming, requiring each detonator to be connected and checked individually. After networking, charging begins, and once charging is complete, the detonator enters a ready-to-detonate state. After ensuring safety, the blaster detonates the detonator. In many practical applications, the borehole filler may contain minerals or even be water-filled. Although the communication leads of the electronic delay detonator and the borehole wire are waterproofed, there is a certain probability of leakage due to the compression of the filler material. Small leakage has little impact on communication and detonation, but when the leakage is too large, communication will fail, and the electronic delay detonator will fail to detonate. The problems caused by leakage are particularly severe when there are many detonators.

[0004] In addition, since detonators sometimes work in conjunction with other devices, such as communication radios, and the source of interference is very close and cannot be cut off at the source, it is also necessary to improve the anti-interference capability of the detonator itself.

[0005] A Chinese patent application with publication number CN113759288A discloses a leakage current detection circuit, method, and detector. The leakage current detection circuit is used to detect leakage current in a device under test. It includes a main winding, an auxiliary winding, a detection module, and a signal output module. The main winding is connected to the leakage current detection terminal of the device under test and coupled to the auxiliary winding. The auxiliary winding is connected to both the signal output module and the detection module. The signal output module outputs alternating positive and negative pulse signals to put the auxiliary winding in a preset state. If there is leakage current in the main winding, the leakage current coupled to the auxiliary winding is superimposed on the alternating positive and negative pulse signals, making the current signal detected by the detection module larger than the current signal detected without the alternating positive and negative pulse signals. This improves the sensitivity of leakage current detection and eliminates the need for highly sensitive detection equipment, reducing detection costs.

[0006] The aforementioned technologies provide methods and devices for detecting leakage current, but they do not offer good solutions to improve the circuit's resistance to leakage current and interference, nor do they optimize the accuracy and reliability of the measurement. Furthermore, they do not specifically analyze potential problems in the circuit to improve the reliability and safety of the equipment.

[0007] Therefore, the present invention provides a device and method for improving resistance to leakage current and interference. Summary of the Invention

[0008] In order to overcome the shortcomings of the prior art, at least one technical problem raised in the background art is solved.

[0009] The technical solution adopted by this invention to solve its technical problem is: a method for improving resistance to leakage current and interference, comprising:

[0010] The system comprises a first instrument amplification module, a second instrument amplification module, a third instrument amplification module, a static current adjustment module, and a microprocessor. Out1 and Out2 are communication lines. Vdac is the analog signal output from the microprocessor's digital-to-analog converter (DAC), and Vadc is the analog signal transmitted to the input of the microprocessor's analog-to-digital converter (ADC). Currently, the detonator current sampling only includes the first instrument amplification module and the microprocessor; the static current Iq and dynamic current Is can only be amplified synchronously.

[0011] The first instrumentation amplifier module includes: a sampling resistor Rs, a first instrumentation amplifier U1, and a first isolation resistor R1. The sampling resistor Rs is connected in series between communication lines Out1 and Out2 to obtain the communication current. After being amplified by U1 by Av1, it is output to the first input terminal of the third instrumentation amplifier module, which is used to sample and amplify the communication current by Av1. The output voltage is: Vo1=Iq*Rs*Av1, where Av1 represents the voltage gain of the first instrumentation amplifier.

[0012] The second instrumentation amplifier module includes: an impedance matching resistor Re, a feedback resistor Rf, a gain adjustment resistor Rg, a second instrumentation amplifier U2, and a second isolation resistor R2. The analog signal Vdac output from the microprocessor's digital-to-analog converter (DAC) is amplified by Av2 times by U2 and then output to the second input terminal of the third instrumentation amplifier module. This amplifies the analog signal Vdac output from the microprocessor's DAC by Av2 times. This analog signal is the voltage corresponding to the static operating current of the electronic delay module, and the output voltage is: Vo2 = Iq * Av2.

[0013] set up: Where Av2 represents the voltage gain of the second instrumentation amplifier;

[0014] The third instrumentation amplifier module includes: a first voltage divider resistor R5, a second voltage divider resistor R6, a third voltage divider resistor R7, a third instrumentation amplifier U3, and a third isolation resistor R3. Vo1 and Vo2 are attenuated to their original values ​​after being divided by the voltage divider network R5, R6, and R7. To prevent the third instrumentation amplifier U3 from saturating, it is used to combine the outputs of the first and second instrumentation amplifier modules and buffer the output. Its total gain is 1, and the combined output is: Vo3 = Vo1 - Vo2 = Iq * Av1, where Av3 represents the voltage gain of the third instrumentation amplifier.

[0015] The static current adjustment module includes a first load resistor R4, a second load resistor R8, and an NMOS switch M1, used to control the load resistance of the first instrumentation amplification module and the voltage division ratio. To correctly obtain the static current Iq of the electronic delay module;

[0016] The microprocessor module includes a microprocessor chip and its peripheral resistors, which are existing circuits.

[0017] As a further technical solution of the present invention, the specific process for obtaining the static operating current Iq is as follows:

[0018] Microprocessor initialization: P2.2 outputs a high level, M1 conducts, the first load resistor R4 is grounded, and the second load resistor R8 is short-circuited, reducing the sampling resistance to [value missing]. To prevent the output of the third instrument amplification module from exceeding the input range of the microprocessor, the ADC is activated to perform analog-to-digital conversion on Vo3 and obtain the static current Iq.

[0019] P2.2 represents the output pin of the microprocessor;

[0020] As a further technical solution of the present invention, the specific process for obtaining the dynamic current Is is as follows:

[0021] When the microprocessor is working normally, P2.2 outputs a low level, M1 is cut off, the first load resistor R4 and the second load resistor R8 are connected in series to ground, and R4+R8 is set to be much larger than R5+R6+R7. The DAC is set to work and converts the static operating current Iq into the analog output Vdac.

[0022] Send a signal to communicate normally with the electronic delay module. When the module returns data, start the ADC. The first instrumentation amplification module outputs the sampling signals of static current Iq and dynamic current Is.

[0023] The Vdac signal is amplified by the second instrument amplification module and then merged with the sampling signal output from the first instrument amplification module in the third instrument amplification module.

[0024] The output Vo3 = Vo1 - Vo2 = Iq * Av1 + Is * Rs * Av1 is converted from analog to digital to obtain the mixed signal Iq + Is * Rs of the static current Iq and the dynamic current Is. Usually, Is is less than Iq.

[0025] As a further technical solution of the present invention, the specific process of data processing is as follows:

[0026] The microprocessor operates normally, processing the mixed signal Iq+Is*Rs to obtain the feedback signal from the electronic delay module.

[0027] Since the dynamic signal Is is amplified to Rs times its original value, the signal-to-noise ratio is increased and the anti-interference performance is improved. Meanwhile, the static current Iq input to the MCU maintains its original amplitude. The first and second instrumentation amplification modules are set to operate at the set working voltage VH to ensure that the sampling signal will not saturate due to the increase in sampling resistance when the leakage current is high.

[0028] As a further technical solution of the present invention, the static current data and dynamic current data of the circuit are obtained. There is leakage current in the static current measurement data and hardware failure occurs when measuring dynamic current, which leads to anomalies in the obtained mixed signal. The cause of the anomaly cannot be specifically determined. After delayed processing, the problem cannot be quickly solved and normal operation cannot be restored. Therefore, the mixed signal is separated and preliminarily processed before sending the mixed signal.

[0029] As a further technical solution of the present invention, the specific process for obtaining the static feature value is as follows:

[0030] Based on the obtained static current data, and the preset static current threshold I... q0 By comparison and analysis, the static characteristic value JT is obtained. The static current threshold represents the maximum current that the device can withstand to maintain normal standby. The static current threshold includes the maximum leakage current that the device can withstand to maintain normal standby.

[0031] If the static current is less than the static current threshold I q0 If so, the static characteristic value JT will be assigned a value of 1, indicating that the device is maintaining normal standby operation;

[0032] If the static current is greater than or equal to the static current threshold I q0 If the static characteristic value JT is -1, it indicates that the device is abnormally maintaining standby operation.

[0033] As a further technical solution of the present invention, the specific process for obtaining the dynamic feature value is as follows:

[0034] Based on the obtained dynamic current data, and the preset dynamic current threshold I s0By comparing and analyzing, the dynamic characteristic value DT is obtained. The dynamic characteristic threshold represents the maximum current that the equipment can withstand to maintain normal operation. The dynamic current threshold includes the maximum current that the equipment can withstand when a hardware failure occurs while maintaining normal operation.

[0035] If the dynamic current is less than the dynamic current threshold I s0 If so, the dynamic characteristic value DT will be assigned a value of 1, indicating that the equipment is operating normally;

[0036] If the dynamic current is greater than or equal to the dynamic current threshold I s0 If the dynamic characteristic value DT is -1, it indicates that the equipment is malfunctioning.

[0037] A further technical solution of the present invention is as follows: based on the obtained static and dynamic characteristic values, a mixed signal of static current Iq and dynamic current Is is obtained: I q +I s *R s The mixed signal I is processed by a microprocessor. d +I s *R s Data processing is performed to obtain the feedback signal value of the electronic delay module. The feedback signal value is analyzed and processed to be converted into the feedback signal of the electronic delay module. The electronic delay module completes the networking after analysis and processing to confirm that the connection is correct.

[0038] As a further technical solution of the present invention, the specific process for obtaining the feedback signal value is as follows:

[0039] The obtained static eigenvalues ​​JT and dynamic eigenvalues ​​DT are then subjected to data analysis and processing using the formula: The feedback signal value FK is obtained, where a1 and a2 are preset correlation coefficients;

[0040] As a further technical solution of the present invention, the specific analysis process of the feedback signal value is as follows:

[0041] The calculated feedback signal value FK is compared with the preset feedback signal thresholds FK0 and FK1, and they are classified into different types.

[0042] If the calculated feedback signal value FK is greater than or equal to the feedback signal threshold FK1, the device will operate normally in standby and working states. The microprocessor analyzes and processes the signal and sends a normal feedback signal to the electronic delay module. After the electronic delay module analyzes and processes the signal and confirms that the connection is correct, it completes the network setup.

[0043] If the calculated feedback signal value FK is greater than or equal to the feedback signal threshold FK0 and less than the feedback signal threshold FK1, the device is operating abnormally in the working state. The microprocessor analyzes and processes the signal and sends the abnormal feedback signal to the electronic delay module. The electronic delay module analyzes and processes the signal and sends a cancellation operation command. At the same time, it displays that the device is abnormal in the working state.

[0044] If the calculated feedback signal value FK is less than the feedback signal threshold FK0, the device is malfunctioning in standby mode. The microprocessor analyzes and processes the signal and sends an abnormal feedback signal to the electronic delay module. The electronic delay module analyzes and processes the signal and sends a cancellation operation command. At the same time, it displays that the device is malfunctioning in standby mode.

[0045] The beneficial effects of this invention are as follows:

[0046] 1. By controlling the load resistor of the first instrumentation amplification module through the static current adjustment module, the measurement of the static current Iq becomes more accurate, and the dynamic current Is is amplified to Rs times its original value, improving the signal-to-noise ratio and making the measurement of the dynamic current more accurate. Because the dynamic signal Is is amplified, the increased signal-to-noise ratio enhances anti-interference performance. The output voltage is attenuated through a voltage divider network (R5 / R6 / R7) to prevent saturation of the third instrumentation amplification module, further improving system stability. The connection state of the first load resistor R4 and the second load resistor R8 is controlled by the NMOS switch M1, allowing flexible adjustment of the measurement range of the static current Iq to ensure measurement accuracy. The system can simultaneously measure the static current Iq and the dynamic current I... Furthermore, the amplification factor of the dynamic current can be adjusted according to the sampling resistor Rs, thereby expanding the dynamic range of the measurement. The first and second instrument amplification modules operate at a set working voltage VH, ensuring that the sampling signal will not saturate even under high leakage current conditions, thus improving the reliability and robustness of the system. The microprocessor is responsible for the coordination and data processing of the entire system. Through digital-to-analog converter (DAC) and analog-to-digital converter (ADC) interfaces, a high degree of hardware and software integration is achieved. The system adopts a modular design, with each module responsible for a specific function, facilitating system expansion and maintenance. The system can effectively amplify the dynamic current signal without affecting the accuracy of static current measurement, thereby improving the accuracy and reliability of the measurement.

[0047] 2. Real-time monitoring of static and dynamic currents allows for timely detection and diagnosis of potential circuit problems, thereby improving the overall reliability of the system. By setting static and dynamic current thresholds and performing corresponding characteristic value analysis, potential fault-causing factors can be detected early, enabling preventative measures to be taken. With clearly defined static characteristic values ​​JT and DT, and the setting of feedback signal thresholds, the system can automatically identify and report any anomalies, allowing maintenance teams to quickly locate problems and reduce troubleshooting time. By separating and independently analyzing static and dynamic current signals, the system ensures correct decision-making even when one or more parameters deviate from normal ranges. The microprocessor analyzes and processes the feedback signal value FK and responds with corresponding instructions based on different threshold ranges, giving the system a certain degree of intelligent decision-making capability. By comprehensively considering changes in static and dynamic currents, an effective means to improve equipment reliability and safety is provided, along with a more scientific method for system maintenance, which is crucial for ensuring the normal operation of equipment in complex environments. Attached Figure Description

[0048] The invention will now be further described with reference to the accompanying drawings.

[0049] Figure 1 This is a circuit block diagram of a device for improving leakage current resistance and interference resistance according to Embodiment 1 of the present invention;

[0050] Figure 2 This is a flowchart of the steps in a method for improving resistance to leakage current and interference in Embodiment 2 of the present invention. Detailed Implementation

[0051] To make the technical means, creative features, objectives and effects of this invention easier to understand, the invention will be further described below in conjunction with specific embodiments.

[0052] Example 1

[0053] like Figure 1 As shown in the circuit block diagram of this invention, this invention provides a device and method for improving leakage current resistance and interference resistance, comprising:

[0054] The system comprises a first instrument amplification module, a second instrument amplification module, a third instrument amplification module, a static current adjustment module, and a microprocessor. Out1 and Out2 are communication lines. Vdac is the analog signal output from the microprocessor's digital-to-analog converter (DAC), and Vadc is the analog signal transmitted to the input of the microprocessor's analog-to-digital converter (ADC). Currently, the detonator current sampling only includes the first instrument amplification module and the microprocessor; the static current Iq and dynamic current Is can only be amplified synchronously.

[0055] The first instrumentation amplifier module includes a sampling resistor Rs, a first instrumentation amplifier U1, and a first isolation resistor R1. The sampling resistor Rs is connected in series between communication lines Out1 and Out2 to obtain the communication current. After being amplified by U1 by a factor of Av1, the current is output to the first input terminal of the third instrumentation amplifier module. This module samples and amplifies the communication current by a factor of Av1, and the output voltage is: Vo1 = Iq * Rs * Av1

[0056] Where Av1 represents the voltage gain of the first instrumentation amplifier;

[0057] The second instrumentation amplifier module includes: an impedance matching resistor Re, a feedback resistor Rf, a gain adjustment resistor Rg, a second instrumentation amplifier U2, and a second isolation resistor R2. The analog signal Vdac output from the microprocessor's digital-to-analog converter (DAC) is amplified by Av2 times by U2 and then output to the second input terminal of the third instrumentation amplifier module. This amplifies the analog signal Vdac output from the microprocessor's DAC by Av2 times. This analog signal is the voltage corresponding to the static operating current of the electronic delay module, and the output voltage is: Vo2 = Iq * Av2.

[0058] set up: Where Av2 represents the voltage gain of the second instrumentation amplifier;

[0059] The third instrumentation amplifier module includes: a first voltage divider resistor R5, a second voltage divider resistor R6, a third voltage divider resistor R7, a third instrumentation amplifier U3, and a third isolation resistor R3. Vo1 and Vo2 are attenuated to their original values ​​after being divided by the voltage divider network R5, R6, and R7. To prevent the third instrumentation amplifier U3 from saturating, it is used to combine the outputs of the first and second instrumentation amplifier modules and buffer the output. Its total gain is 1, and the combined output is: Vo3 = Vo1 - Vo2 = Iq * Av1

[0060] Here, Av3 represents the voltage gain of the third instrumentation amplifier;

[0061] The static current adjustment module includes: a first load resistor R4, a second load resistor R8, and an NMOS switch M1, used to control the load resistor of the first instrumentation amplifier module. The voltage division ratio is: To correctly obtain the static current Iq of the electronic delay module;

[0062] The microprocessor module includes a microprocessor chip and its peripheral resistors, which are existing circuits.

[0063] Includes the following steps:

[0064] The first step is to measure the quiescent operating current Iq.

[0065] During microprocessor initialization, P2.2 outputs a high level, M1 is turned on, the first load resistor R4 is grounded, and the second load resistor R8 is short-circuited, reducing the sampling resistance to: To prevent the output of the third instrument amplification module from exceeding the input range of the microprocessor, the ADC is activated to perform analog-to-digital conversion on Vo3 and obtain the static current Iq.

[0066] P2.2 represents the output pin of the microprocessor;

[0067] The second step is to measure the dynamic current Is.

[0068] When the microprocessor is working normally, P2.2 outputs a low level, M1 is cut off, the first load resistor R4 and the second load resistor R8 are connected in series to ground, and R4+R8 is set to be much larger than R5+R6+R7. The DAC is set to work and converts the static operating current Iq into the analog output Vdac.

[0069] Send a signal to communicate normally with the electronic delay module. When the module returns data, start the ADC. The first instrumentation amplification module outputs the sampling signals of static current Iq and dynamic current Is.

[0070] The Vdac signal is amplified by the second instrument amplification module and then merged with the sampling signal output from the first instrument amplification module in the third instrument amplification module.

[0071] The output Vo3 = Vo1 - Vo2 = Iq * Av1 + Is * Rs * Av1 is converted from analog to digital to obtain a mixed signal of static current Iq and dynamic current Is: Iq + Is * Rs, where Is is usually less than Iq.

[0072] The third step is data processing.

[0073] The microprocessor operates normally, processing the mixed signal Id+Is*Rs to obtain the feedback signal from the electronic delay module.

[0074] Since the dynamic signal Is is amplified to Rs times its original value, the signal-to-noise ratio is increased and the anti-interference performance is improved. Meanwhile, the static current Iq input to the MCU maintains its original amplitude. The first and second instrumentation amplification modules are set to operate at the set operating voltage VH to ensure that the sampling signal will not saturate due to the increase in sampling resistance when the leakage current is high.

[0075] The technical solution of this invention is as follows: The static current adjustment module controls the load resistor of the first instrumentation amplification module, making the measurement of the static current Iq more accurate. The dynamic current Is is amplified to Rs times its original value, improving the signal-to-noise ratio and thus making the dynamic current measurement more accurate. Because the dynamic signal Is is amplified, the signal-to-noise ratio is improved, thereby enhancing anti-interference performance. The output voltage is attenuated through a voltage divider network (R5 / R6 / R7) to prevent saturation of the third instrumentation amplification module, further improving system stability. The connection state of the first load resistor R4 and the second load resistor R8 is controlled by the NMOS switch M1, allowing flexible adjustment of the measurement range of the static current Iq to ensure measurement accuracy. The system can simultaneously measure the static current Iq and the dynamic current I... Furthermore, the amplification factor of the dynamic current can be adjusted according to the sampling resistor Rs, thereby expanding the dynamic range of the measurement. The first and second instrument amplification modules operate at a set working voltage VH, ensuring that the sampling signal will not saturate even under high leakage current conditions, thus improving the reliability and robustness of the system. The microprocessor is responsible for the coordination and data processing of the entire system. Through digital-to-analog converter (DAC) and analog-to-digital converter (ADC) interfaces, a high degree of hardware and software integration is achieved. The system adopts a modular design, with each module responsible for a specific function, facilitating system expansion and maintenance. The system can effectively amplify the dynamic current signal without affecting the accuracy of static current measurement, thereby improving the accuracy and reliability of the measurement.

[0076] Example 2

[0077] Based on Example 1, this invention processes and analyzes the mixed signal of static current and dynamic current. However, anomalies may occur during the measurement process, making it impossible to obtain an accurate mixed signal, leading to abnormal results in data processing and deviations in the feedback signal obtained from the electronic delay module. Therefore, this invention optimizes the data processing of the mixed signal, such as... Figure 1 As shown in the embodiment of the present invention, a method for improving leakage current resistance and interference resistance includes:

[0078] Step 1: Obtain the static current data and dynamic current data of the circuit. The static current data contains leakage current, and a hardware failure occurs when measuring the dynamic current, resulting in an anomaly in the obtained mixed signal. The cause of the anomaly cannot be specifically determined, and delayed processing cannot quickly solve the problem and restore normal operation. Therefore, the mixed signal is separated and preliminarily processed before sending the mixed signal.

[0079] It should be noted that hardware failures include, but are not limited to, component failures, poor soldering, power supply problems, and thermal runaway. Hardware failures cause abnormal current in the circuit during operation.

[0080] Based on the obtained static current data, and the preset static current threshold I... q0 By comparison and analysis, the static characteristic value JT is obtained. The static current threshold represents the maximum current that the device can withstand to maintain normal standby. The static current threshold includes the maximum leakage current that the device can withstand to maintain normal standby.

[0081] It should be noted that the static current threshold is obtained through experimental testing. The current in the circuit is continuously increased while the device is in standby mode. After each increase in current, the device needs to stabilize for a period of time before measurement. At the same time, multiple measurements are required under the same conditions for comparison. When the device can no longer maintain a normal standby state, the current data is recorded and marked as the static current threshold.

[0082] If the static current is less than the static current threshold I q0 If so, the static characteristic value JT will be assigned a value of 1, indicating that the device is maintaining normal standby operation;

[0083] If the static current is greater than or equal to the static current threshold I q0 If the static characteristic value JT is -1, it indicates that the device is abnormally maintaining standby operation.

[0084] Based on the obtained dynamic current data, and the preset dynamic current threshold I s0 By comparing and analyzing, the dynamic characteristic value DT is obtained. The dynamic characteristic threshold represents the maximum current that the equipment can withstand to maintain normal operation. The dynamic current threshold includes the maximum current that the equipment can withstand when a hardware failure occurs while maintaining normal operation.

[0085] It should be noted that the dynamic current threshold is also obtained through experimental testing. The current in the circuit is continuously increased while the device is running normally. After each increase in current, the device needs to stabilize for a period of time before measurement. At the same time, multiple measurements are required under the same conditions for comparison. When the device cannot maintain normal operation, the current data is recorded and marked as the dynamic current threshold.

[0086] If the dynamic current is less than the dynamic current threshold I s0 If so, the dynamic characteristic value DT will be assigned a value of 1, indicating that the equipment is operating normally;

[0087] If the dynamic current is greater than or equal to the dynamic current threshold I s0 If the dynamic characteristic value DT is -1, it indicates that the equipment is malfunctioning.

[0088] Step 2: Based on the obtained static and dynamic eigenvalues, obtain the feedback signal value of the electronic delay module, and acquire the mixed signal I of the static current Iq and the dynamic current Is. d +I s *R sThe mixed signal I is processed by a microprocessor. d +I s *R s Data processing is performed to analyze and convert the feedback signal value into a feedback signal for the electronic delay module. Once the electronic delay module has been analyzed and processed and confirmed to be connected correctly, the networking is completed.

[0089] It should be noted that the electronic delay module is an electronic device used to control the detonation time of an explosive device to ensure that the explosion is triggered accurately at the predetermined time, which can improve the safety and efficiency of blasting operations.

[0090] In some embodiments, the obtained static eigenvalue JT and dynamic eigenvalue DT are subjected to data analysis processing using the formula: The feedback signal value FK is obtained, where a1 and a2 are preset correlation coefficients;

[0091] It should be noted that the feedback signal value FK is calculated through data analysis and processing of the static characteristic value JT and the dynamic characteristic value DT. It reflects the specific situation of the circuit in the standby and running states of the device, and determines whether the device can run normally and complete the command operation. The static characteristic value JT reflects the specific situation of the circuit in the standby state of the device, and the dynamic characteristic value DT reflects the specific situation of the circuit in the running state of the device. When the device can run normally and complete the command operation, the electronic delay module completes the network formation after analysis and processing to confirm that the connection is correct, and sends the next command operation.

[0092] The calculated feedback signal value FK is compared with the preset feedback signal thresholds FK0 and FK1, and they are classified into different types.

[0093] If the calculated feedback signal value FK is greater than or equal to the feedback signal threshold FK1, the device can operate normally in standby and working states. The microprocessor analyzes and processes the signal and sends a normal feedback signal to the electronic delay module. After the electronic delay module analyzes and processes the signal and confirms that the connection is correct, it completes the network setup.

[0094] If the calculated feedback signal value FK is greater than or equal to the feedback signal threshold FK0 and less than the feedback signal threshold FK1, the device cannot operate normally in the working state. The microprocessor analyzes and processes the signal and sends an abnormal feedback signal to the electronic delay module. The electronic delay module analyzes and processes the signal and sends a cancellation operation command. At the same time, it displays that the device is abnormal in the working state.

[0095] If the calculated feedback signal value FK is less than the feedback signal threshold FK0, the device cannot operate normally in standby mode. The microprocessor analyzes and processes the signal and sends an abnormal feedback signal to the electronic delay module. The electronic delay module analyzes and processes the signal and sends a cancellation operation command. At the same time, it displays that the device is abnormal in standby mode.

[0096] For example, setting a1 = 0.5, Feedback signal threshold FK0 = 2, feedback signal threshold FK1 = 4; if the obtained static feature value JT is 1 and the obtained dynamic feature value DT is 0, the feedback signal value can be calculated using the formula. Analysis revealed that the device could not operate normally in standby mode. The microprocessor analyzed and processed the data and sent an abnormal feedback signal to the electronic delay module. After analysis and processing, the electronic delay module confirmed and sent a cancellation operation command, while simultaneously displaying a message indicating that the device was malfunctioning in standby mode.

[0097] The technical solution of this invention is as follows: By real-time monitoring of static and dynamic currents, potential problems in the circuit can be detected and diagnosed in a timely manner, thereby improving the overall reliability of the system. By setting static and dynamic current thresholds and performing corresponding characteristic value analysis, factors that may lead to failure can be detected early, allowing for preventative measures to be taken. Through clear definitions of static characteristic value JT and dynamic characteristic value DT and the setting of feedback signal thresholds, the system can automatically identify and report any abnormalities, enabling the maintenance team to quickly locate the problem and reduce troubleshooting time. By separating static and dynamic current signals and analyzing them independently, the system can still make correct decisions even when one or more parameters deviate from the normal range. By analyzing and processing the feedback signal value FK through a microprocessor and making corresponding instruction responses based on different threshold ranges, the system possesses a certain degree of intelligent decision-making capability. By comprehensively considering the changes in static and dynamic currents, an effective means is provided to improve the reliability and safety of the equipment, while also providing a more scientific method for system maintenance, which is of great significance for ensuring the normal operation of the equipment in complex environments.

[0098] The foregoing has shown and described the basic principles, main features, and advantages of the present invention. Those skilled in the art should understand that the present invention is not limited to the above embodiments. The embodiments and descriptions in the specification are merely illustrative of the principles of the invention and should not be considered as limiting the scope of the invention. All equivalent variations and improvements made within the scope of the present invention should still fall within the patent coverage of the present invention.

Claims

1. A device for improving resistance to leakage current and interference, characterized in that: include: The system comprises a first instrument amplification module (10), a second instrument amplification module (20), a third instrument amplification module (30), a static current adjustment module (40), and a microprocessor (50). The first instrumentation amplification module includes: a sampling resistor Rs, a first instrumentation amplifier U1, and a first isolation resistor R1, which is used to sample the communication current and amplify it by Av1 times, and the output voltage is: Vo1=Id*Rs*Av1; The second instrumentation amplifier module includes: an impedance matching resistor Re, a feedback resistor Rf, a gain adjustment resistor Rg, a second instrumentation amplifier U2, and a second isolation resistor R2. It is used to amplify the analog signal Vdac output by the microprocessor's digital-to-analog converter DAC by Av2 times, and the output voltage is: Vo2=Iq*Av2; The third instrumentation amplifier module includes: a first voltage divider resistor R5, a second voltage divider resistor R6, a third voltage divider resistor R7, a third instrumentation amplifier U3, and a third isolation resistor R3. It is used to combine the outputs of the first and second instrumentation amplifier modules and buffer the output. Its total gain is 1, and the combined output is: Vo3 = Vo1 - Vo2 = Iq * Av1. The static current adjustment module includes a first load resistor R4, a second load resistor R8, and an NMOS switch M1, which are used to control the load resistance and voltage division ratio of the first instrumentation amplification module in order to correctly obtain the static current Iq of the electronic delay module. The steps for measuring quiescent current are as follows: microprocessor initialization, P2.2 output high level, M1 conducts, first load resistor R4 is grounded, and second load resistor R8 is short-circuited; reduce sampling resistor to prevent the output of the third instrumentation amplification module from exceeding the input range of the microprocessor; start ADC to perform analog-to-digital conversion on Vo3 to obtain quiescent current Iq; The steps for measuring dynamic current are as follows: The microprocessor operates normally, P2.2 outputs a low level, M1 is cut off, and the first load resistor R4 and the second load resistor R8 are connected in series and grounded; R4+R8 is set to be much larger than R5+R6+R7, the DAC is set to work, and the static operating current Iq is converted into an analog output Vdac; a signal is sent to communicate normally with the electronic delay module, and the ADC is started when the module returns data. The first instrumentation amplification module outputs the sampling signals of the static current Iq and the dynamic current Is; Vdac is amplified by the second instrumentation amplification module and then combined with the sampling signal output by the first instrumentation amplification module in the third instrumentation amplification module; Vo3 is output, and analog-to-digital conversion is performed on Vo3 to obtain the mixed signal of the static current Iq and the dynamic current Is. The microprocessor includes a microprocessor chip and its peripheral resistors, outputs analog signals, processes mixed signals, and obtains feedback signals from the electronic delay module.

2. The device for improving leakage current resistance and interference resistance according to claim 1, characterized in that: The data processing steps of the device are as follows: The microprocessor works normally, processes the mixed signal, and obtains the feedback signal from the electronic delay module. Since the dynamic signal Is is amplified to Rs times its original value, the signal-to-noise ratio is increased and the anti-interference performance is improved, while the static current Iq input to the MCU maintains its original amplitude. The first and second instrument amplification modules are set to operate at a set working voltage VH to ensure that the sampling signal will not saturate due to the increased sampling resistance when the leakage current is high.

3. A method for improving resistance to leakage current and interference, the method being used to execute the apparatus according to any one of claims 1-2, characterized in that: include: Acquire static and dynamic current data of the circuit, analyze and process the static and dynamic current data to obtain a mixed signal, and separate and preliminarily process the mixed signal before sending it. Based on the obtained static current data, and the preset static current threshold I... q0 By comparing and analyzing, the static eigenvalue JT is obtained. Based on the obtained dynamic current data, and the preset dynamic current threshold I... s0 By comparing and analyzing, the dynamic eigenvalue DT is obtained. The obtained static eigenvalues ​​JT and dynamic eigenvalues ​​DT are subjected to data analysis and processing to obtain the feedback signal value FK. The calculated feedback signal value FK is compared with the preset feedback signal thresholds FK0 and FK1, and they are classified into different types. Based on the feedback signal value obtained from the electronic delay module, a mixed signal of static current Iq and dynamic current Is is acquired: I q +I s *R s The mixed signal I is processed by a microprocessor. q +I s *R s Data processing is performed, and the feedback signal value is analyzed and converted into a feedback signal for the electronic delay module. Once the electronic delay module has been analyzed and processed to confirm that the connection is correct, the network is completed.

4. The method for improving leakage current resistance and interference resistance according to claim 3, characterized in that: Based on the obtained static current data, and the preset static current threshold I... q0 By comparison and analysis, the static characteristic value JT is obtained. The static current threshold represents the maximum current that the device can withstand to maintain normal standby. The static current threshold includes the maximum leakage current that the device can withstand to maintain normal standby.

5. The method for improving leakage current resistance and interference resistance according to claim 3, characterized in that: The specific process for obtaining the static feature values ​​is as follows: If the static current is less than the static current threshold I q0 If so, the static characteristic value JT is assigned a value of 1, indicating that the device is maintaining normal standby operation; If the static current is greater than or equal to the static current threshold I q0 If the static characteristic value JT is -1, it indicates that the device is abnormally maintaining standby operation.

6. The method for improving leakage current resistance and interference resistance according to claim 3, characterized in that: The specific process for obtaining the dynamic feature values ​​is as follows: Based on the obtained dynamic current data, and the preset dynamic current threshold I... s0 By comparing and analyzing, the dynamic characteristic value DT is obtained. The dynamic characteristic threshold represents the maximum current that the equipment can withstand to maintain normal operation. The dynamic current threshold includes the maximum current that the equipment can withstand when a hardware failure occurs while maintaining normal operation. If the dynamic current is less than the dynamic current threshold I s0 If so, the dynamic characteristic value DT will be assigned a value of 1, indicating that the equipment is operating normally; If the dynamic current is greater than or equal to the dynamic current threshold I s0 If the dynamic characteristic value DT is -1, it indicates that the equipment is malfunctioning.

7. The method for improving leakage current resistance and interference resistance according to claim 3, characterized in that: The specific process for obtaining the feedback signal value is as follows: The obtained static eigenvalues ​​JT and dynamic eigenvalues ​​DT are then subjected to data analysis and processing using the formula: The feedback signal value FK is obtained, where a1 and a2 are preset correlation coefficients.

8. The method for improving leakage current resistance and interference resistance according to claim 3, characterized in that: The specific analysis process for the feedback signal value is as follows: If the calculated feedback signal value FK is greater than or equal to the feedback signal threshold FK1, the device will operate normally in standby and working states. The microprocessor analyzes and processes the signal and sends a normal feedback signal to the electronic delay module. After the electronic delay module analyzes and processes the signal and confirms that the connection is correct, it completes the network setup. If the calculated feedback signal value FK is greater than or equal to the feedback signal threshold FK0 and less than the feedback signal threshold FK1, the device is operating abnormally in the working state. The microprocessor analyzes and processes the signal and sends the abnormal feedback signal to the electronic delay module. The electronic delay module analyzes and processes the signal and sends a cancellation operation command. At the same time, it displays that the device is abnormal in the working state. If the calculated feedback signal value FK is less than the feedback signal threshold FK0, the device is malfunctioning in standby mode. The microprocessor analyzes and processes the signal and sends an abnormal feedback signal to the electronic delay module. The electronic delay module analyzes and processes the signal and sends a cancellation command, while simultaneously displaying a message indicating that the device is malfunctioning in standby mode.

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