Distance detection device, detection method and machining apparatus

Abstract

The present application relates to distance detection device, detection method and processing equipment, including processing head for processing workpiece, the processing head is fixed with distance detection device, the height of the workpiece surface is detected through the distance detection device, and the processing head is adjusted for processing according to the height. The distance detection device is detachably connected with the processing head, which facilitates the installation and disassembly of the detection device, and flexibly adapts to various processing heads and realizes the same axiality and same direction external force applied to the distance detection device for probe extension and contraction movement, avoiding the need for resetting point when the detection device extends and contracts in different positions. The distance between the workpiece surface and the processing head is measured quickly after resetting in the same XY axis position, reducing the movement time and improving the work efficiency. At the same time, the lever principle is used to solve the problem of insufficient extension distance of the detection device caused by insufficient space of the processing head. In the same axiality and same direction movement, the damage to the workpiece surface is small, the cost and maintenance cost are low, and the overall structure is simple and compact.

Description

Technical Field

[0001] This invention relates to the field of distance detection, and more particularly to a distance detection device, a distance detection method, and a processing equipment. Background Technology

[0002] Distance detection devices play a crucial role in many fields, such as remote sensing, obstacle avoidance, surveying, and modeling on both mobile and non-mobile platforms; they can also be used in workpiece processing, such as laser engraving and laser marking. Current detection structures first apply a downward force to the upper part of the probe to release it, and after focusing on the detection distance, an upward force is applied from the bottom to retract the probe. Therefore, the force extending and retracting the probe are not applied in the same direction. Since the area below the probe is the working area and no obstacles are allowed, the force applied at the bottom for probe retraction must be outside the working area; otherwise, it may damage the surface of the workpiece. This results in the detection device having to retract the probe outside the working area after each detection distance, making the detection process cumbersome and wasting detection time. Electromagnetic detection schemes also exist. The principle of electromagnetic detection is that only energizing the detection component is needed to achieve probe extension and retraction. The disadvantage is that the extension time is relatively short (2-3 seconds). After 2-3 seconds, the probe cannot continue to extend due to severe overheating and will retract directly, making it impossible to complete multi-point curved surface detection. The longer the probe duration, the larger the probe component and the more expensive it is.

[0003] Chinese Patent Publication No. CN118392093A discloses a distance detector and processing equipment. The distance detector includes a housing, a detection element, and a trigger element. Part of the detection element is slidably inserted into the housing along its length. The trigger element is connected to the detection element and can move with the extension and retraction of the detection element to trigger a sensing component located at a first installation position. The technical solution of this application can improve the user experience of the distance detector. The distance detector in this patent requires resetting at a pushing point after each distance measurement, resulting in a long travel distance during detection and making detection inconvenient.

[0004] Chinese Patent Publication No. CN118393463A discloses a processing device, including a main body and a distance detector. The main body is equipped with a state transition component. The distance detector includes a housing and a probe, which is retractably inserted into the housing. The probe has a detection position and an idle position relative to the housing. When the probe needs to switch its position relative to the housing, the state transition component is positioned opposite the probe, and the state transition component is used to adjust the position of the probe so that the probe can move between the idle position and the detection position. The technical solution of this application can realize the automatic retraction of the probe in the distance detector and avoid the complexity of the distance detector structure. However, this patent also requires resetting at the pusher before the next distance detection can be performed, which means that the laser processing equipment needs to be moved to the pusher for resetting every time a distance detection is performed, which is cumbersome. Summary of the Invention

[0005] The technical problem this invention aims to solve is that current detection structures first apply a downward force to the upper part of the probe to release it, and after distance detection, apply an upward force from the bottom to retract the probe. Therefore, the force extending the probe and the force retracting it are not in the same direction. Furthermore, the area below the probe is the working area, and obstacles are not allowed. Therefore, the force applied at the bottom to retract the probe must be outside the working area. This results in the detection device having to move outside the working area to retract the probe after each distance detection, leading to cumbersome detection steps and wasted detection time. To address the above-mentioned shortcomings of the prior art, this invention provides a distance detection device, detection method, and processing equipment.

[0006] To solve the above-mentioned technical problems, the technical solution adopted by the present invention is as follows:

[0007] A distance detection device is constructed, including a housing with a through hole at the lower end. A pressing shaft and a detection element are disposed inside the housing. The pressing shaft moves along its length. A sliding block is connected to the lower end of the pressing shaft. The sliding block moves with the pressing shaft to push the detection element to move. The detection element can pass through the lower through hole and move along its length. The housing is also provided with preset positions. Applying an external force of the same axis and direction to the detection device causes the sliding block to move to different preset positions inside the housing to change the length of the detection element extending out of the housing.

[0008] The distance detection device described above applies a vertical downward force to the pressing shaft, causing it to move along its length and push the sliding block, thereby moving the detection element. The sliding block is fixed after moving to a preset position, at which point the extension length of the detection element is the maximum required extension length. Simultaneously, a vertical downward force is applied to the pressing shaft, causing it to move to other preset positions. After being subjected to force by the detection element, the length of the detection element extending out of the housing is changed to detect the distance to the machined surface. After detection is completed, the detection element returns to its longest extension position for re-detection, thus achieving repeated detection.

[0009] In the above-mentioned distance measuring device, preferably, an elastic element is provided inside the housing. The elastic element deforms under the action of the sliding block. The sliding block moves to different preset positions inside the housing under the action of the external force applied to the detection device on the same axis and in the same direction and the force of the elastic element, so as to change the length of the detection element extending out of the housing.

[0010] The distance detection device described above incorporates an elastic element that compresses when the sliding block moves and provides a preload force to return the sliding block to its initial position when it rebounds under pressure. This ensures that the sliding block and the detector can return to their preset initial positions each time, resulting in higher detection accuracy.

[0011] In the above-mentioned distance detection device, preferably, a preset groove is provided inside the housing, and multiple preset positions are formed in the preset groove. When the sliding block moves to different preset positions inside the housing, the length of the probe extending out of the housing is the same or not exactly the same.

[0012] The distance detection device described above has multiple preset slots inside the housing and different preset positions. When the sliding block is in different preset positions, the extension length of the probe is the same or not exactly the same. As mentioned above, the extension length of the probe is the maximum when the sliding block is placed in the preset position. Since multiple preset positions can be set, this maximum value can be changed. It is convenient to move the sliding block to different preset positions to change the maximum extension length of the probe, so as to adapt to the maximum position of different processing surfaces and have a wider range of applications.

[0013] In the aforementioned distance detection device, preferably, the preset position includes multiple sets of high points, multiple sets of low points, and multiple sets of intermediate points, and the high points, intermediate points, and low points are sequentially arranged in a preset slot, with an intermediate point between the low point and the high point, and the preset slot is arranged in a loop.

[0014] The distance detection device described above has a sliding block that extends to different heights, low points, and midpoints, corresponding to different extension lengths. In some embodiments, when the sliding block is at a high point, the detector can extend a smaller distance, while in other embodiments, the detector can extend a larger distance. The situation at the low point is the opposite of that at the high point. Because the preset slots are arranged in a loop, the sliding block can cyclically move between the high, mid, and low points to achieve cyclic movement of the detector under the action of external force in the same direction and on the same axis.

[0015] In the above-mentioned distance detection device, preferably, the sliding block and the positioning member interact with each other, the positioning member is placed in a preset groove, the sliding block changes the position of the positioning member in the preset groove when it moves, and the position of the sliding block is fixed when the positioning member is placed in a preset position in the preset groove.

[0016] The distance detection device with the above structure fixes the sliding block by connecting the positioning component to the preset groove, which facilitates the setting of the shape of the preset groove. The positioning component is also easier to set, making it easier to install and disassemble the product and improving the applicability of the product.

[0017] In the above-mentioned distance detection device, preferably, the positioning element is a probe hook with one end connected to the housing, the other end of the probe hook is a movable end, the preset groove is placed on the sliding block, and the movable end of the hook moves in the preset groove of the sliding block to change the relative position of the probe element and the sliding block.

[0018] The distance detection device with the above structure fixes the fixed end of the hook inside the housing, and the movable end slides in the preset groove to adjust the preset position of the hook in the preset groove. After the preset position is fixed, the outer shell and the sliding block are fixed, thereby adjusting the extension length of the detection element. After applying pressure to the pressing element, the movable end moves in the preset groove, making the sliding smoother, the connection more stable, and the operation more convenient.

[0019] In the above-mentioned distance detection device, preferably, the positioning element is a tooth set on the housing, and the sliding block is provided with a preset groove corresponding to the tooth. The position of the detection element is changed when the tooth is placed in different positions of the preset groove.

[0020] In the above-mentioned distance detection device, preferably, the sliding block includes a probe pressure rod and a probe locking member. The lower end of the probe pressure rod is provided with a pressure rod ramp surface, and the upper end of the probe locking member is provided with a locking member ramp surface corresponding to the pressure rod ramp surface. The movement of the pressure rod ramp surface generates a rotational force on the locking member ramp surface, causing the sliding block to move and change the position of the locking teeth in the preset groove to change the position of the detector.

[0021] The distance detection device of the above structure generates a rotational force on the slope of the locking member through the slope of the pressure rod, and drives the locking member to rotate horizontally or move vertically. When moving vertically, it cannot rotate, so the locking member moves downward and compresses the second compression spring. When it moves to the lowest point, it rotates into the preset groove and locks at different positions along the trajectory of the preset groove, changing the extension length of the probe. Then, the probe applies pressure to the elastic member to achieve the extension and retraction movement.

[0022] In the above-mentioned distance detection device, preferably, the positioning element is a probe ball disposed on the sliding block, the preset groove is disposed inside the housing, and the probe ball moves in the preset groove to change the position of the detection element.

[0023] In the above-mentioned distance detection device, preferably, the elastic element includes a first probe spring disposed between the sliding block and the detection element, or the first probe spring is embedded in the detection element, and a second probe spring disposed between the sliding block and the housing. The sliding block reaches a preset position in the housing under the action of external force and / or the force of the second probe spring to change the length of the detection element extending out of the housing. The detection element detects the position of the object surface through the first probe spring to determine whether the surface is detected.

[0024] The distance detection device described above uses the movement trajectory of the detection ball in the preset groove to lock at different positions to change the extension length of the detection needle. Then, the detection needle applies pressure to the first compression spring of the probe to achieve extension and retraction movements, thereby detecting the position of the object surface and determining whether the surface has been detected.

[0025] In the above-mentioned distance detection device, preferably, the detection element is connected to a probe sensing stop, and a stop travel groove is provided on the side of the housing. The probe sensing stop moves within the stop travel groove. The detection device also includes a sensing component corresponding to the sensing stop. The sensing stop can trigger the sensing component when it moves to different positions, and the extension state of the detection element can be detected by the sensing component.

[0026] The distance detection device described above is equipped with a sensing stop that moves with the detection element and passes through the housing. The travel groove on the housing can limit the travel of the detection element. At the same time, the sensing component can detect the position of the sensing stop to know the extension state of the detection element, which facilitates the sensing and detection of the state of the detection element and triggers the sensing component.

[0027] In the above-mentioned distance detection device, preferably, the sensing component includes a fixing member and a PCBA board disposed within the fixing member. Multiple sets of signal components are disposed on the PCBA board along the movement direction of the detection member. Each signal component includes a signal transmitting end and a signal receiving end. The probe sensing stop moves between the signal transmitting end and the signal receiving end. When a certain set of signal components fails to work properly, the probe sensing stop is placed at the position of that set of signal components.

[0028] The distance detection device described above, by setting up signal components, can determine the height of the processing surface when the sensing stop block the signal transmission and reception of a certain set of signal components. The height of the processing surface can be determined by the height of the surface sensing stop corresponding to the current signal component. This height can be set to be consistent with the height of the processing head, or a certain height compensation can be set so that the processing head performs processing operations according to this height or the compensated height, resulting in better processing effects.

[0029] Preferably, in the above-mentioned distance detection device, the detection device further includes a pressing component, which can exert a force on the pressing shaft to make the pressing shaft move;

[0030] Alternatively, the pressing component may be an electromagnetic ring mounted on the sliding block. When the electromagnetic ring is energized, it exerts a force on the pressing shaft and can provide different magnitudes of force on the pressing shaft depending on the magnitude of the energized current.

[0031] The distance detection device described above uses a pressing assembly to press the pressing shaft. This pressing assembly has a rotating shaft that uses a lever principle to generate pressing force on the pressing shaft. This avoids the need for a long pressing shaft, which would otherwise require a large vertical space, thus saving space in the vertical direction. Furthermore, the same processing head can achieve a longer detection distance. Alternatively, an electromagnetic ring can be used. Energizing the electromagnetic ring makes it magnetic and pushes the detection element downwards. The magnitude of the current allows it to be positioned at different preset locations, providing more flexible position control.

[0032] In the above-mentioned distance detection device, preferably, the pressing assembly includes a pressing rotating block and a pressing fixing block connected to the pressing rotating block via a first rotating shaft. The pressing rotating block rotates relative to the pressing fixing block. The pressing rotating block includes a force-receiving end and a probe contact end that contacts the pressing shaft. The force-receiving end is subjected to force, causing the pressing rotating block to rotate and drive the probe contact end to apply pressing force to the pressing shaft.

[0033] The distance detection device pressing component of the above structure uses a fixed block and a rotating block connected together. The rotating block is connected to the fixed block by rotating so that the pressing component is fixed in position. During the process of the processing head rising and falling, it can contact the rotating block to make the rotating block rotate, and then make the probe contact end contact the pressing shaft and generate pressing force on it, making full use of the space in the X direction to realize the pressing action of the detection device.

[0034] In the above-mentioned distance detection device, preferably, the force-receiving end is connected to a bearing, the probe contact end is provided with an inclined surface, the inclined surface is in contact with the pressing shaft, and the pressing rotating block is also provided with a rotating stop block, the rotating stop block limits the pressing rotating block so that the pressing rotating block has the same initial pressing position.

[0035] The inclined surface at the probe contact end of the distance detection device described above increases the contact area between the rotating block and the pressing shaft during rotation, providing a more uniform and vertically downward pressing force, resulting in better movement of the detection device. Simultaneously, the included rotation stop prevents the rotating block from over-resetting during the reset process after the pressing action, allowing for a faster transition to the next pressing action. The stop also limits the pressing action, ensuring that the rotating block maintains the same initial pressing position.

[0036] A distance detection method is constructed by applying an external force to a detection device to move a sliding block and drive a detection element to move. By applying an external force of the same axis and direction to the detection device, the sliding block is moved to different preset positions to change the preset length of the extension of the detection element. Distance detection is performed by changing the extension length of the detection element by moving it to the preset position. After detection, the extension length of the detection element returns to the preset length.

[0037] The aforementioned distance detection method applies a vertical downward force to the pressing shaft, causing it to move along its length and push the sliding block, thereby moving the detection element. The sliding block is fixed after moving to different preset positions, at which point the extension length of the detection element is the maximum length that needs to be extended. At the same time, a vertical downward force is applied to the pressing shaft, causing it to move to other preset positions. After being subjected to force by the detection element, the length of the detection element extending out of the housing is changed to detect the distance to the machined surface. After detection is completed, the detection element returns to the longest length position in the depth for re-detection, thus achieving repeated detection.

[0038] In the above-mentioned distance detection method, preferably, the sliding block is moved to different preset positions by applying an external force of the same axis and direction to the detection device, and the sliding block is moved to different preset positions by the external force of the same axis and direction applied to the detection device and the force of the elastic element, so as to change the preset length of the probe extension.

[0039] The aforementioned distance detection method incorporates an elastic element that compresses when the sliding block moves and provides a preload force to allow the sliding block to return to its initial position when it rebounds under pressure. This ensures that the sliding block and the detector can return to their preset initial positions each time, resulting in higher detection accuracy.

[0040] In the above distance detection method, preferably, the detector is reset by applying an external force along its length to the sliding block again, and the sliding block is moved along its length to perform distance detection.

[0041] The aforementioned distance detection method uses the force applied to the probe to drive the elastic element to change the length of the probe extending out of the housing in order to detect the distance to the machined surface. During the detection process, the elastic element is squeezed by force. After the detection is completed, the elastic element recovers its deformation and pushes the probe to the set position for re-detection, thus enabling repeated detection.

[0042] A processing device is constructed, including a processing head for processing a workpiece. The processing head is connected to a distance detection device as described above. The height of the workpiece surface is detected by the distance detection device, and the processing head is adjusted according to the height for processing.

[0043] The processing equipment with the above structure applies the aforementioned distance detection device to the processing head, which facilitates the processing head to detect the distance to the processing surface and then adjusts the working mode of the processing head to achieve better processing results. Furthermore, since the detection height of the distance detection device is adjustable, it can be used with different processing heads to perform processing operations and detect the distance to the processing surface.

[0044] Preferably, in the above-mentioned processing equipment, the processing equipment further includes a motion device, which drives the processing head to move in three-dimensional directions. A movable block is provided on the Z-direction motion device, and the movable block moves with the processing head. A pressing component is provided on the side of the processing head, and the pressing component moves with the processing head only in the X and Y directions. When the processing head moves in the Z direction, the pressing component applies a force to the pressing shaft. A sensing component is provided inside the processing head, and the sensing component detects the state of the probe.

[0045] The processing equipment with the above structure achieves precise positioning through three-dimensional movement, and the movement in the Z direction drives the movable block to move. The movable block provides pressing force to the pressing component, enabling the processing head to self-reset during the Z-direction movement. Then, it quickly moves to the next workpiece surface distance measurement, improving work efficiency.

[0046] The beneficial effects of this invention are as follows: The working state of the machining operation is determined by detecting the extension state of the probe shaft. If it is in the extended state, the distance to the workpiece can be detected and the machining head can be focused. If it is in the retracted state, the probe shaft can be extended, and the probe shaft remains in the retracted state during machining. This avoids the need for resetting the detection device at a reset point when it extends and retracts at different positions, achieving resetting at the same XY axis position and then quickly measuring the distance to the workpiece surface, reducing movement time and improving work efficiency. The distance detection device is connected to the machining head magnetically, facilitating quick installation and removal. It is flexible and adaptable to various machining heads, achieving probe extension and retraction movements in the same axis and direction. The lever principle is used to solve the problem of insufficient machining head movement space leading to a short extension distance of the detection device. Furthermore, this solution causes less damage to the object surface, has lower cost and maintenance costs, and a simple and compact overall structure. Compared to sensor detection solutions, this solution can continuously detect the workpiece surface position information and generate workpiece surface information. Compared to electromagnetic detection solutions, it is less expensive, more compact, and more reliable. Attached Figure Description

[0047] To more clearly illustrate the technical solutions in the embodiments of the present invention or the prior art, the present invention will be further described below in conjunction with the accompanying drawings and embodiments. The drawings described below are only some embodiments of the present invention. For those skilled in the art, other drawings can be obtained based on these drawings without creative effort:

[0048] Figure 1 This is a three-dimensional structural diagram of the processing equipment according to a preferred embodiment of the present invention;

[0049] Figure 2 This is a schematic diagram of the connection between the distance detection device and the laser motion device in a preferred embodiment of the present invention;

[0050] Figure 3 This is a three-dimensional structural schematic diagram of the distance detection device according to a preferred embodiment of the present invention;

[0051] Figure 4 This is an exploded structural diagram of the distance detection device according to a preferred embodiment of the present invention;

[0052] Figure 5 This is a partial exploded structural diagram of the distance detection device according to a preferred embodiment of the present invention;

[0053] Figure 6 This is a cross-sectional view of the probe hook movable end in the initial position according to a preferred embodiment of the present invention.

[0054] Figure 7This is a cross-sectional view of the probe hook movable end in the rising section of a preferred embodiment of the present invention.

[0055] Figure 8 This is a cross-sectional view of the probe hook movable end at the first high point in a preferred embodiment of the present invention;

[0056] Figure 9 This is a cross-sectional view of the probe hook movable end at the positioning point in a preferred embodiment of the present invention;

[0057] Figure 10 This is a cross-sectional view of the probe hook movable end at the second highest point in a preferred embodiment of the present invention;

[0058] Figure 11 This is a cross-sectional view of the probe hook movable end in the falling section according to a preferred embodiment of the present invention.

[0059] Figure 12 This is a schematic diagram of the direction of movement of the movable end of the probe hook in the hook sliding groove according to a preferred embodiment of the present invention;

[0060] Figure 13 This is an exploded view of the pressing component according to a preferred embodiment of the present invention;

[0061] Figure 14 This is a three-dimensional structural diagram of the pressing component in the unpressed state according to a preferred embodiment of the present invention;

[0062] Figure 15 This is a three-dimensional structural diagram of the pressing component in the pressing state according to a preferred embodiment of the present invention;

[0063] Figure 16 This is a three-dimensional structural schematic diagram of the sensing component according to a preferred embodiment of the present invention;

[0064] Figure 17 This is an exploded structural diagram of the sensing component according to a preferred embodiment of the present invention;

[0065] Figure 18 This is a schematic diagram of the structure of the sensing component in the first signal component state according to a preferred embodiment of the present invention;

[0066] Figure 19 This is a schematic diagram of the structure of the sensing component in the second signal component state according to a preferred embodiment of the present invention;

[0067] Figure 20 This is a schematic diagram of the processing equipment in a pressing state according to a preferred embodiment of the present invention;

[0068] Figure 21 This is a schematic diagram of the connection between the pressing component and the laser motion device in a preferred embodiment of the present invention;

[0069] Figure 22 This is a side view of the laser and detection device according to a preferred embodiment of the present invention;

[0070] Figure 23 This is a schematic diagram of the axial structure of the laser and detection device according to a preferred embodiment of the present invention;

[0071] Figure 24 This is a schematic diagram of the laser, detection device, and motion device according to a preferred embodiment of the present invention;

[0072] Figure 25 This is a schematic diagram of the processing equipment in the unpressed state according to a preferred embodiment of the present invention;

[0073] Figure 26 This is a schematic diagram of the processing equipment in a preferred embodiment of the present invention, with the probe shaft extended and not pressed.

[0074] Figure 27 This is a schematic diagram of another axial structure for connecting the laser and the motion device in a preferred embodiment of the present invention;

[0075] Figure 28 This is a schematic diagram of another axial structure connecting the processing equipment and the pressing component in a preferred embodiment of the present invention;

[0076] Figure 29 This is a preferred embodiment of the present invention. Figure 28 Enlarged structural diagram at point A in the diagram;

[0077] Figure 30 This is a schematic diagram of the connection between the detection device and the laser in a preferred embodiment of the present invention;

[0078] Figure 31 This is a schematic diagram of the exploded structure of the detection device according to a preferred embodiment of the present invention;

[0079] Figure 32 This is a cross-sectional structural diagram of the detection device according to a preferred embodiment of the present invention;

[0080] Figure 33 This is a schematic diagram of another connection structure of the detection device according to a preferred embodiment of the present invention;

[0081] Figure 34 This is a schematic diagram showing the rotation direction of the probe locking member of the detection device in a preferred embodiment of the present invention;

[0082] Figure 35 This is a schematic diagram of the connection between the detection device and the laser in a preferred embodiment of the present invention;

[0083] Figure 36This is a schematic diagram of the exploded structure of the detection device according to a preferred embodiment of the present invention;

[0084] Figure 37 This is a cross-sectional structural diagram of the detection device according to a preferred embodiment of the present invention;

[0085] Figure 38 This is a cross-sectional view of the detection ball placed at the highest point in the groove according to a preferred embodiment of the present invention.

[0086] Figure 39 This is a cross-sectional structural diagram of the detection ball placed in the transition point state within the groove, according to a preferred embodiment of the present invention.

[0087] Figure 40 This is a cross-sectional view of the probe ball in the lowest point of the groove according to a preferred embodiment of the present invention.

[0088] Figure 41 This is a schematic diagram of the unfolded structure of the ball sliding groove in a preferred embodiment of the present invention;

[0089] Figure 42 This is a schematic diagram of the motion trajectory of the detection ball in the ball sliding groove, which is a preferred embodiment of the present invention. Detailed Implementation

[0090] To make the objectives, technical solutions, and advantages of the embodiments of the present invention clearer, a clear and complete description will be provided below in conjunction with the technical solutions in the embodiments of the present invention. Obviously, the described embodiments are only some, not all, of the embodiments of the present invention. All other embodiments obtained by those skilled in the art based on the embodiments of the present invention without creative effort are within the protection scope of the present invention.

[0091] The preferred embodiment of the present invention provides a distance detection device and detection method; such as Figure 3 As shown, the device includes a probe assembly 10 and a pressing assembly 11 that applies pressure to the probe assembly. The pressing assembly 11 applies external force to the probe assembly 10 to adjust the extension distance of the probe assembly, thereby enabling distance measurement. A sensing assembly 12 is provided on the side of the probe assembly 10 to sense and detect the extension status of the probe assembly, improving the accuracy of distance detection. This detection device can be used in conjunction with a laser engraving machine to detect the distance between the surface of the workpiece and the laser. Figure 1-2As shown, the laser 2 is mounted on a support, which includes two sets of opposing laser Y-axis motion devices 5 and a laser X-axis motion device 4 connecting the two ends of the laser Y-axis motion devices. The laser X-axis motion device can move back and forth along the Y direction on the laser Y-axis motion device. One set of X-axis laser motion devices is equipped with a laser Z-axis motion device 3, which can move back and forth along the X direction on the laser X-axis motion device. The laser is mounted on the laser Z-axis motion device and can move back and forth along the Z direction on the laser Z-axis motion device. The laser X-axis motion device 4 and the laser Y-axis motion device 5 together form a processing area, where the laser performs processing operations. The processing operations may include laser engraving, laser cutting, laser marking, etc. This application uses laser engraving as an example. The laser X-axis motion device 4 can move on the laser Y-axis motion device to drive the laser and the laser X-axis motion device to move in the Y direction of the processing area. The laser Z-axis motion device can move on the laser X-axis motion device to drive the laser and the laser Z-axis motion device to move in the X direction of the processing area. This allows for precise positioning of the laser at any position in the processing area before laser engraving. The laser Z-axis motion device adjusts the distance between the laser and the point or surface to be engraved, ensuring the laser is at the optimal engraving distance. A detection device detects the height of the point or surface to be engraved, and the laser Z-axis motion device adjusts the laser's position in the Z direction to achieve the optimal engraving position. This ensures that the engraving effect is optimal at every position on uneven or varying height surfaces.

[0092] Specifically, such as Figure 3-4As shown, the probe assembly 10 includes a lower probe shell 1002 and an upper probe shell 1001 that covers the lower probe shell. A probe slider 1003 is provided between the upper probe shell 1001 and the lower probe shell 1002. A pressing shaft 1000 extending from the upper end of the shell is provided at the upper end of the probe slider. The pressing shaft and the probe slider can be integrally formed. Applying pressing force to the pressing shaft causes it to move, which in turn causes the probe slider to move with the pressing shaft. A sliding groove is provided on the lower probe shell, and the probe slider can slide up and down when placed in the sliding groove. The probe assembly 10 also includes a probe shaft 1006 disposed between the upper and lower probe housings. Part of the probe shaft extends beyond the lower end of the housing, while a portion is placed inside the housing. A probe first compression spring 1007 is disposed between the upper end of the probe slider 1003 and the probe shaft 1006. A central hole is provided at the lower end of the probe slider. The probe shaft 1006 is coaxially mounted with the central hole, passing through the central hole and moving vertically (Z-axis direction) within it. The probe first compression spring 1007 is coaxially mounted with the probe shaft 1006, with its upper end abutting against the probe slider 1003 and its lower end abutting against the probe shaft 1006. The distance detection device also includes a probe sensing stop 1004 fixedly connected to the probe shaft 1006 as a whole, limiting the probe shaft within the probe slider. The probe first compression spring is disposed within the probe slider, restricting the probe sensing stop 1004 from moving vertically (Z-axis direction). Meanwhile, the probe shaft can move up and down within the central hole of the probe slider to compress the first spring of the probe. After the first spring of the probe is compressed and resets, it can also push the probe shaft to reset.

[0093] Furthermore, such as Figure 3-4As shown, the probe assembly 10 also includes two sets of second probe compression springs 1008 disposed below the probe slider 1003. Two sets of second probe compression springs are respectively disposed on both sides of the probe shaft. The upper end of the second probe compression spring contacts the lower end of the probe slider, and the lower end contacts the probe lower housing. The probe slider can slide within the sliding groove and compress the second probe compression spring. After releasing the pressure of the second probe compression spring, the second probe compression spring resets, causing the probe slider to reset. To prevent the second probe compression spring from deforming under pressure and failing to reset, the second probe compression spring is sleeved on a probe compression spring stop 1009. The probe slider also has two sets of vertical through holes corresponding to the probe compression spring stop. When the probe slider slides downwards, the probe compression spring stop is positioned within the vertical through holes. A probe hook 1005 is also provided inside the probe lower housing. One end of the probe hook is fixed inside the probe lower housing, and the other end of the probe hook moves relative to the probe slider to achieve positioning of the probe shaft extending to different lengths. The probe lower housing 1002 has a sensing stop travel groove 1011 on its side. The probe sensing stop moves within the sensing stop travel groove to achieve avoidance. The probe sensing stop passes through the sensing stop travel groove and corresponds with the sensing component to realize the sensing component's judgment of the probe needle shaft extension distance. To facilitate the connection of the probe component to the laser, two sets of probe magnets 1010 are provided on the side of the probe lower housing 1002. The probe component is installed on the laser by the attraction between the probe magnets and the laser. Alternatively, screws or other installation methods can be used to connect the probe component to the laser; no specific limitation is made here.

[0094] Furthermore, such as Figure 5-6As shown, the probe slider 1003 has a hook sliding groove 1012 on its side. One end of the probe hook is fixed inside the probe lower housing, and the other end slides in the hook sliding groove. Different sliding positions correspond to different extension lengths of the probe needle shaft, so as to realize the distance of the probe assembly to detect the surface of the workpiece. It can also lock the position of the probe slider inside the probe lower housing at different positions, making it easier to adjust the position of the probe needle shaft. The hook sliding groove 1012 is heart-shaped and includes an ascending section 10124. The lowest end of the ascending section is set as the initial point 10120, and the highest end is set as the first high point 10122. The ascending section is connected to a descending section 10125. The first high point is located above the descending section in the vertical direction. When the probe hook is at the first high point, it falls vertically into the descending section, and the end of the descending section forms a positioning point 10121. The hook sliding block 1012 also includes an upper inclined section 10126 connected to the lower inclined section. A second high point 10123 is formed at the end of the upper inclined section. A lower falling section 10127 is connected to the upper inclined section. The second high point is vertically located above the lower falling section. When the probe hook is at the second high point 10123, it falls vertically into the lower falling section, with the end of the lower falling section serving as the initial point. In this application, only two sets of high points and one set of positioning points are provided. Alternatively, the lower inclined section 10125 and the upper inclined section 10126 can be connected after the upper inclined section 10126 as needed to form a new positioning point 10121, thereby achieving limiting at different positions. However, it is necessary to ensure that the probe hook enters the lower inclined section after falling vertically from the high point. It should be noted that the first high point 10122 and the second high point 10123 can also be set to different heights, and the height and position of the positioning points can not be completely identical when multiple sets of positioning points are provided.

[0095] Furthermore, such as Figure 3-4As shown, during the assembly of the probe assembly 10, one end of the probe hook 1005 is first installed in the hole of the probe lower housing 1002 through the through hole. Then, the probe shaft 1006 and the probe first compression spring 1007 are placed in the center hole of the probe slider 1003, and the probe sensing stop 1004 is used to limit the probe shaft 1006 and the probe first compression spring 1007 within the probe slider 1003. It should be noted that the probe shaft can move relative to the probe slider at this time, and the probe shaft 1006 can compress the probe first compression spring 1007, or the probe shaft can be pushed relative to the probe slider by the thrust of the probe first compression spring. When the lower end of the probe shaft is subjected to pressure, the probe shaft moves upward to reduce its extension length and compress the probe first compression spring 1007. When the pressure at the lower end is released, the probe first compression spring 1007 is reset by pressure and pushes the probe shaft to extend to the preset value. Alternatively, the first probe spring 1007 can be removed, allowing the lower end of the probe shaft to move downwards under its own weight when no force is applied, extending the probe to the preset length. Relatively speaking, it is better to set the first probe spring to apply preload, which can avoid measurement errors caused by probe shaft wobbling and improve the effect when measuring distance. Then, the second probe spring 1008 is sleeved on the outside of the probe spring stop 1009 and placed in the hole on the side of the probe slider. The slider component is then installed in the sliding groove of the probe lower shell 1002 with the probe hook. The other end of the probe hook is placed in the hook sliding groove 1012, and the probe upper shell 1001 is fastened. Then, the probe magnet 1010 is fixed to the probe lower shell, and the probe assembly is completed.

[0096] like Figure 3-4As shown, the assembled probe assembly 10 has its first spring 1007 compressed and under stress, providing a downward force to the probe shaft. The second spring 1008 is also compressed and under stress. At this time, the probe slider is at its highest position, the probe shaft extends to its shortest distance, and the pressing shaft 1000 extends to its longest distance. The probe slider is at its highest position, and the movable end of the probe hook is at the initial point 10120. The first spring 1007 and the second spring 1008 can also be in their original, uncompressed state. The compressed state gives the probe slider 1003 and the probe shaft 1006 a preload in their initial positions. Under compression, the second spring 1008 can spring the probe slider open, placing it at its highest position. The first spring 1007, under compression, can spring the probe shaft 1006 open, placing it in its initial position. If the first probe spring 1007 and the second probe spring 1008 are in an uncompressed state in the initial state of the probe shaft 1006 and the probe slider 1003, it cannot be completely guaranteed that the probe shaft 1006 and the probe slider 1003 are in a precise predetermined position during the movement of the probe assembly 10. Therefore, the first probe spring and the second probe spring need to be set to a reasonable length, and their restoring force should not change over long-term use. Thus, in the initial state, both the first probe spring 1007 and the second probe spring 1008 receive a certain compressive force to ensure that the probe shaft 1006 and the probe slider 1003 accurately reach the predetermined position during movement. Part of the probe sensing stop 1004 passes through the sensing stop stroke groove 1011 and is positioned above the sensing stop stroke groove. When the pressing shaft 1000 is subjected to a vertically downward pressing force at the initial position, the pressing shaft drives the probe slider 1003 to move downward and the probe needle shaft 1006 to move downward. During the downward movement of the probe needle shaft, the probe second compression spring 1008 is compressed. The probe slider moves downward under the action of external force, and the probe needle shaft moves downward and extends, continuously compressing the probe second compression spring. After the pressing force is released, the probe second compression spring's reset force causes the probe slider to reset, at which point the probe needle shaft 1006 is in the extended state. The control Z-axis motor drives the laser head 2 and the detection device 10 to descend. When the probe needle shaft touches the surface of the workpiece during its downward probe, the workpiece surface exerts a pushing force on the probe needle shaft, causing the probe needle shaft to move upward. The probe needle shaft probe sensing stop 1004 will move synchronously, driving the probe sensing stop upward. When the probe sensing stop detaches from the first signal component, it indicates that the workpiece surface has been detected. Upon detecting a contact signal, the detection device and laser rise, and the reset force of the first probe spring 1007 returns the probe needle shaft to its original position. The first probe spring 1007 and the second probe spring 1008 are constantly compressed, with the compression increasing under pressure. Releasing the pressure causes the probe needle shaft to move. The working principle of the probe assembly 10 is explained below. The probe slider 1003 moves vertically up and down, as... Figure 12As shown, the movable end of the probe hook 1005 reciprocates along a trajectory within the hook sliding groove 1012, moving at various points within the groove, thereby extending and retracting the probe shaft 1006. Figure 6 The diagram shows the probe hook of the probe assembly in its initial state. At this point, the movable end of the probe hook is at initial point 10120, and both the first and second springs are under compression. Simultaneously, the probe shaft 1006 extends the shortest distance, while the pressing shaft 1000 extends the longest distance. (The diagram is incomplete and requires further context.) Figure 7 The diagram shows the probe hook of the probe assembly in the rising phase relative to the probe slider 1003. When pressure is applied to the pressing shaft 1000, causing it to move linearly downwards, it drives the probe slider 1003 downwards, causing the movable end of the probe hook to gradually rise within the rising phase 10124. At this time, the probe shaft 1006 extends further, and the compression degree of the probe's second compression spring 1008 gradually increases. Figure 8 The diagram shows the probe hook of the probe assembly at its first high point, continuously applying pressure to the pressing shaft. When the pressing shaft is subjected to force, causing the movable end of the probe hook to reach the first high point 10122, the probe needle shaft extends the longest distance, the pressing shaft extends the shortest distance, and the probe's second compression spring is in its maximum compressed state. At this point, the pressing force on the pressing shaft 1000 is released. Figure 9 The diagram shows the probe hook of the probe assembly in the positioning point state. When the pressing force of the pressing shaft 1000 disappears, the rebound force generated by the pressure of the probe's second compression spring 1008 exerts a vertical upward thrust on the probe slider, causing the probe slider to move upward in a straight line. At this time, the movable end of the probe hook moves downward relative to the probe slider 1003. Since the first high point is directly above the downward slope section in the vertical direction, the probe hook will move downward relative to the probe slider to the downward slope section 10125. Due to the inclined setting of the downward slope section, the movable end of the probe hook 1005 moves relative to the probe slider along the direction of the downward slope section to the positioning point 10121. At this time, the probe needle shaft 1006 is in the extended state, and at the same time, under the action of the rebound force of the probe's first compression spring 1007, the probe needle shaft can elastically move within the central hole of the probe slider 1003, facilitating the detection of the machined surface, such as... Figure 9 As shown, this can be used to detect the distance to the surface of a workpiece.

[0097] Furthermore, in such Figure 9 The position shown continues to apply pressure to the pressing shaft 1000, causing it to move downwards in a straight line. The probe slider 1003 also moves downwards in a straight line, as shown. Figure 10 The image shows the probe hook of the probe assembly at its second highest point. At this point, the movable end of the probe hook 1005 moves relative to the probe slider 1003 within the upward slope 10126 and continues to move to the second highest point 10123. When the pressing force of the pressing shaft 1000 is released again, as shown... Figure 11The probe hook of the probe assembly is shown in the falling phase relative to the probe slider 1003. The second spring 1008 of the probe, when compressed, rebounds and exerts a vertically upward thrust on the probe slider, causing it to move upwards in a straight line. This causes the movable end of the probe hook to move downwards in a straight line relative to the probe slider 1003. Since the second highest point is directly above the falling phase in the vertical direction, the probe hook will move downwards relative to the probe slider 1003 to the falling phase. Because the end point of the falling phase is the initial point, the probe hook will return to the initial position. At this time, the probe shaft 1006 is in a retracted state (i.e., at its shortest extension length), and the pressing shaft is at its maximum extension distance, thus forming the shape shown below. Figure 6 The state shown forms a complete cycle of motion, and the pressing shaft 1000 can be pressed again to cause the movable end of the probe hook 1005 to move back and forth relative to the probe slider 1003 within the hook stroke groove 1012, so that its movement trajectory relative to the probe slider 1003 is as follows. Figure 12 As shown.

[0098] Regarding the first spring 1007 of the probe, when the movable end of the probe hook 1005 is at the positioning point 10121 in the hook sliding groove 1012, the current extension distance of the probe shaft 1006 is recorded as the maximum extension length in the current state. When the lower end of the probe shaft is subjected to a vertical upward force, it will push the probe shaft to move upward. The extension length of the probe shaft in the current state gradually decreases, and the first spring of the probe is compressed at the same time. After the external force at the lower end of the probe shaft is removed, the first spring of the probe will rebound and push the probe shaft back to the maximum extension length in the current state. Therefore, the first spring of the probe can restore the probe shaft to the preset length in the current state when it is not subjected to external force, so that the maximum extension length of the probe shaft in the subsequent detection is the same in the current state, and the measurement accuracy is higher.

[0099] Furthermore, to accommodate measurements of distances to different workpiece surfaces, the probe assembly 10 can be configured with varying extension lengths as needed. However, when the extension length of the probe assembly 10 is set to be large, the limited space for the laser device to move along the Z-axis will result in insufficient extension of the probe shaft 1006. Therefore, the problem of insufficient extension of the probe shaft caused by the limited Z-axis space of the laser can be solved by setting a pressing component 11 to apply external force to the probe assembly. The pressing component uses a lever principle to address the issue of insufficient extension of the probe shaft caused by the limited Z-axis space of the laser.

[0100] Furthermore, such as Figure 13As shown, the pressing assembly 11 includes a pressing fixing block 1102 and a pressing rotating block 1101 connected to the pressing fixing block. One end of the pressing fixing block is provided with a first rotating shaft 1107. The middle of the pressing rotating block is connected to the first rotating shaft, and a torsion spring 1103 is provided at the connecting shaft. The other end of the pressing rotating block is fixed to the first rotating shaft via a washer 1105 and a retaining spring 1106, allowing the pressing fixing block and the pressing rotating block to rotate relative to each other along the first rotating shaft 1107. The other end of the pressing fixing block can be fixedly mounted on the laser's Z-axis profile, so that the pressing fixing block is fixed relative to the Z-axis fixing component. One end of the pressing rotating block 1101 contacts the movable block 3001, and the other end rotates via the first rotating shaft 1107, driving the probe contact end 11011 to rotate, thereby pressing the pressing shaft.

[0101] Furthermore, such as Figure 13 As shown, the pressing and fixing block 1102 is generally L-shaped, including a horizontal arm 11021 and a vertical arm 11022, which are integrally connected. The first rotating shaft 1107 is located at the end of the vertical arm 11022, and the end of the horizontal part 11021 forms a fixing end 11020 for fixed connection with the Z-axis profile of the laser, thereby fixing the pressing and fixing block. Setting the pressing and fixing block in an L-shape can further reduce the space required for the movement of the pressing assembly, and its horizontal arm can also play a certain role in stopping the pressing and rotating block, thereby limiting the rotation stroke of the pressing and rotating block. The pressing rotating block's force-receiving end 11010 is equipped with a second rotating shaft 1108. A bearing 1104 and a retaining ring 1106 are fitted onto the rotating shaft. The connection between the first rotating shaft and the pressing rotating block can be positioned closer to the force-receiving end, making the distance from the first rotating shaft to the force-receiving end less than the distance from the first rotating shaft to the probe contact end. In this case, other moving components integrated with the laser head can move in the Z-direction and contact the bearing, driving the force-receiving end 11010 to move. The movement of the force-receiving end 11010, via the first rotating shaft 1107, drives the probe contact end 11011 to move in the opposite direction and contact the probe assembly, achieving pressing. Simultaneously, to achieve a better pressing effect, the probe contact end 11011 is designed with an inclined surface facing the probe assembly, optimizing the angle of force application between the probe contact end and the pressing shaft during rotation, thus achieving a better pressing effect.

[0102] Furthermore, such as Figure 13 As shown, during assembly of the pressing assembly 11, the second rotating column 1108 is embedded in the pressing rotating block 1101, and then the bearing 1104 is placed on the second rotating shaft and secured with a retaining spring 1106. Next, the first rotating shaft 1107 is embedded in the pressing rotating block 1102, and then the torsion spring 1103 is placed on the first rotating shaft. The pressing rotating block is then fixed to the pressing fixing block using a washer 1105 and a retaining spring 1106 to complete the assembly. Finally, the pressing assembly 11 is fixed to the laser's Z-axis profile.

[0103] When the pressing component 11 is in operation, such as Figure 14-15 As shown, when the bearing 1104 is subjected to an upward vertical force applied by a fixed component that moves integrally with the laser, the pressing rotating block 1101 rotates around the first rotating shaft 1107, causing the first torsion spring to deform. At this time, the probe contact end 11011 moves downward and presses the probe assembly, applying downward pressure to the probe assembly 10 to perform the aforementioned action, thereby realizing the measurement of the distance between the probe assembly and the workpiece surface. When the external force applied to the bearing 1104 is removed, the first torsion spring resets, causing the pressing rotating block 1101 to reset. A rotation stop 11012 is provided on the pressing rotating block to prevent the inertia generated when the first torsion spring resets from causing the pressing rotating block to continue rotating, providing the same initial position for the pressing rotating block 1101 for the next pressing action. Of course, the rotation stop 11012 is not necessary; the reciprocating pressing function can still be achieved without the rotation stop 11012.

[0104] Furthermore, such as Figure 16-17 As shown, the detection device also includes a sensing component 12, which contacts the probe component and detects the extension and retraction states of the probe component. The sensing component 12 includes a sensing fixture 1201 and a sensing PCBA board 1202. The sensing PCBA board is respectively equipped with a first signal transmitter 1203, a first signal receiver 1204, a second signal transmitter 1205, and a second signal receiver 1206. The sensing PCBA board 1202 is fixed to the sensing fixture, and then the sensing component is fixed to the laser. The first signal transmitter and the first signal receiver are correspondingly positioned on the same horizontal line, and the second signal transmitter and the second signal receiver are also correspondingly positioned on the same horizontal line. Furthermore, a gap is provided between the signal transmitting end and the signal receiving end, and the probe sensing stop 1004 is placed within this gap. Since the probe sensing stop moves up and down synchronously with the probe needle shaft, the movement of the probe needle shaft 1006 can be determined by the movement state of the probe sensing stop 1004. The first signal transmitting end 1203 and the first signal receiving end 1204 are located below the second signal transmitting end 1205 and the second signal receiving end 1206. Figure 18 As shown, when the probe assembly is in the retracted state, the probe sensing stop 1004 is placed between the second signal transmitting end and the second signal receiving end, blocking the signal transmission and reception of the second signal transmitting end and the second signal receiving end, while the first signal transmitting end and the first signal receiving end can be in the normal receiving state. Therefore, the probe assembly is in the retracted state at this time. Figure 19As shown, when the probe sensing stop 1004 is placed between the first signal transmitting end and the first signal receiving end, blocking the signal transmission and reception of the first signal transmitting end and the first signal receiving end, while the second signal transmitting end and the second signal receiving end can be in normal receiving state, the probe assembly is in the extended state. It should be noted that more sets of signal transmission and reception can be set to cope with the sensing detection of various probe extension lengths when the probe assembly is set with multiple sets of positioning points.

[0105] The sensing component 12 works in conjunction with the detection device 10. When the probe shaft 1006 extends to the position of the probe sensing stop 1004 in the position of sensing the first signal component, the main program knows that the probe shaft 1006 is in the extended state. Subsequently, the laser continues to descend. When the probe shaft contacts the surface of the workpiece, the probe shaft contacts the workpiece surface and is supported vertically upward by the workpiece, causing the probe shaft to move upward. The probe shaft will drive the probe sensing stop 1004 to move upward and disengage from the sensing first signal component. The signal change of the first signal component is fed back to the main program. At this time, the main program obtains the feedback signal of the first signal component, indicating that the position is the detected workpiece surface, and records the Z-axis height at this time. The single-point height position detection of the engraved workpiece is completed. The laser is readjusted to the optimal distance again, and then the probe shaft is retracted. Based on the height information of the detected workpiece surface, the program automatically calculates the optimal engraving position of the laser from the engraving focal length. After the laser moves to the optimal focal length position with the workpiece surface, the engraving operation begins.

[0106] like Figure 18-19 and Figure 22-23 As shown, two photoelectric sensors are arranged vertically along the Z-axis inside the sensing component 12. The sensing component 12 is fixed inside the laser head 2. A through-slot structure is provided on the side of the laser head 2 at a corresponding position. The probe sensing stop 1004 can pass through the through-slot structure on the side of the laser head and move vertically along the Z-axis. When the probe shaft 1006 extends to different lengths, the corresponding probe sensing stop 1004 is in different positions. At different positions, the two photoelectric sensors inside the sensing component 12 can be triggered, so that the main program can identify the extension and retraction states of the probe. When the probe sensing stop 1004 triggers the photoelectric sensor above the sensing component 12, it informs the program that the probe is in the retracted state. When the probe sensing stop 1004 triggers the photoelectric sensor below the sensing component 12, it informs the program that the probe is in the extended state. The critical point when the probe sensing stop 1004 changes from the triggered state to the untriggered state from the photoelectric sensor below the sensing component 12 is the detection of the surface state of the engraved object.

[0107] A preferred embodiment of the present invention provides a processing device comprising the aforementioned distance detection device, the specific details of which are as described above and will not be repeated here. This distance detection device can be applied to laser processing equipment such as laser engraving machines, laser cutting machines, and laser marking machines, or to processing equipment such as printers that require detecting the height of the workpiece surface. The distance detection device can be used to detect the distance between the processing head and the processing position of the processing equipment, or to detect the flatness of the processed surface. For example, in laser engraving equipment, the processing head is often configured as a laser engraving head that emits engraving laser. By using the distance detection device to detect the surface position of the workpiece, the position of the laser engraving head can be calculated based on the focal length to ensure the best engraving effect. It can also be used to detect the flatness of the processed surface and generate surface curvature information of the workpiece to achieve variable height multi-point measurement. When measuring the distance between the laser engraving head and the processing surface, the probe shaft in its retracted state can be aligned with the light output port of the laser engraving head. In this case, the distance detected by the probe assembly is the actual distance between the laser engraving head and the processing surface, and the laser engraving head can be focused based on this distance. Alternatively, it can be set to an unaligned state. In this case, the height difference between the retracted and unaligned states needs to be recorded, and distance compensation needs to be performed when calculating the actual distance. Then, the focus can be adjusted based on the compensated distance. This application does not impose any restrictions on the height of the probe shaft in its retracted state and the laser light output port, and both should fall within the protection scope of this application.

[0108] Furthermore, such as Figure 20-21 As shown, the pressing component 11 is mounted on the laser's Z-axis profile 3, and the sensing component 12 is mounted inside the laser 2, as follows. Figure 22-23 As shown, the probe assembly 10 is then attached to the laser 2 by the probe magnet 1010. An adsorption area can be set on the laser to facilitate the installation of the probe assembly, and the magnetic attraction also facilitates disassembly and installation. At the same time, the probe magnet adsorption structure can also effectively replace and install various lasers. The laser with the probe assembly 10 and the sensing assembly 12 installed can be fixed on the laser Z-axis laser connecting block. Other structures that are easy to disassemble can also be used to connect the probe assembly 10 to the laser for easy replacement and installation, such as snap-fit ​​connection, screw connection, etc.

[0109] Furthermore, such as Figure 24 As shown, the laser is fixed to the Z-axis moving component via the laser connecting block 300. The laser Z-axis motor can drive the Z-axis moving component to move up and down along the Z direction. The Z-axis moving component and the laser connecting block 300 move synchronously and fixedly, thereby driving the laser connecting block 300 to move up and down along the Z direction.

[0110] When using the machine, the user fixes the probe assembly 10 to the laser head. The program executes the following actions: first, it resets the laser head 2 to its initial position (X=0, Y=0, Z=0). During the reset, the laser head is first raised to reset it to the initial Z-axis position 0, and then the X and Y axes are reset to their initial positions 0. Two situations may occur at this time:

[0111] If the probe shaft is in the retracted state, when the program resets the Z position, it first raises the laser head 2 to return it to the initial Z-axis position 0. During the raising process, the probe assembly 10 contacts the pressing assembly 11, which continuously presses the probe assembly 10. After the laser head reaches its highest position and completes the 0-position reset, it descends a short distance to release the probe shaft. The probe shaft 1006 is now in the extended state. At this time, the probe sensing stop 1004 triggers the photoelectric sensor located at the lower position inside the sensing assembly 12. The main program then knows that the probe is in the extended state based on the feedback signal from the photoelectric sensor. In this case, the program will not continue to execute the X and Y axis reset actions because moving the laser head while the probe shaft is in the extended state may scratch the object being engraved. At this point, the program will raise the laser head back to the initial Z-axis position 0. During this rising process, the probe assembly 10 contacts the pressing assembly 11, and the pressing assembly 11 continues to press the needle assembly 10. After the laser head reaches the highest position and completes the 0 position reset, it descends a short distance to release the probe needle shaft. The probe needle shaft 1006 is in the retracted state. At this time, the probe sensing stop 1004 triggers the photoelectric sensor located in the upper position inside the sensing assembly 12. The main program determines that the probe needle shaft is in the retracted state based on the photoelectric sensor signal. Then, the main program continues to drive the laser head back to the initial Z-axis position 0, realizing the initial position reset function of the whole machine.

[0112] If the probe shaft 1006 is in the extended state, when the program resets the Z position, it first raises the laser head 2 to reset it to the initial Z-axis position 0. During the raising process, the probe assembly 10 contacts the pressing assembly 11, which continuously presses the probe assembly 10. After the laser head reaches its highest position and completes the 0-position reset, it descends a short distance to release the probe shaft 1006, which is now in the retracted state. At this time, the probe sensing stop 1004 triggers the photoelectric sensor located at the upper position inside the sensing assembly 12. The main program then determines that the probe is in the retracted state based on the photoelectric sensor signal. Subsequently, the main program continues to drive the laser head back to the initial X and Y axes to the 0-position, thus realizing the initial position reset function of the entire machine.

[0113] The laser connecting block 300 is fixed on the movable block 3001. Since the laser connecting block 300 and the laser head 2 are fixed together, the movable block 3001 moves synchronously with the laser 2. When an engraving command is received, as the laser 2, equipped with the probe assembly 10, moves vertically upward along the Z-axis, the movable block 3001 on the laser's Z-axis also moves vertically upward synchronously. When it touches the bearing 1104 of the pressing assembly 11, it drives the pressing rotating block 1101 to rotate clockwise around the first pressing rotating shaft 1107. Figure 20 As shown, the pressing rotating block 1101 then contacts the pressing shaft 1000 and generates a pressing force on it. Figure 20As shown, when the pressing shaft 1000 moves downward, causing the probe slider 1003 to move vertically downward, the probe slider 1003 of the probe assembly 10 is pushed to its lowest point. The probe second spring 1008 is in a compressed state. At the same time, the probe hook 1005 of the probe assembly moves relative to the probe slider 1003 to the first high point of the hook sliding groove 1012. At this time, after the laser 2 moves to the highest point and triggers the induction switch, the laser 2 and the movable block 3001 continue to move downward. The external force applied by the movable block 3001 to the bearing 1004 of the pressing assembly 10 disappears. The pressing rotating block 1101 disengages from the pressing shaft 1000 of the probe assembly 10 under the rebound force of the torsion spring 1103. The probe slider 1003 moves upward after being subjected to the rebound force of the probe second spring 1108 in a compressed state. At this time, the other end of the probe hook moves relative to the probe slider 1003 to the positioning point of the hook sliding groove. Furthermore, the probe sensing stop 1004 is positioned between the first signal transmitting end 1203 and the first signal receiving end 1204, blocking signal transmission and reception. The second signal transmitting end 1205 and the second signal receiving end 1206 are not blocked and are in normal receiving state, indicating that the probe shaft 1006 of the probe assembly 10 is in the extended state at this time. Under the action of the rebound force of the probe first compression spring 1007, the probe shaft 1006 can elastically move within the central hole of the probe slider, which can be used to detect the distance to the surface of the workpiece. During the detection process, since the probe shaft 1006 is in the extended state and the probe sensing stop 1004 is at the first signal assembly, the laser continues to descend until the probe shaft contacts the surface of the workpiece. During the continued descent, the probe shaft moves upward under the action of the workpiece surface and drives the probe sensing stop 1004 to move upward. After the movement, the probe sensing stop is removed from the position of the first signal assembly. At this time, the surface of the workpiece can be detected and the Z-axis height can be recorded, thereby determining the distance between the engraving head and the surface of the workpiece. Once the detection distance is completed, the main program drives the movable block of the laser working platform to move vertically upward. Subsequently, the movable block 3001 touches the bearing 1104 of the pressing assembly 11, causing the pressing rotating block to rotate clockwise around the first rotating shaft 1107. Then, the pressing rotating block 1101 will touch the pressing shaft 1000 again, causing the probe slider 1103 to move vertically downward, pushing the probe slider of the probe assembly 10 to the lowest point. At this time, the movable end of the probe hook 1005 moves relative to the probe slider 1003 in the hook sliding groove until it reaches the second highest point. At this time, the probe second compression spring is in a compressed state.Simultaneously, when the laser 2 moves to its highest point, it triggers the induction switch, and then the laser 2 moves downward. The laser 2 and the movable block 3001 continue to move downward until the external force applied by the movable block 3001 to the bearing 1004 of the pressing assembly 10 disappears. The pressing rotating block 1101 disengages from the pressing shaft 1000 of the probe assembly 10 under the rebound force of the torsion spring 1103. The probe slider 1003 moves upward after being subjected to the rebound force of the second probe compression spring 1108 in a compressed state. The probe hook 1005 moves relative to the probe slider 1003 in the hook sliding groove 1012 under the force and moves along the hook sliding groove. After moving to the initial position, the probe sensing block 1004 is placed between the second signal transmitting end 1205 and the second signal receiving end 1206, blocking the transmission and reception of signals. The first signal transmitting end 1203 and the first signal receiving end 1204 are not blocked and are in normal receiving state. At this time, the probe needle shaft 1006 of the probe assembly 10 is in a retracted state. At this time, the laser calculates the optimal engraving position of the Z-axis of the detection point based on the previously recorded detection point distance and focal length, and moves to the optimal distance position between the laser head and the workpiece for processing. After processing at one position, the probe is moved to another position and repeatedly exerts force on the bearing 1104 through the vertical movement of the movable block 3001, causing the pressing rotating block 1101 to rotate and applying pressure to the pressing shaft 1000. This drives the probe slider 1003 to move vertically and linearly. Then, through the movement of the probe hook 1005 in various positions within the hook sliding groove, the probe slider 1003 is repeatedly pressed, causing the probe needle shaft 1006 to extend and retract under the same axial direction and external force. This avoids the probe device extending and retracting at different XY positions, reducing movement time and improving work efficiency. Simultaneously, the pressing component can be reset at the engraving position, eliminating the need to reset the probe needle shaft by contacting the workpiece surface, thus avoiding damage to the workpiece surface caused by repeated contact and affecting subsequent processing. The above description is only a preferred embodiment of the present invention and does not limit the patent scope of the present invention. Any equivalent structural transformations made using the description and drawings of the present invention under the inventive concept of the present invention, or direct / indirect applications in other related technical fields, are included within the patent protection scope of the present invention.

[0114] The detection device of this invention can be used to determine the optimal engraving position of the laser head in a laser engraving machine, ensuring good engraving results are achieved at the laser focal point. When the detection device is in its initial position, the X, Y, and Z axes are zeroed, and the probe shaft is in a retracted state. At this time, the laser and detection device will move to the X and Y axis coordinates according to instructions, with the laser's Z-axis moving upwards to zero. The probe shaft status is then detected. If the probe shaft is extended, the probe can perform workpiece distance detection to complete laser focusing. If the probe shaft is retracted, the laser's Z-axis moves upwards to zero, and pressing the probe shaft releases it, returning it to the extended state. After focusing, the probe shaft status is checked again. If the probe shaft is extended, the laser's Z-axis moves upwards to zero, and pressing the probe shaft to retract it initiates laser operation. If the probe shaft is retracted, the laser can begin operating. After the work is completed, the probe shaft position is checked. If the probe shaft is in the retracted state, the laser can return to its initial position. If the probe shaft is in the extended state, the laser moves upwards along the Z-axis to zero. When the probe shaft is pressed down to retract, the laser can return to its initial position. The probe shaft is only in the extended state when probing; it is in the retracted state during non-probing operations and movement.

[0115] The engraving process from the initial position to a set position within the working range is as follows: After the XYZ initial position is reset, the main program drives the laser head 2 to the designated engraving position (the laser head reaches the set X and Y positions, and the Z axis is in the position below the initial position after the 0 position reset). At this time, the probe needle shaft 1006 is in the retracted state. The main program drives the laser head 2 to rise along the Z direction. After the laser head rises to the highest position and completes the 0 position reset, it descends a short distance to release the probe needle shaft. The probe needle shaft 1006 is in the extended state. At this time, the probe sensing stop 1004 triggers the photoelectric sensor located in the lower position in the sensing component 12. At this time, the main program knows that the probe needle shaft is in the extended state based on the photoelectric sensor signal. Continue lowering the laser head position in the Z direction until the bottom end of the probe shaft 1006 contacts the surface of the engraved object. Then, continue lowering the laser head until the probe shaft abuts against the surface of the engraved object. The contact point on the surface pushes the probe shaft upwards, causing the probe sensing stop 1004 to be triggered by a changing signal from a constant signal received by the photoelectric sensor located at the lower position within the trigger sensing component 12. This signal is then fed back to the main program as the height of the engraved object surface. When more than one detection point needs to be detected, after detecting one point, the laser head rises a certain height (the position where the probe pressing component 11 and pressing shaft 1000 are not under force) and then continues to descend, detecting and recording the position information of the second point. This cycle continues until all required detection points are detected. Then, the laser head rises to the initial 0 position on the Z axis and descends a short distance to release the probe shaft, at which point the probe retracts. At this time, the probe sensing stop 1004 triggers the photoelectric sensor located at the upper position within the sensing component 12. The main program then determines that the probe is in the retracted state based on the photoelectric sensor signal. Then, the main program generates the height information of the surface to be carved (planar / curved surface) according to the recorded positions of each point on the carving surface. The program will then automatically calculate the optimal carving distance and the Z-axis position of the laser head based on the height information and the laser focal length, and start carving to complete one carving process.

[0116] Furthermore, the measurement of machining distance can also be applied to the detection of surface flatness of the machined surface. After obtaining the distance of the machined surface at the first position by performing the aforementioned steps at the first position, the distance can then be measured by methods such as... Figure 27 As shown, the motor 40 drives the belt 41 to rotate and move the laser to other positions. Repeat the above steps to obtain the distance of the processing surface at the second position. If the distances of the first position and the second position are different, it can be determined that the processing surface is not placed horizontally.

[0117] The preferred embodiment of the present invention provides a distance detection device and detection method; such as... Figure 30 As shown, the probe assembly 60 is fixed to the laser 2. By applying pressure to the pressing shaft 6000, the probe shaft 6006 can also extend and retract under the action of external force in the same direction on the same axis.

[0118] Furthermore, such as Figures 31-32 As shown, the probe assembly 60 includes a probe housing 6007, with a through hole inside the probe housing. A probe shaft 6006 is housed within the through hole, and a second probe compression spring 6005 is sleeved around the probe shaft. A probe base plate 6008 is located at the lower end of the probe housing through hole, fixing the second probe compression spring inside the probe housing. The probe base plate also has a through hole in its center, allowing the probe shaft to move within the through hole to change its extension distance. When the second probe compression spring 6005 is compressed, it applies an upward restoring force to the probe sensing stop 6004, thereby ensuring tight contact between the probe locking member 6002 and the probe pressure rod 6001. A probe sensing stop 6004 is connected to the upper end of the probe shaft 6006. A second probe spring is placed between the probe sensing stop and the probe base plate. The probe housing has a groove for the movement of the probe sensing stop. The probe sensing stop partially passes through the groove and moves between the aforementioned sensing components to detect the movement state of the probe components. The specific method is the same as described above and will not be repeated here. A first probe spring 6003 is connected to the upper end of the probe sensing stop. A probe locking component 6002 is connected to the upper end of the first probe spring. A pressing shaft 6000 is integrally connected to the upper end of the probe rod. The pressing shaft passes through the through hole at the upper end of the probe housing and contacts the pressing component to achieve pressing movement. When the pressing shaft is subjected to force and moves downward, it drives the probe rod to move downward and pushes the probe locking component to move downward. The second probe spring is compressed and generates an upward rebound force on the probe sensing stop, pushing the probe shaft upward. The specific movement method is the same as in Embodiment 1 and will not be repeated here.

[0119] Furthermore, such as Figures 31-34As shown, the probe rod 6001 has a rod groove 60011 on its side, and the probe locking member has a locking member groove 60021 on its side corresponding to the rod groove. The inner wall of the probe housing has a housing boss 60070 corresponding to the rod groove and the locking member groove. After applying pressure to the pressing shaft, the housing boss can move up and down relative to the rod groove and the locking member groove. To achieve locking after rotation, the lower end of the probe rod 6001 has a rod ramp surface 60010, and the upper end of the probe locking member 6002 has a corresponding locking member ramp surface 60020. When the pressing shaft moves downward under force, the rod ramp surface generates a ramp surface force on the locking member ramp surface. The ramp surface force is decomposed into a vertical force and a horizontal force. The vertical force causes the probe locking member to move vertically downward, and the horizontal force will drive the probe locking member to rotate. However, since the housing boss is located at the locking member groove, it cannot rotate in the horizontal direction and can only move downward in the vertical direction. When the outer shell boss 6007 moves below the locking member groove, the horizontal force will be applied to make the probe locking member rotate. In order to fix the position after rotation, the outer shell boss 60070 is provided with an outer shell retaining tooth 60071. When the horizontal force makes the probe locking member rotate, the outer shell retaining tooth is placed below the probe locking member, preventing it from moving in the vertical direction, thereby achieving a limit. If the force is continued to be applied to the pressing shaft to make the probe locking member rotate, the outer shell boss will rotate relative to the needle locking member 6002 to the locking member groove. At this time, it can move in the vertical direction, but cannot rotate in the horizontal direction.

[0120] Furthermore, such as Figures 31-34As shown, when the pressing shaft 6000 moves downward under the pressing force transmitted by the pressing assembly, the probe pressing rod 6001, the probe locking member 6002, the probe sensing stop member 6004, and the probe needle shaft 6006 all move downward within the probe housing 6007. At this time, the pressing rod groove 60011 and the locking member groove 60021 slide within the housing boss 60070, and the pressing rod ramp surface 60010 contacts the locking member ramp surface 60020, applying a ramp surface force to the locking member ramp surface 60020. The force on the ramp surface can be decomposed into a vertical motion force and a horizontal rotational force. The vertical motion force causes the probe locking member to move vertically downwards, while the horizontal rotational force is resisted by the movement of the locking member groove 60021 within the outer shell boss 60070, preventing the probe locking member 6002 from rotating and allowing it to maintain vertical downward movement. During the continuous downward movement, the probe's second compression spring 6005 is in a continuously compressed state, causing the locking member groove 60021 to disengage from the outer shell boss 60070, and the horizontal rotational force will cause the probe locking member to rotate. When the probe locking member 6002 moves to the lowest point, the locking member ramp surface 60020 rotates to the outer shell retaining tooth 60071. After the pressing shaft is released, the probe second compression spring 6005 is in a compressed state and has a rebound force, which applies a vertical upward rebound force to the probe locking member 6002, so that the locking member ramp surface 60020 is locked at the outer shell retaining tooth 60071. At this time, the probe needle shaft 6000 is in an extended state. The probe first compression spring connected to the upper end of the probe needle shaft can realize the adjustment of the extension distance of the probe needle shaft to realize the measurement of the distance of the processing surface. The specific method is the same as that in Embodiment 1, and will not be repeated here. When pressing force continues to be applied to the pressing shaft 6000, the inclined surface 60010 of the pressing rod contacts the inclined surface 60020 of the locking member, and applies an inclined surface force to the inclined surface of the locking member. The inclined surface force can be decomposed into a vertical motion force and a horizontal rotational force. The vertical motion force causes the probe locking member to move vertically downward, and the horizontal rotational force causes the probe locking member 6002 to rotate. The vertical motion force causes the probe locking member to move vertically downward to the lowest point. When the locking member groove 60021 rotates to the outer shell boss 60070, the probe... The second spring 6005 is in a compressed state. When the pressing force of the pressing shaft is released, the second spring of the probe returns to its original position and applies an upward rebound force to the probe locking member 6002, causing the locking member groove 60021 to move along the outer shell boss to return to the initial point. At this time, the probe needle shaft 6006 will be in a retracted state. By repeatedly applying the pressing force to the pressing shaft, the extension and retraction movement of the probe needle shaft can be realized. In conjunction with the aforementioned pressing assembly, the extension and retraction movement can be achieved by applying external force in the same axis and in the same direction.Multiple sets of locking grooves 60021 can be provided on the side of the probe locking member 6002, and a locking ramp surface 60020 is provided between each set of locking grooves. This allows the probe to rotate from one set of locking grooves to another set of locking grooves each time the pressing shaft is pressed, thus achieving reset. The angle of the locking ramp surface can also be set to be different, so as to achieve positioning at different positions. At this time, the extension distance of the probe shaft is not exactly the same, which can realize the measurement of the processing surface at different distances, making the application more extensive.

[0121] The distance detection device and detection method of the preferred embodiment of the present invention are as follows; Figure 35 As shown, the probe assembly 50 is connected to the laser 2. By applying an external force of the same axis and direction to the pressing shaft 5000, the probe shaft 5006 can also extend and retract.

[0122] Furthermore, such as Figure 36 As shown, the probe assembly 50 includes a probe housing 5004 with upper and lower openings and an internal movable channel. A probe shaft 5006 is housed inside the probe housing. A second probe spring 5003 is sleeved on the probe shaft and placed inside the probe housing. A probe base plate 5005 is located at the lower opening of the probe housing, fixing the second probe spring inside the probe housing. A through hole is provided in the center of the probe base plate, through which the probe shaft extends and retracts. A probe pressure rod 5001 is connected to the upper end of the probe shaft 5006. The upper end of the probe pressure rod is connected to a pressing shaft 5000. The pressing shaft passes through the through hole at the upper end of the probe housing and contacts the pressing assembly to achieve a pressing motion. When the pressing shaft is subjected to force and moves downward, it drives the probe pressure rod downward and pushes the probe shaft downward. The probe rod 5001 has a circular annular groove 5008 in the middle, and a probe ball 5002 is disposed in the circular annular groove. The probe ball can rotate freely in the circular annular groove. Inside the probe housing, a ball sliding groove 5007 is provided corresponding to the probe ball. When the pressing shaft is subjected to force and moves downward, the probe ball will slide in the ball sliding groove to achieve positioning. Alternatively, the probe ball 5002 can be replaced with a fixed protrusion. The fixed protrusion is fixedly connected to the probe rod 5001 and moves synchronously. The fixed protrusion can also achieve positioning at different positions in the ball sliding groove 5007. However, in this case, the probe rod and the fixed protrusion rotate while moving up and down inside the housing. With the probe ball, only the probe rod needs to move up and down inside the housing.

[0123] Furthermore, in Embodiment 3, a circular annular groove is provided in the middle of the probe rod 5001, and the probe shaft can also be connected to a sensing stop and sensing component to detect the extended state of the probe shaft. Simultaneously, the upper end of the probe shaft should be connected via a first probe compression spring (not shown in the figure), thereby achieving, as described in Embodiments 1 and 2, the measurement of the workpiece surface position by compressing the first probe compression spring when the probe shaft is in the extended state. This part will not be specifically described in this embodiment.

[0124] Furthermore, such as Figures 41-42 As shown, the ball bearing sliding groove 5007 forms multiple sets of high points 50070 and transition points 50071 within the groove, and multiple sets of low points 50072 within the groove. The ball bearing sliding groove also has multiple sets of rising sections 50073 and descending sections 50074 within the groove. The ends of the rising and descending sections are respectively the transition point 50071 and the high point 50070 or low point 50072 within the groove. When the high and low points fall vertically, they will land in the descending section and move to the transition point 50071. The height of the high point 50070 is higher than the height of the low point 50072, and both are higher than the height of the transition point 50071. The heights of the multiple sets of high and low points can be set differently, so that the probe shaft extends at different high and low points.

[0125] Furthermore, such as Figure 37-42As shown, in the initial state, the probe shaft 5006 is in a retracted state, and the pressing shaft 5000 is in its maximum extended state. At this time, the ball bearing 5002 is positioned at the highest point 50070 in the groove. When the pressing shaft 5000 is subjected to force and moves vertically downward, it drives the probe pressing component 5001 to move downward. At this time, the probe ball bearing 5002 also moves downward vertically until it contacts the descending section 50074 in the groove. Then, the probe ball bearing will move along the descending section in the groove until it reaches the transition point 50071 in the groove, reaching the lowest point. At this time, the probe shaft 5006 is in a retracted state. When the probe reaches its maximum extension distance, the second spring of the probe is in a contracted state. When the pressing force on the pressing shaft is released, the second spring of the probe 5003 rebounds and provides a vertically upward rebound force to the probe rod. The probe ball 5002 also moves vertically upward until it contacts the rising section 50073 in the groove. After that, the probe ball will move along the rising section in the groove until it reaches the lowest point 50072 in the groove. At this time, the probe shaft 5006 is in an extended state, and the distance between the processed surfaces can be measured by compressing the first spring of the probe through the probe shaft. When the pressing shaft 5000 is subjected to a vertically downward pressing force again, causing the probe pressing part 5001 to move downward, the probe ball 5002 also moves vertically downward until it contacts the descending section 50074 in the groove. After that, the probe ball will move along the descending section in the groove until it reaches another transition point 50071 in the groove. At this time, the second spring of the probe is in a compressed state. After the pressing force of the pressing shaft 5000 is released again, the second spring 5003 of the probe is compressed and rebounds, providing a vertically upward rebound force to the probe pressing rod. The probe ball 5002 also moves vertically upward until it moves vertically to the rising section 50073 in the groove. Then the probe ball will move along the rising section in the groove and reach another high point 50070 in the groove. The probe needle shaft is in a retracted state. In this way, the probe ball circulates in the groove wall of the ball sliding groove, and with the pressing component, it can extend and retract under the action of external force in the same direction and axis.

[0126] The preferred embodiment of the present invention provides a distance detection device and method that differs from the three embodiments described above in that a magnet is placed at the upper end of the probe shaft, and the magnetic force of the magnet is changed by energizing the magnet, thereby enabling the probe shaft to extend and retract under the action of an external force in the same axis and direction. However, since this method of movement easily causes the probe shaft to overheat, it needs to be stopped and cooled down after a long period of detection before detection can be performed again. Alternatively, the probe shaft can be pressed after being energized to change the extension length, and then the probe shaft applies an upward force to the first probe spring to achieve distance detection. Under the rebound force of the first probe spring, the probe shaft returns to its initial position. At the same time, a second probe spring can be placed on the probe shaft. When energized, it generates a downward force on the probe shaft, and the downward force can be set according to the magnitude of the energizing current, or the circuit can be gradually increased to continuously provide a downward force on the probe shaft, while the second probe spring is compressed. When the energizing is canceled, the downward force on the probe shaft disappears, and the second probe spring rebounds, causing the probe shaft to return to its initial position. The only difference from the first embodiment is that downward pressure is applied to the probe shaft through electromagnetic induction. The other steps are the same as in the first embodiment, and will not be repeated here.

[0127] It should be understood that the present invention has been described through some embodiments, and those skilled in the art will recognize that various changes or equivalent substitutions can be made to these features and embodiments without departing from the spirit and scope of the invention. Furthermore, under the teachings of the present invention, these features and embodiments can be modified to adapt to specific situations and materials without departing from the spirit and scope of the invention. Therefore, the present invention is not limited to the specific embodiments disclosed herein, and all embodiments falling within the scope of the claims of this application are within the protection scope of the present invention.

Claims

1. A distance detection device, comprising a housing, a through hole at the lower end of the housing, a pressing shaft and a detection element disposed within the housing, the pressing shaft being movable along its length, a sliding block connected to the lower end of the pressing shaft, the sliding block moving with the pressing shaft to push the detection element to move, the detection element being movable through the lower through hole along its length, characterized in that: The housing is also provided with a preset groove, which is arranged in a loop. Multiple preset positions are formed in the preset groove, including multiple sets of high points, multiple sets of low points, and multiple sets of intermediate points. The high points, intermediate points, and low points are arranged sequentially in the preset groove, and an intermediate point is set between the low point and the high point. Applying an external force of the same axis and direction to the detection device causes the sliding block to move to different preset positions in the housing to change the length of the detection element extending out of the housing. When the sliding block moves to different preset positions in the housing, the length of the detection element extending out of the housing is the same or not exactly the same.

2. The distance detection device according to claim 1, characterized in that: An elastic element is provided inside the housing. The elastic element deforms under the action of the sliding block. The sliding block moves to different preset positions inside the housing under the action of the external force applied to the detection device in the same direction and axis and the force of the elastic element, so as to change the length of the detection device extending out of the housing.

3. The distance detection device according to claim 1, characterized in that: The sliding block and the positioning element interact with each other. The positioning element is placed in a preset groove. When the sliding block moves, it changes the position of the positioning element in the preset groove. When the positioning element is placed in a preset position in the preset groove, the position of the sliding block is fixed.

4. The distance detection device according to claim 3, characterized in that: The positioning element is a probe hook connected to the housing at one end, and the other end of the probe hook is a movable end. The preset groove is placed on the sliding block, and the movable end of the hook moves within the preset groove of the sliding block to change the relative position of the probe and the sliding block.

5. The distance detection device according to claim 3, characterized in that: The positioning element is a locking tooth set on the housing, and the sliding block is provided with a preset groove corresponding to the locking tooth. The position of the probe is changed when the locking tooth is placed in different positions of the preset groove.

6. The distance detection device according to claim 5, characterized in that: The sliding block includes a probe pressure rod and a probe locking element. The lower end of the probe pressure rod is provided with a pressure rod ramp surface, and the upper end of the probe locking element is provided with a locking element ramp surface corresponding to the pressure rod ramp surface. The movement of the pressure rod ramp surface generates a rotational force on the locking element ramp surface, causing the sliding block to move and change the relative position of the locking teeth in the preset groove to change the position of the probe.

7. The distance detection device according to claim 3, characterized in that: The positioning element is a probe ball set on the sliding block, and the preset groove is set inside the housing. The probe ball moves in the preset groove to change the position of the probe element.

8. The distance detection device according to claim 2, characterized in that: The elastic element includes a first probe spring, which is disposed between the sliding block and the probe element, or the first probe spring is embedded in the probe element, and a second probe spring disposed between the sliding block and the housing. The sliding block reaches a preset position in the housing under the action of external force and / or the force of the second probe spring to change the length of the probe element extending out of the housing. The probe element detects the position of the object surface through the first probe spring to determine whether the surface is detected.

9. The distance detection device according to any one of claims 1-8, characterized in that: The probe is connected to a probe sensing stop, and a stop travel groove is provided on the side of the housing. The probe sensing stop moves within the stop travel groove. The detection device also includes a sensing component corresponding to the sensing stop. The sensing stop can trigger the sensing component when it moves to different positions, and the sensing component can detect the extension state of the probe.

10. The distance detection device according to claim 9, characterized in that: The sensing component includes a fixing member and a PCBA board disposed within the fixing member. Multiple signal components are disposed on the PCBA board along the movement direction of the probe. Each signal component includes a signal transmitting end and a signal receiving end. The probe sensing stop moves between the signal transmitting end and the signal receiving end. When a certain group of signal components fails to work properly, the probe sensing stop is positioned at the location of that group of signal components.

11. The distance detection device according to claim 1, characterized in that: The detection device also includes a pressing component, which can exert a force on the pressing shaft to make the pressing shaft move; Alternatively, the pressing component may be an electromagnetic ring mounted on the sliding block. When the electromagnetic ring is energized, it exerts a force on the pressing shaft and can provide different magnitudes of force on the pressing shaft depending on the magnitude of the energizing current.

12. The distance detection device according to claim 11, characterized in that: The pressing assembly includes a pressing rotating block and a pressing fixing block connected to the pressing rotating block via a first rotating shaft. The pressing rotating block rotates relative to the pressing fixing block. The pressing rotating block includes a force-receiving end and a probe contact end that contacts the pressing shaft. The force-receiving end is subjected to force, causing the pressing rotating block to rotate and drive the probe contact end to apply pressing force to the pressing shaft.

13. The distance detection device according to claim 12, characterized in that: The force-receiving end is connected to a bearing, the probe contact end is provided with an inclined surface, the inclined surface is in contact with the pressing shaft, and the pressing rotating block is also provided with a rotating stop block, the rotating stop block limits the pressing rotating block, so that the pressing rotating block has the same initial pressing position.

14. A distance detection method, based on a distance detection device as described in claim 1, wherein an external force is applied to the detection device to cause a sliding block to move, thereby driving the detection element to move, characterized in that: By applying an external force of the same axis and direction to the detection device, the sliding block is moved to different preset positions to change the preset length of the probe. Distance detection is performed by changing the extension length of the probe by moving the probe to the preset position, and the extension length of the probe returns to the preset length after detection.

15. The distance detection method according to claim 14, characterized in that, By applying an external force of the same axis and direction to the detection device, the sliding block is moved to different preset positions. Under the action of the external force of the same axis and direction applied to the detection device and the elastic element, the sliding block is moved to different preset positions to change the preset length of the probe extension.

16. The distance detection method according to claim 14, characterized in that: The detector is reset by applying an external force along its length to the sliding block again, and the sliding block is moved along its length to perform distance detection.

17. A processing apparatus, comprising a processing head for processing a workpiece, characterized in that: The processing head is connected to a distance detection device as described in any one of claims 1-13. After detecting the height of the surface of the workpiece by the distance detection device, the processing head is adjusted according to the height for processing.

18. The processing equipment according to claim 17, characterized in that: The processing equipment also includes a motion device that drives the processing head to move in three dimensions. A movable block is provided on the Z-direction motion device, and the movable block moves with the processing head. A pressing component is provided on the side of the processing head, and the pressing component moves with the processing head only in the X and Y directions. When the processing head moves in the Z direction, the pressing component applies a force to the pressing shaft. A sensing component is provided inside the processing head, and the sensing component detects the state of the probe.

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