A body structure for chip detection equipment

Abstract

The present invention discloses a body structure for chip detection equipment, comprising an outer shell, a control structure, a plurality of chambers, a door panel, a heat sink, and a drawer, and also comprises: a fixed-point temperature control structure, a plurality of heat-transmitting grooves are opened on the side of the drawer, the fixed-point temperature control structure comprises a penetration structure arranged on the side of the chamber, and a fixing structure corresponding to the heat-transmitting groove is arranged on the penetration structure; an inner fixed-point position structure, an inner groove is arranged on the side of the bottom of the drawer close to the heat sink, the inner fixed-point position structure comprises an electric pull member arranged in the chamber, a matching member is movably arranged on the output end of the electric pull member, the direction of the matching member is adjusted by an adjustment member, and an electric linkage member is arranged above the electric pull member. The present invention can improve the accuracy of test data.

Description

Technical Field

[0001] The invention relates to a device shell, in particular to a body structure for chip detection equipment. Background Art

[0002] Semiconductor products are widely used in new energy vehicles, photovoltaics and energy storage industries. As key equipment in the third-generation semiconductor industry, they need to undergo various tests before being put into use, such as simulating the product's working conditions in an environment with complex temperature and humidity changes, providing strong support for product quality control, reliability verification and environmental adaptability assessment.

[0003] When testing semiconductor products, due to the complexity of the environment, the existing technology mostly adopts the method of testing in a sealed environment. By testing in a sealed shell, the shell is divided into separate frames and controlled by unified temperature control. However, this control method can only process single components in batches and cannot process multiple components. Therefore, the shell of some equipment adopts a single-body control method, that is, a separate temperature control structure is set in the frame of each single body. Although this temperature control method can achieve the effect of local temperature control, the local temperature control effect is relatively inaccurate, and the tested parameters cannot feedback the most real data, which can easily lead to inaccurate test data.

[0004] Therefore, this case aims to provide a body structure for chip detection equipment, which can not only ensure that the device under test in the box accurately reaches the predetermined position, but also ensure that the device under test is subjected to uniform temperature or humidity effects, thereby improving the accuracy of the test data. Summary of the invention

[0005] The present invention provides a body structure for chip detection equipment, which can effectively solve the above problems.

[0006] The present invention is achieved in that:

[0007] A body structure for chip detection equipment comprises an outer shell, a control structure is arranged on the outer shell, the inner part of the outer shell is divided into a plurality of chambers, the front ends of the plurality of chambers are closed by door panels, the rear ends of the plurality of chambers are closed by heat dissipation plates, the chambers are all slidably mounted with drawers, and the body structure further comprises:

[0008] A fixed-point temperature control structure, wherein a plurality of heat-transmitting grooves are provided on the side of the drawer, and the fixed-point temperature control structure comprises a penetration structure provided on the side of the chamber, and a fixed structure corresponding to the heat-transmitting groove is provided on the penetration structure. When the drawer is in place, the heat generated by the penetration structure directly passes into the heat-transmitting groove, and the fixed structure penetrates into the heat-transmitting groove to limit the drawer;

[0009] An internal fixed-point-in-place structure, wherein an internal groove is provided on one side of the bottom of the drawer close to the heat dissipation plate, and the internal fixed-point-in-place structure comprises an electric pull member arranged in the chamber, a matching member is movably provided on the output end of the electric pull member, and the matching member is adjusted in direction by an adjusting member, and an electric linkage member is provided above the electric pull member, and the matching member is located below the internal groove of the drawer after being pushed in, and the matching member is hooked in the internal groove after being flipped over and drives the drawer to a preset position, and after the drawer reaches the preset position, the electric linkage member is embedded in the drawer.

[0010] As a further improvement, the penetration structure includes two heating plates arranged on the side of the chamber, a shift plate is fixedly connected to the heating plate, and a plurality of alignment holes are opened on the shift plate. When the drawer is in place, the alignment holes and the heat-transmitting groove are in the same straight line.

[0011] As a further improvement, a transverse T-shaped axis is provided at the top of the interior of the chamber, holes are provided at the end and side of the long axis of the T-shaped axis, and the bottom of one end of the short axis of the T-shaped axis is located in the gap between the shift plate and the drawer.

[0012] As a further improvement, two matching ribs are provided on the bottom side of the T-shaped shaft, and U-shaped buckets are provided on the shift plate and the drawer. After the drawer slides into the chamber, the U-shaped bucket is inserted into the matching ribs.

[0013] As a further improvement, the fixing structure includes a pushing member arranged outside the chamber, the end of the pushing member is connected to a moisture cylinder, and the moisture cylinder is connected to the cold air pipe through a pipeline.

[0014] As a further improvement, the electric puller comprises an electric push rod arranged in the chamber, a folding hinge seat is arranged on the output end of the electric push rod, and the matching piece is movably installed in the hinge seat.

[0015] As a further improvement, the matching piece is a hook hinged to the output end of the electric pull piece.

[0016] As a further improvement, the direction-adjusting member includes two connecting rods connected to the outside of the bent hook, the ends of the connecting rods are connected to a rotating motor, a guide groove is opened on the side of the chamber, the connecting rod is slidably installed in the guide groove, a rib groove is provided on the outside of the guide groove, and the rotating motor is movably installed on the outside of the guide groove.

[0017] As a further improvement, the outer side of the hook is a hexagonal stud, and the inner side of the connecting rod is a hexagonal setting.

[0018] As a further improvement, the electric linkage comprises two silver electrode sheets arranged at the bottom of the drawer and two contacts fixed above the electric pull member, the contacts are connected to the power supply of the control structure, and when the drawer is in place, the silver electrode sheets and the contacts form a circuit.

[0019] The beneficial effects of the present invention are:

[0020] In the test cabinet of the prior art, a separate temperature control structure is directly set in the chamber inside the test cabinet. Although the temperature control effect can be achieved, if it is impossible to confirm whether the object to be tested has reached a specific position, even if a separate temperature control structure is set, the object to be tested cannot be accurately controlled in temperature. When the drawer is manually pushed into place, the drawer is not completely in place at this time. Therefore, the present invention sets an internal fixed-point positioning structure. After the drawer reaches the theoretical position, the adjustment part can drive the matching part to rotate, and further the electric pulling part drives the matching part to move inward, so that the drawer is further pulled inward and the entire drawer is completely in place. The drawer in place will form electrical coordination with the electric linkage part, and the entire device will be fully energized, so that the entire body structure will start the power supply only after the drawer is completely in place, ensuring the sealing while maintaining the accuracy of the test accuracy in subsequent high humidity or high temperature tests.

[0021] After the drawer has been pushed to a certain stroke, it cannot be pushed forward any further, or it is difficult to push it into place manually at this time, and even after it is in place, it is easy to pop out again. Therefore, the present invention uses an electric push rod to pull the drawer inward through a matching piece after the drawer is pushed once, so that the drawer is completely in place, thereby avoiding the difficulty in accurately controlling the temperature and humidity caused by the phenomenon of not being in place when manually pushing and pulling.

[0022] In the process of pushing the drawer back, a hinged hook is used, so that when it is necessary to pull it back, the hook can be swung upward to drive the drawer to be pushed back, and in the process of pulling the drawer out, the hook can be swung downward to avoid affecting the normal outward pulling of the drawer, thereby switching between the two movement states of the drawer without affecting each other.

[0023] The direction change of the mating piece is changed by the adjusting piece, but since the position of the mating piece is constantly changing, the position of the adjusting piece also needs to change accordingly. Therefore, the adjusting piece of the present invention not only includes a rotating motor for changing the position of the mating piece, but also the connecting rod and the rotating motor cooperate with the guide groove and the rib groove respectively, so as to realize the change in lateral position, and then realize the active coordination effect with the mating piece, thereby improving the practicality of the present invention.

[0024] In a conventional test structure, the tester cannot confirm whether the object to be tested is in place before turning on the test switch, and thus cannot confirm whether the test result is accurate. Therefore, in the present invention, the switch of the entire test structure is intelligently opened and closed through an electric linkage. Only after the corresponding drawer is in place will the silver electrode sheet and the contact form a match, thereby turning on the test of the corresponding drawer. In this way, all test areas can be relatively independent, and testing will only be performed after the drawer is in place. The test result is more accurate and the sealing of the current area is better.

[0025] Since the chamber corresponding to each drawer is relatively independent, relatively independent space and control are also required during control. In order to improve the accuracy when the drawer is in place and the stability of the internal space of the drawer during the test, the present invention provides a fixed-point temperature control structure. When the drawer is fully in place, the heat-transmitting groove and the penetration structure on the drawer are corresponding, so that the corresponding test effect can be obtained under high temperature or high humidity measurement, and after the heat-transmitting groove and the penetration structure are in corresponding positions, the position of the drawer can be limited immediately by the fixed structure, so that during the test, the drawer can always be located in the best position to achieve the best contact effect with the high-temperature gas or high-humidity gas.

[0026] The through-position structure is mainly used for testing under high temperature. It heats the inside of the drawer through a heating plate. In order to improve the heat transfer effect, the heating plate is directly connected to the heat-transmitting groove on the drawer after it is in place through a baffle plate with alignment holes, thereby realizing point-to-point area thermal radiation heating with excellent heating effect.

[0027] In order to allow heat to circulate and better simulate the use of semiconductor devices in complex environments, the present invention sets a T-shaped axis at the top of the chamber. The hot air that overflows to the top can be circulated to the lower end through the setting of the T-shaped axis. In addition, the T-shaped axis not only serves as a circulation path, but also has two matching ribs at the lower end of the T-shaped axis. Through the guidance of the two matching ribs, the entry and exit positions of the drawers can be standardized, thereby improving the airtightness and having a certain circulation effect.

[0028] During the high humidity test, moisture is introduced from the outside. However, if only one pipe is used, not only is the moisture distribution relatively uneven, but the pipe also only serves to transmit moisture. Therefore, the present invention provides a fixed structure to allow external moisture to enter through the moisture cylinder, and at the same time, the moisture cylinder can be used to limit the heat-transmitting groove of the drawer, so that once the drawer is in place, it cannot be withdrawn until the entire test process is completed. BRIEF DESCRIPTION OF THE DRAWINGS

[0029] In order to more clearly illustrate the technical solutions of the embodiments of the present invention, the drawings required for use in the embodiments will be briefly introduced below. It should be understood that the following drawings only show certain embodiments of the present invention and therefore should not be regarded as limiting the scope. For ordinary technicians in this field, other related drawings can be obtained based on these drawings without paying creative work.

[0030] Figure 1 It is a structural schematic diagram of the present invention.

[0031] Figure 2 It is a schematic diagram of the external structure of the chamber and drawer of the present invention.

[0032] Figure 3 It is a schematic diagram of the internal structure of the chamber and drawer of the present invention.

[0033] Figure 4 It is a schematic structural diagram of the chamber of the present invention.

[0034] Figure 5 The present invention Figure 4 Front view of .

[0035] Figure 6 It is a structural schematic diagram of the fixed point and position structure in the present invention.

[0036] Figure 7 It is a structural schematic diagram of a drawer of the present invention.

[0037] In the figure:

[0038] The outer shell 10, the chamber 20, the guide groove 21, the rib groove 22, the door panel 30, the drawer 50, the heat-transmitting groove 51, the inner groove 52, the fixed-point temperature control structure 60, the penetration structure 61, the heating plate 611, the shift plate 612, the alignment hole 613, the T-shaped shaft 614, the matching rib 6141, the U-shaped bucket 6142, the fixing structure 62, the pushing member 621, the moisture cylinder 622, the inner fixed-point positioning structure 70, the electric pulling member 71, the electric push rod 711, the hinge seat 712, the matching member 72, the adjustment member 73, the connecting rod 731, the rotating motor 732, the silver electrode sheet 741, and the contact 742. DETAILED DESCRIPTION

[0039] In order to make the embodiments of the present invention, all belong to the scope of protection of the present invention. Therefore, the following detailed description of the embodiments of the present invention provided in the accompanying drawings is not intended to limit the scope of the invention claimed for protection, but merely represents the selected embodiments of the present invention. Based on the embodiments of the present invention, all other embodiments obtained by ordinary technicians in this field without creative work belong to the scope of protection of the present invention.

[0040] In the description of the present invention, the terms "first" and "second" are only used for descriptive purposes and cannot be understood as referring to the purpose, technical solutions and advantages of the methods. To be more clear, the technical solutions in the embodiments of the present invention will be clearly and completely described below in conjunction with the drawings in the embodiments of the present invention. Obviously, the described embodiments are part of the embodiments of the present invention, not all of the embodiments. Based on the embodiments of the present invention, all other embodiments obtained by ordinary technicians in this field without creative work indicate or imply relative importance or implicitly indicate the number of indicated technical features. Therefore, the features defined as "first" and "second" may explicitly or implicitly include one or more of the features. In the description of the present invention, the meaning of "multiple" is two or more, unless otherwise clearly and specifically defined.

[0041] Reference Figure 1 to Figure 7 As shown, a body structure for chip detection equipment includes an outer shell 10, on which a control structure is arranged, the interior of the outer shell 10 is divided into a plurality of chambers 20, the front ends of the plurality of chambers 20 are closed by door panels 30, the rear ends of the plurality of chambers 20 are closed by heat dissipation plates, and the chambers 20 are all slidably mounted with drawers 50, and the body structure also includes: a fixed-point temperature control structure 60, on which a plurality of heat-transmitting grooves 51 are opened on the side of the drawer 50, the fixed-point temperature control structure 60 includes a penetration structure 61 arranged on the side of the chamber 20, and a fixing structure 62 corresponding to the heat-transmitting groove 51 is arranged on the penetration structure 61, and when the drawer 50 is in place, the heat generated by the penetration structure 61 is directly passed to the heat-transmitting groove 51. The drawer 50 is in the groove 51, and the fixing structure 62 penetrates into the heat-transmitting groove 51 to limit the position of the drawer 50; the inner fixed-point positioning structure 70, the drawer 50 is provided with an inner groove 52 on the side of the bottom close to the heat dissipation plate, the inner fixed-point positioning structure 70 includes an electric pull member 71 arranged in the chamber 20, and a matching member 72 is movably arranged on the output end of the electric pull member 71, and the matching member 72 is adjusted in direction by an adjusting member 73, and an electric linkage member is arranged above the electric pull member 71, and the matching member 72 is located below the inner groove 52 of the drawer 50 after being pushed in. After the matching member 72 is turned over, it is hooked in the inner groove 52 and drives the drawer 50 to the preset position. After the drawer 50 reaches the preset position, the electric linkage member is embedded in the drawer 50.

[0042] During use, the tester first opens the door panel 30, pulls out all the drawers 50, sets different parameters in different drawers 50, puts in different semiconductor devices, and then closes the drawer 50 to automatically power on and start testing.

[0043] In the test cabinet of the prior art, a separate temperature control structure is directly set in the chamber 20 in the test cabinet. Although the temperature control effect can be achieved, if it is impossible to confirm whether the object to be tested has reached a specific position, even if a separate temperature control structure is set, the object to be tested cannot be accurately controlled in temperature. When the drawer 50 is manually pushed into place, the drawer 50 is not completely in place at this time. Therefore, the present invention sets an internal fixed-point positioning structure 70. After the drawer 50 reaches the theoretical position, the adjustment member 73 can drive the matching member 72 to rotate, and further the electric pulling member 71 can drive the matching member 72 to move inward, so that the drawer 50 is further pulled inward, so that the entire drawer 50 is completely in place. After the drawer 50 is in place, it will form an electrical connection with the electric linkage member, and the entire device will be fully powered on, so that the entire body structure will only start the power supply after the drawer 50 is completely in place, ensuring the sealing while maintaining the accuracy of the test accuracy in the subsequent high humidity or high temperature test process.

[0044] After the drawer 50 is pushed to a certain stroke, it cannot be pushed forward any further, or it is difficult to push it into place manually at this time, and it is easy to pop out again even after it is in place. Therefore, the electric pulling member 71 of this embodiment includes an electric push rod 711 arranged in the chamber 20, and a folding hinge seat 712 is arranged on the output end of the electric push rod 711. The matching member 72 is movably installed in the hinge seat 712. After the drawer 50 is pushed once, the electric push rod 711 is used to pull the drawer 50 inward through the matching member 72, so that the drawer 50 is completely in place, thereby avoiding the temperature and humidity conditions that are difficult to accurately control due to the phenomenon of not being in place during manual pushing and pulling.

[0045] During the process of pushing the drawer 50 back, the matching member 72 is a hook hinged to the output end of the electric pull member 71, and a hinged hook is adopted, so that when it is necessary to pull back, the hook can be swung upward to drive the drawer 50 to be pushed back, and when the drawer 50 is pulled out, the hook can be swung downward to avoid affecting the normal outward pulling of the drawer 50, thereby switching the two movement states of the drawer 50 without affecting each other.

[0046] The direction change of the matching piece 72 is changed by the adjusting piece 73, but because the position of the matching piece 72 is constantly changing, the position of the adjusting piece 73 also needs to change accordingly. Therefore, the adjusting piece 73 of this embodiment includes two connecting rods 731 connected to the outside of the hook, and the ends of the connecting rods 731 are connected to a rotating motor 732. A guide groove 21 is provided on the side of the chamber 20. The connecting rod 731 is slidably installed in the guide groove 21. A rib groove 22 is provided on the outside of the guide groove 21. The rotating motor 732 is movably installed on the outside of the guide groove 21. The adjusting piece 73 not only includes the rotating motor 732 for changing the position of the matching piece 72, but also the connecting rod 731 and the rotating motor 732 cooperate with the guide groove 21 and the rib groove respectively, so as to realize the change in lateral position, and then realize the active cooperation effect with the matching piece 72, thereby improving the practicality of the present invention.

[0047] In order to prevent the connection rod 731 from being disengaged from the hook, the outer side of the hook is a hexagonal stud, and the inner side of the connection rod 731 is an inner hexagonal setting, so that disengagement will not occur during rotation.

[0048] In a conventional test structure, the tester cannot confirm whether the test object is in place and the test switch is turned on, and thus cannot confirm whether the test result is accurate. Therefore, the electric linkage of this embodiment includes two silver electrode sheets 741 arranged at the bottom of the drawer 50, and two contacts 742 fixed above the electric pull member 71, and the contacts 742 are connected to the power supply of the control structure. When the drawer 50 is in place, the silver electrode sheet 741 and the contacts 742 form a loop, and the switch of the entire test structure is intelligently opened and closed through the electric linkage. Only after the corresponding drawer 50 is in place, the silver electrode sheet 741 and the contacts 742 will cooperate to open the test of the corresponding drawer 50, so that all test areas can be relatively independent, and the test will only be performed after the drawer 50 is in place. The test result is more accurate and the sealing of the current area is better.

[0049] Since the chamber 20 corresponding to each drawer 50 is relatively independent, relatively independent space and control are also required during control. In order to improve the accuracy of the drawer 50 when it is in place and the stability of the internal space of the drawer 50 during the test, the present invention sets a fixed-point temperature control structure 60. When the drawer 50 is fully in place, the heat-transmitting groove 51 on the drawer 50 corresponds to the penetration structure 61, so that the corresponding test effect can be obtained under high temperature or high humidity measurement. Moreover, after the heat-transmitting groove 51 and the penetration structure 61 are in corresponding positions, the position of the drawer 50 can be immediately limited by the fixed structure 62, so that during the test, the drawer 50 can always be located in the best position to achieve the best contact effect with the high-temperature gas or high-humidity gas.

[0050] The penetration structure 61 is mainly used for testing at high temperatures. Specifically, the penetration structure 61 includes two heating plates 611 arranged on the side of the chamber 20. A stop plate 612 is fixedly connected to the heating plate 611. The stop plate 612 is provided with a plurality of alignment holes 613. When the drawer 50 is in place, the alignment holes 613 and the heat-transmitting grooves 51 are in the same straight line. The drawer 50 is heated by the heating plate 611. In order to improve the heat transfer effect, the heating plate 611 is directly connected to the heat-transmitting grooves 51 on the drawer 50 after it is in place through the stop plate 612 with the alignment holes 613, so as to realize point-to-point area thermal radiation heating, and the heating effect is excellent.

[0051] In order to allow heat to circulate and better simulate the use of semiconductor devices in a complex environment, a transverse T-shaped shaft 614 is provided at the top of the chamber 20 of the present embodiment. Holes are provided at the end and side of the long axis of the T-shaped shaft 614. The bottom of one end of the short axis of the T-shaped shaft 614 is located in the gap between the shift plate 612 and the drawer 50. The hot air that overflows to the top can be circulated to the lower end through the setting of the T-shaped shaft 614. Specifically, two matching ribs 6141 are provided on the bottom side of the T-shaped shaft 614. U-shaped buckets 6142 are provided on the shift plate 612 and the drawer 50. After the drawer 50 slides into the chamber 20, the U-shaped bucket 6142 is inserted into the matching rib 6141. The T-shaped shaft 614 is not only used as a circulation path, but also has two matching ribs 6141 at the lower end of the T-shaped shaft 614. The guidance of the two matching ribs 6141 can regulate the entry and exit position of the drawer 50, thereby improving the airtightness and having a certain circulation effect.

[0052] During the high humidity test, moisture is introduced from the outside. However, if only one pipe is introduced, not only will the moisture distribution be relatively uneven, but the pipe will also only have the function of transmitting moisture. Therefore, the fixed structure 62 of this embodiment includes a pusher 621 arranged on the outside of the chamber 20, and the end of the pusher 621 is connected to a moisture cylinder 622. The moisture cylinder 622 is connected to the cold air pipe through a pipeline. Through the set fixed structure 62, external moisture can enter through the moisture cylinder 622, and the moisture cylinder 622 can also limit the heat-transmitting groove 51 of the drawer 50, so that the drawer 50 cannot be withdrawn once it is in place until the entire test process is completed.

[0053] The above description is only a preferred embodiment of the present invention and is not intended to limit the present invention. For those skilled in the art, the present invention may have various modifications and variations. Any modification, equivalent replacement, improvement, etc. made within the spirit and principle of the present invention shall be included in the protection scope of the present invention.

Claims

1. A body structure for chip detection equipment, comprising an outer shell (10), wherein a control structure is arranged on the outer shell (10), wherein the interior of the outer shell (10) is divided into a plurality of chambers (20), wherein the front ends of the plurality of chambers (20) are closed by door panels (30), and the rear ends of the plurality of chambers (20) are closed by heat dissipation plates, wherein each of the chambers (20) is slidably mounted with a drawer (50), wherein: The body structure also includes: A fixed-point temperature control structure (60), wherein a plurality of heat-transmitting grooves (51) are provided on the side of the drawer (50), the fixed-point temperature control structure (60) comprises a penetration structure (61) arranged on the side of the chamber (20), a fixing structure (62) corresponding to the heat-transmitting groove (51) is arranged on the penetration structure (61), when the drawer (50) is in place, the heat generated by the penetration structure (61) directly passes into the heat-transmitting groove (51), and the fixing structure (62) penetrates into the heat-transmitting groove (51) to limit the position of the drawer (50); An internal fixed-point positioning structure (70), wherein an internal groove (52) is provided on one side of the bottom of the drawer (50) close to the heat dissipation plate, the internal fixed-point positioning structure (70) comprises an electric pull member (71) arranged in the chamber (20), a matching member (72) is movably provided on the output end of the electric pull member (71), the matching member (72) is adjusted in direction by a direction adjustment member (73), an electric linkage member is provided above the electric pull member (71), the matching member (72) is located below the internal groove (52) of the drawer (50) after being pushed in, the matching member (72) is hooked in the internal groove (52) after being turned over and drives the drawer (50) to reach a preset position, and after the drawer (50) reaches the preset position, the electric linkage member is embedded in the drawer (50); The matching piece (72) is a hook hinged to the output end of the electric pull piece (71); the direction-adjusting piece (73) comprises two connecting rods (731) connected to the outside of the hook; the ends of the connecting rods (731) are connected to the rotating motor (732); a guide groove (21) is provided on the side of the chamber (20); the connecting rod (731) is slidably mounted in the guide groove (21); a rib groove (22) is provided on the outside of the guide groove (21); and the rotating motor (732) is movably mounted on the outside of the guide groove (21); The electric linkage comprises two silver electrode sheets (741) arranged at the bottom of the drawer (50), and two contacts (742) fixed above the electric pull member (71); the contacts (742) are connected to a power source of a control structure; when the drawer (50) is in place, the silver electrode sheets (741) and the contacts (742) form a loop.

2. A body structure for chip detection equipment according to claim 1, characterized in that: The penetration structure (61) comprises two heating plates (611) arranged on the side of the chamber (20), a stop plate (612) being fixedly connected to the heating plates (611), a plurality of alignment holes (613) being formed on the stop plate (612), and when the drawer (50) is in place, the alignment holes (613) and the heat-transmitting grooves (51) are in the same straight line.

3. The body structure for chip detection equipment according to claim 1, characterized in that: A transverse T-shaped shaft (614) is arranged at the top of the chamber (20), and holes are provided at the end and side of the long axis of the T-shaped shaft (614), and the bottom of one end of the short axis of the T-shaped shaft (614) is located in the gap between the shift plate (612) and the drawer (50).

4. The body structure for chip detection equipment according to claim 3, characterized in that: Two matching ribs (6141) are provided on the bottom side of the T-shaped shaft (614), and a U-shaped bucket (6142) is provided on the shift plate (612) and the drawer (50); after the drawer (50) slides into the chamber (20), the U-shaped bucket (6142) is inserted into the matching ribs (6141).

5. The body structure for chip detection equipment according to claim 1, characterized in that: The fixed structure (62) comprises a pushing member (621) arranged outside the chamber (20), the end of the pushing member (621) is connected to a moisture cylinder (622), and the moisture cylinder (622) is connected to a cold air pipe through a pipeline.

6. The body structure for chip detection equipment according to claim 1, characterized in that: The electric puller (71) comprises an electric push rod (711) disposed in a chamber (20), a folding hinge seat (712) being disposed on the output end of the electric push rod (711), and the matching member (72) being movably mounted in the hinge seat (712).

7. The body structure for chip detection equipment according to claim 1, characterized in that: The outer side of the hook is a hexagonal stud, and the inner side of the connecting rod (731) is a hexagonal setting.

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